WO2021246494A1 - Component for electrical/electronic equipment - Google Patents

Component for electrical/electronic equipment Download PDF

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Publication number
WO2021246494A1
WO2021246494A1 PCT/JP2021/021264 JP2021021264W WO2021246494A1 WO 2021246494 A1 WO2021246494 A1 WO 2021246494A1 JP 2021021264 W JP2021021264 W JP 2021021264W WO 2021246494 A1 WO2021246494 A1 WO 2021246494A1
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WO
WIPO (PCT)
Prior art keywords
welded portion
plate material
vickers hardness
welding
electronic equipment
Prior art date
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PCT/JP2021/021264
Other languages
French (fr)
Japanese (ja)
Inventor
紳悟 川田
翔一 檀上
俊太 秋谷
颯己 葛原
Original Assignee
古河電気工業株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Publication date
Priority claimed from JP2020097957A external-priority patent/JP7434066B2/en
Priority claimed from JP2020097955A external-priority patent/JP7470575B2/en
Application filed by 古河電気工業株式会社 filed Critical 古河電気工業株式会社
Priority to CN202180030053.6A priority Critical patent/CN115461184A/en
Priority to KR1020227038953A priority patent/KR20230020393A/en
Publication of WO2021246494A1 publication Critical patent/WO2021246494A1/en

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    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23KSOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K26/00Working by laser beam, e.g. welding, cutting or boring
    • B23K26/20Bonding
    • B23K26/21Bonding by welding
    • CCHEMISTRY; METALLURGY
    • C22METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
    • C22CALLOYS
    • C22C9/00Alloys based on copper
    • CCHEMISTRY; METALLURGY
    • C22METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
    • C22CALLOYS
    • C22C9/00Alloys based on copper
    • C22C9/02Alloys based on copper with tin as the next major constituent
    • CCHEMISTRY; METALLURGY
    • C22METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
    • C22CALLOYS
    • C22C9/00Alloys based on copper
    • C22C9/04Alloys based on copper with zinc as the next major constituent
    • CCHEMISTRY; METALLURGY
    • C22METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
    • C22CALLOYS
    • C22C9/00Alloys based on copper
    • C22C9/06Alloys based on copper with nickel or cobalt as the next major constituent
    • CCHEMISTRY; METALLURGY
    • C22METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
    • C22CALLOYS
    • C22C9/00Alloys based on copper
    • C22C9/10Alloys based on copper with silicon as the next major constituent
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K7/00Constructional details common to different types of electric apparatus
    • H05K7/02Arrangements of circuit components or wiring on supporting structure
    • H05K7/06Arrangements of circuit components or wiring on supporting structure on insulating boards, e.g. wiring harnesses

Definitions

  • the present invention relates to parts for electrical and electronic devices.
  • the amount of heat generated tends to increase due to higher functionality and higher performance of electrical and electronic equipment.
  • the heat generation density increases, so it is becoming important to cool the generated heat.
  • the member for cooling the generated heat include a vapor chamber which is a planar heat pipe.
  • the material of the vapor chamber it is desirable to use a copper-based material (pure copper, copper alloy) having high thermal conductivity.
  • the vapor chamber has a closed structure in which a working liquid is put into an internal space formed by joining the outer peripheral portions in a state where a plurality of plates are stacked, and then sealed under reduced pressure.
  • a joining method include laser welding, resistance welding, diffusion welding, and TIG welding.
  • the welded part is formed by melting once by heating to a high temperature and then re-solidifying, so that it is softened and the plate itself is softened as in the case of annealing. There is a problem that it becomes softer than the strength and the strength becomes low. The lower the strength, the easier it is to deform.
  • Patent Document 1 describes a method of manufacturing a vapor chamber by joining a plurality of parts by diffusion joining or brazing, using a precipitation hardening copper alloy as a material of a housing and aging treatment. Then, a technique for improving the strength of the housing and the like by precipitation hardening is disclosed.
  • a precipitation hardening type copper alloy it is necessary to use a precipitation hardening type copper alloy, and there is a problem that it cannot be applied to a non-precipitation type copper alloy or pure copper.
  • it is necessary to perform aging treatment and there is a problem that productivity is lowered due to an increase in the number of steps. Therefore, it is desired to increase the strength of the welded portion by a method other than the method of precipitation hardening using a precipitation hardening type copper alloy by aging treatment.
  • Patent Document 2 discloses a technique for improving the bonding strength by irradiating a laser with a specific trajectory, but the technique of Patent Document 2 is a technique relating to bonding between aluminum and copper. It is difficult to apply to joining copper-based materials. More specifically, the copper-based material has a high thermal conductivity, so that heat easily escapes, and the laser beam is easily reflected. Therefore, the copper-based material is a material that is difficult to join by laser welding. Therefore, as in Patent Document 2, simple welding using a laser beam has low bonding strength and cannot be sufficiently bonded.
  • the present invention has been made in view of the above circumstances, and is a component for an electric / electronic device in which a plurality of plates made of a copper-based material are joined by welding, and the electric / electronic device having a high weld strength.
  • the subject is to provide parts for use.
  • the present invention is rigid and rigid by controlling the hardness of the welded plate material and the inclination of the hardness of the entire plate material in the parts for electric / electronic equipment having a welded portion such as a vapor chamber and a bus bar. It is an object of the present invention to provide parts for electric / electronic equipment in which welded portions are not easily deformed locally.
  • the present inventors have found that the Vickers hardness HV of the weld can be increased by controlling the laser welding conditions using a plate material having a component composition containing 90% by mass or more of Cu. Further, the present inventors have found that by controlling the appropriate hardness from the welded portion to the non-welded portion and the inclination of the hardness, the welded portion is rigid and the welded portion is less likely to be locally deformed. , The parts for electric and electronic devices of the present invention have been completed.
  • the gist structure of the present invention is as follows. (1) It is composed of a plurality of plate materials containing 90% by mass or more of Cu, and the plurality of plate materials are joined and integrated by welding in a state of being abutted against each other or in a state of being overlapped with each other.
  • the welded portion has a welded portion, and the welded portion extends over the entire thickness of the plate material, and the welded portion is cut in a direction in which the plurality of joined plate materials extend.
  • the welded portion is a component for electrical and electronic equipment having a Vickers hardness HV1 of 60 or more when measured at a position corresponding to half the thickness of the plate material at the center of the weld width, which is the width of the weld mark.
  • the GAM value obtained from the crystal orientation analysis data of the SEM-EBSD method is measured in the rectangular region defined by the welding width of the welded portion and the thickness of the plate material in the cross section.
  • the component for electrical / electronic equipment according to (1) wherein the crystal grains having a value of 0.5 ° or more and less than 2.0 ° have an area ratio of 25% or more to all the crystal grains existing in the measurement area.
  • It is composed of a plurality of plate materials containing 90% by mass or more of Cu.
  • It has a welded portion in which the plurality of plate materials are joined to each other in a linear or dot shape by welding in a state of being abutted against each other or overlapped with each other, and the welded portion covers the entire thickness of the plate material.
  • the thickness of the plate material at the center of the weld width which is the width of the weld mark on the surface of the plate material, in the cross section when the welded portion is cut in the direction in which the plurality of plate materials are extended and joined.
  • the Vickers hardness at the weld when measured at a position corresponding to half the dimension is defined as HV1.
  • the Vickers hardness in the non-welded portion measured at a position separated along the direction of the weld width by a distance corresponding to 1.5 times the weld half width from the center position of the welded portion is HV2, the above.
  • the Vickers hardness HV2 in the non-welded portion was 75 or more, and the difference between the Vickers hardness HV2 in the non-welded portion and the Vickers hardness HV1 in the welded portion was measured by measuring the Vickers hardness HV1 and HV2.
  • the electricity according to (1) or (2), wherein the hardness inclination rate ((HV2-HV1) / X) when divided by the indentation distance X ( ⁇ m) between the positions is 0.2 / ⁇ m or less. Parts for electronic devices.
  • the plate material contains one or more elements selected from the group consisting of Ag, Fe, Ni, Co, Si, Cr, Sn, Zn, Mg and P. Parts for electrical and electronic equipment described in one.
  • a component for electrical / electronic equipment in which a plurality of plates made of a copper-based material containing 90% by mass or more of Cu are joined by welding, and for electrical / electronic equipment having a high weld strength. Parts can be provided. Further, according to the present invention, by obtaining an appropriate hardness at the welded portion and controlling the inclination of the hardness between the welded portion and the non-welded portion, the welded portion is rigid and the welded portion is formed. It is possible to provide parts for electrical and electronic devices that are not easily deformed locally.
  • (A) is a schematic perspective view of two Cu plates constituting the parts for electric / electronic devices according to the embodiment of the present invention, which are linearly laser-welded in a state of being butted against each other
  • (b) Is a schematic perspective view of two Cu plates constituting the parts for electric / electronic devices according to the embodiment of the present invention, which are linearly laser-welded in a state of being overlapped with each other. It is an optical micrograph when observing the surface state of the laser-irradiated side of a Cu joint body (a joint body of two Cu plate materials) obtained by laser-welding a butt Cu plate material from the Z-axis.
  • FIG. 1 It is a figure which shows the schematic structure of the laser welding apparatus. It is a figure which shows the spot diameter of the laser beam of a laser welding apparatus.
  • A is a schematic perspective view when two Cu plates constituting parts for electric / electronic devices according to another embodiment of the present invention are linearly joined in a state of being butted against each other
  • (b) is a schematic perspective view. It is a schematic perspective view when the two Cu plates constituting the parts for electric / electronic devices according to another embodiment of the present invention are joined in a linear manner in a state of being overlapped with each other. It is an optical micrograph when observing the cross-sectional state of the bonded Cu plate material.
  • the component for electric / electronic equipment is composed of a plurality of plate materials containing 90% by mass or more of Cu, and the plurality of plate materials are welded in a state of being abutted against each other or in a state of being overlapped with each other. It has a welded part that is joined and integrated in a linear or dot shape, and the welded part extends over the entire thickness of the plate material, and the welded part extends in the direction in which the plurality of joined plate materials extend. In the cross section when cut, the welded portion has a Vickers hardness of 60 or more when measured at a position corresponding to a dimension of half the thickness of the plate material.
  • FIG. 1A is a schematic perspective view when a Cu joint body 10 (a joint body of two Cu plate materials) is formed by laser welding linearly with two Cu plate materials 1 and 2 abutted against each other.
  • FIG. 1B is a schematic perspective view of a Cu bonded body 10A formed by linear laser welding in a state where two Cu plates 1 and 2 are overlapped with each other.
  • FIG. 1A is a schematic perspective view when a Cu joint body 10 (a joint body of two Cu plate materials) is formed by laser welding linearly with two Cu plate materials 1 and 2 abutted against each other.
  • FIG. 1B is a schematic perspective view of a Cu bonded body 10A formed by linear laser welding in a state where two Cu plates 1 and 2 are overlapped with each other.
  • Cu plate material as used herein means a plate material containing 90% by mass or more of Cu (copper).
  • the "plate material containing 90% by mass or more of Cu” may be any plate material having a Cu content of 90% by mass or more, and may be pure Cu or any Cu alloy, and is not particularly limited.
  • the plate material is a Cu alloy
  • the plate material contains one to two or more elements selected from Ag, Fe, Ni, Co, Si, Cr, Sn, Zn, Mg, and P as alloy components, and the balance of Cu. It is preferable to have a component composition in which is 90% by mass or more.
  • the Cu alloy may be a precipitation hardening type Cu alloy or a non-precipitation hardening type Cu alloy.
  • the Vickers hardness HV of the plate material is not particularly limited because it varies depending on the type and amount of the alloy component to be added, but is generally 75 or more and 240 or less.
  • the plate material is pure Cu
  • the plate material has a Cu content of 99.96% by mass or more, and Cd, Mg, Pb, Sn, Cr, Bi, Se and Te as unavoidable impurities are 5 ppm in total.
  • the total of Ag and O is 400 ppm or less.
  • Pure Cu has excellent thermal conductivity, so it can exhibit excellent performance as a heat dissipation / cooling member. Examples of so-called pure Cu include electrolytic copper, oxygen-free copper (OFC), and TPC.
  • the Vickers hardness of the plate material is not particularly limited, but is generally 65 or more and 120 or less.
  • the "plate material” as used in the present invention is a material processed into a predetermined shape, for example, a plate, a strip, a foil, a rod, a flat wire, etc., and has a predetermined thickness, in a broad sense. Means to include strips.
  • the thickness (plate thickness) of the plate material is not particularly limited, but is preferably 0.05 to 1.0 mm, more preferably 0.1 to 0.8 mm.
  • the shape of the plurality of plate materials to be joined and the thickness (plate thickness) of the plate materials may be the same or different.
  • FIG. 2 is a photograph showing the surface state of the Cu-bonded body 10 obtained by laser-welding two butted Cu plates 1 and 2 on the side irradiated with the laser. It shows that the X-axis direction is the laser sweep direction, that is, the welding direction. In addition, it can be seen that there is a portion where the processing marks of rolling of the Cu plate material have disappeared due to the irradiation of the laser beam. Further, there is a portion where the Cu plate materials 1 and 2 are melted and solidified again, and this is referred to as a welded portion 3.
  • FIG. 2 is a photograph showing the surface state of the Cu-bonded body 10 obtained by laser-welding two butted Cu plates 1 and 2 on the side irradiated with the laser. It shows that the X-axis direction is the laser sweep direction, that is, the welding direction. In addition, it can be seen that there is a portion where the processing marks of rolling of the Cu plate material have disappeared due to the irradiation of the laser beam. Further,
  • FIGS. 2 and 3 are optical micrographs when observing the surface state of the Cu junction 10 obtained by laser-welding two butted Cu plates 1 and 2 on the side opposite to the laser-irradiated side, and is the back surface of FIG. It is an optical micrograph when observing the surface state of.
  • the laser welding mark is on the side irradiated with the laser of the Cu junction 10. It appears on the surface (front) and the surface (back) opposite to the side irradiated with the laser. And usually, as shown in FIGS.
  • FIG. 4 is an optical micrograph showing a cross-sectional state when a Cu plate material is laser welded to form a Cu bonded body. As shown in FIG. 4, the width of the surface of the welded portion that has been irradiated with the laser and melted and solidified again on the side irradiated with the laser corresponds to the weld width.
  • the welding width can also be recognized from the cross-sectional view shown in FIG.
  • the welded portion in the cross section when the welded portion is cut in the direction in which the two joined plates extend, the welded portion is measured at a position corresponding to half the thickness of the plate material.
  • Vickers hardness is 60 or more. In this specification, the Vickers hardness HV is measured according to the method specified in JIS Z2244 (2009).
  • the welding direction (laser sweep direction).
  • the direction perpendicular to the welding direction is the Y-axis direction
  • the plate material normal direction is the Z-axis direction.
  • the direction L in which the plate members 1 and 2 extend is the direction in which the plate members are brought closer to each other in order to bring them into a butt state, that is, the Y-axis direction.
  • the welded portion 3 existing in the cross section A when the Cu bonded body 10 is cut in the Y-axis direction is the Cu plate material 1. It is necessary that the Vickers hardness is 60 or more at the position b corresponding to the half dimension of the thickness a of 2.
  • the welded portion 3A when the welded portion 3A is formed by linearly joining and integrating the two Cu plates 1 and 2 in a state of being overlapped with each other, the two joined plates are joined.
  • the direction in which 1 and 2 extend is the direction perpendicular to the welding direction, that is, the Y-axis direction.
  • the welded part is formed by melting once by heating to a high temperature and then re-solidifying. Therefore, in the conventional joining method, the plate material is softened as in the case of annealing. Therefore, there is a problem that the strength becomes lower than the strength of the plate material itself. The lower the strength, the easier it is to deform.
  • the strength becomes lower than the strength of the plate material itself. The lower the strength, the easier it is to deform.
  • the strength may be higher than that of the plate material itself. Therefore, in the present embodiment, the Vickers hardness of the welded portion can be 60 or more, further 65 or more.
  • the Vickers hardness of the welded portion is 60 or more, which is high, it is possible to provide parts for electric and electronic devices having high strength and excellent deformation resistance. Since there is a proportional relationship between Vickers hardness and strength, the higher the Vickers hardness, the higher the strength.
  • the aging treatment is performed as in Patent Document 1, the entire Cu joint including the welded portion tends to be heated and softened unless a curable copper alloy is used. Therefore, the Vickers hardness of the welded portion is present. It is considered difficult to maintain 60 or more.
  • the upper limit of the Vickers hardness HV of the welded portion is not particularly limited, but in the case of pure Cu, it is, for example, 90 or less, and in the case of Cu alloy, it is, for example, 130 or less.
  • FIG. 5 (a) is a schematic perspective view of the case where two Cu plates 1 and 2 are abutted and laser welded in a dot shape to form a Cu bonded body 10B
  • FIG. 5 (b) is a schematic perspective view of 2. It is a schematic perspective view when the Cu bonded body 10C is formed by laser welding in the form of dots in the state where the Cu plate materials 1 and 2 are superposed.
  • the parts for electrical and electronic equipment of the present embodiment having the configuration of the Cu joint body 10B having the welded portions 3B that are joined and integrated in a dot shape in a state of being butted against each other.
  • the parts for electrical and electronic equipment of the present embodiment having the configuration of the Cu bonded body 10C having the welded portions 3B that are joined and integrated in a dot shape in a state of being overlapped with each other.
  • the Cu plate 1 of the welded portion present in the cross section a 1 of the Cu plate 1 having a thickness of a 1 a position b 1 corresponding to half the size, in both positions b 2 corresponding to half of the thickness dimension a 2 of Cu plate 2 of the welded portion present in the cross section a 2 of the Cu plate 2, Vickers hardness It is necessary to be 60 or more.
  • the Vickers hardness HV in the case of linear laser welding is measured in five cross sections A (YZ planes) cut at intervals of 1 mm in the welding direction (X-axis direction), and these measurements are taken. Calculate as the average value of the results.
  • the SEM-EBSD is formed in a rectangular region divided by the weld width of the welded portion and the thickness of the plate material.
  • the crystal grains having a GAM value of 0.5 ° or more and less than 2.0 ° have an area ratio of 25% to all the crystal grains existing in the measured area. The above is preferable.
  • the GAM (grain average misorientation) value is a value obtained from the crystal orientation analysis data of the SEM-EBSD method, and is a value between measurement points in a crystal grain distinguished by a large angle grain boundary having an orientation difference of 15 ° or more.
  • the distance (hereinafter, also referred to as step size) is measured at 0.1 ⁇ m, the orientation difference between adjacent measurement points is calculated, and the calculated orientation difference is a value calculated as an average value within the same crystal grain.
  • a small GAM value means that the average orientation difference in the crystal grains is small, the uniform crystal grains have very little strain, the crystal grains have a continuous orientation gradient, and the like, and the strain in one crystal grain is Indicates that it is small.
  • a large GAM value means that the average orientation difference in the crystal grains is large, and indicates that the strain in one crystal grain is large.
  • Crystal grains having a GAM value of 0.5 ° or more and less than 2.0 ° are crystal grains having characteristics between them, and indicate that the strain in one crystal grain is large to some extent. When the plate material is annealed, the GAM value is usually 0 ° or more and less than 0.5 °, and the local strain in one crystal grain becomes small.
  • the area ratio of the crystal grains having the GAM value of 0.5 ° or more and less than 2.0 ° is 25% or more, that is, the crystal grains having a certain degree of strain in one crystal grain.
  • the area ratio is 25% or more, in the case of pure Cu, the Vickers hardness of the welded portion can be 65 or more.
  • the GAM value is preferably 0.5 ° or more and less than 2.0 °, and the area ratio of the crystal grains is preferably 45% or more, more preferably 65% or more.
  • the upper limit of the area ratio of the crystal grains having a temperature of 0.5 ° or more and less than 2.0 ° is not particularly limited, but is, for example, 95% or less, preferably 90% or less.
  • the GAM value is analyzed from the crystal orientation data continuously measured using the EBSD detector attached to the high-resolution scanning analytical electron microscope (JSM-7001FA, manufactured by Nippon Denshi Co., Ltd.) (OIM Analysis, manufactured by TSL). It can be obtained from the crystal orientation analysis data calculated using.
  • EBSD is an abbreviation for Electron Backscatter Diffraction, which is a crystal orientation analysis technique using reflected electron Kikuchi line diffraction generated when a copper plate material as a sample is irradiated with an electron beam in a scanning electron microscope (SEM). Is.
  • SEM scanning electron microscope
  • the measurement region is the entire rectangular region of the surfaces of the cross sections A, A 1 , and A 2 which is divided by the weld width of the welded portion and the thickness of the plate material on the surface mirror-finished by electrolytic polishing.
  • the area ratio of crystal grains with GAM values within the specified range is defined as the first category with GAM values of 0 ° or more and less than 0.25 °, 15 categories in 0.25 ° increments, and 0 ° or more and less than 3.75 °.
  • the GAM value is used as a measurement target, and it can be calculated from the total area ratio of crystal grains in each category to the entire SEM image obtained by the SEM-EBSD method.
  • the Cu plate material used for this component for electrical and electronic equipment is a Cu alloy containing 90% by mass or more of Cu and containing other metal elements, or 99.96% by mass or more of Cu and pure Cu which is an unavoidable impurity. It is preferable to have.
  • Thermal conductivity can be provided by using a Cu plate material of 90% by mass or more. Originally, Cu has high thermal conductivity, but the amount of added elements increases, and the appearance of the second phase lowers the thermal conductivity. Therefore, the Cu plate material used for the parts for electric and electronic devices of the present embodiment contains 90% by mass or more of Cu, so that deterioration of thermal conductivity can be suppressed and high strength can be provided.
  • the welded portion is formed on the surface of the plate material in the welded portion and the non-welded portion located adjacent to the welded portion.
  • the width of the weld mark is taken as the weld width, and the center of the weld width and the non-welded portion are 1.5 times the weld width along the width direction of the weld width from the center of the weld.
  • the Vickers hardness HV2 at the heat-affected portion is 75 or more, and the difference between the Vickers hardness HV2 at the heat-affected portion and the Vickers hardness HV1 at the welded portion.
  • HV2-HV1 / X hardness inclination rate
  • the Cu member 10D is arranged so that the two Cu plates 101 and 102 are butted against each other.
  • the two Cu plates 101 and 102 are linearly welded, and the two Cu plates 101 and 102 are abutted and joined at the center 121 of the welded portion 12.
  • the laser beam is swept to form a linear joint.
