WO2022095510A1 - 阵列天线的校准方法、装置及存储介质 - Google Patents
阵列天线的校准方法、装置及存储介质 Download PDFInfo
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- H04—ELECTRIC COMMUNICATION TECHNIQUE
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- H04B7/00—Radio transmission systems, i.e. using radiation field
- H04B7/02—Diversity systems; Multi-antenna system, i.e. transmission or reception using multiple antennas
- H04B7/04—Diversity systems; Multi-antenna system, i.e. transmission or reception using multiple antennas using two or more spaced independent antennas
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- H04B—TRANSMISSION
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- H04B17/10—Monitoring; Testing of transmitters
- H04B17/11—Monitoring; Testing of transmitters for calibration
- H04B17/12—Monitoring; Testing of transmitters for calibration of transmit antennas, e.g. of the amplitude or phase
Definitions
- the embodiments of the present application relate to the field of communications, and in particular, to a method, device, and storage medium for calibrating an array antenna.
- the current calibration scheme for array antennas basically calibrates the array antenna based on the amplitude and phase error calculated from the pattern corresponding to the test array antenna, which is not suitable for the case of coupling, that is, for the array antenna with coupling.
- the current calibration scheme for array antennas will be due to coupling factors. As a result, there is a large error in the calibration result, so the higher-precision calibration requirements for the array antenna cannot be met at all.
- the purpose of the embodiments of the present application is to provide a calibration method, device and storage medium of an array antenna to solve the above technical problems.
- the embodiments of the present application provide a calibration method for an array antenna, including: constructing an array response matrix of the array antenna under test relative to the detection antenna; testing the antenna pattern of the array antenna under test to obtain the antenna direction Figure data vector; according to the array response matrix and the antenna pattern data vector, calculate the coupled channel amplitude and phase error of each element in the array antenna under test, and obtain each element in the array antenna under test.
- the amplitude and phase error of the array element when the amplitude and phase errors obtained from two adjacent calibration tests meet the preset convergence conditions, the test is ended, and the target is determined according to the amplitude and phase errors obtained from the two adjacent calibration tests.
- Calibration weight calibrate the array antenna to be calibrated according to the target calibration weight.
- an embodiment of the present application also provides an array antenna calibration device, including: a target calibration weight determination module and an array antenna calibration module; the target calibration weight determination module is used to construct the array antenna under test relative to the array response matrix of the detection antenna; the target calibration weight determination module is also used to test the antenna pattern of the array antenna under test to obtain an antenna pattern data vector; the target calibration weight determination module is also used for According to the array response matrix and the antenna pattern data vector, calculate the coupled channel amplitude and phase error of each element in the array antenna under test, and obtain the amplitude of each element in the array antenna under test.
- the target calibration weight determination module is further configured to end the test when the amplitude and phase errors obtained from two adjacent calibration tests meet a preset convergence condition, and perform the test according to the results obtained from the two adjacent calibration tests. For the amplitude and phase errors, a target calibration weight is determined; the array antenna calibration module is used for calibrating the to-be-calibrated array antenna according to the target calibration weight.
- an embodiment of the present application further provides a computer-readable storage medium storing a computer program.
- the computer program is executed by the processor, the method for calibrating the array antenna described above is implemented.
- FIG. 1 is a flowchart of a calibration method for an array antenna provided by a first embodiment of the present application.
- FIG. 2 is a schematic diagram of an indoor far-field calibration environment suitable for the calibration method of the array antenna provided by the first embodiment of the present application.
- FIG. 3 is a schematic diagram of a plane near-field calibration environment suitable for the calibration method of the array antenna provided by the first embodiment of the present application.
- FIG. 4 is a schematic diagram of a tight field calibration environment suitable for the calibration method of the array antenna provided by the first embodiment of the present application.
- FIG. 5 shows the signal flow between the detected array antenna 200 , the detection antenna 300 , and the beam controller 500 when the downlink channel signal is calibrated based on the array antenna calibration method provided in the first embodiment of the present application.
- FIG. 6 shows the signal flow between the detected array antenna 200 , the detection antenna 300 , and the beam controller 500 when calibrating an uplink channel signal based on the array antenna calibration method provided in the first embodiment of the present application.
- FIG. 7 is a flowchart of a calibration method for an array antenna provided by a second embodiment of the present application.
- step S50 is a schematic diagram of calibrating the forward signal based on the beamforming weight and the target calibration weight in step S50 of the method for calibrating an array antenna provided by the second embodiment of the present application.
- FIG. 9 is a calibration device of an array antenna provided by a third embodiment of the present application.
- the calibration problem of the array antenna under the coupling condition is firstly analyzed here.
- the array response matrix of an array antenna is A; the coupling relationship of the array antenna is linearized and expressed in the form of a coupling matrix C; the error of each analog channel in the array antenna is expressed as a diagonal matrix E; the array antenna is excited under a certain beam
- the vector is g (the excitation vector corresponding to each beam is known).
- the pattern data f of the array antenna at a certain spatial sampling point can be expressed by formula (1):
- the pattern data f is to be measured, the array response matrix A is known, and in this embodiment, the amplitude and phase error used to determine the target calibration weight, that is, the amplitude and phase error of the channel with coupling (also called the amplitude and phase error of the channel with coupling) Channel amplitude and phase error vector), which can be represented by "CEg" in formula (1).
- e c is used to represent the channel amplitude and phase error vector with coupling, and the details are shown in formula (2):
- e j , g j represent the initial amplitude and phase error corresponding to the j-th array element in the array antenna and the excitation of the array element respectively;
- c ij represents the coupling emission from the j-th array element to the i-th array element in the array antenna ;
- e ci represents the channel amplitude and phase error of the band coupling of the i-th array element in the array antenna.
- the amplitude and phase errors to be obtained are related to the array excitation of the array antenna. That is, when there is coupling, the channel amplitude and phase errors are not fixed, and change with the array excitation. There is a certain contradiction.
- the calibration weights are directly substituted into the system, the corresponding amplitude and phase errors will also change when the excitation changes before the calibration. Calibration weights do not apply to the system after adding calibration weights. Although the error caused by coupling is small, it cannot meet the requirements of high channel consistency of MIMO systems.
- an embodiment of the present application provides a calibration method for an array antenna that adopts an adaptive manner to reduce the influence of front and rear calibration errors.
- the method for calibrating an array antenna involved in the embodiments of the present application continuously obtains the antenna pattern data of the array antenna under test, thereby obtaining an antenna pattern data vector, and uses the least squares method to solve the problem in combination with the array response matrix that can reflect the array antenna.
- the coupled channel amplitude and phase error of each array element in the array antenna under test is determined, and the target calibration weight is determined based on the channel amplitude and phase error to be coupled, and then the to-be-calibrated array antenna is calibrated according to the calculated target calibration weight. , so as to realize the calibration and decoupling of each channel of the millimeter-band base station antenna.
- the amplitude and phase errors between the channels of the base station antenna can be effectively resolved, thereby improving the side lobe level of the base station antenna and the scanning capability of the array beam, thereby improving the effective radiation of the entire system power, and improve the system performance of high-frequency Massive MIMO communication systems such as 5G millimeter waves.
- the embodiments of the present application take the example that the calibration method of the array antenna is applicable to the base station antenna in the 5G millimeter-wave Massive MIMO communication system. That is, the array antenna mentioned in this embodiment, whether it is the array antenna under test or the array antenna to be calibrated, is the base station antenna in the 5G millimeter-wave Massive MIMO communication system.
- Step S10 constructing an array response matrix of the array antenna under test relative to the detection antenna.
- the construction process of the array response matrix may be as follows:
- the calibration system a system capable of implementing the calibration method provided in this embodiment
- test environment mentioned above is based on the actual usage scenarios of the array antenna, and is realized by simulating these scenarios.
- the construction process of the array response matrix may also be constructed based on the actual test environment information obtained from the actual signal transmission and reception operations performed by other array antennas.
- the dimension of the array response matrix is specifically determined by the number of spatial sampling points and the number of array elements in the array antenna under test.
- the spatial sampling points are determined based on the predetermined pattern of the array antenna under test.
- the constructed array response matrix A is an N ⁇ M dimensional matrix.
- N ⁇ M-dimensional array response matrix A is shown in formula (5):
- test environment information specifically includes the acquired information such as the array layout of the array antenna under test, the specific position relative to the phase center of the turntable, and the actual distance from the detection antenna.
- test environment information can be obtained, no matter it is in a test environment or an actual applicable environment, it can be used.
- the acquisition and construction of the array response matrix The equipment involved in the system can be calibrated once before the required test environment information.
- the calibration of the equipment involved in the system mentioned in this embodiment mainly includes the zero-seeking calibration of the turntable that fixes the array antenna under test, that is, the zero-adjustment and calibration of the turntable is performed before the test, and the The parallelism and pointing deviation between the array antenna under test and the detection antenna are calibrated, that is, the parallelism and the pointing deviation between the array antenna under test and the detection antenna are adjusted to the range that meets the test requirements.
- the above-mentioned antenna pattern is specifically a graph for characterizing the relationship between the antenna radiation characteristics (field intensity amplitude, phase, and polarization) and the spatial angle.
- the complete antenna pattern is a three-dimensional spatial graph, which is drawn by measuring its radiation characteristics point by point (spatial sampling point) on a spherical surface with a sufficiently large radius r, with the antenna phase center as the center of the sphere (the origin of coordinates). .
- it can be assisted by various existing computer drawing software, and the specific drawing process will not be repeated in this embodiment.
- Step S20 test the antenna pattern of the array antenna under test, and obtain the data vector of the antenna pattern.
- the origin of the pattern data corresponding to each spatial sampling point in the antenna pattern is specifically based on the spatial position of each spatial sampling point in the antenna pattern, and the The turntable of the array antenna under test is turned, and after turning to the spatial position corresponding to the current spatial sampling point, the signal transmitter is controlled to transmit the calibration signal, and the signal receiver is controlled to receive the calibration signal, and then according to the signal transmitted by the signal transmitter.
