WO2021169518A1 - Dispositif de mesure de longueur d'onde, procédé d'obtention de paramètre de dispositif de mesure de longueur d'onde et procédé d'étalonnage en ligne - Google Patents

Dispositif de mesure de longueur d'onde, procédé d'obtention de paramètre de dispositif de mesure de longueur d'onde et procédé d'étalonnage en ligne Download PDF

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Publication number
WO2021169518A1
WO2021169518A1 PCT/CN2020/137353 CN2020137353W WO2021169518A1 WO 2021169518 A1 WO2021169518 A1 WO 2021169518A1 CN 2020137353 W CN2020137353 W CN 2020137353W WO 2021169518 A1 WO2021169518 A1 WO 2021169518A1
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WIPO (PCT)
Prior art keywords
light
sub
measured
wavelength
calibration
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PCT/CN2020/137353
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English (en)
Chinese (zh)
Inventor
秦华强
赵晗
贾伟
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华为技术有限公司
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Publication of WO2021169518A1 publication Critical patent/WO2021169518A1/fr

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
    • G01J9/02—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength by interferometric methods
    • G01J9/0246—Measuring optical wavelength
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
    • G01J9/02—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength by interferometric methods

Definitions

  • This application relates to the field of optical communication technology, and in particular to a wavelength meter, a method for obtaining parameters of the wavelength meter, and a method for online calibration.
  • the wavelength meter can be a wavelength meter based on an etalon (Etalon).
  • Etalon etalon
  • the light transmittance is at the wavelength corresponding to the reference transmittance curve.
  • the method of measuring wavelength by Etalon Because the method of measuring wavelength by Etalon, its measurement accuracy is related to the slope of the transmittance curve at the wavelength of the light to be measured (when the wavelength is at a position where the slope of the transmittance curve is large, the measurement accuracy of the wavelength is higher, and when the wavelength of the light to be measured is When it is at the peak or bottom of the transmittance curve, the transmittance slope is very low, and the measurement accuracy of this wavelength is poor), so the wavelength measurement scheme based on Etalon needs to use the position with the larger transmittance curve slope to meet the high measurement accuracy requirements.
  • Etalon's refractive index, Etalon's end surface reflectance, etc. are used to obtain multiple Free Spectral Range (FSR) transmittance curves with different differences.
  • FSR Free Spectral Range
  • the wavelength meter In the communication field, when the wavelength meter is used in the optical communication system, in order to ensure the measurement accuracy of the wavelength meter and the continuity of the service, the wavelength meter needs to be calibrated online.
  • the related technology only provides a solution for measuring the wavelength. No calibration program is provided, so a program for online calibration of the wavelength meter is needed.
  • This application provides a wavelength meter, a method for obtaining parameters of the wavelength meter, and an online calibration method for online calibration of the wavelength meter.
  • a wavelength meter which includes a first optical splitter, a first optical path converter, an etalon, and a plurality of first photodetectors.
  • the first beam splitter is used for splitting the input calibration light to obtain multiple beams of collimating sub lights, wherein the multiple beams of collimating sub lights include the first collimating sub lights and the second collimating sub lights.
  • the first optical path converter is used to change the propagation direction of the first sub-calibration light and/or the second sub-calibration light.
  • the first sub-calibration light directly enters the first photodetector and can be used as the reference light of the calibration light.
  • the etalon is used for the interference processing of the second sub-calibration light to obtain the third sub-calibration light, which is output to the first photodetector, and multiple first photodetectors are used to receive the first sub-calibration light or the third sub-calibration
  • the light is converted into multiple first electrical signals, and the multiple first electrical signals are used to calibrate the wavelength meter. In this way, since the calibration light enters the wavelength meter and shares the same etalon with the part to be measured, the wavelength meter can be calibrated without affecting the wavelength measurement part, so an online calibration can be provided Wavelength meter.
  • the wavelength meter may further include a plurality of second photodetectors
  • the first spectroscope is also used for splitting the input light to be measured to obtain multiple beams of light to be measured, wherein the multiple beams of light to be measured are
  • the photometry includes a first sub-light to be measured and multiple beams of second sub-lights to be measured.
  • the first optical path converter is also used to change the propagation direction of the first sub-light to be measured and/or the second sub-light to be measured.
  • the first sub-light to be measured directly enters the second photodetector and can be used as the reference light of the light to be measured.
  • the etalon is also used to perform interference processing on the multiple second sub-lights to be measured respectively, to obtain multiple third sub-lights to be measured, and respectively output to different second photodetectors.
  • the plurality of second photodetectors are used to convert the received first sub-light to be measured or the third sub-to-be-measured light into multiple second electrical signals, and the multiple second electrical signals are used to determine the wavelength of the light to be measured.
  • a beam of light to be measured can be divided into a plurality of second sub-lights to be measured with different propagation directions, and a multi-angle etalon is realized.
  • the wavelength can be measured without multiple etalons, and the structure of the wavelength meter can be simplified.
  • the wavelength meter further includes a linear filter and a third photodetector
  • the multiple beams of light to be measured further include a fourth light to be measured.
  • the linear filter is used to filter the received fourth sub light to be measured to obtain the fifth sub light to be measured and output to the third photodetector.
  • the third photodetector is used to convert the fifth sub-light to be measured into a third electrical signal, and the third electrical signal is used to determine the wavelength position of the wavelength of the light to be measured in the reference transmittance curve corresponding to the light to be measured.
  • the linear filter is used in the wavelength meter, the approximate wavelength position of the wavelength of the light to be measured in the target reference transmittance curve of the light to be measured can be determined through the linear filter, and there is no need to pre-store the wavelength to be measured corresponding to the wavelength meter.
  • Light range there is no need to input the approximate wavelength position of the light to be measured, which can make the wavelength meter suitable for a wider range of wavelength measurement.
  • the first optical path converter is any one of a collimator array, a convex lens or a concave lens.
  • the collimator array is composed of a set of lenses, and each beam of light entering the first optical path converter enters a different lens.
  • the wavelength meter further includes a processor.
  • the processor is electrically connected to the plurality of first photodetectors, and the processor is electrically connected to the plurality of second photodetectors, respectively.
  • the processor is configured to calibrate the wavelength meter according to the calibration parameters provided by the plurality of first photodetectors, and the processor is also configured to determine the wavelength of the light to be measured according to the first measurement parameters provided by the plurality of second photodetectors.
  • the wavelength meter also includes a processor, the wavelength meter can directly calibrate the reference transmittance curve of the light to be measured through the processor, and directly determine the wavelength of the light to be measured.
  • a method for obtaining parameters of a wavelength meter is provided.
  • the method is applied to the wavelength meter of the first aspect, and the method includes:
  • a beam of light is input to the wavelength meter, and the wavelength meter can divide a beam of light input each time into multiple sub-beams, and the multiple sub-beams include a first sub-beam and a second sub-beam.
  • the wavelength meter can directly convert the first sub-beam into a first electrical signal, and perform interference processing on the second sub-beam to obtain the third sub-beam. Then the wavelength meter converts the third sub-beam into a second electrical signal, and finally the wavelength meter determines the voltage value or current value of the first electrical signal and the second electrical signal as the parameters of the wavelength meter.
  • the parameters of the wavelength meter include a calibration parameter and a first measurement parameter. The calibration parameter is used for calibrating the wavelength meter, and the first measurement parameter is used for the wavelength meter to determine the wavelength of the light to be measured. In this way, a wavelength meter is provided for the processor to provide parameters so that the processor can perform corresponding processing.
  • the parameters of the wavelength meter are calibration parameters.
  • the monochromatic light of different wavelengths in the calibration light is input into the wavelength meter in a preset order.
  • the wavelength meter splits the calibration light input each time to obtain multiple sub-calibration lights.
  • the multiple sub-calibration lights include a first sub-calibration light and a second sub-calibration light, and the power of the multiple sub-calibration lights is the same.
  • the wavelength meter can directly convert the first sub-calibration light into the first electrical signal, and can perform interference processing on the second sub-calibration light to obtain the third sub-calibration light.
  • the wavelength meter converts the third sub-calibration light into a second electrical signal.
  • the wavelength meter uses the voltage value or current value of the first electrical signal and the second electrical signal as the calibration parameter of the wavelength meter.
  • the processor is provided with calibration parameters, so that the processor performs calibration processing on the reference transmittance curve of the light to be measured, thereby realizing online calibration of the wavelength meter.
  • the parameter of the wavelength meter is the first measurement parameter.
  • the light to be measured can be input to the wavelength meter.
