WO2022247663A1 - Système et procédé de test automatisé - Google Patents

Système et procédé de test automatisé Download PDF

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Publication number
WO2022247663A1
WO2022247663A1 PCT/CN2022/092820 CN2022092820W WO2022247663A1 WO 2022247663 A1 WO2022247663 A1 WO 2022247663A1 CN 2022092820 W CN2022092820 W CN 2022092820W WO 2022247663 A1 WO2022247663 A1 WO 2022247663A1
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WO
WIPO (PCT)
Prior art keywords
test
host
gui
updated
software
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PCT/CN2022/092820
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English (en)
Chinese (zh)
Inventor
褚方民
李志顺
周永明
Original Assignee
爱德万测试股份有限公司
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Publication date
Application filed by 爱德万测试股份有限公司 filed Critical 爱德万测试股份有限公司
Publication of WO2022247663A1 publication Critical patent/WO2022247663A1/fr

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    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/36—Preventing errors by testing or debugging software
    • G06F11/3668—Software testing
    • G06F11/3672—Test management
    • G06F11/3688—Test management for test execution, e.g. scheduling of test suites
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/36—Preventing errors by testing or debugging software

Definitions

  • the invention relates to an automated test system and method, in particular to an automated test system and method based on standardized test IP.
  • ATE automated test equipment
  • test plan of each electronic product or component is different, so the test process, test method, test item and test environment are also different.
  • the automated testing procedures for each electronic product or component are customized and exclusive. Therefore, software developers need to write exclusive automated test program codes according to exclusive test plans.
  • writing automated test program code not only takes a lot of time, but also cannot ensure the quality of its testing. Because the quality of the test depends on the professional ability of the software developer, such as the ability of program coding and the ability to understand the communication protocol.
  • an embodiment of the present invention provides an automated testing system including: a cloud host, a test host, and a device under test.
  • the cloud host is used to store a plurality of test IPs, wherein each test IP includes a default measurement condition.
  • the test host is coupled to the cloud host, the test host includes GUI test software, and the GUI test software includes a test process editor.
  • the device under test is coupled to the test host.
  • An embodiment of the present invention provides an automated testing method, which is suitable for an automated testing system including a cloud host, a test host, and a device to be tested, wherein the cloud host stores a plurality of test IPs, each test IP includes a default measurement condition, and the test host includes a GUI.
  • Test software and the GUI test software includes a test flow editor, and the automated test method includes: the GUI test software judges whether a test IP is dragged and dropped into the editing screen of the test flow editor; if so, the test flow editor generates a test according to the test IP program.
  • the test IP is downloaded from the cloud host through the test host, and the test IP is dragged and dropped into the editing screen of the test process editor to generate a test program.
  • the test program is executed, the test host tests the device under test according to the test program to generate and display test results. In this way, the time for developing test programs is greatly reduced, and the time for products to market is shortened, while ensuring the quality of testing.
  • FIG. 1 is a schematic diagram of an automated testing system provided by an embodiment of the present invention.
  • Fig. 2 is a schematic diagram of an automated testing method provided by an embodiment of the present invention.
  • Fig. 3 is a schematic diagram of an automated testing method provided by another embodiment of the present invention.
  • FIG. 1 is the schematic diagram of the automated test system provided by the embodiment of the present invention
  • Fig. 2 is the schematic diagram of the automated test method provided by the embodiment of the present invention.
  • An automated testing system 1 includes: a cloud host 10 , a test host 20 and a device under test 30 , wherein the test host 20 is coupled to the cloud host 10 and the device under test 30 .
  • the cloud host 10 stores a plurality of test IPs, wherein each test IP is a self-contained package (self-contained package) of the same structure, such as standard interface description (such as XML), signal input (such as test method parameters/specification variables ), the output of the signal (such as test method parameters/measurement results/test descriptors), and the default value (default value).
  • each test IP has different default measurement conditions (such as default communication protocol, default measurement parameters), such as test IP that conforms to communication protocols such as Wi-Fi protocol, Bluetooth (Bluetooth) protocol, and NB-IoT protocol. Or a test IP that conforms to other protocols.
  • the test IP of the Bluetooth protocol includes measurement items or test items that conform to the Bluetooth protocol, such as transmit power (TX Power), receive sensitivity (RX Sensitivity), and adjacent channel power ratio (ACPR).
  • TX Power transmit power
  • RX Sensitivity receive sensitivity
  • ACPR adjacent channel power ratio
  • each measurement item can be regarded as a test IP, such as a transmit power test IP, a receive sensitivity test IP, and an adjacent channel power ratio test IP. Therefore, each specific test IP can be a standardized test IP or a modular test IP conforming to a specific communication protocol.
  • the test host 20 includes GUI (Graphical User Interface) test software 210, preferably a software that adopts a computer-operated user interface displayed in an image or graphic mode.
  • GUI testing software 210 includes a test flow editor, a setting panel, and a monitoring panel.
  • the test process editor can generate corresponding test programs according to the test IP.
  • the setting panel can provide the user of the test host 20 to modify the default measurement conditions.
  • the monitoring panel can provide the user of the test host 20 to control the execution of the test program and can be used to display test results.
  • users of the test host 20 (such as software developers) can quickly develop high-quality test programs based on standardized test IP and operate through the GUI test software 210, thereby greatly reducing the professional skills required by users.
  • test process editor the setting panel and the monitoring panel are preferably presented as panels with images or graphical interfaces, so that users can interact with the device or equipment through the program interface through images or graphics.
  • the device under test 30 may be an electronic product or a semiconductor product (such as a chip).
  • a kind of automated testing method comprises the following steps: first, the test host 20 downloads any test IP in a plurality of test IPs from the cloud host 10 to the test host 20 (as shown in step S100), such as a local file of the test host 20 in the middle.
  • the GUI test software 210 judges whether the test IP is dragged and dropped into the editing screen of the test flow editor (as shown in step S110 ). If yes, the test flow editor generates a corresponding test program according to the test IP (as shown in step S120).
  • the GUI test software 210 judges whether the test host 20 executes the test program (as shown in step S130) by such as a monitoring panel, if so, the test host 20 tests the device under test 30 according to the test program to generate a test result, and can pass For example, the monitoring panel displays the test result (as shown in step S140).
  • FIG. 3 is a schematic diagram of an automated testing method provided by another embodiment of the present invention.
  • GUI test software 210 judges whether the test host 20 modifies the default measurement condition (such as power supply setting, protocol setting or RF measurement setting) of the test IP through the setting panel for example (such as shown in step S112). If so, the GUI test software 210 modifies the test IP and generates an updated test IP according to the modified default measurement condition, and the test flow editor generates an updated test program according to the updated test IP (shown in step S114 ).
  • the default measurement condition such as power supply setting, protocol setting or RF measurement setting
  • the GUI test software 210 determines whether the test host 20 executes the updated test program through, for example, the monitoring panel (shown in step S116 ). If yes, the test host 20 tests the device under test 30 according to the updated test program to generate an updated test result, and can display the updated test result through, for example, a monitoring panel (as shown in step S118 ). In other words, the user of the test host 20 can modify the default measurement conditions of the test IP through, for example, the setting panel, so as to generate and use an updated test program to test the device under test 30, and can also view the test results through, for example, the monitoring panel result. In this way, the test program can be modified, adjusted or debugged in real time.
  • the test host downloads the test IP from the cloud host, and drags and drops the test IP to the editing screen of the test process editor to generate a test program.
  • the test program When the test program is executed, the test host tests the device under test according to the test program to generate and display test results. In this way, the time for developing test programs is greatly reduced, and the time for products to market is shortened, while ensuring the quality of testing.

