WO2022111019A1 - Wafer processing device capable of isolating and protecting wafer - Google Patents

Wafer processing device capable of isolating and protecting wafer Download PDF

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Publication number
WO2022111019A1
WO2022111019A1 PCT/CN2021/120293 CN2021120293W WO2022111019A1 WO 2022111019 A1 WO2022111019 A1 WO 2022111019A1 CN 2021120293 W CN2021120293 W CN 2021120293W WO 2022111019 A1 WO2022111019 A1 WO 2022111019A1
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WO
WIPO (PCT)
Prior art keywords
wafer
isolating
processing device
processing
opening
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PCT/CN2021/120293
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French (fr)
Chinese (zh)
Inventor
徐枭宇
朱政挺
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杭州众硅电子科技有限公司
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Publication of WO2022111019A1 publication Critical patent/WO2022111019A1/en

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Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/677Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
    • H01L21/67739Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber
    • H01L21/67742Mechanical parts of transfer devices
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/677Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
    • H01L21/67739Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber
    • H01L21/67751Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber vertical transfer of a single workpiece

Definitions

  • the present invention relates to the technical field of chip processing, and more particularly, to a wafer processing device capable of isolating and protecting wafers.
  • each module will be provided with an independent protective device, but this will lead to high cost, unprotected loading and unloading areas, and it is not easy for residues dripping on the protective isolation devices in each area. Centralized processing, etc.
  • the object of the present invention is to provide a wafer processing apparatus capable of isolating and protecting wafers, which can effectively improve the cleanliness of the processing environment, thereby improving the yield of wafers .
  • the present invention provides the following technical solutions:
  • a wafer processing device capable of isolating and protecting wafers comprising a processing device for processing wafers and a lifting device for driving the wafer to descend to enter the working place of the processing device, including a blocking device and the position of the barrier device corresponding to the working place of the processing device is provided with an opening that penetrates up and down, so that the lifting device can drive the wafer to pass through the opening to connect with the barrier device on the upper side of the barrier device. It is transported back and forth between the working places of the processing device on the lower side of the blocking device, and the opening is provided with a closed door.
  • the closing door is closed at this time, and the wafer and the processing device begin to move laterally relative to each other.
  • the lateral relative movement when the liquid remaining on the wafer falls, because the closing door is closed, it will fall on the closing door, and will not fall between the processing devices on the underside of the closing door, nor will it fall on the body of the processing unit.
  • the closed door is opened, and the lifting device can drive the wafer through the opening to enter the working place of the processing device for wafer processing.
  • the upper and lower isolation is performed by the barrier device, so as to effectively prevent the liquid dropped on the wafer from falling on the processing device or other processing devices on the lower side of the barrier device during the working process.
  • an opening is provided, and when the closed door is opened, the lifting device can transport the wafer up and down.
  • the wafer processing apparatus capable of isolating and protecting wafers can effectively improve the cleanliness of the processing environment, thereby improving the yield of wafers.
  • the closing door can be opened when the lifting device drives the wafer to descend, and the closing door can be closed when the wafer is driven to ascend to reset.
  • the closing door and the blocking device are slidably connected in a horizontal direction to realize opening and closing.
  • one side edge of the closing door is rotatably connected with the corresponding side port edge of the opening so that opening and closing can be realized by rotation.
  • it includes a plurality of the processing devices, and also includes a transport device that drives the lifting device to move along the arrangement direction of the plurality of processing devices, and the blocking device is provided with a plurality of openings corresponding to each of the processing devices.
  • At least one group of the processing devices is a cleaning module for cleaning the wafers.
  • At least one group of the processing devices is a polishing device, and the polishing device includes a loading and unloading stage for carrying wafers, and the polishing part can move to avoid the opening corresponding to the loading and unloading stage.
  • the polishing device further comprises a swing arm or a robot for transferring wafers that can be rotated around a vertical axis, and the polishing part is mounted on the swing arm or the robot.
  • it includes a polishing work area, a wafer transition area and a wafer transfer area that are arranged in sequence, and at least one group of the processing devices is a polishing processing device, and the polishing processing device can be used to Wafer polishing process, the wafer transition area is provided with a transfer device, the wafer transfer area is provided with the opening and the closed door, and the transfer device can transfer the wafers in the polishing work area to the The wafer transfer area corresponds to below the opening.
  • the blocking device is in the form of a long strip, and a plurality of the openings are arranged in sequence.
  • the blocking device is a disc device, and a plurality of the openings are distributed circumferentially.
  • a wetting device for spraying liquid to wet the wafer on the upper side of the blocking device is further included, and the wetting device is mounted on the blocking device.
  • FIG. 1 is a schematic partial structure diagram of a wafer processing apparatus capable of isolating and protecting wafers according to an embodiment of the present invention
  • FIG. 2 is a schematic diagram of a sliding opening of a closed door provided by an embodiment of the present invention
  • FIG. 3 is a schematic diagram of a rotary opening of a closed door provided by an embodiment of the present invention.
  • FIG. 4 is a schematic structural diagram of a cleaning module of a wafer processing apparatus capable of isolating and protecting wafers according to an embodiment of the present invention
  • FIG. 5 is a schematic structural diagram of a polishing module of a wafer processing apparatus capable of isolating and protecting wafers according to an embodiment of the present invention
  • FIG. 6 is a schematic top view of the wafer processing apparatus capable of isolating the guard wafer in FIG. 5;
  • FIG. 7 is a schematic structural diagram of a wafer processing device capable of isolating and protecting wafers during rotation and transportation according to an embodiment of the present invention
  • FIG. 8 is a schematic diagram of an installation structure of a wetting device provided by an embodiment of the present invention.
  • FIG. 9 is a schematic structural diagram of a wafer processing apparatus when a polishing processing apparatus and a wafer transfer area are separated by a transition area according to an embodiment of the present invention.
  • Blocking device 1 lifting device 2, closing door 3, wafer 4, cleaning module 5, polishing part 6, loading and unloading table 7, swing arm 8, transport device 9, wetting device 10, polishing work area 11, wafer Transition area 12 , wafer transfer area 13 , transition area robot 14 , opening 15 .
  • the embodiment of the present invention discloses a wafer processing device capable of isolating and protecting wafers, so as to effectively solve the problem that the residual liquid of the wafer is difficult to clean.
  • FIG. 1 is a schematic diagram of a partial structure of a wafer processing apparatus capable of isolating and protecting wafers according to an embodiment of the present invention
  • FIG. 2 is a schematic diagram of a sliding opening of a closed door provided by an embodiment of the present invention
  • FIG. 3 FIG. 4 is a schematic structural diagram of a cleaning module of a wafer processing device capable of isolating and protecting wafers according to an embodiment of the present invention
  • FIG. 5 is a schematic diagram of a cleaning module provided by an embodiment of the present invention. Schematic diagram of a polishing module structure of a wafer processing device for isolating and protecting wafers;
  • FIG. 1 is a schematic diagram of a partial structure of a wafer processing apparatus capable of isolating and protecting wafers according to an embodiment of the present invention
  • FIG. 2 is a schematic diagram of a sliding opening of a closed door provided by an embodiment of the present invention
  • FIG. 3 is a schematic structural diagram of a cleaning module of a wafer
  • FIG. 6 is a schematic top view of a wafer processing device capable of isolating and protecting wafers in FIG. 5 ;
  • FIG. 7 is an embodiment of the present invention.
