WO2021238131A1 - 一种用于麦克风芯片的测试插座 - Google Patents

一种用于麦克风芯片的测试插座 Download PDF

Info

Publication number
WO2021238131A1
WO2021238131A1 PCT/CN2020/133321 CN2020133321W WO2021238131A1 WO 2021238131 A1 WO2021238131 A1 WO 2021238131A1 CN 2020133321 W CN2020133321 W CN 2020133321W WO 2021238131 A1 WO2021238131 A1 WO 2021238131A1
Authority
WO
WIPO (PCT)
Prior art keywords
test
chip
test socket
floating
lower chamber
Prior art date
Application number
PCT/CN2020/133321
Other languages
English (en)
French (fr)
Inventor
卢成
侯燕兵
Original Assignee
法特迪精密科技（苏州）有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 法特迪精密科技（苏州）有限公司 filed Critical 法特迪精密科技（苏州）有限公司
Publication of WO2021238131A1 publication Critical patent/WO2021238131A1/zh

Links

Classifications

    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04R—LOUDSPEAKERS, MICROPHONES, GRAMOPHONE PICK-UPS OR LIKE ACOUSTIC ELECTROMECHANICAL TRANSDUCERS; DEAF-AID SETS; PUBLIC ADDRESS SYSTEMS
    • H04R29/00—Monitoring arrangements; Testing arrangements

