WO2021093580A1 - 半导体自动测试设备测试拓展卡助拔连杆装置 - Google Patents

半导体自动测试设备测试拓展卡助拔连杆装置 Download PDF

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Publication number
WO2021093580A1
WO2021093580A1 PCT/CN2020/124071 CN2020124071W WO2021093580A1 WO 2021093580 A1 WO2021093580 A1 WO 2021093580A1 CN 2020124071 W CN2020124071 W CN 2020124071W WO 2021093580 A1 WO2021093580 A1 WO 2021093580A1
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WO
WIPO (PCT)
Prior art keywords
pull
connecting rod
assisting
expansion card
handle
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PCT/CN2020/124071
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English (en)
French (fr)
Inventor
包智杰
赵坤岭
Original Assignee
南京宏泰半导体科技有限公司
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Application filed by 南京宏泰半导体科技有限公司 filed Critical 南京宏泰半导体科技有限公司
Priority to US17/638,193 priority Critical patent/US11977111B2/en
Publication of WO2021093580A1 publication Critical patent/WO2021093580A1/zh

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2601—Apparatus or methods therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2834—Automated test systems [ATE]; using microprocessors or computers

Definitions

  • This application relates to the field of semiconductor automatic test equipment, and in particular to a device for assisting the pulling-out of a semiconductor automatic test equipment test expansion card.
  • Semiconductor automatic test equipment testing is a process of testing integrated circuits or chips, aiming to determine whether the functions of the integrated circuits or chips meet customer needs by comparing the output and theoretical values of the measuring circuits or chips.
  • the test method is to connect the test expansion card (LOADBOARD) with the probe station or the packaging and testing machine to realize the test of the integrated circuit or chip.
  • the test expansion card and the semiconductor automatic test equipment are connected together through the European socket, so if the customer needs to change the test
  • the integrated circuit board or chip needs to be replaced with the test expansion card.
  • the pull-out assistance mechanism composed of chains and steel wires is used to realize the pull-out and insertion of the test expansion card, but the advancement distance of the pull-out assistance mechanism is not accurate, the structure is complicated, and the investment cost is high.
  • the purpose of this application is to provide a pull-out assistance connecting rod device for testing expansion cards of semiconductor automatic test equipment, which aims to solve the technical problems of inaccurate advancement distance of the pull-out mechanism in the prior art, complex structure, and high investment cost.
  • a semiconductor automatic test equipment test expansion card pull-assisting connecting rod device adopted in this application includes a handle, a rotating member, a connecting rod, a rotating disk, a universal connecting rod, a first pull-assisting rod, and a second pull-assisting rod.
  • the handle is rotatably connected with the testing machine equipment through the rotating part, the middle part of the handle is fixedly connected with the connecting rod through a bolt, the number of the rotating disk is two, and the two rotating disks are respectively connected with
  • the connecting rods are fixedly connected and are located at both ends of the connecting rods, and each of the rotating disks is rotatably connected with the testing machine equipment, and both the first pull-assisting rod and the second pull-assisting rod pass through the
  • the universal connecting rod is fixedly connected to each of the rotating disks, and the first pull-out rod and the second pull-out rod are slidably connected to the testing machine equipment, and the first pull-out rod has a side wall
  • the first extraction assistance groove has a second extraction assistance groove on the side wall of the second extraction assistance rod, and the first extraction assistance groove and the second extraction assistance groove are arranged in opposite directions.
  • the first extraction aid groove includes a first loosening portion, a first pressing portion, and a first extension portion, and the first loosening portion is integrally formed with one end of the first extension portion.
  • a pressing part is integrally formed with the other end of the first extension part.
  • the second extraction assistance groove includes a second loosening portion, a second pressing portion and a second extension portion, and the second loosening portion is integrally formed with one end of the second extension portion, and the first The two pressing parts are integrally formed with the other end of the second extension part.
