WO2022153618A1 - 熱交換装置および電力変換装置 - Google Patents
熱交換装置および電力変換装置 Download PDFInfo
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- WO2022153618A1 WO2022153618A1 PCT/JP2021/036017 JP2021036017W WO2022153618A1 WO 2022153618 A1 WO2022153618 A1 WO 2022153618A1 JP 2021036017 W JP2021036017 W JP 2021036017W WO 2022153618 A1 WO2022153618 A1 WO 2022153618A1
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- Prior art keywords
- heat exchange
- exchange device
- cooling water
- fin
- water channel
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- 238000006243 chemical reaction Methods 0.000 title claims abstract description 23
- 239000000498 cooling water Substances 0.000 claims abstract description 80
- 238000005192 partition Methods 0.000 claims abstract description 23
- 239000004065 semiconductor Substances 0.000 claims abstract description 22
- 238000001816 cooling Methods 0.000 claims description 7
- 230000015572 biosynthetic process Effects 0.000 abstract description 6
- 238000003475 lamination Methods 0.000 abstract 1
- 230000017525 heat dissipation Effects 0.000 description 10
- 239000000463 material Substances 0.000 description 10
- 239000011347 resin Substances 0.000 description 9
- 229920005989 resin Polymers 0.000 description 9
- 239000003507 refrigerant Substances 0.000 description 7
- 238000007789 sealing Methods 0.000 description 7
- 239000003566 sealing material Substances 0.000 description 6
- 238000000034 method Methods 0.000 description 3
- 239000000758 substrate Substances 0.000 description 3
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 2
- 238000005219 brazing Methods 0.000 description 2
- 239000000919 ceramic Substances 0.000 description 2
- 229910052802 copper Inorganic materials 0.000 description 2
- 239000010949 copper Substances 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000005242 forging Methods 0.000 description 2
- 239000004519 grease Substances 0.000 description 2
- 238000003754 machining Methods 0.000 description 2
- 230000005855 radiation Effects 0.000 description 2
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 2
- 238000003466 welding Methods 0.000 description 2
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 239000003990 capacitor Substances 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- -1 copper and aluminum Chemical class 0.000 description 1
- 230000003203 everyday effect Effects 0.000 description 1
- 230000005669 field effect Effects 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 150000002739 metals Chemical class 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000000465 moulding Methods 0.000 description 1
- 229910000679 solder Inorganic materials 0.000 description 1
- 238000003860 storage Methods 0.000 description 1
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K7/00—Constructional details common to different types of electric apparatus
- H05K7/20—Modifications to facilitate cooling, ventilating, or heating
- H05K7/2089—Modifications to facilitate cooling, ventilating, or heating for power electronics, e.g. for inverters for controlling motor
- H05K7/20927—Liquid coolant without phase change
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/34—Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements
- H01L23/42—Fillings or auxiliary members in containers or encapsulations selected or arranged to facilitate heating or cooling
- H01L23/433—Auxiliary members in containers characterised by their shape, e.g. pistons
- H01L23/4334—Auxiliary members in encapsulations
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- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/34—Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements
- H01L23/46—Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements involving the transfer of heat by flowing fluids
- H01L23/473—Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements involving the transfer of heat by flowing fluids by flowing liquids
-
- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02M—APPARATUS FOR CONVERSION BETWEEN AC AND AC, BETWEEN AC AND DC, OR BETWEEN DC AND DC, AND FOR USE WITH MAINS OR SIMILAR POWER SUPPLY SYSTEMS; CONVERSION OF DC OR AC INPUT POWER INTO SURGE OUTPUT POWER; CONTROL OR REGULATION THEREOF
- H02M7/00—Conversion of ac power input into dc power output; Conversion of dc power input into ac power output
- H02M7/003—Constructional details, e.g. physical layout, assembly, wiring or busbar connections
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
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- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/31—Structure, shape, material or disposition of the layer connectors after the connecting process
- H01L2224/32—Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
- H01L2224/321—Disposition
- H01L2224/32135—Disposition the layer connector connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip
- H01L2224/32145—Disposition the layer connector connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip the bodies being stacked
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- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/31—Structure, shape, material or disposition of the layer connectors after the connecting process
- H01L2224/32—Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
- H01L2224/321—Disposition
- H01L2224/32151—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/32221—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/32245—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/31—Structure, shape, material or disposition of the layer connectors after the connecting process
- H01L2224/33—Structure, shape, material or disposition of the layer connectors after the connecting process of a plurality of layer connectors
- H01L2224/331—Disposition
- H01L2224/3318—Disposition being disposed on at least two different sides of the body, e.g. dual array
- H01L2224/33181—On opposite sides of the body
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/34—Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements
- H01L23/36—Selection of materials, or shaping, to facilitate cooling or heating, e.g. heatsinks
- H01L23/367—Cooling facilitated by shape of device
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L24/31—Structure, shape, material or disposition of the layer connectors after the connecting process
- H01L24/32—Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L24/31—Structure, shape, material or disposition of the layer connectors after the connecting process
- H01L24/33—Structure, shape, material or disposition of the layer connectors after the connecting process of a plurality of layer connectors
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L25/00—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof
- H01L25/03—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes
- H01L25/04—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers
- H01L25/07—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers the devices being of a type provided for in group H01L29/00
- H01L25/072—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers the devices being of a type provided for in group H01L29/00 the devices being arranged next to each other
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L25/00—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof
- H01L25/18—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof the devices being of types provided for in two or more different subgroups of the same main group of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/181—Encapsulation
Definitions
- the present invention relates to a heat exchange device and a power conversion device.
