WO2021151524A1 - Hochfrequenz-prüfkontaktelement und prüfstiftvorrichtung - Google Patents
Hochfrequenz-prüfkontaktelement und prüfstiftvorrichtung Download PDFInfo
- Publication number
- WO2021151524A1 WO2021151524A1 PCT/EP2020/073901 EP2020073901W WO2021151524A1 WO 2021151524 A1 WO2021151524 A1 WO 2021151524A1 EP 2020073901 W EP2020073901 W EP 2020073901W WO 2021151524 A1 WO2021151524 A1 WO 2021151524A1
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- WO
- WIPO (PCT)
- Prior art keywords
- contact
- test
- section
- pin device
- contacting
- Prior art date
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06772—High frequency probes
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06705—Apparatus for holding or moving single probes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
- G01R1/06716—Elastic
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
- G01R1/06733—Geometry aspects
Definitions
- the present invention relates to a high-frequency test contact element and a test pin device for releasably contacting a contact partner in the high-frequency range.
- High-frequency test pin devices with a contact head are generally known from the prior art and are used in test fields or other test contexts to test a test partner, for example an electronic assembly having a suitable socket section, for functionality.
- the test pin device is placed as a plug on the contact partner to be tested or makes contact with it by means of contact elements arranged at the end or extending, such as contact pins or contact lamellas. Test signals are then sent to the contact partner via suitable contacting.
- contact is then made, typically at periodic intervals, by means of a relative approach of the test pin device and a test item to be tested, whereby a high contact quality is required during the testing process, especially in the field of high-frequency technology, since inadequate electrical contacting not only leads to greater wear and thus an impaired service life but also leads to inadequate resistance and therefore wave adaptation, with the result of undesired reflections and thus potentially incorrect contact or measurement results.
- a configuration of the contact elements and the device that is optimized with regard to the transmission properties of high-frequency signals, in particular in order to minimize the probability of possible signal losses.
- WO 2019 / 138505A1 describes a test head pin for a test device in the high-frequency range, having a first and second linear lamellar area each connected to opposing contact sections and an elastic area in between with a centrally arranged cavity extending along the direction of extension.
- the elastic region has a plurality of curved sections lined up in a row in the course direction, a respective angle of curvature or bending angle of the curved sections being between 90 and 180 °.
- CN 109782034A describes a test head pin and an associated test device for the high frequency range.
- the test head pin is designed as a continuous stamped part and has a contact section for contacting a contact partner and a connection section for connecting to a circuit board of the test device.
- An elastic arm is formed between the contact section and the connecting section, which arm has a multiplicity of strongly curved or bent bending sections.
- the object of the present invention is to provide an improved contact element and a test pin device which enables optimized transmission of high-frequency signals and, at the same time, reliable contacting of a contact partner to be tested.
- the present invention relates to a high-frequency test contact element for detachably contacting a contact partner and for connection to a test pin device, in particular a “board-to-board” connector, having a lamellar base body with a first contact area at the end for contacting a contact partner Opposite second contact area for contacting a test pin device receiving the test contact element and an intermediate meander-shaped elastic area with a preferably centrally arranged cavity extending along a direction of extension of the elastic area for suspension along a direction of longitudinal extension of the test contact element, the meander-shaped elastic region having a plurality of one on top of the other in the direction of extension has the following bending elements of the base body with a respective bending angle of 5 to 70 °.
- the high-frequency test contact element according to the invention provides a spring effect in the longitudinal direction of extension through the meander-shaped elastic region, whereby an optimized contacting of a contact partner can be achieved.
- the bending elements according to the invention of the meandering area have a relatively small bending angle compared to the prior art, so that an optimized signal transmission is achieved by means of the test contact element.
- the relatively small bending angle minimizes the occurrence of vibrations, radiation and / or damping, so that signal transmission is significantly improved compared to the prior art and, in addition, a high number of load changes is made possible.
- the test contact element has an essentially elongated or elongated base body.
- the first and second contact areas of the test contact element in particular preferably extend essentially along the direction of longitudinal extent of the contact element.
- the first and / or second contact area are preferably designed to be essentially linear.
- the first and / or second contact area can also have slightly inclined and / or curved sections.
- the meandering elastic region arranged in between has a direction basically in the direction of the longitudinal extent of the test contact element, but here has the plurality of bending elements, ie which are arranged bent relative to the direction of longitudinal extent.
- the respective bending elements or the bending angles of these elements preferably relate to a respective bend in the same plane, in particular parallel to the direction of longitudinal extension of the contact element.
- the lamellar base body of the test contact element and thus the above-described areas thereof extend within a plane.
- the test contact element or the lamellar base body is preferably shaped or designed as an integral component.
- the test contact element is preferably made of a conductive material, in particular a metal.
- the meandering elastic region preferably has two bending sections following one another in the direction of extension, each with two consecutive opposing, in particular S-shaped, bending elements.
- the respective successive bending sections are preferably also arranged in opposite directions, in particular in an S-shape, to one another.
- the two bending elements of the Bending sections preferably have two essentially equal bending angles.
- the bending elements of a first, preferably S-shaped, bending section have a respective bending angle of 40 ° to 70 °, more preferably 45 ° to 65 °.
- the bending elements of a second bending section preferably have a respective bending angle of 5 to 25 °, more preferably 5 to 15 °.
- the bending elements of the second bending section can also have a respective bending angle analogous to the first bending section.
- the first bending section is preferably assigned to the first contact area for contacting a contact partner or is arranged following this.
- the second bending section is preferably assigned to the second contact area for contacting a test pin device.
- the elastic region has a total of only two bent sections, which are preferably arranged in opposite directions. These preferably each have only two bending elements, which are preferably arranged in opposite directions.
- the cavity extending in the direction of the elastic region preferably extends through the entire material thickness of the lamellar base body and preferably has an essentially homogeneous width.
- the lamellar base body is divided in the longitudinal direction into two connecting elements, which preferably run parallel, through the cavity. These thus run together with the intermediate cavity preferably parallel in the direction of the elastic region.
- the thickness or material thickness of the lamellar base body of the test contact element is preferably constant.
- the thickness or material thickness of the base body is preferably 0.1 to 0.3 mm.
- the elastic region preferably has a substantially homogeneous total cross-sectional area perpendicular to the direction of extension.
- the total cross-sectional area is understood here to mean the sum of the cross-sectional areas from the connecting elements that run parallel and are separated by the cavity.
- the cross-sectional areas of the first and second contact areas of the lamellar base body preferably also have an essentially homogeneous cross-sectional area, perpendicular to their respective direction of extension.
- the elastic area has a preferably homogeneous overall cross-sectional area in the direction of extension, which is less than 20%, more preferably less than 15%, and particularly preferably less than 10% of the cross-sectional area of an adjoining section of the first and / or second contact area deviates.
- the cross-sectional area of the elastic area preferably has a deviation of less than 20%, more preferably less than 15% and particularly preferably less than 10% of the cross-sectional area of a section of the first and / or second contact area adjoining the elastic area. This enables a particularly optimized signal transmission even in the elastic range.
- a respective width of the first and second contact area in the direction of extension is preferably essentially constant.
- a respective width of the elastic region in the direction of extension is also preferably constant.