  • first loosening part is arranged opposite to the second pressing part, and the second loosening part is arranged opposite to the first pressing part.
  • the diameter of the first extension portion decreases sequentially along the first loosening portion to the first pressing portion
  • the diameter of the second extending portion is along the second loosening portion to the first pressing portion.
  • the second pressing part decreases sequentially.
  • first extension portion and the second extension portion are both arranged at an oblique angle.
  • the inclination angles of the first extension portion and the second extension portion are both 10°-15°.
  • the distance between the middle part of the handle and the rotating part is smaller than the distance between the middle part of the handle and the end of the handle away from the rotating part.
  • the edge of one end of the handle away from the rotating part is arranged in an arc-shaped structure.
  • the handle has anti-skid patterns.
  • a semiconductor automatic test equipment test expansion card pull-out assistance connecting rod device of the present application is connected to the testing machine equipment through the rotating part through one end of the handle, and the middle part of the handle is fixedly connected to the connecting rod through a bolt ,
  • the number of the rotating disks is two, the two rotating disks are respectively fixedly connected to the connecting rod and located at both ends of the connecting rod, and each of the rotating disks is rotatably connected to the testing machine equipment,
  • the first pull-assisting rod and the second pull-assisting rod are each fixedly connected to each of the rotating disks through the universal connecting rod, and the first pull-assisting rod and the second pull-assisting rod It is slidably connected to the testing machine equipment, the side wall of the first pull-out rod has a first pull-out groove, and the side wall of the second pull-out rod has a second pull-out groove, and the first pull-out groove is And the second drawing-assisting groove are arranged opposite to each other.
  • the structure is simple, and the advancement distance of the expansion card can be tested. It is more accurate, so that the advancing distance of the pull-assisting mechanism is more accurate, the structure is simple, and the investment cost is low.
  • FIG. 1 is a schematic diagram of the structure of the test expansion card pull-out assistance connecting rod device of the semiconductor automatic test equipment of the present application in a separated state.
  • FIG. 2 is a schematic structural diagram of the test expansion card pull-out assistance connecting rod device of the semiconductor automatic test equipment of the present application in a compressed state.
  • FIG. 3 is a schematic diagram of a part of the structure of the connecting rod assisting device for testing an expansion card of a semiconductor automatic test equipment of the present application.
  • Fig. 4 is a schematic diagram of the structure of the first pull-assist rod of the present application.
  • Fig. 5 is a schematic diagram of the structure of the second pull-assist rod of the present application.
  • Fig. 6 is a schematic diagram of the structure of the test expansion card of the present application.
  • 100-Semiconductor automatic test equipment test expansion card pull-assisting connecting rod device 10-handle, 20-rotating part, 30-rotating disc, 40-universal connecting rod, 50-first pull-out lever, 51-first pull-out Groove, 511-first loosening part, 512-first pressing part, 513-first extension part, 60-second extraction rod, 61-second extraction assistance groove, 611-second loosening part, 612 -Second pressing part, 613-Second extension part, 70-Connecting rod.
  • this application provides a semiconductor automatic test equipment test expansion card pull-out assistance connecting rod device 100, including a handle 10, a rotating member 20, a connecting rod 70, a rotating disk 30, a universal connecting rod 40, The first pulling rod 50 and the second pulling rod 60.
  • the handle 10 is rotatably connected with the testing machine device through the rotating member 20.
  • the middle part of the handle 10 is fixedly connected to the connecting rod 70 by bolts.
  • the number of the rotating disk 30 is two.
  • the two rotating disks 30 are respectively fixedly connected with the connecting rod 70 and located at two ends of the connecting rod 70, and each of the rotating disks 30 is rotatably connected with the testing machine equipment.
  • the first pull-out rod 50 and the second pull-out rod 60 are both fixedly connected to each of the rotating disks 30 through the universal connecting rod 40, and the first pull-out rod 50 and the The second pulling rod 60 is slidably connected with the testing machine equipment.
