WO2022180055A1 - Zerstäubungstarget - Google Patents
Zerstäubungstarget Download PDFInfo
- Publication number
- WO2022180055A1 WO2022180055A1 PCT/EP2022/054443 EP2022054443W WO2022180055A1 WO 2022180055 A1 WO2022180055 A1 WO 2022180055A1 EP 2022054443 W EP2022054443 W EP 2022054443W WO 2022180055 A1 WO2022180055 A1 WO 2022180055A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- inserts
- sputtering
- target
- sputtering target
- plate
- Prior art date
Links
- 238000000889 atomisation Methods 0.000 title abstract description 21
- 239000000463 material Substances 0.000 claims abstract description 77
- 238000000576 coating method Methods 0.000 claims abstract description 42
- 239000011248 coating agent Substances 0.000 claims abstract description 31
- 238000005477 sputtering target Methods 0.000 claims description 79
- 238000004544 sputter deposition Methods 0.000 claims description 49
- 229910052782 aluminium Inorganic materials 0.000 claims description 15
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims description 14
- 239000010936 titanium Substances 0.000 claims description 14
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 claims description 12
- 229910052719 titanium Inorganic materials 0.000 claims description 11
- 239000000758 substrate Substances 0.000 claims description 10
- 238000007373 indentation Methods 0.000 claims description 5
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims description 3
- 229910052802 copper Inorganic materials 0.000 claims description 3
- 239000010949 copper Substances 0.000 claims description 3
- 229910000881 Cu alloy Inorganic materials 0.000 claims description 2
- 238000000034 method Methods 0.000 description 8
- 150000002500 ions Chemical class 0.000 description 6
- 238000000168 high power impulse magnetron sputter deposition Methods 0.000 description 4
- 229910052751 metal Inorganic materials 0.000 description 4
- 230000000052 comparative effect Effects 0.000 description 3
- 230000001419 dependent effect Effects 0.000 description 3
- 230000002349 favourable effect Effects 0.000 description 3
- 239000002184 metal Substances 0.000 description 3
- 150000002739 metals Chemical class 0.000 description 3
- 239000000203 mixture Substances 0.000 description 3
- 229910052799 carbon Inorganic materials 0.000 description 2
- 239000011651 chromium Substances 0.000 description 2
- 238000010410 dusting Methods 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 230000003628 erosive effect Effects 0.000 description 2
- 239000002245 particle Substances 0.000 description 2
- 238000005240 physical vapour deposition Methods 0.000 description 2
- 229910052710 silicon Inorganic materials 0.000 description 2
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 1
- VYZAMTAEIAYCRO-UHFFFAOYSA-N Chromium Chemical compound [Cr] VYZAMTAEIAYCRO-UHFFFAOYSA-N 0.000 description 1
- 229910045601 alloy Inorganic materials 0.000 description 1
- 239000000956 alloy Substances 0.000 description 1
- 229910052796 boron Inorganic materials 0.000 description 1
- 238000004364 calculation method Methods 0.000 description 1
- 229910052804 chromium Inorganic materials 0.000 description 1
- 150000001875 compounds Chemical class 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000005284 excitation Effects 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 229910021645 metal ion Inorganic materials 0.000 description 1
- 239000007769 metal material Substances 0.000 description 1
- 230000000737 periodic effect Effects 0.000 description 1
- 230000000750 progressive effect Effects 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 239000011343 solid material Substances 0.000 description 1
- 229910052715 tantalum Inorganic materials 0.000 description 1
- GUVRBAGPIYLISA-UHFFFAOYSA-N tantalum atom Chemical compound [Ta] GUVRBAGPIYLISA-UHFFFAOYSA-N 0.000 description 1
- 229910052720 vanadium Inorganic materials 0.000 description 1
- GPPXJZIENCGNKB-UHFFFAOYSA-N vanadium Chemical compound [V]#[V] GPPXJZIENCGNKB-UHFFFAOYSA-N 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/34—Gas-filled discharge tubes operating with cathodic sputtering
- H01J37/3411—Constructional aspects of the reactor
- H01J37/3414—Targets
- H01J37/3423—Shape
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/06—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the coating material
- C23C14/14—Metallic material, boron or silicon
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
- C23C14/3407—Cathode assembly for sputtering apparatus, e.g. Target
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/34—Gas-filled discharge tubes operating with cathodic sputtering
- H01J37/3411—Constructional aspects of the reactor
- H01J37/3414—Targets
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/34—Gas-filled discharge tubes operating with cathodic sputtering
- H01J37/3411—Constructional aspects of the reactor
- H01J37/3414—Targets
- H01J37/3426—Material
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/34—Gas-filled discharge tubes operating with cathodic sputtering
- H01J37/3411—Constructional aspects of the reactor
- H01J37/3414—Targets
- H01J37/3426—Material
- H01J37/3429—Plural materials
Definitions
- the invention relates to a sputtering target, a coating system and a coating process.