  • Melted liquid Cu is formed in the portion irradiated with the strong laser beam. After that, after the laser beam passes through the Cu, the liquid Cu rapidly cools and changes to a solid Cu due to its high thermal conductivity.
  • a welded portion 12 having a wavy bead is formed. Since it is once melted and solidified, it is clearly in a state different from that of the base material 11 of the Cu plate materials 101 and 102. Further, a portion 13 affected by heat is formed around the welded portion 12 in a state different from the surface of the base material 11 of the Cu plate materials 101 and 102 under the influence of heat. The heat-affected portion 13 is also affected by the heat, and the characteristics of the base material 11 of the Cu plate materials 101 and 102 are also altered. The heat to the heat-affected zone 13 includes both the heat generated by the irradiation of the laser beam and the heat generated from the welded portion 12. As shown in FIG.
  • the stacked Cu plates 101 and 102 are welded so that the width in the Y-axis direction of the bonded Cu plates is 1 ⁇ 2 or more of the welding width of the surface.
  • a point-shaped joint can be formed by irradiating and joining the centers of two Cu plates in a state where they are butted together without sweeping the laser beam.
  • the shape of the laser beam may be any of a circular shape, an elliptical shape, a barrel shape, and a rectangular shape.
  • the point shape may be a broken line shape as long as the welded portions are present separately from each other.
  • the Cu plate material may be penetrated in the plate thickness direction, or the metal Cu may be stopped from melting in the middle.
  • the two Cu plates may be overlapped with each other and irradiated with a laser beam to join them in a dot shape. Also in this case, in order to obtain sufficient bonding strength, the overlapped Cu plates are welded so that the width in the Y-axis direction of the bonded members is 1 ⁇ 2 or more of the welding width of the surface.
  • FIG. 2 is a photograph showing the surface state of a Cu member formed by laser welding and joining butt Cu plates, and shows that the X-axis direction is the laser sweep direction. In addition, it can be seen that there is a portion where the processing traces of rolling of the Cu plate material have disappeared due to the irradiation of the laser beam. Further, it can be clearly seen that the Cu plate material has a melted and solidified portion, which is a welded portion.
  • the width of the welded portion of the laser welding mark shown in the figure is defined as the welding width in the present invention, and the cut is cut at the dotted line cross-sectional observation position to observe the cross-sectional structure.
  • FIG. 9 is an optical micrograph showing a cross-sectional state of a Cu member formed by laser welding a Cu plate material. As shown in FIG. 9, the welded portion joined by irradiating a laser beam to melt and then solidifying is represented as a weld width. Even when viewed from the cross-sectional view from FIG. 9, the width of the welding mark on the surface of the Cu plate material on the side irradiated with the laser beam can be clearly recognized.
  • a point advanced along the direction of the weld width by a distance 1.5 times the length of half the weld width (half-width of the weld) from the center of the weld is called a non-weld part, and in the plate thickness direction at these two points.
  • the depth in the plate thickness direction at the center of the weld width is the Vickers hardness HV1 and HV2 of the welded portion and the non-welded portion at the position of 1/2 of the plate thickness, respectively. Measure.
  • Vickers hardness is a measurement method standardized by "JIS Z 2244".
  • the Vickers hardness HV is a numerical value indicating whether a rigid body (indenter) made of diamond is pressed against a test object and the area of a dent (indentation) formed at that time is large or small, and whether it is hard or soft.
  • the indentation is ideally square because the indenter has a quadrangular pyramid shape that resembles an inverted pyramid.
  • the test force is variable, and the JIS standard specifies 10 gf to 100 kgf.
  • the measurement of the non-welded portion is performed by measuring the points on both sides perpendicular to the traveling direction of the laser beam from the center of the welded portion and measuring the average value of the non-welded portion.
  • Vickers hardness is HV2.
  • the Vickers hardness HV2 of the non-welded portion is measured from the center of the welded portion at a right angle to the direction in which the laser beam travels and at a point opposite to the near end portion. ..
  • the Cu plate material at this time measures the Vickers hardness HV1 and HV2 at two points, the center of the welded portion and the non-welded portion.
  • the value when the difference between the Vickers hardness HV2 at the non-welded portion and the Vickers hardness HV1 at the center of the weld is divided by the indentation distance X ⁇ m between the measured positions of the Vickers hardness HV1 and HV2. ((HV2-HV1) / X) is defined as the hardness inclination rate.
  • the welding width is defined as the widest portion of the dotted welded portion as the welding width and the surface on which the cross section of that portion is measured. Therefore, the non-welded portion is a portion adjacent to the dotted welded portion and at a distance of 1.5 times the half width of the weld along the width direction of the weld width from the center of the welded portion. Therefore, the hardness is measured at the center point of the widest part of the point shape and the point of the non-welded part at a certain distance from the center point. Thereby, the Vickers hardness HV1 and HV2 can be measured, and the hardness inclination rate can be obtained.
  • the hardness represents the difficulty of deforming the object and the resistance of the object to be scratched, especially when the surface of the Cu plate is about to be deformed or scratched.
  • the hardness represents the difficulty of deforming the object and the resistance of the object to be scratched, especially when the surface of the Cu plate is about to be deformed or scratched.
  • the hardness is distributed, cracks are likely to occur and the joints are easily cracked. This is because when stress is applied to a plate material in which a hard part with high hardness and a soft part with low hardness coexist, the deformation stress is concentrated, so that the low hardness part is easily deformed and cracks may occur. ..
  • the Cu plate material which has a large difference in the effect of heat between the part affected by heat and the welded part that has melted and solidified due to the rapid heating and quenching of the laser welding process, is easily deformed by stress. , Cracks tend to enter easily. Therefore, if the hardness inclination ratio is large during the manufacture of parts for electrical and electronic equipment, cracks may occur and the parts may be damaged.
  • the hardness inclination rate which indicates the change in hardness in the base material, non-welded portion, and welded portion of the Cu plate material.
  • the larger the hardness inclination ratio the larger the difference in hardness between the base material, the non-welded part, and the welded part of the Cu plate material. It will be easier. Therefore, the difference between the Vickers hardness HV1 at the weld and the Vickers hardness HV2 at the non-welded portion located adjacent to the weld is the indentation distance X (indentation distance X) between the positions where the Vickers hardness HV1 and HV2 are measured.
  • the hardness inclination rate ((HV2-HV1) / X), which is a numerical value when divided by ⁇ m), is set to 0.2 / ⁇ m or less, more preferably 0.15 / ⁇ m or less.
  • the welded portion it is preferable that the Vickers hardness HV2 in the Cu plate material portion other than the above, particularly in the non-welded portion located adjacent to the welded portion, is 75 or more.
  • Cu alloy plate material A plate material having a Cu content of 90% by mass or more may be used, and may be pure Cu or any Cu alloy, and is not particularly limited.
  • the Cu plate material used as a component for electrical and electronic equipment is a Cu alloy, one to two or more types selected from Ag, Fe, Ni, Co, Si, Cr, Sn, Zn, Mg, and P as alloy components. It is preferable to have a component composition containing an element and having a residual Cu of 90% by mass or more.
  • the Cu alloy may be a precipitation hardening type Cu alloy or a non-precipitation hardening type Cu alloy.
  • the Vickers hardness HV2 in the non-welded portion is in the range of 75 to 240.
  • the hardness inclination ratio is set to 0.2 / ⁇ m or less to suppress the occurrence of cracks. Further, it is preferable that not only the hardness inclination rate but also the base material, the non-welded portion, and the welded portion of the Cu plate material are hard, and in particular, the Vickers hardness HV2 in the non-welded portion is in the range of 75 to 240. Is preferable. If the Vickers hardness HV2 at the non-welded portion is less than 75, the Cu alloy plate material is likely to be deformed during processing. When the Vickers hardness HV2 in the non-welded portion exceeds 240, deformation of the welded portion and cracks easily occur at the boundary between the non-welded portion and the base metal and the welded portion at the boundary.
  • the Vickers hardness HV2 in the non-welded portion is in the range of 75 to 120. Is preferable. It is preferable that the hardness inclination of the base material, the welded portion, and the non-welded portion of the Cu plate material is small. By using the pure Cu plate material, the hardness inclination ratio can be reduced to 0.1 / ⁇ m or less, and the welded portion. Local deformation of is difficult.
  • the Vickers hardness HV2 in the non-welded portion is less than 75, it is likely to be deformed during processing.
  • the Vickers hardness HV2 in the non-welded portion exceeds 120, deformation of the welded portion and cracks easily occur at the boundary between the non-welded portion and the base metal and the welded portion and the non-welded portion.
  • the plate material constituting the parts for electric and electronic devices of the present invention may be any plate material containing 90% by mass or more of Cu, and may be either a Cu alloy or pure Cu.
  • the plate material preferably contains one or more elements selected from the group consisting of Ag, Fe, Ni, Co, Si, Cr, Sn, Zn, Mg and P.
  • Ag is a component having an action of improving mechanical properties without impairing electrical properties, and in order to exert such actions, the Ag content is preferably 0.05% by mass or more. .. Further, it is not necessary to set an upper limit of the Ag content in particular, but since Ag is expensive, it is preferable to set the upper limit of the Ag content to 5.0% by mass from the viewpoint of material cost.
  • Fe 0.05 to 0.50% by mass
  • Fe (iron) is a component having an action of improving mechanical properties.
  • the Fe content is preferably 0.05% by mass or more.
  • the Fe content is preferably 0.05 to 0.50% by mass.
  • Ni (Ni: 0.05 to 5.00% by mass) Ni (nickel) is finely precipitated in the matrix of Cu as a precipitate of second-phase particles composed of a simple substance or a compound with Si, for example, in a size of about 50 to 500 nm, and this precipitate is formed. It is a component having an action of precipitation hardening by suppressing dislocation movement, further suppressing grain growth, and increasing material strength by refining crystal grains. In order to exert such an effect, the Ni content is preferably 0.05% by mass or more. On the other hand, when the Ni content exceeds 5.00% by mass, the conductivity and the thermal conductivity are significantly lowered. Therefore, the upper limit of the Ni content is preferably 5.00% by mass.
  • Co (Co: 0.05 to 2.00% by mass)
  • Co (cobalt) is finely precipitated in the matrix of Cu as a precipitate of second-phase particles composed of a simple substance or a compound with Si, for example, in a size of about 50 to 500 nm, and this precipitate is formed.
  • It is a component having an action of precipitation hardening by suppressing dislocation movement, further suppressing grain growth, and increasing material strength by refining crystal grains.
  • the Co content is preferably 0.05% by mass or more.
  • the upper limit of the Co content is preferably 2.00% by mass or less.
  • Si (Si: 0.05 to 1.10% by mass) Si (silicon) is finely precipitated in the matrix of Cu as a precipitate of second-phase particles composed of compounds together with Ni and Co, and this precipitate is precipitated and hardened by suppressing dislocation movement. Furthermore, it is an important component having an action of suppressing grain growth and increasing the material strength by refining the crystal grains.
  • the Si content is preferably 0.05% by mass or more.
  • the Si content exceeds 1.10% by mass, the conductivity and the thermal conductivity are significantly lowered. Therefore, the upper limit of the Si content is preferably 1.10% by mass.
  • Cr 0.05 to 0.50% by mass
  • Cr Cr (chromium) is finely precipitated in the matrix of Cu as a compound or a single substance in the form of a precipitate having a size of, for example, about 10 to 500 nm, and this precipitate suppresses dislocation movement. It is a component that has the effect of precipitating and hardening, further suppressing grain growth, and increasing the material strength by refining the crystal grains.
  • the Cr content is preferably 0.05% by mass or more. Further, when the Cr content exceeds 0.50% by mass, the conductivity and the thermal conductivity are significantly lowered. Therefore, the Cr content is preferably 0.05 to 0.50% by mass.
  • Sn (tin) is a component that is solid-solved in the matrix of Cu and contributes to the improvement of the strength of the Cu alloy, and the Sn content is preferably 0.05% by mass or more.
  • the Sn content is preferably 0.05 to 9.50% by mass.
  • the Sn content is set to 0.05 to 0.50% by mass in the case of suppressing the decrease in the conductivity and the thermal conductivity. Is more preferable.
  • Zn (zinc) is a component having an effect of improving the adhesion and migration characteristics of Sn plating and solder plating.
  • the Zn content is preferably 0.05% by mass or more.
  • the Zn content is preferably 0.05 to 0.50% by mass.
  • Mg 0.01 to 0.50% by mass
  • Mg magnesium
  • the Mg content is preferably 0.01% by mass or more.
  • the Mg content is preferably 0.01 to 0.50% by mass.
  • P 0.01 to 0.50% by mass
  • P (phosphorus) not only contributes as a deoxidizing material for Cu alloys, but also finely precipitates in the form of precipitates having a size of about 20 to 500 nm as compounds with Fe, Ni, etc., and these precipitates suppress dislocation movement. By doing so, precipitation hardening can be performed, and further, grain growth is suppressed and the material strength can be increased by refining the crystal grains.
  • the P content is preferably 0.01% by mass or more.
  • the P content is set to 0.01 to 0.50% by mass.
  • the plate material is 99.96% or more Cu and, as unavoidable impurities, for example, Cd, Mg, Pb, Sn, Cr, Bi, Se, Te. Is preferably 5 ppm or less in total, and pure Cu having a component composition in which Ag and O are each 400 ppm or less is preferable.
  • a plurality of plate materials containing 90% by mass or more of Cu are set in a state of being abutted against each other or in a state of being overlapped with each other, and then joined.
  • the spot is irradiated with a first laser beam having a wavelength of 400 to 500 nm with a spot diameter of 100 to 500 ⁇ m, and a second laser beam having a wavelength of 800 to 1200 nm is irradiated with a spot diameter of 10 to 300 ⁇ m.
  • It includes a welding step of linearly joining and integrating a plurality of plate materials by welding while injecting an inert gas containing 1 to 50 ppm of oxygen into the molten portion at a flow rate of 10 to 50 L / min.
  • an inert gas containing 1 to 50 ppm of oxygen into the molten portion at a flow rate of 10 to 50 L / min.
  • the hardness gradient was controlled by 0.1 to 10 msec / spot (in the case of a linear shape, the speed of sweeping a distance corresponding to one spot diameter, and in the case of a point shape, the irradiation time per spot).
  • the laser welding method is a welding method in which light having a wavelength with good directivity and concentration is collected by a lens and laser light having an extremely high energy density is used as a heat source.
  • penetration welding with a narrow width with respect to the depth is also possible.
  • the laser beam can be narrowed down to a very small size as compared with the arc of arc welding.
  • the laser welding device can perform local welding and joining materials with different melting points. It is suitable for fine welding because it has little heat effect due to welding, the welding pattern is fine, and no processing reaction force is generated.
  • FIG. 6 is a diagram showing an example of a schematic configuration of a laser welding apparatus.
  • the laser welding apparatus 20 includes a laser control unit 21, oscillators 221 and 222, a laser head 29, a processing table 24, and a gas supply nozzle 30.
  • Cu plate materials 111 and 112, which are the materials to be processed, are arranged on the processing table 24 in a butt or overlapped state.
  • the laser control unit 21 controls laser oscillators 221 and 222 that oscillate laser light, a scanner (not shown), a laser head 29, a processing table, and the like.
  • the control unit 21 controls the course directions of the Cu plate members 111 and 112, which are the workpieces, by controlling the rotation of the X-axis motor and the Y-axis motor (not shown), for example. Further, the control unit 21 may move and control the laser beams 231 and 232. This can be appropriately selected depending on the size of the work material.
  • the control unit 21 oscillates a plurality of first and second laser beams 231 and 232 oscillated from the oscillators 221 and 222.
  • the oscillated first and second laser beams 231 and 232 are collected in parallel light through the glass fiber 25 by the first and second condenser lenses 261 and 262 in the laser head 29, respectively.
  • the first and second laser beams 231 and 232 are changed in the direction of the processing table by the first and second mirrors 271 and 272, and the first and second laser beams 231 and 232 are passed through the focusing lens 28 to the Cu plate material 111. Welding is performed by focusing and irradiating the positions of 112 to be joined. At this time, the inert gas is supplied from the gas supply nozzle 30 in order to prevent oxidation caused by heating by the laser beam.
  • the inert gas can be appropriately selected from argon, helium, nitrogen and the like.
  • the laser can be appropriately selected from those known as welding lasers.
  • lasers include CO 2 lasers, Nd: YAG lasers, semiconductor lasers, fiber lasers and the like. It is preferable to use a fiber laser from the viewpoint of output and condensing property of laser light.
  • Other configurations of the laser welder can be selected from any conventionally known configuration.
  • FIG. 7 is a diagram showing an example of the spot diameter of the laser beam of the laser welding apparatus.
  • the first laser beam 231 having a wavelength of 400 to 500 nm is irradiated with a spot diameter of 100 to 500 ⁇ m.
  • the second laser beam 232 having a wavelength of 800 to 1200 nm is irradiated with a spot diameter of 10 to 300 ⁇ m.
  • FIG. 7 shows an example in which the first laser beam 231 and the second laser beam 232 are irradiated so as to overlap each other on the surface of the plate material.
  • the inert gas supplied to the molten part contains 10 to 50 ppm of oxygen.
  • the inert gas include nitrogen gas and argon gas.
  • the melted portion is covered with the inert gas, and an appropriate amount of oxygen is applied to the melted portion. It is presumed that it can be sent to the inside, thereby generating fine oxides to increase the hardness of the welded portion, and by quenching, an appropriate strain is introduced into the crystal grains. If the oxygen content of the inert gas is less than 10 ppm, sufficient oxygen cannot be supplied and the hardness may be low.
  • the time is 0.1 to 10 msec / spot. (In the case of a linear shape, the speed of sweeping a distance corresponding to the diameter of one spot, in the case of a point shape, the irradiation time per spot) If it is shorter than 0.1 msec, it is difficult to join and the hardness is inclined. Tends to be steep. On the other hand, if it exceeds 10 msec, the metal may be melted down from the welded portion and chipped, or the metal may be softened and the strength may be insufficient.
  • the joints between the plurality of plate materials are irradiated with the first and second laser beams 231 and 232.
  • a plurality of plate materials are joined to each other in a linear or dot shape to be integrated.
  • the first laser beam 231 that efficiently penetrates only the surface of the Cu plate material heats the Cu plate material in a wider range than the second laser light 232, and when heated, the second laser beam 232 that penetrates deeply into the Cu plate material is irradiated almost at the same time. Welding can be performed with almost no defects such as blow holes and internal defects.
  • the wavelengths and spot diameters of the first and second laser beams 231 and 232 are out of the range, the surface quality deteriorates and welding cannot be performed, which is inappropriate. Further, controlling the heating by the first laser beam 231 affects the cooling rate when the plate material is melted and solidified by the second laser beam 232, and as a result of diligent examination, it is 0.1 to 10 msec / spot or less. By doing so, it is possible to suppress changes in the hardness of the Cu plate base material, the non-welded portion, and the welded portion of the Cu plate material, and further suppress the inclination of the hardness of the non-welded portion and the welded portion of the Cu plate material to be low. understood.
  • the parts for electrical and electronic devices of the present invention can be considered to be used in semiconductor devices, LSIs, or many electronic devices using these, and further, for example, homes that need to be particularly miniaturized and highly integrated.
  • Use for electrical and electronic equipment such as game consoles, medical equipment, workstations, servers, personal computers, car navigation systems, mobile phones, robot connectors, battery terminals, jacks, relays, switches, autofocus camera modules, lead frames, etc. Is possible.
  • the component for an electric / electronic device according to an embodiment of the present invention is made of pure Cu or Cu alloy having excellent thermal conductivity, and has high strength and excellent deformation resistance, so that it is applied to a heat pipe or a vapor chamber. It is preferable to do so.
  • the parts for electric and electronic devices of other embodiments of the present invention are preferably applied to heat pipes and vapor chambers because they have high rigidity and have characteristics of less generation of cracks. In particular, since cracks are less likely to occur as a structural material for vapor chamber products, leakage and corrosion during use due to cracks are improved, which suppresses deterioration of thermal conductivity and deteriorates vapor chamber products. It can contribute to suppression and extension of life.
  • the component for an electric / electronic device is made of pure Cu or a Cu alloy having excellent thermal conductivity, and is suitable as a bus bar because of its high strength and excellent deformation resistance.
  • the bus bar can be applied as an electric path for electrically connecting and as a transportation path for heat dissipation.
  • the bus bar can also be used as a cooling device by connecting the bus bar from the heat generating portion and providing a path to the heat dissipation portion or the outside. Applicable.
  • the bus bar formed of the parts for electric / electronic devices of another embodiment of the present invention has excellent characteristics for local deformation, so that it can be used for electrically connecting electric paths and for heat dissipation. It can also be applied as a transportation route.
  • it can also be applied as a cooling device by connecting a bus bar from a heat generating portion and providing a path to a heat radiating portion or the outside.
  • Examples 1 to 6 and Comparative Examples 1 to 9 Joining of two same plates made of pure Cu Examples 1 to 5 and Comparative Examples 1 to 9 are made of pure Cu having the component composition shown in Table 1.
  • Two plates were cut out to a thickness of 0.15 mm, a width of 20 mm, and a length of 1000 mm. The two cut out plates were moved in a direction in which the end faces extending in the length direction were brought closer to each other, and arranged in a butt state as shown in FIG. 1 (a).
  • the first laser beam having a wavelength of 400 to 500 nm and a spot diameter (hereinafter, may be referred to as “beam diameter”) of 100 to 500 ⁇ m, and a wavelength of 800 to 1200 nm and a spot diameter of 10 to 300 ⁇ m.
  • the second laser beam was laser-welded while maintaining the positional relationship of the spot diameters as shown in FIG.
  • the laser conditions are shown in Table 1.
  • Laser welding was performed while supplying the fused portion with an inert gas containing oxygen as shown in Table 1.
  • the inert gas a mixed gas of G1 grade nitrogen gas manufactured by Taiyo Nippon Sanso and oxygen gas was used.
  • Example 6 instead of the butt arrangement, the overlapping arrangement shown in FIG. 1 (b) was used, and laser welding was performed under the same conditions as in Example 1.
  • the Vickers hardness and the GAM value of the welded portion were measured by the following methods. The results are shown in Table 1. Further, in Table 1, the area ratio to all the crystal grains existing in the measured area of the crystal grains having the Vickers hardness Hv1 of 60 or more and the GAM value of 0.5 ° or more and less than 2.0 ° is 25%. The above cases are described as " ⁇ " as having excellent deformation resistance characteristics, and the crystal grains having a Vickers hardness Hv1 of 60 or more and a GAM value of 0.5 ° or more and less than 2.0 ° are described.
