WO2021196088A1

WO2021196088A1 - Analog-to-digital conversion method, apparatus, and chip, electronic device, and storage medium

Info

Publication number: WO2021196088A1
Application number: PCT/CN2020/082816
Authority: WO
Inventors: 程顺均
Original assignee: 深圳市汇顶科技股份有限公司
Priority date: 2020-04-01
Filing date: 2020-04-01
Publication date: 2021-10-07
Also published as: CN111819796A; CN111819796B

Abstract

Some embodiments of the present application provide an analog-to-digital conversion method and apparatus, relating to an analog-to-digital conversion technology. The analog-to-digital conversion methods comprise: obtaining a measured value of a voltage to be measured subjected to analog-to-digital conversion under a preset reference voltage (101); obtaining a measured value and a standard value of a standard voltage subjected to analog-to-digital conversion under the preset reference voltage (102); determining a reference voltage fluctuation coefficient according to the measured value and the standard value of the standard voltage subjected to analog-to-digital conversion under the preset reference voltage (103); and compensating, according to the reference voltage fluctuation coefficient, for the measured value of the voltage to be measured and outputting the compensated measured value as an analog-to-digital conversion result of the voltage to be measured (104). According to the embodiments of the present application, the compensation for the measured value of the voltage to be measured that has been subjected to analog-to-digital conversion can prevent the deviation of the analog-to-digital conversion result caused by reference voltage fluctuation, thereby improving the accuracy of analog-to-digital conversion.

Description

Analog-to-digital conversion method, device, chip, electronic equipment and storage medium

Technical field

This application relates to the field of electronic technology, and in particular to an analog-to-digital conversion method, device, chip, electronic equipment, and storage medium.

Background technique

Analog-to-digital conversion technology (ADC) plays the role of converting analog signals into digital signals in signal processing, and the accuracy of ADC directly affects the performance of the signal processing system. The essence of ADC conversion is the process of comparing the sampled signal with the reference voltage, so the reference voltage has a great influence on the accuracy and error of the ADC. The relationship between the result of the ADC conversion and the reference voltage is as follows:

Among them, D is the conversion result, n is an integer greater than 0, ADC resolution is expressed in binary digits, n is the digits of ADC resolution, and the analog signal value corresponding to the full scale is divided into 2 ⁿ grids to characterize the ADC The accuracy of V _in is the input signal and V _ref is the reference voltage. In order to avoid the ADC saturation caused by the excessive difference between the value of the reference voltage and the maximum value of the input signal, the reference voltage needs to be dynamically adjusted according to the application scenario. In order to flexibly adjust the specific value of the reference voltage, the reference voltage is provided by an external input circuit, thereby avoiding the ADC saturation problem.

However, the inventor found that the related technology has at least the following problem: when the reference voltage is provided through an external input circuit, the reference voltage is easily affected by circuit noise and fluctuates, which in turn causes deviations in the ADC conversion result and affects the performance of the signal processing system.

Summary of the invention

The purpose of some embodiments of this application is to provide an analog-to-digital conversion method, device, chip, electronic device, and storage medium, to avoid the deviation of the analog-to-digital conversion caused by the fluctuation of the reference voltage, and to ensure the accuracy of the digital-to-analog conversion result.

An embodiment of the present application provides an analog-to-digital conversion method, including: obtaining a measured value of a voltage to be measured after analog-to-digital conversion under a preset reference voltage; obtaining a standard voltage after performing analog-to-digital conversion under the same preset reference voltage Determine the reference voltage fluctuation coefficient according to the measured value and standard value of the standard voltage after the analog-to-digital conversion under the preset reference voltage; determine the reference voltage fluctuation coefficient according to the reference voltage fluctuation coefficient; The measured value of the measured voltage is compensated, and the compensated measured value is output as the analog-to-digital conversion result of the measured voltage.

The embodiment of the present application also provides an analog-to-digital conversion device, including: an analog-to-digital conversion unit and a calculation unit; the analog-to-digital conversion unit is used to perform analog-to-digital conversion on the standard voltage and the voltage to be measured to obtain the standard voltage And the measured value of the voltage to be measured after analog-to-digital conversion under the same preset reference voltage; the calculation unit is configured to perform analog-to-digital conversion according to the measured value of the standard voltage under the preset reference voltage Determine the reference voltage fluctuation coefficient with the standard value, and compensate the measured value of the voltage to be measured according to the reference voltage fluctuation coefficient, and output the compensated measured value as an analog-to-digital conversion result of the voltage to be measured.

The embodiment of the present application also provides an analog-to-digital conversion chip, the analog-to-digital conversion chip is connected to at least one memory, and the memory stores instructions that can be executed by the analog-to-digital conversion chip. The digital conversion chip is executed, so that the analog-to-digital conversion chip can perform the above-mentioned analog-to-digital conversion method.

An embodiment of the present application also provides an electronic device, including a memory, and the above-mentioned analog-to-digital conversion chip, and the memory is in communication connection with the analog-to-digital conversion chip.

The embodiment of the present application also provides a computer-readable storage medium that stores a computer program, and when the computer program is executed by a processor, the above-mentioned analog-to-digital conversion method is implemented.

Compared with the prior art, the embodiment of the present application determines the analog-to-digital conversion process according to the measured value and standard value of the standard voltage after the analog-to-digital conversion under the preset reference voltage when performing the analog-to-digital conversion of the voltage to be measured According to the reference voltage fluctuation coefficient in the reference voltage, the measured value after the analog-to-digital conversion of the voltage to be measured under the same preset reference voltage is compensated according to the reference voltage fluctuation coefficient, and the compensated measurement value is output as the analog-to-digital conversion result of the voltage to be measured . The standard voltage is an internal constant voltage, which is generally about half of the lowest working voltage of the analog-to-digital converter. It is not affected by the change of the reference voltage value. Therefore, the measured value and the analog-digital value of the standard voltage under the preset reference voltage are obtained. Standard value, determine the fluctuation of the conversion result during the analog-to-digital conversion process, and use the fluctuation of the standard voltage analog-to-digital conversion process as a reference for the fluctuation of the voltage to be measured during the analog-to-digital conversion process, and then the measurement after the analog-to-digital conversion of the voltage to be measured The value is compensated, which solves the problem that the analog-to-digital conversion result in the prior art will deviate due to the fluctuation of the reference voltage, ensures the accuracy of the analog-to-digital conversion result, and avoids the performance of the signal processing system due to the deviation of the analog-to-digital conversion result. Influence.