  • the first extraction assistance rod 50 has a first extraction assistance groove 51 on the side wall.
  • the second extraction assistance rod 60 has a second extraction assistance groove 61 on the side wall.
  • the first extraction assistance groove 51 and the second extraction assistance groove 61 are arranged oppositely.
  • the rotating member 20 is a needle bearing.
  • the semiconductor automatic test equipment tests that the expansion card pull-out assistance connecting rod device 100 is in a disengaged state.
  • the handle 10 and the connecting rod 70 are arranged at a specified angle, that is, the initial position of the handle 10.
  • each of the universal connecting rods 40 pulls the corresponding first extraction rod 50 and the second extraction rod 60 to move, the first extraction rod 50 moves toward the end far away from the connecting rod 70 and moves a specified distance, the second extraction rod 60 moves toward the end close to the connecting rod 70, and moves a specified distance, and due to the first extraction groove 51 and the second extraction assistance groove 61 are arranged in reverse, so the test expansion card originally fixed between the first extraction assistance groove 51 and the second extraction assistance groove 61 is detached, thereby realizing test expansion Disengagement of the card from the device.
  • the test expansion card pull-out assisting link device 100 of the semiconductor automatic test equipment is in a disengaged state.
  • the handle 10 and the connecting rod 70 are arranged at a specified angle, that is, the initial position of the handle 10.
  • the connecting rod 70 is driven to translate, and then the connecting rod 70 pulls the two ends at both ends.
  • each of the rotating disks 30, each of the rotating disks 30 pulls the corresponding universal connecting rod 40, and each of the universal connecting rods 40 pulls the corresponding first pull rod 50 and the
  • the second extraction rod 60 moves, the first extraction rod 50 moves toward the end close to the connecting rod 70 and moves a specified distance, and the second extraction rod 60 moves toward the end away from the connecting rod 70 , And move a specified distance, and because the first extraction groove 51 and the second extraction groove 61 are arranged in opposite directions, they are originally fixed in the first extraction groove 51 and the second extraction groove
  • the test expansion card between 61 is press-fitted to realize the compression of the test expansion card and the device.
  • the test expansion card pull-out assistance connecting rod device 100 of the semiconductor automatic test equipment can achieve accurate load-bearing advancing distance without a positioning device to assist in completing the advancing distance confirmation, simple structure, and low production investment cost.
  • it can ensure that the force of the European-style socket with which it is matched is the same, avoiding the pin of the European-style socket or the male and female sockets from being too much friction when mating, and the socket is extended. Life.
  • the first extraction assistance groove 51 includes a first loosening portion 511, a first pressing portion 512, and a first extending portion 513, and one end of the first loosening portion 511 and the first extending portion 513
  • the first pressing portion 512 and the other end of the first extension portion 513 are integrally formed.
  • the second extraction assistance groove 61 includes a second loosening portion 611, a second pressing portion 612, and a second extension portion 613.
  • the second loosening portion 611 is integrally formed with one end of the second extension portion 613.
  • the second pressing portion 612 and the other end of the second extension portion 613 are integrally formed.
  • the first loose part 511 is arranged opposite to the second pressing part 612
  • the second loose part 611 is arranged opposite to the first pressing part 512.
  • the first pull-out rod 50 moves toward one end away from the connecting rod 70 and moves a specified distance
  • the second pull-out rod 60 faces close to the connecting rod 70.
  • One end of the connecting rod 70 moves and moves a specified distance, and because the first extraction assistance groove 51 and the second extraction assistance groove 61 are arranged in opposite directions, the sockets at one end of the test expansion card will pass through all the sockets in turn.
  • the first pressing part 512, the first extension part 513, and finally sliding to the first loose part 511, the seat at the other end of the test expansion card will pass through the second pressing part 612,
  • the second extension part 613 finally slides to the second loose part 611, so as to realize the accurate driving distance of the load-bearing load of the device 100 for testing the expansion card assisting link 70 of the semiconductor automatic test equipment without the assistance of positioning devices.