- the width in the direction of the elastic Area is preferably greater than the width of the first and / or second contact area.
- the meandering elastic region has at least one connecting bridge at which the cavity extending along the direction of extension is interrupted.
- a connecting bridge is understood to mean a connection, preferably arranged perpendicular to the direction of extension, of the connecting elements extending in the direction of extension.
- the connecting bridge is preferably formed in the base body of the contact element and thus formed integrally with the rest of the contact element.
- the connecting bridge is preferably a short-circuit bridge for shortening the cavity area in the direction of its extension. In this way, a resonance frequency of the contact element that interferes with the signal transmission can be increased and, in particular, shifted above a frequency band to be transmitted.
- the elastic area preferably has only two, more preferably only one, connecting bridge.
- the second contact area has an end section which is at least partially bent with respect to the direction of longitudinal extent and which is designed for at least partially resilient contacting of a contacting section of a circuit board on the test pin device.
- the end section preferably has a reduced cross-sectional area compared to the remaining cross-sectional area of the second contact area.
- the first contact area of the contact element has a distally arranged contacting section for contacting a contact partner.
- This preferably has a flat contact surface at the end.
- the contacting section has preferably a lamellar design analogous to the rest of the first contact area.
- the contacting section can alternatively be V-shaped or U-shaped and thus designed as a tapering contact section.
- the contacting section can also alternatively have a spreading shape, for example an inverted V or U shape.
- the present invention relates to a high-frequency test pin device for releasably contacting a multi-pole contact partner, in particular a board-to-board connector, having an inner housing with a contact section arranged at the end for interacting with the contact partner for testing purposes, and an outer housing in which the inner housing is guided movably at least in sections and relative to it, in particular along a device longitudinal direction, in such a way that the inner housing is arranged securely in position in a first contact-free relative position, and at least partially movable relative to the outer housing, in particular rotatable and / or, in a second relative position contacting a contact partner tiltable, is mounted, the test pin device having at least one circuit board with contacting means for external contacting of the test pin device and a plurality of contact with the circuit board hearted and extending to the contact section of the inner housing has high-frequency test contact elements as described above, and wherein the circuit board and the test contact elements are arranged in the inner housing that they extend substantially in the device
- An extension “essentially in the longitudinal direction of the device” is understood here in particular to mean that the printed circuit board and the test contact elements extend essentially in one direction Extend longitudinal extension or parallel to the longitudinal extension direction. In particular, neither the printed circuit board nor the test contact elements should run significantly deviating from the direction of longitudinal extent or even orthogonally to it.
- An optimized signal transmission in the high-frequency range is achieved by means of the arrangement according to the invention of the printed circuit board and the test contact elements contacted with it.
- an optimized signal transmission can be achieved by means of the alignment according to the invention while minimizing the occurrence of disruptive oscillating circuits or damping.
- the design according to the invention enables the device to be precisely aligned to a contact partner in the first relative position, as well as providing a tolerance for any positional and / or dimensional deviations of the contact partner in the second relative position.
- the first relative position preferably corresponds to an end position of the inner housing in the outer housing, in which the inner housing is pretensioned in the outer housing by means of an energy store, in particular a spring element.
- the second relative position preferably corresponds to a partially sprung state of the inner housing in the outer housing in the longitudinal direction of the device.
- the inner housing and the outer housing are biased against one another into the first relative position, in particular with a spring element.
- the spring element is arranged in particular in such a way that a contact section of the inner housing is pressed away from the outer housing in one direction.
- the spring element which is arranged between the inner and outer housing, is referred to below as the first spring element.
- the outer housing preferably surrounds the inner housing at least in sections completely or circumferentially around an outer diameter of the inner housing.
- the outer housing can have an inner cylinder section in which or through which the inner housing is guided.
- the outer housing preferably has fastening means for arranging the test pin device on a test device. These can in particular be designed in a flange-like manner to the rest of the housing.
- the outer housing can also have an essentially flange-like design, having a preferably central inner cylinder section for guiding and / or leading through the inner housing.
- the at least one circuit board of the device has conductor tracks arranged thereon, in particular for the respective connection of a contact section for contacting an assigned test contact element with the contacting means for external signal transmission to and from the test pin device.
- the conductor tracks arranged on the circuit board preferably extend essentially in the longitudinal direction of the device.
- the conductor tracks preferably have no bending section or a bend or bending element with a bending angle of greater than 70 °, more preferably of greater than 45 °. This enables a further optimized signal transmission by means of the conductor tracks or by means of the circuit board.
- a respective contact section of a conductor track of the circuit board for contacting the test contact element preferably has a cross-sectional area which is matched to a cross-sectional area of the bent end section of the test contact element contacted therewith, such that a resulting total cross-sectional area of the contacted elements deviates by less than 20%, more preferably less than 15%, and further preferably less than 10% from the cross-sectional area of a second contact area of the high-frequency test contact element adjoining the end section.
- the conductor track preferably has a cross-sectional area that is larger than the contact section. This is preferably constant over the further course of the conductor track.
- the contacting means of the circuit board for externally contacting the test pin device are preferably arranged or designed such that a respective conductor connected to it, for example a connecting cable for external contacting of the test pin device, extends essentially in the longitudinal direction of the device.
- the contacting means preferably comprise a connector which is arranged in a longitudinal slot of the printed circuit board, preferably aligned in the longitudinal direction of the device, or a correspondingly arranged soldering point for providing a non-releasable connection with a provided external connector or conductor.
- the test pin device has two opposing, in particular arranged parallel, printed circuit boards which are preferably arranged radially outside of the test contact elements with which they are contacted.
- the circuit boards are aligned in such a way that the conductor tracks arranged thereon are opposite one another, that is to say face one another.
- Such an arrangement of the circuit boards enables, in particular, a spatial separation of the circuit boards and thus a reduction in the mutual influence of signals.
- this alignment enables a further reduction in the bending angle in the associated test contact element.
- the test pin device has two parallel or directly adjacent printed circuit boards, which are preferably arranged essentially centrally in the test pin device, ie along a central axis of the device.
- the conductor tracks of the circuit boards are preferably arranged on two sides facing away from one another.
- a single printed circuit board with printed conductors arranged on opposite sides can also be provided.
- the test pin device preferably has insulating means which are arranged between the individual high-frequency test contact elements.
- the insulating means can be arranged or designed as a carrier unit in the interior of the inner housing.
- the insulating means preferably comprise a plastic body arranged between the test contact elements. This preferably has a plurality of lateral, in particular slot-like, recesses in which the test contact elements run and / or are guided. The recesses are preferably formed parallel to one another in the plastic body.
- two recesses for receiving and / or guiding a test contact element are each aligned adjacent to one another in one plane.
- the respective cutouts are formed from opposite sides of the plastic body, in particular as slot-like cutouts, a test contact element being arranged in each of the two cutouts.
- the two test contact elements arranged in one plane are preferably arranged in opposite directions with regard to their elastic region and are in contact with a respective associated circuit board.
- the plastic body in particular as a coherent solid material, is located between the two recesses arranged in one plane Separation of the adjacent recesses arranged. This preferably extends to the contact section of the test pin device.
- the contact section is preferably designed with multiple poles.