For example, the determining the reference voltage fluctuation coefficient according to the measured value and the standard value of the standard voltage after the analog-to-digital conversion under the preset reference voltage includes: according to the standard voltage under the preset reference voltage The ratio of the standard value after the analog-to-digital conversion to the measured value determines the fluctuation coefficient of the reference voltage. In the embodiment of this application, the reference voltage fluctuation coefficient is determined by the ratio between the measured value of the standard voltage after the analog-to-digital conversion under the preset reference voltage and the standard value, and the ratio between the measured value and the standard value is used to accurately compare the analog-to-digital value. The fluctuations in the conversion process are measured.

For example, the compensating the measured value of the voltage to be measured according to the reference voltage fluctuation coefficient includes: compensating the measured value of the voltage to be measured according to the following formula;

Wherein, D _c is the measured value after compensation, DATA1 is the measured value of the standard voltage, D _ref is the standard value of the standard voltage, and DATA2 is the measured value of the voltage to be measured. In the embodiment of the application, after the fluctuation coefficient is determined according to the ratio of the measured value of the standard voltage after the analog-to-digital conversion to the standard value, the measured value of the voltage to be measured is multiplied by the determined fluctuation coefficient, so as to accurately base on the fluctuation of the standard voltage The situation is to compensate the measured value of the voltage to be measured to ensure the accuracy of the analog-to-digital conversion result of the voltage to be measured.

For example, before the determination of the reference voltage fluctuation coefficient based on the measured value and the standard value of the standard voltage after the analog-to-digital conversion under the preset reference voltage, the method further includes: obtaining the standard voltage for calibration The reference voltage and the calibration value of the standard voltage after analog-to-digital conversion under the calibration reference voltage; according to the preset reference voltage, the calibration reference voltage, and the calibration value, obtaining the standard voltage at the The standard value after analog-to-digital conversion under the preset reference voltage. In the embodiment of the application, the preset reference voltage when performing analog-to-digital conversion in combination with the standard voltage, the calibration reference voltage when the standard voltage is calibrated, and the calibration value of the calibration reference voltage are used to determine that the standard voltage is modulated under the preset reference voltage. The standard value after digital conversion, so as to accurately obtain the different standard values corresponding to the standard voltage under different reference voltages, thereby ensuring that the fluctuation of the standard voltage during the analog-to-digital conversion process under the preset reference voltage can be accurately measured .

For example, the obtaining the standard value of the standard voltage after analog-to-digital conversion under the preset reference voltage according to the preset reference voltage, the calibration reference voltage, and the calibration value includes: according to the following The formula determines the standard value D _{ref of} the standard voltage;

Wherein, V ₀ is the calibration reference voltage, D ₀ is the calibration value of the standard voltage, and V _ref is the preset reference voltage. In the embodiments of this application, based on the principle that the ratio of the calibration reference voltage to the preset reference voltage is consistent with the ratio of the standard value of the current standard voltage to the measured value under the calibration reference voltage, according to the calibration value of the standard voltage under the calibration reference voltage, Accurately determine the standard value of the standard voltage under the preset reference voltage.

For example, the measured value of the standard voltage after analog-to-digital conversion is obtained by sampling the standard voltage through a first analog-to-digital converter; The digital converter is obtained by sampling the voltage to be measured; wherein, the first analog-to-digital converter and the second analog-to-digital converter have the same configuration data and clock. When obtaining the measured values of the standard voltage and the voltage to be measured in the embodiments of the present application, the measured values are obtained through two analog-to-digital converters with the same configuration data and clock. Since the sampling of the standard voltage and the voltage to be measured is synchronized, The consistency between the obtained measured values is guaranteed, and the sampling efficiency for obtaining the standard voltage and the measured value of the voltage to be measured is guaranteed.

For example, the measured value of the voltage to be measured after the analog-to-digital conversion and the measured value of the standard voltage after the analog-to-digital conversion are used to sequentially compare the voltage to be measured and the standard voltage in a preset order through the same analog-to-digital converter. The voltage is obtained by sampling. When obtaining the measured values of the standard voltage and the voltage to be measured in the embodiment of the present application, according to the preset analog-to-digital conversion sequence, the same analog-to-digital converter is used to perform the analog-to-digital conversion of the voltage to be measured and the standard voltage, which avoids the need to perform the analog-to-digital conversion of the standard voltage and the standard voltage. When the voltage to be measured performs analog-to-digital conversion, a new analog-to-digital converter needs to be added, which reduces the power consumption during the analog-to-digital conversion process and the measured value compensation process.

Description of the drawings

One or more embodiments are exemplified by the pictures in the corresponding drawings. These exemplified descriptions do not constitute a limitation on the embodiments. The elements with the same reference numerals in the drawings are denoted as similar elements. Unless otherwise stated, the figures in the attached drawings do not constitute a scale limitation.

Fig. 1 is a flowchart of an analog-to-digital conversion method according to the first embodiment of the present application;

FIG. 2 is a schematic diagram of device implementation of the analog-to-digital conversion method according to the second embodiment of the present application;

Fig. 3 is a schematic diagram of a working sequence according to the second embodiment of the present application;

Fig. 4 is a schematic diagram of another working sequence according to the second embodiment of the present application;

FIG. 5 is a schematic diagram of device implementation of the analog-to-digital conversion method according to the third embodiment of the present application;

Fig. 6 is a schematic diagram of a working sequence according to a third embodiment of the present application;

FIG. 7 is a schematic structural diagram of an analog-to-digital conversion device according to a fourth embodiment of the present application;

FIG. 8 is a first structural diagram of the analog-to-digital conversion unit 701 in the fourth embodiment of the present application;

FIG. 9 is a second structural diagram of the analog-to-digital conversion unit 701 according to the fourth embodiment of the present application;

FIG. 10 is a third structural diagram of the analog-to-digital conversion unit 701 according to the fourth embodiment of the present application;

FIG. 11 is a fourth structural diagram of the analog-to-digital conversion unit 701 according to the fourth embodiment of the present application;

Fig. 12 is a schematic structural diagram of an electronic device according to a sixth embodiment of the present application.

Detailed ways

In order to make the objectives, technical solutions, and advantages of the present application clearer, some embodiments of the present application will be further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present application, and are not used to limit the present application.

The first embodiment of the present application relates to an analog-to-digital conversion method. In this embodiment, the measured value of the voltage to be measured after analog-to-digital conversion under a preset reference voltage is obtained; the standard voltage is obtained under the same preset reference voltage. The measured value and standard value after analog-to-digital conversion; the measured value and standard value of the standard voltage after the analog-digital conversion under the preset reference voltage are used to determine the reference voltage fluctuation coefficient; the measured value of the voltage to be measured is carried out according to the reference voltage fluctuation coefficient Compensate, and output the compensated measured value as the analog-to-digital conversion result of the voltage to be measured. In the embodiment of the present application, the reference voltage fluctuation coefficient during the analog-to-digital conversion process is accurately determined by the measured value of the standard voltage after the analog-to-digital conversion under the preset reference voltage and the standard value, and the output is performed according to the reference voltage fluctuation coefficient. The compensated measured value of the voltage to be measured, thereby avoiding the deviation of the analog-to-digital conversion caused by the fluctuation of the reference voltage during the analog-to-digital conversion process, ensuring the accuracy of the analog-to-digital conversion result, and thereby ensuring the performance of the signal processing system.