  • Example 6 When the linear direction is the Z-axis direction, the Vickers hardness Hv1 at the position b corresponding to half the thickness a of the plate material of the welded portion existing in the cross section A when the welded portion is cut in the Y-axis direction. was measured. Measurements were made on five cross sections A (YZ planes) cut at intervals of 1 mm in the welding direction (X-axis direction), and the average values of those measurement results were obtained. In Example 6 was superimposed a plate, as shown in FIG.
  • the GAM value is analyzed from the crystal orientation data continuously measured using the EBSD detector attached to the high-resolution scanning analysis electron microscope (JSM-7001FA, manufactured by Nippon Denshi Co., Ltd.) (OIM Analysis, manufactured by TSL). It was obtained from the crystal orientation analysis data calculated using. The measurement was performed with a step size of 0.1 ⁇ m. The measurement region is the entire rectangular region of the surfaces of the cross sections A, A 1 , and A 2 which is divided by the weld width of the welded portion and the thickness of the plate material on the surface mirror-finished by electrolytic polishing.
  • the area ratio of crystal grains with GAM values within the specified range is defined as the first category with GAM values of 0 ° or more and less than 0.25 °, 15 categories in 0.25 ° increments, and 0 ° or more and less than 3.75 °.
  • the GAM value was used as a measurement target, and it was calculated from the total area ratio of crystal grains in each category to the entire SEM image obtained by the SEM-EBSD method.
  • Example 6 the average value of the area ratio of the crystal grains of the GAM value measured for each of the two plate materials was obtained, and the average value is shown in Table 1.
  • a first laser beam having a wavelength of 400 to 500 nm is irradiated with a spot diameter of 100 to 500 ⁇ m, and 800 to 1200 nm. While irradiating a second laser beam having a wavelength with a spot diameter of 10 to 300 ⁇ m and injecting an inert gas containing 1 to 50 ppm of oxygen into the molten portion at a flow rate of 10 to 50 L / min, 0.1 to 3 msec. It can be seen that the Vickers hardness Hv1 of the welded portion can be set to 60 or more by welding at the spot.
  • the Vickers hardness Hv1 was 65 or more, which was particularly high. Further, it can be seen that when the irradiation time is 2 msec or more, the inclination becomes small.
  • Comparative Example 1 in which the oxygen content of the inert gas was less than 10 ppm, the Vickers hardness was low. Further, in Comparative Example 2 in which the oxygen content of the inert gas was more than 50 ppm and Comparative Example 3 in which the flow rate of the inert gas was less than 10 L / min, internal oxidation became excessive and embrittlement occurred, resulting in great damage.
  • Comparative Example 4 in which the flow rate of the inert gas was more than 50 L / min, poor solidification occurred and the thickness of the welded portion was greatly reduced.
  • Comparative Example 5 in which the laser conditions are such that the first laser beam having a wavelength of 400 to 500 nm is irradiated with a spot diameter of 100 to 500 ⁇ m and the second laser beam having a wavelength of 800 to 1200 nm is not irradiated with a spot diameter of 10 to 300 ⁇ m.
  • the plates made of pure Cu could not be joined to each other.
  • Example 7 to 26 and Comparative Examples 10 to 12 Joining of two same plates made of Cu alloy In Examples 7 to 26 and Comparative Examples 10 to 12, 2 made of Cu alloy having the component composition shown in Table 2. The same procedure as in Example 1 was carried out except that the sheets were welded under the welding conditions shown in Table 2. The results are shown in Table 2.
  • a first laser beam having a wavelength of 400 to 500 nm is irradiated with a spot diameter of 100 to 500 ⁇ m, and 800 to 1200 nm.
  • a second laser beam having a wavelength is irradiated with a spot diameter of 10 to 300 ⁇ m, and an inert gas containing 1 to 50 ppm of oxygen is injected into the molten portion at a flow rate of 10 to 50 L / min at a flow rate of 0.2 to 10 msec / min. It can be seen that the Vickers hardness Hv1 of the welded portion can be set to 60 or more by welding at the spot.
  • the Vickers hardness of the welded portion with respect to the plate material is obtained.
  • the Vickers hardness of the welded portion (Vickers hardness of the welded portion / Vickers hardness of the plate material) could be set to 0.5 or more, and the decrease in the Vickers hardness of the welded portion could be particularly suppressed.
  • Comparative Example 10 since the amount of oxygen was small, the strength of the welded portion could not be increased, and in Comparative Example 11, the irradiation time was short, so welding was not performed. Further, in Comparative Example 12, since the irradiation time was long, the welded portion was melted down, and the wall thickness was reduced, so that a clean cross section could not be obtained.
  • Example 27 Joining of two plates made of pure Cu and having different component compositions
  • a plate made of a Cu alloy having the component composition shown in Table 3 was used, and the welding conditions shown in Table 3 were used. It was the same as in Example 1 (butting) except that it was welded in.
  • Example 28 a plate material made of a Cu alloy having the component composition shown in Table 3 was used, and the same as in Example 6 (superimposition) except that welding was performed under the welding conditions shown in Table 3.
  • the plates shown in the upper part of Table 3 were overlapped so as to be on the laser irradiation side. The results are shown in Table 3.
  • a first laser beam having a wavelength of 400 to 500 nm is irradiated with a spot diameter of 100 to 500 ⁇ m, and 800.
  • a second laser beam having a wavelength of about 1200 nm is irradiated with a spot diameter of 10 to 300 ⁇ m, and an inert gas containing 1 to 50 ppm of oxygen is injected into the molten portion at a flow rate of 10 to 50 L / min at 1 msec / spot. It can be seen that the Vickers hardness Hv1 of the welded portion can be set to 60 or more by welding with the irradiation time of.
  • Example 29 to 31 Joining of two plates made of Cu alloy and having different composition compositions
  • the plates made of Cu alloy having the composition shown in Table 4 are used and are shown in Table 4.
  • the same as in Example 1 was carried out except that the welding was performed under the welding conditions. The results are shown in Table 4.
  • a first laser beam having a wavelength of 400 to 500 nm is irradiated with a spot diameter of 100 to 500 ⁇ m, and 800.
  • a second laser beam having a wavelength of about 1200 nm is irradiated with a spot diameter of 10 to 300 ⁇ m, and an inert gas containing 1 to 50 ppm of oxygen is injected into the molten portion at a flow rate of 10 to 50 L / min at 1 msec / spot. It can be seen that the Vickers hardness Hv1 of the welded portion can be set to 60 or more by welding with the irradiation time of.
  • Example 32 Welding of a plate material made of pure Cu and a plate material made of Cu alloy
  • Example 32 a plate material made of pure Cu having the component composition shown in Table 5 and a plate material made of Cu alloy are used. The same as in Example 1 (butting) except that the welding was performed under the welding conditions described in 5.
  • Example 33 a plate material made of pure Cu having the component composition shown in Table 5 and a plate material made of a Cu alloy were used and welded under the welding conditions shown in Table 5, but in Example 6 (superimposition). I did the same.
  • the first plate materials shown in the upper part of Table 5 were overlapped so as to be on the laser irradiation side. The results are shown in Table 5.
  • the first laser beam having a wavelength of 400 to 500 nm is irradiated with a spot diameter of 100 to 500 ⁇ m, and 800.
  • a second laser beam having a wavelength of about 1200 nm is irradiated with a spot diameter of 10 to 300 ⁇ m, and an inert gas containing 1 to 50 ppm of oxygen is injected into the molten portion at a flow rate of 10 to 50 L / min at 1 msec / spot. It can be seen that the Vickers hardness Hv1 of the welded portion can be set to 60 or more by welding with the irradiation time of. It was
  • the hardness of the welded portion can be controlled to 60 or more, and in addition, the welded portion and the non-welded portion are not welded.
  • the hardness inclination ratio of the portion is 0.2 / ⁇ m or less, it becomes more resistant to deformation, and it can be seen that there is no practical problem. Therefore, according to the present invention, in an electric / electronic device component having a welded portion such as a vapor chamber or a bus bar, the hardness of the welded portion / non-welded portion is controlled to have rigidity and locality at the welded portion. It can be seen that parts for electrical and electronic equipment that are resistant to deformation can be obtained.

Abstract

Provided is a component for electrical/electronic equipment, the component having a plurality of sheet materials that are joined by welding, the sheet materials comprising copper-based materials, wherein the strength of a welded section is high. The component for electrical/electronic equipment is configured by a plurality of sheet materials containing 90 mass% or more of Cu, and has a welded section at which the plurality of sheet materials are joined and integrated through welding in a linear or dot shape in a state of being mutually abutted or overlapped. The welded section extends across the entire thickness of the sheet materials, and in a cross section when the welded section is cut in the direction in which the plurality of joined sheet materials extend, the welded section has a Vickers hardness of 60 or more when measured at a position corresponding to a dimension of half the thickness of the sheet materials.

Description

電気・電子機器用部品Parts for electrical and electronic equipment
 本発明は、電気・電子機器用部品に関する。 The present invention relates to parts for electrical and electronic devices.
 近年、電気・電子機器の高機能化、高性能化によって発熱量が増加する傾向がある。また、電気・電子機器の小型化が進むことで、発熱密度が増加するため、発生した熱を冷却することが重要になってきている。発生した熱を冷却するための部材としては、例えば、面状のヒートパイプであるベーパーチャンバが挙げられる。ベーパーチャンバの素材としては、高い熱伝導率を有する銅系材料(純銅、銅合金)を用いることが望まれる。 In recent years, the amount of heat generated tends to increase due to higher functionality and higher performance of electrical and electronic equipment. In addition, as the miniaturization of electric and electronic devices progresses, the heat generation density increases, so it is becoming important to cool the generated heat. Examples of the member for cooling the generated heat include a vapor chamber which is a planar heat pipe. As the material of the vapor chamber, it is desirable to use a copper-based material (pure copper, copper alloy) having high thermal conductivity.
 ここで、ベーパーチャンバは、複数枚の板を重ねた状態で外周部を接合して形成した内部空間に作動液を入れ、その後、減圧封入することによって接合された密閉構造を有する。かかる接合方法としては、例えば、レーザ溶接、抵抗溶接、拡散接合、TIG溶接が挙げられる。
 これら溶接で接合される場合、溶接部は、高温に加熱されることにより一度溶融させた後に再凝固させることによって形成されるため、板材に焼きなましをした場合と同様、軟質化して、板材自体の強度よりも軟質化して強度が低くなるという問題がある。強度が低くなると、変形しやすくなる。
Here, the vapor chamber has a closed structure in which a working liquid is put into an internal space formed by joining the outer peripheral portions in a state where a plurality of plates are stacked, and then sealed under reduced pressure. Examples of such a joining method include laser welding, resistance welding, diffusion welding, and TIG welding.
When joining by these welds, the welded part is formed by melting once by heating to a high temperature and then re-solidifying, so that it is softened and the plate itself is softened as in the case of annealing. There is a problem that it becomes softer than the strength and the strength becomes low. The lower the strength, the easier it is to deform.
 このような問題に対して、特許文献1には、複数の部品を拡散接合やろう付けで接合してベーパーチャンバを製造する方法において、筐体の素材として析出硬化型銅合金を用い、時効処理して析出硬化させることで、筐体の強度等を向上させる技術が開示されている。
 しかしながら、特許文献1の技術では、析出硬化型銅合金を用いる必要があり、非析出型銅合金や、純銅には適用できないという問題がある。また、特許文献1の技術では、時効処理を行う必要があり、工程数増加に伴う生産性の低下が生じるという問題がある。
 このため、析出硬化型銅合金を用い時効処理して析出硬化させる方法以外の方法によって、溶接部の強度を高くすることが望まれる。
To deal with such problems, Patent Document 1 describes a method of manufacturing a vapor chamber by joining a plurality of parts by diffusion joining or brazing, using a precipitation hardening copper alloy as a material of a housing and aging treatment. Then, a technique for improving the strength of the housing and the like by precipitation hardening is disclosed.
However, in the technique of Patent Document 1, it is necessary to use a precipitation hardening type copper alloy, and there is a problem that it cannot be applied to a non-precipitation type copper alloy or pure copper. Further, in the technique of Patent Document 1, it is necessary to perform aging treatment, and there is a problem that productivity is lowered due to an increase in the number of steps.
Therefore, it is desired to increase the strength of the welded portion by a method other than the method of precipitation hardening using a precipitation hardening type copper alloy by aging treatment.
 上述した溶接部の強度が低くなるという問題は、ベーパーチャンバに限らず、バスバー等のその他の電気・電子機器においても同様に存在する。 The above-mentioned problem of low strength of the welded portion exists not only in the vapor chamber but also in other electric / electronic devices such as a bus bar.
 なお、特許文献2には、レーザを特定の軌跡で照射することにより、接合強度を向上させる技術が開示されているが、特許文献2の技術は、アルミと銅との接合に関する技術であり、銅系材料同士の接合には適用し難い。詳述すると、銅系材料は、熱伝導率が高いため熱が逃げやすく、また、レーザ光が反射しやすいため、銅系材料は、レーザ溶接による接合をし難い材料である。このため、特許文献2のように、レーザ光を用いた単純な溶接では、接合強度が低く十分に接合できない。 Note that Patent Document 2 discloses a technique for improving the bonding strength by irradiating a laser with a specific trajectory, but the technique of Patent Document 2 is a technique relating to bonding between aluminum and copper. It is difficult to apply to joining copper-based materials. More specifically, the copper-based material has a high thermal conductivity, so that heat easily escapes, and the laser beam is easily reflected. Therefore, the copper-based material is a material that is difficult to join by laser welding. Therefore, as in Patent Document 2, simple welding using a laser beam has low bonding strength and cannot be sufficiently bonded.
国際公開第2017/164013号International Publication No. 2017/164013 特開2017-168340号公報Japanese Unexamined Patent Publication No. 2017-168340
 本発明は、以上の実情に鑑みてなされたものであり、銅系材料からなる複数の板材が溶接により接合された電気・電子機器用部品であって、溶接部の強度が高い電気・電子機器用部品を提供することを課題とする。
 また、本発明は、ベーパーチャンバやバスバーなどの溶接部を有する電気・電子機器用部品において、溶接された板材の硬さおよび板材全体の硬さの傾斜を制御することによって、剛性があり、かつ、溶接部が局所変形し難い電気・電子機器用部品を提供することを課題とする。
The present invention has been made in view of the above circumstances, and is a component for an electric / electronic device in which a plurality of plates made of a copper-based material are joined by welding, and the electric / electronic device having a high weld strength. The subject is to provide parts for use.
Further, the present invention is rigid and rigid by controlling the hardness of the welded plate material and the inclination of the hardness of the entire plate material in the parts for electric / electronic equipment having a welded portion such as a vapor chamber and a bus bar. It is an object of the present invention to provide parts for electric / electronic equipment in which welded portions are not easily deformed locally.
 本発明者らは、鋭意検討を重ねた結果、90質量%以上のCuを含有する成分組成の板材を用い、レーザ溶接条件を制御することで、溶接部のビッカース硬さHVを高くできることを見出し、また、本発明者らは、溶接部から非溶接部に適切な硬さ、およびその硬さの傾斜を制御することによって、剛性があり、かつ、溶接部が局所変形し難くなることを見出し、本発明の電気・電子機器用部品を完成するに至った。 As a result of diligent studies, the present inventors have found that the Vickers hardness HV of the weld can be increased by controlling the laser welding conditions using a plate material having a component composition containing 90% by mass or more of Cu. Further, the present inventors have found that by controlling the appropriate hardness from the welded portion to the non-welded portion and the inclination of the hardness, the welded portion is rigid and the welded portion is less likely to be locally deformed. , The parts for electric and electronic devices of the present invention have been completed.
 すなわち、本発明の要旨構成は以下のとおりである。
(1)90質量%以上のCuを含有する複数の板材で構成され、前記複数の板材同士を、互いに突き合わせた状態又は重ね合わせた状態で溶接により線状又は点状に接合して一体化する溶接部を有し、前記溶接部は、前記板材の厚さ全体に亘って延在し、接合された前記複数の板材が延在する方向に前記溶接部を切断したときの断面にて、前記溶接部は、溶接痕の幅である溶接幅の中央で前記板材の厚さの半分の寸法に相当する位置において測定したときのビッカース硬さHV1が、60以上である電気・電子機器用部品。
(2)前記断面において、前記溶接部の溶接幅と前記板材の厚さとで区画される長方形の領域にて、SEM-EBSD法の結晶方位解析データから得られるGAM値を測定したとき、前記GAM値が0.5°以上2.0°未満である結晶粒は、測定面積に存在する全ての結晶粒に対する面積割合が25%以上である、(1)に記載の電気・電子機器用部品。
(3)90質量%以上のCuを含有する複数の板材で構成され、
前記複数の板材同士を、互いに突き合わせた状態又は重ね合わせた状態で溶接により線状又は点状に接合して一体化する溶接部を有し、前記溶接部は、前記板材の厚さ全体に亘って延在し、接合された前記複数の板材が延在する方向に前記溶接部を切断したときの断面にて、板材表面の溶接痕の幅である溶接幅の中央で前記板材の厚さの半分の寸法に相当する位置において測定したときの前記溶接部におけるビッカース硬さをHV1とし、
 前記溶接部の中心位置から溶接半幅の1.5倍に相当する距離だけ、溶接幅の方向に沿って離隔した位置で測定したときの前記非溶接部におけるビッカース硬さをHV2とするとき、前記非溶接部でのビッカース硬さHV2が75以上であり、前記非溶接部でのビッカース硬さHV2と、前記溶接部でのビッカース硬さHV1との差を、ビッカース硬さHV1およびHV2を測定した位置間の圧痕距離X(μm)で除したときの硬さ傾斜率((HV2-HV1)/X)が、0.2/μm以下である、(1)又は(2)に記載の電気・電子機器用部品。
(4)前記板材が、Ag、Fe、Ni、Co、Si、Cr、Sn、Zn、MgおよびPからなる群より選択される1種以上の元素を含む、(1)~(3)のいずれか1つに記載の電気・電子機器用部品。
(5)前記板材が、99.96質量%以上のCuおよび不可避不純物である、(1)~(3)のいずれか1つに記載の電気・電子機器用部品。
(6)前記電気・電子機器用部品がベーパーチャンバである、(1)~(5)のいずれか1つに記載の電気・電子機器用部品。
(7)前記電気・電子機器用部品がバスバーである、(1)~(5)のいずれか1つに記載の電気・電子機器用部品。
That is, the gist structure of the present invention is as follows.
(1) It is composed of a plurality of plate materials containing 90% by mass or more of Cu, and the plurality of plate materials are joined and integrated by welding in a state of being abutted against each other or in a state of being overlapped with each other. The welded portion has a welded portion, and the welded portion extends over the entire thickness of the plate material, and the welded portion is cut in a direction in which the plurality of joined plate materials extend. The welded portion is a component for electrical and electronic equipment having a Vickers hardness HV1 of 60 or more when measured at a position corresponding to half the thickness of the plate material at the center of the weld width, which is the width of the weld mark.
(2) When the GAM value obtained from the crystal orientation analysis data of the SEM-EBSD method is measured in the rectangular region defined by the welding width of the welded portion and the thickness of the plate material in the cross section, the GAM is measured. The component for electrical / electronic equipment according to (1), wherein the crystal grains having a value of 0.5 ° or more and less than 2.0 ° have an area ratio of 25% or more to all the crystal grains existing in the measurement area.
(3) It is composed of a plurality of plate materials containing 90% by mass or more of Cu.
It has a welded portion in which the plurality of plate materials are joined to each other in a linear or dot shape by welding in a state of being abutted against each other or overlapped with each other, and the welded portion covers the entire thickness of the plate material. The thickness of the plate material at the center of the weld width, which is the width of the weld mark on the surface of the plate material, in the cross section when the welded portion is cut in the direction in which the plurality of plate materials are extended and joined. The Vickers hardness at the weld when measured at a position corresponding to half the dimension is defined as HV1.
When the Vickers hardness in the non-welded portion measured at a position separated along the direction of the weld width by a distance corresponding to 1.5 times the weld half width from the center position of the welded portion is HV2, the above. The Vickers hardness HV2 in the non-welded portion was 75 or more, and the difference between the Vickers hardness HV2 in the non-welded portion and the Vickers hardness HV1 in the welded portion was measured by measuring the Vickers hardness HV1 and HV2. The electricity according to (1) or (2), wherein the hardness inclination rate ((HV2-HV1) / X) when divided by the indentation distance X (μm) between the positions is 0.2 / μm or less. Parts for electronic devices.
(4) Any of (1) to (3), wherein the plate material contains one or more elements selected from the group consisting of Ag, Fe, Ni, Co, Si, Cr, Sn, Zn, Mg and P. Parts for electrical and electronic equipment described in one.
(5) The component for electrical / electronic equipment according to any one of (1) to (3), wherein the plate material is 99.96% by mass or more of Cu and unavoidable impurities.
(6) The component for electrical / electronic equipment according to any one of (1) to (5), wherein the component for electrical / electronic equipment is a vapor chamber.
(7) The component for electrical / electronic equipment according to any one of (1) to (5), wherein the component for electrical / electronic equipment is a bus bar.
 本発明によれば、90質量%以上のCuを含有する銅系材料からなる複数の板材が溶接により接合された電気・電子機器用部品であって、溶接部の強度が高い電気・電子機器用部品を提供することができる。
 また、本発明によれば、溶接部で適切な硬さを得て、かつ、溶接部から非溶接部への間で硬さの傾斜を制御することで、剛性があり、かつ、溶接部が局所変形し難い電気・電子機器用部品を提供することができる。
According to the present invention, a component for electrical / electronic equipment in which a plurality of plates made of a copper-based material containing 90% by mass or more of Cu are joined by welding, and for electrical / electronic equipment having a high weld strength. Parts can be provided.
Further, according to the present invention, by obtaining an appropriate hardness at the welded portion and controlling the inclination of the hardness between the welded portion and the non-welded portion, the welded portion is rigid and the welded portion is formed. It is possible to provide parts for electrical and electronic devices that are not easily deformed locally.