- a sputtering target is used in sputtering technology, in particular for coating substrates.
- the sputtering target is sputtered by particle bombardment.
- the dusted components of the target get into the gas phase and can thus be used as materials for surface coatings, for example.
- a sputtering target is connected as a cathode in a coating chamber of a coating system and is sputtered by positively charged particles, in particular gas and/or metal ions.
- sputtering targets which consist entirely of one material
- sputtering targets which comprise a number of materials, in particular different metals.
- a design is known in which a sputtering target has a plate made of a first material in which bores are arranged, with plugs made of a different material being inserted in the bores.
- US Pat. No. 6,852,201 shows an atomization component for carrying out a PVD coating process, in which atomization occurs by means of bombardment with gas ions and a layer with a plurality of metallic elements is applied to a substrate.
- the atomization component consists of a titanium base plate, which has bores into which aluminum plugs are pressed.
- the dusting rate for aluminum is greater than for titanium, so the aluminum plugs have a concave curvature of the exposed surfaces with respect to the base plate.
- DE 2940369 Ai discloses a target for dusting at least two different metallic materials.
- a plate made of a material to be dusted has through holes with a circular cross-section, are used in the bolts from the second material to be dusted with a snug fit.
- the bolts have a thickened end which engages in an enlarged end region of the bores formed as a countersunk bore.
- the sputtering target according to the invention has a base plate and a target plate fastened thereon.
- the target plate has a plurality of inserts located in recesses formed in the surface of the target plate.
- the base plate and/or target plate is preferably flat and/or rectangular in shape.
- the base and target plates are preferably at least essentially of the same size.
- the inserts are preferably shaped in such a way that they suitably fill out the recesses, optionally with a superficial concave depression.
- the recesses and the inserts that fit into them can have any cross-sectional shape, for example round, triangular, rectangular, square, polygonal, oval, etc. Examples of inserts with different cross-sectional shapes are explained below.
- the target plate is composed of a first sputtering material and at least a portion of the inserts, more preferably the majority of the inserts and most preferably all of the inserts are composed of a second sputtering material.
- An atomization material is understood as meaning a solid material that can be used for atomization processes and in particular for coating processes. Metals are preferred, in particular pure metals, but other materials such as carbon can also be used. Examples of atomizing materials are given below.
- the materials of the target plate and the plugs differ.
- the second sputtering material constituting the plugs has a higher sputter yield than the first sputtering material constituting the target plate.
- the second sputtering material can have a sputter yield that is at least 20%, preferably at least 50%, and even 100% higher than the first sputtering material.
- sputtering yield is a material dependent parameter that indicates the average number of target atoms emitted per impinging ion during the sputtering process. Consequently, there is a higher sputter removal in relation to the area with uniformly impinging ions in the inserts formed from the second sputtering material compared to the target plate.
- the inserts made of the second atomization material preferably the majority and particularly preferably all inserts, have a shape in which the expansion, measured in a measuring direction parallel to the surface, extends over a depth direction starting from the surface to the base plate. continuously enlarged.
- the extent increases strictly monotonously over the depth.
- the respective cross-sectional area of the inserts preferably also increases accordingly over the depth direction.
- the increasing shape of the inserts is sometimes referred to with the terms "cone” or “conicity”, which does not mean a limitation to a cone or cone shape, i.e. a round cross-sectional shape and/or a continuous linear progression , although the latter is preferred.
- the conical shape of the inserts has proven to be advantageous for achieving a composition of the sputtered material that is as uniform as possible over the useful life of the sputtering target.
- the coating produced is composed of the components of the dusted material.