  • the confirmation of the advancement distance is completed, the structure is simple, and the production input cost is low.
  • the diameter of the first extension portion 513 decreases sequentially along the first loosening portion 511 to the first pressing portion 512, and the diameter of the second extending portion 613 is along the second loosening portion 512.
  • the portion 611 to the second pressing portion 612 decrease sequentially.
  • the first caliber decreases in sequence along the first loosening portion 511 to the first pressing portion 512
  • the second extending portion 613 has a caliber along the second loosening portion.
  • the successively reduced setting of the portion 611 to the second pressing portion 612 can enable the test expansion card to be quickly pressed or detached.
  • first extension portion 513 and the second extension portion 613 are both arranged at an oblique angle.
  • first extension portion 513 and the second extension portion 613 are both arranged at an oblique angle, which can make it more convenient and labor-saving for the user to remove and insert the test expansion card.
  • the inclination angles of the first extension portion 513 and the second extension portion 613 are both 10°-15°.
  • the user when the inclination angles of the first extension 513 and the second extension 613 are controlled at 10° ⁇ 15°, the user can save effort to the greatest extent when plugging and unplugging the test expansion card. .
  • the distance from the middle of the handle 10 to the rotating member 20 is smaller than the distance from the middle of the handle 10 to the end of the handle 10 away from the rotating member 20.
