WO2023211123A1 - 코팅 두께 측정 장치 및 방법 - Google Patents
코팅 두께 측정 장치 및 방법 Download PDFInfo
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- WO2023211123A1 WO2023211123A1 PCT/KR2023/005629 KR2023005629W WO2023211123A1 WO 2023211123 A1 WO2023211123 A1 WO 2023211123A1 KR 2023005629 W KR2023005629 W KR 2023005629W WO 2023211123 A1 WO2023211123 A1 WO 2023211123A1
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- thickness
- coating
- substrate
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- 238000009675 coating thickness measurement Methods 0.000 title claims abstract description 28
- 238000000034 method Methods 0.000 title claims abstract description 21
- 238000000576 coating method Methods 0.000 claims abstract description 288
- 239000011248 coating agent Substances 0.000 claims abstract description 284
- 239000000758 substrate Substances 0.000 claims abstract description 95
- 239000000463 material Substances 0.000 claims abstract description 93
- 238000003860 storage Methods 0.000 claims abstract description 87
- 238000012937 correction Methods 0.000 claims abstract description 58
- 230000002093 peripheral effect Effects 0.000 claims description 25
- 238000005259 measurement Methods 0.000 description 19
- 238000001514 detection method Methods 0.000 description 12
- 238000010586 diagram Methods 0.000 description 11
- 238000006073 displacement reaction Methods 0.000 description 7
- 238000007726 management method Methods 0.000 description 7
- 230000032258 transport Effects 0.000 description 5
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 4
- 238000004891 communication Methods 0.000 description 4
- 238000002360 preparation method Methods 0.000 description 4
- WHXSMMKQMYFTQS-UHFFFAOYSA-N Lithium Chemical compound [Li] WHXSMMKQMYFTQS-UHFFFAOYSA-N 0.000 description 3
- 229910052744 lithium Inorganic materials 0.000 description 3
- 229920005596 polymer binder Polymers 0.000 description 3
- 239000002491 polymer binding agent Substances 0.000 description 3
- 230000007423 decrease Effects 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000004146 energy storage Methods 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 239000000945 filler Substances 0.000 description 2
- 239000011888 foil Substances 0.000 description 2
- 230000006870 function Effects 0.000 description 2
- 239000010954 inorganic particle Substances 0.000 description 2
- 229910052759 nickel Inorganic materials 0.000 description 2
- 239000002245 particle Substances 0.000 description 2
- 238000012545 processing Methods 0.000 description 2
- 239000002002 slurry Substances 0.000 description 2
- 239000007787 solid Substances 0.000 description 2
- 239000013077 target material Substances 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 238000013459 approach Methods 0.000 description 1
- OJIJEKBXJYRIBZ-UHFFFAOYSA-N cadmium nickel Chemical compound [Ni].[Cd] OJIJEKBXJYRIBZ-UHFFFAOYSA-N 0.000 description 1
- 239000003575 carbonaceous material Substances 0.000 description 1
- 230000000295 complement effect Effects 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 239000011889 copper foil Substances 0.000 description 1
- 238000013500 data storage Methods 0.000 description 1
- 239000002270 dispersing agent Substances 0.000 description 1
- 239000007772 electrode material Substances 0.000 description 1
- 239000002001 electrolyte material Substances 0.000 description 1
- 229910052739 hydrogen Inorganic materials 0.000 description 1
- 239000001257 hydrogen Substances 0.000 description 1
- 230000001678 irradiating effect Effects 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 230000003446 memory effect Effects 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 229910044991 metal oxide Inorganic materials 0.000 description 1
- 150000004706 metal oxides Chemical class 0.000 description 1
- 239000007773 negative electrode material Substances 0.000 description 1
- QELJHCBNGDEXLD-UHFFFAOYSA-N nickel zinc Chemical compound [Ni].[Zn] QELJHCBNGDEXLD-UHFFFAOYSA-N 0.000 description 1
- 229920006254 polymer film Polymers 0.000 description 1
- 229920000307 polymer substrate Polymers 0.000 description 1
- 239000007774 positive electrode material Substances 0.000 description 1
- 238000012827 research and development Methods 0.000 description 1
- 238000007789 sealing Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 239000002904 solvent Substances 0.000 description 1
- 238000001228 spectrum Methods 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
- G01B11/0616—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating
- G01B11/0625—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating with measurement of absorption or reflection
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
- G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
- G01B21/04—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points
- G01B21/045—Correction of measurements
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01M—PROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSION OF CHEMICAL ENERGY INTO ELECTRICAL ENERGY
- H01M4/00—Electrodes
- H01M4/02—Electrodes composed of, or comprising, active material
- H01M4/04—Processes of manufacture in general
Definitions
- Embodiments disclosed in this document relate to a thickness measuring device and method, and more specifically, to a coating thickness measuring device and method that can accurately measure the coating thickness of a coating material applied to a substrate.
- lithium secondary batteries have little memory effect compared to nickel-based secondary batteries, so they can be freely charged and discharged. It is receiving attention for its extremely low self-discharge rate and high energy density.
- secondary batteries have been widely used for driving or energy storage in medium to large-sized devices such as electric vehicles and energy storage systems (ESS). And, because of this, interest in secondary batteries is increasing, and related research and development is being conducted more actively.
- ESS electric vehicles and energy storage systems
- such secondary batteries can be manufactured by storing the electrode assembly and electrolyte material in a battery case and sealing the battery case.
- the electrode assembly of the secondary battery may include a positive electrode, a negative electrode, and a separator interposed between the positive electrode and the negative electrode.
- the positive electrode, negative electrode, and separator included in the electrode assembly of the secondary battery can each be manufactured through a process of coating a certain sheet or plate-shaped substrate with a certain coating material.
- a positive electrode can be manufactured through a process of coating the surface of a substrate such as aluminum foil with a coating material containing a positive electrode active material such as lithium-based oxide.
- the negative electrode can be manufactured through a process of coating the surface of a substrate such as copper foil with a coating material containing a negative electrode active material such as carbon material.
- the separator can be manufactured through a process of coating the surface of a porous polymer substrate with a coating material containing inorganic particles and a polymer binder.
- each coating material In order to increase the charging capacity and energy density of such secondary batteries, each coating material must be coated with an even thickness on the surface of the corresponding substrate.
- the coating thickness of the corresponding coating material In other words, in order to manufacture high-quality and highly efficient secondary battery products, while the anode electrode, cathode electrode, or separator is coated by the coating device, the coating thickness of the corresponding coating material must be accurately measured in real time and based on the measured coating thickness. Therefore, appropriate maintenance must be performed on the coating equipment or subsequent processing equipment.