  • the wavelength meter can split the input light to be measured to obtain multiple sub-beams to be measured, and the multiple sub-beams of light to be measured include a first sub-light to be measured and a plurality of second sub-lights to be measured.
  • the wavelength meter can directly convert the first sub-calibration light into a first electrical signal, and can perform interference processing on the second sub-calibration light to obtain multiple third sub-lights to be measured.
  • the wavelength meter converts the plurality of third sub-lights to be measured into second electrical signals.
  • the wavelength meter will use the voltage value or current value of the first electrical signal and the second electrical signal as the first measurement parameter of the wavelength meter.
  • the processor is provided with the first measurement parameter, so that the processor can determine the wavelength of the light to be measured based on the first measurement parameter and the pre-stored reference transmittance curve.
  • the parameters of the wavelength meter may further include the second measurement parameter.
  • the obtained multiple sub-lights to be measured further include a fourth sub-light to be measured.
  • the wavelength meter can filter the fourth sub light to be measured to obtain the fifth sub light to be measured. Then the wavelength meter converts the fifth sub-to-be-measured light into a third electrical signal, and determines the voltage value or current value of the third electrical signal as the second measurement parameter.
  • the subsequent processor can use the second measurement parameter to determine the wavelength position of the wavelength of the light to be measured in the target reference transmittance curve corresponding to the light to be measured, and there is no need to pre-store the light range to be measured corresponding to the wavelength meter, nor Additional input of the approximate wavelength position of the light to be measured can make the wavelength meter suitable for a wider range of wavelength measurement.
  • an online calibration method is provided, which is applied to the wavelength meter of the first aspect, and the method includes:
  • the transmittance curve corresponding to the current calibration light is determined, and then the adjustment parameters of the wavelength meter are determined according to the transmittance curve corresponding to the calibration light and the reference transmittance curve corresponding to the calibration light.
  • the adjustment parameters the reference transmittance curve corresponding to the light to be measured is corrected, and the target reference transmittance curve corresponding to the light to be measured is obtained.
  • the calibration parameters can be used to determine the target reference transmittance curve corresponding to the light to be measured, and the target reference transmittance curve can be used later to determine the wavelength of the light to be measured, and the wavelength meter can be maintained as much as possible. Measurement accuracy.
  • the transmittance curve corresponding to the calibration light and the reference transmittance curve corresponding to the calibration light can be determined. If the minimum transmittances of the two transmittance curves are not the same, then The reflectance of the etalon in the adjustment parameters of the wavelength meter can be determined. If the free spectral regions of the two transmittance curves are not the same, the refractive index of the etalon in the adjustment parameters of the wavelength meter can be determined according to the free spectral region of the transmittance curve corresponding to the calibration light. In this way, the adjustment parameters of the wavelength meter can be determined.
  • the reflectance and refractive index in the adjustment parameters can also be substituted into the transmittance curve formula of the reference transmittance curve corresponding to the light to be measured to obtain the target reference transmittance curve corresponding to the light to be measured.
  • the target reference transmittance curve can be determined by the transmittance curve formula.
  • the method further includes: acquiring, in the first measurement parameter, an electrical signal provided by a second photodetector for detecting the reference light of the light to be measured, and detecting the light to be measured
  • the transmittance of the light to be measured through the etalon is determined by the electrical signal provided by the second photodetector of the light to be measured output by the etalon. Then determine the ratio of the electrical signal provided by the third detector to the electrical signal provided by the second photodetector used to detect the reference light of the light to be measured. In the transmittance curve corresponding to the linear filter, determine the ratio corresponding to the The wavelength position of the metering wavelength.
  • the wavelength position, transmittance and target reference transmittance curve determine the wavelength of the light to be measured.
  • the period of the wavelength of the light to be measured in the reference transmittance curve of the light to be measured can be determined, there is no need to pre-store the range of the light to be measured corresponding to the wavelength meter, and there is no need to input the approximate wavelength position of the light to be measured. , Can make the wavelength meter suitable for a wider range of wavelength measurement.
  • the free spectral region to which the wavelength position belongs can be selected from the target reference transmittance curve corresponding to the light to be measured according to the wavelength position. Then, in the free spectral region of the selected target reference transmittance curve, obtain the target reference transmittance curve with the highest slope. In the target reference transmittance curve, select the transmittance (the transmittance is the same as the selected target reference transmittance). The wavelength corresponding to the curve having the same etalon incidence angle (transmittance of the light to be measured) is determined as the wavelength of the light to be measured.
  • the approximate wavelength position of the light to be measured can be used to select the free spectral region, the wavelength of the light to be measured can be selected directly in the free spectral region. There is no need to pre-store the range of light to be measured corresponding to the wavelength meter, and no additional Inputting the approximate wavelength position of the light to be measured can make the wavelength meter suitable for a wider range of wavelength measurement.
  • the reflectance and refractive index in the adjustment parameters can also be substituted into the transmittance curve formula of the reference transmittance curve corresponding to the calibration light to obtain the corrected reference transmittance curve corresponding to the calibration light.
  • the corrected reference transmittance curve corresponding to the calibration light can be determined by the transmittance curve formula, and the corrected reference transmittance curve can be subsequently used for the next calibration of the wavelength meter.
  • a wavelength meter in a fourth aspect, includes a first optical splitter, a first optical path converter, an etalon, and a plurality of first photodetectors.
  • the first optical splitter is used to split the input light to be measured to obtain A plurality of sub-lights to be measured includes a first sub-light to be measured and a plurality of second sub-lights to be measured.
  • the first optical path converter is used to change the propagation direction of the first sub-to-be-measured light and/or the second sub-to-be-measured light, so that the first sub-to-be-measured light directly goes to the first photodetector, so that multiple beams of the second sub-to-be-measured light
  • the beam is etalon at different incident angles.
  • the first sub-light to be measured directly enters the first photodetector and can be used as the reference light of the light to be measured.
  • the etalon is used to perform interference processing on the multiple second sub-lights to be measured respectively to obtain multiple third sub-lights to be measured and output to different first photodetectors respectively.
  • the multiple first photodetectors are used to convert the received first sub-light to be measured or the third sub-light to be measured into multiple second electrical signals, and the multiple second electrical signals are used to determine the wavelength of the light to be measured.
  • the first beam splitter and the first optical path converter can be used to output multiple beams of light to be measured with different propagation directions
  • the second sub-light to be measured input to the etalon is the light to be measured with multiple different propagation directions.
  • the wavelength measurement can be realized without multiple etalons, and the structure of the wavelength meter can be made simpler.
  • the wavelength meter further includes a linear filter and a second photodetector
  • the multiple sub-lights to be measured further include a fourth sub-light to be measured.
  • the first optical path converter outputs the fourth sub-to-be-measured light to the linear filter.
  • the linear filter can filter the received fourth sub-to-be-measured light to obtain the fifth sub-to-be-measured light and output it to the second photodetector.
  • the second photodetector can convert the fifth sub-light to be measured into a second electrical signal, and the second electrical signal is used to determine the wavelength position of the wavelength of the light to be measured in the reference transmittance curve corresponding to the light to be measured.
  • the linear filter is used in the wavelength meter, the approximate wavelength position of the wavelength of the light to be measured in the target reference transmittance curve of the light to be measured can be determined through the linear filter, and there is no need to pre-store the wavelength to be measured corresponding to the wavelength meter.
  • Light range there is no need to input the approximate wavelength position of the light to be measured, which can make the wavelength meter suitable for a wider range of wavelength measurement.
  • the wavelength meter further includes a plurality of third photodetectors
  • the first spectroscope is also used to split the input calibration light to obtain multiple sub-calibration lights
  • the multiple sub-calibration lights include the first The sub-alignment light and the second sub-alignment light.
  • the first optical path converter is also used to change the propagation direction of the first sub-calibration light and/or the second sub-calibration light, so that the first sub-calibration light enters the second photodetector, and the second sub-calibration light enters the etalon.
  • the first sub-calibration light directly enters the third photodetector and can be used as the reference light of the calibration light.
  • the etalon is also used for the interference processing of the second sub-calibration light to obtain the third sub-calibration light, which is output to the third photodetector.
  • the calibration light is converted into a plurality of third electric signals, and the plurality of third electric signals are used for calibrating the wavelength meter. In this way, since the calibration light enters the wavelength meter, and the part that measures the light to be measured uses an etalon, the wavelength meter can be calibrated without affecting the wavelength measurement part, so an online calibration can be provided Wavelength meter.