  • the distance between the handle 10 and the rotating member 20 by setting the distance between the handle 10 and the rotating member 20 to be smaller than the distance from the middle of the handle 10 to the end of the handle 10 away from the rotating member 20, the user can be set to When the handle 10 is turned, it is more relaxed and labor-saving.
  • edge of the handle 10 at one end away from the rotating member 20 is arranged in an arc-shaped structure.
  • the edge of the end of the handle 10 away from the rotating member 20 is arranged in an arc-shaped structure so that the user can fit the hand more closely when holding the handle 10.
  • the handle 10 has anti-slip patterns.
  • the provision of anti-slip patterns can increase the friction between the handle 10 and the user's hand, and play an anti-slip effect.

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

一种半导体自动测试设备测试拓展卡助拔连杆装置，手柄（10）的一端通过所述转动件（20）与测试机设备转动连接，手柄（10）的中部通过螺栓与连杆（70）固定连接，两个转动盘（30）分别与连杆（70）固定连接，并位于连杆（70）的两端，且每个转动盘（30）与测试机设备转动连接，第一助拔杆（50）和第二助拔杆（60）均通过万向连接杆（40）分别与每个转动盘（30）固定连接，且第一助拔杆（50）和第二助拔杆（60）与测试机设备滑动连接，第一助拔杆（50）的侧壁上具有第一助拔槽（51），第二助拔杆（60）的侧壁上具有第二助拔槽（61），第一助拔槽（51）和第二助拔槽（61）反向设置。达到助拔机构的推进距离更加精确，结构简单，投入成本低的目的。

Description

半导体自动测试设备测试拓展卡助拔连杆装置 技术领域
本申请涉及半导体自动测试设备领域，尤其涉及一种半导体自动测试设备测试拓展卡助拔连杆装置。
背景技术
半导体自动测试设备测试是对集成电路或芯片进行检测，旨在通过对比测量电路或芯片的输出和理论值，确定集成电路或芯片功能是否满足客户需求的过程。测试方法为，通过测试拓展卡(LOADBOARD)与探针台或封测机对接，实现集成电路或芯片的测试，测试拓展卡与半导体自动测试设备通过欧式插座连接在一起，所以如果客户需要更换测试集成电路板或芯片就需要更换测试拓展卡。目前通过利用链条和钢丝组成的助拔机构实现测试拓展卡的拔插，但是该助拔机构的推进距离不精确，且结构复杂，投入成本高。
发明内容
本申请的目的在于提供一种半导体自动测试设备测试拓展卡助拔连杆装置，旨在解决现有技术中的助拔机构的推进距离不精确，且结构复杂，投入成本高的技术问题。
为实现上述目的，本申请采用的一种半导体自动测试设备测试拓展卡助拔连杆装置，包括手柄、转动件、连杆、转动盘、万向连接杆、第一助拔杆和第二助拔杆；
所述手柄的一端通过所述转动件与测试机设备转动连接，所述手柄的中部通过螺栓与所述连杆固定连接，所述转动盘的数量为两个，两个所述转动盘分别与所述连杆固定连接，并位于所述连杆的两端，且每个所述转动盘与测试机设备转动连接，所述第一助拔杆和所述第二助拔杆 均通过所述万向连接杆分别与每个所述转动盘固定连接，且所述第一助拔杆和所述第二助拔杆与测试机设备滑动连接，所述第一助拔杆的侧壁上具有第一助拔槽，所述第二助拔杆的侧壁上具有第二助拔槽，所述第一助拔槽和所述第二助拔槽反向设置。
