WO2023008143A1 - 塗装欠陥の基準サンプル及びその製造方法 - Google Patents
塗装欠陥の基準サンプル及びその製造方法 Download PDFInfo
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- WO2023008143A1 WO2023008143A1 PCT/JP2022/027087 JP2022027087W WO2023008143A1 WO 2023008143 A1 WO2023008143 A1 WO 2023008143A1 JP 2022027087 W JP2022027087 W JP 2022027087W WO 2023008143 A1 WO2023008143 A1 WO 2023008143A1
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- Prior art keywords
- defect
- pseudo
- coating
- reference sample
- pseudo defect
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- 230000007547 defect Effects 0.000 title claims abstract description 239
- 239000011248 coating agent Substances 0.000 title claims abstract description 77
- 238000000576 coating method Methods 0.000 title claims abstract description 77
- 239000013074 reference sample Substances 0.000 title claims abstract description 47
- 238000004519 manufacturing process Methods 0.000 title claims description 23
- 239000000758 substrate Substances 0.000 claims abstract description 55
- 238000011156 evaluation Methods 0.000 claims description 27
- 239000003973 paint Substances 0.000 claims description 17
- 230000002093 peripheral effect Effects 0.000 claims description 13
- 238000003754 machining Methods 0.000 claims description 10
- 239000011347 resin Substances 0.000 claims description 10
- 229920005989 resin Polymers 0.000 claims description 10
- 238000000034 method Methods 0.000 claims description 9
- 238000010422 painting Methods 0.000 claims description 7
- 238000012545 processing Methods 0.000 claims description 5
- 238000000465 moulding Methods 0.000 claims description 3
- 230000002950 deficient Effects 0.000 claims description 2
- 239000011247 coating layer Substances 0.000 abstract description 6
- 239000010410 layer Substances 0.000 description 27
- 230000000007 visual effect Effects 0.000 description 11
- 239000002987 primer (paints) Substances 0.000 description 5
- 241000207199 Citrus Species 0.000 description 4
- 235000020971 citrus fruits Nutrition 0.000 description 4
- 238000013461 design Methods 0.000 description 3
- 239000002184 metal Substances 0.000 description 3
- 239000000523 sample Substances 0.000 description 3
- 239000004065 semiconductor Substances 0.000 description 3
- 239000000428 dust Substances 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 239000000126 substance Substances 0.000 description 2
- 238000013459 approach Methods 0.000 description 1
- 238000005266 casting Methods 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000004070 electrodeposition Methods 0.000 description 1
- 238000007667 floating Methods 0.000 description 1
- 238000001746 injection moulding Methods 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 238000003908 quality control method Methods 0.000 description 1
- 210000002374 sebum Anatomy 0.000 description 1
- 238000011179 visual inspection Methods 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/8422—Investigating thin films, e.g. matrix isolation method
Definitions
- the present invention relates to a standard sample of coating defects used for evaluating the size of convex and/or concave coating defects on the coating surface of products such as automobiles, and a method of manufacturing the same.
- the acceptable product limit for convex and concave paint defects is often defined by the size of the defect diameter when visually observed.
- foreign substances such as machine dust and human sebum are generated to some extent. Due to these foreign substances, certain convex and concave defects occur in the production process.
- the size of the coating defect diameter is determined by the size of the foreign matter, the amount of oil adhered, the viscosity of the paint, etc., and is widely distributed in the range of about 0.2 mm to 2.0 mm.
- the paint defects thus generated are inspected according to quality standards according to the grade of the product, and defects larger than the standard are repaired.
- Patent Document 1 the depth and width of the scratch are quantitatively inspected and fed back to the semiconductor device manufacturing process to improve the yield of the product.
- a technique is disclosed for quantifying the depth and width of a scratch using a standard sample of a pseudo machining mark to calibrate the scratch detection capability of a scattered light detector for semiconductor inspection.
- the convex and concave shapes of the painted surface have a three-dimensional shape, and the appearance depends on the tilt angle of the defect and the lighting. For this reason, the dot gauge was not sufficient for proper evaluation.
- Patent Document 1 is for evaluation of scratches that occur in the semiconductor device manufacturing process, and could not be applied to evaluation of coating defects.
- This invention has been made in view of such a technical background, and is intended to properly evaluate the size of convex or concave coating defects on the coating surface of products subject to defect evaluation.