(a)は、本発明の一の実施形態となる電気・電子機器用部品を構成する2枚のCu板材を突き合わせた状態で線状にレーザ溶接したときの概略斜視図であり、(b)は、本発明の一の実施形態となる電気・電子機器用部品を構成する2枚のCu板材を重ね合わせた状態で線状にレーザ溶接したときの概略斜視図である。(A) is a schematic perspective view of two Cu plates constituting the parts for electric / electronic devices according to the embodiment of the present invention, which are linearly laser-welded in a state of being butted against each other, and (b). Is a schematic perspective view of two Cu plates constituting the parts for electric / electronic devices according to the embodiment of the present invention, which are linearly laser-welded in a state of being overlapped with each other. 突き合わせたCu板材をレーザ溶接したCu接合体(2枚のCu板材の接合体)のレーザを照射した側の表面状態をZ軸上から観察したときの光学顕微鏡写真である。It is an optical micrograph when observing the surface state of the laser-irradiated side of a Cu joint body (a joint body of two Cu plate materials) obtained by laser-welding a butt Cu plate material from the Z-axis. 突き合わせたCu板材をレーザ溶接したCu接合体のレーザを照射した側とは反対側の表面状態を観察したときの光学顕微鏡写真である。It is an optical micrograph when observing the surface state of the Cu junction body which laser-welded the butt Cu plate material on the side opposite to the side irradiated with the laser. Cu板材をレーザ溶接したCu接合体の断面状態をX軸上から観察したときの光学顕微鏡写真である。It is an optical micrograph when observing the cross-sectional state of the Cu joint body which laser-welded the Cu plate material from the X-axis. (a)は、2枚のCu板材を突き合わせた状態で点状にレーザ溶接したときの概略斜視図、(b)は、2枚のCu板材を重ね合わせた状態で点状にレーザ溶接したときの概略斜視図であって、いずれも溶接部を、Cu接合体が延在する方向に切断したときの断面が見えるような状態で示す。(A) is a schematic perspective view when two Cu plates are abutted and laser-welded in a dot shape, and (b) is a case where two Cu plates are laser-welded in a dot-like state in a superposed state. It is a schematic perspective view of the above, and in each case, the welded portion is shown in a state where the cross section can be seen when the Cu joint is cut in the extending direction. レーザ溶接装置の概略構成を示す図である。It is a figure which shows the schematic structure of the laser welding apparatus. レーザ溶接装置のレーザ光のスポット径を示す図である。It is a figure which shows the spot diameter of the laser beam of a laser welding apparatus. (a)は、本発明の他の実施形態となる電気・電子機器用部品を構成する2枚のCu板材を突き合わせた状態で線状に接合したときの概略斜視図であり、(b)は、本発明の他の実施形態となる電気・電子機器用部品を構成する2枚のCu板材を重ね合わせた状態で線状に接合したときの概略斜視図である。(A) is a schematic perspective view when two Cu plates constituting parts for electric / electronic devices according to another embodiment of the present invention are linearly joined in a state of being butted against each other, and (b) is a schematic perspective view. It is a schematic perspective view when the two Cu plates constituting the parts for electric / electronic devices according to another embodiment of the present invention are joined in a linear manner in a state of being overlapped with each other. 接合したCu板材の断面状態を観察したときの光学顕微鏡写真である。It is an optical micrograph when observing the cross-sectional state of the bonded Cu plate material.
 以下に、本発明の実施の形態を説明する。以下の説明は、本発明における実施の形態の例であって、特許請求の範囲を限定するものではない。 Hereinafter, embodiments of the present invention will be described. The following description is an example of an embodiment of the present invention and does not limit the scope of claims.
 本発明の一の実施形態となる電気・電子機器用部品は、90質量%以上のCuを含有する複数の板材で構成され、複数の板材同士を、互いに突き合わせた状態又は重ね合わせた状態で溶接により線状又は点状に接合して一体化する溶接部を有し、溶接部は、板材の厚さ全体に亘って延在し、接合された複数の板材が延在する方向に溶接部を切断したときの断面にて、溶接部は、板材の厚さの半分の寸法に相当する位置において測定したときのビッカース硬さが、60以上である。 The component for electric / electronic equipment according to an embodiment of the present invention is composed of a plurality of plate materials containing 90% by mass or more of Cu, and the plurality of plate materials are welded in a state of being abutted against each other or in a state of being overlapped with each other. It has a welded part that is joined and integrated in a linear or dot shape, and the welded part extends over the entire thickness of the plate material, and the welded part extends in the direction in which the plurality of joined plate materials extend. In the cross section when cut, the welded portion has a Vickers hardness of 60 or more when measured at a position corresponding to a dimension of half the thickness of the plate material.
 図1(a)は、2枚のCu板材1、2を突き合わせた状態で線状にレーザ溶接してCu接合体10(2枚のCu板材の接合体)を形成したときの概略斜視図であり、図1(b)は、2枚のCu板材1、2を重ね合わせた状態で線状にレーザ溶接してCu接合体10Aを形成したときの概略斜視図である。図1(a)に示す実施態様では、Cu板材1、2同士を突き合わせた状態で線状に接合して一体化する溶接部3を有し、その部分をレーザ溶接で接合している。また、図1(b)に示す実施態様では、Cu板材1、2を重ね合わせた状態で一体化する溶接部3Aを有し、その部分をレーザ溶接で接合している。そして、溶接部3は、板材1、2の厚さ全体に亘って延在している。すなわち、図1(a)及び図1(b)においては、溶接部3は、レーザを照射した側の表面から反対側の表面(裏面)まで溶け込むように溶融し凝固して、板材1、2を厚さ方向に貫通するように存在している。なお、ここでいう「Cu板材」とは、90質量%以上のCu(銅)を含有する板材を意味する。 FIG. 1A is a schematic perspective view when a Cu joint body 10 (a joint body of two Cu plate materials) is formed by laser welding linearly with two Cu plate materials 1 and 2 abutted against each other. FIG. 1B is a schematic perspective view of a Cu bonded body 10A formed by linear laser welding in a state where two Cu plates 1 and 2 are overlapped with each other. In the embodiment shown in FIG. 1 (a), there is a welded portion 3 in which the Cu plate members 1 and 2 are joined together in a linear manner in a state of being butted against each other, and the portions are joined by laser welding. Further, in the embodiment shown in FIG. 1 (b), there is a welded portion 3A in which Cu plate materials 1 and 2 are integrated in a superposed state, and the portions are joined by laser welding. The welded portion 3 extends over the entire thickness of the plate members 1 and 2. That is, in FIGS. 1 (a) and 1 (b), the welded portion 3 is melted and solidified so as to melt from the surface on the side irradiated with the laser to the surface (back surface) on the opposite side, and the plate materials 1 and 2 are formed. Exists so as to penetrate in the thickness direction. The term "Cu plate material" as used herein means a plate material containing 90% by mass or more of Cu (copper).
 ここで、「90質量%以上のCuを含有する板材」は、Cuの含有量が90質量%以上である板材であればよく、純CuでもいずれのCu合金でもよく、特に限定はされない。
 板材がCu合金の場合には、板材は、合金成分としてAg、Fe、Ni、Co、Si、Cr、Sn、Zn、Mg、Pから選ばれる1種から2種以上の元素を含み残部のCuが90質量%以上である成分組成を有することが好ましい。Cu合金は、析出硬化型Cu合金でも、非析出硬化型Cu合金でもよい。板材がCu合金の場合、板材のビッカース硬さHVは、添加する合金成分の種類や添加量によっても異なるため、特に限定はしないが、例えば、一般的には75以上240以下である。
 また、板材が純Cuの場合には、板材は、Cuの含有量が99.96質量%以上であり、不可避不純物としてのCd、Mg、Pb、Sn、Cr、Bi、Se及びTeが合計5ppm以下かつAg及びOの合計が400ppm以下である。純Cuでは、熱伝導性に優れているため放熱・冷却部材として優れた性能を発揮することができる。なお、いわゆる純Cuは、電気銅、無酸素銅(OFC)、TPC等を例に挙げることができる。板材が純Cuの場合、板材のビッカース硬さは、特に限定はしないが、例えば、一般的には65以上120以下である。
Here, the "plate material containing 90% by mass or more of Cu" may be any plate material having a Cu content of 90% by mass or more, and may be pure Cu or any Cu alloy, and is not particularly limited.
When the plate material is a Cu alloy, the plate material contains one to two or more elements selected from Ag, Fe, Ni, Co, Si, Cr, Sn, Zn, Mg, and P as alloy components, and the balance of Cu. It is preferable to have a component composition in which is 90% by mass or more. The Cu alloy may be a precipitation hardening type Cu alloy or a non-precipitation hardening type Cu alloy. When the plate material is a Cu alloy, the Vickers hardness HV of the plate material is not particularly limited because it varies depending on the type and amount of the alloy component to be added, but is generally 75 or more and 240 or less.
When the plate material is pure Cu, the plate material has a Cu content of 99.96% by mass or more, and Cd, Mg, Pb, Sn, Cr, Bi, Se and Te as unavoidable impurities are 5 ppm in total. The total of Ag and O is 400 ppm or less. Pure Cu has excellent thermal conductivity, so it can exhibit excellent performance as a heat dissipation / cooling member. Examples of so-called pure Cu include electrolytic copper, oxygen-free copper (OFC), and TPC. When the plate material is pure Cu, the Vickers hardness of the plate material is not particularly limited, but is generally 65 or more and 120 or less.
 また、本発明でいう「板材」とは、所定の形状、例えば、板、条、箔、棒、平角線などに加工されたものであって、所定の厚みを有する形状のものであり、広義には条材を含む意味である。本発明において、板材の厚さ(板厚)は、特に限定されるものではないが、好ましくは0.05~1.0mm、さらに好ましくは0.1~0.8mmである。なお、接合する複数の板材の形状や板材の厚さ(板厚)は、それぞれ同じでも、異なっていてもよい。 Further, the "plate material" as used in the present invention is a material processed into a predetermined shape, for example, a plate, a strip, a foil, a rod, a flat wire, etc., and has a predetermined thickness, in a broad sense. Means to include strips. In the present invention, the thickness (plate thickness) of the plate material is not particularly limited, but is preferably 0.05 to 1.0 mm, more preferably 0.1 to 0.8 mm. The shape of the plurality of plate materials to be joined and the thickness (plate thickness) of the plate materials may be the same or different.
 図2は、突き合わせた2枚のCu板材1、2をレーザ溶接したCu接合体10のレーザを照射した側の表面状態を示す写真である。X軸方向がレーザ掃引方向、すなわち溶接方向であることを示している。また、レーザ光の照射を受けて、Cu板材の圧延の加工痕が消失している部分があることが分かる。さらに、Cu板材1、2が溶融して、再度凝固した部分があり、これを溶接部3と称している。
 図3は、突き合わせた2枚のCu板材1、2をレーザ溶接したCu接合体10のレーザを照射した側とは反対側の表面状態を観察したときの光学顕微鏡写真であり、図2の裏面の表面状態を観察したときの光学顕微鏡写真である。
 図2及び図3に示すように、溶接部3は、板材1、2の厚さ全体に亘って延在しているため、レーザ溶接の痕は、Cu接合体10のレーザを照射した側の表面(表)とレーザを照射した側とは反対側の表面(裏)に現れる。そして、通常は、図2及び図3に示すように、レーザを照射した側の表面のレーザ溶接の痕の幅は、レーザを照射した側とは反対側の表面のレーザ溶接の痕よりも広くなる。このレーザを照射した側の表面のレーザ溶接の痕の幅を、本発明における溶接幅と規定し、また点線状の断面観察位置で切断し、断面組織の観察を行った。
 図4は、Cu板材をレーザ溶接してCu接合体を形成したときの断面状態を示す光学顕微鏡写真である。図4に示すように、レーザが照射されて溶融し、再度凝固した溶接部の、レーザが照射された側の表面の幅が溶接幅に相当する。図4に示す断面図からも、溶接幅を認めることができる。
FIG. 2 is a photograph showing the surface state of the Cu-bonded body 10 obtained by laser-welding two butted Cu plates 1 and 2 on the side irradiated with the laser. It shows that the X-axis direction is the laser sweep direction, that is, the welding direction. In addition, it can be seen that there is a portion where the processing marks of rolling of the Cu plate material have disappeared due to the irradiation of the laser beam. Further, there is a portion where the Cu plate materials 1 and 2 are melted and solidified again, and this is referred to as a welded portion 3.
FIG. 3 is an optical micrograph when observing the surface state of the Cu junction 10 obtained by laser-welding two butted Cu plates 1 and 2 on the side opposite to the laser-irradiated side, and is the back surface of FIG. It is an optical micrograph when observing the surface state of.
As shown in FIGS. 2 and 3, since the welded portion 3 extends over the entire thickness of the plate materials 1 and 2, the laser welding mark is on the side irradiated with the laser of the Cu junction 10. It appears on the surface (front) and the surface (back) opposite to the side irradiated with the laser. And usually, as shown in FIGS. 2 and 3, the width of the laser welding mark on the surface on the laser-irradiated side is wider than the laser welding mark on the surface opposite to the laser-irradiated side. Become. The width of the laser welding mark on the surface irradiated with this laser was defined as the welding width in the present invention, and the cross-sectional structure was observed by cutting at the dotted cross-sectional observation position.
FIG. 4 is an optical micrograph showing a cross-sectional state when a Cu plate material is laser welded to form a Cu bonded body. As shown in FIG. 4, the width of the surface of the welded portion that has been irradiated with the laser and melted and solidified again on the side irradiated with the laser corresponds to the weld width. The welding width can also be recognized from the cross-sectional view shown in FIG.
 本発明においては、接合された2枚の板材が延在する方向に溶接部を切断したときの断面にて、溶接部は、板材の厚さの半分の寸法に相当する位置において測定したときのビッカース硬さが、60以上である。なお、本明細書において、ビッカース硬さHVは、JIS Z2244(2009)に規定の方法に準拠して測定される。 In the present invention, in the cross section when the welded portion is cut in the direction in which the two joined plates extend, the welded portion is measured at a position corresponding to half the thickness of the plate material. Vickers hardness is 60 or more. In this specification, the Vickers hardness HV is measured according to the method specified in JIS Z2244 (2009).
 詳述すると、図1(a)のように、2枚のCu板材1、2を互いに突き合わせた状態で線状に接合して一体化する溶接部3を有する場合は、溶接方向(レーザ掃引方向)をX軸方向、溶接方向に対して垂直な方向(板材の幅方向)をY軸方向、板材法線方向(板材の厚さ方向)をZ軸方向とするとき、接合された2枚の板材1、2が延在する方向Lは、板材を突き合せ状態にするため接近させる方向、すなわちY軸方向である。このような接合体10の構成を有する本実施形態の電気・電子機器用部品の場合は、Y軸方向にCu接合体10を切断したときの断面Aに存在する溶接部3は、Cu板材1、2の厚さaの半分の寸法に相当する位置bにおいて、ビッカース硬さが、60以上であることが必要である。 More specifically, as shown in FIG. 1 (a), when the welded portion 3 is provided by linearly joining and integrating the two Cu plates 1 and 2 in a state of being butted against each other, the welding direction (laser sweep direction). ) Is the X-axis direction, the direction perpendicular to the welding direction (width direction of the plate material) is the Y-axis direction, and the plate material normal direction (thickness direction of the plate material) is the Z-axis direction. The direction L in which the plate members 1 and 2 extend is the direction in which the plate members are brought closer to each other in order to bring them into a butt state, that is, the Y-axis direction. In the case of the electric / electronic device parts of the present embodiment having such a structure of the bonded body 10, the welded portion 3 existing in the cross section A when the Cu bonded body 10 is cut in the Y-axis direction is the Cu plate material 1. It is necessary that the Vickers hardness is 60 or more at the position b corresponding to the half dimension of the thickness a of 2.
 また、図1(b)のように、2枚のCu板材1、2を互いに重ね合わせた状態で線状に接合して一体化する溶接部3Aを有する場合は、接合された2枚の板材1、2が延在する方向は、溶接方向に対して垂直な方向、すなわちY軸方向である。このような接合体10Aの構成を有する本実施形態の電気・電子機器用部品の場合は、Y軸方向にCu接合体10Aを切断したときの、Cu板材1の断面Aに存在する溶接部のCu板材1の厚さaの半分の寸法に相当する位置bと、Cu板材2の断面Aに存在する溶接部のCu板材2の厚さaの半分の寸法に相当する位置bとの双方において、ビッカース硬さが60以上であることが必要である。 Further, as shown in FIG. 1 (b), when the welded portion 3A is formed by linearly joining and integrating the two Cu plates 1 and 2 in a state of being overlapped with each other, the two joined plates are joined. The direction in which 1 and 2 extend is the direction perpendicular to the welding direction, that is, the Y-axis direction. For parts for electrical and electronic equipment of the present embodiment having the configuration of such a conjugate 10A, when cutting the Cu assembly 10A in the Y axis direction, welds present in cross-section A 1 of the Cu plate 1 Position b 1 corresponding to half the size of the thickness a 1 of the Cu plate material 1 and the position corresponding to half the size of the thickness a 2 of the Cu plate material 2 of the welded portion existing in the cross section A 2 of the Cu plate material 2. in both the b 2, Vickers hardness is required to be 60 or more.
 溶接で接合される場合、溶接部は、高温に加熱されることにより一度溶融させた後に再凝固させることによって形成されるため、従来の接合方法では、板材を焼きなましをした場合と同様、軟質化して、板材自体の強度よりも軟質化して強度が低くなるという問題がある。強度が低くなると、変形しやすくなる。
 しかしながら、後述する実施例に示すように、90質量%以上のCuを含有する組成の板材を用い、レーザ溶接条件を制御することにより、溶接部の軟質化による強度低下を抑制できる。なお、レーザ溶接条件によっては、板材自体の強度よりも高くすることもできる。
 このため、本実施形態では、溶接部のビッカース硬さを60以上、さらには65以上にすることができる。溶接部のビッカース硬さが60以上であり高いため、強度が高く耐変形性に優れた電気・電子機器用部品を提供することができる。ビッカース硬さと強度には比例関係があるため、ビッカース硬さが高いと、強度が高くなる。なお、特許文献1のように時効処理を行う場合、硬化型銅合金を用いない限りは、溶接部を含むCu接合体全体が加熱されて軟化する傾向があることから、溶接部のビッカース硬さ60以上を維持することは難しいと考えられる。
When joining by welding, the welded part is formed by melting once by heating to a high temperature and then re-solidifying. Therefore, in the conventional joining method, the plate material is softened as in the case of annealing. Therefore, there is a problem that the strength becomes lower than the strength of the plate material itself. The lower the strength, the easier it is to deform.
However, as shown in Examples described later, by using a plate material having a composition containing 90% by mass or more of Cu and controlling the laser welding conditions, it is possible to suppress a decrease in strength due to softening of the welded portion. Depending on the laser welding conditions, the strength may be higher than that of the plate material itself.
Therefore, in the present embodiment, the Vickers hardness of the welded portion can be 60 or more, further 65 or more. Since the Vickers hardness of the welded portion is 60 or more, which is high, it is possible to provide parts for electric and electronic devices having high strength and excellent deformation resistance. Since there is a proportional relationship between Vickers hardness and strength, the higher the Vickers hardness, the higher the strength. When the aging treatment is performed as in Patent Document 1, the entire Cu joint including the welded portion tends to be heated and softened unless a curable copper alloy is used. Therefore, the Vickers hardness of the welded portion is present. It is considered difficult to maintain 60 or more.
 溶接部のビッカース硬さHVの上限は、特に限定されないが、純Cuの場合は、例えば90以下であり、また、Cu合金の場合は、例えば130以下である。 The upper limit of the Vickers hardness HV of the welded portion is not particularly limited, but in the case of pure Cu, it is, for example, 90 or less, and in the case of Cu alloy, it is, for example, 130 or less.
 上記では、線状にレーザ溶接したときについて説明したが、点状にレーザ溶接した場合を図5(a)及び(b)に示す。図5(a)は、2枚のCu板材1、2を突き合わせた状態で点状にレーザ溶接してCu接合体10Bを形成したときの概略斜視図であり、図5(b)は、2枚のCu板材1、2を重ね合わせた状態で点状にレーザ溶接してCu接合体10Cを形成したときの概略斜視図である。 In the above, the case of linear laser welding has been described, but the case of point laser welding is shown in FIGS. 5 (a) and 5 (b). FIG. 5 (a) is a schematic perspective view of the case where two Cu plates 1 and 2 are abutted and laser welded in a dot shape to form a Cu bonded body 10B, and FIG. 5 (b) is a schematic perspective view of 2. It is a schematic perspective view when the Cu bonded body 10C is formed by laser welding in the form of dots in the state where the Cu plate materials 1 and 2 are superposed.
 図5(a)に示すように、互いに突き合わせた状態で点状に接合して一体化する溶接部3Bを有するCu接合体10Bの構成を有する本実施形態の電気・電子機器用部品の場合は、板材表面における溶接部3Bの中心cを通り、Cu板材1、2の延在方向Lに接合体10Bを切断したときの断面Aに存在する溶接部3BのCu板材1、2の厚さaの半分の寸法に相当する位置bにおいて、ビッカース硬さが60以上であることが必要である。 As shown in FIG. 5A, in the case of the parts for electrical and electronic equipment of the present embodiment having the configuration of the Cu joint body 10B having the welded portions 3B that are joined and integrated in a dot shape in a state of being butted against each other. The thickness a of the Cu plates 1 and 2 of the welded portion 3B existing in the cross section A when the joint 10B is cut in the extending direction L of the Cu plates 1 and 2 through the center c of the welded portion 3B on the surface of the plate material. It is necessary that the Vickers hardness is 60 or more at the position b corresponding to the half dimension of.
 また、図5(b)に示すように、互いに重ね合わせた状態で点状に接合して一体化する溶接部3Bを有するCu接合体10Cの構成を有する本実施形態の電気・電子機器用部品の場合は、板材表面における溶接部の中心cを通り、板材の積層方向に溶接部を切断したときの、Cu板材1の断面Aに存在する溶接部のCu板材1の厚さaの半分の寸法に相当する位置bと、Cu板材2の断面Aに存在する溶接部のCu板材2の厚さaの半分の寸法に相当する位置bの双方において、ビッカース硬さが60以上であることが必要である。 Further, as shown in FIG. 5 (b), the parts for electrical and electronic equipment of the present embodiment having the configuration of the Cu bonded body 10C having the welded portions 3B that are joined and integrated in a dot shape in a state of being overlapped with each other. for passes through the center c of the welded portion in the plate surface, obtained by cutting the welded portion in the stacking direction of the plate, the Cu plate 1 of the welded portion present in the cross section a 1 of the Cu plate 1 having a thickness of a 1 a position b 1 corresponding to half the size, in both positions b 2 corresponding to half of the thickness dimension a 2 of Cu plate 2 of the welded portion present in the cross section a 2 of the Cu plate 2, Vickers hardness It is necessary to be 60 or more.