  • the wavelength meter may further include a second optical splitter, a second optical path converter, and a plurality of third photodetectors.
  • the second beam splitter is used for splitting the input calibration light to obtain multiple beams of collimating sub lights, and the multiple beams of collimating sub lights include the first collimating sub lights and the second collimating sub lights.
  • the second optical path converter is used to change the propagation direction of the first sub-calibration light and/or the second sub-calibration light.
  • the first sub-calibration light directly enters the third photodetector and can be used as the reference light of the calibration light.
  • the etalon is also used for the interference processing of the second sub-calibration light to obtain the third sub-calibration light, which is output to the third photodetector.
  • the calibration light is converted into a plurality of third electric signals, and the plurality of third electric signals are used for calibrating the wavelength meter. In this way, since the calibration light enters the wavelength meter, and the part that measures the light to be measured uses an etalon, the wavelength meter can be calibrated without affecting the wavelength measurement part, so an online calibration can be provided Wavelength meter.
  • the first optical path converter is any one of a collimator array, a convex lens or a concave lens.
  • the wavelength meter further includes a processor.
  • the processor is electrically connected to the plurality of first photodetectors, and the processor is electrically connected to the plurality of second photodetectors, respectively.
  • the processor in the wavelength meter can directly calibrate the reference transmittance curve of the light to be measured, and can directly determine the wavelength of the light to be measured.
  • an online calibration method includes:
  • the calibration light input each time is split to obtain multiple sub-calibration lights.
  • the multiple sub-calibration lights include a first sub-calibration light and a second sub-calibration light.
  • the calibration light includes monochromatic light of multiple wavelengths and is preset Sequential input; convert the first sub-calibration light into a first electrical signal, and perform interference processing on the second sub-calibration light to obtain the third sub-calibration light; convert the third sub-calibration light into a second electrical signal; The voltage value or current value of the signal and the second electrical signal is used as the calibration parameter of the wavelength meter.
  • the calibration parameters determine the transmittance curve corresponding to the calibration light; determine the adjustment parameters of the wavelength meter according to the transmittance curve corresponding to the calibration light and the reference transmittance curve corresponding to the calibration light; according to the adjustment parameters, the reference transmission corresponding to the light to be measured
  • the rate curve is corrected to obtain the target reference transmittance curve corresponding to the light to be measured.
  • monochromatic lights of different wavelengths in the calibration light are input to the wavelength meter in a preset order.
  • the wavelength meter splits the calibration light input each time to obtain multiple sub-calibration lights.
  • the multiple sub-calibration lights include a first sub-calibration light and a second sub-calibration light, and the power of the multiple sub-calibration lights is the same.
  • the wavelength meter can directly convert the first sub-calibration light into the first electrical signal, and can perform interference processing on the second sub-calibration light to obtain the third sub-calibration light.
  • the wavelength meter converts the third sub-calibration light into a second electrical signal.
  • the wavelength meter uses the voltage value or current value of the first electrical signal and the second electrical signal as the calibration parameter of the wavelength meter. Then determine the ratio of the voltage value (or current value) of each second electrical signal to the voltage value (current value) of the first electrical signal in the calibration parameter, and each ratio corresponds to the transmittance of monochromatic light of different wavelengths, In this way, the transmittance curve corresponding to the current calibration light can be obtained. Then, according to the transmittance curve corresponding to the calibration light and the reference transmittance curve corresponding to the calibration light, the adjustment parameters of the wavelength meter are determined. According to the adjustment parameters, the reference transmittance curve corresponding to the light to be measured is corrected, and the target reference transmittance curve corresponding to the light to be measured is obtained.
  • the calibration parameters can be used to determine the target reference transmittance curve corresponding to the light to be measured, and the target reference transmittance curve can be used later to determine the wavelength of the light to be measured, and the wavelength meter can be maintained as much as possible. Measurement accuracy.
  • the method further includes: splitting the input light to be measured to obtain multiple sub-beams of light to be measured, wherein the multiple sub-beams of light to be measured include a first sub-be-measured light and a plurality of second sub-beams.
  • the first sub light to be measured is converted into a third electrical signal, and the multiple beams of the second sub light to be measured are respectively subjected to interference processing to obtain multiple beams of the third sub light to be measured;
  • the light is respectively converted into a fourth electrical signal, and the voltage value or current value of the third electrical signal and the fourth electrical signal are used as the first measurement parameter of the wavelength meter.
  • the transmittance of the light to be measured through the etalon is determined; and the wavelength of the light to be measured is determined according to the transmittance and the target reference transmittance curve.
  • the target reference transmittance curve is relatively accurate, the wavelength of the light to be measured can be determined relatively accurately.
  • the method further includes: the multiple beams of light to be measured further include a fourth light to be measured, and the method further comprises: filtering the fourth light to be measured to obtain the fifth light to be measured Light, the fifth sub-light to be measured is converted into a fifth electrical signal; the voltage value or current value of the fifth electrical signal is determined as the second measurement parameter, where the second measurement parameter is used to determine that the light to be measured is The wavelength position in the reference transmittance curve of light.
  • the first measurement parameter determine the transmittance of the light to be measured through the etalon.
  • the first measurement parameter and the second measurement parameter in the transmittance curve corresponding to the linear filter, determine the wavelength corresponding to the wavelength of the light to be measured.
  • Wavelength position determine the wavelength of the light to be measured. In this way, since the period of the wavelength of the light to be measured in the reference transmittance curve of the light to be measured can be determined, there is no need to pre-store the range of the light to be measured corresponding to the wavelength meter, and there is no need to input the approximate wavelength position of the light to be measured. , Can make the wavelength meter suitable for a wider range of wavelength measurement.
  • the adjustment parameters of the wavelength meter are determined according to the transmittance curve corresponding to the calibration light and the reference transmittance curve corresponding to the calibration light, including: if the transmittance curve corresponding to the calibration light and the reference transmittance curve corresponding to the calibration light If the minimum transmittance in the transmittance curve is not the same, the minimum transmittance in the transmittance curve corresponding to the calibration light is used to determine the reflectance of the etalon in the adjustment parameters of the wavelength meter; if the free spectrum of the transmittance curve corresponding to the calibration light The free spectral region of the reference transmittance curve corresponding to the calibration light zone and the calibration light are different, and the refractive index of the etalon in the adjustment parameter of the wavelength meter is determined according to the free spectral zone of the transmittance curve corresponding to the calibration light. In this way, the adjustment parameters of the wavelength meter can be determined.
  • the reference transmittance curve corresponding to the light to be measured is corrected to obtain the target reference transmittance curve corresponding to the light to be measured, including: according to the reflectance, refractive index, and corresponding light to be measured
  • the transmittance curve formula of the reference transmittance curve to obtain the target reference transmittance curve corresponding to the light to be measured.
  • the target reference transmittance curve can be determined by the transmittance curve formula.
  • determining the wavelength of the light to be measured according to the wavelength position, transmittance and the target reference transmittance curve includes: selecting the target reference transmittance curve corresponding to the light to be measured according to the wavelength position The free spectral region to which the wavelength position belongs. Then, in the free spectral region of the selected target reference transmittance curve, obtain the target reference transmittance curve with the highest slope. In the target reference transmittance curve, select the transmittance (the transmittance is compared with the selected reference transmittance curve). The wavelength corresponding to the transmittance of the light to be measured with the incident angle of the same etalon is determined as the wavelength of the light to be measured.
  • the approximate wavelength position of the light to be measured can be used to select the free spectral region, the wavelength of the light to be measured can be selected directly in the free spectral region. There is no need to pre-store the range of light to be measured corresponding to the wavelength meter, and no additional Inputting the approximate wavelength position of the light to be measured can make the wavelength meter suitable for a wider range of wavelength measurement.
  • the reflectance and refractive index in the adjustment parameters can also be substituted into the transmittance curve formula of the reference transmittance curve corresponding to the calibration light to obtain the corrected reference transmittance curve corresponding to the calibration light.
  • the corrected reference transmittance curve corresponding to the calibration light can be determined by the transmittance curve formula, and the corrected reference transmittance curve can be subsequently used for the next calibration of the wavelength meter.
  • an online calibration device which is applied to the wavelength meter described in the first aspect, and the device includes:
  • the determining module is used to determine the transmittance curve corresponding to the calibration light according to the calibration parameters obtained from each first photodetector; according to the transmittance curve corresponding to the calibration light and the reference transmittance curve corresponding to the calibration light, Determining the adjustment parameters of the wavelength meter;
  • the correction module is used for correcting the reference transmittance curve corresponding to the light to be measured according to the adjustment parameters to obtain the target reference transmittance curve corresponding to the light to be measured.