- the purpose is to provide a reference sample of coating defects that can be produced and a manufacturing method thereof.
- a coating film layer is formed by covering at least the pseudo defect portion and its peripheral portion of a substrate having one or more pseudo defect portions with convex and/or concave shapes formed on the surface.
- Reference sample for paint defects (2) The coating defect reference sample according to the preceding item 1, wherein the coating film layer is formed of the same paint as the paint used for the defect evaluation target product.
- a reference sample of the described paint defects (5) Among the plurality of pseudo defect parts, at least one of the diameter, height and / or depth in plan view, and the inclination angle of the coating defect according to the preceding item 4, which changes in a geometric progression reference sample. (6) The reference sample of the coating defect according to any one of the preceding items 1 to 5, wherein the defect area of the pseudo defect is determined based on the inclination angle in the cross section of the pseudo defect. (7) In the cross section of the convex pseudo defect portion, the portion where the inclination angle is 0.5 degrees as a boundary is defined as the defect region, and in the cross section of the concave pseudo defect portion, the inclination angle is 7.
- coating at least the pseudo defect portion and its peripheral portion of the substrate is applied. How to prepare the reference sample.
- the coating defect according to the preceding item 9 which processes the pseudo defect portion by moving the tool linearly and moving it in a direction parallel to the previous movement direction when transitioning to the next processing position. How to prepare the reference sample.
- the reference sample of the coating defect is a substrate having one or more pseudo defect portions having a convex shape and/or a concave shape formed on the surface. Since the coating film layer is formed by covering the peripheral part, the pseudo-defective part covered with the coating film layer does not have a convex shape on the surface of the product to be evaluated for defects, such as a painted product. It looks like a concave painting defect, and the size of the painting defect on the product to be evaluated can be easily and properly evaluated by comparing it with a reference sample of the painting defect.
- the coating film layer is formed of the same paint as the paint used for the defect evaluation target product, so the size of the coating defect etc. of the defect evaluation target product can be determined more accurately. can be evaluated.
- the color of the coating film layer is the same as the color of the paint used for the defect evaluation target product, so the size of the coating defect of the defect evaluation target product can be determined more accurately. can be evaluated.
- the pseudo defect portion includes a plurality of pseudo defect portions differing in at least one of diameter, height and/or depth, and angle of inclination in plan view. Therefore, even if the sizes of the coating defects of the defect evaluation object are various, they can be evaluated with one standard sample of the coating defects.
- At least one of the diameter, height and/or depth in plan view, and angle of inclination changes geometrically between the plurality of pseudo defect portions. Therefore, it is possible to easily distinguish the difference between a plurality of pseudo-defective parts by human visual observation. Therefore, by comparing with the pseudo-defective parts, it is possible to accurately evaluate the size of the coating defect, etc. of the product to be evaluated for defects. can be done.
- the defect area of the pseudo defect is determined based on the inclination angle in the cross section of the pseudo defect, so the size of the pseudo defect is adjusted to the human visual reference. be able to.
- the portion where the inclination angle is 0.5 degrees as a boundary is the defect region, and the concave pseudo defect In the section of the part, since the recessed part with an absolute value of 0.5 degrees as the boundary is defined as the defect area, the size of the pseudo defect part can be accurately adjusted to the human visual reference.
- the substrate having one or more convex and/or concave pseudo defect portions formed on the surface is coated with at least the pseudo defect portion and its peripheral portion. , a reference sample of coating defects with a coating layer formed can be produced.
- the pseudo defect portion can be easily formed by machining the substrate.
- the pseudo defect portion is machined by moving the tool so that the movement direction thereof is linear and parallel, so that the pseudo defect portion is machined without leaving a machining trace.
- the boundary portion between the pseudo defect portion and the peripheral portion can be processed smoothly.
- resin molding is performed using a mold having one or more recesses and/or protrusions for forming pseudo defects on the surface, so that the surface has a convex shape and/or It is possible to manufacture a substrate made of resin on which one or more recessed pseudo defect portions are formed.
- FIG. 1 is a plan view of a substrate used as a reference sample for coating defects according to one embodiment of the present invention
- (B) is a plan view of one pseudo defect portion similarly formed on the substrate
- (C) is a cross-sectional view of one pseudo defect.
- (A) is a cross-sectional view of the substrate of FIG. 1(A) cut along line IIA-IIA
- (B) is a cross-sectional view of the same cut along line IIB-IIB.