The implementation details of this embodiment will be described in detail below. The following content is only provided for ease of understanding and is not necessary for this embodiment.

The specific process of an analog-to-digital conversion method in this embodiment is shown in FIG. 1, and specifically includes the following steps:

Step 101: Obtain a measured value of the voltage to be measured after analog-to-digital conversion under a preset reference voltage.

Specifically, when performing analog-to-digital conversion of the voltage to be measured, after the analog-to-digital converter obtains the configuration data from the configuration register, it adjusts the input reference voltage, sampling time and working clock according to the configuration data, and then performs voltage sampling on the voltage to be measured , That is, by comparing the sampled voltage value V _in with the reference voltage V _ref of the analog-to-digital converter, the measured value of the voltage to be measured after the analog-to-digital conversion is obtained.

Step 102: Obtain the measured value and the standard value of the standard voltage after analog-to-digital conversion under the same preset reference voltage.

Specifically, when performing analog-to-digital conversion on the standard voltage, the analog-to-digital converter obtains the same configuration data as the voltage to be measured for analog-to-digital conversion, and uses the same reference voltage and sampling as the voltage to be tested for analog-to-digital conversion. Time and working clock sample the standard voltage, _{compare the sampled voltage V in} _{with the reference voltage V ref of the} analog-to-digital converter to obtain the measured value of the standard voltage after analog-to-digital conversion under the preset reference voltage, and store it in the register Obtain the standard value of the pre-stored standard voltage after analog-to-digital conversion under the preset reference voltage.

It is worth mentioning that when obtaining the measured value of the voltage to be measured after the analog-to-digital conversion and the measured value of the standard voltage after the analog-to-digital conversion, different analog-to-digital converters with the same configuration data can be used. The voltage undergoes synchronous and parallel analog-to-digital conversion, and the measured values of the voltage to be measured and the standard voltage after analog-to-digital conversion are obtained respectively; the same analog-to-digital converter can also be used to orderly use the voltage to be measured and the standard voltage as the analog-to-digital The input of the converter, and then obtain the measured value of the voltage to be measured and the standard voltage after the analog-to-digital conversion in an orderly manner. In this embodiment, the method for obtaining the measured value of the voltage to be measured and the standard voltage after the analog-to-digital conversion is insufficiently limited.

Step 103: Determine the reference voltage fluctuation coefficient according to the measured value of the standard voltage after the analog-to-digital conversion under the preset reference voltage and the standard value.

Specifically, after obtaining the measured value and standard value of the standard voltage after the analog-to-digital conversion under the preset reference voltage, according to the ratio of the standard value of the standard voltage to the measured value of the standard voltage, it is determined that the analog-to-digital conversion process is in progress. The reference voltage fluctuation coefficient.

In one example, when the standard value of the standard voltage is determined, the calibration reference voltage of the standard voltage for calibration and the calibration value of the standard voltage after the analog-to-digital conversion under the calibration reference voltage are obtained; according to the preset reference voltage, the calibration reference voltage and Calibration value to obtain the standard value of the standard voltage after analog-to-digital conversion under the preset reference voltage. When determining the standard value of the standard voltage under the preset reference voltage, the standard value D _{ref of the} standard voltage can be determined according to the following formula:

Among them, V ₀ is the calibrated reference voltage, D ₀ is the calibrated value of the standard voltage, and V _ref is the current reference voltage.

For example, if the selected analog-to-digital converter is a 12-bit analog-to-digital converter, the full-scale output is 4095. By reading the pre-stored standard voltage calibration data, it can be obtained under the calibration reference voltage V ₀ with an amplitude of 3.3V. _{, The calibrated value D 0} after analog-to-digital conversion _{is 1489, and the current preset reference voltage V ref} when performing analog-to-digital conversion on the standard voltage is 2.5V. According to the above formula, it can be obtained that the standard reference voltage is 2.5V. The standard value of the voltage should be 3.3/2.5×1489=1965.

After obtaining the measured value and standard value of the standard voltage after the analog-to-digital conversion, since the voltage to be measured and the standard voltage are the same as the reference voltage used in the analog-to-digital conversion, the standard voltage is affected by voltage fluctuations and the The measured voltage is uniformly affected by the voltage fluctuation, and the standard voltage analog-to-digital conversion result is not affected by the change of the reference voltage value, but is only affected by the voltage fluctuation during the analog-to-digital conversion process. Therefore, directly based on the ratio of the standard value of the standard voltage to the measured value of the standard voltage, that is, the standard value/measured value, the fluctuation coefficient of the reference voltage in the analog-to-digital conversion process is determined.

For example, the measured value of the obtained standard voltage after analog-to-digital conversion is 2000, the standard value is 1965, and the ratio of the standard value to the measured value is used as the reference voltage fluctuation coefficient, that is, the reference voltage fluctuation coefficient is 1965/2000=0.825.

In another example, when determining the standard value of the standard voltage, the standard value of the standard voltage after the analog-to-digital conversion under the current preset reference voltage can be calculated in real time according to the selected analog-to-digital converter and the calibration reference voltage. , And then determine the reference voltage fluctuation coefficient in the analog-to-digital conversion process according to the ratio of the standard value of the standard voltage to the measured value of the standard voltage.

Step 104: Output the measured value of the voltage to be measured after being compensated according to the reference voltage fluctuation coefficient.

Specifically, after the measured value of the voltage to be measured and the reference voltage fluctuation coefficient in the analog-to-digital conversion process are obtained, the measured value of the voltage to be measured is compensated according to the reference voltage fluctuation coefficient, and the compensated measured value is used as the measured value The output of the analog-to-digital conversion result of the voltage.

In this embodiment, after the reference voltage fluctuation coefficient and the measured value of the voltage to be measured after the analog-to-digital conversion are obtained, the measured value of the voltage to be measured after the analog-to-digital conversion can be compensated by the following formula:

Among them, D _c is the measured value after compensation, DATA1 is the measured value of the standard voltage, DATA2 is the measured value of the voltage to be measured, and D _ref is the standard value of the standard voltage. Since the standard voltage is a non-zero voltage, the measured value of the standard voltage after analog-to-digital conversion will not be zero.