 なお、本明細書において、線状にレーザ溶接した場合のビッカース硬さHVは、溶接方向(X軸方向)に1mmの間隔で切断した5つの断面A(YZ面)において測定し、それらの測定結果の平均値として求める。 In the present specification, the Vickers hardness HV in the case of linear laser welding is measured in five cross sections A (YZ planes) cut at intervals of 1 mm in the welding direction (X-axis direction), and these measurements are taken. Calculate as the average value of the results.
 本発明においては、接合された複数の板材が延在する方向に溶接部を切断したときの断面において、溶接部の溶接幅と板材の厚さとで区画される長方形の領域にて、SEM-EBSD法の結晶方位解析データから得られるGAM値を測定したとき、GAM値が0.5°以上2.0°未満である結晶粒は、測定面積に存在する全ての結晶粒に対する面積割合が25%以上であることが好ましい。 In the present invention, in the cross section when the welded portion is cut in the direction in which the plurality of joined plate materials extend, the SEM-EBSD is formed in a rectangular region divided by the weld width of the welded portion and the thickness of the plate material. When the GAM value obtained from the crystal orientation analysis data of the method is measured, the crystal grains having a GAM value of 0.5 ° or more and less than 2.0 ° have an area ratio of 25% to all the crystal grains existing in the measured area. The above is preferable.
 GAM(grain average misorientation)値は、SEM-EBSD法の結晶方位解析データから得られる値であり、15°以上の方位差を有する大角度粒界で区別される結晶粒内において、測定点間の距離(以下、ステップサイズともいう)を0.1μmで測定して隣り合った測定点ごとの方位差を計算し、計算された方位差を同一結晶粒内で平均値として算出した値である。 The GAM (grain average misorientation) value is a value obtained from the crystal orientation analysis data of the SEM-EBSD method, and is a value between measurement points in a crystal grain distinguished by a large angle grain boundary having an orientation difference of 15 ° or more. The distance (hereinafter, also referred to as step size) is measured at 0.1 μm, the orientation difference between adjacent measurement points is calculated, and the calculated orientation difference is a value calculated as an average value within the same crystal grain.
 GAM値が小さいとは、結晶粒内の平均方位差が小さい、ひずみの非常に少ない均一な結晶粒である、連続的な方位勾配を有する、などを意味し、1つの結晶粒内のひずみが小さいことを示す。一方、GAM値が大きいとは、結晶粒内の平均方位差が大きいことを意味し、1つの結晶粒内のひずみが大きいことを示す。GAM値が0.5°以上2.0°未満である結晶粒は、これらの間の特性を持つ結晶粒であり、1つの結晶粒内のひずみがある程度大きいことを示す。なお、板材に焼きなましを施した場合、GAM値は、通常では0°以上0.5°未満となり、1つの結晶粒内の局所的なひずみは小さくなる。 A small GAM value means that the average orientation difference in the crystal grains is small, the uniform crystal grains have very little strain, the crystal grains have a continuous orientation gradient, and the like, and the strain in one crystal grain is Indicates that it is small. On the other hand, a large GAM value means that the average orientation difference in the crystal grains is large, and indicates that the strain in one crystal grain is large. Crystal grains having a GAM value of 0.5 ° or more and less than 2.0 ° are crystal grains having characteristics between them, and indicate that the strain in one crystal grain is large to some extent. When the plate material is annealed, the GAM value is usually 0 ° or more and less than 0.5 °, and the local strain in one crystal grain becomes small.
 このように、上記GAM値が0.5°以上2.0°未満である結晶粒の面積割合が25%以上であるようにする、すなわち、1つの結晶粒内にひずみがある程度大きい結晶粒の面積割合が25%以上であると、純Cuの場合、溶接部のビッカース硬さを65以上にすることができる。 In this way, the area ratio of the crystal grains having the GAM value of 0.5 ° or more and less than 2.0 ° is 25% or more, that is, the crystal grains having a certain degree of strain in one crystal grain. When the area ratio is 25% or more, in the case of pure Cu, the Vickers hardness of the welded portion can be 65 or more.
 上記GAM値は、0.5°以上2.0°未満である結晶粒の面積割合が45%以上であることが好ましく、65%以上であることがより好ましい。また、0.5°以上2.0°未満である結晶粒の面積割合の上限は特に限定されないが、例えば、95%以下であり、好ましくは90%以下である。 The GAM value is preferably 0.5 ° or more and less than 2.0 °, and the area ratio of the crystal grains is preferably 45% or more, more preferably 65% or more. The upper limit of the area ratio of the crystal grains having a temperature of 0.5 ° or more and less than 2.0 ° is not particularly limited, but is, for example, 95% or less, preferably 90% or less.
 GAM値は、高分解能走査型分析電子顕微鏡(日本電子株式会社製、JSM-7001FA)に付属するEBSD検出器を用いて連続して測定した結晶方位データから解析ソフト(TSL社製、OIM Analysis)を用いて算出した結晶方位解析データから得られることができる。「EBSD」とは、Electron BackScatter Diffractionの略で、走査型電子顕微鏡(SEM)内で試料である銅板材に電子線を照射したときに生じる反射電子菊池線回折を利用した結晶方位解析技術のことである。「OIM Analysis」とは、EBSDにより測定されたデータの解析ソフトである。
 本発明において、測定領域は、上記断面A、A、Aの表面について、電解研磨で鏡面仕上げされた表面において、溶接部の溶接幅と板材の厚さとで区画される長方形の領域全体である。所定範囲内のGAM値の結晶粒の面積割合は、0°以上0.25°未満のGAM値を第1区分とし、0.25°刻みで15区分、0°以上3.75°未満までのGAM値を測定対象とし、SEM-EBSD法で得られるSEM画像全体に占める各区分の結晶粒の面積割合の合計から算出することができる。
The GAM value is analyzed from the crystal orientation data continuously measured using the EBSD detector attached to the high-resolution scanning analytical electron microscope (JSM-7001FA, manufactured by Nippon Denshi Co., Ltd.) (OIM Analysis, manufactured by TSL). It can be obtained from the crystal orientation analysis data calculated using. "EBSD" is an abbreviation for Electron Backscatter Diffraction, which is a crystal orientation analysis technique using reflected electron Kikuchi line diffraction generated when a copper plate material as a sample is irradiated with an electron beam in a scanning electron microscope (SEM). Is. "OIM Analysis" is data analysis software measured by EBSD.
In the present invention, the measurement region is the entire rectangular region of the surfaces of the cross sections A, A 1 , and A 2 which is divided by the weld width of the welded portion and the thickness of the plate material on the surface mirror-finished by electrolytic polishing. be. The area ratio of crystal grains with GAM values within the specified range is defined as the first category with GAM values of 0 ° or more and less than 0.25 °, 15 categories in 0.25 ° increments, and 0 ° or more and less than 3.75 °. The GAM value is used as a measurement target, and it can be calculated from the total area ratio of crystal grains in each category to the entire SEM image obtained by the SEM-EBSD method.
 この電気・電子機器用部品に用いるCu板材は、90質量%以上のCuを含有し、他の金属元素を含むCu合金、または、99.96質量%以上のCuおよび不可避不純物である純Cuであることが好ましい。90質量%以上のCu板材を用いることで熱伝導性を備えることができる。もともと、Cuは高い熱伝導性を備えているが、添加元素が多くなり、また、第2相が現れることで熱伝導性が低下する。したがって、本実施形態の電気・電子機器用部品に用いるCu板材は、90質量%以上のCuを含有することで、熱伝導性の低下を抑え、高い強度を備えることができる。 The Cu plate material used for this component for electrical and electronic equipment is a Cu alloy containing 90% by mass or more of Cu and containing other metal elements, or 99.96% by mass or more of Cu and pure Cu which is an unavoidable impurity. It is preferable to have. Thermal conductivity can be provided by using a Cu plate material of 90% by mass or more. Originally, Cu has high thermal conductivity, but the amount of added elements increases, and the appearance of the second phase lowers the thermal conductivity. Therefore, the Cu plate material used for the parts for electric and electronic devices of the present embodiment contains 90% by mass or more of Cu, so that deterioration of thermal conductivity can be suppressed and high strength can be provided.
 さらに、溶接部を横断する方向に、一体化した複数の板材を切断したときの断面で見て、溶接部と、溶接部に隣接して位置する非溶接部とにおいて、溶接部が、板材表面の溶接痕の幅を溶接幅として、その溶接幅の中央と、非溶接部が、溶接部の中心から溶接幅の幅方向に沿って溶接幅の1.5倍の距離とで、それぞれのビッカース硬さHV1及びHV2を測定したときの、熱影響部でのビッカース硬さHV2が75以上であり、かつ、熱影響部でのビッカース硬さHV2と、溶接部でのビッカース硬さHV1との差を、ビッカース硬さHV1およびHV2を測定した位置間の圧痕距離X(μm)で除したときの数値(以下、「硬さ傾斜率」という場合がある。)((HV2-HV1)/X)が、0.2/μm以下である。 Further, when viewed in cross section when a plurality of integrated plate materials are cut in a direction crossing the welded portion, the welded portion is formed on the surface of the plate material in the welded portion and the non-welded portion located adjacent to the welded portion. The width of the weld mark is taken as the weld width, and the center of the weld width and the non-welded portion are 1.5 times the weld width along the width direction of the weld width from the center of the weld. When the hardness HV1 and HV2 are measured, the Vickers hardness HV2 at the heat-affected portion is 75 or more, and the difference between the Vickers hardness HV2 at the heat-affected portion and the Vickers hardness HV1 at the welded portion. Is divided by the indentation distance X (μm) between the positions where the Vickers hardnesses HV1 and HV2 are measured (hereinafter, may be referred to as “hardness inclination rate”) ((HV2-HV1) / X). However, it is 0.2 / μm or less.
(線状の溶接)
 図8(a) (図8の説明のみ番号を付している。)に示すように、2枚のCu板材101、102を突き合せた状態にして配置するCu部材10Dである。その突き合せた状態の中心にレーザ光を照射して掃引することで、2枚のCu板材101、102を線状に溶接して、溶接部12の中心121で突き合わされて接合する。ここでは、レーザ光を掃引することで、線状の接合部を形成する。強いレーザ光が照射された部分は、溶融した液体状のCuが形成される。その後、レーザ光が通過した後は、Cuは高い熱伝導率のために、液体状のCuが急速に冷却して固体状のCuに変化する。これが、連続的に進行すると、波状のビードを有する溶接部12が形成される。一旦溶融し凝固していることから明らかにCu板材101、102の母材11とは異なる状態となっている。さらに、その溶接部12の周囲には、熱の影響を受けてCu板材101、102の母材11の表面と異なる状態の熱影響を受けた部分13が形成される。この熱影響を受けた部分13は、熱の影響を受けてCu板材101、102の母材11の特性も変質している。熱影響を受けた部分13に対する熱は、レーザ光の照射による熱と、溶接部12から発している熱の両方がある。図8(b)に示すように、2枚のCu板材101、102を重ね合わせた状態にしてレーザ光を照射して掃引することで、Cu板材表面を線状に溶接したCu部材10Dである。十分な接合強度を得るために、重ね合ったCu板材101、102が溶接で接合されたY軸方向の幅が表面の溶接幅の1/2以上になるように溶接する。
(Linear welding)
As shown in FIG. 8A (only the description of FIG. 8 is numbered), the Cu member 10D is arranged so that the two Cu plates 101 and 102 are butted against each other. By irradiating the center of the abutted state with a laser beam and sweeping, the two Cu plates 101 and 102 are linearly welded, and the two Cu plates 101 and 102 are abutted and joined at the center 121 of the welded portion 12. Here, the laser beam is swept to form a linear joint. Melted liquid Cu is formed in the portion irradiated with the strong laser beam. After that, after the laser beam passes through the Cu, the liquid Cu rapidly cools and changes to a solid Cu due to its high thermal conductivity. When this progresses continuously, a welded portion 12 having a wavy bead is formed. Since it is once melted and solidified, it is clearly in a state different from that of the base material 11 of the Cu plate materials 101 and 102. Further, a portion 13 affected by heat is formed around the welded portion 12 in a state different from the surface of the base material 11 of the Cu plate materials 101 and 102 under the influence of heat. The heat-affected portion 13 is also affected by the heat, and the characteristics of the base material 11 of the Cu plate materials 101 and 102 are also altered. The heat to the heat-affected zone 13 includes both the heat generated by the irradiation of the laser beam and the heat generated from the welded portion 12. As shown in FIG. 8B, it is a Cu member 10D in which the surface of the Cu plate material is linearly welded by irradiating and sweeping the two Cu plate materials 101 and 102 in a state of being overlapped with each other and irradiating with a laser beam. .. In order to obtain sufficient bonding strength, the stacked Cu plates 101 and 102 are welded so that the width in the Y-axis direction of the bonded Cu plates is ½ or more of the welding width of the surface.
(点状の溶接)
 2枚のCu板材を突き合せた状態の中心を、レーザ光を掃引することなく、照射して接合することで点状の接合部を形成することができる。レーザ光の形状は、円形状、楕円形状、樽型形状、矩形型形状のいずれであってもよい。また、点状とは、破線状であっても、互いに別個に溶接部が存在する状態であればよい。点状の溶接には、突き合せた場合の接合では、Cu板材を板厚方向に貫通させても、途中で金属Cuの溶融を止めるものであってもよい。また、2枚のCu板材を重ね合わせた状態で、レーザ光を照射して点状に接合するものであってもよい。この場合も、十分な接合強度を得るために、重ね合ったCu板材が溶接で接合されたY軸方向の幅が表面の溶接幅の1/2以上になるように溶接する。
(Dot-shaped welding)
A point-shaped joint can be formed by irradiating and joining the centers of two Cu plates in a state where they are butted together without sweeping the laser beam. The shape of the laser beam may be any of a circular shape, an elliptical shape, a barrel shape, and a rectangular shape. Further, the point shape may be a broken line shape as long as the welded portions are present separately from each other. In the point-shaped welding, in the case of butt welding, the Cu plate material may be penetrated in the plate thickness direction, or the metal Cu may be stopped from melting in the middle. Further, the two Cu plates may be overlapped with each other and irradiated with a laser beam to join them in a dot shape. Also in this case, in order to obtain sufficient bonding strength, the overlapped Cu plates are welded so that the width in the Y-axis direction of the bonded members is ½ or more of the welding width of the surface.
(Cu部材の表面状態)
 図2は、突き合わせたCu板材をレーザ溶接して接合したCu部材の表面状態を示す写真で、X軸方向がレーザ掃引方向であることを示している。また、レーザ光の照射を受けて、Cu板材の圧延の加工跡が消滅している部分があることが分かる。さらに、Cu板材が溶融して、再度凝固した部分があり溶接部であることが明らかに見て取れる。図中で示されるレーザ溶接の跡の溶接部の幅を本発明における溶接幅と規定し、また点線状の断面観察位置で切断し、断面組織の観察を行った。
(Surface condition of Cu member)
FIG. 2 is a photograph showing the surface state of a Cu member formed by laser welding and joining butt Cu plates, and shows that the X-axis direction is the laser sweep direction. In addition, it can be seen that there is a portion where the processing traces of rolling of the Cu plate material have disappeared due to the irradiation of the laser beam. Further, it can be clearly seen that the Cu plate material has a melted and solidified portion, which is a welded portion. The width of the welded portion of the laser welding mark shown in the figure is defined as the welding width in the present invention, and the cut is cut at the dotted line cross-sectional observation position to observe the cross-sectional structure.
(線状接合のビッカース硬さの測定の位置)
 図9は、Cu板材をレーザ溶接して接合したCu部材の断面状態を示す光学顕微鏡写真である。図9に示すように、レーザ光を照射して溶融した後に凝固することによって接合した溶接部分を溶接幅と表している。図9からの断面図から見ても、レーザ光を照射した側のCu板材表面の溶接痕の幅を明らかに認めることができる。溶接部の中心から、溶接幅の半分の長さ(溶接半幅)の1.5倍の距離だけ溶接幅の方向に沿って進めた地点を非溶接部と称し、この2点における板厚方向で、図9中の矢印で示しているように、その溶接幅の中央で板厚方向の深さは板厚の1/2の位置におけるそれぞれ溶接部と非溶接部のビッカース硬さHV1、HV2を測定する。
(Position of measuring Vickers hardness of linear joint)
FIG. 9 is an optical micrograph showing a cross-sectional state of a Cu member formed by laser welding a Cu plate material. As shown in FIG. 9, the welded portion joined by irradiating a laser beam to melt and then solidifying is represented as a weld width. Even when viewed from the cross-sectional view from FIG. 9, the width of the welding mark on the surface of the Cu plate material on the side irradiated with the laser beam can be clearly recognized. A point advanced along the direction of the weld width by a distance 1.5 times the length of half the weld width (half-width of the weld) from the center of the weld is called a non-weld part, and in the plate thickness direction at these two points. As shown by the arrows in FIG. 9, the depth in the plate thickness direction at the center of the weld width is the Vickers hardness HV1 and HV2 of the welded portion and the non-welded portion at the position of 1/2 of the plate thickness, respectively. Measure.
(ビッカース硬さ)
 ビッカース硬さとは、「JIS Z 2244」で規格化された測定方法である。ビッカース硬さHVは、ダイヤモンドでできた剛体(圧子)を被試験物に対して押し込み、そのときにできるくぼみ(圧痕)の面積の大小で硬いか軟らかいかを数値で表したものである。圧子は、ピラミッドをひっくり返したような四角錐形状を有しているので、圧痕は理想的には正方形である。試験力は可変で、JIS規格では10gf~100kgfまで規定されている。
(Vickers hardness)
Vickers hardness is a measurement method standardized by "JIS Z 2244". The Vickers hardness HV is a numerical value indicating whether a rigid body (indenter) made of diamond is pressed against a test object and the area of a dent (indentation) formed at that time is large or small, and whether it is hard or soft. The indentation is ideally square because the indenter has a quadrangular pyramid shape that resembles an inverted pyramid. The test force is variable, and the JIS standard specifies 10 gf to 100 kgf.
(硬さの傾斜率)
 非溶接部の測定は、図8(a)で示す突き合せの場合は溶接部の中心から、レーザ光の進む方向に直角の両側の地点を測定し、その平均値を測定した非溶接部のビッカース硬さHV2とする。また、図8(b)で示す重ね合わせの場合は溶接部の中心から、レーザ光の進む方向に直角で、近い端部と反対側の地点を測定し非溶接部のビッカース硬さHV2とする。
 このときのCu板材は、溶接部の中心と非溶接部の2点におけるビッカース硬さHV1、HV2を測定する。それを、非溶接部でのビッカース硬さHV2と、溶接部の中心でのビッカース硬さHV1との差を、ビッカース硬さHV1およびHV2を測定した位置間の圧痕距離Xμmで除したときの数値((HV2-HV1)/X)を硬さ傾斜率とする。
(Inclination rate of hardness)
In the case of the butting shown in FIG. 8A, the measurement of the non-welded portion is performed by measuring the points on both sides perpendicular to the traveling direction of the laser beam from the center of the welded portion and measuring the average value of the non-welded portion. Vickers hardness is HV2. Further, in the case of superposition shown in FIG. 8B, the Vickers hardness HV2 of the non-welded portion is measured from the center of the welded portion at a right angle to the direction in which the laser beam travels and at a point opposite to the near end portion. ..
The Cu plate material at this time measures the Vickers hardness HV1 and HV2 at two points, the center of the welded portion and the non-welded portion. The value when the difference between the Vickers hardness HV2 at the non-welded portion and the Vickers hardness HV1 at the center of the weld is divided by the indentation distance X μm between the measured positions of the Vickers hardness HV1 and HV2. ((HV2-HV1) / X) is defined as the hardness inclination rate.
(点状接合のビッカース硬さの測定位置)
 点状の溶接では、溶接幅は、点状の溶接部で最も幅の広い部分を溶接幅とし、その部分の断面を測定する面とする。したがって、非溶接部は、点状の溶接部に隣接していて、溶接部の中心から溶接幅の幅方向に沿って溶接半幅の1.5倍の距離の部分をいう。
 したがって、点状の最も幅の広い部分の中心点と、そこから一定の距離の離れた非溶接部の点で硬さを測定する。これによって、ビッカース硬さHV1、HV2を測定し、硬さ傾斜率を求めることができる。
(Measurement position of Vickers hardness of point joint)
In dot-shaped welding, the welding width is defined as the widest portion of the dotted welded portion as the welding width and the surface on which the cross section of that portion is measured. Therefore, the non-welded portion is a portion adjacent to the dotted welded portion and at a distance of 1.5 times the half width of the weld along the width direction of the weld width from the center of the welded portion.
Therefore, the hardness is measured at the center point of the widest part of the point shape and the point of the non-welded part at a certain distance from the center point. Thereby, the Vickers hardness HV1 and HV2 can be measured, and the hardness inclination rate can be obtained.
(硬さの分布)
 硬さは、Cu板材の特に表面に変形や傷を与えられようとする時の、物体の変形しにくさ、物体の傷つきにくさを表している。特に、2枚のCu板材を溶接して接合した接合体では、硬さに分布があるとクラックが入るなどして割れやすくなる。これは、硬さの高い硬質部分と硬さの低い軟質部分が混在する板材に応力がかかると、変形応力が集中するために、硬さの低い部分が容易に変形しクラックが生ずることがある。そのために、レーザ溶接処理の急熱・急冷によって、熱の影響を受けた部分と、溶融・凝固した溶接部で熱の影響に大きな差があるCu板材では、応力に対して変形が容易になり、クラックが容易に入る傾向がある。そのために、電気・電子機器用部品の製造時に硬さ傾斜率が大きいとクラックが入り破損することがある。
(Hardness distribution)
The hardness represents the difficulty of deforming the object and the resistance of the object to be scratched, especially when the surface of the Cu plate is about to be deformed or scratched. In particular, in a joined body obtained by welding and joining two Cu plates, if the hardness is distributed, cracks are likely to occur and the joints are easily cracked. This is because when stress is applied to a plate material in which a hard part with high hardness and a soft part with low hardness coexist, the deformation stress is concentrated, so that the low hardness part is easily deformed and cracks may occur. .. Therefore, the Cu plate material, which has a large difference in the effect of heat between the part affected by heat and the welded part that has melted and solidified due to the rapid heating and quenching of the laser welding process, is easily deformed by stress. , Cracks tend to enter easily. Therefore, if the hardness inclination ratio is large during the manufacture of parts for electrical and electronic equipment, cracks may occur and the parts may be damaged.