- the channel amplitude and phase corresponding to the calibration signal and the channel amplitude and phase corresponding to the calibration signal received by the signal receiving device determine the channel amplitude and phase error corresponding to the current spatial sampling point, and finally determine the channel amplitude and phase error.
- pattern data corresponding to the current spatial sampling point pattern data corresponding to one spatial sampling point in the antenna pattern can be obtained.
- the corresponding channel amplitude and phase error can be determined according to the above method, and the corresponding pattern data can be obtained, and then the directions corresponding to all the spatial sampling points in the antenna pattern can be obtained.
- image data that is, the antenna pattern data vector is obtained.
- the pattern data essentially embodies the amplitude and phase, so the pattern data under the spatial sampling point can be expressed as
- the above-mentioned antenna pattern data vector can be shown in formula (6):
- F A represents the antenna pattern data vector
- N represents the spatial sampling point
- the above-mentioned calibration signal in specific implementation, it may be a single-frequency signal or a broadband signal, which is not limited in this embodiment.
- the purpose of transmitting the calibration signal through the signal transmitting device and receiving the calibration signal through the signal receiving device is mainly to obtain the amplitude and phase error between the signal transmitting device and the signal receiving device. Therefore, in the specific implementation, it can be assumed that the amplitude and phase difference between the array elements in the tested array antenna changes slowly with frequency, so the amplitude and phase error obtained at the operating frequency of the system can be selected as the amplitude and phase difference between the two. phase error.
- Step S30 according to the array response matrix and the antenna pattern data vector, calculate the coupled channel amplitude and phase error of each array element in the array antenna under test, and obtain each array antenna in the array antenna under test. Amplitude and phase error of the element.
- the array response matrix reflects the coupling relationship between the array antennas, and the antenna pattern data vector records the pattern data of the array elements at different spatial sampling points. Therefore, according to the two, the amplitude and phase error of each element in the array antenna under test can be calculated, that is, the vector value that can reflect the coupling relationship and the channel amplitude and phase error.
- the target calibration weight used to calibrate the array antenna to be calibrated is based on the above-mentioned channel amplitude and phase error with coupling (for the convenience of description, In this embodiment, the channel amplitude-phase error with coupling is referred to as the amplitude-phase error).
- the maximum phase fluctuation value and the maximum amplitude fluctuation value can be determined according to the amplitude and phase error; then, the maximum phase fluctuation value can be determined; Whether the fluctuation value is not greater than the phase error convergence upper limit value specified by the convergence condition, and whether the maximum amplitude fluctuation value is not greater than the amplitude error convergence upper limit value specified by the convergence condition.
- the maximum phase fluctuation value is not greater than (less than or equal to) the upper limit value of phase error convergence specified by the convergence condition
- the maximum amplitude fluctuation value is not greater than (less than or equal to) specified by the convergence condition. If the upper limit value of the amplitude error convergence is determined, it is determined that the amplitude and phase errors satisfy a preset convergence condition.
- g ei represents the amplitude and phase error obtained by calculation during the i-th calibration test
- angle max (*) represents the largest phase fluctuation value in *, that is, the above-mentioned maximum phase fluctuation value
- dB max (*) represents *
- the maximum amplitude fluctuation value in the above-mentioned maximum amplitude fluctuation value Represents the upper limit of phase error convergence, in degrees
- G l represents the upper limit of amplitude error convergence, specifically in the form of dB.
- the maximum phase fluctuation value can be determined based on formula (9), and the maximum amplitude fluctuation value can be determined based on formula (10):
- angle max (*) involved in formula (9) satisfies the following conditions: 0 ⁇ angle max (*) ⁇ 180.
- Step S40 when the amplitude and phase errors obtained from two adjacent calibration tests satisfy a preset convergence condition, end the test, and determine target calibration weights according to the amplitude and phase errors obtained from two adjacent calibration tests.
- ge ,0 [1,1,1,...1].
- the calibration test is performed again, that is, the termination condition of the iterative training is that the amplitude and phase errors meet the requirements. Convergence conditions mentioned above.
- the above calibration test process given in this embodiment can be specifically applicable to an indoor far-field calibration environment, a planar near-field calibration environment (also called an indoor near-field calibration environment), and a tight-field calibration environment.
- this implementation combines the indoor far-field calibration environment given in Figure 2, the planar near-field calibration environment given in Figure 3, and the tight field calibration environment given in Figure 4.
- the turntable 400 for fixing the array antenna under test 200 and the detection antenna bracket 600 for fixing the detection antenna 300 need to be placed in the dark room within 100.
- the turntable 400 used in the indoor far-field calibration environment is specifically composed of a fixing part 401 for fixing the array antenna 200 under test and a supporting part 402 for supporting the fixing part 401 (or a become a pedestal).
- the part of the fixed part 401 in contact with the support part 401 can be rotated left and right, and the part in contact with the array antenna 200 under test can be rotated on the line. Through the rotation of these two parts, the turntable can be controlled to turn to a specific spatial sampling point. the spatial location.
- a beam controller 500 needs to be set at the position where the fixed part 401 of the turntable 400 contacts the array antenna under test 200 .
- a position calibration device 700 may also be provided on the detection antenna support 600 to realize the calibration of the array antenna under test 200 and the detection antenna Calibration of parallelism and pointing deviation between 300.
- a calibration system or a calibration device based on the calibration method of the array antenna provided in this embodiment is also required, that is, the amplitude and phase error calibration module shown in FIG.
- the measurement array antenna 200, the detection antenna 300, the turntable 400 and the beam controller 500 are connected in communication, so that the above-mentioned devices in the anechoic chamber 100 can be controlled, and the target calibration weights are determined according to the calibration method of the array antenna provided in this embodiment.
- the equipment and devices located in the darkroom 100 are roughly the same as those in the indoor far-field calibration environment shown in FIG. 2 , and the main differences are The point is:
- the detection antenna bracket 800 for fixing the detection antenna 300 is a plane scanning bracket.
- a sliding device 900 that can slide left and right and up and down is provided on the bracket, and the detection antenna 300 is fixed on the sliding device 900 .
- the turntable 400 for fixing the array antenna under test 200 and the detection antenna 300 also need to be placed in the darkroom 100, and in the darkroom 100, it is also necessary to implement a calibration system or calibration device based on the calibration method of the array antenna provided in this embodiment, that is, the amplitude and phase error calibration module shown in FIG. 300.
- the turntable 400 is connected in communication with the beam controller 500, so that the above-mentioned devices in the anechoic chamber 100 can be controlled, and the determination of the target calibration weight is completed according to the calibration method of the array antenna provided in this embodiment.
- the turntable located in the darkroom 100 also includes a fixing part 401 and a supporting part 402, the fixing part 401 for fixing the array sky 200 under test only needs to be rotated left and right.
- a target calibration weight storage module for storing target calibration weights can also be set.
- the target calibration weight storage module is usually connected in communication with the beam controller 500 , as shown in FIG. 2 , FIG. 3 and FIG. 4 for details.
- the amplitude and phase error calibration module is connected in communication with the array antenna 200 under test, the detection antenna 300, the turntable 400 and the beam controller 500 in the anechoic chamber 100, the control of these devices can be realized, thereby Signal transmission and reception can be realized, thereby ensuring that the calibration method of the array antenna provided in this embodiment can be carried out smoothly.
- the target calibration weight storage module derived from the beam controller 500 using dotted lines in FIG. 2, FIG. 3 and FIG. 4 can usually be integrated in the beam controller 500, that is, this implementation
- the beam controller 500 mentioned in the example has both the beam steering function and the storage function of the target calibration weight.
- Step S50 calibrate the array antenna to be calibrated according to the target calibration weight.
- step S50 may be performed during the use of the array antenna to be calibrated, or before the use of the array antenna to be calibrated, or a combination of the two methods in practical applications.
- the array antenna to be calibrated is first calibrated based on the above method, and the determined target calibration weight is stored in the calibration weight storage module.
- the stored target calibration weight can be obtained from the calibration weight storage module according to the actual situation.
- the value of the current array antenna is re-calibrated again, so as to effectively ensure the accurate calibration of the array antenna.
- the above-mentioned array antenna under test and the array antenna to be calibrated can be the same array antenna, that is, when an array antenna is put into use, the array antenna is directly used as the array antenna under test. Carry out a test, and then determine the target calibration weight based on the test, and then calibrate it in subsequent use.
- the array antenna located in the base station can both transmit signals, which is suitable for downlink channel scenarios, and can receive signals, which is suitable for uplink channel scenarios.
- the connection between the detected array antenna 200 here can be regarded as the above-mentioned array antenna to be calibrated
- the detection antenna 300 and the beam controller 500 The signal flow direction and the signal flow direction between the detected array antenna 200, the detection antenna 300 and the beam controller 500 when the uplink signal is calibrated in the uplink channel scenario will be described in detail below with reference to FIG. 5 and FIG. 6 .
- the array antenna 200 under test can be divided into a power divider network 201 , an amplitude modulation and phase modulation module 202 , a power amplifier module 203 and an antenna module 204 .
- the power divider network 201 is mainly used to divide the digital signal into multiple channels and send it to each analog channel in equal parts; Phase modulation and amplitude modulation are used to complete the beamforming function; the power amplifier module 203 is mainly used to increase the signal transmission power; the antenna module 204 is mainly used to transmit signals to space to complete the conversion of radio frequency signals and electromagnetic wave signals.
- the power divider network 201 is mainly used to combine the signals of each analog channel, and output the combined signal to the corresponding digital channel;
- the amplitude modulation and phase modulation module 202 is mainly used for the control signal transmitted by the beam controller 500 Phase modulation and amplitude modulation are performed to complete the beamforming function to realize the adaptive function;
- the power amplifier module 203 is mainly used for power amplifying the space signal received by the antenna module 204;
- the antenna module 204 is mainly used to receive the space signal, complete Conversion of radio frequency signals to electromagnetic wave signals.