- FIG. 2 is a cross-sectional view of a reference sample of a coating defect according to one embodiment of the present invention using the substrate of FIG.
- FIG. 1 is a plan view of a substrate used as a reference sample for coating defects according to another embodiment of the present invention
- (B) is a plan view of one pseudo defect portion similarly formed on the substrate
- (C ) is a cross-sectional view of one pseudo defect.
- 4A is a cross-sectional view of the substrate of FIG. 4A cut along line IIA-IIA
- FIG. 4B is a cross-sectional view of the same cut along line IIB-IIB.
- FIG. 5 is a cross-sectional view of a reference sample of coating defects according to another embodiment of the present invention using the substrate of FIG. 4
- (A) and (B) are diagrams for explaining one method of manufacturing a substrate.
- (A) is a graph showing the contour of a longitudinal section of a certain convex defect
- FIG. 1A is a plan view of a substrate 10 used as a reference sample for coating defects according to one embodiment of the present invention (hereinafter also simply referred to as a reference sample), and FIG. 3C is a plan view of one pseudo defect portion 11, and (C) is a cross-sectional view of one pseudo defect portion 11.
- FIG. 1A is a plan view of a substrate 10 used as a reference sample for coating defects according to one embodiment of the present invention (hereinafter also simply referred to as a reference sample)
- FIG. 3C is a plan view of one pseudo defect portion 11
- (C) is a cross-sectional view of one pseudo defect portion 11.
- FIG. 1A is a plan view of a substrate 10 used as a reference sample for coating defects according to one embodiment of the present invention (hereinafter also simply referred to as a reference sample)
- FIG. 3C is a plan view of one pseudo defect portion 11
- (C) is a cross-sectional view of one pseudo defect portion 11.
- the substrate 10 shown in FIG. 1 has a thickness of about 2 mm, for example, and on one side of the substrate 10, a plurality of protruding pseudo defect portions 11 are formed integrally with the substrate 10 and aligned with intervals in the vertical and horizontal directions.
- the pseudo defect portion 11 is formed in a truncated cone shape having a bottom diameter (lower diameter) D1 larger than a top diameter (upper diameter) D2, as shown in FIGS.
- the shape of the convex portion of the pseudo defect portion 11 is not limited to a truncated cone shape, and may be a conical shape, a cylindrical shape, a truncated pyramid shape, a pyramid shape, a prism shape, etc., but the defect evaluation is performed.
- a truncated conical shape which looks more like a convex coating defect of a defect evaluation target product such as an automobile, is desirable.
- FIG. 2(A) is a cross-sectional view of the substrate 10 of FIG. 1(A) taken along line IIA-IIA
- FIG. 2(B) is a cross-sectional view taken along line IIB-IIB.
- pseudo defect portions 11 for example, pseudo defect portions 11a1, 11a2, 11a3 .
- the diameter D1 and the upper diameter D2 increase from the tip side (upper side in FIG. 1A) to the terminal side (lower side in FIG. 1A) of the row, respectively, but the maximum height of the pseudo defect portion 11
- the height H is constant.
- the pseudo defect portions 11 for example, pseudo defect portions 11a1, 11b1, 11c1 .
- the height H of the pseudo defect portion increases from the tip (left side in FIG. 1A) to the end (right side in FIG. 1A) of the row.
- Table 1 shows an example of the dimensions of the lower diameter D1, the upper diameter D2 and the height H of the pseudo defect portion 11.
- 1 to 8 are row numbers, and are assigned in order starting from 1 from the upper side to the lower side of FIG. 1(A).
- a to e are symbols of columns, and are assigned in order from a to the right from the left side of FIG. 1(A).
- the lower diameter D1 and the upper diameter D2 of the pseudo defect portions 11 in columns and the maximum height H of the pseudo defect portions 11 in rows all change in a geometric progression.
- the difference between the pseudo defect portions 11 can be easily distinguished by human visual observation.
- the size of the convex coating defect occurring on the surface of the defect evaluation target product can be determined with high accuracy. can be evaluated.
- At least one of the lower diameter D1, the upper diameter D2, and the maximum height H may be changed geometrically.
- the inclination angle of the slope of the pseudo defect portion 11 may be changed geometrically.
- the surface of the substrate 10 shown in FIGS. 1 and 2 on which the pseudo defect portion 11 is formed is coated over the entire surface, and as shown in FIG. 12 are formed.