Definitions

  • This application relates to the technical field of microphone detection equipment, and in particular to a test socket for microphone chips.
  • the proton exchange membranes, catalysts, bipolar plates, and gas diffusion layers in the fuel cell system undergo irreversible performance degradation over time during the operation of the fuel cell vehicle, which leads to the decline of the fuel cell system voltage.
  • the power of the fuel cell system is attenuated. If the power attenuation is too large, it will not be able to meet the energy distribution requirements of the vehicle. Most of the current fuel cell service life cannot meet the requirements. Therefore, limiting the fuel cell decay rate to a certain level can meet the life requirements of the fuel cell system to a certain extent. Therefore, it is necessary to monitor the power attenuation of the fuel cell system in real time. Maintain the fuel cell system in a timely manner.
  • MEMS Micro-Electro-Mechanical-System
  • the MEMS microphone chip has higher requirements for the test environment. During the test, it is not only necessary to shield the external sound, and then send the test sound through the test sounder, so that the test sound is evenly and efficiently transmitted to the chip under test, and it must be controlled well. The pressure exerted on the chip to be tested, but the traditional test socket is difficult to match the test requirements, resulting in poor accuracy of the test results.
  • the purpose of this application is to provide a test socket for microphone chips, which can effectively shield external sounds, conduct test sounds evenly and efficiently, and at the same time avoid the chip caused by excessive or small pressure during the test. The test failed.
  • a test socket for a microphone chip including a test socket and a test cover that can be closed on the test socket.
  • the test seat is provided with a lower chamber with a hemispherical structure.
  • the top of the lower chamber is provided with a floating plate for placing the chip to be tested, and the bottom of the lower chamber is provided with a receiving groove for placing a microphone.
  • the test cover is provided with an upper chamber which can cooperate with the lower chamber to form a spherical reflection cavity.
  • the top of the upper chamber is provided with a sounding groove for placing a sound generator, and the inner wall is provided with a pressing component that can be elastically pressed against the chip to be tested.
  • the test cover is also provided with a sealing component for sealing the spherical reflecting cavity.
  • the sealing of the spherical reflective cavity by the sealing component can effectively shield the external sound and provide a closed environment for the test of the chip to be tested;
  • the setting of the pressing component can elastically press down the chip to be tested, which ensures that The chip to be tested can accurately enter the test position, and the test failure caused by excessive or small pressure on the chip to be tested is avoided;
  • the spherical reflective cavity formed by the upper and lower chambers makes the sounder emit The test sound can be evenly reflected on the chip to be tested on the floating board to ensure the uniform and efficient conduction of the test sound.
  • the sealing assembly includes an annular groove opened at the bottom of the test cover along the outer side of the upper chamber, and an O-shaped sealing ring is installed in the annular groove.
  • the O-shaped sealing ring can be sealed and pressed against the floating plate.
  • test seat is provided with a mounting ring groove opened outward along the edge of the lower chamber, and the floating plate which can be driven up and down by the floating assembly is installed in the mounting ring groove.
  • the floating assembly includes several sets of springs evenly distributed in the mounting ring groove; the springs are arranged vertically, one end of which is fixed to the mounting ring groove, and the other end is fixed to the floating plate . Evenly distributed sets of springs can ensure the uniformity of floating of the floating plate.
  • a test pin for testing the chip to be tested is also fixed on the inner wall of the lower chamber.
  • a gap is left between the test needle and the floating plate.
  • a plurality of placement grooves for placing the chip to be tested are evenly distributed on the floating plate, and a plurality of insertion holes for the test pin to be inserted are provided in the placement groove.
  • the pressing component includes elastic pins corresponding to the placing grooves one-to-one; the elastic pins are vertically arranged, the top of which is clamped in the upper chamber, and the bottom is aligned with the placing groove.
  • the elastic pin is arranged to realize the elastic pressing of the chip to be tested.
  • Figure 1 is an exploded view of an embodiment of the application
  • Figure 2 is a cut-away schematic diagram of the application.
  • a test socket for microphone chips of the present application includes a test socket 1 and a test cover 2 that can be covered on the test socket 1.
  • the test seat 1 is provided with a lower chamber 11 with a hemispherical structure.
  • the top of the lower chamber 11 is provided with a floating plate 3 for placing the chip to be tested, the bottom is provided with a receiving groove 12 for placing a microphone, and the inner wall is provided with a test pin 13 for testing the chip to be tested.
  • the test cover 2 is provided with an upper chamber 21 capable of cooperating with the lower chamber 11 to form a spherical reflective cavity.
  • the top of the upper chamber 21 is provided with a sounding groove 22 for placing a sounder, and the inner wall is provided with a pressing component that can be elastically pressed against the chip to be tested.
  • the test cover is also provided with a sealing component for sealing the spherical reflection cavity.
  • the sealing of the spherical reflective cavity by the sealing component can effectively shield the external sound and provide a sealed environment for the test of the chip under test;
  • the setting of the pressing component can elastically press down the chip under test, which ensures that the chip under test can accurately enter The test position avoids the test failure caused by excessive or too small pressure on the chip to be tested;
  • the spherical reflection cavity formed by the upper chamber and the lower chamber enables the test sound emitted by the sound generator to be evenly reflected to It is located on the chip to be tested on the floating board to ensure the even and efficient conduction of the test sound.
  • the test seat 1 is provided with a mounting ring groove 14 that is opened outward along the edge of the lower chamber 11, and the mounting ring groove 14 is installed in the mounting ring groove 14 which can float up and down driven by a floating assembly.
  • the floating assembly includes several sets of springs 4 evenly distributed in the mounting ring groove 14; the springs 4 are arranged vertically, one end of which is fixed to the mounting ring groove 14, and the other end is fixed to the floating plate 3. catch. When the spring 4 is in a natural state, a gap is left between the test needle 13 and the floating plate 3.
  • the up and down floating of the floating plate 3 ensures that when the chip to be tested is placed, the chip to be tested does not touch the test pin 13, thereby reducing the wear of the test pin 13; the floating plate 3 can be ensured by a number of evenly distributed sets of springs 4 The uniformity of the float.
  • the floating board 3 is evenly distributed with four placement slots 31 for placing the chips to be tested, and each placement slot 31 is provided with a plurality of insertion slots for the test pins 13 to be inserted. ⁇ 311.
  • the inner wall of the lower chamber 11 is provided with four test needles 13 corresponding to the placement grooves 31 one by one.
  • the sealing assembly includes an annular groove 23 opened at the bottom of the test cover 2 along the outer side of the upper chamber 21, and an O-shaped sealing ring 24 is installed in the annular groove 23.
  • the O-shaped sealing ring 24 can be sealed and pressed against the floating plate 3, thereby ensuring the sealing of the spherical reflecting cavity.
  • the pressing component includes elastic pins 5 corresponding to the placement grooves 31 one-to-one.
  • the elastic pin 5 is vertically arranged, the top of which is clamped in the upper chamber 21 and the bottom thereof is aligned with the placement groove 31.
  • the elastic pin is arranged to realize the elastic pressing of the chip to be tested, which not only ensures that the chip to be tested can accurately enter the test position, but also avoids the test failure caused by excessive or small pressure on the chip to be tested.

