WO2022021855A1 - Impedance matching apparatus and method for pcb wiring of solid state drive, device and medium - Google Patents

Impedance matching apparatus and method for pcb wiring of solid state drive, device and medium Download PDF

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Publication number
WO2022021855A1
WO2022021855A1 PCT/CN2021/076945 CN2021076945W WO2022021855A1 WO 2022021855 A1 WO2022021855 A1 WO 2022021855A1 CN 2021076945 W CN2021076945 W CN 2021076945W WO 2022021855 A1 WO2022021855 A1 WO 2022021855A1
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impedance
impedance value
ddr
line width
string
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PCT/CN2021/076945
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French (fr)
Chinese (zh)
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郭丹萍
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苏州浪潮智能科技有限公司
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    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F30/00Computer-aided design [CAD]
    • G06F30/30Circuit design
    • G06F30/39Circuit design at the physical level
    • G06F30/394Routing
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F30/00Computer-aided design [CAD]
    • G06F30/30Circuit design
    • G06F30/39Circuit design at the physical level
    • G06F30/398Design verification or optimisation, e.g. using design rule check [DRC], layout versus schematics [LVS] or finite element methods [FEM]
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F2115/00Details relating to the type of the circuit
    • G06F2115/12Printed circuit boards [PCB] or multi-chip modules [MCM]

Definitions

  • the present application relates to the technical field of PCB wiring, and in particular, to an impedance matching device, method, electronic device, and computer-readable storage medium for PCB wiring of a solid-state hard disk.
  • SSD Solid State Drive, solid-state drive
  • DDR Double Data Rate, double-rate synchronous dynamic random access memory
  • the main control chip CPU usually It is required to hang many DDR chips to improve its storage performance and read and write speed.
  • the addition of DDR particles will introduce a certain load capacitance to the circuit traces, causing the unit capacitance of the circuit traces to increase and the impedance to decrease, which in turn causes the impedance mismatch of the entire trace before and after the DDR particles are attached, causing signal reflections.
  • DDR Double Data Rate, double-rate synchronous dynamic random access memory
  • the purpose of this application is to provide an impedance matching device, method, electronic device, and computer-readable storage medium for PCB wiring of solid-state hard disks, so as to simply and efficiently solve the problem of wiring impedance mismatch caused by adding DDR particles, thereby improving DDR signal transmission performance.
  • the present application discloses an impedance matching device for PCB wiring of a solid-state hard disk.
  • the solid-state hard disk includes a main control chip and a DDR string connected by a backbone wiring.
  • a plurality of DDR particles connected in series by the trace segments; the impedance matching device includes:
  • the line width calculation module is used to calculate the line width of the corresponding continuous trace according to the input impedance value and stacking parameters;
  • the first line width determination module is used to determine the first impedance value of the trunk line, and use it as the actual impedance value of the DDR string; call the line width calculation module, which will be calculated based on the first impedance value.
  • the first line width of is used as the line width of the trunk line;
  • the impedance matching model is used to output the impedance value range of the continuous trace corresponding to the actual impedance value and having the same length as the total length of each trace segment in the DDR string; the lower limit of the impedance value range value is greater than the actual impedance value;
  • a training module configured to pre-train and generate the impedance matching model according to the impact on the impedance reduction of the continuous wiring after the DDR particles are connected in series;
  • the second line width determination module is used to receive the input second impedance value whose value is within the impedance value range; call the line width calculation module, and use the second line width calculated based on the second impedance value as the line width of the trace segment.
  • the first line width determination module is specifically used for:
  • the calibration module is configured to generate a signal simulation eye diagram according to the input second impedance value, so that the user can adjust the second impedance value according to the effect of the signal simulation eye diagram.
  • the training module is specifically used for:
  • the preset DDR string impedance calculation formula calculate the overall impedance value of the sample DDR string after the DDR particles reduce the trace impedance; according to the continuous trace impedance calculation formula, calculate the total length of each trace segment in the sample DDR string, etc.
  • the associated impedance value of the long continuous trace taking the overall impedance value as an input, and taking the corresponding value range of the associated impedance value as an output, training to generate the DDR string impedance matching model.
  • L and C are the parasitic inductance and parasitic capacitance of the continuous traces of the same length as the total length of each trace segment in the DDR string, respectively; m is the total number of DDR particles; C L is the equivalent capacitance of the DDR particles; X is the length of each trace segment.
  • the stacking parameters include copper foil thickness, sheet dielectric constant and sheet thickness of the PCB board.
  • the present application discloses a method for impedance matching of PCB wiring of a solid-state hard disk.
  • the solid-state hard disk includes a main control chip and a DDR string connected by a backbone wiring, and the DDR string comprises a plurality of wiring segments connected in series. DDR particles; the impedance matching method includes:
  • the impedance matching model is pre-trained and generated based on the impact on the impedance reduction of the continuous wiring after the DDR particles are connected in series.
  • the determining the first impedance value of the trunk line includes:
  • the chip database is queried to obtain the first impedance value corresponding to the model information and the signal type information.
  • the method further includes:
  • a signal simulation eye diagram is generated, so that the user can adjust the second impedance value according to the effect of the signal simulation eye diagram.
  • the training process of the impedance matching model includes:
  • the preset DDR string impedance calculation formula calculate the overall impedance value of the sample DDR string after the DDR particles reduce the trace impedance
  • the DDR string impedance matching model is generated by training.
  • the preset DDR string impedance calculation formula is specifically:
  • L and C are the parasitic inductance and parasitic capacitance of the continuous traces of the same length as the total length of each trace segment in the DDR string, respectively; m is the total number of DDR particles; C L is the equivalent capacitance of the DDR particles; X is the length of each trace segment.
  • the stacking parameters include copper foil thickness, sheet dielectric constant and sheet thickness of the PCB board.
  • the present application also discloses an electronic device, comprising:
  • the processor is configured to execute the computer program to implement the steps of any of the above-mentioned impedance matching methods for PCB traces of the solid-state hard disk.
  • the present application provides an impedance matching device for PCB wiring of a solid-state hard disk.
  • the solid-state hard disk includes a main control chip and a DDR string connected by a backbone wiring, and the DDR string includes a plurality of DDR particles connected in series by wiring segments.
  • the beneficial effects of the impedance matching device, method, electronic device, and computer-readable storage medium for solid-state drive PCB wiring provided by the present application are: the present application considers the impact on the impedance reduction of the continuous wiring after the DDR particles are connected in series, By reasonably adjusting the line width of the trace segments, the impedance value of each trace segment plus each DDR particle, that is, the actual impedance value of the DDR string, is equal to the first impedance value of the backbone trace, thus effectively realizing the entire link.
  • the impedance matching of the DDR signal ensures the integrity and transmission rate of the DDR signal, and improves the signal quality; in addition, the application does not need to add components such as resistors and capacitors, which effectively saves cost and layout space, and is efficient and convenient.
  • FIG. 1 is a structural block diagram of an impedance matching device for a PCB wiring of a solid-state hard disk disclosed in an embodiment of the application;
  • FIG. 2 is a schematic circuit diagram of a solid-state hard disk disclosed in an embodiment of the present application
  • FIG. 3 is a flowchart of a method for impedance matching of a solid-state drive PCB wiring disclosed in an embodiment of the present application
  • FIG. 4 is a flowchart of a training method for an impedance matching module disclosed in an embodiment of the present application
  • FIG. 5 is a structural block diagram of an electronic device disclosed in an embodiment of the present application.
  • the core of the present application is to provide an impedance matching device, method, electronic device and computer-readable storage medium for PCB traces of solid-state drives, so as to simply and efficiently solve the problem of trace impedance mismatch caused by adding DDR particles, thereby improving DDR signal transmission performance.
  • SSD Solid State Drive, solid state drive
  • DDR Double Data Rate, double-rate synchronous dynamic random access memory
  • the main control chip CPU usually It is required to hang many DDR chips to improve its storage performance and read and write speed.
  • the addition of DDR particles will introduce a certain load capacitance to the circuit traces, causing the unit capacitance of the circuit traces to increase and the impedance to decrease, which in turn causes the impedance mismatch of the entire trace before and after the DDR particles are mounted, causing signal reflections.
  • the present application provides an impedance matching solution for PCB wiring of a solid-state hard disk, which can effectively solve the above problems.
  • an embodiment of the present application discloses an impedance matching device for PCB wiring of a solid-state hard disk.
  • the solid-state hard disk includes a main control chip and a DDR string connected by backbone wires, as shown in FIG. 2 for details.
  • the DDR string includes a plurality of DDR particles connected in series by wiring segments.
  • A represents the backbone wiring
  • A1, A2, ..., An represent n wiring segments respectively
  • DDR0, DDR1, ..., DDRn represent n+1 DDR particles, respectively.
  • the impedance matching device provided by this application, as shown in Figure 1, mainly includes:
  • the line width calculation module 101 is used to calculate the line width of the corresponding continuous wiring according to the input impedance value and the stacking parameters;
  • the impedance matching model 103 is used to output the impedance value range of the continuous trace corresponding to the actual impedance value and having the same length as the total length of each trace segment in the DDR string; the lower limit of the impedance value range is greater than the actual impedance value ;
  • the training module 104 is used for pre-training and generating the impedance matching model 103 according to the impact on the impedance reduction of the continuous wiring after the DDR particles are connected in series;
  • the second line width determination module 105 is used to receive the input second impedance value whose value is within the impedance value range; the line width calculation module 101 is called, and the second line width calculated based on the second impedance value is used as the line segment line width.
  • the impedance matching device for the PCB traces of the solid-state hard disk takes into account the impact of the DDR particle load on the impedance of the entire DDR trace, so the line width of the trace segment is adjusted to make it different from the main trace.