  • FIG. 8 is a schematic diagram of an installation structure of a wetting device provided by an embodiment of the present invention.
  • this embodiment provides a wafer processing device capable of isolating and protecting wafers, specifically, including a processing device, a lifting device 2 and a blocking device 1 .
  • the processing device is used to process the wafer 4, and the processing methods are cleaning, polishing, etc.
  • the specific processing device can be correspondingly set according to actual production needs.
  • the lifting device 2 is used to drive the wafer 4 to descend to enter the working place of the processing device, so that the processing device can process the wafer 4 .
  • the processed wafer 4 may be driven up by the lifting device 2 to enter the next processing device to continue the processing.
  • a transportation device 9 will be installed, and the transportation device 9 will drive the lifting device 2 to move laterally relative to the processing device, which can be realized by directly driving the lifting device 2 to move, or directly driving the processing device. .
  • the lifting device 2 can be a manipulator, the driving end has a fixing mechanism to fix the wafer 4, and the lifting and lowering of the driving end can be realized by rotational driving, such as a swing arm, or it can be realized by linear up and down driving, such as an up and down telescopic electric cylinder , telescopic pneumatic cylinder, telescopic hydraulic cylinder, etc. Specifically, it can be set as required, subject to the opening that can drive the wafer 4 to pass through the blocking device 1 .
  • the part of the blocking device 1 corresponding to the working place of the processing device is provided with an opening that penetrates up and down, so that the lifting device 2 drives the wafer 4 to penetrate from the upper side of the blocking device 1 to the lower side of the blocking device 1 through the opening.
  • the processing unit work place. Therefore, the opening should be slightly larger than the wafer 4, and when the lifting device 2 needs to pass through the opening together, according to the structural characteristics of the lifting device 2, the opening should be avoided to ensure that the lifting device 2 can drive the wafer 4 down to the working place of the processing device.
  • the opening is generally a rectangular opening, of course, it can also be a circular opening or other polygonal openings, which can be set as required. It should be noted that the openings may also be borderless openings, groove-type openings, etc. The groove-type openings, that is, one side edge of the opening is missing.
  • the opening is provided with a closed door 3, so that when the closed door 3 is closed, the falling liquid droplets on the upper side of the closed door 3 will not enter the lower side of the closed door 3, so as to play a blocking effect.
  • the closing door 3 is opened, the wafer 4 can pass through the opening, from bottom to top, or from top to bottom.
  • the movable connection between the closing door 3 and the blocking device 1 may be, for example, a sliding connection or a rotating connection as the current door body, and of course it may also be a foldable connection. Specifically, it can be set as required.
  • the closing door 3 is closed at this time.
  • the liquid remaining on the wafer 4 falls, because the closing door 3 is closed, it will fall on the closing door 3, and will not fall between the two processing devices on the lower side of the closing door 3, and will not fall on the lower side of the closing door 3. on the body of the processing unit.
  • the closing door 3 is opened at this time, and the lifting device 2 can drive the wafer 4 through the opening to enter the working place of the processing device for processing.
  • the upper and lower isolation is performed by the barrier device 1 to effectively prevent the liquid dropped from the wafer 4 from falling on the lower side of the barrier device during transportation.
  • an opening is provided on the device or other wafers.
  • the lifting device can transfer the wafers up and down.
  • the wafer processing apparatus capable of isolating and protecting wafers can effectively improve the cleanliness of the processing environment, thereby improving the wafer yield.
  • the opening and closing of the closed door 3 is related to the elevating drive of the lifting device 2, in order to avoid driving the closing door 3 to open and close independently each time, it is preferable here that the opening and closing of the closed door 3 is linked with the elevating drive of the lifting device 2, So that when the lifting device 2 drives the wafer 4 to descend, the closing door 3 is opened, and when the wafer 4 is driven to ascend to reset, the closing door 3 is closed.
  • a controller can be set to send a corresponding control signal to the closed door 3 when the controller sends a control signal to the lifting device 2, such as when sending a descending signal of the lifting device 2, and simultaneously send an opening signal to the closed door 3, such as When sending the lifting signal of the lifting device 2, the interval is predetermined time, so as to ensure that the lifting device 2 is completely raised, and the signal is closed.
  • Door 3 sends a close signal.
  • the communication can also be achieved through a mechanical structure, or the lifting signal of the lifting device 2 can be obtained through a detector such as a touch switch, and the closed door 3 can be controlled to open and close accordingly.
  • the closing door 3 may be sliding open, and specifically the closing door 3 is slidably connected with the blocking device 1 in the horizontal direction to realize opening and closing.
  • the closing door 3 is preferably located on the upper side of the body of the blocking device 1 here. It is also possible to rotate one side edge of the closed door 3 and the corresponding side edge of the opening so as to be able to be opened by rotation, specifically, it can be rotated downward to open, or it can be rotated upward to open.
  • a corresponding transportation device 9 is provided to drive the transportation device 9 to move the lifting device 2 along the arrangement direction of the plurality of processing devices
  • the blocking device 1 is preferably provided with a plurality of openings corresponding to each processing device, wherein the blocking device 1 can be relatively fixed with each lifting device 2 in the transporting direction of the transporting device 9 to move synchronously in the transporting direction, It may also be relatively fixed with the corresponding processing device. By setting a plurality of openings, it is ensured that each processing device can complete the corresponding processing work.
  • the plurality of processing devices may be sequentially distributed along a straight line, or may be sequentially distributed along a curve, and specifically, may be set as required.
  • the baffle device 1 can be formed in a long shape, and a plurality of openings can be arranged in sequence; the baffle device 1 can also be made into a disc device, and the plurality of the openings are distributed in the circumferential direction, and of course, it can be not in the shape of a circle. Shape distribution, the distribution form can be set as required.
  • At least one group of the processing devices can be a cleaning module 5 for cleaning the wafers 4 .
  • a plurality of cleaning modules 5 can be uniformly arranged in sequence along the transportation direction of the transport device 9 to form a plurality of cleaning stations. and unloading the wafer 4 station.
  • At least one group of the processing devices may be polishing devices, and the polishing device includes a loading and unloading table 7 for carrying the wafers 4 and a polishing part 6 for polishing the wafers 4 on the loading and unloading table 7 , wherein
  • the polishing part 6 is movably connected to the loading and unloading platform 7 so as to be movable to avoid the opening corresponding to the loading and unloading platform 7 , so that when the opening is avoided, the residual liquid falling from the opening can be effectively avoided from falling. into the polishing part 6 .
  • the sliding connection between the polishing part 6 and the loading and unloading table 7 may be a direct or indirect sliding connection.
  • a swing arm 8 that can rotate around a vertical axis, and the polishing part 6 is installed on the swing arm 8 on.
  • the swing arm 8 is rotated so that both the polishing part 6 and the swing arm 8 can avoid the opening, so that after the wafer 4 is loaded, it is rotated back so that the polishing part 6
  • the wafer 4 can be processed.
  • the swing arm 8 can also be of other structures.
  • the polishing device is provided with a robot arm specially used to transport the wafer 4 in and out, and the polishing part 6 does not need to be swing out.
  • FIG. 9 is the structure of the wafer processing apparatus when the polishing processing apparatus and the wafer transfer area are separated by a transition area according to an embodiment of the present invention.