- the individual poles are formed here by the contact elements as described above.
- the contact elements are preferably arranged selectively interchangeably in the device.
- the device can have specifically designed locking means or bearing means for the contact elements.
- the contact section of the test pin device preferably has an oval or polygonal, in particular rectangular, inner and / or circumferential contour.
- the inner and / or circumferential contour is preferably adapted or designed for contacting a so-called “board-to-board” connector or “multi-line” connector.
- the contact section has a centering section which is resiliently mounted in the longitudinal direction of the device and is arranged at the end, in particular with respect to the high-frequency test contact elements.
- the centering section is preferably resiliently mounted relative to the test contact element or the test contact elements by means of associated energy storage means, in particular at least one spring element.
- the spring-loaded centering section enables a further optimized positional alignment of the test pin device when contacting a contact partner for test purposes.
- the inner housing comprises a piston which is arranged movably at the end and is acted upon by spring force, on which the contact section of the test pin device is in turn formed at the end.
- the piston is preferably opposite the rest of the inner housing, which is arranged therein Plastic body and arranged movably with respect to the individual test contact elements and has a central opening or bore for the implementation of the test contact elements and the plastic body or insulating means arranged between them.
- the centering section is preferably formed integrally with the movable piston and on an inner circumferential surface aligned with a contact partner.
- the centering section preferably has an inner contour that tapers radially inwards or towards the test contact elements arranged centrally therein. This can have at least one correspondingly inclined centering bevel. Such an arrangement is preferably designed for reaching around and centering an outer contour of the contact partner.
- the centering section can have an outer contour that is opposite to the aforementioned design and, in particular, enlarges radially outwards or away from the test contact elements centrally located therein, which is designed to engage in a preferably centrally located opening of the contact partner.
- the movable piston is preferably movably mounted on and / or at least partially in the base body of the plastic body of the inner housing and is pretensioned in a direction away from the base body of the inner housing by means of at least one spring element, particularly preferably by means of a plurality of circumferentially distributed spring elements, in particular spring-loaded contact pins.
- the movable piston can be arranged so as to press against an inner shoulder of a piston which surrounds the movable piston and is immovably arranged with respect to the rest of the inner housing. That between the movable piston and the plastic body or the spring element arranged in the rest of the inner housing is referred to below as the second spring element.
- the movable piston can in particular assume an initial first relative position to the test contact elements and the assigned plastic body, in which the respective contact areas of the test contact elements for contacting a contact partner in the end-side contact section or a centering section assigned to it are protected, that is, not against a side view of the device Peripheral or side wall of the contact portion protruding, are arranged.
- This first relative position corresponds to a position not acted upon externally or a position released by the contact partner.
- the movable piston In a second relative position, in particular contacting a contact partner, the movable piston is arranged indented in the direction of the base body of the inner housing, preferably in such a way that the respective contact areas for contacting the contact partner protrude further out of the contact section and in the direction of a contact partner compared to the first relative position .
- the insulating means or the plastic body of the device are designed in two parts.
- the plastic body preferably has a guide element which is assigned to the contact section of the device and which is movable with respect to a rearwardly arranged base body of the plastic body.
- the guide element is preferably arranged at least partially guided in the plastic base body, with an associated energy storage means, in particular at least one spring element, more preferably a compression spring element, being arranged between the base body and the guide element, which prestresses the guide element in the direction of the contact section or a contact partner to be contacted.
- the spring element between the plastic base body and the guide element of the plastic body is referred to below as the third spring element.
- the guide element is preferably pretensioned against a delimitation element contacting it, preferably against a pin or dowel pin arranged essentially orthogonally to the direction of movement of the guide element.
- This is preferably arranged in a fixed position in the inner housing and can be arranged in a recess or bore of the guide element that runs essentially orthogonally to the direction of movement of the guide element.
- a side wall of the delimitation element can serve as a stop surface for an inner wall of the recess or bore.
- a maximum stroke of the guide element can also be defined by the delimitation element, in particular by means of interaction with the aforementioned recess or bore.
- an opposite side wall of the delimiting element can serve as a stop surface for an opposite inner wall of the recess or bore.
- the guide element is preferably arranged to be movable with respect to the individual test contact elements.
- the guide element can in particular assume a first relative position to the test contact elements, in which the respective contact areas of the test contact elements for contacting a contact partner are protected within openings formed at the end in the guide element, ie not protruding in the side view of the device, or preferably only partially protruding.
- This first relative position preferably corresponds to a position not acted upon by an external force or a position released by the contact partner.
- the respective contact areas are in a second relative position, in particular in contacting a contact partner for contacting the contact partner at least partially protrude from the respective openings in the guide element or at least protrude further from the associated openings with respect to the first relative position. In the second relative position, the guide element is subjected to an external force against the pretensioning force and towards the base body by a contact partner.
- the end openings for the contact areas of the test contact elements are preferably formed integrally with the respective laterally arranged, slot-like recesses of the plastic body for supporting and / or guiding the individual contact elements.
- the individual test contact elements can move independently of the guide element in the respective associated recesses of the plastic body, in particular in the respective recesses of the guide element of the base body. This arrangement enables a further improved tolerance compensation when making contact with the individual contacts of a contact partner.
- the guide element is designed or arranged opposite the test contact elements such that when a contact partner is contacted, the guide element is first moved from its initial first relative position in the direction of the second or spring-loaded relative position and the contact partner is contacted during the further movement of the guide element the contact areas of the test contact elements takes place. During a continued, further stroke movement of the device in the direction of the contact partner, a simultaneous or parallel deflection of the guide element and the test contact elements takes place.
- the guide element preferably has a distal centering section which is arranged on an end section of the guide element assigned to the contact partner to be contacted.
- the centering section advantageously has a projection or projection which is preferably aligned centrally in the contact section of the device
- the centering section can have an end face which is arranged essentially orthogonally to the longitudinal direction of the device.
- the end face forms openings at the end of the lateral, in particular slot-like, recesses for mounting and / or guiding the test contact elements, from which the distal contact areas of the test contact elements protrude or are retracted depending on the position relative to the guide element.
- the centering section can have a plurality of elevations or recesses, which are each arranged adjacent to the openings of the cutouts on the contact section side for guiding the test contact elements.
- the movable piston of the inner housing can be connected to shortened contact elements as a function of position.
- the shortened contact elements are provided in addition to the plurality of high-frequency test contact elements contacted with the printed circuit board and extending to the contact section of the inner housing and arranged in such a way that they can be connected to the movable piston in a signal-conducting manner depending on the position.
- the shortened contact elements are arranged parallel to the remaining test contact elements and have a shortened first contact area compared to the remaining test contact elements on. Otherwise, the shortened contact elements essentially have a structure corresponding to the test contact elements already described above.
- the shortened contact elements are here preferably also contacted with the circuit board, analogous to the test contact elements according to the invention.
- the movable piston is made of conductive material and is designed for contacting, in particular, a ground contact of the contact partner.
- the movable piston has a rear and preferably ring-shaped or step-shaped contact shoulder, which contacts the shortened contact elements when the movable piston is deflected from its initial first relative position to a second relative position.