  • the line width is used to balance the influence of the DDR load on the trace impedance.
  • the line width and stacking parameters are PCB traces that do not include other components (such as DDR particles) and are continuously routed. Therefore, when the impedance value and stacking parameters are known, the line width of the corresponding continuous trace can also be determined.
  • the line width calculation module 101 in the present application can calculate the line width of the corresponding continuous trace according to the input impedance value and stacking parameters.
  • the stacking parameters may specifically include the thickness of the copper foil of the PCB board, the dielectric constant of the board, and the thickness of the board.
  • the first line width determination module 102 is mainly used to determine the line width of the trunk line, that is, the first line width. Specifically, the first impedance value of the trunk line can be determined according to actual application requirements, and further, by calling the line width calculation module 101, the line width of the trunk line can be calculated. In addition, in order to achieve impedance matching, the actual impedance value of the entire DDR should be equal to the first impedance value of the trunk line.
  • the second line width determination module 105 is mainly used to determine the line width of the trace segment, that is, the second line width. It should be emphasized that since the introduction of DDR particles will reduce the impedance of the traces, compared with the continuous traces of equal length, the total impedance value of each trace segment in the DDR string with each DDR particle attached, that is, its The actual impedance value should be small. And because the line width calculation module 101 is only suitable for calculating the line width of the continuous line according to the impedance value, the application needs to imagine that the ends of each line in the DDR string are spliced together to form a line without DDR particles.
  • the line width of the imaginary continuous line can be calculated by calling the line width calculation module 101, that is, the line width of the imaginary continuous line.
  • the line width of the line segment is the key to solving the mismatch in impedance reduction caused by the introduction of DDR particles, and is also the key to the technical problem solved by the present application.
  • the impedance matching model 103 in the present application is just used to provide the impedance value range of the second impedance value.
  • the first impedance value that is, the actual impedance value is smaller than the second impedance value. Therefore, the lower limit of the impedance value range of the second impedance value is larger than the actual impedance value.
  • a large amount of sample data can be obtained in advance, and these sample data can be used to reflect and analyze the impact of the impedance reduction on the continuous traces after the DDR chips are connected in series, and then the impedance matching model 103 can be trained and generated based on the large amount of sample data, so as to According to the actual impedance value of the DDR string, the corresponding imaginary continuous line impedance value range can be given.
  • each routing segment is the same. For example, if there are n trace segments, and the length of each trace segment is X, the length of the imaginary continuous trace corresponding to the DDR string is n ⁇ X.
  • the impedance matching model 103 can perform matching output according to these specific conditions.
  • the user can determine the size of the second impedance value within the given impedance value range, and then the second line width determination module 105 can call the line width calculation module 101 to calculate the second line width as the line width of the trace segment.
  • the solid-state hard disk includes a main control chip and a DDR string connected by a backbone wiring, and the DDR string includes a plurality of DDR particles connected in series by wiring segments;
  • the impedance matching The device includes: a line width calculation module 101 for calculating the line width of a corresponding continuous line according to the input impedance value and stacking parameters; a first line width determination module 102 for determining the first impedance value of the trunk line, and use it as the actual impedance value of the DDR string; call the line width calculation module 101, and use the first line width calculated based on the first impedance value as the line width of the trunk line; the impedance matching model 103 is used for outputting corresponding to the actual impedance value
  • the impedance value range of the continuous trace that is equal to the total length of each trace segment in the DDR string; the lower limit of the impedance value range is greater than the actual impedance value; the
  • the impedance matching device for the PCB wiring of the solid-state hard disk provided by this application, considering the impact on the impedance reduction of the continuous wiring after the DDR particles are connected in series, the line width of the wiring segment is reasonably adjusted, so that each wiring segment adds
  • the impedance value after each DDR particle that is, the actual impedance value of the DDR string, is equal to the first impedance value of the trunk line, thus effectively realizing the impedance matching of the entire link, ensuring the integrity and transmission rate of the DDR signal, and improving the Signal quality; in addition, the application does not need to add components such as resistors, capacitors, etc., which effectively saves cost and layout space, and is efficient and convenient.
  • the first line width determination module 102 is specifically used for:
  • the signal types can be specifically classified into data signals, control signals, and clock signals.
  • the impedance matching device for the PCB wiring of the solid-state disk disclosed in the embodiment of the present application further includes: a calibration module, configured to generate a signal artificial eye according to the input second impedance value diagram, so that the user can adjust the second impedance value according to the effect of the signal simulation eye diagram.
  • a calibration module is also provided, so that the user can adjust the value of the second impedance value for multiple times, so as to improve the impedance Matching accuracy.
  • the calibration module is also used to provide a corresponding signal simulation eye diagram, so as to measure the effect of impedance matching through the signal quality.
  • the preset DDR string impedance calculation formula calculate the overall impedance value of the sample DDR string after the DDR particles reduce the trace impedance; The associated impedance value of the continuous trace; the overall impedance value is used as input, and the range of the corresponding associated impedance value is used as the output to train and generate the DDR string impedance matching model 103 .
  • the preset DDR string impedance calculation formula is specifically:
  • L and C are the parasitic inductance and parasitic capacitance of the continuous traces of the same length as the total length of each trace segment in the DDR string, respectively; m is the total number of DDR particles; C L is the equivalent capacitance of DDR particles; X is each The length of a trace segment.
  • an embodiment of the present application further discloses an impedance matching method for PCB wiring of a solid-state hard disk.
  • the solid-state hard disk includes a main control chip and a DDR string connected by backbone wires, and the DDR string includes a plurality of DDR particles connected in series by wire segments.
  • the impedance matching method provided by this application includes:
  • S201 Determine the first impedance value of the trunk line and use it as the actual impedance value of the DDR string.
  • S203 Invoke the impedance matching model, and output the impedance value range of the continuous trace corresponding to the actual impedance value and equal to the total length of each trace segment in the DDR string; the lower limit of the impedance value range is greater than the actual impedance value .
  • the impedance matching model is pre-trained and generated based on the impact on the impedance reduction of the continuous wiring after the DDR particles are connected in series.
  • S204 Receive an input second impedance value whose value is within an impedance value range.
  • S205 Use the second line width of the continuous line calculated based on the second impedance value and the stacking parameter as the line width of the line segment.
  • the impedance matching method for the PCB traces of the solid-state hard disk takes into account the impact on the impedance reduction of the continuous traces after the DDR particles are connected in series.
  • the impedance value after each DDR particle that is, the actual impedance value of the DDR string, is equal to the first impedance value of the trunk line, thus effectively realizing the impedance matching of the entire link, ensuring the integrity and transmission rate of the DDR signal, and improving the Signal quality; in addition, the application does not need to add components such as resistors, capacitors, etc., which effectively saves cost and layout space, and is efficient and convenient.
  • the impedance matching method for the PCB wiring of the solid-state hard disk determines the first impedance value of the main wiring on the basis of the above content, including:
  • the chip database is queried to obtain the first impedance value corresponding to the model information and the signal type information.
  • the impedance matching method for the PCB wiring of the solid-state hard disk is based on the above content, and after receiving the input second impedance value whose value is within the impedance value range, Also includes:
  • a signal simulation eye diagram is generated, so that the user can adjust the second impedance value according to the effect of the signal simulation eye diagram.
  • the impedance matching method for the PCB routing of the solid-state hard disk provided by the embodiment of the present application is based on the above content, and the training process of the impedance matching model can be specifically referred to FIG. 4, which mainly includes the following steps:
  • preset DDR string impedance calculation formula is specifically:
  • the impedance matching method of the solid-state drive PCB trace provided by the embodiment of the present application is based on the above content, and the stacking parameters include the copper foil thickness of the PCB board, the dielectric constant of the board, and the board thickness.
  • an electronic device including:
  • memory 401 for storing computer programs
  • the processor 402 is configured to execute the computer program to implement the steps of any of the above-mentioned impedance matching methods for PCB traces of the solid-state hard disk.
  • an embodiment of the present application also discloses a computer-readable storage medium, where a computer program is stored in the computer-readable storage medium, and the computer program is used to implement any of the above when executed by a processor.

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Abstract

An impedance matching apparatus and method for a PCB wiring of a solid state drive, an electronic device and a computer-readable storage medium. Said apparatus comprises: a line width calculation module, configured to calculate the line width of a continuous wiring according to an impedance value; a first line width determination module, configured to determine a first impedance value of a main wiring, take same as an actual impedance value of a DDR string, and invoke the line width calculation module to determine the line width of the main wiring according to the first impedance value; an impedance matching model, configured to output an impedance value range of the continuous wiring having the same length as the total length of all wiring segments in the DDR string, a lower limit value of the impedance value range being greater than the actual impedance value; a training module, configured to pre-train to generate the impedance matching model; and a second line width determination module, configured to receive a second impedance value which is within the impedance value range, and invoke the line width calculation module to determine the line width of the wiring segments on the basis of the second impedance value. Said apparatus effectively achieves impedance matching, improves signal quality, and is efficient and simple.

Description

固态硬盘PCB走线的阻抗匹配装置、方法、设备及介质Impedance matching device, method, device and medium for solid-state hard disk PCB traces
本申请要求于2020年07月30日提交中国专利局、申请号为CN202010751225.6、发明名称为“固态硬盘PCB走线的阻抗匹配装置、方法、设备及介质”的中国专利申请的优先权,其全部内容通过引用结合在本申请中。This application claims the priority of the Chinese patent application filed on July 30, 2020, with the application number CN202010751225.6 and the invention titled "An Impedance Matching Device, Method, Equipment and Medium for PCB Routing of Solid State Disks", The entire contents of which are incorporated herein by reference.