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  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)

Abstract

Procédé de test automatisé approprié pour un système de test automatisé. Le système de test automatisé comprend un hôte en nuage, un hôte de test et un dispositif à tester. L'hôte en nuage stocke une pluralité d'IP de test, chaque IP de test comprenant une condition de test par défaut. L'hôte de test comprend un logiciel de test de GUI, le logiciel de test de GUI comprenant un éditeur de flux de test. Le procédé de test automatisé comprend les étapes suivantes : un logiciel de test de GUI détermine si un IP de test est glissé dans un écran d'édition d'un éditeur de flux de test ; et si tel est le cas, l'éditeur de flux de test génère un programme de test selon l'IP de test.
PCT/CN2022/092820 2021-05-25 2022-05-13 Système et procédé de test automatisé WO2022247663A1 (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
CN202110571411.6A CN115391166A (zh) 2021-05-25 2021-05-25 自动化测试系统及方法
CN202110571411.6 2021-05-25

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WO2022247663A1 true WO2022247663A1 (fr) 2022-12-01

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CN (1) CN115391166A (fr)
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Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20130061206A1 (en) * 2011-09-07 2013-03-07 Auriga Measurement Systems, LLC Automatically generating executable code for a test sequence
US20150058671A1 (en) * 2012-06-04 2015-02-26 Advantest Corporation Test program
US20150127986A1 (en) * 2012-08-30 2015-05-07 Advantest Corporation Test program and test system
CN104732001A (zh) * 2013-12-20 2015-06-24 爱德万测试公司 电子器件的在线设计验证
CN111506508A (zh) * 2020-04-17 2020-08-07 北京百度网讯科技有限公司 边缘计算测试方法、装置、设备和可读存储介质

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20130061206A1 (en) * 2011-09-07 2013-03-07 Auriga Measurement Systems, LLC Automatically generating executable code for a test sequence
US20150058671A1 (en) * 2012-06-04 2015-02-26 Advantest Corporation Test program
US20150127986A1 (en) * 2012-08-30 2015-05-07 Advantest Corporation Test program and test system
CN104732001A (zh) * 2013-12-20 2015-06-24 爱德万测试公司 电子器件的在线设计验证
CN111506508A (zh) * 2020-04-17 2020-08-07 北京百度网讯科技有限公司 边缘计算测试方法、装置、设备和可读存储介质

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