WO2020224224A1 - Mocvd reaction device - Google Patents

Mocvd reaction device Download PDF

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Publication number
WO2020224224A1
WO2020224224A1 PCT/CN2019/118490 CN2019118490W WO2020224224A1 WO 2020224224 A1 WO2020224224 A1 WO 2020224224A1 CN 2019118490 W CN2019118490 W CN 2019118490W WO 2020224224 A1 WO2020224224 A1 WO 2020224224A1
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WO
WIPO (PCT)
Prior art keywords
outer ring
heating wire
reaction device
mocvd reaction
support
Prior art date
Application number
PCT/CN2019/118490
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French (fr)
Chinese (zh)
Inventor
蒲健
姚志伟
陈军
Original Assignee
聚灿光电科技股份有限公司
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Application filed by 聚灿光电科技股份有限公司 filed Critical 聚灿光电科技股份有限公司
Priority to KR1020217035583A priority Critical patent/KR102632383B1/en
Publication of WO2020224224A1 publication Critical patent/WO2020224224A1/en

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    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/458Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for supporting substrates in the reaction chamber
    • C23C16/4582Rigid and flat substrates, e.g. plates or discs
    • C23C16/4583Rigid and flat substrates, e.g. plates or discs the substrate being supported substantially horizontally
    • C23C16/4584Rigid and flat substrates, e.g. plates or discs the substrate being supported substantially horizontally the substrate being rotated
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/458Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for supporting substrates in the reaction chamber
    • C23C16/4582Rigid and flat substrates, e.g. plates or discs
    • C23C16/4583Rigid and flat substrates, e.g. plates or discs the substrate being supported substantially horizontally
    • C23C16/4586Elements in the interior of the support, e.g. electrodes, heating or cooling devices
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/06Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of metallic material
    • C23C16/18Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of metallic material from metallo-organic compounds
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/455Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/455Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
    • C23C16/45587Mechanical means for changing the gas flow
    • C23C16/45591Fixed means, e.g. wings, baffles
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/458Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for supporting substrates in the reaction chamber
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/46Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for heating the substrate
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/48Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating by irradiation, e.g. photolysis, radiolysis, particle radiation

Definitions

  • the invention relates to the field of vapor deposition, in particular to a MOCVD reaction device.
  • MOCVD Metal-Organic Chemical Vapor Deposition, metal organic compound chemical vapor deposition
  • VPE vapor phase epitaxy
  • MOCVD is the core equipment for preparing compound semiconductor epitaxial materials.
  • Organic compounds of group III and group II elements and hydrides of group V and VI elements are used as crystal growth source materials to conduct vapor phase epitaxy on the substrate by means of thermal decomposition reaction. It is mainly used for the growth of various III-V group, II-VI group compound semiconductors and their multiple solid solution thin layer single crystal materials, covering all common semiconductors, and has a very broad market prospect.
  • the model of the K465i machine has a smaller carrier plate size, and the number of wafers carried by the carrier plate is 14*4 (that is, 14 4-inch wafers).
  • the stability and consistency of technology and machines are mature, but due to low production capacity, it is increasingly unable to meet market demand.
  • the purpose of the present invention is to provide a MOCVD reaction device, which can greatly increase the productivity.
  • an embodiment of the present invention provides a MOCVD reaction device, comprising: a carrier plate and a heating device located below the carrier plate, the heating device comprising a heating wire assembly and supporting the heating wire assembly
  • the bracket assembly the heating wire assembly includes an outer ring heating wire set corresponding to the edge area of the carrier plate
  • the bracket assembly includes a plurality of outer ring brackets supporting the outer ring heating wire
  • the outer ring bracket includes parallel Two outer ring support feet are provided and an outer ring support portion connecting the two outer ring support feet.
  • the side of the outer ring support portion away from the two outer ring support feet includes a flat support surface, and the support surface includes The first supporting surface and the second supporting surface are connected, the first supporting surface is corresponding to the middle area of the two outer ring supporting feet, and the second supporting surface protrudes away from the center of the outer ring heating wire The first supporting surface exits, and the outer ring heating wire is located on the first supporting surface and the second supporting surface.
  • the carrier disk is circular, the diameter of the carrier disk ranges from 480 to 500 mm, and the outer diameter of the outer ring heating wire ranges from 480 to 500 mm.
  • the outer ring bracket is integrally formed, and the two outer ring support legs and the outer ring support portion are located in the same plane.
  • the distance from any point on the supporting surface to the horizontal plane is equal.
  • the heating device further includes a substrate, a thermal insulation component and a ceramic base located between the substrate and the heating wire component, the substrate includes a mounting hole, and the thermal insulation
  • the assembly includes a through hole, the ceramic base is disposed in the through hole and the mounting hole, and the ceramic base has a accommodating cavity, and the two outer ring support legs of the outer ring bracket are limited in the accommodating Cavity.
  • the thermal insulation component includes a plurality of stacked thermal insulation sheets, the outer diameter of the thermal insulation component ranges from 480 to 500 mm, and the outer diameter of the substrate is smaller than that of the thermal insulation component ⁇ OD ⁇
  • the heating device further includes a support portion connected to the substrate, and the support portion extends to the outer edge of the outer ring heating wire.
  • the MOCVD reaction device further includes a cover provided around the heating device, and the inner diameter of the cover is in the range of 480 to 500 mm.
  • the MOCVD reaction device further includes an ash collecting ring, the cover body is connected to the ash collecting ring, and a plurality of exhaust holes are provided on the ash collecting ring.
  • the MOCVD reaction device further includes a baffle in a hollow ring shape, the upper end surface of the side wall of the baffle has a first width, and the value range of the first width is 16.9 ⁇ 26.9mm.
  • the beneficial effect of the present invention is that in an embodiment of the present invention, when the original machine station is not moving, simply changing the design of several components can greatly increase the production capacity and have high practicability.
  • Fig. 1 is a schematic diagram of a MOCVD reaction apparatus according to an embodiment of the present invention
  • FIG. 2 is a schematic diagram of a baffle according to an embodiment of the present invention.
  • FIG. 3 is a cross-sectional view of the area A-A in FIG. 2 corresponding to the prior art
  • FIG. 4 is a cross-sectional view of the area A-A in FIG. 2 corresponding to an embodiment of the present invention
  • Figure 5 is a perspective view of a heating device according to an embodiment of the present invention.
