WO2022198341A1 - Dispositif d'analyse capacitive d'un objet d'essai allongé et mobile - Google Patents

Dispositif d'analyse capacitive d'un objet d'essai allongé et mobile Download PDF

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Publication number
WO2022198341A1
WO2022198341A1 PCT/CH2022/000001 CH2022000001W WO2022198341A1 WO 2022198341 A1 WO2022198341 A1 WO 2022198341A1 CH 2022000001 W CH2022000001 W CH 2022000001W WO 2022198341 A1 WO2022198341 A1 WO 2022198341A1
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WO
WIPO (PCT)
Prior art keywords
capacitor
capacitor arrangement
opening
spacer
arrangement
Prior art date
Application number
PCT/CH2022/000001
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German (de)
English (en)
Inventor
Roy Bearth
Christian CAVEGN
Original Assignee
Uster Technologies Ag
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Uster Technologies Ag filed Critical Uster Technologies Ag
Priority to EP22709553.6A priority Critical patent/EP4314794A1/fr
Priority to CN202280024163.6A priority patent/CN117178185A/zh
Publication of WO2022198341A1 publication Critical patent/WO2022198341A1/fr

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/02—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance
    • G01N27/22—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating capacitance
    • G01N27/226—Construction of measuring vessels; Electrodes therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/36—Textiles
    • G01N33/365—Filiform textiles, e.g. yarns

