WO2022244071A1 - Component push-up device and component mounting device - Google Patents

Component push-up device and component mounting device Download PDF

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Publication number
WO2022244071A1
WO2022244071A1 PCT/JP2021/018640 JP2021018640W WO2022244071A1 WO 2022244071 A1 WO2022244071 A1 WO 2022244071A1 JP 2021018640 W JP2021018640 W JP 2021018640W WO 2022244071 A1 WO2022244071 A1 WO 2022244071A1
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WO
WIPO (PCT)
Prior art keywords
push
component
magnet
wafer
die
Prior art date
Application number
PCT/JP2021/018640
Other languages
French (fr)
Japanese (ja)
Inventor
洋平 岸本
Original Assignee
ヤマハ発動機株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by ヤマハ発動機株式会社 filed Critical ヤマハ発動機株式会社
Priority to PCT/JP2021/018640 priority Critical patent/WO2022244071A1/en
Priority to CN202180097917.6A priority patent/CN117280453A/en
Priority to JP2023522019A priority patent/JPWO2022244071A1/ja
Priority to DE112021007307.9T priority patent/DE112021007307T5/en
Priority to KR1020237035708A priority patent/KR20230158099A/en
Priority to TW110126899A priority patent/TWI830034B/en
Publication of WO2022244071A1 publication Critical patent/WO2022244071A1/en

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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67132Apparatus for placing on an insulating substrate, e.g. tape
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67144Apparatus for mounting on conductive members, e.g. leadframes or conductors on insulating substrates
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/683Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L21/6835Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
    • H01L21/6836Wafer tapes, e.g. grinding or dicing support tapes
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/683Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L21/6838Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping with gripping and holding devices using a vacuum; Bernoulli devices
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2221/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof covered by H01L21/00
    • H01L2221/67Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere
    • H01L2221/683Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L2221/68304Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
    • H01L2221/68354Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support used to support diced chips prior to mounting
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2221/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof covered by H01L21/00
    • H01L2221/67Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere
    • H01L2221/683Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L2221/68304Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
    • H01L2221/68381Details of chemical or physical process used for separating the auxiliary support from a device or wafer
    • H01L2221/68386Separation by peeling
    • H01L2221/6839Separation by peeling using peeling wedge or knife or bar