- the beam controller 500 whether in the downlink channel or the uplink channel, it is used to load the predetermined target calibration weight according to the specified beam information of the baseband system, generate the calibrated beam excitation, and transmit the excitation to the AM and phase modulation module 203 .
- a target calibration weight storage module that is communicatively connected to the beam controller 500 may also be set in the calibration device implemented based on the array antenna calibration method provided in this embodiment, and a target calibration weight storage module that is communicatively connected to the target calibration An amplitude and phase error calibration module that is communicatively connected to the weight storage module.
- the target calibration weight storage module is specifically configured to store the target calibration weight determined based on the above steps.
- the signal transmitting device and the signal receiving device used in the above-mentioned array antenna calibration method as well as a module for conducting an antenna pattern test to obtain an antenna pattern data vector, and a module for calculating target calibration weights
- the modules are not shown in Figures 5 and 6.
- the realization of the above-mentioned array antenna calibration method needs to rely on the signal transmitting device to transmit the specified calibration information, and transmit the calibration signal to the array antenna in the system under test; the signal receiving device needs to receive the measured calibration information.
- the calibration signal returned by the system.
- the pattern test module controls the turntable to turn to the specified direction, receives the actual turning information of the turntable, and controls the signal transmitting device and the signal receiving device to obtain that the array antenna is at the designated direction. direction map data.
- the calibration weight calculation module obtains the array response matrix according to the actual information of the array antenna in the test environment, and calculates the amplitude and phase errors in combination with the pattern data data set transmitted by the pattern test module. Then, combined with the convergence conditions, it is judged whether the amplitude and phase error data are converged. If the amplitude and phase error data converges, stop the calibration test; if not, control the pattern test module to trigger a new calibration process until the amplitude and phase errors meet the convergence conditions, and then according to the two consecutive amplitude and phase errors that satisfy the convergence conditions
- the target calibration weight is generated from the data, and the calibration weight is transmitted to the calibration weight storage module for subsequent calibration of the array antenna to be calibrated.
- the calibration method of the array antenna provided in this embodiment, by constructing an array response matrix relative to the detection antenna based on the array antenna under test, and testing the antenna pattern of the array antenna under test, and then obtains a result that can reflect the The antenna pattern data data of the channel amplitude and phase errors corresponding to each array element in the array antenna, and then based on the array response matrix and the antenna pattern data data, the amplitude and phase errors that can reflect both the coupling relationship and the channel amplitude and phase errors are obtained.
- the target calibration weights suitable for the array antenna are finally determined according to the amplitude and phase errors obtained from two adjacent calibration tests that satisfy the convergence conditions, so that the calibration weights can be realized according to the target calibration weights.
- the calibration of the array antenna there is no need to add any hardware device to the array antenna to be calibrated.
- the decoupling of the to-be-calibrated antennas can also be achieved during the calibration process of the array antenna to be calibrated according to the target calibration weights .
- the target calibration weights are determined based on the amplitude and phase errors that satisfy the convergence conditions, that is, the target calibration weights used for calibrating the array antenna to be calibrated are obtained through iterative training, thus ensuring that the target calibration weights can be better It is suitable for the array antenna to be calibrated, and meets the higher-precision calibration requirements for the array antenna.
- the second embodiment of the present application relates to a calibration method of an array antenna.
- This embodiment mainly provides a specific calibration method for the array antenna to be calibrated based on the target calibration weight.
- steps S10 to S40 in this embodiment are substantially the same as steps S10 and S40 in the first embodiment, which will not be repeated here.
- the following mainly describes the two specific sub-steps in step S50:
- Sub-step S51 during the use of the array antenna to be calibrated, receive beam information, and generate a beamforming weight corresponding to an analog channel according to the beam information.
- this embodiment takes a downlink channel scenario as an example for specific description.
- the beam controller first receives the beam information sent by the baseband processing module (or baseband processor, baseband processing chip), and then generates a designated beam according to the beam information, The beamforming weight corresponding to each analog channel.
- G bf,i represents the beamforming weight corresponding to the ith analog channel, which is a complex number.
- the beamforming weights can be formulated offline and read in the form of a look-up table during work, thereby further improving the processing efficiency and reducing the occupation of system resources.
- Sub-step S52 Perform amplitude and phase error compensation processing on the forward signal of the analog channel according to the target calibration weight and the beamforming weight, so as to calibrate the array antenna to be calibrated.
- the beam controller is specifically The stored target calibration weight is read from the target calibration weight storage module.
- C e,i represents the calibration weight of the ith analog channel, which is a complex number.
- the beamforming weights are calibrated according to the target calibration weights.
- the target calibration weight that is, the beam calibrated by the target calibration weight
- the target beamforming weight that is, the beam calibrated by the target calibration weight
- the target beamforming weight perform amplitude and phase error compensation processing on the forward signal of the analog channel.
- the beamforming weights are input to the multiplier, and after multiplication by the multiplier, the obtained product is used as the calibrated output signal.
- the baseband processing module (or baseband processor, baseband processing chip) is used to perform baseband processing on the signal to be transmitted, and then a baseband signal that meets the requirements is obtained; then, the amplitude of the obtained baseband signal is performed.
- Factor reduction CFR rest Factor Reduction processing to reduce the amplitude of the baseband signal to the preset requirement; then, the baseband signal whose amplitude is reduced to the preset requirement is subjected to digital pre-distortion processing;
- the signal is processed by digital-to-analog conversion, that is, the digital signal is converted into an analog signal, and then the analog signal is input into the power divider network of the array antenna, and the digital signal is divided into multiple channels and sent to each analog channel in equal parts.
- the forward signal of each analog channel that needs to be processed.
- the output signal after the amplitude and phase error compensation process can also be subjected to power amplification processing to generate power that meets the power requirements.
- the radio frequency signal; finally, the radio frequency signal is sent through the array elements in the to-be-calibrated array antenna.
- the array antenna to be calibrated is calibrated in the above manner, without adding any hardware device to the array antenna to be calibrated, so as to realize the calibration and decoupling of the array antenna to be calibrated, and at the same time It also satisfies the higher-precision calibration requirements for the array antenna.
- the third embodiment of the present application relates to an array antenna calibration device, as shown in FIG. 9 , including: a target calibration weight determination module 901 and an array antenna calibration module 902 .
- the target calibration weight determination module 901 is used to construct an array response matrix of the array antenna under test relative to the detection antenna.
- the target calibration weight determination module 901 is further configured to test the antenna pattern of the array antenna under test to obtain the antenna pattern data vector.
- the target calibration weight determination module 901 is further configured to calculate, according to the array response matrix and the data vector of the antenna pattern, the band coupling of each element in the array antenna under test.
- the amplitude and phase error of the channel is obtained to obtain the amplitude and phase error of each array element in the tested array antenna.
- the target calibration weight determination module 901 is further configured to end the test when the amplitude and phase errors obtained from two adjacent calibration tests meet a preset convergence condition, and perform the test according to the two adjacent calibration tests. The amplitude and phase errors obtained by the calibration test are used to determine the target calibration weight.
- the array antenna calibration module 902 is configured to calibrate the array antenna to be calibrated according to the target calibration weight.
- the target calibration weight determination module 901 constructs the array response matrix of the array antenna under test relative to the detection antenna, the specific steps are:
- the array response matrix of the array antenna under test relative to the detection antenna is constructed according to the test environment information.
- the calibration apparatus for the array antenna may further include a device calibration module.
- the device calibration module is used to obtain, in the target weight determination module 901, the array layout of the array antenna under test, the specific position relative to the phase center of the turntable, and the actual relationship between the detection antenna Before obtaining the test environment information, zeroing calibration is performed on the turntable, and parallelism and pointing deviation between the array antenna under test and the detection antenna are calibrated.
- the target weight determination module when testing the antenna pattern of the array antenna under test, obtains the data vector of the antenna pattern, specifically:
- the turntable on which the measured array antenna is fixed is controlled to turn, and the signal transmitting device is controlled to transmit a calibration signal, and the signal receiving device is controlled to receive the calibration signal;
- the channel amplitude and phase corresponding to the calibration signal transmitted by the signal transmitting device and the channel amplitude and phase corresponding to the calibration signal received by the signal receiving device determine the channel amplitude and phase error corresponding to the current spatial sampling point, and Taking the determined channel amplitude and phase error as the direction map data corresponding to the current spatial sampling point;
- the corresponding channel amplitude and phase error is determined according to the above method, and the data vector of the antenna pattern is obtained.
- the calibration device for the array antenna may further include a convergence judgment module.
- the convergence judgment module is configured to determine the maximum phase fluctuation value and the maximum amplitude fluctuation value according to the amplitude and phase error;
- the maximum phase fluctuation value is not greater than the upper limit value of the phase error convergence specified by the convergence condition, and the maximum amplitude fluctuation value is not greater than the upper limit value of the amplitude error convergence specified by the convergence condition, then determine the The amplitude and phase errors satisfy the convergence condition.
- the array antenna calibration module 902 calibrates the to-be-calibrated array antenna according to the target calibration weight, specifically:
- the array antenna receives beam information, and generate a beamforming weight corresponding to an analog channel according to the beam information;
- amplitude and phase error compensation processing is performed on the forward signal of the analog channel, so as to realize the calibration of the to-be-calibrated array antenna.
- the array antenna calibration module 902 performs amplitude and phase error compensation processing on the forward signal of the analog channel according to the target calibration weight and the beamforming weight, specifically for:
- the beamforming weight is calibrated to obtain the target beamforming weight
- Amplitude and phase error compensation processing is performed on the forward signal of the analog channel according to the target beamforming weight.