- the coating film layer 12 has a three-layer structure consisting of a primer layer 12a, a base layer 12b, and a clear layer 12c in order from the substrate 10 side.
- the coating layer 12 is formed under the same coating conditions as the defect-evaluation target product in terms of making it look the same as the defect-evaluation target product and allowing highly accurate defect evaluation. Specifically, it is desirable that the paint used, layer structure, color, thickness, etc. are the same as those of the product to be evaluated for defects.
- the coating film layer 12 does not have to be formed on the entire surface of the substrate 10, and may be formed at least on the pseudo defect portion 11 and its peripheral portion. should be formed in
- FIG. 4A is a plan view of a substrate 20 in a reference sample 1 according to another embodiment of the invention
- (B) is a plan view of one pseudo defect portion 21 similarly formed on the substrate 20,
- (C) is a cross-sectional view of one pseudo defect portion 21.
- the substrate 20 shown in FIG. 4 has a thickness of about 2 mm, for example, and on one side of the substrate 20, a plurality of concave pseudo defect portions 21 are formed integrally with the substrate 20 and aligned with intervals in the vertical and horizontal directions.
- the pseudo defect portion 21 is formed as an inverted truncated conical concave portion having an upper diameter (D3) larger than a lower diameter (D4).
- the concave shape of the pseudo defect portion 21 is not limited to the inverted truncated cone shape, and may be an inverted truncated cone shape, a cylindrical shape, an inverted truncated pyramid shape, an inverted pyramid shape, a prism shape, etc.
- the defect evaluation An inverted frusto-conical shape is desirable, which is more similar in appearance to the concave coating defect of the target product.
- FIG. 5(A) is a cross-sectional view of the substrate 21 of FIG. 4(A) cut along the VA-VA line
- FIG. 5(B) is a cross-sectional view of the same cut along the VB-VB line.
- pseudo defect portions 21 for example, pseudo defect portions 21a1, 21a2, 21a3 .
- the diameter D3 and the lower diameter D4 increase from the tip end side (upper side of FIG. 4A) to the end side (lower side of FIG. 4A) of the row, respectively.
- the height D5 is constant.
- pseudo defect portions 21 for example, pseudo defect portions 21a1, 21b1, 21c1, .
- the lower diameter D4 is constant, the depth D5 of the pseudo defect portion 21 increases from the tip (left side in FIG. 4A) to the end (right side in FIG. 4A) of the row.
- Table 2 shows an example of the dimensions of the upper diameter D3, the lower diameter D4 and the depth D5 of the pseudo defect portion 21.
- 1 to 8 are row numbers, which are assigned in order starting from 1 from the upper side to the lower side of FIG. 4(A).
- a to e are symbols of columns, and are assigned in order starting from a from the left side to the right side of FIG. 4(A).
- the upper diameter D3, the lower diameter D4, and the maximum depth D5 of the row of pseudo defect portions 21 in columns all change in a geometrical progression.
- the difference between the pseudo defect portions 21 can be easily distinguished by human visual observation.
- the size of the concave coating defect that occurred on the surface of the defect evaluation target product was evaluated with high accuracy. can do.
- At least one of the upper diameter D3, the lower diameter D4, and the maximum depth D5 may be changed geometrically.
- the inclination angle of the slope of the pseudo defect portion 21 may be changed geometrically.
- the coating film layer 22 has a three-layer structure of a primer layer 22a, a base layer 22b, and a clear layer 22c in order from the substrate 20 side.
- the coating layer 22 is preferably formed under the same coating conditions as the defect evaluation target product, and the paint used, layer structure, color, and thickness are also the same as those of the defect evaluation target product. 20 need not be formed on the entire surface, but should be formed at least on the pseudo defect portion 21 and its peripheral portion. are the same.
- the reference sample 1 having only the convex pseudo defect portion 11 and the reference sample 1 having only the concave pseudo defect portion 21 are shown, the convex pseudo defect portion 11 and the concave pseudo defect portion 21 are shown.
- the reference sample 1 may be a mixture of .
- the substrates 10, 20 are manufactured on the surface of which one or more pseudo defect portions 11, 21 having a convex shape and/or a concave shape are formed.
- a method of forming the defect portions 11 and 21 to form the substrates 10 and 20 can be mentioned.
- 7A and 7B show the case of forming a convex pseudo defect portion 11, but the same applies to the case of having a concave pseudo defect portion 21.