- the inventors have found that in conventional sputtering targets with cylindrical inserts as wear progresses, a reduction in the proportion of the Inserts forming the second sputtering material relative to the target plate forming the first sputtering material shows.
- This tendency is counteracted with the sputtering target according to the invention, so that preferably the change in the relative proportion of the second sputtering material is at least partially or ideally even at least essentially completely compensated.
- a more uniform layer composition can be achieved over the service life of the sputtering target.
- the shape of the inserts which increases in depth, can be achieved with various designs.
- the inserts can have one or more steps in longitudinal section, at which their extent in the measuring direction increases suddenly.
- the shape has a continuously continuous, i.e. constant, increase in the extent over the depth direction, which is preferably linear, so that, for example, in the case of a round cross-section, at least a section of a truncated cone shape results, or in the case of a rectangular or square cross-section, the shape of a truncated pyramid results.
- the inserts are particularly preferably conically or pyramidally shaped throughout.
- the outer contour can run obliquely at least in a section of the respective inserts, ie at a conicity angle, compared to a cuboid or cylindrical shape.
- the conicity angle can, for example, be in the range of 1-20°. Since the depth direction under consideration proceeds perpendicularly from the surface, the angle formed between the edge under consideration and the surface is, for example, 70° to 89°. A conicity angle of 4 to 15° (corresponding to an angle of 75 ° to 86°) is preferred between edge and surface); a conicity angle of 6° to 12° (78° to 84° between edge and surface) is particularly preferred. As explained below, the taper angle of different inserts of the target can differ.
- the preferred increase in cross-sectional area of the inserts may vary in different embodiments.
- the data given for the degree of conicity have proven to be favorable, in particular for material pairings in which the second sputtering material has a 50%-150% higher sputtering yield than the first sputtering material.
- the base plate and target plate preferably lie flat and directly on top of one another.
- the base plate can have indentations, which are preferably formed in its surface facing the target plate, but do not completely penetrate the base plate.
- a few, several, or preferably all inserts made of the second atomization material preferably protrude into the depressions of the base plate and can more preferably at least essentially completely fill them. This enables better utilization of the material of the target plate, since the sputtering target can be used for longer without the material of the base plate being sputtered to any significant extent.
- the base plate serves, on the one hand, for mechanically holding and fixing the sputtering target and, preferably, on the other hand, for good heat distribution and dissipation.
- the base plate preferably consists entirely or at least predominantly of at least essentially pure copper or of a copper alloy.
- the base plate may include fasteners or fastener engagement structures, such as fastener engagement bores.
- the first and the second atomization material can in particular be selected from the group comprising C, B, Al, Si and the elements of groups 4-6 of the periodic table according to IUPAC (1988) in pure form or as compounds, alloys or sintered materials.
- the material combination of the first and second atomization material can be, for example, titanium/aluminum.
- the target plate and/or the base plate is preferably rectangular in shape, in particular oblong, i.e. with a length of more than 3 times, preferably more than 5 times, its width.
- the width can be, for example, in the range from 50 to 200 mm, preferably 70-150 mm.
- the length can be, for example, in the range from 200 to 1000 mm, preferably 300 to 700 mm.
- the thickness of the target plate is preferably relatively small compared to its length and width and can preferably be, for example, in the range from 3 to 30 mm, particularly preferably 5 to 15 mm.
- the inserts may be arranged on the target plate in an annular region, i.e. along a closed strip surrounding the center of the target plate.
- annular does not necessarily mean a circular shape; in fact, with the preferred rectangular shape of the target plate, the preferred arrangement of the inserts follows an elliptical path or a rounded rectangle.
- the inserts are preferably arranged on the target plate along a line, with successive inserts being offset in directions laterally to the line. This arrangement has proven to be favorable in order to enable a relatively high number of uses along the area which is mainly stressed during cathode sputtering.
- inserts of different shapes and/or sizes can be used in different positions on the target plate. This can be particularly advantageous when different sputtering conditions result depending on the position on the target plate, for example due to different magnetic field strengths when the sputtering target is arranged on a magnetron cathode. In this way, any inhomogeneities can be compensated.
- inserts of different cross-sectional areas, in particular different diameters, and/or inserts with a greater or lesser conicity can be used.
- a first type of inserts of a first size and taper may be placed along the long sides of the target plate and a second type on the short sides.