Definitions

  • the present invention relates to a device for the capacitive examination of a moving test material in the form of a strand, preferably a textile material, according to the preamble of the independent patent claim. It is preferably, but not exclusively, used for offline measurement of the mass irregularity of yarn, roving or sliver, as is done on textile laboratory testing devices.
  • US-2013/342225 A1 and WO-2016/149847 A1 each disclose a device for capacitively measuring properties of a textile product such as sliver, roving or yarn.
  • a capacitive sensor assembly with five support plates that form four through openings or measurement gaps of different gap widths. The test material is guided through one of the measuring gaps. Since the
  • the test material can only be inserted into exactly one of the measurement gaps and moved through it along its longitudinal axis.
  • the measurement gaps each have an electrode of a plate capacitor in or on the two side walls of the support plates that delimit them and between which the product can be guided.
  • a test material located between the capacitor electrodes influences the total capacitance of the capacitor, so that an electrical output signal from the capacitor is a measure of the test material mass located in the capacitor.
  • the gap widths of the various measuring gaps in a sensor assembly are of different sizes in order to be able to optimally test test objects of different thicknesses. A specific test material thickness range is assigned to each gap width.
  • the thickness of the test material must be slightly smaller than the gap width, otherwise the test material will rub against the side walls of the measurement gap during its movement, which could damage the test material and/or the side walls.
  • the thickness of the test material must not be too small compared to the gap width, otherwise the measuring sensitivity and the signal-to-noise ratio are low.
  • a compensation measurement method is used to eliminate disruptive influences such as changes in temperature or humidity as much as possible.
  • the measuring capacitor is installed in a bridge circuit that also contains a reference capacitor.
  • the bridge circuit is adjusted in such a way that it delivers the value zero without test material and with test material an output signal that is proportional to the test material mass in the measuring capacitor. If the reference capacitor has the same structure and is exposed to the same interference as the measuring capacitor, the interference will not affect the measurement results.
  • suitable compensation bridge circuits are given in the documents US-2011/254567 A1 and US-2013/342225 A1. The latter assumes that the measurement capacitor and the reference capacitor are in the same measurement gap.
  • the present invention relates to the arrangement, which is also known from the prior art, with two through-openings which are usually next to one another and parallel to one another, one of which accommodates the measuring capacitor and the other accommodates the reference capacitor.
  • WO-2016/149847 A1 deals with the problem of the falsification of measurement results from capacitive textile testing devices due to temperature changes.
  • Electronic circuits of modern capacitive sensor assemblies are equipped with many electronic components such as semiconductor amplifiers, which together generate a large amount of heat loss. When the test device is switched on, this heat loss leads to a slow heating of the sensor assembly and thus to thermal drift, which falsifies the measurement results until a thermal equilibrium is reached.
  • WO-2016/149847 A1 proposes installing a temperature sensor and a controllable electrothermal converter in the capacitive sensor assembly. In this way, the sensor assembly can be actively regulated to a temperature setpoint so that it measures largely stably and without temperature drift.
  • both the support plates of the capacitor electrodes and the spacer between the support plates expand. These usually consist of different materials with different coefficients of thermal expansion. Since thermal expansion of the support plates and thermal expansion of the spacer affect the capacitance of the capacitor in opposite directions, the thermal expansion of the two materials can compensate for each other with a suitable choice of material so that the capacitance remains unchanged for any temperature change.
  • US Pat. No. 5,099,386 A makes use of this idea of passive temperature compensation.
  • the carrier plates should have a linear thermal expansion coefficient at and the spacer should have a linear thermal expansion coefficient CXA.
  • the capacitance C of a plate capacitor is known to be proportional to the ratio A/d of the surface area A of an electrode to the electrode spacing d:
  • Today's capacitive yarn testing devices are high-precision laboratory measuring devices. They record changes in the mass of the running yarn that cause relative changes in capacitance AC/C of the measuring capacitor of the order of just a millionth, i. H.
  • the invention uses a compensation measuring bridge known per se with two capacitor arrangements, each of which has a capacitor.
