WO2021090863A1 - Laminate body that includes temporary adhesive film; temporary adhesive composition; laminate body manufacturing method; and semiconductor element manufacturing method - Google Patents

Laminate body that includes temporary adhesive film; temporary adhesive composition; laminate body manufacturing method; and semiconductor element manufacturing method Download PDF

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Publication number
WO2021090863A1
WO2021090863A1 PCT/JP2020/041302 JP2020041302W WO2021090863A1 WO 2021090863 A1 WO2021090863 A1 WO 2021090863A1 JP 2020041302 W JP2020041302 W JP 2020041302W WO 2021090863 A1 WO2021090863 A1 WO 2021090863A1
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Prior art keywords
adhesive film
temporary adhesive
base material
support
laminate according
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PCT/JP2020/041302
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French (fr)
Japanese (ja)
Inventor
齋江 俊之
晃 山内
嶋田 和人
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富士フイルム株式会社
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Publication of WO2021090863A1 publication Critical patent/WO2021090863A1/en

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    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J101/00Adhesives based on cellulose, modified cellulose, or cellulose derivatives
    • C09J101/08Cellulose derivatives
    • C09J101/32Cellulose ether-esters
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J129/00Adhesives based on homopolymers or copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and at least one being terminated by an alcohol, ether, aldehydo, ketonic, acetal, or ketal radical; Adhesives based on hydrolysed polymers of esters of unsaturated alcohols with saturated carboxylic acids; Adhesives based on derivatives of such polymers
    • C09J129/14Homopolymers or copolymers of acetals or ketals obtained by polymerisation of unsaturated acetals or ketals or by after-treatment of polymers of unsaturated alcohols
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J133/00Adhesives based on homopolymers or copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and at least one being terminated by only one carboxyl radical, or of salts, anhydrides, esters, amides, imides, or nitriles thereof; Adhesives based on derivatives of such polymers
    • C09J133/04Homopolymers or copolymers of esters
    • C09J133/06Homopolymers or copolymers of esters of esters containing only carbon, hydrogen and oxygen, the oxygen atom being present only as part of the carboxyl radical
    • C09J133/10Homopolymers or copolymers of methacrylic acid esters