- the array antenna calibration module 902 is further configured to perform power amplifying processing on the output signal after the amplitude and phase error compensation processing, so as to generate a radio frequency signal that meets the power requirements;
- the array element in the array antenna transmits the radio frequency signal.
- this embodiment is a device embodiment corresponding to the first or second embodiment, and this embodiment can be implemented in cooperation with the first or second embodiment.
- the related technical details mentioned in the first or second embodiment are still valid in this embodiment, and are not repeated here in order to reduce repetition.
- the related technical details mentioned in this embodiment can also be applied in the first or second embodiment.
- a logical unit may be a physical unit, a part of a physical unit, or multiple physical units.
- a composite implementation of the unit in order to highlight the innovative part of the present application, this embodiment does not introduce units that are not closely related to solving the technical problem raised by the present application, but this does not mean that there are no other units in this embodiment.
- the fourth embodiment of the present application relates to a computer-readable storage medium storing a computer program.
- the computer program is executed by the processor, the method for calibrating the array antenna described in the above method embodiments is implemented.
- the computer-readable storage medium includes transient or non-transitory, removable or Non-removable media.
- the functional modules/units in the system and the device can be implemented as software (can be implemented by computer program codes executable by the computing device), firmware, hardware, and their appropriate combination.
- the division between functional modules/units mentioned in the above description does not necessarily correspond to the division of physical components; for example, one physical component may have multiple functions, or one function or step may be composed of several physical components Components execute cooperatively.
- Some or all physical components may be implemented as software executed by a processor, such as a central processing unit, digital signal processor or microprocessor, or as hardware, or as an integrated circuit, such as an application specific integrated circuit .
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Abstract
本申请公开了一种阵列天线的校准方法、装置及存储介质。本申请中，基于被测阵列天线(200)相对于探测天线(300)的位置，构建阵列响应矩阵，并测试被测阵列天线(200)的天线方向图，以获得天线方向图数据矢量，进而基于阵列响应矩阵和天线方向图数据数据获得既能体现耦合关系，又能体现通道幅相误差的幅相误差，并通过监测幅相误差的收敛性，最终根据相邻两次校准测试得到的满足收敛条件的幅相误差来确定适用于阵列天线的目标校准权值。
Description
相关申请的交叉引用
本申请基于申请号为202011211359.5、申请日为2020年11月03日的中国专利申请提出，并要求该中国专利申请的优先权，该中国专利申请的全部内容在此以引入方式并入本申请。
本申请实施例涉及通信领域，特别涉及一种阵列天线的校准方法、装置及存储介质。
随着大规模多天线技术的日益成熟以及在基站系统中的广泛应用，人们对基站阵列天线中各阵子之间的幅相一致性有了更高的要求。如果基站阵列天线中各阵子之间存在较大的幅相不一致性，将导致阵列天线的波束赋形、多输入多输出(Multiple In Multiple Out，MIMO)失效，进而影响基站系统的性能。通过分析发现，影响基站阵列天线中各阵子之间的幅相不一致性的主要因素有两个。一个是各阵子对应通道之间的幅相差异，另一个是各阵子之间的耦合。
但是，目前针对阵列天线的校准方案，基本都是基于测试阵列天线对应的方向图计算获得的幅相误差来对阵列天线进行校准，不适用于存在耦合的情况，即对于存在耦合的阵列天线，如毫米波阵列天线、太赫兹阵列天线、光学频段阵列天线、共形阵列天线、稀疏阵列天线，以及各种使用类似阵列天线的5G、6G基站产品，目前针对阵列天线的校准方案会因为耦合因素导致校准结果存在较大误差，因而根本无法满足对阵列天线更高精度的校准要求。
发明内容
本申请实施例的目的在于提供一种阵列天线的校准方法、装置及存储介质，旨在解决上述技术问题。
为解决上述技术问题，本申请的实施例提供了一种阵列天线的校准方法，包括：构建被测阵列天线相对于探测天线的阵列响应矩阵；测试被测阵列天线的天线方向图，得到天线方向图数据矢量；根据所述阵列响应矩阵和所述天线方向图数据矢量，计算所述被测阵列天线中每一个阵元的带耦合的通道幅相误差，得到所述被测阵列天线中每一个阵元的幅相误差；在相邻两次校准测试得到的所述幅相误差满足预设的收敛条件时，结束测试，并根据相邻两次校准测试得到的所述幅相误差，确定目标校准权值；根据所述目标校准权值对所述待校准阵列天线进行校准。
为实现上述目的，本申请实施例还提供了一种阵列天线的校准装置，包括：目标校准权值确定模块和阵列天线校准模块；所述目标校准权值确定模块，用于构建被测阵列天线相对于探测天线的阵列响应矩阵；所述目标校准权值确定模块，还用于测试被测阵列天线的天线 方向图，得到天线方向图数据矢量；所述目标校准权值确定模块，还用于根据所述阵列响应矩阵和所述天线方向图数据矢量，计算所述被测阵列天线中每一个阵元的带耦合的通道幅相误差，得到所述被测阵列天线中每一个阵元的幅相误差；所述目标校准权值确定模块，还用于在相邻两次校准测试得到的所述幅相误差满足预设的收敛条件时，结束测试，并根据相邻两次校准测试得到的所述幅相误差，确定目标校准权值；所述阵列天线校准模块，用于根据所述目标校准权值对所述待校准阵列天线进行校准。
为实现上述目的，本申请实施例还提供了一种计算机可读存储介质，存储有计算机程序。所述计算机程序被处理器执行时实现上述所述的阵列天线的校准方法。
一个或多个实施例通过与之对应的附图中的图片进行示例性说明，这些示例性说明并不构成对实施例的限定。
图1是本申请第一实施例提供的阵列天线的校准方法的流程图。
图2是适用于本申请第一实施例提供的阵列天线的校准方法的室内远场校准环境的示意图。
图3是适用于本申请第一实施例提供的阵列天线的校准方法的平面近场校准环境的示意图。
图4是适用于本申请第一实施例提供的阵列天线的校准方法的紧缩场校准环境的示意图。
图5是基于本申请第一实施例提供的阵列天线的校准方法针对下行通道信号进行校准时，被探测阵列天线200、探测天线300和波束控制器500之间的信号流向。
图6是基于本申请第一实施例提供的阵列天线的校准方法针对上行通道信号进行校准时，被探测阵列天线200、探测天线300和波束控制器500之间的信号流向。