  • Figure 6 is a top view of a heating device according to an embodiment of the present invention.
  • Figure 7 is a side view of a heating device according to an embodiment of the present invention.
  • Fig. 8 is a schematic diagram of a middle ring bracket according to an embodiment of the present invention.
  • Figure 9 is a schematic diagram of an outer ring bracket according to an embodiment of the present invention.
  • FIG. 10 is a schematic diagram of the cooperation between the cover body and the dust collecting ring according to an embodiment of the present invention.
  • Fig. 11 is a schematic diagram of a cover according to an embodiment of the present invention.
  • relative position in space is for the purpose of facilitating description to describe a unit or feature shown in the drawings relative to The relationship of another unit or feature.
  • the term of the relative position in space may be intended to include different orientations of the device in use or operation other than those shown in the figures. For example, if the device in the figure is turned over, the unit described as being “below” or “below” other units or features will be “above” the other units or features. Therefore, the exemplary term “below” can encompass both above and below orientations.
  • the device can be oriented in other ways (rotated by 90 degrees or other orientations), and the space-related descriptors used herein are explained accordingly.
  • FIG. 1 it is a schematic diagram of a MOCVD reaction apparatus 100 according to an embodiment of the present invention.
  • the MOCVD reaction device 100 includes a tray 10, a baffle 20, a heating device 30, a cover 40, an ash collecting ring 50, and the like.
  • the carrier plate 10 is located in the reaction chamber S of the MOCVD reaction device 100, the carrier plate 10 is a large graphite plate formed by graphite pressing, and a plurality of carrier cavities 101 for carrying wafers are formed on the carrier plate 10.
  • the carrier plate 10 is circular, and the diameter of the carrier plate 10 ranges from 480 to 500 mm.
  • the carrier plate 10 can increase the output of 1 to 5 pieces on the basis of the original K465i machine output, so that the single cavity output capacity Increase, in this embodiment, the tray 10 at this time can carry 16 4-inch wafers.
  • the MOCVD reactor 100 of this embodiment can be an existing K465i machine (or K300, K465, etc.).
  • the production capacity can be increased by changing some parts. For example, at this time, the diameter of the carrier 10 is changed from the original 465mm to 480-500mm. Under the condition that the process time is not much different, the output capacity of the single cavity is increased.
  • the change of other components please refer to the following description.
  • the MOCVD reaction apparatus 100 also includes a source supply system 70 and other structures.
  • the source supply system 70 is used to provide reaction gas to the reaction chamber S. 10 rotation can make the reaction gas evenly deposited on each wafer.
  • the baffle 20 is in a hollow ring shape, and the baffle 20 is arranged around the tray 10, and the baffle 20 can move up and down, so as to fully meet the requirements of MOCVD automated production.
  • the most important part is the design of the flow field and thermal field inside the reaction chamber S. Only the most suitable design of the flow field and thermal field can make the reaction process inside the reaction chamber S proceed smoothly and improve the source material of the reactants.
  • the baffle 20 arranged next to the carrier plate 10 is particularly important, which directly affects the flow field distribution above the carrier plate 10, and because the baffle plate 20 is separated
  • the carrier plate 10 is very close, which also has a certain degree of influence on the temperature field distribution on the surface of the carrier plate 10.
  • the baffle plate 20 can provide a surrounding stable space for the reaction chamber S during the growth process. The phenomenon of chaotic airflow occurs.
  • FIG. 2 it is a schematic diagram of the baffle 20.
  • the baffle 20 includes a baffle body 21 and a conveying pipe 22.
  • the baffle body 21 has a cooling water cavity, and the conveying pipe 22 conveys cooling water to the cooling water cavity. In this way, the temperature of the baffle 20 itself can be greatly reduced.
  • the baffle 20 with a lower temperature can achieve a better heat insulation effect, and can prevent the high temperature of the reaction chamber S from affecting other components (such as sealing).
  • the impurities generated by the reaction can be deposited on the side wall of the baffle body 21 with a lower temperature, and the baffle body 21 can be cleaned later.
  • Figures 3 and 4 are cross-sectional views of AA in Figure 2.
  • Figure 3 corresponds to the original baffle plate of the K465i machine
  • Figure 4 corresponds to the baffle plate 20 of this embodiment.
  • the parts have the same name.
  • the upper end surface of the side wall of the baffle body 21 of the baffle 20 of this embodiment has a first width L1
  • the value range of the first width L1 is 16.9-26.9mm (34.4-[( 500-465)/2] ⁇ L1 ⁇ 34.4-[(480-465)/2])
  • the second width L2 of the lower end surface changes year-on-year with the first width L1.
  • the side wall of the baffle body 21 is thinned under the condition that the outer diameter of the baffle body 21 remains unchanged, so that the baffle body 21 and the tray A proper gap can still be ensured between 10, so other parts of the baffle body 21 and other parts connected to the baffle body 21 do not need to be changed, which greatly simplifies the improvement process.
  • the heating device 30 is located below the carrier plate 10, and the heating device 30 is used to heat the carrier plate 10 to keep the carrier plate 10 within the epitaxial growth temperature range, thereby realizing the formation of the film.
  • heating is commonly used
  • the method is radiant heating, and the temperature of the tray 10 is raised by the heat radiation of the heating device 30.
  • the heating device 30 includes a substrate 31, a heating wire assembly 32 located above the substrate 31, a support assembly 33 supporting the heating wire assembly 32, a heat insulation assembly 34 located between the substrate 31 and the heating wire assembly 32, and The ceramic base 35 and the drive shaft 60 pass through the heating device 30 to be connected to the tray 10.
  • the heating wire assembly 32 is substantially in the shape of a disk, and in the direction from the center of the heating wire assembly 32 to the outer edge, the heating wire assembly 32 includes an inner ring heating wire 321, a middle ring heating wire 322 and an outer ring heating wire 323 in sequence.