- the shortened contact elements are advantageously each arranged in a radially outer position relative to the remaining test contact elements. In particular, the shortened contact elements are arranged at four outer edge positions relative to the remaining contact elements.
- the movable piston When contacting a contact partner, the movable piston initially compresses against the spring force of the assigned second spring element or the advantageously provided circumferentially distributed (second) spring elements. After the piston has covered a predefined working stroke, the piston makes contact with its rear contact shoulder with the shortened contact elements, which are thus connected in a signal-conducting manner to the contact partner, in particular to a ground contact of the contact partner, by means of the piston.
- the shortened contact elements represent an additional spring force application in the device longitudinal direction on the piston due to their inherent spring action due to their elastic area Spring force of the shortened contact elements and, on the other hand, moved back into its initial first relative position by the spring force of the associated second spring element or the advantageously provided circumferentially distributed (second) spring elements.
- the first spring element which is arranged between the inner and outer housing, has a higher spring force than the second spring element, which is arranged between the movable piston and the main body of the inner housing or the plastic main body.
- the second spring element and thus the movable piston are first deflected in relation to the plastic base body and only when further or higher force is applied is the first spring element and thus the inner housing deflected in relation to the outer housing.
- the first spring element also has a higher spring force than the third spring element which is arranged between the plastic base body and the guide element. In a further preferred embodiment, the first spring element has a higher spring force than the sum of the spring forces of the second and third spring elements.
- the second spring element can have a higher spring force than the third spring element, which is arranged between the plastic base body and the guide element.
- the spring force of the second and third spring elements can also be approximately the same.
- the second and third spring elements preferably each have a lower spring force than the first spring element.
- the spring force of the third spring element can also be greater than that of the second spring element.
- the spring force of the first spring element is preferably 4 to 18N, more preferably 4 to 8N, further preferably 5.5 to 6.5N.
- the spring force of the second spring element is preferably 2 to 7N, more preferably 2.5 to 4.5N, further preferably about 2.5 to 3N.
- the spring force of the second spring element is preferably composed of a plurality of spring forces from (second) spring elements arranged in parallel.
- the second spring element advantageously comprises four circumferentially distributed spring elements, the aforementioned spring force representing the resulting spring force of the four spring elements.
- the spring force of the third spring element is preferably 0.1 to 2N, more preferably 0.3 to 1.2N, more preferably 0.5 to 0.8N.
- the spring force of the floch frequency test contact elements according to the invention and the shortened test contact elements in the longitudinal direction of the test contact elements is preferably 0.1 to 0.5N, more preferably 0.15 to 0.3N, further preferably 0.18 to 0.25N.
- the present invention relates to a test contact attachment for a test pin device as described above, having a first housing section running in the longitudinal direction, preferably with connecting means for selective connection to the test pin device, and a second housing section protruding from the end, the second housing section being a particularly in Has a longitudinal recess for receiving an end section of the test pin device and a contact section arranged radially outside the recess for releasably contacting a contact partner, and wherein the contact section is at least partially resilient in the longitudinal direction relative to the second housing section.
- the contact attachment according to the invention enables the test pin device according to the invention to be selectively expanded and adapted with regard to the contact partners to be tested.
- the contact attachment allows in particular additional test partners, which are arranged, for example, directly next to the contact partners to be tested by the test pin device, to be checked or tested simultaneously with the test pin device in the simplest manner.
- the contact attachment preferably has a cohesive housing.
- the first and second housing sections are preferably designed or arranged essentially L-shaped in a side view.
- the connecting means arranged in the first housing section can for example have a screw connection by means of which the test contact attachment can be selectively connected to the test pin device.
- the connecting means can alternatively be clamping or latching means have for selective cooperation with the test pin device or a suitable receiving means arranged thereon.
- the first housing section is preferably plate-shaped or slightly curved perpendicular to the longitudinal direction.
- the first housing section is preferably thin-walled. This is in particular in order to keep the lateral extension of the test contact attachment relatively small in the connected state with the test pin device.
- a width of the first housing section, i.e. an extension orthogonal to the longitudinal direction, is preferably less than 6 mm, more preferably less than 4 mm.
- the first housing section preferably has contacting means for external contact with the test contact attachment.
- the contacting means are preferably arranged on a housing area opposite the end of the contact section for releasably contacting the test partner.
- Contacting means can in particular comprise at least one plug connector which is used for selective contacting of the test contact attachment.
- conductors running in the housing can also be led out of the first housing section directly at the end.
- a respective contacting means, in particular a plug connection, can for example also be provided at the end of the conductor and outside the housing.
- the recess in the second housing section is preferably cylindrical or rectangular in shape.
- the recess is furthermore preferably adapted to an outer contour of an end section of the test pin device.
- the contact section of the test contact attachment is preferably multi-pole.
- the individual poles are preferably formed in series in the contact section. However, the poles can also be arranged in any other arrangement.
- the contact section has at least one electrical conductor which is at least partially resiliently mounted in a receptacle, preferably running parallel to the recess, in the second housing section, in particular a bore.
- the resilient mounting of the electrical conductor can be made possible by means of an at least partially curved guide of the conductor in the housing of the test contact attachment and / or by providing additional energy storage devices, in particular by spring means acting on the conductor.
- the contact section has at least one contact pin, preferably spring-loaded on both sides, which is arranged in a receptacle which is preferably arranged parallel to the recess, in particular is supported in a positionally secure manner.
- the contact pin can for example be fitted into the corresponding receptacle.
- 1a, 1b show a high-frequency test contact element according to a preferred embodiment of the invention in side view and perspective side view; 2a shows an alternative preferred embodiment of the high-frequency test contact element according to the invention; 2b shows an alternative embodiment of a distally arranged contacting section of the
- FIG. 3 shows a preferred embodiment of the high-frequency test pin device in a perspective side view
- Fig. 4 is an exploded view of the high frequency test pin device of Fig. 3; Fig. 5a, 5b a partially sectioned side view of the
- FIGS. 3 and 4 show a side sectional view of the high-frequency test pin device according to FIGS. 3 and 4;
- FIG. 9 is a perspective side sectional view of FIG.
- High-frequency test pin device according to FIG. 8; 10a shows a perspective side view of a preferred embodiment of the high-frequency test pin device with test contact elements according to FIG. 1a, with some components omitted to improve the overview;
- FIG. 10b is a perspective side view of an alternative preferred embodiment of FIG.
- FIG. 10c shows a detailed view of a printed circuit board of the embodiment according to FIG. 10a;
- 11a-c are side sectional views of a further preferred embodiment of the high-frequency test pin device.
- FIGS. 11 a-c show a perspective side view of the insulating means with test contact elements guided therein and a perspective partial sectional view of the high-frequency test pin device according to FIGS. 11 a-c;
- 17a-c are perspective views of a preferred embodiment
- test contact element 10 has an essentially lamellar base body 10a with a preferably homogeneous thickness or material thickness t.
- the test contact element 10 is an integral, ie cohesive, component, preferably as a punched, Etching or electroforming manufactured component, formed and extending along a longitudinal extension direction L.
- the test contact element or its base body 10a has an end, first contact area 1 for contacting a contact partner 30 (see e.g. For example, FIG. 3) and an intermediate meandering elastic region 3.