- targets can be provided in which the inserts in a range with a length of e.g. 100-350 mm, preferably 200-300 mm, arranged e.g. centrally along the long sides, have no conicity or less than e.g.
- inserts with a round cross-section are known and tested, it has been shown that with severe conicity, ie increasing the diameter over the depth direction, it can be difficult to achieve a sufficiently dense arrangement of the inserts to obtain high surface fractions of the second atomizing material.
- inserts with a strip-shaped cross-section can therefore be used in particular.
- This is understood to mean a cross-sectional shape in which a maximum length dimension, ie length, is significantly greater than a dimension transverse to the length, ie width.
- the length of strip-shaped inserts preferably corresponds to at least twice the width, preferably at least three times. Even longer designs, in which the length/width ratio is at least 4, 5, 8 or 10, have also proven to be advantageous.
- the strip shape is preferably at least essentially rectangular, ie it has two at least essentially parallel longitudinal edges.
- the ends can preferably be rounded.
- Strip-shaped inserts can have a width of, for example, 5-20 mm, preferably 8-16 mm, particularly preferably 10-15 mm on the upper side.
- the length can depend on the arrangement within a rectangular target plate, so that shorter inserts can be used in a transverse arrangement or diagonal arrangement and longer inserts can be used in a longitudinal arrangement.
- the length can be, for example, 20-100 mm, preferably 25-80 mm, particularly preferably 30-50 mm. In a long version, the length can be up to 500 mm, for example.
- the strip-shaped inserts can be provided with a taper in that their length and/or their width increases in the depth direction. Both the width and the length preferably increase.
- Strip-shaped inserts can preferably be arranged parallel to one another.
- An oblique, i.e. diagonal arrangement of the inserts in a rectangular target surface has proven to be particularly favorable, in which the inserts are arranged with their longitudinal axis at an angle of preferably 20-70°, particularly preferably 30-60°, in particular 45 ° +/- io° are aligned relative to the longitudinal and/or transverse boundary of a rectangular target area.
- Good homogeneity in the distribution of the first and second sputtering material on the surface of the sputtering target can thus be achieved.
- the invention further relates to a coating installation in which, in a manner known per se, a vacuum can be generated in a coating chamber by means of suitable means and a substrate to be coated can be arranged.
- At least one cathode preferably a plurality of cathodes, in particular magnetron cathodes, is arranged inside the coating chamber.
- a sputtering target according to one of the preceding claims is attached to at least one, preferably several or all of the cathodes.
- the invention relates to a coating process in which a sputtering target according to the invention is sputtered in a vacuum by means of cathode sputtering and a Coating of sputtered components of the sputtering target is applied to a substrate.
- FIG. 1 shows a perspective view of a first embodiment of a atomization target with partially inserted inserts
- FIG. 2 shows the sputtering target from FIG. 1 in plan view
- FIG. 3 shows a view of a longitudinal section through the target along the line A..A in FIG. 2;
- FIG. 4 is an enlargement of area B of FIG. 3 showing the shape of an insert according to the first embodiment of the sputtering target;
- FIG. 5 shows a coating system in a schematic representation
- FIG. 6 shows a plan view of a second embodiment of a sputtering target with inserted inserts
- Figure 7a - 7c views of an insert of the sputtering target according to Figure 6;
- FIG. 8 shows a top view of a third embodiment of a sputtering target with inserted inserts
- FIG. 9 shows a diagram of the course of the proportion of a sputtering material over the removal of a sputtering target
- FIG. 10, 11 in top view a fourth and fifth embodiment of an atomization target with inserted inserts.
- Figure 1 shows a first embodiment of a sputtering target 10.
- the sputtering target 10 is of rectangular flat shape. It comprises a rectangular base plate 12 made of copper and a target plate 14 arranged thereon and made of a first sputtering material, here for example pure titanium.
- Recesses 18 are provided on a front surface 16 of the target plate, in which inserts 20 of a second sputtering material are inserted, here for example pure aluminum.
- the inserts 20 are also referred to as plugs.
- the recesses 18 are shown in the right half of the sputtering target 10 without inserts 20 inserted therein and in the left half with inserts 20 Recesses 18 are completely or at least mostly filled.
