WO2022260133A1 - Système de surveillance, procédé de surveillance, programme et support d'enregistrement lisible par ordinateur à programme informatique stocké en son sein - Google Patents
Système de surveillance, procédé de surveillance, programme et support d'enregistrement lisible par ordinateur à programme informatique stocké en son sein Download PDFInfo
- Publication number
- WO2022260133A1 WO2022260133A1 PCT/JP2022/023309 JP2022023309W WO2022260133A1 WO 2022260133 A1 WO2022260133 A1 WO 2022260133A1 JP 2022023309 W JP2022023309 W JP 2022023309W WO 2022260133 A1 WO2022260133 A1 WO 2022260133A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- contraindicated
- substance
- iron scrap
- photographing
- unit
- Prior art date
Links
- 238000012544 monitoring process Methods 0.000 title claims abstract description 40
- 238000000034 method Methods 0.000 title claims description 71
- 238000004590 computer program Methods 0.000 title claims description 6
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 claims abstract description 362
- 229910052742 iron Inorganic materials 0.000 claims abstract description 181
- 238000003384 imaging method Methods 0.000 claims abstract description 23
- 239000000126 substance Substances 0.000 claims description 183
- 238000000605 extraction Methods 0.000 claims description 17
- 239000000725 suspension Substances 0.000 claims 2
- 238000001514 detection method Methods 0.000 description 80
- 238000010586 diagram Methods 0.000 description 34
- 238000012545 processing Methods 0.000 description 27
- 238000013136 deep learning model Methods 0.000 description 24
- 230000008569 process Effects 0.000 description 23
- 238000004891 communication Methods 0.000 description 20
- 238000007689 inspection Methods 0.000 description 15
- 238000003860 storage Methods 0.000 description 12
- 229910000831 Steel Inorganic materials 0.000 description 11
- 230000006870 function Effects 0.000 description 11
- 239000010959 steel Substances 0.000 description 11
- 238000013500 data storage Methods 0.000 description 10
- 238000010801 machine learning Methods 0.000 description 9
- 230000005856 abnormality Effects 0.000 description 8
- 230000000052 comparative effect Effects 0.000 description 8
- 239000000284 extract Substances 0.000 description 8
- 238000002474 experimental method Methods 0.000 description 6
- 230000032258 transport Effects 0.000 description 6
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 5
- 238000013528 artificial neural network Methods 0.000 description 5
- 229910052802 copper Inorganic materials 0.000 description 5
- 239000010949 copper Substances 0.000 description 5
- 238000013135 deep learning Methods 0.000 description 5
- 238000012986 modification Methods 0.000 description 5
- 230000004048 modification Effects 0.000 description 5
- 230000002159 abnormal effect Effects 0.000 description 4
- 230000008859 change Effects 0.000 description 4
- 230000000694 effects Effects 0.000 description 4
- 238000004519 manufacturing process Methods 0.000 description 4
- 238000005516 engineering process Methods 0.000 description 3
- 230000003287 optical effect Effects 0.000 description 3
- 238000004364 calculation method Methods 0.000 description 2
- 238000012790 confirmation Methods 0.000 description 2
- 238000013527 convolutional neural network Methods 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 238000005457 optimization Methods 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 238000012549 training Methods 0.000 description 2
- CWYNVVGOOAEACU-UHFFFAOYSA-N Fe2+ Chemical compound [Fe+2] CWYNVVGOOAEACU-UHFFFAOYSA-N 0.000 description 1
- 238000009825 accumulation Methods 0.000 description 1
- 238000013473 artificial intelligence Methods 0.000 description 1
- 239000000470 constituent Substances 0.000 description 1
- 238000011109 contamination Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- 238000004880 explosion Methods 0.000 description 1
- 238000003709 image segmentation Methods 0.000 description 1
- 230000010365 information processing Effects 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 239000004973 liquid crystal related substance Substances 0.000 description 1
- 230000007246 mechanism Effects 0.000 description 1