  • the wafer processing device includes a polishing work area 11, a wafer transition area 12 and a wafer transfer area 13 that are arranged in parallel. It is the transverse direction along the transportation direction, specifically, it can be set as required.
  • the barrier device 1 is present, it is preferred that the barrier device 1 is located above the wafer transfer area.
  • at least one group of the processing apparatuses are polishing processing apparatuses.
  • the polishing processing apparatuses can be used to polish the wafers 4 located in the polishing work area 11 .
  • the specific polishing processing apparatuses may be directly installed in the polishing work area 11 .
  • the wafer transition area 12 is provided with a transmission device, and the specific transmission device may be a transition area robot 14.
  • the transition area robot 14 is installed in the wafer transition area 12, and the wafer transmission area 13 is provided with the above-mentioned opening 15 and In the above-mentioned closed door 3, the transition area robot 14 can transfer the wafer 4 in the polishing work area 11 to the corresponding opening 15 in the wafer transfer area 13, so as to facilitate further taking out the wafer 4 from the opening 15 to the barrier device 1.
  • the wafer 4 processed by the polishing processing device is moved from the polishing work area 11 through the wafer transition area 12 to the wafer transfer area 13 by the transition area robot 14 for picking and unloading.
  • the manipulator 14 in the transition area can preferably also transfer the wafer 4 at the corresponding opening 15 to the polishing work area 11 , so that the polishing process device can perform polishing processing in the polishing work area 11 .
  • the transition zone manipulator 14 may be the above-mentioned swing arm 8 or other specially used transmission mechanisms.
  • a wetting device 10 is further preferably provided.
  • the function of the wetting device 10 is to wet the transmission space on the upper side of the barrier device 1, specifically, to wet the crystals in the space of the transportation channel.
  • liquid is sprayed to wet the wafer 4 to create a moist environment to prevent the surface of the wafer 4 from crystallizing.
  • the specific wetting device 10 can be installed on the blocking device 1, and the specific installation position and installation quantity on the blocking device 1 can be set as required. For example, it can be installed at the corners of the blocking device 1, specifically, the wetting device 10 can be installed at both of the corners.
  • the specific structure of the wetting device 10 can also be set according to the configuration, and specifically may include a nozzle mounting seat and a nozzle on the mounting seat for spraying liquid on the wafer 4 .
  • the wetting device 10 may spray liquid (such as ultrapure water) all the time when the device is running, or it may spray liquid intermittently only when the wafer 4 is transported, and the specific settings are determined according to requirements.

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  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
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Abstract

A wafer processing device capable of isolating and protecting a wafer, comprising a processing device used for processing a wafer (4) and a lifting/lowering device (2) used for driving the wafer (4) to be lowered to enter a working place of the processing device, and comprising a baffle device (1). A portion of the baffle device (1) corresponding to the working place of the processing device is provided with an opening penetrating through in the up and down direction, such that the lifting/lowering device (2) can drive the wafer (4) to be conveyed back and forth between the upper side of the baffle device (1) and the working place of the processing device on the lower side of the baffle device (1) by means of the opening; a sealing door (3) is provided at the opening. Upper and lower isolation is performed by means of the baffle device (1), to effectively prevent, during a working process, a liquid falling from the wafer (4) from falling onto the processing device or other wafers on the lower side of the baffle device (1), thereby improving the cleanliness of a processing environment, thus increasing the yield of wafers. When the sealing door (3) is opened, the lifting/lowering device (2) can convey the wafer (4) up and down. Therefore, the cleanliness of a wafer processing environment can be effectively improved, thus increasing the yield of the wafers.

Description

一种可隔离防护晶圆的晶圆处理装置A wafer processing device capable of isolating and protecting wafers 技术领域technical field
本发明涉及芯片加工技术领域,更具体地说,涉及一种可隔离防护晶圆的晶圆处理装置。The present invention relates to the technical field of chip processing, and more particularly, to a wafer processing device capable of isolating and protecting wafers.
背景技术Background technique
目前,化学机械平坦化(Chemical Mechanical Planarization,CMP)设备大多数采用的都是湿法工艺,传输过程中会有各类残液从晶圆表面滴落到其他工艺环境内,而这种情况会影响整个产品处理工艺,影响机台的工作效率和晶圆的成品率。为克服此不足,现有技术中,每个模组会设置有独立的防护装置,但是这将会导致成本高、装卸区域未得到防护、滴落在各区防护隔离装置上的残渍又不容易集中处理等问题。At present, most chemical mechanical planarization (CMP) equipments use wet processes. During the transmission process, various residual liquids will drip from the wafer surface into other process environments, and this situation will It affects the entire product processing process, and affects the work efficiency of the machine and the yield of the wafer. In order to overcome this deficiency, in the prior art, each module will be provided with an independent protective device, but this will lead to high cost, unprotected loading and unloading areas, and it is not easy for residues dripping on the protective isolation devices in each area. Centralized processing, etc.
综上所述,如何有效地提高加工环境的清洁度、进而提高晶圆成品率,是目前本领域技术人员急需解决的问题。To sum up, how to effectively improve the cleanliness of the processing environment, thereby improving the yield of wafers, is an urgent problem to be solved by those skilled in the art at present.
发明内容SUMMARY OF THE INVENTION
有鉴于此,本发明的目的在于提供一种可隔离防护晶圆的晶圆处理装置,该可隔离防护晶圆的晶圆处理装置可以有效地提高加工环境的清洁度、进而提高晶圆成品率。In view of this, the object of the present invention is to provide a wafer processing apparatus capable of isolating and protecting wafers, which can effectively improve the cleanliness of the processing environment, thereby improving the yield of wafers .
为了达到上述目的,本发明提供如下技术方案:In order to achieve the above object, the present invention provides the following technical solutions:
一种可隔离防护晶圆的晶圆处理装置,包括用于对晶圆进行处理的处理装置和用于驱动所述晶圆下降以进入到所述处理装置工作处的升降装置,包括隔挡装置,所述隔挡装置与所述处理装置工作处对应的部位设置有上下贯通的开口,以使得所述升降装置能够驱动所述晶圆通过该开口在所述隔挡装置上侧与所述隔挡装置下侧的所述处理装置工作处之间来回运输,所述开口设置有封闭门。 A wafer processing device capable of isolating and protecting wafers, comprising a processing device for processing wafers and a lifting device for driving the wafer to descend to enter the working place of the processing device, including a blocking device and the position of the barrier device corresponding to the working place of the processing device is provided with an opening that penetrates up and down, so that the lifting device can drive the wafer to pass through the opening to connect with the barrier device on the upper side of the barrier device. It is transported back and forth between the working places of the processing device on the lower side of the blocking device, and the opening is provided with a closed door.