  • the inner ring heating wire 321 is arranged adjacent to and surrounding the drive shaft 60, the inner ring heating wire 321 may be a ring-shaped metal sheet, the middle ring heating wire 322 has a spiral ring structure, and the middle ring heating wire 322 is arranged around the inner ring heating wire 321 ,
  • the outer ring heating wire 323 is a ring structure, the outer ring heating wire 323 is arranged around the middle ring heating wire 322, and the outer ring heating wire 323 is arranged corresponding to the edge area of the carrier plate 10, and the outer diameter range of the outer ring heating wire is 480-500mm, in this way, it can adapt to the change of the tray 10, so that the heating wire assembly 32 can still heat the tray 10 uniformly and fully.
  • this embodiment increases the size of the outer ring heating wire 323 while keeping the position and size of the inner ring heating wire 321 and the middle ring heating wire 322 unchanged (outer ring heating wire 323
  • the original outer diameter is approximately 465mm).
  • this embodiment increases the outer diameter and inner diameter of the outer ring heating wire 323, and the distance between the inner ring side wall and the outer ring side wall of the outer ring heating wire 323 remains unchanged, that is, at this time Only the outer ring heating wire 323 is enlarged, the width of the outer ring heating wire 323 does not change, and the gap between the outer ring heating wire 323 and the middle ring heating wire 322 is correspondingly larger, and the change range of the gap is higher than that of the outer ring.
  • the heating wire assembly 32 also includes heating wire electrodes, such as outer heating wire electrodes 323a, middle heating wire electrodes 322a, etc., through which the corresponding heating wires can be powered so that the corresponding heating wires generate heat.
  • heating wire electrodes such as outer heating wire electrodes 323a, middle heating wire electrodes 322a, etc.
  • the bracket assembly 33 includes a plurality of middle ring brackets 332 supporting the middle ring heating wire 322 and a plurality of outer ring brackets 333 supporting the outer ring heating wire 323.
  • the middle ring bracket 332 is roughly in the shape of a "door".
  • the middle ring bracket 332 includes two middle ring support legs 3321 arranged in parallel and a middle ring support portion 3322 connecting the two middle ring support legs 3321.
  • the ring support portion 3322 is perpendicular to the two center ring support feet 3321, and a plurality of center ring supports 332 surround the center ring to support the center ring heating wire 322.
  • the outer ring support 333 includes two outer ring support legs 3331 arranged in parallel and an outer ring support portion 3332 connecting the two outer ring support legs 3331.
  • a plurality of outer ring supports 333 surround and form a circle to support the outer ring heating wire 323.
  • the base plate 31 includes a mounting hole 311
  • the heat insulation component 34 includes a through hole 341
  • the ceramic base 35 is disposed in the through hole 341 and the mounting hole 311
  • the ceramic base 35 has a receiving cavity 351 and two middle ring brackets 332.
  • the two outer ring support legs 3331 of the middle ring support leg 3321 and the outer ring support 333 are confined in the accommodating cavity 351. In this way, the fixation between the middle ring support 332 and the outer ring 333 is realized.
  • the heat insulation component 34 includes a plurality of stacked heat insulation sheets 34 a, the outer diameter of the heat insulation component 34 ranges from 480 to 500 mm, and the outer diameter of the base plate 31 is smaller than the outer diameter of the heat insulation component 34.
  • this embodiment increases the size of the heat insulation assembly 34 and the outer ring heating wire 323 while keeping the substrate 31 unchanged to adapt to the size change of the tray 10 .
  • the side of the outer ring support portion 3332 of the outer ring bracket 333 away from the two outer ring support legs 3331 includes a flat support surface 3333.
  • the support surface 3333 includes a connected first support surface 3333a and a second support surface 3333b, the first support surface 3333a is set corresponding to the middle area of the two outer ring support legs 3331, the second support surface 3333b protrudes from the first support surface 3333a in the direction away from the center of the outer ring heating wire 323, and the outer ring heating wire 323 Located on the first supporting surface 3333a and the second supporting surface 3333b.
  • this embodiment does not change the positions of the two outer ring support legs 3331, and forms a second support surface 3333b that extends outward to adapt to the outer ring heating wire 323 that moves outward.
  • the position of the support leg 3331 of the outer ring remains unchanged, the position of the ceramic base 35 does not need to be changed, and the positions of the mounting hole 311 and the through hole 341 do not need to be changed, which greatly simplifies the improvement process.
  • the outer ring bracket 333 is integrally formed, and the two outer ring support legs 3331 and the outer ring support portion 3332 are located in the same plane, that is, the outer ring can be formed by bending a linear material in a plane.
  • the ring bracket 333 has simple process and good forming effect.
  • the distance from any point on the supporting surface 3333 to the horizontal plane is equal, that is, the supporting surface 3333 is a plane.
  • the heating device 30 further includes a support portion connected to the substrate 31, the support portion extends to the outer edge of the outer ring heating wire 333, where the support portion can extend and protrude from the upper surface of the outer ring heating wire 333, and the support portion is tight It is arranged by the outer ring heating wire 333.
  • the support portion can abut against the outer ring heating wire 333 to prevent the outer ring heating wire 333 from deforming.
  • the cover body 40 is arranged around the heating device 30.
  • the cover body 40 is a molybdenum cover, and the cover body 40 can protect the heating device 30.
  • the cover body 40 can prevent impurities generated by the reaction from entering the bottom of the heating device 30.
  • the cover body 40 The blocking effect can stabilize the airflow.
  • the inner diameter of the cover body 40 ranges from 480 mm to 500 mm to adapt to the size change of the heating device 30.
  • the ash collecting ring 50 is provided with a number of vent holes 51, and the growing gas flow and reacted compounds are discharged from the reaction chamber S through the vent holes 51 in the ash collecting ring 50, and residual impurities are retained in the ash collecting ring 50.
  • the cover body 40 is connected to the dust collecting ring 50. At this time, considering that the total height of the cover body 40 and the dust ring 50 needs to meet the design requirements, the height of the cover body 40 can be appropriately reduced compared with the original K465i machine.
  • the magnitude of the decrease is, for example, the height of the dust collecting ring 50.
  • the cover body 40 includes a cover body 41 and an extension part 42 extending outward from the cover body 41.
  • the extension part 42 and the dust collecting ring 50 can be fixed to each other by screws or other fixing members.
  • the vent hole 51 on the ash collecting ring 50 can be appropriately designed to give way.