技术领域technical field
本申请涉及PCB布线技术领域,特别涉及一种固态硬盘PCB走线的阻抗匹配装置、方法、电子设备及计算机可读存储介质。The present application relates to the technical field of PCB wiring, and in particular, to an impedance matching device, method, electronic device, and computer-readable storage medium for PCB wiring of a solid-state hard disk.
背景技术Background technique
在电子存储领域中,SSD(Solid State Drive,固态硬盘)的应用极其广泛。随着DDR(Double Data Rate,双倍速率同步动态随机存储器)传输速率的越来越快和市场对SSD的容量需求越来越高,目前市场中的SSD产品中,其主控芯片CPU通常会被要求挂很多个DDR颗粒来提升其存储性能和读写速度。而DDR颗粒的加入会给电路走线上引入一定的负载电容,引起电路走线的单位电容增加、阻抗降低,进而导致整条走线在挂上DDR颗粒前后的阻抗不匹配,引起信号反射,严重影响DDR信号的完整性,导致DDR速率等性能无法达到预期要求。In the field of electronic storage, SSD (Solid State Drive, solid-state drive) is extremely widely used. With the increasing transmission rate of DDR (Double Data Rate, double-rate synchronous dynamic random access memory) and the market's increasing demand for SSD capacity, in the current SSD products in the market, the main control chip CPU usually It is required to hang many DDR chips to improve its storage performance and read and write speed. The addition of DDR particles will introduce a certain load capacitance to the circuit traces, causing the unit capacitance of the circuit traces to increase and the impedance to decrease, which in turn causes the impedance mismatch of the entire trace before and after the DDR particles are attached, causing signal reflections. Seriously affect the integrity of the DDR signal, resulting in the performance of the DDR rate and other performance cannot meet the expected requirements.
鉴于此,提供一种解决上述技术问题的方案,已经是本领域技术人员所亟需关注的。In view of this, providing a solution to the above-mentioned technical problems is an urgent need for those skilled in the art.
发明内容SUMMARY OF THE INVENTION
本申请的目的在于提供一种固态硬盘PCB走线的阻抗匹配装置、方法、电子设备及计算机可读存储介质,以便简便高效地解决因加入DDR颗粒导致的走线阻抗不匹配问题,进而提高DDR信号的传输性能。The purpose of this application is to provide an impedance matching device, method, electronic device, and computer-readable storage medium for PCB wiring of solid-state hard disks, so as to simply and efficiently solve the problem of wiring impedance mismatch caused by adding DDR particles, thereby improving DDR signal transmission performance.
为解决上述技术问题,第一方面,本申请公开了一种固态硬盘PCB走线的阻抗匹配装置,所述固态硬盘包括通过主干走线连接的主控芯片和DDR串,所述DDR串包括由走线片段串连的多个DDR颗粒;所述阻抗 匹配装置包括:In order to solve the above technical problems, in the first aspect, the present application discloses an impedance matching device for PCB wiring of a solid-state hard disk. The solid-state hard disk includes a main control chip and a DDR string connected by a backbone wiring. A plurality of DDR particles connected in series by the trace segments; the impedance matching device includes:
线宽计算模块,用于根据输入的阻抗值和叠层参数计算对应的连续走线的线宽;The line width calculation module is used to calculate the line width of the corresponding continuous trace according to the input impedance value and stacking parameters;
第一线宽确定模块,用于确定所述主干走线的第一阻抗值,并作为所述DDR串的实际阻抗值;调用所述线宽计算模块,将基于所述第一阻抗值计算得到的第一线宽作为所述主干走线的线宽;The first line width determination module is used to determine the first impedance value of the trunk line, and use it as the actual impedance value of the DDR string; call the line width calculation module, which will be calculated based on the first impedance value. The first line width of is used as the line width of the trunk line;
阻抗匹配模型,用于输出与所述实际阻抗值对应的、与所述DDR串中各走线片段的总长度等长的连续走线的阻抗取值范围;所述阻抗取值范围的下限值大于所述实际阻抗值;The impedance matching model is used to output the impedance value range of the continuous trace corresponding to the actual impedance value and having the same length as the total length of each trace segment in the DDR string; the lower limit of the impedance value range value is greater than the actual impedance value;
训练模块,用于根据串接DDR颗粒后对连续走线的阻抗降低影响而预先训练生成所述阻抗匹配模型;a training module, configured to pre-train and generate the impedance matching model according to the impact on the impedance reduction of the continuous wiring after the DDR particles are connected in series;
第二线宽确定模块,用于接收输入的、取值在所述阻抗取值范围内的第二阻抗值;调用所述线宽计算模块,将基于所述第二阻抗值计算得到的第二线宽作为所述走线片段的线宽。The second line width determination module is used to receive the input second impedance value whose value is within the impedance value range; call the line width calculation module, and use the second line width calculated based on the second impedance value as the line width of the trace segment.
可选地,所述第一线宽确定模块具体用于:Optionally, the first line width determination module is specifically used for:
接收输入的所述主控芯片的型号信息和信号类型信息;查询芯片资料库以获取与所述型号信息和所述信号类型信息对应的所述第一阻抗值。Receive the input model information and signal type information of the main control chip; query a chip database to obtain the first impedance value corresponding to the model information and the signal type information.
可选地,还包括:Optionally, also include:
校准模块,用于根据输入的所述第二阻抗值,生成信号仿真眼图,以便用户根据信号仿真眼图的效果调整所述第二阻抗值。The calibration module is configured to generate a signal simulation eye diagram according to the input second impedance value, so that the user can adjust the second impedance value according to the effect of the signal simulation eye diagram.
可选地,所述训练模块具体用于:Optionally, the training module is specifically used for:
根据预设DDR串阻抗计算公式,计算样本DDR串在DDR颗粒降低走线阻抗后的整体阻抗值;根据连续走线阻抗计算公式,计算与所述样本DDR串中各走线片段的总长度等长的连续走线的关联阻抗值;以所述整体阻抗值为输入,以对应的所述关联阻抗值的取值范围为输出,训练生成所述DDR串阻抗匹配模型。According to the preset DDR string impedance calculation formula, calculate the overall impedance value of the sample DDR string after the DDR particles reduce the trace impedance; according to the continuous trace impedance calculation formula, calculate the total length of each trace segment in the sample DDR string, etc. The associated impedance value of the long continuous trace; taking the overall impedance value as an input, and taking the corresponding value range of the associated impedance value as an output, training to generate the DDR string impedance matching model.
可选地,所述预设DDR串阻抗计算公式具体为:Optionally, the preset DDR string impedance calculation formula is specifically:
Figure PCTCN2021076945-appb-000001
Figure PCTCN2021076945-appb-000001
其中,L和C分别为与所述DDR串中各走线片段的总长度等长的连续走线的寄生电感和寄生电容;m为DDR颗粒总数;C L为DDR颗粒的等效电容;X为每个走线片段的长度。 Wherein, L and C are the parasitic inductance and parasitic capacitance of the continuous traces of the same length as the total length of each trace segment in the DDR string, respectively; m is the total number of DDR particles; C L is the equivalent capacitance of the DDR particles; X is the length of each trace segment.
可选地,所述层叠参数包括PCB板的铜箔厚度、板材介电常数和板材厚度。Optionally, the stacking parameters include copper foil thickness, sheet dielectric constant and sheet thickness of the PCB board.
第二方面,本申请公开了一种固态硬盘PCB走线的阻抗匹配方法,所述固态硬盘包括通过主干走线连接的主控芯片和DDR串,所述DDR串包括由走线片段串联的多个DDR颗粒;所述阻抗匹配方法包括:In a second aspect, the present application discloses a method for impedance matching of PCB wiring of a solid-state hard disk. The solid-state hard disk includes a main control chip and a DDR string connected by a backbone wiring, and the DDR string comprises a plurality of wiring segments connected in series. DDR particles; the impedance matching method includes:
确定所述主干走线的第一阻抗值,并作为所述DDR串的实际阻抗值;determining the first impedance value of the trunk line as the actual impedance value of the DDR string;
将基于所述第一阻抗值和叠层参数计算得到的连续走线的第一线宽作为所述主干走线的线宽;Taking the first line width of the continuous wiring calculated based on the first impedance value and the stacking parameters as the line width of the trunk wiring;
调用阻抗匹配模型,输出与所述实际阻抗值对应的、与所述DDR串中各走线片段的总长度等长的连续走线的阻抗取值范围;所述阻抗取值范围的下限值大于所述实际阻抗值;Invoke the impedance matching model, and output the impedance value range of the continuous trace corresponding to the actual impedance value and equal to the total length of each trace segment in the DDR string; the lower limit of the impedance value range greater than the actual impedance value;
接收输入的、取值在所述阻抗取值范围内的第二阻抗值;receiving an input second impedance value whose value is within the impedance value range;
将基于所述第二阻抗值和所述叠层参数计算得到的连续走线的第二线宽作为所述走线片段的线宽;Using the second line width of the continuous trace calculated based on the second impedance value and the stacking parameter as the line width of the trace segment;
其中,所述阻抗匹配模型基于串接DDR颗粒后对连续走线的阻抗降低影响而预先训练生成。Wherein, the impedance matching model is pre-trained and generated based on the impact on the impedance reduction of the continuous wiring after the DDR particles are connected in series.
可选地,所述确定所述主干走线的第一阻抗值,包括:Optionally, the determining the first impedance value of the trunk line includes:
接收输入的所述主控芯片的型号信息和信号类型信息;Receive the input model information and signal type information of the main control chip;
查询芯片资料库以获取与所述型号信息和所述信号类型信息对应的所述第一阻抗值。The chip database is queried to obtain the first impedance value corresponding to the model information and the signal type information.