Definitions

  • the present invention includes a component push-up device that pushes up and separates a die (bare chip) from below a wafer sheet when picking up the die (bare chip) from the wafer attached to the wafer sheet, and the component push-up device. It relates to a component mounting apparatus.
  • a component mounting apparatus that picks up a die (bare chip) from a diced wafer and mounts it on a substrate is known.
  • a wafer camera takes an image of a wafer carried into a predetermined position (component placement area) inside the machine by a wafer feeder to recognize the wafer, and then the die is picked by a head equipped with a die holding function. The action of doing is repeated.
  • the component mounting device is equipped with a component push-up device that separates the die from the wafer sheet prior to die picking by pushing up the die from below the wafer attached to the wafer sheet.
  • the component push-up device includes a columnar suction housing and a push-up pin provided at the center thereof so as to be retractable. With the wafer sheet sucked from below by the suction housing, the die is pushed up from below by the push-up pin. Push up.
  • Japanese Laid-Open Patent Publication No. 2002-100000 discloses a component push-up device that includes a unit called a suction pot that includes a suction housing and a push-up pin, and that the suction pot is replaceable.
  • a clamping mechanism is incorporated in the suction pot, and it can be attached to, detached from, or replaced by operating a lever on a predetermined mounting portion.
  • the present invention has been made in view of the above-mentioned problems, and its object is to make it possible to change the push-up tool such as the suction housing and the push-up pin in a component push-up device with a simpler configuration. .
  • a component push-up device is a component push-up device that separates a die from a wafer sheet by pushing up the die from below the wafer attached to the wafer sheet, wherein the wafer an attracting surface that attracts the lower surface of the sheet under negative pressure; and a thrust tool that includes a thrust pin that is provided so as to be retractable from the attracting surface to the wafer sheet side and protrudes from the attracting surface to push up the die; a support member that is relatively movable along the wafer and detachably supports the push-up tool, and a magnet is provided on one side of the push-up tool and the support member. At least the surface facing the magnet on the other side is made of a magnetic material.
  • a component mounting apparatus includes a component supply unit in which a wafer that has been diced and attached to a wafer sheet is placed, and a die is picked from the wafer placed in the component supply unit. a component transfer head that transfers the component onto a substrate by means of the component transfer head;
  • FIG. 1 is a top plan view showing the overall configuration of a component mounting apparatus according to an embodiment of the present invention (a component mounting apparatus provided with a component pushing-up apparatus of the present invention).
  • FIG. 2 is a schematic perspective view showing a head unit and a push-up unit.
  • FIG. 3 is a perspective view of a push-up unit.
  • FIG. 4 is an enlarged perspective view of a main portion of the push-up unit.
  • FIG. 5 is a perspective view of the push-up head.
  • FIG. 6 is a cross-sectional view of the push-up head.
  • FIGS. 7A to 7C are explanatory diagrams of the pushing-up operation of the die by the pushing-up head.
  • FIG. 8 is a table showing the magnetic pole relationship between the fixed magnets of the attraction housing and the fixed magnets of the attraction housing.
  • FIG. 1 is a top plan view showing the overall configuration of a component mounting apparatus 1 according to an embodiment of the present invention.
  • the component mounting apparatus 1 is an apparatus that mounts a die 7a (component) diced from a wafer 7 on a substrate P.
  • FIG. The component mounting apparatus 1 includes a base 2 , a conveyor 3 , a head unit 4 , a component supply section 5 (component placement area), a wafer supply apparatus 6 , a camera unit 32U and a push-up unit 40 .
  • FIG. 2 is a schematic perspective view showing the head unit 4 and the push-up unit 40 not shown in FIG.
  • the base 2 is a mounting base for various devices provided in the component mounting apparatus 1 .
  • the conveyor 3 is a transport line for the substrate P installed on the base 2 so as to extend in the X direction.
  • the conveyor 3 carries the board P from the outside to a predetermined mounting work position, and carries the board P out of the machine from the work position after the mounting work.
  • the position where the substrate P is shown in FIG. 1 is the mounting work position.
  • the component supply unit 5 supplies a plurality of dies 7a arranged by dicing from the wafer 7 .
  • the head unit 4 picks the die 7a in the component supply unit 5, moves to the mounting work position, and mounts the die 7a on the board P.
  • the head unit 4 includes a plurality of heads 4H (“component transfer heads” of the present invention) that attract and hold the die 7a during the picking.
  • the head 4H can move back and forth (up and down) in the Z direction with respect to the head unit 4 and can rotate about its axis.
  • the head unit 4 is equipped with a substrate recognition camera 31 that captures an image of the substrate P. As shown in FIG. The feducial mark attached to the board P is recognized from the photographed image of the board recognition camera 31, and the positional deviation is corrected at the time of component mounting.
  • the component mounting apparatus 1 includes a drive mechanism D1 that allows the head unit 4 to move horizontally (X and Y directions) between the component supply unit 5 and the board P held at the mounting position.
  • the drive mechanism D1 includes a pair of Y-axis fixed rails 13, a first Y-axis servomotor 14 and a ball screw shaft 15 on the +X side and the -X side, and a support frame 16 constructed between the pair of Y-axis fixed rails 13. It has The ball screw shaft 15 is screwed onto a nut 17 provided on the support frame 16 .
  • the drive mechanism D ⁇ b>1 also includes a guide member (not shown) mounted on the support frame 16 , a first X-axis servomotor 18 and a ball screw shaft 19 .
  • the guide member supports the head unit 4 so as to be movable in the X direction, and the ball screw shaft 19 is screwed to a nut (not shown) provided on the head unit 4 .
  • the head unit 4 moves in the horizontal direction (X and Y directions). That is, when the ball screw shaft 15 is rotationally driven by the first Y-axis servomotor 14, the head unit 4 moves together with the support frame 16 in the Y direction. Further, the head unit 4 moves in the X direction with respect to the support frame 16 by rotationally driving the ball screw shaft 19 by the first X-axis servomotor 18 .
  • the component supply unit 5 includes a wafer supply device 6 that supplies a plurality of dies 7a in the form of wafers 7 to a predetermined component extraction work position (wafer stage 10).
  • the wafer feeder 6 includes a wafer holding frame 8 that holds a wafer sheet 8a. An assembly of a large number of dies 7a, 7a, .
  • the wafer feeder 6 feeds the dies 7a to the component extraction work position in such a manner that the wafer holding frame 8 is replaced.
  • the wafer supply device 6 includes a wafer storage elevator 9, a wafer stage 10 and a wafer conveyor 11.
  • the wafer storage elevator 9 stores the wafer sheets 8a to which the wafers 7 are adhered on the wafer holding frame 8 in multiple stages.
  • a wafer stage 10 is installed on the base 2 at a position on the -Y side of the wafer storage elevator 9 .
  • the wafer stage 10 is arranged at a position aligned on the +Y side with respect to the mounting work position where the substrate P is stopped.
  • a wafer conveyor 11 draws the wafer holding frame 8 from the wafer storage elevator 9 onto the wafer stage 10 .
  • the camera unit 32U is a unit that is movable in the X and Y directions, and includes the wafer camera 32. Wafer camera 32 images a portion of wafer 7 positioned on wafer stage 10, that is, die 7a within the camera's field of view. Based on this captured image, the position of the die 7a to be picked up is recognized.
  • the component mounting apparatus 1 includes a drive mechanism D2 that allows the camera unit 32U to move in the horizontal direction (X and Y directions) between the component supply unit 5 and a predetermined standby position.
  • the drive mechanism D2 includes a pair of Y-axis fixed rails 33 on the +X side and the -X side, a second Y-axis servomotor 34 and a ball screw shaft 35 arranged on the +X side, and between the pair of Y-axis fixed rails 33. and a suspended support frame 36 .
  • the ball screw shaft 35 is screwed onto a nut 37 provided on the support frame 36 .
  • the drive mechanism D ⁇ b>2 also includes a guide member (not shown) mounted on the support frame 36 , a second X-axis servomotor 38 and a ball screw shaft 39 .
  • the guide member supports the camera unit 32U so as to be movable in the X direction, and the ball screw shaft 39 is screwed to a nut (not shown) provided on the camera unit 32U.
  • the camera unit 32U moves in the horizontal direction (X and Y directions). That is, when the ball screw shaft 35 is rotationally driven by the second Y-axis servomotor 34, the camera unit 32U moves together with the support frame 36 in the Y direction. Further, the camera unit 32U moves in the X direction with respect to the support frame 36 by rotationally driving the ball screw shaft 39 by the second X-axis servomotor 38 .
  • the push-up unit 40 is arranged below the component supply unit 5, and pushes up the die 7a to be picked up by the head 4H from the lower surface side of the wafer sheet 8a.
  • the push-up unit 40 is arranged on the base 2 so as to be movable in the XY directions over a range corresponding to the wafer stage 10 .
  • the component mounting apparatus 1 includes a drive mechanism D3 that allows the push-up unit 40 to move.
  • the drive mechanism D3 includes a support frame 42 movable along a pair of guide rails 41 extending in the Y direction, a ball screw shaft 43 extending in the Y direction, and a third Y-axis servomotor 44.
  • the ball screw shaft 43 is screwed into a nut (not shown) provided on the support frame 42 .
  • the X-direction movement mechanism includes a guide member (not shown) mounted on the support frame 42 , a third X-axis servomotor 46 and a ball screw shaft 45 .
  • the guide member supports the push-up unit 40 so as to be movable in the X direction, and the ball screw shaft 45 is screwed to a nut (not shown) provided on the push-up unit 40 .
  • the push-up unit 40 moves in the horizontal direction (X and Y directions). That is, when the ball screw shaft 43 is rotationally driven by the third Y-axis servomotor 44, the push-up unit 40 moves together with the support frame 42 in the Y direction. Further, the ball screw shaft 45 is rotationally driven by the third X-axis servomotor 46, so that the push-up unit 40 moves in the X direction with respect to the support frame 42. As shown in FIG.
  • the push-up unit 40 has two push-up heads 50A and 50B each provided with a push-up pin 71 for pushing up the die 7a (only the push-up pin 71 is shown in FIG. 2), as will be described in detail later.
  • the push-up unit 40 raises the push-up pins 71 to push up the die 7a through the wafer sheet 8a when the die 7a is sucked by the head 4H.
  • the pushing-up unit 40 and the drive mechanism D3 described above correspond to the "parts pushing-up device" of the present invention.
  • a component recognition camera 30 is installed on the base 2 .
  • the component recognition camera 30 images the die 7a sucked by the head 4H of the head unit 4 from below before being mounted on the substrate P. As shown in FIG. Based on this captured image, it is determined whether the head 4H has picked up the die 7a abnormally or picked up incorrectly.
  • the basic operation of the component mounting apparatus 1 described above is as follows. First, the wafer holding frame 8 is pulled out from the wafer storage elevator 9 by the wafer conveyor 11 . Accordingly, the wafer sheet 8a to which the assembly (wafer 7) of the many dies 7a, 7a, . . .
  • the camera unit 32U moves above the wafer stage 10 and images the wafer 7.
  • the imaging by the camera unit 32U is for recognition of the group of dies 7a to be picked up by the head 4H in the later picking operation.
  • the camera unit 32U When the imaging of the group of dies 7a is completed, the camera unit 32U is retracted from above the wafer stage 10, while the head unit 4 is placed above the wafer stage 10 and the push-up unit 40 is placed below the wafer 7, respectively. Then, the head 4H picks from the wafer 7 a group of dies 7a recognized by the imaging by the camera unit 32U. At this time, the push-up pins 71 of the push-up unit 40 are raised to push up the die 7a through the wafer sheet 8a.
  • the head unit 4 moves from above the wafer stage 10 to above the substrate P at the mounting work position via the component recognition camera 30. As a result, the die 7a sucked by the head 4H is mounted on the substrate P. As shown in FIG.
  • the camera unit 32U After picking the die 7a, when the head unit 4 moves from above the wafer stage 10, the camera unit 32U enters and moves above the wafer stage 10 in synchronization with this movement. After that, the head unit 4 and the camera unit 32U are moved above the wafer stage 10 so as to be sequentially replaced, and the picking of the die 7a and the mounting operation on the substrate P are repeated.
  • FIG. 3 is a perspective view of the push-up unit 40
  • FIG. 5 is a perspective view of the push-up heads 50A and 50B provided in the push-up unit 40
  • FIG. 6 is a cross-sectional view of the push-up heads 50A and 50B.
  • the push-up unit 40 has a base frame 47 connected to the drive mechanism D3.
  • the base frame 47 includes a pair of push-up heads 50A and 50B, a switching mechanism D4 for switching between the push-up heads 50A and 50B, and a first lifting mechanism D5 for advancing and retreating (elevating) the push-up heads 50A and 50B in the Z direction. and a second elevating mechanism D6 for advancing and retreating (elevating) in the Z direction the thrusting pins 71 provided in the thrusting heads 50A and 50B.
  • the push-up heads 50A and 50B push up the die 7a through the wafer sheet 8a when the die 7a is sucked by the head 4H.
  • the push-up heads 50A and 50B have basically the same structure except for the type of push-up tool 60 described later.
  • the push-up head 50A (50B) includes a base member 52 and a push-up tool 60 attached to the base member 52.
  • the push-up tool 60 includes a suction housing 62 and a pin holder 63 for sucking the wafer sheet 8a from below.
  • the pin holder 63 is composed of a cylindrical holder body 70 with a ceiling and a push-up pin 71 held at the upper end thereof. This push-up pin 71 pushes up the die 7a.
  • a pin holder 63 having an optimum push-up pin 71 corresponding to the die 7a is selected from among a plurality of types of pin holders 63 and incorporated into the push-up head 50A (50B).
  • the push-up head 50A (50B) has a push-up main shaft 74 supported by the base member 52 so as to be able to move up and down.
  • the pin holder 63 is detachably fixed to the upper end of the push-up main shaft 74 .
  • the push-up main shaft 74 is a spline shaft, and is supported vertically (movably in the Z direction) by a spline bearing 75 fixed in a through hole 55 formed in the base member 52 .
  • a cylindrical pin base 72 is fixed near the upper end of the push-up main shaft 74 so that the push-up main shaft 74 projects slightly upward (referred to as a projecting portion 74a).
  • the pin base 72 includes a base body portion 72a and a fixed magnet 72b stacked on the upper end thereof.
  • the stationary magnet 72b has a ring shape that is flat in the Z direction, and is arranged on the base body portion 72a with the protrusion 74a penetrating through the center of the fixed magnet 72b. being stopped.
  • the pin holder 63 is arranged on the pin base 72 with the projecting portion 74a inserted inside the holder body 70 and positioned in the circumferential direction with respect to the projecting portion 74a.
  • the entire holder body 70, or at least the surface of the holder body 70 facing the pin base 72 (fixed magnet 72b) is made of a magnetic material such as iron. That is, the pin holder 63 is fixed to the pin base 72 by the magnetic force of the fixed magnet 72b.
  • the pin holder 63 (holder main body 70) and the pin base 72 have the same outer diameter, and when the pin holder 63 is fixed to the pin base 72, they form an integral columnar shape.
  • a lower end portion of the push-up main shaft 74 protrudes downward from the base member 52, and a columnar follower member 76 is provided at the lower end portion.
  • a coil spring 78 is mounted between the follower member 76 of the push-up main shaft 74 and the lower surface of the base member 52 . The elastic force of the coil spring 78 urges the push-up main shaft 74 downward (-Z direction), and as a result, the pin base 72 is held at the lower end position (position shown in FIG. 6) where the pin base 72 comes into contact with the spline bearing 75. It is
  • the suction housing 62 includes a hollow cylindrical portion 65 having a suction surface 66 for sucking the wafer sheet 8a at its upper end, and a flange portion 67 connected to its lower end.
  • the suction housing 62 is attached to the upper surface 54 of the base member 52 via a flange portion 67 .
  • An annular boss portion 53 protrudes from the upper surface 54 of the base member 52 around the through hole 55, while a concave portion 67b corresponding to the boss portion 53 is formed on the lower surface of the flange portion 67.
  • the suction housing 62 is arranged on the upper surface 54 of the base member 52 with the boss portion 53 fitted (inserted) into the concave portion 67b.
  • a notch portion 67a is formed in the peripheral portion of the flange portion 67, and a positioning pin 69 erected on the upper surface 54 is inserted into the notch portion 67a. Thereby, the suction housing 62 is positioned in the circumferential direction with respect to the base member 52 .
  • a plurality of fixed magnets 68 are arranged at equal intervals in the circumferential direction around the boss portion 53 on the upper surface 54 of the base member 52 . These fixed magnets 68 are embedded in the base member 52 so that their upper surfaces and the upper surface 54 of the base member 52 are flush with each other.
  • the entire attraction housing 62 or at least the surface of the attraction housing 62 facing the base member 52 (fixed magnet 68) is made of a magnetic material such as iron. That is, the attraction housing 62 is fixed to the base member 52 by the magnetic force of the stationary magnet 68 .
  • a gap is formed between the inner ceiling surface of the cylindrical portion 65 of the suction housing 62 and the holder body 70 of the pin holder 63 to allow the pin holder 63 to move up and down.
  • the push-up main shaft 74 rises from the lower end position and the pin holder 63 rises to a position where it contacts the ceiling surface of the cylindrical portion 65 or a position in the vicinity thereof, the push-up pin 71 is formed on the attracting surface 66 (ceiling surface). protrudes from the pin hole 66a. This protrusion enables the die 7 a to be pushed up by the push-up pin 71 .
  • the base member 52 and the pin base 72 correspond to the "support member” of the present invention. Specifically, the base member 52 and the pin base 72 correspond to the "base portion” and the “movable portion,” respectively.
  • the push-up head 50A has a negative pressure supply mechanism for sucking the wafer sheet 8a.
  • This negative pressure supply mechanism includes a negative pressure port portion 57 provided in the lower portion of the base member 52 and a negative pressure passage 56 formed inside the base member 52 .
  • the negative pressure port portion 57 is connected to a negative pressure generator 58 (see FIG. 3) through a pipe (not shown).
  • the negative pressure passage 56 introduces the negative pressure supplied to the negative pressure port portion 57 into the through hole 55 . Thereby, a negative pressure is supplied to the interior of the suction housing 62 (cylindrical portion 65 ) through the through hole 55 .
  • the attraction surface 66 is formed with a plurality of concentrically formed annular grooves and openings (not shown) that communicate the annular grooves with the interior of the attraction housing 62 .
  • a negative pressure passage formed between the suction housing 62 and the pin holder 63 communicates with each opening, and negative pressure is supplied to each annular groove through each opening (wafer sheet 8a is sucked through each annular groove). ), the wafer sheet 8 a is attracted to the attraction surface 66 .
  • the push-up unit 40 has a movable frame 48 that can move in the X direction with respect to the base frame 47.
  • the push-up heads 50A and 50B are mounted on the movable frame 48 side by side in the X direction.
  • the movable frame 48 is connected to an operating shaft 49a of a first air cylinder 49 fixed to the base frame 47, and the operation of the first air cylinder 49 causes the movable frame 48 to move back and forth in the X direction.
  • one thrust head 50A is placed at a predetermined working position Wp (state shown in FIG. 3), and when it is placed at the retracted position, the other thrust head 50B is placed.
  • the switching mechanism D4 is composed of the movable frame 48 and the first air cylinder 49. As shown in FIG.
  • the push-up heads 50A and 50B are vertically supported by a pair of guide rails 51 provided on the movable frame 48 and extending in the Z direction.
  • a first elevating mechanism D5 for elevating the push-up heads 50A and 50B includes the pair of guide rails 51, a first push-up member 81, a second air cylinder 80, and a cam mechanism (not shown).
  • the first push-up member 81 is provided so as to be able to move up and down below the push-up head 50A (50B) arranged at the working position Wp.
  • the first push-up member 81 moves up and down by the actuation of the cam mechanism by the second air cylinder 80, and raises and lowers the push-up head 50A (50B) arranged at the working position Wp between the raised position and the lowered position.
  • the raised position is a height position at which the suction surface 66 of the suction housing 62 contacts or approaches the lower surface of the wafer sheet 8a of the wafer holding frame 8 placed on the wafer stage 10 .
  • a second elevating mechanism D6 for elevating the push-up pin 71 includes a second push-up member 82, a Z-axis servomotor 84, and a transmission mechanism 83. Each element of the second elevating mechanism D6 is assembled to a bracket (not shown) fixed to the first lifting member 81. As shown in FIG. Therefore, the second lifting mechanism D6 moves up and down together with the first lifting member 81. As shown in FIG.
  • the second push-up member 82 is arranged on the -Y side of the first push-up member 81 below the push-up head 50A (50B) arranged at the working position Wp.
  • the second push-up member 82 is a block-shaped member having a flat upper surface.
  • the second push-up member 82 is movably supported by a guide member (not shown) fixed to the bracket, and is driven by a Z-axis servomotor 84 via a transmission mechanism 83 such as a screw feed mechanism. ascending and descending along
  • Reference numeral 58 in FIG. 3 denotes a negative pressure generator fixed to the base frame 47.
  • the negative pressure generator 58 is connected to the negative pressure ports 57 of the push-up heads 50A and 50B via piping (not shown).
  • the negative pressure generator 58 switches between supplying negative pressure for attracting the wafer sheet to the push-up heads 50A and 50B and stopping the supply (release to the atmosphere).
  • FIGS. 7A to 7C are explanatory diagrams of the pushing-up operation of the die 7a by the pushing-up heads 50A and 50B. 7, illustration of the die 7a (wafer 7) is omitted.
  • the push-up unit 40 is arranged below the wafer 7 and pushes up the die 7a through the wafer sheet 8a when the head 4H picks the die 7a from the wafer 7, as described above.
  • a specific operation of the push-up unit 40 is as follows.
  • the push-up head used for pushing up the die 7a is placed at the working position Wp by the operation of the switching mechanism D4. Further, the thrusting unit 40 is moved by the operation of the driving mechanism D3, and the thrusting head 50A (50B) arranged at the working position Wp is arranged below the die 7a to be pushed up (FIG. 7(A)).
  • the thrusting head 50A (50B) located at the working position Wp is lifted by the operation of the first lifting mechanism D5 (Fig. 7(B)).
  • the suction surface 66 of the suction housing 62 contacts or approaches the lower surface of the wafer sheet 8a, and the wafer sheet 8a is suctioned by the suction surface 66 under negative pressure.
  • This negative pressure suction is performed substantially simultaneously with the timing when the push-up head 50A (50B) reaches the raised end position (simultaneously when the suction surface 66 abuts or approaches the lower surface of the wafer sheet 8a).
  • the pin holder 63 moves up and down together with the push-up main shaft 74 due to the operation of the second elevating mechanism D6.
  • the push-up pin 71 protrudes from the suction housing 62 (suction surface 66), penetrates the wafer sheet 8a, and pushes up the die 7a (FIG. 7(C)).
  • the push-up pins 71 pin holders 63
  • the mode of elevation either a mode in which the push-up pin 71 is continuously raised and lowered, or a mode in which the push-up pin 71 temporarily stays at the position after being raised and then descends is performed.
  • the push-up pin 71 pin holder 63
  • the negative pressure supply from the negative pressure generator 58 is stopped.
  • the push-up unit 40 is moved by the operation of the drive mechanism D3, and the push-up head 50A (50B) is arranged below the die 7a to be pushed up next. in short.
  • the push-up unit 40 moves while the suction surface 66 of the suction housing 62 slides along the lower surface of the wafer sheet 8a and approaches along the lower surface of the wafer sheet 8a.
  • the wafer sheet 8a is sucked under negative pressure, and after the push-up pins 71 (pin holders 63) are raised and lowered by the operation of the second elevating mechanism D6 to push up the next die 7a (FIG. 7(C)), the wafer sheet 8a of negative pressure adsorption is stopped. Thereafter, the above-described pushing-up operation of the die 7a is repeated in the same manner.
  • the thrust-up tools 60 suitable for the die 7a to be thrust-up are incorporated in the thrust-up heads 50A and 50B. ) is required to replace the thrust tool 60 .
  • the push-up tool 60 since the push-up tool 60 includes the suction housing 62 and the pin holder 63, these need to be replaced.
  • the attraction housing 62 is fixed to the base member 52 by the fixed magnet 68, as described above.
  • the pin holder 63 is also fixed to the pin base 72 by a fixed magnet 72b. Therefore, the operator simply lifts and removes the suction housing 62 and the pin holder 63 from the base member 52 and the like in this order, and sets the new suction housing 62 and the pin holder 63 in the reverse order to their original positions.
  • the push-up tool 60 can be easily exchanged without any need.
  • the attraction forces of the stationary magnets 68 and 72b are both set within the range of 5 to 30N.
  • the range of the adsorption force is determined experimentally so that the adsorption stability of the adsorption housing 62 and the pin holder 63 and the operability of manual attachment/detachment by the operator can be compatible. Therefore, the operator can easily replace the suction housing 62 and the pin holder 63 with one touch.
  • the push-up tool 60 (suction housing 62 and pin holder 63) can be changed with a simpler structure than the conventional structure (Patent Document 1) having a clamp mechanism for replacing the push-up tool. becomes possible.
  • Patent Document 1 the conventional structure having a clamp mechanism for replacing the push-up tool. becomes possible.
  • it is basically a structure in which the fixed magnets 68 and 72b are simply incorporated in the base member 52, there is no significant increase in weight of the push-up head 50A (50B). Therefore, the increased weight of the push-up head 50A (50B) does not cause a problem that time loss tends to occur when the push-up unit 40 is moved.
  • fixed magnets 68 and 72b for fixing the push-up tool 60 are arranged only on the base member 52 and pin base 72 side. Therefore, the fixed magnets 68 and 72b can be shared for a plurality of types of push-up tools 60, which is rational.
  • the direction of the magnetic poles of the fixed magnet 68 that fixes the attraction housing 62 and the direction of the magnetic poles of the fixed magnet 72b that fixes the pin holder 63 are set to be the same. ing. That is, no repulsive force acts between the fixed magnet 68 and the fixed magnet 72b.
  • the upper surface side of the fixed magnet 72b (pin holder magnet) is the N pole
  • the upper surface side of the fixed magnet 68 (attraction housing magnet) is also set to the N pole (combination 1).
  • the upper surface of the fixed magnet 72b is the S pole
  • the upper surface of the fixed magnet 68 is also set to the S pole (combination 2).
  • the push-up heads 50A and 50B cause the suction surface 66 of the suction housing 62 to slide along or come close to the lower surface of the wafer sheet 8a when moving to the position of the next die 7a of the same wafer 7. to move (FIG. 7(B)).
  • the position of the fixed magnet 72b (second magnet) that fixes the pin holder 63 is positioned above the position of the fixed magnet 68 (first magnet) that fixes the attraction housing 62.
  • the adsorption housing 62 may rise against the elastic force of the coil spring 78 .
  • the push-up pins 71 may unintentionally protrude from the suction housing 62 and damage the wafer sheet 8a.
  • the configuration of the push-up unit 40 in which the fixed magnets 68 and 72b have the same magnetic pole direction there is no room for the repulsive force to occur, and the above-described inconveniences can be avoided.
  • the component mounting apparatus 1 described above is an example of a preferred embodiment of a component mounting apparatus to which the component pushing-up apparatus according to the present invention is applied. , can be changed as appropriate without departing from the gist of the present invention. For example, it is possible to employ the following configuration.
  • fixed magnets 68 and 72b for fixing the push-up tool 60 are arranged on the side of the base member 52 and the base body portion 72a.
  • the fixed magnets 68 and 72b may be provided on the push-up tool 60 (suction housing 62 and pin holder 63) side, or may be provided on both sides.
  • the fixed magnets 68 for fixing the attraction housing 62 are provided at regular intervals around the boss portion 53 on the upper surface 54 of the base member 52, and the fixed magnets 72b for fixing the pin holder 63 are provided in a ring shape. It is however, as long as the fixed magnets 68 and 72b can be detachably fixed to the attraction housing 62 and the pin holder 63, other specific aspects may be used.
  • the push-up tool 60 (attraction There is an advantage that the thrusting tool 60 can be stably fixed by applying a magnetic force to the housing 62 and the pin holder 63) in a well-balanced manner.
  • the component push-up apparatus according to the present invention is applied to a component mounting apparatus. It can be applied to various devices such as a taping device or a component mounting device that mounts the die on a substrate.
  • a component push-up device is a component push-up device that separates a die from a wafer sheet by pushing up the die from below the wafer attached to the wafer sheet, wherein the wafer an attracting surface that attracts the lower surface of the sheet under negative pressure; and a thrust tool that includes a thrust pin that is provided so as to be retractable from the attracting surface to the wafer sheet side and protrudes from the attracting surface to push up the die; a support member that is relatively movable along the wafer and detachably supports the push-up tool, and a magnet is provided on one side of the push-up tool and the support member. At least the surface facing the magnet on the other side is made of a magnetic material.
  • this part push-up device, it is possible to change (replace) the push-up tool with a simpler structure than the conventional structure with a dedicated clamping mechanism.
  • the support member includes a base portion and a movable portion that moves up and down relative to the base portion, and the push-up tool moves the suction surface to an upper end.
  • a hollow suction housing that is detachably supported by the base portion; a pin holder that ascends and descends together with the magnet, wherein the magnet is provided on one side of the attraction housing and the base portion, and at least the opposing surface of the magnet on the other side is formed of the magnetic material, and the pin holder and the movable portion, the magnet is provided on one side thereof, and at least the opposing surface of the magnet on the other side is formed of the magnetic material.
  • the magnet is provided on the side of the support member in the component push-up device.
  • the magnet is common to a plurality of push-up tools (attraction housing and pin holder), resulting in a rational configuration.
  • the pin holder is attached to the suction housing by the movable portion.
  • the second magnet which is the magnet for fixing the pin holder to the movable portion, is arranged above the first magnet, which is the magnet for fixing the attraction housing to the base portion.
  • a repulsive force acts between the two magnets, preventing proper operation of the pin holder. Avoided.
  • the magnets are provided intermittently at equal intervals around the push-up center of the push-up tool, or continuously in an annular shape.
  • the attraction force of the push-up tool by the magnet is within a range of 5 to 30N.
  • a component mounting apparatus includes a component supply section in which a wafer that has been diced and attached to a wafer sheet is placed, and a die is picked from the wafer placed in the component supply section. and the component push-up device according to any one of the above aspects, which pushes up the die from below the wafer sheet when the die is picked by the component transfer head. Prepare.
  • this component mounting apparatus since it is equipped with the component push-up device as described above, it is possible to change (replace) the push-up tool with a simple configuration.