- FIG. The substrate material 5 may be metal or resin.
- a region 4 indicated by a dashed line in FIG. 7(B) indicates a portion removed by machining.
- the tool 3 when machining at least the pseudo defect portions 11 and 21 and their peripheral portions, the tool 3 is moved linearly as indicated by arrow F in FIG. 7(A). Further, the tool 3 is made to make a U-turn at the end of the substrate material 5 which does not affect the pseudo defect portions 11 and 21, and when the next processing position is reached, the tool 3 is moved in a direction parallel to the previous moving direction. By moving the tool 3 linearly and in parallel in this manner, the pseudo defect portions 11 and 21 that are clean even when painted without leaving any characteristic processing marks near the boundary between the pseudo defect portions 11 and 21 and the peripheral portion. It becomes the reference sample 1 for coating defects having.
- the tool 3 is moved in a circular shape around the convex or concave shape, and the tool moves linearly when leaving the convex or concave shape. move 3.
- Such a way of moving is a desirable technique for reducing the shape error of convex and concave shapes.
- the joints between the pseudo defect portions 11 and 21 and the peripheral portion are important, and if the moving directions of the tool 3 intersect at this portion, machining traces are likely to occur. Movement of the tool 3 is suitable.
- Another method for manufacturing the substrates 10 and 20 is a method for manufacturing a resin substrate using a mold. That is, a metal base plate having concave portions corresponding to the convex pseudo defect portions 11 and convex portions corresponding to the concave pseudo defect portions 21 is manufactured, and using this base plate as a mold, vacuum casting or injection molding is performed. , resin substrates 10 and 20 having a protruding pseudo defect portion 11 and a concave pseudo defect portion 21 are produced. According to this method, a large number of resin substrates 10 and 20 and a large number of reference samples 1 can be produced efficiently.
- a primer coating, a base coating, and a clear coating were sequentially applied to the substrates 10 and 20 thus produced on the side having the pseudo defect portions 11 and 21, and the reference sample 1 coated with the coating layers 12 and 22 and do.
- electrodeposition coating is performed before the primer coating.
- FIG. 8 shows the inclination angle determined by defining the recessed portion as the boundary as the defect area.
- FIG. 8(A) is a graph showing the contour of a longitudinal section of a convex defect
- FIG. 8(B) shows the inclination angle (also referred to as inclination) of each part of the contour of FIG. 8(A). is a graph.
- the absolute value of the inclination is set to 0.5 degree (“degree” is indicated by “deg” in the figure) as a reference, and the protruding range is defined as the defect area.
- the diameter of the defect is approximately 0.9 mm.
- FIG. 9 is a graph showing a comparison between the size of the defect according to the above definition and the size of the defect based on visual inspection, and the vertical axis represents the absolute value of the slope of 0.5 degrees ( ⁇ 0.5 degrees).
- the size of the defect when defined is shown on the horizontal axis, and the size of the defect on the visual basis is shown on the horizontal axis.
- FIG. 10 is a graph showing changes in the degree of matching with the visual reference when the slope is varied from ⁇ 0.2 deg to ⁇ 2 deg, where the vertical axis represents the degree of matching and the horizontal axis represents the slope. . From the graph of FIG. 10, it can be said that the correlation with visual observation is highest when the gradient is 0.5 deg, and the correlation with visual observation is relatively high when the gradient is in the range of ⁇ 0.3 deg to ⁇ 1.0 deg.
- FIGS. 8 to 10 are the same for concave defects.
- the defect area of the pseudo defect portions 11 and 21 is determined based on the inclination angle in the cross section of the pseudo defect portions 11 and 21. It is desirable in that it can be matched.
- the portion where the inclination is 0.5 degrees as a boundary is defined as the defect region
- the inclination angle is the absolute value
- the absolute value is not 0.5 degrees, but the absolute value is 0.3 to 1.0 deg as a boundary. You may define whether it is a region or not.
- citrus peel occurs as an unavoidable noise in manufacturing. For this reason, it is desirable to generate citrus peel on the surface of the coating film layer of the reference sample 1 as well, because the coating defect of the defect evaluation target product can be reproduced with higher accuracy. In this case, it is desirable that the inclination angle of the citrus peel be larger than half the inclination angle of the pseudo defect portions 11 and 21, similarly to the citrus peel of the product to be evaluated for defects.