Definitions

  • the present invention relates to a laminate containing a temporary adhesive film, a composition for temporary adhesion, a method for producing a laminate, and a method for producing a semiconductor element.
  • a dicing process is performed to convert a base material such as a silicon wafer into chips.
  • a base material is usually attached to a support (generally also called a dicing tape) via a temporary adhesive film to form a laminate for fixing the base material, and blade dicing, laser dicing, or the like is used. It is carried out by cutting the base material (for example, Patent Document 1).
  • Patent Document 2 a technique for temporarily forming a protective film made of resin or the like on the surface of a base material is well known in order to prevent foreign matter from adhering to or scratching the surface of the base material.
  • some steps may continue after the dicing process, and it may be preferable to protect the surface of the base material in such steps.
  • the present invention has been made in view of the above problems, and an object of the present invention is to provide a laminate capable of protecting the chip surface after dicing treatment. Another object of the present invention is to provide a composition for temporary adhesion, a method for producing a laminate, and a method for producing a semiconductor device for such a laminate.
  • the above problem can be solved by making it possible to use a temporary adhesive film for fixing the base material to the support as a protective film during dicing.
  • the above-mentioned problems have been solved by the following means of ⁇ 1>, preferably by the means of ⁇ 2> and thereafter.
  • ⁇ 1> A laminate having a base material, a temporary adhesive film, and a support in this order.
  • the base material and the temporary adhesive film are divided into a plurality of parts by a notch extending from the base material to the temporary adhesive film.
  • a laminate in which the first adhesive force between the base material and the temporary adhesive film is equal to or greater than the second adhesive force between the temporary adhesive film and the support.
  • the difference between the first adhesive force and the second adhesive force is 10 to 100 N / mm 2 .
  • the laminate according to ⁇ 1>. ⁇ 3> The second adhesive force is 20-100 N / mm 2 .
  • ⁇ 4> The thickness of the temporary adhesive film is 10 to 100 ⁇ m.
  • ⁇ 5> After the base material is peeled off from the support, the thickness of the temporary adhesive film on the base material is 10 to 100 ⁇ m.
  • the temporary adhesive film contains a release layer on the surface layer on the support side, The laminate according to any one of ⁇ 1> to ⁇ 5>.
  • the support includes a release layer on the surface layer on the temporary adhesive film side.
  • the release layer contains a surfactant, The laminate according to ⁇ 6> or ⁇ 7>.
  • the thickness of the release layer is 0.1 to 10 ⁇ m.
  • Temporary adhesive film contains non-curable resin, The laminate according to any one of ⁇ 1> to ⁇ 9>.
  • Temporary adhesive film contains water-insoluble resin, The laminate according to any one of ⁇ 1> to ⁇ 10>.
  • ⁇ 12> The laminate according to any one of ⁇ 1> to ⁇ 11>, wherein the temporary adhesive film contains a resin having a saturated solubility in 100 g of water at 23 ° C. of 0.9 g or less.
  • the temporary adhesive film contains at least one resin selected from the group consisting of polyvinyl acetal, polyalkyl methacrylate and acyl cellulose.
  • Temporary adhesive film contains antioxidant, The laminate according to any one of ⁇ 1> to ⁇ 13>.
  • the base material contains a semiconductor circuit on the surface layer on the temporary adhesive film side,
  • the support is a dicing tape,
  • a method of manufacturing a laminate A method for producing a laminate, wherein the first adhesive force between the base material and the temporary adhesive film is equal to or greater than the second adhesive force between the temporary adhesive film and the support.
  • it includes a step of forming a temporary adhesive film on one surface of the base material and the support.
  • the temporary adhesive composition is applied to the surface of the base material or the support, and then the temporary adhesive composition is dried.
  • the method for producing a laminate according to ⁇ 17>. ⁇ 19> The method of applying the temporary bonding composition to the surface of the base material or the support is a spin coating method, a slit coating method or a spiral coating method.
  • ⁇ 20> A method for manufacturing a semiconductor device, which comprises the method for manufacturing a laminate according to any one of ⁇ 17> to ⁇ 19>.
  • the laminate of the present invention makes it possible to protect the chip surface after dicing.
  • FIG. 1 is a schematic cross-sectional view showing a laminated body of the present invention.
  • FIG. 2 is a schematic view showing a state when the divided base material piece (chip) is taken out.
  • FIG. 3 is a schematic view showing an example of some steps in the method for producing a laminate of the present invention.
  • the numerical range represented by the symbol "-" in the present specification means a range including the numerical values before and after "-" as the lower limit value and the upper limit value, respectively.
  • process means not only an independent process but also a process that cannot be clearly distinguished from other processes as long as the intended action of the process can be achieved.
  • the notation that does not describe substitution and non-substitution with respect to a group means that a group having a substituent (atomic group) is included as well as a group having no substituent (atomic group). is there.
  • alkyl group when simply described as "alkyl group", this includes both an alkyl group having no substituent (unsubstituted alkyl group) and an alkyl group having a substituent (substituted alkyl group).
  • exposure means not only drawing using light but also drawing using particle beams such as an electron beam and an ion beam, unless otherwise specified.
  • energy rays used for drawing include emission line spectra of mercury lamps, far ultraviolet rays typified by excimer lasers, active rays such as extreme ultraviolet rays (EUV light) and X-rays, and particle beams such as electron beams and ion beams. Be done.
  • (meth) acrylate means both “acrylate” and “methacrylate”, or either
  • (meth) acrylic means both “acrylic” and “methacrylic", or , Either
  • (meth) acryloyl means both “acryloyl” and “methacryloyl”, or either.
  • the solid content in the composition means other components other than the solvent, and the content (concentration) of the solid content in the composition is, unless otherwise specified, based on the total mass of the composition. It is represented by the mass percentage of other components excluding the solvent.
  • the temperature is 23 ° C. and the atmospheric pressure is 101325 Pa (1 atm).
  • the weight average molecular weight (Mw) and the number average molecular weight (Mn) are shown as polystyrene-equivalent values according to gel permeation chromatography (GPC measurement) unless otherwise specified.
  • GPC measurement gel permeation chromatography
  • Mw and Mn for example, HLC-8220 (manufactured by Tosoh Corporation) is used, and guard columns HZ-L, TSKgel Super HZM-M, TSKgel Super HZ4000, TSKgel are used as columns. It can be obtained by using Super HZ3000 and TSKgel Super HZ2000 (manufactured by Tosoh Corporation).
  • the measurement is carried out using THF (tetrahydrofuran) as the eluent.
  • a UV ray (ultraviolet) wavelength 254 nm detector is used for detection in GPC measurement.
  • each layer constituting the laminated body when the positional relationship of each layer constituting the laminated body is described as "upper” or “lower", the other layer is above or below the reference layer among the plurality of layers of interest. All you need is. That is, a third layer or element may be further interposed between the reference layer and the other layer, and the reference layer and the other layer need not be in contact with each other.
  • the direction in which the layers are stacked on the base material is referred to as "upper", or if there is a photosensitive layer, the direction from the base material to the photosensitive layer is referred to as "upper”.
  • the opposite direction is referred to as "down”. It should be noted that such a vertical setting is for convenience in the present specification, and in an actual embodiment, the "upward" direction in the present specification may be different from the vertical upward direction.
  • FIG. 1 is a schematic cross-sectional view showing a laminated body of the present invention
  • FIG. 2 is a schematic view showing a state when one of the divided base material pieces (chips) is taken out.
  • the laminate 1 of the present invention has a base material 10, a temporary adhesive film 12, and a support 14 in this order. Then, in the laminated body 1, the base material 10 and the temporary adhesive film 12 are divided into a plurality of parts by a notch 16 extending from the base material 10 to the temporary adhesive film 12, and between the base material 10 and the temporary adhesive film 12.
  • the first adhesive force is equal to or greater than the second adhesive force between the temporary adhesive film 12 and the support 14.
  • the temporary adhesive film 12 adheres to the chip C when the chip C is taken out from the support 14 as shown in FIG. It will be in the state of.
  • a method of forming a protective film on the surface of each chip after the dicing treatment can be considered.
  • forming a protective film on the surface of individual chips having a small size after the dicing process is complicated as a work, and further increases the number of steps of the semiconductor process, which may cause a problem that the manufacturing efficiency is lowered. .. From this point of view, when the laminate of the present invention is used, it is not necessary to separately provide a step of forming a protective film after the dicing treatment, so that it is possible to obtain an effect that a decrease in production efficiency can be suppressed.
  • the peeling mode of the laminated body is not particularly limited as long as the temporary adhesive film remains on the surface of the base material to be protected.
  • a peeling mode for example, a state in which the support 14 and the temporary adhesive film 12 are peeled off at the adhesive interface S2 (that is, all of the temporary adhesive film 12 remains on the surface of the base material), and further, the inside of the temporary adhesive film 12 (It is a so-called cohesive failure of the temporary adhesive film, and a part of the temporary adhesive film remains on the surface of the base material).
  • the first adhesive force is equal to the second adhesive force or when the difference between them is small, the temporary adhesive film 12 is likely to be coagulated and broken, and the temporary adhesive film 12 is likely to be peeled off inside. ..
  • the thickness of the temporary adhesive film 12 is smaller than that in the laminated state, but the problem of the present invention is achieved because the temporary adhesive film is present on the base material. can do.
  • cohesive failure occurs, the adhesive forces on both sides of the temporary adhesive film are considered to be equal to each other.
  • the temporary adhesive film 12 does not have to be present on the entire adhesive surface of the base material 10. Therefore, it is sufficient that the temporary adhesive film 12 remains at least in the region of the base material 10 that is used as the chip C, and the temporary adhesive film 12 remains in the region that is not used as the chip C, such as the outer edge of the base material 10. It is not necessary, and the temporary adhesive film 12 may be peeled off at the adhesive interface S1 of the base material 10 and the temporary adhesive film 12.
  • the base material 10 and the temporary adhesive film 12 are adhered to each other at the adhesive interface S1, and the temporary adhesive film 12 and the support 14 are adhered to each other at the adhesive interface S2.
  • the first adhesive force is the force related to the adhesion between the base material 10 and the temporary adhesive film 12 as described above
  • the second adhesive force is related to the adhesion between the temporary adhesive film 12 and the support 14 as described above. It is power.
  • the adhesive force acting between two substances in a bonded state can be measured as an external force per unit area required to separate the two substances (that is, release the bonded state).
  • the method for measuring the adhesive force is not particularly limited as long as such an external force can be measured, but it can be carried out, for example, by the measuring method described in Examples described later.
  • the first adhesive force is preferably larger than the second adhesive force.
  • peeling is likely to occur more effectively at the adhesive interface between the support and the temporary adhesive film, and the strength of the temporary adhesive film as a protective film is likely to be ensured.
  • the difference between the first adhesive force and the second adhesive force is preferably 10 to 100 N / mm 2.
  • the upper limit of this numerical range is preferably 90 N / mm 2 or less, more preferably 80 N / mm 2 or less, and further preferably 50 N / mm 2 or less.
  • the lower limit of this numerical range is preferably 11 N / mm 2 or more, more preferably 20 N / mm 2 or more, and further preferably 30 N / mm 2 or more.
  • the second adhesive force is preferably 20 to 110 N / mm 2.
  • the upper limit of this numerical range is preferably 100 N / mm 2 or less, more preferably 90 N / mm 2 or less, and further preferably 50 N / mm 2 or less.
  • the lower limit of the numerical range is preferably 21N / mm 2 or more, more preferably 25 N / mm 2 or more, more preferably 30 N / mm 2 or more.
  • the second adhesive force may be reduced after the dicing treatment by altering the support or the like.
  • the second adhesive force can be adjusted before and after dicing in this way, it becomes easier to achieve both peeling at the adhesive interface between the support and the temporary adhesive film and securing the holding force of the base material during dicing.
  • the base is used in the present invention.
  • the first adhesive force between the material and the temporary adhesive film may be greater than or equal to the second adhesive force after the change and before peeling. In this case, the difference between the adhesive strengths is the value after the change and before the peeling.
  • Second adhesive strength after reduction it is preferably 1.0 N / mm 2 or less, more preferably 0.5 N / mm 2 or less, and more preferably 0.3 N / mm 2 or less .
  • the second adhesive force before reduction is preferably 3.0 N / mm 2 or more, more preferably 5.0 N / mm 2 or more, it is 10.0 N / mm 2 or more More preferred.
  • the above difference between the adhesive forces after the second adhesive force is reduced is preferably 2.0 N / mm 2 or more, more preferably 4.0 N / mm 2 or more, and 9. It is more preferably 0 N / mm 2 or more.
  • the base material is a member that is chipped by a dicing process, and is not particularly limited, and various base materials that can be used in the semiconductor process can be used depending on the use of the laminate.
  • the base material for example, a transparent substrate used for a liquid crystal display device or the like, and a semiconductor substrate used for a light emitting element, a solid-state image sensor, a semiconductor memory, or the like can be used.
  • the base material may be a metal substrate, a resin substrate, or a prepreg (a sheet formed by impregnating a fiber member with a resin).
  • the transparent substrate is, for example, a glass substrate such as quartz glass, non-alkali glass, soda glass, borosilicate glass and aluminosilicate glass.
  • Other structures such as a transparent conductive film, a reflective film, and a protective film may be formed on these transparent substrates.
  • Semiconductor substrates include, for example, silicon, sapphire, silicon carbide, gallium nitride, aluminum, amorphous aluminum oxide, polycrystalline aluminum oxide, silicon nitride, silicon nitride, GaAsP, GaP, AlGaAs, InGaN, GaN, AlGaN, ZnSe, AlGa, etc. It is a substrate made of InP, ZnO, or the like.
  • the metal substrate is, for example, an aluminum substrate, a copper substrate, a stainless steel substrate, or the like.
  • the resin substrate is, for example, an epoxy substrate, a polycarbonate substrate, a flexible substrate (polyimide substrate, polyethylene naphthalate (PEN) substrate, polyethylene terephthalate (PET) substrate) and the like.
  • the base material may include an undercoat layer in the surface layer portion on the temporary adhesive film side in order to improve adhesion with the upper layer, prevent diffusion of substances, or flatten the surface.
  • the base material may include, for example, a semiconductor circuit in the surface layer portion on the temporary adhesive film side.
  • the base material may have a single-layer structure or a laminated structure.
  • the thickness of the base material (the maximum thickness when a structure or the like is included) is not particularly limited, and is appropriately set according to the application of the laminate.
  • the thickness of the base material is, for example, 0.3 to 2 mm.
  • the upper limit of this numerical range is preferably 1.5 mm or less, more preferably 1 mm or less, and further preferably 0.8 mm or less.
  • the lower limit of this numerical value range is preferably 0.4 mm or more, more preferably 0.5 mm or more, and further preferably 0.6 mm or more.
  • the shape of the base material is not particularly limited and is appropriately set according to the use of the laminated body.
  • the shape of the base material is, for example, a disk shape (wafer type substrate) and a rectangular shape (panel type substrate).
  • the diameter is, for example, 50 to 500 mm.
  • the upper limit of this numerical range is preferably 400 mm or less, more preferably 300 mm or less, and even more preferably 250 mm or less.
  • the lower limit of this numerical value range is preferably 100 mm or more, more preferably 150 mm or more, and further preferably 170 mm or more.
  • the maximum side length is, for example, 200 to 1000 mm.
  • the upper limit of this numerical range is preferably 900 mm or less, more preferably 800 mm or less, and further preferably 700 mm or less. Further, the lower limit of this numerical value range is preferably 300 mm or more, more preferably 400 mm or more, and further preferably 450 mm or more.
  • the base material may have an orientation flat or a notch.
  • the role of the surface on the base material protected by the temporary adhesive film is not particularly limited, and is appropriately set as necessary from the viewpoint of preventing the adhesion of foreign substances and the occurrence of scratches.
  • the surface on the substrate thus protected is, for example, the surface of the substrate on which a predetermined structure or semiconductor circuit is formed.
  • the surface of the base material on which a predetermined structure or semiconductor circuit is formed is attached so as to come into contact with the temporary adhesive film.
  • the surface on the base material thus protected may be, for example, the surface of the base material itself (so-called back surface) opposite to the surface of the base material on which a predetermined structure or semiconductor circuit is formed. In this case, the back surface is attached so as to come into contact with the temporary adhesive film.
  • a protective film may be separately formed before dicing from the viewpoint of protecting the structure and the semiconductor circuit from debris generated during dicing. Further, even if the surface is on the same side, it is sufficient that the region where the structure or the semiconductor circuit is formed, that is, the region used as the chip can be protected. Therefore, for example, a temporary adhesive film is formed in the outer edge region which is not used as the chip. It is not mandatory to be done. However, from the viewpoint of dicing stability, it is preferable that the entire surface of the base material on the temporary adhesive film side adheres to the temporary adhesive film.
  • the temporary adhesive film is mainly composed of resin.
  • the resin is appropriately selected within a range in which the first adhesive force is equal to or greater than the second adhesive force.
  • the temporary adhesive film preferably contains a non-curable resin.
  • non-curable means at least one of heat (for example, 150 ° C. or higher, preferably 200 ° C. or higher) or light (for example, a wavelength in the range of 180 to 800 nm) exposed in the step after dicing treatment. It means that the hardness (Rockwell hardness) does not increase due to light in the band, preferably light having a wavelength of 200 to 400 nm. This makes it easier to remove the temporary adhesive film.
  • the temporary adhesive film preferably contains a thermoplastic resin (a resin that softens when heated to a glass transition point or a melting point). This makes it easier to remove the temporary adhesive film. It is also preferable that the temporary adhesive film contains a water-insoluble resin.
  • the term "water-insoluble” means a property in which the saturated solubility (g) in 100 g of water at 23 ° C. is 1 g or less. As a result, the protective function in the post-process using water is further improved.
  • the saturated solubility of the water-insoluble resin in 100 g of water at 23 ° C. is preferably 0.9 g or less, more preferably 0.5 g or less, and further preferably 0.1 g or less.
  • the saturated solubility in water at 23 ° C. is practically 0.001 g or more, and may be 0.01 g or more.
  • the temporary adhesive film contains a transparent resin. This makes it possible to visually recognize the surface of the base material covered with the temporary adhesive film in the process after the dicing treatment.
  • the temporary adhesive film contains a transparent resin
  • the minimum light transmittance of the temporary adhesive film having a thickness of 50 mm in the wavelength range of 400 to 700 nm is preferably 85% or more, more preferably 88% or more. , 90% or more is more preferable. Further, the minimum light transmittance of the temporary adhesive film is practically 99.9% or less, and may be 98% or less.
  • the temporary adhesive film preferably contains a non-curable and water-insoluble resin or a thermoplastic and water-insoluble resin, and is a non-curable, water-insoluble and transparent resin or a thermoplastic and water-insoluble resin. It is more preferable to contain a transparent resin, and further preferably to contain a thermoplastic, water-insoluble and transparent resin.
  • the temporary adhesive film preferably contains at least one resin selected from the group consisting of polyvinyl acetal, polyalkyl methacrylate and acylcellulose, and at least selected from the group consisting of polyvinyl acetal and polyalkyl methacrylate. It is more preferable to contain one kind of resin, and it is further preferable to contain polyvinyl acetal.
  • the polyvinyl acetal is preferably a resin obtained by reacting polyvinyl alcohol with an aldehyde to acetalize it, and more preferably a compound containing each repeating unit represented by the following formula (PV-1).
  • R 1 represents an alkyl group
  • R 2 to R 5 each independently represent a hydrogen atom or a monovalent substituent
  • x, y and z are each repeating unit. It represents the molar ratio (mol%) in the resin, and x + y + z is 80 to 100 mol%.
  • an asterisk "*" represents a bond or terminal site between repeating units.
  • R 1 is preferably an alkyl group having 1 to 10 carbon atoms, more preferably an alkyl group having 1 to 5 carbon atoms, and further preferably an alkyl group having 2 or 3 carbon atoms.
  • R 1 is a propyl group (-C 3 H 7 ), that is, the polyvinyl acetal is polyvinyl butyral.
  • R 2 ⁇ R 5 are hydrogen atoms.
  • the monovalent substituent is preferably, for example, the following substituent T.
  • R 2 to R 5 represent a monovalent substituent, R 2 may be the same or different between different repeating units, and R 3 is the same among different repeating units.
  • R 4 may be the same or different between different repeating units, and R 5 may be the same or different between different repeating units. Good.
  • the substituent T is a halogen atom, a cyano group, a nitro group, a hydrocarbon group, a heterocyclic group, -ORt 1 , -CORt 1 , -COORt 1 , -OCORt 1 , -NRt 1 Rt 2 , -NHCORt 1 , -CONRT. 1 Rt 2 , -NHCONRT 1 Rt 2 , -NHCOORt 1 , -SRt 1 , -SO 2 Rt 1 , -SO 2 ORt 1 , -NHSO 2 Rt 1 and -SO 2 NRt 1 Rt 2 is there.
  • Rt 1 and Rt 2 independently represent a hydrogen atom, a hydrocarbon group, or a heterocyclic group, respectively. When Rt 1 and Rt 2 are hydrocarbon groups, they may be bonded to each other to form a ring.
  • examples of the halogen atom include a fluorine atom, a chlorine atom, a bromine atom and an iodine atom.
  • examples of the hydrocarbon group include an alkyl group, an alkenyl group, an alkynyl group, and an aryl group.
  • the number of carbon atoms of the alkyl group is preferably 1 to 10, more preferably 1 to 5, and even more preferably 1 or 2.
  • the alkyl group may be linear, branched or cyclic, preferably linear or branched.
  • the alkenyl group preferably has 2 to 10 carbon atoms, more preferably 2 to 5 carbon atoms, and particularly preferably 2 or 3 carbon atoms.
  • the alkenyl group may be linear, branched or cyclic, preferably linear or branched.
  • the alkynyl group preferably has 2 to 10 carbon atoms, and more preferably 2 to 5 carbon atoms.
  • the alkynyl group may be linear or branched.
  • the aryl group preferably has 6 to 10 carbon atoms, more preferably 6 to 8 carbon atoms, and even more preferably 6 to 7 carbon atoms.
  • the heterocyclic group may be monocyclic or polycyclic.
  • the heterocyclic group is preferably a single ring or a polycycle having 2 to 4 rings.
  • the number of heteroatoms constituting the ring of the heterocyclic group is preferably 1 to 3.
  • the hetero atom constituting the ring of the heterocyclic group is preferably a nitrogen atom, an oxygen atom or a sulfur atom.
  • the number of carbon atoms constituting the ring of the heterocyclic group is preferably 3 to 10, more preferably 3 to 8, and even more preferably 3 to 5.
  • the hydrocarbon group and the heterocyclic group as the substituent T may have yet another substituent or may be unsubstituted.
  • the above-mentioned substituent T can be mentioned.
  • the substituent T as described above includes, for example, a halogen atom (particularly a fluorine atom, a chlorine atom and a bromine atom), an alkyl group having 1 to 5 carbon atoms (particularly a methyl group, an ethyl group and a propyl group).
  • a halogen atom particularly a fluorine atom, a chlorine atom and a bromine atom
  • an alkyl group having 1 to 5 carbon atoms particularly a methyl group, an ethyl group and a propyl group.
  • Alkenyl groups with 2 to 5 carbon atoms (particularly ethenyl groups (vinyl groups) and propenyl groups), alkoxy groups with 1 to 5 carbon atoms (particularly methoxy groups, ethoxy groups and propoxy groups), hydroxyl groups, thiol groups, carbonyl groups, thio
  • the substituent T is preferably a fluorine atom, a methyl group, an ethyl group, a methoxy group, an ethoxy group, a hydroxyl group, a carbonyl group and a carboxy group. These substituents may have yet another substituent or may be unsubstituted.
  • X + y + z is preferably 85 to 100 mol%.
  • the upper limit of this numerical range is usually 100 mol%, but may be about 98 mol%.
  • the lower limit of this numerical range is more preferably 90 mol% or more, and further preferably 95 mol% or more. That is, the polyvinyl acetal may contain a repeating unit other than the above three repeating units, but the molar ratio of such other repeating units is preferably 0 to 20 mol%, and 0 to 10 mol. It is more preferably%, further preferably 0 to 5 mol%, and particularly preferably 0 mol%.
  • x corresponds to the degree of acetalization in the polyvinyl acetal resin, and is preferably 50 to 90 mol%.
  • the upper limit of this numerical range is preferably 85 mol% or less, more preferably 80 mol% or less, and further preferably 76 mol% or less.
  • the lower limit of this numerical value range is preferably 60 mol% or more, more preferably 65 mol% or more, and further preferably 70 mol% or more.
  • y corresponds to the content of hydroxyl groups in the polyvinyl acetal resin, and is preferably 10 to 50 mol%.
  • the upper limit of this numerical range is preferably 40 mol% or less, more preferably 35 mol% or less, and further preferably 30 mol% or less.
  • the lower limit of this numerical value range is preferably 15 mol% or more, more preferably 20 mol% or more, and further preferably 24 mol% or more.
  • z corresponds to the content of the acetyl group in the polyvinyl acetal resin, and is preferably 1 to 5 mol%.
  • the upper limit of this numerical range is preferably 4 mol% or less, more preferably 3.5 mol% or less, and further preferably 3 mol% or less.
  • the lower limit of this numerical value range is preferably 1.5 mol% or more, more preferably 1.7 mol% or more, and further preferably 2 mol% or more.
  • the weight average molecular weight of polyvinyl acetal is preferably 10,000 to 300,000.
  • the upper limit of this numerical range is preferably 200,000 or less, more preferably 150,000 or less, and even more preferably 120,000 or less.
  • the lower limit of this numerical range is preferably 20,000 or more, more preferably 50,000 or more, and further preferably 80,000 or more.
  • the content of polyvinyl acetal in the temporary adhesive film is preferably 50 to 100% by mass.
  • the upper limit of this numerical range may be 98% by mass or less, 95% by mass or less, or 93% by mass or less.
  • the lower limit of this numerical range is preferably 70% by mass or more, more preferably 80% by mass or more, and further preferably 85% by mass or more.
  • the polyvinyl acetal in the temporary adhesive film may be composed of one kind alone or a mixture containing two or more kinds of polyvinyl acetals. When the polyvinyl acetals are mixtures, their total amount is preferably in the above range.
  • the polyalkyl methacrylate is more preferably a compound containing each repeating unit represented by the following formula (PM-1).
  • R 7 represents an alkyl group
  • R 8 represents a hydrogen atom or a methyl group
  • R 9 represents a monovalent organic group
  • p and q are each repeating unit in the resin.
  • P is 60 to 100 mol%
  • q is 0 to 40 mol%
  • p + q is 80 to 100 mol%.
  • an asterisk "*" represents a bond or terminal site between repeating units.
  • the repeating unit with q is a repeating unit that does not satisfy the requirements for the repeating unit with p.
  • p is preferably 80 mol% or more, more preferably 90 mol% or more, still more preferably 95 mol% or more. Further, p may be 98 mol% or less.
  • R 7 is preferably an alkyl group having 1 to 10 carbon atoms, more preferably an alkyl group having 1 to 5 carbon atoms, and further preferably an alkyl group having 1 to 3 carbon atoms. In particular, R 7 is preferably a methyl group. R 7 may be different between different repeating units, but is preferably the same.
  • the polyalkyl methacrylate is preferably polymethyl methacrylate (PMMA) in which p is 90 mol% or more and R 7 is a methyl group.
  • q is preferably 20 mol% or less, more preferably 10 mol% or less, and further preferably 5 mol% or more. Further, q may be 2 mol% or more.
  • the repeating unit with q is preferably a repeating unit derived from (meth) acrylate that does not meet the requirements for the repeating unit with p.
  • Such repeating units include the case where R 8 is a hydrogen atom and R 8 is a methyl group and R 9 is -COOR 10 (R 10 is an organic other than an alkyl group) in the repeating unit with q. It may be represented by ().
  • repeating unit with q is a repeating unit represented by the following formula (PM-2).
  • R 8 has the same meaning as R 8 in formula (PM-1), R 20 is a monovalent substituent, m represents an integer of 0-4.
  • substituents include the above-mentioned substituent T, and specific examples thereof include a fluorine atom, a methyl group, an ethyl group, a methoxy group, an ethoxy group, a hydroxyl group, a carbonyl group and a carboxy group.
  • the group of may further have a substituent.
  • m may be 3 or less, or 1 or more.
  • the hydrogen atom in the polyalkyl methacrylate may be substituted with a substituent.
  • substituents include the above-mentioned substituent T, and specific examples thereof include a fluorine atom, a methyl group, an ethyl group, a methoxy group, an ethoxy group, a hydroxyl group, a carbonyl group and a carboxy group.
  • the weight average molecular weight of the polyalkyl methacrylate is preferably 10,000 to 300,000.
  • the upper limit of this numerical range is preferably 200,000 or less, more preferably 150,000 or less, and even more preferably 120,000 or less.
  • the lower limit of this numerical range is preferably 20,000 or more, more preferably 50,000 or more, and further preferably 80,000 or more.
  • the content of polyalkyl methacrylate in the temporary adhesive film is preferably 50 to 100% by mass.
  • the upper limit of this numerical range may be 98% by mass or less, 95% by mass or less, or 93% by mass or less.
  • the lower limit of this numerical range is preferably 70% by mass or more, more preferably 80% by mass or more, and further preferably 85% by mass or more.
  • the polyalkyl methacrylate in the temporary adhesive film may be composed of one kind alone or a mixture containing two or more kinds of polyalkyl methacrylate. When the polyalkyl methacrylates are mixtures, their total amount is preferably in the above range.
  • Acyl Cellulose is a compound obtained by acyl esterifying cellulose, and is more preferably a compound represented by the following formula (AC-1).
  • R 11 to R 16 independently represent a hydrogen atom or an acyl group (-COR 17 : R 17 is an alkyl group), and at least one of R 11 to R 16 is an acyl group. It is a group, and n represents the degree of polymerization.
  • the alkyl group R 17 in the acyl group is preferably an alkyl group having 1 to 10 carbon atoms, more preferably an alkyl group having 1 to 5 carbon atoms, and 1 to 5 carbon atoms. It is more preferably an alkyl group of 3.
  • R 17 is a methyl group, that is, the acyl group is an acetyl group and the acyl cellulose is cellulose acetate.
  • the types of acyl groups are usually the same, but may be partially different.
  • R 11 to R 16 in the same repeating unit at least two are preferably acyl groups, at least four are more preferably acyl groups, and all six may be acyl groups. Between different repeating units, the number of acyl groups may be the same or different.
  • the degree of acylation (the ratio of carboxylic acid liberated by saponifying acyl cellulose, which is also called the degree of vinegarization when the acyl cellulose is cellulose acetate), which indicates the degree of acyl esterification, is 35 to 75%. Is preferable.
  • the upper limit of this numerical range is preferably 70% or less, more preferably 65% or less, and even more preferably 60% or less.
  • the lower limit of this numerical range is preferably 40% or more, more preferably 45% or more, and further preferably 50% or more.
  • the degree of substitution representing the degree of substitution of the acyl group is preferably 0.1 to 3.
  • the upper limit of this numerical range is preferably 2.9 or less, more preferably 2.8 or less, and even more preferably 2.7 or less.
  • the lower limit of this numerical range is preferably 0.2 or more, more preferably 0.3 or more, and further preferably 0.4 or more.
  • the degree of substitution means the average number of acetylated (acylated) groups of three hydroxyl groups per glucose unit.
  • Cellulose acetate may have, for example, the above-mentioned substituent T.
  • the hydrogen atom at the terminal in the formula (AC-1) may be substituted with a substituent (for example, another sugar).
  • the weight average molecular weight of acylcellulose is preferably 10,000 to 300,000.
  • the upper limit of this numerical range is preferably 200,000 or less, more preferably 150,000 or less, and even more preferably 120,000 or less.
  • the lower limit of this numerical range is preferably 20,000 or more, more preferably 50,000 or more, and further preferably 80,000 or more.
  • the content of acyl cellulose in the temporary adhesive film is preferably 50 to 100% by mass.
  • the upper limit of this numerical range may be 98% by mass or less, 95% by mass or less, or 93% by mass or less.
  • the lower limit of this numerical range is preferably 70% by mass or more, more preferably 80% by mass or more, and further preferably 85% by mass or more.
  • the acyl cellulose in the temporary adhesive film may be composed of one kind alone or a mixture containing two or more kinds of acyl cellulose. When the acylcellulose is a mixture, it is preferable that the total amount thereof is in the above range.
  • the resin used for the temporary adhesive film for example, an elastomer can also be used. Since the temporary adhesive film contains an elastomer, it can follow the fine irregularities of the base material and the support, and can form a film having excellent adhesiveness by an appropriate anchor effect. Further, when the chip is peeled from the support, the chip can be easily peeled from the support without applying stress to the chip, and damage or peeling of the device or the like on the base material can be prevented.
  • an elastomer means a polymer compound exhibiting elastic deformation. That is, it is a polymer compound having a property of being instantly deformed in response to the external force when an external force is applied and recovering to the original shape in a short time when the external force is removed.
  • an elastomer can be elastically deformed to a length of 200% by applying an external force and pulling both ends when the length of the original shape is 100% at room temperature (23 ° C.), and the external force is applied. It is preferable to have a property of returning to a length of 130% in a short time when the above is removed.
  • the elastomer has a 5% thermogravimetric reduction temperature raised from 25 ° C. to 20 ° C./min at 375 ° C. or higher, preferably 380 ° C. or higher, further preferably 390 ° C. or higher, and 400 ° C. or higher.
  • the upper limit is not particularly limited, but is preferably 1000 ° C. or lower, more preferably 800 ° C. or lower, for example. According to this aspect, it is easy to form a film such as a sheet having excellent heat resistance.
  • the mass reduction temperature is a value measured by a thermogravimetric analyzer (TGA) under the above-mentioned temperature rising conditions under a nitrogen stream.
  • TGA thermogravimetric analyzer
  • the glass transition temperature of the elastomer (hereinafter, also referred to as “Tg”) is preferably ⁇ 50 to 300 ° C., more preferably 0 to 200 ° C.
  • Tg is in the above range, it has good followability to the surface of the device wafer at the time of bonding, and a film such as a void-free sheet can be formed.
  • the value of Tg means the lower glass transition temperature.
  • the weight average molecular weight of the elastomer is preferably 2,000 to 200,000, more preferably 10,000 to 200,000, and particularly preferably 50,000 to 100,000. Within this range, since the elastomer exhibits excellent solubility in a solvent, there is an advantage that no residue remains on the chip when the temporary adhesive film is removed.
  • the elastomer includes an elastomer containing a repeating unit derived from styrene (polystyrene-based elastomer), a polyester-based elastomer, a polyolefin-based elastomer, a polyurethane-based elastomer, a polyamide-based elastomer, a polyacrylic elastomer, a silicone-based elastomer, and a polyimide-based elastomer.
  • Etc. can be used.
  • polystyrene-based elastomers One or more selected from polystyrene-based elastomers, polyester-based elastomers, polyolefin-based elastomers, polyurethane-based elastomers, polyamide-based elastomers, polyacrylic elastomers, silicone-based elastomers, and polyimide-based elastomers is preferable, and from the viewpoint of solubility, heat resistance, and the like.
  • Polystyrene elastomers are particularly preferred.
  • the polystyrene-based elastomer is not particularly limited and can be appropriately selected according to the purpose.
  • SBS styrene-butadiene-styrene block copolymer
  • SIS styrene-isoprene-styrene block copolymer
  • SEBS styrene-ethylene-butylene-styrene block copolymer
  • SBBS copolymers
  • SEPS styrene-ethylene-propylene-styrene block copolymers
  • SEPS styrene-ethylene-ethylene-propylene-styrene block copolymers
  • the content of the repeating unit derived from styrene in the polystyrene-based elastomer is preferably 40% by mass or more, preferably 45% by mass or more, and more preferably 46% by mass or more.
  • the upper limit can be, for example, 90% by mass or less, or 85% by mass or less.
  • the polystyrene-based elastomer is preferably a block copolymer of styrene and another monomer, more preferably a block copolymer having one end or both ends being a styrene block, and both ends being a styrene block. It is particularly preferable that it is a block copolymer. If both ends of the polystyrene-based elastomer are styrene blocks (repeating units derived from styrene), the heat resistance is further improved. This is because a repeating unit derived from styrene, which has high heat resistance, is present at the end.
  • the styrene block is a reactive polystyrene-based hard block, it tends to be more excellent in heat resistance and chemical resistance, which is preferable.
  • the phase separation between the hard block and the soft block is performed at 200 ° C. or higher by using an elastomer which is a block copolymer.
  • the shape of the phase separation is considered to contribute to the suppression of the occurrence of unevenness on the substrate surface of the device wafer.
  • such elastomers are more preferred from the standpoint of solvent solubility and resistance to resist solvents.
  • polystyrene-based elastomers when hydrogenated, their stability against heat is improved, and deterioration such as decomposition and polymerization is unlikely to occur. Further, it is more preferable from the viewpoint of solubility in a solvent and resistance to a resist solvent.
  • the "styrene-derived repeating unit” is a styrene-derived structural unit contained in the polymer when styrene or a styrene derivative is polymerized, and may have a substituent.
  • the styrene derivative include ⁇ -methylstyrene, 3-methylstyrene, 4-propylstyrene, 4-cyclohexylstyrene and the like.
  • the substituent include an alkyl group having 1 to 5 carbon atoms, an alkoxy group having 1 to 5 carbon atoms, an alkoxyalkyl group having 1 to 5 carbon atoms, an acetoxy group, a carboxy group and the like.
  • elastomers for example, polyester-based elastomers, polyolefin-based elastomers, polyurethane-based elastomers, polyamide-based elastomers, polyacrylic elastomers, silicone-based elastomers, polyimide-based elastomers, etc.
  • elastomers for example, polyester-based elastomers, polyolefin-based elastomers, polyurethane-based elastomers, polyamide-based elastomers, polyacrylic elastomers, silicone-based elastomers, polyimide-based elastomers, etc.
  • the elastomer is preferably a hydrogenated product.
  • a polystyrene-based elastomer hydrogenated product is preferable.
  • the elastomer is a hydrogenated product, it is easy to form a film such as a sheet having excellent heat resistance. Furthermore, it is easy to form a film such as a sheet having excellent peelability and cleaning / removing property after peeling. The above effect is remarkable when a polystyrene-based elastomer hydrogenated product is used.
  • the hydrogenated product means a polymer having a structure in which an elastomer is hydrogenated.
  • the elastomer preferably contains 10 to 100% by mass of polystyrene-based elastomer, more preferably 80 to 100% by mass, further preferably 90 to 100% by mass, and 95 to 100% by mass. It is more preferable that the mixture is substantially composed of a polystyrene-based elastomer only. Further, among them, it is more preferable that the polystyrene-based elastomer hydrogenated product is contained in the above ratio.
  • the content of the elastomer in the temporary adhesive film is preferably 50 to 100% by mass.
  • the upper limit of this numerical range may be 98% by mass or less, 95% by mass or less, or 93% by mass or less.
  • the lower limit of this numerical range is preferably 70% by mass or more, more preferably 80% by mass or more, and further preferably 85% by mass or more.
  • the elastomer may contain a plurality of the types listed above. When the resin in the temporary adhesive film contains a plurality of elastomers, the total amount thereof is preferably in the above range.
  • thermoplastic resin other than the above-mentioned polyvinyl acetal, polymethyl methacrylate, cellulose acetate and elastomer (hereinafter, also simply referred to as “other thermoplastic resin”) can also be used.
  • Other thermoplastic resins may be used alone or in combination of two or more.
  • Specific examples of other thermoplastic resins include acrylic resin, polyvinyl alcohol resin, polyvinyl acetal resin, polyvinylpyrrolidone resin, cycloolefin resin, thermoplastic siloxane resin, unsaturated polyester resin, thermoplastic polyimide resin, and polyvinyl chloride.
  • Examples thereof include resins, polyvinyl acetate resins, polycarbonate resins, polyphenylene ether resins, polybutylene terephthalate resins, polyethylene terephthalate resins, polyphenylene sulfide resins, polysulfone resins, polyether sulfone resins, polyarylate resins, and cellulose resins.
  • acrylic resins as other thermoplastic resins include 2-ethylhexyl (meth) acrylate, ethyl (meth) acrylate, n-propyl (meth) acrylate, isopropyl (meth) acrylate, pentyl (meth) acrylate, and n-octyl.
  • examples thereof include Mitsubishi Rayon Co., Ltd., Acrypet MF 001, 3M Japan Ltd., LC-5320 F1035, and
  • the acrylic resin may be a compound obtained by copolymerizing a (meth) acrylate monomer and another monomer without departing from the spirit of the present invention.
  • the amount of the other monomer is preferably 10 mol% or less of the total monomer.
  • the content of the resin in the temporary adhesive film is preferably 8% by mass or more.
  • the upper limit of this numerical range is preferably 30% by mass or less, more preferably 26% by mass or less, and further preferably 22% by mass or less.
  • the lower limit of this numerical value range is preferably 10% by mass or more, more preferably 11% by mass or more, and further preferably 12% by mass or more.
  • the resin in the temporary adhesive film may be composed of one kind alone or a mixed resin containing two or more kinds of resins. When the resin is a mixed resin, it is preferable that the total amount thereof is in the above range.
  • the thickness of the temporary adhesive film in the laminated body is preferably 10 to 100 ⁇ m.
  • the thickness of the temporary adhesive film is within the above range, the thickness of the temporary adhesive film is within an appropriate range on the chip peeled from the support, and the function of the temporary adhesive film as a protective film is more effectively exhibited.
  • the upper limit of this numerical range is preferably 90 ⁇ m or less, more preferably 85 ⁇ m or less, and further preferably 80 ⁇ m or less.
  • the lower limit of this numerical value range is preferably 15 ⁇ m or more, more preferably 20 ⁇ m or more, and further preferably 30 ⁇ m or more.
  • the thickness of the temporary adhesive film on the chip is preferably 10 to 100 ⁇ m.
  • the upper limit of this numerical range is preferably 90 ⁇ m or less, more preferably 85 ⁇ m or less, and further preferably 80 ⁇ m or less.
  • the lower limit of this numerical value range is preferably 15 ⁇ m or more, more preferably 20 ⁇ m or more, and further preferably 30 ⁇ m or more.
  • the temporary adhesive film may contain a plasticizer, if necessary.
  • a plasticizer phthalates, fatty acid esters, aromatic polyvalent carboxylic acid esters, polyesters and the like can be used.
  • phthalates examples include DMP, DEP, DBP, # 10, BBP, DOP, DINP, DIDP (above, manufactured by Daihachi Chemical Industry Co., Ltd.), PL-200, DOIP (above, manufactured by CGG Ester Co., Ltd.), Examples include Sun Associate DUP (manufactured by New Japan Chemical Co., Ltd.).
  • fatty acid esters examples include butyl stearate, Unistar M-9676, Unistar M-2222SL, Unistar H-476, Unistar H-476D, Panaceto 800B, Panaceto 875, Panaceto 810 (all manufactured by NOF CORPORATION), and DBA. , DIBA, DBS, DOA, DINA, DIDA, DOS, BXA, DOZ, DESU (all manufactured by Daihachi Chemical Industry Co., Ltd.) and the like.
  • aromatic polyvalent carboxylic acid ester examples include TOTM, monosizer W-705 (above, manufactured by Daihachi Chemical Industry Co., Ltd.), UL-80, UL-100 (above, manufactured by ADEKA Corporation), and the like.
  • polyester examples include Polysizer TD-1720, Polysizer S-2002, Polysizer S-2010 (all manufactured by DIC Corporation), BAA-15 (manufactured by Daihachi Chemical Industry Co., Ltd.) and the like.
  • plasticizers DIDP, DIDA, TOTM, Unistar M-2222SL, and Polysizer TD-1720 are preferable, DIDA and TOTM are more preferable, and TOTM is particularly preferable. Only one type of plasticizer may be used, or two or more types may be combined.
  • thermoplasticity of cellulose acetate is relatively small, it is useful to add a plasticizer to cellulose acetate.
  • Preferred plasticizers for cellulose acetate are, for example, triethyl citrate, acetyl triethyl citrate, dibutyl phthalate (DBP), diaryl phthalate, diethyl phthalate (DEP), dimethyl phthalate (DMP), di-2 phthalate.
  • the temperature at which the mass of the plasticizer decreases by 1% by mass when the mass change is measured under a nitrogen flow and a constant rate of temperature of 20 ° C./min It is preferably 250 ° C. or higher, more preferably 270 ° C. or higher, and particularly preferably 300 ° C. or higher.
  • the upper limit is not particularly specified, but can be, for example, 500 ° C. or lower.
  • the amount of the plasticizer added is preferably 0.01% by mass to 5.0% by mass, more preferably 0.1% by mass to 2.0% by mass in the temporary adhesive film.
  • the temporary adhesive film may contain an antioxidant.
  • an antioxidant a phenol-based antioxidant, a sulfur-based antioxidant, a phosphorus-based antioxidant, a quinone-based antioxidant, an amine-based antioxidant and the like can be used.
  • phenolic antioxidant examples include p-methoxyphenol, 2,6-di-tert-butyl-4-methylphenol, Irganox1010, Irganox1330, Irganox3114, Irganox1035 (all manufactured by BASF Japan Ltd.), Sumilizer MDP- Examples include S and Sumilizer GA-80 (all manufactured by Sumitomo Chemical Co., Ltd.).
  • sulfur-based antioxidant examples include 3,3'-thiodipropionate distearyl, Sumilizer TPM, Sumilizer TPS, Sumilizer TP-D (all manufactured by Sumitomo Chemical Co., Ltd.) and the like.
  • phosphorus-based antioxidants include tris (2,4-di-tert-butylphenyl) phosphite, bis (2,4-di-tert-butylphenyl) pentaerythritol diphosphite, and poly (dipropylene glycol).
  • examples thereof include phenylphosphite, diphenylisodecylphosphite, 2-ethylhexyldiphenylphosphite, triphenylphosphite, Irgafos168, Irgafos38 (all manufactured by BASF Japan Co., Ltd.) and the like.
  • quinone-based antioxidant examples include p-benzoquinone and 2-tert-butyl-1,4-benzoquinone.
  • amine-based antioxidants examples include dimethylaniline and phenothiazine.
  • Irganox1010, Irganox1330, 3,3'-thiodipropionate distearyl and Sumilizer TP-D are preferable, Irganox1010 and Irganox1330 are more preferable, and Irganox1010 is particularly preferable.
  • a phenol-based antioxidant in combination with a sulfur-based antioxidant or a phosphorus-based antioxidant, and a phenol-based antioxidant and a sulfur-based antioxidant are used in combination. Is most preferable.
  • a polystyrene-based elastomer is used as the elastomer
  • a phenol-based antioxidant and a sulfur-based antioxidant in combination. With such a combination, it is expected that the deterioration of the temporary adhesive composition due to the oxidation reaction can be efficiently suppressed.
  • Irganox1010 and Sumilizer TP-D As the combination of antioxidants, Irganox1010 and Sumilizer TP-D, Irganox1330 and Sumilizer TP-D, and Sumilizer GA-80 and Sumilizer TP-D are preferable, and Irganox1010 and SumilizerTP-D, Irganox1010 and SumilizerTP-D, Ir. More preferred, Irganox 1010 and Sumilizer TP-D are particularly preferred.
  • the molecular weight of the antioxidant is preferably 400 or more, more preferably 600 or more, and particularly preferably 750 or more.
  • the content of the antioxidant is preferably 0.001 to 20.0% by mass, preferably 0.005 to 10.0% by mass in the temporary adhesive film. Is more preferable. Only one type of antioxidant may be used, or two or more types may be used. When there are two or more kinds of antioxidants, it is preferable that the total amount thereof is in the above range.
  • the composition for temporary adhesion used in the present invention is, as long as the effect of the present invention is not impaired, in addition to the above-mentioned additives, various additives such as a curing agent, a curing catalyst, a filler, and adhesion promotion are required. Agents, ultraviolet absorbers, anti-aggregation agents and the like can be blended. When these additives are blended, the total blending amount is preferably 3% by mass or less of the total solid content of the temporary adhesive composition.
  • the temporary adhesive film may have a single-layer structure or a multi-layer structure.
  • the temporary adhesive film can include one or more resin layers made of each of the above resins.
  • the temporary adhesive film may include a release layer described later in the surface layer portion on the support side.
  • the support is a member for fixing the laminated body to the dicing frame during the dicing process, and is generally also called a dicing tape.
  • the support may have a single-layer structure or a multi-layer structure. That is, the support can consist of a single-layer or multi-layer support film as a base.
  • the support can include an adhesive layer formed on the support film.
  • the support can include a release layer described later in the surface layer portion on the temporary adhesive film side.
  • the support preferably has elasticity so that it can be expanded (expanded) and easily taken out after dicing. Further, the support preferably has light transmission property when an adhesive layer made of an ultraviolet curable resin composition is used as described later.
  • the material of the support film constituting the support is not particularly limited, and may be appropriately selected from known polymer materials for resin films.
  • the polymer materials constituting the support film include, for example, polyethylene, polypropylene, ethylene / propylene copolymers and polyolefins such as polybutene, ethylene / vinyl acetate copolymers, ethylene / (meth) acrylate copolymers, and the like.
  • Ethylene copolymers such as ionomers, including copolymers of ethylene / (meth) acrylic acid esters, and copolymers of ethylene / (meth) acrylic acid metal salts, polyesters such as polyethylene terephthalate and polybutylene terephthalate, Acrylics such as polymethylmethacrylate, polyvinyl chlorides, polycarbonates, polyacetals, polyamides, polyimides, polyurethanes, polystyrenes, natural rubbers, synthetic rubbers and the like are preferred.
  • the support film may be composed of a mixed resin in which two or more kinds selected from these groups are mixed, or may have a structure in which two or more kinds of resins are multi-layered.
  • the material of the support can be arbitrarily selected in consideration of the adhesiveness with the adhesive layer.
  • the thickness of the support film is not particularly limited, and is preferably 50 to 300 ⁇ m, for example.
  • the upper limit of this numerical range is preferably 250 ⁇ m or less, more preferably 200 ⁇ m or less, and even more preferably 160 ⁇ m or less.
  • the lower limit of this numerical value range is preferably 60 ⁇ m or more, more preferably 70 ⁇ m or more, and further preferably 90 ⁇ m or more.
  • the adhesive layer that can form the support has sufficient adhesiveness to suppress the scattering of the base material such as a semiconductor device during dicing.
  • the material of the adhesive layer is not particularly limited, and conventionally known adhesive materials such as acrylic resin, urethane resin, and silicone resin can be included.
  • the adhesive layer is preferably made of a curable composition that is cured by applying heat or energy rays. As a result, the adhesive layer can be appropriately cured by applying heat or energy rays, and the adhesive force to the temporary adhesive film can be reduced. As a result, peeling is likely to occur more effectively at the adhesive interface between the support and the temporary adhesive film, and the strength of the temporary adhesive film as a protective film is likely to be secured.
  • the curable composition is preferably a composition that is cured by irradiation with energy rays, and more preferably a composition that is cured by irradiation with ultraviolet rays.
  • the curable composition contains, for example, a monomer or oligomer having a polymerizable functional group, and a polymerization initiator.
  • the adhesiveness of the adhesive layer can be appropriately controlled by controlling the crosslink density of the adhesive material.
  • the cross-linking density of the adhesive material is controlled by, for example, a method of cross-linking with an appropriate cross-linking agent such as a polyfunctional isocyanate compound, an epoxy compound, a melamine compound, a metal salt compound, a metal chelate compound, an amino resin compound and a peroxide.
  • a compound having two or more carbon-carbon double bonds can be mixed and subjected to an appropriate method such as a method of cross-linking by irradiation with energy rays or the like.
  • the curable composition may optionally contain one or more other additives such as polymerization inhibitors, antioxidants, leveling agents, thickeners, thickeners, surfactants and fillers. You may. Further, the ultraviolet curable composition may contain a solvent from the viewpoint of improving the applicability of the composition.
  • the thickness of the adhesive layer is not particularly limited, and is preferably 5 to 100 ⁇ m, for example.
  • the upper limit of this numerical range is preferably 80 ⁇ m or less, more preferably 70 ⁇ m or less, and further preferably 60 ⁇ m or less.
  • the lower limit of this numerical value range is preferably 10 ⁇ m or more, and may be 15 ⁇ m or more or 20 ⁇ m or more.
  • the thickness of the entire support is preferably 60 to 300 ⁇ m.
  • the upper limit of this numerical range is preferably 250 ⁇ m or less, more preferably 200 ⁇ m or less, and even more preferably 160 ⁇ m or less.
  • the lower limit of this numerical value range is preferably 70 ⁇ m or more, more preferably 80 ⁇ m or more, and further preferably 100 ⁇ m or more.
  • the following commercially available dicing tape can also be used as the support.
  • HAE-1503, HAE-1603, UC-334EP-85, UC-353EP-110A, UC3026M-110, UC3044M-110B all manufactured by Furukawa Electric Co., Ltd.
  • the temporary adhesive film contains a release layer in the surface layer portion on the support side, or the support includes a release layer in the surface layer portion on the temporary adhesive film side.
  • the release layer is a part of the temporary adhesive film, and if the release layer is on the support side, the release layer is used. Is part of the support.
  • the release layer has a function of promoting separation between the support and the temporary adhesive film.
  • the thickness of the release layer in the laminate is preferably 10 to 100 ⁇ m.
  • the upper limit of this numerical range is preferably 90 ⁇ m or less, more preferably 85 ⁇ m or less, and further preferably 80 ⁇ m or less. Further, the lower limit of this numerical value range is preferably 15 ⁇ m or more, more preferably 20 ⁇ m or more, and further preferably 30 ⁇ m or more.
  • the release layer preferably contains a surfactant, preferably contains at least one of a fluorine-based surfactant and a silicone-based surfactant, and is a fluorine-based surfactant and a silicone-based surfactant. It preferably consists of at least one type.
  • the fluorine content in the fluorine-based surfactant is preferably 3 to 40% by mass.
  • the fluorine content is the ratio of the mass of all fluorine atoms to the molecular weight.
  • the upper limit is more preferably 30% by mass or less, and particularly preferably 25% by mass or less.
  • the lower limit is more preferably 5% by mass or more, and particularly preferably 7% by mass or more.
  • a surfactant having a fluorine content within this range is effective in terms of uniformity of the thickness of the coating film and liquid saving property, and also has good peelability of the temporary adhesive layer.
  • the fluorine-based surfactant is not particularly limited, but a fluorine-based surfactant that does not contain perfluorooctanoic acid (PFOA) or perfluorooctanesulfonic acid (PFOS) is preferable.
  • PFOA perfluorooctanoic acid
  • PFOS perfluorooctanesulfonic acid
  • Examples of the fluorine-based surfactant that can be used in the present invention include commercially available products, Megafuck F142D, F172, F173, F176, F177, F183, F479, F482, and F554.
  • F780, F781, F781-F, R30, R08, F-472SF, BL20, R-61, R-90 (manufactured by DIC Co., Ltd.), Florard FC-135, FC- 170C, FC-430, FC-431, Novec FC-4430 (manufactured by Sumitomo 3M Co., Ltd.), Asahi Guard AG7105, AG7000, AG950, AG7600, Surfron S-112, S-113, S -131, S-141, S-145, S-381, S-382, SC-101, SC-102, SC-103, SC-104, SC-105, SC -106 (manufactured by AGC Seimi Chemical Co., Ltd.), Ftop EF301, EF303, EF351, EF352, EF801, EF802 (manufactured by Mitsubishi Materials Electronics Co., Ltd.), Fluorent 250 (manufactured by Neos Co., Ltd.) Can be mentioned.
  • KP manufactured by Shin-Etsu Chemical Co., Ltd.
  • Polyflow manufactured by Kyoeisha Chemical Co., Ltd.
  • PolyFox manufactured by OMNOVA
  • silicone-based surfactant examples include compounds containing Si—O bonds, such as silicone oil, silane coupling agent, silicone resin, silicone rubber, and cyclic siloxane, and silicone oil is preferable.
  • the silicone-based surfactant does not contain a reactive group such as a polymerizable group.
  • the silicone-based surfactant is preferably a polyether-modified silicone.
  • the ratio of the polyether-modified silicone represented by the formula (A) is 80% or more.
  • MO is the mol% of methylene oxide contained in the polyether structure in the polyether-modified silicone
  • EO is the mol% of ethylene oxide contained in the polyether structure in the polyether-modified silicone
  • AO refers to the mol% of alkylene oxide contained in the polyether structure in the polyether-modified silicone.
  • the ratio represented by the above formula (A) is preferably 90% or more, more preferably 95% or more, further preferably 98% or more, still more preferably 99% or more. , 100% is even more preferable.
  • the weight average molecular weight of the polyether-modified silicone is preferably 500 to 100,000, more preferably 1,000 to 50,000, and even more preferably 2,000 to 40,000.
  • the polyether-modified silicone is obtained when the polyether-modified silicone is heated from 20 ° C. to 280 ° C. at a heating rate of 20 ° C./min under a nitrogen flow of 60 mL / min and held at a temperature of 280 ° C. for 30 minutes.
  • the mass reduction rate is preferably 50% by mass or less. By using such a compound, the surface texture after processing of the substrate accompanied by heating is further improved.
  • the mass reduction rate of the polyether-modified silicone is preferably 45% by mass or less, more preferably 40% by mass or less, further preferably 35% by mass or less, still more preferably 30% by mass or less.
  • the lower limit of the mass reduction rate of the polyether-modified silicone may be 0% by mass, but 15% by mass or more, further 20% by mass or more is a sufficiently practical level.
  • the light refractive index of the polyether-modified silicone is preferably 1.440 or less.
  • the lower limit is not particularly defined, but even if it is 1.400 or more, it is a sufficiently practical level.
  • the content of the polyoxyalkylene group in the molecule of the polyether-modified silicone is not particularly limited, but it is desirable that the content of the polyoxyalkylene group exceeds 1% by mass in the total molecular weight.
  • the content of the polyoxyalkylene group is defined by " ⁇ (the formula amount of the polyoxyalkylene group in one molecule) / the molecular weight of one molecule ⁇ x 100".
  • silane coupling agent examples include a fluorine atom-containing silane coupling agent, and triethoxy (1H, 1H, 2H, 2H-nonafluorohexyl) silane is preferable.
  • examples of the silane coupling agent include JP-A-62-036663, JP-A-61-226746, JP-A-61-226745, JP-A-62-170950, and JP-A. 63-034540, 07-230165, 08-062834, 09-054432, 09-005988, 2001-330953, respectively. Surfactants are also mentioned and these descriptions are incorporated herein.
  • silicone-based surfactant used in the present invention a commercially available product can also be used.
  • the silicone-based surfactants include the trade names "BYK-300”, “BYK-306", “BYK-310", “BYK-315”, “BYK-313", “BYK-320”, and “BYK”. -322 “,” BYK-323 “,” BYK-325 “,” BYK-330 “,” BYK-333 “,” BYK-337 “,” BYK-341 ",” BYK-344 “,” BYK-370 “ , “BYK-375”, “BYK-UV3500”, “BYK-UV3510", “BYK-UV3570", “BYK-3550”, “BYK-SILCLEAN3700”, “BYK-SILCLEAN3720” (Manufactured by Co., Ltd.), product names “AC FS 180", “AC FS 360”, “AC S 20” (above, manufactured by Algin Chemie), product names “Polyflow KL-400X”, “Polyflow KL-400HF”, “Polyflow
  • the release layer can be formed, for example, by applying the above-mentioned surfactant as it is to a temporary adhesive film or a support to form a film. Further, if necessary, a composition in which the above-mentioned surfactant is dissolved in a solvent may be applied to the temporary adhesive film or the support.
  • the temporary adhesive composition is a composition used for forming a temporary adhesive film.
  • the composition for temporary adhesion contains the above-mentioned material component of the temporary adhesive film as a solid content, and can contain a solvent if necessary.
  • the temporary adhesive film is formed by applying a solvent-containing temporary adhesive composition to the surface of a support or a base material and drying the composition.
  • the temporary adhesive film is formed by attaching a temporary adhesive film formed in a sheet shape to the surface of the support or the base material.
  • the solvent used in the temporary bonding composition is preferably an organic solvent.
  • Organic solvents include ethyl acetate, -n-butyl acetate, isobutyl acetate, amyl formate, isoamyl acetate, butyl propionate, isopropyl butyrate, ethyl butyrate, butyl butyrate, methyl lactate, ethyl lactate, alkyloxyoxyacetate (eg alkyl).
  • Methyl oxyacetate, ethyl alkyloxyacetate, butyl alkyloxyacetate eg, methyl methoxyacetate, ethyl methoxyacetate, butyl methoxyacetate, methyl ethoxyacetate, ethyl ethoxyacetate, etc.
  • 3-alkyloxypropionate alkyl esters eg) : Methyl 3-alkyloxypropionate, ethyl 3-alkyloxypropionate, etc.
  • 2-alkyloxypropionate alkyl esters eg, methyl 2-alkyloxypropionate, ethyl 2-alkyloxypropionate, propyl 2-alkyloxypropionate, etc.
  • Esters such as methyl, ethyl 2-oxobutate, 1-methoxy-2-propyl acetate; Diethylene glycol dimethyl ether, tetrahydrofuran, ethylene glycol monomethyl ether, ethylene glycol monoethyl ether, methyl cellosolve acetate, ethyl cellosolve acetate, diethylene glycol monomethyl ether, diethylene glycol monoethyl ether, diethylene glycol monobutyl ether, propylene glycol monomethyl ether, propylene glycol monomethyl ether acetate, propylene glycol Ethers such as monoethyl ether acetate and propylene glycol monopropyl ether acetate; Ketones such as methyl ethyl ketone, cyclohexanone, 2-heptanone, 3-heptanone, N-methyl-2-pyrrolidone, ⁇ -butyrolactone; Toluene, xylene, anisole
  • these solvents from the viewpoint of improving the properties of the coated surface.
  • Ethyl lactate diethylene glycol dimethyl ether, butyl acetate, methyl 3-methoxypropionate, 2-heptanone, cyclohexanone, cyclopentanone, ethylcarbitol acetate, butylcarbitol acetate, propylene glycol methyl ether, and propylene glycol methyl ether acetate. It is a mixed solution composed of two or more kinds.
  • the content of the solvent in the temporary adhesive composition is preferably such that the total solid content concentration of the composition is 5 to 80% by mass, more preferably 10 to 50% by mass. It is particularly preferably 12 to 40% by mass.
  • the solvent may be only one type or two or more types. When there are two or more kinds of solvents, it is preferable that the total amount thereof is in the above range.
  • the content of the solvent in the temporary adhesive film obtained by drying is preferably 1% by mass or less, and more preferably 0.1% by mass or less.
  • FIG. 3 is a schematic view showing an example of some steps in the method for producing a laminate of the present invention.
  • the method for producing a laminated body of the present invention is a method for producing the above-mentioned laminated body with a notch by dicing treatment. That is, in the method for producing a laminated body of the present invention, a temporary adhesive film 12 (step A in FIG. 3) formed on the surface of one of the base material 10 and the support 14 (support 14 in FIG. 3) is used as a base material. Adhesion to the surface of 10 and the other of the support 14 (base material 10 in FIG.
  • step B in FIG. 3 step B in FIG. 3
  • step C) of FIG. the first adhesive force between the base material 10 and the temporary adhesive film 12 is equal to or greater than the second adhesive force between the temporary adhesive film 12 and the support 14.
  • the temporary adhesive film is formed by using the above-mentioned temporary adhesive composition.
  • the method for forming the temporary adhesive film is not particularly limited, and as such a method, for example, a method of applying the temporary adhesive composition to one surface of the base material and the support and drying the composition, and a method of preliminarily drying the film.
  • the release layer it may be formed on the surface of the support or the surface of the temporary adhesive film before the support and the temporary adhesive film are adhered to each other.
  • Examples of the method for applying the composition for temporary bonding include a spin coating method, a slit coating method, a spiral coating method, a spray coating method, a screen printing method, an inkjet method, a casting coating method, a roll coating method and a dropping method (drop casting).
  • the application method is preferably a spin coating method, a slit coating method or a spiral coating method.
  • the drying conditions of the applied temporary bonding composition can be adjusted as appropriate, for example, by heating at 80 to 270 ° C. (preferably 150 to 210 ° C.) for 0.5 to 5 minutes (preferably 1 to 4 minutes). Can be done.
  • step B as a method of adhering the temporary adhesive film 12 to the base material 10 or the support 14, for example, a method using a crimping device is preferable. Further, in the bonding using the crimping device, it is preferable to individually or simultaneously apply heat and pressure to the base material, the temporary adhesive film and the support, and it is more preferable to perform both of them at the same time.
  • the heating temperature is, for example, 50 to 300 ° C., although it depends on the components contained in the temporary bonding composition.
  • the upper limit of this numerical range is preferably 250 ° C. or lower, and more preferably 200 ° C. or lower. Further, the lower limit of this numerical value range is preferably 80 ° C. or higher, and more preferably 100 ° C. or higher.
  • the heating time is, for example, 30 seconds to 30 minutes.
  • the upper limit of this numerical range is preferably 15 minutes or less, and more preferably 5 minutes or less.
  • the lower limit of this numerical range is preferably 45 seconds or longer, and more preferably 1 minute or longer.
  • the pressure is, for example, 0.05 to 3 N / mm 2 .
  • the upper limit of the numerical range it is more preferable is preferably 2.5 N / mm 2 or less, 2N / mm 2 or less.
  • the lower limit of this numerical range is preferably 0.08 N / mm 2 or more, and more preferably 0.1 N / mm 2 or more.
  • the pressure application time is, for example, 30 seconds to 30 minutes.
  • the upper limit of this numerical range is preferably 20 minutes or less, and more preferably 10 minutes or less.
  • the lower limit of this numerical range is preferably 45 seconds or longer, and more preferably 1 minute or longer.
  • the dicing method including forming the notch 16 is not particularly limited, and blade dicing, laser dicing, plasma dicing and the like are appropriately selected.
  • the mode of cutting is not particularly limited, and may be half-cut or full-cut, and any of the full-cut, single-cut, step-cut, bevel-cut, and the like may be used.
  • the depth of cut is appropriately adjusted according to the thickness of the temporary adhesive film and the base material, and is preferably 50% or more of the total thickness of the temporary adhesive film and the base material, for example.
  • the support may be expanded to promote chip formation.
  • the depth of cut is more preferably 70% or more of the total thickness, and further preferably 80% or more of the total thickness. Further, the depth of cut may be 100% of the total thickness (that is, the cut reaches the bonding interface between the temporary adhesive film and the support), and may be 90% or less of the total thickness.
  • the depth of cut may reach the inside of the support within a range that does not interfere with the dicing process, but it is preferable that the depth of the cut does not reach the inside of the support from the viewpoint of stability of the dicing process.
  • the width of the notch can be adjusted as appropriate, for example, 0.01 to 1 mm.
  • the upper limit of this numerical range is preferably 0.5 mm or less, and more preferably 0.3 mm or less.
  • the lower limit of this numerical range is preferably 0.03 mm or more, and more preferably 0.05 mm or more.
  • the shape of the chip is usually rectangular except for the outer edge region of the base material, but it may be another polygonal shape.
  • the size of the chip (length of the maximum side) is not particularly limited, but is, for example, 0.8 to 3 mm.
  • the upper limit of this numerical range may be 2.5 mm or less, or 2 mm or less. Further, the lower limit of this numerical range may be 0.9 mm or more, or 1 mm or more.
  • the temporary adhesive film on the chip after dicing may be physically peeled off manually or by using a machine, but it is preferably performed using an organic solvent.
  • an organic solvent of the same type as the organic solvent used in the temporary bonding composition can be used.
  • a method of applying the solvent to the temporary adhesive film on the chip a known method such as a dip method or a spray method can be appropriately adopted.
  • the temperature of the solvent for removing the temporary adhesive film is, for example, 10 to 50 ° C.
  • the upper limit of this numerical range is preferably 45 ° C. or lower, and more preferably 40 ° C. or lower.
  • the lower limit of this numerical value range is preferably 15 ° C. or higher, and more preferably 20 ° C. or higher.
  • ultrasonic cleaning may be performed by irradiating ultrasonic waves (about 20 to 50 kHz) together with the application of the organic solvent.
  • the method for manufacturing a semiconductor device of the present invention is characterized by including the above-mentioned method for manufacturing a laminate. That is, in the method for manufacturing a semiconductor element of the present invention, a laminated body with a notch is manufactured by the above-mentioned manufacturing method for a laminated body, a chip is taken out from the laminated body, and the semiconductor element is packaged by packaging the chip or the like. It is a method of manufacturing.
  • the semiconductor element manufactured by the manufacturing method of the present invention is, for example, an LSI device, but the semiconductor element of the present invention is not limited to this, and the present invention can be applied to various semiconductor elements.
  • the present invention can be applied to logic integrated circuits such as ASIC (Application Specific Integrated Circuit), FPGA (Field Programmable Gate Array), and ASSP (Application Specific Standard Product), for example. Further, the present invention can be applied to, for example, a microprocessor such as a CPU (Central Processing Unit) and a GPU (Graphics Processing Unit). Further, the present invention provides, for example, DRAM (Dynamic Random Access Memory), HMC (Hybrid Memory Cube), MRAM (Magnetoresistive Random Access Memory), PCM (Phase-Change Memory), ReRAM (Resistance Random Access Memory), FeRAM (Ferroelectric). It can also be applied to memories such as RandomAccessMemory) and flash memory.
  • ASIC Application Specific Integrated Circuit
  • FPGA Field Programmable Gate Array
  • ASSP Application Specific Standard Product
  • the present invention can be applied to, for example, a microprocessor such as a CPU (Central Processing Unit) and a GPU (Graphics Processing Unit).
  • the present invention also applies to analog integrated circuits such as LEDs (Light Emitting Diodes), power devices, DC (Direct Current) -DC (Direct Current) converters, and insulated gate bipolar transistors (Insulated Gate Bipolar Transistors: IGBTs). Applicable.
  • the present invention is also applicable to MEMS (Micro Electro Mechanical Systems) such as acceleration sensors, pressure sensors, oscillators, and gyro sensors. Further, the present invention relates to, for example, GPS (Global Positioning System), FM (Frequency Modulation), NFC (Near field communication), RFEM (RF Expansion Module), MMIC (Monolithic Microwave Integrated Circuit), WLAN (Wireless Local Area Network).
  • GPS Global Positioning System
  • FM Frequency Modulation
  • NFC Near field communication
  • RFEM RF Expansion Module
  • MMIC Monitoring Microlithic Microwave Integrated Circuit
  • WLAN Wireless Local Area Network
  • CMOS Complementary Metal Oxide Semiconductor
  • CMOS image sensors Camera modules
  • Passive devices SAW (Surface Acoustic Wave) filters
  • RF (Radio Frequency) filters IPD (Integrated Passive Devices), etc. Applicable.
  • the final product on which the semiconductor element of the present invention is mounted as described above is not particularly limited, and is, for example, a smart TV, a mobile communication terminal, a mobile phone, a smartphone, a tablet terminal, a desktop PC, a notebook PC, or a network device.
  • Robot switching
  • wired infrastructure equipment digital camera, game machine, controller, data center, server, mining PC, HPC, graphic card, network server, storage, chipset, in-vehicle equipment (electronic control equipment, driving support system) ), Car navigation system, PND, lighting (general lighting, in-vehicle lighting, LED lighting, OLED lighting), TV, display, display panel (liquid crystal panel, organic EL panel, electronic paper), music playback terminal, industrial equipment, industrial use Robots, inspection equipment, medical equipment, white goods, space / aircraft equipment, wearable devices, etc.
  • the base material was sufficiently pressed against the temporary adhesive film (for example, with a force of about 0.5 to 1 N / mm 2 ) to adhere the base material to the temporary adhesive film. As a result, a laminated body before the incision was formed was obtained.
  • dicing was performed by forming a single cut with a depth of 0.75 mm in the vertical and horizontal directions at a pitch of 3 mm on the above-mentioned laminated body before cutting. As a result, a laminated body with a notch divided into 3 mm squares was obtained.
  • Example 3 is an example in which the adhesive layer of the dicing tape is cured by irradiating ultraviolet rays (200 mJ / cm 2 , 30 seconds) from the dicing tape side after dicing and before taking out the chips.
  • R-1 Mega Fvck F-553 (manufactured by DIC Corporation)
  • R-2 KP-341 (manufactured by Shin-Etsu Chemical Co., Ltd.)
  • R-3 Optool DSX (manufactured by Daikin Industries, Ltd.)
  • BX-1 manufactured by Sekisui Chemical Co., Ltd.
  • -P-8 Cellulose acetate (61% vinegarization, LT-35, manufactured by Daicel)
  • -P-9 Cellulose acetate butyrate (Mw70,000. CAB-381-20, manufactured by Tomoe Engineering Co., Ltd.)
  • -P-10 Polymethyl methacrylate (Mw 90,000. Bimodal 80NEN, manufactured by Asahi Kasei Corporation)
  • -P-11 Styrene-butadiene-styrene copolymer (Mw20,000. TR2000, manufactured by JSR Corporation)
  • Base material >> -M-1: Silicon substrate (disk-shaped, thickness 0.7 mm, maximum diameter 200 mm) -M-2: Copper substrate (disk-shaped, thickness 0.8 mm, maximum diameter 200 mm) -M-3: Glass substrate (disk-shaped, thickness 1.1 mm, maximum diameter 200 mm)
  • first adhesive force The adhesive force between the base material and the temporary adhesive film
  • second adhesive force The adhesive force between the support and the temporary adhesive film
  • first adhesive force a temporary adhesive film was formed on the base material, and then the upper temporary adhesive film was pulled up at a speed of 50 mm / min in the direction perpendicular to the lower base material.
  • the first adhesive force was obtained by measuring the external force required for the pulling up.
  • the base material was replaced with a support, and a second adhesive force was obtained by the same method.
  • the pulling force was measured using a force gauge (ZTS-100N, manufactured by Imada Co., Ltd.).
  • the saturated solubility of the resin (saturated solubility (g) in 100 g of water at 23 ° C.) was separately measured by the following method. First, a saturated aqueous solution was prepared by adding a small amount of resin to water at 23 ° C. and stirring the mixture several times. A certain amount of the saturated aqueous solution was taken, the water content and the dissolved mass were calculated from the mass before and after the water was evaporated, and the saturated solubility of the resin in water was obtained based on these values. In the column of "saturated solubility" in the table, in the example using the mixed resin, the saturated solubility of each resin is shown.
  • Example 1 the silicon substrate of Example 1 was replaced with a silicon substrate having a semiconductor circuit formed on the surface, and a chip was produced by the same procedure as in Example 1. At this time, the surface of the silicon substrate on which the semiconductor circuit was formed was adhered to the temporary adhesive film as a surface to be protected. Then, a predetermined semiconductor process was applied to the chip with the temporary adhesive film. Then, the temporary adhesive film adhering to the chip was removed, and the chip was packaged as a semiconductor element. This semiconductor device had no problem in performance.