- the upper sides of the inserts 20 each form a continuous flat surface with the surface 16 of the target plate 14 or alternatively adjoin the surface 16 but then have a concave upper indentation (not shown).
- the sputtering target 10 is shown in Figure 2 in plan view.
- the recesses 18 and inserts 20 inserted therein are placed on the surface 16 in an annular array along a circumferential strip which is in the shape of a narrow, elongate, rounded-cornered rectangle.
- successive inserts 20 are alternately laterally offset from one another and arranged so closely one after the other that their edges almost touch.
- the target plate 14 has recesses in the corners, while the base plate 12 underneath has screw holes for fastening the sputtering target 10 to a cathode of a coating system, as will be explained below with regard to FIG.
- the target plate 14 and the base plate 12 have a number of centrally located bores, which are also used for attachment.
- FIG. 3 shows a longitudinal section through the sputtering target 10 along the line A..A in FIG. 2, the arrangement and shape of the base plate 12, target plate 14 and recesses 18 and inserts 20.
- FIG. 4 shows the area B from FIG. 3 on an enlarged scale.
- the inserts 20 each have the same shape.
- Each insert 20 is shaped as a truncated cone having an upper, minor diameter Di at surface 16 and a lower, major diameter D2.
- a depth direction T which extends from the surface 16 at right angles in the direction of the base plate 12, the transverse dimension measured here as a diameter increases linearly in the measuring direction parallel to the surface 16 from the diameter Di to the diameter D2. Consequently, the cross-sectional area of the insert 20 measured parallel to the surface 16 increases accordingly.
- the angle ⁇ is approximately 8° and the angle ⁇ is consequently approximately 82°.
- the insert 20 extends further in the depth direction than corresponds to the thickness Ti of the target plate 14 , namely up into recesses 22 in the base plate 12 .
- the base plate 12 here has a thickness T2 and the insert 20 extends into the base plate 12 by an amount T3.
- the length or depth of the inserts 20 (Ti + T3) is approximately 4 to 20 mm, preferably approximately 7 mm.
- the upper diameter Di of the inserts 20 is, for example, in the range of 10 to 20 mm and is preferably about 15 mm, and the lower diameter D2 is, for example, 5-20% larger than Di, preferably about 13%.
- Fig. 5 shows schematically a coating system 30 with a vacuum chamber 32, in which, for example, four cathodes 40 designed as unbalanced magnetrons around a sub- strategically 38 arranged around. Each of the cathodes 40 is each equipped with a sputtering target 10 .
- Means 34 for vacuum generation (pump system) and means 36 for supplying process gas and, if necessary, reactive gas are connected to the vacuum chamber 32 .
- the cathodes 20, the substrate table 38 and an anode 44, which is also arranged in the vacuum chamber 32, are connected to an electrical power supply system 42.
- the coating system 30 can be constructed and operated, for example, as disclosed in the applicant's WO 98/46807.
- the content of this publication is included here, in particular with regard to the electrical configuration of the illustrated elements of the coating system 30 and with regard to the processes during the coating.
- a plasma is generated in the vacuum chamber 32 by the electric power supply system 42 by means of an electric voltage between the cathodes 40 and the anode 44, so that the sputtering targets 10 are sputtered.
- Substrates arranged on the substrate table 38 are thus provided with a coating of the sputtered components of the sputtering target 10 .
- material is removed from the surface 16 of the sputtering target 10, primarily along an erosion ditch that extends annularly over the sputtering target along the arrangement of the inserts 20 (see FIG. 2). In the process, material is removed both from the exposed surface of the target plate 14 and from the inserts 20.
- the removal is not uniform, but is designed differently for the first sputtering material, here titanium, and the second sputtering material, here aluminum, according to the respective sputtering yield of these materials.
- the sputter yield of the second sputtering material, aluminum is approximately 100% higher than the sputter yield of the first sputtering material, titanium.
- inserts 20 have the same shape in the embodiment of sputtering target 10 described above, the shapes of the individual inserts 20 of the same sputtering target 10 can also differ from one another, in particular inserts 20 can have different degrees of conicity (ie in particular different angles of conicity) or inserts 20 can also be cylindrical Form, so have no conicity.
- a sputtering target 10 which has the same shape as the target plate 14 and the same number and arrangement of inserts 20 as the sputtering target 10 shown, but along a distance of, for example, 250 mm centrally along the longitudinal sides of the target plate 14 inserts 20 are provided with a cylindrical shape, ie without conicity.