  • the module is determined for:
  • the wavelength is determined according to the minimum transmittance in the transmittance curve corresponding to the calibration light.
  • the free spectral region of the transmittance curve corresponding to the calibration light is different from the free spectral region of the reference transmittance curve corresponding to the calibration light, the free spectral region of the transmittance curve corresponding to the calibration light is determined.
  • the refractive index of the etalon in the adjustment parameters of the wavelength meter is determined.
  • the correction module is used to:
  • the target reference transmittance curve corresponding to the light to be measured is obtained.
  • the determining module is further configured to determine the transmittance of the light to be measured through the etalon according to the first measurement parameter obtained from each second photodetector; A measurement parameter and a second measurement parameter obtained from the third photodetector, in the target reference transmittance curve, determine the wavelength position corresponding to the wavelength of the light to be measured; according to the wavelength position, the transmittance and The target determines the wavelength of the light to be measured with reference to the transmittance curve.
  • a computing device in a seventh aspect, includes a processor and a memory, wherein:
  • Computer instructions are stored in the memory
  • the processor executes the computer instructions to implement the method described in the third aspect.
  • a computer-readable storage medium stores computer instructions.
  • the computing device executes The method described in the third aspect.
  • Fig. 1 is a schematic structural diagram of a wavelength meter provided by an exemplary embodiment of the present application
  • Fig. 2 is a schematic structural diagram of a wavelength meter provided by an exemplary embodiment of the present application
  • Fig. 3 is a schematic diagram of optical path transmission provided by an exemplary embodiment of the present application.
  • Fig. 4 is a schematic structural diagram of a wavelength meter provided by an exemplary embodiment of the present application.
  • Fig. 5 is a schematic structural diagram of a wavelength meter provided by an exemplary embodiment of the present application.
  • Fig. 6 is a schematic structural diagram of a wavelength meter provided by an exemplary embodiment of the present application.
  • Fig. 7 is a schematic structural diagram of a wavelength meter provided by an exemplary embodiment of the present application.
  • Fig. 8 is a schematic structural diagram of a wavelength meter provided by an exemplary embodiment of the present application.
  • Fig. 9 is a schematic diagram of light beam transmission provided by an exemplary embodiment of the present application.
  • Fig. 10 is a schematic diagram of light beam transmission provided by an exemplary embodiment of the present application.
  • FIG. 11 is a schematic flowchart of a method for obtaining parameters of a wavelength meter according to an exemplary embodiment of the present application.
  • FIG. 12 is a schematic flowchart of a method for obtaining calibration parameters provided by an exemplary embodiment of the present application.
  • FIG. 13 is a schematic flowchart of a method for obtaining measurement parameters provided by an exemplary embodiment of the present application.
  • FIG. 14 is a schematic flowchart of a method for online wavelength calibration provided by an exemplary embodiment of the present application.
  • Fig. 15 is a schematic structural diagram of a wavelength meter provided by an exemplary embodiment of the present application.
  • Fig. 16 is a schematic structural diagram of a wavelength meter provided by an exemplary embodiment of the present application.
  • Fig. 17 is a schematic structural diagram of an online calibration device provided by an exemplary embodiment of the present application.
  • the third photodetector 109, the processor 110 The third photodetector 109, the processor 110.
  • a wavelength meter is a device that measures the wavelength of electromagnetic waves in a transmission line. It can usually be realized by the resonance characteristics of a resonant cavity.
  • a wavelength meter based on an etalon where the etalon is a Fabry-Perot (F-P) standing wave cavity.
  • the etalon is composed of two flat glasses. The inner surface of the two flat glasses is coated with a high reflectivity mold. After the light beam enters the etalon, the light beam will be reflected by the air layer between the two coated surfaces to form interference.
  • the wavelength meter is generally installed at the transceiver end, intermediate node, etc. in the optical communication system.
  • the wavelength meter may include a first optical splitter 101, a first optical path converter 102, an etalon 103, and a One first photodetector 104, the first photodetector 104 may be a photodiode.
  • the etalon 103 is an etalon used for the wavelength meter to measure the wavelength.
  • the first beam splitter 101 may include a collimated light entrance port, which may be used to input collimated light.
  • the first beam splitter 101 is used to split the input collimated light to obtain multiple beams of collimated light, and the power of each beam of collimated light may be the same.
  • the plurality of sub-collimation lights includes a first sub-alignment light and a second sub-alignment light.
  • the multiple collimated beams are parallel beams.
  • the multiple beams of collimated light output from the first beam splitter 101 may be input to the first optical path converter 102, and the first optical path converter 102 may change the propagation direction of the first collimated light and the second collimated light; or the first optical path conversion
  • the device 102 may change the propagation direction of the first sub-calibration light; or, the first optical path converter 102 may change the propagation direction of the second sub-calibration light, so that the propagation directions of the first sub-calibration light and the second sub-calibration light are different.
  • the first sub-calibration light output from the first optical path converter 102 directly enters the first photodetector 104 without passing through the etalon 103.
  • the first photodetector 104 converts the received first sub-calibration light into a first electrical Signal.
  • the first sub-collimation light serves as the reference light of the collimation light.
  • the second sub-calibration light output from the first optical path converter 102 enters the etalon 103, and the etalon 103 performs interference processing on the received second sub-calibration light, and outputs the third sub-calibration light.
  • the third sub-calibration light output from the etalon 103 enters the first photodetector 104, and the first photodetector 104 converts the received third sub-calibration light into a first electrical signal.
  • the above-mentioned multiple first electrical signals are used to calibrate the wavelength meter (the calibration process will be described later).
  • the photodetectors used by the first sub-calibration light and the second sub-calibration light are both the first photodetector 104, the same first photodetector 104 is actually used.
  • the wavelength meter since the wavelength meter includes the calibration part of the wavelength meter, and the calibration part of the wavelength meter introduces the calibration light through the calibration light entrance port for calibration without affecting the wavelength measurement part of the wavelength meter, it can provide An online calibrated wavelength meter.
  • the second sub-calibration light is multiple beams
  • the second sub-calibration light output by the first optical path converter 102 is incident on the etalon at different incident angles (that is, different propagation directions). 103.
  • the second sub-collimation light may be one beam or multiple beams, and only one beam is shown in the embodiment of the present application.
  • the wavelength meter also includes a wavelength measuring part, and the wavelength measuring part may use the same first optical splitter 101 and first optical path converter 102 as the calibration part of the wavelength meter.
  • the wavelength meter may also include a plurality of second photodetectors 105.
  • the second photodetector 105 is the same as the first photodetector 104, and may also be a photodiode.
  • the first beam splitter 101 also includes a light entrance for the light to be measured, which is used to input the light to be measured.
  • the first beam splitter 101 is further configured to split the input light to be measured to obtain multiple beams of sub beams to be measured, and the multiple beams of sub beams to be measured include a first beam of sub beams to be measured and a plurality of second beams of sub beams to be measured.
  • the multiple light beams to be measured are parallel light beams.
  • the multiple sub-beams to be measured output from the first beam splitter 101 can be output to the first optical path converter 102, and the first optical path converter 102 can change the propagation direction of the first sub-to-be-measured light and the second sub-to-be-measured light; or An optical path converter 102 can change the propagation direction of the first sub-to-be-measured light; or, the first optical path converter 102 can change the propagation direction of the second sub-to-be-measured light.
  • the first sub-to-be-measured light output from the first optical path converter 102 directly enters the second photodetector 105 without passing through the etalon 103.
  • the second photo-detector 105 converts the received first sub-to-be-measured light into a second photodetector 105.
  • the first sub light to be measured serves as the reference light of the light to be measured.
  • the multiple beams of the second sub-to-be-measured light output from the first optical path converter 102 enters the etalon 103, and the etalon 103 performs interference processing on the received multiple beams of the second sub-to-be-measured light respectively, and outputs multiple beams of the third sub-to-be-measured Light.
  • the multiple third sub-beams output from the etalon 103 respectively enter different second photodetectors 105, and the second photodetector 105 converts the received third sub-beams into second electrical signals.
  • the above-mentioned multiple second electrical signals are used to determine the wavelength (the process of determining the wavelength is described later).
  • the photodetectors used for the first sub-to-be-measured light and the second sub-to-be-measured light are both the second photodetector 105, the same second photodetector 105 is actually used.
  • the calibrated light enters the first spectroscope and the light to be measured enters the spectroscope adopts different light inlets, so that the measurement part of the calibrated wavelength timing wavelength meter can be performed normally.