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  • Organic Chemistry (AREA)
  • Adhesives Or Adhesive Processes (AREA)
  • Laminated Bodies (AREA)

Abstract

This laminate body comprises, in order, a substrate, a temporary adhesive film, and a support body, wherein the substrate and the temporary adhesive film are divided into multiple sections by cuts extending from the substrate to the temporary adhesive film, and a first adhesive strength between the substrate and the temporary adhesive film is greater than or equal to a second adhesive strength between the temporary adhesive film and the support body. Also provided are a temporary adhesive composition for such a laminate body, a laminate body manufacturing method, and a semiconductor element manufacturing method.

Description

仮接着膜を含む積層体、仮接着用組成物、積層体の製造方法および半導体素子の製造方法Laminated body including temporary adhesive film, temporary adhesive composition, manufacturing method of laminated body and manufacturing method of semiconductor element
 本発明は、仮接着膜を含む積層体、仮接着用組成物、積層体の製造方法および半導体素子の製造方法に関する。 The present invention relates to a laminate containing a temporary adhesive film, a composition for temporary adhesion, a method for producing a laminate, and a method for producing a semiconductor element.
 半導体素子の製造工程(半導体プロセス)において、シリコンウェハ等の基材をチップ化するためにダイシング処理が行われる。ダイシング処理は、通常、仮接着膜を介して基材を支持体(一般にダイシングテープとも呼ばれる。)に貼り付けて、基材を固定するための積層体を形成し、ブレードダイシングやレーザダイシングなどによって基材を切断することにより実施される(例えば特許文献1)。 In the semiconductor element manufacturing process (semiconductor process), a dicing process is performed to convert a base material such as a silicon wafer into chips. In the dicing process, a base material is usually attached to a support (generally also called a dicing tape) via a temporary adhesive film to form a laminate for fixing the base material, and blade dicing, laser dicing, or the like is used. It is carried out by cutting the base material (for example, Patent Document 1).
 また、半導体プロセスにおいて、基材の表面に異物が付着したり傷がついたりすることを防止するために、基材の表面に樹脂等からなる保護膜を一時的に形成する技術もよく知られている(例えば特許文献2)。 Further, in a semiconductor process, a technique for temporarily forming a protective film made of resin or the like on the surface of a base material is well known in order to prevent foreign matter from adhering to or scratching the surface of the base material. (For example, Patent Document 2).
特許第5687862号公報Japanese Patent No. 5678682 特開平07-161665号公報Japanese Unexamined Patent Publication No. 07-161665
 半導体プロセスにおいて、ダイシング処理の後にも、いくつかの工程が続く場合があるため、そのような工程において、基材の表面を保護することが好ましい場合がある。 In the semiconductor process, some steps may continue after the dicing process, and it may be preferable to protect the surface of the base material in such steps.
 本発明は上記問題に鑑みてなされたものであり、ダイシング処理後のチップ表面を保護することを可能とする積層体の提供を目的とする。また、本発明は、そのような積層体に関する仮接着用組成物、積層体の製造方法および半導体素子の製造方法の提供を目的とする。 The present invention has been made in view of the above problems, and an object of the present invention is to provide a laminate capable of protecting the chip surface after dicing treatment. Another object of the present invention is to provide a composition for temporary adhesion, a method for producing a laminate, and a method for producing a semiconductor device for such a laminate.
 上記課題は、ダイシングの際に基材を支持体に固定するための仮接着膜を保護膜として使用できるようにすることにより、解決できた。具体的には、以下の<1>の手段により、好ましくは<2>以降の手段により、上記課題は解決された。
<1>
 基材と、仮接着膜と、支持体とを順に有する積層体であって、
 基材および仮接着膜が、基材から仮接着膜まで延びる切込みによって、複数に分割されており、
 基材および仮接着膜の間の第1の接着力が、仮接着膜および支持体の間の第2の接着力以上である、積層体。
<2>
 第1の接着力および第2の接着力の差が10~100N/mmである、
 <1>に記載の積層体。
<3>
 第2の接着力が20~100N/mmである、
 <1>または<2>に記載の積層体。
<4>
 仮接着膜の厚さが10~100μmである、
 <1>~<3>のいずれか1つに記載の積層体。
<5>
 基材を支持体から剥離した後において、基材上の仮接着膜の厚さが、10~100μmである、
 <1>~<4>のいずれか1つに記載の積層体。
<6>
 仮接着膜が支持体側の表層部分に剥離層を含む、
 <1>~<5>のいずれか1つに記載の積層体。
<7>
 支持体が仮接着膜側の表層部分に剥離層を含む、
 <1>~<5>のいずれか1つに記載の積層体。
<8>
 剥離層が界面活性剤を含む、
 <6>または<7>に記載の積層体。
<9>
 剥離層の厚さが0.1~10μmである、
 <6>~<8>のいずれか1つに記載の積層体。
<10>
 仮接着膜が非硬化性の樹脂を含む、
 <1>~<9>のいずれか1つに記載の積層体。
<11>
 仮接着膜が非水溶性の樹脂を含む、
 <1>~<10>のいずれか1つに記載の積層体。
<12>
 仮接着膜が、23℃の水100gへの飽和溶解度が0.9g以下である樹脂を含む、<1>~<11>のいずれか1つに記載の積層体。
<13>
 仮接着膜が、ポリビニルアセタール、ポリメタクリル酸アルキルおよびアシルセルロースからなる群より選択される少なくとも1種の樹脂を含む、
 <1>~<12>のいずれか1つに記載の積層体。
<14>
 仮接着膜が、酸化防止剤を含む、
 <1>~<13>のいずれか1つに記載の積層体。
<15>
 基材が仮接着膜側の表層部分に半導体回路を含み、
 支持体がダイシングテープである、
 <1>~<14>のいずれか1つに記載の積層体。
<16>
 <1>~<15>のいずれか1つに記載の積層体における仮接着膜の形成に使用される仮接着用組成物。
<17>
 基材および支持体の一方の表面に形成された仮接着膜を、基材および支持体の他方の表面に接着すること、および
 その後、基材から仮接着膜まで延びる切込みを形成することを含む、積層体の製造方法であって、
 基材および仮接着膜の間の第1の接着力が、仮接着膜および支持体の間の第2の接着力以上である、積層体の製造方法。
<18>
 さらに、基材および支持体の一方の表面に仮接着膜を形成する工程を含み、
 仮接着膜を形成する工程において、仮接着用組成物を基材または支持体の表面に適用し、その後、仮接着用組成物を乾燥させることを含む、
 <17>に記載の積層体の製造方法。
<19>
 仮接着用組成物を基材または支持体の表面に適用する方法が、スピンコート法、スリットコート法またはスパイラルコート法である、
 <18>に記載の積層体の製造方法。
<20>
 <17>~<19>のいずれか1つに記載の積層体の製造方法を含む、半導体素子の製造方法。
The above problem can be solved by making it possible to use a temporary adhesive film for fixing the base material to the support as a protective film during dicing. Specifically, the above-mentioned problems have been solved by the following means of <1>, preferably by the means of <2> and thereafter.
<1>
A laminate having a base material, a temporary adhesive film, and a support in this order.
The base material and the temporary adhesive film are divided into a plurality of parts by a notch extending from the base material to the temporary adhesive film.
A laminate in which the first adhesive force between the base material and the temporary adhesive film is equal to or greater than the second adhesive force between the temporary adhesive film and the support.
<2>
The difference between the first adhesive force and the second adhesive force is 10 to 100 N / mm 2 .
The laminate according to <1>.
<3>
The second adhesive force is 20-100 N / mm 2 .
The laminate according to <1> or <2>.
<4>
The thickness of the temporary adhesive film is 10 to 100 μm.
The laminate according to any one of <1> to <3>.
<5>
After the base material is peeled off from the support, the thickness of the temporary adhesive film on the base material is 10 to 100 μm.
The laminate according to any one of <1> to <4>.
<6>
The temporary adhesive film contains a release layer on the surface layer on the support side,
The laminate according to any one of <1> to <5>.
<7>
The support includes a release layer on the surface layer on the temporary adhesive film side.
The laminate according to any one of <1> to <5>.
<8>
The release layer contains a surfactant,
The laminate according to <6> or <7>.
<9>
The thickness of the release layer is 0.1 to 10 μm.
The laminate according to any one of <6> to <8>.
<10>
Temporary adhesive film contains non-curable resin,
The laminate according to any one of <1> to <9>.
<11>
Temporary adhesive film contains water-insoluble resin,
The laminate according to any one of <1> to <10>.
<12>
The laminate according to any one of <1> to <11>, wherein the temporary adhesive film contains a resin having a saturated solubility in 100 g of water at 23 ° C. of 0.9 g or less.
<13>
The temporary adhesive film contains at least one resin selected from the group consisting of polyvinyl acetal, polyalkyl methacrylate and acyl cellulose.
The laminate according to any one of <1> to <12>.
<14>
Temporary adhesive film contains antioxidant,
The laminate according to any one of <1> to <13>.
<15>
The base material contains a semiconductor circuit on the surface layer on the temporary adhesive film side,
The support is a dicing tape,
The laminate according to any one of <1> to <14>.
<16>
A composition for temporary adhesion used for forming a temporary adhesive film in the laminate according to any one of <1> to <15>.
<17>
This includes adhering a temporary adhesive film formed on one surface of the base material and the support to the other surface of the base material and the support, and then forming a notch extending from the base material to the temporary adhesive film. , A method of manufacturing a laminate,
A method for producing a laminate, wherein the first adhesive force between the base material and the temporary adhesive film is equal to or greater than the second adhesive force between the temporary adhesive film and the support.
<18>
Further, it includes a step of forming a temporary adhesive film on one surface of the base material and the support.
In the step of forming the temporary adhesive film, the temporary adhesive composition is applied to the surface of the base material or the support, and then the temporary adhesive composition is dried.
The method for producing a laminate according to <17>.
<19>
The method of applying the temporary bonding composition to the surface of the base material or the support is a spin coating method, a slit coating method or a spiral coating method.
The method for producing a laminate according to <18>.
<20>
A method for manufacturing a semiconductor device, which comprises the method for manufacturing a laminate according to any one of <17> to <19>.
 本発明の積層体により、ダイシング処理後のチップ表面を保護することが可能となる。 The laminate of the present invention makes it possible to protect the chip surface after dicing.
図1は、本発明の積層体を示す概略断面図である。FIG. 1 is a schematic cross-sectional view showing a laminated body of the present invention. 図2は、分割後の基材片(チップ)を取り出したときの様子を示す概略図である。FIG. 2 is a schematic view showing a state when the divided base material piece (chip) is taken out. 図3は、本発明の積層体の製造方法における一部工程の例を示す概略図である。FIG. 3 is a schematic view showing an example of some steps in the method for producing a laminate of the present invention.
 以下、本発明の主要な実施形態について説明する。しかしながら、本発明は、明示した実施形態に限られるものではない。 Hereinafter, the main embodiments of the present invention will be described. However, the present invention is not limited to the specified embodiments.
 本明細書において「~」という記号を用いて表される数値範囲は、「~」の前後に記載される数値をそれぞれ下限値および上限値として含む範囲を意味する。 The numerical range represented by the symbol "-" in the present specification means a range including the numerical values before and after "-" as the lower limit value and the upper limit value, respectively.
 本明細書において「工程」との語は、独立した工程だけではなく、その工程の所期の作用が達成できる限りにおいて、他の工程と明確に区別できない工程も含む意味である。 In the present specification, the term "process" means not only an independent process but also a process that cannot be clearly distinguished from other processes as long as the intended action of the process can be achieved.
 本明細書において基(原子団)に関し、置換および無置換を記していない表記は、置換基を有さない基(原子団)と共に、置換基を有する基(原子団)をも包含する意味である。例えば、単に「アルキル基」と記載した場合には、これは、置換基を有さないアルキル基(無置換アルキル基)、および、置換基を有するアルキル基(置換アルキル基)の両方を包含する意味である。 In the present specification, the notation that does not describe substitution and non-substitution with respect to a group (atomic group) means that a group having a substituent (atomic group) is included as well as a group having no substituent (atomic group). is there. For example, when simply described as "alkyl group", this includes both an alkyl group having no substituent (unsubstituted alkyl group) and an alkyl group having a substituent (substituted alkyl group). Means.
 本明細書において「露光」とは、特に断らない限り、光を用いた描画のみならず、電子線、イオンビーム等の粒子線を用いた描画も含む意味である。描画に用いられるエネルギー線としては、水銀灯の輝線スペクトル、エキシマレーザーに代表される遠紫外線、極紫外線(EUV光)およびX線などの活性光線、ならびに、電子線およびイオン線などの粒子線が挙げられる。 In the present specification, "exposure" means not only drawing using light but also drawing using particle beams such as an electron beam and an ion beam, unless otherwise specified. Examples of energy rays used for drawing include emission line spectra of mercury lamps, far ultraviolet rays typified by excimer lasers, active rays such as extreme ultraviolet rays (EUV light) and X-rays, and particle beams such as electron beams and ion beams. Be done.
 本明細書において、「(メタ)アクリレート」は、「アクリレート」および「メタクリレート」の両方、または、いずれかを意味し、「(メタ)アクリル」は、「アクリル」および「メタクリル」の両方、または、いずれかを意味し、「(メタ)アクリロイル」は、「アクリロイル」および「メタクリロイル」の両方、または、いずれかを意味する。 As used herein, "(meth) acrylate" means both "acrylate" and "methacrylate", or either, and "(meth) acrylic" means both "acrylic" and "methacrylic", or , Either, and "(meth) acryloyl" means both "acryloyl" and "methacryloyl", or either.
 本明細書において、組成物中の固形分は、溶剤を除く他の成分を意味し、組成物中の固形分の含有量(濃度)は、特に述べない限り、その組成物の総質量に対する、溶剤を除く他の成分の質量百分率によって表される。 In the present specification, the solid content in the composition means other components other than the solvent, and the content (concentration) of the solid content in the composition is, unless otherwise specified, based on the total mass of the composition. It is represented by the mass percentage of other components excluding the solvent.
 本明細書において、特に述べない限り、温度は23℃、気圧は101325Pa(1気圧)である。 In the present specification, unless otherwise specified, the temperature is 23 ° C. and the atmospheric pressure is 101325 Pa (1 atm).
 本明細書において、重量平均分子量(Mw)および数平均分子量(Mn)は、特に述べない限り、ゲル浸透クロマトグラフィ(GPC測定)に従い、ポリスチレン換算値として示される。この重量平均分子量(Mw)および数平均分子量(Mn)は、例えば、HLC-8220(東ソー(株)製)を用い、カラムとしてガードカラムHZ-L、TSKgel Super HZM-M、TSKgel Super HZ4000、TSKgel Super HZ3000およびTSKgel Super HZ2000(東ソー(株)製)を用いることによって求めることができる。また、特に述べない限り、溶離液としてTHF(テトラヒドロフラン)を用いて測定したものとする。また、特に述べない限り、GPC測定における検出には、UV線(紫外線)の波長254nm検出器を使用したものとする。 In the present specification, the weight average molecular weight (Mw) and the number average molecular weight (Mn) are shown as polystyrene-equivalent values according to gel permeation chromatography (GPC measurement) unless otherwise specified. For this weight average molecular weight (Mw) and number average molecular weight (Mn), for example, HLC-8220 (manufactured by Tosoh Corporation) is used, and guard columns HZ-L, TSKgel Super HZM-M, TSKgel Super HZ4000, TSKgel are used as columns. It can be obtained by using Super HZ3000 and TSKgel Super HZ2000 (manufactured by Tosoh Corporation). Unless otherwise specified, the measurement is carried out using THF (tetrahydrofuran) as the eluent. Unless otherwise specified, a UV ray (ultraviolet) wavelength 254 nm detector is used for detection in GPC measurement.
 本明細書において、積層体を構成する各層の位置関係について、「上」または「下」と記載したときには、注目している複数の層のうち基準となる層の上側または下側に他の層があればよい。すなわち、基準となる層と上記他の層の間に、さらに第3の層や要素が介在していてもよく、基準となる層と上記他の層は接している必要はない。また、特に断らない限り、基材に対し層が積み重なっていく方向を「上」と称し、または、感光層がある場合には、基材から感光層へ向かう方向を「上」と称し、その反対方向を「下」と称する。なお、このような上下方向の設定は、本明細書中における便宜のためであり、実際の態様においては、本明細書における「上」方向は、鉛直上向きと異なることもありうる。 In the present specification, when the positional relationship of each layer constituting the laminated body is described as "upper" or "lower", the other layer is above or below the reference layer among the plurality of layers of interest. All you need is. That is, a third layer or element may be further interposed between the reference layer and the other layer, and the reference layer and the other layer need not be in contact with each other. Unless otherwise specified, the direction in which the layers are stacked on the base material is referred to as "upper", or if there is a photosensitive layer, the direction from the base material to the photosensitive layer is referred to as "upper". The opposite direction is referred to as "down". It should be noted that such a vertical setting is for convenience in the present specification, and in an actual embodiment, the "upward" direction in the present specification may be different from the vertical upward direction.
 下記では、図面を参照しながら、本発明の積層体の実施形態について説明するが、本発明はこれに限られるものではない。なお、視認しやすくするため、図面中の各構成要素の縮尺は実際のものとは適宜異ならせてある。 Hereinafter, embodiments of the laminate of the present invention will be described with reference to the drawings, but the present invention is not limited thereto. In order to make it easier to see, the scale of each component in the drawing is appropriately different from the actual one.
<積層体>
 図1は、本発明の積層体を示す概略断面図であり、図2は、分割後の基材片(チップ)の1つを取り出したときの様子を示す概略図である。
<Laminated body>
FIG. 1 is a schematic cross-sectional view showing a laminated body of the present invention, and FIG. 2 is a schematic view showing a state when one of the divided base material pieces (chips) is taken out.
 本発明の積層体1は、図1に示すように、基材10と、仮接着膜12と、支持体14とを順に有する。そして、この積層体1において、基材10および仮接着膜12は、基材10から仮接着膜12まで延びる切込み16によって、複数に分割されており、基材10および仮接着膜12の間の第1の接着力が、仮接着膜12および支持体14の間の第2の接着力以上である。 As shown in FIG. 1, the laminate 1 of the present invention has a base material 10, a temporary adhesive film 12, and a support 14 in this order. Then, in the laminated body 1, the base material 10 and the temporary adhesive film 12 are divided into a plurality of parts by a notch 16 extending from the base material 10 to the temporary adhesive film 12, and between the base material 10 and the temporary adhesive film 12. The first adhesive force is equal to or greater than the second adhesive force between the temporary adhesive film 12 and the support 14.
 本発明の積層体では、第1の接着力が第2の接着力以上であるため、図2に示すようにチップCを支持体14から取り出した際に、仮接着膜12がチップCに付着した状態となる。これにより、仮接着膜12をチップCの表面を保護する保護膜として使用することが可能となり、ダイシング処理後の各工程(例えば、ダイボンディング、ワイヤーボンディングおよびチップコーティングなど。)において、チップ表面を保護することが可能となる。 In the laminated body of the present invention, since the first adhesive force is equal to or greater than the second adhesive force, the temporary adhesive film 12 adheres to the chip C when the chip C is taken out from the support 14 as shown in FIG. It will be in the state of. This makes it possible to use the temporary adhesive film 12 as a protective film that protects the surface of the chip C, and in each step after the dicing process (for example, die bonding, wire bonding, chip coating, etc.), the chip surface can be used. It becomes possible to protect.
 また、例えば、ダイシング処理後の各工程において、基材の表面を保護する方法としては、ダイシング処理後に個々のチップの表面に保護膜を形成する方法も考えられる。しかしながら、ダイシング処理後に、サイズの小さい個々のチップの表面に保護膜を形成することは、作業として煩雑であり、さらに半導体プロセスの工程数を増加させるため、製造効率が低下するという問題が生じ得る。このような観点において、本発明の積層体を使用した場合には、ダイシング処理後に別途、保護膜を形成する工程を設ける必要がないため、製造効率の低下を抑制できるという効果も得られる。 Further, for example, as a method of protecting the surface of the base material in each step after the dicing treatment, a method of forming a protective film on the surface of each chip after the dicing treatment can be considered. However, forming a protective film on the surface of individual chips having a small size after the dicing process is complicated as a work, and further increases the number of steps of the semiconductor process, which may cause a problem that the manufacturing efficiency is lowered. .. From this point of view, when the laminate of the present invention is used, it is not necessary to separately provide a step of forming a protective film after the dicing treatment, so that it is possible to obtain an effect that a decrease in production efficiency can be suppressed.
 積層体の剥離態様は、基材の保護したい表面に仮接着膜が残存していれば、特に制限されない。剥離態様としては、例えば、支持体14および仮接着膜12の接着界面S2で剥離した状態(つまり、仮接着膜12のすべてが基材表面に残る。)、さらには、仮接着膜12の内部で剥離した状態(いわゆる仮接着膜の凝集破壊であり、仮接着膜の一部が基材表面に残る。)などが挙げられる。特に、第1の接着力が第2の接着力に等しい場合や、それらの差が小さい場合には、仮接着膜12の凝集破壊が起こりやすく、仮接着膜12の内部での剥離が生じやすい。仮接着膜12が内部で剥離した場合には、仮接着膜の厚さが積層状態のときよりも減少するが、基材上に仮接着膜が存在しているため、本発明の課題は達成することができる。なお、凝集破壊が生じた場合には、仮接着膜の両面の各接着力は互いに等しいものとみなす。仮接着膜12は基材10の接着面の全体に存在している必要はない。したがって、基材10のうち少なくともチップCとして使用する領域に仮接着膜12が残存していればよく、基材10の外縁などチップCとして使用しない領域では、仮接着膜12が残存している必要はなく、また、基材10および仮接着膜12の接着界面S1で仮接着膜12が剥離してもよい。 The peeling mode of the laminated body is not particularly limited as long as the temporary adhesive film remains on the surface of the base material to be protected. As a peeling mode, for example, a state in which the support 14 and the temporary adhesive film 12 are peeled off at the adhesive interface S2 (that is, all of the temporary adhesive film 12 remains on the surface of the base material), and further, the inside of the temporary adhesive film 12 (It is a so-called cohesive failure of the temporary adhesive film, and a part of the temporary adhesive film remains on the surface of the base material). In particular, when the first adhesive force is equal to the second adhesive force or when the difference between them is small, the temporary adhesive film 12 is likely to be coagulated and broken, and the temporary adhesive film 12 is likely to be peeled off inside. .. When the temporary adhesive film 12 is peeled off internally, the thickness of the temporary adhesive film is smaller than that in the laminated state, but the problem of the present invention is achieved because the temporary adhesive film is present on the base material. can do. When cohesive failure occurs, the adhesive forces on both sides of the temporary adhesive film are considered to be equal to each other. The temporary adhesive film 12 does not have to be present on the entire adhesive surface of the base material 10. Therefore, it is sufficient that the temporary adhesive film 12 remains at least in the region of the base material 10 that is used as the chip C, and the temporary adhesive film 12 remains in the region that is not used as the chip C, such as the outer edge of the base material 10. It is not necessary, and the temporary adhesive film 12 may be peeled off at the adhesive interface S1 of the base material 10 and the temporary adhesive film 12.
 本発明の積層体1において、基材10および仮接着膜12は接着界面S1において互いに接着しており、仮接着膜12および支持体14は接着界面S2において互いに接着している。第1の接着力は、上記のとおり、基材10および仮接着膜12の接着に係る力であり、第2の接着力は、上記のとおり、仮接着膜12および支持体14の接着に係る力である。接着状態にある2つの物質の間に働く接着力は、その2つの物質を剥離する(すなわち接着状態を解除する)のに必要な単位面積当たりの外力として測定できる。接着力の測定方法は、そのような外力を測定できれば、特段制限されないが、例えば、後述する実施例に記載の測定方法により実施できる。第1の接着力は、第2の接着力よりも大きいことが好ましい。これにより、支持体および仮接着膜の接着界面で、より効果的に剥離が生じやすくなり、仮接着膜の保護膜としての強度が確保されやすくなる。さらに、第1の接着力および第2の接着力の差は10~100N/mmであることが好ましい。この数値範囲の上限は、90N/mm以下であることが好ましく、80N/mm以下であることがより好ましく、50N/mm以下であることがさらに好ましい。また、この数値範囲の下限は、11N/mm以上であることが好ましく、20N/mm以上であることがより好ましく、30N/mm以上であることがさらに好ましい。第2の接着力は20~110N/mmであることが好ましい。これにより、支持体および仮接着膜の接着界面で、より効果的に剥離が生じやすくなり、かつ、ダイシング時の基材の保持力を充分に確保することができる。この数値範囲の上限は、100N/mm以下であることが好ましく、90N/mm以下であることがより好ましく、50N/mm以下であることがさらに好ましい。また、この数値範囲の下限は、21N/mm以上であることが好ましく、25N/mm以上であることがより好ましく、30N/mm以上であることがさらに好ましい。 In the laminate 1 of the present invention, the base material 10 and the temporary adhesive film 12 are adhered to each other at the adhesive interface S1, and the temporary adhesive film 12 and the support 14 are adhered to each other at the adhesive interface S2. The first adhesive force is the force related to the adhesion between the base material 10 and the temporary adhesive film 12 as described above, and the second adhesive force is related to the adhesion between the temporary adhesive film 12 and the support 14 as described above. It is power. The adhesive force acting between two substances in a bonded state can be measured as an external force per unit area required to separate the two substances (that is, release the bonded state). The method for measuring the adhesive force is not particularly limited as long as such an external force can be measured, but it can be carried out, for example, by the measuring method described in Examples described later. The first adhesive force is preferably larger than the second adhesive force. As a result, peeling is likely to occur more effectively at the adhesive interface between the support and the temporary adhesive film, and the strength of the temporary adhesive film as a protective film is likely to be ensured. Further, the difference between the first adhesive force and the second adhesive force is preferably 10 to 100 N / mm 2. The upper limit of this numerical range is preferably 90 N / mm 2 or less, more preferably 80 N / mm 2 or less, and further preferably 50 N / mm 2 or less. Further, the lower limit of this numerical range is preferably 11 N / mm 2 or more, more preferably 20 N / mm 2 or more, and further preferably 30 N / mm 2 or more. The second adhesive force is preferably 20 to 110 N / mm 2. As a result, peeling is more likely to occur more effectively at the adhesive interface between the support and the temporary adhesive film, and the holding force of the base material during dicing can be sufficiently secured. The upper limit of this numerical range is preferably 100 N / mm 2 or less, more preferably 90 N / mm 2 or less, and further preferably 50 N / mm 2 or less. The lower limit of the numerical range, is preferably 21N / mm 2 or more, more preferably 25 N / mm 2 or more, more preferably 30 N / mm 2 or more.
 また、第2の接着力は、支持体を変質させる等により、ダイシング処理後に低減されてもよい。このように第2の接着力をダイシング前後で調整できる場合には、支持体および仮接着膜の接着界面での剥離と、ダイシング時の基材の保持力の確保とがより両立しやすくなる。なお、硬化型組成物からなる粘着層を有する場合のように、支持体の変質に伴って支持体および仮接着膜の間の第2の接着力が変化する場合には、本発明において、基材および仮接着膜の間の第1の接着力は、その変化後で剥離前に、第2の接着力以上であればよい。この場合、各接着力間の差は、その変化後で剥離前の値とする。低減後の第2の接着力は、1.0N/mm以下であることが好ましく、0.5N/mm以下であることがより好ましく、0.3N/mm以下であることがさらに好ましい。また、低減前の第2の接着力は、3.0N/mm以上であることが好ましく、5.0N/mm以上であることがより好ましく、10.0N/mm以上であることがさらに好ましい。また、第2の接着力が低減した後における各接着力間の上記差は、2.0N/mm以上であることが好ましく、4.0N/mm以上であることがより好ましく、9.0N/mm以上であることがさらに好ましい。 Further, the second adhesive force may be reduced after the dicing treatment by altering the support or the like. When the second adhesive force can be adjusted before and after dicing in this way, it becomes easier to achieve both peeling at the adhesive interface between the support and the temporary adhesive film and securing the holding force of the base material during dicing. In the present invention, when the second adhesive force between the support and the temporary adhesive film changes with the deterioration of the support, as in the case of having an adhesive layer made of a curable composition, the base is used in the present invention. The first adhesive force between the material and the temporary adhesive film may be greater than or equal to the second adhesive force after the change and before peeling. In this case, the difference between the adhesive strengths is the value after the change and before the peeling. Second adhesive strength after reduction, it is preferably 1.0 N / mm 2 or less, more preferably 0.5 N / mm 2 or less, and more preferably 0.3 N / mm 2 or less .. Further, the second adhesive force before reduction, is preferably 3.0 N / mm 2 or more, more preferably 5.0 N / mm 2 or more, it is 10.0 N / mm 2 or more More preferred. Further, the above difference between the adhesive forces after the second adhesive force is reduced is preferably 2.0 N / mm 2 or more, more preferably 4.0 N / mm 2 or more, and 9. It is more preferably 0 N / mm 2 or more.
<<基材>>
 基材は、ダイシング処理によってチップ化される部材であり、特に制限されず、積層体の用途に応じて、半導体プロセスにおいて使用できる種々の基材を使用できる。基材としては、例えば、液晶表示装置等に用いられる透明基板、ならびに、発光素子、固体撮像素子および半導体メモリ等に用いられる半導体基板が使用できる。また、基材は金属基板、樹脂基板およびプリプレグ(繊維部材に樹脂を含侵させ成形したシート)でもよい。
<< Base material >>
The base material is a member that is chipped by a dicing process, and is not particularly limited, and various base materials that can be used in the semiconductor process can be used depending on the use of the laminate. As the base material, for example, a transparent substrate used for a liquid crystal display device or the like, and a semiconductor substrate used for a light emitting element, a solid-state image sensor, a semiconductor memory, or the like can be used. Further, the base material may be a metal substrate, a resin substrate, or a prepreg (a sheet formed by impregnating a fiber member with a resin).
 透明基板は、例えば、石英ガラス、無アルカリガラス、ソーダガラス、ホウケイ酸ガラスおよびアルミノシリケートガラスなどのガラス基板である。これらの透明基板には、透明導電膜、反射膜および保護膜など他の構造が形成されていてもよい。半導体基板は、例えば、シリコン、サファイア、炭化ケイ素、窒化ガリウム、アルミニウム、アモルファス酸化アルミニウム、多結晶酸化アルミニウム、窒化ケイ素、酸窒化ケイ素、GaAsP、GaP、AlGaAs、InGaN、GaN、AlGaN、ZnSe、AlGa、InPおよびZnOなどからなる基板である。これらの半導体基板には、PN接合層、発光層、光電変換層、相補性金属酸化膜半導体(CMOS)層および電極層など他の構造が形成されていてもよい。金属基板は、例えば、アルミニウム基板、銅基板およびステンレス基板などである。樹脂基板は、例えば、エポキシ基板、ポリカーボネート基板およびフレキシブル基板(ポリイミド基板、ポリエチレンナフタレート(PEN)基板、ポリエチレンテレフタレート(PET)基板)などである。 The transparent substrate is, for example, a glass substrate such as quartz glass, non-alkali glass, soda glass, borosilicate glass and aluminosilicate glass. Other structures such as a transparent conductive film, a reflective film, and a protective film may be formed on these transparent substrates. Semiconductor substrates include, for example, silicon, sapphire, silicon carbide, gallium nitride, aluminum, amorphous aluminum oxide, polycrystalline aluminum oxide, silicon nitride, silicon nitride, GaAsP, GaP, AlGaAs, InGaN, GaN, AlGaN, ZnSe, AlGa, etc. It is a substrate made of InP, ZnO, or the like. Other structures such as a PN junction layer, a light emitting layer, a photoelectric conversion layer, a complementary metal oxide semiconductor (CMOS) layer, and an electrode layer may be formed on these semiconductor substrates. The metal substrate is, for example, an aluminum substrate, a copper substrate, a stainless steel substrate, or the like. The resin substrate is, for example, an epoxy substrate, a polycarbonate substrate, a flexible substrate (polyimide substrate, polyethylene naphthalate (PEN) substrate, polyethylene terephthalate (PET) substrate) and the like.
 また、必要により、基材は、仮接着膜側の表層部分に、上部の層との密着改良、物質の拡散防止あるいは表面の平坦化のために下塗り層を含んでもよい。また、基材は、仮接着膜側の表層部分に、例えば半導体回路を含んでもよい。基材は、単層構造であっても積層構造であってもよい。 Further, if necessary, the base material may include an undercoat layer in the surface layer portion on the temporary adhesive film side in order to improve adhesion with the upper layer, prevent diffusion of substances, or flatten the surface. Further, the base material may include, for example, a semiconductor circuit in the surface layer portion on the temporary adhesive film side. The base material may have a single-layer structure or a laminated structure.