- the present invention it is possible to provide a heat exchange device having reduced pressure loss and improved heat dissipation performance, and a power conversion device including the heat exchange device.
- FIG. 2A is a cross-sectional view taken along the line AA of FIG.
- the external view of the power module which concerns on 1st Embodiment of this invention.
- Exploded view of FIG. Exploded view of the first water channel of FIG.
- FIG. 4 is a sectional view taken along the line CC of FIG.
- FIG. 8 is a sectional view taken along line DD of FIG.
- FIG. 8 is a cross-sectional view taken along the line EE of FIG.
- the external view of the power module which concerns on 2nd Embodiment.
- Exploded view of FIG. The first waterway exploded view of FIG.
- the external view of the power module which concerns on 3rd Embodiment.
- the mold body 300 includes power semiconductor elements 321U, 321L, 322U, and 322L.
- the power semiconductor elements 321U and 321L are IGBTs of the upper arm and the lower arm, respectively. Further, the power semiconductor elements 322U and 322L are diodes for the upper arm and the lower arm, respectively.
- the power semiconductor elements 321U, 321L, 322U, and 322L can be applied not only to IGBTs but also to FETs (Field effect transistors) and the like.
- the mold body 300 is composed of an upper arm 300U and a lower arm 300L.
- the upper arm 300U is composed of an IGBT 321U and a diode 322U, and has a DC positive electrode terminal 311 and a signal terminal 314.
- the lower arm 300L is composed of an IGBT 321L and a diode 322L, and has a DC negative electrode terminal 312 and a signal terminal 315.
- the upper arm 300U and the lower arm 300L have an AC terminal 313 at an intermediate connection point.
- the DC positive electrode terminal 311 and the DC negative electrode terminal 312 are connected to a capacitor (not shown) or the like to supply DC power to the power semiconductor elements 321U, 321L, 322U, and 322L from the outside of the mold body 300. ..
- the signal terminals 314 and 315 are connected to the control board and control the switching operation of the power semiconductor elements 321U, 321L, 322U and 322L.
- the AC terminal 313 electrically connects the upper arm 300U and the lower arm 300L, and outputs AC power to the outside of the mold body 300.
- the power semiconductor elements 321U, 321L, 322U, and 322L have a lower surface joined to the first heat sink 341 via the first joining material 345, and an upper surface joined to the first heat sink 341 via the second joining material 346. It is joined to the second heat sink 342.
- the first joining material 345 and the second joining material 346 are solders and sintered materials.
- the water channel connection flange 170 has a water channel opening 171 and a water channel mounting hole 172, and a water channel mounting surface 173. Used for connection.
- the water channel opening 171 is an inlet or outlet for cooling water in the first water channel 110.
- the first water channel 110 is connected to a case or the like that supplies cooling water from the outside by the water channel mounting surface 173.
- the first intermediate plate 140 has two first intermediate plate second openings 142 at both ends (longitudinal) in the lateral direction.
- first water channel 110 Inside the first water channel 110, a buffer region formed by the first water channel cover 150 and the first intermediate plate 140, and fin formation formed by the first fin cover 120, the first intermediate plate 140, and the first fin 130. It is composed of two layers of the area.
- the first fin 130 is joined to the first intermediate plate 140.
- the first intermediate plate 140 is joined to the first water channel cover 150.
- the first channel cover 150 is joined to the channel connecting flange 170. These joins are made by brazing or laser welding.