在该可隔离防护晶圆的晶圆处理装置中,在应用时,当升降装置所固定的晶圆运动到隔挡装置上方,此时封闭门关闭,此时晶圆与处理装置开始横向相对移动。在横向相对移动过程中,当晶圆上残留的液体下落时,因为封闭门关闭,会掉落在封闭门上,而不会掉落至封闭门下侧的处理装置之间,也不会掉落在处理装置的机身上。而当晶圆需要与下侧的处理装置进行交互时,封闭门打开,升降装置可以驱动晶圆穿过开口进入到处理装置工作处进行晶圆处理。在该可隔离防护晶圆的晶圆处理装置中,通过隔挡装置进行上下隔离,以在工作过程中,有效地阻止晶圆上掉落的液体落在隔挡装置下侧的处理装置或其它晶圆上,且设置开口,当封闭门打开时,升降装置可以上下传输晶圆。综上所述,该可隔离防护晶圆的晶圆处理装置能够有效地提高加工环境的清洁度、进而提高晶圆成品率。In the wafer processing device capable of isolating and protecting wafers, during application, when the wafer fixed by the lifting device moves above the blocking device, the closing door is closed at this time, and the wafer and the processing device begin to move laterally relative to each other. . During the lateral relative movement, when the liquid remaining on the wafer falls, because the closing door is closed, it will fall on the closing door, and will not fall between the processing devices on the underside of the closing door, nor will it fall on the body of the processing unit. When the wafer needs to interact with the processing device on the lower side, the closed door is opened, and the lifting device can drive the wafer through the opening to enter the working place of the processing device for wafer processing. In the wafer processing device capable of isolating and protecting the wafer, the upper and lower isolation is performed by the barrier device, so as to effectively prevent the liquid dropped on the wafer from falling on the processing device or other processing devices on the lower side of the barrier device during the working process. On the wafer, an opening is provided, and when the closed door is opened, the lifting device can transport the wafer up and down. To sum up, the wafer processing apparatus capable of isolating and protecting wafers can effectively improve the cleanliness of the processing environment, thereby improving the yield of wafers.
优选地,所述升降装置驱动所述晶圆下降时,所述封闭门能够打开,而在驱动所述晶圆上升至复位时所述封闭门能够关闭。Preferably, the closing door can be opened when the lifting device drives the wafer to descend, and the closing door can be closed when the wafer is driven to ascend to reset.
优选地,所述封闭门与所述隔挡装置沿水平方向滑动连接以实现开闭。Preferably, the closing door and the blocking device are slidably connected in a horizontal direction to realize opening and closing.
优选地,所述封闭门的一侧边沿与所述开口的对应一侧口沿转动连接以能够通过转动实现开闭。Preferably, one side edge of the closing door is rotatably connected with the corresponding side port edge of the opening so that opening and closing can be realized by rotation.
优选地,包括多个所述处理装置,还包括沿多个所述处理装置排列方向驱动升降装置移动的运输装置,所述隔挡装置设置有多个与各个所述处理装置相对应的开口。Preferably, it includes a plurality of the processing devices, and also includes a transport device that drives the lifting device to move along the arrangement direction of the plurality of processing devices, and the blocking device is provided with a plurality of openings corresponding to each of the processing devices.
优选地,至少一组所述处理装置为用于对所述晶圆进行清洗的清洗模组。Preferably, at least one group of the processing devices is a cleaning module for cleaning the wafers.
优选地,至少一组所述处理装置为抛光装置,所述抛光装置包括用于承载晶圆的装卸台,抛光部能够活动至避开与所述装卸台相对应的所述开口。Preferably, at least one group of the processing devices is a polishing device, and the polishing device includes a loading and unloading stage for carrying wafers, and the polishing part can move to avoid the opening corresponding to the loading and unloading stage.
优选地,所述抛光装置还包括能够绕竖直轴线转动的摆臂或传递晶圆的机械手,所述抛光部安装在所述摆臂或机械手上。Preferably, the polishing device further comprises a swing arm or a robot for transferring wafers that can be rotated around a vertical axis, and the polishing part is mounted on the swing arm or the robot.
优选地,包括依次并列设置的抛光工作区、晶圆过渡区和晶圆传输区,至少一组所述处理装置为抛光处理装置,所述抛光处理装置能够用于对位于所述抛光工作区的晶圆抛光处理,所述晶圆过渡区设置有传输装置,所述晶圆传输区设置有所述开口以及所述封闭门,所述传输装置能够将所述抛光工作区的晶圆传递至所述晶圆传输区对应所述开口下方。Preferably, it includes a polishing work area, a wafer transition area and a wafer transfer area that are arranged in sequence, and at least one group of the processing devices is a polishing processing device, and the polishing processing device can be used to Wafer polishing process, the wafer transition area is provided with a transfer device, the wafer transfer area is provided with the opening and the closed door, and the transfer device can transfer the wafers in the polishing work area to the The wafer transfer area corresponds to below the opening.
优选地,所述隔挡装置呈长条型,依次设置有多个所述开口。 Preferably, the blocking device is in the form of a long strip, and a plurality of the openings are arranged in sequence.
优选地,所述隔挡装置呈圆盘装置,多个所述开口周向分布。Preferably, the blocking device is a disc device, and a plurality of the openings are distributed circumferentially.
优选地,还包括用于对所述隔挡装置上侧的晶圆进行喷液体湿润的润湿装置,所述润湿装置安装在所述隔挡装置上。Preferably, a wetting device for spraying liquid to wet the wafer on the upper side of the blocking device is further included, and the wetting device is mounted on the blocking device.
附图说明Description of drawings
为了更清楚地说明本发明实施例或现有技术中的技术方案,下面将对实施例或现有技术描述中所需要使用的附图作简单地介绍,显而易见地,下面描述中的附图仅仅是本发明的一些实施例,对于本领域普通技术人员来讲,在不付出创造性劳动的前提下,还可以根据这些附图获得其他的附图。In order to explain the embodiments of the present invention or the technical solutions in the prior art more clearly, the following briefly introduces the accompanying drawings that need to be used in the description of the embodiments or the prior art. Obviously, the accompanying drawings in the following description are only These are some embodiments of the present invention. For those of ordinary skill in the art, other drawings can also be obtained according to these drawings without creative efforts.
图1为本发明实施例提供的可隔离防护晶圆的晶圆处理装置的局部结构示意图;FIG. 1 is a schematic partial structure diagram of a wafer processing apparatus capable of isolating and protecting wafers according to an embodiment of the present invention;
图2为本发明实施例提供的封闭门的滑动打开示意图;2 is a schematic diagram of a sliding opening of a closed door provided by an embodiment of the present invention;
图3为本发明实施例提供的封闭门的转动打开示意图;FIG. 3 is a schematic diagram of a rotary opening of a closed door provided by an embodiment of the present invention;
图4为本发明实施例提供的可隔离防护晶圆的晶圆处理装置的清洗模组的结构示意图;4 is a schematic structural diagram of a cleaning module of a wafer processing apparatus capable of isolating and protecting wafers according to an embodiment of the present invention;
图5为本发明实施例提供的可隔离防护晶圆的晶圆处理装置的抛光模组结构示意图;5 is a schematic structural diagram of a polishing module of a wafer processing apparatus capable of isolating and protecting wafers according to an embodiment of the present invention;
图6为图5中的可隔离防护晶圆的晶圆处理装置的俯视示意图;6 is a schematic top view of the wafer processing apparatus capable of isolating the guard wafer in FIG. 5;
图7为本发明实施例提供的可隔离防护晶圆的晶圆处理装置的转动运输时结构示意图;7 is a schematic structural diagram of a wafer processing device capable of isolating and protecting wafers during rotation and transportation according to an embodiment of the present invention;
图8为本发明实施例提供的润湿装置的安装结构示意;8 is a schematic diagram of an installation structure of a wetting device provided by an embodiment of the present invention;
图9为本发明实施例提供的一种抛光处理装置与晶圆传输区被过渡区隔开时晶圆处理装置的结构示意图。9 is a schematic structural diagram of a wafer processing apparatus when a polishing processing apparatus and a wafer transfer area are separated by a transition area according to an embodiment of the present invention.