可选地,在所述接收输入的、取值在所述阻抗取值范围内的第二阻抗值之后,还包括:Optionally, after receiving the input second impedance value whose value is within the impedance value range, the method further includes:
根据输入的所述第二阻抗值,生成信号仿真眼图,以便用户根据信号仿真眼图的效果调整所述第二阻抗值。According to the inputted second impedance value, a signal simulation eye diagram is generated, so that the user can adjust the second impedance value according to the effect of the signal simulation eye diagram.
可选地,所述阻抗匹配模型的训练过程包括:Optionally, the training process of the impedance matching model includes:
根据预设DDR串阻抗计算公式,计算样本DDR串在DDR颗粒降低 走线阻抗后的整体阻抗值;According to the preset DDR string impedance calculation formula, calculate the overall impedance value of the sample DDR string after the DDR particles reduce the trace impedance;
根据连续走线阻抗计算公式,计算与所述样本DDR串中各走线片段的总长度等长的连续走线的关联阻抗值;According to the formula for calculating the impedance of the continuous trace, calculate the associated impedance value of the continuous trace that is equal to the total length of each trace segment in the sample DDR string;
以所述整体阻抗值为输入,以对应的所述关联阻抗值的取值范围为输出,训练生成所述DDR串阻抗匹配模型。Taking the overall impedance value as an input, and taking the corresponding value range of the associated impedance value as an output, the DDR string impedance matching model is generated by training.
可选地,所述预设DDR串阻抗计算公式具体为:Optionally, the preset DDR string impedance calculation formula is specifically:
Figure PCTCN2021076945-appb-000002
Figure PCTCN2021076945-appb-000002
其中,L和C分别为与所述DDR串中各走线片段的总长度等长的连续走线的寄生电感和寄生电容;m为DDR颗粒总数;C L为DDR颗粒的等效电容;X为每个走线片段的长度。 Wherein, L and C are the parasitic inductance and parasitic capacitance of the continuous traces of the same length as the total length of each trace segment in the DDR string, respectively; m is the total number of DDR particles; C L is the equivalent capacitance of the DDR particles; X is the length of each trace segment.
可选地,所述层叠参数包括PCB板的铜箔厚度、板材介电常数和板材厚度。Optionally, the stacking parameters include copper foil thickness, sheet dielectric constant and sheet thickness of the PCB board.
第三方面,本申请还公开了一种电子设备,包括:In a third aspect, the present application also discloses an electronic device, comprising:
存储器,用于存储计算机程序;memory for storing computer programs;
处理器,用于执行所述计算机程序以实现如上所述的任一种固态硬盘PCB走线的阻抗匹配方法的步骤。The processor is configured to execute the computer program to implement the steps of any of the above-mentioned impedance matching methods for PCB traces of the solid-state hard disk.
第四方面,本申请还公开了一种计算机可读存储介质,所述计算机可读存储介质中存储有计算机程序,所述计算机程序被处理器执行时用以实现如上所述的任一种固态硬盘PCB走线的阻抗匹配方法的步骤。In a fourth aspect, the present application also discloses a computer-readable storage medium, where a computer program is stored in the computer-readable storage medium, and when the computer program is executed by a processor, it is used to implement any of the above solid-state The steps of the impedance matching method of the hard disk PCB trace.
本申请提供了一种固态硬盘PCB走线的阻抗匹配装置,所述固态硬盘包括通过主干走线连接的主控芯片和DDR串,所述DDR串包括由走线片段串连的多个DDR颗粒;所述阻抗匹配装置包括:线宽计算模块,用于根据输入的阻抗值和叠层参数计算对应的连续走线的线宽;第一线宽确定模块,用于确定所述主干走线的第一阻抗值,并作为所述DDR串的实际阻抗值;调用所述线宽计算模块,将基于所述第一阻抗值计算得到的第一线宽作为所述主干走线的线宽;阻抗匹配模型,用于输出与所述实际阻抗值对应的、与所述DDR串中各走线片段的总长度等长的连续走线的阻抗取值范围;所述阻抗取值范围的下限值大于所述实际阻抗值;训练模块, 用于根据串接DDR颗粒后对连续走线的阻抗降低影响而预先训练生成所述阻抗匹配模型;第二线宽确定模块,用于接收输入的、取值在所述阻抗取值范围内的第二阻抗值;调用所述线宽计算模块,将基于所述第二阻抗值计算得到的第二线宽作为所述走线片段的线宽。The present application provides an impedance matching device for PCB wiring of a solid-state hard disk. The solid-state hard disk includes a main control chip and a DDR string connected by a backbone wiring, and the DDR string includes a plurality of DDR particles connected in series by wiring segments. ; The impedance matching device includes: a line width calculation module for calculating the line width of the corresponding continuous line according to the input impedance value and the stacking parameters; a first line width determination module for determining the main line The first impedance value is used as the actual impedance value of the DDR string; the line width calculation module is called, and the first line width calculated based on the first impedance value is used as the line width of the trunk line; impedance The matching model is used to output the impedance value range of the continuous traces corresponding to the actual impedance value and having the same length as the total length of each trace segment in the DDR string; the lower limit of the impedance value range is greater than the actual impedance value; a training module is used for pre-training to generate the impedance matching model according to the impact on the impedance reduction of the continuous wiring after the DDR particles are connected in series; the second line width determination module is used for receiving the input value of The second impedance value within the impedance value range; the line width calculation module is invoked, and the second line width calculated based on the second impedance value is used as the line width of the trace segment.
本申请所提供的固态硬盘PCB走线的阻抗匹配装置、方法、电子设备及计算机可读存储介质所具有的有益效果是:本申请考虑到串接DDR颗粒后对连续走线的阻抗降低影响,通过合理调整走线片段的线宽,使得各走线片段加上各DDR颗粒后的阻抗值,即DDR串的实际阻抗值,等于主干走线的第一阻抗值,从而有效实现了整个链路的阻抗匹配,保障了DDR信号的完整性和传输速率,提高了信号质量;此外,本申请无需添加电阻、电容等元器件,有效节约了成本和布局空间,高效且简便。The beneficial effects of the impedance matching device, method, electronic device, and computer-readable storage medium for solid-state drive PCB wiring provided by the present application are: the present application considers the impact on the impedance reduction of the continuous wiring after the DDR particles are connected in series, By reasonably adjusting the line width of the trace segments, the impedance value of each trace segment plus each DDR particle, that is, the actual impedance value of the DDR string, is equal to the first impedance value of the backbone trace, thus effectively realizing the entire link. The impedance matching of the DDR signal ensures the integrity and transmission rate of the DDR signal, and improves the signal quality; in addition, the application does not need to add components such as resistors and capacitors, which effectively saves cost and layout space, and is efficient and convenient.
附图说明Description of drawings
为了更清楚地说明现有技术和本申请实施例中的技术方案,下面将对现有技术和本申请实施例描述中需要使用的附图作简要的介绍。当然,下面有关本申请实施例的附图描述的仅仅是本申请中的一部分实施例,对于本领域普通技术人员来说,在不付出创造性劳动的前提下,还可以根据提供的附图获得其他的附图,所获得的其他附图也属于本申请的保护范围。In order to more clearly illustrate the prior art and the technical solutions in the embodiments of the present application, the following will briefly introduce the drawings to be used in the description of the prior art and the embodiments of the present application. Of course, the following drawings related to the embodiments of the present application describe only a part of the embodiments of the present application. For those of ordinary skill in the art, without any creative effort, they can also obtain other embodiments according to the provided drawings. The accompanying drawings and other drawings obtained also belong to the protection scope of the present application.
图1为本申请实施例公开的一种固态硬盘PCB走线的阻抗匹配装置的结构框图;FIG. 1 is a structural block diagram of an impedance matching device for a PCB wiring of a solid-state hard disk disclosed in an embodiment of the application;
图2为本申请实施例公开的一种固态硬盘的电路示意图;FIG. 2 is a schematic circuit diagram of a solid-state hard disk disclosed in an embodiment of the present application;
图3为本申请实施例公开的一种固态硬盘PCB走线的阻抗匹配方法的流程图;3 is a flowchart of a method for impedance matching of a solid-state drive PCB wiring disclosed in an embodiment of the present application;
图4为本申请实施例公开的一种阻抗匹配模块的训练方法的流程图;4 is a flowchart of a training method for an impedance matching module disclosed in an embodiment of the present application;
图5为本申请实施例公开的一种电子设备的结构框图。FIG. 5 is a structural block diagram of an electronic device disclosed in an embodiment of the present application.
具体实施方式detailed description
本申请的核心在于提供一种固态硬盘PCB走线的阻抗匹配装置、方法、电子设备及计算机可读存储介质,以便简便高效地解决因加入DDR 颗粒导致的走线阻抗不匹配问题,进而提高DDR信号的传输性能。The core of the present application is to provide an impedance matching device, method, electronic device and computer-readable storage medium for PCB traces of solid-state drives, so as to simply and efficiently solve the problem of trace impedance mismatch caused by adding DDR particles, thereby improving DDR signal transmission performance.
为了对本申请实施例中的技术方案进行更加清楚、完整地描述,下面将结合本申请实施例中的附图,对本申请实施例中的技术方案进行介绍。基于本申请中的实施例,本领域普通技术人员在没有做出创造性劳动前提下所获得的所有其他实施例,都属于本申请保护的范围。In order to describe the technical solutions in the embodiments of the present application more clearly and completely, the technical solutions in the embodiments of the present application will be introduced below with reference to the drawings in the embodiments of the present application. Based on the embodiments in the present application, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of the present application.