  • the present invention can greatly increase the production capacity by simply changing the design of several components when the original machine station is not moving as a whole, and has high practicability.

Abstract

An MOCVD reaction device (100), comprising: a carrier plate (10) and a heating device (30) located below the carrier plate (10). The heating device (30) comprises a heating wire assembly (32) and a support assembly (33) supporting the heating wire assembly (32). The heating wire assembly (32) comprises an outer ring heating wire (323) disposed in correspondence with an edge area of the carrier plate (10), and the support assembly (33) comprises a plurality of outer ring supports (333) supporting the outer ring heating wire (323); the outer ring supports (333) comprise two outer ring supporting legs (3331) arranged in parallel and an outer ring supporting portion (3332) connecting the two outer ring supporting legs (3331); the outer ring supporting portion (3332) comprises a flat supporting surface (3333) at a side away from the two outer ring supporting legs (3331), and the supporting surface (3333) comprises a first supporting surface (3333a) and a second supporting surface (3333b) which are connected; the first supporting surface (3333a) is disposed in correspondence with an intermediate area of the two outer ring supporting legs (3331), and the second supporting surface (3333b) protrudes out of the first supporting surface (3333a) in the direction away from the center of the outer ring heating wire (323); and the outer ring heating wire (323) is located on the first supporting surface (3333a) and the second supporting surface (3333b).

Description

MOCVD反应装置MOCVD reactor
本申请要求了申请日为2019年05月08日,申请号为201910380483.5,发明名称为“MOCVD反应装置”的中国专利申请的优先权,其全部内容通过引用结合在本申请中。This application claims the priority of the Chinese patent application whose application date is May 08, 2019, application number is 201910380483.5, and invention title is "MOCVD reaction device", the entire content of which is incorporated into this application by reference.
技术领域Technical field
本发明涉及气相沉积领域,尤其涉及一种MOCVD反应装置。The invention relates to the field of vapor deposition, in particular to a MOCVD reaction device.
背景技术Background technique
MOCVD(Metal-Organic Chemical Vapor Deposition,金属有机化合物化学气相沉积)是在气相外延生长(Vapour Phase Epitaxy,VPE)的基础上发展起来的一种新型气相外延生长技术。MOCVD是制备化合物半导体外延材料的核心设备,以Ⅲ族、Ⅱ族元素的有机化合物和V、Ⅵ族元素的氢化物等作为晶体生长源材料,以热分解反应方式在衬底上进行气相外延,主要用于生长各种Ⅲ-V族、Ⅱ-Ⅵ族化合物半导体以及它们的多元固溶体的薄层单晶材料,涵盖了所有常见半导体,有着非常广阔的市场前景。MOCVD (Metal-Organic Chemical Vapor Deposition, metal organic compound chemical vapor deposition) is a new vapor phase epitaxy growth technology developed on the basis of vapor phase epitaxy (VPE). MOCVD is the core equipment for preparing compound semiconductor epitaxial materials. Organic compounds of group III and group II elements and hydrides of group V and VI elements are used as crystal growth source materials to conduct vapor phase epitaxy on the substrate by means of thermal decomposition reaction. It is mainly used for the growth of various Ⅲ-V group, Ⅱ-VI group compound semiconductors and their multiple solid solution thin layer single crystal materials, covering all common semiconductors, and has a very broad market prospect.
现有技术中,例如型号为K465i机台,其包含的载盘尺寸较小,载盘承载的晶圆数量为14*4(即14片4寸晶圆),在当今的市场行情下,虽技术及机台的稳定性、一致性都很成熟,但由于产能低,越来越不能满足市场的需求。In the prior art, for example, the model of the K465i machine has a smaller carrier plate size, and the number of wafers carried by the carrier plate is 14*4 (that is, 14 4-inch wafers). In today's market, although The stability and consistency of technology and machines are mature, but due to low production capacity, it is increasingly unable to meet market demand.
发明内容Summary of the invention
本发明的目的在于提供一种MOCVD反应装置,其可以大大提高产能。The purpose of the present invention is to provide a MOCVD reaction device, which can greatly increase the productivity.
为实现上述发明目的之一,本发明一实施方式提供一种MOCVD反应装置,包括:载盘及位于所述载盘下方的加热装置,所述加热装置包括加热丝组件及支撑所述加热丝组件的支架组件,所述加热丝组件包括对应所述载盘的边缘区域设置的外圈加热丝,所述支架组件包括支撑所述外圈加热丝的若干外圈支架,所述外圈支架包括平行设置的两条外圈支撑脚及连接两条外圈支撑脚的外圈支撑部,所述外圈支撑部远离两条外圈支撑脚的一侧包括呈平面的支撑面,所述支撑面包括相连的第一支撑面及第二支撑面,所述第一支撑面对应两条外圈支撑脚的中间区域设置,所述第二支撑面朝远离所述外圈加热丝的中心方向凸伸出所述第一支撑面,且所述外圈加热丝位于所述第一支撑面及所述第二支撑面上。In order to achieve one of the above-mentioned objects of the invention, an embodiment of the present invention provides a MOCVD reaction device, comprising: a carrier plate and a heating device located below the carrier plate, the heating device comprising a heating wire assembly and supporting the heating wire assembly The bracket assembly, the heating wire assembly includes an outer ring heating wire set corresponding to the edge area of the carrier plate, the bracket assembly includes a plurality of outer ring brackets supporting the outer ring heating wire, the outer ring bracket includes parallel Two outer ring support feet are provided and an outer ring support portion connecting the two outer ring support feet. The side of the outer ring support portion away from the two outer ring support feet includes a flat support surface, and the support surface includes The first supporting surface and the second supporting surface are connected, the first supporting surface is corresponding to the middle area of the two outer ring supporting feet, and the second supporting surface protrudes away from the center of the outer ring heating wire The first supporting surface exits, and the outer ring heating wire is located on the first supporting surface and the second supporting surface.
作为本发明一实施方式的进一步改进,所述载盘呈圆形,所述载盘的直径范围为480~500mm,所述外圈加热丝的外径范围为480~500mm。As a further improvement of an embodiment of the present invention, the carrier disk is circular, the diameter of the carrier disk ranges from 480 to 500 mm, and the outer diameter of the outer ring heating wire ranges from 480 to 500 mm.