其中，所述第一助拔槽包括第一松脱部、第一压紧部和第一延伸部，所述第一松脱部与所述第一延伸部的一端一体成型设置，所述第一压紧部与所述第一延伸部的另一端一体成型设置。
其中，所述第二助拔槽包括第二松脱部、第二压紧部和第二延伸部，所述第二松脱部与所述第二延伸部的一端一体成型设置，所述第二压紧部与所述第二延伸部的另一端一体成型设置。
其中，所述第一松脱部与所述第二压紧部相对设置，所述第二松脱部与所述第一压紧部相对设置。
其中，所述第一延伸部的口径沿所述第一松脱部至所述第一压紧部依次减小，所述第二延伸部的口径沿所述第二松脱部至所述第二压紧部依次减小。
其中，所述第一延伸部和所述第二延伸部均呈倾斜角度设置。
其中，所述第一延伸部和所述第二延伸部的倾斜角度均为10°～15°。
其中，所述手柄的中部至所述转动件之间的距离小于所述手柄的中部至所述手柄远离所述转动件一端之间的距离。
其中，所述手柄远离所述转动件一端的边缘呈圆弧形结构设置。其中，所述手柄上具有防滑纹。
本申请的一种半导体自动测试设备测试拓展卡助拔连杆装置，通过所述手柄的一端通过所述转动件与测试机设备转动连接，所述手柄的中部通过螺栓与所述连杆固定连接，所述转动盘的数量为两个，两个所述转动盘分别与所述连杆固定连接，并位于所述连杆的两端，且每个所述转动盘与测试机设备转动连接，所述第一助拔杆和所述第二助拔杆均通过所述万向连接杆分别与每个所述转动盘固定连接，且所述第一助拔杆和所述第二助拔杆与测试机设备滑动连接，所述第一助拔杆的侧壁上具有第一助拔槽，所述第二助拔杆的侧壁上具有第二助拔槽，所述第一 助拔槽和所述第二助拔槽反向设置。通过所述第一助拔槽和所述第二助拔槽反向设置，所述第一助拔杆与所述第二助拔杆相互配合，结构简单的同时，使得测试拓展卡的推进距离更加精确，以此获得助拔机构的推进距离更加精确，结构简单，投入成本低的效果。
附图说明
为了更清楚地说明本申请实施例或现有技术中的技术方案，下面将对实施例或现有技术描述中所需要使用的附图作简单地介绍，显而易见地，下面描述中的附图仅仅是本申请的一些实施例，对于本领域普通技术人员来讲，在不付出创造性劳动的前提下，还可以根据这些附图获得其他的附图。
图1是本申请的半导体自动测试设备测试拓展卡助拔连杆装置处于脱离状态的结构示意图。
图2是本申请的半导体自动测试设备测试拓展卡助拔连杆装置处于压紧状态的结构示意图。
图3是本申请的半导体自动测试设备测试拓展卡助拔连杆装置的部分结构示意图。
图4是本申请的第一助拔杆的结构示意图。
图5是本申请的第二助拔杆的结构示意图。
图6是本申请的测试拓展卡的结构示意图。
100-半导体自动测试设备测试拓展卡助拔连杆装置、10-手柄、20-转动件、30-转动盘、40-万向连接杆、50-第一助拔杆、51-第一助拔槽、511-第一松脱部、512-第一压紧部、513-第一延伸部、60-第二助拔杆、61-第二助拔槽、611-第二松脱部、612-第二压紧部、613-第二延伸部、70-连杆。
具体实施方式
下面详细描述本申请的实施例，所述实施例的示例在附图中示出，其中自始至终相同或类似的标号表示相同或类似的元件或具有相同或 类似功能的元件。下面通过参考附图描述的实施例是示例性的，旨在用于解释本申请，而不能理解为对本申请的限制。
在本申请的描述中，需要理解的是，术语“长度”、“宽度”、“上”、“下”、“前”、“后”、“左”、“右”、“竖直”、“水平”、“顶”、“底”“内”、“外”等指示的方位或位置关系为基于附图所示的方位或位置关系，仅是为了便于描述本申请和简化描述，而不是指示或暗示所指的装置或元件必须具有特定的方位、以特定的方位构造和操作，因此不能理解为对本申请的限制。此外，在本申请的描述中，“多个”的含义是两个或两个以上，除非另有明确具体的限定。
请参阅图1至图6，本申请提供了一种半导体自动测试设备测试拓展卡助拔连杆装置100，包括手柄10、转动件20、连杆70、转动盘30、万向连接杆40、第一助拔杆50和第二助拔杆60。
所述手柄10的一端通过所述转动件20与测试机设备转动连接。所述手柄10的中部通过螺栓与所述连杆70固定连接。所述转动盘30的数量为两个。两个所述转动盘30分别与所述连杆70固定连接，并位于所述连杆70的两端，且每个所述转动盘30与测试机设备转动连接。所述第一助拔杆50和所述第二助拔杆60均通过所述万向连接杆40分别与每个所述转动盘30固定连接，且所述第一助拔杆50和所述第二助拔杆60与测试机设备滑动连接。所述第一助拔杆50的侧壁上具有第一助拔槽51。所述第二助拔杆60的侧壁上具有第二助拔槽61。所述第一助拔槽51和所述第二助拔槽61反向设置。