- the first and second contact areas 1 and 2 preferably extend essentially in the longitudinal direction L and have a preferably homogeneous width b1, b2 in a side view.
- the width b1, b2 of the first and second contact areas 1 and 2 is preferably the same size and can in particular be between 0.25 and 0.45 mm.
- the meandering area 3 between the first and second contact areas 1, 2 has a meandering direction V, which meanders along the longitudinal direction L.
- the area 3 has a cavity 5 which is preferably formed centrally therein and extends in the direction V. This divides the base body 10a in the region 3 into two connecting elements 4a, 4b, which are preferably uniformly designed and run in parallel.
- the resulting total thickness b3 is preferably greater than the widths b1, b2 of the first and second contact sections 1, 2 and is preferably between 0.35 and 0.65 mm.
- the meandering configuration with cavity 5 provides an elasticity of the area 3, in particular along the direction of longitudinal extent L of the test contact element 10.
- the meandering elastic region 3 has a plurality of bending elements 8a, 8b, 8c, 8d of the consecutive in the direction V Base body 10a with a respective bending angle ai, 02, ßi, ß2.
- the respective bending angle is preferably within a range from 5 to 70 °.
- the meandering elastic region 3 does not have a bending angle greater than 70 °.
- the direction V of the meandering region 3 is preferably in one plane. This means that the bending elements 8a, 8b, 8c, 8d all extend in the same plane.
- the meandering elastic region 3 has in particular two bending sections 6a, 6b, preferably directly following one another in the course direction V, i.e. arranged one behind the other. These are in opposite directions, in particular S-shaped, curved or arranged in the course.
- Each of the two bending sections has two bending elements 8a, 8b, 8c, 8d, preferably with the same bending angles ai and 02, as well as ßi and ß2.
- the bending elements 8a, 8b of the first bending section 6a have a respective bending angle of 40 ° to 70 °, preferably 45 ° to 65 °.
- the bending elements 8c, 8d of the second bending section 6b have a respective bending angle of 5 to 25 °, preferably 5 to 15 °.
- the first contact region 1 has a contact section 1 a, which is used to contact a contact partner 30. This can have a planar contact surface orthogonal to the remaining extent of the contact area 1.
- the second contact area 2 has a curved end section 2a opposite the contact area 1 or its distal contacting section 1a, which is designed to contact a contact section 18 on the test pin device 20 (cf. FIG. 10c). Arranged adjacent to this, the second contact area 2 has a laterally protruding nose 2b, which is used for fastening and in particular tensioning of the test contact element is formed in a receptacle of the test pin device.
- the elastic region 3 has a connecting bridge 7 at which the cavity extending along the direction V is interrupted.
- the geometry of the base body in the direction V from the first contact area 1 via the elastic area 3 to the second contact area 2 is preferably designed such that a respective cross-sectional area F1, F2, F3 remains essentially constant. In the present case, this is understood to mean that the cross-sectional area deviates by less than 20%, preferably less than 15% and particularly preferably less than 10% from the remaining cross-sectional area.
- the elastic region 3 has a total cross-sectional area F3, ie the sum of the cross-sectional areas of the first and second connecting elements 4a, 4b, which run parallel thereto, which is less than 20%, more preferably less than 15%, further preferably less than 10% of the Cross-sectional area FI, F2 of a respectively adjoining section of the first and / or second contact area 1, 2 differs.
- the second contact area 2 can also have a cavity 5.
- the respective geometric shape is selected in such a way that a respective total cross-sectional area in area 2 does not deviate significantly from the remaining cross-sectional area of the test contact element.
- the test contact element 10 can also have a connecting bridge 7 of the cavity 5.
- the contacting section 1a can have an at least partially protruding V-shaped contact tip.
- the contacting section 1a can have a spreading shape, for example an inverted V or U shape.
- the test pin device 20 has an inner housing 11 with a contact section 12 arranged at the end for interacting and, in particular, contacting the contact partner 30 for testing purposes, as well as an outer housing 13.
- the outer housing 13 preferably has a flange 13a, in particular protruding from a central housing section, with assembly and / or connection means 13b formed therein.
- the outer housing 13 can thereby be mounted on a fastening device such as, for example, a fastening grid of a movable test unit.
- the inner housing 11 On the rear side of the device 20, at an end-side section opposite the contact section 12, the inner housing 11 has a Connection section 9, which is used for coupling and / or decoupling electrical signals, in particular by means of electrical conductors or cables 17a, 17b, and is connected to the contact section 12.
- the inner housing 11 is at least partially supported and guided in the outer housing 13.
- the inner housing 11 is guided in the outer housing 13 so as to be movable essentially along a device longitudinal direction L1.
- An energy store 21, preferably a first spring element, arranged between the inner and outer housing 11, 13, provides a pretensioning force which the device in the contact-free end position or first relative position between inner and outer housing 11 shown in FIGS. 3 and 5a , 13 holds.
- 5b shows a second relative position of the inner and outer housings 11, 13, in which the inner housing 11 is mounted so as to be movable, in particular rotatable, tiltable and / or laterally displaceable relative to the outer housing 13, whereby when contacting a test contact or Contact partner 30 preferably several degrees of freedom for moving the inner housing 11 are provided and thus an effective tolerance compensation between contact section 12 of the inner housing 11 and contact partner 30 is made possible.
- the device 20 furthermore has at least one, preferably two circuit boards 14a, 14b and a plurality of high-frequency test contact elements 10 which are in contact with the circuit boards and extend to the contact section 12, as described above.
- the circuit boards are arranged on a carrier unit, in particular an insulating means 19, for example a plastic body, in the inner housing 11.
- the circuit boards 14a, 14b can, for example, with provided fastening or assembly means,
- a screw connection 22a, 22b can be attached to the carrier unit 19.
- the contact section 12 can have a centering section 12a which is resiliently mounted relative to the rest of the inner housing and in particular relative to the high-frequency test contact elements 10 and is arranged at the end.
- This can be mounted on the carrier unit or on the insulating means 19 by means of associated energy storage means 23, in particular a second spring element, for example comprising a plurality of spring elements 23, which are preferably distributed around the circumference.
- the contact section 12 and the centering section 12a assigned to it are preferably formed in a movable piston 27 of the inner housing 11, in particular arranged at the end and aligned with a contact partner 30 to be contacted.
- the piston 27 is arranged at the end on the inner housing 11 and is acted upon by spring force by the second spring element 23.
- the movable piston 27 is pretensioned in a direction away from the base body 11a of the inner housing 11, preferably a hollow cylindrical base body.
- the movable piston 27 can be arranged so as to press against an inner shoulder 34a of a piston 34 which surrounds the movable piston 27 and is immovably arranged with respect to the rest of the inner housing.
- the inner housing 11 preferably comprises a plurality of individual parts 11a-11e, in particular mountable. These can preferably be screwed into a unit in the device longitudinal direction L1.
- the inner housing 11 has an outer contour which interacts with an inner contour of the outer housing 13 as a function of position.
- the inner housing 11 has a bearing axis section 24 with a varying outer contour and axially extending between the contact section 12 and the other end. This is at least partially received or guided in a guide recess 25 of the outer housing 13 that extends along the device longitudinal direction L.