Abstract

Provided is a component push-up device that pushes up a die from below a wafer attached to a wafer sheet to separate the die from the wafer sheet. The component push-up device includes a push-up tool including a suction surface that suctions the lower surface of the wafer sheet with negative pressure and a push-up pin that is capable of coming out from the suction surface toward the wafer sheet and protrudes from the suction surface to push up the die; and a support member that is movable along and relative to the wafer and detachably supports the push-up tool. A magnet is provided on one of the push-up tool and the support part, and at least a surface which is of the other thereof and faces the magnet is formed of a magnetic material.

Description

部品突上げ装置及び部品実装装置Component push-up device and component mounting device
 本発明は、ウェハシートに貼着されているウェハからダイ(ベアチップ)をピックアップする際に、ウェハシートの下方からダイを突上げて剥離させる部品突上げ装置、及びこの部品突上げ装置を備えた部品実装装置に関する。 The present invention includes a component push-up device that pushes up and separates a die (bare chip) from below a wafer sheet when picking up the die (bare chip) from the wafer attached to the wafer sheet, and the component push-up device. It relates to a component mounting apparatus.
 ダイシングされたウェハからダイ(ベアチップ)をピックアップして基板に実装する部品実装装置が知られている。この部品実装装置では、ウェハ供給機によって機内の所定位置(部品配置エリア)に搬入されたウェハを、ウェハカメラが撮像してウェハ認識を行い、次いでダイの保持機能を備えたヘッドでダイをピッキングするという動作が繰り返される。 A component mounting apparatus that picks up a die (bare chip) from a diced wafer and mounts it on a substrate is known. In this component mounting apparatus, a wafer camera takes an image of a wafer carried into a predetermined position (component placement area) inside the machine by a wafer feeder to recognize the wafer, and then the die is picked by a head equipped with a die holding function. The action of doing is repeated.
 部品実装装置には、ウェハシートに貼着されたウェハの下方からダイを突上げることにより、ダイのピッキングに先立ち、ウェハシートからダイを剥離させる、部品突上げ装置が備えられる。部品突上げ装置は、円柱状の吸着ハウジングと、その中心部に出没可能に設けられた突上げピンとを備え、吸着ハウジングでウェハシートを下面から吸着した状態で、突上げピンによってダイを下方から突上げる。 The component mounting device is equipped with a component push-up device that separates the die from the wafer sheet prior to die picking by pushing up the die from below the wafer attached to the wafer sheet. The component push-up device includes a columnar suction housing and a push-up pin provided at the center thereof so as to be retractable. With the wafer sheet sucked from below by the suction housing, the die is pushed up from below by the push-up pin. Push up.
 ダイのサイズは多種多様であり、部品突上げ装置には、ダイのサイズに適した吸着ハウジング及び突上げピンを用いることが求められる。例えば特許文献1には、吸着ハウジング及び突上げピンを各々備えた吸着ポットと称するユニットを備え、当該吸着ポットが交換可能とされた部品突上げ装置が開示されている。吸着ポットにはクランプ機構が組込まれており、所定の取付部に対してレバー操作で着脱、交換が可能となっている。 There are a wide variety of die sizes, and it is required that the component push-up device use a suction housing and push-up pin that are suitable for the size of the die. For example, Japanese Laid-Open Patent Publication No. 2002-100000 discloses a component push-up device that includes a unit called a suction pot that includes a suction housing and a push-up pin, and that the suction pot is replaceable. A clamping mechanism is incorporated in the suction pot, and it can be attached to, detached from, or replaced by operating a lever on a predetermined mounting portion.
 しかし、特許文献1の部品突上げ装置では、クランプ機構が組込まれる分、吸着ハウジングや突上げピンの周辺構造が複雑になる。また、吸着ハウジング及び突上げピンを備えた移動可能なヘッドを備え、当該ヘッドがウェハに対して移動しながらダイを突上げるタイプの部品突上げ装置の場合、クランプ機構が組込まれることによるヘッドの高重量化がタクトタイムのロス要因となることが考えられる。 However, in the component push-up device of Patent Document 1, the surrounding structure of the suction housing and the push-up pin becomes complicated because the clamp mechanism is incorporated. In addition, in the case of a component push-up device of the type that has a movable head equipped with a suction housing and push-up pins, and pushes up the die while the head moves relative to the wafer, the head is lifted by incorporating a clamping mechanism. It is conceivable that the increase in weight causes loss of takt time.
特開2012-169321号公報JP 2012-169321 A
 本発明は、既述の課題に鑑みてなされてものであり、その目的は、部品突上げ装置において、吸着ハウジングや突き上げピン等の突き上げツールを、より簡素な構成で変更可能とすることにある。 SUMMARY OF THE INVENTION The present invention has been made in view of the above-mentioned problems, and its object is to make it possible to change the push-up tool such as the suction housing and the push-up pin in a component push-up device with a simpler configuration. .
 本発明の一局面に係る部品突上げ装置は、ウェハシートに貼着されたウェハの下方からダイを突上げることにより、当該ダイを前記ウェハシートから剥離させる部品突上げ装置であって、前記ウェハシートの下面を負圧吸着する吸着面、及びこの吸着面からウェハシート側に出没可能に設けられて、前記吸着面から突出することにより前記ダイを突上げる突上げピンを含む突上げツールと、前記ウェハに沿って相対的に移動可能に設けられて、前記突上げツールを着脱可能に支持する支持部材と、を備え、前記突上げツール及び前記支持部材の何れか一方側に磁石が備えられるとともに、他方側のうち少なくとも前記磁石の対向面が磁性材料により形成されている。 A component push-up device according to one aspect of the present invention is a component push-up device that separates a die from a wafer sheet by pushing up the die from below the wafer attached to the wafer sheet, wherein the wafer an attracting surface that attracts the lower surface of the sheet under negative pressure; and a thrust tool that includes a thrust pin that is provided so as to be retractable from the attracting surface to the wafer sheet side and protrudes from the attracting surface to push up the die; a support member that is relatively movable along the wafer and detachably supports the push-up tool, and a magnet is provided on one side of the push-up tool and the support member. At least the surface facing the magnet on the other side is made of a magnetic material.
 また、本発明の一局面に係る部品実装装置は、ダイシングされてウェハシートに貼着された状態のウェハが配置される部品供給部と、前記部品供給部に配置されたウェハからダイをピッキングして基板に移載する部品移載ヘッドと、前記部品移載ヘッドによるダイのピッキングの際に、前記ウェハシートの下方から前記ダイを突き上げる、上記の部品突上げ装置と、を備える。 In addition, a component mounting apparatus according to one aspect of the present invention includes a component supply unit in which a wafer that has been diced and attached to a wafer sheet is placed, and a die is picked from the wafer placed in the component supply unit. a component transfer head that transfers the component onto a substrate by means of the component transfer head;
図1は、本発明の実施形態に係る部品実装装置(本発明の部品突上げ装置が備えられた部品実装装置)の全体構成を示す、上面視の平面図である。FIG. 1 is a top plan view showing the overall configuration of a component mounting apparatus according to an embodiment of the present invention (a component mounting apparatus provided with a component pushing-up apparatus of the present invention). 図2は、ヘッドユニット及び突き上げユニットを示す概略斜視図である。FIG. 2 is a schematic perspective view showing a head unit and a push-up unit. 図3は、突き上げユニットの斜視図である。FIG. 3 is a perspective view of a push-up unit. 図4は、突き上げユニットの要部拡大斜視図である。FIG. 4 is an enlarged perspective view of a main portion of the push-up unit. 図5は、突上げヘッドの斜視図である。FIG. 5 is a perspective view of the push-up head. 図6は、突上げヘッドの断面図である。FIG. 6 is a cross-sectional view of the push-up head. 図7(A)~(C)は、突上げヘッドによるダイの突き上げ動作の説明図である。FIGS. 7A to 7C are explanatory diagrams of the pushing-up operation of the die by the pushing-up head. 図8は、吸着ハウジングの固定マグネットと吸着ハウジングの固定マグネットとの磁極の関係を示す表図である。FIG. 8 is a table showing the magnetic pole relationship between the fixed magnets of the attraction housing and the fixed magnets of the attraction housing.
 以下、添付図面を参照しながら本発明の好ましい実施形態について詳述する。 Preferred embodiments of the present invention will be described in detail below with reference to the accompanying drawings.
 [部品実装装置の説明]
 図1は、本発明の実施形態に係る部品実装装置1の全体構成を示す、上面視の平面図である。部品実装装置1は、ウェハ7からダイシングされたダイ7a(部品)を基板Pに実装する装置である。部品実装装置1は、基台2、コンベア3、ヘッドユニット4、部品供給部5(部品配置エリア)、ウェハ供給装置6、カメラユニット32U及び突き上げユニット40を含む。図2は、ヘッドユニット4と、図1では表出しない突き上げユニット40とを示す概略斜視図である。
[Description of component mounter]
FIG. 1 is a top plan view showing the overall configuration of a component mounting apparatus 1 according to an embodiment of the present invention. The component mounting apparatus 1 is an apparatus that mounts a die 7a (component) diced from a wafer 7 on a substrate P. FIG. The component mounting apparatus 1 includes a base 2 , a conveyor 3 , a head unit 4 , a component supply section 5 (component placement area), a wafer supply apparatus 6 , a camera unit 32U and a push-up unit 40 . FIG. 2 is a schematic perspective view showing the head unit 4 and the push-up unit 40 not shown in FIG.
 基台2は、部品実装装置1が備える各種の機器の搭載ベースである。コンベア3は、基台2上にX方向に延びるように設置された、基板Pの搬送ラインである。コンベア3は、機外から所定の実装作業位置に基板Pを搬入し、実装作業後に基板Pを前記作業位置から機外へ搬出する。なお、図1中に基板Pが示されている位置が、前記実装作業位置である。部品供給部5は、複数個のダイ7aを、ウェハ7からダイシングされた配置状態で供給する。 The base 2 is a mounting base for various devices provided in the component mounting apparatus 1 . The conveyor 3 is a transport line for the substrate P installed on the base 2 so as to extend in the X direction. The conveyor 3 carries the board P from the outside to a predetermined mounting work position, and carries the board P out of the machine from the work position after the mounting work. The position where the substrate P is shown in FIG. 1 is the mounting work position. The component supply unit 5 supplies a plurality of dies 7a arranged by dicing from the wafer 7 .
 ヘッドユニット4は、部品供給部5においてダイ7aをピッキングし、上記実装作業位置へ移動すると共に、基板Pにダイ7aを実装する。ヘッドユニット4は、前記ピッキングの際にダイ7aを吸着して保持する複数のヘッド4H(本発明の「部品移載ヘッド」)を備える。ヘッド4Hは、ヘッドユニット4に対するZ方向への進退(昇降)移動と、軸回りの回転移動とが可能である。ヘッドユニット4には、基板Pを撮像する基板認識カメラ31が搭載されている。基板認識カメラ31の撮影画像より、基板Pに付されたフェデューシャルマークが認識され、部品実装時に前記位置ずれの補正が為される。 The head unit 4 picks the die 7a in the component supply unit 5, moves to the mounting work position, and mounts the die 7a on the board P. The head unit 4 includes a plurality of heads 4H (“component transfer heads” of the present invention) that attract and hold the die 7a during the picking. The head 4H can move back and forth (up and down) in the Z direction with respect to the head unit 4 and can rotate about its axis. The head unit 4 is equipped with a substrate recognition camera 31 that captures an image of the substrate P. As shown in FIG. The feducial mark attached to the board P is recognized from the photographed image of the board recognition camera 31, and the positional deviation is corrected at the time of component mounting.
 部品実装装置1は、ヘッドユニット4を、部品供給部5と前記実装作業位置で保持された基板Pとの間で、水平方向(X及びY方向)に移動可能とする駆動機構D1を備える。駆動機構D1は、+X側及び-X側で一対のY軸固定レール13、第1Y軸サーボモータ14及びボールねじ軸15と、一対の前記Y軸固定レール13間に架設された支持フレーム16とを備えている。ボールねじ軸15は、前記支持フレーム16に備えられたナット17に螺合している。また、駆動機構D1は、支持フレーム16に搭載された図略のガイド部材、第1X軸サーボモータ18及びボールねじ軸19を備える。前記ガイド部材は、ヘッドユニット4をX方向に移動可能に支持しており、ボールねじ軸19は、前記ヘッドユニット4に備えられた図外のナットに螺合している。 The component mounting apparatus 1 includes a drive mechanism D1 that allows the head unit 4 to move horizontally (X and Y directions) between the component supply unit 5 and the board P held at the mounting position. The drive mechanism D1 includes a pair of Y-axis fixed rails 13, a first Y-axis servomotor 14 and a ball screw shaft 15 on the +X side and the -X side, and a support frame 16 constructed between the pair of Y-axis fixed rails 13. It has The ball screw shaft 15 is screwed onto a nut 17 provided on the support frame 16 . The drive mechanism D<b>1 also includes a guide member (not shown) mounted on the support frame 16 , a first X-axis servomotor 18 and a ball screw shaft 19 . The guide member supports the head unit 4 so as to be movable in the X direction, and the ball screw shaft 19 is screwed to a nut (not shown) provided on the head unit 4 .
 以上の駆動機構D1の作動により、ヘッドユニット4が水平方向(X及びY方向)に移動する。つまり、第1Y軸サーボモータ14によりボールねじ軸15が回転駆動されることにより、ヘッドユニット4が支持フレーム16と一体にY方向に移動する。また、第1X軸サーボモータ18によりボールねじ軸19が回転駆動されることにより、ヘッドユニット4が支持フレーム16に対してX方向に移動する。 By the above operation of the drive mechanism D1, the head unit 4 moves in the horizontal direction (X and Y directions). That is, when the ball screw shaft 15 is rotationally driven by the first Y-axis servomotor 14, the head unit 4 moves together with the support frame 16 in the Y direction. Further, the head unit 4 moves in the X direction with respect to the support frame 16 by rotationally driving the ball screw shaft 19 by the first X-axis servomotor 18 .
 部品供給部5は、複数個のダイ7aをウェハ7の形態で、所定の部品取出作業位置(ウェハステージ10)へ供給するウェハ供給装置6を備える。ウェハ供給装置6は、ウェハシート8aを保持するウェハ保持枠8を含む。ウェハシート8a上には、ウェハ7を碁盤目状にダイシングされて形成された多数のダイ7a,7a…の集合体が貼着されている。ウェハ供給装置6は、ウェハ保持枠8を入れ替える態様で、ダイ7aを前記部品取出作業位置へ供給する。 The component supply unit 5 includes a wafer supply device 6 that supplies a plurality of dies 7a in the form of wafers 7 to a predetermined component extraction work position (wafer stage 10). The wafer feeder 6 includes a wafer holding frame 8 that holds a wafer sheet 8a. An assembly of a large number of dies 7a, 7a, . The wafer feeder 6 feeds the dies 7a to the component extraction work position in such a manner that the wafer holding frame 8 is replaced.
 ウェハ供給装置6は、ウェハ収納エレベータ9、ウェハステージ10及びウェハコンベア11を含む。ウェハ収納エレベータ9は、ウェハ7が貼着されたウェハシート8aをウェハ保持枠8に保持した状態で、上下多段に収納している。ウェハステージ10は、ウェハ収納エレベータ9の-Y側の位置において、基台2上に設置されている。基板Pの停止位置となる前記実装作業位置に対して、ウェハステージ10は+Y側に並ぶ位置に配置されている。ウェハコンベア11は、ウェハ収納エレベータ9からウェハステージ10上にウェハ保持枠8を引き出す。 The wafer supply device 6 includes a wafer storage elevator 9, a wafer stage 10 and a wafer conveyor 11. The wafer storage elevator 9 stores the wafer sheets 8a to which the wafers 7 are adhered on the wafer holding frame 8 in multiple stages. A wafer stage 10 is installed on the base 2 at a position on the -Y side of the wafer storage elevator 9 . The wafer stage 10 is arranged at a position aligned on the +Y side with respect to the mounting work position where the substrate P is stopped. A wafer conveyor 11 draws the wafer holding frame 8 from the wafer storage elevator 9 onto the wafer stage 10 .
 カメラユニット32Uは、X方向及びY方向に移動可能なユニットであって、ウェハカメラ32を備えている。ウェハカメラ32は、ウェハステージ10上に位置決めされたウェハ7の一部分、つまりカメラ視野内のダイ7aを撮像する。この撮像画像に基づいて、ピックアップ対象のダイ7aの位置認識が為される。部品実装装置1は、カメラユニット32Uを、部品供給部5と所定の待機位置との間で、水平方向(X及びY方向)に移動可能とする駆動機構D2を備える。 The camera unit 32U is a unit that is movable in the X and Y directions, and includes the wafer camera 32. Wafer camera 32 images a portion of wafer 7 positioned on wafer stage 10, that is, die 7a within the camera's field of view. Based on this captured image, the position of the die 7a to be picked up is recognized. The component mounting apparatus 1 includes a drive mechanism D2 that allows the camera unit 32U to move in the horizontal direction (X and Y directions) between the component supply unit 5 and a predetermined standby position.