当前,在电子存储领域中,SSD SSD(Solid State Drive,固态硬盘)的应用极其广泛。随着DDR(Double Data Rate,双倍速率同步动态随机存储器)传输速率的越来越快和市场对SSD的容量需求越来越高,目前市场中的SSD产品中,其主控芯片CPU通常会被要求挂很多个DDR颗粒来提升其存储性能和读写速度。而DDR颗粒的加入会给电路走线上引入一定的负载电容,引起电路走线的单位电容增加、阻抗降低,进而导致整条走线在挂载DDR颗粒前后的阻抗不匹配,引起信号反射,严重影响DDR信号的完整性,导致DDR速率等性能无法达到预期要求。鉴于此,本申请提供了一种固态硬盘PCB走线的阻抗匹配方案,可有效解决上述问题。At present, in the field of electronic storage, SSD (Solid State Drive, solid state drive) is extremely widely used. With the increasing transmission rate of DDR (Double Data Rate, double-rate synchronous dynamic random access memory) and the market's increasing demand for SSD capacity, in the current SSD products in the market, the main control chip CPU usually It is required to hang many DDR chips to improve its storage performance and read and write speed. The addition of DDR particles will introduce a certain load capacitance to the circuit traces, causing the unit capacitance of the circuit traces to increase and the impedance to decrease, which in turn causes the impedance mismatch of the entire trace before and after the DDR particles are mounted, causing signal reflections. Seriously affect the integrity of the DDR signal, resulting in the performance of the DDR rate and other performance cannot meet the expected requirements. In view of this, the present application provides an impedance matching solution for PCB wiring of a solid-state hard disk, which can effectively solve the above problems.
参见图1所示,本申请实施例公开了一种固态硬盘PCB走线的阻抗匹配装置。Referring to FIG. 1 , an embodiment of the present application discloses an impedance matching device for PCB wiring of a solid-state hard disk.
该固态硬盘包括通过主干走线连接的主控芯片和DDR串,具体可参见图2。其中,DDR串包括由走线片段串连的多个DDR颗粒。具体地,在图2中,A表示主干走线;A1、A2、…、An分别表示n个走线片段;DDR0、DDR1、…、DDRn分别表示n+1个DDR颗粒。The solid-state hard disk includes a main control chip and a DDR string connected by backbone wires, as shown in FIG. 2 for details. Wherein, the DDR string includes a plurality of DDR particles connected in series by wiring segments. Specifically, in FIG. 2 , A represents the backbone wiring; A1, A2, ..., An represent n wiring segments respectively; DDR0, DDR1, ..., DDRn represent n+1 DDR particles, respectively.
本申请所提供的阻抗匹配装置,如图1所示,主要包括:The impedance matching device provided by this application, as shown in Figure 1, mainly includes:
线宽计算模块101,用于根据输入的阻抗值和叠层参数计算对应的连续走线的线宽;The line width calculation module 101 is used to calculate the line width of the corresponding continuous wiring according to the input impedance value and the stacking parameters;
第一线宽确定模块102,用于确定主干走线的第一阻抗值,并作为DDR串的实际阻抗值;调用线宽计算模块101,将基于第一阻抗值计算得到的第一线宽作为主干走线的线宽;The first line width determination module 102 is used to determine the first impedance value of the trunk line and use it as the actual impedance value of the DDR string; the line width calculation module 101 is called, and the first line width calculated based on the first impedance value is used as The line width of the trunk line;
阻抗匹配模型103,用于输出与实际阻抗值对应的、与DDR串中各走 线片段的总长度等长的连续走线的阻抗取值范围;阻抗取值范围的下限值大于实际阻抗值;The impedance matching model 103 is used to output the impedance value range of the continuous trace corresponding to the actual impedance value and having the same length as the total length of each trace segment in the DDR string; the lower limit of the impedance value range is greater than the actual impedance value ;
训练模块104,用于根据串接DDR颗粒后对连续走线的阻抗降低影响而预先训练生成阻抗匹配模型103;The training module 104 is used for pre-training and generating the impedance matching model 103 according to the impact on the impedance reduction of the continuous wiring after the DDR particles are connected in series;
第二线宽确定模块105,用于接收输入的、取值在阻抗取值范围内的第二阻抗值;调用线宽计算模块101,将基于第二阻抗值计算得到的第二线宽作为走线片段的线宽。The second line width determination module 105 is used to receive the input second impedance value whose value is within the impedance value range; the line width calculation module 101 is called, and the second line width calculated based on the second impedance value is used as the line segment line width.
具体地,本申请所提供的固态硬盘PCB走线的阻抗匹配装置,考虑到了DDR颗粒负载对DDR走线整条链路的阻抗影响,因而采用调节走线片段的线宽使其不同于主干走线线宽的方式,来均衡DDR负载引入对走线阻抗的影响。Specifically, the impedance matching device for the PCB traces of the solid-state hard disk provided by the present application takes into account the impact of the DDR particle load on the impedance of the entire DDR trace, so the line width of the trace segment is adjusted to make it different from the main trace. The line width is used to balance the influence of the DDR load on the trace impedance.
需要说明的是,对于PCB板上的一条连续走线,影响其等效阻抗的主要因素有线宽和叠层参数。所谓的连续走线,即不包括其他元件(如DDR颗粒)的、连续布线的PCB走线。因而,当阻抗值、叠层参数已知时,其对应的连续走线的线宽也是可以确定的。本申请中的线宽计算模块101可根据输入的阻抗值和叠层参数来计算出对应的连续走线的线宽。It should be noted that, for a continuous trace on the PCB, the main factors affecting its equivalent impedance are the line width and stacking parameters. The so-called continuous traces are PCB traces that do not include other components (such as DDR particles) and are continuously routed. Therefore, when the impedance value and stacking parameters are known, the line width of the corresponding continuous trace can also be determined. The line width calculation module 101 in the present application can calculate the line width of the corresponding continuous trace according to the input impedance value and stacking parameters.
其中,作为一个具体实施例,叠层参数可具体包括PCB板的铜箔厚度、板材介电常数和板材厚度。Wherein, as a specific example, the stacking parameters may specifically include the thickness of the copper foil of the PCB board, the dielectric constant of the board, and the thickness of the board.
第一线宽确定模块102主要用于确定主干走线的线宽,即第一线宽。具体地,主干走线的第一阻抗值可根据实际应用情况的需要而确定,进而,通过调用线宽计算模块101,即可计算出主干走线的线宽。此外,为了实现阻抗匹配,整个DDR的实际阻抗值应当与主干走线的第一阻抗值相等。The first line width determination module 102 is mainly used to determine the line width of the trunk line, that is, the first line width. Specifically, the first impedance value of the trunk line can be determined according to actual application requirements, and further, by calling the line width calculation module 101, the line width of the trunk line can be calculated. In addition, in order to achieve impedance matching, the actual impedance value of the entire DDR should be equal to the first impedance value of the trunk line.
第二线宽确定模块105主要用于确定走线片段的线宽,即第二线宽。需要强调的是,由于DDR颗粒的引入会降低走线的阻抗,因此,相比于等长的连续走线,DDR串中的各走线片段附带上各个DDR颗粒后的总阻抗值,即其实际阻抗值要偏小。而又由于线宽计算模块101仅适合根据阻抗值计算连续走线的线宽,由此,本申请需要先假想把DDR串中的各个走线片端均拼接起来,形成一个不带有DDR颗粒的假想的连续走线,通过给出该假想的连续走线的阻抗值,即第二阻抗值,即可通过调用线宽计 算模块101而计算出该假想的连续走线的线宽,亦即走线片段的线宽。而给出第二阻抗值的合理取值范围,正是解决因DDR颗粒引入导致阻抗降低不匹配的关键所在,也正是本申请所解决的技术问题的关键。The second line width determination module 105 is mainly used to determine the line width of the trace segment, that is, the second line width. It should be emphasized that since the introduction of DDR particles will reduce the impedance of the traces, compared with the continuous traces of equal length, the total impedance value of each trace segment in the DDR string with each DDR particle attached, that is, its The actual impedance value should be small. And because the line width calculation module 101 is only suitable for calculating the line width of the continuous line according to the impedance value, the application needs to imagine that the ends of each line in the DDR string are spliced together to form a line without DDR particles. For an imaginary continuous line, by giving the impedance value of the imaginary continuous line, that is, the second impedance value, the line width of the imaginary continuous line can be calculated by calling the line width calculation module 101, that is, the line width of the imaginary continuous line. The line width of the line segment. Providing a reasonable value range of the second impedance value is the key to solving the mismatch in impedance reduction caused by the introduction of DDR particles, and is also the key to the technical problem solved by the present application.
本申请中的阻抗匹配模型103正是用于提供出第二阻抗值的阻抗取值范围。如前,第一阻抗值亦即实际阻抗值相比于第二阻抗值要偏小,故而,第二阻抗值的阻抗取值范围的下限值要大于实际阻抗值。本申请中,可预先获取大量的样本数据,这些样本数据可体现和用于分析串接DDR颗粒后对连续走线的阻抗降低影响,进而可基于大量的样本数据训练生成阻抗匹配模型103,以便可依据DDR串的实际阻抗值,给出对应的假想的连续走线的阻抗取值范围。The impedance matching model 103 in the present application is just used to provide the impedance value range of the second impedance value. As before, the first impedance value, that is, the actual impedance value is smaller than the second impedance value. Therefore, the lower limit of the impedance value range of the second impedance value is larger than the actual impedance value. In this application, a large amount of sample data can be obtained in advance, and these sample data can be used to reflect and analyze the impact of the impedance reduction on the continuous traces after the DDR chips are connected in series, and then the impedance matching model 103 can be trained and generated based on the large amount of sample data, so as to According to the actual impedance value of the DDR string, the corresponding imaginary continuous line impedance value range can be given.