图7是本申请第二实施例提供的阵列天线的校准方法的流程图。
图8是本申请第二实施例提供的阵列天线的校准方法中步骤S50所说的基于波束赋形权值和目标校准权值对前向信号进行校准的示意图。
图9是本申请第三实施例提供的阵列天线的校准装置。
为使本申请实施例的目的、技术方案和优点更加清楚，下面将结合附图对本申请的各实施例进行详细的阐述。然而，本领域的普通技术人员可以理解，在本申请各实施例中，为了使读者更好地理解本申请而提出了许多技术细节。但是，即使没有这些技术细节和基于以下各实施例的种种变化和修改，也可以实现本申请所要求保护的技术方案。以下各个实施例的划分是为了描述方便，不应对本申请的具体实现方式构成任何限定，各个实施例在不矛盾的前提下可以相互结合相互引用。
为了便于理解本申请本实施例提供的阵列天线的校准方法为何可以实现对阵列天线中各通道的校准与解耦，此处首先分析耦合情况下阵列天线的校准问题。
假设某阵列天线的阵列响应矩阵为A；将该阵列天线的耦合关系线性化，以耦合矩阵C形式表示；阵列天线中各模拟通道的误差以对角矩阵E表示；阵列天线在某波束下激励矢量为g(每一个波束对应的激励矢量是已知的)。那么，该阵列天线在某一空间采样点下的方向图数据f可以通过公式(1)表示：
f＝ACEg (1)
其中，方向图数据f为待测量，阵列响应矩阵A已知，而本实施例中用来确定目标校准权值的幅相误差，即带耦合的通道幅相误差(也可称为带耦合的通道幅相误差矢量)，可以用公式(1)中的“CEg”表示。为了便于后续使用，本实施例用e
c表示带耦合的通道幅相误差矢量，具体详实如公式(2)所示：
e
c＝CEg
0 (2)
其中，g
0为单位矢量，具体取值为：g
0＝[1 1 1…1]。
关于g
0对应的取值集合中“1”的个数，具体取决于构建的阵列响应矩阵中阵列天线的阵元个数。
结合公式(1)和公式(2)，带耦合的通道幅相误差矢量求解过程如公式(3)所示：
其中，./表示点除。使用元素表示为：
其中，e
j、g
j分别表示阵列天线中第j个阵元对应的初始幅相误差、阵元激励；c
ij表示阵列天线中第j个阵元耦合到第i个阵元的耦合发射量；e
ci表示阵列天线中第i个阵元带耦合的通道幅相误差。
通过上述公式(1)、(2)、(3)和(4)可以看出，待求取的幅相误差与阵列天线的阵列激励有关。也即存在耦合时，通道幅相误差并不是固定的，随着阵列激励改变而改变。这就存在一定矛盾的地方，当第一次完成校准时，如果直接将校准权值代入系统中，此时相比校准之前激励发生改变，对应的幅相误差也会发生改变，所以此时的校准权值并不适用于添加校准权值之后的系统。虽然耦合引起的误差较小，但是已经不能满足MIMO系统通道高一致性的要求。
为解决该问题，本申请实施例提供了一种采用自适应方式，借以减小前后校准误差影响的阵列天线的校准方法。本申请实施例涉及的阵列天线的校准方法，通过不断求取被测阵列天线的天线方向图数据，进而得到天线方向图数据矢量，并结合能够体现阵列天线的阵列响应矩阵，使用最小二乘法求解被测阵列天线中每一个阵元的带耦合的通道幅相误差，并基于这种待耦合的通道幅相误差确定目标校准权值，进而根据计算出的目标校准权值对待校准阵列天线进行校准，从而实现了对毫米波段基站天线各通道的校准与解耦。
即，基于本实施例提供的阵列天线的校准方法，可以有效解决基站天线各通道之间的幅相误差，从而改善基站天线的副瓣水平，以及阵列波束扫描能力，进而提高整个系统的有效辐射功率，提升5G毫米波等高频大规模Massive MIMO通信系统的系统性能。
下面对本申请本实施例的阵列天线的校准方法的实现细节进行说明，以下内容仅为方便理解而提供的实现细节，并非实施本方案的必须。
为了便于理解，本申请实施例以所述阵列天线的校准方法适用于5G毫米波Massive MIMO通信系统中的基站天线为例。即，本实施例中所说的阵列天线，不论是被测阵列天线，还是待校准阵列天线，均为5G毫米波Massive MIMO通信系统中的基站天线。
本申请的第一实施例的具体流程如图1所示，具体包括以下步骤：
步骤S10，构建被测阵列天线相对于探测天线的阵列响应矩阵。
具体的说，所述阵列响应矩阵的构建过程可以如下：
基于测试环境，即利用被测阵列天线模拟阵列天线的信号发射和接收操作，并利用校准系统(能够实现本实施例提供的校准方法的系统)，获取模拟过程中产生的测试环境信息，进而根据获取到的测试环境信息构建被测阵列天线相对于探测天线的阵列响应矩阵。
关于上述所说的测试环境，具体是基于阵列天线实际的使用场景，通过模拟这些场景实现的。
在本实施例中，在实际应用中，所述阵列响应矩阵的构建过程也可以是基于其他阵列天线实际进行的信号发射和接收操作，所获取到的真实的测试环境信息，构建而成的。
需要说明的是，在具体实现中，阵列响应矩阵的维度具体是由空间采样点的数量和被测阵列天线中阵元的数量确定的。而空间采样点则是基于预先确定的被测阵列天线方向图决定的。
假设，绘制的被测阵列天线的天线方向图中的空间采样点的数量为N，被测阵列天线中阵元的数量为M，则构建的阵列响应矩阵A为N×M维矩阵。
具体的，构建的N×M维的阵列响应矩阵A，如公式(5)所示：
其中，
表示在空间采样点位N的情况下，被测阵列天线中第M个阵元的相位和幅度。
此外，关于上述所说的测试环境信息，在本实施例中，具体是获取的被测阵列天线的阵列布局、相对于转台相位中心的具体位置、与探测天线之间的实际距离等信息。
即，只要能够获取到上述测试环境信息，无论是在测试环境下，还是实际适用环境下，均可以。
在本实施例中，在具体实现时，为了尽可能保证确定的目标校准权值能够更好的适用于后续对待校准阵列天线的校准，以保证更高的精确度，在获取构建阵列响应矩阵所需要的测试环境信息之前，可以先对系统中涉及的设备进行一次校准。
具体的，本实施例中所说的对系统中涉及的设备进行的校准，主要包括对固定被测阵列 天线的转台进行寻零校准，即在进行测试前先对转台进行调零校准，同时对被测阵列天线和探测天线之间的平行度和指向偏差进行校准，即将被测阵列天线和探测天线之间的平行度和指向偏差均调整到符合测试要求的区间。
此外，关于上述所说的天线方向图，具体是用于表征天线辐射特性(场强振幅、相位、极化)与空间角度关系的图形。完整的天线方向图是一个三维的空间图形，它是以天线相位中心为球心(坐标原点)，在半径r足够大的球面上，逐点(空间采样点)测定其辐射特性绘制而成的。在具体实现中，可以借助现有各种计算机绘图软件辅助完成，对于具体的绘制过程，本实施例不再赘述。
步骤S20，测试被测阵列天线的天线方向图，得到天线方向图数据矢量。
具体的说，在实际应用中，天线方向图中各空间采样点对应的方向图数据的由来，具体是根据所述天线方向图中各空间采样点所处的空间位置，通过控制固定有所述被测阵列天线的转台转向，在转到当前空间采样点对应的空间位置后，控制信号发射装置发射校准信号，并控制信号接收装置接收所述校准信号，进而根据所述信号发射装置发射出去的所述校准信号对应的通道幅相和所述信号接收装置接收到的所述校准信号对应的通道幅相，确定当前空间采样点对应的通道幅相误差，最终将确定的所述通道幅相误差作为当前空间采样点对应的方向图数据，便可以获得天线方向图中一个空间采样点对应的方向图数据。
也就是说，对于天线方向图中每一个空间采样点而言，按照上述方式确定对应的通道幅相误差，便可以获得对应的方向图数据，进而得到天线方向图中所有空间采样点对应的方向图数据，即得到天线方向图数据矢量。
通过上述描述可知，方向图数据实质体现的是幅相，故而对于空间采样点下的方向图数据可以表示成
相应地，上述所说的天线方向图数据矢量，可以如公式(6)所示：
其中，F
A表示天线方向图数据矢量，N表示空间采样点，
表示第N个空间采样点下的方向图数据。
此外，值得一提的是，关于上述所说的校准信号，在具体实现中，可以是单频点信号，也可以是宽带信号，本实施例对此不做限制。
此外，应当理解的是，上述通过信号发射装置发射校准信号，通过信号接收装置接收校准信号的目的主要是为了得到信号发射装置和信号接收装置之间的幅相误差。因此，在具体实现中，可以假设被测阵列天线中各阵元之间的幅相差异随频率变换缓慢，所以可以选用系统工作频点下获取到的幅相误差，作为二者之间的幅相误差。
步骤S30，根据所述阵列响应矩阵和所述天线方向图数据矢量，计算所述被测阵列天线中每一个阵元的带耦合的通道幅相误差，得到所述被测阵列天线中每一个阵元的幅相误差。
通过上述描述可知，阵列响应矩阵体现了阵列天线之间的耦合关系，而天线方向图数据矢量中又记录了阵列天线中的阵元在不同空间采样点下的方向图数据。因而，根据这两者， 便可以计算出被测阵列天线中每一个阵元的幅相误差，即能够体现耦合关系和通道幅相误差的矢量值。
为了便于理解，此处以公式(5)所示的阵列响应矩阵和公式(6)所示的天线方向图数据矢量为例，结合公式(3)来求取被测阵列天线中每一个阵元的带耦合的通道幅相误差，具体求取方式如公式(7)所示：
此外，值得一提的是，由于在本实施例提供的阵列天线的校准方法中，用于对待校准阵列天线进行校准的目标校准权值是基于上述带耦合的通道幅相误差(为了便于描述，本实施例将带耦合的通道幅相误差称为幅相误差)，为了保证确定的目标校准权值能够更好的适用于对阵列天线的校准，对于所述被测阵列天线中的每一个阵元，对于所述被测阵列天线中的每一个阵元，在计算得到幅相误差后，可以根据所述幅相误差，确定最大相位波动值和最大幅度波动值；然后，判断所述最大相位波动值是否不大于所述收敛条件规定的相位误差收敛上限值，且所述最大幅度波动值是否不大于所述收敛条件规定的幅度误差收敛上限值。
相应地，若上述两个判断均满足，即最大相位波动值不大于(小于或等于)收敛条件规定的相位误差收敛上限值，且最大幅度波动值不大于(小于或等于)收敛条件规定的幅度误差收敛上限值，则确定所述幅相误差满足预设的收敛条件。
关于上述判断过程，在具体实现中，可以通过公式(8)实现：
其中，g
ei表示第i次校准测试时，计算获得的幅相误差，angle
max(*)表示*中最大的相位波动值，即上述所说的最大相位波动值，dB
max(*)表示*中最大的幅度波动值，即上述所说的最大幅度波动值，
表示相位误差收敛上限值，单位为度，G
l表示幅度误差收敛上限值，具体为dB形式。
此外，在具体实现中，最大相位波动值可以基于公式(9)确定，最大幅度波动值可以基于公式(10)确定：