附图中标记如下:The figures are marked as follows:
隔挡装置1、升降装置2、封闭门3、晶圆4、清洗模组5、抛光部6、装卸台7、摆臂8、运输装置9、润湿装置10、抛光工作区11、晶圆过渡区12、晶圆传输区13、过渡区机械手14、开口15。Blocking device 1, lifting device 2, closing door 3, wafer 4, cleaning module 5, polishing part 6, loading and unloading table 7, swing arm 8, transport device 9, wetting device 10, polishing work area 11, wafer Transition area 12 , wafer transfer area 13 , transition area robot 14 , opening 15 .
具体实施方式 Detailed ways
本发明实施例公开了一种可隔离防护晶圆的晶圆处理装置,以有效地解决晶圆残液掉落很难清理的问题。The embodiment of the present invention discloses a wafer processing device capable of isolating and protecting wafers, so as to effectively solve the problem that the residual liquid of the wafer is difficult to clean.
下面将结合本发明实施例中的附图,对本发明实施例中的技术方案进行清楚、完整地描述,显然,所描述的实施例仅仅是本发明一部分实施例,而不是全部的实施例。基于本发明中的实施例,本领域普通技术人员在没有做出创造性劳动前提下所获得的所有其他实施例,都属于本发明保护的范围。The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, rather than all the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of the present invention.
请参阅图1-图8,图1为本发明实施例提供的可隔离防护晶圆的晶圆处理装置的局部结构示意图;图2为本发明实施例提供的封闭门的滑动打开示意图;图3为本发明实施例提供的封闭门的转动打开示意图;图4为本发明实施例提供的可隔离防护晶圆的晶圆处理装置的清洗模组结构示意图;图5为本发明实施例提供的可隔离防护晶圆的晶圆处理装置的抛光模组结构示意图;图6为图5中的可隔离防护晶圆的晶圆处理装置的俯视示意图;图7为本发明实施例提供的可隔离防护晶圆的晶圆处理装置的转动运输时结构示意图;图8为本发明实施例提供的润湿装置的安装结构示意。Please refer to FIG. 1-FIG. 8. FIG. 1 is a schematic diagram of a partial structure of a wafer processing apparatus capable of isolating and protecting wafers according to an embodiment of the present invention; FIG. 2 is a schematic diagram of a sliding opening of a closed door provided by an embodiment of the present invention; FIG. 3 FIG. 4 is a schematic structural diagram of a cleaning module of a wafer processing device capable of isolating and protecting wafers according to an embodiment of the present invention; FIG. 5 is a schematic diagram of a cleaning module provided by an embodiment of the present invention. Schematic diagram of a polishing module structure of a wafer processing device for isolating and protecting wafers; FIG. 6 is a schematic top view of a wafer processing device capable of isolating and protecting wafers in FIG. 5 ; FIG. 7 is an embodiment of the present invention. A schematic structural diagram of a circular wafer processing device during rotation and transportation; FIG. 8 is a schematic diagram of an installation structure of a wetting device provided by an embodiment of the present invention.
在一种具体实施例中,本实施例提供了一种可隔离防护晶圆的晶圆处理装置,具体的,包括处理装置、升降装置2和隔挡装置1。其中处理装置用于对晶圆4进行处理,处理方式如清洗、抛光等,具体的处理装置可以根据实际生产需要进行对应设置。In a specific embodiment, this embodiment provides a wafer processing device capable of isolating and protecting wafers, specifically, including a processing device, a lifting device 2 and a blocking device 1 . The processing device is used to process the wafer 4, and the processing methods are cleaning, polishing, etc. The specific processing device can be correspondingly set according to actual production needs.
其中升降装置2,则是用于驱动晶圆4下降以进入到处理装置的工作处,以使得处理装置能够对晶圆4进行处理工作。而处理完成的晶圆4,可以是通过升降装置2驱动上升,以进入到下一处理装置处,继续进行处理工作。需要说明的是,在实际生产中,会设置运输装置9,运输装置9会驱动升降装置2与处理装置横向相对移动,可以是直接驱动升降装置2移动实现,也可以是直接驱动处理装置移动实现。The lifting device 2 is used to drive the wafer 4 to descend to enter the working place of the processing device, so that the processing device can process the wafer 4 . The processed wafer 4 may be driven up by the lifting device 2 to enter the next processing device to continue the processing. It should be noted that, in actual production, a transportation device 9 will be installed, and the transportation device 9 will drive the lifting device 2 to move laterally relative to the processing device, which can be realized by directly driving the lifting device 2 to move, or directly driving the processing device. .
其中升降装置2可以是机械手,驱动端具有固定机构以能够固定晶圆4,而驱动端的升降可以是通过转动驱动实现,如摆臂,也可以是通过直线上下驱动实现,如上下伸缩的电缸、伸缩气压缸、伸缩液压缸等。具体的,可以根据需要进行设置,以能够驱动晶圆4穿过隔挡装置1的开口为准。The lifting device 2 can be a manipulator, the driving end has a fixing mechanism to fix the wafer 4, and the lifting and lowering of the driving end can be realized by rotational driving, such as a swing arm, or it can be realized by linear up and down driving, such as an up and down telescopic electric cylinder , telescopic pneumatic cylinder, telescopic hydraulic cylinder, etc. Specifically, it can be set as required, subject to the opening that can drive the wafer 4 to pass through the blocking device 1 .
其中隔挡装置1与处理装置工作处对应的部位设置有上下贯通的开口,以使得升降装置2驱动晶圆4从隔挡装置1上侧通过该开口穿入至隔挡装置1下侧 的处理装置工作处。所以开口应当略大于晶圆4,且当升降装置2需要共同穿过开口时,根据升降装置2的结构特点,开口进行避让,以保证升降装置2能够驱动晶圆4下降至处理装置的工作处。其中开口一般为矩形开口,当然也可以是圆形开口或者其它多边形开口,具体的可以根据需要进行设置。需要说明的是,其中开口还可以是无边界开口、凹槽型开口等,凹槽型开口,即开口的一侧口沿缺失。The part of the blocking device 1 corresponding to the working place of the processing device is provided with an opening that penetrates up and down, so that the lifting device 2 drives the wafer 4 to penetrate from the upper side of the blocking device 1 to the lower side of the blocking device 1 through the opening. The processing unit work place. Therefore, the opening should be slightly larger than the wafer 4, and when the lifting device 2 needs to pass through the opening together, according to the structural characteristics of the lifting device 2, the opening should be avoided to ensure that the lifting device 2 can drive the wafer 4 down to the working place of the processing device. . The opening is generally a rectangular opening, of course, it can also be a circular opening or other polygonal openings, which can be set as required. It should be noted that the openings may also be borderless openings, groove-type openings, etc. The groove-type openings, that is, one side edge of the opening is missing.
其中开口处设置有封闭门3,以当封闭门3关闭时,封闭门3上侧的掉落的液珠不会进入到封闭门3的下侧,以起到隔挡的效果。而当封闭门3打开时,则晶圆4能够穿过该开口,由下至上,或由上至下。其中封闭门3与隔挡装置1之间活动连接方式,如可以是如当前门体一样,滑动连接或转动连接,当然还可以是折叠。具体的,可以根据需要进行设置。The opening is provided with a closed door 3, so that when the closed door 3 is closed, the falling liquid droplets on the upper side of the closed door 3 will not enter the lower side of the closed door 3, so as to play a blocking effect. When the closing door 3 is opened, the wafer 4 can pass through the opening, from bottom to top, or from top to bottom. The movable connection between the closing door 3 and the blocking device 1 may be, for example, a sliding connection or a rotating connection as the current door body, and of course it may also be a foldable connection. Specifically, it can be set as required.