 駆動機構D2は、+X側及び-X側で一対のY軸固定レール33と、+X側に配置された第2Y軸サーボモータ34及びボールねじ軸35と、前記一対のY軸固定レール33間に架設された支持フレーム36とを備える。ボールねじ軸35は、支持フレーム36に備えられたナット37に螺合している。また、駆動機構D2は、支持フレーム36に搭載された図略のガイド部材、第2X軸サーボモータ38及びボールねじ軸39を備える。前記ガイド部材は、カメラユニット32UをX方向に移動可能に支持しており、ボールねじ軸39は、前記カメラユニット32Uに備えられた図外のナットに螺合している。 The drive mechanism D2 includes a pair of Y-axis fixed rails 33 on the +X side and the -X side, a second Y-axis servomotor 34 and a ball screw shaft 35 arranged on the +X side, and between the pair of Y-axis fixed rails 33. and a suspended support frame 36 . The ball screw shaft 35 is screwed onto a nut 37 provided on the support frame 36 . The drive mechanism D<b>2 also includes a guide member (not shown) mounted on the support frame 36 , a second X-axis servomotor 38 and a ball screw shaft 39 . The guide member supports the camera unit 32U so as to be movable in the X direction, and the ball screw shaft 39 is screwed to a nut (not shown) provided on the camera unit 32U.
 以上の駆動機構D2の作動により、カメラユニット32Uが水平方向(X及びY方向)に移動する。つまり、第2Y軸サーボモータ34によりボールねじ軸35が回転駆動されることにより、カメラユニット32Uが支持フレーム36と一体にY方向に移動する。また、第2X軸サーボモータ38によりボールねじ軸39が回転駆動されることにより、カメラユニット32Uが支持フレーム36に対してX方向に移動する。 By the operation of the drive mechanism D2 described above, the camera unit 32U moves in the horizontal direction (X and Y directions). That is, when the ball screw shaft 35 is rotationally driven by the second Y-axis servomotor 34, the camera unit 32U moves together with the support frame 36 in the Y direction. Further, the camera unit 32U moves in the X direction with respect to the support frame 36 by rotationally driving the ball screw shaft 39 by the second X-axis servomotor 38 .
 突き上げユニット40は、部品供給部5の下方に配置され、ヘッド4Hが吸着すべきダイ7aを、ウェハシート8aの下面側から突き上げる。突き上げユニット40は、ウェハステージ10に対応する程度の範囲にわたってXY方向に移動可能に、基台2上に配置されている。部品実装装置1は、突き上げユニット40を移動可能とする駆動機構D3を備える。 The push-up unit 40 is arranged below the component supply unit 5, and pushes up the die 7a to be picked up by the head 4H from the lower surface side of the wafer sheet 8a. The push-up unit 40 is arranged on the base 2 so as to be movable in the XY directions over a range corresponding to the wafer stage 10 . The component mounting apparatus 1 includes a drive mechanism D3 that allows the push-up unit 40 to move.
 駆動機構D3は、Y方向に延びる一対のガイドレール41に沿って移動可能な支持フレーム42と、Y方向に延びるボールねじ軸43と、第3Y軸サーボモータ44とを備える。ボールねじ軸43は、支持フレーム42に備えられた図外のナットに螺合している。X方向移動機構は、支持フレーム42に搭載された図略のガイド部材、第3X軸サーボモータ46及びボールねじ軸45を備える。前記ガイド部材は、突き上げユニット40をX方向に移動可能に支持しており、ボールねじ軸45は、前記突き上げユニット40に備えられた図外のナットに螺合している。 The drive mechanism D3 includes a support frame 42 movable along a pair of guide rails 41 extending in the Y direction, a ball screw shaft 43 extending in the Y direction, and a third Y-axis servomotor 44. The ball screw shaft 43 is screwed into a nut (not shown) provided on the support frame 42 . The X-direction movement mechanism includes a guide member (not shown) mounted on the support frame 42 , a third X-axis servomotor 46 and a ball screw shaft 45 . The guide member supports the push-up unit 40 so as to be movable in the X direction, and the ball screw shaft 45 is screwed to a nut (not shown) provided on the push-up unit 40 .
 以上の駆動機構D3の作動により、突き上げユニット40が水平方向(X及びY方向)に移動する。つまり、第3Y軸サーボモータ44によりボールねじ軸43が回転駆動されることにより、突き上げユニット40が支持フレーム42と一体にY方向に移動する。また、第3X軸サーボモータ46によりボールねじ軸45が回転駆動されることにより、突き上げユニット40が支持フレーム42に対してX方向に移動する。 By the above operation of the drive mechanism D3, the push-up unit 40 moves in the horizontal direction (X and Y directions). That is, when the ball screw shaft 43 is rotationally driven by the third Y-axis servomotor 44, the push-up unit 40 moves together with the support frame 42 in the Y direction. Further, the ball screw shaft 45 is rotationally driven by the third X-axis servomotor 46, so that the push-up unit 40 moves in the X direction with respect to the support frame 42. As shown in FIG.
 突き上げユニット40は、後に詳述する通り、ダイ7aを突き上げる突き上げピン71を各々備えた2つの突上げヘッド50A、50Bを有する(図2では突き上げピン71のみ図示)。突き上げユニット40は、ヘッド4Hによるダイ7aの吸着時に、突き上げピン71を上昇させ、ウェハシート8aを通してダイ7aを突き上げる。なお、当例では、既述の突き上げユニット40及び駆動機構D3が本発明の「部品突上げ装置」に相当する。 The push-up unit 40 has two push-up heads 50A and 50B each provided with a push-up pin 71 for pushing up the die 7a (only the push-up pin 71 is shown in FIG. 2), as will be described in detail later. The push-up unit 40 raises the push-up pins 71 to push up the die 7a through the wafer sheet 8a when the die 7a is sucked by the head 4H. In this example, the pushing-up unit 40 and the drive mechanism D3 described above correspond to the "parts pushing-up device" of the present invention.
 基台2には、部品認識カメラ30が据え付けられている。部品認識カメラ30は、ヘッドユニット4のヘッド4Hに吸着されているダイ7aを、基板Pへの実装の前に下側から撮像する。この撮像画像に基づいて、ヘッド4Hによるダイ7aの吸着異常や吸着ミス等が判定される。 A component recognition camera 30 is installed on the base 2 . The component recognition camera 30 images the die 7a sucked by the head 4H of the head unit 4 from below before being mounted on the substrate P. As shown in FIG. Based on this captured image, it is determined whether the head 4H has picked up the die 7a abnormally or picked up incorrectly.
 以上の部品実装装置1の基本動作は、次の通りである。まず、ウェハ収納エレベータ9からウェハ保持枠8がウェハコンベア11によって引き出される。これにより、多数のダイ7a,7a…の集合体(ウェハ7)が貼着されたウェハシート8aがウェハ保持枠8と共にウェハステージ10に配置される。 The basic operation of the component mounting apparatus 1 described above is as follows. First, the wafer holding frame 8 is pulled out from the wafer storage elevator 9 by the wafer conveyor 11 . Accordingly, the wafer sheet 8a to which the assembly (wafer 7) of the many dies 7a, 7a, . . .
 次に、カメラユニット32Uがウェハステージ10の上空に移動してウェハ7を撮像する。カメラユニット32Uの撮像は、後のピッキング動作でヘッド4Hが吸着するダイ7a群の認識のためである。 Next, the camera unit 32U moves above the wafer stage 10 and images the wafer 7. The imaging by the camera unit 32U is for recognition of the group of dies 7a to be picked up by the head 4H in the later picking operation.
 ダイ7a群の撮像が完了すると、カメラユニット32Uが、ウェハステージ10の上空から退避移動する一方、ヘッドユニット4がウェハステージ10の上空へ、突き上げユニット40がウェハ7の下方に各々配置される。そして、カメラユニット32Uによる撮像で認識されたダイ7a群を、ヘッド4Hがウェハ7からピッキングする。この際、突き上げユニット40の突き上げピン71が上昇し、ウェハシート8aを通してダイ7aを突き上げる。 When the imaging of the group of dies 7a is completed, the camera unit 32U is retracted from above the wafer stage 10, while the head unit 4 is placed above the wafer stage 10 and the push-up unit 40 is placed below the wafer 7, respectively. Then, the head 4H picks from the wafer 7 a group of dies 7a recognized by the imaging by the camera unit 32U. At this time, the push-up pins 71 of the push-up unit 40 are raised to push up the die 7a through the wafer sheet 8a.
 ダイ7aのピッキング後、ヘッドユニット4がウェハステージ10の上空から、部品認識カメラ30を経由して実装作業位置の基板Pの上空へ移動する。これにより、ヘッド4Hで吸着したダイ7aが基板Pに実装される。 After picking the die 7a, the head unit 4 moves from above the wafer stage 10 to above the substrate P at the mounting work position via the component recognition camera 30. As a result, the die 7a sucked by the head 4H is mounted on the substrate P. As shown in FIG.
 なお、ダイ7aのピッキング後、ヘッドユニット4がウェハステージ10の上空から移動すると、これに同期して、カメラユニット32Uがウェハステージ10の上空へ進入移動する。以降、ウェハステージ10の上空に、ヘッドユニット4とカメラユニット32Uとが順次入れ替わるように移動し、ダイ7aのピッキング及び基板Pへの実装動作が繰り替えされる。 After picking the die 7a, when the head unit 4 moves from above the wafer stage 10, the camera unit 32U enters and moves above the wafer stage 10 in synchronization with this movement. After that, the head unit 4 and the camera unit 32U are moved above the wafer stage 10 so as to be sequentially replaced, and the picking of the die 7a and the mounting operation on the substrate P are repeated.
 [突き上げユニット40の詳細構造]
 図3は、突き上げユニット40の斜視図であり、図4は、突き上げユニット40の要部拡大斜視図である。また、図5は、突き上げユニット40に備えられる突上げヘッド50A、50Bの斜視図であり、図6は、突上げヘッド50A、50Bの断面図である。
[Detailed structure of push-up unit 40]
FIG. 3 is a perspective view of the push-up unit 40, and FIG. Also, FIG. 5 is a perspective view of the push-up heads 50A and 50B provided in the push-up unit 40, and FIG. 6 is a cross-sectional view of the push-up heads 50A and 50B.
 突き上げユニット40は、前記駆動機構D3に連結されたベースフレーム47を有する。ベースフレーム47には、一対の突上げヘッド50A、50Bと、突上げヘッド50A、50Bを切り替える切替機構D4と、突上げヘッド50A、50BをZ方向に進退(昇降)移動させる第1昇降機構D5と、突上げヘッド50A、50Bに備えられる後記突き上げピン71をZ方向に進退(昇降)移動させる第2昇降機構D6とを含む。 The push-up unit 40 has a base frame 47 connected to the drive mechanism D3. The base frame 47 includes a pair of push-up heads 50A and 50B, a switching mechanism D4 for switching between the push-up heads 50A and 50B, and a first lifting mechanism D5 for advancing and retreating (elevating) the push-up heads 50A and 50B in the Z direction. and a second elevating mechanism D6 for advancing and retreating (elevating) in the Z direction the thrusting pins 71 provided in the thrusting heads 50A and 50B.
 突上げヘッド50A、50Bは、ヘッド4Hによるダイ7aの吸着時に、ウェハシート8aを通してダイ7aを突き上げるものである。突上げヘッド50A、50Bは、後記突上げツール60の種類が異なる以外は、基本的に同一の構造である。 The push-up heads 50A and 50B push up the die 7a through the wafer sheet 8a when the die 7a is sucked by the head 4H. The push-up heads 50A and 50B have basically the same structure except for the type of push-up tool 60 described later.
 図5及び図6に示すように、突上げヘッド50A(50B)は、ベース部材52と、このベース部材52に組付けられる突上げツール60とを備える。突上げツール60は、ウェハシート8aを下方から吸着するための吸着ハウジング62と、ピンホルダ63とを含む。ピンホルダ63は、有天円筒形状のホルダ本体70と、その上端部に保持された突き上げピン71とで構成される。この突き上げピン71がダイ7aを突き上げる。 As shown in FIGS. 5 and 6, the push-up head 50A (50B) includes a base member 52 and a push-up tool 60 attached to the base member 52. As shown in FIGS. The push-up tool 60 includes a suction housing 62 and a pin holder 63 for sucking the wafer sheet 8a from below. The pin holder 63 is composed of a cylindrical holder body 70 with a ceiling and a push-up pin 71 held at the upper end thereof. This push-up pin 71 pushes up the die 7a.
 ピンホルダ63に備えられる突き上げピン71の数及び配置、突き上げピン71のサイズ(径、長さ)及び先端形状は、ダイ7aのサイズやそこに形成される回路等に応じて最適な態様が相違する。そのため、複数種類のピンホルダ63の中から、ダイ7aに対応する最適な突き上げピン71を備えたピンホルダ63が選択されて突上げヘッド50A(50B)に組み込まれる。 The number and arrangement of the push-up pins 71 provided in the pin holder 63, the size (diameter, length) and tip shape of the push-up pins 71 differ in the optimum mode according to the size of the die 7a, the circuit formed thereon, and the like. . Therefore, a pin holder 63 having an optimum push-up pin 71 corresponding to the die 7a is selected from among a plurality of types of pin holders 63 and incorporated into the push-up head 50A (50B).
 突上げヘッド50A(50B)は、ベース部材52に昇降可能に支持された突上げ主軸74を備えている。前記ピンホルダ63は、この突上げ主軸74の上端部に着脱可能に固定される。突上げ主軸74はスプライン軸であり、ベース部材52に形成された貫通穴55内に固定されるスプライン軸受75に昇降自在(Z方向に移動自在)に支持されている。突上げ主軸74の上端部近傍には、当該突上げ主軸74を僅かに上方に突出させた状態(突出部74aという)で円筒状のピンベース72が固定されている。 The push-up head 50A (50B) has a push-up main shaft 74 supported by the base member 52 so as to be able to move up and down. The pin holder 63 is detachably fixed to the upper end of the push-up main shaft 74 . The push-up main shaft 74 is a spline shaft, and is supported vertically (movably in the Z direction) by a spline bearing 75 fixed in a through hole 55 formed in the base member 52 . A cylindrical pin base 72 is fixed near the upper end of the push-up main shaft 74 so that the push-up main shaft 74 projects slightly upward (referred to as a projecting portion 74a).
 ピンベース72は、ベース本体部72aと、その上端に積層配置される固定マグネット72bとを備える。固定マグネット72bは、Z方向に扁平なリング形状であり、その中心を前記突出部74aが貫通する状態でベース本体部72a上に配置され、前記突出部74a(突上げ主軸74)に対して抜け止めされている。 The pin base 72 includes a base body portion 72a and a fixed magnet 72b stacked on the upper end thereof. The stationary magnet 72b has a ring shape that is flat in the Z direction, and is arranged on the base body portion 72a with the protrusion 74a penetrating through the center of the fixed magnet 72b. being stopped.
 前記ピンホルダ63は、前記突出部74aがホルダ本体70の内側に挿入され、かつ当該突出部74aに対して周方向に位置決めされた状態で、ピンベース72上に配置される。ホルダ本体70の全体、又はホルダ本体70のうち少なくともピンベース72(固定マグネット72b)との対向面は鉄等の磁性材料で形成されている。つまり、ピンホルダ63は、固定マグネット72bの磁力によってピンベース72に固定されている。ピンホルダ63(ホルダ本体70)とピンベース72とは同等の外径を有しており、ピンホルダ63がピンベース72に固定された状態で、これらは一体の円柱形状を成す。 The pin holder 63 is arranged on the pin base 72 with the projecting portion 74a inserted inside the holder body 70 and positioned in the circumferential direction with respect to the projecting portion 74a. The entire holder body 70, or at least the surface of the holder body 70 facing the pin base 72 (fixed magnet 72b) is made of a magnetic material such as iron. That is, the pin holder 63 is fixed to the pin base 72 by the magnetic force of the fixed magnet 72b. The pin holder 63 (holder main body 70) and the pin base 72 have the same outer diameter, and when the pin holder 63 is fixed to the pin base 72, they form an integral columnar shape.
 前記突上げ主軸74の下端部は、ベース部材52から下方に突出しており、当該下端部には、円柱状のフォロア部材76が設けられている。突上げ主軸74のうちフォロア部材76とベース部材52の下面との間には、コイルばね78が装着されている。このコイルばね78の弾発力により、突上げ主軸74が下向き(-Z方向)に付勢され、その結果、ピンベース72がスプライン軸受75に当接する下降端位置(図6の位置)に保持されている。 A lower end portion of the push-up main shaft 74 protrudes downward from the base member 52, and a columnar follower member 76 is provided at the lower end portion. A coil spring 78 is mounted between the follower member 76 of the push-up main shaft 74 and the lower surface of the base member 52 . The elastic force of the coil spring 78 urges the push-up main shaft 74 downward (-Z direction), and as a result, the pin base 72 is held at the lower end position (position shown in FIG. 6) where the pin base 72 comes into contact with the spline bearing 75. It is
 前記吸着ハウジング62は、ウェハシート8aを吸着する吸着面66を上端部に備えた有天の円筒部65と、その下端部に連設されたフランジ部67とを備えている。吸着ハウジング62は、フランジ部67を介してベース部材52の上面54に取付けられている。ベース部材52の上面54のうち、前記貫通穴55の周囲には円環状のボス部53が突設される一方、フランジ部67の下面には当該ボス部53に対応する凹部67bが形成されている。吸着ハウジング62は、この凹部67bに前記ボス部53を嵌合(嵌入)させた状態でベース部材52の上面54に配置されている。フランジ部67の周縁部には、切欠き部67aが形成されており、前記上面54に立設された位置決めピン69がこの切欠き部67aに介挿されている。これにより吸着ハウジング62がベース部材52に対して周方向に位置決めされている。 The suction housing 62 includes a hollow cylindrical portion 65 having a suction surface 66 for sucking the wafer sheet 8a at its upper end, and a flange portion 67 connected to its lower end. The suction housing 62 is attached to the upper surface 54 of the base member 52 via a flange portion 67 . An annular boss portion 53 protrudes from the upper surface 54 of the base member 52 around the through hole 55, while a concave portion 67b corresponding to the boss portion 53 is formed on the lower surface of the flange portion 67. there is The suction housing 62 is arranged on the upper surface 54 of the base member 52 with the boss portion 53 fitted (inserted) into the concave portion 67b. A notch portion 67a is formed in the peripheral portion of the flange portion 67, and a positioning pin 69 erected on the upper surface 54 is inserted into the notch portion 67a. Thereby, the suction housing 62 is positioned in the circumferential direction with respect to the base member 52 .