作为本发明一实施方式的进一步改进,所述外圈支架一体成型,且两条外圈支撑脚及所述外 圈支撑部位于同一平面内。As a further improvement of an embodiment of the present invention, the outer ring bracket is integrally formed, and the two outer ring support legs and the outer ring support portion are located in the same plane.
作为本发明一实施方式的进一步改进,所述支撑面上任意一点至水平面的距离均相等。As a further improvement of an embodiment of the present invention, the distance from any point on the supporting surface to the horizontal plane is equal.
作为本发明一实施方式的进一步改进,所述加热装置还包括基板、位于所述基板及所述加热丝组件之间的隔热组件及陶瓷基座,所述基板包括安装孔,所述隔热组件包括贯穿孔,所述陶瓷基座设置于所述贯穿孔及所述安装孔内,且所述陶瓷基座具有容纳腔,所述外圈支架的两条外圈支撑脚限位于所述容纳腔内。As a further improvement of an embodiment of the present invention, the heating device further includes a substrate, a thermal insulation component and a ceramic base located between the substrate and the heating wire component, the substrate includes a mounting hole, and the thermal insulation The assembly includes a through hole, the ceramic base is disposed in the through hole and the mounting hole, and the ceramic base has a accommodating cavity, and the two outer ring support legs of the outer ring bracket are limited in the accommodating Cavity.
作为本发明一实施方式的进一步改进,所述隔热组件包括若干叠置的隔热片,所述隔热组件的外径范围为480~500mm,所述基板的外径小于所述隔热组件的外径。As a further improvement of an embodiment of the present invention, the thermal insulation component includes a plurality of stacked thermal insulation sheets, the outer diameter of the thermal insulation component ranges from 480 to 500 mm, and the outer diameter of the substrate is smaller than that of the thermal insulation component的OD。
作为本发明一实施方式的进一步改进,所述加热装置还包括连接所述基板的支撑部,所述支撑部延伸至所述外圈加热丝的外侧缘处。As a further improvement of an embodiment of the present invention, the heating device further includes a support portion connected to the substrate, and the support portion extends to the outer edge of the outer ring heating wire.
作为本发明一实施方式的进一步改进,所述MOCVD反应装置还包括环绕所述加热装置设置的罩体,所述罩体的内径范围为480~500mm。As a further improvement of an embodiment of the present invention, the MOCVD reaction device further includes a cover provided around the heating device, and the inner diameter of the cover is in the range of 480 to 500 mm.
作为本发明一实施方式的进一步改进,所述MOCVD反应装置还包括集灰环,所述罩体连接所述集灰环,所述集灰环上设置有若干排气孔。As a further improvement of an embodiment of the present invention, the MOCVD reaction device further includes an ash collecting ring, the cover body is connected to the ash collecting ring, and a plurality of exhaust holes are provided on the ash collecting ring.
作为本发明一实施方式的进一步改进,所述MOCVD反应装置还包括呈中空环状的挡板,所述挡板的侧壁的上端面具有第一宽度,所述第一宽度的取值范围为16.9~26.9mm。As a further improvement of an embodiment of the present invention, the MOCVD reaction device further includes a baffle in a hollow ring shape, the upper end surface of the side wall of the baffle has a first width, and the value range of the first width is 16.9~26.9mm.
与现有技术相比,本发明的有益效果在于:本发明一实施方式在原有机台整体不动的情况下,简单改变几个部件的设计便可大大提高产能,实用性高。Compared with the prior art, the beneficial effect of the present invention is that in an embodiment of the present invention, when the original machine station is not moving, simply changing the design of several components can greatly increase the production capacity and have high practicability.
附图说明Description of the drawings
图1是本发明一实施方式的MOCVD反应装置示意图;Fig. 1 is a schematic diagram of a MOCVD reaction apparatus according to an embodiment of the present invention;
图2是本发明一实施方式的挡板示意图;2 is a schematic diagram of a baffle according to an embodiment of the present invention;
图3是图2中A-A区域对应现有技术的剖视图;3 is a cross-sectional view of the area A-A in FIG. 2 corresponding to the prior art;
图4是图2中A-A区域对应本发明一实施方式的剖视图;4 is a cross-sectional view of the area A-A in FIG. 2 corresponding to an embodiment of the present invention;
图5是本发明一实施方式的加热装置立体图;Figure 5 is a perspective view of a heating device according to an embodiment of the present invention;
图6是本发明一实施方式的加热装置俯视图;Figure 6 is a top view of a heating device according to an embodiment of the present invention;
图7是本发明一实施方式的加热装置侧视图;Figure 7 is a side view of a heating device according to an embodiment of the present invention;
图8是本发明一实施方式的中圈支架示意图;Fig. 8 is a schematic diagram of a middle ring bracket according to an embodiment of the present invention;
图9是本发明一实施方式的外圈支架示意图;Figure 9 is a schematic diagram of an outer ring bracket according to an embodiment of the present invention;
图10是本发明一实施方式的罩体及集灰环配合示意图;FIG. 10 is a schematic diagram of the cooperation between the cover body and the dust collecting ring according to an embodiment of the present invention;
图11是本发明一实施方式的罩体示意图。Fig. 11 is a schematic diagram of a cover according to an embodiment of the present invention.
具体实施方式Detailed ways
以下将结合附图所示的具体实施方式对本发明进行详细描述。但这些实施方式并不限制本发明,本领域的普通技术人员根据这些实施方式所做出的结构、方法、或功能上的变换均包含在本发明的保护范围内。The present invention will be described in detail below in conjunction with the specific embodiments shown in the drawings. However, these embodiments do not limit the present invention, and the structural, method, or functional changes made by those skilled in the art based on these embodiments are all included in the protection scope of the present invention.
本申请的各个图示中,为了便于图示,结构或部分的某些尺寸会相对于其它结构或部分夸大,因此,仅用于图示本申请的主题的基本结构。In each figure of the present application, for the convenience of illustration, some dimensions of the structure or part will be exaggerated relative to other structures or parts, therefore, they are only used to illustrate the basic structure of the subject of the present application.