- the existing technology does not consider the effect of temperature changes when measuring the coating thickness, so there is a problem in that the accuracy of the coating thickness measurement value is further reduced.
- the technical problem to be solved by the present invention is to provide a coating thickness measuring device and method that can measure the thickness of a coating material applied to a substrate with a high level of accuracy.
- another technical problem that the present invention aims to solve is to further improve the accuracy of the coating thickness measurement value by correcting the coating thickness measurement value by considering the effect of temperature changes when measuring the thickness of the coating material applied to the substrate.
- the coating thickness measuring device is a coating material applied to the contact portion of the substrate that is in contact with the coating roll while the substrate to which the coating material is applied is transported by the coating roll.
- a data acquisition unit configured to acquire thickness data indicating the thickness of; and creating a virtual memory zone having a plurality of storage areas in which correction data is distributed and stored, correcting the thickness data based on correction data previously stored in a target storage area selected from the plurality of storage areas, and correcting the thickness data. It includes a processor configured to generate.
- the data acquisition unit is configured to divide the outer peripheral surface of the coating roll into a plurality of sections and further acquire section identification data identifying a section in contact with a contact portion of the substrate among the plurality of sections.
- the processor may be configured to select a storage area corresponding to the section identification data among the plurality of storage areas as the target storage area before correcting the thickness data.
- the correction data previously stored in the target storage area may include a roundness value of the section in contact with the contact portion of the substrate.
- the data acquisition unit is configured to further acquire temperature data indicating the temperature of the coating roll, and the processor, based on correction data pre-stored in the target storage area and the temperature data, It may be configured to correct thickness data.
- the pre-stored correction data may include a data table recording roundness values for each temperature of a section in contact with a contact portion of the substrate among a plurality of sections dividing the outer peripheral surface of the coating roll by position. .
- the data acquisition unit before acquiring the thickness data, divides the outer peripheral surface of the coating roll into a plurality of sections and is configured to obtain roundness data indicating the roundness of the corresponding section for each section
- the processor may be configured to store the roundness data obtained by section by the data acquisition unit divided by section into the plurality of storage areas.
- the data acquisition unit includes a sensing module including a thickness sensor; And a position adjustment module that adjusts the position of the sensing module and allows the sensing module to sense the thickness of the coating material applied to the contact portion of the substrate through the thickness sensor to generate the thickness data.
- the sensing module further includes a temperature sensor that senses the temperature of the coating roll, and the processor stores correction data pre-stored in the target storage area and temperature data acquired through the temperature sensor. Based on, it may be configured to correct the thickness data.
- the position adjustment module includes: a first moving unit that moves the sensing module along a first axis; And it may include a second movement unit that moves the sensing module along a second axis that intersects the first axis.
- the position adjustment module may further include a third movement unit that moves the sensing module along a third axis that intersects the first axis and the second axis, respectively.
- the position adjustment module may further include a rotation unit that rotates the sensing module within a certain rotation angle range around a predetermined rotation axis.
- the data acquisition unit may include a plurality of data acquisition units, and the plurality of data acquisition units may be arranged to be spaced apart from each other in the width direction of the substrate transported in the longitudinal direction by the coating roll.
- a coating system according to another aspect of the present invention may include a coating thickness measuring device according to any one of the above-described embodiments.
- a coating thickness measurement method is a method performed by a device for measuring the thickness of a coating material applied to a substrate, and includes a virtual memory zone having a plurality of storage areas in which correction data are distributed and stored. generating step; While a substrate coated with a coating material is transported by a coating roll, obtaining thickness data indicating the thickness of the coating material applied to the contact portion of the substrate in contact with the coating roll; and generating corrected thickness data by correcting the thickness data based on correction data previously stored in a target storage area selected from among the plurality of storage areas.
- the coating thickness measurement method further includes obtaining temperature data representing the temperature of the coating roll before generating the corrected thickness data, and generating the corrected thickness data.
- the step may include correcting the thickness data based on correction data pre-stored in the target storage area and the temperature data.
- the pre-stored correction data may include a data table recording roundness values for each temperature of a section in contact with a contact portion of the substrate among a plurality of sections dividing the outer peripheral surface of the coating roll by position. .
- the data acquisition unit determines the coating applied to that portion of the entire substrate in contact with the coating roll.
- the data acquisition unit determines the coating applied to that portion of the entire substrate in contact with the coating roll.
- the processor creates a virtual memory zone with a plurality of storage areas and corrects the thickness data acquired by the data acquisition unit based on correction data previously stored in a target storage area selected from the plurality of storage areas.
- the data acquisition unit is configured to further acquire temperature data indicating the temperature of the coating roll
- the processor is configured to correct the thickness data based on the temperature data and correction data pre-stored in the target storage area.
- the data acquisition unit includes a position adjustment module that adjusts the position of the sensing module along with a sensing module that senses the thickness of the coating material, so that the sensing position of the sensing module can be optimized and the size of the substrate to be measured , the position of the sensing module can be appropriately changed depending on the relative positions of the rolls transporting the measurement target material.
- Figure 1 This is a block diagram showing a coating thickness measuring device according to an embodiment of the present invention.
- Figure 2 is a diagram showing a coating system according to an embodiment of the present invention.
- Figure 3 is a diagram showing a coating thickness measuring device of the coating system shown in Figure 2.
- Figure 4 is a cross-sectional view showing a coating roll applicable to the coating system according to the present invention.
- Figure 5 is a diagram showing an example of a virtual memory zone created by the coating thickness measuring device according to the present invention.
- FIG. 6 is a diagram showing the storage state of correction data in the virtual memory zone shown in FIG. 5.
- Figure 7 is a diagram showing an example of correction data stored in the storage area of the virtual memory zone.
- Figure 8 is a diagram showing the measurement preparation state of the coating thickness measuring device shown in Figure 3.
- Figure 9 is a diagram showing a coating thickness measuring device according to a modified embodiment of the present invention.
- Figure 10 is a diagram showing the measurement preparation state of the coating thickness measuring device shown in Figure 9.
- Figure 11 is a graph showing coating thickness values measured through a general displacement sensor.
- Figure 12 is a graph showing corrected coating thickness values according to an embodiment of the present invention.
- Figure 13 is a diagram showing a coating system according to an embodiment of the present invention.
- Figure 14 is a flowchart showing a method of measuring coating thickness according to an embodiment of the present invention.
- Figure 1 shows a block diagram of a coating thickness measuring device 10 according to an embodiment of the present invention.