还需要说明的是,一般各个走线片段的长度均相等。例如,若有n个走线片段,每个走线片段的长度为X,则该DDR串对应的假想的连续走线的长度即为n·X。此外,DDR颗粒的数量、DDR颗粒的等效负载电容、每个走线片段的长度X等参数不同时,所产生的阻抗降低影响的大小不同。因此,阻抗匹配模型103可具体依据这些具体情况进行匹配输出。It should also be noted that, generally, the lengths of each routing segment are the same. For example, if there are n trace segments, and the length of each trace segment is X, the length of the imaginary continuous trace corresponding to the DDR string is n·X. In addition, when parameters such as the number of DDR particles, the equivalent load capacitance of the DDR particles, and the length X of each trace segment are different, the magnitude of the impact of the resulting impedance reduction is different. Therefore, the impedance matching model 103 can perform matching output according to these specific conditions.
用户可以在给出的阻抗取值范围内确定第二阻抗值的大小,进而第二线宽确定模块105可调用线宽计算模块101,计算得到第二线宽,以便作为走线片段的线宽。The user can determine the size of the second impedance value within the given impedance value range, and then the second line width determination module 105 can call the line width calculation module 101 to calculate the second line width as the line width of the trace segment.
本申请所公开的固态硬盘PCB走线的阻抗匹配装置中,固态硬盘包括通过主干走线连接的主控芯片和DDR串,DDR串包括由走线片段串连的多个DDR颗粒;该阻抗匹配装置包括:线宽计算模块101,用于根据输入的阻抗值和叠层参数计算对应的连续走线的线宽;第一线宽确定模块102,用于确定主干走线的第一阻抗值,并作为DDR串的实际阻抗值;调用线宽计算模块101,将基于第一阻抗值计算得到的第一线宽作为主干走线的线宽;阻抗匹配模型103,用于输出与实际阻抗值对应的、与DDR串中各走线片段的总长度等长的连续走线的阻抗取值范围;阻抗取值范围的下限值大于实际阻抗值;训练模块104,用于根据串接DDR颗粒后对连续走线的阻抗降低影响而预先训练生成阻抗匹配模型103;第二线宽确定模块105,用于接收输入的、取值在阻抗取值范围内的第二阻抗值;调用线宽计 算模块101,将基于第二阻抗值计算得到的第二线宽作为走线片段的线宽。In the impedance matching device for the PCB wiring of the solid-state hard disk disclosed in this application, the solid-state hard disk includes a main control chip and a DDR string connected by a backbone wiring, and the DDR string includes a plurality of DDR particles connected in series by wiring segments; the impedance matching The device includes: a line width calculation module 101 for calculating the line width of a corresponding continuous line according to the input impedance value and stacking parameters; a first line width determination module 102 for determining the first impedance value of the trunk line, and use it as the actual impedance value of the DDR string; call the line width calculation module 101, and use the first line width calculated based on the first impedance value as the line width of the trunk line; the impedance matching model 103 is used for outputting corresponding to the actual impedance value The impedance value range of the continuous trace that is equal to the total length of each trace segment in the DDR string; the lower limit of the impedance value range is greater than the actual impedance value; the training module 104 The impedance matching model 103 is generated by pre-training on the impact of the impedance reduction of the continuous trace; the second line width determination module 105 is used to receive the input second impedance value whose value is within the impedance value range; call the line width calculation module 101 , and the second line width calculated based on the second impedance value is used as the line width of the trace segment.
可见,本申请所提供的固态硬盘PCB走线的阻抗匹配装置,考虑到串接DDR颗粒后对连续走线的阻抗降低影响,通过合理调整走线片段的线宽,使得各走线片段加上各DDR颗粒后的阻抗值,即DDR串的实际阻抗值,等于主干走线的第一阻抗值,从而有效实现了整个链路的阻抗匹配,保障了DDR信号的完整性和传输速率,提高了信号质量;此外,本申请无需添加电阻、电容等元器件,有效节约了成本和布局空间,高效且简便。It can be seen that the impedance matching device for the PCB wiring of the solid-state hard disk provided by this application, considering the impact on the impedance reduction of the continuous wiring after the DDR particles are connected in series, the line width of the wiring segment is reasonably adjusted, so that each wiring segment adds The impedance value after each DDR particle, that is, the actual impedance value of the DDR string, is equal to the first impedance value of the trunk line, thus effectively realizing the impedance matching of the entire link, ensuring the integrity and transmission rate of the DDR signal, and improving the Signal quality; in addition, the application does not need to add components such as resistors, capacitors, etc., which effectively saves cost and layout space, and is efficient and convenient.
作为一种具体实施例,本申请实施例所公开的固态硬盘PCB走线的阻抗匹配装置在上述内容的基础上,第一线宽确定模块102具体用于:As a specific embodiment, on the basis of the above-mentioned content, the first line width determination module 102 is specifically used for:
接收输入的主控芯片的型号信息和信号类型信息;查询芯片资料库以获取与型号信息和信号类型信息对应的第一阻抗值。Receive the input model information and signal type information of the main control chip; query the chip database to obtain the first impedance value corresponding to the model information and the signal type information.
具体地,第一线宽确定模块102可内置有芯片资料库,以便通过根据实际应用情况查询芯片资料库来确定主干走线的第一阻抗值。不同芯片、不同的信号类型对阻抗要求不同,相关数据存储在芯片资料库中,并可由具有相关权限的研发人员进行更新维护,防止其他人员误删或修改。Specifically, the first line width determination module 102 may have a built-in chip database, so as to determine the first impedance value of the main line by querying the chip database according to the actual application situation. Different chips and different signal types have different impedance requirements. The relevant data is stored in the chip database, and can be updated and maintained by R&D personnel with relevant authority to prevent other personnel from mistakenly deleting or modifying.
其中,信号类型可具体分为数据信号、控制信号、时钟信号。The signal types can be specifically classified into data signals, control signals, and clock signals.
作为一种具体实施例,本申请实施例所公开的固态硬盘PCB走线的阻抗匹配装置在上述内容的基础上,还包括:校准模块,用于根据输入的第二阻抗值,生成信号仿真眼图,以便用户根据信号仿真眼图的效果调整第二阻抗值。As a specific embodiment, on the basis of the above content, the impedance matching device for the PCB wiring of the solid-state disk disclosed in the embodiment of the present application further includes: a calibration module, configured to generate a signal artificial eye according to the input second impedance value diagram, so that the user can adjust the second impedance value according to the effect of the signal simulation eye diagram.
具体地,由于信号阻抗匹配是很难精确计算、可能需要不断调试的过程,因此,本实施例中,还设置有校准模块,以便用户多次调试更改第二阻抗值的取值,以便提高阻抗匹配精确度。具体地,校准模块还用于提供对应的信号仿真眼图,以便通过信号质量来衡量阻抗匹配的效果。Specifically, since signal impedance matching is a process that is difficult to calculate accurately and may require continuous debugging, in this embodiment, a calibration module is also provided, so that the user can adjust the value of the second impedance value for multiple times, so as to improve the impedance Matching accuracy. Specifically, the calibration module is also used to provide a corresponding signal simulation eye diagram, so as to measure the effect of impedance matching through the signal quality.
作为一种具体实施例,本申请实施例所公开的固态硬盘PCB走线的阻抗匹配装置在上述内容的基础上,训练模块104具体用于:As a specific embodiment, on the basis of the above-mentioned content, the training module 104 is specifically used for:
根据预设DDR串阻抗计算公式,计算样本DDR串在DDR颗粒降低走线阻抗后的整体阻抗值;根据连续走线阻抗计算公式,计算与样本DDR 串中各走线片段的总长度等长的连续走线的关联阻抗值;以整体阻抗值为输入,以对应的关联阻抗值的取值范围为输出,训练生成DDR串阻抗匹配模型103。According to the preset DDR string impedance calculation formula, calculate the overall impedance value of the sample DDR string after the DDR particles reduce the trace impedance; The associated impedance value of the continuous trace; the overall impedance value is used as input, and the range of the corresponding associated impedance value is used as the output to train and generate the DDR string impedance matching model 103 .
进一步地,预设DDR串阻抗计算公式具体为:Further, the preset DDR string impedance calculation formula is specifically:
Figure PCTCN2021076945-appb-000003
Figure PCTCN2021076945-appb-000003
其中,L和C分别为与DDR串中各走线片段的总长度等长的连续走线的寄生电感和寄生电容;m为DDR颗粒总数;C L为DDR颗粒的等效电容;X为每个走线片段的长度。 Among them, L and C are the parasitic inductance and parasitic capacitance of the continuous traces of the same length as the total length of each trace segment in the DDR string, respectively; m is the total number of DDR particles; C L is the equivalent capacitance of DDR particles; X is each The length of a trace segment.
需要说明的是,一般地,走线片段的个数n与DDR颗粒总数m之间的关系为:m=n+1。It should be noted that, generally, the relationship between the number n of wiring segments and the total number m of DDR particles is: m=n+1.
至于连续走线阻抗计算公式,可采用本技术领域内的常规公式,本申请不作限定。As for the formula for calculating the impedance of the continuous trace, a conventional formula in the technical field can be used, which is not limited in this application.
参见图3所示,本申请实施例还公开了一种固态硬盘PCB走线的阻抗匹配方法。Referring to FIG. 3 , an embodiment of the present application further discloses an impedance matching method for PCB wiring of a solid-state hard disk.
该固态硬盘包括通过主干走线连接的主控芯片和DDR串,该DDR串包括由走线片段串联的多个DDR颗粒。本申请提供的该阻抗匹配方法包括:The solid-state hard disk includes a main control chip and a DDR string connected by backbone wires, and the DDR string includes a plurality of DDR particles connected in series by wire segments. The impedance matching method provided by this application includes:
S201:确定主干走线的第一阻抗值,并作为DDR串的实际阻抗值。S201: Determine the first impedance value of the trunk line and use it as the actual impedance value of the DDR string.