- the water channel opening 171 is formed by forming two water channel openings 171 with only one water channel connecting flange 170 by using only one first intermediate plate first opening 141 of the first intermediate plate 140 to form cooling water. It may be used as a doorway. At this time, the first waterway cover opening 151 and the first intermediate plate first opening 141 each have only one configuration. Further, the first fin 130 may be formed on the first fin cover 120 by forging or machining so as to be integrated with the first fin cover 120.
- One of the two first intermediate plate second openings 142 is the first fin region inlet 143.
- the other of the two first intermediate plate second openings 142 is the first fin region outlet 144.
- the first fin region inlet 143 connects the first buffer region 152 and the first fin region 122 to form a water channel.
- One of the two second intermediate plate second openings 242 is the second fin region inlet 243.
- the other of the two second intermediate plate second openings 242 is the second fin region outlet 244.
- the second fin region inlet 243 connects the third buffer region 252 and the second fin region 222 to form a water channel.
- the second water channel partition portion 254 is arranged in a shape that divides the second water channel 210 diagonally. Since the flow path width of the cooling water 245 flowing in the third buffer region 252 narrows from the second pipe opening 261 on the inlet side toward the second fin region inlet 243, the flow rate of the cooling water becomes smaller. On the other hand, the cooling water 245 flowing in the fourth buffer region 253 is cooled water because the cooling water flows from the second fin region outlet 244 and the flow path width widens toward the second pipe opening 261 on the outlet side. The flow rate of
- Cooling water flows in opposite directions to the two fin forming regions facing each other with the power semiconductor element in between.
- inlets and outlets formed at both ends in the longitudinal direction of the heat exchanger are formed at only one of both ends in the longitudinal direction.
- the present invention is described with the configuration that the entrance and exit to the water channel is only from the buffer region, the entrance and exit of the water channel connected to the fin region are provided so that the cooling water can enter and exit from both layers. May be good.
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- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Physics & Mathematics (AREA)
- Power Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Thermal Sciences (AREA)
- Cooling Or The Like Of Semiconductors Or Solid State Devices (AREA)
Abstract
Description
以下、図面を参照して本発明の実施形態を説明する。ただし、本発明は下記の実施形態に限定解釈されるものではなく、公知の他の構成要素を組み合わせて本発明の技術思想を実現してもよい。なお、各図において同一要素については同一の符号を記し、重複する説明は省略する。
図12は、第2の実施形態に係る、パワーモジュールの外観図である。
図16は、第3の実施形態に係る、パワーモジュールの外観図である。
110、110A、110B・・・第1水路
111A・・・第1水路接続部
120、120A・・・第1フィンカバー
121・・・第1フィンカバー放熱面
122・・・第1フィン領域
130、130A・・・第1フィン
140、140A・・・第1中間板
141、141A・・・第1中間板第1開口
142・・・第1中間板第2開口
143・・・第1フィン領域入口
144・・・第1フィン領域出口
150、150A・・・第1水路カバー
151、151A・・・第1水路カバー開口
152・・・第1バッファ領域
153・・・第2バッファ領域
154・・・第1仕切り部
160、160A・・・第1パイプ