 なお、ベース部材52の上面54のうち、ボス部53の周囲には、周方向に等間隔で複数の固定マグネット68が配置されている。これら固定マグネット68は、それらの上面とベース部材52の上面54とが面一となるようにベース部材52に埋設されている。一方、吸着ハウジング62の全体、又は吸着ハウジング62のうち少なくともベース部材52(固定マグネット68)との対向面は鉄等の磁性材料で形成されている。つまり、吸着ハウジング62は、固定マグネット68の磁力によってベース部材52に固定されている。 A plurality of fixed magnets 68 are arranged at equal intervals in the circumferential direction around the boss portion 53 on the upper surface 54 of the base member 52 . These fixed magnets 68 are embedded in the base member 52 so that their upper surfaces and the upper surface 54 of the base member 52 are flush with each other. On the other hand, the entire attraction housing 62 or at least the surface of the attraction housing 62 facing the base member 52 (fixed magnet 68) is made of a magnetic material such as iron. That is, the attraction housing 62 is fixed to the base member 52 by the magnetic force of the stationary magnet 68 .
 吸着ハウジング62の円筒部65の内部天井面とピンホルダ63のホルダ本体70との間には、ピンホルダ63の昇降を許容する隙間が形成されている。突上げ主軸74が前記下降端位置から上昇し、円筒部65の前記天井面に当接する位置又はその近傍の位置までピンホルダ63が上昇すると、突き上げピン71が、吸着面66(天井面)に形成されたピン穴66aから突出する。この突出により、突き上げピン71によるダイ7aの突き上げが可能となる。一方、突上げ主軸74と共にピンホルダ63が下降端位置に配置された状態では、突き上げピン71は、ピンホルダ63内に退避する。なお、突き上げピン71の吸着面66からの突出量は、ダイ7aの種類等に応じて変更(設定)される。 A gap is formed between the inner ceiling surface of the cylindrical portion 65 of the suction housing 62 and the holder body 70 of the pin holder 63 to allow the pin holder 63 to move up and down. When the push-up main shaft 74 rises from the lower end position and the pin holder 63 rises to a position where it contacts the ceiling surface of the cylindrical portion 65 or a position in the vicinity thereof, the push-up pin 71 is formed on the attracting surface 66 (ceiling surface). protrudes from the pin hole 66a. This protrusion enables the die 7 a to be pushed up by the push-up pin 71 . On the other hand, when the pin holder 63 is arranged at the lower end position together with the push-up main shaft 74 , the push-up pin 71 is retracted into the pin holder 63 . The amount of protrusion of the push-up pin 71 from the attracting surface 66 is changed (set) according to the type of the die 7a.
 なお、当例では、ベース部材52及びピンベース72が本発明の「支持部材」に相当する。詳しくは、ベース部材52が「ベース部」に、ピンベース72が「可動部」に各々相当する。 Incidentally, in this example, the base member 52 and the pin base 72 correspond to the "support member" of the present invention. Specifically, the base member 52 and the pin base 72 correspond to the "base portion" and the "movable portion," respectively.
 突上げヘッド50A(50B)は、ウェハシート8aを吸着するための負圧供給機構を備える。この負圧供給機構は、ベース部材52の下部に備えられる負圧ポート部57と、ベース部材52の内部に形成された負圧通路56とを含む。負圧ポート部57は、図外のパイプを通じて負圧発生器58(図3参照)に接続されている。負圧通路56は、負圧ポート部57に供給される負圧を前記貫通穴55内に導入する。これにより、貫通穴55を通じて吸着ハウジング62(円筒部65)の内部に負圧が供給される。 The push-up head 50A (50B) has a negative pressure supply mechanism for sucking the wafer sheet 8a. This negative pressure supply mechanism includes a negative pressure port portion 57 provided in the lower portion of the base member 52 and a negative pressure passage 56 formed inside the base member 52 . The negative pressure port portion 57 is connected to a negative pressure generator 58 (see FIG. 3) through a pipe (not shown). The negative pressure passage 56 introduces the negative pressure supplied to the negative pressure port portion 57 into the through hole 55 . Thereby, a negative pressure is supplied to the interior of the suction housing 62 (cylindrical portion 65 ) through the through hole 55 .
 前記吸着面66には、同心円状に形成された複数の環状溝と、各環状溝と吸着ハウジング62内部とを各々連通する図外の開口が形成されている。吸着ハウジング62とピンホルダ63との間に形成された負圧の通路が各開口に通じており、各開口を通じて各環状溝に負圧が供給される(各環状溝を介してウェハシート8aを吸引する)ことにより、ウェハシート8aが吸着面66に吸着される。 The attraction surface 66 is formed with a plurality of concentrically formed annular grooves and openings (not shown) that communicate the annular grooves with the interior of the attraction housing 62 . A negative pressure passage formed between the suction housing 62 and the pin holder 63 communicates with each opening, and negative pressure is supplied to each annular groove through each opening (wafer sheet 8a is sucked through each annular groove). ), the wafer sheet 8 a is attracted to the attraction surface 66 .
 図3及び図4に示すように、突き上げユニット40は、ベースフレーム47に対してX方向に移動可能な可動フレーム48を備えている。突上げヘッド50A、50Bは、X方向に横並びの状態で当該可動フレーム48に搭載されている。可動フレーム48は、ベースフレーム47に固定された第1エアシリンダ49の作動軸49aに連結されており、この第1エアシリンダ49の作動により可動フレーム48がX方向に進退移動する。可動フレーム48が前進位置に配置されると、一方の突上げヘッド50Aが所定の作業位置Wpに配置され(図3に示す状態)、後退位置に配置されると、他方の突上げヘッド50Bが前記作業位置Wpに配置される。これにより、ダイ7aの突き上げに使用される突上げヘッド50A、50Bの切替えが行われる。これら可動フレーム48及び第1エアシリンダ49により前記切替機構D4が構成されている。 As shown in FIGS. 3 and 4, the push-up unit 40 has a movable frame 48 that can move in the X direction with respect to the base frame 47. As shown in FIG. The push-up heads 50A and 50B are mounted on the movable frame 48 side by side in the X direction. The movable frame 48 is connected to an operating shaft 49a of a first air cylinder 49 fixed to the base frame 47, and the operation of the first air cylinder 49 causes the movable frame 48 to move back and forth in the X direction. When the movable frame 48 is placed at the forward position, one thrust head 50A is placed at a predetermined working position Wp (state shown in FIG. 3), and when it is placed at the retracted position, the other thrust head 50B is placed. It is arranged at the working position Wp. As a result, the push-up heads 50A and 50B used for pushing up the die 7a are switched. The switching mechanism D4 is composed of the movable frame 48 and the first air cylinder 49. As shown in FIG.
 突上げヘッド50A、50Bは、可動フレーム48に設けられた、Z方向に延びる一対のガイドレール51に昇降自在に支持されている。突上げヘッド50A、50Bを昇降させる第1昇降機構D5は、前記一対のガイドレール51と、第1押し上げ部材81と、第2エアシリンダ80と、図外のカム機構とを含む。第1押し上げ部材81は、作業位置Wpに配置された突上げヘッド50A(50B)の下方位置に昇降可能に設けられている。第1押し上げ部材81は、第2エアシリンダ80によるカム機構の作動により昇降し、作業位置Wpに配置されている突上げヘッド50A(50B)を上昇位置と下降位置との間で昇降させる。上昇位置は、吸着ハウジング62の吸着面66が、ウェハステージ10に配置されたウェハ保持枠8のウェハシート8aの下面に当接又は近接する高さ位置である。 The push-up heads 50A and 50B are vertically supported by a pair of guide rails 51 provided on the movable frame 48 and extending in the Z direction. A first elevating mechanism D5 for elevating the push-up heads 50A and 50B includes the pair of guide rails 51, a first push-up member 81, a second air cylinder 80, and a cam mechanism (not shown). The first push-up member 81 is provided so as to be able to move up and down below the push-up head 50A (50B) arranged at the working position Wp. The first push-up member 81 moves up and down by the actuation of the cam mechanism by the second air cylinder 80, and raises and lowers the push-up head 50A (50B) arranged at the working position Wp between the raised position and the lowered position. The raised position is a height position at which the suction surface 66 of the suction housing 62 contacts or approaches the lower surface of the wafer sheet 8a of the wafer holding frame 8 placed on the wafer stage 10 .
 突き上げピン71を昇降させる第2昇降機構D6は、第2押し上げ部材82と、Z軸サーボモータ84と、伝動機構83とを含む。第2昇降機構D6の各要素は、第1押し上げ部材81に固定された図外のブラケットに組付けられている。従って、第2昇降機構D6は、第1押し上げ部材81と共に昇降する。 A second elevating mechanism D6 for elevating the push-up pin 71 includes a second push-up member 82, a Z-axis servomotor 84, and a transmission mechanism 83. Each element of the second elevating mechanism D6 is assembled to a bracket (not shown) fixed to the first lifting member 81. As shown in FIG. Therefore, the second lifting mechanism D6 moves up and down together with the first lifting member 81. As shown in FIG.
 第2押し上げ部材82は、作業位置Wpに配置された突上げヘッド50A(50B)の下方であって前記第1押し上げ部材81の-Y側に配置されている。第2押し上げ部材82は、平坦な上面部を有するブロック状の部材である。第2押し上げ部材82は、前記ブラケットに固定された図外のガイド部材に昇降可能に支持されおり、ねじ送り機構等からなる伝動機構83を介してZ軸サーボモータ84により駆動され、前記ガイド部材に沿って昇降する。 The second push-up member 82 is arranged on the -Y side of the first push-up member 81 below the push-up head 50A (50B) arranged at the working position Wp. The second push-up member 82 is a block-shaped member having a flat upper surface. The second push-up member 82 is movably supported by a guide member (not shown) fixed to the bracket, and is driven by a Z-axis servomotor 84 via a transmission mechanism 83 such as a screw feed mechanism. ascending and descending along
 第2押し上げ部材82が下降端位置に配置されている状態では、図6に示すように、その上面が、作業位置Wpに配置された突上げヘッド50A(50B)の突上げ主軸74のフォロア部材76の下面に僅かの隙間を介して対向している。第2押し上げ部材82が上昇すると、これに伴い突上げ主軸74がコイルばね78の付勢力に抗して押し上げられ、この突上げ主軸74の上昇と共にピンホルダ63(突き上げピン71)が上昇し、吸着ハウジング62の前記ピン穴66aから突き上げピン71が突出する。その後、第2押し上げ部材82が下降すると、これに伴い突上げ主軸74がコイルばね78の付勢力を受けながら下降し、元の下降端位置にリセットされる。これにより、突き上げピン71が吸着ハウジング62内に退避する。 In the state where the second push-up member 82 is arranged at the lower end position, as shown in FIG. It faces the lower surface of 76 with a small gap therebetween. When the second push-up member 82 rises, the push-up main shaft 74 is pushed up against the urging force of the coil spring 78. As the push-up main shaft 74 rises, the pin holder 63 (push-up pin 71) rises and is attracted. A push-up pin 71 protrudes from the pin hole 66 a of the housing 62 . After that, when the second push-up member 82 descends, the push-up main shaft 74 descends while receiving the urging force of the coil spring 78, and is reset to the original lowered end position. As a result, the push-up pin 71 is retracted into the suction housing 62 .
 なお、図3中の符号58は、前記ベースフレーム47に固定された負圧発生器である。負圧発生器58は、図外の配管を介して突上げヘッド50A、50Bの負圧ポート部57と接続されている。負圧発生器58は、突上げヘッド50A、50Bに対して、ウェハシート吸着用の負圧の供給とその停止(大気開放)とを切替る。 Reference numeral 58 in FIG. 3 denotes a negative pressure generator fixed to the base frame 47. The negative pressure generator 58 is connected to the negative pressure ports 57 of the push-up heads 50A and 50B via piping (not shown). The negative pressure generator 58 switches between supplying negative pressure for attracting the wafer sheet to the push-up heads 50A and 50B and stopping the supply (release to the atmosphere).
 [突き上げユニット40の動作と作用効果]
 図7(A)~(C)は、突上げヘッド50A、50Bによるダイ7aの突き上げ動作の説明図である。なお、図7では、ダイ7a(ウェハ7)の図示を省略している。突き上げユニット40は、既述の通り、ヘッド4Hがウェハ7からダイ7aをピッキングする際に、ウェハ7の下方に配置されてウェハシート8aを通してダイ7aを突き上げる。突き上げユニット40による具体的な動作は以下の通りである。
[Operation and effects of push-up unit 40]
7A to 7C are explanatory diagrams of the pushing-up operation of the die 7a by the pushing-up heads 50A and 50B. 7, illustration of the die 7a (wafer 7) is omitted. The push-up unit 40 is arranged below the wafer 7 and pushes up the die 7a through the wafer sheet 8a when the head 4H picks the die 7a from the wafer 7, as described above. A specific operation of the push-up unit 40 is as follows.
 まず、二つの突上げヘッド50A、50Bのうち、ダイ7aの突上げに使用される突上げヘッドが、切替機構D4の作動により作業位置Wpに配置される。また、前記駆動機構D3の作動により突き上げユニット40が移動し、作業位置Wpに配置された突上げヘッド50A(50B)が、突き上げるべきダイ7aの下方に配置される(図7(A))。 First, of the two push-up heads 50A and 50B, the push-up head used for pushing up the die 7a is placed at the working position Wp by the operation of the switching mechanism D4. Further, the thrusting unit 40 is moved by the operation of the driving mechanism D3, and the thrusting head 50A (50B) arranged at the working position Wp is arranged below the die 7a to be pushed up (FIG. 7(A)).
 次に、第1昇降機構D5の作動より、作業位置Wpに配置されている突上げヘッド50A(50B)が上昇する(図7(B))。これにより、吸着ハウジング62の吸着面66がウェハシート8aの下面に当接又は近接し、当該吸着面66によりウェハシート8aが負圧吸着される。この負圧吸着は、突上げヘッド50A(50B)が上昇端位置に到達するタイミングと略同時(吸着面66がウェハシート8aの下面に当接又は近接するのと同時)に行われる。 Next, the thrusting head 50A (50B) located at the working position Wp is lifted by the operation of the first lifting mechanism D5 (Fig. 7(B)). As a result, the suction surface 66 of the suction housing 62 contacts or approaches the lower surface of the wafer sheet 8a, and the wafer sheet 8a is suctioned by the suction surface 66 under negative pressure. This negative pressure suction is performed substantially simultaneously with the timing when the push-up head 50A (50B) reaches the raised end position (simultaneously when the suction surface 66 abuts or approaches the lower surface of the wafer sheet 8a).
 続いて、第2昇降機構D6の作動により、突上げ主軸74と共にピンホルダ63が昇降する。これにより突き上げピン71が吸着ハウジング62(吸着面66)から突出し、ウェハシート8aを貫通してダイ7aを突上げる(図7(C))。この場合、突き上げピン71(ピンホルダ63)の昇降は、吸着ハウジング62によるウェハシート8aの吸着と同時又はそれよりも若干遅れたタイミングで行われる。また、昇降の態様は、突き上げピン71の上昇と下降とが連続的に行われる態様、又は突き上げピン71が上昇後その位置に一時的に留まった後に下降する態様の何れかが行われる。 Subsequently, the pin holder 63 moves up and down together with the push-up main shaft 74 due to the operation of the second elevating mechanism D6. As a result, the push-up pin 71 protrudes from the suction housing 62 (suction surface 66), penetrates the wafer sheet 8a, and pushes up the die 7a (FIG. 7(C)). In this case, the push-up pins 71 (pin holders 63) are moved up and down at the same time as the wafer sheet 8a is sucked by the suction housing 62 or at a slightly later timing. Also, as for the mode of elevation, either a mode in which the push-up pin 71 is continuously raised and lowered, or a mode in which the push-up pin 71 temporarily stays at the position after being raised and then descends is performed.
 ダイ7aのピッキングが終了すると、突き上げピン71(ピンホルダ63)が下降端位置にリセットされるとともに、負圧発生器58からの負圧供給が停止される。この状態で、前記駆動機構D3の作動により突き上げユニット40が移動し、次に突き上げるべきダイ7aの下方位置に突上げヘッド50A(50B)が配置される。つまり。突き上げユニット40は、吸着ハウジング62の吸着面66を、ウェハシート8aの下面に沿って摺動、又ウェハシート8aの下面に沿って近接させた状態で移動する。 When the picking of the die 7a is completed, the push-up pin 71 (pin holder 63) is reset to the lower end position, and the negative pressure supply from the negative pressure generator 58 is stopped. In this state, the push-up unit 40 is moved by the operation of the drive mechanism D3, and the push-up head 50A (50B) is arranged below the die 7a to be pushed up next. in short. The push-up unit 40 moves while the suction surface 66 of the suction housing 62 slides along the lower surface of the wafer sheet 8a and approaches along the lower surface of the wafer sheet 8a.
 その後、ウェハシート8aが負圧吸着され、第2昇降機構D6の作動により突き上げピン71(ピンホルダ63)が昇降して次のダイ7aを突上げた後(図7(C))、ウェハシート8aの負圧吸着が停止される。以降、同様にして、既述のダイ7aの突上げ動作が繰り替えされる。 After that, the wafer sheet 8a is sucked under negative pressure, and after the push-up pins 71 (pin holders 63) are raised and lowered by the operation of the second elevating mechanism D6 to push up the next die 7a (FIG. 7(C)), the wafer sheet 8a of negative pressure adsorption is stopped. Thereafter, the above-described pushing-up operation of the die 7a is repeated in the same manner.
 なお、上記突き上げユニット40では、突き上げるべきダイ7aに適した突上げツール60が突上げヘッド50A、50Bに組込まれているが、ウェハ7の変更等、必要に応じて各突上げヘッド50A(50B)の突上げツール60を交換することが求められる。この場合、突上げツール60は、吸着ハウジング62とピンホルダ63とを含むため、これらを交換する必要がある。 In the thrust-up unit 40, the thrust-up tools 60 suitable for the die 7a to be thrust-up are incorporated in the thrust-up heads 50A and 50B. ) is required to replace the thrust tool 60 . In this case, since the push-up tool 60 includes the suction housing 62 and the pin holder 63, these need to be replaced.