 基材の厚さ(構造物等を含む場合には、最大の厚さ)は、特に制限されず、積層体の用途に応じて適宜設定される。基材の厚さは、例えば0.3~2mmである。この数値範囲の上限は、1.5mm以下であることが好ましく、1mm以下であることがより好ましく、0.8mm以下であることがさらに好ましい。また、この数値範囲の下限は、0.4mm以上であることが好ましく、0.5mm以上であることがより好ましく、0.6mm以上であることがさらに好ましい。 The thickness of the base material (the maximum thickness when a structure or the like is included) is not particularly limited, and is appropriately set according to the application of the laminate. The thickness of the base material is, for example, 0.3 to 2 mm. The upper limit of this numerical range is preferably 1.5 mm or less, more preferably 1 mm or less, and further preferably 0.8 mm or less. Further, the lower limit of this numerical value range is preferably 0.4 mm or more, more preferably 0.5 mm or more, and further preferably 0.6 mm or more.
 基材の形状は、特に制限されず、積層体の用途に応じて適宜設定される。基材の形状は、例えば円盤状(ウェハ型基板)および矩形状(パネル型基板)である。基材が円盤状である場合、直径は、例えば50~500mmである。この数値範囲の上限は、400mm以下であることが好ましく、300mm以下であることがより好ましく、250mm以下であることがさらに好ましい。また、この数値範囲の下限は、100mm以上であることが好ましく、150mm以上であることがより好ましく、170mm以上であることがさらに好ましい。一方、基材が矩形状である場合、最大辺の長さは、例えば200~1000mmである。この数値範囲の上限は、900mm以下であることが好ましく、800mm以下であることがより好ましく、700mm以下であることがさらに好ましい。また、この数値範囲の下限は、300mm以上であることが好ましく、400mm以上であることがより好ましく、450mm以上であることがさらに好ましい。基材は、オリエンテーションフラットやノッチを有していてもよい。 The shape of the base material is not particularly limited and is appropriately set according to the use of the laminated body. The shape of the base material is, for example, a disk shape (wafer type substrate) and a rectangular shape (panel type substrate). When the base material has a disk shape, the diameter is, for example, 50 to 500 mm. The upper limit of this numerical range is preferably 400 mm or less, more preferably 300 mm or less, and even more preferably 250 mm or less. Further, the lower limit of this numerical value range is preferably 100 mm or more, more preferably 150 mm or more, and further preferably 170 mm or more. On the other hand, when the base material has a rectangular shape, the maximum side length is, for example, 200 to 1000 mm. The upper limit of this numerical range is preferably 900 mm or less, more preferably 800 mm or less, and further preferably 700 mm or less. Further, the lower limit of this numerical value range is preferably 300 mm or more, more preferably 400 mm or more, and further preferably 450 mm or more. The base material may have an orientation flat or a notch.
 仮接着膜によって保護される基材上の表面の役割は、特に制限されず、異物の付着や傷の発生を防止するなどの観点から、必要に応じて適宜設定される。そのように保護される基材上の表面は、例えば、所定の構造物や半導体回路が形成された基材の表面である。この場合には、所定の構造物や半導体回路が形成された基材の表面が、仮接着膜に接触するように貼り付けられる。また、そのように保護される基材上の表面は、例えば、所定の構造物や半導体回路が形成された基材の表面の反対側の基材自体の表面(いわゆる裏面)でもよい。この場合には、上記の裏面が、仮接着膜に接触するように貼り付けられる。後者の場合には、ダイシング時に発生するデブリから上記構造物や半導体回路を保護する観点から、別途ダイシング前に保護膜を形成してもよい。また、同じ側の表面であっても、上記構造物や半導体回路が形成された領域、つまり、チップとして使用される領域を保護できればよいため、例えばチップとして使用されない外縁領域に仮接着膜が形成されることは必須ではない。ただし、ダイシングの安定性の観点からは、基材の仮接着膜側の表面の全面が仮接着膜と接着することが好ましい。 The role of the surface on the base material protected by the temporary adhesive film is not particularly limited, and is appropriately set as necessary from the viewpoint of preventing the adhesion of foreign substances and the occurrence of scratches. The surface on the substrate thus protected is, for example, the surface of the substrate on which a predetermined structure or semiconductor circuit is formed. In this case, the surface of the base material on which a predetermined structure or semiconductor circuit is formed is attached so as to come into contact with the temporary adhesive film. Further, the surface on the base material thus protected may be, for example, the surface of the base material itself (so-called back surface) opposite to the surface of the base material on which a predetermined structure or semiconductor circuit is formed. In this case, the back surface is attached so as to come into contact with the temporary adhesive film. In the latter case, a protective film may be separately formed before dicing from the viewpoint of protecting the structure and the semiconductor circuit from debris generated during dicing. Further, even if the surface is on the same side, it is sufficient that the region where the structure or the semiconductor circuit is formed, that is, the region used as the chip can be protected. Therefore, for example, a temporary adhesive film is formed in the outer edge region which is not used as the chip. It is not mandatory to be done. However, from the viewpoint of dicing stability, it is preferable that the entire surface of the base material on the temporary adhesive film side adheres to the temporary adhesive film.
<<仮接着膜>>
 仮接着膜は主として樹脂から構成される。樹脂は、上記第1の接着力が上記第2の接着力以上となる範囲で適宜選択される。仮接着膜は非硬化性の樹脂を含むことが好ましい。本明細書において、「非硬化性」とは、ダイシング処理後の工程において曝される熱(例えば150℃以上、好ましくは200℃以上)や光(例えば波長180~800nmの範囲の少なくともいずれかの帯域の光、好ましくは波長200~400nmの光)によって硬度(ロックウェル硬度)が増えない性質を意味する。これにより、仮接着膜の除去がより容易となる。さらに、仮接着膜は熱可塑性樹脂(ガラス転移点または融点程度まで加熱すると柔らかくなる樹脂)を含むことが好ましい。これにより、仮接着膜の除去がより容易となる。仮接着膜は非水溶性の樹脂を含むことも好ましい。本明細書において、「非水溶性」とは、23℃の水100gへの飽和溶解度(g)が1g以下である性質を意味する。これにより、水を使用した後工程における保護機能がより向上する。非水溶性樹脂について、23℃の水100gへの飽和溶解度は、0.9g以下であることが好ましく、0.5g以下であることがより好ましく、0.1g以下であることがさらに好ましい。また、非水溶性樹脂について、23℃の水への飽和溶解度は、0.001g以上であることが実際的であり、0.01g以上でもよい。仮接着膜は透明な樹脂を含むことも好ましい。これにより、ダイシング処理後の工程において、仮接着膜に覆われている基材の表面を視認することが可能となる。仮接着膜が透明な樹脂を含む場合、波長400~700nmの範囲における厚さ50mmの仮接着膜の最小光透過率は、85%以上であることが好ましく、88%以上であることがより好ましく、90%以上であることがさらに好ましい。また、仮接着膜の上記最小光透過率は、99.9%以下であることが実際的であり、98%以下でもよい。特に、仮接着膜は、非硬化性かつ非水溶性の樹脂または熱可塑性かつ非水溶性の樹脂を含むことが好ましく、非硬化性かつ非水溶性かつ透明な樹脂または熱可塑性かつ非水溶性かつ透明な樹脂を含むことがより好ましく、熱可塑性かつ非水溶性かつ透明な樹脂を含むことがさらに好ましい。
<< Temporary adhesive film >>
The temporary adhesive film is mainly composed of resin. The resin is appropriately selected within a range in which the first adhesive force is equal to or greater than the second adhesive force. The temporary adhesive film preferably contains a non-curable resin. As used herein, "non-curable" means at least one of heat (for example, 150 ° C. or higher, preferably 200 ° C. or higher) or light (for example, a wavelength in the range of 180 to 800 nm) exposed in the step after dicing treatment. It means that the hardness (Rockwell hardness) does not increase due to light in the band, preferably light having a wavelength of 200 to 400 nm. This makes it easier to remove the temporary adhesive film. Further, the temporary adhesive film preferably contains a thermoplastic resin (a resin that softens when heated to a glass transition point or a melting point). This makes it easier to remove the temporary adhesive film. It is also preferable that the temporary adhesive film contains a water-insoluble resin. As used herein, the term "water-insoluble" means a property in which the saturated solubility (g) in 100 g of water at 23 ° C. is 1 g or less. As a result, the protective function in the post-process using water is further improved. The saturated solubility of the water-insoluble resin in 100 g of water at 23 ° C. is preferably 0.9 g or less, more preferably 0.5 g or less, and further preferably 0.1 g or less. Further, with respect to the water-insoluble resin, the saturated solubility in water at 23 ° C. is practically 0.001 g or more, and may be 0.01 g or more. It is also preferable that the temporary adhesive film contains a transparent resin. This makes it possible to visually recognize the surface of the base material covered with the temporary adhesive film in the process after the dicing treatment. When the temporary adhesive film contains a transparent resin, the minimum light transmittance of the temporary adhesive film having a thickness of 50 mm in the wavelength range of 400 to 700 nm is preferably 85% or more, more preferably 88% or more. , 90% or more is more preferable. Further, the minimum light transmittance of the temporary adhesive film is practically 99.9% or less, and may be 98% or less. In particular, the temporary adhesive film preferably contains a non-curable and water-insoluble resin or a thermoplastic and water-insoluble resin, and is a non-curable, water-insoluble and transparent resin or a thermoplastic and water-insoluble resin. It is more preferable to contain a transparent resin, and further preferably to contain a thermoplastic, water-insoluble and transparent resin.
 特に、仮接着膜は、ポリビニルアセタール、ポリメタクリル酸アルキルおよびアシルセルロースからなる群より選択される少なくとも1種の樹脂を含むことが好ましく、ポリビニルアセタールおよびポリメタクリル酸アルキルからなる群より選択される少なくとも1種の樹脂を含むことがより好ましく、ポリビニルアセタールを含むことがさらに好ましい。 In particular, the temporary adhesive film preferably contains at least one resin selected from the group consisting of polyvinyl acetal, polyalkyl methacrylate and acylcellulose, and at least selected from the group consisting of polyvinyl acetal and polyalkyl methacrylate. It is more preferable to contain one kind of resin, and it is further preferable to contain polyvinyl acetal.
<<<ポリビニルアセタール>>>
 ポリビニルアセタールは、ポリビニルアルコールにアルデヒドを反応させてアセタール化した樹脂であることが好ましく、下記式(PV-1)に示された各繰り返し単位を含む化合物であることがより好ましい。
<<< Polyvinyl Acetal >>>
The polyvinyl acetal is preferably a resin obtained by reacting polyvinyl alcohol with an aldehyde to acetalize it, and more preferably a compound containing each repeating unit represented by the following formula (PV-1).
Figure JPOXMLDOC01-appb-C000001
Figure JPOXMLDOC01-appb-C000001
 式(PV-1)において、Rはアルキル基を表し、R~Rは、それぞれ独立して水素原子または1価の置換基を表し、x、yおよびzは、それぞれ各繰り返し単位の樹脂中のモル比(モル%)を表し、x+y+zは80~100モル%である。また、アスタリスク「*」は繰り返し単位間の結合または末端部位を表す。 In formula (PV-1), R 1 represents an alkyl group, R 2 to R 5 each independently represent a hydrogen atom or a monovalent substituent, and x, y and z are each repeating unit. It represents the molar ratio (mol%) in the resin, and x + y + z is 80 to 100 mol%. In addition, an asterisk "*" represents a bond or terminal site between repeating units.
 Rは、炭素数1~10のアルキル基であることが好ましく、炭素数1~5のアルキル基であることがより好ましく、炭素数2または3のアルキル基であることがさらに好ましい。特に、Rはプロピル基(-C)であること、つまりポリビニルアセタールはポリビニルブチラールであることがより好ましい。 R 1 is preferably an alkyl group having 1 to 10 carbon atoms, more preferably an alkyl group having 1 to 5 carbon atoms, and further preferably an alkyl group having 2 or 3 carbon atoms. In particular, it is more preferable that R 1 is a propyl group (-C 3 H 7 ), that is, the polyvinyl acetal is polyvinyl butyral.
 R~Rは水素原子であることが好ましい。一方、R~Rが1価の置換基を表す場合において、1価の置換基は、例えば下記の置換基Tであることが好ましい。また、R~Rが1価の置換基を表す場合において、Rは、異なる繰り返し単位間において、同一であっても異なっていてもよく、Rは、異なる繰り返し単位間において、同一であっても異なっていてもよく、Rは、異なる繰り返し単位間において、同一であっても異なっていてもよく、Rは、異なる繰り返し単位間において、同一であっても異なっていてもよい。 It is preferred R 2 ~ R 5 are hydrogen atoms. On the other hand, when R 2 to R 5 represent a monovalent substituent, the monovalent substituent is preferably, for example, the following substituent T. Further, when R 2 to R 5 represent a monovalent substituent, R 2 may be the same or different between different repeating units, and R 3 is the same among different repeating units. R 4 may be the same or different between different repeating units, and R 5 may be the same or different between different repeating units. Good.
 置換基Tは、ハロゲン原子、シアノ基、ニトロ基、炭化水素基、複素環基、-ORt、-CORt、-COORt、-OCORt、-NRtRt、-NHCORt、-CONRtRt、-NHCONRtRt、-NHCOORt、-SRt、-SORt、-SOORt、-NHSORtおよび-SONRtRtから選択される1種である。ここで、RtおよびRtは、それぞれ独立して水素原子、炭化水素基または複素環基を表す。RtとRtが炭化水素基である場合には、これらが互いに結合して環を形成してもよい。 The substituent T is a halogen atom, a cyano group, a nitro group, a hydrocarbon group, a heterocyclic group, -ORt 1 , -CORt 1 , -COORt 1 , -OCORt 1 , -NRt 1 Rt 2 , -NHCORt 1 , -CONRT. 1 Rt 2 , -NHCONRT 1 Rt 2 , -NHCOORt 1 , -SRt 1 , -SO 2 Rt 1 , -SO 2 ORt 1 , -NHSO 2 Rt 1 and -SO 2 NRt 1 Rt 2 is there. Here, Rt 1 and Rt 2 independently represent a hydrogen atom, a hydrocarbon group, or a heterocyclic group, respectively. When Rt 1 and Rt 2 are hydrocarbon groups, they may be bonded to each other to form a ring.
 上記置換基Tについて、ハロゲン原子としては、フッ素原子、塩素原子、臭素原子およびヨウ素原子が挙げられる。炭化水素基としては、アルキル基、アルケニル基、アルキニル基、アリール基が挙げられる。アルキル基の炭素数は、1~10が好ましく、1~5がより好ましく、1または2がさらに好ましい。アルキル基は、直鎖、分岐、環状のいずれでもよく、直鎖または分岐が好ましい。アルケニル基の炭素数は、2~10が好ましく、2~5がより好ましく、2または3が特に好ましい。アルケニル基は直鎖、分岐、環状のいずれでもよく、直鎖または分岐が好ましい。アルキニル基の炭素数は、2~10が好ましく、2~5がより好ましい。アルキニル基は直鎖および分岐のいずれでもよい。アリール基の炭素数は、6~10が好ましく、6~8がより好ましく、6~7がさらに好ましい。複素環基は、単環であってもよく、多環であってもよい。複素環基は、単環または環数が2~4の多環が好ましい。複素環基の環を構成するヘテロ原子の数は1~3が好ましい。複素環基の環を構成するヘテロ原子は、窒素原子、酸素原子または硫黄原子が好ましい。複素環基の環を構成する炭素原子の数は3~10が好ましく、3~8がより好ましく、3~5がより好ましい。 Regarding the above-mentioned substituent T, examples of the halogen atom include a fluorine atom, a chlorine atom, a bromine atom and an iodine atom. Examples of the hydrocarbon group include an alkyl group, an alkenyl group, an alkynyl group, and an aryl group. The number of carbon atoms of the alkyl group is preferably 1 to 10, more preferably 1 to 5, and even more preferably 1 or 2. The alkyl group may be linear, branched or cyclic, preferably linear or branched. The alkenyl group preferably has 2 to 10 carbon atoms, more preferably 2 to 5 carbon atoms, and particularly preferably 2 or 3 carbon atoms. The alkenyl group may be linear, branched or cyclic, preferably linear or branched. The alkynyl group preferably has 2 to 10 carbon atoms, and more preferably 2 to 5 carbon atoms. The alkynyl group may be linear or branched. The aryl group preferably has 6 to 10 carbon atoms, more preferably 6 to 8 carbon atoms, and even more preferably 6 to 7 carbon atoms. The heterocyclic group may be monocyclic or polycyclic. The heterocyclic group is preferably a single ring or a polycycle having 2 to 4 rings. The number of heteroatoms constituting the ring of the heterocyclic group is preferably 1 to 3. The hetero atom constituting the ring of the heterocyclic group is preferably a nitrogen atom, an oxygen atom or a sulfur atom. The number of carbon atoms constituting the ring of the heterocyclic group is preferably 3 to 10, more preferably 3 to 8, and even more preferably 3 to 5.
 置換基Tとしての炭化水素基および複素環基は、さらに別の置換基を有していてもよく、無置換であってもよい。ここでの更なる置換基としては、上述した置換基Tが挙げられる。 The hydrocarbon group and the heterocyclic group as the substituent T may have yet another substituent or may be unsubstituted. As a further substituent here, the above-mentioned substituent T can be mentioned.
 具体的には、上記のような置換基Tは、例えば、ハロゲン原子(特にフッ素原子、塩素原子および臭素原子)、炭素数1~5のアルキル基(特にメチル基、エチル基およびプロピル基)、炭素数2~5のアルケニル基(特にエテニル基(ビニル基)およびプロペニル基)、炭素数1~5のアルコキシ基(特にメトキシ基、エトキシ基およびプロポキシ基)、水酸基、チオール基、カルボニル基、チオカルボニル基、カルボキシ基、アミノ基、ニトロ基およびフェニル基などである。特に、置換基Tは、フッ素原子、メチル基、エチル基、メトキシ基、エトキシ基、水酸基、カルボニル基およびカルボキシ基であることが好ましい。これらの置換基は、さらに別の置換基を有していてもよく、無置換であってもよい。 Specifically, the substituent T as described above includes, for example, a halogen atom (particularly a fluorine atom, a chlorine atom and a bromine atom), an alkyl group having 1 to 5 carbon atoms (particularly a methyl group, an ethyl group and a propyl group). Alkenyl groups with 2 to 5 carbon atoms (particularly ethenyl groups (vinyl groups) and propenyl groups), alkoxy groups with 1 to 5 carbon atoms (particularly methoxy groups, ethoxy groups and propoxy groups), hydroxyl groups, thiol groups, carbonyl groups, thio These include a carbonyl group, a carboxy group, an amino group, a nitro group and a phenyl group. In particular, the substituent T is preferably a fluorine atom, a methyl group, an ethyl group, a methoxy group, an ethoxy group, a hydroxyl group, a carbonyl group and a carboxy group. These substituents may have yet another substituent or may be unsubstituted.
 x+y+zは、85~100モル%であることが好ましい。この数値範囲の上限は、通常は100モル%であるが、98モル%程度でもよい。この数値範囲の下限は90モル%以上であることがより好ましく、95モル%以上であることがさらに好ましい。すなわち、ポリビニルアセタールは、上記した3つの繰り返し単位以外の繰り返し単位を含有してもよいが、そのような他の繰り返し単位のモル比は0~20モル%であることが好ましく、0~10モル%であることがより好ましく、0~5モル%であることがさらに好ましく、0モル%であることが特に好ましい。xは、ポリビニルアセタール樹脂におけるアセタール化度に相当し、50~90モル%であることが好ましい。この数値範囲の上限は、85モル%以下であることが好ましく、80モル%以下であることがより好ましく、76モル%以下であることがさらに好ましい。また、この数値範囲の下限は、60モル%以上であることが好ましく、65モル%以上であることがより好ましく、70モル%以上であることがさらに好ましい。yは、ポリビニルアセタール樹脂における水酸基の含有率に相当し、10~50モル%であることが好ましい。この数値範囲の上限は、40モル%以下であることが好ましく、35モル%以下であることがより好ましく、30モル%以下であることがさらに好ましい。また、この数値範囲の下限は、15モル%以上であることが好ましく、20モル%以上であることがより好ましく、24モル%以上であることがさらに好ましい。zは、ポリビニルアセタール樹脂におけるアセチル基の含有率に相当し、1~5モル%であることが好ましい。この数値範囲の上限は、4モル%以下であることが好ましく、3.5モル%以下であることがより好ましく、3モル%以下であることがさらに好ましい。また、この数値範囲の下限は、1.5モル%以上であることが好ましく、1.7モル%以上であることがより好ましく、2モル%以上であることがさらに好ましい。 X + y + z is preferably 85 to 100 mol%. The upper limit of this numerical range is usually 100 mol%, but may be about 98 mol%. The lower limit of this numerical range is more preferably 90 mol% or more, and further preferably 95 mol% or more. That is, the polyvinyl acetal may contain a repeating unit other than the above three repeating units, but the molar ratio of such other repeating units is preferably 0 to 20 mol%, and 0 to 10 mol. It is more preferably%, further preferably 0 to 5 mol%, and particularly preferably 0 mol%. x corresponds to the degree of acetalization in the polyvinyl acetal resin, and is preferably 50 to 90 mol%. The upper limit of this numerical range is preferably 85 mol% or less, more preferably 80 mol% or less, and further preferably 76 mol% or less. Further, the lower limit of this numerical value range is preferably 60 mol% or more, more preferably 65 mol% or more, and further preferably 70 mol% or more. y corresponds to the content of hydroxyl groups in the polyvinyl acetal resin, and is preferably 10 to 50 mol%. The upper limit of this numerical range is preferably 40 mol% or less, more preferably 35 mol% or less, and further preferably 30 mol% or less. Further, the lower limit of this numerical value range is preferably 15 mol% or more, more preferably 20 mol% or more, and further preferably 24 mol% or more. z corresponds to the content of the acetyl group in the polyvinyl acetal resin, and is preferably 1 to 5 mol%. The upper limit of this numerical range is preferably 4 mol% or less, more preferably 3.5 mol% or less, and further preferably 3 mol% or less. Further, the lower limit of this numerical value range is preferably 1.5 mol% or more, more preferably 1.7 mol% or more, and further preferably 2 mol% or more.
 ポリビニルアセタールの重量平均分子量は、10,000~300,000であることが好ましい。この数値範囲の上限は、200,000以下であることが好ましく、150,000以下であることがより好ましく、120,000以下であることがさらに好ましい。また、この数値範囲の下限は、20,000以上であることが好ましく、50,000以上であることがより好ましく、80,000以上であることがさらに好ましい。 The weight average molecular weight of polyvinyl acetal is preferably 10,000 to 300,000. The upper limit of this numerical range is preferably 200,000 or less, more preferably 150,000 or less, and even more preferably 120,000 or less. Further, the lower limit of this numerical range is preferably 20,000 or more, more preferably 50,000 or more, and further preferably 80,000 or more.
 ポリビニルアセタールを主成分とする仮接着膜においては、仮接着膜中のポリビニルアセタールの含有量は、50~100質量%であることが好ましい。この数値範囲の上限は、98質量%以下でもよく、95質量%以下でもよく、93質量%以下でもよい。また、この数値範囲の下限は、70質量%以上であることが好ましく、80質量%以上であることがより好ましく、85質量%以上であることがさらに好ましい。仮接着膜中のポリビニルアセタールは、1種単独で構成されてもよく、2種以上のポリビニルアセタールを含む混合物から構成されてもよい。ポリビニルアセタールが混合物である場合には、それらの合計量が上記範囲にあることが好ましい。 In the temporary adhesive film containing polyvinyl acetal as a main component, the content of polyvinyl acetal in the temporary adhesive film is preferably 50 to 100% by mass. The upper limit of this numerical range may be 98% by mass or less, 95% by mass or less, or 93% by mass or less. Further, the lower limit of this numerical range is preferably 70% by mass or more, more preferably 80% by mass or more, and further preferably 85% by mass or more. The polyvinyl acetal in the temporary adhesive film may be composed of one kind alone or a mixture containing two or more kinds of polyvinyl acetals. When the polyvinyl acetals are mixtures, their total amount is preferably in the above range.
<<<ポリメタクリル酸アルキル>>>
 ポリメタクリル酸アルキルは、下記式(PM-1)に示された各繰り返し単位を含む化合物であることがより好ましい。
<<< Alkyl methacrylate >>>
The polyalkyl methacrylate is more preferably a compound containing each repeating unit represented by the following formula (PM-1).
Figure JPOXMLDOC01-appb-C000002
Figure JPOXMLDOC01-appb-C000002
 式(PM-1)において、Rはアルキル基を表し、Rは水素原子またはメチル基を表し、Rは1価の有機基を表し、pおよびqは、それぞれ樹脂中の各繰り返し単位のモル比を表し、pは60~100モル%であり、qは0~40モル%であり、p+qは80~100モル%である。また、アスタリスク「*」は繰り返し単位間の結合または末端部位を表す。なお、qが付された繰り返し単位は、pが付された繰り返し単位の要件を満たさない繰り返し単位である。 In formula (PM-1), R 7 represents an alkyl group, R 8 represents a hydrogen atom or a methyl group, R 9 represents a monovalent organic group, and p and q are each repeating unit in the resin. P is 60 to 100 mol%, q is 0 to 40 mol%, and p + q is 80 to 100 mol%. In addition, an asterisk "*" represents a bond or terminal site between repeating units. The repeating unit with q is a repeating unit that does not satisfy the requirements for the repeating unit with p.
 pが付された繰り返し単位について、pは、80モル%以上であることが好ましく、90モル%以上であることがより好ましく、95モル%以上であることがさらに好ましい。また、pは、98モル%以下であってもよい。Rは、炭素数1~10のアルキル基であることが好ましく、炭素数1~5のアルキル基であることがより好ましく、炭素数1~3のアルキル基であることがさらに好ましい。特に、Rはメチル基であることが好ましい。Rは、異なる繰り返し単位間において、異なっていてもよいが、同一であることが好ましい。さらに、ポリメタクリル酸アルキルは、pが90モル%以上でありかつRがメチル基であるポリメタクリル酸メチル(PMMA)であることが好ましい。 For the repeating unit with p, p is preferably 80 mol% or more, more preferably 90 mol% or more, still more preferably 95 mol% or more. Further, p may be 98 mol% or less. R 7 is preferably an alkyl group having 1 to 10 carbon atoms, more preferably an alkyl group having 1 to 5 carbon atoms, and further preferably an alkyl group having 1 to 3 carbon atoms. In particular, R 7 is preferably a methyl group. R 7 may be different between different repeating units, but is preferably the same. Further, the polyalkyl methacrylate is preferably polymethyl methacrylate (PMMA) in which p is 90 mol% or more and R 7 is a methyl group.
 qが付された繰り返し単位について、qは、20モル%以下であることが好ましく、10モル%以下であることがより好ましく、5モル%以上であることがさらに好ましい。また、qは、2モル%以上であってもよい。 For the repeating unit with q, q is preferably 20 mol% or less, more preferably 10 mol% or less, and further preferably 5 mol% or more. Further, q may be 2 mol% or more.
 さらに、qが付された繰り返し単位は、pが付された繰り返し単位の要件を満たさない(メタ)アクリレート由来の繰り返し単位であることが好ましい。そのような繰り返し単位としては、qが付された繰り返し単位において、Rが水素原子である場合や、Rがメチル基でありかつRが-COOR10(R10はアルキル基以外の有機基である。)で表される場合などがある。 Further, the repeating unit with q is preferably a repeating unit derived from (meth) acrylate that does not meet the requirements for the repeating unit with p. Such repeating units include the case where R 8 is a hydrogen atom and R 8 is a methyl group and R 9 is -COOR 10 (R 10 is an organic other than an alkyl group) in the repeating unit with q. It may be represented by ().
 さらに、qが付された繰り返し単位は、下記式(PM-2)で表される繰り返し単位であることも好ましい。 Further, it is also preferable that the repeating unit with q is a repeating unit represented by the following formula (PM-2).
Figure JPOXMLDOC01-appb-C000003
Figure JPOXMLDOC01-appb-C000003
 式(PM-2)において、Rは式(PM-1)のRと同義であり、R20は1価の置換基であり、mは0~4の整数を表す。ここで、置換基としては、例えば上記した置換基Tが挙げられ、具体的には、フッ素原子、メチル基、エチル基、メトキシ基、エトキシ基、水酸基、カルボニル基およびカルボキシ基などであり、これらの基がさらに置換基を有していてもよい。mは3以下でもよく、1以上でもよい。 In the formula (PM-2), R 8 has the same meaning as R 8 in formula (PM-1), R 20 is a monovalent substituent, m represents an integer of 0-4. Here, examples of the substituent include the above-mentioned substituent T, and specific examples thereof include a fluorine atom, a methyl group, an ethyl group, a methoxy group, an ethoxy group, a hydroxyl group, a carbonyl group and a carboxy group. The group of may further have a substituent. m may be 3 or less, or 1 or more.
 また、ポリメタクリル酸アルキル中の水素原子は置換基によって置換されていてもよい。置換基としては、例えば上記した置換基Tが挙げられ、具体的には、フッ素原子、メチル基、エチル基、メトキシ基、エトキシ基、水酸基、カルボニル基およびカルボキシ基などである。 Further, the hydrogen atom in the polyalkyl methacrylate may be substituted with a substituent. Examples of the substituent include the above-mentioned substituent T, and specific examples thereof include a fluorine atom, a methyl group, an ethyl group, a methoxy group, an ethoxy group, a hydroxyl group, a carbonyl group and a carboxy group.
 ポリメタクリル酸アルキルの重量平均分子量は、10,000~300,000であることが好ましい。この数値範囲の上限は、200,000以下であることが好ましく、150,000以下であることがより好ましく、120,000以下であることがさらに好ましい。また、この数値範囲の下限は、20,000以上であることが好ましく、50,000以上であることがより好ましく、80,000以上であることがさらに好ましい。 The weight average molecular weight of the polyalkyl methacrylate is preferably 10,000 to 300,000. The upper limit of this numerical range is preferably 200,000 or less, more preferably 150,000 or less, and even more preferably 120,000 or less. Further, the lower limit of this numerical range is preferably 20,000 or more, more preferably 50,000 or more, and further preferably 80,000 or more.
 ポリメタクリル酸アルキルを主成分とする仮接着膜においては、仮接着膜中のポリメタクリル酸アルキルの含有量は、50~100質量%であることが好ましい。この数値範囲の上限は、98質量%以下でもよく、95質量%以下でもよく、93質量%以下でもよい。また、この数値範囲の下限は、70質量%以上であることが好ましく、80質量%以上であることがより好ましく、85質量%以上であることがさらに好ましい。仮接着膜中のポリメタクリル酸アルキルは、1種単独で構成されてもよく、2種以上のポリメタクリル酸アルキルを含む混合物から構成されてもよい。ポリメタクリル酸アルキルが混合物である場合には、それらの合計量が上記範囲にあることが好ましい。 In the temporary adhesive film containing polyalkyl methacrylate as a main component, the content of polyalkyl methacrylate in the temporary adhesive film is preferably 50 to 100% by mass. The upper limit of this numerical range may be 98% by mass or less, 95% by mass or less, or 93% by mass or less. Further, the lower limit of this numerical range is preferably 70% by mass or more, more preferably 80% by mass or more, and further preferably 85% by mass or more. The polyalkyl methacrylate in the temporary adhesive film may be composed of one kind alone or a mixture containing two or more kinds of polyalkyl methacrylate. When the polyalkyl methacrylates are mixtures, their total amount is preferably in the above range.
<<<アシルセルロース>>>
アシルセルロースは、セルロースをアシルエステル化することにより得られる化合物であり、下記式(AC-1)で表される化合物であることがより好ましい。
<<< Acyl Cellulose >>
Acyl cellulose is a compound obtained by acyl esterifying cellulose, and is more preferably a compound represented by the following formula (AC-1).
Figure JPOXMLDOC01-appb-C000004
Figure JPOXMLDOC01-appb-C000004
 式(AC-1)において、R11~R16は、それぞれ独立して水素原子またはアシル基(-COR17:R17はアルキル基)を表し、R11~R16のうち少なくとも1つはアシル基であり、nは重合度を表す。 In the formula (AC-1), R 11 to R 16 independently represent a hydrogen atom or an acyl group (-COR 17 : R 17 is an alkyl group), and at least one of R 11 to R 16 is an acyl group. It is a group, and n represents the degree of polymerization.
 R11~R16について、アシル基中のアルキル基R17は、炭素数1~10のアルキル基であることが好ましく、炭素数1~5のアルキル基であることがより好ましく、炭素数1~3のアルキル基であることがさらに好ましい。特に、R17はメチル基であること、すなわち、アシル基はアセチル基であり、アシルセルロースは酢酸セルロースであることが好ましい。同一の繰り返し単位内および異なる繰り返し単位間において、アシル基の種類は、通常、同一であるが、一部異なっていてもよい。 Regarding R 11 to R 16 , the alkyl group R 17 in the acyl group is preferably an alkyl group having 1 to 10 carbon atoms, more preferably an alkyl group having 1 to 5 carbon atoms, and 1 to 5 carbon atoms. It is more preferably an alkyl group of 3. In particular, it is preferable that R 17 is a methyl group, that is, the acyl group is an acetyl group and the acyl cellulose is cellulose acetate. Within the same repeating unit and between different repeating units, the types of acyl groups are usually the same, but may be partially different.
 同一の繰り返し単位内のR11~R16について、少なくとも2つがアシル基であることが好ましく、少なくとも4つがアシル基であることがより好ましく、6つすべてがアシル基であってもよい。異なる繰り返し単位間において、アシル基の数は、同一であってもよく、異なっていてもよい。アシルエステル化の度合を表すアシル化度(アシルセルロースを鹸化して遊離するカルボン酸の割合。特にアシルセルロースが酢酸セルロースである場合には、酢化度とも言われる。)は、35~75%であることが好ましい。この数値範囲の上限は、70%以下であることが好ましく、65%以下であることがより好ましく、60%以下であることがさらに好ましい。また、この数値範囲の下限は、40%以上であることが好ましく、45%以上であることがより好ましく、50%以上であることがさらに好ましい。また、アシル基の置換度合を表す置換度は、0.1~3であることが好ましい。この数値範囲の上限は、2.9以下であることが好ましく、2.8以下であることがより好ましく、2.7以下であることがさらに好ましい。また、この数値範囲の下限は、0.2以上であることが好ましく、0.3以上であることがより好ましく、0.4以上であることがさらに好ましい。ここで、上記置換度は、グルコース単位当たり3個ある水酸基のうち、アセチル化(アシル化)されたものの平均の数を意味する。酢酸セルロースは、例えば上記の置換基Tを有していてもよい。 For R 11 to R 16 in the same repeating unit, at least two are preferably acyl groups, at least four are more preferably acyl groups, and all six may be acyl groups. Between different repeating units, the number of acyl groups may be the same or different. The degree of acylation (the ratio of carboxylic acid liberated by saponifying acyl cellulose, which is also called the degree of vinegarization when the acyl cellulose is cellulose acetate), which indicates the degree of acyl esterification, is 35 to 75%. Is preferable. The upper limit of this numerical range is preferably 70% or less, more preferably 65% or less, and even more preferably 60% or less. Further, the lower limit of this numerical range is preferably 40% or more, more preferably 45% or more, and further preferably 50% or more. The degree of substitution representing the degree of substitution of the acyl group is preferably 0.1 to 3. The upper limit of this numerical range is preferably 2.9 or less, more preferably 2.8 or less, and even more preferably 2.7 or less. Further, the lower limit of this numerical range is preferably 0.2 or more, more preferably 0.3 or more, and further preferably 0.4 or more. Here, the degree of substitution means the average number of acetylated (acylated) groups of three hydroxyl groups per glucose unit. Cellulose acetate may have, for example, the above-mentioned substituent T.
 また、式(AC-1)中の末端の水素原子は置換基(例えば他の糖)によって置換されていてもよい。 Further, the hydrogen atom at the terminal in the formula (AC-1) may be substituted with a substituent (for example, another sugar).
 アシルセルロースの重量平均分子量は、10,000~300,000であることが好ましい。この数値範囲の上限は、200,000以下であることが好ましく、150,000以下であることがより好ましく、120,000以下であることがさらに好ましい。また、この数値範囲の下限は、20,000以上であることが好ましく、50,000以上であることがより好ましく、80,000以上であることがさらに好ましい。 The weight average molecular weight of acylcellulose is preferably 10,000 to 300,000. The upper limit of this numerical range is preferably 200,000 or less, more preferably 150,000 or less, and even more preferably 120,000 or less. Further, the lower limit of this numerical range is preferably 20,000 or more, more preferably 50,000 or more, and further preferably 80,000 or more.