在该可隔离防护晶圆的晶圆处理装置中,在应用时,当升降装置2所固定的晶圆4与处理装置横向相对移动时,此时封闭门3关闭,在横向相对移动过程中,当晶圆4上残留的液体下落时,因为封闭门3关闭,会掉落在封闭门3上,而不会掉落至封闭门3下侧两个处理装置之间,更不会掉落在处理装置的机身上。而当晶圆4需要与下侧的处理装置进行交互时,此时封闭门3打开,升降装置2可以驱动晶圆4穿过开口进入到处理装置工作处进行加工。在该可隔离防护晶圆的晶圆处理装置中,通过隔挡装置1进行上下隔离,以在运输过程中,有效地阻止晶圆4上掉落的液体落在隔挡装置的下侧的处理装置或其它晶圆上,且设置开口,当封闭门打开时,升降装置可以上下传输晶圆。综上所述,该可隔离防护晶圆的晶圆处理装置能够有效地提高加工环境的清洁度、进而提高晶圆成品率的问题。In the wafer processing device capable of isolating and protecting wafers, during application, when the wafer 4 fixed by the lifting device 2 moves relatively laterally with the processing device, the closing door 3 is closed at this time. When the liquid remaining on the wafer 4 falls, because the closing door 3 is closed, it will fall on the closing door 3, and will not fall between the two processing devices on the lower side of the closing door 3, and will not fall on the lower side of the closing door 3. on the body of the processing unit. When the wafer 4 needs to interact with the processing device on the lower side, the closing door 3 is opened at this time, and the lifting device 2 can drive the wafer 4 through the opening to enter the working place of the processing device for processing. In the wafer processing device capable of isolating and protecting the wafer, the upper and lower isolation is performed by the barrier device 1 to effectively prevent the liquid dropped from the wafer 4 from falling on the lower side of the barrier device during transportation. On the device or other wafers, an opening is provided. When the closing door is opened, the lifting device can transfer the wafers up and down. To sum up, the wafer processing apparatus capable of isolating and protecting wafers can effectively improve the cleanliness of the processing environment, thereby improving the wafer yield.
进一步的,考虑到封闭门3开闭与升降装置2的升降驱动具有相关性,为了避免每次单独驱动封闭门3开闭,此处优选封闭门3开闭与升降装置2的升降驱动联动,以使得升降装置2驱动所述晶圆4下降时,封闭门3打开,而在驱动晶圆4上升至复位时封闭门3关闭。具体的,可以设置控制器,以在控制器向升降装置2发送控制信号时,向封闭门3发送对应的控制信号,如发送升降装置2下降信号时,同时向封闭门3发送打开信号,如发送升降装置2上升信号时,间隔预定时长,以保证升降装置2完全上升时,向封闭 门3发送关闭信号。当然也可以是通过机械结构实现连通,或者通过触碰开关等检测器获取升降装置2升降信号,对应控制封闭门3开闭。Further, considering that the opening and closing of the closed door 3 is related to the elevating drive of the lifting device 2, in order to avoid driving the closing door 3 to open and close independently each time, it is preferable here that the opening and closing of the closed door 3 is linked with the elevating drive of the lifting device 2, So that when the lifting device 2 drives the wafer 4 to descend, the closing door 3 is opened, and when the wafer 4 is driven to ascend to reset, the closing door 3 is closed. Specifically, a controller can be set to send a corresponding control signal to the closed door 3 when the controller sends a control signal to the lifting device 2, such as when sending a descending signal of the lifting device 2, and simultaneously send an opening signal to the closed door 3, such as When sending the lifting signal of the lifting device 2, the interval is predetermined time, so as to ensure that the lifting device 2 is completely raised, and the signal is closed. Door 3 sends a close signal. Of course, the communication can also be achieved through a mechanical structure, or the lifting signal of the lifting device 2 can be obtained through a detector such as a touch switch, and the closed door 3 can be controlled to open and close accordingly.
如上所述,其中封闭门3打开,可以是滑动打开,具体的封闭门3与隔挡装置1沿水平方向滑动连接以实现开闭。为了保证封闭门3遮挡效果,此处优选封闭门3位于隔挡装置1本体的上侧。还可以是使封闭门3的一侧边沿与所述开口的对应一侧口沿转动连接以能够通过转动实现打开,具体的,可以是向下转动打开,也可以是向上转动打开。As mentioned above, wherein the closing door 3 is opened, it may be sliding open, and specifically the closing door 3 is slidably connected with the blocking device 1 in the horizontal direction to realize opening and closing. In order to ensure the shielding effect of the closing door 3 , the closing door 3 is preferably located on the upper side of the body of the blocking device 1 here. It is also possible to rotate one side edge of the closed door 3 and the corresponding side edge of the opening so as to be able to be opened by rotation, specifically, it can be rotated downward to open, or it can be rotated upward to open.
进一步的,如当设置有多个处理装置,至少一组所述处理装置为抛光装置时,对应的设置有运输装置9,以沿多个处理装置排列方向驱动升降装置2移动的运输装置9,其中隔挡装置1优选对应设置有多个与各个处理装置相对应的开口,其中隔挡装置1可以是与各个升降装置2在运输装置9运输方向上相对固定,以在运输方向上同步移动,也可以是与对应的处理装置相对固定。通过设置多个开口,以保证各个处理装置能够完成对应处理工作。需要说明的是,多个处理装置可以是沿直线依次分布,也可以是沿曲线依次分布,具体的,可以是根据需要进行设置。具体的,如可以使隔挡装置1呈长条型,依次设置有多个开口;还可以使隔挡装置1呈圆盘装置,多个所述开口呈周向分布,当然也可以不呈圆形分布,具分布形式可以根据需要进行设置。Further, if a plurality of processing devices are provided, and at least one group of the processing devices is a polishing device, a corresponding transportation device 9 is provided to drive the transportation device 9 to move the lifting device 2 along the arrangement direction of the plurality of processing devices, Wherein the blocking device 1 is preferably provided with a plurality of openings corresponding to each processing device, wherein the blocking device 1 can be relatively fixed with each lifting device 2 in the transporting direction of the transporting device 9 to move synchronously in the transporting direction, It may also be relatively fixed with the corresponding processing device. By setting a plurality of openings, it is ensured that each processing device can complete the corresponding processing work. It should be noted that, the plurality of processing devices may be sequentially distributed along a straight line, or may be sequentially distributed along a curve, and specifically, may be set as required. Specifically, for example, the baffle device 1 can be formed in a long shape, and a plurality of openings can be arranged in sequence; the baffle device 1 can also be made into a disc device, and the plurality of the openings are distributed in the circumferential direction, and of course, it can be not in the shape of a circle. Shape distribution, the distribution form can be set as required.