另外,本文使用的例如“上”、“上方”、“下”、“下方”等表示空间相对位置的术语是出于便于说明的目的来描述如附图中所示的一个单元或特征相对于另一个单元或特征的关系。空间相对位置的术语可以旨在包括设备在使用或工作中除了图中所示方位以外的不同方位。例如,如果将图中的设备翻转,则被描述为位于其他单元或特征“下方”或“之下”的单元将位于其他单元或特征“上方”。因此,示例性术语“下方”可以囊括上方和下方这两种方位。设备可以以其他方式被定向(旋转90度或其他朝向),并相应地解释本文使用的与空间相关的描述语。In addition, terms such as "upper", "above", "below", "below" and the like used herein to indicate a relative position in space are for the purpose of facilitating description to describe a unit or feature shown in the drawings relative to The relationship of another unit or feature. The term of the relative position in space may be intended to include different orientations of the device in use or operation other than those shown in the figures. For example, if the device in the figure is turned over, the unit described as being "below" or "below" other units or features will be "above" the other units or features. Therefore, the exemplary term "below" can encompass both above and below orientations. The device can be oriented in other ways (rotated by 90 degrees or other orientations), and the space-related descriptors used herein are explained accordingly.
结合图1,为本发明一实施方式的MOCVD反应装置100的示意图。With reference to FIG. 1, it is a schematic diagram of a MOCVD reaction apparatus 100 according to an embodiment of the present invention.
MOCVD反应装置100包括载盘10、挡板20、加热装置30、罩体40及集灰环50等。The MOCVD reaction device 100 includes a tray 10, a baffle 20, a heating device 30, a cover 40, an ash collecting ring 50, and the like.
在本实施方式中,载盘10位于MOCVD反应装置100的反应腔S内,载盘10为石墨压制形成的石墨大盘,载盘10上形成有承载晶圆的若干承载腔101。In this embodiment, the carrier plate 10 is located in the reaction chamber S of the MOCVD reaction device 100, the carrier plate 10 is a large graphite plate formed by graphite pressing, and a plurality of carrier cavities 101 for carrying wafers are formed on the carrier plate 10.
这里,载盘10呈圆形,载盘10的直径范围为480~500mm,此时,载盘10可在原有K465i机台产量的基础上增加1~5片产量,使得单腔产出的产能增大,在本实施方式中,此时的载盘10可承载16片4寸晶圆。Here, the carrier plate 10 is circular, and the diameter of the carrier plate 10 ranges from 480 to 500 mm. At this time, the carrier plate 10 can increase the output of 1 to 5 pieces on the basis of the original K465i machine output, so that the single cavity output capacity Increase, in this embodiment, the tray 10 at this time can carry 16 4-inch wafers.
需要说明的是,本实施方式的MOCVD反应装置100可以是现有的K465i机台(或者是K300、K465等),在原有机台整体不动的基础上,通过改变部分部件便可以实现产能的提高,例如,此时载盘10的直径由原来的465mm变更为480~500mm,在工艺程序时间相差不大的情况下,单腔产出的产能增大,其他部件的改变可参考下述说明。It should be noted that the MOCVD reactor 100 of this embodiment can be an existing K465i machine (or K300, K465, etc.). On the basis of the original organic machine as a whole, the production capacity can be increased by changing some parts. For example, at this time, the diameter of the carrier 10 is changed from the original 465mm to 480-500mm. Under the condition that the process time is not much different, the output capacity of the single cavity is increased. For the change of other components, please refer to the following description.
另外,载盘10的中心固定于驱动轴60上以实现载盘10的旋转,MOCVD反应装置100还包括源供给系统70等结构,源供给系统70用于为反应腔S提供反应气体,载盘10旋转可使得反应气体均匀沉积在各个晶圆上。In addition, the center of the tray 10 is fixed on the drive shaft 60 to realize the rotation of the tray 10. The MOCVD reaction apparatus 100 also includes a source supply system 70 and other structures. The source supply system 70 is used to provide reaction gas to the reaction chamber S. 10 rotation can make the reaction gas evenly deposited on each wafer.
在本实施方式中,挡板20呈中空环状,且挡板20环绕载盘10设置,挡板20能够上下移动,从而能够充分的满足MOCVD自动化生产的要求。In this embodiment, the baffle 20 is in a hollow ring shape, and the baffle 20 is arranged around the tray 10, and the baffle 20 can move up and down, so as to fully meet the requirements of MOCVD automated production.
在MOCVD设计中,其最重要的部分在于反应腔S内部流场及热场的设计,只有设计最合适的流场及热场才能使反应腔S内部的反应过程平稳进行,提高反应物源材料的利用率,并提高 沉积薄膜的质量,在垂直式MOCVD中,设置于载盘10旁边的挡板20显得尤其重要,其直接影响载盘10上方的流场分布,并且由于该挡板20离载盘10很近,其对载盘10表面的温场分布也具有一定程度的影响,挡板20可在生长过程中为反应腔S提供一个环绕型稳定的空间,气流经过反应腔S不会有气流乱串的现象发生。In the MOCVD design, the most important part is the design of the flow field and thermal field inside the reaction chamber S. Only the most suitable design of the flow field and thermal field can make the reaction process inside the reaction chamber S proceed smoothly and improve the source material of the reactants. In the vertical MOCVD, the baffle 20 arranged next to the carrier plate 10 is particularly important, which directly affects the flow field distribution above the carrier plate 10, and because the baffle plate 20 is separated The carrier plate 10 is very close, which also has a certain degree of influence on the temperature field distribution on the surface of the carrier plate 10. The baffle plate 20 can provide a surrounding stable space for the reaction chamber S during the growth process. The phenomenon of chaotic airflow occurs.
结合图2,为挡板20的示意图。In conjunction with FIG. 2, it is a schematic diagram of the baffle 20.
挡板20包括挡板本体21及输送管道22,挡板本体21内具有冷却水腔体,输送管道22输送冷却水至冷却水腔体内,如此,挡板20本身的温度可以大大降低。The baffle 20 includes a baffle body 21 and a conveying pipe 22. The baffle body 21 has a cooling water cavity, and the conveying pipe 22 conveys cooling water to the cooling water cavity. In this way, the temperature of the baffle 20 itself can be greatly reduced.