  • One of the capacitors contains the test material and is used as a measuring capacitor, while the other capacitor remains empty and serves as a reference capacitor.
  • the device according to the invention is designed in such a way that its converters, namely the two capacitors, react simultaneously and equally to temperature changes, so that their difference always remains essentially constant. This passive measure ensures that measurements carried out during a transition from a first to a second state of equilibrium are also uncorrupted.
  • CT the specific heat capacities of the carrier plates or the
  • the carriers and the spacers are considered separately, i. H. the minuends or the subtrahends on both sides of equation (6) are set equal to one another.
  • the material and mass symmetry ensure that the same heat flow in corresponding components of the two capacitor assemblies causes the same capacitance change in the two capacitors.
  • the two capacitances change equally with time as heat is sensed in or out over time.
  • thermal coupling ensures that the temperature is equalized as quickly as possible between the components of the device and that the heat flows into the two capacitor arrangements are as equal as possible. It is particularly important when there is a spatial temperature gradient.
  • thermally coupled means that good heat conduction should be possible between the components that are thermally coupled to one another.
  • the components are either in direct contact with each other or are connected to one another via one or more media that allow good heat transfer, i. H. do not thermally insulate.
  • the heat transfer coefficient between the two components should be greater than approx.
  • the device according to the invention is used for the capacitive examination of a moving test material in the form of a strand. It contains a first capacitor arrangement with a first passage opening, through which the test material can be moved along its longitudinal axis, and a first capacitor, which is arranged on the first passage opening in such a way that its capacitance can be influenced by a test material located in the first passage opening, and the has a first capacity without test material. Furthermore, the device contains a second capacitor arrangement with a second through-opening and a second capacitor which is arranged at the second through-opening and which has a second capacitance. The device also includes a compensation measurement bridge that includes the first capacitor and the second capacitor. The first capacitor arrangement and the second capacitor arrangement are designed and arranged in such a way that a difference between the first capacitance and the second capacitance remains essentially constant when the temperature changes over time.
  • the difference between the first capacitance and the second capacitance is preferably zero.
  • the first capacitor arrangement and the second capacitor arrangement have a structure that is analogous to one another, and corresponding components of the first capacitor arrangement and the second capacitor arrangement each consist of the same material.
  • the first capacitor arrangement and the second capacitor arrangement each contain two mutually parallel support plates which are spaced apart from one another and between which the through-opening is located and on which the first capacitor or the second capacitor is arranged, and the through-opening is in each case through a between parts of the first spacer or second spacer clamped between the two support plates.
  • the masses of the first spacer and the second spacer are preferably the same.
  • the masses of the mutually corresponding carrier plates of the first capacitor arrangement and of the second capacitor arrangement are preferably the same.
  • the first capacitor can have two electrodes, each arranged on or in one of the support plates of the first capacitor arrangement
  • the second capacitor can have two electrodes, each arranged on or in one of the support plates of the second capacitor arrangement, and the masses of the mutually corresponding electrodes of the first capacitor arrangement and the second capacitor arrangement are preferably the same.
  • At least one component of the first capacitor arrangement and one component of the second capacitor arrangement are thermally coupled to one another.
  • the first spacer and the second spacer are preferably thermally coupled to one another.
  • a carrier plate of the first capacitor arrangement and a carrier plate of the second capacitor arrangement are preferably thermally coupled to one another.
  • At least one spacer and at least one support plate are preferably thermally coupled to one another.
  • the support plates consist of a ceramic material and/or the spacers consist of a metal.
  • a support plate of the first capacitor arrangement can coincide with a support plate of the second capacitor arrangement.
  • the first capacitor has two planar electrodes, each arranged on or in one of the support plates of the first capacitor arrangement
  • the second capacitor has two planar electrodes, each arranged on or in one of the support plates of the second capacitor arrangement.
  • the coefficient of thermal expansion of the spacer of the respective capacitor arrangement is twice that of the support plates of the same capacitor arrangement.