如可以使至少一组所述处理装置为用于对所述晶圆4进行清洗的清洗模组5。为了保证清洗效果,如可以使多个清洗模组5沿运输装置9运输方向依次均匀设置,以形成多个清洗工位,为了方便进行清洗,还可以是在清洗模块处设置有装载晶圆4和卸载晶圆4的工位。For example, at least one group of the processing devices can be a cleaning module 5 for cleaning the wafers 4 . In order to ensure the cleaning effect, for example, a plurality of cleaning modules 5 can be uniformly arranged in sequence along the transportation direction of the transport device 9 to form a plurality of cleaning stations. and unloading the wafer 4 station.
具体的,还可以使至少一组所述处理装置为抛光装置,抛光装置包括用于承载晶圆4的装卸台7和用于对装卸台7上的晶圆4进行抛光的抛光部6,其中抛光部6与所述装卸台7活动连接,以能够活动至避开与所述装卸台7相对应的所述开口,以使得在避开开口时,可以有效地避免开口处下落的残液落入到抛光部6上。其中抛光部6与装卸台7之间滑动连接,可以是直接或间接滑动连接,为了方便驱动,此处优选还包括能够绕竖直轴线转动的摆臂8,抛光部6安装在所述摆臂8上。以通过摆臂8转动,以使得抛光部6以及摆臂8均能够避开开口,以正在晶圆4装载好后,转回,以使得抛光部6 能够对晶圆4进行加工。当然其中的摆臂8还可以是其它结构,如抛光装置设置有专门用于进出输送晶圆4的机械手,抛光部6不需要摆出。Specifically, at least one group of the processing devices may be polishing devices, and the polishing device includes a loading and unloading table 7 for carrying the wafers 4 and a polishing part 6 for polishing the wafers 4 on the loading and unloading table 7 , wherein The polishing part 6 is movably connected to the loading and unloading platform 7 so as to be movable to avoid the opening corresponding to the loading and unloading platform 7 , so that when the opening is avoided, the residual liquid falling from the opening can be effectively avoided from falling. into the polishing part 6 . The sliding connection between the polishing part 6 and the loading and unloading table 7 may be a direct or indirect sliding connection. In order to facilitate driving, it is preferable to further include a swing arm 8 that can rotate around a vertical axis, and the polishing part 6 is installed on the swing arm 8 on. The swing arm 8 is rotated so that both the polishing part 6 and the swing arm 8 can avoid the opening, so that after the wafer 4 is loaded, it is rotated back so that the polishing part 6 The wafer 4 can be processed. Of course, the swing arm 8 can also be of other structures. For example, the polishing device is provided with a robot arm specially used to transport the wafer 4 in and out, and the polishing part 6 does not need to be swing out.
对于其中的抛光装置设置,还可以其它设置方案,如附图9,附图9为本发明实施例提供的一种抛光处理装置与晶圆传输区被过渡区隔开时晶圆处理装置的结构示意图,具体的,该晶圆处理装置包括依次并列设置的抛光工作区11、晶圆过渡区12和晶圆传输区13,上述三个工作区并列方向可以是运输装置9的运输方向,还可以是沿运输方向的横向方向,具体的,可以根据需要进行设置。当存在隔挡装置1时,优选隔挡装置1位于晶圆传输区上方。如上,至少一组所述处理装置为抛光处理装置,此时抛光处理装置能够用于对位于抛光工作区11的晶圆4抛光处理,具体的抛光处理装置可以是直接安装在抛光工作区11。其中晶圆过渡区12设置有传输装置,具体的传输装置可以为一种过渡区机械手14,过渡区机械手14安装在晶圆过渡区12,而其中的晶圆传输区13设置有上述开口15以及上述封闭门3,其中过渡区机械手14能够将抛光工作区11的晶圆4传递至晶圆传输区13对应开口15处,以方便进一步从开口15处将晶圆4取出至隔挡装置1上侧,即,通过过渡区机械手14将抛光处理装置处理完成的晶圆4从抛光工作区11、经过晶圆过渡区12以移动至晶圆传输区13,以进行取放料。当然该过渡区机械手14优选还可以将对应开口15处的晶圆4传递至抛光工作区11,以在抛光工作区11由抛光处理装置进行抛光处理。其中过渡区机械手14可以是上述摆臂8或其它专门使用的传输机构。For the setting of the polishing apparatus, other setting solutions are also possible, as shown in FIG. 9 , which is the structure of the wafer processing apparatus when the polishing processing apparatus and the wafer transfer area are separated by a transition area according to an embodiment of the present invention. Schematic diagram, specifically, the wafer processing device includes a polishing work area 11, a wafer transition area 12 and a wafer transfer area 13 that are arranged in parallel. It is the transverse direction along the transportation direction, specifically, it can be set as required. When the barrier device 1 is present, it is preferred that the barrier device 1 is located above the wafer transfer area. As above, at least one group of the processing apparatuses are polishing processing apparatuses. In this case, the polishing processing apparatuses can be used to polish the wafers 4 located in the polishing work area 11 . The specific polishing processing apparatuses may be directly installed in the polishing work area 11 . The wafer transition area 12 is provided with a transmission device, and the specific transmission device may be a transition area robot 14. The transition area robot 14 is installed in the wafer transition area 12, and the wafer transmission area 13 is provided with the above-mentioned opening 15 and In the above-mentioned closed door 3, the transition area robot 14 can transfer the wafer 4 in the polishing work area 11 to the corresponding opening 15 in the wafer transfer area 13, so as to facilitate further taking out the wafer 4 from the opening 15 to the barrier device 1. In other words, the wafer 4 processed by the polishing processing device is moved from the polishing work area 11 through the wafer transition area 12 to the wafer transfer area 13 by the transition area robot 14 for picking and unloading. Of course, the manipulator 14 in the transition area can preferably also transfer the wafer 4 at the corresponding opening 15 to the polishing work area 11 , so that the polishing process device can perform polishing processing in the polishing work area 11 . The transition zone manipulator 14 may be the above-mentioned swing arm 8 or other specially used transmission mechanisms.
在上述各个实施例基础上,进一步的还优选设置有润湿装置10,润湿装置10的作用在于对隔挡装置1上侧传输空间进行湿润,具体的的,是对运输通道空间中的晶圆4,进行喷液体以湿润晶圆4,以制造湿润环境防止晶圆4表面结晶。为了方便安装,具体的润湿装置10可以是安装在隔挡装置1上,而在隔挡装置1上的具体安装位置以及安装数量均可以根据需要进行设置。如可以安装在隔挡装置1的角部,具体的可以在其中两个角部均安装有润湿装置10。其中润湿装置10的具体结构,也可以根据进行设置,具体的可以包括喷头安装座和安装座上对晶圆4喷液体的喷头。其中润湿装置10可在设备运行时一直喷液体(如超纯水),也可以只在运输晶圆4时间歇喷液体,具体设置根据需求而定。 On the basis of the above embodiments, a wetting device 10 is further preferably provided. The function of the wetting device 10 is to wet the transmission space on the upper side of the barrier device 1, specifically, to wet the crystals in the space of the transportation channel. In circle 4, liquid is sprayed to wet the wafer 4 to create a moist environment to prevent the surface of the wafer 4 from crystallizing. For the convenience of installation, the specific wetting device 10 can be installed on the blocking device 1, and the specific installation position and installation quantity on the blocking device 1 can be set as required. For example, it can be installed at the corners of the blocking device 1, specifically, the wetting device 10 can be installed at both of the corners. The specific structure of the wetting device 10 can also be set according to the configuration, and specifically may include a nozzle mounting seat and a nozzle on the mounting seat for spraying liquid on the wafer 4 . The wetting device 10 may spray liquid (such as ultrapure water) all the time when the device is running, or it may spray liquid intermittently only when the wafer 4 is transported, and the specific settings are determined according to requirements.