 前記突き上げユニット40では、既述の通り、吸着ハウジング62は、固定マグネット68によってベース部材52に固定されている。また、ピンホルダ63も、固定マグネット72bによってピンベース72に固定されている。そのため、オペレータは、吸着ハウジング62及びピンホルダ63をこの順番でベース部材52等から持ち上げて取外し、新たな吸着ハウジング62及びピンホルダ63を逆の順番で元の位置にセットするだけで、特に工具を用いることなく、簡単に突上げツール60を交換することができる。 In the push-up unit 40, the attraction housing 62 is fixed to the base member 52 by the fixed magnet 68, as described above. The pin holder 63 is also fixed to the pin base 72 by a fixed magnet 72b. Therefore, the operator simply lifts and removes the suction housing 62 and the pin holder 63 from the base member 52 and the like in this order, and sets the new suction housing 62 and the pin holder 63 in the reverse order to their original positions. The push-up tool 60 can be easily exchanged without any need.
 この場合、固定マグネット68、72bの吸着力は、何れも5~30Nの範囲内で設定されている。この吸着力の範囲は、吸着ハウジング62及びピンホルダ63の吸着安定性と、オペレータによる手作業での着脱作業性とが両立し得るように試験的に定められた範囲である。そのため、オペレータは、吸着ハウジング62やピンホルダ63を各々ワンタッチで難なく交換することができる。 In this case, the attraction forces of the stationary magnets 68 and 72b are both set within the range of 5 to 30N. The range of the adsorption force is determined experimentally so that the adsorption stability of the adsorption housing 62 and the pin holder 63 and the operability of manual attachment/detachment by the operator can be compatible. Therefore, the operator can easily replace the suction housing 62 and the pin holder 63 with one touch.
 従って、前記突き上げユニット40の構成によると、突上げツール交換用のクランプ機構を備える従来構造(特許文献1)に比べて、簡素な構成で突上げツール60(吸着ハウジング62及びピンホルダ63)の変更が可能となる。しかも、基本的にはベース部材52に固定マグネット68、72bが組み込まれるだけの構成であるため、突上げヘッド50A(50B)の著しい重量増大を伴うことがない。従って、突上げヘッド50A(50B)の重量の増加により、突き上げユニット40の移動時にタイムロスが生じ易くなるといった弊害を伴うこともない。 Therefore, according to the configuration of the push-up unit 40, the push-up tool 60 (suction housing 62 and pin holder 63) can be changed with a simpler structure than the conventional structure (Patent Document 1) having a clamp mechanism for replacing the push-up tool. becomes possible. Moreover, since it is basically a structure in which the fixed magnets 68 and 72b are simply incorporated in the base member 52, there is no significant increase in weight of the push-up head 50A (50B). Therefore, the increased weight of the push-up head 50A (50B) does not cause a problem that time loss tends to occur when the push-up unit 40 is moved.
 さらに、突上げツール60(吸着ハウジング62及びピンホルダ63)を固定するための固定マグネット68、72bは、ベース部材52及びピンベース72側にのみ配置されている。そのため、複数種類の突上げツール60に対して固定マグネット68、72bを共通化することができ、合理的である。 Furthermore, fixed magnets 68 and 72b for fixing the push-up tool 60 (attraction housing 62 and pin holder 63) are arranged only on the base member 52 and pin base 72 side. Therefore, the fixed magnets 68 and 72b can be shared for a plurality of types of push-up tools 60, which is rational.
 なお、上記説明では言及していないが、前記突き上げユニット40では、吸着ハウジング62を固定する固定マグネット68の磁極の向きと、ピンホルダ63を固定する固定マグネット72bの磁極の向きとが同一に設定されている。つまり、固定マグネット68と固定マグネット72bとの間に反発力が働かないようにされている。具体的には、図8に示すように、固定マグネット72b(ピンホルダマグネット)の上面側がN極の場合には、固定マグネット68(吸着ハウジングマグネット)の上面側もN極に設定される(組合せ1)。また、固定マグネット72bの上面側がS極の場合には、固定マグネット68の上面側もS極に設定される(組合せ2)。 Although not mentioned in the above description, in the push-up unit 40, the direction of the magnetic poles of the fixed magnet 68 that fixes the attraction housing 62 and the direction of the magnetic poles of the fixed magnet 72b that fixes the pin holder 63 are set to be the same. ing. That is, no repulsive force acts between the fixed magnet 68 and the fixed magnet 72b. Specifically, as shown in FIG. 8, when the upper surface side of the fixed magnet 72b (pin holder magnet) is the N pole, the upper surface side of the fixed magnet 68 (attraction housing magnet) is also set to the N pole (combination 1). When the upper surface of the fixed magnet 72b is the S pole, the upper surface of the fixed magnet 68 is also set to the S pole (combination 2).
 この構成により、前記反発力に起因して、次のような不都合が生じることが回避される。既述の通り、突上げヘッド50A、50Bは、同一ウェハ7の次のダイ7aの位置に移動する際に、吸着ハウジング62の吸着面66をウェハシート8aの下面に沿って摺動又は近接させて移動する(図7(B))。このとき、前記突き上げユニット40では、ピンホルダ63を固定する固定マグネット72b(第2磁石)の位置が、吸着ハウジング62を固定する固定マグネット68(第1磁石)の位置の上方に位置するため、前記反発力が作用すると、コイルばね78の弾発力に抗して吸着ハウジング62が上昇することが起こり得る。この場合には、突き上げピン71が意図せず吸着ハウジング62から突出してウェハシート8aを損傷することが考えられる。この点、両固定マグネット68、72bの磁極の向きが同一である上記突き上げユニット40の構成によれば、前記反発力が生じる余地がなく、既述のような不都合が生じることが回避される。 This configuration avoids the following inconveniences due to the repulsive force. As described above, the push-up heads 50A and 50B cause the suction surface 66 of the suction housing 62 to slide along or come close to the lower surface of the wafer sheet 8a when moving to the position of the next die 7a of the same wafer 7. to move (FIG. 7(B)). At this time, in the push-up unit 40, the position of the fixed magnet 72b (second magnet) that fixes the pin holder 63 is positioned above the position of the fixed magnet 68 (first magnet) that fixes the attraction housing 62. When the repulsive force acts, the adsorption housing 62 may rise against the elastic force of the coil spring 78 . In this case, it is conceivable that the push-up pins 71 may unintentionally protrude from the suction housing 62 and damage the wafer sheet 8a. In this regard, according to the configuration of the push-up unit 40 in which the fixed magnets 68 and 72b have the same magnetic pole direction, there is no room for the repulsive force to occur, and the above-described inconveniences can be avoided.
 以上説明した部品実装装置1は、本発明に係る部品突上げ装置が適用された部品実装装置の好ましい実施形態の例示であって、その具体的な構成や部品突上げ装置の具体的な構成は、本発明の要旨を逸脱しない範囲で適宜変更可能である。例えば、以下のような構成を採用することも可能である。 The component mounting apparatus 1 described above is an example of a preferred embodiment of a component mounting apparatus to which the component pushing-up apparatus according to the present invention is applied. , can be changed as appropriate without departing from the gist of the present invention. For example, it is possible to employ the following configuration.
 例えば、実施形態では、突上げツール60(吸着ハウジング62及びピンホルダ63)を固定するための固定マグネット68、72bは、ベース部材52及びベース本体部72a側に配置されている。しかし、固定マグネット68、72bは、突上げツール60(吸着ハウジング62及びピンホルダ63)側に設けられていてもよいし、双方に設けられていてもよい。例えば、吸着ハウジング62(吸着面66)のサイズに応じて吸着力を変える方が好ましい場合も考えられるため、その場合には、吸着ハウジング62側に固定マグネット68を備えるようにしてもよい。この点は、ピンホルダ63と固定マグネット72bとの関係についても同じである。 For example, in the embodiment, fixed magnets 68 and 72b for fixing the push-up tool 60 (suction housing 62 and pin holder 63) are arranged on the side of the base member 52 and the base body portion 72a. However, the fixed magnets 68 and 72b may be provided on the push-up tool 60 (suction housing 62 and pin holder 63) side, or may be provided on both sides. For example, there may be cases where it is preferable to change the attracting force according to the size of the attracting housing 62 (attracting surface 66). This point also applies to the relationship between the pin holder 63 and the fixed magnet 72b.
 また、実施形態では、吸着ハウジング62を固定する固定マグネット68は、ベース部材52の上面54のボス部53周囲に等間隔で設けられており、ピンホルダ63を固定する固定マグネット72bはリング状に設けられている。しかし、固定マグネット68、72bの具体的な態様は、吸着ハウジング62やピンホルダ63を着脱可能に固定できれば、他の態様であっても構わない。但し、実施形態のように、突上げツール60の突上げ中心の周囲に、等間隔で断続的に又は環状に連続的に固定マグネットが設けられている構成によれば、突上げツール60(吸着ハウジング62及びピンホルダ63)に対してバランス良く磁力を作用させて、当該突上げツール60を安定的に固定することができるという利点がある。 In the embodiment, the fixed magnets 68 for fixing the attraction housing 62 are provided at regular intervals around the boss portion 53 on the upper surface 54 of the base member 52, and the fixed magnets 72b for fixing the pin holder 63 are provided in a ring shape. It is However, as long as the fixed magnets 68 and 72b can be detachably fixed to the attraction housing 62 and the pin holder 63, other specific aspects may be used. However, according to the configuration in which fixed magnets are provided intermittently at regular intervals or continuously in an annular shape around the center of the push-up of the push-up tool 60 as in the embodiment, the push-up tool 60 (attraction There is an advantage that the thrusting tool 60 can be stably fixed by applying a magnetic force to the housing 62 and the pin holder 63) in a well-balanced manner.
 また、実施形態では、本発明に係る部品突上げ装置が部品実装装置に適用された例について説明したが、本発明に係る部品突上げ装置は、例えばウェハからダイシングされたダイをテープに収容するテーピング装置、或いは前記ダイを基板に実装する部品実装装置などの各種装置に適用することができる。 Further, in the embodiments, an example in which the component push-up apparatus according to the present invention is applied to a component mounting apparatus has been described. It can be applied to various devices such as a taping device or a component mounting device that mounts the die on a substrate.
 [上記実施形態に含まれる発明]
 本発明の一局面に係る部品突上げ装置は、ウェハシートに貼着されたウェハの下方からダイを突上げることにより、当該ダイを前記ウェハシートから剥離させる部品突上げ装置であって、前記ウェハシートの下面を負圧吸着する吸着面、及びこの吸着面からウェハシート側に出没可能に設けられて、前記吸着面から突出することにより前記ダイを突上げる突上げピンを含む突上げツールと、前記ウェハに沿って相対的に移動可能に設けられて、前記突上げツールを着脱可能に支持する支持部材と、を備え、前記突上げツール及び前記支持部材の何れか一方側に磁石が備えられるとともに、他方側のうち少なくとも前記磁石の対向面が磁性材料により形成されている。
[Inventions included in the above embodiments]
A component push-up device according to one aspect of the present invention is a component push-up device that separates a die from a wafer sheet by pushing up the die from below the wafer attached to the wafer sheet, wherein the wafer an attracting surface that attracts the lower surface of the sheet under negative pressure; and a thrust tool that includes a thrust pin that is provided so as to be retractable from the attracting surface to the wafer sheet side and protrudes from the attracting surface to push up the die; a support member that is relatively movable along the wafer and detachably supports the push-up tool, and a magnet is provided on one side of the push-up tool and the support member. At least the surface facing the magnet on the other side is made of a magnetic material.
 この部品突上げ装置の構成によれば、専用のクランプ機構が備えられる従来の構造に比べて、簡素な構成で突上げツールの変更(交換)が可能となる。 According to the configuration of this part push-up device, it is possible to change (replace) the push-up tool with a simpler structure than the conventional structure with a dedicated clamping mechanism.
 前記部品突上げ装置において、より具体的には、前記支持部材は、ベース部と、当該ベース部に対して相対的に昇降する可動部とを含み、前記突上げツールは、前記吸着面を上端に備え、前記ベース部に対して着脱可能に支持される中空の吸着ハウジングと、前記突上げピンを保持するとともに前記ハウジングの内部に配置されて前記可動部に着脱可能に支持され、当該可動部と共に昇降するピンホルダと、を備え、前記吸着ハウジング及び前記ベース部のうち何れか一方側に前記磁石が備えられるとともに、他方側のうち少なくとも当該磁石の対向面が前記磁性材料で形成され、前記ピンホルダ及び前記可動部のうち何れか一方側に前記磁石が備えられるとともに、他方側のうち少なくとも当該磁石の対向面が前記磁性材料で形成されている。 More specifically, in the component push-up device, the support member includes a base portion and a movable portion that moves up and down relative to the base portion, and the push-up tool moves the suction surface to an upper end. a hollow suction housing that is detachably supported by the base portion; a pin holder that ascends and descends together with the magnet, wherein the magnet is provided on one side of the attraction housing and the base portion, and at least the opposing surface of the magnet on the other side is formed of the magnetic material, and the pin holder and the movable portion, the magnet is provided on one side thereof, and at least the opposing surface of the magnet on the other side is formed of the magnetic material.
 この部品突上げ装置では、突上げツールとして備えられる複数部材、すなわち吸着ハウジングとピンホルダとを、簡素な構成で変更(交換)することが可能となる。 With this component push-up device, it is possible to change (replace) a plurality of members provided as a push-up tool, ie, the suction housing and the pin holder, with a simple configuration.
 前記部品突上げ装置においては、前記支持部材側に前記磁石が備えられているのが望ましい。 It is desirable that the magnet is provided on the side of the support member in the component push-up device.
 この構成によれば、複数の突上げツール(吸着ハウジング及びピンホルダ)に対して磁石が共通化されるため、合理的な構成となる。 According to this configuration, the magnet is common to a plurality of push-up tools (attraction housing and pin holder), resulting in a rational configuration.
 なお、前記支持部材が、前記ベース部と前記可動部とを含み、前記突上げツールが、前記吸着ハウジングと前記ピンホルダとを備える場合であって、前記吸着ハウジングに対して前記ピンホルダが前記可動部と共に下降した状態において、前記吸着ハウジングを前記ベース部に固定する磁石である第1磁石に対して、前記ピンホルダを前記可動部に固定する磁石である第2磁石が上方に配置されるように当該部品突上げ装置が構成される場合には、前記第1磁石及び前記第2磁石は、それらの磁極の向きが同一であるのが好適である。 In the case where the support member includes the base portion and the movable portion, and the push-up tool includes the suction housing and the pin holder, the pin holder is attached to the suction housing by the movable portion. and the second magnet, which is the magnet for fixing the pin holder to the movable portion, is arranged above the first magnet, which is the magnet for fixing the attraction housing to the base portion. When a part push-up device is constructed, it is preferable that the first magnet and the second magnet have the same magnetic pole orientation.
 この構成によれば、両磁石の間に反発力(排斥力)が作用して、ピンホルダの適切な動作が妨げられること、つまり、ピンホルダが意図せず上昇して突上げピンが突出することが回避される。 According to this configuration, a repulsive force (expulsive force) acts between the two magnets, preventing proper operation of the pin holder. Avoided.
 なお、前記部品突上げ装置において、前記磁石は、前記突上げツールの突上げ中心の周囲に、等間隔で断続的に、又は環状に連続的に設けられているのが好適である。 In addition, in the component push-up device, it is preferable that the magnets are provided intermittently at equal intervals around the push-up center of the push-up tool, or continuously in an annular shape.
 この構成によれば、突上げツールに対してバランス良く磁力を作用させて、突上げツールを安定的に固定することができる。 According to this configuration, it is possible to apply a magnetic force to the push-up tool in a well-balanced manner and stably fix the push-up tool.
 また、前記部品突上げ装置において、前記磁石による前記突上げツールの吸着力は5~30Nの範囲内であるのが好適である。 Further, in the component push-up device, it is preferable that the attraction force of the push-up tool by the magnet is within a range of 5 to 30N.
 この構成によれば、突上げツールの吸着安定性と、オペレータの手作業による突上げツールの着脱作業性とを両立させることが可能となる。 According to this configuration, it is possible to achieve both the adsorption stability of the push-up tool and the workability of attaching and detaching the push-up tool manually by the operator.
 一方、本発明の一局面に係る部品実装装置は、ダイシングされてウェハシートに貼着された状態のウェハが配置される部品供給部と、前記部品供給部に配置されたウェハからダイをピッキングして基板に移載する部品移載ヘッドと、前記部品移載ヘッドによるダイのピッキングの際に、前記ウェハシートの下方から前記ダイを突き上げる、上述した態様の何れかの部品突上げ装置と、を備える。 On the other hand, a component mounting apparatus according to one aspect of the present invention includes a component supply section in which a wafer that has been diced and attached to a wafer sheet is placed, and a die is picked from the wafer placed in the component supply section. and the component push-up device according to any one of the above aspects, which pushes up the die from below the wafer sheet when the die is picked by the component transfer head. Prepare.
 この部品実装装置の構成によれば、既述のような部品突上げ装置を備えているため、簡素な構成で突上げツールの変更(交換)が可能となる。 According to the configuration of this component mounting apparatus, since it is equipped with the component push-up device as described above, it is possible to change (replace) the push-up tool with a simple configuration.