  • the wavelength meter adopts the first beam splitter 101 and the first optical path converter 102, so that the multiple second sub-lights to be measured enter the etalon 103 in different propagation directions, so that the measurement part of the wavelength of the wavelength meter forms a multi-angle etalon 103 (
  • the multi-angle etalon 103 means that multiple beams of the second sub-beams to be measured are incident on the etalon 103) at different incident angles, and the multi-angle etalon 103 formed by the first beam splitter 101 and the first optical path converter 102, each beam
  • the light splitting ratio of the light to be measured can be adjusted, and a higher dynamic range of measurable power can be achieved by designing the light splitting ratio of the first beam splitter 101.
  • the same etalon 103 is used for the wavelength measurement part of the wavelength meter and the calibration part
  • the wavelength meter uses fewer components and has a simple structure.
  • the angle of each light beam output by the first optical path converter 102 is determined by the relative position of the light exit of the first beam splitter 101 and the first optical path converter 102, and fewer components and parameters need to be adjusted, so it is easy to assemble and debug.
  • the relative position is adjusted, there is no need to adjust the angle, so after the device is fixed, the angle of each beam is not easy to change, so the structural stability is good. For example, as shown in FIG.
  • the light to be measured enters from the light entrance of the light to be measured of the first beam splitter 101, and is divided into multiple paths by the first beam splitter 101 and output to the first optical path converter 102 (such as a collimator array, etc.). ), by designing the distance between each second sub-light to be measured and the optical axis of each collimator in the collimator array, so that the angle of light emitted by each collimator is different.
  • ⁇ L1 to ⁇ L4 respectively correspond to the distance of the 4 beams to be measured from the optical axis of the corresponding collimator.
  • the wavelength meter uses few devices, and they are all mature process devices, which are low in price, easy to assemble and debug, low in assembly cost, and low in total cost.
  • the overall volume is small.
  • the second sub-lights to be measured may be two beams, and both beams are shown in the structural diagram of the wavelength meter.
  • the wavelength meter includes a wavelength measuring part, and the wavelength measuring part may be different from the calibration part of the wavelength meter using a first optical splitter 101 and a first optical path converter 102. , That is, the second optical splitter 106 and the second optical path converter 107 are used.
  • the wavelength meter may also include a plurality of second photodetectors 105.
  • the second photodetector 105 is the same as the first photodetector 104, and may also be a photodiode.
  • the second beam splitter 106 is used for splitting the input light to be measured to obtain multiple sub-lights to be measured.
  • the multiple sub-lights to be measured include a first sub-light to be measured and a plurality of second sub-lights to be measured.
  • the multiple sub-beams to be measured output from the second beam splitter 106 can be output to the second optical path converter 107, and the second optical path converter 107 can change the propagation direction of the first sub-to-be-measured light and the second sub-to-be-measured light; or The second optical path converter 107 can change the propagation direction of the first sub-to-be-measured light; alternatively, the second optical path converter 107 can change the propagation direction of the second sub-to-be-measured light.
  • the first sub-to-be-measured light output from the second optical path converter 107 directly enters the second photodetector 105 without passing through the etalon 103.
  • the second photo-detector 105 converts the received first sub-to-be-measured light into a second photodetector 105.
  • the first sub light to be measured serves as the reference light of the light to be measured.
  • the multiple beams of the second sub-to-be-measured light output from the second optical path converter 107 enter the etalon 103, and the etalon 103 performs interference processing on the received multiple beams of the second sub-to-be-measured light respectively, and outputs multiple beams of the third sub-to-be-measured Light.
  • the multiple beams of the third sub light to be measured output from the etalon 103 respectively enter different second photodetectors 105, and the second photodetector 105 converts the received third sub light to be measured into a second electrical signal.
  • the above-mentioned multiple second electrical signals are used to determine the wavelength (the process of determining the wavelength is described later).
  • the wavelength meter adopts the second optical splitter 106 and the second optical path converter 107, so that the measuring part of the wavelength of the wavelength meter forms a multi-angle etalon 103, and the second optical splitter 106 and the second optical path converter 107 form a multi-angle etalon 103.
  • the light splitting ratio of each beam to be measured can be adjusted, and a higher dynamic range of measurable power can be achieved by designing the light splitting ratio of the second beam splitter 106.
  • the wavelength meter further includes a linear filter 108 and a third photodetector 109.
  • the photodetector 104 is the same, and may also be a photodiode.
  • the plurality of sub-beams of light to be measured obtained after the light to be measured is split by the first beam splitter 101 further includes the fourth sub-beams to be measured.
  • the first optical path converter 102 can also output the fourth sub-to-be-measured light into the linear filter 108.
  • the linear filter 108 performs filtering processing on the received fourth sub-light to be measured to obtain the fifth sub-light to be measured.
  • the linear filter 108 outputs the fifth sub-to-be-detected light to the third photodetector 109 without passing through the etalon 103.
  • the third photodetector 109 can convert the fifth sub-light to be measured into a third electrical signal, which can be used to determine the wavelength position of the wavelength of the light to be measured in the reference transmittance curve corresponding to the light to be measured ( This will be explained later).
  • the fourth sub-to-be-measured light is output by the first optical path converter 102, it first enters the linear filter 108 and then enters the third photodetector 109 without passing through the etalon.
  • the linear filter 108 is used in the wavelength meter, the approximate wavelength position of the wavelength of the light to be measured in the target reference transmittance curve of the light to be measured can be determined through the linear filter 108, and there is no need to pre-store the corresponding wavelength meter.
  • the range of the light to be measured does not require additional input of the approximate wavelength position of the light to be measured, which can make the wavelength meter suitable for a wider range of wavelength measurement.
  • the wavelength meter further includes a linear filter 108 and a third photodetector 109.
  • the third photodetector 109 and the first The photodetector 104 is the same, and may also be a photodiode.
  • the multiple sub-beams to be measured obtained by the second beam splitter 106 after splitting the light to be measured further include the fourth sub-beams.
  • the second optical path converter 107 can also output the fourth sub-light to be measured and enter the linear filter 108.
  • the linear filter 108 performs filtering processing on the received fourth sub light to be measured to obtain the fifth sub light to be measured.
  • the linear filter 108 outputs the fifth sub-to-be-measured light to the third photodetector 109 without passing through the etalon 103.
  • the third photodetector 109 can convert the fifth sub-light to be measured into a third electrical signal, and the third electrical signal can be used to determine the wavelength position of the wavelength of the light to be measured in the reference transmittance curve corresponding to the light to be measured ( This will be explained later).
  • the linear filter 108 is used in the wavelength meter, the approximate wavelength position of the wavelength of the light to be measured in the target reference transmittance curve of the light to be measured can be determined through the linear filter 108, and there is no need to pre-store the corresponding wavelength meter.
  • the range of the light to be measured does not require additional input of the approximate wavelength position of the light to be measured, which can make the wavelength meter suitable for a wider range of wavelength measurement.
  • the linear filter 108 is a frequency selection device, and the specific filtering process is that the linear filter 108 passes the optical signal of a specific wavelength, while filtering out the optical signal of the remaining wavelength.
  • the wavelength meter further includes a processor 110, and the processor 110 is electrically connected to the plurality of first photodetectors 104, and the processor 110 is respectively connected to The plurality of second photodetectors 105 are electrically connected.
  • the processor 110 can calibrate the wavelength meter according to the calibration parameters provided by the plurality of first photodetectors 104, and the processor 110 is further configured to determine the wavelength of the light to be measured according to the first measurement parameters provided by the plurality of second photodetectors 105 In this way, since the wavelength meter also includes the processor 110, the wavelength meter can directly calibrate the reference transmittance curve of the light to be measured through the processor 110, and directly determine the wavelength of the light to be measured.
  • the wavelength meter further includes a processor 110, and the processor 110 is electrically connected to the third photodetector 109.
  • the wavelength meter may also be externally connected with a processor 110 for calibrating the reference transmittance curve of the light to be measured and directly determining the wavelength of the light to be measured.
  • the first optical path converter 102 is any one of a collimator array, a convex lens or a concave lens.
  • the collimator array is composed of a group of lenses, and each beam of light entering the first optical path converter 102 enters a different lens.
  • FIG. 9 shows The concave lens, ⁇ L1 to ⁇ L4 respectively correspond to the distance of the 4 second sub-lights to be measured from the optical axis of the concave lens.
  • the second optical path converter 107 is any one of a collimator array, a convex lens or a concave lens.