 したがって、Cu板材の母材、非溶接部、溶接部における硬さの変化を表す硬さ傾斜率が小さいことが望ましい。硬さ傾斜率が大きいほど、Cu板材の母材、非溶接部、溶接部の間における硬さの差が大きくなることであり、応力が集中する部分を形成することで脆くなり、クラックが入り易くなる。したがって、溶接部でのビッカース硬さHV1と、溶接部に隣接して位置する非溶接部でのビッカース硬さHV2との差を、ビッカース硬さHV1およびHV2を測定した位置間の圧痕距離X(μm)で除したときの数値である硬さ傾斜率((HV2-HV1)/X)を、0.2/μm以下にし、より好ましくは0.15/μm以下にする。 Therefore, it is desirable that the hardness inclination rate, which indicates the change in hardness in the base material, non-welded portion, and welded portion of the Cu plate material, is small. The larger the hardness inclination ratio, the larger the difference in hardness between the base material, the non-welded part, and the welded part of the Cu plate material. It will be easier. Therefore, the difference between the Vickers hardness HV1 at the weld and the Vickers hardness HV2 at the non-welded portion located adjacent to the weld is the indentation distance X (indentation distance X) between the positions where the Vickers hardness HV1 and HV2 are measured. The hardness inclination rate ((HV2-HV1) / X), which is a numerical value when divided by μm), is set to 0.2 / μm or less, more preferably 0.15 / μm or less.
 さらに、電気・電子機器用部品として実用するためには容易に変形するようでは実用上問題があり、Cu板材の母材自身の硬さによる剛性が必要となり、そのために、本発明では、溶接部以外のCu板材部分、特に溶接部に隣接して位置する非溶接部でのビッカース硬さHV2を75以上とすることが好ましい。 Further, in order to put it into practical use as a component for electrical and electronic equipment, there is a practical problem if it is easily deformed, and rigidity due to the hardness of the base material of the Cu plate material itself is required. Therefore, in the present invention, the welded portion. It is preferable that the Vickers hardness HV2 in the Cu plate material portion other than the above, particularly in the non-welded portion located adjacent to the welded portion, is 75 or more.
(Cu合金の板材)
 Cuの含有量が90質量%以上である板材であればよく、純CuでもいずれのCu合金でもよく、特に限定はされない。
 電気・電子機器用部品として用いるCu板材がCu合金の場合には、合金成分としてAg、Fe、Ni、Co、Si、Cr、Sn、Zn、Mg、Pから選ばれる1種から2種以上の元素を含み残部のCuが90質量%以上である成分組成を有することが好ましい。Cu合金は、析出硬化型Cu合金でも、非析出硬化型Cu合金でもよい。板材がCu合金の場合、非溶接部でのビッカース硬さHV2が75~240の範囲にある。
(Cu alloy plate material)
A plate material having a Cu content of 90% by mass or more may be used, and may be pure Cu or any Cu alloy, and is not particularly limited.
When the Cu plate material used as a component for electrical and electronic equipment is a Cu alloy, one to two or more types selected from Ag, Fe, Ni, Co, Si, Cr, Sn, Zn, Mg, and P as alloy components. It is preferable to have a component composition containing an element and having a residual Cu of 90% by mass or more. The Cu alloy may be a precipitation hardening type Cu alloy or a non-precipitation hardening type Cu alloy. When the plate material is a Cu alloy, the Vickers hardness HV2 in the non-welded portion is in the range of 75 to 240.
 Cu板材としてはCu合金を用いることで、硬さ傾斜率を0.2/μm以下にしてクラックの発生を抑える。さらに、硬さ傾斜率だけではなく、Cu板材の母材、非溶接部、溶接部のいずれも硬いことが好ましく、特に、非溶接部でのビッカース硬さHV2が75~240の範囲であることが好ましい。Cu合金板材は、非溶接部でのビッカース硬さHV2が75未満では、加工時に変形しやすくなる。非溶接部でのビッカース硬さHV2が240を超えると、溶接部の変形や境界での非溶接部と母材、溶接部との境界でクラックが入りやすくなる。 By using a Cu alloy as the Cu plate material, the hardness inclination ratio is set to 0.2 / μm or less to suppress the occurrence of cracks. Further, it is preferable that not only the hardness inclination rate but also the base material, the non-welded portion, and the welded portion of the Cu plate material are hard, and in particular, the Vickers hardness HV2 in the non-welded portion is in the range of 75 to 240. Is preferable. If the Vickers hardness HV2 at the non-welded portion is less than 75, the Cu alloy plate material is likely to be deformed during processing. When the Vickers hardness HV2 in the non-welded portion exceeds 240, deformation of the welded portion and cracks easily occur at the boundary between the non-welded portion and the base metal and the welded portion at the boundary.
(純Cuの板材)
 また、電気・電子機器用部品として用いるCu板材が、99.96質量%以上のCuおよび不可避不純物を含む純Cuである場合には、非溶接部でのビッカース硬さHV2が75~120の範囲であることが好ましい。Cu板材の母材、溶接部、非溶接部の硬さの傾斜が小さいことが好ましく、純Cu板材を用いることで、硬さ傾斜率を0.1/μm以下にすることができ、溶接部の局所変形がし難くなる。特に、純Cu板材で、非溶接部でのビッカース硬さHV2が75未満では、加工時に変形しやすくなる。非溶接部でのビッカース硬さHV2が120を超えると、溶接部の変形や非溶接部と母材および溶接部と非溶接部の境界でクラックが入りやすくなる。
(Pure Cu plate material)
Further, when the Cu plate material used as a component for electric / electronic equipment is pure Cu containing 99.96% by mass or more of Cu and unavoidable impurities, the Vickers hardness HV2 in the non-welded portion is in the range of 75 to 120. Is preferable. It is preferable that the hardness inclination of the base material, the welded portion, and the non-welded portion of the Cu plate material is small. By using the pure Cu plate material, the hardness inclination ratio can be reduced to 0.1 / μm or less, and the welded portion. Local deformation of is difficult. In particular, in a pure Cu plate material, if the Vickers hardness HV2 in the non-welded portion is less than 75, it is likely to be deformed during processing. When the Vickers hardness HV2 in the non-welded portion exceeds 120, deformation of the welded portion and cracks easily occur at the boundary between the non-welded portion and the base metal and the welded portion and the non-welded portion.
 次に、本発明の電気・電子機器用部品を構成する板材の好適な成分組成の限定理由について以下で説明する。
 本発明の電気・電子機器用部品を構成する板材は、90質量%以上のCuを含有する板材であればよく、Cu合金でも純Cuでもいずれでもよい。
Next, the reasons for limiting the suitable component composition of the plate material constituting the parts for electric and electronic devices of the present invention will be described below.
The plate material constituting the parts for electric and electronic devices of the present invention may be any plate material containing 90% by mass or more of Cu, and may be either a Cu alloy or pure Cu.
 まず、板材がCu合金の場合の成分組成を説明する。
(1)板材がCu合金である場合
 板材は、Ag、Fe、Ni、Co、Si、Cr、Sn、Zn、MgおよびPからなる群より選択される1種以上の元素を含むことが好ましい。
First, the component composition when the plate material is a Cu alloy will be described.
(1) When the plate material is a Cu alloy The plate material preferably contains one or more elements selected from the group consisting of Ag, Fe, Ni, Co, Si, Cr, Sn, Zn, Mg and P.
(Ag:0.05~5.00質量%)
 Ag(銀)は、電気的特性を損ねることなく機械的特性を向上させる作用を有する成分であり、かかる作用を発揮させる場合には、Ag含有量を0.05質量%以上とすることが好ましい。また、Ag含有量の上限については特に設ける必要はないが、Agは高価であるため、材料コストの観点から、Ag含有量の上限を5.0質量%とすることが好ましい。
(Ag: 0.05 to 5.00% by mass)
Ag (silver) is a component having an action of improving mechanical properties without impairing electrical properties, and in order to exert such actions, the Ag content is preferably 0.05% by mass or more. .. Further, it is not necessary to set an upper limit of the Ag content in particular, but since Ag is expensive, it is preferable to set the upper limit of the Ag content to 5.0% by mass from the viewpoint of material cost.
(Fe:0.05~0.50質量%)
 Fe(鉄)は、機械的特性を向上する作用を有する成分である。かかる作用を発揮させる場合には、Fe含有量を0.05質量%以上とすることが好ましい。しかしながら、Feを0.50質量%より多く含有させても、それ以上の向上効果が期待できず、さらに耐食性低下の懸念が生じる。このため、Fe含有量は、0.05~0.50質量%とすることが好ましい。
(Fe: 0.05 to 0.50% by mass)
Fe (iron) is a component having an action of improving mechanical properties. In order to exert such an effect, the Fe content is preferably 0.05% by mass or more. However, even if Fe is contained in an amount of more than 0.50% by mass, no further improvement effect can be expected, and there is a concern that the corrosion resistance is further lowered. Therefore, the Fe content is preferably 0.05 to 0.50% by mass.
(Ni:0.05~5.00質量%)
 Ni(ニッケル)は、Cuの母相(マトリクス)中に、単体またはSiとの化合物からなる第二相粒子の析出物として、例えば50~500nm程度の大きさで微細析出し、この析出物が転位移動を抑制することにより析出硬化させ、さらに、粒成長が抑制されて結晶粒の微細化によって材料強度を上昇させる作用を有する成分である。かかる作用を発揮させる場合には、Ni含有量を0.05質量%以上とすることが好ましい。一方、Ni含有量が5.00質量%を超えると、導電率や熱伝導率の低下が顕著になることから、Ni含有量の上限は5.00質量%とすることが好ましい。
(Ni: 0.05 to 5.00% by mass)
Ni (nickel) is finely precipitated in the matrix of Cu as a precipitate of second-phase particles composed of a simple substance or a compound with Si, for example, in a size of about 50 to 500 nm, and this precipitate is formed. It is a component having an action of precipitation hardening by suppressing dislocation movement, further suppressing grain growth, and increasing material strength by refining crystal grains. In order to exert such an effect, the Ni content is preferably 0.05% by mass or more. On the other hand, when the Ni content exceeds 5.00% by mass, the conductivity and the thermal conductivity are significantly lowered. Therefore, the upper limit of the Ni content is preferably 5.00% by mass.
(Co:0.05~2.00質量%)
 Co(コバルト)は、Cuの母相(マトリクス)中に、単体またはSiとの化合物からなる第二相粒子の析出物として、例えば50~500nm程度の大きさで微細析出し、この析出物が転位移動を抑制することにより析出硬化させ、さらに、粒成長が抑制されて結晶粒の微細化によって材料強度を上昇させる作用を有する成分である。かかる作用を発揮させる場合には、Co含有量を0.05質量%以上とすることが好ましい。一方、Co含有量が2.00量%を超えると、導電率や熱伝導率の低下が顕著になることから、Co含有量の上限は2.00質量%以下にすることが好ましい。
(Co: 0.05 to 2.00% by mass)
Co (cobalt) is finely precipitated in the matrix of Cu as a precipitate of second-phase particles composed of a simple substance or a compound with Si, for example, in a size of about 50 to 500 nm, and this precipitate is formed. It is a component having an action of precipitation hardening by suppressing dislocation movement, further suppressing grain growth, and increasing material strength by refining crystal grains. In order to exert such an effect, the Co content is preferably 0.05% by mass or more. On the other hand, when the Co content exceeds 2.00% by mass, the conductivity and the thermal conductivity are significantly lowered. Therefore, the upper limit of the Co content is preferably 2.00% by mass or less.
(Si:0.05~1.10質量%)
 Si(珪素)は、Cuの母相(マトリクス)中に、NiやCoなどとともに化合物からなる第二相粒子の析出物として微細析出し、この析出物が転位移動を抑制することにより析出硬化させ、さらに、粒成長が抑制されて結晶粒の微細化によって材料強度を上昇させる作用を有する重要な成分である。かかる作用を発揮させる場合には、Si含有量を0.05質量%以上とすることが好ましい。一方、Si含有量が1.10質量%を超えると、導電率や熱伝導率の低下が顕著になることから、Si含有量の上限は1.10質量%にすることが好ましい。
(Si: 0.05 to 1.10% by mass)
Si (silicon) is finely precipitated in the matrix of Cu as a precipitate of second-phase particles composed of compounds together with Ni and Co, and this precipitate is precipitated and hardened by suppressing dislocation movement. Furthermore, it is an important component having an action of suppressing grain growth and increasing the material strength by refining the crystal grains. In order to exert such an effect, the Si content is preferably 0.05% by mass or more. On the other hand, when the Si content exceeds 1.10% by mass, the conductivity and the thermal conductivity are significantly lowered. Therefore, the upper limit of the Si content is preferably 1.10% by mass.
(Cr:0.05~0.50質量%)
 Cr(クロム)は、Cuの母相(マトリクス)中に、化合物や単体として、例えば10~500nm程度の大きさの析出物の形で微細析出し、この析出物が転位移動を抑制することにより析出硬化させ、さらに、粒成長が抑制されて結晶粒の微細化によって材料強度を上昇させる作用を有する成分である。この作用を発揮させる場合には、Cr含有量を0.05質量%以上とすることが好ましい。また、Cr含有量が0.50質量%を超えると、導電率および熱伝導率の低下が顕著になることから、Cr含有量は、0.05~0.50質量%とすることが好ましい。
(Cr: 0.05 to 0.50% by mass)
Cr (chromium) is finely precipitated in the matrix of Cu as a compound or a single substance in the form of a precipitate having a size of, for example, about 10 to 500 nm, and this precipitate suppresses dislocation movement. It is a component that has the effect of precipitating and hardening, further suppressing grain growth, and increasing the material strength by refining the crystal grains. In order to exert this effect, the Cr content is preferably 0.05% by mass or more. Further, when the Cr content exceeds 0.50% by mass, the conductivity and the thermal conductivity are significantly lowered. Therefore, the Cr content is preferably 0.05 to 0.50% by mass.
(Sn:0.05~9.50質量%)
 Sn(錫)は、Cuの母相(マトリクス)中に固溶し、Cu合金の強度向上に寄与する成分であり、Sn含有量は0.05質量%以上とすることが好ましい。一方、Sn含有量が9.50質量%を超えると脆化が生じやすくなる。このため、Sn含有量は0.05~9.50質量%とすることが好ましい。また、Snの含有は、導電率および熱伝導率を低下させる傾向があることから、導電率及び熱伝導率の低下を抑制する場合には、Sn含有量を0.05~0.50質量%とするのがより好ましい。
(Sn: 0.05 to 9.50% by mass)
Sn (tin) is a component that is solid-solved in the matrix of Cu and contributes to the improvement of the strength of the Cu alloy, and the Sn content is preferably 0.05% by mass or more. On the other hand, when the Sn content exceeds 9.50% by mass, embrittlement is likely to occur. Therefore, the Sn content is preferably 0.05 to 9.50% by mass. Further, since the Sn content tends to decrease the conductivity and the thermal conductivity, the Sn content is set to 0.05 to 0.50% by mass in the case of suppressing the decrease in the conductivity and the thermal conductivity. Is more preferable.
(Zn:0.05~0.50質量%)
 Zn(亜鉛)は、Snめっきやはんだめっきの密着性やマイグレーション特性を改善する作用を有する成分である。かかる作用を発揮させる場合には、Zn含有量を0.05質量%以上とすることが好ましい。一方、Zn含有量が0.50質量%を超えると、溶接時に亜鉛の蒸気量が増え、溶接部に欠陥が生じる恐れがある。このため、Zn含有量は、0.05~0.50質量%とすることが好ましい。
(Zn: 0.05 to 0.50% by mass)
Zn (zinc) is a component having an effect of improving the adhesion and migration characteristics of Sn plating and solder plating. In order to exert such an effect, the Zn content is preferably 0.05% by mass or more. On the other hand, if the Zn content exceeds 0.50% by mass, the amount of zinc vapor increases during welding, which may cause defects in the welded portion. Therefore, the Zn content is preferably 0.05 to 0.50% by mass.
(Mg:0.01~0.50質量%)
 Mg(マグネシウム)は、機械的特性を向上させる作用を有する成分である。かかる作用を発揮させる場合には、Mg含有量を0.01質量%以上とすることが好ましい。一方、Mg含有量が0.50質量%を超えると、導電率や熱伝導率が低下する傾向がある。このため、Mg含有量は、0.01~0.50質量%とすることが好ましい。
(Mg: 0.01 to 0.50% by mass)
Mg (magnesium) is a component having an action of improving mechanical properties. In order to exert such an effect, the Mg content is preferably 0.01% by mass or more. On the other hand, when the Mg content exceeds 0.50% by mass, the conductivity and the thermal conductivity tend to decrease. Therefore, the Mg content is preferably 0.01 to 0.50% by mass.
(P:0.01~0.50質量%)
 P(リン)はCu合金の脱酸材として寄与するだけでなく、FeやNiなどと化合物として20~500nm程度の大きさの析出物の形で微細析出し、この析出物が転位移動を抑制することにより析出硬化させ、さらに、粒成長が抑制されて結晶粒の微細化によって材料強度を上昇させることができる。かかる作用を発揮させるためにはP含有量を0.01質量%以上とすることが好ましい。一方、P含有量が0.50質量%を超えると、溶接後の凝固部で割れが生じやすくなる傾向がある。このため、P含有量は、0.01~0.50質量%とする。
(P: 0.01 to 0.50% by mass)
P (phosphorus) not only contributes as a deoxidizing material for Cu alloys, but also finely precipitates in the form of precipitates having a size of about 20 to 500 nm as compounds with Fe, Ni, etc., and these precipitates suppress dislocation movement. By doing so, precipitation hardening can be performed, and further, grain growth is suppressed and the material strength can be increased by refining the crystal grains. In order to exert such an effect, the P content is preferably 0.01% by mass or more. On the other hand, when the P content exceeds 0.50% by mass, cracks tend to easily occur in the solidified portion after welding. Therefore, the P content is set to 0.01 to 0.50% by mass.
(2)板材が導電性や放熱性に優れた純Cuである場合
 板材は、99.96%以上のCuかつ、不可避不純物として、たとえばCd、Mg、Pb、Sn、Cr、Bi、Se、Teが合計5ppm以下かつ、Ag、Oがそれぞれ400ppm以下である成分組成を有する純Cuであることが好ましい。
(2) When the plate material is pure Cu with excellent conductivity and heat dissipation The plate material is 99.96% or more Cu and, as unavoidable impurities, for example, Cd, Mg, Pb, Sn, Cr, Bi, Se, Te. Is preferably 5 ppm or less in total, and pure Cu having a component composition in which Ag and O are each 400 ppm or less is preferable.
(電気・電子機器用部品の製造方法)
 本発明の一実施形態である電気・電子機器用部品の製造方法は、90質量%以上のCuを含有する複数の板材同士を、互いに突き合わせた状態又は重ね合わせた状態にセットした後に、接合する箇所を、400~500nmの波長を有する第1レーザ光を100~500μmのスポット径で照射し、かつ、800~1200nmの波長を有する第2レーザ光を10~300μmのスポット径で照射すると共に、溶融部に酸素が1~50ppm含まれる不活性ガスを10~50L/minの流量で噴射しながら溶接することで、複数の板材同士を線状に接合して一体化する溶接工程を含む。
 このような溶接工程によれば、従来困難であったCu板材同士の溶接を容易にさせた上、溶接部のビッカース硬さを60以上にすることができ、強度の高い溶接部を得ることができる。
(Manufacturing method of parts for electrical and electronic equipment)
In the method for manufacturing a component for an electric / electronic device according to an embodiment of the present invention, a plurality of plate materials containing 90% by mass or more of Cu are set in a state of being abutted against each other or in a state of being overlapped with each other, and then joined. The spot is irradiated with a first laser beam having a wavelength of 400 to 500 nm with a spot diameter of 100 to 500 μm, and a second laser beam having a wavelength of 800 to 1200 nm is irradiated with a spot diameter of 10 to 300 μm. It includes a welding step of linearly joining and integrating a plurality of plate materials by welding while injecting an inert gas containing 1 to 50 ppm of oxygen into the molten portion at a flow rate of 10 to 50 L / min.
According to such a welding process, it is possible to easily weld Cu plates to each other, which has been difficult in the past, and to increase the Vickers hardness of the welded portion to 60 or more, thereby obtaining a welded portion having high strength. can.
 さらに、400~500nmの波長をもつ第1レーザ光を100~500μmのスポット径で照射し、かつ800~1200nmの波長をもつ第2レーザ光を10~300μmのスポット径で照射する際の照射時間を0.1~10msec/スポット(線状の場合は1スポット径に相当する距離を掃引する速度、点状の場合は1スポットあたりの照射時間)ことで、硬さの勾配を制御した。 Further, the irradiation time when the first laser beam having a wavelength of 400 to 500 nm is irradiated with a spot diameter of 100 to 500 μm and the second laser beam having a wavelength of 800 to 1200 nm is irradiated with a spot diameter of 10 to 300 μm. The hardness gradient was controlled by 0.1 to 10 msec / spot (in the case of a linear shape, the speed of sweeping a distance corresponding to one spot diameter, and in the case of a point shape, the irradiation time per spot).
(レーザ溶接法)
 レーザ溶接法は、指向性や集中性の良い波長の光をレンズで集め、きわめて高いエネルギー密度のレーザ光を熱源とする溶接方法である。レーザ光の出力を調整することで、深さに対して幅の狭い溶込み溶接も可能である。また、レーザ光は、アーク溶接のアークに比べてきわめて小さく絞り込むことができる。集光レンズにより高密度化されたエネルギーで、レーザ溶接装置は局所の溶接や融点の異なる材料の接合が可能である。溶接による熱影響が少なく溶接の模様は細く、加工反力も発生しないため、微細な溶接にも向いている。
(Laser welding method)
The laser welding method is a welding method in which light having a wavelength with good directivity and concentration is collected by a lens and laser light having an extremely high energy density is used as a heat source. By adjusting the output of the laser beam, penetration welding with a narrow width with respect to the depth is also possible. In addition, the laser beam can be narrowed down to a very small size as compared with the arc of arc welding. With the energy densified by the condenser lens, the laser welding device can perform local welding and joining materials with different melting points. It is suitable for fine welding because it has little heat effect due to welding, the welding pattern is fine, and no processing reaction force is generated.