- the bearing axis section 24 here has at least one preferably essentially conical projection 24a, which is mounted in a complementary recess 25a of the guide recess 25 in the first relative position.
- projection 24a and recess 25a preferably have a non-rotationally symmetrical shape in the circumferential direction.
- the projection 24a can be designed to be rectangular in plan view (cf. FIG. 4).
- Inner housing 11 and outer housing 13 are pretensioned against one another and axially pushed apart by the action of the first spring element 21, in particular a spiral spring, the spiral spring 21 on one end on a first annular shoulder 26a of the inner housing 11 and on the other end on a second annular shoulder 26b of the opposite along the device longitudinal direction L1
- Outer housing 13 attacks and inner housing 1 and outer housing 2 drives apart.
- a maximum stroke movement of the inner housing 11 in the outer housing 13 is limited by a centering section 24b of the bearing axis section 24 of the inner housing 11 arranged on the shell side, which engages in an end-side widening of the outer housing 25b or rests against it at maximum stroke.
- the projection 24a and the associated recess 25a are spaced from one another.
- the bearing axis section 24 has a smaller outer diameter than the assigned guide recess 25 of the outer housing 13, so that in this second position rotation, tilting and / or offset within predefined limits of the inner housing 11 in the outer housing 13 is now possible.
- FIG. 6c shows a sectional view in a plane that is radially offset from FIG.
- the second spring elements 23 preferably comprise spring-loaded contact pins which are arranged parallel to the longitudinal direction L1 of the device 20.
- 7a shows the contact section 12 with the centering section 12a arranged at the end.
- the latter is resiliently mounted in particular with respect to the test contact elements 10 protruding into the centering section 12a. This is preferably achieved by the arrangement of the contact section 12 in or at the end of the movable piston 27 which is acted upon by spring force.
- the centering section has an inner contour that tapers towards the test contact elements, preferably with centering bevels 12b arranged around the circumference.
- 7b shows the contact section 12 when it comes into contact with a contact partner 30. This is caused by the centering section 12a with the circumferential centering bevels 12b when the contact section 12 and Contact partner 30 centered and thus brought up to contact section 12 in a secure manner.
- test pin device 8a-d show a side sectional view of a preferred embodiment of the high-frequency test pin device 20 with test contact elements 10 arranged therein and associated detailed views B, C, D. 9 shows an associated perspective sectional view of the test pin device.
- the device 20 preferably has two spaced apart and opposite printed circuit boards 14a, 14b. These are arranged laterally in the device longitudinal direction L1 on the centrally arranged carrier unit 19.
- 8b shows the basic arrangement of the test contact elements 10, which extend from a respective end of the printed circuit boards 14a, 14b at which they are contacted to the opposite contact area 12 of the device.
- the contact elements 10 are preferably arranged on both sides of the centrally arranged carrier unit 19.
- the respective contact elements 10 run in respective recesses 19a of the carrier element or the carrier unit 19 (cf. also FIG. 9).
- the recesses 19a are designed in such a way that the contact elements 10 can be deflected in the device longitudinal direction L1 or longitudinal extension direction L of the test contact element 10.
- test contact element 10 shows a detailed view of the mounting of the test contact element 10 on the circuit board 14a.
- the test contact element 10 rests with the bent end section 2a on the circuit board 14a and makes contact with a respective conductor track 15a of the circuit board 14a via a contacting section 18 assigned to it (cf. FIG. 10c).
- a laterally protruding nose 2b of the test contact element 10 engages Latching purposes in a recess 19b provided for this purpose in the carrier unit 19.
- an opposite end of the test contact element 10, in particular its first contact area 1 at least partially rests on a guide section 12c of the inner housing 11 or the movable piston 27 or is linearly guided along this in the device longitudinal direction L1.
- FIG. 10a, 10b show alternative embodiments of the high-frequency test pin device 20 with test contact elements 10 according to the invention, omitting the outer housing 13 and the outer components of the inner housing 11 to improve the overview.
- FIG. 10c shows an associated detailed view of a printed circuit board 14a of FIG. 10a.
- a plurality of high-frequency test contact elements 10 are in each case contacted with the circuit board 14a, 14b.
- the test contact elements 10 and the printed circuit boards 14a, 14b are arranged in the inner housing 11 in such a way that they extend essentially in the device longitudinal direction L1 or parallel thereto.
- a longitudinal extension direction L (cf. FIG. 1 a) of the respective test contact elements 10 runs in particular parallel to the device longitudinal direction L1. This essentially linear alignment enables an optimized signal transmission from the contact partner 30 to the signal tap on the connection section 9 arranged at the rear of the device.
- the circuit boards 14a, 14b each have conductor tracks 15a, 15b arranged thereon, which are designed to connect a contacting section 18 for contacting an assigned test contact element 10 with a respective connection section 9.
- the one on the circuit board arranged conductor tracks 15a, 15b preferably also extend essentially in the device longitudinal direction L1 or parallel thereto.
- the conductor tracks 15a, 15b preferably have in
- a connection section 9 of the circuit board for external contacting of the test pin device is preferably arranged or designed such that a respective conductor 17a, 17b connected to it extends essentially in the device longitudinal direction L1 from the circuit board 14a, 14b.
- the connection section 9 preferably comprises contacting means 9a, for example a soldering contact point for soldering to a provided external connector or conductor 9b and thus for providing a non-detachable connection.
- the connector or conductor 9b can be arranged at least partially in a longitudinal slot 16 of the circuit board, which preferably extends in the device longitudinal direction L1.
- the contacting means 9b can also have a plug connector (not shown), which preferably extends in the device longitudinal direction L1, for contacting by an associated external plug connector 9b, which is arranged in a longitudinal slot 16 of the circuit board 14a, 14b.
- the connection section 9 can have a plug connector 9a, which is preferably arranged at the end on a surface of the conductor track (cf. FIG. 10b).
- the test pin device 20 has two opposing, in particular parallel arranged, printed circuit boards 14a, 14b which are arranged radially outside the test contact elements 10 with which they are contacted.
- the circuit boards 14a, 14b are in this case aligned in such a way that the conductor tracks 15a, 15b arranged thereon are opposite one another, that is to say face one another.
- the test pin device 20 has two parallel or directly adjacent printed circuit boards 14a, 14b, which are preferably arranged essentially centrally in the test pin device, i.e. along a central axis of the device.
- the conductor tracks 15a, 15b of the circuit boards 14a, 14b are preferably arranged on two sides facing away from one another.
- the test contact elements 10 contacted thereby are arranged radially outside of the circuit boards 14a, 14b with respect to the device 20.
- the test contact elements 10 contact a respective contacting section 18 of a respective associated conductor track 15a.
- the contacting section 18 preferably has a cross-sectional area perpendicular to a running direction of the conductor track or of the contacting section 18, which is matched to a cross-sectional area of the bent end section 2a of the test contact element 10 contacted therewith, such that a resulting total cross-sectional area of the contacted elements is less than 20%, more preferably less than 15%, and furthermore preferably less than 10%, deviates from the cross-sectional area of a second contact region 2 of the high-frequency test contact element 10 adjoining the end section 2a.