For example, if the measured value of the obtained standard voltage is 2000, the standard value of the standard voltage is 1965, and the measured value of the voltage to be measured is 1200, then according to the above formula, the measured value of the voltage to be measured is multiplied by the reference voltage fluctuation coefficient 0.9825, The measured value of the voltage to be measured after compensation is 1200×0.9825=1179, and then 1179 is output as the result of the analog-to-digital conversion of the voltage to be measured.

Compared with the prior art, in the present embodiment, when performing analog-to-digital conversion of the voltage to be measured, the reference voltage fluctuation coefficient in the analog-to-digital conversion process is determined according to the measured value of the standard voltage after the analog-to-digital conversion and the standard value. Compensate the measured value of the voltage to be measured after analog-to-digital conversion under the same reference voltage, and output the compensated measured value as the analog-to-digital conversion result of the voltage to be measured. Using the characteristic that the standard voltage is not affected by the reference voltage value, the deviation of the voltage to be measured is compensated through the deviation in the analog-to-digital conversion process of the standard voltage, and the error of the measured value of the voltage to be measured is eliminated. Determine the standard value of the standard voltage under the current reference voltage according to the reference voltage at the time of sampling, the preset calibration reference voltage, and the calibration value of the standard voltage under the preset calibration reference voltage, and then according to the ratio of the standard value of the standard voltage to the measured value , To ensure that the determined reference voltage fluctuation coefficient in the analog-to-digital conversion process is consistent with the actual situation; the product of the measured value after the analog-to-digital conversion of the voltage to be measured and the reference voltage fluctuation coefficient is used as the result of the analog-to-digital conversion of the voltage to be measured The output solves the analog-to-digital conversion deviation caused by the fluctuation of the reference voltage, ensures the accuracy of the analog-to-digital conversion result of the voltage to be measured, and avoids the influence of the deviation of the analog-to-digital conversion result on the performance of the signal processing system.

The second embodiment of the present application relates to an analog-to-digital conversion method. In this embodiment, when obtaining the measured values of the standard voltage and the voltage to be measured, two analog-to-digital converters are used to perform parallel analog to the standard voltage and the voltage to be measured. Digital conversion, so as to ensure the efficiency of the analog-to-digital conversion of the voltage to be measured; when there is no need to compensate for the analog-to-digital conversion result, the two analog-to-digital converters can also work independently to improve resource utilization.

In this embodiment, the measured value of the standard voltage after the analog-to-digital conversion is obtained by sampling the standard voltage by the first analog-to-digital converter; the measured value of the voltage to be measured after the analog-to-digital conversion is obtained through the second analog-to-digital converter The voltage to be measured is sampled and obtained; wherein, the first analog-to-digital converter and the second analog-to-digital converter have the same configuration data and clock. The specific implementation method of analog-to-digital conversion in this embodiment can be implemented by the device shown in FIG. 2, and the specific description is as follows:

First, obtain the measured values of the standard voltage and the voltage to be measured after analog-to-digital conversion.

Specifically, the first analog-to-digital converter 207 is used for sampling and analog-to-digital conversion of the standard voltage, and the second analog-to-digital converter 208 is used for sampling and analog-to-digital conversion of the voltage to be measured.

In order to ensure the accuracy of analog-to-digital conversion compensation, it is necessary to ensure the consistency of the analog-to-digital conversion process for the standard voltage and the voltage to be measured. Therefore, when performing analog-to-digital conversion, the configuration data, reference voltage, and sampling time of the two analog-to-digital converters It needs to be consistent with the working clock. In order to achieve consistency during analog-to-digital conversion, the following two methods can be used in this embodiment:

One method in this embodiment is: the first analog-to-digital converter 207 is optionally connected to the first configuration register 201 and the second configuration register 202 through the first selector 203, and the second analog-to-digital converter 208 is directly connected to the first configuration register 201 and the second configuration register 202. The second configuration register 202 is connected. During operation, both analog-to-digital converters obtain configuration data from the second configuration register 202, and are controlled by the second configuration register 202 to adjust their configuration parameters to obtain the same reference voltage, Sampling time and working clock. Of course, in this manner, the first configuration register 201 may not be included, or the first selector 203 may not be included, and the two analog-to-

digital converters

207 and 208 are directly connected to the same configuration register 202.

Another method in this embodiment is: before the analog-to-digital converter obtains the configuration data, the configuration data in the configuration register is edited in advance, so that the configuration data stored in the first configuration register 201 and the second configuration register 202 are Consistent. The first analog-to-digital converter 207 is connected to the first configuration register 201 through the first selector, the second analog-to-digital converter 208 is connected to the second configuration register 202, and the two analog-to-digital converters obtain configurations from the connected configuration registers. Data, modify its own configuration data, determine the sampling time, working clock and reference voltage.

After the two analog-to-digital converters complete the configuration update according to the configuration data, and start the two analog-to-digital converters through the configuration register, the analog-to-digital converter performs the correction of the standard voltage and the voltage to be measured according to the determined reference voltage, sampling time and working clock. Perform sampling and quantization. Specifically, the first input selector 204 inputs the standard voltage to the first analog-to-digital converter 207. In order to facilitate the analog-to-digital conversion of multiple signals, the second analog-to-digital converter 208 may have multiple input interfaces to communicate with each other. Different input signals, and the second selection switch 205 switches the input interface connected with the second analog-to-digital converter 208 according to the detection requirements. When the voltage to be measured is converted from analog to digital, according to the input interface corresponding to the voltage to be measured, the second The input selector 205 switches the input interface connected with the second analog-to-digital converter 208 to the input interface corresponding to the voltage to be measured, so as to input the analog voltage to be measured in the external input into the second analog-to-digital converter 208. The

converters

207 and 208 synchronously sample the standard voltage and the voltage to be measured, and quantify the measured value corresponding to the sampled voltage according to the ratio of the sampled voltage to the reference voltage, and determine the measured value of the standard voltage after the analog-to-digital conversion DATA1 and the measured value DATA2 of the voltage to be measured after analog-to-digital conversion, and the measured value DATA1 of the standard voltage is transmitted to the hardware accelerator 209 and the first data register 211, and the measured value DATA2 of the voltage to be measured is transmitted to the hardware accelerator 209 and the first data register 211. The second selector 210 determines whether to store the measured value DATA2 of the voltage to be measured in the second data register 212 by the second selector 210.

After obtaining the measured value of the voltage to be measured and the standard voltage after analog-to-digital conversion, the measured value of the voltage to be measured is compensated according to the measured value of the standard voltage and the standard value, and the compensated measured value is output.

