WO2021088833A1

WO2021088833A1 - Auxiliary device for testing chip-on-board

Info

Publication number: WO2021088833A1
Application number: PCT/CN2020/126287
Authority: WO
Inventors: 苏永东
Original assignee: 新嘉数码电子(深圳)有限公司
Priority date: 2019-11-05
Filing date: 2020-11-03
Publication date: 2021-05-14
Also published as: CN112782553A

Abstract

An auxiliary device for testing a chip-on-board (100). The auxiliary device comprises a chip jig (1) and an outer wiring board (4). A limiting fixing opening (2) capable of covering the top of the chip-on-board (100) is provided on the chip jig (1), and a plurality of metal contacts (3) are arranged on an inner side wall of the limiting fixing opening (2) in a penetrating manner and are in one-to-one correspondence to pins (101) of the chip-on-board (100). A first end of the outer wiring board (4) is located inside the chip jig (1), the plurality of metal contacts (3) are each electrically connected to the first end of the outer wiring board (4), and a second end of the outer wiring board (4) extends out of the chip jig (1) and is electrically connected with a multi-pin plug connector (5). When the limiting fixing opening (2) of the chip jig (1) covers the top of the chip-on-board (100), the plurality of metal contacts (3) abut against the plurality of pins of the chip-on-board (100) respectively to electrically connect the chip-on-board (100) to an external test apparatus by means of the metal contacts (3), the outer wiring board (4) and the multi-pin plug connector (5). The original connection state between the chip and a circuit board does not need to be changed, and thus the chip can be prevented from being damaged and the reliable connection to the pins (101) of the chip-on-board (100) is achieved.

Description

Auxiliary device for on-board chip test

Technical field

The utility model relates to chip testing equipment, in particular to an auxiliary device for on-board chip testing.

Background technique

In the prior art, when electronic devices such as computers, mobile phones, and game consoles need to be tested or repaired, it is usually necessary to perform read and write tests on the chips in the circuit boards of these electronic devices. However, the existing test method generally uses the chip to be tested. However, this method is not only easy to damage the chip, but also because the chip is difficult to reset on the board, the chip or the circuit board is scrapped, and the safety and reliability are poor. In addition, the chip can be tested on-board through some jigs. Most of the chips are of SMD type, and their pins are not only small, but also attached to the circuit board, so it is difficult to reliably connect the probes of the fixture to the chip pins, and it is difficult to meet the testing needs of users.

Utility model content

The technical problem to be solved by the utility model is to provide a board that does not need to change the original connection state of the chip and the circuit board, can avoid damaging the chip or the circuit board, and can be reliably connected to the pins of the on-board chip in view of the shortcomings of the prior art. Chip-on-chip test auxiliary device.

In order to solve the above technical problems, the present utility model adopts the following technical solutions.

An auxiliary device for testing an on-board chip, which includes a chip fixture and an external wiring board. The chip fixture is provided with a limit fixing port that can cover the top of the onboard chip, and the inner side of the limit fixing port The wall is penetrated with a plurality of metal contacts, the metal contacts correspond to the pins of the onboard chip one-to-one, the first end of the outer wiring board is located in the chip fixture, and a plurality of metal The contacts are respectively electrically connected to the first end of the outer wiring board, the second end of the outer wiring board extends to the outside of the chip fixture, and the second end of the outer wiring board is electrically connected A multi-pin connector is sexually connected. When the limit fixing mask of the chip fixture is set on the top of the on-board chip, a plurality of metal contacts are respectively abutted on the pins of the on-board chip, by The metal contacts, the external wiring board and the multi-pin connector electrically connect the pins of the on-board chip to the external test equipment in a one-to-one correspondence.

Preferably, the chip fixture is provided with an inner wiring board, a plurality of metal contacts are fixed on the inner wiring board, and the outer wiring board and the inner wiring board are integrally formed.

Preferably, a plurality of metal contacts are sequentially distributed along the edge of the inner wiring board.

Preferably, the inner side wall of the limit fixing port is provided with a plurality of slots, the slots are aligned with the metal contacts one by one, the metal contacts pass through the slots, and the metal contacts The point can move in the slot.

Preferably, the end of the metal contact is formed with a hook that is bent toward the inner side of the limit fixing opening.

Preferably, an inclined surface is formed on the outer side of the hook, and the hook is wedge-shaped by the inclined surface.

Preferably, a cover plate is fixed on the side of the chip fixture that faces away from the limit fixing port.

Preferably, the inner wiring board is sandwiched between the chip fixture and the cover plate.

Preferably, a plurality of metal contacts are separately provided on the left and right sides of the inner wiring board or distributed in a square or rectangular shape along the circumference of the inner wiring board.