在本实施方式中，所述转动件20为滚针轴承，如图1所示，所述半导体自动测试设备测试拓展卡助拔连杆装置100处于脱离状态。所述手柄10与所述连杆70呈指定角度设置，即所述手柄10的初始位置。当所述手柄10以所述转动件20为中心而转动时，带动所述连杆70平移，然后所述连杆70拉动两端的两个所述转动盘30，每个所述转动盘30拉动各自对应的所述万向连接杆40，每个所述万向连接杆40拉动各自对应的所述第一助拔杆50和所述第二助拔杆60移动，所述第一助拔杆50朝向远离所述连杆70的一端移动，并移动指定距离，所述第二助拔杆60朝向靠近所述连杆70的一端移动，并 移动指定距离，并且由于所述第一助拔槽51和所述第二助拔槽61反向设置，因此将原本固定在所述第一助拔槽51和所述第二助拔槽61之间的测试拓展卡进行脱离，以此实现测试拓展卡与设备的脱离。
如图2所示，所述半导体自动测试设备测试拓展卡助拔连杆装置100处于脱离状态。所述手柄10与所述连杆70呈指定角度设置，即所述手柄10的初始位置。当所述手柄10以所述转动件20为中心而沿着与图1中的所述手柄10转动方向反向转动时，带动所述连杆70平移，然后所述连杆70拉动两端的两个所述转动盘30，每个所述转动盘30拉动各自对应的所述万向连接杆40，每个所述万向连接杆40拉动各自对应的所述第一助拔杆50和所述第二助拔杆60移动，所述第一助拔杆50朝向靠近所述连杆70的一端移动，并移动指定距离，所述第二助拔杆60朝向远离所述连杆70的一端移动，并移动指定距离，并且由于所述第一助拔槽51和所述第二助拔槽61反向设置，因此将原本固定在所述第一助拔槽51和所述第二助拔槽61之间的测试拓展卡进行压紧配合，以此实现测试拓展卡与设备的压紧。
综合上述可得知：所述半导体自动测试设备测试拓展卡助拔连杆装置100可实现承重载荷推进距离精确，无需定位装置来协助完成推进距离的确认，结构简单，生产投入成本少。此外在测试拓展卡拔插过程中，能够保证与之配合的欧式座子所受的力相同，避免将欧式座子的针插弯或者公母座配合的时候摩擦了过大，延长了座子的使用寿命。
进一步地，所述第一助拔槽51包括第一松脱部511、第一压紧部512和第一延伸部513，所述第一松脱部511与所述第一延伸部513的一端一体成型设置，所述第一压紧部512与所述第一延伸部513的另一端一体成型设置。所述第二助拔槽61包括第二松脱部611、第二压紧部612和第二延伸部613，所述第二松脱部611与所述第二延伸部613的一端一体成型设置，所述第二压紧部612与所述第二延伸部613的另一端一体成型设置。所述第一松脱部511与所述第二压紧部612相对设置，所述第二松脱部611与所述第一压紧部512相对设置。
在本实施方式中，在对测试拓展卡进行脱离时，所述第一助拔杆50 朝向远离所述连杆70的一端移动，并移动指定距离，所述第二助拔杆60朝向靠近所述连杆70的一端移动，并移动指定距离，并且由于所述第一助拔槽51和所述第二助拔槽61反向设置，进而测试拓展卡其中一端的座子，会依次经过所述第一压紧部512、所述第一延伸部513，最后滑动至所述第一松脱部511，测试拓展卡另一端的座子，会依次经过所述第二压紧部612、所述第二延伸部613，最后滑动至所述第二松脱部611，以此实现所述半导体自动测试设备测试拓展卡助拔连杆70装置100的承重载荷推进距离精确，无需定位装置来协助完成推进距离的确认，结构简单，生产投入成本少。
进一步地，所述第一延伸部513的口径沿所述第一松脱部511至所述第一压紧部512依次减小，所述第二延伸部613的口径沿所述第二松脱部611至所述第二压紧部612依次减小。
在本实施方式中，所述第一的口径沿所述第一松脱部511至所述第一压紧部512依次减小，所述第二延伸部613的口径沿所述第二松脱部611至所述第二压紧部612依次减小的设置，能够使得测试拓展卡能够被快速压紧或者脱离。
进一步地，所述第一延伸部513和所述第二延伸部613均呈倾斜角度设置。