angle
max(*)＝max(angle(*))-min(angle(*)) (9)
dB
max(g
ei)＝max(dB(g
ei))-min(dB(g
ei)) (10)
其中，公式(9)中涉及的angle
max(*)，满足如下条件：0≤angle
max(*)≤180。
步骤S40，在相邻两次校准测试得到的所述幅相误差满足预设的收敛条件时，结束测试，并根据相邻两次校准测试得到的所述幅相误差，确定目标校准权值。
即，通过上述公式(8)对每一次校准测试得到的幅相误差进行收敛性判断后，若相邻两次校准测试得到的幅相误差均满足预设的收敛条件，则结束测试，并根据相邻两次校准测试得到的所述幅相误差，确定目标校准权值。
关于，根据相邻两次校准测试得到的满足收敛条件的幅相误差确定目标校准权值的方式，具体可以结合公式(11)和公式(12)实现：
g
e,i＝g
e,i*g
e,i-1 (11)
其中，g
e,0＝[1,1,1,…1]。
c
e,i＝1/g
e,i (12)
通过公式(11)和公式(12)可以看出，在确定目标校准权值时，具体是将相邻两次校准测试得到的满足收敛条件的幅相误差相乘，然后将得到的乘积作为最终用于确定目标校准权值的幅相误差，最终通过将公式(11)中计算获得的幅相误差按照公式(12)的方式进行转换，便可以将幅相误差转换为目标校准权值。
相应地，若通过公式(8)进行收敛性判断后，发现本次校准测试获得的幅相误差不满足预设的收敛条件，则再次进行校准测试，即迭代训练的终止条件为幅相误差满足上述所说的收敛条件。
此外，值得一提的是，本实施例给出的上述校准测试过程，具体可以适用于室内远场校准环境、平面近场校准环境(也称：室内近场校准环境)和紧缩场校准环境。
为了便于理解，本实施结合图2给出的室内远场校准环境、图3给出的平面近场校准环境和图4给出的紧缩场校准环境，对这三种测试环境中涉及的设备、器件进行说明：
如图2所示，在基于室内远场校准环境，对被测阵列天线进行校准测试的过程中，需要将固定被测阵列天线200的转台400、固定探测天线300的探测天线支架600放置于暗室100内。
从图2可以看出，在具体实现中，针对室内远场校准环境中使用的转台400具体是由固定被测阵列天线200的固定部401和用于支撑固定部401的支撑部402(也可以成为基座)组成。
其中，固定部401与支撑部401接触的部分可以左右转动，与被测阵列天线200接触的部分可以上线转动，通过这两个部分的转动，从而可以实现控制转台转向特定的空间采样点所处的空间位置。
在本实施例中，在实际应用中，为了实现对被测阵列天线的控制，在转台400的固定部401与被测阵列天线200接触的部位，还需要设置一个波束控制器500。
此外，为了实现对被测阵列天线200和探测天线300之间的平行度和指向偏差的校准，在探测天线支架600上还可以设置位置校准装置700，以实现对被测阵列天线200和探测天线300之间的平行度和指向偏差的校准。
此外，值得一提的是，在实际应用中，为了保证上述方案的实现，针对图2所示的室内远场校准环境，除了需要暗室100内包括的上述设备、器件之外，在暗室100外，需要将基于本实施例提供的阵列天线的校准方法实现的校准系统或校准装置，即图2中示出的幅相误差校准模块与暗室100内的被测阵列天线200、探测天线300、转台400和波束控制器500通信连接，从而可以控制暗室100内的上述器件，按照本实施例中提供的阵列天线的校准方法完成目标校准权值的确定。
如图3所示，在基于室内近场校准环境，对被测阵列天线进行校准测试的过程中，同样 需要将固定被测阵列天线200的转台400、固定探测天线300的探测天线支架800放置于暗室100内，并且在暗室100外，同样需要将基于本实施例提供的阵列天线的校准方法实现的校准系统或校准装置，即图3中示出的幅相误差校准模块与暗室100内的被测阵列天线200、探测天线300、转台400和波束控制器500通信连接，从而可以控制暗室100内的上述器件，按照本实施例中提供的阵列天线的校准方法完成目标校准权值的确定。
从图3可以看出，针对室内近场校准环境，位于暗室100内的设备和器件，与图2中所示的针对室内远场校准环境中位于暗室100内的设备和器件大致相同，主要区别之处在于：
在室内近场校准环境中，用于固定探测天线300的探测天线支架800是平面扫描支架。
针对这种探测天线支架，其上设置的是可以左右滑动和上下滑动的滑动装置900，并且探测天线300是固定在滑动装置900上的。
如图4所示，在基于紧缩场校准环境，对被测阵列天线进行校准测试的过程中，同样需要将固定被测阵列天线200的转台400和探测天线300放置于暗室100内，并且在暗室100外，同样需要将基于本实施例提供的阵列天线的校准方法实现的校准系统或校准装置，即图4中示出的幅相误差校准模块与暗室100内的被测阵列天线200、探测天线300、转台400和波束控制器500通信连接，从而可以控制暗室100内的上述器件，按照本实施例中提供的阵列天线的校准方法完成目标校准权值的确定。
从图4可以看出，针对紧缩场校准环境，是不需要单独设置专门用于固定探测天线300的探测天线支架的，即探测天线300是直接固定在暗室100的内顶壁。针对这种情况，位于暗室100内的转台虽然同样包括固定部401和支撑部402，用于固定被测阵列天200的固定部401只需左右转动即可。
此外，值得一提的是，在实际应用中，在被测阵列天线侧，还可以设置用于存储目标校准权值的目标校准权值存储模块。具体而言，所述目标校准权值存储模块通常与波束控制器500通信连接，详见图2、图3和图4。
此外，通过上述描述不难发现，由于幅相误差校准模块与暗室100内的被测阵列天线200、探测天线300、转台400和波束控制器500通信连接，因而可以实现对这些器件的控制，从而可以实现对信号的收发，进而保证了本实施例提供的阵列天线的校准方法能顺利进行。
此外，需要说明的是，在实际应用中，图2、图3和图4中采用虚线从波束控制器500引出的目标校准权值存储模块，通常可以集成在波束控制器500中，即本实施例中所说的波束控制器500兼具了波束控制功能和目标校准权值的存储功能。
应当理解的是，上述示例仅是为了更好的理解本实施例的技术方案而列举的示例，不作为对本实施例的唯一限制。
步骤S50，根据所述目标校准权值对所述待校准阵列天线进行校准。
具体的说，步骤S50中所说的操作，在实际应用中可以是在待校准阵列天线的使用过程中，也可以是在待校准阵列天线使用之前，亦或两种方式配合进行。
比如说，使用待校准阵列天线之前，先基于上述方式，对待校准阵列天线进行一次校准，并将确定的目标校准权值存储到校准权值存储模块。
在本实施例中，在完成上述校准操作，对待校准阵列天线(已经进行了一次校准操作的阵列天线)的使用过程中，可以根据实际情况，从校准权值存储模块中获取存储的目标校准 权值再次对当前的阵列天线进行二次校准，从而有效保证阵列天线的精准校准。
需要说明的是，在实际应用中，上述所说的被测阵列天线和待校准阵列天线可以是同一阵列天线，即在将某一阵列天线投入使用时，直接将该阵列天线作为被测试阵列天线进行测试，然后基于测试确定目标校准权值，在后续使用中对其进行校准即可。
具体的说，由于在实际应用中，位于基站中的阵列天线既可以向外发射信号，即适用于下行通道场景，又可以接收信号，即适用于上行通道场景。为了更好的理解下行通道场景下，对下行信号进行校准时，被探测阵列天线200(此处可以看作是上述所说的待校准阵列天线)、探测天线300和波束控制器500之间的信号流向，以及上行通道场景下，对上行信号进行校准时，被探测阵列天线200、探测天线300和波束控制器500之间的信号流向，以下结合图5和图6进行具体说明。
从图5和图6可以看出，不论是针对下行通道信号进行校准，还是针对上行通道信号进行校准，两种场景下，除了信号的走向不同(下行是：被测阵列天线向探测天线发射信号；上行是：被测阵列天线接收探测天线发射的信号)，内部功能模块的划分是一致的。
具体而言，对于被测阵列天线200可以划分为功分器网络201、调幅调相模块202、功放模块203和天线模块204。
其中，对于下行通道，功分器网络201主要用于将数字信号一分多路，并等分地送给各模拟通道；调幅调相模块202主要用于根据波束控制器500传送的控制信号进行调相、调幅，从而完成完成波束赋形功能；功放模块203主要用于提升信号发射功率；天线模块204主要用于向空间发射信号，完成射频信号与电磁波信号的转换。
对于上行通道，功分器网络201主要用于将各模拟通道信号合路，并将合路后的信号输出到对应数字通道；调幅调相模块202主要用于根据波束控制器500传送的控制信号进行调相、调幅，从而完成完成波束赋形功能，以实现自适应功能；功放模块203主要用于对天线模块204接收到的空间信号进行功率放大；天线模块204主要用于接收空间信号，完成射频信号与电磁波信号的转换。
对于波束控制器500，不论是在下行通道，还是上行通道，其均是用于根据基带系统的指定波束信息，加载预先确定的目标校准权值，生成校准后的波束激励，并将该激励传送给调幅调相模块203。
在本实施例中，在实际应用中，还可以在基于本实施例提供的阵列天线的校准方法实现的校准装置中设置与波束控制器500通信连接的目标校准权值存储模块，以及与目标校准权值存储模块通信连接的幅相误差校准模块。
相应地，所说目标校准权值存储模块，具体用于存储基于上述步骤确定的目标校准权值。
此外，实现上述所说的阵列天线的校准方法中所用到的信号发射装置和信号接收装置，以及用于进行天线方向图测试，以获得天线方向图数据矢量的模块和用于计算目标校准权值的模块均未在图5和图6中示出。
但在具体实现中，上述所说的阵列天线的校准方法的实现，需要依赖信号发送装置发射指定的校准信息，并将校准信号传送给被测系统中的阵列天线；信号接收装置需要接收被测系统返回的所述校准信号。
相应地，方向图测试模块，具体是在触发方向图测试过程中，控制转台转到指定方向，并接收转台的实际转向信息，并控制信号发射装置以及信号接收装置，得到阵列天线在指定方向处的方向图数据。