- the reference sample 1 includes at least pseudo defects of the substrates 10 and 20 on which one or more pseudo defect portions 11 and 21 having a convex shape and/or a concave shape are formed. Since the coating film layers 12 and 22 are formed by covering the parts 11 and 21 and their peripheral parts, the pseudo defect parts 11 and 21 covered with the coating film layer 22 are not covered by the painted product or the like. It looks like a convex or concave painting defect on the surface of the defect evaluation product, and it is easy and appropriate to compare the size of the coating defect of the defect evaluation product with the reference sample 1. can be evaluated to
- the present invention can be used, for example, to evaluate the size of convex and/or concave coating defects on the coating surface of products such as automobiles.
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Abstract
Description
(1)表面に凸形状及び/または凹形状の1個または複数個の疑似欠陥部が形成された基板の少なくとも前記疑似欠陥部とその周辺部を被覆して、塗膜層が形成されている塗装欠陥の基準サンプル。
(2)前記塗膜層は、欠陥評価対象品に用いられる塗料と同じ塗料によって形成されている前項1に記載の塗装欠陥の基準サンプル。
(3)前記塗膜層の色は、欠陥評価対象品に用いられる塗料の色と同じである前項1に記載の塗装欠陥の基準サンプル。
(4)前記疑似欠陥部には、平面視での径、高さ及び/または深さ、傾斜角の少なくとも1つが異なる複数個の疑似欠陥部が含まれている前項1~3のいずれかに記載の塗装欠陥の基準サンプル。
(5)複数の疑似欠陥部の間で、平面視での径、高さ及び/または深さ、傾斜角の少なくとも1つが、等比級数的に変化している前項4に記載の塗装欠陥の基準サンプル。
(6)前記疑似欠陥部の断面における傾斜角度を基準にして、疑似欠陥部の欠陥領域が決定される前項1~5のいずれかに記載の塗装欠陥の基準サンプル。
(7)凸形状の前記疑似欠陥部の断面において、傾斜角度が絶対値で0.5度を境として突出している部分を欠陥領域とし、凹形状の前記疑似欠陥部の断面において、傾斜角度が絶対値で0.5度を境として凹んでいる部分を欠陥領域とする前項6に記載の塗装欠陥の基準サンプル。
(8)表面に凸形状及び/または凹形状の1個または複数個の疑似欠陥部を形成した基板を製作した後、前記基板の少なくとも前記疑似欠陥部とその周辺部に塗装を施す塗装欠陥の基準サンプルの製造方法。
(9)基板を機械加工することにより前記疑似欠陥部を形成する前項8に記載の塗装欠陥の基準サンプルの製造方法。
(10)工具を直線的に移動させるとともに、次の加工位置に遷移したときは前回の移動方向と平行な方向に移動させることにより、前記疑似欠陥部を加工する前項9に記載の塗装欠陥の基準サンプルの製造方法。
(11)表面に1個または複数個の疑似欠陥形成用の凹部及び/または凸部を有する型を用いて樹脂成型することにより、表面に凸形状及び/または凹形状の1個または複数個の疑似欠陥部を形成した樹脂製の基板を製作する前項8に記載の塗装欠陥の基準サンプルの製造方法。
10、20 基板
11(11a1~11a3、11b1、11c1) 凸形状の疑似欠陥部
21(21a1~21a3、21b1、21c1) 凹形状の疑似欠陥部
3 工具
4 加工部
12、22 塗膜層
12a、22a プライマー層
12b、22b ベース層
12c、22c クリア層
Claims (11)
- 表面に凸形状及び/または凹形状の1個または複数個の疑似欠陥部が形成された基板の少なくとも前記疑似欠陥部とその周辺部を被覆して、塗膜層が形成されている塗装欠陥の基準サンプル。
- 前記塗膜層は、欠陥評価対象品に用いられる塗料と同じ塗料によって形成されている請求項1に記載の塗装欠陥の基準サンプル。
- 前記塗膜層の色は、欠陥評価対象品に用いられる塗料の色と同じである請求項1に記載の塗装欠陥の基準サンプル。
- 前記疑似欠陥部には、平面視での径、高さ及び/または深さ、傾斜角の少なくとも1つが異なる複数個の疑似欠陥部が含まれている請求項1~3のいずれかに記載の塗装欠陥の基準サンプル。