 アシルセルロースを主成分とする仮接着膜においては、仮接着膜中のアシルセルロースの含有量は、50~100質量%であることが好ましい。この数値範囲の上限は、98質量%以下でもよく、95質量%以下でもよく、93質量%以下でもよい。また、この数値範囲の下限は、70質量%以上であることが好ましく、80質量%以上であることがより好ましく、85質量%以上であることがさらに好ましい。仮接着膜中のアシルセルロースは、1種単独で構成されてもよく、2種以上のアシルセルロースを含む混合物から構成されてもよい。アシルセルロースが混合物である場合には、それらの合計量が上記範囲にあることが好ましい。 In the temporary adhesive film containing acyl cellulose as a main component, the content of acyl cellulose in the temporary adhesive film is preferably 50 to 100% by mass. The upper limit of this numerical range may be 98% by mass or less, 95% by mass or less, or 93% by mass or less. Further, the lower limit of this numerical range is preferably 70% by mass or more, more preferably 80% by mass or more, and further preferably 85% by mass or more. The acyl cellulose in the temporary adhesive film may be composed of one kind alone or a mixture containing two or more kinds of acyl cellulose. When the acylcellulose is a mixture, it is preferable that the total amount thereof is in the above range.
<<<エラストマー>>>
 仮接着膜に使用される樹脂としては、例えばエラストマーを使用することもできる。仮接着膜がエラストマーを含有することで、基材や支持体の微細な凹凸にも追従し、適度なアンカー効果により、優れた接着性を有する膜を形成できる。また、支持体からチップを剥離する際に、チップに応力をかけることなく、チップを支持体から簡単に剥離でき、基材上のデバイス等の破損や剥落を防止できる。
<<< Elastomer >>>
As the resin used for the temporary adhesive film, for example, an elastomer can also be used. Since the temporary adhesive film contains an elastomer, it can follow the fine irregularities of the base material and the support, and can form a film having excellent adhesiveness by an appropriate anchor effect. Further, when the chip is peeled from the support, the chip can be easily peeled from the support without applying stress to the chip, and damage or peeling of the device or the like on the base material can be prevented.
 なお、本明細書において、エラストマーとは、弾性変形を示す高分子化合物を意味する。すなわち、外力を加えたときに、その外力に応じて瞬時に変形し、かつこの外力を除いたときには短時間で元の形状まで回復する性質を有する高分子化合物である。例えば、エラストマーは、室温(23℃)において元の形状の長さを100%としたときに、外力を付与して両端を引っ張ることにより200%の長さまで弾性変形させることができ、かつその外力を除いたときに、短時間で130%の長さにまで戻る性質を有することが好ましい。 In addition, in this specification, an elastomer means a polymer compound exhibiting elastic deformation. That is, it is a polymer compound having a property of being instantly deformed in response to the external force when an external force is applied and recovering to the original shape in a short time when the external force is removed. For example, an elastomer can be elastically deformed to a length of 200% by applying an external force and pulling both ends when the length of the original shape is 100% at room temperature (23 ° C.), and the external force is applied. It is preferable to have a property of returning to a length of 130% in a short time when the above is removed.
 本発明において、エラストマーは、25℃から、20℃/分で昇温した5%熱質量減少温度が、375℃以上であり、380℃以上が好ましく、390℃以上がさらに好ましく、400℃以上が最も好ましい。また、上限値は特に限定はないが、例えば1000℃以下が好ましく、800℃以下がより好ましい。この態様によれば、耐熱性に優れたシート等の膜を形成しやすい。質量減少温度は、熱重量測定装置(TGA)により、窒素気流下において、上記昇温条件で測定した値である。なお、本発明の組成物がエラストマーを2種以上含む場合は、2種以上のエラストマーの混合物における値を意味する。 In the present invention, the elastomer has a 5% thermogravimetric reduction temperature raised from 25 ° C. to 20 ° C./min at 375 ° C. or higher, preferably 380 ° C. or higher, further preferably 390 ° C. or higher, and 400 ° C. or higher. Most preferred. The upper limit is not particularly limited, but is preferably 1000 ° C. or lower, more preferably 800 ° C. or lower, for example. According to this aspect, it is easy to form a film such as a sheet having excellent heat resistance. The mass reduction temperature is a value measured by a thermogravimetric analyzer (TGA) under the above-mentioned temperature rising conditions under a nitrogen stream. When the composition of the present invention contains two or more types of elastomers, it means a value in a mixture of two or more types of elastomers.
 本発明において、エラストマーのガラス転移温度(以下、「Tg」ともいう)は、-50~300℃が好ましく、0~200℃がより好ましい。Tgが上記範囲であれば、接着時にデバイスウェハ表面への追従性がよく、ボイドのないシート等の膜を形成することができる。なお、エラストマーがTgを2点以上有する場合は、上記Tgの値は、低い方のガラス転移温度を意味する。 In the present invention, the glass transition temperature of the elastomer (hereinafter, also referred to as “Tg”) is preferably −50 to 300 ° C., more preferably 0 to 200 ° C. When Tg is in the above range, it has good followability to the surface of the device wafer at the time of bonding, and a film such as a void-free sheet can be formed. When the elastomer has two or more points of Tg, the value of Tg means the lower glass transition temperature.
 本発明において、エラストマーの重量平均分子量は、2,000~200,000が好ましく、10,000~200,000がより好ましく、50,000~100,000が特に好ましい。この範囲にあることで、エラストマーが溶剤への優れた溶解性を示すため、仮接着膜の除去の際にチップに残渣が残らないなどの利点がある。 In the present invention, the weight average molecular weight of the elastomer is preferably 2,000 to 200,000, more preferably 10,000 to 200,000, and particularly preferably 50,000 to 100,000. Within this range, since the elastomer exhibits excellent solubility in a solvent, there is an advantage that no residue remains on the chip when the temporary adhesive film is removed.
 本発明において、エラストマーとしては、スチレン由来の繰り返し単位を含むエラストマー(ポリスチレン系エラストマー)、ポリエステル系エラストマー、ポリオレフィン系エラストマー、ポリウレタン系エラストマー、ポリアミド系エラストマー、ポリアクリル系エラストマー、シリコーン系エラストマー、ポリイミド系エラストマーなどが使用できる。ポリスチレン系エラストマー、ポリエステル系エラストマー、ポリオレフィン系エラストマー、ポリウレタン系エラストマー、ポリアミド系エラストマー、ポリアクリル系エラストマー、シリコーン系エラストマーおよびポリイミド系エラストマーから選ばれる1種以上が好ましく、溶解性、耐熱性等の観点からポリスチレン系エラストマーが特に好ましい。 In the present invention, the elastomer includes an elastomer containing a repeating unit derived from styrene (polystyrene-based elastomer), a polyester-based elastomer, a polyolefin-based elastomer, a polyurethane-based elastomer, a polyamide-based elastomer, a polyacrylic elastomer, a silicone-based elastomer, and a polyimide-based elastomer. Etc. can be used. One or more selected from polystyrene-based elastomers, polyester-based elastomers, polyolefin-based elastomers, polyurethane-based elastomers, polyamide-based elastomers, polyacrylic elastomers, silicone-based elastomers, and polyimide-based elastomers is preferable, and from the viewpoint of solubility, heat resistance, and the like. Polystyrene elastomers are particularly preferred.
 ポリスチレン系エラストマーとしては、特に制限はなく、目的に応じて適宜選択することができる。例えば、スチレン-ブタジエン-スチレンブロック共重合体(SBS)、スチレン-イソプレン-スチレンブロック共重合体(SIS)、スチレン-エチレン-ブチレン-スチレンブロック共重合体(SEBS)、スチレン-ブタジエン-ブチレン-スチレン共重合体(SBBS)およびこれらの水添物、スチレン-エチレン-プロピレン-スチレンブロック共重合体(SEPS)、スチレン-エチレン-エチレン-プロピレン-スチレンブロック共重合体等が挙げられる。 The polystyrene-based elastomer is not particularly limited and can be appropriately selected according to the purpose. For example, styrene-butadiene-styrene block copolymer (SBS), styrene-isoprene-styrene block copolymer (SIS), styrene-ethylene-butylene-styrene block copolymer (SEBS), styrene-butadiene-butylene-styrene. Examples thereof include copolymers (SBBS) and their hydrogenators, styrene-ethylene-propylene-styrene block copolymers (SEPS), and styrene-ethylene-ethylene-propylene-styrene block copolymers.
 ポリスチレン系エラストマーにおける、スチレン由来の繰り返し単位の含有量は40質量%以上が好ましく、45質量%以上が好ましく、46質量%以上がより好ましい。上限は、例えば、90質量%以下とすることができ、85質量%以下とすることもできる。 The content of the repeating unit derived from styrene in the polystyrene-based elastomer is preferably 40% by mass or more, preferably 45% by mass or more, and more preferably 46% by mass or more. The upper limit can be, for example, 90% by mass or less, or 85% by mass or less.
 ポリスチレン系エラストマーは、スチレンと他のモノマーのブロック共重合体であることが好ましく、片末端または両末端がスチレンブロックであるブロック共重合体であることがより好ましく、両末端がスチレンブロックである、ブロック共重合体であることが特に好ましい。ポリスチレン系エラストマーの両端を、スチレンブロック(スチレン由来の繰り返し単位)とすると、耐熱性がより向上する。これは、耐熱性の高いスチレン由来の繰り返し単位が末端に存在することとなるためである。特に、スチレンブロックが反応性のポリスチレン系ハードブロックであることにより、耐熱性、耐薬品性により優れる傾向にあり好ましい。また、ブロック共重合体であるエラストマーを用いることにより、200℃以上においてハードブロックとソフトブロックでの相分離を行うと考えられる。その相分離の形状はデバイスウェハの基板表面の凹凸の発生の抑制に寄与すると考えられる。加えて、このようなエラストマーは、溶剤への溶解性およびレジスト溶剤への耐性の観点からもより好ましい。 The polystyrene-based elastomer is preferably a block copolymer of styrene and another monomer, more preferably a block copolymer having one end or both ends being a styrene block, and both ends being a styrene block. It is particularly preferable that it is a block copolymer. If both ends of the polystyrene-based elastomer are styrene blocks (repeating units derived from styrene), the heat resistance is further improved. This is because a repeating unit derived from styrene, which has high heat resistance, is present at the end. In particular, since the styrene block is a reactive polystyrene-based hard block, it tends to be more excellent in heat resistance and chemical resistance, which is preferable. Further, it is considered that the phase separation between the hard block and the soft block is performed at 200 ° C. or higher by using an elastomer which is a block copolymer. The shape of the phase separation is considered to contribute to the suppression of the occurrence of unevenness on the substrate surface of the device wafer. In addition, such elastomers are more preferred from the standpoint of solvent solubility and resistance to resist solvents.
 また、ポリスチレン系エラストマーは水添物であると、熱に対する安定性が向上し、分解や重合等の変質が起こりにくい。さらに、溶剤への溶解性およびレジスト溶剤への耐性の観点からもより好ましい。 In addition, when polystyrene-based elastomers are hydrogenated, their stability against heat is improved, and deterioration such as decomposition and polymerization is unlikely to occur. Further, it is more preferable from the viewpoint of solubility in a solvent and resistance to a resist solvent.
 なお、本明細書において「スチレン由来の繰り返し単位」とは、スチレンまたはスチレン誘導体を重合した際に重合体に含まれるスチレン由来の構成単位であり、置換基を有していてもよい。スチレン誘導体としては、例えば、α-メチルスチレン、3-メチルスチレン、4-プロピルスチレン、4-シクロヘキシルスチレン等が挙げられる。置換基としては、例えば、炭素数1~5のアルキル基、炭素数1~5のアルコキシ基、炭素数1~5のアルコキシアルキル基、アセトキシ基、カルボキシ基等が挙げられる。 In the present specification, the "styrene-derived repeating unit" is a styrene-derived structural unit contained in the polymer when styrene or a styrene derivative is polymerized, and may have a substituent. Examples of the styrene derivative include α-methylstyrene, 3-methylstyrene, 4-propylstyrene, 4-cyclohexylstyrene and the like. Examples of the substituent include an alkyl group having 1 to 5 carbon atoms, an alkoxy group having 1 to 5 carbon atoms, an alkoxyalkyl group having 1 to 5 carbon atoms, an acetoxy group, a carboxy group and the like.
 その他のエラストマー(例えば、ポリエステル系エラストマー、ポリオレフィン系エラストマー、ポリウレタン系エラストマー、ポリアミド系エラストマー、ポリアクリル系エラストマー、シリコーン系エラストマーおよびポリイミド系エラストマーなど。)に関する詳細は、例えば特開2018-037558号公報に記載されており、これらの記載は本明細書に組み込まれる。 For details on other elastomers (for example, polyester-based elastomers, polyolefin-based elastomers, polyurethane-based elastomers, polyamide-based elastomers, polyacrylic elastomers, silicone-based elastomers, polyimide-based elastomers, etc.), see, for example, JP-A-2018-037558. It has been described and these statements are incorporated herein by reference.
 また、エラストマーは、水添物であることが好ましい。特に、ポリスチレン系エラストマーの水添物が好ましい。エラストマーが水添物であると、耐熱性に優れたシート等の膜を形成しやすい。さらには、剥離性および剥離後の洗浄除去性に優れたシート等の膜を形成しやすい。ポリスチレン系エラストマーの水添物を使用した場合上記効果が顕著である。なお、水添物とは、エラストマーが水添された構造の重合体を意味する。 Further, the elastomer is preferably a hydrogenated product. In particular, a polystyrene-based elastomer hydrogenated product is preferable. When the elastomer is a hydrogenated product, it is easy to form a film such as a sheet having excellent heat resistance. Furthermore, it is easy to form a film such as a sheet having excellent peelability and cleaning / removing property after peeling. The above effect is remarkable when a polystyrene-based elastomer hydrogenated product is used. The hydrogenated product means a polymer having a structure in which an elastomer is hydrogenated.
 また、エラストマーは、ポリスチレン系エラストマーを10~100質量%含有することが好ましく、80~100質量%含有することがより好ましく、90~100質量%含有することがさらに好ましく、95~100質量%含有することが一層好ましく、実質的に、ポリスチレン系エラストマーのみで構成されていることが特に好ましい。さらに、その中でも、ポリスチレン系エラストマー水添物が上記割合で含まれていることがより好ましい。 The elastomer preferably contains 10 to 100% by mass of polystyrene-based elastomer, more preferably 80 to 100% by mass, further preferably 90 to 100% by mass, and 95 to 100% by mass. It is more preferable that the mixture is substantially composed of a polystyrene-based elastomer only. Further, among them, it is more preferable that the polystyrene-based elastomer hydrogenated product is contained in the above ratio.
 エラストマーを主成分とする仮接着膜においては、仮接着膜中のエラストマーの含有量は、50~100質量%であることが好ましい。この数値範囲の上限は、98質量%以下でもよく、95質量%以下でもよく、93質量%以下でもよい。また、この数値範囲の下限は、70質量%以上であることが好ましく、80質量%以上であることがより好ましく、85質量%以上であることがさらに好ましい。エラストマーは上記に挙げた種類を複数含んでいてもよい。仮接着膜中の樹脂が複数のエラストマーを含有する場合には、それらの合計量が上記範囲にあることが好ましい。 In the temporary adhesive film containing an elastomer as a main component, the content of the elastomer in the temporary adhesive film is preferably 50 to 100% by mass. The upper limit of this numerical range may be 98% by mass or less, 95% by mass or less, or 93% by mass or less. Further, the lower limit of this numerical range is preferably 70% by mass or more, more preferably 80% by mass or more, and further preferably 85% by mass or more. The elastomer may contain a plurality of the types listed above. When the resin in the temporary adhesive film contains a plurality of elastomers, the total amount thereof is preferably in the above range.
<<<その他の熱可塑性樹脂>>>
 本発明では、上述したポリビニルアセタール、ポリメタクリル酸メチル、酢酸セルロースおよびエラストマー以外の熱可塑性樹脂(以下、単に、「その他の熱可塑性樹脂」ともいう。)を用いることもできる。その他の熱可塑性樹脂は、1種または2種以上を併用することもできる。その他の熱可塑性樹脂の具体例としては、例えば、アクリル樹脂、ポリビニルアルコール樹脂、ポリビニルアセタール樹脂、ポリビニルピロリドン樹脂、シクロオレフィン樹脂、熱可塑性シロキサン樹脂、不飽和ポリエステル樹脂、熱可塑性ポリイミド樹脂、ポリ塩化ビニル樹脂、ポリ酢酸ビニル樹脂、ポリカーボネート樹脂、ポリフェニレンエーテル樹脂、ポリブチレンテレフタレート樹脂、ポリエチレンテレフタレート樹脂、ポリフェニレンスルフィド樹脂、ポリスルホン樹脂、ポリエーテルスルホン樹脂、ポリアリレート樹脂、セルロース樹脂などが挙げられる。
<<< Other Thermoplastic Resins >>>
In the present invention, a thermoplastic resin other than the above-mentioned polyvinyl acetal, polymethyl methacrylate, cellulose acetate and elastomer (hereinafter, also simply referred to as “other thermoplastic resin”) can also be used. Other thermoplastic resins may be used alone or in combination of two or more. Specific examples of other thermoplastic resins include acrylic resin, polyvinyl alcohol resin, polyvinyl acetal resin, polyvinylpyrrolidone resin, cycloolefin resin, thermoplastic siloxane resin, unsaturated polyester resin, thermoplastic polyimide resin, and polyvinyl chloride. Examples thereof include resins, polyvinyl acetate resins, polycarbonate resins, polyphenylene ether resins, polybutylene terephthalate resins, polyethylene terephthalate resins, polyphenylene sulfide resins, polysulfone resins, polyether sulfone resins, polyarylate resins, and cellulose resins.
 例えば、その他の熱可塑性樹脂としてのアクリル樹脂は、2-エチルヘキシル(メタ)アクリレート、エチル(メタ)アクリレート、n-プロピル(メタ)アクリレート、イソプロピル(メタ)アクリレート、ペンチル(メタ)アクリレート、n-オクチル(メタ)アクリレート、イソオクチル(メタ)アクリレート、イソノニル(メタ)アクリレート、n-ブチル(メタ)アクリレート、イソブチル(メタ)アクリレート、ヘキシル(メタ)アクリレート、n-ノニル(メタ)アクリレート、イソアミル(メタ)アクリレート、n-デシル(メタ)アクリレート、イソデシル(メタ)アクリレート、ドデシル(メタ)アクリレート、イソボルニル(メタ)アクリレート、シクロヘキシル(メタ)アクリレート、フェニル(メタ)アクリレート、ベンジル(メタ)アクリレート、および2-メチルブチル(メタ)アクリレートなどである。また、上記の他、三菱レイヨン(株)製、アクリペット MF 001、スリーエム ジャパン(株)製、LC-5320 F1035などが例示される。 For example, acrylic resins as other thermoplastic resins include 2-ethylhexyl (meth) acrylate, ethyl (meth) acrylate, n-propyl (meth) acrylate, isopropyl (meth) acrylate, pentyl (meth) acrylate, and n-octyl. (Meta) acrylate, isooctyl (meth) acrylate, isononyl (meth) acrylate, n-butyl (meth) acrylate, isobutyl (meth) acrylate, hexyl (meth) acrylate, n-nonyl (meth) acrylate, isoamyl (meth) acrylate , N-decyl (meth) acrylate, isodecyl (meth) acrylate, dodecyl (meth) acrylate, isobornyl (meth) acrylate, cyclohexyl (meth) acrylate, phenyl (meth) acrylate, benzyl (meth) acrylate, and 2-methylbutyl ( Meta) acrylate and the like. In addition to the above, examples thereof include Mitsubishi Rayon Co., Ltd., Acrypet MF 001, 3M Japan Ltd., LC-5320 F1035, and the like.
 また、アクリル樹脂は、本発明の趣旨を逸脱しない範囲で、(メタ)アクリレートモノマーと他のモノマーとを共重合して得た化合物でもよい。(メタ)アクリレートモノマーと他のモノマーとを共重合する場合、他のモノマーの量は、全モノマーの10モル%以下であることが好ましい。 Further, the acrylic resin may be a compound obtained by copolymerizing a (meth) acrylate monomer and another monomer without departing from the spirit of the present invention. When the (meth) acrylate monomer is copolymerized with another monomer, the amount of the other monomer is preferably 10 mol% or less of the total monomer.
 仮接着膜中の樹脂の含有量は、8質量%以上であることが好ましい。特に、この数値範囲の上限は、30質量%以下であることが好ましく、26質量%以下であることがより好ましく、22質量%以下であることがさらに好ましい。また、この数値範囲の下限は、10質量%以上であることが好ましく、11質量%以上であることがより好ましく、12質量%以上であることがさらに好ましい。仮接着膜中の樹脂は、1種単独で構成されてもよく、2種以上の樹脂を含む混合樹脂から構成されてもよい。樹脂が混合樹脂である場合には、それらの合計量が上記範囲にあることが好ましい。 The content of the resin in the temporary adhesive film is preferably 8% by mass or more. In particular, the upper limit of this numerical range is preferably 30% by mass or less, more preferably 26% by mass or less, and further preferably 22% by mass or less. Further, the lower limit of this numerical value range is preferably 10% by mass or more, more preferably 11% by mass or more, and further preferably 12% by mass or more. The resin in the temporary adhesive film may be composed of one kind alone or a mixed resin containing two or more kinds of resins. When the resin is a mixed resin, it is preferable that the total amount thereof is in the above range.
 積層体中の仮接着膜の厚さは、10~100μmであることが好ましい。仮接着膜の厚さが上記範囲にあることにより、支持体から剥離したチップ上で仮接着膜の厚さが適切な範囲となり、仮接着膜の保護膜としての機能がより効果的に発揮される。この数値範囲の上限は、90μm以下であることが好ましく、85μm以下であることがより好ましく、80μm以下であることがさらに好ましい。また、この数値範囲の下限は、15μm以上であることが好ましく、20μm以上であることがより好ましく、30μm以上であることがさらに好ましい。 The thickness of the temporary adhesive film in the laminated body is preferably 10 to 100 μm. When the thickness of the temporary adhesive film is within the above range, the thickness of the temporary adhesive film is within an appropriate range on the chip peeled from the support, and the function of the temporary adhesive film as a protective film is more effectively exhibited. To. The upper limit of this numerical range is preferably 90 μm or less, more preferably 85 μm or less, and further preferably 80 μm or less. Further, the lower limit of this numerical value range is preferably 15 μm or more, more preferably 20 μm or more, and further preferably 30 μm or more.
 また、基材片(チップ)を支持体から剥離した後において、チップ上の仮接着膜の厚さは、10~100μmであることが好ましい。基材を支持体から剥離した後において、チップ上の仮接着膜の厚さが上記範囲にあることにより、仮接着膜の保護膜としての機能がより効果的に発揮される。この数値範囲の上限は、90μm以下であることが好ましく、85μm以下であることがより好ましく、80μm以下であることがさらに好ましい。また、この数値範囲の下限は、15μm以上であることが好ましく、20μm以上であることがより好ましく、30μm以上であることがさらに好ましい。 Further, after the base material piece (chip) is peeled off from the support, the thickness of the temporary adhesive film on the chip is preferably 10 to 100 μm. When the thickness of the temporary adhesive film on the chip is within the above range after the base material is peeled off from the support, the function of the temporary adhesive film as a protective film is more effectively exhibited. The upper limit of this numerical range is preferably 90 μm or less, more preferably 85 μm or less, and further preferably 80 μm or less. Further, the lower limit of this numerical value range is preferably 15 μm or more, more preferably 20 μm or more, and further preferably 30 μm or more.
<<<可塑剤>>>
 仮接着膜は、必要に応じて可塑剤を含んでいてもよい。可塑剤としては、フタル酸エステル、脂肪酸エステル、芳香族多価カルボン酸エステル、ポリエステルなどが使用できる。
<<< Plasticizer >>>
The temporary adhesive film may contain a plasticizer, if necessary. As the plasticizer, phthalates, fatty acid esters, aromatic polyvalent carboxylic acid esters, polyesters and the like can be used.
 フタル酸エステルとしては例えば、DMP、DEP、DBP、#10、BBP、DOP、DINP、DIDP(以上、大八化学工業社製)、PL-200、DOIP(以上、シージーエスター(株)製)、サンソサイザーDUP(新日本理化(株)製)などが挙げられる。 Examples of phthalates include DMP, DEP, DBP, # 10, BBP, DOP, DINP, DIDP (above, manufactured by Daihachi Chemical Industry Co., Ltd.), PL-200, DOIP (above, manufactured by CGG Ester Co., Ltd.), Examples include Sun Associate DUP (manufactured by New Japan Chemical Co., Ltd.).
 脂肪酸エステルとしては例えば、ブチルステアレート、ユニスターM-9676、ユニスターM-2222SL、ユニスターH-476、ユニスターH-476D、パナセート800B、パナセート875、パナセート810(以上、日油(株)製)、DBA、DIBA、DBS、DOA、DINA、DIDA、DOS、BXA、DOZ、DESU(以上、大八化学工業社製)などが挙げられる。 Examples of fatty acid esters include butyl stearate, Unistar M-9676, Unistar M-2222SL, Unistar H-476, Unistar H-476D, Panaceto 800B, Panaceto 875, Panaceto 810 (all manufactured by NOF CORPORATION), and DBA. , DIBA, DBS, DOA, DINA, DIDA, DOS, BXA, DOZ, DESU (all manufactured by Daihachi Chemical Industry Co., Ltd.) and the like.
 芳香族多価カルボン酸エステルとしては、TOTM、モノサイザーW-705(以上、大八化学工業社製)、UL-80、UL-100(以上、(株)ADEKA製)などが挙げられる。 Examples of the aromatic polyvalent carboxylic acid ester include TOTM, monosizer W-705 (above, manufactured by Daihachi Chemical Industry Co., Ltd.), UL-80, UL-100 (above, manufactured by ADEKA Corporation), and the like.
 ポリエステルとしては、ポリサイザーTD-1720、ポリサイザーS-2002、ポリサイザーS-2010(以上、DIC(株)製)、BAA-15(大八化学工業社製)などが挙げられる。 Examples of polyester include Polysizer TD-1720, Polysizer S-2002, Polysizer S-2010 (all manufactured by DIC Corporation), BAA-15 (manufactured by Daihachi Chemical Industry Co., Ltd.) and the like.
 上記可塑剤の中では、DIDP、DIDA、TOTM、ユニスターM-2222SL、ポリサイザーTD-1720が好ましく、DIDA、TOTMがより好ましく、TOTMが特に好ましい。可塑剤は1種のみを用いてもよいし、2種以上を組み合わせてもよい。 Among the above plasticizers, DIDP, DIDA, TOTM, Unistar M-2222SL, and Polysizer TD-1720 are preferable, DIDA and TOTM are more preferable, and TOTM is particularly preferable. Only one type of plasticizer may be used, or two or more types may be combined.
 特に、酢酸セルロースの熱可塑性は比較的小さいため、酢酸セルロースへの可塑剤の添加は有用である。酢酸セルロースについて好ましい可塑剤は、例えば、クエン酸トリエチル、クエン酸アセチル・トリエチル、フタル酸ジブチル(DBP)、フタル酸ジアリール、フタル酸ジエチル(DEP)、フタル酸ジメチル(DMP)、フタル酸ジ-2-メトキシエチル、酒石酸ジブチル、o-ベンゾイル安息香酸エチル、エチルフタリル・エチルグリコレート(EPEG)、メチルフタリル・エチルグリコレート(MPEG)、N-エチルトルエンスルホンアミド、トリアセチン、p-トルエンスルホン酸O-クレジル、リン酸トリエチル(TEP)、リン酸トリフェニル(TPP)、およびトリプロピオニンなどである。 In particular, since the thermoplasticity of cellulose acetate is relatively small, it is useful to add a plasticizer to cellulose acetate. Preferred plasticizers for cellulose acetate are, for example, triethyl citrate, acetyl triethyl citrate, dibutyl phthalate (DBP), diaryl phthalate, diethyl phthalate (DEP), dimethyl phthalate (DMP), di-2 phthalate. -Methoxyethyl, dibutyl tartrate, ethyl o-benzoylbenzoate, ethylphthalyl ethylglycolate (EPEG), methylphthalyl ethylglycolate (MPEG), N-ethyltoluenesulfonamide, triacetin, p-toluenesulfonic acid O-cresyl, Triethyl phosphate (TEP), triphenyl phosphate (TPP), tripropionin and the like.
 可塑剤は、加熱中の昇華防止の観点から、窒素気流下、20℃/分の一定速度の昇温条件のもとで質量変化を測定したとき、その質量が1質量%減少する温度が、250℃以上であることが好ましく、270℃以上がより好ましく、300℃以上が特に好ましい。上限は特に定めるものではないが、例えば、500℃以下とすることができる。 From the viewpoint of preventing sublimation during heating, the temperature at which the mass of the plasticizer decreases by 1% by mass when the mass change is measured under a nitrogen flow and a constant rate of temperature of 20 ° C./min. It is preferably 250 ° C. or higher, more preferably 270 ° C. or higher, and particularly preferably 300 ° C. or higher. The upper limit is not particularly specified, but can be, for example, 500 ° C. or lower.
 可塑剤の添加量は、仮接着膜中0.01質量%~5.0質量%であることが好ましく、より好ましくは0.1質量%~2.0質量%である。 The amount of the plasticizer added is preferably 0.01% by mass to 5.0% by mass, more preferably 0.1% by mass to 2.0% by mass in the temporary adhesive film.
<<<酸化防止剤>>>
 仮接着膜は、酸化防止剤を含有してもよい。酸化防止剤としては、フェノール系酸化防止剤、硫黄系酸化防止剤、リン系酸化防止剤、キノン系酸化防止剤、アミン系酸化防止剤などが使用できる。
<<< Antioxidant >>>
The temporary adhesive film may contain an antioxidant. As the antioxidant, a phenol-based antioxidant, a sulfur-based antioxidant, a phosphorus-based antioxidant, a quinone-based antioxidant, an amine-based antioxidant and the like can be used.
 フェノール系酸化防止剤としては例えば、p-メトキシフェノール、2,6-ジ-tert-ブチル-4-メチルフェノール、Irganox1010、Irganox1330、Irganox3114、Irganox1035(以上、BASFジャパン(株)製)、Sumilizer MDP-S、Sumilizer GA-80(以上、住友化学(株)製)などが挙げられる。 Examples of the phenolic antioxidant include p-methoxyphenol, 2,6-di-tert-butyl-4-methylphenol, Irganox1010, Irganox1330, Irganox3114, Irganox1035 (all manufactured by BASF Japan Ltd.), Sumilizer MDP- Examples include S and Sumilizer GA-80 (all manufactured by Sumitomo Chemical Co., Ltd.).
 硫黄系酸化防止剤としては例えば、3,3’-チオジプロピオネートジステアリル、Sumilizer TPM、Sumilizer TPS、Sumilizer TP-D(以上、住友化学(株)製)などが挙げられる。 Examples of the sulfur-based antioxidant include 3,3'-thiodipropionate distearyl, Sumilizer TPM, Sumilizer TPS, Sumilizer TP-D (all manufactured by Sumitomo Chemical Co., Ltd.) and the like.
 リン系酸化防止剤としては例えば、トリス(2,4-ジ-tert-ブチルフェニル)ホスファイト、ビス(2,4-ジ-tert-ブチルフェニル)ペンタエリスリトールジホスファイト、ポリ(ジプロピレングリコール)フェニルホスファイト、ジフェニルイソデシルホスファイト、2-エチルヘキシルジフェニルホスファイト、トリフェニルホスファイト、Irgafos168、Irgafos38(以上、BASFジャパン(株)製)などが挙げられる。 Examples of phosphorus-based antioxidants include tris (2,4-di-tert-butylphenyl) phosphite, bis (2,4-di-tert-butylphenyl) pentaerythritol diphosphite, and poly (dipropylene glycol). Examples thereof include phenylphosphite, diphenylisodecylphosphite, 2-ethylhexyldiphenylphosphite, triphenylphosphite, Irgafos168, Irgafos38 (all manufactured by BASF Japan Co., Ltd.) and the like.
 キノン系酸化防止剤としては例えば、p-ベンゾキノン、2-tert-ブチル-1,4-ベンゾキノンなどが挙げられる。 Examples of the quinone-based antioxidant include p-benzoquinone and 2-tert-butyl-1,4-benzoquinone.
 アミン系酸化防止剤としては例えば、ジメチルアニリンやフェノチアジンなどが挙げられる。 Examples of amine-based antioxidants include dimethylaniline and phenothiazine.
 酸化防止剤は、Irganox1010、Irganox1330、3,3’-チオジプロピオネートジステアリル、Sumilizer TP-Dが好ましく、Irganox1010、Irganox1330がより好ましく、Irganox1010が特に好ましい。 As the antioxidant, Irganox1010, Irganox1330, 3,3'-thiodipropionate distearyl and Sumilizer TP-D are preferable, Irganox1010 and Irganox1330 are more preferable, and Irganox1010 is particularly preferable.
 また、上記酸化防止剤のうち、フェノール系酸化防止剤と、硫黄系酸化防止剤またはリン系酸化防止剤とを併用することが好ましく、フェノール系酸化防止剤と硫黄系酸化防止剤とを併用することが最も好ましい。特に、エラストマーとして、ポリスチレン系エラストマーを使用した場合において、フェノール系酸化防止剤と硫黄系酸化防止剤とを併用することが好ましい。このような組み合わせにすることにより、酸化反応による仮接着用組成物の劣化を、効率よく抑制できる効果が期待できる。フェノール系酸化防止剤と硫黄系酸化防止剤とを併用する場合、両者の質量比は、フェノール系酸化防止剤:硫黄系酸化防止剤=95:5~5:95が好ましく、25:75~75:25がより好ましい。 Further, among the above-mentioned antioxidants, it is preferable to use a phenol-based antioxidant in combination with a sulfur-based antioxidant or a phosphorus-based antioxidant, and a phenol-based antioxidant and a sulfur-based antioxidant are used in combination. Is most preferable. In particular, when a polystyrene-based elastomer is used as the elastomer, it is preferable to use a phenol-based antioxidant and a sulfur-based antioxidant in combination. With such a combination, it is expected that the deterioration of the temporary adhesive composition due to the oxidation reaction can be efficiently suppressed. When a phenolic antioxidant and a sulfur-based antioxidant are used in combination, the mass ratio of the two is preferably phenol-based antioxidant: sulfur-based antioxidant = 95: 5 to 5:95, and 25: 75 to 75. : 25 is more preferable.
 酸化防止剤の組み合わせとしては、Irganox1010とSumilizer TP-D、Irganox1330とSumilizer TP-D、および、Sumilizer GA-80とSumilizer TP-Dが好ましく、Irganox1010とSumilizer TP-D、Irganox1330とSumilizer TP-Dがより好ましく、Irganox1010とSumilizer TP-Dが特に好ましい。 As the combination of antioxidants, Irganox1010 and Sumilizer TP-D, Irganox1330 and Sumilizer TP-D, and Sumilizer GA-80 and Sumilizer TP-D are preferable, and Irganox1010 and SumilizerTP-D, Irganox1010 and SumilizerTP-D, Ir. More preferred, Irganox 1010 and Sumilizer TP-D are particularly preferred.
 酸化防止剤の分子量は加熱中の昇華防止の観点から、400以上が好ましく、600以上がさらに好ましく、750以上が特に好ましい。 From the viewpoint of preventing sublimation during heating, the molecular weight of the antioxidant is preferably 400 or more, more preferably 600 or more, and particularly preferably 750 or more.
 仮接着膜が酸化防止剤を含有する場合、酸化防止剤の含有量は、仮接着膜中0.001~20.0質量%であることが好ましく、0.005~10.0質量%であることがより好ましい。酸化防止剤は1種のみでもよいし、2種以上であってもよい。酸化防止剤が2種以上の場合は、それらの合計量が上記範囲にあることが好ましい。 When the temporary adhesive film contains an antioxidant, the content of the antioxidant is preferably 0.001 to 20.0% by mass, preferably 0.005 to 10.0% by mass in the temporary adhesive film. Is more preferable. Only one type of antioxidant may be used, or two or more types may be used. When there are two or more kinds of antioxidants, it is preferable that the total amount thereof is in the above range.
<<<その他の添加剤>>>
 本発明で用いる仮接着用組成物は、本発明の効果を損なわない範囲で、上述した添加剤に加え、必要に応じて、各種添加物、例えば、硬化剤、硬化触媒、充填剤、密着促進剤、紫外線吸収剤、凝集防止剤等を配合することができる。これらの添加剤を配合する場合、その合計配合量は仮接着用組成物の全固形分の3質量%以下が好ましい。
<<< Other Additives >>>
The composition for temporary adhesion used in the present invention is, as long as the effect of the present invention is not impaired, in addition to the above-mentioned additives, various additives such as a curing agent, a curing catalyst, a filler, and adhesion promotion are required. Agents, ultraviolet absorbers, anti-aggregation agents and the like can be blended. When these additives are blended, the total blending amount is preferably 3% by mass or less of the total solid content of the temporary adhesive composition.
 仮接着膜は、単層構造でもよく、複層構造でもよい。複層構造である場合には、仮接着膜は、上記各樹脂からなる1つ以上の樹脂層を含むことができる。また、仮接着膜は、支持体側の表層部分に後述する剥離層を含むことができる。 The temporary adhesive film may have a single-layer structure or a multi-layer structure. In the case of a multi-layer structure, the temporary adhesive film can include one or more resin layers made of each of the above resins. Further, the temporary adhesive film may include a release layer described later in the surface layer portion on the support side.
<<支持体>>