- the coating thickness measuring device 10 includes a data acquisition unit 100 and a processor 200. Depending on the embodiment, the coating thickness measuring device 10 may further include an output unit 300.
- the data acquisition unit 100 determines the thickness of the coating material applied to the contact portion of the entire substrate that is in contact with the coating roll. It is configured to acquire thickness data representing.
- the data acquisition unit 100 includes a sensing module 110 that senses the thickness of the coating material and generates thickness data of the coating material, and a position adjustment module that adjusts the position of the sensing module 110 ( 120) may be included.
- the substrate may be a metal foil that forms a positive or negative electrode of a secondary battery, or a porous polymer film that forms a separator of a secondary battery.
- the coating material applied to the substrate may be a slurry-like material mixed with fine solid particles and a solvent, or a powder-like material mixed with different solid particles.
- the coating material when the coating material is an electrode coating material, the coating material may include an electrode active material and, depending on the embodiment, may optionally further include a polymer binder, a conductive material, a filler, etc.
- the coating material when the coating material is a separator coating material, the coating material may include inorganic particles and, depending on the embodiment, may optionally further include a polymer binder, a dispersant, a heat-resistant filler, etc.
- the processor 200 is configured to create a virtual memory zone with a plurality of storage areas before the data acquisition unit 100 acquires the thickness data.
- the plurality of storage areas of the virtual memory zone may be configured to respectively correspond to a plurality of sections divided according to the location of the outer peripheral surface of the coating roll. In these plural storage areas, correction data used for thickness data correction may be distributed and stored.
- the data acquisition unit 100 divides the entire outer peripheral surface of the coating roll into a plurality of sections and obtains roundness data indicating the roundness of the corresponding section for each section. It can be configured.
- the processor 200 may store the roundness data obtained for each section divided by section into the plurality of storage areas.
- the processor 200 corrects the thickness data acquired by the data acquisition unit 100 based on correction data previously stored in a target storage area selected from among the plurality of storage areas, and adjusts the thickness data to the corrected thickness. It is configured to generate data.
- the output unit 300 may be configured to output the corrected thickness data generated by the processor 200 visually, auditorily, or audiovisually.
- the output unit 103 may optionally include a display, printer, speaker, etc.
- the data acquisition unit 100 divides the outer peripheral surface of the coating roll into a plurality of sections, and further obtains section identification data identifying a section in contact with the contact portion of the substrate among the plurality of sections. It can be configured to do so.
- the section identification data may include an identification number assigned to each section, or may include an angle formed between a predetermined first center line among center lines passing through the center of the coating roll and a second center line passing through the section. .
- the processor 200 selects a storage area corresponding to the section identification data among the plurality of storage areas as the target storage area, and stores data in the target storage area.
- the acquired thickness data can be corrected using stored correction data.
- the correction data pre-stored in the target storage area may include a roundness value of a section of the plurality of sections that is in contact with a contact portion of the substrate.
- the processor 200 may generate corrected thickness data by removing an error due to the roundness value of the contacted section from the coating thickness value indicated by the acquired thickness data.
- the data acquisition unit 100 may be configured to further acquire temperature data indicating the temperature of the coating roll.
- the data acquisition unit 100 may include a temperature sensor.
- the temperature sensor may be configured as a non-contact temperature sensor, such as an infrared temperature sensor.
- the processor 200 may correct the obtained thickness data based on correction data pre-stored in the target storage area and temperature data acquired by the data acquisition unit 100.
- the correction data pre-stored in the target storage area may include a data table recording roundness values by temperature of the section in contact with the contact portion of the substrate among a plurality of sections dividing the outer peripheral surface of the coating roll by position. You can.
- the processor 200 checks the roundness value of the section corresponding to the obtained temperature data in the data table previously stored in the target storage area, and corrects the obtained thickness data using the confirmed roundness value. can do. That is, the processor 200 can generate corrected thickness data by removing an error according to the confirmed roundness value from the coating thickness value indicated by the acquired thickness data.
- FIG. 2 shows a coating system 2 according to one embodiment of the present invention.
- the coating system 2 may include a coating thickness measuring device 10 and a coating device 20 according to the present invention.
- the coating thickness measuring device 10 may be configured to measure the thickness of the coating material applied to the substrate by the coating device 20.
- the coating device 20 includes a coating roll 22 that supports and transports the substrate, and a coater 24 that discharges a coating material in a slurry state onto the substrate supported by contact with the coating roll 22. can do.
- the coating thickness measuring device 10 may include a data acquisition unit 100 and a processor 200, as described with reference to FIG. 1 .
- the data acquisition unit 100 is a contact portion of the substrate that is in contact with the coating roll 22 among all substrates while the substrate to which the coating material is applied is supported and transported by the coating roll 22. It may be configured to obtain thickness data representing the thickness of the coating material applied to. To this end, the data acquisition unit 100 may include a sensing module 110 and a position adjustment module 120.
- the sensing module 110 may be configured to generate thickness data of the coating material by sensing the thickness of the coating material applied to the substrate.
- the sensing module 110 may include a thickness sensor.
- the thickness sensor may include a displacement sensor that measures the thickness of the coating material by irradiating light or a laser to the coating material and obtaining the reflected light or laser. This thickness sensor may be supported by being coupled to the housing (H) of the sensing module 110.
- the position adjustment module 120 may be configured to adjust the position of the sensing module 110. That is, the position adjustment module 120 adjusts the position of the sensing module 110, allowing the sensing module 110 to determine the thickness of the coating material applied to the contact portion of the substrate in contact with the coating roll 22. It can be sensed through a thickness sensor.
- the position adjustment module 120 may include a first movement unit 122 and a second movement unit 124. Depending on the embodiment, the position adjustment module 120 may further include a third movement unit 126.
- the first moving unit 122 may be configured to move the sensing module 110 along a first axis (eg, X-axis). To this end, the first moving unit 122 may include a first actuator 122a and a first support structure 122b moved in the first axis direction by the first actuator 122a.
- a first axis eg, X-axis
- the first moving unit 122 may include a first actuator 122a and a first support structure 122b moved in the first axis direction by the first actuator 122a.
- the second moving unit 124 may be configured to move the sensing module 110 along a second axis (eg, Z-axis) that intersects the first axis.
- the second moving unit 124 includes a second actuator 124a coupled to the first support structure 122b, and a second support unit moved in the second axis direction by the second actuator 124a. It may include a structure 124b.
- the sensing module 110 may be coupled to the second support structure 124b of the second moving unit 124.