  • the collimator array is composed of a group of lenses, and each beam of light entering the second optical path converter 102 enters a different lens.
  • the second optical path converter 107 adopts a collimator array, the four second sub-lights to be measured are respectively output to different lenses of the second optical path converter 107. Since the parallel second sub-lights to be measured enter the lens through different positions of the lens, they will exit at different angles after being refracted by the lens, so the second optical path converter 107 can change the 4 parallel second sub-lights to be measured In Fig.
  • ⁇ L1 to ⁇ L4 respectively correspond to the distances from the optical axis of the corresponding collimator (such as convex lens, etc.) of the 4 second sub-lights to be measured.
  • the first optical splitter 101 and the second optical splitter 106 may adopt a planar light wave circuit (PLC).
  • PLC planar light wave circuit
  • the embodiment of the present application also provides a method for obtaining the parameters of the wavelength meter.
  • the execution process of this method can be:
  • Step 1101 Split a beam of input light to obtain multiple sub-beams, where the multiple sub-beams include a first sub-beam and a second sub-beam.
  • the wavelength meter can split a beam of input light to obtain multiple sub-beams.
  • the multiple sub-beams include a first sub-beam and a second sub-beam.
  • the multiple sub-beams are parallel light beams, so the propagation directions of the multiple sub-beams are the same.
  • the specific step may be executed by the first optical splitter 101.
  • Step 1102 Convert the first sub-beam into a first electrical signal, and perform interference processing on the second sub-beam to obtain a third sub-beam.
  • converting the first sub-beam into the first electrical signal may be performed by the first photodetector 104, and obtaining the third sub-beam may be performed by the etalon 103.
  • Step 1103 Convert the third sub-beam into a second electrical signal.
  • the specific step may be performed by the first photodetector 104.
  • Step 1104 Use the voltage value or current value of the first electrical signal and the second electrical signal as a parameter of the wavelength meter.
  • the specific step may be performed by the first photodetector 104.
  • the procedure for obtaining the calibration parameters of the wavelength meter is:
  • Step 1201 Split the calibration light input each time to obtain multiple sub-calibration lights, where the multiple sub-calibration lights include a first sub-calibration light and a second sub-calibration light, and the calibration light includes monochromatic lights of multiple wavelengths, and Enter in the preset order.
  • the calibration light includes monochromatic light of multiple wavelengths, and the timing of each input of the wavelength is input according to a preset sequence of monochromatic light of multiple wavelengths.
  • the wavelength meter acquires the second electrical signal of monochromatic light of different wavelengths in a preset sequence.
  • the calibration light includes monochromatic light of four wavelengths: a, b, c, and d.
  • the preset sequence is a, c, b, d. In a calibration process, input a first, then input c, and then input b , And finally enter d.
  • the wavelength meter can split the calibration light input each time to obtain multiple sub-calibration lights, and the multiple sub-calibration lights include the first sub-calibration light and the second sub-calibration light.
  • the specific step may be executed by the first optical splitter 101.
  • Step 1202 Convert the first sub-calibration light into a first electrical signal, and perform interference processing on the second sub-calibration light to obtain a third sub-calibration light.
  • the wavelength meter can directly convert the first sub-calibration light into the first electrical signal, and can perform interference processing on the second sub-calibration light to obtain the third sub-calibration light.
  • converting the first sub-calibration light into the first electrical signal may be performed by the first photodetector 104, and obtaining the third sub-calibration light may be performed by the etalon 103.
  • Step 1203 Convert the third sub-calibration light into a second electrical signal.
  • the specific step may be performed by the first photodetector 104.
  • Step 1204 Use the voltage value or current value of the first electrical signal and the second electrical signal as a calibration parameter of the wavelength meter.
  • the calibration parameters of the wavelength meter can be used to calibrate the wavelength meter (described later), and the specific step can be performed by the first photodetector 104.
  • the calibration part of the wavelength meter can provide calibration parameters for the processor 110 for the processor 110 to calibrate the wavelength meter based on the calibration parameters.
  • the calibration parameters include the transmission information of monochromatic light of different wavelengths through the etalon, so the subsequent determination can be based on the calibration parameters The current calibrated transmittance curve.
  • the flow of the measurement part of the wavelength of the wavelength meter is also provided.
  • the execution flow can be as follows:
  • Step 1301 Split the input light to be measured to obtain multiple sub-lights to be measured, where the multiple sub-lights to be measured include first sub-lights to be measured and multiple beams of second sub-lights to be measured.
  • the light to be measured when the optical module (receiving end, transmitting end, etc.) needs to measure the wavelength of the light beam (hereinafter referred to as the light to be measured), the light to be measured can be input to the wavelength meter.
  • the wavelength meter can split the input light to be measured to obtain multiple sub-beams to be measured, and the multiple sub-beams of light to be measured include a first sub-light to be measured and a plurality of second sub-lights to be measured.
  • Step 1302 Convert the first sub-light to be measured into a first electrical signal, and perform interference processing on the multiple second sub-lights respectively to obtain multiple third sub-lights to be measured.
  • the wavelength meter can directly convert the first sub light to be measured into the first electrical signal, and can perform interference processing on the second sub light to be measured to obtain multiple third sub light to be measured.
  • converting the first sub-light to be measured into the first electrical signal can be performed by the second photodetector 105, and obtaining the third sub-light to be measured can be performed by the etalon 103.
  • Step 1303 Convert the multiple third sub-lights to be measured into second electrical signals, respectively.
  • the specific step can be executed by the second photodetector 105.
  • Step 1304 Use the voltage value or current value of the first electrical signal and the second electrical signal as the first measurement parameter of the wavelength meter.
  • the first measurement parameter of the wavelength meter can be used to determine the wavelength of the light to be measured (described later), and the specific step can be performed by the second photodetector 105.
  • the calibration part of the wavelength meter can provide the processor 110 with the first measurement parameter for the processor 110 to determine the wavelength of the light to be measured based on the first measurement parameter.
  • the measurement parameters of the wavelength meter may also include a second measurement parameter (the second measurement parameter is used to determine the wavelength position of the light to be measured in the reference transmittance curve of the light to be measured), and the second measurement parameter is obtained.
  • the process of measuring parameters is as follows:
  • the obtained multiple beams of light to be measured also include the fourth light to be measured.
  • the wavelength meter can filter the fourth sub light to be measured to obtain the fifth sub light to be measured. Then the wavelength meter converts the fifth sub-to-be-measured light into a third electrical signal, and determines the voltage value or current value of the third electrical signal as the second measurement parameter.
  • the subsequent processor 110 can use the second measurement parameter to determine the wavelength position of the wavelength of the light to be measured in the target reference transmittance curve corresponding to the light to be measured. It is necessary to input the approximate wavelength position of the light to be measured, which can make the wavelength meter suitable for a wider range of wavelength measurement.
  • the measurement part of the wavelength meter and the calibration part in the above flow chart of FIG. 13 can use the same optical splitter and optical path converter.
  • the measurement part of the wavelength meter and the calibration part can use different optical splitters and optical path converters.
  • a process for the processor 110 to calibrate the wavelength meter online based on the calibration parameters is also provided:
  • Step 1401 according to the calibration parameters obtained from each first photodetector 104, determine the transmittance curve corresponding to the calibration light.
  • the transmittance curve can be expressed in a rectangular coordinate system, with the horizontal axis as the wavelength and the vertical axis as the transmittance.
  • the processor 110 determines that the voltage value of the first electrical signal provided by the first photodetector 104 into which the third sub-calibration light output by the etalon enters and the reference light for detecting the calibration light (ie, the first sub-calibration light) ) Is the ratio of the voltage value of the electrical signal provided by the first photodetector 104 to obtain the transmittance of the second sub-calibration light through the etalon. Because the light source of the calibration light can output monochromatic light of multiple wavelengths, and output monochromatic light of multiple wavelengths in a preset order each time.
  • the processor 110 can obtain the stored preset sequence of the calibration light, and determine based on the preset sequence Each time the wavelength corresponding to the first electrical signal provided by the first photodetector 104 is obtained, the transmittance of the monochromatic light of each wavelength through the etalon 103 can be determined, and the transmittance curve of the calibration light can be determined.
  • the second sub-calibration light passing through the etalon is one beam each time, a transmittance curve can be determined. If the second sub-calibration light passing through the etalon is multiple beams each time, then Determine multiple transmittance curves with different incident angles of the etalon. Only one transmittance curve can be used in this application. The above is the use of the voltage value of the first electrical signal, of course, the current value of the first electrical signal may also be used.