 支持体は、ダイシング処理の際に、積層体をダイシングフレームに固定するための部材であり、一般的にダイシングテープとも呼ばれている。支持体は、単層構造でもよく、複層構造でもよい。つまり、支持体は、母体となる単層または複層の支持フィルムからなることができる。また、支持体は、支持フィルム上に形成された粘着層を含むことができる。さらに、支持体は、仮接着膜側の表層部分に後述する剥離層を含むことができる。支持体は、ダイシング後に、拡張(エキスパンド)して取り出しやすくするため、伸縮性を有することが好ましい。また、支持体は、後述するように紫外線硬化型樹脂組成物からなる粘着層を使用する場合には、光透過性を有することが好ましい。
<< Support >>
The support is a member for fixing the laminated body to the dicing frame during the dicing process, and is generally also called a dicing tape. The support may have a single-layer structure or a multi-layer structure. That is, the support can consist of a single-layer or multi-layer support film as a base. In addition, the support can include an adhesive layer formed on the support film. Further, the support can include a release layer described later in the surface layer portion on the temporary adhesive film side. The support preferably has elasticity so that it can be expanded (expanded) and easily taken out after dicing. Further, the support preferably has light transmission property when an adhesive layer made of an ultraviolet curable resin composition is used as described later.
 支持体を構成する支持フィルムの材料は、特に制限されず、公知の樹脂フィルム用の高分子材料の中から適宜選択されてもよい。支持フィルムを構成する高分子材料は、例えば、ポリエチレン、ポリプロピレン、エチレン/プロピレンの共重合体およびポリブテンのようなポリオレフィン、エチレン/酢酸ビニルの共重合体、エチレン/(メタ)アクリレートの共重合体、エチレン/(メタ)アクリル酸エステルの共重合体、および、エチレン/(メタ)アクリル酸金属塩の共重合体を含むアイオノマーのようなエチレン共重合体、ポリエチレンテレフタレートおよびポリブチレンテレフタレートのようなポリエステル、ポリメタクリル酸メチルのようなアクリル、ポリ塩化ビニル、ポリカーボネート、ポリアセタール、ポリアミド、ポリイミド、ポリウレタン、ポリスチレン、天然ゴム、ならびに合成ゴムなどであることが好ましい。また、支持フィルムは、これらの群から選ばれる2種以上が混合された混合樹脂から構成されてもよく、2種以上の樹脂が複層化された構造を有していてもよい。支持体が粘着層を含む場合には、支持体の材料は、粘着層との接着性も考慮しながら任意に選択することができる。 The material of the support film constituting the support is not particularly limited, and may be appropriately selected from known polymer materials for resin films. The polymer materials constituting the support film include, for example, polyethylene, polypropylene, ethylene / propylene copolymers and polyolefins such as polybutene, ethylene / vinyl acetate copolymers, ethylene / (meth) acrylate copolymers, and the like. Ethylene copolymers such as ionomers, including copolymers of ethylene / (meth) acrylic acid esters, and copolymers of ethylene / (meth) acrylic acid metal salts, polyesters such as polyethylene terephthalate and polybutylene terephthalate, Acrylics such as polymethylmethacrylate, polyvinyl chlorides, polycarbonates, polyacetals, polyamides, polyimides, polyurethanes, polystyrenes, natural rubbers, synthetic rubbers and the like are preferred. Further, the support film may be composed of a mixed resin in which two or more kinds selected from these groups are mixed, or may have a structure in which two or more kinds of resins are multi-layered. When the support includes an adhesive layer, the material of the support can be arbitrarily selected in consideration of the adhesiveness with the adhesive layer.
 支持フィルムの厚さは、特に制限されず、例えば50~300μmであることが好ましい。この数値範囲の上限は、250μm以下であることが好ましく、200μm以下であることがより好ましく、160μm以下であることがさらに好ましい。また、この数値範囲の下限は、60μm以上であることが好ましく、70μm以上であることがより好ましく、90μm以上であることがさらに好ましい。 The thickness of the support film is not particularly limited, and is preferably 50 to 300 μm, for example. The upper limit of this numerical range is preferably 250 μm or less, more preferably 200 μm or less, and even more preferably 160 μm or less. Further, the lower limit of this numerical value range is preferably 60 μm or more, more preferably 70 μm or more, and further preferably 90 μm or more.
 支持体を構成しうる粘着層は、ダイシング中に半導体デバイス等の基材の飛散を抑制するのに十分な粘着性を有する。粘着層の材料は、特に制限されず、アクリル樹脂、ウレタン樹脂およびシリコーン樹脂など、従来公知の粘着性材料を含むことができる。粘着層は、熱やエネルギー線の付与により硬化する硬化型組成物からなることが好ましい。これにより、熱やエネルギー線の付与によって粘着層を適度に硬化させて、仮接着膜に対する粘着力を低下させることができる。その結果、支持体および仮接着膜の接着界面で、より効果的に剥離が生じやすくなり、仮接着膜の保護膜としての強度が確保されやすくなる。特に、上記硬化型組成物は、エネルギー線の照射により硬化する組成物であることが好ましく、紫外線の照射により硬化する組成物であることがより好ましい。硬化型組成物は、例えば、重合性官能基を有するモノマーまたはオリゴマー、および重合開始剤を含む。粘着層の粘着性は、粘着材料の架橋密度を制御することにより適宜制御可能である。粘着材料の架橋密度の制御は、例えば、多官能イソシアネート化合物、エポキシ化合物、メラミン化合物、金属塩化合物、金属キレート化合物、アミノ樹脂化合物および過酸化物などの適宜な架橋剤を介して架橋処理する方式、ならびに、炭素-炭素二重結合を2個以上有する化合物を混合し、エネルギー線の照射等により架橋処理する方式などの適宜な方式で行うことができる。 The adhesive layer that can form the support has sufficient adhesiveness to suppress the scattering of the base material such as a semiconductor device during dicing. The material of the adhesive layer is not particularly limited, and conventionally known adhesive materials such as acrylic resin, urethane resin, and silicone resin can be included. The adhesive layer is preferably made of a curable composition that is cured by applying heat or energy rays. As a result, the adhesive layer can be appropriately cured by applying heat or energy rays, and the adhesive force to the temporary adhesive film can be reduced. As a result, peeling is likely to occur more effectively at the adhesive interface between the support and the temporary adhesive film, and the strength of the temporary adhesive film as a protective film is likely to be secured. In particular, the curable composition is preferably a composition that is cured by irradiation with energy rays, and more preferably a composition that is cured by irradiation with ultraviolet rays. The curable composition contains, for example, a monomer or oligomer having a polymerizable functional group, and a polymerization initiator. The adhesiveness of the adhesive layer can be appropriately controlled by controlling the crosslink density of the adhesive material. The cross-linking density of the adhesive material is controlled by, for example, a method of cross-linking with an appropriate cross-linking agent such as a polyfunctional isocyanate compound, an epoxy compound, a melamine compound, a metal salt compound, a metal chelate compound, an amino resin compound and a peroxide. , And a compound having two or more carbon-carbon double bonds can be mixed and subjected to an appropriate method such as a method of cross-linking by irradiation with energy rays or the like.
 硬化型組成物は、必要に応じて、重合禁止剤、酸化防止剤、レベリング剤、増粘剤、減粘剤、界面活性剤およびフィラーなどの他の添加剤を1種または2種以上含んでいてもよい。さらに、紫外線硬化型組成物は、組成物の適用性を向上させる観点から、溶剤を含むことができる。 The curable composition may optionally contain one or more other additives such as polymerization inhibitors, antioxidants, leveling agents, thickeners, thickeners, surfactants and fillers. You may. Further, the ultraviolet curable composition may contain a solvent from the viewpoint of improving the applicability of the composition.
 硬化型組成物からなる粘着層を含むダイシングテープの詳細は、例えば特開2010-251722号公報に記載されており、この内容は本明細書に組み込まれる。 Details of the dicing tape containing the adhesive layer made of the curable composition are described in, for example, Japanese Patent Application Laid-Open No. 2010-251722, and the contents thereof are incorporated in the present specification.
 粘着層の厚さは、特に制限されず、例えば5~100μmであることが好ましい。この数値範囲の上限は、80μm以下であることが好ましく、70μm以下であることがより好ましく、60μm以下であることがさらに好ましい。また、この数値範囲の下限は、10μm以上であることが好ましく、15μm以上でも、20μm以上でもよい。 The thickness of the adhesive layer is not particularly limited, and is preferably 5 to 100 μm, for example. The upper limit of this numerical range is preferably 80 μm or less, more preferably 70 μm or less, and further preferably 60 μm or less. Further, the lower limit of this numerical value range is preferably 10 μm or more, and may be 15 μm or more or 20 μm or more.
 支持体全体の厚さは、60~300μmであることが好ましい。この数値範囲の上限は、250μm以下であることが好ましく、200μm以下であることがより好ましく、160μm以下であることがさらに好ましい。また、この数値範囲の下限は、70μm以上であることが好ましく、80μm以上であることがより好ましく、100μm以上であることがさらに好ましい。 The thickness of the entire support is preferably 60 to 300 μm. The upper limit of this numerical range is preferably 250 μm or less, more preferably 200 μm or less, and even more preferably 160 μm or less. Further, the lower limit of this numerical value range is preferably 70 μm or more, more preferably 80 μm or more, and further preferably 100 μm or more.
 支持体として、次に示す市販のダイシングテープを使用することもできる。HAE-1503、HAE-1603、UC-334EP-85、UC-353EP-110A、UC3026M-110、UC3044M-110B(以上、古河電気工業社製)、UHP-1005AT、UHP-1025M3、USP-1520MG、UDT-1915MC(以上、DENKA社製)、D-series(以上、リンテック社製)。 The following commercially available dicing tape can also be used as the support. HAE-1503, HAE-1603, UC-334EP-85, UC-353EP-110A, UC3026M-110, UC3044M-110B (all manufactured by Furukawa Electric Co., Ltd.), UHP-1005AT, UHP-1025M3, USP-1520MG, UDT -1915MC (above, manufactured by DENKA), D-series (above, manufactured by Lintec).
<<剥離層>>
 本発明の積層体において、仮接着膜が支持体側の表層部分に剥離層を含むか、あるいは支持体が仮接着膜側の表層部分に剥離層を含むことが好ましい。本明細書において、仮接着膜が支持体に接着する前において、剥離層が仮接着膜側にあれば、剥離層は仮接着膜の一部とし、剥離層が支持体側にあれば、剥離層は支持体の一部とする。剥離層は、支持体および仮接着膜の間の剥離を促進する機能を有する。積層体中の剥離層の厚さは10~100μmであることが好ましい。剥離層の厚さが上記範囲にあることにより、ダイシング処理の際に必要な接着力が確保され、かつ、チップの支持体からの剥離もより効果的に促進される。この数値範囲の上限は、90μm以下であることが好ましく、85μm以下であることがより好ましく、80μm以下であることがさらに好ましい。また、この数値範囲の下限は、15μm以上であることが好ましく、20μm以上であることがより好ましく、30μm以上であることがさらに好ましい。
<< Peeling layer >>
In the laminated body of the present invention, it is preferable that the temporary adhesive film contains a release layer in the surface layer portion on the support side, or the support includes a release layer in the surface layer portion on the temporary adhesive film side. In the present specification, if the release layer is on the temporary adhesive film side before the temporary adhesive film is adhered to the support, the release layer is a part of the temporary adhesive film, and if the release layer is on the support side, the release layer is used. Is part of the support. The release layer has a function of promoting separation between the support and the temporary adhesive film. The thickness of the release layer in the laminate is preferably 10 to 100 μm. When the thickness of the release layer is within the above range, the adhesive force required for the dicing process is secured, and the release of the chip from the support is more effectively promoted. The upper limit of this numerical range is preferably 90 μm or less, more preferably 85 μm or less, and further preferably 80 μm or less. Further, the lower limit of this numerical value range is preferably 15 μm or more, more preferably 20 μm or more, and further preferably 30 μm or more.
 剥離層は、界面活性剤を含むことが好ましく、フッ素系の界面活性剤およびシリコーン系の界面活性剤の少なくとも1種を含むことが好ましく、フッ素系の界面活性剤およびシリコーン系の界面活性剤の少なくとも1種からなることが好ましい。 The release layer preferably contains a surfactant, preferably contains at least one of a fluorine-based surfactant and a silicone-based surfactant, and is a fluorine-based surfactant and a silicone-based surfactant. It preferably consists of at least one type.
 フッ素系界面活性剤中のフッ素含有率は、3~40質量%であることが好適である。ここで、フッ素含有率とは、分子量に対する全フッ素原子の質量の割合である。フッ素含有率について、上限は、より好ましくは30質量%以下であり、特に好ましくは25質量%以下である。また、下限は、より好ましくは5質量%以上であり、特に好ましくは7質量%以上である。フッ素含有率がこの範囲内である界面活性剤は、塗布膜の厚さの均一性や省液性の点で効果的であり、仮接着層の剥離性も良好である。 The fluorine content in the fluorine-based surfactant is preferably 3 to 40% by mass. Here, the fluorine content is the ratio of the mass of all fluorine atoms to the molecular weight. Regarding the fluorine content, the upper limit is more preferably 30% by mass or less, and particularly preferably 25% by mass or less. The lower limit is more preferably 5% by mass or more, and particularly preferably 7% by mass or more. A surfactant having a fluorine content within this range is effective in terms of uniformity of the thickness of the coating film and liquid saving property, and also has good peelability of the temporary adhesive layer.
 フッ素系界面活性剤は、特に限定されないが、パーフルオロオクタン酸(PFOA)やパーフルオロオクタンスルホン酸(PFOS)を含まないフッ素系界面活性剤が好ましい。本発明に用いることができるフッ素系界面活性剤としては、例えば、市販品である、メガファックF142D、同F172、同F173、同F176、同F177、同F183、同F479、同F482、同F554、同F780、同F781、同F781-F、同R30、同R08、同F-472SF、同BL20、同R-61、同R-90(DIC(株)製)、フロラードFC-135、同FC-170C、同FC-430、同FC-431、Novec FC-4430(住友スリーエム(株)製)、アサヒガードAG7105、同AG7000、同AG950、同AG7600、サーフロンS-112、同S-113、同S-131、同S-141、同S-145、同S-381、同S-382、同SC-101、同SC-102、同SC-103、同SC-104、同SC-105、同SC-106(AGCセイミケミカル社製)、エフトップEF301、同EF303、同EF351、同EF352、同EF801、同EF802(三菱マテリアル電子化成(株)製)、フタージェント250(ネオス(株)製)が挙げられる。また、上記以外にも、KP(信越化学工業(株)製)、ポリフロー(共栄社化学(株)製)、PolyFox(OMNOVA社製)等の各シリーズを挙げることができる。 The fluorine-based surfactant is not particularly limited, but a fluorine-based surfactant that does not contain perfluorooctanoic acid (PFOA) or perfluorooctanesulfonic acid (PFOS) is preferable. Examples of the fluorine-based surfactant that can be used in the present invention include commercially available products, Megafuck F142D, F172, F173, F176, F177, F183, F479, F482, and F554. F780, F781, F781-F, R30, R08, F-472SF, BL20, R-61, R-90 (manufactured by DIC Co., Ltd.), Florard FC-135, FC- 170C, FC-430, FC-431, Novec FC-4430 (manufactured by Sumitomo 3M Co., Ltd.), Asahi Guard AG7105, AG7000, AG950, AG7600, Surfron S-112, S-113, S -131, S-141, S-145, S-381, S-382, SC-101, SC-102, SC-103, SC-104, SC-105, SC -106 (manufactured by AGC Seimi Chemical Co., Ltd.), Ftop EF301, EF303, EF351, EF352, EF801, EF802 (manufactured by Mitsubishi Materials Electronics Co., Ltd.), Fluorent 250 (manufactured by Neos Co., Ltd.) Can be mentioned. In addition to the above, KP (manufactured by Shin-Etsu Chemical Co., Ltd.), Polyflow (manufactured by Kyoeisha Chemical Co., Ltd.), PolyFox (manufactured by OMNOVA), and the like can be mentioned.
 シリコーン系界面活性剤としては、Si-O結合を含む化合物であり、シリコーンオイル、シランカップリング剤、シリコーン樹脂、シリコーンゴム、環状シロキサンなどが例示され、シリコーンオイルが好ましい。 Examples of the silicone-based surfactant include compounds containing Si—O bonds, such as silicone oil, silane coupling agent, silicone resin, silicone rubber, and cyclic siloxane, and silicone oil is preferable.
 また、シリコーン系界面活性剤は、重合性基などの反応性基を含まないことが好ましい。 Further, it is preferable that the silicone-based surfactant does not contain a reactive group such as a polymerizable group.
 シリコーン系界面活性剤は、ポリエーテル変性シリコーンであることが好ましい。ポリエーテル変性シリコーンは、式(A)で表される比率が80%以上である。 The silicone-based surfactant is preferably a polyether-modified silicone. The ratio of the polyether-modified silicone represented by the formula (A) is 80% or more.
 式(A) {(MO+EO)/AO}×100
 上記式(A)中、MOは、ポリエーテル変性シリコーン中のポリエーテル構造に含まれるメチレンオキシドのモル%であり、EOは、ポリエーテル変性シリコーン中のポリエーテル構造に含まれるエチレンオキシドのモル%であり、AOは、ポリエーテル変性シリコーン中のポリエーテル構造に含まれるアルキレンオキシドのモル%をいう。
Formula (A) {(MO + EO) / AO} x 100
In the above formula (A), MO is the mol% of methylene oxide contained in the polyether structure in the polyether-modified silicone, and EO is the mol% of ethylene oxide contained in the polyether structure in the polyether-modified silicone. Yes, AO refers to the mol% of alkylene oxide contained in the polyether structure in the polyether-modified silicone.
 上記式(A)で表される比率は、90%以上であることが好ましく、95%以上であることがより好ましく、98%以上であることがさらに好ましく、99%以上であることが一層好ましく、100%がより一層好ましい。 The ratio represented by the above formula (A) is preferably 90% or more, more preferably 95% or more, further preferably 98% or more, still more preferably 99% or more. , 100% is even more preferable.
 ポリエーテル変性シリコーンの重量平均分子量は、500~100000が好ましく、1000~50000がより好ましく、2000~40000がさらに好ましい。 The weight average molecular weight of the polyether-modified silicone is preferably 500 to 100,000, more preferably 1,000 to 50,000, and even more preferably 2,000 to 40,000.
 ポリエーテル変性シリコーンは、ポリエーテル変性シリコーンを窒素気流60mL/分のもと、20℃から280℃まで20℃/分の昇温速度で昇温し、280℃の温度で30分間保持したときの質量減少率が50質量%以下であることが好ましい。このような化合物を用いることにより、加熱を伴う基板の加工後の面性状がより向上する。上記ポリエーテル変性シリコーンの質量減少率は、45質量%以下が好ましく、40質量%以下がより好ましく、35質量%以下がさらに好ましく、30質量%以下が一層好ましい。上記ポリエーテル変性シリコーンの質量減少率の下限値は0質量%であってもよいが、15質量%以上、さらには20質量%以上でも十分に実用レベルである。 The polyether-modified silicone is obtained when the polyether-modified silicone is heated from 20 ° C. to 280 ° C. at a heating rate of 20 ° C./min under a nitrogen flow of 60 mL / min and held at a temperature of 280 ° C. for 30 minutes. The mass reduction rate is preferably 50% by mass or less. By using such a compound, the surface texture after processing of the substrate accompanied by heating is further improved. The mass reduction rate of the polyether-modified silicone is preferably 45% by mass or less, more preferably 40% by mass or less, further preferably 35% by mass or less, still more preferably 30% by mass or less. The lower limit of the mass reduction rate of the polyether-modified silicone may be 0% by mass, but 15% by mass or more, further 20% by mass or more is a sufficiently practical level.
 ポリエーテル変性シリコーンの光の屈折率は、1.440以下であることが好ましい。下限値については、特に定めるものではないが、1.400以上であっても十分実用レベルである。 The light refractive index of the polyether-modified silicone is preferably 1.440 or less. The lower limit is not particularly defined, but even if it is 1.400 or more, it is a sufficiently practical level.
 ポリエーテル変性シリコーンにおける、ポリオキシアルキレン基の分子中での含有量は特に限定されないが、ポリオキシアルキレン基の含有量が全分子量中1質量%を超えるものが望ましい。 The content of the polyoxyalkylene group in the molecule of the polyether-modified silicone is not particularly limited, but it is desirable that the content of the polyoxyalkylene group exceeds 1% by mass in the total molecular weight.
 ポリオキシアルキレン基の含有率は、「{(1分子中のポリオキシアルキレン基の式量)/1分子の分子量}×100」で定義される。 The content of the polyoxyalkylene group is defined by "{(the formula amount of the polyoxyalkylene group in one molecule) / the molecular weight of one molecule} x 100".
 シランカップリング剤の例としては、フッ素原子含有シランカップリング剤が挙げられ、トリエトキシ(1H,1H,2H,2H-ノナフルオロヘキシル)シランが好ましい。 Examples of the silane coupling agent include a fluorine atom-containing silane coupling agent, and triethoxy (1H, 1H, 2H, 2H-nonafluorohexyl) silane is preferable.
 さらに、シランカップリング剤の例としては、特開昭62-036663号公報、特開昭61-226746号公報、特開昭61-226745号公報、特開昭62-170950号公報、特開昭63-034540号公報、特開平07-230165号公報、特開平08-062834号公報、特開平09-054432号公報、特開平09-005988号公報、特開2001-330953号公報のそれぞれに記載の界面活性剤も挙げられ、これらの記載は本明細書に組み込まれる。 Further, examples of the silane coupling agent include JP-A-62-036663, JP-A-61-226746, JP-A-61-226745, JP-A-62-170950, and JP-A. 63-034540, 07-230165, 08-062834, 09-054432, 09-005988, 2001-330953, respectively. Surfactants are also mentioned and these descriptions are incorporated herein.
 本発明で用いるシリコーン系界面活性剤は、市販品を用いることもできる。 As the silicone-based surfactant used in the present invention, a commercially available product can also be used.
 例えば、「ADVALON FA33」、「FLUID L03」、「FLUID L033」、「FLUID L051」、「FLUID L053」、「FLUID L060」、「FLUID L066」、「IM22」、「WACKER-Belsil DMC 6038」(以上、旭化成ワッカーシリコーン(株)製)、「KF-352A」、「KF-353」、「KF-615A」、「KP-112」、「KP-341」、「X-22-4515」、「KF-354L」、「KF-355A」、「KF-6004」、「KF-6011」、「KF-6011P」、「KF-6012」、「KF-6013」、「KF-6015」、「KF-6016」、「KF-6017」、「KF-6017P」、「KF-6020」、「KF-6028」、「KF-6028P」、「KF-6038」、「KF-6043」、「KF-6048」、「KF-6123」、「KF-6204」、「KF-640」、「KF-642」、「KF-643」、「KF-644」、「KF-945」、「KP-110」、「KP-355」、「KP-369」、「KS-604」、「Polon SR-Conc」、「X-22-4272」、「X-22-4952」(以上、信越化学工業(株)製)、「8526 ADDITIVE」、「FZ-2203」、「FZ-5609」、「L-7001」、「SF 8410」、「2501 COSMETIC WAX」、「5200 FORMULATION AID」、「57 ADDITIVE」、「8019 ADDITIVE」、「8029 ADDITIVE」、「8054 ADDITIVE」、「BY16-036」、「BY16-201」、「ES-5612 FORMULATION AID」、「FZ-2104」、「FZ-2108」、「FZ-2123」、「FZ-2162」、「FZ-2164」、「FZ-2191」、「FZ-2207」、「FZ-2208」、「FZ-2222」、「FZ-7001」、「FZ-77」、「L-7002」、「L-7604」、「SF8427」、「SF8428」、「SH 28 PAINR ADDITIVE」、「SH3749」、「SH3773M」、「SH8400」、「SH8700」(以上、東レ・ダウコーニング(株)製)、「BYK-378」、「BYK-302」、「BYK-307」、「BYK-331」、「BYK-345」、「BYK-B」、「BYK-347」、「BYK-348」、「BYK-349」、「BYK-377」(以上、ビックケミー・ジャパン(株)製)、「Silwet L-7001」、「Silwet L-7002」、「Silwet L-720」、「Silwet L-7200」、「Silwet L-7210」、「Silwet L-7220」、「Silwet L-7230」、「Silwet L-7605」、「TSF4445」、「TSF4446」、「TSF4452」、「Silwet Hydrostable 68」、「Silwet L-722」、「Silwet L-7280」、「Silwet L-7500」、「Silwet L-7550」、「Silwet L-7600」、「Silwet L-7602」、「Silwet L-7604」、「Silwet L-7607」、「Silwet L-7608」、「Silwet L-7622」、「Silwet L-7650」、「Silwet L-7657」、「Silwet L-77」、「Silwet L-8500」、「Silwet L-8610」、「TSF4440」、「TSF4441」、「TSF4450」、「TSF4460」(以上、モメンティブ・パフォーマンス・マテリアルズ・ジャパン合同会社製)が例示される。 For example, "ADVALON FA33", "FLUID L03", "FLUID L033", "FLUID L051", "FLUID L053", "FLUID L060", "FLUID L066", "IM22", "WACKER-Belsil DMC 6038" , Asahi Kasei Wacker Silicone Co., Ltd., "KF-352A", "KF-353", "KF-615A", "KP-112", "KP-341", "X-22-4515", "KF" -354L "," KF-355A "," KF-6004 "," KF-6011 "," KF-6011P "," KF-6012 "," KF-6013 "," KF-6015 "," KF-6016 " , "KF-6017", "KF-6017P", "KF-6020", "KF-6028", "KF-6028P", "KF-6038", "KF-6043", "KF-6048", "KF-6123", "KF-6204", "KF-640", "KF-642", "KF-643", "KF-644", "KF-945", "KP-110", "KP" -355 "," KP-369 "," KS-604 "," Polon SR-Conc "," X-22-4272 "," X-22-4952 "(all manufactured by Shin-Etsu Chemical Co., Ltd.), "8526 ADDITIVE", "FZ-2203", "FZ-5609", "L-7001", "SF 8410", "2501 COSMETIC WAX", "5200 FORMURATION AID", "57 ADDITIVE", "8019 ADDITIVE", "8029 ADDITIVE", "8054 ADDITIVE", "BY16-036", "BY16-201", "ES-5612 FORMURATION AID", "FZ-2104", "FZ-2108", "FZ-2123", "FZ" -2162 "," FZ-2164 "," FZ-2191 "," FZ-2207 "," FZ-2208 "," FZ-2222 "," FZ-7001 "," FZ-77 "," L-7002 " , "L-7604", "SF8427", "SF8428", "SH 28 PAINR ADDITIVE", "SH3479", "SH3773M", "SH8400", "SH8700" (all manufactured by Toray Dow Corning Co., Ltd.) , "BYK-378", "BYK-302", "BYK-307", " BYK-331 "," BYK-345 "," BYK-B "," BYK-347 "," BYK-348 "," BYK-349 "," BYK-377 "(all manufactured by Big Chemie Japan Co., Ltd.) ), "Silwet L-7001", "Silwet L-7002", "Silwet L-720", "Silwet L-7200", "Silwet L-7210", "Silwet L-7220", "Silwet L-7230" , "Silwet L-7605", "TSF4445", "TSF4446", "TSF4452", "Silwet Hydrostable 68", "Silwet L-722", "Silwet L-7280", "Silwet L-7500", "Silwet L-7500" -7550 ”,“ Silwet L-7600 ”,“ Silwet L-7602 ”,“ Silwet L-7604 ”,“ Silwet L-7607 ”,“ Silwet L-7608 ”,“ Silwet L-7622 ”,“ Silwet L- 7650 ”,“ Silwet L-7657 ”,“ Silwet L-77 ”,“ Silwet L-8500 ”,“ Silwet L-8610 ”,“ TSF4440 ”,“ TSF4441 ”,“ TSF4450 ”,“ TSF4460 ”(above, momentary)・ Performance Materials Japan GK) is an example.
 また、シリコーン系界面活性剤としては、商品名「BYK-300」、「BYK-306」、「BYK-310」、「BYK-315」、「BYK-313」、「BYK-320」、「BYK-322」、「BYK-323」、「BYK-325」、「BYK-330」、「BYK-333」、「BYK-337」、「BYK-341」、「BYK-344」、「BYK-370」、「BYK-375」、「BYK-UV3500」、「BYK-UV3510」、「BYK-UV3570」、「BYK-3550」、「BYK-SILCLEAN3700」、「BYK-SILCLEAN3720」(以上、ビックケミー・ジャパン(株)製)、商品名「AC FS 180」、「AC FS 360」、「AC S 20」(以上、Algin Chemie製)、商品名「ポリフローKL-400X」、「ポリフローKL-400HF」、「ポリフローKL-401」、「ポリフローKL-402」、「ポリフローKL-403」、「ポリフローKL-404」、「ポリフローKL-700」(以上、共栄社化学(株)製)、商品名「KP-301」、「KP-306」、「KP-109」、「KP-310」、「KP-310B」、「KP-323」、「KP-326」、「KP-341」、「KP-104」、「KP-110」、「KP-112」、「KP-360A」、「KP-361」、「KP-354」、「KP-357」、「KP-358」、「KP-359」、「KP-362」、「KP-365」、「KP-366」、「KP-368」、「KP-330」、「KP-650」、「KP-651」、「KP-390」、「KP-391」、「KP-392」(以上、信越化学工業(株)製)、商品名「LP-7001」、「LP-7002」、「8032 ADDITIVE」、「FZ-2110」、「FZ-2105」、「67 ADDITIVE」、「8618 ADDITIVE」、「3 ADDITIVE」、「56 ADDITIVE」(以上、東レ・ダウコーニング(株)製)、「TEGO WET 270」(エボニック・デグサ・ジャパン(株)製)、「NBX-15」((株)ネオス製)なども使用することができる。 The silicone-based surfactants include the trade names "BYK-300", "BYK-306", "BYK-310", "BYK-315", "BYK-313", "BYK-320", and "BYK". -322 "," BYK-323 "," BYK-325 "," BYK-330 "," BYK-333 "," BYK-337 "," BYK-341 "," BYK-344 "," BYK-370 " , "BYK-375", "BYK-UV3500", "BYK-UV3510", "BYK-UV3570", "BYK-3550", "BYK-SILCLEAN3700", "BYK-SILCLEAN3720" (Manufactured by Co., Ltd.), product names "AC FS 180", "AC FS 360", "AC S 20" (above, manufactured by Algin Chemie), product names "Polyflow KL-400X", "Polyflow KL-400HF", "Polyflow" KL-401, "Polyflow KL-402", "Polyflow KL-403", "Polyflow KL-404", "Polyflow KL-700" (all manufactured by Kyoeisha Chemical Co., Ltd.), product name "KP-301" , "KP-306", "KP-109", "KP-310", "KP-310B", "KP-323", "KP-326", "KP-341", "KP-104", " KP-110 "," KP-112 "," KP-360A "," KP-361 "," KP-354 "," KP-357 "," KP-358 "," KP-359 "," KP- 362 ”,“ KP-365 ”,“ KP-366 ”,“ KP-368 ”,“ KP-330 ”,“ KP-650 ”,“ KP-651 ”,“ KP-390 ”,“ KP-391 ” , "KP-392" (all manufactured by Shin-Etsu Chemical Co., Ltd.), product names "LP-7001", "LP-7002", "8032 ADDITIVE", "FZ-2110", "FZ-2105", " 67 ADDITIVE, 8618 ADDITIVE, 3 ADDITIVE, 56 ADDITIVE (above, manufactured by Toray Dow Corning Co., Ltd.), "TEGO WET 270" (manufactured by Ebonic Degusa Japan Co., Ltd.), "NBX" -15 "(manufactured by Neos Co., Ltd.) and the like can also be used.
 剥離層は、例えば、上記のような界面活性剤をそのまま仮接着膜または支持体に適用して膜を形成することにより形成することができる。また、必要に応じて上記のような界面活性剤を溶剤に溶かした組成物を仮接着膜もしくは支持体に適用してもよい。 The release layer can be formed, for example, by applying the above-mentioned surfactant as it is to a temporary adhesive film or a support to form a film. Further, if necessary, a composition in which the above-mentioned surfactant is dissolved in a solvent may be applied to the temporary adhesive film or the support.
<仮接着用組成物>
 仮接着用組成物は、仮接着膜の形成に使用される組成物である。仮接着用組成物は、固形分として上記した仮接着膜の材料成分を含有し、必要に応じて溶剤を含有することができる。例えば、仮接着膜は、溶剤を含有する仮接着用組成物を支持体または基材の表面に適用し、これを乾燥させることで形成される。あるいは、仮接着膜は、予めシート状に形成された仮接着膜を支持体または基材の表面に貼り付けることにより形成される。上記仮接着用組成物に使用される溶剤は、有機溶剤であることが好ましい。
<Composition for temporary adhesion>
The temporary adhesive composition is a composition used for forming a temporary adhesive film. The composition for temporary adhesion contains the above-mentioned material component of the temporary adhesive film as a solid content, and can contain a solvent if necessary. For example, the temporary adhesive film is formed by applying a solvent-containing temporary adhesive composition to the surface of a support or a base material and drying the composition. Alternatively, the temporary adhesive film is formed by attaching a temporary adhesive film formed in a sheet shape to the surface of the support or the base material. The solvent used in the temporary bonding composition is preferably an organic solvent.
 有機溶剤としては、酢酸エチル、酢酸-n-ブチル、酢酸イソブチル、ギ酸アミル、酢酸イソアミル、プロピオン酸ブチル、酪酸イソプロピル、酪酸エチル、酪酸ブチル、乳酸メチル、乳酸エチル、アルキルオキシ酢酸アルキル(例:アルキルオキシ酢酸メチル、アルキルオキシ酢酸エチル、アルキルオキシ酢酸ブチル(例えば、メトキシ酢酸メチル、メトキシ酢酸エチル、メトキシ酢酸ブチル、エトキシ酢酸メチル、エトキシ酢酸エチル等))、3-アルキルオキシプロピオン酸アルキルエステル類(例:3-アルキルオキシプロピオン酸メチル、3-アルキルオキシプロピオン酸エチル等(例えば、3-メトキシプロピオン酸メチル、3-メトキシプロピオン酸エチル、3-エトキシプロピオン酸メチル、3-エトキシプロピオン酸エチル等))、2-アルキルオキシプロピオン酸アルキルエステル類(例:2-アルキルオキシプロピオン酸メチル、2-アルキルオキシプロピオン酸エチル、2-アルキルオキシプロピオン酸プロピル等(例えば、2-メトキシプロピオン酸メチル、2-メトキシプロピオン酸エチル、2-メトキシプロピオン酸プロピル、2-エトキシプロピオン酸メチル、2-エトキシプロピオン酸エチル))、2-アルキルオキシ-2-メチルプロピオン酸メチルおよび2-オキシ-2-メチルプロピオン酸エチル(例えば、2-メトキシ-2-メチルプロピオン酸メチル、2-エトキシ-2-メチルプロピオン酸エチル等)、ピルビン酸メチル、ピルビン酸エチル、ピルビン酸プロピル、アセト酢酸メチル、アセト酢酸エチル、2-オキソブタン酸メチル、2-オキソブタン酸エチル、1-メトキシ-2-プロピルアセテート等のエステル類;
 ジエチレングリコールジメチルエーテル、テトラヒドロフラン、エチレングリコールモノメチルエーテル、エチレングリコールモノエチルエーテル、メチルセロソルブアセテート、エチルセロソルブアセテート、ジエチレングリコールモノメチルエーテル、ジエチレングリコールモノエチルエーテル、ジエチレングリコールモノブチルエーテル、プロピレングリコールモノメチルエーテル、プロピレングリコールモノメチルエーテルアセテート、プロピレングリコールモノエチルエーテルアセテート、プロピレングリコールモノプロピルエーテルアセテート等のエーテル類;
 メチルエチルケトン、シクロヘキサノン、2-ヘプタノン、3-ヘプタノン、N-メチル-2-ピロリドン、γ-ブチロラクトン等のケトン類;
 トルエン、キシレン、アニソール、メシチレン、エチルベンゼン、プロピルベンゼン、クメン、n-ブチルベンゼン、sec-ブチルベンゼン、イソブチルベンゼン、t-ブチルベンゼン、アミルベンゼン、イソアミルベンゼン、(2,2-ジメチルプロピル)ベンゼン、1-フェニルへキサン、1-フェニルヘプタン、1-フェニルオクタン、1-フェニルノナン、1-フェニルデカン、シクロプロピルベンゼン、シクロヘキシルベンゼン、2-エチルトルエン、1,2-ジエチルベンゼン、o-シメン、インダン、1,2,3,4-テトラヒドロナフタレン、3-エチルトルエン、m-シメン、1,3-ジイソプロピルベンゼン、4-エチルトルエン、1,4-ジエチルベンゼン、p-シメン、1,4-ジイソプロピルベンゼン、4-t-ブチルトルエン、1,4-ジ-t-ブチルベンゼン、1,3-ジエチルベンゼン、1,2,3-トリメチルベンゼン、1,2,4-トリメチルベンゼン、4-t-ブチル-o-キシレン、1,2,4-トリエチルベンゼン、1,3,5-トリエチルベンゼン、1,3,5-トリイソプロピルベンゼン、5-t-ブチル-m-キシレン、3,5-ジ-t-ブチルトルエン、1,2,3,5-テトラメチルベンゼン、1,2,4,5-テトラメチルベンゼン、ペンタメチルベンゼン等の芳香族炭化水素類;
 リモネン、p-メンタン、ノナン、デカン、ドデカン、デカリン等の炭化水素類などが好適に挙げられる。
Organic solvents include ethyl acetate, -n-butyl acetate, isobutyl acetate, amyl formate, isoamyl acetate, butyl propionate, isopropyl butyrate, ethyl butyrate, butyl butyrate, methyl lactate, ethyl lactate, alkyloxyoxyacetate (eg alkyl). Methyl oxyacetate, ethyl alkyloxyacetate, butyl alkyloxyacetate (eg, methyl methoxyacetate, ethyl methoxyacetate, butyl methoxyacetate, methyl ethoxyacetate, ethyl ethoxyacetate, etc.), 3-alkyloxypropionate alkyl esters (eg) : Methyl 3-alkyloxypropionate, ethyl 3-alkyloxypropionate, etc. (for example, methyl 3-methoxypropionate, ethyl 3-methoxypropionate, methyl 3-ethoxypropionate, ethyl 3-ethoxypropionate, etc.)) , 2-alkyloxypropionate alkyl esters (eg, methyl 2-alkyloxypropionate, ethyl 2-alkyloxypropionate, propyl 2-alkyloxypropionate, etc. (eg, methyl 2-methoxypropionate, 2-methoxy) Ethyl propionate, propyl 2-methoxypropionate, methyl 2-ethoxypropionate, ethyl 2-ethoxypropionate)), methyl 2-alkyloxy-2-methylpropionate and ethyl 2-oxy-2-methylpropionate ( For example, methyl 2-methoxy-2-methylpropionate, ethyl 2-ethoxy-2-methylpropionate, etc.), methyl pyruvate, ethyl pyruvate, propyl pyruvate, methyl acetoacetate, ethyl acetoacetate, 2-oxobutanoic acid. Esters such as methyl, ethyl 2-oxobutate, 1-methoxy-2-propyl acetate;
Diethylene glycol dimethyl ether, tetrahydrofuran, ethylene glycol monomethyl ether, ethylene glycol monoethyl ether, methyl cellosolve acetate, ethyl cellosolve acetate, diethylene glycol monomethyl ether, diethylene glycol monoethyl ether, diethylene glycol monobutyl ether, propylene glycol monomethyl ether, propylene glycol monomethyl ether acetate, propylene glycol Ethers such as monoethyl ether acetate and propylene glycol monopropyl ether acetate;
Ketones such as methyl ethyl ketone, cyclohexanone, 2-heptanone, 3-heptanone, N-methyl-2-pyrrolidone, γ-butyrolactone;
Toluene, xylene, anisole, mesitylene, ethylbenzene, propylbenzene, cumene, n-butylbenzene, sec-butylbenzene, isobutylbenzene, t-butylbenzene, amylbenzene, isoamylbenzene, (2,2-dimethylpropyl) benzene, 1 -Phenylhexane, 1-phenylheptane, 1-phenyloctane, 1-phenylnonane, 1-phenyldecane, cyclopropylbenzene, cyclohexylbenzene, 2-ethyltoluene, 1,2-diethylbenzene, o-simene, indan, 1 , 2,3,4-Tetrahydronaphthalene, 3-ethyltoluene, m-simene, 1,3-diisopropylbenzene, 4-ethyltoluene, 1,4-diethylbenzene, p-simene, 1,4-diisopropylbenzene, 4- t-butyltoluene, 1,4-di-t-butylbenzene, 1,3-diethylbenzene, 1,2,3-trimethylbenzene, 1,2,4-trimethylbenzene, 4-t-butyl-o-xylene, 1,2,4-triethylbenzene, 1,3,5-triethylbenzene, 1,3,5-triisopropylbenzene, 5-t-butyl-m-xylene, 3,5-di-t-butyltoluene, 1 , 2,3,5-tetramethylbenzene, 1,2,4,5-tetramethylbenzene, pentamethylbenzene and other aromatic hydrocarbons;