- the third moving unit 126 may be configured to move the sensing module 110 along a third axis (eg, Y axis) that intersects the first axis and the second axis, respectively.
- the third moving unit 126 may include a guide rail 126a extending in the third axis direction and a base structure 126b configured to be movable along the guide rail 126a.
- the guide rail 126a of the third moving unit 126 may be coupled to and fixed to the outer surface of the coater 24. Additionally, the first actuator 122a of the first moving unit 122 may be coupled to the base structure 126b of the third moving unit 126.
- the coating thickness measuring device 10 may include a plurality of the data acquisition units 100 described above.
- the plurality of data acquisition units 100 may be arranged to be spaced apart from each other in the width direction (X-axis direction) of the substrate transported in the longitudinal direction by the coating roll 22. Additionally, the spacing between data acquisition units may be adjusted by the third mobile unit 126.
- the coating thickness measuring device 10 may further include a rotation detection module 400.
- the rotation detection module 400 may be configured to detect at least one of the rotation angle and rotation speed of the coating roll 22.
- the rotation detection module 400 may include a rotary encoder.
- This rotation detection module 400 detects the rotation angle or rotation speed of the coating roll 22, and detects the section that is in contact with the contact portion of the substrate to which the coating material is applied, among a plurality of sections forming the outer peripheral surface of the coating roll 22. can detect and generate section identification data that identifies the detected section.
- the rotation detection module 400 may provide the generated section identification data to the data acquisition unit 100.
- the data acquisition unit 100 may transmit thickness data of the coating material applied to the contact portion of the substrate and section identification data of the section in contact with the contact portion of the substrate to the processor 200.
- the data acquisition unit 100 may be configured to communicate with the processor 200 by wire or wirelessly.
- the processor 200 may select a target storage area corresponding to the section identification data from among a plurality of storage areas of the virtual memory zone and correct the thickness data based on correction data previously stored in the target storage area. .
- the processor 200 may optionally include a central processing unit (CPU), an application-specific integrated circuit (ASIC), a chipset, a logic circuit, a register, etc., to execute various control logics required in the present invention.
- the control logic executed by the processor 200 may be implemented as software, and the software may be stored in a memory built into the processor 200 or a memory located outside the processor 200.
- This processor 200 may be placed in the housing H of the data acquisition unit 100 or may be placed in a terminal located outside the data acquisition unit 100.
- the coating thickness measuring device 10 may be configured to perform a correction data acquisition procedure before a coating process on the substrate is performed.
- the data acquisition unit 100 acquires roundness data indicating the roundness value of each section of the coating roll 22 using a displacement sensor, and the roundness data of each section and Section identification data may be transmitted to the processor 200.
- the processor 200 may store the roundness data and section identification data transmitted from the data acquisition unit 100, separated by section, in a plurality of storage areas of the virtual memory zone.
- the coating thickness measuring device 10 may repeat the above-described correction data acquisition procedure while changing the temperature of the coating roll 22.
- the coating thickness measuring device 10 may further include a vibration measurement module 500.
- the vibration measurement module 500 may be configured to measure the natural frequency of vibration generated by the coating device 20.
- the vibration measurement module 500 may include a vibration sensor.
- the vibration measurement module 500 Based on the measured natural frequency, the vibration measurement module 500 generates correction data regarding the error for each section of the coating roll 22 caused by vibration and provides it to the data acquisition unit 100. . Then, the data acquisition unit 100 transmits the correction data regarding the error for each section to the processor 200, and the processor 200 stores the correction data for the error for each section in the plurality of virtual memory zones. It can be saved separately by section in the area.
- Figure 3 shows a coating thickness measuring device 10 of the coating system shown in Figure 2.
- the data acquisition unit 100 of the coating thickness measurement device 10 may include a sensing module 110 and a position adjustment module 120.
- the sensing module 110 can measure the coating thickness of a portion of the contact portion C1 of the substrate BM that is in contact with the outer peripheral surface of the coating roll 22.
- the sensing module 110 may include thickness sensors 112a and 112b.
- the thickness sensors 112a and 112b of the sensing module 110 may be configured as non-contact displacement sensors.
- the thickness sensors 112a and 112b may include a light applying unit 112a and a light obtaining unit 112b.
- the light applicator 112a may be configured to apply light or laser to the surface of the coating material (CM) applied to the base material (BM).
- the light applying unit 112a may include a light source provided inside the housing H and a lens that applies the light generated by this light source to the surface of the base material BM.
- the light applying unit 112a may be configured to apply light to the contact portion C1 of the entire substrate BM that is in contact with the coating roll 22.
- the portion of the substrate BM in contact with the coating roll 22 is a portion located to the left with respect to the vertical center line L1 of the coating roll 22, and among the portions, the coating thickness is measured.
- This contact portion (C1) is located above the horizontal center line (L2).
- the light acquisition unit 112b may be configured to obtain light applied by the light application unit 112a and reflected from the surface of the coating material CM.
- the light acquisition unit 112b may include a lens configured to collect reflected light or a laser, and a light receiving element such as a photo diode or a complementary metal-oxide semiconductor (CMOS).
- CMOS complementary metal-oxide semiconductor
- the light reflected from the surface of the coating material (CM) and passing through the light receiving lens may be received by a light receiving element disposed inside the housing (H) and converted into an electrical signal.
- the sensing module 110 may generate thickness data regarding the thickness of the coating material CM based on the light acquired by the light acquisition unit 112b.
- the sensing module 110 obtains a wavelength domain spectrum for the amplitude ratio or phase difference of the light received by the light receiving element, and performs fast Fourier transform on it to determine the thickness of the coating material (CM). The value can be calculated.
- the sensing module 110 measures the time of flight (TOF) of the light applied by the light applying unit 112a and acquired by the light acquiring unit 112b, and converts the measured TOF into a distance.
- the thickness value of the coating material (CM) can also be calculated.
- the thickness is measured on the part of the substrate that moves in the air between two rolls that transport the coated substrate, due to vibration of the equipment or differences in roundness between the rolls. There is a problem in that shaking occurs in the substrate, and as a result, it is difficult to accurately measure the coating thickness of the substrate.
- the coating thickness measuring device 10 measures the coating material (CM) applied to the portion of the substrate with minimal shaking among the entire substrate BM, that is, the contact portion of the substrate supported in contact with the coating roll 22. ) By being configured to measure the thickness, measurement errors caused by shaking of the substrate can be reduced and measurement accuracy can be improved.