- the conductor track preferably has a cross-sectional area that is larger than the contact section. Over the further course, the conductor track preferably has an essentially constant cross-sectional area.
- 11 ac show side sectional views of a further preferred embodiment of the high-frequency test pin device 10. The illustration in FIG. 11c is here cut in a plane orthogonal to the sectional plane of the illustration in FIG. 11b.
- the carrier unit or the insulating means 19 is designed in two parts.
- the carrier unit has a base body 19c, which is firmly positioned in the inner housing as an immovable unit and on which the printed circuit boards 14a, b are arranged, as well as a guide element 19d that is relatively movable thereto.
- Lateral recesses 19a, arranged in the carrier unit, for mounting and guiding the individual test contact elements 10 are designed to be conformal both in the base body 19c and in the guide element 19d.
- two lateral recesses 19a are preferably located opposite one another in a plane, with solid material of the carrier unit or the insulating means 19 being arranged in between.
- a force storage means in particular a third spring element 19e, is arranged between the base body 19c and the guide element 19d.
- the third spring element 19e is designed as a compression spring and provides a pretensioning force on the guide element 19d in the direction of the contact section or a contact partner to be contacted.
- the guide element 19d is preloaded against a pin or dowel pin 28 which is arranged essentially orthogonally to the direction of movement of the guide element and which is preferably arranged in a fixed position in the inner housing 11 and is arranged in a bore 19e of the guide element 19d that runs essentially orthogonally to the direction of movement of the guide element.
- a side or jacket surface of the dowel pin 28 serves as a stop surface for an inner wall of the bore 19e.
- a maximum stroke of the guide element 19d can also be limited by the interaction of the dowel pin 28 with an opposite inner wall of the bore 19e.
- the respective contacting sections 1a of the test contact elements 10 for contacting a contact partner 30 are preferably arranged at least partially protected within openings 29 formed at the ends in the guide element 19d, i.e. not completely protruding in the side view of the device.
- the contacting sections 1a of the test contact elements 10 In a second relative position of the guide element 19d, it is moved against the biasing force of the third spring element 19e in the direction of the base body 19c, the contacting sections 1a of the test contact elements 10 preferably protruding further in the associated openings 29 than in the first relative position.
- the aforementioned end openings 29 for the contact areas 1a of the test contact elements 10 are preferably formed integrally with the respective laterally arranged, slot-like recesses 19a of the carrier unit 19 for mounting and / or guiding the individual contact elements 10 or form the end sections of the recesses 19a (cf. 12a, 12b).
- the guide element 19d preferably comprises at least one distal centering section 31, which is arranged on an end section of the guide element 19d assigned to the contact partner 30 to be contacted.
- the centering section 31 advantageously has at least one projection or recess which is preferably aligned centrally in the contact section 12 of the device 20 and which is designed to engage in a respective central recess or projection in the contact partner 30 to be contacted when the contact partner is contacted.
- the centering section 31 can comprise a frontally and centrally arranged recess.
- the centering section 31 also has a plurality of projections 31a, which are formed laterally to the centrally arranged recess and the partially protruding contacting sections 1a of the contact element 10 at least partially surrounding them.
- the embodiment preferably has shortened contact elements 32, which are contacted analogously to the high-frequency test contact elements 10 with the circuit board 14a, b.
- the contact elements 32 are advantageously each arranged in a radially outer position relative to the remaining high-frequency test contact elements 10.
- the shortened contact elements 32 are arranged at four outer edge positions relative to the remaining test contact elements 10.
- the shortened contact elements 32 are designed for position-dependent interaction with the movable piston 27, in particular such that there is no contact between the contact elements 32 and the piston 27 in a first relative position of the piston 27 and the contact elements 32 in a second relative position of the piston 27 that is subjected to force contact this and thus a signal tap via the piston 27, in particular a ground contact, is possible.
- the position-dependent contact is made here via a preferably ring-shaped or step-shaped contact shoulder 33 of the piston 27 (cf. .
- 13a-c show lateral partial sectional views of the movable piston 27 of the test pin device 20 according to FIGS. 11a-c when contacting a contact partner 30 and the position-dependent interaction of the movable piston 27 with the shortened contact elements 32.
- a relative movement between the movable piston 27 and the inner and / or outer housing 11, 13 preferably does not yet take place.
- the resulting positioning is also shown in FIG. 14a and the associated detailed view in FIG. 15a shown.
- the contact partner 30 is offset to a greater extent relative to the piston 27, the movable piston 27 can already partially be deflected against the spring force of the second spring element 23 with respect to the rest of the inner housing 11a.
- the movable piston 27 With continued application of force to the device 20 towards the contact partner 30, as shown in FIG. 13b, the movable piston 27 is deflected relative to the rest of the inner housing 11 against the spring force of the second spring element or the circumferentially distributed second spring elements 23 of the piston 27, the piston makes contact with its rear contact shoulder 33 with the shortened contact elements 32, which are thus connected in a signal-conducting manner to the contact partner 30, in particular to a ground contact of the contact partner, by means of the piston 27.
- the shortened contact elements 32 represent an additional spring force application in the device longitudinal direction L1 on the piston 27 due to their inherent spring action through their elastic region 3
- a further centering or optimization of the alignment of the contact partner 30 with respect to the device 20 can be achieved by means of the centering section 31 of the guide element 19d.
- the resulting positioning is also shown in Figure 14b.
- the first spring element 21, which is arranged between the inner and outer housing 11, 13 has a higher spring force than the second spring element 23 or the sum of the spring forces of the second spring elements 23, which are arranged between the movable piston 27 and the base body 11a of the inner housing 11 or the carrier unit base body 19c.
- the second spring element (s) 23, and thus the movable piston 27, is preferably initially deflected in relation to the carrier unit base body 19c and only when further or higher force is applied is the first spring element 21 and thus the inner housing 11 deflected in relation to the outer housing 13th
- a contact of an alternative contact partner 30 with a further preferred embodiment of the device 20 according to the invention is shown analogously to the above statements with regard to Figs. 13a-13c and Figs. 14a, b. This essentially corresponds to the device described above, the distinguishing features being discussed below.
- the movable piston 27 of this embodiment has, radially inside the centering section 12b, a contacting projection 27a which tapers in the direction of the contact partner 30 with regard to its outer contour. This is designed to engage in a respectively provided opening or recess 30a of the contact partner 30 and preferably has at least two oppositely arranged bevels, which are preferably formed in opposite directions to a bevel of the centering section 12b arranged adjacent thereto and radially outside.
- the centering section 12b can be used as a separate component and in particular as an attachment element 27b at a distal end of the movable piston 27 be formed.
- the centering section 27a is preferably formed integrally with the rest of the piston 27 and is preferably used to establish ground contact with the contact partner 30, in particular via the position-dependent interaction of the piston 27 and the shortened contact elements 32, as already described with reference to FIGS. 13a-c.
- the guide element 19d has a distal centering section 31 which, in contrast to the embodiment described above, is designed as a central projection arranged at the end and which, when making contact, enters a central opening or recess 30b of the contact partner 30 intervenes.
- the opposite side surfaces of the projection 31 are here designed to taper towards the contact partner 30 and enable optimized guidance during contacting.