Hydrocarbons such as limonene, p-menthane, nonane, decane, dodecane, and decalin are preferably mentioned.
 これらの中でも、メシチレン、t-ブチルベンゼン、1,2,4-トリメチルベンゼン、p-メンタン、γ-ブチロラクトン、アニソール、3-エトキシプロピオン酸メチル、3-エトキシプロピオン酸エチル、エチルセロソルブアセテート、乳酸エチル、ジエチレングリコールジメチルエーテル、酢酸ブチル、3-メトキシプロピオン酸メチル、2-ヘプタノン、シクロヘキサノン、エチルカルビトールアセテート、ブチルカルビトールアセテート、プロピレングリコールメチルエーテル、およびプロピレングリコールメチルエーテルアセテートが好ましい。 Among these, mesitylene, t-butylbenzene, 1,2,4-trimethylbenzene, p-menthane, γ-butyrolactone, anisole, methyl 3-ethoxypropionate, ethyl 3-ethoxypropionate, ethyl cellosolve acetate, ethyl lactate , Diethylene glycol dimethyl ether, butyl acetate, methyl 3-methoxypropionate, 2-heptanone, cyclohexanone, ethyl carbitol acetate, butyl carbitol acetate, propylene glycol methyl ether, and propylene glycol methyl ether acetate are preferred.
 これらの溶剤は、塗布面性状の改良などの観点から、2種以上を混合する形態も好ましい。この場合、特に好ましくは、メシチレン、t-ブチルベンゼン、1,2,4-トリメチルベンゼン、p-メンタン、γ-ブチロラクトン、アニソール、3-エトキシプロピオン酸メチル、3-エトキシプロピオン酸エチル、エチルセロソルブアセテート、乳酸エチル、ジエチレングリコールジメチルエーテル、酢酸ブチル、3-メトキシプロピオン酸メチル、2-ヘプタノン、シクロヘキサノン、シクロペンタノン、エチルカルビトールアセテート、ブチルカルビトールアセテート、プロピレングリコールメチルエーテル、およびプロピレングリコールメチルエーテルアセテートから選択される2種以上で構成される混合溶液である。 It is also preferable to mix two or more of these solvents from the viewpoint of improving the properties of the coated surface. In this case, particularly preferably, mesityrene, t-butylbenzene, 1,2,4-trimethylbenzene, p-menthane, γ-butyrolactone, anisole, methyl 3-ethoxypropionate, ethyl 3-ethoxypropionate, ethyl cellosolve acetate. , Ethyl lactate, diethylene glycol dimethyl ether, butyl acetate, methyl 3-methoxypropionate, 2-heptanone, cyclohexanone, cyclopentanone, ethylcarbitol acetate, butylcarbitol acetate, propylene glycol methyl ether, and propylene glycol methyl ether acetate. It is a mixed solution composed of two or more kinds.
 仮接着用組成物中の溶剤の含有量は、塗布性の観点から、組成物の全固形分濃度が5~80質量%になる量が好ましく、10~50質量%であることがさらに好ましく、12~40質量%であることが特に好ましい。溶剤は1種のみでもよいし、2種以上であってもよい。溶剤が2種以上の場合は、それらの合計量が上記範囲にあることが好ましい。 From the viewpoint of coatability, the content of the solvent in the temporary adhesive composition is preferably such that the total solid content concentration of the composition is 5 to 80% by mass, more preferably 10 to 50% by mass. It is particularly preferably 12 to 40% by mass. The solvent may be only one type or two or more types. When there are two or more kinds of solvents, it is preferable that the total amount thereof is in the above range.
 なお、乾燥させて得られる仮接着膜中の溶剤の含有量は、1質量%以下であることが好ましく、0.1質量%以下であることがより好ましい。 The content of the solvent in the temporary adhesive film obtained by drying is preferably 1% by mass or less, and more preferably 0.1% by mass or less.
<積層体の製造方法>
 以下、図3を参照しながら本発明の積層体の製造方法について説明する。図3は、本発明の積層体の製造方法における一部工程の例を示す概略図である。本発明の積層体の製造方法は、ダイシング処理による切込み付きの上記積層体を製造する方法である。すなわち、本発明の積層体の製造方法は、基材10および支持体14の一方(図3では支持体14)の表面に形成された仮接着膜12(図3の工程A)を、基材10および支持体14の他方(図3では基材10)の表面に接着すること(図3の工程B)、および、その後、基材10から仮接着膜12まで延びる切込み16を形成すること(図3の工程C)を含むことを特徴とする。そして、本発明の積層体の製造方法において、基材10および仮接着膜12の間の第1の接着力が、仮接着膜12および支持体14の間の第2の接着力以上である。上記のような本発明の積層体の製造方法により、ダイシング処理後のチップ表面を保護することが可能となる積層体が得られる。
<Manufacturing method of laminated body>
Hereinafter, the method for producing the laminate of the present invention will be described with reference to FIG. FIG. 3 is a schematic view showing an example of some steps in the method for producing a laminate of the present invention. The method for producing a laminated body of the present invention is a method for producing the above-mentioned laminated body with a notch by dicing treatment. That is, in the method for producing a laminated body of the present invention, a temporary adhesive film 12 (step A in FIG. 3) formed on the surface of one of the base material 10 and the support 14 (support 14 in FIG. 3) is used as a base material. Adhesion to the surface of 10 and the other of the support 14 (base material 10 in FIG. 3) (step B in FIG. 3), and then forming a notch 16 extending from the base material 10 to the temporary adhesive film 12 (step B in FIG. 3). It is characterized by including the step C) of FIG. Then, in the method for producing a laminated body of the present invention, the first adhesive force between the base material 10 and the temporary adhesive film 12 is equal to or greater than the second adhesive force between the temporary adhesive film 12 and the support 14. By the method for producing a laminated body of the present invention as described above, a laminated body capable of protecting the chip surface after dicing treatment can be obtained.
 工程Aにおいて、仮接着膜は、上記した仮接着用組成物を用いて形成される。仮接着膜の形成方法は特に制限されず、そのような方法としては、例えば、基材および支持体の一方の表面に仮接着用組成物を適用し、これを乾燥させる方法、および、予め膜の形態にした仮接着用組成物を基材および支持体の一方の表面に貼り付ける方法などがある。剥離層を設ける場合には、支持体と仮接着膜とを接着する前に、支持体の表面あるいは仮接着膜の表面に形成すればよい。 In step A, the temporary adhesive film is formed by using the above-mentioned temporary adhesive composition. The method for forming the temporary adhesive film is not particularly limited, and as such a method, for example, a method of applying the temporary adhesive composition to one surface of the base material and the support and drying the composition, and a method of preliminarily drying the film. There is a method of attaching the temporary adhesive composition in the form of the above to one surface of the base material and the support. When the release layer is provided, it may be formed on the surface of the support or the surface of the temporary adhesive film before the support and the temporary adhesive film are adhered to each other.
 仮接着用組成物の適用方法としては、スピンコート法、スリットコート法、スパイラルコート法、スプレーコート法、スクリーン印刷法、インクジェット法、流延塗布法、ロール塗布法および滴下法(ドロップキャスト)が挙げられる。その中でも、適用方法は、スピンコート法、スリットコート法またはスパイラルコート法であることが好ましい。適用した仮接着用組成物の乾燥条件は、適宜調整でき、例えば80~270℃(好ましくは150~210℃)で0.5~5分間(好ましくは1~4分間)加熱することにより行うことができる。 Examples of the method for applying the composition for temporary bonding include a spin coating method, a slit coating method, a spiral coating method, a spray coating method, a screen printing method, an inkjet method, a casting coating method, a roll coating method and a dropping method (drop casting). Can be mentioned. Among them, the application method is preferably a spin coating method, a slit coating method or a spiral coating method. The drying conditions of the applied temporary bonding composition can be adjusted as appropriate, for example, by heating at 80 to 270 ° C. (preferably 150 to 210 ° C.) for 0.5 to 5 minutes (preferably 1 to 4 minutes). Can be done.
 工程Bにおいて、仮接着膜12を基材10または支持体14に接着させる方法は、例えば圧着装置を使用する方法が好ましい。また、圧着装置を用いた接着において、基材、仮接着膜および支持体に対し、加熱および圧力印加を個別にまたは同時に実施することが好ましく、その両方を同時に実施することがより好ましい。加熱温度は、仮接着用組成物に含まれる成分にもよるが、例えば50~300℃である。この数値範囲の上限は、250℃以下であることが好ましく、200℃以下であることがより好ましい。また、この数値範囲の下限は、80℃以上であることが好ましく、100℃以上であることがより好ましい。加熱時間は、例えば30秒~30分である。この数値範囲の上限は、15分以下であることが好ましく、5分以下であることがより好ましい。また、この数値範囲の下限は、45秒以上であることが好ましく、1分以上であることがより好ましい。圧力は、例えば0.05~3N/mmである。この数値範囲の上限は、2.5N/mm以下であることが好ましく、2N/mm以下であることがより好ましい。また、この数値範囲の下限は、0.08N/mm以上であることが好ましく、0.1N/mm以上であることがより好ましい。圧力の付加時間は、例えば30秒~30分である。この数値範囲の上限は、20分以下であることが好ましく、10分以下であることがより好ましい。また、この数値範囲の下限は、45秒以上であることが好ましく、1分以上であることがより好ましい。 In step B, as a method of adhering the temporary adhesive film 12 to the base material 10 or the support 14, for example, a method using a crimping device is preferable. Further, in the bonding using the crimping device, it is preferable to individually or simultaneously apply heat and pressure to the base material, the temporary adhesive film and the support, and it is more preferable to perform both of them at the same time. The heating temperature is, for example, 50 to 300 ° C., although it depends on the components contained in the temporary bonding composition. The upper limit of this numerical range is preferably 250 ° C. or lower, and more preferably 200 ° C. or lower. Further, the lower limit of this numerical value range is preferably 80 ° C. or higher, and more preferably 100 ° C. or higher. The heating time is, for example, 30 seconds to 30 minutes. The upper limit of this numerical range is preferably 15 minutes or less, and more preferably 5 minutes or less. The lower limit of this numerical range is preferably 45 seconds or longer, and more preferably 1 minute or longer. The pressure is, for example, 0.05 to 3 N / mm 2 . The upper limit of the numerical range, it is more preferable is preferably 2.5 N / mm 2 or less, 2N / mm 2 or less. The lower limit of this numerical range is preferably 0.08 N / mm 2 or more, and more preferably 0.1 N / mm 2 or more. The pressure application time is, for example, 30 seconds to 30 minutes. The upper limit of this numerical range is preferably 20 minutes or less, and more preferably 10 minutes or less. The lower limit of this numerical range is preferably 45 seconds or longer, and more preferably 1 minute or longer.
<<ダイシング>>
 切込み16を形成することを含むダイシング方法は、特に制限されず、ブレードダイシング、レーザダイシングおよびプラズマダイシングなど適宜選択される。切込みの態様は、特に制限されず、ハーフカットでもフルカットでもよく、フルカットの中でも、シングルカット、ステップカットおよびベベルカットなど、いずれの態様でもよい。
<< Dicing >>
The dicing method including forming the notch 16 is not particularly limited, and blade dicing, laser dicing, plasma dicing and the like are appropriately selected. The mode of cutting is not particularly limited, and may be half-cut or full-cut, and any of the full-cut, single-cut, step-cut, bevel-cut, and the like may be used.
 切込みの深さは、仮接着膜および基材の厚さに応じて適宜調整され、例えば、仮接着膜および基材の合計の厚さの50%以上であることが好ましい。切込みが仮接着膜および支持体の接着界面に到達していない場合には、支持体を拡張(エキスパンド)することにより、チップ化を促進すればよい。切込みの深さは、その合計厚さの70%以上であることがより好ましく、その合計厚さの80%以上であることがさらに好ましい。また、切込みの深さは、その合計厚さの100%でもよく(つまり、切込みが仮接着膜および支持体の接着界面に到達)、その合計厚さの90%以下でもよい。なお、切込みの深さは、ダイシング処理に支障がない範囲で、支持体内部に到達してもよいが、ダイシング処理の安定性の観点から支持体内部には到達しない方が好ましい。切込みの幅は、適宜調整でき、例えば0.01~1mmである。この数値範囲の上限は、0.5mm以下であることが好ましく、0.3mm以下であることがより好ましい。また、この数値範囲の下限は、0.03mm以上であることが好ましく、0.05mm以上であることがより好ましい。 The depth of cut is appropriately adjusted according to the thickness of the temporary adhesive film and the base material, and is preferably 50% or more of the total thickness of the temporary adhesive film and the base material, for example. When the notch does not reach the adhesive interface between the temporary adhesive film and the support, the support may be expanded to promote chip formation. The depth of cut is more preferably 70% or more of the total thickness, and further preferably 80% or more of the total thickness. Further, the depth of cut may be 100% of the total thickness (that is, the cut reaches the bonding interface between the temporary adhesive film and the support), and may be 90% or less of the total thickness. The depth of cut may reach the inside of the support within a range that does not interfere with the dicing process, but it is preferable that the depth of the cut does not reach the inside of the support from the viewpoint of stability of the dicing process. The width of the notch can be adjusted as appropriate, for example, 0.01 to 1 mm. The upper limit of this numerical range is preferably 0.5 mm or less, and more preferably 0.3 mm or less. The lower limit of this numerical range is preferably 0.03 mm or more, and more preferably 0.05 mm or more.
 チップの形状は、基材の外縁領域を除き、通常、矩形状であるが、その他の多角形状であってもよい。チップのサイズ(最大辺の長さ)は、特に制限されないが、例えば0.8~3mmである。この数値範囲の上限は、2.5mm以下でもよく、2mm以下でもよい。また、この数値範囲の下限は、0.9mm以上でもよく、1mm以上でもよい。 The shape of the chip is usually rectangular except for the outer edge region of the base material, but it may be another polygonal shape. The size of the chip (length of the maximum side) is not particularly limited, but is, for example, 0.8 to 3 mm. The upper limit of this numerical range may be 2.5 mm or less, or 2 mm or less. Further, the lower limit of this numerical range may be 0.9 mm or more, or 1 mm or more.
 ダイシング後のチップ上の仮接着膜の除去は、手動によりまたは機械を用いて物理的に剥離してもよいが、有機溶剤を用いて行うことが好ましい。有機溶剤としては、仮接着用組成物に使用される有機溶剤と同種の有機溶剤を使用できる。チップ上の仮接着膜に溶剤を適用する方法は、ディップ法やスプレー法など公知の方法を適宜採用できる。仮接着膜を除去する際の溶剤の温度は、例えば10~50℃である。この数値範囲の上限は、45℃以下であることが好ましく、40℃以下であることがより好ましい。また、この数値範囲の下限は、15℃以上であることが好ましく、20℃以上であることがより好ましい。また、有機溶剤の適用と併せて超音波(20~50kHz程度)を照射して超音波洗浄を実施してもよい。 The temporary adhesive film on the chip after dicing may be physically peeled off manually or by using a machine, but it is preferably performed using an organic solvent. As the organic solvent, an organic solvent of the same type as the organic solvent used in the temporary bonding composition can be used. As a method of applying the solvent to the temporary adhesive film on the chip, a known method such as a dip method or a spray method can be appropriately adopted. The temperature of the solvent for removing the temporary adhesive film is, for example, 10 to 50 ° C. The upper limit of this numerical range is preferably 45 ° C. or lower, and more preferably 40 ° C. or lower. Further, the lower limit of this numerical value range is preferably 15 ° C. or higher, and more preferably 20 ° C. or higher. Further, ultrasonic cleaning may be performed by irradiating ultrasonic waves (about 20 to 50 kHz) together with the application of the organic solvent.
<半導体素子の製造方法>
 本発明の半導体素子の製造方法は、上記した積層体の製造方法を含むことを特徴とする。すなわち、本発明の半導体素子の製造方法は、上記した積層体の製造方法により、切込み付きの積層体を製造し、この積層体からチップを取り出し、このチップをパッケージング等することにより半導体素子を製造する方法である。
<Manufacturing method of semiconductor elements>
The method for manufacturing a semiconductor device of the present invention is characterized by including the above-mentioned method for manufacturing a laminate. That is, in the method for manufacturing a semiconductor element of the present invention, a laminated body with a notch is manufactured by the above-mentioned manufacturing method for a laminated body, a chip is taken out from the laminated body, and the semiconductor element is packaged by packaging the chip or the like. It is a method of manufacturing.
 本発明の製造方法により製造される半導体素子は、例えばLSIデバイスであるが、本発明の半導体素子はこれに限定されず、本発明は種々の半導体素子に適用可能である。 The semiconductor element manufactured by the manufacturing method of the present invention is, for example, an LSI device, but the semiconductor element of the present invention is not limited to this, and the present invention can be applied to various semiconductor elements.
 本発明は、例えば、ASIC(Application Specific Integrated Circuit)、FPGA(Field Programmable Gate Array)、ASSP(Application Specific Standard Product)等のロジック集積回路にも適用可能である。また、本発明は、例えば、CPU(Central Processing Unit)、GPU(Graphics Processing Unit)等のマイクロプロセッサにも適用可能である。また、本発明は、例えば、DRAM(Dynamic Random Access Memory)、HMC(Hybrid Memory Cube)、MRAM(Magnetoresistive Random Access Memory)、PCM(Phase-Change Memory)、ReRAM(Resistance Random Access Memory)、FeRAM(Ferroelectric Random Access Memory)、フラッシュメモリ等のメモリにも適用可能である。また、本発明は、例えば、LED(Light Emitting Diode)、パワーデバイス、DC(Direct Current)-DC(Direct Current)コンバータ、絶縁ゲートバイポーラトランジスタ(Insulated Gate Bipolar Transistor:IGBT)等のアナログ集積回路にも適用可能である。また、本発明は、例えば、加速度センサ、圧力センサ、振動子、ジャイロセンサ等のMEMS(Micro Electro Mechanical Systems)にも適用可能である。また、本発明は、例えば、GPS(Global Positioning System)、FM(Frequency Modulation)、NFC(Near field communication)、RFEM(RF Expansion Module)、MMIC(Monolithic Microwave Integrated Circuit)、WLAN(Wireless Local Area Network)等のワイヤレス素子、ディスクリート素子、CMOS(Complementary Metal Oxide Semiconductor)、CMOSイメージセンサー、カメラモジュール、Passiveデバイス、SAW(Surface Acoustic Wave)フィルタ、RF(Radio Frequency)フィルタ、IPD(Integrated Passive Devices)等にも適用可能である。 The present invention can be applied to logic integrated circuits such as ASIC (Application Specific Integrated Circuit), FPGA (Field Programmable Gate Array), and ASSP (Application Specific Standard Product), for example. Further, the present invention can be applied to, for example, a microprocessor such as a CPU (Central Processing Unit) and a GPU (Graphics Processing Unit). Further, the present invention provides, for example, DRAM (Dynamic Random Access Memory), HMC (Hybrid Memory Cube), MRAM (Magnetoresistive Random Access Memory), PCM (Phase-Change Memory), ReRAM (Resistance Random Access Memory), FeRAM (Ferroelectric). It can also be applied to memories such as RandomAccessMemory) and flash memory. The present invention also applies to analog integrated circuits such as LEDs (Light Emitting Diodes), power devices, DC (Direct Current) -DC (Direct Current) converters, and insulated gate bipolar transistors (Insulated Gate Bipolar Transistors: IGBTs). Applicable. The present invention is also applicable to MEMS (Micro Electro Mechanical Systems) such as acceleration sensors, pressure sensors, oscillators, and gyro sensors. Further, the present invention relates to, for example, GPS (Global Positioning System), FM (Frequency Modulation), NFC (Near field communication), RFEM (RF Expansion Module), MMIC (Monolithic Microwave Integrated Circuit), WLAN (Wireless Local Area Network). For wireless elements such as wireless elements, discrete elements, CMOS (Complementary Metal Oxide Semiconductor), CMOS image sensors, camera modules, Passive devices, SAW (Surface Acoustic Wave) filters, RF (Radio Frequency) filters, IPD (Integrated Passive Devices), etc. Applicable.
 そして、上記のような本発明の半導体素子が搭載される最終製品は、特に限定されず、例えば、スマートTV、移動体通信端末、携帯電話、スマートフォン、タブレット端末、デスクトップPC、ノートPC、ネットワーク機器(ルーター、スイッチング)、有線インフラ機器、デジタルカメラ、ゲーム機、コントローラ、データセンター、サーバー、マイニング用PC、HPC、グラフィックカード、ネットワークサーバ、ストレージ、チップセット、車載機器(電子制御機器、運転支援システム)、カーナビ、PND、照明(一般照明、車載照明、LED照明、OLED照明)、テレビ、ディスプレイ、ディスプレイ用パネル(液晶パネル、有機ELパネル、電子ペーパー)、音楽再生端末、産業用機器、産業用ロボット、検査装置、医療機器、白物家電、宇宙・航空機用機器、ウェアラブルデバイス等である。 The final product on which the semiconductor element of the present invention is mounted as described above is not particularly limited, and is, for example, a smart TV, a mobile communication terminal, a mobile phone, a smartphone, a tablet terminal, a desktop PC, a notebook PC, or a network device. (Router, switching), wired infrastructure equipment, digital camera, game machine, controller, data center, server, mining PC, HPC, graphic card, network server, storage, chipset, in-vehicle equipment (electronic control equipment, driving support system) ), Car navigation system, PND, lighting (general lighting, in-vehicle lighting, LED lighting, OLED lighting), TV, display, display panel (liquid crystal panel, organic EL panel, electronic paper), music playback terminal, industrial equipment, industrial use Robots, inspection equipment, medical equipment, white goods, space / aircraft equipment, wearable devices, etc.
 以下に実施例を挙げて本発明をさらに具体的に説明する。以下の実施例に示す材料、使用量、割合、処理内容、処理手順等は、本発明の趣旨を逸脱しない限り、適宜、変更することができる。従って、本発明の範囲は以下に示す具体例に限定されるものではない。「部」、「%」は特に述べない限り、質量基準である。 The present invention will be described in more detail with reference to examples below. The materials, amounts used, ratios, treatment contents, treatment procedures, etc. shown in the following examples can be appropriately changed as long as they do not deviate from the gist of the present invention. Therefore, the scope of the present invention is not limited to the specific examples shown below. Unless otherwise specified, "part" and "%" are based on mass.
<積層体の形成>
 表1に記載の材料を使用して、下記のとおり、積層体を形成した。まず、プロピレングリコールモノメチルエーテルに樹脂(必要に応じて混合樹脂)を溶かした塗布液(固形分濃度:14質量%)を支持体上に塗布し、これを乾燥させて、支持体上に仮接着膜(表に記載の厚さ)を形成した。なお、支持体の大きさは、ダイシングフレームに装着できるよう充分な大きさとした。また、一部の実施例では、仮接着膜の形成前に、支持体上に剥離剤を塗布し、これを乾燥させて、支持体表面に剥離層(厚さ:50μm)を形成した。次いで、基材を仮接着膜に充分に(例えば0.5~1N/mm程度の力で)押し付けて、基材を仮接着膜に接着させた。これにより、切込み形成前の積層体が得られた。
<Formation of laminate>
The materials listed in Table 1 were used to form laminates as described below. First, a coating solution (solid content concentration: 14% by mass) in which a resin (mixed resin if necessary) is dissolved in propylene glycol monomethyl ether is applied onto a support, dried, and temporarily adhered onto the support. A film (thickness listed in the table) was formed. The size of the support was set to a sufficient size so that it could be attached to the dicing frame. Further, in some examples, a release agent was applied on the support and dried before forming the temporary adhesive film to form a release layer (thickness: 50 μm) on the surface of the support. Next, the base material was sufficiently pressed against the temporary adhesive film (for example, with a force of about 0.5 to 1 N / mm 2 ) to adhere the base material to the temporary adhesive film. As a result, a laminated body before the incision was formed was obtained.
 ダイシング装置(DAD324、ディスコ社製)を使用して、切込み形成前の上記積層体に、深さ0.75mmのシングルカットを縦および横方向にピッチ3mmで形成することによりダイシングを行った。これにより、3mm四方に区画された切込み付きの積層体が得られた。 Using a dicing device (DAD324, manufactured by Disco Corporation), dicing was performed by forming a single cut with a depth of 0.75 mm in the vertical and horizontal directions at a pitch of 3 mm on the above-mentioned laminated body before cutting. As a result, a laminated body with a notch divided into 3 mm squares was obtained.
Figure JPOXMLDOC01-appb-T000005
Figure JPOXMLDOC01-appb-T000005
Figure JPOXMLDOC01-appb-T000006
Figure JPOXMLDOC01-appb-T000006
 表1において、「樹脂1」および「樹脂2」の欄の数値は、混合樹脂における各樹脂の混合割合(質量%)である。また、実施例3は、ダイシング後チップの取り出しの前に、ダイシングテープ側から紫外線(200mJ/cm、30秒間)を照射して、ダイシングテープの粘着層を硬化させた例である。 In Table 1, the numerical values in the columns of "Resin 1" and "Resin 2" are the mixing ratio (mass%) of each resin in the mixed resin. Further, Example 3 is an example in which the adhesive layer of the dicing tape is cured by irradiating ultraviolet rays (200 mJ / cm 2 , 30 seconds) from the dicing tape side after dicing and before taking out the chips.
 上記表に記載の各材料の仕様は下記のとおりである。
<<支持体>>
・S-1:UC-334EP-85(古河電気工業社製)
・S-2:UC3026M-110(古河電気工業社製)
・S-3:UC3044M-110B(古河電気工業社製)
・S-4:UC-353EP-110A(古河電気工業工社製)
The specifications of each material described in the above table are as follows.
<< Support >>
・ S-1: UC-334EP-85 (manufactured by Furukawa Electric Co., Ltd.)
・ S-2: UC3026M-110 (manufactured by Furukawa Electric Co., Ltd.)
・ S-3: UC3044M-110B (manufactured by Furukawa Electric Co., Ltd.)
・ S-4: UC-353EP-110A (manufactured by Furukawa Electric Co., Ltd.)
<<剥離剤>>
・R-1:メガファックF-553(DIC社製)
・R-2:KP-341(信越化学工業社製)
・R-3:オプツールDSX(ダイキン工業社製)
<< Release agent >>
・ R-1: Mega Fvck F-553 (manufactured by DIC Corporation)
・ R-2: KP-341 (manufactured by Shin-Etsu Chemical Co., Ltd.)
・ R-3: Optool DSX (manufactured by Daikin Industries, Ltd.)
<<樹脂>>
・P-1:ポリビニルアセトアセタール(アセタール化度66モル%、水酸基含有量31モル%、アセチル基含有量3モル%。Mw40,000。BL-7、積水化学社製)
・P-2:ポリビニルブチラール(アセタール化度74モル%、水酸基含有量25モル%、アセチル基含有量1モル%。Mw108,000。KS-6Z、積水化学社製)
・P-3:ポリビニルブチラール(アセタール化度71モル%、水酸基含有量27モル%、アセチル基含有量1モル%。Mw108,000。B75-H、クラレ社製)
・P-4:ポリメタクリル酸メチル(Mw80,000。テルペット80NH、旭化成社製)
・P-5:酢酸セルロース(酢化度55%。L-20、ダイセル社製)
・P-6:ポリビニルブチラール(アセタール化度74モル%、水酸基含有量25モル%、アセチル基含有量1モル%。Mw130,000)
・P-7:ポリビニルブチラール(アセタール化度71モル%、水酸基含有量27モル%、アセチル基含有量2モル%。Mw100,000。BX-1、積水化学社製)
・P-8:酢酸セルロース(酢化度61%。LT-35、ダイセル社製)
・P-9:セルロースアセテートブチレート(Mw70,000。CAB-381-20、巴工業社製)
・P-10:ポリメタクリル酸メチル(Mw90,000。バイモーダル80NEN、旭化成社製)
・P-11:スチレン-ブタジエン-スチレン共重合体(Mw20,000。TR2000、JSR社製)
<< Resin >>
-P-1: Polyvinyl acetal acetal (acetalization degree 66 mol%, hydroxyl group content 31 mol%, acetyl group content 3 mol%. Mw 40,000. BL-7, manufactured by Sekisui Chemical Co., Ltd.)
P-2: Polyvinyl butyral (acetalization degree 74 mol%, hydroxyl group content 25 mol%, acetyl group content 1 mol%. Mw108,000. KS-6Z, manufactured by Sekisui Chemical Co., Ltd.)
P-3: Polyvinyl butyral (acetalization degree 71 mol%, hydroxyl group content 27 mol%, acetyl group content 1 mol%. Mw108,000. B75-H, manufactured by Kuraray Co., Ltd.)
-P-4: Polymethyl methacrylate (Mw80,000. Telpet 80NH, manufactured by Asahi Kasei Corporation)
-P-5: Cellulose acetate (55% vinegarization, L-20, manufactured by Daicel)
P-6: Polyvinyl butyral (acetalization degree 74 mol%, hydroxyl group content 25 mol%, acetyl group content 1 mol%. Mw 130,000)
P-7: Polyvinyl butyral (acetalization degree 71 mol%, hydroxyl group content 27 mol%, acetyl group content 2 mol%. Mw 100,000. BX-1, manufactured by Sekisui Chemical Co., Ltd.)
-P-8: Cellulose acetate (61% vinegarization, LT-35, manufactured by Daicel)
-P-9: Cellulose acetate butyrate (Mw70,000. CAB-381-20, manufactured by Tomoe Engineering Co., Ltd.)
-P-10: Polymethyl methacrylate (Mw 90,000. Bimodal 80NEN, manufactured by Asahi Kasei Corporation)
-P-11: Styrene-butadiene-styrene copolymer (Mw20,000. TR2000, manufactured by JSR Corporation)
<<基材>>
・M-1:シリコン基板(円盤状、厚さ0.7mm、最大直径200mm)
・M-2:銅基板(円盤状、厚さ0.8mm、最大直径200mm)
・M-3:ガラス基板(円盤状、厚さ1.1mm、最大直径200mm)
<< Base material >>
-M-1: Silicon substrate (disk-shaped, thickness 0.7 mm, maximum diameter 200 mm)
-M-2: Copper substrate (disk-shaped, thickness 0.8 mm, maximum diameter 200 mm)
-M-3: Glass substrate (disk-shaped, thickness 1.1 mm, maximum diameter 200 mm)
<接着力の測定>
 基材および仮接着膜の間の接着力(第1の接着力)、ならびに、支持体および仮接着膜の間の接着力(第2の接着力)は、別途、下記の方法で測定した。まず、基材上に仮接着膜を形成し、その後、上側の仮接着膜を下側の基材に対して垂直方向に50mm/分の速さで引き上げた。そして、その引き上げに要した外力を測定することにより、第1の接着力を得た。また、基材を支持体に替えて、同様の方法により、第2の接着力を得た。引き上げ力の測定は、フォースゲージ((株)イマダ製、ZTS-100N)を用いて行った。
<Measurement of adhesive strength>
The adhesive force between the base material and the temporary adhesive film (first adhesive force) and the adhesive force between the support and the temporary adhesive film (second adhesive force) were separately measured by the following methods. First, a temporary adhesive film was formed on the base material, and then the upper temporary adhesive film was pulled up at a speed of 50 mm / min in the direction perpendicular to the lower base material. Then, the first adhesive force was obtained by measuring the external force required for the pulling up. Further, the base material was replaced with a support, and a second adhesive force was obtained by the same method. The pulling force was measured using a force gauge (ZTS-100N, manufactured by Imada Co., Ltd.).
<飽和溶解度の測定>
 上記樹脂の飽和溶解度(23℃の水100gへの飽和溶解度(g))は、別途、下記の方法で測定した。まず、23℃の水に少量の樹脂を入れおよび撹拌することを数回繰り返して、飽和水溶液を調製した。その飽和水溶液を一定量取り、水を蒸発させる前後の質量から水分量および溶質量を算出し、これらの値に基づいてその樹脂の水に対する飽和溶解度を得た。表中の「飽和溶解度」の欄において、混合樹脂を使用した例では、各樹脂の飽和溶解度を示した。
<Measurement of saturation solubility>
The saturated solubility of the resin (saturated solubility (g) in 100 g of water at 23 ° C.) was separately measured by the following method. First, a saturated aqueous solution was prepared by adding a small amount of resin to water at 23 ° C. and stirring the mixture several times. A certain amount of the saturated aqueous solution was taken, the water content and the dissolved mass were calculated from the mass before and after the water was evaporated, and the saturated solubility of the resin in water was obtained based on these values. In the column of "saturated solubility" in the table, in the example using the mixed resin, the saturated solubility of each resin is shown.
<評価>
 切込み付きの上記積層体をエキスパンドし、この積層体から3mm四方のチップを取り出した。そして、チップの剥離面を肉眼で観察することで、下記基準に従って効果の評価を行った。なお、必要に応じてルーペや光学顕微鏡を使用して剥離面の観察を行ってもよい。
・A:支持体および仮接着膜の接着界面で剥離していた。
・B:仮接着膜の内部で剥離していた。
・C:基材および仮接着膜の接着界面で剥離していた。
<Evaluation>
The above-mentioned laminated body with a notch was expanded, and a 3 mm square chip was taken out from this laminated body. Then, the effect was evaluated according to the following criteria by observing the peeled surface of the chip with the naked eye. If necessary, the peeled surface may be observed using a loupe or an optical microscope.
-A: It was peeled off at the adhesive interface between the support and the temporary adhesive film.
-B: It was peeled off inside the temporary adhesive film.
-C: It was peeled off at the adhesive interface between the base material and the temporary adhesive film.
<評価結果>
 各実施例および比較例の評価結果を上記表2に示す。この結果から、本発明の積層体を用いることにより、支持体からチップを剥離した際に仮接着膜が基材側に残存するため、製造効率の低下を抑えながら、ダイシング処理後のチップ表面を保護することが可能となることがわかった。
<Evaluation result>
The evaluation results of each Example and Comparative Example are shown in Table 2 above. From this result, by using the laminate of the present invention, the temporary adhesive film remains on the base material side when the chip is peeled off from the support, so that the surface of the chip after the dicing treatment can be maintained while suppressing a decrease in manufacturing efficiency. It turns out that it is possible to protect.
 また、実施例1のシリコン基板を、半導体回路が表面に形成されたシリコン基板に換えて、実施例1と同様の手順によりチップを作製した。この際、上記半導体回路が形成されたシリコン基板の表面を保護対象の面として仮接着膜に接着させた。そして、仮接着膜付きの上記チップに所定の半導体プロセスを施した。その後、チップに付着した仮接着膜を除去し、半導体素子としてチップをパッケージングした。この半導体素子は、性能に問題はなかった。 Further, the silicon substrate of Example 1 was replaced with a silicon substrate having a semiconductor circuit formed on the surface, and a chip was produced by the same procedure as in Example 1. At this time, the surface of the silicon substrate on which the semiconductor circuit was formed was adhered to the temporary adhesive film as a surface to be protected. Then, a predetermined semiconductor process was applied to the chip with the temporary adhesive film. Then, the temporary adhesive film adhering to the chip was removed, and the chip was packaged as a semiconductor element. This semiconductor device had no problem in performance.
1  積層体
10 基材
12 仮接着膜
14 支持体
16 切込み
C  チップ
S1 基材および仮接着膜の接着界面
S2 仮接着膜および支持体の接着界面
1 Laminated body 10 Base material 12 Temporary adhesive film 14 Support 16 Notch C chip S1 Adhesive interface between base material and temporary adhesive film S2 Adhesive interface between temporary adhesive film and support