(レーザ溶接装置)
 図6は、レーザ溶接装置の概略構成の一例を示す図である。レーザ溶接装置20は、レーザ制御部21、発振器221、222、レーザヘッド29、加工台24およびガス供給ノズル30を備えている。加工台24上に、被加工材であるCu板材111,112を突き合せた状態又は重ね合わせた状態にして配置する。レーザ制御部21は、レーザ光を発振するレーザ発振器221、222、図示しないスキャナ、レーザヘッド29、加工台等の制御を行う。制御部21は、例えば、図示しないX軸モータ及びY軸モータの回転を制御することによって、被加工材であるCu板材111、112の進路方向を制御する。また、制御部21は、レーザ光231、232を移動させ制御するものであってもよい。これは、被加工材の大きさによって適宜選択することができる。制御部21は、発振器221、222から発振される複数の第1及び第2レーザ光231、232を発振する。発振した第1及び第2レーザ光231、232は、グラスファイバー25を通して、レーザヘッド29内のそれぞれの第1及び第2集光レンズ261、262によって平行な光に集められる。この第1及び第2レーザ光231、232を第1及び第2ミラー271、272で加工台の方向に変更し、この第1及び第2レーザ光231、232を、集束レンズ28を通してCu板材111、112の接合すべき位置に集束させて照射することで、溶接を実施する。このとき、ガス供給ノズル30から、レーザ光による加熱によって生じる酸化を防止するために、不活性ガスを供給する。不活性ガスは、アルゴン、ヘリウム、窒素等から適宜選択することができる。
(Laser welding equipment)
FIG. 6 is a diagram showing an example of a schematic configuration of a laser welding apparatus. The laser welding apparatus 20 includes a laser control unit 21, oscillators 221 and 222, a laser head 29, a processing table 24, and a gas supply nozzle 30. Cu plate materials 111 and 112, which are the materials to be processed, are arranged on the processing table 24 in a butt or overlapped state. The laser control unit 21 controls laser oscillators 221 and 222 that oscillate laser light, a scanner (not shown), a laser head 29, a processing table, and the like. The control unit 21 controls the course directions of the Cu plate members 111 and 112, which are the workpieces, by controlling the rotation of the X-axis motor and the Y-axis motor (not shown), for example. Further, the control unit 21 may move and control the laser beams 231 and 232. This can be appropriately selected depending on the size of the work material. The control unit 21 oscillates a plurality of first and second laser beams 231 and 232 oscillated from the oscillators 221 and 222. The oscillated first and second laser beams 231 and 232 are collected in parallel light through the glass fiber 25 by the first and second condenser lenses 261 and 262 in the laser head 29, respectively. The first and second laser beams 231 and 232 are changed in the direction of the processing table by the first and second mirrors 271 and 272, and the first and second laser beams 231 and 232 are passed through the focusing lens 28 to the Cu plate material 111. Welding is performed by focusing and irradiating the positions of 112 to be joined. At this time, the inert gas is supplied from the gas supply nozzle 30 in order to prevent oxidation caused by heating by the laser beam. The inert gas can be appropriately selected from argon, helium, nitrogen and the like.
 レーザは溶接用のレーザとして公知のものの中から適宜選択することができる。レーザの一例としてCOレーザ、Nd:YAGレーザ、半導体レーザ、ファイバレーザなどが挙げられる。出力やレーザ光の集光性などの点からファイバレーザを用いることが好ましい。レーザ溶接装置のその他の構成は、従来公知のあらゆる構成から選択することができる。 The laser can be appropriately selected from those known as welding lasers. Examples of lasers include CO 2 lasers, Nd: YAG lasers, semiconductor lasers, fiber lasers and the like. It is preferable to use a fiber laser from the viewpoint of output and condensing property of laser light. Other configurations of the laser welder can be selected from any conventionally known configuration.
(レーザ溶接)
 図7は、レーザ溶接装置のレーザ光のスポット径の一例を示す図である。図7に示すように、400~500nmの波長をもつ第1レーザ光231を100~500μmのスポット径で照射する。そして、800~1200nmの波長をもつ第2レーザ光232を10~300μmのスポット径で照射する。図7においては、第1レーザ光231と第2レーザ光232が板材表面で重なるように照射した例を示している。特定の波長及びスポット径の複数のレーザ光を同時に照射することで、従来困難であったCu板材を容易に溶接することが可能になった。その上、溶融部に酸素が1~50ppm含まれる不活性ガスを10~50L/minで噴射しながら溶接することで、ビッカース硬さが60以上の溶接部を得ることができる。
(Laser welding)
FIG. 7 is a diagram showing an example of the spot diameter of the laser beam of the laser welding apparatus. As shown in FIG. 7, the first laser beam 231 having a wavelength of 400 to 500 nm is irradiated with a spot diameter of 100 to 500 μm. Then, the second laser beam 232 having a wavelength of 800 to 1200 nm is irradiated with a spot diameter of 10 to 300 μm. FIG. 7 shows an example in which the first laser beam 231 and the second laser beam 232 are irradiated so as to overlap each other on the surface of the plate material. By simultaneously irradiating a plurality of laser beams having a specific wavelength and spot diameter, it has become possible to easily weld a Cu plate material, which has been difficult in the past. Further, by welding while injecting the inert gas containing 1 to 50 ppm of oxygen into the molten portion at 10 to 50 L / min, a welded portion having a Vickers hardness of 60 or more can be obtained.
 溶融部に供給する不活性ガスは、酸素を10~50ppm含む。不活性ガスとしては、窒素ガスやアルゴンガス等が挙げられる。このような酸素を10~50ppm含む不活性ガスを、10~50L/minの流量で噴射しながらレーザ溶接することで、溶融部を不活性ガスで覆った上で、適度な酸素を溶融部の内部に送ることができ、これにより微細な酸化物を生成させて溶接部の硬さを上昇させ、かつ、急冷されることで、結晶粒内に適度なひずみが導入されると推測される。不活性ガスの酸素含有量が10ppmより少ないと、十分な酸素を供給することができないため、硬さが低くなる場合がある。一方、50ppmを超えると、内部の酸化が過剰になり脆化が生じる場合がある。また、酸素を10~50ppm含む不可性ガスの流量が10L/min未満では十分なシールド効果が得られず酸化が過剰に進行する上、溶融部の冷却速度が低下するため、結晶内部に十分なひずみを得ることができない。また、流量が50L/minを超過すると、溶融部に多量のガスを吹き付けることで溶融池の形状が不安定になり、凝固不良を生じる場合がある。 The inert gas supplied to the molten part contains 10 to 50 ppm of oxygen. Examples of the inert gas include nitrogen gas and argon gas. By laser welding such an inert gas containing 10 to 50 ppm of oxygen at a flow rate of 10 to 50 L / min, the melted portion is covered with the inert gas, and an appropriate amount of oxygen is applied to the melted portion. It is presumed that it can be sent to the inside, thereby generating fine oxides to increase the hardness of the welded portion, and by quenching, an appropriate strain is introduced into the crystal grains. If the oxygen content of the inert gas is less than 10 ppm, sufficient oxygen cannot be supplied and the hardness may be low. On the other hand, if it exceeds 50 ppm, internal oxidation may become excessive and embrittlement may occur. Further, if the flow rate of the non-volatile gas containing 10 to 50 ppm of oxygen is less than 10 L / min, a sufficient shielding effect cannot be obtained, oxidation proceeds excessively, and the cooling rate of the molten portion decreases, so that the inside of the crystal is sufficient. No strain can be obtained. Further, when the flow rate exceeds 50 L / min, the shape of the molten pool becomes unstable by blowing a large amount of gas on the molten portion, which may cause poor solidification.
 さらに、400~500nmの波長をもつ第1レーザ光231を100~500μmのスポット径で照射し、800~1200nmの波長をもつ第2レーザ光232を10~300μmのスポット径で照射する際の照射時間を0.1~10msec/スポットとする。(線状の場合は1スポット径に相当する距離を掃引する速度、点状の場合は1スポットあたりの照射時間)0.1msecより短い場合は、接合し難くなるのに加え、硬さの傾斜が急峻になり易い。一方、10msecを超過すると、溶接部から金属が溶け落ちて欠損してしまったり、軟化して強度が不足したりする恐れがある。 Further, irradiation when the first laser beam 231 having a wavelength of 400 to 500 nm is irradiated with a spot diameter of 100 to 500 μm and the second laser beam 232 having a wavelength of 800 to 1200 nm is irradiated with a spot diameter of 10 to 300 μm. The time is 0.1 to 10 msec / spot. (In the case of a linear shape, the speed of sweeping a distance corresponding to the diameter of one spot, in the case of a point shape, the irradiation time per spot) If it is shorter than 0.1 msec, it is difficult to join and the hardness is inclined. Tends to be steep. On the other hand, if it exceeds 10 msec, the metal may be melted down from the welded portion and chipped, or the metal may be softened and the strength may be insufficient.
 本発明の電気・電子機器用部品は、複数の板材を、互いに突き合わせ又は重ね合わせた状態にセットした後に、複数の板材同士の接合箇所に、第1及び第2レーザ光231、232で照射して、複数の板材同士を線状又は点状に接合して一体化する。Cu板材表面のみ効率よく浸透する第1レーザ光231を第2レーザ光232より広い範囲でCu板材を加熱し、加熱するとほぼ同時にCu板材に深く浸透する第2レーザ光232を照射することで、ブローホールや内部欠陥などの不良がほぼ生じない溶接加工を施すことができる。 In the parts for electrical and electronic equipment of the present invention, after setting a plurality of plate materials in a state of being butted or overlapped with each other, the joints between the plurality of plate materials are irradiated with the first and second laser beams 231 and 232. Then, a plurality of plate materials are joined to each other in a linear or dot shape to be integrated. The first laser beam 231 that efficiently penetrates only the surface of the Cu plate material heats the Cu plate material in a wider range than the second laser light 232, and when heated, the second laser beam 232 that penetrates deeply into the Cu plate material is irradiated almost at the same time. Welding can be performed with almost no defects such as blow holes and internal defects.
 第1及び第2レーザ光231、232の波長及びスポット径の範囲外であると、表面品質が低下したり、溶接ができなかったりするため、不適当である。また、第1レーザ光231による加熱を制御すると、第2レーザ光232で板材を溶融、凝固させる際の冷却速度に影響を与えており、鋭意検討した結果、0.1~10msec/スポット以下にすることで、Cu板材のCu板材の母材、非溶接部、溶接部における硬さの変化を抑え、さらに、Cu板材の非溶接部、溶接部の硬さの傾斜を低く抑えることができることがわかった。 If the wavelengths and spot diameters of the first and second laser beams 231 and 232 are out of the range, the surface quality deteriorates and welding cannot be performed, which is inappropriate. Further, controlling the heating by the first laser beam 231 affects the cooling rate when the plate material is melted and solidified by the second laser beam 232, and as a result of diligent examination, it is 0.1 to 10 msec / spot or less. By doing so, it is possible to suppress changes in the hardness of the Cu plate base material, the non-welded portion, and the welded portion of the Cu plate material, and further suppress the inclination of the hardness of the non-welded portion and the welded portion of the Cu plate material to be low. understood.
(溶接の効果)
 このように、所定の成分組成を有するCu板材の母材、非溶接部、溶接部を制御することによって、硬さがあって剛性があり、かつ、溶接部の局所変形が生じ難い電気・電子機器用部品を得ることができる。
(Effect of welding)
By controlling the base material, non-welded portion, and welded portion of the Cu plate material having a predetermined component composition in this way, electricity and electrons that are hard and rigid and that local deformation of the welded portion is unlikely to occur. Equipment parts can be obtained.
(電気・電子機器への適用)
 本発明の電気・電子機器用部品は、半導体装置、LSI、あるいはこれらを利用した多くの電子機器で使用することが考えられる、さらに、例えば、特に小型化、高集積化の必要がある、家庭用ゲーム機、医療機器、ワークステーション、サーバー、パーソナルコンピュータ、カーナビゲーション、携帯電話、ロボットのコネクタ、バッテリー端子、ジャック、リレー、スイッチ、オートフォーカスカメラモジュール、リードフレーム等の電気・電子機器への利用が可能である。
(Application to electrical and electronic equipment)
The parts for electrical and electronic devices of the present invention can be considered to be used in semiconductor devices, LSIs, or many electronic devices using these, and further, for example, homes that need to be particularly miniaturized and highly integrated. Use for electrical and electronic equipment such as game consoles, medical equipment, workstations, servers, personal computers, car navigation systems, mobile phones, robot connectors, battery terminals, jacks, relays, switches, autofocus camera modules, lead frames, etc. Is possible.
(ベーパーチャンバ)
 本発明の一の実施形態の電気・電子機器用部品は、優れた熱伝導性を有する純CuやCu合金からなり、且つ強度が高く耐変形性に優れるため、ヒートパイプや、ベーパーチャンバに適用することが好ましい。
 本発明の他の実施形態の電気・電子機器用部品は、剛性が高く、特に、クラックの発生の少ない特性を有していることで、ヒートパイプ、ベーパーチャンバに適用することが好ましい。特に、ベーパーチャンバの製品の構造材としてクラックが発生しにくいことから、クラックに由来する使用時のリークや腐食が改善されるため、熱伝導性の低下を抑制し、ベーパーチャンバの製品の劣化の抑制、長寿命化に貢献することができる。
(Vapor chamber)
The component for an electric / electronic device according to an embodiment of the present invention is made of pure Cu or Cu alloy having excellent thermal conductivity, and has high strength and excellent deformation resistance, so that it is applied to a heat pipe or a vapor chamber. It is preferable to do so.
The parts for electric and electronic devices of other embodiments of the present invention are preferably applied to heat pipes and vapor chambers because they have high rigidity and have characteristics of less generation of cracks. In particular, since cracks are less likely to occur as a structural material for vapor chamber products, leakage and corrosion during use due to cracks are improved, which suppresses deterioration of thermal conductivity and deteriorates vapor chamber products. It can contribute to suppression and extension of life.
(バスバー)
 本発明の一の実施形態の電気・電子機器用部品は、優れた熱伝導性を有する純CuやCu合金からなり、且つ強度が高く耐変形性に優れるため、バスバーとして好適である。バスバーは、電気的に接続する電気経路、また、放熱のための輸送経路としても適用することができ、特に、発熱部分からバスバーをつないで放熱部分又は外部まで経路を設けることで冷却装置としても適用できる。
 また、本発明の他の実施形態の電気・電子機器用部品で形成したバスバーは、局所変形に優れた特性を有していることで、電気的に接続する電気経路、また、放熱のための輸送経路としても適用することができる。特に、発熱部分からバスバーをつないで放熱部分又は外部まで経路を設けることで冷却装置としても適用できる。
(Busbar)
The component for an electric / electronic device according to an embodiment of the present invention is made of pure Cu or a Cu alloy having excellent thermal conductivity, and is suitable as a bus bar because of its high strength and excellent deformation resistance. The bus bar can be applied as an electric path for electrically connecting and as a transportation path for heat dissipation. In particular, the bus bar can also be used as a cooling device by connecting the bus bar from the heat generating portion and providing a path to the heat dissipation portion or the outside. Applicable.
Further, the bus bar formed of the parts for electric / electronic devices of another embodiment of the present invention has excellent characteristics for local deformation, so that it can be used for electrically connecting electric paths and for heat dissipation. It can also be applied as a transportation route. In particular, it can also be applied as a cooling device by connecting a bus bar from a heat generating portion and providing a path to a heat radiating portion or the outside.
 本発明の実施例について以下に説明する。本発明は様々な態様が可能であり、以下の実施例に限定されるものではない。 Examples of the present invention will be described below. Various embodiments are possible in the present invention, and the present invention is not limited to the following examples.
(実施例1~6および比較例1~9)純Cuからなる2枚の同じ板材の接合
 実施例1~5および比較例1~9では、表1に記載の成分組成を持つ純Cuからなる板材を厚さ0.15mm、幅20mm、長さ1000mmに2枚切り出した。切り出した2枚の板材について、長さ方向に延在する端面同士を互いに接近させる方向に移動させて、図1(a)に示すような突き合せ状態に配置した。そして、波長が400~500nm及びスポット径(以下、「ビーム径」と記すことがある。)が100~500μmである第1レーザ光と、波長が800~1200nm及びスポット径が10~300μmである第2レーザ光とを、図8に示すようなスポット径の位置関係を維持しながら、レーザ溶接した。レーザ条件を、表1に示す。レーザ溶接は、溶融部に、表1に記載する酸素を含む不活性ガスを供給しながら行った。不活性ガスとして、太陽日酸製のG1グレードの窒素ガスと、酸素ガスとの混合ガスを使用した。
 また、実施例6では、突合せ配置することに代えて、図1(b)に示す重ね合わせ配置にして実施例1と同様な条件でレーザ溶接を行った。
(Examples 1 to 6 and Comparative Examples 1 to 9) Joining of two same plates made of pure Cu Examples 1 to 5 and Comparative Examples 1 to 9 are made of pure Cu having the component composition shown in Table 1. Two plates were cut out to a thickness of 0.15 mm, a width of 20 mm, and a length of 1000 mm. The two cut out plates were moved in a direction in which the end faces extending in the length direction were brought closer to each other, and arranged in a butt state as shown in FIG. 1 (a). The first laser beam having a wavelength of 400 to 500 nm and a spot diameter (hereinafter, may be referred to as “beam diameter”) of 100 to 500 μm, and a wavelength of 800 to 1200 nm and a spot diameter of 10 to 300 μm. The second laser beam was laser-welded while maintaining the positional relationship of the spot diameters as shown in FIG. The laser conditions are shown in Table 1. Laser welding was performed while supplying the fused portion with an inert gas containing oxygen as shown in Table 1. As the inert gas, a mixed gas of G1 grade nitrogen gas manufactured by Taiyo Nippon Sanso and oxygen gas was used.
Further, in Example 6, instead of the butt arrangement, the overlapping arrangement shown in FIG. 1 (b) was used, and laser welding was performed under the same conditions as in Example 1.
 その後、溶接部について、ビッカース硬さと、GAM値を下記方法により測定した。結果を表1に示す。また、表1中では、ビッカース硬さHv1が60以上、且つ、GAM値が0.5°以上2.0°未満である結晶粒の測定面積に存在する全ての結晶粒に対する面積割合が25%以上である場合を、耐変形性特性が優れているとして「◎」と記載し、ビッカース硬さHv1が60以上、且つ、GAM値が0.5°以上2.0°未満である結晶粒は、測定面積に存在する全ての結晶粒に対する面積割合が25%未満である場合を、耐変形特性が良好であるとして「〇」と記載し、そして、ビッカース硬さHv1が60未満である場合を、耐変形特性が悪いとして「×」と記載した。
 また、溶接部の局所的な変形特性も併せて評価した。非溶接部の硬さと溶接部の硬さ及びその圧痕距離から得られる硬さ傾斜率が0.2/μm以下の場合は、溶接部と非溶接部の小さい傾斜材になる為、局所変形し難くなり、耐局所変形特性が良好であるとして「○」とし評価した。一方、0.2/μm超の場合は局所変形し易いとし「△」とした。
Then, the Vickers hardness and the GAM value of the welded portion were measured by the following methods. The results are shown in Table 1. Further, in Table 1, the area ratio to all the crystal grains existing in the measured area of the crystal grains having the Vickers hardness Hv1 of 60 or more and the GAM value of 0.5 ° or more and less than 2.0 ° is 25%. The above cases are described as "◎" as having excellent deformation resistance characteristics, and the crystal grains having a Vickers hardness Hv1 of 60 or more and a GAM value of 0.5 ° or more and less than 2.0 ° are described. , The case where the area ratio to all the crystal grains existing in the measurement area is less than 25% is described as "○" as having good deformation resistance, and the case where the Vickers hardness Hv1 is less than 60. , It is described as "x" because it has poor deformation resistance.
In addition, the local deformation characteristics of the weld were also evaluated. When the hardness of the non-welded part, the hardness of the welded part, and the hardness inclination ratio obtained from the indentation distance are 0.2 / μm or less, the welded part and the non-welded part become a small inclined material, so that they are locally deformed. It became difficult and was evaluated as "○" because of its good local deformation resistance. On the other hand, when it exceeds 0.2 / μm, it is easily deformed locally and is set as “Δ”.
[ビッカース硬さ]
 ビッカース硬さHVは、JIS Z2244(2009)に規定の方法に準拠して測定した。このときの荷重(試験力)は20~100gfの間から、圧痕の対角線長さが0.03mmを超えない範囲で選択して試験した。なお、圧子の圧下時間(押し込み時間)は15secである。
 板材を突き合せた実施例1~5、比較例1~9では、図1(a)に示すように、溶接方向をX軸方向、溶接方向に対して垂直な方向をY軸方向、板材法線方向をZ軸方向とした時、このY軸方向に溶接部を切断したときの断面Aに存在する溶接部の板材の厚さaの半分の寸法に相当する位置bにおいて、ビッカース硬さHv1を測定した。溶接方向(X軸方向)に1mmの間隔で切断した5つの断面A(YZ面)において測定し、それらの測定結果の平均値として求めた。
 また、板材を重ね合わせた実施例6では、図1(b)に示すように、Y軸方向に溶接部を切断したときの断面Aに存在する溶接部の板材1の厚さaの半分の寸法に相当する位置b、および、Y軸方向に溶接部を切断したときの断面Aに存在する溶接部の板材2の厚さaの半分の寸法に相当する位置bにおいて、ビッカース硬さHv1を測定した。溶接方向(X軸方向)に1mmの間隔で切断したそれぞれ5つの断面A、A(YZ面)において測定し、それらの測定結果の平均値として求めた。
[Vickers hardness]
Vickers hardness HV was measured according to the method specified in JIS Z2244 (2009). The load (test force) at this time was selected from between 20 and 100 gf within a range in which the diagonal length of the indentation did not exceed 0.03 mm and tested. The pressing time (pushing time) of the indenter is 15 sec.
In Examples 1 to 5 and Comparative Examples 1 to 9 in which the plate materials are butted, as shown in FIG. 1 (a), the welding direction is the X-axis direction, the direction perpendicular to the welding direction is the Y-axis direction, and the plate material method. When the linear direction is the Z-axis direction, the Vickers hardness Hv1 at the position b corresponding to half the thickness a of the plate material of the welded portion existing in the cross section A when the welded portion is cut in the Y-axis direction. Was measured. Measurements were made on five cross sections A (YZ planes) cut at intervals of 1 mm in the welding direction (X-axis direction), and the average values of those measurement results were obtained.
In Example 6 was superimposed a plate, as shown in FIG. 1 (b), of the plate 1 of the welded portion present in the cross section A 1 obtained by cutting the welded portion in the Y-axis direction of the thickness of a 1 At the position b 1 corresponding to half the dimension and at the position b 2 corresponding to half the thickness a 2 of the plate material 2 of the weld portion existing in the cross section A 2 when the weld portion is cut in the Y-axis direction. , Vickers hardness Hv1 was measured. Measured in the welding direction (X axis direction) respectively were cut at intervals of 1mm to five cross A 1, A 2 (YZ plane) was determined as an average of the measurement results.