Landscapes

  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Otolaryngology (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Acoustics & Sound (AREA)
  • Signal Processing (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Electrostatic, Electromagnetic, Magneto- Strictive, And Variable-Resistance Transducers (AREA)

Abstract

本申请公开了一种用于麦克风芯片的测试插座，包括测试座以及能盖合在所述测试座上的测试盖。所述测试座内设有半球形结构的下腔室；所述下腔室的顶部设有用于放置待测芯片的浮动板，底部设有用于放置收音器的收音槽。所述测试盖内设有能与所述下腔室配合以形成球形反射腔的上腔室。所述上腔室的顶部设有用于放置发声器的发声槽，内壁设有能弹性压靠到待测芯片上的压靠组件。所述测试盖内还设有用于密封所述球形反射腔的密封组件。本申请的测试插座能有效屏蔽外界声音，均匀高效地传导测试声音，同时又避免了测试过程中芯片因压力过大或过小导致的测试失效。

Description

一种用于麦克风芯片的测试插座 技术领域
本申请涉及麦克风检测设备技术领域，尤其涉及一种用于麦克风芯片的测试插座。
 背景技术
对于燃料电池车，燃料电池系统中的质子交换膜、催化剂、双极板和气体扩散层等在燃料电池汽车运行过程中随着时间发生不可逆的性能退化，从而导致了燃料电池系统电压的衰退，进而导致燃料电池系统功率的衰减。若功率衰减过大就无法满足整车能量分配需求。当前的燃料电池大都使用寿命无法满足要求，因此将燃料电池衰退速率限定在一定的水平内就能够在一定程度上满足燃料电池系统的寿命要求，所以实时监测燃料电池系统功率衰减很有必要，便于及时对燃料电池系统进行维护保养处理。
近年来利用MEMS（Micro-Electro-Mechanical-System,简称MEMS）工艺集成的MEMS麦克风开始被批量应用到手机、笔记本电脑等电子产品中，其封装体积比传统的驻极体麦克风小，因此受到大部分麦克风生产商的青睐。
而MEMS类麦克风芯片对测试环境要求较高，在测试时不仅需要屏蔽外界声音，再通过测试用的发声器发出测试声音，以使测试声音均匀高效地传导到待测芯片上，同时要控制好施加在待测芯片上的压力，但传统的测试插座难以匹配该测试要求，导致测试结果准确度较差。
 技术问题
为克服上述缺点，本申请的目的在于提供一种用于麦克风芯片的测试插座，能有效屏蔽外界声音，均匀高效地传导测试声音，同时又避免了测试过程中芯片因压力过大或过小导致的测试失效。
 技术解决方案
为了达到以上目的，本申请采用的技术方案是：一种用于麦克风芯片的测试插座，包括测试座以及能盖合在所述测试座上的测试盖。所述测试座内设有半球形结构的下腔室。所述下腔室的顶部设有用于放置待测芯片的浮动板，底部设有用于放置收音器的收音槽。所述测试盖内设有能与所述下腔室配合以形成球形反射腔的上腔室。所述上腔室的顶部设有用于放置发声器的发声槽，内壁设有能弹性压靠到待测芯片上的压靠组件。所述测试盖内还设有用于密封所述球形反射腔的密封组件。
本申请的有益效果在于：通过密封组件对球形反射腔的密封能有效屏蔽外界声音，为待测芯片的测试提供密闭环境；通过压靠组件的设置能对待测芯片进行弹性下压，既保证了待测芯片能准确进入到测试位，又避免了施加在待测芯片上的压力过大或过小导致的测试失效；再通过上腔室、下腔室形成的球形反射腔使得发声器发出的测试声音能均匀地反射到位于浮动板上的待测芯片上，保证测试声音的均匀高效传导。
进一步来说，所述密封组件包括沿所述上腔室外侧开设在所述测试盖底部的环形凹槽，所述环形凹槽内安装有O型密封圈。当所述测试盖盖合在所述测试座上时，所述O型密封圈能密封抵压在所述浮动板上。
进一步来说，所述测试座内设有沿所述下腔室边缘向外开设的安装环槽，所述安装环槽内安装有受浮动组件驱动能上下浮动的所述浮动板。