In this embodiment, the compensation of the measured value of the voltage to be measured can be realized by the following two methods:

A compensation method in this embodiment is: if the hardware accelerator 209 is in a normal working state, the hardware accelerator 209 obtains the standard value D _ref of the standard voltage under the current reference voltage from the standard voltage calibration register 206, and combines the received standard voltage The measured value DATA1 after the analog-to-digital conversion and the measured value DATA2 after the analog-to-digital conversion of the voltage to be measured use the compensation calculation formula pre-stored in the hardware accelerator 209:

D _C voltage measurement value measured after the compensation is calculated, i.e. DATA3, DATA3 measured value transmission measurement value and the second compensation to the selector 210, the selector 210 selects the second compensation voltage to be measured DATA3 It is transmitted to the second data register 212, and then the data DATA3 in the second data register is directly read, and DATA3 is output as the result of the analog-to-digital conversion of the voltage to be measured. When the method realizes the analog-to-digital conversion of the voltage to be measured, the device works The timing diagram is shown in FIG. 3. When the hardware accelerator 209 compensates for the voltage measurement value to be measured for the first time, the first analog-to-digital converter 207 and the second analog-to-digital converter 208 can perform the second standby synchronously. Sampling and quantification of measured voltage and standard voltage.

Another compensation method in this embodiment is: the hardware accelerator 209 is in the disabled state. At this time, the second selector 210 transmits the measured value DATA2 of the voltage to be measured after the analog-to-digital conversion to the second data register 212, and the software _{The program obtains the standard value D ref} of the standard voltage under the current reference voltage from the standard voltage calibration register 206 according to the reference voltage of the analog-to-digital converter, and obtains the measured value DATA1 of the standard voltage from the first data register 211, from the second data The register 212 obtains the measured value DATA2 of the voltage to be measured, and according to the pre-stored compensation calculation formula:

After calculating the compensation measurement D _C voltage to be measured, and the measured value compensated as a result of the test voltage output of the analog to digital conversion, when the voltage to be measured to achieve analog to digital conversion, an operation timing chart of the method by means of FIG. As shown in 4, the software directly completes the compensation and output of the measured value of the voltage to be measured. When compensating the measured value of the voltage to be measured for the first time, the second sampling and quantization of the voltage to be measured and the standard voltage are performed simultaneously .

It is worth mentioning that after detecting that the function of compensating the measured value of the voltage to be measured is disabled, the first selector 203 in the device can choose to connect the first analog-to-digital converter 207 with the first configuration register 201, and the second The analog-to-digital converter 208 is only connected to the second configuration register 202. The difference from when the compensation function is enabled is that in the disabled state, the first configuration register and the second configuration register store different configuration data in the two configuration registers. The two analog-to-digital converters work independently, do not affect each other, improve resource utilization, and automatically shut off the power supply to the hardware accelerator 209 to reduce energy consumption.

Compared with the prior art, the embodiment of the application has all the beneficial effects of the first embodiment, and at the same time, the analog-to-digital conversion of the standard voltage and the voltage to be measured is performed through two synchronously parallel analog-to-digital converters, which ensures the sampling and Conversion efficiency; change the compensation calculation method according to the demand, and perform the compensation calculation through the hardware accelerator, which can improve the calculation efficiency as much as possible and reduce the burden on the CPU (processor); when the compensation calculation is performed by software, the hardware accelerator can be used Shutdown, thereby reducing the overall power consumption in the analog-to-digital conversion process.

The third embodiment of the present application relates to an analog-to-digital conversion method. In this embodiment, the standard voltage and the voltage to be measured are sequentially converted from analog to digital through the same analog-to-digital converter. The compensation of the measured value is realized through software calculation, avoiding the need to increase the hardware accelerator, reducing the area of the chip, and realizing detection through an analog-to-digital converter, reducing power consumption as much as possible.

In this embodiment, when obtaining the measured values of the standard voltage and the voltage to be measured, the measured value of the voltage to be measured after the analog-to-digital conversion and the measured value of the standard voltage after the analog-to-digital conversion are passed through the same analog-to-digital converter in a preset order Sampling and obtaining the voltage to be measured and the standard voltage in turn. The specific implementation method of analog-to-digital conversion in this embodiment can be implemented by the device shown in FIG. 5, which is specifically described as follows:

First, obtain the measured value of the standard voltage and the voltage to be measured after the analog-to-digital conversion under the same preset reference voltage.

Specifically, first charge the sampling capacitor. The first sampling capacitor 506 is connected to the standard voltage input through the double-pole double-throw switch 504, and the second sampling capacitor 505 is connected to the output terminal of the input selector 501 through the double-pole double-throw switch 504. The voltage to be measured is used as the output signal. When the double-pole double-throw switch 504 is closed, the standard voltage and the voltage to be measured simultaneously charge the first sampling capacitor 506 and the second sampling capacitor 505, respectively, and the double-pole double-throw switch 504 is opened When, charging stops at the same time.

After the sampling capacitor is charged, the single-pole double-throw switch 507 is used to start the analog-to-digital converter 508 through the configuration register 502 according to the preset analog-to-digital conversion sequence. The converter 508 is connected, and the analog-to-digital converter 508 determines the sampling time and working clock according to the configuration data obtained from the configuration register 502, performs voltage sampling on the voltage held on the sampling capacitor, and performs voltage sampling according to the ratio of the input reference voltage to the sampling voltage Quantify the voltage on the sampling capacitor, determine the measured value of the voltage corresponding to the sampling capacitor after analog-to-digital conversion, and then transmit the obtained measurement value to the first data register 503 or the second data register 510 through the output selector 509 Store it.

For example, the single-pole double-throw switch 507 connects the first sampling capacitor 506 with the analog-to-digital converter 508 first, that is, performs analog-to-digital conversion on the standard voltage, and the analog-to-digital converter 508 samples the voltage held on the first sampling capacitor 506 and For quantization, at this time, the output selector 509 connects the analog-to-digital converter 508 with the first data register 503, and the analog-to-digital converter 508 transmits the measured value of the standard voltage to the first data register 503. Then, the single-pole double-throw switch 507 connects the second sampling capacitor 505 with the analog-to-digital converter 508, that is, performs analog-to-digital conversion on the voltage to be measured. According to the same method, the voltage on the second sampling capacitor 505 is sampled and quantized. The output selection switch 509 connects the analog-to-digital converter 508 with the second data register 510, and transmits the measured value of the voltage to be measured to the second data register 510. In practical applications, the connection sequence of the sampling capacitor and the analog-to-digital converter can be adjusted, and this embodiment does not limit the sequence of the analog-to-digital conversion.

After obtaining the measured value of the voltage to be measured and the standard voltage after the analog-to-digital conversion, the measured value of the voltage to be measured is compensated, and the measured value of the voltage to be measured after compensation is output.