- CM coating material
- the sensing module 110 is connected to the distal end A1 of the contact portion C1 with the minimum degree of curvature among the contact portions C1 of the base material BM supported by contact with the coating roll 22. , may be configured to measure the thickness of the coating material (CM). In this way, measurement accuracy can be further improved by measuring the coating thickness at the distal end (A1) of the contact portion (C1), which has minimal shaking and minimal curvature.
- CM coating material
- the sensing module 110 may further include a temperature sensor 114 that senses the temperature of the coating roll 22.
- This temperature sensor 114 may be configured as a non-contact temperature sensor such as an infrared temperature sensor.
- the processor 200 of the coating thickness measuring device 10 uses correction data pre-stored in a target storage area among the plurality of storage areas of the virtual memory zone and temperature data acquired through the temperature sensor 114. Based on this, the thickness data acquired by the data acquisition unit 100 can be corrected.
- the correction data pre-stored in the target storage area is data recording roundness values for each temperature of the section in contact with the portion to be measured for thickness of the substrate among a plurality of sections dividing the outer peripheral surface of the coating roll 22 by position.
- the processor 200 checks the roundness value of the section corresponding to the obtained temperature data in the data table previously stored in the target storage area, and corrects the obtained thickness data using the confirmed roundness value. can do.
- the coating thickness measuring device 10 may further include a coating detection module 116.
- the coating detection module 116 may be configured to detect the coating material (CM) applied to the substrate (BM).
- the coating detection module 116 may be configured to detect at least one of whether the coating material is applied, the application location, and the width of the applied coating material.
- the coating detection module 116 may include a photoelectric sensor.
- the sensing module 110 may be configured to start measuring the thickness of the coating material (CM) after the coating material (CM) is detected by the coating detection module 116.
- This coating detection module 116 may be placed in the housing (H) of the sensing module 110, or may be placed in the second support structure 124b of the second moving unit 124 that moves the sensing module 110. .
- the position adjustment module 120 may adjust the position of the sensing module 110 before the sensing module 110 senses the thickness of the coating material (CM). That is, the position adjustment module 120 adjusts the position of the sensing module 110, allowing the sensing module 110 to detect the coating applied to the contact portion of the substrate in contact with the coating roll 22 among the entire substrate BM. The thickness of the material (CM) can be sensed.
- the position adjustment module 120 may be configured to adjust the position of the sensing module 110 according to the result of sensing the coating material by the coating detection module 116.
- the position adjustment module 120 may include a first movement unit 122 and a second movement unit 124. Depending on the embodiment, the position adjustment module 120 may further include a third movement unit 126.
- the first movement unit 122 may move the sensing module 110 along a first axis (eg, X-axis). To this end, the first moving unit 122 may include a first actuator 122a and a first support structure 122b moved in the first axis direction by the first actuator 122a.
- a first axis eg, X-axis
- the first moving unit 122 may include a first actuator 122a and a first support structure 122b moved in the first axis direction by the first actuator 122a.
- the second moving unit 124 may move the sensing module 110 along a second axis (eg, Z-axis) that intersects the first axis.
- the second moving unit 124 includes a second actuator 124a coupled to the first support structure 122b, and a second support unit moved in the second axis direction by the second actuator 124a. It may include a structure 124b.
- the sensing module 110 may be coupled to the second support structure 124b of the second moving unit 124.
- the third movement unit 126 may move the sensing module 110 along a third axis (eg, Y axis) that intersects the first axis and the second axis, respectively.
- the third moving unit 126 may include a guide rail 126a extending in the third axis direction and a base structure 126b configured to be movable along the guide rail 126a.
- the guide rail 126a of the third moving unit 126 may be coupled to and fixed to the outer surface of the coater 24. Additionally, the first actuator 122a of the first moving unit 122 may be coupled to the base structure 126b of the third moving unit 126.
- the coating roll 22 of the coating device 20 has a cylindrical shape and can support and transport the base material BM in contact with its outer peripheral surface.
- the coater 24 of the coating device 20 can continuously apply the coating material (CM) to the surface of the base material (BM) supported by contacting the outer peripheral surface of the coating roll 22.
- the coater 24 may be implemented as a slot die coater that discharges the coating material (CM) in a slurry state through a slot.
- This coater 24 is disposed on one side of the coating roll 22 and can discharge the coating material (CM) toward the coating roll (R).
- the coater 24 may be disposed on the horizontal center line L2 of the coating roll 22, but is not limited to this.
- FIG 4 shows a cross-sectional view of a coating roll applicable to the coating system 2 according to the present invention.
- the cross section of the ideal coating roll (CR o ) has a perfect circular shape with the rotation center (C R ) of the coating roll (CR o ) as the center of the circle and the radius is R.
- the actual cross section of the coating roll (CR) is not a perfect circle, and each section of the coating roll (CR) has errors ( ⁇ R1, ⁇ R2) depending on the roundness. Therefore, when measuring the thickness of the coating material coated on the portion of the substrate that is in contact with the outer peripheral surface of the actual coating roll (CR), the measurement value includes an error due to roundness, thereby reducing the accuracy of the measurement value. Reliability decreases.
- the coating thickness measuring device 10 divides the outer peripheral surface of the coating roll into a plurality of sections, acquires in advance roundness data indicating the roundness value of each section, and obtains the obtained roundness data. Thickness data regarding the coating thickness obtained subsequently can be corrected using correction data including.
- Figure 5 shows an example of a virtual memory zone (Z1) created by the coating thickness measuring device according to the present invention.
- the virtual memory zone (Z1) may have a plurality of storage areas (M1, M2, M3, etc.).
- the plurality of storage areas may each correspond to a plurality of sections in which the outer peripheral surface of the coating roll 22 is divided according to the circumferential position. For example, if the outer peripheral surface of the coating roll 22 is divided into 100,000 sections, the virtual memory zone Z1 may have a storage area of 100,000 sections.
- correction data including the roundness value of the corresponding section may be stored in each storage area.
- FIG. 6 shows the correction data storage state of the virtual memory zone Z1 shown in FIG. 5.
- the roundness value (e.g., 3.8) of the first section among the plurality of sections dividing the outer peripheral surface of the coating roll 22 by position is one of the plurality of storage areas of the virtual memory zone Z1. It may be stored in the first storage area (M1).
- the roundness value (eg, 3.4) of the 50004th section among the plurality of sections may be stored in the 50004th storage area M50K4 among the plurality of storage areas of the virtual memory zone Z1.
- the roundness values for each section of the coating roll 22 may be stored separately for each section in a plurality of storage areas of the virtual memory zone Z1.
- Figure 7 shows an example of correction data stored in the storage area of the virtual memory zone.