进一步来说，所述浮动组件包括均布在所述安装环槽内的若干组弹簧；所述弹簧竖直设置，其一端与所述安装环槽固接，另一端与所述浮动板固接。通过均布的若干组弹簧能保证浮动板浮动的均匀度。
进一步来说，所述下腔室的内壁上还固接有用于测试待测芯片的测试针。当所述弹簧处于自然状态时，所述测试针与浮动板之间留有间隙。通过浮动板的上下浮动，保证了在放置待测芯片时，待测芯片是不接触测试针的，进而减小了测试针的磨损。
进一步来说，所述浮动板上均布有多个用于放置待测芯片的放置槽，所述放置槽内设有多个供所述测试针插入的插孔。
进一步来说，所述压靠组件包括与所述放置槽一一对应的弹性销；所述弹性销竖直设置，其顶部卡接在所述上腔室内，底部对准所述放置槽。通过弹性销的设置实现了对待测芯片的弹性压合。
 附图说明
图1为本申请实施例的爆炸视图；
图2为本申请的剖切示意图。
图中：1-测试座；11-下腔室；12-收音槽；13-测试针；14-安装环槽；2-测试盖；21-上腔室；22-发声槽；23-环形凹槽；24-O型密封圈；3-浮动板；31-放置槽；311-插孔；4-弹簧；5-弹性销。
 本发明的最佳实施方式
下面结合附图对本申请的较佳实施例进行详细阐述，以使本申请的优点和特征能更易于被本领域技术人员理解，从而对本申请的保护范围做出更为清楚明确的界定。
 实施例
参见附图1-2所示，本申请的一种用于麦克风芯片的测试插座，包括测试座1以及能盖合在所述测试座1上的测试盖2。所述测试座1内设有半球形结构的下腔室11。所述下腔室11的顶部设有用于放置待测芯片的浮动板3，底部设有用于放置收音器的收音槽12，内壁设有用于测试待测芯片的测试针13。所述测试盖2内设有能与所述下腔室11配合以形成球形反射腔的上腔室21。所述上腔室21的顶部设有用于放置发声器的发声槽22，内壁设有能弹性压靠到待测芯片上的压靠组件。所述测试盖内还设有用于密封所述球形反射腔的密封组件。
通过密封组件对球形反射腔的密封能有效屏蔽外界声音，为待测芯片的测试提供密闭环境；通过压靠组件的设置能对待测芯片进行弹性下压，既保证了待测芯片能准确进入到测试位，又避免了施加在待测芯片上的压力过大或过小导致的测试失效；再通过上腔室、下腔室形成的球形反射腔使得发声器发出的测试声音能均匀地反射到位于浮动板上的待测芯片上，保证测试声音的均匀高效传导。
在本实施例中，所述测试座1内设有沿所述下腔室11边缘向外开设的安装环槽14，所述安装环槽14内安装有受浮动组件驱动能上下浮动的所述浮动板3。所述浮动组件包括均布在所述安装环槽14内的若干组弹簧4；所述弹簧4竖直设置，其一端与所述安装环槽14固接，另一端与所述浮动板3固接。当所述弹簧4处于自然状态时，所述测试针13与浮动板3之间留有间隙。通过浮动板3的上下浮动保证了在放置待测芯片时，待测芯片是不接触测试针13的，进而减小了测试针13的磨损；通过均布的若干组弹簧4能保证浮动板3浮动的均匀度。
在本实施例中，所述浮动板3上均布有四个用于放置待测芯片的放置槽31，每个所述放置槽31内均设有多个供所述测试针13插入的插孔311。对应的，所述下腔室11的内壁上设有4个与所述放置槽31一一对应的所述测试针13。通过多个放置槽的设置实现了对多个芯片的同步测试，提高了测试效率。
在本实施例中，所述密封组件包括沿所述上腔室21外侧开设在所述测试盖2底部的环形凹槽23，所述环形凹槽23内安装有O型密封圈24。当所述测试盖2盖合在所述测试座1上时，所述O型密封圈24能密封抵压在所述浮动板3上，进而保证球形反射腔的密封。
在本实施例中，所述压靠组件包括与所述放置槽31一一对应的弹性销5。所述弹性销5竖直设置，其顶部卡接在所述上腔室21内，底部对准所述放置槽31。通过弹性销的设置实现了对待测芯片的弹性压合，既保证了待测芯片能准确进入到测试位，又避免了施加在待测芯片上的压力过大或过小导致的测试失效。
以上实施方式只为说明本申请的技术构思及特点，其目的在于让熟悉此项技术的人了解本申请的内容并加以实施，并不能以此限制本申请的保护范围，凡根据本申请精神实质所做的等效变化或修饰，都应涵盖在本申请的保护范围内。