- Such a target is particularly suitable for operation according to the HIPIMS method, in which there is greater removal in the middle of the longitudinal sides.
- the sputtering target 110 according to a preferred second embodiment largely corresponds to the sputtering target 10 according to the first embodiment; identical parts are provided with the same reference numbers.
- the sputtering target 110 has, like the sputtering target 10, a rectangular target plate 14 with a base plate 12 underneath it (not visible in FIG. 6).
- the second embodiment differs from the first embodiment in the different cross-sectional shape of the recesses 118 and the inserts 120 fittingly accommodated therein.
- the recesses 118 and inserts 120 are conical, ie they increase in depth direction T.
- the inserts 120 have a length Li and at the lower end a length L2, which is greater than Li Width B2 at the lower end is greater than a width Bi on the surface 16. Due to the elongated shape, the length Li, L2 is in each case significantly greater than the associated width Bi, B2 and is approximately 10 times the size here.
- the target plate 14 is preferably made of titanium and the inserts 120 are made of aluminum.
- the width of the inserts 120 increases over the depth direction T from the width B1 to the width B2 so that—seen in the longitudinal direction of the inserts 120—the side wall runs at an angle ßi.
- the length of the inserts 120 increases over the depth direction T from the length L1 to L2, so that—seen in the transverse direction of the inserts 120—the side wall runs at an angle ⁇ 2.
- the cross-sectional area of inserts 120 (parallel to surface 14) increases from surface 16 from an area Li x Bi in depth direction T to an area L2 x B2 (rounding not being considered in this calculation).
- the dimensions for the sizes Li, L2, Bi, B2, ßi, ß2 can differ for different embodiments.
- it may prove to be easier in terms of manufacturing technology to only provide a taper in the transverse direction, but not in the longitudinal direction (i.e. LI L2), since the influence of the taper in the transverse direction is stronger anyway.
- the inserts 120 may be characterized by the following values:
- the elongate inserts 120 extend on the surface 16 parallel to one another in diagonal alignment with the edges of the target Plate 14, here at an angle of about 45 ° .
- the conicity of the inserts 120 makes it easier to achieve a significant increase in the area proportion of the material of the inserts 120 in relation to the total area, without causing problems in placing the inserts 120 next to one another.
- FIG. 8 shows a sputtering target 210 according to a third embodiment.
- the sputtering target 210 according to the second embodiment largely corresponds to the sputtering target 110 according to the second embodiment; here, too, identical parts are provided with the same reference symbols. Only the differences between the embodiments are referred to below.
- the recesses 218 and inserts 220 inserted therein are also elongated, albeit significantly shorter with a width to length ratio of about 1:4.
- the inserts 220 are oriented diagonally, here also at about 45 ° to the edges, and are arranged in two parallel rows along the longitudinal edges of the target plate 14 .
- the inserts 220 are also conical, ie their length and/or width increases over the depth direction T (not shown in FIG. 8).
- the representations of the inserts 120 according to FIGS. 7a-7c also apply to the inserts 220, i.e. the dimensions L1, L2, B1, B2, ⁇ 1, ⁇ 2 also apply to the shape and enlargement in the depth direction T. According to a preferred embodiment, these can be selected as follows:
- FIG. 9 shows results of coating experiments using various sputtering targets 210 according to the third embodiment. Coatings were applied using the sputtering targets 210 consisting of a target plate 14 made of titanium and inserts 220 made of aluminum in the system 30 as described above. The aluminum content is shown (in at-% of the metallic layer components) in the layers produced over the removal of the sputtering target 210 (in mm)
- FIG. 9 three different curves are shown for different tapers of the inserts 220, each indicated by the area ratio between the cross-sectional area at the surface 16 and at the lower end.
- FIG. 10, FIG. 11 show sputtering targets 310, 410 according to a fourth and fifth embodiment.
- the sputtering target 310, 410 according to the fourth and fifth embodiments corresponds largely to the sputtering targets 110, 210 according to the previously described embodiments; here, too, identical parts are provided with the same reference symbols. Only the differences between the embodiments are referred to below.