Claims (20)

  1.  基材と、仮接着膜と、支持体とを順に有する積層体であって、
     前記基材および前記仮接着膜が、前記基材から前記仮接着膜まで延びる切込みによって、複数に分割されており、
     前記基材および前記仮接着膜の間の第1の接着力が、前記仮接着膜および前記支持体の間の第2の接着力以上である、積層体。
    A laminate having a base material, a temporary adhesive film, and a support in this order.
    The base material and the temporary adhesive film are divided into a plurality of parts by a notch extending from the base material to the temporary adhesive film.
    A laminate in which the first adhesive force between the base material and the temporary adhesive film is equal to or greater than the second adhesive force between the temporary adhesive film and the support.
  2.  前記第1の接着力および前記第2の接着力の差が10~100N/mmである、
     請求項1に記載の積層体。
    The difference between the first adhesive force and the second adhesive force is 10 to 100 N / mm 2 .
    The laminate according to claim 1.
  3.  前記第2の接着力が20~100N/mmである、
     請求項1または2に記載の積層体。
    The second adhesive force is 20 to 100 N / mm 2 .
    The laminate according to claim 1 or 2.
  4.  前記仮接着膜の厚さが10~100μmである、
     請求項1~3のいずれか1項に記載の積層体。
    The temporary adhesive film has a thickness of 10 to 100 μm.
    The laminate according to any one of claims 1 to 3.
  5.  前記基材を前記支持体から剥離した後において、前記基材上の前記仮接着膜の厚さが、10~100μmである、
     請求項1~4のいずれか1項に記載の積層体。
    After the base material is peeled off from the support, the thickness of the temporary adhesive film on the base material is 10 to 100 μm.
    The laminate according to any one of claims 1 to 4.
  6.  前記仮接着膜が前記支持体側の表層部分に剥離層を含む、
     請求項1~5のいずれか1項に記載の積層体。
    The temporary adhesive film contains a release layer on the surface layer portion on the support side.
    The laminate according to any one of claims 1 to 5.
  7.  前記支持体が前記仮接着膜側の表層部分に剥離層を含む、
     請求項1~5のいずれか1項に記載の積層体。
    The support includes a release layer on the surface layer portion on the temporary adhesive film side.
    The laminate according to any one of claims 1 to 5.
  8.  前記剥離層が界面活性剤を含む、
     請求項6または7に記載の積層体。
    The release layer contains a surfactant.
    The laminate according to claim 6 or 7.
  9.  前記剥離層の厚さが0.1~10μmである、
     請求項6~8のいずれか1項に記載の積層体。
    The thickness of the release layer is 0.1 to 10 μm.
    The laminate according to any one of claims 6 to 8.
  10.  前記仮接着膜が非硬化性の樹脂を含む、
     請求項1~9のいずれか1項に記載の積層体。
    The temporary adhesive film contains a non-curable resin.
    The laminate according to any one of claims 1 to 9.
  11.  前記仮接着膜が非水溶性の樹脂を含む、
     請求項1~10のいずれか1項に記載の積層体。
    The temporary adhesive film contains a water-insoluble resin,
    The laminate according to any one of claims 1 to 10.
  12.  前記仮接着膜が、23℃の水100gへの飽和溶解度が0.9g以下である樹脂を含む、請求項1~11のいずれか1項に記載の積層体。 The laminate according to any one of claims 1 to 11, wherein the temporary adhesive film contains a resin having a saturated solubility in 100 g of water at 23 ° C. of 0.9 g or less.
  13.  前記仮接着膜が、ポリビニルアセタール、ポリメタクリル酸アルキルおよびアシルセルロースからなる群より選択される少なくとも1種の樹脂を含む、
     請求項1~12のいずれか1項に記載の積層体。
    The temporary adhesive film contains at least one resin selected from the group consisting of polyvinyl acetal, polyalkyl methacrylate and acyl cellulose.
    The laminate according to any one of claims 1 to 12.
  14.  前記仮接着膜が、酸化防止剤を含む、
     請求項1~13のいずれか1項に記載の積層体。
    The temporary adhesive film contains an antioxidant.
    The laminate according to any one of claims 1 to 13.
  15.  前記基材が前記仮接着膜側の表層部分に半導体回路を含み、
     前記支持体がダイシングテープである、
     請求項1~14のいずれか1項に記載の積層体。
    The base material contains a semiconductor circuit on the surface layer portion on the temporary adhesive film side.
    The support is a dicing tape,
    The laminate according to any one of claims 1 to 14.
  16.  請求項1~15のいずれか1項に記載の積層体における前記仮接着膜の形成に使用される仮接着用組成物。 A composition for temporary adhesion used for forming the temporary adhesive film in the laminate according to any one of claims 1 to 15.
  17.  基材および支持体の一方の表面に形成された仮接着膜を、前記基材および前記支持体の他方の表面に接着すること、および
     その後、前記基材から前記仮接着膜まで延びる切込みを形成することを含む、積層体の製造方法であって、
     前記基材および前記仮接着膜の間の第1の接着力が、前記仮接着膜および前記支持体の間の第2の接着力以上である、積層体の製造方法。
    A temporary adhesive film formed on one surface of the base material and the support is adhered to the other surface of the base material and the support, and then a notch extending from the base material to the temporary adhesive film is formed. A method for manufacturing a laminated body, which includes the above-mentioned method.
    A method for producing a laminate, wherein the first adhesive force between the base material and the temporary adhesive film is equal to or greater than the second adhesive force between the temporary adhesive film and the support.
  18.  さらに、前記基材および前記支持体の前記一方の表面に前記仮接着膜を形成する工程を含み、
     前記仮接着膜を形成する工程において、仮接着用組成物を前記基材または前記支持体の表面に適用し、その後、前記仮接着用組成物を乾燥させることを含む、
     請求項17に記載の積層体の製造方法。
    Further, the step of forming the temporary adhesive film on the one surface of the base material and the support is included.
    The step of forming the temporary adhesive film comprises applying the temporary adhesive composition to the surface of the base material or the support, and then drying the temporary adhesive composition.
    The method for producing a laminate according to claim 17.
  19.  前記仮接着用組成物を前記基材または前記支持体の表面に適用する方法が、スピンコート法、スリットコート法またはスパイラルコート法である、
     請求項18に記載の積層体の製造方法。
    The method of applying the temporary bonding composition to the surface of the base material or the support is a spin coating method, a slit coating method or a spiral coating method.
    The method for producing a laminate according to claim 18.
  20.  請求項17~19のいずれか1項に記載の積層体の製造方法を含む、半導体素子の製造方法。 A method for manufacturing a semiconductor device, which comprises the method for manufacturing a laminate according to any one of claims 17 to 19.
PCT/JP2020/041302 2019-11-07 2020-11-05 Laminate body that includes temporary adhesive film; temporary adhesive composition; laminate body manufacturing method; and semiconductor element manufacturing method WO2021090863A1 (en)

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Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012195414A (en) * 2011-03-16 2012-10-11 Sumitomo Bakelite Co Ltd Dicing tape integrated adhesive sheet, multilayer circuit board, electronic component and semiconductor device
JP2016102165A (en) * 2014-11-28 2016-06-02 日東電工株式会社 Sheet-like resin composition, laminate sheet and manufacturing method of semiconductor device

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012195414A (en) * 2011-03-16 2012-10-11 Sumitomo Bakelite Co Ltd Dicing tape integrated adhesive sheet, multilayer circuit board, electronic component and semiconductor device
JP2016102165A (en) * 2014-11-28 2016-06-02 日東電工株式会社 Sheet-like resin composition, laminate sheet and manufacturing method of semiconductor device

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