  • the first through-opening and the second through-opening are preferably mutually arranged in such a way that the test material can be moved along its longitudinal axis through exactly the first through-opening, but not at the same time through the second through-opening without a change in direction.
  • the first through-opening has a first opening width and the second through-opening has a second opening width that differs from the first opening width. Thanks to the invention, the device and its measurement results have a good
  • FIG. 1 schematically shows a device according to the invention in a cross section.
  • Figure 2 shows the two spacers of the device of Figure 1 in a view perpendicular to the plane of Figure 1.
  • FIG. 3 shows in each case schematic time curves of a temperature and of a second temperature
  • FIG. 1 shows a schematic of an embodiment of a device 1 according to the invention for the capacitive examination of a moving test material 9 in the form of a strand, e.g. B. a yarn, a roving or a sliver.
  • the exemplary device 1 includes two capacitor arrangements 2.1, 2.2.
  • the invention is not limited to two capacitor arrays limited; the inventive device can have more than two, z. B. four, include capacitor arrays.
  • a first capacitor arrangement 2.1 contains two mutually parallel carrier plates 31.1, 32.1 which are spaced apart from one another and are made of a ceramic material, for example. Between the two carrier plates 31.1, 32.1 there is a first passage opening 21.1 with a first opening width di.
  • the first opening width di z. B. in the range between 0.1 mm and 10 mm.
  • the 21.1 is defined by a first spacer 4.1, which is clamped between parts of the two carrier plates 31.1, 32.1.
  • the first The spacer 4.1 can, for. B. consist of a metal.
  • a metallic electrode 51.1, 52.1 is located on each of the plate surfaces facing one another and the first through-opening 21.1.
  • each carrier plate 52.1 can e.g. B. by coating the support plates 31.1, 32.1 or by attaching a metal plate to the support plates 31.1, 32.1.
  • the two electrodes 51.1, 52.1 lie opposite one another and together form a first capacitor 5.1, which is designed as a plate capacitor. Furthermore, each carrier plate
  • 31.1. 32.1 including its electrode 51.1, 52.1 of at least one protective sheath (not shown), e.g. B. a layer of paint, be covered.
  • the test material 9 can be introduced from the outside into the first through-opening 21.1, and consequently into the first capacitor 5.1, and can be moved along its longitudinal axis through the first through-opening 21.1 and the first capacitor 5.1. If the test material 9 is in the first capacitor 5.1, it influences a capacitance of the first capacitor 5.1. The capacitance is dependent on the mass of the test material 9 in the first capacitor 5.1, so that it is z. B. with moving test material 9 is a measure of mass changes of the test material 9 along its longitudinal axis.
  • a second capacitor arrangement 2.2 is constructed analogously to the first capacitor arrangement 2.1.
  • a second capacitor arrangement 2.2 thus contains two mutually parallel carrier plates 31.2, 32.2 which are spaced apart from one another. Between the two support plates 31.2, 32.2 there is a second passage opening 21.2 with a second opening width th.
  • the second opening width ck z. B. also be in the range between 0.1 mm and 10 mm. As in FIG. 1, it can be different from or equal to the first opening width di.
  • the second passage opening 21.2 is defined by a second spacer 4.2 which is clamped between parts of the two carrier plates 31.2, 32.2.
  • a metallic electrode 51.2, 52.2 is located on each of the plate surfaces facing one another and the second through-opening 21.2. The two electrodes 51.2, 52.2 lie opposite one another and together form a second capacitor 5.2.
  • a support plate 32.1 of the first capacitor arrangement 2.1 coincides with a support plate 32.2 of the second capacitor arrangement 2.2. Accordingly, this central support plate 32.1, 32.2 has an electrode 52.1, 52.2 on each of its two plate surfaces, one of which belongs to the first capacitor 5.1 and the other to the second capacitor 5.2.
  • a dual function of a carrier plate 32.1, 32.2 is not mandatory for the invention.
  • the capacitor arrangements 2.1, 2.2 can each have two separate support plates.
  • the first capacitor arrangement 2.1 with the wider first through-opening 21.1 is suitable for thicker test objects 9, while thinner test objects 9 can be tested in the second capacitor arrangement 2.2 with the narrower second through-opening 21.2.
  • the two capacitor arrangements 2.1, 2.2 can be fastened in a support block 6.
  • the capacitances of the first capacitor 5.1 and of the second capacitor 5.2 are preferably of the same size.
  • the electrodes 51.2, 52.2 of the second capacitor 5.2 have a smaller surface area than the electrodes 51.1, 52.1 of the first capacitor 5.1 in order to compensate for the different opening widths di>d2.
  • Different capacitances of the two capacitors 5.1, 5.2 could be compensated for with additional capacitors (not shown).
  • the first capacitor 5.1 and the second capacitor 5.2 are installed in a compensation measuring bridge.