In the on-board chip test auxiliary device disclosed by the utility model, during testing, the clamping mask of the chip fixture is first set on the top of the on-board chip, and then pressure is applied to the chip fixture to make a plurality of metal contacts Abut against the multiple pins of the on-board chip, and after the metal contacts and the pins are in close contact, the multi-pin connector is electrically connected to the external test equipment, and the metal contacts and the pins are electrically connected to the external test equipment. The coordination of the flat cable and the multi-pin connector realizes the point-to-point electrical connection between the on-board chip and the external test equipment, and finally the external test equipment is used to perform a read and write test on the on-board chip. Compared with the prior art, the present invention does not need to change the original connection state of the chip and the circuit board, not only can avoid damage to the chip or the circuit board, but also can be reliably connected with the pins of the on-board chip, and has a plug and play function. , Simple and reliable, etc., which satisfies the needs of chip testing well.

Description of the drawings

Figure 1 is a perspective view of the utility model on-board chip test auxiliary device;

Figure 2 is an enlarged view of part A in Figure 1;

Figure 3 is an exploded view 1 of the utility model on-board chip test auxiliary device;

Figure 4 is an enlarged view of part B in Figure 3;

Figure 5 is the second exploded view of the utility model on-board chip test auxiliary device;

Figure 6 is a cross-sectional view of the utility model on-board chip test auxiliary device.

Detailed ways

The following describes the utility model in more detail with reference to the drawings and embodiments.

The utility model discloses an auxiliary device for on-board chip testing. The on-board chip is located on a target board that needs to be tested. As shown in FIG. 1 to FIG. 6, it includes a chip fixture 1 and an external wiring board 4. The chip fixture 1 is provided with a limit fixing port 2 that can cover the top of the onboard chip 100, and the inner side wall of the limit fixing port 2 is provided with a plurality of metal contacts 3, and the metal contacts 3 In one-to-one correspondence with the pins 101 of the on-board chip 100, the first end of the outer wiring board 4 is located in the chip fixture 1, and a plurality of metal contacts 3 are electrically connected to the outer The first end of the wiring board 4, the second end of the outer wiring board 4 extends outside the chip fixture 1, and the second end of the outer wiring board 4 is electrically connected with a multi-pin plug Connector 5, when the limit fixing port 2 of the chip fixture 1 is covered on the top of the onboard chip 100, a plurality of metal contacts 3 respectively abut against the plurality of pins 101 of the onboard chip 100 , The pins of the on-board chip 100 are electrically connected to the external test equipment through the metal contacts 3, the outer wiring board 4 and the multi-pin connector 5 in a one-to-one correspondence.

During testing of the above-mentioned device, the limit fixing port 2 of the chip fixture 1 is first covered on the top of the on-board chip 100, and then pressure is applied to the chip fixture 1, so that a plurality of metal contacts 3 are respectively pressed against Are connected to the multiple pins 101 of the onboard chip 100. After the metal contacts 3 are in close contact with the pins 101, the multi-pin connector 5 is electrically connected to an external test device, and the metal contacts Point 3. The external wiring board 4 and the multi-pin connector 5 cooperate to realize the electrical connection between the onboard chip 100 and the external test equipment, and finally the onboard chip 100 is tested by the external test equipment. Compared with the prior art, the present invention does not need to change the original connection state of the chip and the circuit board, not only can avoid damage to the chip or the circuit board, but also can be reliably connected with the pins of the on-board chip, and has a plug and play function. , Simple and reliable, etc., which satisfies the needs of chip testing well.

In order to support the metal contact 3 and at the same time electrically connect the metal contact 3 with the outer wiring board 4, in this embodiment, the chip fixture 1 is provided with an inner wiring board 6, and a plurality of metal The contact 3 is fixed on the inner wiring board 6, and the outer wiring board 4 and the inner wiring board 6 are integrally formed.

As a preferred manner, a plurality of metal contacts 3 are sequentially distributed along the edge of the inner wiring board 6. For example, a plurality of metal contacts 3 are separately provided on the left and right sides of the inner wiring board 6 or distributed in a square or rectangular shape along the circumference of the inner wiring board 6.

In this embodiment, the inner side wall of the limit fixing opening 2 is provided with a plurality of slots 20, the slots 20 are aligned with the metal contacts 3 one by one, and the metal contacts 3 pass through the slots. A hole 20, and the metal contact 3 can move in the slot 20. The above-mentioned slot 20 is not only used to pass through the metal contact 3, but can also provide an elastic movable space for the metal contact 3, so that the metal contact 3 and the pin 101 are more reliably contacted.