- 238000010295 mobile communication Methods 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 238000007781 pre-processing Methods 0.000 description 1
- 239000002994 raw material Substances 0.000 description 1
- 230000011218 segmentation Effects 0.000 description 1
- 230000005236 sound signal Effects 0.000 description 1
- 238000012360 testing method Methods 0.000 description 1
- 238000012795 verification Methods 0.000 description 1
- 238000010792 warming Methods 0.000 description 1
Images
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B09—DISPOSAL OF SOLID WASTE; RECLAMATION OF CONTAMINATED SOIL
- B09B—DISPOSAL OF SOLID WASTE
- B09B5/00—Operations not covered by a single other subclass or by a single other group in this subclass
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/85—Investigating moving fluids or granular solids
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B19/00—Programme-control systems
- G05B19/02—Programme-control systems electric
- G05B19/418—Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS], computer integrated manufacturing [CIM]
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
- G06N3/00—Computing arrangements based on biological models
- G06N3/02—Neural networks
- G06N3/08—Learning methods
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0004—Industrial image inspection
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
- G01N2021/8854—Grading and classifying of flaws
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
- G01N2021/8854—Grading and classifying of flaws
- G01N2021/888—Marking defects
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
- G01N2021/8883—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges involving the calculation of gauges, generating models
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
- G01N2021/8887—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/10—Scanning
- G01N2201/104—Mechano-optical scan, i.e. object and beam moving
- G01N2201/1042—X, Y scan, i.e. object moving in X, beam in Y
Abstract
La présente invention concerne un système de surveillance de résidus ferreux, le système comprenant : une unité d'imagerie pour capturer plusieurs fois des images de résidus ferreux à partir de différents points de vue et à différents moments ; une unité de spécification d'objet incompatible (312) pour entrer la pluralité d'images obtenues par la capture d'images par l'unité d'imagerie dans un modèle d'apprentissage prédéfini, et spécifier le type et
la position d'un objet incompatible qui est un objet à éliminer des résidus ferreux, et la probabilité que l'objet soit un objet incompatible ; et une unité de sortie (32) pour délivrer le type et la position de l'objet incompatible lorsque la probabilité spécifiée par l'unité de spécification d'objet incompatible (312) dépasse une valeur seuil prédéfinie.
Priority Applications (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202280028057.5A CN117157518A (zh) | 2021-06-09 | 2022-06-09 | 监视系统、监视方法、程序及存储计算机程序的计算机可读取记录介质 |
| KR1020237034848A KR20230154274A (ko) | 2021-06-09 | 2022-06-09 | 감시 시스템, 감시 방법, 프로그램 및 컴퓨터 프로그램이 기억된 컴퓨터 판독 가능한 기록 매체 |
| JP2023527922A JP7469731B2 (ja) | 2021-06-09 | 2022-06-09 | 監視システム、監視方法、およびプログラム |
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2021-096468 | 2021-06-09 | ||
| JP2021096468 | 2021-06-09 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| WO2022260133A1 true WO2022260133A1 (fr) | 2022-12-15 |
Family
ID=84424588
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PCT/JP2022/023309 WO2022260133A1 (fr) | 2021-06-09 | 2022-06-09 | Système de surveillance, procédé de surveillance, programme et support d'enregistrement lisible par ordinateur à programme informatique stocké en son sein |
Country Status (4)
| Country | Link |
|---|---|
| JP (1) | JP7469731B2 (fr) |
| KR (1) | KR20230154274A (fr) |
| CN (1) | CN117157518A (fr) |
| WO (1) | WO2022260133A1 (fr) |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2019208729A1 (fr) * | 2018-04-27 | 2019-10-31 | 日立造船株式会社 | Dispositif de traitement d'informations, dispositif de commande et système de détection d'article inapproprié |