161・・・第1パイプ開口
162・・・シール材収容部
170、170A・・・水路接続フランジ
171・・・水路開口
172・・・水路取付穴
173・・・水路取付面
210、210A・・・第2水路
211、211A・・・第2水路接続部
220、220A・・・第2フィンカバー
222・・・第2フィン領域
230、230A・・・第2フィン
240、240A・・・第2中間板
241、241A・・・第2中間板第1開口
242・・・第2中間板第2開口
243・・・第2フィン領域入口
244・・・第2フィン領域出口
245・・・冷却水(の流れ)
250、250A・・・第2水路カバー
251・・・第2水路カバー開口
252・・・第3バッファ領域
253・・・第4バッファ領域
254、254A・・・第2仕切り部
260、260A・・・第2パイプ
261・・・第2パイプ開口
300、300A、300B・・・モールド体
300U・・・上アーム
300L・・・下アーム
311・・・直流正極端子
312・・・直流負極端子
313・・・交流端子
314、315・・・信号端子
330・・・封止樹脂
350・・・熱伝導部材
400・・・シール材
Claims (14)
- 略長方形状に形成された熱交換装置であって、
前記熱交換装置の短手方向に冷却水を流すフィン形成領域と、
積層方向において、隔壁を間に挟んで前記フィン形成領域と対向して形成されるバッファ領域と、を備え、
前記熱交換装置の長手方向の両端部の少なくとも一方に、冷却水の入口および出口がそれぞれ形成され、
前記短手方向の両端部において前記長手方向に、前記フィン形成領域と前記バッファ領域とを接続する流路穴が形成され、
前記バッファ領域は、前記入口から流入する前記冷却水と前記出口に向かう冷却水を分ける仕切り部を有し、前記流路穴を介して前記フィン形成領域と前記入口および前記出口とがそれぞれ接続される
熱交換装置。 - 請求項1に記載の熱交換装置であって、
前記仕切り部は、前記熱交換装置の対角線上に配置される
熱交換装置。 - 請求項1に記載の熱交換装置であって、
パワー半導体素子は、2つの前記熱交換装置の間に挟まれ、前記熱交換装置のカバーを介して前記フィン形成領域と接している
熱交換装置。 - 請求項2に記載の熱交換装置であって、
前記バッファ領域は、前記冷却水が前記入口から前記流路穴に向かうにしたがって流路幅を縮め、前記冷却水が前記流路穴から前記出口に向かうにしたがって流路幅を広げる
熱交換装置。 - 請求項3に記載の熱交換装置であって、
前記パワー半導体素子を間に挟んで対向する2つの前記フィン形成領域は、互いに逆向きに冷却水を流す
熱交換装置。 - 請求項1に記載の熱交換装置であって、
前記入口および前記出口は、前記長手方向の両端部のどちらか一方だけに形成される
熱交換装置。 - 請求項1に記載の熱交換装置であって、
パワー半導体素子は、前記熱交換装置によって片面が冷却される
熱交換装置。 - パワー半導体素子と、
略長方形状に形成されて前記パワー半導体素子を冷却する熱交換装置と、を備える電力変換装置であって、
前記熱交換装置は、
前記熱交換装置の短手方向に冷却水を流すフィン形成領域と、
積層方向において、隔壁を間に挟んで前記フィン形成領域と対向して形成されるバッファ領域と、を備え、
前記熱交換装置の長手方向の両端部の少なくとも一方に、冷却水の入口および出口がそれぞれ形成され、
前記短手方向の両端部において前記長手方向に、前記フィン形成領域と前記バッファ領域とを接続する流路穴が形成され、
前記バッファ領域は、前記入口から流入する前記冷却水と前記出口に向かう冷却水を分ける仕切り部を有し、前記流路穴を介して前記フィン形成領域と前記入口および前記出口とがそれぞれ接続される
電力変換装置。 - 請求項8に記載の熱交換装置であって、
前記仕切り部は、前記熱交換装置の対角線上に配置される
熱交換装置。 - 請求項8に記載の電力変換装置であって、
パワー半導体素子は、2つの前記熱交換装置の間に挟まれ、前記熱交換装置のカバーを介して前記フィン形成領域と接している
電力変換装置。 - 請求項9に記載の電力変換装置であって、
前記バッファ領域は、前記冷却水が前記入口から前記流路穴に向かうにしたがって流路幅を縮め、前記冷却水が前記流路穴から前記出口に向かうにしたがって流路幅を広げる
電力変換装置。 - 請求項10に記載の電力変換装置であって、
前記パワー半導体素子を間に挟んで対向する2つの前記フィン形成領域は、互いに逆向きに冷却水を流す
電力変換装置。 - 請求項8に記載の電力変換装置であって、
前記入口および前記出口は、前記長手方向の両端部のどちらか一方だけに形成される
電力変換装置。 - 請求項8に記載の電力変換装置であって、
パワー半導体素子は、前記熱交換装置によって片面が冷却される
電力変換装置。
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Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
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JPS6471156A (en) * | 1987-09-11 | 1989-03-16 | Hitachi Ltd | Cooling system for semiconductor |
JP2012044828A (ja) * | 2010-08-23 | 2012-03-01 | Denso Corp | 電力変換装置 |
JP2012129280A (ja) * | 2010-12-14 | 2012-07-05 | Toyota Motor Corp | 半導体冷却装置及びその製造方法 |
WO2019211889A1 (ja) * | 2018-05-01 | 2019-11-07 | 三菱電機株式会社 | 半導体装置 |
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JP6972645B2 (ja) | 2017-05-10 | 2021-11-24 | 株式会社デンソー | 電力変換装置 |
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Publication number | Priority date | Publication date | Assignee | Title |
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JPS6471156A (en) * | 1987-09-11 | 1989-03-16 | Hitachi Ltd | Cooling system for semiconductor |
JP2012044828A (ja) * | 2010-08-23 | 2012-03-01 | Denso Corp | 電力変換装置 |
JP2012129280A (ja) * | 2010-12-14 | 2012-07-05 | Toyota Motor Corp | 半導体冷却装置及びその製造方法 |
WO2019211889A1 (ja) * | 2018-05-01 | 2019-11-07 | 三菱電機株式会社 | 半導体装置 |
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