- the contacting section 1a of the respective contact element 10 is designed as an inverted U-shape in this embodiment.
- contact elements 30c of the contact partner 30 protruding in the direction of the device 20 can be contacted in an optimized manner. Due to the inverted U-shaped design, the individual contact elements 30c are particularly better captured during the contacting process.
- FIGS. 18a, 18b show associated
- the test contact top 40 has a housing which is essentially L-shaped in side view, with a first housing section 41 and a second housing section 42 connected to it and extending away from the first housing section 41.
- the first housing section is preferably plate-shaped and / or thin-walled and extends along it a longitudinal direction L2 of the attachment 40.
- the second housing section 42 preferably extends essentially orthogonally to the longitudinal direction L2 and has a recess 43 running in the longitudinal direction L2 for receiving an end section 12 of the test pin device 20.
- An inner contour of the recess 43 is here preferably adapted to an outer contour of the contact section 12 of the device 20 to be received.
- the test contact attachment 40 can thus be slipped over the end-side contact section 12 of the test pin device 20 and selectively fixed to the test pin device 20 by means of connecting means 48 arranged in the first housing section 41 (cf. FIG. 17c).
- the second housing section 42 has a contact section 44 for releasably contacting a contact partner (not shown).
- the contact section 44 preferably protrudes from an end-side, planar surface 46 of the second housing section 42 that extends orthogonally to the longitudinal direction L2 and is at least partially resilient in the longitudinal direction L2.
- the contact section 44 can include at least one electrical conductor 45a, which is resiliently mounted and / or guided in a receptacle 45b of the second housing section 42 that preferably runs parallel to the recess 43. An axial elasticity of the conductor 45a is achieved in the embodiment according to FIG.
- the electrical conductor 45a preferably extends through the entire housing 41, 42 and is connected on an opposite side of the housing to contacting means 47 for external contacting of the test contact attachment 40.
- the contacting means 47 can be used, for example, as a plug connection for external contacting of the
- Contact portion 44 may be formed with an external conductor 49.
- the axial elasticity of the contact section 44 is achieved by a contact pin 45a 'which is preferably spring-loaded on both sides and which is in an associated
- the contact pin 45a can be in contact with a conductor arranged in the second housing section 42 or a circuit board 50. This can be connected to an external conductor 49 by means of contacting means 47 provided.
- the contact attachment according to the invention enables the test pin device according to the invention to be selectively expanded and adapted with regard to the contact partners to be tested.
- additional test partners which are arranged, for example, directly next to the contact partners to be tested by the test pin device, can be checked or tested in the simplest manner at the same time as the test pin device.
- test pin device 21 first spring element
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Abstract
Description
Claims
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
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KR1020227027636A KR20220134567A (ko) | 2020-01-30 | 2020-08-26 | 고주파 테스트 접속 요소 및 테스트 핀 장치 |
CN202080095160.2A CN115485568A (zh) | 2020-01-30 | 2020-08-26 | 高频测试接触元件和测试探针设备 |
JP2022546384A JP2023514814A (ja) | 2020-01-30 | 2020-08-26 | 高周波試験接触部材及び試験ピン装置 |
DE112020006635.5T DE112020006635A5 (de) | 2020-01-30 | 2020-08-26 | Hochfrequenz-Prüfkontaktelement und Prüfstiftvorrichtung |
Applications Claiming Priority (2)
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DE102020102302.2A DE102020102302A1 (de) | 2020-01-30 | 2020-01-30 | Hochfrequenz-Prüfkontaktelement und Prüfstiftvorrichtung |
DE102020102302.2 | 2020-01-30 |
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WO2021151524A1 true WO2021151524A1 (de) | 2021-08-05 |
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JP (1) | JP2023514814A (de) |
KR (1) | KR20220134567A (de) |
CN (1) | CN115485568A (de) |
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WO (1) | WO2021151524A1 (de) |
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US11519937B2 (en) * | 2017-06-06 | 2022-12-06 | Feinmetall Gmbh | Contact element system with at least two contact elements having different cross-sectional areas, differently shaped strips in an intermediate region, and a same bending rigidity |
TWI805298B (zh) * | 2022-03-31 | 2023-06-11 | 中華精測科技股份有限公司 | 多針形垂直式探針卡 |
DE102022106991A1 (de) | 2022-03-24 | 2023-09-28 | Ingun Prüfmittelbau Gmbh | Hochfrequenz-Prüfstiftvorrichtung |
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WO2019138505A1 (ja) | 2018-01-11 | 2019-07-18 | オムロン株式会社 | プローブピン、検査治具、検査ユニットおよび検査装置 |
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2020
- 2020-01-30 DE DE102020102302.2A patent/DE102020102302A1/de not_active Withdrawn
- 2020-08-26 WO PCT/EP2020/073901 patent/WO2021151524A1/de active Application Filing
- 2020-08-26 CN CN202080095160.2A patent/CN115485568A/zh active Pending
- 2020-08-26 KR KR1020227027636A patent/KR20220134567A/ko active Search and Examination
- 2020-08-26 DE DE112020006635.5T patent/DE112020006635A5/de active Pending
- 2020-08-26 JP JP2022546384A patent/JP2023514814A/ja active Pending
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EP2117081A1 (de) * | 2008-05-09 | 2009-11-11 | Feinmetall GmbH | Elektrisches Kontaktelement zum Berührungskontaktieren von elektrischen Prüflingen sowie entsprechende Kontaktieranordnung |
EP2144338A1 (de) * | 2008-07-11 | 2010-01-13 | Tyco Electronics Nederland B.V. | Koaxialsonde |
JP2013007700A (ja) * | 2011-06-27 | 2013-01-10 | Japan Electronic Materials Corp | 電気的接触子 |
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US20180340957A1 (en) * | 2016-02-15 | 2018-11-29 | Omron Corporation | Probe pin and inspection device including probe pin |
WO2019138505A1 (ja) | 2018-01-11 | 2019-07-18 | オムロン株式会社 | プローブピン、検査治具、検査ユニットおよび検査装置 |
CN109782034A (zh) | 2019-01-19 | 2019-05-21 | 电连技术股份有限公司 | 一种多通道探针 |
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US11519937B2 (en) * | 2017-06-06 | 2022-12-06 | Feinmetall Gmbh | Contact element system with at least two contact elements having different cross-sectional areas, differently shaped strips in an intermediate region, and a same bending rigidity |
DE102022106991A1 (de) | 2022-03-24 | 2023-09-28 | Ingun Prüfmittelbau Gmbh | Hochfrequenz-Prüfstiftvorrichtung |
WO2023180392A1 (de) | 2022-03-24 | 2023-09-28 | Ingun Prüfmittelbau Gmbh | Hochfrequenz-prüfstiftvorrichtung |
TWI805298B (zh) * | 2022-03-31 | 2023-06-11 | 中華精測科技股份有限公司 | 多針形垂直式探針卡 |
Also Published As
Publication number | Publication date |
---|---|
KR20220134567A (ko) | 2022-10-05 |
DE112020006635A5 (de) | 2022-11-10 |
DE102020102302A1 (de) | 2021-08-05 |
JP2023514814A (ja) | 2023-04-11 |
CN115485568A (zh) | 2022-12-16 |
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