| US20200012894A1 (en) * | 2018-07-05 | 2020-01-09 | Mitsubishi Electric Research Laboratories, Inc. | Visually Aided Active Learning for Training Object Detector |
| JP2020035195A (ja) * | 2018-08-30 | 2020-03-05 | 富士通株式会社 | 画像認識装置、画像認識方法および画像認識プログラム |
| JP2020095709A (ja) * | 2018-11-29 | 2020-06-18 | 株式会社神鋼エンジニアリング＆メンテナンス | スクラップ等級判定システム、スクラップ等級判定方法、推定装置、学習装置、学習済みモデルの生成方法、及びプログラム |
| JP2021086285A (ja) * | 2019-11-26 | 2021-06-03 | 株式会社神鋼エンジニアリング＆メンテナンス | 密閉物検出システム、密閉物検出方法、推定装置、及びプログラム |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3187237B2 (ja) | 1994-03-16 | 2001-07-11 | 新日本製鐵株式会社 | 鉄スクラップ群から銅を含有したスクラップを自動識別する方法 |
| JP7213741B2 (ja) | 2019-04-17 | 2023-01-27 | 株式会社メタルワン | 鉄スクラップ検品方法および鉄スクラップ検品システム |
-
2022
- 2022-06-09 WO PCT/JP2022/023309 patent/WO2022260133A1/fr active Application Filing
- 2022-06-09 JP JP2023527922A patent/JP7469731B2/ja active Active
- 2022-06-09 KR KR1020237034848A patent/KR20230154274A/ko unknown
- 2022-06-09 CN CN202280028057.5A patent/CN117157518A/zh active Pending
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2019208729A1 (fr) * | 2018-04-27 | 2019-10-31 | 日立造船株式会社 | Dispositif de traitement d'informations, dispositif de commande et système de détection d'article inapproprié |
| US20200012894A1 (en) * | 2018-07-05 | 2020-01-09 | Mitsubishi Electric Research Laboratories, Inc. | Visually Aided Active Learning for Training Object Detector |
| JP2020035195A (ja) * | 2018-08-30 | 2020-03-05 | 富士通株式会社 | 画像認識装置、画像認識方法および画像認識プログラム |
| JP2020095709A (ja) * | 2018-11-29 | 2020-06-18 | 株式会社神鋼エンジニアリング＆メンテナンス | スクラップ等級判定システム、スクラップ等級判定方法、推定装置、学習装置、学習済みモデルの生成方法、及びプログラム |
| JP2021086285A (ja) * | 2019-11-26 | 2021-06-03 | 株式会社神鋼エンジニアリング＆メンテナンス | 密閉物検出システム、密閉物検出方法、推定装置、及びプログラム |
Also Published As
| Publication number | Publication date |
|---|---|
| JPWO2022260133A1 (fr) | 2022-12-15 |
| KR20230154274A (ko) | 2023-11-07 |
| JP7469731B2 (ja) | 2024-04-17 |
| CN117157518A (zh) | 2023-12-01 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US7233867B2 (en) | Eddy current inspection method and system | |
| JP2007230706A (ja) | ベルトコンベアの縦裂き検知方法および装置 | |
| CN104773626B (zh) | 一种施工升降机标准节螺栓安全状态检测装置 | |
| JP2006282319A (ja) | コンベアベルトの縦裂き検知方法および装置 | |
| JP2010249547A (ja) | 外観検査装置及び外観検査方法 | |
| WO2022260133A1 (fr) | Système de surveillance, procédé de surveillance, programme et support d'enregistrement lisible par ordinateur à programme informatique stocké en son sein | |
| CN106485701B (zh) | 基于图像的铁路接触网承力索座装反与否的检测方法 | |
| JP2014126445A (ja) | 位置合せ装置、欠陥検査装置、位置合せ方法、及び制御プログラム | |
| CN113128555B (zh) | 一种用于列车闸片部件异常检测的方法 | |
| JP4823996B2 (ja) | 輪郭検出方法及び輪郭検出装置 | |
| JP7213741B2 (ja) | 鉄スクラップ検品方法および鉄スクラップ検品システム | |
| KR101678771B1 (ko) | Ｓｍｔ 불량 판별 장치 및 방법 | |
| CN115504187B (zh) | 一种矿用皮带智能调速和保护系统及控制方法 | |
| US20210080521A1 (en) | Magnetic particle inspection device | |
| JP2020037464A (ja) | 判定装置および判定方法 | |
| JP3536884B2 (ja) | 半導体ウエハの欠陥分類方法及びその装置 | |
| JP2009080004A (ja) | 検査装置 | |
| JPH04106460A (ja) | 欠陥検出方法 | |
| CN115082850A (zh) | 基于计算机视觉的模板支架安全风险识别方法 | |
| JP2012211876A (ja) | 外観検査装置 | |
| JP7056401B2 (ja) | 連続鋳造用モールド内のボイル検出方法、連続鋳造鋳片の品質判定方法、連続鋳造設備の監視方法、連続鋳造用モールド内のボイル検出装置 | |
| CN107543826A (zh) | 一种轴承缺陷检测装置 | |
| JP7241011B2 (ja) | 情報処理装置、情報処理方法及びプログラム | |
| JP2022119754A (ja) | 物体検査装置、検査用プログラム、及びシステム | |
| JP2000329594A (ja) | データ収集処理装置およびデータ収集処理用プログラムが記録された記録媒体 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| 121 | Ep: the epo has been informed by wipo that ep was designated in this application |
Ref document number: 22820312 Country of ref document: EP Kind code of ref document: A1 |
|
| WWE | Wipo information: entry into national phase |
Ref document number: 2023527922 Country of ref document: JP |
|
| WWE | Wipo information: entry into national phase |
Ref document number: 18283323 Country of ref document: US |
|
| ENP | Entry into the national phase |
Ref document number: 20237034848 Country of ref document: KR Kind code of ref document: A |
|
| WWE | Wipo information: entry into national phase |
Ref document number: 1020237034848 Country of ref document: KR |
|
| WWE | Wipo information: entry into national phase |
Ref document number: 2301006762 Country of ref document: TH |
|
| NENP | Non-entry into the national phase |
Ref country code: DE |