  • Various suitable materials are used in a compensation measuring bridge.
  • two alternating signal generators 7.1, 7.2 apply electrical alternating signals with the same frequency but a mutual phase shift of 180° to an outer electrode 51.1, 51.2 of the first capacitor 5.1 or the second capacitor 5.2.
  • the two inner electrodes 52.1, 52.2 are electrically connected to one another.
  • An electrical output signal tapped off from them is supplied on an output line 81 to an evaluation unit 8 for evaluation.
  • the compensation measuring bridge In the empty state without test material 9, the compensation measuring bridge should be in equilibrium with the same capacitances of the first capacitor 5.1 and the second capacitor 5.2 and should deliver a zero signal on the output line 81. Adjustment means for the zero adjustment of capacitive measuring bridges are known from the prior art and do not need to be discussed here.
  • the introduction of the test material 9 into the first passage opening 21.1 changes the capacitance of the first capacitor 5.1, so that the measuring bridge becomes unbalanced. Its non-zero output signal is a measure of the mass of the test material in the first capacitor 5.1.
  • the first capacitor arrangement 2.1 and the second capacitor arrangement 2.2 have a structure that is analogous to one another, and corresponding components of the first capacitor arrangement 2.1 and the second capacitor arrangement 2.2 each consist of the same material.
  • the masses of the first spacer 4.1 and the second spacer 4.2 are the same (cf. equation (8) above). Since the thicknesses of the first spacer 4.1 and the second spacer 4.2 differ from one another, the mass symmetry should be achieved by different surface areas. Such an embodiment is discussed in the following paragraph.
  • Figures 2 (a) and (b) show an example of the two spacers 4.1 and 4.2.
  • the spacers 4.1, 4.2 are shown here in a view perpendicular to the plane of the drawing in FIG. B. as longitudinal sections along the planes a-a and b-b in Figure 1 or as side views parallel to these planes. Without loss of generality, it is assumed that the first spacer 4.1 has a greater thickness than the second spacer 4.2. To achieve mass equality, the first spacer 4.1 should have a correspondingly smaller surface area than the second spacer 4.2.
  • the first spacer 4.1 is essentially designed as a rectangular frame that frames a rectangular recess 41.
  • the spacers 4.1, 4.2 can have other geometric shapes. There can be several recesses. The recess may be on the edge rather than inside the first spacer. The recess need not be continuous.
  • the masses of the carrier plates 31.1, 32.1, 31.2, 32.2 of the first capacitor arrangement 2.1 and of the second capacitor arrangement 2.2 are the same (cf. equation (8) above).
  • the carrier plates 31.1, 32.1, 31.2, 32.2 are preferably identical. If not, mass symmetry can be achieved by appropriate choice of their thicknesses and surface areas.
  • the masses of the corresponding electrodes 51.1, 51.2; 52.1, 52.2 of the first capacitor arrangement 2.1 and the second capacitor arrangement 2.2 are not identical, mass symmetry can be achieved by appropriate choice of their thicknesses and areas. Thanks to the material and mass symmetry described above, corresponding components experience the same temperature change at the same time when there is an external temperature change. This means that the measuring bridge always remains in equilibrium, even when the temperature changes.
  • At least one component of the first capacitor arrangement 2.1 and one component of the second capacitor arrangement 2.2 are thermally coupled to one another.
  • the thermal coupling can exist between the first spacer 4.1 and the second spacer 4.2, between the support plates 31.1, 32.1, 32.1, 32.2 and/or between a spacer 4.1, 4.2 and a support plate 31.1, 32.1, 32.1, 32.2.
  • the support block 6 is also preferably thermally coupled to the spacers 4.1, 4.2 and/or the support plates 31.1, 32.1, 32.1, 32.2.
  • Good heat conduction should be possible between the components that are thermally coupled to one another.
  • the heat transfer coefficient between the two components should be greater than approx. 200 W/(m 2 -K) and preferably greater than approx.
  • the thermal coupling the temperature between the components of the device 1 is equalized as quickly as possible. In this way, a spatial temperature gradient is quickly compensated and the measuring bridge is brought back into balance.
  • FIG. 3 illustrates advantages of the invention over the prior art. It shows schematic time curves of a temperature T(t) - for example an air temperature - in an area surrounding the device and two capacitances Ci(t), C2(t) and their difference Ci(t) - C2(t) compared to one time t
  • FIG. 3(b) shows the curves for the device 1 according to the invention.
  • the measuring bridge is adjusted at all times t > to and measures without errors.
  • the passive temperature compensation according to US-5,099,386 A (equation (3) above) can be used, but is not a necessary condition for the functioning of the invention.
  • the capacitances Ci(t), C2(t) have a different value in the second equilibrium state than in the first.