S202:将基于第一阻抗值和叠层参数计算得到的连续走线的第一线宽作为主干走线的线宽。S202: Use the first line width of the continuous wiring calculated based on the first impedance value and the stacking parameter as the line width of the trunk wiring.
S203:调用阻抗匹配模型,输出与实际阻抗值对应的、与DDR串中各走线片段的总长度等长的连续走线的阻抗取值范围;阻抗取值范围的下限值大于实际阻抗值。S203: Invoke the impedance matching model, and output the impedance value range of the continuous trace corresponding to the actual impedance value and equal to the total length of each trace segment in the DDR string; the lower limit of the impedance value range is greater than the actual impedance value .
其中,阻抗匹配模型基于串接DDR颗粒后对连续走线的阻抗降低影响而预先训练生成。Among them, the impedance matching model is pre-trained and generated based on the impact on the impedance reduction of the continuous wiring after the DDR particles are connected in series.
S204:接收输入的、取值在阻抗取值范围内的第二阻抗值。S204: Receive an input second impedance value whose value is within an impedance value range.
S205:将基于第二阻抗值和叠层参数计算得到的连续走线的第二线宽 作为走线片段的线宽。S205: Use the second line width of the continuous line calculated based on the second impedance value and the stacking parameter as the line width of the line segment.
可见,本申请所提供的固态硬盘PCB走线的阻抗匹配方法,考虑到串接DDR颗粒后对连续走线的阻抗降低影响,通过合理调整走线片段的线宽,使得各走线片段加上各DDR颗粒后的阻抗值,即DDR串的实际阻抗值,等于主干走线的第一阻抗值,从而有效实现了整个链路的阻抗匹配,保障了DDR信号的完整性和传输速率,提高了信号质量;此外,本申请无需添加电阻、电容等元器件,有效节约了成本和布局空间,高效且简便。It can be seen that the impedance matching method for the PCB traces of the solid-state hard disk provided by the present application takes into account the impact on the impedance reduction of the continuous traces after the DDR particles are connected in series. The impedance value after each DDR particle, that is, the actual impedance value of the DDR string, is equal to the first impedance value of the trunk line, thus effectively realizing the impedance matching of the entire link, ensuring the integrity and transmission rate of the DDR signal, and improving the Signal quality; in addition, the application does not need to add components such as resistors, capacitors, etc., which effectively saves cost and layout space, and is efficient and convenient.
作为一种具体实施例,本申请实施例所提供的固态硬盘PCB走线的阻抗匹配方法在上述内容的基础上,确定主干走线的第一阻抗值,包括:As a specific embodiment, the impedance matching method for the PCB wiring of the solid-state hard disk provided by the embodiment of the present application determines the first impedance value of the main wiring on the basis of the above content, including:
接收输入的主控芯片的型号信息和信号类型信息;Receive the model information and signal type information of the input main control chip;
查询芯片资料库以获取与型号信息和信号类型信息对应的第一阻抗值。The chip database is queried to obtain the first impedance value corresponding to the model information and the signal type information.
作为一种具体实施例,本申请实施例所提供的固态硬盘PCB走线的阻抗匹配方法在上述内容的基础上,在接收输入的、取值在阻抗取值范围内的第二阻抗值之后,还包括:As a specific embodiment, the impedance matching method for the PCB wiring of the solid-state hard disk provided by the embodiment of the present application is based on the above content, and after receiving the input second impedance value whose value is within the impedance value range, Also includes:
根据输入的第二阻抗值,生成信号仿真眼图,以便用户根据信号仿真眼图的效果调整第二阻抗值。According to the input second impedance value, a signal simulation eye diagram is generated, so that the user can adjust the second impedance value according to the effect of the signal simulation eye diagram.
作为一种具体实施例,本申请实施例所提供的固态硬盘PCB走线的阻抗匹配方法在上述内容的基础上,阻抗匹配模型的训练过程可具体参见图4,主要包括以下步骤:As a specific embodiment, the impedance matching method for the PCB routing of the solid-state hard disk provided by the embodiment of the present application is based on the above content, and the training process of the impedance matching model can be specifically referred to FIG. 4, which mainly includes the following steps:
S301:根据预设DDR串阻抗计算公式,计算样本DDR串在DDR颗粒降低走线阻抗后的整体阻抗值。S301 : According to a preset DDR string impedance calculation formula, calculate the overall impedance value of the sample DDR string after the DDR chip reduces the trace impedance.
S302:根据连续走线阻抗计算公式,计算与样本DDR串中各走线片段的总长度等长的连续走线的关联阻抗值。S302 : Calculate, according to the formula for calculating the impedance of the continuous wiring, the associated impedance value of the continuous wiring that is equal to the total length of each wiring segment in the sample DDR string.
S303:以整体阻抗值为输入,以对应的关联阻抗值的取值范围为输出,训练生成DDR串阻抗匹配模型。S303: Taking the overall impedance value as input, and taking the value range of the corresponding associated impedance value as output, train to generate a DDR string impedance matching model.
其中,进一步地,预设DDR串阻抗计算公式具体为:Wherein, further, the preset DDR string impedance calculation formula is specifically:
Figure PCTCN2021076945-appb-000004
Figure PCTCN2021076945-appb-000004
其中,L和C分别为与DDR串中各走线片段的总长度等长的连续走线的寄生电感和寄生电容;m为DDR颗粒总数;C L为DDR颗粒的等效电容;X为每个走线片段的长度。 Among them, L and C are the parasitic inductance and parasitic capacitance of the continuous traces of the same length as the total length of each trace segment in the DDR string, respectively; m is the total number of DDR particles; C L is the equivalent capacitance of DDR particles; X is each The length of a trace segment.
作为一种具体实施例,本申请实施例所提供的固态硬盘PCB走线的阻抗匹配方法在上述内容的基础上,层叠参数包括PCB板的铜箔厚度、板材介电常数和板材厚度。As a specific embodiment, the impedance matching method of the solid-state drive PCB trace provided by the embodiment of the present application is based on the above content, and the stacking parameters include the copper foil thickness of the PCB board, the dielectric constant of the board, and the board thickness.
关于上述固态硬盘PCB走线的阻抗匹配方法的具体内容,可参考前述关于固态硬盘PCB走线的阻抗匹配装置的详细介绍,这里就不再赘述。For the specific content of the impedance matching method for the above-mentioned solid-state drive PCB wiring, reference may be made to the foregoing detailed introduction on the impedance matching device for the solid-state hard drive PCB wiring, which will not be repeated here.
参见图5所示,本申请实施例公开了一种电子设备,包括:Referring to FIG. 5 , an embodiment of the present application discloses an electronic device, including:
存储器401,用于存储计算机程序; memory 401 for storing computer programs;
处理器402,用于执行所述计算机程序以实现如上所述的任一种固态硬盘PCB走线的阻抗匹配方法的步骤。The processor 402 is configured to execute the computer program to implement the steps of any of the above-mentioned impedance matching methods for PCB traces of the solid-state hard disk.
进一步地,本申请实施例还公开了一种计算机可读存储介质,所述计算机可读存储介质中存储有计算机程序,所述计算机程序被处理器执行时用以实现如上所述的任一种固态硬盘PCB走线的阻抗匹配方法的步骤。Further, an embodiment of the present application also discloses a computer-readable storage medium, where a computer program is stored in the computer-readable storage medium, and the computer program is used to implement any of the above when executed by a processor. The steps of the impedance matching method of the PCB trace of the solid state drive.
关于上述电子设备和计算机可读存储介质的具体内容,可参考前述关于固态硬盘PCB走线的阻抗匹配装置的详细介绍,这里就不再赘述。For the specific content of the electronic device and the computer-readable storage medium, reference may be made to the foregoing detailed introduction on the impedance matching device for the PCB wiring of the solid-state drive, which will not be repeated here.
本申请中各个实施例采用递进的方式描述,每个实施例重点说明的都是与其他实施例的不同之处,各个实施例之间相同相似部分互相参见即可。对于实施例公开的设备而言,由于其与实施例公开的方法相对应,所以描述的比较简单,相关之处参见方法部分说明即可。The various embodiments in this application are described in a progressive manner, and each embodiment focuses on the differences from other embodiments, and the same and similar parts between the various embodiments may be referred to each other. For the device disclosed in the embodiment, since it corresponds to the method disclosed in the embodiment, the description is relatively simple, and the relevant part can be referred to the description of the method.
还需说明的是,在本申请文件中,诸如“第一”和“第二”之类的关系术语,仅仅用来将一个实体或者操作与另一个实体或者操作区分开来,而不一定要求或者暗示这些实体或者操作之间存在任何这种实际的关系或者顺序。此外,术语“包括”、“包含”或者其任何其他变体意在涵盖非排 他性的包含,从而使得包括一系列要素的过程、方法、物品或者设备不仅包括那些要素,而且还包括没有明确列出的其他要素,或者是还包括为这种过程、方法、物品或者设备所固有的要素。在没有更多限制的情况下,由语句“包括一个……”限定的要素,并不排除在包括所述要素的过程、方法、物品或者设备中还存在另外的相同要素。It should also be noted that, in this application document, relational terms such as "first" and "second" are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require Or imply that there is any such actual relationship or order between these entities or operations. Furthermore, the terms "comprising", "comprising" or any other variation thereof are intended to encompass non-exclusive inclusion such that a process, method, article or device comprising a list of elements includes not only those elements, but also includes not explicitly listed or other elements inherent to such a process, method, article or apparatus. Without further limitation, an element qualified by the phrase "comprising a..." does not preclude the presence of additional identical elements in a process, method, article or apparatus that includes the element.