- the correction data stored in each storage area of the virtual memory zone Z1 is a section corresponding to the storage area among a plurality of sections dividing the outer peripheral surface of the coating roll 22 by position. It may include a data table recording roundness values for each temperature.
- the data table stored in the first storage area of the virtual memory zone Z1 may include roundness values for each temperature of the section corresponding to the first storage area among the plurality of sections of the coating roll 22. .
- FIG. 8 shows the coating thickness measuring device 10 shown in FIG. 3 ready for measurement.
- the data acquisition unit 100 of the coating thickness measuring device 10 is used to measure the thickness of the coating material (CM) applied to the substrate (BM) by the coating device 20. , measurement preparation operations can be performed.
- the position adjustment module 120 of the data acquisition unit 100 adjusts the position of the sensing module 110 to allow the sensing module 110 to contact the coating roll 22 among the entire substrate BM.
- the thickness of the coating material (CM) applied to the contact portion (C1) of the substrate, particularly the distal end (A1) of the contact portion (C1), may be sensed.
- the position of the contact portion C1 or the distal end A1 of the contact portion C1 may change depending on the transport directions D1 and D2 of the base material BM.
- the first moving unit 122 of the position adjustment module 120 may move the sensing module 110 to the right along the X-axis and position it above the distal end A1 of the contact portion C1.
- the first moving unit 122 may include a first actuator 122a and a first support structure 122b moved in the X-axis direction by the first actuator 122a.
- the second moving unit 124 of the position adjustment module 120 moves the sensing module 110 downward along the Z axis to approach the distal end A1 of the contact portion C1.
- the second moving unit 124 includes a second actuator 124a coupled to the first support structure 122b, and a second support structure moved in the Z-axis direction by the second actuator 124a. It may include (124b).
- the sensing module 110 may be coupled to the second support structure 124b of the second moving unit 124.
- Figure 9 shows a coating thickness measuring device according to a modified embodiment of the present invention.
- the data acquisition unit 100A of the coating thickness measurement device adjusts the position of the sensing module 110, like the data acquisition unit 100 described above. It may include a module 120.
- the position adjustment module 120 of the data acquisition unit 100A may further include a rotation unit 128.
- This rotation unit 128 may further include a rotation unit 128 that rotates the sensing module 110 within a certain rotation angle range around a predetermined rotation axis.
- the rotation unit 128 may include a servomotor and a rotation axis that rotates the sensing module 110 by the driving force of the servomotor.
- the coating roll ( 22), the length of the contact portion (C1') of the substrate and the position of the distal end (A1') of the contact portion (C1') are different from those in FIG. 8. That is, the length of the contact portion C1' is reduced, and the distal end A1 of the contact portion C1 is located at a predetermined angle ⁇ in the counterclockwise direction from the vertical center line L1.
- Figure 10 shows the measurement preparation state of the coating thickness measuring device shown in Figure 9.
- the rotation unit 128 of the position adjustment module 120 rotates the sensing module 110 counterclockwise by a predetermined angle ⁇ to contact the contact portion C1 of the base material BM. '), the thickness direction of the coating material (CM) applied to the distal end (A1') and the sensing direction of the sensing module 110 may be matched.
- the coating thickness measuring device can be applied to coating systems of various structures and measures the thickness of the coating material applied to the substrate with a high level of accuracy regardless of the transport direction of the substrate. It can be measured.
- the coating thickness value measured for the contact portion of the substrate in contact with each section is, It includes errors depending on the roundness of the section.
- coating thickness values continuously measured through a displacement sensor exhibit large deviations from each other, even when the thickness of the coating material applied to the substrate is actually uniform.
- Figure 12 graphically shows corrected coating thickness values according to an embodiment of the present invention.
- the coating thickness values corrected according to an embodiment of the present invention do not include errors due to the temperature of the coating roll at the time of measurement and the roundness of each section, so there is a difference in the thickness of the actual coating material between each other. Only the deviation corresponding to is displayed.
- FIG. 13 shows a coating system 2 according to one embodiment of the present invention.
- the coating system 2 includes the above-described coating thickness measuring device 10 and the coating device 20, and according to the embodiment, the management server 30 ) may further be included.
- the management server 30 communicates with the coating thickness measuring device 10 and the coating device 20 through a communication network, and may be configured to manage the coating thickness measuring device 10 and the coating device 20.
- the communication network may include various types of wired or wireless networks such as Local Area Network (LAN), Wide Area Network (WAN), mobile radio communication network, Wireless Broadband Internet (Wibro), etc.
- the management server 30 may use thickness data provided by the coating thickness measuring device 10 to determine whether the coating device 20 is operating normally. If it is determined that the coating device 20 is operating abnormally, the management server 30 may generate an alarm through a display or speaker, or stop the coating device 20.
- the management server 30 displays thickness data provided from the coating thickness measurement device 10 through a display and transmits feedback information input by the manager to the coating thickness measurement device 10. It can be configured.
- the feedback information transmitted to the coating thickness measurement device 10 may include weight information for one or two or more of the factors of the correction data (e.g., temperature, roundness, vibration, etc.) used for correction of the thickness data. You can.
- the coating thickness measurement device 10 that receives the feedback information may reflect the weight information when correcting thickness data.
- This management server 30 may be implemented as a computer such as a desktop, laptop, or notebook, but is not limited thereto, and may be implemented as any type of computing device equipped with computing functions and communication functions. there is.
- Figure 14 shows a flowchart of a coating thickness measurement method according to an embodiment of the present invention.
- detailed operations of the coating thickness measuring device 10 described above will be described in chronological order with reference to FIG. 14 .
- the coating thickness measuring device 10 configured to measure the thickness of a coating material applied to a substrate, provides correction data used to correct the thickness data before a coating process on the substrate is performed. Obtain (S10).
- the data acquisition unit 100, 100A of the coating thickness measuring device 10 acquires roundness data indicating the roundness value of the corresponding section for each section of the coating roll 22 using a displacement sensor, and the Correction data including roundness data and section identification data may be transmitted to the processor 200.
- the processor 200 of the coating thickness measuring device 10 may create a virtual memory zone having a plurality of storage areas in which the correction data is distributed and stored.
- the processor 200 may create a virtual memory zone with a plurality of storage areas and store the correction data transmitted from the data acquisition unit 100 separately by section in the plurality of storage areas of the virtual memory zone. there is.
- the coating thickness measuring device 10 may repeat the above-described correction data acquisition procedure while changing the temperature of the coating roll 22.