- 複数の疑似欠陥部の間で、平面視での径、高さ及び/または深さ、傾斜角の少なくとも1つが、等比級数的に変化している請求項4に記載の塗装欠陥の基準サンプル。
- 前記疑似欠陥部の断面における傾斜角度を基準にして、疑似欠陥部の欠陥領域が決定される請求項1~5のいずれかに記載の塗装欠陥の基準サンプル。
- 凸形状の前記疑似欠陥部の断面において、傾斜角度が絶対値で0.5度を境として突出している部分を欠陥領域とし、凹形状の前記疑似欠陥部の断面において、傾斜角度が絶対値で0.5度を境として凹んでいる部分を欠陥領域とする請求項6に記載の塗装欠陥の基準サンプル。
- 表面に凸形状及び/または凹形状の1個または複数個の疑似欠陥部を形成した基板を製作した後、前記基板の少なくとも前記疑似欠陥部とその周辺部に塗装を施す塗装欠陥の基準サンプルの製造方法。
- 基板を機械加工することにより前記疑似欠陥部を形成する請求項8に記載の塗装欠陥の基準サンプルの製造方法。
- 工具を直線的に移動させるとともに、次の加工位置に遷移したときは前回の移動方向と平行な方向に移動させることにより、前記疑似欠陥部を加工する請求項9に記載の塗装欠陥の基準サンプルの製造方法。
- 表面に1個または複数個の疑似欠陥形成用の凹部及び/または凸部を有する型を用いて樹脂成型することにより、表面に凸形状及び/または凹形状の1個または複数個の疑似欠陥部を形成した樹脂製の基板を製作する請求項8に記載の塗装欠陥の基準サンプルの製造方法。
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Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH07146247A (ja) * | 1993-11-25 | 1995-06-06 | Sanyo Electric Co Ltd | 異物検査装置の検査対象物及びその製造方法 |
JPH1164239A (ja) * | 1997-08-26 | 1999-03-05 | Nec Corp | 異物検出感度校正用標準サンプル及びその製造方法 |
JP2000058606A (ja) | 1998-08-06 | 2000-02-25 | Hitachi Ltd | 検査用標準試料 |
JP2002148197A (ja) * | 2000-11-10 | 2002-05-22 | Japan Paint Inspection Association | 塗膜欠陥評価用標準画像の作成方法、そのプログラムを記録した記録媒体、及び作成した標準画像を記録した記録媒体 |
JP2009180674A (ja) * | 2008-01-31 | 2009-08-13 | Hoya Corp | 眼鏡レンズ外観検査用欠陥限度見本具およびその製造方法 |
JP2013257197A (ja) * | 2012-06-12 | 2013-12-26 | Toppan Printing Co Ltd | 印刷物検査装置の性能評価シート |
JP2016161398A (ja) * | 2015-03-02 | 2016-09-05 | 株式会社村上開明堂 | 外観限度見本具の製造方法及び外観限度見本具 |
JP2021121485A (ja) | 2020-01-31 | 2021-08-26 | キョーラク株式会社 | 構造体及びその製造方法 |
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Patent Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH07146247A (ja) * | 1993-11-25 | 1995-06-06 | Sanyo Electric Co Ltd | 異物検査装置の検査対象物及びその製造方法 |
JPH1164239A (ja) * | 1997-08-26 | 1999-03-05 | Nec Corp | 異物検出感度校正用標準サンプル及びその製造方法 |
JP2000058606A (ja) | 1998-08-06 | 2000-02-25 | Hitachi Ltd | 検査用標準試料 |
JP2002148197A (ja) * | 2000-11-10 | 2002-05-22 | Japan Paint Inspection Association | 塗膜欠陥評価用標準画像の作成方法、そのプログラムを記録した記録媒体、及び作成した標準画像を記録した記録媒体 |
JP2009180674A (ja) * | 2008-01-31 | 2009-08-13 | Hoya Corp | 眼鏡レンズ外観検査用欠陥限度見本具およびその製造方法 |
JP2013257197A (ja) * | 2012-06-12 | 2013-12-26 | Toppan Printing Co Ltd | 印刷物検査装置の性能評価シート |
JP2016161398A (ja) * | 2015-03-02 | 2016-09-05 | 株式会社村上開明堂 | 外観限度見本具の製造方法及び外観限度見本具 |
JP2021121485A (ja) | 2020-01-31 | 2021-08-26 | キョーラク株式会社 | 構造体及びその製造方法 |
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