以上对本申请所提供的技术方案进行了详细介绍。本文中应用了具体个例对本申请的原理及实施方式进行了阐述,以上实施例的说明只是用于帮助理解本申请的方法及其核心思想。应当指出,对于本技术领域的普通技术人员来说,在不脱离本申请原理的前提下,还可以对本申请进行若干改进和修饰,这些改进和修饰也落入本申请的保护范围内。The technical solutions provided by the present application have been introduced in detail above. Specific examples are used herein to illustrate the principles and implementations of the present application, and the descriptions of the above embodiments are only used to help understand the methods and core ideas of the present application. It should be pointed out that for those skilled in the art, without departing from the principles of the present application, several improvements and modifications can also be made to the present application, and these improvements and modifications also fall within the protection scope of the present application.

Claims (10)

  1. 一种固态硬盘PCB走线的阻抗匹配装置,其特征在于,所述固态硬盘包括通过主干走线连接的主控芯片和DDR串,所述DDR串包括由走线片段串连的多个DDR颗粒;所述阻抗匹配装置包括:An impedance matching device for PCB wiring of a solid-state hard disk, characterized in that the solid-state hard disk comprises a main control chip and a DDR string connected by a backbone wiring, and the DDR string comprises a plurality of DDR particles connected in series by wiring segments ; The impedance matching device includes:
    线宽计算模块,用于根据输入的阻抗值和叠层参数计算对应的连续走线的线宽;The line width calculation module is used to calculate the line width of the corresponding continuous trace according to the input impedance value and stacking parameters;
    第一线宽确定模块,用于确定所述主干走线的第一阻抗值,并作为所述DDR串的实际阻抗值;调用所述线宽计算模块,将基于所述第一阻抗值计算得到的第一线宽作为所述主干走线的线宽;The first line width determination module is used to determine the first impedance value of the trunk line, and use it as the actual impedance value of the DDR string; call the line width calculation module, which will be calculated based on the first impedance value. The first line width of is used as the line width of the trunk line;
    阻抗匹配模型,用于输出与所述实际阻抗值对应的、与所述DDR串中各走线片段的总长度等长的连续走线的阻抗取值范围;所述阻抗取值范围的下限值大于所述实际阻抗值;The impedance matching model is used to output the impedance value range of the continuous trace corresponding to the actual impedance value and having the same length as the total length of each trace segment in the DDR string; the lower limit of the impedance value range value is greater than the actual impedance value;
    训练模块,用于根据串接DDR颗粒后对连续走线的阻抗降低影响而预先训练生成所述阻抗匹配模型;a training module, configured to pre-train and generate the impedance matching model according to the impact on the impedance reduction of the continuous wiring after the DDR particles are connected in series;
    第二线宽确定模块,用于接收输入的、取值在所述阻抗取值范围内的第二阻抗值;调用所述线宽计算模块,将基于所述第二阻抗值计算得到的第二线宽作为所述走线片段的线宽。The second line width determination module is used to receive the input second impedance value whose value is within the impedance value range; call the line width calculation module, and use the second line width calculated based on the second impedance value as the line width of the trace segment.
  2. 根据权利要求1所述的阻抗匹配装置,其特征在于,所述第一线宽确定模块具体用于:The impedance matching device according to claim 1, wherein the first line width determination module is specifically used for:
    接收输入的所述主控芯片的型号信息和信号类型信息;查询芯片资料库以获取与所述型号信息和所述信号类型信息对应的所述第一阻抗值。Receive the input model information and signal type information of the main control chip; query a chip database to obtain the first impedance value corresponding to the model information and the signal type information.
  3. 根据权利要求1所述的阻抗匹配装置,其特征在于,还包括:The impedance matching device according to claim 1, further comprising:
    校准模块,用于根据输入的所述第二阻抗值,生成信号仿真眼图,以便用户根据信号仿真眼图的效果调整所述第二阻抗值。The calibration module is configured to generate a signal simulation eye diagram according to the input second impedance value, so that the user can adjust the second impedance value according to the effect of the signal simulation eye diagram.
  4. 根据权利要求1所述的阻抗匹配装置,其特征在于,所述训练模块具体用于:The impedance matching device according to claim 1, wherein the training module is specifically used for:
    根据预设DDR串阻抗计算公式,计算样本DDR串在DDR颗粒降低走线阻抗后的整体阻抗值;根据连续走线阻抗计算公式,计算与所述样本DDR串中各走线片段的总长度等长的连续走线的关联阻抗值;以所述整体 阻抗值为输入,以对应的所述关联阻抗值的取值范围为输出,训练生成所述DDR串阻抗匹配模型。According to the preset DDR string impedance calculation formula, calculate the overall impedance value of the sample DDR string after the DDR particles reduce the trace impedance; according to the continuous trace impedance calculation formula, calculate the total length of each trace segment in the sample DDR string, etc. The associated impedance value of the long continuous trace; taking the overall impedance value as an input, and taking the corresponding value range of the associated impedance value as an output, training to generate the DDR string impedance matching model.
  5. 根据权利要求4所述的阻抗匹配装置,其特征在于,所述预设DDR串阻抗计算公式具体为:The impedance matching device according to claim 4, wherein the preset DDR string impedance calculation formula is specifically:
    Figure PCTCN2021076945-appb-100001
    Figure PCTCN2021076945-appb-100001
    其中,L和C分别为与所述DDR串中各走线片段的总长度等长的连续走线的寄生电感和寄生电容;m为DDR颗粒总数;C L为DDR颗粒的等效电容;X为每个走线片段的长度。 Wherein, L and C are the parasitic inductance and parasitic capacitance of the continuous traces of the same length as the total length of each trace segment in the DDR string, respectively; m is the total number of DDR particles; C L is the equivalent capacitance of the DDR particles; X is the length of each trace segment.
  6. 根据权利要求1至5任一项所述的阻抗匹配装置,其特征在于,所述层叠参数包括PCB板的铜箔厚度、板材介电常数和板材厚度。The impedance matching device according to any one of claims 1 to 5, wherein the stacking parameters include copper foil thickness, sheet dielectric constant and sheet thickness of the PCB board.
  7. 一种固态硬盘PCB走线的阻抗匹配方法,其特征在于,所述固态硬盘包括通过主干走线连接的主控芯片和DDR串,所述DDR串包括由走线片段串联的多个DDR颗粒;所述阻抗匹配方法包括:An impedance matching method for PCB wiring of a solid-state hard disk, characterized in that the solid-state hard disk comprises a main control chip and a DDR string connected by a backbone wiring, and the DDR string comprises a plurality of DDR particles connected in series by wiring segments; The impedance matching method includes:
    确定所述主干走线的第一阻抗值,并作为所述DDR串的实际阻抗值;determining the first impedance value of the trunk line as the actual impedance value of the DDR string;
    将基于所述第一阻抗值和叠层参数计算得到的连续走线的第一线宽作为所述主干走线的线宽;Taking the first line width of the continuous wiring calculated based on the first impedance value and the stacking parameters as the line width of the trunk wiring;
    调用阻抗匹配模型,输出与所述实际阻抗值对应的、与所述DDR串中各走线片段的总长度等长的连续走线的阻抗取值范围;所述阻抗取值范围的下限值大于所述实际阻抗值;Invoke the impedance matching model, and output the impedance value range of the continuous trace corresponding to the actual impedance value and equal to the total length of each trace segment in the DDR string; the lower limit of the impedance value range greater than the actual impedance value;
    接收输入的、取值在所述阻抗取值范围内的第二阻抗值;receiving an input second impedance value whose value is within the impedance value range;
    将基于所述第二阻抗值和所述叠层参数计算得到的连续走线的第二线宽作为所述走线片段的线宽;Using the second line width of the continuous trace calculated based on the second impedance value and the stacking parameter as the line width of the trace segment;
    其中,所述阻抗匹配模型基于串接DDR颗粒后对连续走线的阻抗降低影响而预先训练生成。Wherein, the impedance matching model is pre-trained and generated based on the impact on the impedance reduction of the continuous wiring after the DDR particles are connected in series.
  8. 根据权利要求7所述的阻抗匹配方法,其特征在于,所述阻抗匹配模型的训练过程包括:The impedance matching method according to claim 7, wherein the training process of the impedance matching model comprises:
    根据预设DDR串阻抗计算公式,计算样本DDR串在DDR颗粒降低走线阻抗后的整体阻抗值;According to the preset DDR string impedance calculation formula, calculate the overall impedance value of the sample DDR string after the DDR particles reduce the trace impedance;
    根据连续走线阻抗计算公式,计算与所述样本DDR串中各走线片段的总长度等长的连续走线的关联阻抗值;According to the formula for calculating the impedance of the continuous trace, calculate the associated impedance value of the continuous trace that is equal to the total length of each trace segment in the sample DDR string;
    以所述整体阻抗值为输入,以对应的所述关联阻抗值的取值范围为输出,训练生成所述DDR串阻抗匹配模型。Taking the overall impedance value as an input, and taking the corresponding range of the associated impedance value as an output, the DDR string impedance matching model is generated by training.
  9. 一种电子设备,其特征在于,包括:An electronic device, comprising:
    存储器,用于存储计算机程序;memory for storing computer programs;
    处理器,用于执行所述计算机程序以实现如权利要求7或者8所述的固态硬盘PCB走线的阻抗匹配方法的步骤。The processor is configured to execute the computer program to implement the steps of the impedance matching method for the PCB wiring of the solid-state hard disk according to claim 7 or 8.
  10. 一种计算机可读存储介质,其特征在于,所述计算机可读存储介质中存储有计算机程序,所述计算机程序被处理器执行时用以实现如权利要求7或者8所述的固态硬盘PCB走线的阻抗匹配方法的步骤。A computer-readable storage medium, characterized in that, a computer program is stored in the computer-readable storage medium, and when the computer program is executed by a processor, it is used to realize the solid-state hard disk PCB operation according to claim 7 or 8. The steps of the line impedance matching method.
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