本说明书中各个实施例采用递进的方式描述,每个实施例重点说明的都是与其他实施例的不同之处,各个实施例之间相同相似部分互相参见即可。The various embodiments in this specification are described in a progressive manner, and each embodiment focuses on the differences from other embodiments, and the same and similar parts between the various embodiments can be referred to each other.
对所公开的实施例的上述说明,使本领域专业技术人员能够实现或使用本发明。对这些实施例的多种修改对本领域的专业技术人员来说将是显而易见的,本文中所定义的一般原理可以在不脱离本发明的精神或范围的情况下,在其它实施例中实现。因此,本发明将不会被限制于本文所示的这些实施例,而是要符合与本文所公开的原理和新颖特点相一致的最宽的范围。 The above description of the disclosed embodiments enables any person skilled in the art to make or use the present invention. Various modifications to these embodiments will be readily apparent to those skilled in the art, and the generic principles defined herein may be implemented in other embodiments without departing from the spirit or scope of the invention. Thus, the present invention is not intended to be limited to the embodiments shown herein, but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.

Claims (11)

  1. 一种可隔离防护晶圆的晶圆处理装置,包括用于对晶圆进行处理的处理装置和用于驱动所述晶圆下降以进入到所述处理装置工作处的升降装置,其特征在于,包括隔挡装置,所述隔挡装置与所述处理装置工作处对应的部位设置有上下贯通的开口,以使得所述升降装置能够驱动所述晶圆通过该开口在所述隔挡装置上侧与所述隔挡装置下侧的所述处理装置工作处之间来回运输,所述开口设置有封闭门。A wafer processing device capable of isolating and protecting wafers, comprising a processing device for processing the wafer and a lifting device for driving the wafer to descend to enter the working place of the processing device, characterized in that: A blocking device is included, and the position corresponding to the working place of the processing device is provided with an opening that penetrates up and down, so that the lifting device can drive the wafer to pass through the opening on the upper side of the blocking device It is transported back and forth with the working place of the processing device on the lower side of the blocking device, and the opening is provided with a closed door.
  2. 根据权利要求1所述的可隔离防护晶圆的晶圆处理装置,其特征在于,所述升降装置驱动所述晶圆下降时,所述封闭门能够打开,而在驱动所述晶圆上升至复位时所述封闭门能够关闭。The wafer processing apparatus capable of isolating and protecting wafers according to claim 1, wherein when the lifting device drives the wafer to descend, the closing door can be opened, and when the lifting device drives the wafer to ascend to the The closing door can be closed during reset.
  3. 根据权利要求2所述的可隔离防护晶圆的晶圆处理装置,其特征在于,所述封闭门与所述隔挡装置沿水平方向滑动连接以实现开闭。The wafer processing device capable of isolating and protecting wafers according to claim 2, wherein the closing door and the blocking device are slidably connected in a horizontal direction to realize opening and closing.
  4. 根据权利要求2所述的可隔离防护晶圆的晶圆处理装置,其特征在于,所述封闭门的一侧边沿与所述开口的对应一侧口沿转动连接以能够通过转动实现开闭。The wafer processing apparatus capable of isolating and protecting wafers according to claim 2, wherein one side edge of the closed door is rotatably connected with the corresponding side port edge of the opening so as to be able to be opened and closed by rotation.
  5. 根据权利要求1-4任一项所述的可隔离防护晶圆的晶圆处理装置,其特征在于,包括多个所述处理装置,还包括沿多个所述处理装置排列方向驱动升降装置移动的运输装置,所述隔挡装置设置有多个与各个所述处理装置相对应的开口。The wafer processing device capable of isolating and protecting wafers according to any one of claims 1 to 4, characterized by comprising a plurality of the processing devices, and further comprising driving a lifting device to move along the arrangement direction of the plurality of processing devices The transport device is provided with a plurality of openings corresponding to each of the processing devices.
  6. 根据权利要求5所述的可隔离防护晶圆的晶圆处理装置,其特征在于,至少一组所述处理装置为用于对所述晶圆进行清洗的清洗模组。The wafer processing device capable of isolating and protecting wafers according to claim 5, wherein at least one group of the processing devices is a cleaning module for cleaning the wafers.
  7. 根据权利要求5所述的可隔离防护晶圆的晶圆处理装置,其特征在于,至少一组所述处理装置为抛光装置,所述抛光装置包括用于承载晶圆的装卸台,抛光部能够活动至避开与所述装卸台相对应的所述开口。The wafer processing device capable of isolating and protecting wafers according to claim 5, wherein at least one group of the processing devices is a polishing device, the polishing device includes a loading and unloading table for carrying the wafer, and the polishing part can Move to avoid the opening corresponding to the loading dock.
  8. 根据权利要求7所述的可隔离防护晶圆的晶圆处理装置,其特征在于,所述抛光装置还包括能够绕竖直轴线转动的摆臂或传递晶圆的机械手,所述抛光部安装在所述摆臂或机械手上。The wafer processing device capable of isolating and protecting wafers according to claim 7, wherein the polishing device further comprises a swing arm or a manipulator for transferring wafers that can rotate around a vertical axis, and the polishing part is mounted on the on the swing arm or manipulator.
  9. 根据权利要求5所述的可隔离防护晶圆的晶圆处理装置,其特征在于,包括依次并列设置的抛光工作区、晶圆过渡区和晶圆传输区,至少一组所述处理装置为抛光处理装置,所述抛光处理装置能够用于对位于所述抛光工作 区的晶圆抛光处理,所述晶圆过渡区设置有传输装置,所述晶圆传输区设置有所述开口以及所述封闭门,所述传输装置能够将所述抛光工作区的晶圆传递至所述晶圆传输区对应所述开口。The wafer processing device capable of isolating and protecting wafers according to claim 5, characterized in that it comprises a polishing work area, a wafer transition area and a wafer transfer area which are arranged in parallel in sequence, and at least one group of the processing devices is for polishing processing device, the polishing processing device can be used for the polishing work located in the The wafer transition area is provided with a transfer device, the wafer transfer area is provided with the opening and the closed door, and the transfer device can transfer the wafers in the polishing work area. to the wafer transfer area corresponding to the opening.
  10. 根据权利要求5所述的可隔离防护晶圆的晶圆处理装置,其特征在于,所述隔挡装置呈长条型,依次设置有多个所述开口;或者,所述隔挡装置呈圆盘装置,多个所述开口周向分布。The wafer processing device capable of isolating and protecting wafers according to claim 5, wherein the blocking device is in the form of a long strip, and a plurality of the openings are arranged in sequence; or, the blocking device is circular In the disk device, a plurality of the openings are circumferentially distributed.
  11. 根据权利要求5所述的可隔离防护晶圆的晶圆处理装置,其特征在于,还包括用于对所述隔挡装置上侧的晶圆进行喷液体湿润的润湿装置,所述润湿装置安装在所述隔挡装置上。 The wafer processing device capable of isolating and protecting wafers according to claim 5, further comprising a wetting device for spraying liquid to wet the wafers on the upper side of the blocking device, the wetting device A device is mounted on the baffle.
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