  • Step 1402 Determine the adjustment parameters of the wavelength meter according to the transmittance curve corresponding to the calibration light and the reference transmittance curve corresponding to the calibration light.
  • the reference transmittance curve is a transmittance curve stored in advance.
  • the reference transmittance curve is a transmittance curve measured with calibration light before the wavelength meter is shipped.
  • the reference transmittance curve is the reference transmittance curve after the reference transmittance curve corresponding to the calibration light was calibrated last time.
  • the processor 110 may compare the transmittance curve corresponding to the calibration light with the reference transmittance curve corresponding to the calibration light to obtain the adjustment parameters of the wavelength meter. In step 1401, if multiple transmittance curves are determined, the processor 110 may only compare the transmittance curve corresponding to the calibration light and the reference transmittance curve corresponding to the calibration light under the same incident angle (incident angle of the etalon) to obtain The adjustment parameters of the wavelength meter.
  • the adjustment parameters can be determined as follows:
  • the minimum transmittance in the transmittance curve corresponding to the calibration light is used to determine the etalon value in the adjustment parameters of the wavelength meter. Reflectivity. If the free spectral region of the transmittance curve corresponding to the calibration light is different from the free spectral region of the reference transmittance curve corresponding to the calibration light, determine the standard in the adjustment parameters of the wavelength meter according to the free spectral region of the transmittance curve corresponding to the calibration light With the refractive index.
  • the processor 110 can obtain the minimum transmittance of the transmittance curve corresponding to the calibration light and the minimum transmittance of the reference transmittance curve corresponding to the calibration light, and then can determine the transmittance curve and the calibration light corresponding to the calibration light. Whether the minimum transmittance of the corresponding reference transmittance curve is the same. When the two minimum transmittances are not the same, the processor 110 may determine the reflectance of the etalon 103 in the adjustment parameter of the wavelength meter according to the minimum transmittance in the transmittance curve corresponding to the calibration light. Specifically, formula (1) can be used:
  • R represents the reflectance of the etalon 103
  • TFmin represents the minimum transmittance in the transmittance curve corresponding to the calibration light.
  • the processor 110 can obtain the free spectral region of the transmittance curve corresponding to the calibration light and the free spectral region of the reference transmittance curve corresponding to the calibration light, and then can determine the transmittance curve corresponding to the calibration light and the reference transmittance curve corresponding to the calibration light Are the free spectral regions of the same.
  • the processor 110 may determine the refractive index of the etalon in the adjustment parameter of the wavelength meter according to the free spectral region in the transmittance curve corresponding to the calibration light.
  • formula (2) can be used:
  • n is the refractive index of the etalon 103
  • c refers to the speed of light
  • FSR refers to the free spectral region of the transmittance curve corresponding to the current calibration light (that is, the period of the transmittance curve)
  • l refers to the etalon 103
  • the cavity length of, ⁇ is the angle between the light inside the etalon 103 and the normal of the end face of the etalon 103.
  • Step 1403 According to the adjustment parameters, the reference transmittance curve corresponding to the light to be measured is corrected to obtain the target reference transmittance curve corresponding to the light to be measured.
  • the reference transmittance curve corresponding to the light to be measured can be the wavelength measurement part of the wavelength meter using monochromatic light of multiple wavelengths before the wavelength meter leaves the factory, and each incident angle of the etalon 103 obtained by the measurement corresponds to each incident angle. Transmittance curve.
  • the reference transmittance curve corresponding to the light to be measured is the target reference transmittance curve after the last time the reference transmittance curve of the light to be measured is calibrated.
  • the processor 110 can obtain the pre-stored reference transmittance curve corresponding to the light to be measured, and then can use the adjustment parameters to correct the reference transmittance curve corresponding to the light to be measured to obtain the target reference corresponding to the light to be measured Transmittance curve.
  • each beam corresponds to a transmittance curve, so the final The target reference transmittance curve corresponding to the determined light to be measured is multiple beams.
  • step 1403 the following methods may be used to obtain the target reference transmittance curve corresponding to the light to be measured:
  • the target reference transmittance curve corresponding to the light to be measured is obtained.
  • the transmittance curve formula of the reference transmittance curve corresponding to the light to be measured is:
  • TF( ⁇ ) is the transmittance at the wavelength ⁇
  • ⁇ is the wavelength on the reference transmittance curve corresponding to the light to be measured
  • R is the reflectivity of the etalon 103
  • n is the refractive index of the etalon 103
  • ⁇ is Pi
  • l refers to the cavity length of the etalon 103
  • ⁇ is the angle between the light inside the etalon 103 and the normal of the end surface of the etalon 103.
  • the subsequent wavelength meter determines the wavelength of the light to be measured
  • the second electrical signal provided by the second photodetector 105 is used to determine the transmittance.
  • the processor 110 can determine the wavelength corresponding to the transmittance in the target reference transmittance curve, that is, the wavelength of the light to be measured.
  • the reference transmittance curve corresponding to the calibration light uses the factory reference transmittance curve
  • the reference transmittance corresponding to the light to be measured also uses the factory reference transmittance curve
  • the calibration light corresponds to The reference transmittance curve used is the reference transmittance curve after the last correction
  • the reference transmittance curve corresponding to the light to be measured is also the target reference transmittance curve after the last correction.
  • the wavelength of the light to be measured can be determined as follows:
  • each second photodetector 105 determines the transmittance of the light to be measured through the etalon; according to the first measurement parameter and the second measurement parameter obtained from the third photodetector 109, in the target reference In the transmittance curve, determine the wavelength position corresponding to the wavelength of the light to be measured; determine the wavelength of the light to be measured according to the wavelength position, transmittance and the target reference transmittance curve.
  • the processor 110 determines that the voltage value of the second electrical signal provided by the second photodetector 105 into which the third sub-to-be-measured light output by the etalon enters and the reference light for detecting the light-to-be-measured (ie, the first sub-beam)
  • the ratio of the voltage value of the second electrical signal provided by the second photodetector 105 of the light to be measured is obtained to obtain the transmittance of the light to be measured through the etalon. Since multiple second sub-lights to be measured enter the etalon, multiple transmittances can be obtained.
  • the processor 110 can determine the voltage value of the third electrical signal (i.e., the second measurement parameter) provided by the third photodetector 109 and the second photodetector that detects the reference light (i.e., the first sub-light to be measured) of the light to be measured.
  • the ratio of the voltage value of the second electrical signal provided by 105 is obtained to obtain the transmittance of the linear filter 108 through the light to be measured.
  • the processor 110 determines the wavelength position of the wavelength corresponding to the transmittance in the transmittance curve corresponding to the linear filter.
  • the processor 110 can then use the wavelength position, the transmittance and the target reference transmittance curve to determine the wavelength of the light to be measured.
  • the above is the voltage value of the second electrical signal and the third electrical signal.
  • the current value of the second electrical signal and the third electrical signal can also be used.
  • the method of determining the wavelength of the light to be measured is as follows:
  • the processor 110 may select the free spectral region to which the wavelength position belongs from the target reference transmittance curve corresponding to the light to be measured. Then, in the selected free spectral region, the target reference transmittance curve with the highest slope at the wavelength position is obtained. In the target reference transmittance curve, select the transmittance (the transmittance and the selected target reference transmittance curve have the same etalon incidence angle of the light to be measured) corresponding to the wavelength, determined as the light to be measured ⁇ wavelength. In this way, since the approximate wavelength position of the light to be measured can be used to select the free spectral region, the wavelength of the light to be measured can be selected directly in the free spectral region. There is no need to pre-store the range of light to be measured corresponding to the wavelength meter, and no additional Inputting the approximate wavelength position of the light to be measured can make the wavelength meter suitable for a wider range of wavelength measurement.
  • the processor 110 may also substitute the reflectance and refractive index in the adjustment parameters into the transmittance curve formula of the reference transmittance curve corresponding to the calibration light to obtain the corrected reference transmittance corresponding to the calibration light. curve.
  • the corrected reference transmittance curve corresponding to the calibration light can be determined by the transmittance curve formula, and the corrected reference transmittance curve can be subsequently used for the next calibration of the wavelength meter.
  • the target reference transmittance after the reference transmittance curve of the light to be measured is also used for calibration. curve.
  • processor 110 determines the wavelength of the light to be measured, and the processor 110 may be the processor 110 of the wavelength meter or the processor 110 external to the wavelength meter, which is not limited in the embodiment of the present application.
  • an embodiment of the present application also provides a wavelength meter, which includes a wavelength measurement part.