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  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Textile Engineering (AREA)
  • Electrochemistry (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Food Science & Technology (AREA)
  • Medicinal Chemistry (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)

Abstract

L'invention concerne un dispositif (1) d'analyse capacitive d'un objet d'essai (9) allongé et mobile, qui contient un premier agencement de condensateurs (2.1) avec une première ouverture de passage (21.1), à travers laquelle l'objet d'essai (9) peut être déplacé, et un premier condensateur (5.1), dont la capacité peut être influencée par un objet d'essai (9) se trouvant dans la première ouverture de passage (21.1) et qui présente une première capacité en l'absence d'objet d'essai (9). Le dispositif (1) contient en outre un second agencement de condensateurs (2.2) avec une seconde ouverture de passage (21.1) et un second condensateur (5.2) qui est disposé dans la seconde ouverture de passage (21.2) et qui présente une seconde capacité. Le premier condensateur (5.1) et le second condensateur (5.2) constituent des éléments d'un pont de mesure. Le premier agencement de condensateurs (2.1) et le second agencement de condensateurs (2.2) sont prévus et disposés de telle sorte que, en cas de changement de température dans le temps, une différence entre la première capacité et la seconde capacité reste sensiblement constante. Il en résulte une meilleure stabilité thermique du dispositif (1).
PCT/CH2022/000001 2021-03-22 2022-03-03 Dispositif d'analyse capacitive d'un objet d'essai allongé et mobile WO2022198341A1 (fr)

Priority Applications (2)

Application Number Priority Date Filing Date Title
EP22709553.6A EP4314794A1 (fr) 2021-03-22 2022-03-03 Dispositif d'analyse capacitive d'un objet d'essai allongé et mobile
CN202280024163.6A CN117178185A (zh) 2021-03-22 2022-03-03 对移动的细长测试物体进行电容分析的设备

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
CH00304/21 2021-03-22
CH3042021 2021-03-22

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WO2022198341A1 true WO2022198341A1 (fr) 2022-09-29

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EP (1) EP4314794A1 (fr)
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WO (1) WO2022198341A1 (fr)

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5099386A (en) 1990-09-20 1992-03-24 General Scanning, Inc. Variable-capacitance position transducing
US6072319A (en) * 1997-12-19 2000-06-06 Zellweger Luwa Ag Device for measuring properties of a textile product
US20080111563A1 (en) * 2005-04-05 2008-05-15 Uster Technologies Ag Device and Method for Examining a Solid, Elongate Product to be Tested
US20110193572A1 (en) * 2008-10-16 2011-08-11 Uster Technologies Ag Determining a Dielectric Property of a Capacitor
US20110254567A1 (en) 2008-10-16 2011-10-20 Uster Technologies Ag Capacitive Measuring Circuit for Yarn Inspection
CH705030A2 (de) * 2011-05-16 2012-11-30 Uster Technologies Ag Verfahren und Schaltung zur elektrischen Untersuchung eines Prüfgutes.
US20130342225A1 (en) 2011-03-11 2013-12-26 Uster Technologies Ag Capacitive Analysis of a Moving Test Material
WO2016149847A1 (fr) 2015-03-20 2016-09-29 Uster Technologies Ag Module capteur capacitif pour un appareil de contrôle de textile

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5099386A (en) 1990-09-20 1992-03-24 General Scanning, Inc. Variable-capacitance position transducing
US6072319A (en) * 1997-12-19 2000-06-06 Zellweger Luwa Ag Device for measuring properties of a textile product
US20080111563A1 (en) * 2005-04-05 2008-05-15 Uster Technologies Ag Device and Method for Examining a Solid, Elongate Product to be Tested
US20110193572A1 (en) * 2008-10-16 2011-08-11 Uster Technologies Ag Determining a Dielectric Property of a Capacitor
US20110254567A1 (en) 2008-10-16 2011-10-20 Uster Technologies Ag Capacitive Measuring Circuit for Yarn Inspection
US20130342225A1 (en) 2011-03-11 2013-12-26 Uster Technologies Ag Capacitive Analysis of a Moving Test Material
CH705030A2 (de) * 2011-05-16 2012-11-30 Uster Technologies Ag Verfahren und Schaltung zur elektrischen Untersuchung eines Prüfgutes.
WO2016149847A1 (fr) 2015-03-20 2016-09-29 Uster Technologies Ag Module capteur capacitif pour un appareil de contrôle de textile

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EP4314794A1 (fr) 2024-02-07
CN117178185A (zh) 2023-12-05

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