Claims (7)

  1.  ウェハシートに貼着されたウェハの下方からダイを突上げることにより、当該ダイを前記ウェハシートから剥離させる部品突上げ装置であって、
     前記ウェハシートの下面を負圧吸着する吸着面、及びこの吸着面からウェハシート側に出没可能に設けられて、前記吸着面から突出することにより前記ダイを突上げる突上げピンを含む突上げツールと、
     前記ウェハに沿って相対的に移動可能に設けられて、前記突上げツールを着脱可能に支持する支持部材と、を備え、
     前記突上げツール及び前記支持部材の何れか一方側に磁石が備えられるとともに、他方側のうち少なくとも前記磁石の対向面が磁性材料により形成されている、部品突上げ装置。
    A component push-up device for separating a die from a wafer sheet by pushing up the die from below the wafer attached to the wafer sheet,
    A push-up tool comprising: a suction surface for sucking the lower surface of the wafer sheet under negative pressure; When,
    a support member that is relatively movable along the wafer and detachably supports the push-up tool;
    A component push-up device, wherein a magnet is provided on one side of the push-up tool and the support member, and at least a surface of the other side facing the magnet is made of a magnetic material.
  2.  請求項1に記載の部品突上げ装置において、
     前記支持部材は、ベース部と、当該ベース部に対して相対的に昇降する可動部とを含み、
     前記突上げツールは、
     前記吸着面を上端に備え、前記ベース部に対して着脱可能に支持される中空の吸着ハウジングと、
     前記突上げピンを保持するとともに前記ハウジングの内部に配置されて前記可動部に着脱可能に支持され、当該可動部と共に昇降するピンホルダと、を備え、
     前記吸着ハウジング及び前記ベース部のうち何れか一方側に前記磁石が備えられるとともに、他方側のうち少なくとも当該磁石の対向面が前記磁性材料で形成され、
     前記ピンホルダ及び前記可動部のうち何れか一方側に前記磁石が備えられるとともに、他方側のうち少なくとも当該磁石の対向面が前記磁性材料で形成されている、部品突上げ装置。
    In the component push-up device according to claim 1,
    The support member includes a base portion and a movable portion that moves up and down relative to the base portion,
    The push-up tool is
    a hollow suction housing provided with the suction surface at its upper end and detachably supported with respect to the base;
    a pin holder that holds the push-up pin, is arranged inside the housing, is detachably supported by the movable part, and moves up and down together with the movable part;
    The magnet is provided on one side of the attraction housing and the base portion, and at least the opposing surface of the magnet on the other side is formed of the magnetic material,
    A component push-up device, wherein the magnet is provided on one side of the pin holder and the movable portion, and at least the opposing surface of the magnet on the other side is formed of the magnetic material.
  3.  請求項1又は2に記載の部品突上げ装置において、
     前記支持部材側に前記磁石が備えられている、部品突上げ装置。
    In the component pushing-up device according to claim 1 or 2,
    A part push-up device, wherein the magnet is provided on the support member side.
  4.  請求項3に記載の部品突上げ装置において、
     前記支持部材は、前記ベース部と前記可動部とを含み、前記突上げツールは、前記吸着ハウジングと前記ピンホルダとを備え、
     当該部品突上げ装置は、前記吸着ハウジングに対して前記ピンホルダが前記可動部と共に下降した状態において、前記吸着ハウジングを前記ベース部に固定する磁石である第1磁石に対して、前記ピンホルダを前記可動部に固定する磁石である第2磁石が上方に配置されるように構成されており、
     前記第1磁石及び前記第2磁石は、それらの磁極の向きが同一である、部品突上げ装置。
    In the component push-up device according to claim 3,
    The support member includes the base portion and the movable portion, and the push-up tool includes the suction housing and the pin holder,
    In the component push-up device, in a state in which the pin holder is lowered together with the movable portion with respect to the attraction housing, the pin holder is moved with respect to a first magnet that fixes the attraction housing to the base portion. The second magnet, which is a magnet fixed to the part, is arranged above,
    The first magnet and the second magnet have magnetic poles in the same orientation.
  5.  請求項1乃至4の何れか一項に記載の部品突上げ装置において、
     前記磁石は、前記突上げツールの突上げ中心の周囲に、等間隔で断続的に、又は環状に連続的に設けられている、部品突上げ装置。
    In the component pushing-up device according to any one of claims 1 to 4,
    The parts thrusting device, wherein the magnets are provided intermittently at regular intervals or continuously in an annular shape around the thrusting center of the thrusting tool.
  6.  請求項1乃至5の何れか一項に記載の部品突上げ装置において、
     前記磁石による前記突上げツールの吸着力は5~30Nの範囲内である、部品突上げ装置。
    In the component push-up device according to any one of claims 1 to 5,
    A device for pushing up a component, wherein the attraction force of the pushing tool by the magnet is within a range of 5 to 30N.
  7.  ダイシングされてウェハシートに貼着された状態のウェハが配置される部品供給部と、
     前記部品供給部に配置されたウェハからダイをピッキングして基板に移載する部品移載ヘッドと、
     前記部品移載ヘッドによるダイのピッキングの際に、前記ウェハシートの下方から前記ダイを突き上げる、請求項1~6の何れか一項に記載の部品突上げ装置と、を備える、部品実装装置。
    a component supply unit in which a wafer that has been diced and attached to a wafer sheet is arranged;
    a component transfer head for picking a die from a wafer placed in the component supply unit and transferring the die to a substrate;
    7. A component mounting apparatus, comprising: the component push-up device according to claim 1, which pushes up the die from below the wafer sheet when the die is picked by the component transfer head.
PCT/JP2021/018640 2021-05-17 2021-05-17 Component push-up device and component mounting device WO2022244071A1 (en)