Specifically, after the measured values of the standard voltage and the voltage to be measured after the analog-to-digital conversion are transmitted to the first data register 503 and the second data register 510, respectively, the fluctuation coefficient of the reference voltage in the analog-to-digital conversion process is obtained first. Before obtaining the reference voltage fluctuation coefficient, obtain the standard value of the standard voltage after analog-to-digital conversion under the current reference voltage through the control program in the software. In this embodiment, it can be directly based on the current reference voltage and the pre-stored reference voltage and standard voltage. Correspondence relationship, search in the calibration value of the pre-stored standard voltage to determine the standard value of the standard voltage under the current reference voltage, or according to the current reference voltage, the calibration reference voltage when the standard voltage is calibrated, and the standard voltage under the calibration reference voltage The calibration value obtained after analog-to-digital conversion, according to the pre-stored formula:

Calculate the standard value of the standard voltage under the current reference voltage, where V ₀ is the calibrated reference voltage, D ₀ is the calibrated value of the standard voltage, and V _ref is the current reference voltage. Then, according to the ratio of the measured value of the standard voltage to the standard value, the reference voltage fluctuation coefficient is determined, and then the measured value of the voltage to be measured is compensated according to the reference voltage fluctuation coefficient. _{For example, read the standard value D ref} of the standard voltage under the current reference voltage, the measured value DATA1 of the standard voltage buffered in the first data register 503, and the measured value DATA2 of the voltage to be measured buffered in the second data register 510, and then according to Pre-stored compensation calculation formula:

After calculating the compensation measurement D _C voltage to be measured, and the measured value compensated as a result of the test voltage output of the analog to digital conversion.

When the analog-to-digital conversion of the voltage to be measured and the standard voltage is completed by this method, the working sequence diagram of the device is shown in Figure 6. After charging the two capacitors, quantization and processing are carried out in sequence, and the sampled voltage is converted into a digital signal according to The register stores the data format, adjusts the format of the digital signal to align with the format of the data register, then stores the data in the data register, and then processes and outputs the analog-to-digital conversion result of the compensated voltage to be measured through software.

Compared with the prior art, the embodiment of the application has all the beneficial effects of the first embodiment, and only one analog-to-digital converter is used to perform the measured value of the voltage to be measured and the standard voltage after the analog-to-digital conversion under the same reference voltage. The method of software calculation realizes the compensation of the measured voltage value to be measured, which avoids the addition of hardware accelerators and new analog-to-digital converters, and reduces the area of the chip and the power consumption during the analog-to-digital conversion process.

The fourth embodiment of the present application relates to an analog-to-digital conversion device. The schematic structural diagram of the analog-to-digital conversion device is shown in FIG. 7 and includes: an analog-to-digital conversion unit and a calculation unit;

The analog-to-digital conversion unit 701 is configured to perform analog-to-digital conversion on the standard voltage and the voltage to be measured to obtain the measured value of the standard voltage and the voltage to be measured after the analog-to-digital conversion under the same preset reference voltage;

The calculation unit 702 is configured to determine the reference voltage fluctuation coefficient according to the measured value of the standard voltage after the analog-to-digital conversion under the preset reference voltage and the standard value, and compensate the measured value of the voltage to be measured according to the reference voltage fluctuation coefficient, and compensate The subsequent measured value is output as the analog-to-digital conversion result of the voltage to be measured.

Optionally, as shown in FIG. 8, the analog-to-digital conversion unit 701 may include: a first analog-to-digital converter 801, a second analog-to-digital converter 802, and a first analog-to-digital converter 801 and a second analog-to-digital converter 802 The connected first configuration register 803;

The first analog-to-digital converter 801 is connected to the first configuration register, and is used to perform analog-to-digital conversion on the standard voltage according to the configuration data stored in the first configuration register 803 to obtain the measured value of the standard voltage after the analog-to-digital conversion.

Specifically, the first analog-to-digital converter 801 sets its own reference voltage input, sampling time, and working clock according to the configuration data obtained from the first configuration register 803, and then samples the standard voltage, according to the difference between the sampled voltage and the reference voltage Ratio, determine the measured value of the standard voltage after analog-to-digital conversion.

The second analog-to-digital converter 802 is connected to the first configuration register 803, and is configured to perform analog-to-digital conversion of the voltage to be measured according to the configuration data stored in the first configuration register 803, and obtain the measured value of the voltage to be measured after the analog-to-digital conversion. The method for obtaining the measured value of the voltage to be measured after the analog-to-digital conversion is the same as the above-mentioned method for obtaining the measured value of the standard voltage after the analog-to-digital conversion, and will not be repeated here.

In another example, as shown in FIG. 9, the analog-to-digital conversion unit 701 may further include: a first analog-to-digital converter 901, a second analog-to-digital converter 902, a first configuration register 903, a register selection switch 904, and a second Configuration register 905;

The first input terminal of the register selection switch 904 is connected to the first configuration register 903, the second input terminal is connected to the second configuration register 905, and the output terminal is connected to the first analog-to-digital converter 901 for selecting and connecting to the first analog-to-digital converter. 901 connected configuration register.

Specifically, when the requirements for the analog-to-digital conversion result of the voltage to be measured are relatively high, it is necessary to compensate the analog-to-digital conversion result of the voltage to be measured. Connected, the first analog-to-digital converter 901 and the second analog-to-digital converter 902 are both controlled by the first configuration register 903, so as to ensure the synchronization of sampling; when the accuracy of the analog-to-digital conversion result of the voltage to be measured is low, you can Turn off the enable for compensating the analog-digital conversion result of the voltage to be measured, that is, no longer compensate the analog-digital conversion result of the voltage to be measured based on the measured value of the standard voltage after the analog-to-digital conversion and the reference voltage fluctuation coefficient determined by the standard value. The first analog-to-digital converter 901 and the second analog-to-digital converter 902 can work as independent analog-to-digital converters without affecting each other. At this time, the second configuration register 905 is converted to the first analog-to-digital converter through the register selection switch 904 The device 901 is connected, and the first analog-to-digital converter 901 is controlled by the second configuration register 905, and independently performs analog-to-digital conversion on the input voltage to be measured.

The second configuration register 905 is used to provide configuration data for the connected first analog-to-digital converter 901.

In another example, as shown in FIG. 10, the analog-to-digital conversion unit 701 may include: a first sampling capacitor 1001, a second sampling capacitor 1002, a capacitor selection switch 1003, and an analog-to-digital converter 1004;

The first sampling capacitor 1001 is connected to the capacitor selection switch 1003 for sampling the standard voltage.

