WO2022265458A8 - 이차전지 저전압 불량 예측 장치 및 방법, 상기 장치를 포함하는 전지 제어 시스템 - Google Patents

이차전지 저전압 불량 예측 장치 및 방법, 상기 장치를 포함하는 전지 제어 시스템 Download PDF

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Publication number
WO2022265458A8
WO2022265458A8 PCT/KR2022/008648 KR2022008648W WO2022265458A8 WO 2022265458 A8 WO2022265458 A8 WO 2022265458A8 KR 2022008648 W KR2022008648 W KR 2022008648W WO 2022265458 A8 WO2022265458 A8 WO 2022265458A8
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WIPO (PCT)
Prior art keywords
secondary batteries
low voltage
receiving
unit
training data
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PCT/KR2022/008648
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English (en)
French (fr)
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WO2022265458A1 (ko
Inventor
공창선
김선민
이규황
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주식회사 엘지화학
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Priority to EP22825381.1A priority Critical patent/EP4300109A1/en
Priority to JP2023553062A priority patent/JP2024509525A/ja
Priority to CN202280017983.2A priority patent/CN117795355A/zh
Priority to US18/283,261 priority patent/US20240168093A1/en
Publication of WO2022265458A1 publication Critical patent/WO2022265458A1/ko
Publication of WO2022265458A8 publication Critical patent/WO2022265458A8/ko

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/36—Arrangements for testing, measuring or monitoring the electrical condition of accumulators or electric batteries, e.g. capacity or state of charge [SoC]
    • G01R31/367—Software therefor, e.g. for battery testing using modelling or look-up tables
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/36—Arrangements for testing, measuring or monitoring the electrical condition of accumulators or electric batteries, e.g. capacity or state of charge [SoC]
    • G01R31/3644—Constructional arrangements
    • G01R31/3648—Constructional arrangements comprising digital calculation means, e.g. for performing an algorithm
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/36—Arrangements for testing, measuring or monitoring the electrical condition of accumulators or electric batteries, e.g. capacity or state of charge [SoC]
    • G01R31/382—Arrangements for monitoring battery or accumulator variables, e.g. SoC
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/36—Arrangements for testing, measuring or monitoring the electrical condition of accumulators or electric batteries, e.g. capacity or state of charge [SoC]
    • G01R31/382—Arrangements for monitoring battery or accumulator variables, e.g. SoC
    • G01R31/3828—Arrangements for monitoring battery or accumulator variables, e.g. SoC using current integration
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/36—Arrangements for testing, measuring or monitoring the electrical condition of accumulators or electric batteries, e.g. capacity or state of charge [SoC]
    • G01R31/392—Determining battery ageing or deterioration, e.g. state of health
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/36—Arrangements for testing, measuring or monitoring the electrical condition of accumulators or electric batteries, e.g. capacity or state of charge [SoC]
    • G01R31/396—Acquisition or processing of data for testing or for monitoring individual cells or groups of cells within a battery
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N20/00—Machine learning
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N20/00—Machine learning
    • G06N20/10—Machine learning using kernel methods, e.g. support vector machines [SVM]
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N20/00—Machine learning
    • G06N20/20—Ensemble learning
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N5/00—Computing arrangements using knowledge-based models
    • G06N5/01—Dynamic search techniques; Heuristics; Dynamic trees; Branch-and-bound
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01M—PROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSION OF CHEMICAL ENERGY INTO ELECTRICAL ENERGY
    • H01M10/00—Secondary cells; Manufacture thereof
    • H01M10/42—Methods or arrangements for servicing or maintenance of secondary cells or secondary half-cells
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01M—PROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSION OF CHEMICAL ENERGY INTO ELECTRICAL ENERGY
    • H01M10/00—Secondary cells; Manufacture thereof
    • H01M10/42—Methods or arrangements for servicing or maintenance of secondary cells or secondary half-cells
    • H01M10/425—Structural combination with electronic components, e.g. electronic circuits integrated to the outside of the casing
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01M—PROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSION OF CHEMICAL ENERGY INTO ELECTRICAL ENERGY
    • H01M10/00—Secondary cells; Manufacture thereof
    • H01M10/42—Methods or arrangements for servicing or maintenance of secondary cells or secondary half-cells
    • H01M10/48—Accumulators combined with arrangements for measuring, testing or indicating the condition of cells, e.g. the level or density of the electrolyte
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01M—PROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSION OF CHEMICAL ENERGY INTO ELECTRICAL ENERGY
    • H01M10/00—Secondary cells; Manufacture thereof
    • H01M10/42—Methods or arrangements for servicing or maintenance of secondary cells or secondary half-cells
    • H01M10/425—Structural combination with electronic components, e.g. electronic circuits integrated to the outside of the casing
    • H01M2010/4271—Battery management systems including electronic circuits, e.g. control of current or voltage to keep battery in healthy state, cell balancing
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E60/00—Enabling technologies; Technologies with a potential or indirect contribution to GHG emissions mitigation
    • Y02E60/10—Energy storage using batteries