校准权值计算模块，则是根据阵列天线在测试环境的实际信息得到阵列响应矩阵，并结合方向图测试模块传送的方向图数据数据集，计算幅相误差。进而结合收敛条件，判断幅相误差数据是否收敛。如果幅相误差数据收敛，则停止校准测试；如果不收敛，则控制方向图测试模块，触发新的校准过程，直到幅相误差满收敛条件，然后根据相邻两次满足收敛条件的幅相误差数据生成目标校准权值，并将校准权值传送给校准权值存储模块，以备后续对待校准阵列天线的校准使用。
应当理解的是，上述示例仅是为了更好的理解本实施例的技术方案而列举的示例，不作为对本实施例的唯一限制。
通过上述描述不难发现，本实施例提供的阵列天线的校准方法，通过基于被测阵列天线构建相对于探测天线的阵列响应矩阵，并测试被测阵列天线的天线方向图，进而获取到能够体现阵列天线中各阵元对应的通道幅相误差的天线方向图数据数据，接着基于阵列响应矩阵和天线方向图数据数据，获取既能体现耦合关系，又能体现通道幅相误差的幅相误差，并通过监测幅相误差的收敛性，最终根据相邻两次校准测试得到的满足收敛条件的幅相误差来确定适用于阵列天线的目标校准权值，从而根据目标校准权值便可以实现对待校准阵列天线的校准，无需在待校准阵列天线上添加任何硬件设备。
此外，由于目标校准权值是基于能够体现耦合关系和通道幅相误差的幅相误差确定的，因而在根据目标校准权值对待校准阵列天线的校准过程中，也可以实现对待校准天线的解耦。
此外，由于目标校准权值是基于满足收敛条件的幅相误差确定的，即用于对待校准阵列天线进行校准的目标校准权值是通过迭代训练获得的，从而保证了目标校准权值能够更好的适用于待校准阵列天线，满足了对阵列天线更高精度的校准要求。
本申请的第二实施例涉及一种阵列天线的校准方法。本实施例主要是给出了一种基于目标校准权值对待校准阵列天线的具体校准方式。结合图7不难发现，本实施例中的步骤S10至步骤S40与第一实施例中的步骤S10和步骤S40大致相同，在此就不再赘述。以下主要针对步骤S50中的两个具体子步骤进行说明：
子步骤S51，在所述待校准阵列天线的使用过程中，接收波束信息，根据所述波束信息生成模拟通道对应的波束赋形权值。
为了便于说明，本实施例以下行通道场景为例，进行具体说明。
具体的说，在需要通过待校准阵列天线发射信号时，首先由波束控制器接收基带处理模块(或基带处理器、基带处理芯片)发出的波束信息，进而根据所述波束信息生成指定波束下，各模拟通道对应的波束赋形权值。
关于波束赋形权值的表示，具体可以采用公式(13)表示：
其中，G
bf,i表示第i个模拟通道对应的波束赋形权值，该值为复数。
此外，需要说明的是，波束赋形权值可以离线制定，工作中使用查找表的形式读取，从而进一步提升处理效率，降低对系统资源的占用。
子步骤S52，根据所述目标校准权值和所述波束赋形权值，对所述模拟通道的前向信号进行幅相误差补偿处理，实现对所述待校准阵列天线的校准。
具体的说，对于目标校准权值是通过步骤S10至步骤S40的操作，预先迭代训练确定，并存储在目标校准权值存储模块中的情况，在执行子步骤S52时，具体是由波束控制器从目标校准权值存储模块中读取存储的目标校准权值。
关于读取出的目标校准权值，具体可以用公式(14)表示：
其中，C
e,i表示第i个模拟通道校准权值，该值为复数。
此外，关于子步骤S52中所说的根据所述目标校准权值和所述波束赋形权值，对所述模拟通道的前向信号进行幅相误差补偿处理的操作，可以结合图8实现：
如图8所示，首先，在得到需要的波束赋形权值和目标校准权值值后，根据所述目标校准权值，对所述波束赋形权值进行校准，在具体实现中，是通过将所述波束赋形权值和所述目标校准权值输入乘法器，经乘法器做乘法运算后，将得到的乘积作为目标波束赋形权值，即被目标校准权值校准后的波束赋形权值；然后，根据所述目标波束赋形权值，对所述模拟通道的前向信号进行幅相误差补偿处理，在具体实现中，是通过将所述前向信号和所述目标波束赋形权值输入乘法器，经乘法器做乘法运算后，将得到的乘积作为校准后的输出信号。
关于上述所说的前向信号，具体是通过如下处理流程得到：
在接收到需要发射的信号时，首先通过基带处理模块(或基带处理器、基带处理芯片)对需要发射的信号进行基带处理，进而得到符合要求的基带信号；接着，对得到的基带信号进行振幅因素降低CFR(Crest Factor Reduction)处理，以将基带信号的振幅降低到预设要求；接着，将振幅降低到预设要求的基带信号进行数字预失真处理；接着，将数字预失真处理后的基带信号进行数模转换处理，即将数字信号转换为模拟信号，然后将模拟信号输入阵列天线的功分器网络，将数字信号一分多路，并等分地送给各模拟通道，此时便出现的需要处理的各模拟通道的前向信号。
此外，值得一提的是，在实际应用中，经上述校准处理，即幅相误差补偿处理后，还可以对经所述幅相误差补偿处理后的输出信号进行功率放大处理，生成符合功率要求的射频信号；最终，通过所述待校准阵列天线中的阵元，发送所述射频信号。
由此，本实施例提供的阵列天线的校准方法，采用上述方式对待校准阵列天线进行校准，无需在待校准阵列天线上添加任何硬件设备，便实现了对待校准阵列天线的校准和解耦，同时也满足了对阵列天线更高精度的校准要求。
此外，应当理解的是，上面各种方法的步骤划分，只是为了描述清楚，实现时可以合并为一个步骤或者对某些步骤进行拆分，分解为多个步骤，只要包括相同的逻辑关系，都在本 专利的保护范围内；对算法中或者流程中添加无关紧要的修改或者引入无关紧要的设计，但不改变其算法和流程的核心设计都在该专利的保护范围内。
本申请第三实施例涉及一种阵列天线的校准装置，如图9所示，包括：目标校准权值确定模块901和阵列天线校准模块902。
其中，所述目标校准权值确定模块901，用于构建被测阵列天线相对于探测天线的阵列响应矩阵。
在本实施例中，所述目标校准权值确定模块901，还用于测试被测阵列天线的天线方向图，得到天线方向图数据矢量。
在本实施例中，所述目标校准权值确定模块901，还用于根据所述阵列响应矩阵和所述天线方向图数据矢量，计算所述被测阵列天线中每一个阵元的带耦合的通道幅相误差，得到所述被测阵列天线中每一个阵元的幅相误差。
在本实施例中，所述目标校准权值确定模块901，还用于在相邻两次校准测试得到的所述幅相误差满足预设的收敛条件时，结束测试，并根据相邻两次校准测试得到的所述幅相误差，确定目标校准权值。
所述阵列天线校准模块902，用于根据所述目标校准权值对所述待校准阵列天线进行校准。
此外，在另一个例子中，所述目标校准权值确定模块901构建被测阵列天线相对于探测天线的阵列响应矩阵时，具体为：
获取所述被测阵列天线的阵列布局、相对于转台相位中心的具体位置、与所述探测天线之间的实际距离，得到测试环境信息；
根据所述测试环境信息，构建所述被测阵列天线相对于所述探测天线的所述阵列响应矩阵。
此外，在另一个例子中，为了尽可能保证最终确定的目标校准权值的准确性，所述阵列天线的校准装置，还可以包括设备校准模块。
具体而言，所述设备校准模块，用于在所述目标权值确定模块901获取所述被测阵列天线的阵列布局、相对于转台相位中心的具体位置、与所述探测天线之间的实际距离，以得到测试环境信息之前，对所述转台进行寻零校准，并对所述被测阵列天线和所述探测天线之间的平行度和指向偏差进行校准。
此外，在另一个例子中，所述目标权值确定模块，在测试被测阵列天线的天线方向图，得到天线方向图数据矢量时，具体为：
根据所述天线方向图中各空间采样点所处的空间位置，控制固定有所述被测阵列天线的转台转向，并控制信号发射装置发射校准信号，控制信号接收装置接收所述校准信号；
根据所述信号发射装置发射出去的所述校准信号对应的通道幅相和所述信号接收装置接收到的所述校准信号对应的通道幅相，确定当前空间采样点对应的通道幅相误差，并将确定的所述通道幅相误差作为所述当前空间采样点对应的方向图数据；
对于每一个空间采样点，按照上述方式确定对应的通道幅相误差，得到所述天线方向图数据矢量。
此外，在另一个例子中，为了确定计算出的幅相误差是否满足收敛条件，所述阵列天线 的校准装置，还可以包括收敛性判断模块。
具体而言，对于所述被测阵列天线中的每一个阵元，所述收敛性判断模块，用于根据所述幅相误差，确定最大相位波动值和最大幅度波动值；
判断所述最大相位波动值是否不大于所述收敛条件规定的相位误差收敛上限值，且所述最大幅度波动值是否不大于所述收敛条件规定的幅度误差收敛上限值。
相应地，若所述最大相位波动值不大于所述收敛条件规定的相位误差收敛上限值，且所述最大幅度波动值不大于所述收敛条件规定的幅度误差收敛上限值，则确定所述幅相误差满足所述收敛条件。
此外，在另一个例子中，所述阵列天线校准模块902根据所述目标校准权值对所述待校准阵列天线进行校准时，具体为：
在所述待校准阵列天线的使用过程中，接收波束信息，根据所述波束信息生成模拟通道对应的波束赋形权值；
根据所述目标校准权值和所述波束赋形权值，对所述模拟通道的前向信号进行幅相误差补偿处理，实现对所述待校准阵列天线的校准。
此外，在另一个例子中，所述阵列天线校准模块902在根据所述目标校准权值和所述波束赋形权值，对所述模拟通道的前向信号进行幅相误差补偿处理时，具体为：
根据所述目标校准权值，对所述波束赋形权值进行校准，得到目标波束赋形权值；
根据所述目标波束赋形权值，对所述模拟通道的前向信号进行幅相误差补偿处理。
此外，在另一个例子中，所述阵列天线校准模块902，还用于对经所述幅相误差补偿处理后的输出信号进行功率放大处理，生成符合功率要求的射频信号；通过所述待校准阵列天线中的阵元，发送所述射频信号。
不难发现，本实施例为与第一或第二实施例相对应的装置实施例，本实施例可与第一或第二实施例互相配合实施。第一或第二实施例中提到的相关技术细节在本实施例中依然有效，为了减少重复，这里不再赘述。相应地，本实施例中提到的相关技术细节也可应用在第一或第二实施例中。
值得一提的是，本实施例中所涉及到的各模块均为逻辑模块，在实际应用中，一个逻辑单元可以是一个物理单元，也可以是一个物理单元的一部分，还可以以多个物理单元的组合实现。此外，为了突出本申请的创新部分，本实施例中并没有将与解决本申请所提出的技术问题关系不太密切的单元引入，但这并不表明本实施例中不存在其它的单元。