- the data acquisition unit (100, 100A) of the coating thickness measuring device (10) is in contact with the coating roll (22) while the substrate to which the coating material is applied is transported by the coating roll (22).
- thickness data indicating the thickness of the coating material applied to the contact portion is obtained (S20).
- the position adjustment module 120 of the data acquisition unit 100 adjusts the position of the sensing module 110 of the data acquisition unit 100, 100A, allowing the sensing module 110 to
- the thickness of the coating material applied to the contact portion of the substrate in contact with the coating roll 22, particularly the distal end of the contact portion, may be sensed.
- the data acquisition unit 100, 100A may further acquire temperature data indicating the temperature of the coating roll 22 using the temperature sensor 114 while acquiring the thickness data (S30). .
- the processor 200 of the coating thickness measuring device 10 selects a target storage area from among the plurality of storage areas of the virtual memory zone and calculates the thickness data based on correction data previously stored in the target storage area. By correcting, corrected thickness data is generated (S40).
- the processor 200 may use the data acquisition unit 100 based on correction data pre-stored in a target storage area among the plurality of storage areas of the virtual memory zone and temperature data acquired through the temperature sensor 114. ) The thickness data obtained can be corrected.
- the correction data pre-stored in the target storage area is data recording roundness values for each temperature of the section in contact with the portion to be measured for thickness of the substrate among a plurality of sections dividing the outer peripheral surface of the coating roll 22 by position.
- the coating thickness measuring device 10 can output the corrected thickness data through a display or speaker, or transmit it to an external device such as a management server (S50).
- a management server S50
- the coating thickness measuring device 10 may repeat the above-described processes until the coating process is stopped (S60).
- the data acquisition unit determines the portion of the substrate that is in contact with the coating roll among the entire substrate, By being configured to acquire thickness data of the coating material applied to the portion, measurement errors caused by shaking of the substrate can be reduced, and the thickness of the coating material applied to the substrate can be measured with a high level of accuracy.
- the processor creates a virtual memory zone with a plurality of storage areas and corrects the thickness data acquired by the data acquisition unit based on correction data previously stored in a target storage area selected from the plurality of storage areas.
- the data acquisition unit is configured to further acquire temperature data indicating the temperature of the coating roll
- the processor is configured to correct the thickness data based on the temperature data and correction data pre-stored in the target storage area.
- the data acquisition unit includes a position adjustment module that adjusts the position of the sensing module along with a sensing module that senses the thickness of the coating material, so that the sensing position of the sensing module can be optimized and the size of the substrate to be measured , the position of the sensing module can be appropriately changed depending on the relative positions of the rolls transporting the measurement target material.
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Abstract
Description
Claims (15)
- 코팅 물질이 도포된 기재가 코팅 롤에 의해 이송되는 동안, 상기 코팅 롤에 접촉되는 상기 기재의 접촉 부분에 대하여, 해당 접촉 부분에 도포된 코팅 물질의 두께를 나타내는 두께 데이터를 획득하도록 구성된 데이터 획득부; 및보정 데이터들이 분산되어 저장된 복수의 저장 영역을 가진 가상 메모리 존을 생성하고, 상기 복수의 저장 영역 중에서 선택되는 타깃 저장 영역에 기 저장된 보정 데이터를 기반으로 상기 두께 데이터를 보정하여, 보정된 두께 데이터를 생성하도록 구성된 프로세서를 포함하는 코팅 두께 측정 장치.
- 제1항에 있어서,상기 데이터 획득부는, 상기 코팅 롤의 외주면을 복수의 섹션으로 구분하여, 상기 복수의 섹션 중 상기 기재의 접촉 부분과 접촉한 섹션을 식별하는 섹션 식별 데이터를 더 획득하도록 구성되고,상기 프로세서는, 상기 두께 데이터를 보정하기 전에, 상기 복수의 저장 영역 중 상기 섹션 식별 데이터에 대응하는 저장 영역을, 상기 타깃 저장 영역으로 선택하도록 구성된 것을 특징으로 하는 코팅 두께 측정 장치.
- 제2항에 있어서,상기 타깃 저장 영역에 기 저장된 보정 데이터는, 상기 기재의 접촉 부분과 접촉한 상기 섹션의 진원도 값을 포함하는 것을 특징으로 하는 코팅 두께 측정 장치.
- 제1항에 있어서,상기 데이터 획득부는, 상기 코팅 롤의 온도를 나타내는 온도 데이터를 더 획득하도록 구성되고,상기 프로세서는, 상기 타깃 저장 영역에 기 저장된 보정 데이터와, 상기 온도 데이터를 기반으로, 상기 두께 데이터를 보정하도록 구성된 것을 특징으로 하는 코팅 두께 측정 장치.
- 제4항에 있어서,상기 기 저장된 보정 데이터는, 상기 코팅 롤의 외주면을 위치별로 구분한 복수의 섹션 중 상기 기재의 접촉 부분과 접촉한 섹션의 온도별 진원도 값들을 기록한 데이터 테이블을 포함하는 것을 특징으로 하는 코팅 두께 측정 장치.
- 제1항에 있어서,상기 데이터 획득부는, 상기 두께 데이터를 획득하기 전에, 상기 코팅 롤의 외주면을 복수의 섹션으로 구분하여, 각각의 섹션별로 해당 섹션의 진원도를 나타내는 진원도 데이터를 획득하도록 구성되고,상기 프로세서는, 상기 데이터 획득부에 의해 섹션별로 획득된 진원도 데이터들을, 상기 복수의 저장 영역에 섹션별로 나누어 저장하도록 구성된 것을 특징으로 하는 코팅 두께 측정 장치.
- 제1항에 있어서,상기 데이터 획득부는,두께 센서를 구비한 센싱 모듈; 및상기 센싱 모듈의 위치를 조정하여, 상기 센싱 모듈로 하여금 상기 두께 센서를 통해 상기 기재의 접촉 부분에 도포된 코팅 물질의 두께를 센싱하여 상기 두께 데이터를 생성하도록 하는 위치 조정 모듈을 포함하는 것을 특징으로 하는 코팅 두께 측정 장치.
- 제7항에 있어서,상기 센싱 모듈은, 상기 코팅 롤의 온도를 센싱하는 온도 센서를 더 구비하고,상기 프로세서는, 상기 타깃 저장 영역에 기 저장된 보정 데이터와, 상기 온도 센서를 통해 획득된 온도 데이터를 기반으로, 상기 두께 데이터를 보정하도록 구성된 것을 특징으로 하는 코팅 두께 측정 장치.