这里,由于在实际的反应过程中,载盘10温度极高,温度较低的挡板20可以实现较佳的隔热效果,而且,可以防止反应腔S高温影响邻近设置的其他部件(例如密封圈、传盘口、观察窗口等),另外,反应产生的杂质可以沉积在温度较低的挡板本体21侧壁上,后续清理挡板本体21即可。Here, since the temperature of the tray 10 is extremely high during the actual reaction process, the baffle 20 with a lower temperature can achieve a better heat insulation effect, and can prevent the high temperature of the reaction chamber S from affecting other components (such as sealing In addition, the impurities generated by the reaction can be deposited on the side wall of the baffle body 21 with a lower temperature, and the baffle body 21 can be cleaned later.
结合图3及图4,图3、图4为图2中A-A的剖面图,图3对应K465i机台原有的挡板,图4对应本实施方式对应的挡板20,为了便于说明,相同的部件采用相同的名称。With reference to Figures 3 and 4, Figures 3 and 4 are cross-sectional views of AA in Figure 2. Figure 3 corresponds to the original baffle plate of the K465i machine, and Figure 4 corresponds to the baffle plate 20 of this embodiment. For ease of description, the same The parts have the same name.
可以看到,在图3中,原有挡板的挡板本体21’的侧壁的上端面具有第一宽度L1’,第一宽度L1’=34.4mm,下端面具有第二宽度L2’=24.8mm,在图4中,本实施方式的挡板20的挡板本体21的侧壁的上端面具有第一宽度L1,第一宽度L1的取值范围为16.9~26.9mm(34.4-[(500-465)/2]≤L1≤34.4-[(480-465)/2]),同理,下端面的第二宽度L2与第一宽度L1同比变化。It can be seen that in Figure 3, the upper end surface of the side wall of the baffle body 21' of the original baffle has a first width L1', the first width L1'=34.4mm, and the lower end surface has a second width L2'= 24.8mm, in Fig. 4, the upper end surface of the side wall of the baffle body 21 of the baffle 20 of this embodiment has a first width L1, and the value range of the first width L1 is 16.9-26.9mm (34.4-[( 500-465)/2]≤L1≤34.4-[(480-465)/2]), in the same way, the second width L2 of the lower end surface changes year-on-year with the first width L1.
也就是说,为了适应尺寸变大的载盘10,在保证挡板本体21外径不变的情况下,对挡板本体21的侧壁进行减薄处理,以使得挡板本体21与载盘10之间仍可以保证有合适的间隙,如此,挡板本体21的其他部分以及与挡板本体21连接的其他部件均不需要做改变,大大简化了改进工艺。That is to say, in order to adapt to the larger size of the tray 10, the side wall of the baffle body 21 is thinned under the condition that the outer diameter of the baffle body 21 remains unchanged, so that the baffle body 21 and the tray A proper gap can still be ensured between 10, so other parts of the baffle body 21 and other parts connected to the baffle body 21 do not need to be changed, which greatly simplifies the improvement process.
在本实施方式中,加热装置30位于载盘10下方,加热装置30用于为载盘10加热以使得载盘10保持在外延生长温度范围内,从而实现薄膜的成型,目前,普遍采用的加热方式是辐射加热,依靠加热装置30的热辐射使载盘10升温。In this embodiment, the heating device 30 is located below the carrier plate 10, and the heating device 30 is used to heat the carrier plate 10 to keep the carrier plate 10 within the epitaxial growth temperature range, thereby realizing the formation of the film. At present, heating is commonly used The method is radiant heating, and the temperature of the tray 10 is raised by the heat radiation of the heating device 30.
结合图5至图7,加热装置30包括基板31、位于基板31上方的加热丝组件32、支撑加热丝组件32的支架组件33、位于基板31及加热丝组件32之间的隔热组件34及陶瓷基座35,驱动轴60穿过加热装置30而连接至载盘10。With reference to Figures 5 to 7, the heating device 30 includes a substrate 31, a heating wire assembly 32 located above the substrate 31, a support assembly 33 supporting the heating wire assembly 32, a heat insulation assembly 34 located between the substrate 31 and the heating wire assembly 32, and The ceramic base 35 and the drive shaft 60 pass through the heating device 30 to be connected to the tray 10.
加热丝组件32大致呈圆盘状,由加热丝组件32中心朝向外缘的方向上,加热丝组件32依次包括内圈加热丝321、中圈加热丝322及外圈加热丝323。The heating wire assembly 32 is substantially in the shape of a disk, and in the direction from the center of the heating wire assembly 32 to the outer edge, the heating wire assembly 32 includes an inner ring heating wire 321, a middle ring heating wire 322 and an outer ring heating wire 323 in sequence.
这里,内圈加热丝321邻近且环绕驱动轴60设置,内圈加热丝321可以是环状金属片,中 圈加热丝322为螺旋环状结构,中圈加热丝322环绕内圈加热丝321设置,外圈加热丝323为一圈环状结构,外圈加热丝323环绕中圈加热丝322设置,且外圈加热丝323对应载盘10的边缘区域设置,外圈加热丝的外径范围为480~500mm,如此,可适配载盘10的变化,使得加热丝组件32仍可以均匀且全面加热载盘10。Here, the inner ring heating wire 321 is arranged adjacent to and surrounding the drive shaft 60, the inner ring heating wire 321 may be a ring-shaped metal sheet, the middle ring heating wire 322 has a spiral ring structure, and the middle ring heating wire 322 is arranged around the inner ring heating wire 321 , The outer ring heating wire 323 is a ring structure, the outer ring heating wire 323 is arranged around the middle ring heating wire 322, and the outer ring heating wire 323 is arranged corresponding to the edge area of the carrier plate 10, and the outer diameter range of the outer ring heating wire is 480-500mm, in this way, it can adapt to the change of the tray 10, so that the heating wire assembly 32 can still heat the tray 10 uniformly and fully.
相较于原有的K465i机台,本实施方式在保持内圈加热丝321、中圈加热丝322位置及大小不变的情况下,加大外圈加热丝323的尺寸(外圈加热丝323原来的外径大致为465mm)。Compared with the original K465i machine, this embodiment increases the size of the outer ring heating wire 323 while keeping the position and size of the inner ring heating wire 321 and the middle ring heating wire 322 unchanged (outer ring heating wire 323 The original outer diameter is approximately 465mm).