在本实施方式中，所述第一延伸部513和所述第二延伸部613均呈倾斜角度设置，能够使得用户在对测试拓展卡进行拔插时更加的方便省力。
进一步地，所述第一延伸部513和所述第二延伸部613的倾斜角度均为10°～15°。
在本实施方式中，将所述第一延伸部513和所述第二延伸部613的倾斜角度控制在10°～15°时能够实现用户在对测试拓展卡进行拔插时，最大程度的省力。
进一步地，所述手柄10的中部至所述转动件20之间的距离小于所述手柄10的中部至所述手柄10远离所述转动件20一端之间的距离。
在本实施方式中，通过设置所述手柄10至所述转动件20之间的 距离小于所述手柄10的中部至所述手柄10远离所述转动件20一端之间的距离，能够设置用户在转动所述手柄10时更加的轻松省力。
进一步地，所述手柄10远离所述转动件20一端的边缘呈圆弧形结构设置。
在本实施方式中，所述手柄10远离所述转动件20一端的边缘呈圆弧形结构设置能够让用户在握持所述手柄10时与手部贴合更加紧密。
进一步地，所述手柄10上具有防滑纹。
在本实施方式中，防滑纹的设置能够增加所述手柄10与用户手部之间的摩擦力，起到防滑作用。
以上所揭露的仅为本申请一种较佳实施例而已，当然不能以此来限定本申请之权利范围，本领域普通技术人员可以理解实现上述实施例的全部或部分流程，并依本申请权利要求所作的等同变化，仍属于本申请所涵盖的范围。

Claims (10)

  1. 一种半导体自动测试设备测试拓展卡助拔连杆装置，其中，所述半导体自动测试设备测试拓展卡助拔连杆装置包括：手柄、转动件、连杆、转动盘、万向连接杆、第一助拔杆和第二助拔杆；
    所述手柄的一端通过所述转动件与测试机设备转动连接；
    所述手柄的中部通过螺栓与所述连杆固定连接；
    所述转动盘的数量为两个，两个所述转动盘分别与所述连杆固定连接，并位于所述连杆的两端，且每个所述转动盘与测试机设备转动连接；
    所述第一助拔杆和所述第二助拔杆均通过所述万向连接杆分别与每个所述转动盘固定连接，且所述第一助拔杆和所述第二助拔杆与测试机设备滑动连接；
    所述第一助拔杆的侧壁上具有第一助拔槽，所述第二助拔杆的侧壁上具有第二助拔槽，所述第一助拔槽和所述第二助拔槽反向设置。
  2. 如权利要求1所述的半导体自动测试设备测试拓展卡助拔连杆装置，其中，所述第一助拔槽包括：
    第一松脱部、第一压紧部和第一延伸部；
    所述第一松脱部与所述第一延伸部的一端一体成型设置；
    所述第一压紧部与所述第一延伸部的另一端一体成型设置。
  3. 如权利要求2所述的半导体自动测试设备测试拓展卡助拔连杆装置，其中，所述第二助拔槽包括：
    第二松脱部、第二压紧部和第二延伸部；
    所述第二松脱部与所述第二延伸部的一端一体成型设置；
    所述第二压紧部与所述第二延伸部的另一端一体成型设置。
  4. 如权利要求3所述的半导体自动测试设备测试拓展卡助拔连杆装置，其中，
    所述第一松脱部与所述第二压紧部相对设置，所述第二松脱部与所述第一压紧部相对设置。
  5. 如权利要求4所述的半导体自动测试设备测试拓展卡助拔连杆装置，其中，
    所述第一延伸部的口径沿所述第一松脱部至所述第一压紧部依次减小；
    所述第二延伸部的口径沿所述第二松脱部至所述第二压紧部依次减小。
  6. 如权利要求5所述的半导体自动测试设备测试拓展卡助拔连杆装置，其中，
    所述第一延伸部和所述第二延伸部均呈倾斜角度设置。
  7. 如权利要求6所述的半导体自动测试设备测试拓展卡助拔连杆装置，其中，
    所述第一延伸部和所述第二延伸部的倾斜角度均为10°～15°。
  8. 如权利要求1所述的半导体自动测试设备测试拓展卡助拔连杆装置，其中，
    所述手柄的中部至所述转动件之间的距离小于所述手柄的中部至所述手柄远离所述转动件一端之间的距离。
  9. 如权利要求8所述的半导体自动测试设备测试拓展卡助拔连杆装置，其中，
    所述手柄远离所述转动件一端的边缘呈圆弧形结构设置。
  10. 如权利要求9所述的半导体自动测试设备测试拓展卡助拔连杆装置，其中，所述手柄上具有防滑纹。
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