In order to make the metal contact 3 and the pin 101 more closely connected, in this embodiment, the end of the metal contact 3 is formed with a hook 30 bent toward the inner side of the limit fixing opening 2.

As a preferred manner, an inclined surface 31 is formed on the outer side of the hook 30, and the hook 30 is wedge-shaped by the inclined surface 31. The above-mentioned wedge-shaped hook 30 helps to slide the metal contact 3 to the outside of the pin 101, thereby playing a guiding role during clamping.

As a preferred structure, a cover plate 7 is fixed on the side of the chip fixture 1 facing away from the limit fixing opening 2.

Further, the inner wiring board 6 is sandwiched between the chip fixture 1 and the cover plate 7.

In order to better describe the technical solution of the present invention, the present invention also relates to an auxiliary method for on-board chip testing. As shown in FIG. 1 to FIG. 6, the method is implemented based on a device that includes a chip fixture 1 and the outer wiring board 4, the chip fixture 1 is provided with a limit fixing port 2, and the inner side wall of the limit fixing port 2 is provided with a plurality of metal contacts 3, and the outer wiring board 4 The first end is located in the chip fixture 1, and a plurality of metal contacts 3 are respectively electrically connected to the first end of the outer wiring board 4, and the second end of the outer wiring board 4 faces the The chip fixture 1 extends outside, and the second end of the outer wiring board 4 is electrically connected to a multi-pin connector 5. The method includes the following steps:

Step S1, covering the limit fixing port 2 of the chip fixture 1 on the top of the onboard chip 100;

Step S2, applying pressure to the chip fixture 1 so that a plurality of metal contacts 3 respectively abut against a plurality of pins 101 of the on-board chip 100;

Step S3, electrically connecting the multi-pin connector 5 to an external test device;

In step S4, the on-board chip 100 is tested using an external test device.

In the above method, the end of the metal contact 3 is formed with a hook 30 bent toward the inner side of the limit fixing opening 2. In step S2, the hook 30 at the end of the metal contact 3 It is pressed tightly to the outside of the pin 101 of the on-board chip 100. Through the above structure, it can be ensured that the metal contact 3 and the pin 101 are electrically connected accurately and reliably.

The above are only preferred embodiments of the present utility model, and are not used to limit the present utility model. Any modification, equivalent replacement or improvement made within the technical scope of the utility model shall be included in the protection of the utility model. In the range.

Industrial applicability

Claims

An auxiliary device for on-board chip testing, which is characterized in that it includes a chip fixture and an external wiring board. The chip fixture is provided with a limit fixing port that can cover the top of the onboard chip, and the limit fixation The inner side wall of the port is provided with a plurality of metal contacts, the metal contacts correspond to the pins of the on-board chip one-to-one, the first end of the outer wiring board is located in the chip fixture, and A plurality of metal contacts are respectively electrically connected to the first end of the outer wiring board, the second end of the outer wiring board extends outside the chip fixture, and the first end of the outer wiring board The two ends are electrically connected with a multi-pin connector. When the limit fixing mask of the chip fixture is set on the top of the on-board chip, a plurality of metal contacts respectively abut against the multiple leads of the on-board chip. The pins are electrically connected to the external test equipment through the metal contacts, the external wiring board, and the multi-pin connector to electrically connect the pins of the on-board chip to the external test equipment in a one-to-one correspondence.
The on-board chip test auxiliary device of claim 1, wherein the chip fixture is provided with an inner wiring board, a plurality of metal contacts are fixed on the inner wiring board, and the outer wiring board The wiring board and the inner wiring board are integrally formed.
3. The on-board chip test auxiliary device according to claim 2, wherein a plurality of metal contacts are sequentially distributed along the edge of the inner wiring board.
5. The on-board chip test auxiliary device according to claim 1, wherein a plurality of slots are formed on the inner side wall of the limit fixing opening, and the slots are aligned with the metal contacts one by one, and the The metal contact passes through the slot hole, and the metal contact can move in the slot hole.
3. The on-board chip test auxiliary device according to claim 1, wherein the end of the metal contact is formed with a hook that is bent toward the inner side of the limit fixing opening.
5. The on-board chip test auxiliary device of claim 5, wherein an inclined surface is formed on the outer side of the hook, and the hook is wedge-shaped by the inclined surface.
3. The on-board chip test auxiliary device according to claim 2, wherein a cover plate is fixed on a side of the chip fixture that faces away from the limit fixing port.
8. The on-board chip test auxiliary device of claim 7, wherein the inner wiring board is sandwiched between the chip fixture and the cover plate.
4. The on-board chip test auxiliary device of claim 3, wherein a plurality of metal contacts are separately provided on the left and right sides of the inner wiring board or distributed in a square or rectangular shape along the circumference of the inner wiring board .