Specifically, the first sampling capacitor 1001 stores the charges acquired in the process of charging according to the standard voltage on the electrode plate, and the analog-to-digital converter 1004 is connected to the first sampling capacitor 1001 to charge the first sampling capacitor 1001. The voltage is converted to determine the measured value of the standard voltage after analog-to-digital conversion.

The second sampling capacitor 1002 is connected to the capacitor selection switch 1003 for sampling the voltage to be measured. The method for sampling the voltage to be measured by the second sampling capacitor 1002 is the same as the method for sampling the standard voltage by the first capacitor 1001, which will not be repeated here.

The capacitor selection switch 1003 is connected to the first sampling capacitor 1001, the second sampling capacitor 1002, and the analog-to-digital converter 1004, and is used to select the sampling capacitor connected to the analog-to-digital converter 1004 to realize the sampling and analog of the standard voltage and the voltage to be measured. Number conversion.

The analog-to-digital converter 1004 is used to sequentially perform analog-to-digital conversion on the voltage on the connected sampling capacitor to obtain the standard voltage and the measured value of the voltage to be measured after the analog-to-digital conversion.

Specifically, the analog-to-digital converter 1004 obtains the voltage on the connected sampling capacitor, determines the measured value of the voltage on the sampling capacitor after analog-to-digital conversion, and obtains the measured value of the standard voltage and the voltage to be measured after the analog-to-digital conversion.

It is worth mentioning that in the process of sampling the standard voltage and the voltage to be measured, in order to ensure the synchronization and consistency of the charging time of the sampling capacitor, a double-pole double-throw switch can be added in front of the sampling capacitor. Switch to control the charging time of the two sampling capacitors at the same time.

In another example, as shown in FIG. 11, the digital conversion unit 701 may further include: a first sampling capacitor 1101, a second sampling capacitor 1102, a capacitor selection switch 1103, an analog-to-digital converter 1104, an output selection switch 1105, and a first sampling capacitor 1101. Data register 1106 and second data register 1107;

The input of the output selection switch 1105 is connected to the analog-to-digital converter 1104, and the output is connected to the first data register 1106 and the second data register 1107. The output selection switch 1105 is used to output the measured value of the standard voltage converted by the analog-to-digital converter 1104 To the first data register 1106, that is, when the sampling capacitor connected to the analog-to-digital converter 1104 is the first sampling capacitor 1101, the output selection switch 1105 connects the first data register 1106 with the analog-to-digital converter 1104 to convert the analog to digital The result is transmitted to the first data register 1106; the measured value of the voltage to be measured converted by the analog-to-digital converter 1104 is output to the second data register 1107, that is, the sampling capacitor connected to the analog-to-digital converter 1104 by the output selection switch 1105 is the first When the second sampling capacitor 1102 is used, the output selection switch 1105 is connected to the second data register 1107, and the analog-to-digital conversion result of the analog-to-digital converter 1104 is transmitted to the second data register 1107.

In an example, the calculation unit 702 may be a hardware accelerator or a register pre-stored with a simulation model of the hardware accelerator.

In practical applications, the specific structure of the calculation unit can be set according to actual conditions and needs, and this embodiment does not limit the specific setting of the structure of the calculation unit.

Compared with the prior art, the embodiment of the present application determines the reference voltage fluctuation coefficient during the analog-to-digital conversion process according to the measured value of the standard voltage after the analog-to-digital conversion and the standard value when performing the analog-to-digital conversion of the voltage to be measured. Compensate the measured value of the voltage to be measured after the analog-to-digital conversion under the same preset reference voltage, and output the compensated measured value as the result of the analog-to-digital conversion of the voltage to be measured. Utilizing the characteristic that the standard voltage is not affected by the reference voltage value, the deviation of the standard voltage analog-to-digital conversion process under the same reference voltage is used to compensate for the deviation of the voltage to be measured, and the error of the voltage measurement value to be measured is eliminated. When the standard voltage and the measured value of the voltage to be measured are obtained after the analog-to-digital conversion, two analog-to-digital converters are used to synchronously sample the voltage to be measured and the standard voltage to ensure the efficiency of the analog-to-digital conversion of the voltage to be measured. Sequential sampling of the voltage to be measured and the standard voltage through the same analog-to-digital converter can reduce the area of the chip and the overall power consumption; when the accuracy of the analog-to-digital conversion result is low, the two analog-to-digital converters work independently to ensure Efficient use of resources; when compensating the measured value of the voltage to be measured after the analog-to-digital conversion, the hardware accelerator is used to perform the measurement value compensation calculation, which can avoid the occupation of CPU (processor) resources and improve the efficiency of the compensation calculation , And through the software simulation model to calculate the measured value compensation based on the data in the two data registers, it can avoid adding new hardware, reducing the area of the chip and the overall power consumption.

The fifth embodiment of the present application relates to an analog-to-digital conversion chip. The analog-to-digital conversion chip is connected to at least one memory. The memory stores instructions that can be executed by the analog-to-digital conversion chip. The chip can execute the analog-to-digital conversion methods described in the first, second, and third embodiments of this application.

Compared with the prior art, in the present embodiment, when performing analog-to-digital conversion of the voltage to be measured, the reference voltage fluctuation coefficient in the analog-to-digital conversion process is determined according to the measured value of the standard voltage after the analog-to-digital conversion and the standard value. Compensate the measured value of the voltage to be measured after the analog-to-digital conversion, and output the compensated measured value as the result of the analog-to-digital conversion of the voltage to be measured. Using the characteristic that the standard voltage is not affected by the reference voltage value, the deviation of the voltage to be measured is compensated through the deviation in the analog-to-digital conversion process of the standard voltage, and the error of the measured value of the voltage to be measured is eliminated.

The sixth embodiment of the present application relates to an electronic device. As shown in FIG. 12, it includes a memory 1201 and the analog-to-digital conversion chip 1202 described in the fifth embodiment above, and the memory 1201 is in communication connection with the analog-to-digital conversion chip 1202.

The seventh embodiment of the present application relates to a computer-readable storage medium that stores a computer program. When the computer program is executed by a processor, it realizes the modules described in the first, second, and third embodiments of the present application. Conversion method.

That is, those skilled in the art can understand that all or part of the steps in the method of the foregoing embodiments can be implemented by instructing relevant hardware through a program. The program is stored in a storage medium and includes several instructions to enable a device ( It may be a single-chip microcomputer, a chip, etc.) or a processor (processor) that executes all or part of the steps of the methods described in the embodiments of the present application. The aforementioned storage media include: U disk, mobile hard disk, read-only memory (ROM, Read-Only Memory), random access memory (RAM, Random Access Memory), magnetic disks or optical disks and other media that can store program codes. .