Claims (7)

  1. 一种用于麦克风芯片的测试插座，包括测试座以及能盖合在所述测试座上的测试盖；其特征在于：所述测试座的顶部设有半球形结构的下腔室；所述下腔室的顶部设有用于放置待测芯片的浮动板，底部设有用于放置收音器的收音槽；所述测试盖上设有能与所述下腔室配合以形成球形反射腔的上腔室；所述上腔室的顶部设有用于放置发声器的发声槽，内壁设有能弹性压靠到待测芯片上的压靠组件；所述测试盖内还设有用于密封所述球形反射腔的密封组件。
  2. 根据权利要求1所述的测试插座，其特征在于：所述密封组件包括沿所述上腔室外侧开设在所述测试盖底部的环形凹槽，所述环形凹槽内安装有O型密封圈；当所述测试盖盖合在所述测试座上时，所述O型密封圈能密封抵压在所述浮动板上。
  3. 根据权利要求2所述的测试插座，其特征在于：所述测试座内设有沿所述下腔室边缘向外开设的安装环槽，所述安装环槽内安装有受浮动组件驱动能上下浮动的所述浮动板。
  4. 根据权利要求3所述的测试插座，其特征在于：所述浮动组件包括均布在所述安装环槽内的若干组弹簧；所述弹簧竖直设置，其一端与所述安装环槽固接，另一端与所述浮动板固接。
  5. 根据权利要求4所述的测试插座，其特征在于：所述下腔室的内壁上还固接有用于测试待测芯片的测试针；当所述弹簧处于自然状态时，所述测试针与浮动板之间留有间隙。
  6. 根据权利要求5所述的测试插座，其特征在于：所述浮动板上均布有多个用于放置待测芯片的放置槽，所述放置槽内设有多个供所述测试针插入的插孔。
  7. 根据权利要求6所述的测试插座，其特征在于：所述压靠组件包括与所述放置槽一一对应的弹性销；所述弹性销竖直设置，其顶部卡接在所述上腔室内，底部对准所述放置槽。
PCT/CN2020/133321 2020-05-26 2020-12-02 一种用于麦克风芯片的测试插座 WO2021238131A1 (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
CN202020911043.6U CN211959563U (zh) 2020-05-26 2020-05-26 一种用于麦克风芯片的测试插座
CN202020911043.6 2020-05-26

Publications (1)

Publication Number Publication Date
WO2021238131A1 true WO2021238131A1 (zh) 2021-12-02

Family

ID=73170970

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/CN2020/133321 WO2021238131A1 (zh) 2020-05-26 2020-12-02 一种用于麦克风芯片的测试插座

Country Status (2)

Country Link
CN (1) CN211959563U (zh)
WO (1) WO2021238131A1 (zh)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN211959563U (zh) * 2020-05-26 2020-11-17 法特迪精密科技（苏州）有限公司 一种用于麦克风芯片的测试插座