- the recesses 318, 418 and inserts 320, 420 inserted therein are not arranged diagonally but parallel to the edges of the target plate 14; in the example of FIG. 10 parallel to the narrow sides and in FIG. 11 parallel to the long sides.
- the inserts 320, 420 are of conical design, ie their length and/or width increases over the depth direction T (not shown in FIGS. 10, 11).
- a conicity of inserts of a sputtering target can be used to homogenize the relative proportion of the coating materials in the layers produced.
- Such a taper can be provided for inserts 20, 120, 220, 320, 420 of different cross-sectional shape and arrangement in the target plate 14.
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- Chemical Kinetics & Catalysis (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
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- Organic Chemistry (AREA)
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Abstract
Description
Claims
Priority Applications (4)
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CN202280016152.3A CN116897220A (zh) | 2021-02-23 | 2022-02-22 | 溅射靶 |
EP22708892.9A EP4281596A1 (de) | 2021-02-23 | 2022-02-22 | Zerstäubungstarget |
US18/547,678 US20240229224A9 (en) | 2021-02-23 | 2022-02-22 | Sputtering target |
JP2023548566A JP2024506646A (ja) | 2021-02-23 | 2022-02-22 | スパッタリングターゲット |
Applications Claiming Priority (2)
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DE102021104255.0 | 2021-02-23 | ||
DE102021104255.0A DE102021104255A1 (de) | 2021-02-23 | 2021-02-23 | Zerstäubungstarget |
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WO2022180055A1 true WO2022180055A1 (de) | 2022-09-01 |
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PCT/EP2022/054443 WO2022180055A1 (de) | 2021-02-23 | 2022-02-22 | Zerstäubungstarget |
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EP (1) | EP4281596A1 (de) |
JP (1) | JP2024506646A (de) |
CN (1) | CN116897220A (de) |
DE (1) | DE102021104255A1 (de) |
WO (1) | WO2022180055A1 (de) |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4724060A (en) * | 1984-11-14 | 1988-02-09 | Hitachi, Ltd. | Sputtering apparatus with film forming directivity |
EP0634499A1 (de) * | 1993-07-15 | 1995-01-18 | Japan Energy Corporation | Mosaik-Target |
US20030173216A1 (en) * | 2000-08-08 | 2003-09-18 | Bernd Hermeler | Sputtertarget |
WO2013003065A2 (en) * | 2011-06-30 | 2013-01-03 | Soladigm, Inc. | Sputter target and sputtering methods |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE2940369C2 (de) | 1979-10-05 | 1982-10-21 | W.C. Heraeus Gmbh, 6450 Hanau | Target |
JPS59133369A (ja) | 1983-01-21 | 1984-07-31 | Hitachi Ltd | スパツタリング用のタ−ゲツト構造体 |
WO1998046807A1 (en) | 1997-04-14 | 1998-10-22 | Cemecon-Ceramic Metal Coatings-Dr.-Ing. Antonius Leyendecker Gmbh | Method and device for pvd coating |
-
2021
- 2021-02-23 DE DE102021104255.0A patent/DE102021104255A1/de active Pending
-
2022
- 2022-02-22 CN CN202280016152.3A patent/CN116897220A/zh active Pending
- 2022-02-22 WO PCT/EP2022/054443 patent/WO2022180055A1/de active Application Filing
- 2022-02-22 EP EP22708892.9A patent/EP4281596A1/de active Pending
- 2022-02-22 JP JP2023548566A patent/JP2024506646A/ja active Pending
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4724060A (en) * | 1984-11-14 | 1988-02-09 | Hitachi, Ltd. | Sputtering apparatus with film forming directivity |
EP0634499A1 (de) * | 1993-07-15 | 1995-01-18 | Japan Energy Corporation | Mosaik-Target |
US20030173216A1 (en) * | 2000-08-08 | 2003-09-18 | Bernd Hermeler | Sputtertarget |
WO2013003065A2 (en) * | 2011-06-30 | 2013-01-03 | Soladigm, Inc. | Sputter target and sputtering methods |
Also Published As
Publication number | Publication date |
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EP4281596A1 (de) | 2023-11-29 |
DE102021104255A1 (de) | 2022-08-25 |
US20240133022A1 (en) | 2024-04-25 |
CN116897220A (zh) | 2023-10-17 |
JP2024506646A (ja) | 2024-02-14 |
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