A person of ordinary skill in the art can understand that the above-mentioned embodiments are specific embodiments for realizing the present application, and in practical applications, various changes can be made to them in form and details without departing from the spirit and spirit of the present application. Scope.

Claims

An analog-to-digital conversion method, characterized in that it comprises:

Obtain the measured value of the voltage to be measured after analog-to-digital conversion under the preset reference voltage;

Acquiring the measured value and the standard value of the standard voltage after analog-to-digital conversion under the same preset reference voltage;

Determine the reference voltage fluctuation coefficient according to the measured value and the standard value of the standard voltage after analog-to-digital conversion under the preset reference voltage;

Compensate the measured value of the voltage to be measured according to the reference voltage fluctuation coefficient, and output the compensated measured value as an analog-to-digital conversion result of the voltage to be measured.
The method according to claim 1, wherein the determining the reference voltage fluctuation coefficient according to the measured value and the standard value of the standard voltage after the analog-to-digital conversion at the preset reference voltage comprises:

The reference voltage fluctuation coefficient is determined according to the ratio of the standard value after the analog-to-digital conversion of the standard voltage under the preset reference voltage to the measured value.
The method of claim 2, wherein the compensating the measured value of the voltage to be measured according to the reference voltage fluctuation coefficient comprises: compensating the measured value of the voltage to be measured according to the following formula ；

Wherein, D c is the measured value after compensation, DATA1 is the measured value of the standard voltage, D ref is the standard value of the standard voltage, and DATA2 is the measured value of the voltage to be measured.
The method according to claim 1, characterized in that, before determining the reference voltage fluctuation coefficient based on the measured value and the standard value of the standard voltage after the analog-to-digital conversion under the preset reference voltage, the method further comprises :

Acquiring a calibration reference voltage when the standard voltage is calibrated and a calibration value of the standard voltage after analog-to-digital conversion under the calibration reference voltage;

According to the preset reference voltage, the calibration reference voltage, and the calibration value, a standard value of the standard voltage after the analog-to-digital conversion under the preset reference voltage is obtained.
The method according to claim 4, wherein, according to the preset reference voltage, the calibrated reference voltage, and the calibrated value, obtaining the modulus of the standard voltage under the current reference voltage The converted standard value includes: determining the standard value D ref of the standard voltage according to the following formula;

Wherein, V 0 is the calibration reference voltage, D 0 is the calibration value of the standard voltage, and V ref is the preset reference voltage.
The method according to any one of claims 1 to 5, wherein:

The measured value of the standard voltage after the analog-to-digital conversion is obtained by sampling the standard voltage by the first analog-to-digital converter;

The measured value of the voltage to be measured after the analog-to-digital conversion is obtained by sampling the voltage to be measured by a second analog-to-digital converter;

Wherein, the first analog-to-digital converter and the second analog-to-digital converter have the same configuration data and clock.
The method according to any one of claims 1 to 5, wherein:

The measured value of the voltage to be measured after the analog-to-digital conversion and the measured value of the standard voltage after the analog-to-digital conversion are performed on the voltage to be measured and the standard voltage in sequence through the same analog-to-digital converter in a preset order Obtained by sampling.
An analog-to-digital conversion device, characterized by comprising: an analog-to-digital conversion unit and a calculation unit;

The analog-to-digital conversion unit is configured to perform analog-to-digital conversion on the standard voltage and the voltage to be measured to obtain the measured value of the standard voltage and the voltage to be measured after the analog-to-digital conversion under the same preset reference voltage;

The calculation unit is configured to determine the reference voltage fluctuation coefficient according to the measured value of the standard voltage after the analog-to-digital conversion under the preset reference voltage and the standard value, and to determine the reference voltage fluctuation coefficient according to the reference voltage fluctuation coefficient. The measured value of the measured voltage is compensated, and the compensated measured value is output as the analog-to-digital conversion result of the measured voltage.
8. The device of claim 8, wherein the analog-to-digital conversion unit comprises: a first analog-to-digital converter, a second analog-to-digital converter, and the first analog-to-digital converter and the second analog-to-digital converter; The first configuration register connected to the analog-to-digital converter;

The first analog-to-digital converter is configured to perform analog-to-digital conversion on the standard voltage according to the configuration data stored in the first configuration register, and obtain the measured value of the standard voltage after the analog-to-digital conversion;

The second analog-to-digital converter is configured to perform analog-to-digital conversion on the voltage to be measured according to the configuration data stored in the first configuration register, and obtain the measured value of the voltage to be measured after the analog-to-digital conversion.
9. The device of claim 9, wherein the analog-to-digital conversion unit further comprises: a second configuration register and a register selection switch;

The first input terminal of the register selection switch is connected to the first configuration register, the second input terminal is connected to the second configuration register, and the output terminal is connected to the first analog-to-digital converter. The configuration register connected to the analog-to-digital converter.
8. The device of claim 8, wherein the analog-to-digital conversion unit comprises: a first sampling capacitor, a second sampling capacitor, a capacitor selection switch, and an analog-to-digital converter;

The first sampling capacitor is used to sample the standard voltage;

The second sampling capacitor is used to sample the voltage to be measured;

The first sampling capacitor and the second sampling capacitor are connected to the analog-to-digital converter through the capacitor selection switch, and the capacitor selection switch is used to select a sampling capacitor connected to the analog-to-digital converter;

The analog-to-digital converter is used to sequentially perform analog-to-digital conversion on the voltage on the connected sampling capacitor to obtain the standard voltage and the measured value of the voltage to be measured after the analog-to-digital conversion.
11. The device of claim 10, wherein the device further comprises: an output selection switch, a first data register, and a second data register;

Both the first data register and the second data register are connected to the analog-to-digital converter through the output selection switch;

The output selection switch is used to output the measured value of the standard voltage obtained by the conversion of the analog-to-digital converter to the first data register, and measure the voltage to be measured obtained by the conversion of the analog-to-digital converter The value is output to the second data register.
8. The device according to claim 8, wherein the computing unit is a hardware accelerator or a register pre-stored with a simulation model of the hardware accelerator.
An analog-to-digital conversion chip, characterized in that it is connected to at least one memory, and the memory stores instructions that can be executed by the analog-to-digital conversion chip, and the instructions are executed by the analog-to-digital conversion chip so that the The analog-to-digital conversion chip can execute the analog-to-digital conversion method according to any one of claims 1 to 7.
An electronic device, characterized by comprising: a memory, and the analog-to-digital conversion chip according to claim 14, wherein the memory is communicatively connected with the analog-to-digital conversion chip.
A computer-readable storage medium storing a computer program, wherein the computer program implements the analog-to-digital conversion method according to any one of claims 1 to 7 when the computer program is executed by a processor.