[GAM値]
 GAM値は、高分解能走査型分析電子顕微鏡(日本電子株式会社製、JSM-7001FA)に付属するEBSD検出器を用いて連続して測定した結晶方位データから解析ソフト(TSL社製、OIM Analysis)を用いて算出した結晶方位解析データから得た。測定は、ステップサイズ0.1μmで行った。測定領域は、上記断面A、A、Aの表面について、電解研磨で鏡面仕上げされた表面において、溶接部の溶接幅と板材の厚さとで区画される長方形の領域全体である。
 所定範囲内のGAM値の結晶粒の面積割合は、0°以上0.25°未満のGAM値を第1区分とし、0.25°刻みで15区分、0°以上3.75°未満までのGAM値を測定対象とし、SEM-EBSD法で得られるSEM画像全体に占める各区分の結晶粒の面積割合の合計から算出した。
 なお、実施例6においては、2枚の板材それぞれについて測定された、GAM値の結晶粒の面積割合の平均値を求め、この平均値を表1に記載した。
[GAM value]
The GAM value is analyzed from the crystal orientation data continuously measured using the EBSD detector attached to the high-resolution scanning analysis electron microscope (JSM-7001FA, manufactured by Nippon Denshi Co., Ltd.) (OIM Analysis, manufactured by TSL). It was obtained from the crystal orientation analysis data calculated using. The measurement was performed with a step size of 0.1 μm. The measurement region is the entire rectangular region of the surfaces of the cross sections A, A 1 , and A 2 which is divided by the weld width of the welded portion and the thickness of the plate material on the surface mirror-finished by electrolytic polishing.
The area ratio of crystal grains with GAM values within the specified range is defined as the first category with GAM values of 0 ° or more and less than 0.25 °, 15 categories in 0.25 ° increments, and 0 ° or more and less than 3.75 °. The GAM value was used as a measurement target, and it was calculated from the total area ratio of crystal grains in each category to the entire SEM image obtained by the SEM-EBSD method.
In Example 6, the average value of the area ratio of the crystal grains of the GAM value measured for each of the two plate materials was obtained, and the average value is shown in Table 1.
Figure JPOXMLDOC01-appb-T000001
Figure JPOXMLDOC01-appb-T000001
 実施例1~6によれば、純Cuからなる2枚の同じ板材の接合において、400~500nmの波長を有する第1レーザ光を100~500μmのスポット径で照射し、かつ、800~1200nmの波長を有する第2レーザ光を10~300μmのスポット径で照射すると共に、溶融部に酸素が1~50ppm含まれる不活性ガスを10~50L/minの流量で噴射しながら、0.1~3msec/スポットで溶接することで、溶接部のビッカース硬さHv1を60以上とすることができることが分かる。中でも、GAM値の結晶粒の面積割合が25%以上である実施例1~3、5及び6は、ビッカース硬さHv1が65以上であり特に高かった。さらに、照射時間が2msec以上の場合は、傾斜が小さくなることが分かる。
 一方、不活性ガスの酸素含有量が10ppmより少ない比較例1は、ビッカース硬さが低かった。また、不活性ガスの酸素含有量が50ppmより多い比較例2や、不活性ガスの流量が10L/minより少ない比較例3は、内部酸化が過剰になり脆化が生じ損傷が大きかった。不活性ガスの流量が50L/minよりも多い比較例4は、凝固不良を生じ溶接部の厚さが大きく減少した。レーザ条件が、400~500nmの波長を有する第1レーザ光を100~500μmのスポット径で照射かつ800~1200nmの波長を有する第2レーザ光を10~300μmのスポット径で照射ではない比較例5~9は、純Cuからなる板材同士を接合できなかった。
According to Examples 1 to 6, in the joining of two identical plates made of pure Cu, a first laser beam having a wavelength of 400 to 500 nm is irradiated with a spot diameter of 100 to 500 μm, and 800 to 1200 nm. While irradiating a second laser beam having a wavelength with a spot diameter of 10 to 300 μm and injecting an inert gas containing 1 to 50 ppm of oxygen into the molten portion at a flow rate of 10 to 50 L / min, 0.1 to 3 msec. It can be seen that the Vickers hardness Hv1 of the welded portion can be set to 60 or more by welding at the spot. Among them, in Examples 1 to 3, 5 and 6 in which the area ratio of the crystal grains having the GAM value was 25% or more, the Vickers hardness Hv1 was 65 or more, which was particularly high. Further, it can be seen that when the irradiation time is 2 msec or more, the inclination becomes small.
On the other hand, in Comparative Example 1 in which the oxygen content of the inert gas was less than 10 ppm, the Vickers hardness was low. Further, in Comparative Example 2 in which the oxygen content of the inert gas was more than 50 ppm and Comparative Example 3 in which the flow rate of the inert gas was less than 10 L / min, internal oxidation became excessive and embrittlement occurred, resulting in great damage. In Comparative Example 4 in which the flow rate of the inert gas was more than 50 L / min, poor solidification occurred and the thickness of the welded portion was greatly reduced. Comparative Example 5 in which the laser conditions are such that the first laser beam having a wavelength of 400 to 500 nm is irradiated with a spot diameter of 100 to 500 μm and the second laser beam having a wavelength of 800 to 1200 nm is not irradiated with a spot diameter of 10 to 300 μm. In No. 9, the plates made of pure Cu could not be joined to each other.
(実施例7~26および比較例10~12)Cu合金からなる2枚の同じ板材の接合
 実施例7~26および比較例10~12では、表2記載の成分組成を持つCu合金からなる2枚の板材を用い、表2に記載した溶接条件で溶接したことの他は、実施例1と同様にした。結果を表2に示す。
(Examples 7 to 26 and Comparative Examples 10 to 12) Joining of two same plates made of Cu alloy In Examples 7 to 26 and Comparative Examples 10 to 12, 2 made of Cu alloy having the component composition shown in Table 2. The same procedure as in Example 1 was carried out except that the sheets were welded under the welding conditions shown in Table 2. The results are shown in Table 2.
Figure JPOXMLDOC01-appb-T000002
Figure JPOXMLDOC01-appb-T000002
 実施例7~26によれば、Cu合金からなる2枚の同じ板材の接合において、400~500nmの波長を有する第1レーザ光を100~500μmのスポット径で照射し、かつ、800~1200nmの波長を有する第2レーザ光を10~300μmのスポット径で照射すると共に、溶融部に酸素が1~50ppm含まれる不活性ガスを10~50L/minの流量で噴射しながら0.2~10msec/スポットで溶接することで、溶接部のビッカース硬さHv1を60以上とすることができることが分かる。中でも、GAM値の結晶粒の面積割合が25%以上である実施例7、8、10、12、14、15、16、18、20、22、24、26は、板材に対する溶接部のビッカース硬さの比(溶接部のビッカース硬さ/板材のビッカース硬さ)を0.5以上にすることができ、溶接部のビッカース硬さの低下を特に抑制できた。
比較例10は酸素量が少ない為、溶接部の強度を高めることが出来ず、比較例11では照射時間が短い為、溶接がなされなかった。さらに比較例12では照射時間が長い為に溶接部の溶け落ちが生じ、減肉することできれいな断面を得ることが出来なかった。
According to Examples 7 to 26, in the joining of two identical plates made of Cu alloy, a first laser beam having a wavelength of 400 to 500 nm is irradiated with a spot diameter of 100 to 500 μm, and 800 to 1200 nm. A second laser beam having a wavelength is irradiated with a spot diameter of 10 to 300 μm, and an inert gas containing 1 to 50 ppm of oxygen is injected into the molten portion at a flow rate of 10 to 50 L / min at a flow rate of 0.2 to 10 msec / min. It can be seen that the Vickers hardness Hv1 of the welded portion can be set to 60 or more by welding at the spot. Among them, in Examples 7, 8, 10, 12, 14, 15, 16, 18, 20, 22, 24, and 26 in which the area ratio of the crystal grains having the GAM value is 25% or more, the Vickers hardness of the welded portion with respect to the plate material is obtained. The Vickers hardness of the welded portion (Vickers hardness of the welded portion / Vickers hardness of the plate material) could be set to 0.5 or more, and the decrease in the Vickers hardness of the welded portion could be particularly suppressed.
In Comparative Example 10, since the amount of oxygen was small, the strength of the welded portion could not be increased, and in Comparative Example 11, the irradiation time was short, so welding was not performed. Further, in Comparative Example 12, since the irradiation time was long, the welded portion was melted down, and the wall thickness was reduced, so that a clean cross section could not be obtained.
(実施例27~28)純Cuからなり成分組成の異なる2枚の板材の接合
 実施例27では、表3に記載の成分組成を持つCu合金からなる板材を用い、表3に記載した溶接条件で溶接したことの他は、実施例1(突き合わせ)と同様にした。
 実施例28では、表3に記載の成分組成を持つCu合金からなる板材を用い、表3に記載した溶接条件で溶接したことの他は、実施例6(重ね合わせ)と同様にした。なお、表3の上段に記載した板材がレーザ照射側となるように重ね合わせた。
 結果を表3に示す。
(Examples 27 to 28) Joining of two plates made of pure Cu and having different component compositions In Example 27, a plate made of a Cu alloy having the component composition shown in Table 3 was used, and the welding conditions shown in Table 3 were used. It was the same as in Example 1 (butting) except that it was welded in.
In Example 28, a plate material made of a Cu alloy having the component composition shown in Table 3 was used, and the same as in Example 6 (superimposition) except that welding was performed under the welding conditions shown in Table 3. The plates shown in the upper part of Table 3 were overlapped so as to be on the laser irradiation side.
The results are shown in Table 3.
Figure JPOXMLDOC01-appb-T000003
Figure JPOXMLDOC01-appb-T000003
 実施例27~28によれば、純Cuからなり成分組成の異なる2枚の板材の接合において、400~500nmの波長を有する第1レーザ光を100~500μmのスポット径で照射し、かつ、800~1200nmの波長を有する第2レーザ光を10~300μmのスポット径で照射すると共に、溶融部に酸素が1~50ppm含まれる不活性ガスを10~50L/minの流量で噴射しながら1msec/スポットの照射時間で溶接することで、溶接部のビッカース硬さHv1を60以上とすることができることが分かる。 According to Examples 27 to 28, in the joining of two plates made of pure Cu and having different component compositions, a first laser beam having a wavelength of 400 to 500 nm is irradiated with a spot diameter of 100 to 500 μm, and 800. A second laser beam having a wavelength of about 1200 nm is irradiated with a spot diameter of 10 to 300 μm, and an inert gas containing 1 to 50 ppm of oxygen is injected into the molten portion at a flow rate of 10 to 50 L / min at 1 msec / spot. It can be seen that the Vickers hardness Hv1 of the welded portion can be set to 60 or more by welding with the irradiation time of.
(実施例29~31)Cu合金からなり成分組成の異なる2枚の板材の接合
 実施例29~31では、表4に記載の成分組成を持つCu合金からなる板材を用い、表4に記載した溶接条件で溶接したことの他は、実施例1と同様にした。結果を表4に示す。
(Examples 29 to 31) Joining of two plates made of Cu alloy and having different composition compositions In Examples 29 to 31, the plates made of Cu alloy having the composition shown in Table 4 are used and are shown in Table 4. The same as in Example 1 was carried out except that the welding was performed under the welding conditions. The results are shown in Table 4.
Figure JPOXMLDOC01-appb-T000004
Figure JPOXMLDOC01-appb-T000004
 実施例29~31によれば、Cu合金からなり成分組成の異なる2枚の板材の接合において、400~500nmの波長を有する第1レーザ光を100~500μmのスポット径で照射し、かつ、800~1200nmの波長を有する第2レーザ光を10~300μmのスポット径で照射すると共に、溶融部に酸素が1~50ppm含まれる不活性ガスを10~50L/minの流量で噴射しながら1msec/スポットの照射時間で溶接することで、溶接部のビッカース硬さHv1を60以上とすることができることが分かる。 According to Examples 29 to 31, in the joining of two plates made of Cu alloy and having different component compositions, a first laser beam having a wavelength of 400 to 500 nm is irradiated with a spot diameter of 100 to 500 μm, and 800. A second laser beam having a wavelength of about 1200 nm is irradiated with a spot diameter of 10 to 300 μm, and an inert gas containing 1 to 50 ppm of oxygen is injected into the molten portion at a flow rate of 10 to 50 L / min at 1 msec / spot. It can be seen that the Vickers hardness Hv1 of the welded portion can be set to 60 or more by welding with the irradiation time of.
(実施例32~33)純Cuからなる板材とCu合金からなる板材との接合
 実施例32では、表5に記載の成分組成を持つ純Cuからなる板材とCu合金からなる板材を用い、表5に記載した溶接条件で溶接したことの他は、実施例1(突き合わせ)と同様にした。
 実施例33では、表5に記載の成分組成を持つ純Cuからなる板材とCu合金からなる板材を用い、表5に記載した溶接条件で溶接したことの他は、実施例6(重ね合わせ)と同様にした。なお、表5の上段に記載した第1板材がレーザ照射側となるように重ね合わせた。
 結果を表5に示す。
(Examples 32 to 33) Welding of a plate material made of pure Cu and a plate material made of Cu alloy In Example 32, a plate material made of pure Cu having the component composition shown in Table 5 and a plate material made of Cu alloy are used. The same as in Example 1 (butting) except that the welding was performed under the welding conditions described in 5.
In Example 33, a plate material made of pure Cu having the component composition shown in Table 5 and a plate material made of a Cu alloy were used and welded under the welding conditions shown in Table 5, but in Example 6 (superimposition). I did the same. The first plate materials shown in the upper part of Table 5 were overlapped so as to be on the laser irradiation side.
The results are shown in Table 5.
Figure JPOXMLDOC01-appb-T000005
Figure JPOXMLDOC01-appb-T000005
 実施例32~33によれば、純Cuからなる板材とCu合金からなる板材との接合において、400~500nmの波長を有する第1レーザ光を100~500μmのスポット径で照射し、かつ、800~1200nmの波長を有する第2レーザ光を10~300μmのスポット径で照射すると共に、溶融部に酸素が1~50ppm含まれる不活性ガスを10~50L/minの流量で噴射しながら1msec/スポットの照射時間で溶接することで、溶接部のビッカース硬さHv1を60以上とすることができることが分かる。  According to Examples 32 to 33, in the joining of the plate material made of pure Cu and the plate material made of Cu alloy, the first laser beam having a wavelength of 400 to 500 nm is irradiated with a spot diameter of 100 to 500 μm, and 800. A second laser beam having a wavelength of about 1200 nm is irradiated with a spot diameter of 10 to 300 μm, and an inert gas containing 1 to 50 ppm of oxygen is injected into the molten portion at a flow rate of 10 to 50 L / min at 1 msec / spot. It can be seen that the Vickers hardness Hv1 of the welded portion can be set to 60 or more by welding with the irradiation time of. It was
 以上、これらの実施例・比較例によりGAM値が0.5°以上2.0°未満の面積割合を高めることで、溶接部の硬さを60以上に制御でき、加えて溶接部と非溶接部の硬さ傾斜率が0.2/μm以下であれば、より変形に対し強くなるため、実用上問題がないことがわかる。したがって、本発明により、ベーパーチャンバやバスバーなどの溶接部を有する電気・電子機器用部品において、溶接部・非溶接部の硬さを制御することによって、剛性があり、かつ、溶接部での局所変形に強い電気・電子機器用部品を得られることがわかる。 As described above, by increasing the area ratio in which the GAM value is 0.5 ° or more and less than 2.0 ° by these Examples and Comparative Examples, the hardness of the welded portion can be controlled to 60 or more, and in addition, the welded portion and the non-welded portion are not welded. When the hardness inclination ratio of the portion is 0.2 / μm or less, it becomes more resistant to deformation, and it can be seen that there is no practical problem. Therefore, according to the present invention, in an electric / electronic device component having a welded portion such as a vapor chamber or a bus bar, the hardness of the welded portion / non-welded portion is controlled to have rigidity and locality at the welded portion. It can be seen that parts for electrical and electronic equipment that are resistant to deformation can be obtained.
 1、2 板材
 3、3A、3B、3C 溶接部
 10、10A、10B、10C 接合体
 10D Cu部材
 101、102 Cu板材
 20 レーザ溶接装置
 21 レーザ制御部
 24 加工台
 25 グラスファイバー
 26 集光レンズ
 28 集束レンズ
 29 レーザヘッド
 30 ガス供給ノズル
 221,222 レーザ発振器
 231 第1レーザ光
 232 第2レーザ光
 261 第1集光レンズ
 262 第2集光レンズ
 271 第1ミラー
 272 第2ミラー
1, 2 Plate material 3, 3A, 3B, 3C Welded part 10, 10A, 10B, 10C Joined body 10D Cu member 101, 102 Cu plate material 20 Laser welding device 21 Laser control unit 24 Processing table 25 Glass fiber 26 Condensing lens 28 Focusing Lens 29 Laser head 30 Gas supply nozzle 221,222 Laser oscillator 231 1st laser beam 232 2nd laser beam 261 1st condensing lens 262 2nd condensing lens 271 1st mirror 272 2nd mirror

Claims (7)

  1.  90質量%以上のCuを含有する複数の板材で構成され、
     前記複数の板材同士を、互いに突き合わせた状態又は重ね合わせた状態で溶接により線状又は点状に接合して一体化する溶接部を有し、
     前記溶接部は、前記板材の厚さ全体に亘って延在し、
     接合された前記複数の板材が延在する方向に前記溶接部を切断したときの断面にて、
     前記溶接部は、溶接痕の幅である溶接幅の中央で前記板材の厚さの半分の寸法に相当する位置において測定したときのビッカース硬さHV1が、60以上である電気・電子機器用部品。
    It is composed of a plurality of plate materials containing 90% by mass or more of Cu.
    It has a welded portion in which the plurality of plate materials are joined to each other in a linear or dot shape by welding in a state of being abutted against each other or in a state of being overlapped with each other.
    The weld extends over the entire thickness of the plate.
    In the cross section when the welded portion is cut in the direction in which the plurality of joined plates extend.
    The welded portion is a component for electrical and electronic equipment having a Vickers hardness HV1 of 60 or more when measured at a position corresponding to half the thickness of the plate material at the center of the weld width, which is the width of the weld mark. ..
  2.  前記断面において、前記溶接部の溶接幅と前記板材の厚さとで区画される長方形の領域にて、SEM-EBSD法の結晶方位解析データから得られるGAM値を測定したとき、前記GAM値が0.5°以上2.0°未満である結晶粒は、測定面積に存在する全ての結晶粒に対する面積割合が25%以上である、請求項1に記載の電気・電子機器用部品。 In the cross section, when the GAM value obtained from the crystal orientation analysis data of the SEM-EBSD method is measured in the rectangular region partitioned by the welding width of the welded portion and the thickness of the plate material, the GAM value is 0. The component for electrical / electronic equipment according to claim 1, wherein the crystal grains having a temperature of 5.5 ° or more and less than 2.0 ° have an area ratio of 25% or more to all the crystal grains existing in the measurement area.
  3.  90質量%以上のCuを含有する複数の板材で構成され、
    前記複数の板材同士を、互いに突き合わせた状態又は重ね合わせた状態で溶接により線状又は点状に接合して一体化する溶接部を有し、
     前記溶接部は、前記板材の厚さ全体に亘って延在し、
     接合された前記複数の板材が延在する方向に前記溶接部を切断したときの断面にて、
     板材表面の溶接痕の幅である溶接幅の中央で前記板材の厚さの半分の寸法に相当する位置において測定したときの前記溶接部におけるビッカース硬さをHV1とし、
     前記溶接部の中心位置から溶接半幅の1.5倍に相当する距離だけ、溶接幅の方向に沿って離隔した位置で測定したときの前記非溶接部におけるビッカース硬さをHV2とするとき、
     前記非溶接部でのビッカース硬さHV2が75以上であり、
     前記非溶接部でのビッカース硬さHV2と、前記溶接部でのビッカース硬さHV1との差を、ビッカース硬さHV1およびHV2を測定した位置間の圧痕距離X(μm)で除したときの硬さ傾斜率((HV2-HV1)/X)が、0.2/μm以下である、請求項1又は2の電気・電子機器用部品。
    It is composed of a plurality of plate materials containing 90% by mass or more of Cu.
    It has a welded portion in which the plurality of plate materials are joined to each other in a linear or dot shape by welding in a state of being abutted against each other or in a state of being overlapped with each other.
    The weld extends over the entire thickness of the plate.
    In the cross section when the welded portion is cut in the direction in which the plurality of joined plates extend.
    The Vickers hardness at the welded portion when measured at a position corresponding to half the thickness of the plate material at the center of the weld width, which is the width of the weld mark on the surface of the plate material, is defined as HV1.
    When the Vickers hardness in the non-welded portion when measured at a position separated along the direction of the weld width by a distance corresponding to 1.5 times the weld half width from the center position of the welded portion is HV2.
    The Vickers hardness HV2 in the non-welded portion is 75 or more, and the Vickers hardness is 75 or more.
    Hardness when the difference between the Vickers hardness HV2 in the non-welded portion and the Vickers hardness HV1 in the welded portion is divided by the indentation distance X (μm) between the positions where the Vickers hardness HV1 and HV2 are measured. The component for electrical / electronic equipment according to claim 1 or 2, wherein the slope ratio ((HV2-HV1) / X) is 0.2 / μm or less.
  4.  前記板材が、Ag、Fe、Ni、Co、Si、Cr、Sn、Zn、MgおよびPからなる群より選択される1種以上の元素を含む、請求項1ないし3のいずれか1項に記載の電気・電子機器用部品。 The invention according to any one of claims 1 to 3, wherein the plate material contains one or more elements selected from the group consisting of Ag, Fe, Ni, Co, Si, Cr, Sn, Zn, Mg and P. Parts for electrical and electronic equipment.
  5.  前記板材が、99.96質量%以上のCuおよび不可避不純物である、請求項1ないし3のいずれか1項に記載の電気・電子機器用部品。 The component for electrical / electronic equipment according to any one of claims 1 to 3, wherein the plate material is 99.96% by mass or more of Cu and unavoidable impurities.
  6.  前記電気・電子機器用部品がベーパーチャンバである、請求項1~5のいずれか1項に記載の電気・電子機器用部品。 The component for electrical / electronic equipment according to any one of claims 1 to 5, wherein the component for electrical / electronic equipment is a vapor chamber.
  7.  前記電気・電子機器用部品がバスバーである、請求項1~5のいずれか1項に記載の電気・電子機器用部品。 The component for electrical / electronic equipment according to any one of claims 1 to 5, wherein the component for electrical / electronic equipment is a bus bar.
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