  • the wavelength meter includes a first optical splitter 101, a first optical path converter 102, and an etalon 103 and a plurality of first photodetectors 104.
  • the first photodetector 104 may be a photodiode.
  • the first beam splitter 101 also includes a light entrance for the light to be measured, which is used to input the light to be measured.
  • the first beam splitter 101 is used for splitting the input light to be measured to obtain multiple sub-lights to be measured.
  • the multiple sub-lights to be measured include a first sub-light to be measured and a plurality of second sub-lights to be measured.
  • the multiple sub-beams to be measured output from the first beam splitter 101 can be output to the first optical path converter 102, and the first optical path converter 102 can change the propagation direction of the first sub-to-be-measured light and the second sub-to-be-measured light; or An optical path converter 102 can change the propagation direction of the first sub-to-be-measured light; or, the first optical path converter 102 can change the propagation direction of the second sub-to-be-measured light.
  • the first sub-to-be-measured light output from the first optical path converter 102 directly enters the first photodetector 104 without passing through the etalon 103.
  • the first photo-detector 104 converts the received first sub-to-be-measured light into a first photodetector.
  • the first sub light to be measured serves as the reference light of the light to be measured.
  • the multiple second sub-beams output from the first optical path converter 102 enter the etalon 103 with different propagation directions (that is, different incident angles), and the etalon 103 respectively interferes with the multiple received second sub-beams Processing, output multiple beams of the third sub light to be measured.
  • the multiple beams of the third sub-to-be-measured light output from the etalon 103 respectively enter different first photodetectors 104, and the first photodetector 104 converts the received third sub-to-be-measured light into a first electrical signal.
  • the above-mentioned multiple first electrical signals are used to determine the wavelength (the process of determining the wavelength is described in the foregoing).
  • the photodetectors used by the first sub-to-be-measured light and the second sub-to-be-measured light are both the first photodetector 104, the same first photodetector 104 is actually used.
  • the wavelength meter adopts the first optical splitter 101 and the first optical path converter 102, so that the measuring part of the wavelength of the wavelength meter forms a multi-angle etalon 103, and the first optical splitter 101 and the first optical path converter 102 form a multi-angle etalon 103.
  • the light splitting ratio of each beam to be measured can be adjusted, and a higher dynamic range of measurable power can be achieved by designing the light splitting ratio of the first light splitter 101.
  • a calibration part of the wavelength meter may be added.
  • the calibration part may be the same as the description in FIG. 1, and the structure diagram is shown in FIG.
  • the calibration part of the wavelength meter can be added on the basis of FIG. 15.
  • the calibration part is different from the first optical splitter 101 and the first optical path converter 102 used in FIG. Figure 4 is similar and will not be repeated here.
  • the wavelength meter further includes a linear filter 108 and a second photodetector 105, and it may also be a photodiode.
  • the multiple sub-beams to be measured obtained by the first beam splitter 101 further include the fourth sub-beams to be measured.
  • the linear filter 108 can filter the fourth sub-to-be-measured light to obtain the fifth sub-to-be-measured light.
  • the second photodetector 105 can convert the fifth sub-to-be-measured light into a second electrical signal. It is used to determine the wavelength position of the wavelength of the light to be measured in the reference transmittance curve corresponding to the light to be measured.
  • the linear filter 108 is used in the wavelength meter, the approximate wavelength position of the wavelength of the light to be measured in the target reference transmittance curve of the light to be measured can be determined through the linear filter 108, and there is no need to pre-store the corresponding wavelength meter.
  • the range of the light to be measured does not require additional input of the approximate wavelength position of the light to be measured, which can make the wavelength meter suitable for a wider range of wavelength measurement.
  • the first beam splitter 101 may be a PLC
  • the first optical path converter 102 may be any one of a convex lens, a collimator array, and a concave lens.
  • Fig. 17 is a structural diagram of an online calibration device provided by an embodiment of the present application.
  • the device can be implemented as part or all of the device through software, hardware or a combination of the two.
  • the device provided in the embodiment of the present application can implement the process described in FIG. 14 of the embodiment of the present application.
  • the device includes: a determination module 1710 and a correction module 1720, wherein:
  • the determining module 1710 is configured to determine the transmittance curve corresponding to the calibration light according to the calibration parameters obtained from each first photodetector; according to the transmittance curve corresponding to the calibration light and the reference transmittance curve corresponding to the calibration light , To determine the adjustment parameters of the wavelength meter; specifically, it can be used to implement the determining function of step 1401 and step 1402 and the implicit steps included in step 1401 and step 1402.
  • the correcting module 1720 is configured to correct the reference transmittance curve corresponding to the light to be measured according to the adjustment parameters to obtain the target reference transmittance curve corresponding to the light to be measured. Specifically, it can be used to implement the correction function of step 143 and the implicit steps included in step 1403.
  • the determining module 1710 is used to:
  • the wavelength is determined according to the minimum transmittance in the transmittance curve corresponding to the calibration light.
  • the free spectral region of the transmittance curve corresponding to the calibration light is different from the free spectral region of the reference transmittance curve corresponding to the calibration light, the free spectral region of the transmittance curve corresponding to the calibration light is determined.
  • the refractive index of the etalon in the adjustment parameters of the wavelength meter is determined.
  • the correction module 1720 is used to:
  • the target reference transmittance curve corresponding to the light to be measured is obtained.
  • the determining module 1710 is further configured to determine the transmittance of the light to be measured through the etalon according to the first measurement parameter obtained from each second photodetector; The first measurement parameter and the second measurement parameter obtained from the third photodetector, in the target reference transmittance curve, determine the wavelength position corresponding to the wavelength of the light to be measured; according to the wavelength position and the transmittance And the target reference transmittance curve to determine the wavelength of the light to be measured.
  • the division of modules in the above embodiments of the present application is illustrative, and it is only a logical function division. In actual implementation, there may also be other division methods.
  • the functional modules in the various embodiments of the present application may be integrated in A processor may also exist alone physically, or two or more modules may be integrated into one module.
  • the above-mentioned integrated modules can be implemented in the form of hardware or software functional modules.
  • the computer program product includes one or more computer instructions, and when the computer program instructions are loaded and executed on a server or a terminal, the processes or functions described in the embodiments of the present application are generated in whole or in part.
  • the computer instructions may be stored in a computer-readable storage medium, or transmitted from one computer-readable storage medium to another computer-readable storage medium.
  • the computer instructions may be transmitted from a website, computer, server, or data center.
  • the computer-readable storage medium may be any available medium that can be accessed by a server or a terminal, or a data storage device such as a server or a data center integrated with one or more available media.
  • the usable medium may be a magnetic medium (such as a floppy disk, a hard disk, a tape, etc.), an optical medium (such as a digital video disk (Digital Video Disk, DVD), etc.), or a semiconductor medium (such as a solid-state hard disk, etc.).

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Abstract

L'invention concerne un dispositif de mesure de longueur d'onde, un procédé d'obtention d'un paramètre du dispositif de mesure de longueur d'onde, et un procédé d'étalonnage en ligne, qui se rapportent au domaine technique des communications optiques. Le dispositif de mesure de longueur d'onde comprend un premier diviseur optique (101), un premier convertisseur de trajet optique (102), un étalon (103), et de multiples premiers photodétecteurs (104) ; le premier diviseur optique (101) sert à diviser la lumière d'étalonnage d'entrée pour obtenir de multiples faisceaux de lumière de sous-étalonnage, et les multiples faisceaux de lumière de sous-étalonnage comprennent une première lumière de sous-étalonnage et une deuxième lumière de sous-étalonnage ; le premier convertisseur de trajet optique (102) sert à modifier la direction de propagation de la première lumière de sous-étalonnage et/ou de la deuxième lumière de sous-étalonnage ; l'étalon (103) sert appliquer un traitement d'interférence à la deuxième lumière de sous-étalonnage pour obtenir une troisième lumière de sous-étalonnage ; les multiples premiers photodétecteurs (104) servent à convertir la première lumière de sous-étalonnage ou la troisième lumière de sous-étalonnage reçue en de multiples premiers signaux électriques, et les multiples premiers signaux électriques servent à étalonner le dispositif de mesure de longueur d'onde. Le dispositif de mesure de longueur d'onde peut être étalonné en ligne.
PCT/CN2020/137353 2020-02-29 2020-12-17 Dispositif de mesure de longueur d'onde, procédé d'obtention de paramètre de dispositif de mesure de longueur d'onde et procédé d'étalonnage en ligne WO2021169518A1 (fr)

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