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PCT/JP2021/018640 WO2022244071A1 (en) 2021-05-17 2021-05-17 Component push-up device and component mounting device
CN202180097917.6A CN117280453A (en) 2021-05-17 2021-05-17 Component push-up device and component mounting device
JP2023522019A JPWO2022244071A1 (en) 2021-05-17 2021-05-17
DE112021007307.9T DE112021007307T5 (en) 2021-05-17 2021-05-17 Component push-up device and component assembly device
KR1020237035708A KR20230158099A (en) 2021-05-17 2021-05-17 Component lifting device and component mounting device
TW110126899A TWI830034B (en) 2021-05-17 2021-07-22 Parts lifting device and parts installation device

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Citations (3)

* Cited by examiner, † Cited by third party
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JP2012169321A (en) * 2011-02-10 2012-09-06 Fuji Mach Mfg Co Ltd Die feed apparatus
JP2013168664A (en) * 2013-04-04 2013-08-29 Renesas Electronics Corp Method of manufacturing semiconductor device and semiconductor manufacturing apparatus
JP2015142135A (en) * 2014-01-29 2015-08-03 セメス株式会社Semes Co., Ltd. Die ejecting device

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102213777B1 (en) * 2018-02-02 2021-02-08 주식회사 엘지화학 Adhesive film for semiconductor device

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012169321A (en) * 2011-02-10 2012-09-06 Fuji Mach Mfg Co Ltd Die feed apparatus
JP2013168664A (en) * 2013-04-04 2013-08-29 Renesas Electronics Corp Method of manufacturing semiconductor device and semiconductor manufacturing apparatus
JP2015142135A (en) * 2014-01-29 2015-08-03 セメス株式会社Semes Co., Ltd. Die ejecting device

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DE112021007307T5 (en) 2024-01-25
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