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  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Software Systems (AREA)
  • Manufacturing & Machinery (AREA)
  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • General Chemical & Material Sciences (AREA)
  • Computing Systems (AREA)
  • Data Mining & Analysis (AREA)
  • Evolutionary Computation (AREA)
  • Artificial Intelligence (AREA)
  • General Engineering & Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Medical Informatics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computational Linguistics (AREA)
  • Charge And Discharge Circuits For Batteries Or The Like (AREA)
  • Secondary Cells (AREA)
  • Tests Of Electric Status Of Batteries (AREA)

Abstract

본 발명은 이차전지의 제1 학습 데이터를 입력 받는 제1 학습 데이터 입력부; 이차전지의 제1 측정 데이터를 입력 받는 제1 측정 데이터 입력부; 제1 이차전지의 저전압 예측 모델(Model)을 생성하고, 제1 학습 데이터 중에서 주요 인자를 선별하는 제1 데이터 학습부; 제1 이차전지의 저전압 예측 모델을 검증하고 최적화하는 제1 검증부; 최적화된 제1 이차전지의 저전압 예측 모델 및 가중치 k의 최적값을 전이 받는 모델 전이부; 이차전지의 제2 학습 데이터를 입력 받는 제2 학습 데이터 입력부; 이차전지의 제2 측정 데이터를 입력 받는 제2 측정 데이터 입력부; 제2 이차전지의 저전압 예측 모델을 생성하는 제2 데이터 학습부; 및 판정 예측 결과를 출력하는 제2 출력부를 포함하고, 제1 학습 대상 및 제1 예측 대상과 제2 학습 대상 및 제2 예측 대상으로 선택된 이차전지의 공정 조건은 서로 상이한 것인 이차전지 저전압 불량 예측 장치에 관한 것이다.
PCT/KR2022/008648 2021-06-18 2022-06-17 이차전지 저전압 불량 예측 장치 및 방법, 상기 장치를 포함하는 전지 제어 시스템 WO2022265458A1 (ko)

Priority Applications (4)

Application Number Priority Date Filing Date Title
EP22825381.1A EP4300109A1 (en) 2021-06-18 2022-06-17 Device and method for predicting low voltage failure of secondary battery, and battery control system comprising same device
JP2023553062A JP2024509525A (ja) 2021-06-18 2022-06-17 二次電池の低電圧不良予測装置および方法、並びにその装置を含む電池制御システム
CN202280017983.2A CN117795355A (zh) 2021-06-18 2022-06-17 预测二次电池的低电压故障的装置和方法以及包括该装置的电池控制系统
US18/283,261 US20240168093A1 (en) 2021-06-18 2022-06-17 Device and Method for Predicting Low Voltage Failure of Secondary Battery, and Battery Control System Comprising Same Device

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR20210079389 2021-06-18
KR10-2021-0079389 2021-06-18

Publications (2)

Publication Number Publication Date
WO2022265458A1 WO2022265458A1 (ko) 2022-12-22
WO2022265458A8 true WO2022265458A8 (ko) 2023-11-16

Family

ID=84527253

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Application Number Title Priority Date Filing Date
PCT/KR2022/008648 WO2022265458A1 (ko) 2021-06-18 2022-06-17 이차전지 저전압 불량 예측 장치 및 방법, 상기 장치를 포함하는 전지 제어 시스템

Country Status (6)

Country Link
US (1) US20240168093A1 (ko)
EP (1) EP4300109A1 (ko)
JP (1) JP2024509525A (ko)
KR (1) KR20220169433A (ko)
CN (1) CN117795355A (ko)
WO (1) WO2022265458A1 (ko)

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100911316B1 (ko) * 2007-08-23 2009-08-11 주식회사 엘지화학 배터리의 장기 특성 예측 시스템 및 방법
JP6250298B2 (ja) * 2013-04-15 2017-12-20 新電元工業株式会社 二次電池寿命予測システムおよび二次電池特性評価装置
KR101800050B1 (ko) 2013-10-30 2017-11-21 주식회사 엘지화학 이차전지 저전압 불량 조기 감지 시스템 및 그 방법
KR101802002B1 (ko) * 2013-10-30 2017-11-27 주식회사 엘지화학 이차전지 저전압 불량률 조기 감지 시스템 및 그 방법
US11449249B2 (en) 2018-11-26 2022-09-20 Micron Technology, Inc. Configuring command/address channel for memory
KR102238248B1 (ko) * 2019-07-31 2021-04-12 주식회사 에스제이 테크 머신러닝을 이용한 배터리 진단 방법
US11209492B2 (en) * 2019-10-02 2021-12-28 Continental Automotive Systems, Inc. Method and system for determining battery state of health

Also Published As

Publication number Publication date
US20240168093A1 (en) 2024-05-23
EP4300109A1 (en) 2024-01-03
JP2024509525A (ja) 2024-03-04
WO2022265458A1 (ko) 2022-12-22
CN117795355A (zh) 2024-03-29
KR20220169433A (ko) 2022-12-27

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