本申请的第四实施例涉及一种计算机可读存储介质，存储有计算机程序。计算机程序被处理器执行时实现上述方法实施例所描述的阵列天线的校准方法。该计算机可读存储介质包括在用于存储信息(诸如计算机可读指令、数据结构、计算机程序模块或其他数据)的任何方法或技术中实施的暂态性或非暂态性、可移除或不可移除的介质。
即，本领域技术人员可以理解，实现上述实施例方法中的全部或部分步骤是可以通过程序来指令相关的硬件来完成，该程序存储在一个中，包括若干指令用以使得一个设备(可以是单片机，芯片等)或处理器(processor)执行本申请各个实施例所述方法的全部或部分步骤。而前述的包括：U盘、移动硬盘、只读存储器(ROM，Read-Only Memory)、随机存取存储器(RAM，Random Access Memory)、磁碟或者光盘等各种可以存储程序代码的介质。
本领域的技术人员应该明白，上文中所公开方法中的全部或某些步骤、系统、装置中的功能模块/单元可以被实施为软件(可以用计算装置可执行的计算机程序代码来实现)、固件、硬件及其适当的组合。在硬件实施方式中，在以上描述中提及的功能模块/单元之间的划分不一定对应于物理组件的划分；例如，一个物理组件可以具有多个功能，或者一个功能或步骤可以由若干物理组件合作执行。某些物理组件或所有物理组件可以被实施为由处理器，如中央处理器、数字信号处理器或微处理器执行的软件，或者被实施为硬件，或者被实施为集成电路，如专用集成电路。
本领域的普通技术人员可以理解，上述各实施例是实现本申请的具体实施例，而在实际应用中，可以在形式上和细节上对其作各种改变，而不偏离本申请的精神和范围。
Claims (10)
- 一种阵列天线的校准方法，包括：构建被测阵列天线相对于探测天线的阵列响应矩阵；测试被测阵列天线的天线方向图，得到天线方向图数据矢量；根据所述阵列响应矩阵和所述天线方向图数据矢量，计算所述被测阵列天线中每一个阵元的带耦合的通道幅相误差，得到所述被测阵列天线中每一个阵元的幅相误差；在相邻两次校准测试得到的所述幅相误差均满足预设的收敛条件时，结束测试，并根据相邻两次校准测试得到的所述幅相误差，确定目标校准权值；根据所述目标校准权值对所述待校准阵列天线进行校准。
- 如权利要求1所述的阵列天线的校准方法，其中，所述构建被测阵列天线相对于探测天线的阵列响应矩阵，包括：获取所述被测阵列天线的阵列布局、相对于转台相位中心的具体位置、与所述探测天线之间的实际距离，得到测试环境信息；根据所述测试环境信息，构建所述被测阵列天线相对于所述探测天线的所述阵列响应矩阵。
- 如权利要求2所述的阵列天线的校准方法，其中，在所述获取所述被测阵列天线的阵列布局、相对于转台相位中心的具体位置、与所述探测天线之间的实际距离，得到测试环境信息之前，所述方法还包括：对所述转台进行寻零校准，并对所述被测阵列天线和所述探测天线之间的平行度和指向偏差进行校准。
- 如权利要求1所述的阵列天线的校准方法，其中，测试被测阵列天线的天线方向图，得到天线方向图数据矢量，包括：根据所述天线方向图中各空间采样点所处的空间位置，控制固定有所述被测阵列天线的转台转向，并控制信号发射装置发射校准信号，控制信号接收装置接收所述校准信号；根据所述信号发射装置发射出去的所述校准信号对应的通道幅相和所述信号接收装置接收到的所述校准信号对应的通道幅相，确定当前空间采样点对应的通道幅相误差，并将确定的所述通道幅相误差作为所述当前空间采样点对应的方向图数据；对于每一个空间采样点，按照上述方式确定对应的通道幅相误差，得到所述天线方向图数据矢量。
- 如权利要求1所述的阵列天线的校准方法，其中，在所述根据所述阵列响应矩阵和所述天线方向图数据矢量，计算所述被测阵列天线中每一个阵元的带耦合的通道幅相误差，得到所述被测阵列天线中每一个阵元的幅相误差之后，所述方法还包括：对于所述被测阵列天线中的每一个阵元，根据所述幅相误差，确定最大相位波动值和最大幅度波动值；判断所述最大相位波动值是否不大于所述收敛条件规定的相位误差收敛上限值，且所述最大幅度波动值是否不大于所述收敛条件规定的幅度误差收敛上限值；若是，则确定所述幅相误差满足所述收敛条件。
- 如权利要求1至5中任一项所述的阵列天线的校准方法，其中，所述根据所述目标校准权值对所述待校准阵列天线进行校准，包括：在所述待校准阵列天线的使用过程中，接收波束信息，根据所述波束信息生成模拟通道对应的波束赋形权值；根据所述目标校准权值和所述波束赋形权值，对所述模拟通道的前向信号进行幅相误差补偿处理，实现对所述待校准阵列天线的校准。
- 如权利要求6所述的阵列天线的校准方法，其中，所述根据所述目标校准权值和所述波束赋形权值，对所述模拟通道的前向信号进行幅相误差补偿处理，包括：根据所述目标校准权值，对所述波束赋形权值进行校准，得到目标波束赋形权值；根据所述目标波束赋形权值，对所述模拟通道的前向信号进行幅相误差补偿处理。
- 如权利要求6所述的阵列天线的校准方法，其中，在所述根据所述目标校准权值和所述波束赋形权值，对所述模拟通道的前向信号进行幅相误差补偿处理之后，所述方法还包括：对经所述幅相误差补偿处理后的输出信号进行功率放大处理，生成符合功率要求的射频信号；通过所述待校准阵列天线中的阵元，发送所述射频信号。
- 一种阵列天线的校准装置，包括：目标校准权值确定模块和阵列天线校准模块；所述目标校准权值确定模块，用于构建被测阵列天线相对于探测天线的阵列响应矩阵；所述目标校准权值确定模块，还用于测试被测阵列天线的天线方向图，得到天线方向图数据矢量；所述目标校准权值确定模块，还用于根据所述阵列响应矩阵和所述天线方向图数据矢量，计算所述被测阵列天线中每一个阵元的带耦合的通道幅相误差，得到所述被测阵列天线中每一个阵元的幅相误差；所述目标校准权值确定模块，还用于在相邻两次校准测试得到的所述幅相误差满足预设的收敛条件时，结束测试，并根据相邻两次校准测试得到的所述幅相误差，确定目标校准权值；所述阵列天线校准模块，用于根据所述目标校准权值对所述待校准阵列天线进行校准。
- 一种计算机可读存储介质，存储有计算机程序，所述计算机程序被处理器执行时实现权利要求1至8中任一项所述的阵列天线的校准方法。
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| CN114865313A (zh) * | 2022-05-18 | 2022-08-05 | 中国电子科技集团公司第三十八研究所 | 一种运动载体相控阵天线动态校正系统 |
| CN114966238A (zh) * | 2022-07-27 | 2022-08-30 | 陕西拾贝通讯技术有限公司 | 一种天线相位中心的自动检测与对准方法 |
| CN115207629A (zh) * | 2022-07-21 | 2022-10-18 | 中国信息通信研究院 | 5g大规模阵列天线的幅相校准方法 |
| CN115575934A (zh) * | 2022-12-08 | 2023-01-06 | 中国西安卫星测控中心 | 一种适用于大规模相控阵的距离零值标定方法 |
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| CN117233716A (zh) * | 2023-11-16 | 2023-12-15 | 中科亿海微电子科技（苏州）有限公司 | 一种星载相控阵天线波束控制及测试一体化方法和装置 |
| CN117805722A (zh) * | 2024-02-28 | 2024-04-02 | 上海银基信息安全技术股份有限公司 | Aoa校准、计算方法及装置、定位设备及存储介质 |
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| CN114865313A (zh) * | 2022-05-18 | 2022-08-05 | 中国电子科技集团公司第三十八研究所 | 一种运动载体相控阵天线动态校正系统 |
| CN114865313B (zh) * | 2022-05-18 | 2024-05-28 | 中国电子科技集团公司第三十八研究所 | 一种运动载体相控阵天线动态校正系统 |
| CN115207629A (zh) * | 2022-07-21 | 2022-10-18 | 中国信息通信研究院 | 5g大规模阵列天线的幅相校准方法 |
| CN115207629B (zh) * | 2022-07-21 | 2024-04-12 | 中国信息通信研究院 | 5g大规模阵列天线的幅相校准方法 |
| CN114966238A (zh) * | 2022-07-27 | 2022-08-30 | 陕西拾贝通讯技术有限公司 | 一种天线相位中心的自动检测与对准方法 |
| CN115575934A (zh) * | 2022-12-08 | 2023-01-06 | 中国西安卫星测控中心 | 一种适用于大规模相控阵的距离零值标定方法 |
| CN116973639A (zh) * | 2023-07-31 | 2023-10-31 | 青岛空天电子信息技术研究院有限公司 | 一种基于大数据的紧缩场检测环境管控系统 |
| CN116827454A (zh) * | 2023-08-30 | 2023-09-29 | 北京星河动力装备科技有限公司 | 相控阵天线及其校准方法、运载火箭 |
| CN116827454B (zh) * | 2023-08-30 | 2024-01-09 | 北京星河动力装备科技有限公司 | 相控阵天线及其校准方法、运载火箭 |
| CN117233716A (zh) * | 2023-11-16 | 2023-12-15 | 中科亿海微电子科技（苏州）有限公司 | 一种星载相控阵天线波束控制及测试一体化方法和装置 |
| CN117233716B (zh) * | 2023-11-16 | 2024-03-15 | 中科亿海微电子科技（苏州）有限公司 | 一种星载相控阵天线波束控制及测试一体化方法和装置 |
| CN117805722A (zh) * | 2024-02-28 | 2024-04-02 | 上海银基信息安全技术股份有限公司 | Aoa校准、计算方法及装置、定位设备及存储介质 |
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