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20070170938A1 (en) * 2006-01-26 2007-07-26 Horng Terng Automation Co., Ltd Test fixture and method for testing a semi-finished chip package
CN205320292U (zh) * 2015-12-18 2016-06-15 歌尔声学股份有限公司 一种mems麦克风测试工装
CN105722003A (zh) * 2016-01-20 2016-06-29 苏州搏技光电技术有限公司 一种mems麦克风测试机构
CN209746090U (zh) * 2019-03-06 2019-12-06 法特迪精密科技（苏州）有限公司 一种用于芯片上表面不能受力情况下的测试插座
CN210518828U (zh) * 2019-09-20 2020-05-12 珠海市运泰利自动化设备有限公司 麦克风测试装置
CN211959563U (zh) * 2020-05-26 2020-11-17 法特迪精密科技（苏州）有限公司 一种用于麦克风芯片的测试插座

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20070170938A1 (en) * 2006-01-26 2007-07-26 Horng Terng Automation Co., Ltd Test fixture and method for testing a semi-finished chip package
CN205320292U (zh) * 2015-12-18 2016-06-15 歌尔声学股份有限公司 一种mems麦克风测试工装
CN105722003A (zh) * 2016-01-20 2016-06-29 苏州搏技光电技术有限公司 一种mems麦克风测试机构
CN209746090U (zh) * 2019-03-06 2019-12-06 法特迪精密科技（苏州）有限公司 一种用于芯片上表面不能受力情况下的测试插座
CN210518828U (zh) * 2019-09-20 2020-05-12 珠海市运泰利自动化设备有限公司 麦克风测试装置
CN211959563U (zh) * 2020-05-26 2020-11-17 法特迪精密科技（苏州）有限公司 一种用于麦克风芯片的测试插座

Also Published As

Publication number Publication date
CN211959563U (zh) 2020-11-17

Similar Documents

Publication Publication Date Title
US7901833B2 (en) Fuel cartridge for fuel cells, fuel cell, fuel cell power system and method of mounting a fuel cell cartridge on a fuel cell
US7709131B2 (en) Fuel cell endplate comprising current collector plate and fuel cell incorporating same
WO2021238131A1 (zh) 一种用于麦克风芯片的测试插座
TW202119044A (zh) 環境控制設備及晶片測試系統
TWI248695B (en) Battery
CN111384416A (zh) 一种燃料电池双极板密封结构和密封方法
CN211556045U (zh) 一种燃料电池双极板密封结构
US8339143B2 (en) Lens connector-testing device
CN216310082U (zh) 一种用于待测元器件的测试治具
CN217546298U (zh) 一种微型扬声器测试工装
CN111007325B (zh) 一种测试腔体、天线测试装置及天线测试系统
US8427174B2 (en) Measurement process for determination of the optimum contact pressure among components of a solid oxide fuel cell stack in the packaging process and its measurement apparatus
CN211784120U (zh) 一种燃料电池装堆的快速测漏装置
CN212410014U (zh) 测试夹具
CN113782782A (zh) 电池管理装置
CN209497546U (zh) 一种摄像模组的测试治具
CN221148756U (zh) 一种晶圆夹具的热沉装置
CN209821356U (zh) 一种用于直接甲醇燃料电池试验的装置
CN219798636U (zh) 一种简易膜电极气密性检测夹具
CN111929543A (zh) 电池绝缘层尖端放电检测腔体结构
CN213400951U (zh) 一种具有高密封性的薄膜开关
CN219042085U (zh) 一种可远程用于多车型的便携式碳罐脱附流量测量装置
CN218352735U (zh) 一种微型扬声器一体测试工装
TWI778373B (zh) 電池管理裝置
CN221765196U (zh) 一种电池测试装置及电池测试系统

Legal Events

Date Code Title Description
121 Ep: the epo has been informed by wipo that ep was designated in this application

Ref document number: 20938326

Country of ref document: EP

Kind code of ref document: A1

NENP Non-entry into the national phase

Ref country code: DE

122 Ep: pct application non-entry in european phase

Ref document number: 20938326

Country of ref document: EP

Kind code of ref document: A1