- 제7항에 있어서,상기 위치 조정 모듈은,제1 축을 따라 상기 센싱 모듈을 이동시키는 제1 이동 유닛; 및상기 제1 축과 교차하는 제2 축을 따라 상기 센싱 모듈을 이동시키는 제2 이동 유닛을 포함하는 것을 특징으로 하는 코팅 두께 측정 장치.
- 제9항에 있어서,상기 위치 조정 모듈은, 상기 제1 축 및 상기 제2 축과 각각 교차하는 제3 축을 따라 상기 센싱 모듈을 이동시키는 제3 이동 유닛을 더 포함하는 것을 특징으로 하는 코팅 두께 측정 장치.
- 제9항에 있어서,상기 위치 조정 모듈은, 상기 센싱 모듈을 소정 회전축을 중심으로 일정 회전 각도 범위 내에서 회전시키는 회전 유닛을 더 포함하는 것을 특징으로 하는 코팅 두께 측정 장치.
- 제1항에 있어서,상기 데이터 획득부를 복수로 포함하고, 복수의 데이터 획득부는 상기 코팅 롤에 의해 길이 방향으로 이송되는 상기 기재의 폭 방향으로 상호 이격되어 배치되는 것을 특징으로 하는 코팅 두께 측정 장치.
- 기재에 도포된 코팅 물질의 두께를 측정하는 장치에 의해 수행되는 코팅 두께 측정 방법으로서,보정 데이터들이 분산되어 저장된 복수의 저장 영역을 가진 가상 메모리 존을 생성하는 단계;코팅 물질이 도포된 기재가 코팅 롤에 의해 이송되는 동안, 상기 코팅 롤에 접촉되는 상기 기재의 접촉 부분에 대하여, 해당 접촉 부분에 도포된 코팅 물질의 두께를 나타내는 두께 데이터를 획득하는 단계; 및상기 복수의 저장 영역 중에서 선택되는 타깃 저장 영역에 기 저장된 보정 데이터를 기반으로 상기 두께 데이터를 보정하여, 보정된 두께 데이터를 생성하는 단계를 포함하는 코팅 두께 측정 방법.
- 제13항에 있어서,상기 보정된 두께 데이터를 생성하는 단계 전에, 상기 코팅 롤의 온도를 나타내는 온도 데이터를 획득하는 단계를 더 포함하고,상기 보정된 두께 데이터를 생성하는 단계는, 상기 타깃 저장 영역에 기 저장된 보정 데이터와, 상기 온도 데이터를 기반으로, 상기 두께 데이터를 보정하는 단계를 포함하는 것을 특징으로 하는 코팅 두께 측정 방법.
- 제14항에 있어서,상기 기 저장된 보정 데이터는, 상기 코팅 롤의 외주면을 위치별로 구분한 복수의 섹션 중 상기 기재의 접촉 부분과 접촉한 섹션의 온도별 진원도 값들을 기록한 데이터 테이블을 포함하는 것을 특징으로 하는 코팅 두께 측정 방법.
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
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CN202380011936.1A CN117396723A (zh) | 2022-04-29 | 2023-04-25 | 涂覆厚度测量设备及方法 |
EP23796768.2A EP4332498A1 (en) | 2022-04-29 | 2023-04-25 | Coating thickness measurement apparatus and method |
CA3222112A CA3222112A1 (en) | 2022-04-29 | 2023-04-25 | Coating thickness meaesuring apparatus and method |
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KR10-2023-0051593 | 2023-04-19 | ||
KR1020230051593A KR20230153933A (ko) | 2022-04-29 | 2023-04-19 | 코팅 두께 측정 장치 및 방법 |
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JPH0831158B2 (ja) * | 1987-07-02 | 1996-03-27 | 株式会社東芝 | 紙葉類の厚さ検知装置 |
JPH11276959A (ja) * | 1998-03-30 | 1999-10-12 | Nitto Denko Corp | 塗膜厚みの制御装置 |
KR101185003B1 (ko) * | 2012-03-21 | 2012-10-02 | (주)대흥정밀산업 | 도막두께 측정장치 |
KR20130090342A (ko) * | 2012-02-03 | 2013-08-13 | 요코가와 덴키 가부시키가이샤 | 코팅 치수 측정 장치 |
KR101810025B1 (ko) * | 2016-04-14 | 2017-12-18 | 씨아이에스(주) | 이차전지용 전극의 코팅부 두께 측정방법 |
KR20220053732A (ko) | 2020-10-22 | 2022-05-02 | 주식회사 대오정공 | 승강기 스윙도어용 잠금장치 |
KR20220053733A (ko) | 2020-10-22 | 2022-05-02 | 삼성전자주식회사 | 반도체 메모리 장치, 이를 포함하는 전자 시스템 및 이의 제조 방법 |
KR20230051593A (ko) | 2020-10-20 | 2023-04-18 | 만다 핫꼬 가부시기가이샤 | 발효 조성물 |
-
2023
- 2023-04-25 CA CA3222112A patent/CA3222112A1/en active Pending
- 2023-04-25 EP EP23796768.2A patent/EP4332498A1/en active Pending
- 2023-04-25 WO PCT/KR2023/005629 patent/WO2023211123A1/ko active Application Filing
Patent Citations (8)
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JPH0831158B2 (ja) * | 1987-07-02 | 1996-03-27 | 株式会社東芝 | 紙葉類の厚さ検知装置 |
JPH11276959A (ja) * | 1998-03-30 | 1999-10-12 | Nitto Denko Corp | 塗膜厚みの制御装置 |
KR20130090342A (ko) * | 2012-02-03 | 2013-08-13 | 요코가와 덴키 가부시키가이샤 | 코팅 치수 측정 장치 |
KR101185003B1 (ko) * | 2012-03-21 | 2012-10-02 | (주)대흥정밀산업 | 도막두께 측정장치 |
KR101810025B1 (ko) * | 2016-04-14 | 2017-12-18 | 씨아이에스(주) | 이차전지용 전극의 코팅부 두께 측정방법 |
KR20230051593A (ko) | 2020-10-20 | 2023-04-18 | 만다 핫꼬 가부시기가이샤 | 발효 조성물 |
KR20220053732A (ko) | 2020-10-22 | 2022-05-02 | 주식회사 대오정공 | 승강기 스윙도어용 잠금장치 |
KR20220053733A (ko) | 2020-10-22 | 2022-05-02 | 삼성전자주식회사 | 반도체 메모리 장치, 이를 포함하는 전자 시스템 및 이의 제조 방법 |
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CA3222112A1 (en) | 2023-11-02 |
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