具体的,本实施方式加大了外圈加热丝323的外径及内径,而外圈加热丝323的内圈侧壁及外圈侧壁之间的间距保持不变,也就是说,此时仅是将外圈加热丝323放大,外圈加热丝323的宽度并没有改变,外圈加热丝323与中圈加热丝322之间的间隙也相应的变大,且间隙的变化幅度同比于外圈加热丝323的变化幅度,再换句话说,相较于原有的K465i机台,本实施方式的外圈加热丝323外移以适配尺寸变大的载盘10。Specifically, this embodiment increases the outer diameter and inner diameter of the outer ring heating wire 323, and the distance between the inner ring side wall and the outer ring side wall of the outer ring heating wire 323 remains unchanged, that is, at this time Only the outer ring heating wire 323 is enlarged, the width of the outer ring heating wire 323 does not change, and the gap between the outer ring heating wire 323 and the middle ring heating wire 322 is correspondingly larger, and the change range of the gap is higher than that of the outer ring. The variation range of the loop heating wire 323, in other words, compared with the original K465i machine, the outer loop heating wire 323 of this embodiment is moved outward to fit the carrier plate 10 with a larger size.
加热丝组件32还包括加热丝电极,例如外圈加热丝电极323a、中圈加热丝电极322a等,通过加热丝电极可给对应的加热丝供电以使得对应的加热丝产生热量。The heating wire assembly 32 also includes heating wire electrodes, such as outer heating wire electrodes 323a, middle heating wire electrodes 322a, etc., through which the corresponding heating wires can be powered so that the corresponding heating wires generate heat.
支架组件33包括支撑中圈加热丝322的若干中圈支架332及支撑外圈加热丝323的若干外圈支架333。The bracket assembly 33 includes a plurality of middle ring brackets 332 supporting the middle ring heating wire 322 and a plurality of outer ring brackets 333 supporting the outer ring heating wire 323.
这里,结合图8,中圈支架332大致呈“门”字型,中圈支架332包括平行设置的两条中圈支撑脚3321及连接两条中圈支撑脚3321的中圈支撑部3322,中圈支撑部3322垂直于两条中圈支撑脚3321,若干中圈支架332环绕形成若干圈以支撑中圈加热丝322。Here, in conjunction with Figure 8, the middle ring bracket 332 is roughly in the shape of a "door". The middle ring bracket 332 includes two middle ring support legs 3321 arranged in parallel and a middle ring support portion 3322 connecting the two middle ring support legs 3321. The ring support portion 3322 is perpendicular to the two center ring support feet 3321, and a plurality of center ring supports 332 surround the center ring to support the center ring heating wire 322.
结合图9,外圈支架333包括平行设置的两条外圈支撑脚3331及连接两条外圈支撑脚3331的外圈支撑部3332,若干外圈支架333环绕形成一圈以支撑外圈加热丝323。With reference to Figure 9, the outer ring support 333 includes two outer ring support legs 3331 arranged in parallel and an outer ring support portion 3332 connecting the two outer ring support legs 3331. A plurality of outer ring supports 333 surround and form a circle to support the outer ring heating wire 323.
这里,基板31包括安装孔311,隔热组件34包括贯穿孔341,陶瓷基座35设置于贯穿孔341及安装孔311内,且陶瓷基座35具有容纳腔351,中圈支架332的两条中圈支撑脚3321及外圈支架333的两条外圈支撑脚3331限位于容纳腔351内,如此,便实现了中圈支架332及外圈之间333的固定。Here, the base plate 31 includes a mounting hole 311, the heat insulation component 34 includes a through hole 341, the ceramic base 35 is disposed in the through hole 341 and the mounting hole 311, and the ceramic base 35 has a receiving cavity 351 and two middle ring brackets 332. The two outer ring support legs 3331 of the middle ring support leg 3321 and the outer ring support 333 are confined in the accommodating cavity 351. In this way, the fixation between the middle ring support 332 and the outer ring 333 is realized.
隔热组件34包括若干叠置的隔热片34a,隔热组件34的外径范围为480~500mm,基板31的外径小于隔热组件34的外径。The heat insulation component 34 includes a plurality of stacked heat insulation sheets 34 a, the outer diameter of the heat insulation component 34 ranges from 480 to 500 mm, and the outer diameter of the base plate 31 is smaller than the outer diameter of the heat insulation component 34.
也就是说,相较于原有的K465i机台,本实施方式保持基板31不变的情况下,加大了隔热组件34及外圈加热丝323的尺寸,以适应载盘10的尺寸变化。That is to say, compared with the original K465i machine, this embodiment increases the size of the heat insulation assembly 34 and the outer ring heating wire 323 while keeping the substrate 31 unchanged to adapt to the size change of the tray 10 .
需要说明的是,基板31处连接有很多部件,例如,连通加热丝电极的供电部件、各类支架等等,基板31不改变,那么连接基板31的很多部件也不需要做改变,大大简化了改进工艺。It should be noted that there are many components connected to the substrate 31, such as power supply components connected to the heating wire electrodes, various supports, etc., and the substrate 31 does not change, so many components connected to the substrate 31 do not need to be changed, which is greatly simplified. Improve the process.
继续结合图9,外圈支架333的外圈支撑部3332远离两条外圈支撑脚3331的一侧包括呈平 面的支撑面3333,支撑面3333包括相连的第一支撑面3333a及第二支撑面3333b,第一支撑面3333a对应两条外圈支撑脚3331的中间区域设置,第二支撑面3333b朝远离外圈加热丝323的中心方向凸伸出第一支撑面3333a,且外圈加热丝323位于第一支撑面3333a及第二支撑面3333b上。Continuing with FIG. 9, the side of the outer ring support portion 3332 of the outer ring bracket 333 away from the two outer ring support legs 3331 includes a flat support surface 3333. The support surface 3333 includes a connected first support surface 3333a and a second support surface 3333b, the first support surface 3333a is set corresponding to the middle area of the two outer ring support legs 3331, the second support surface 3333b protrudes from the first support surface 3333a in the direction away from the center of the outer ring heating wire 323, and the outer ring heating wire 323 Located on the first supporting surface 3333a and the second supporting surface 3333b.
也就是说,本实施方式在不改变两条外圈支撑脚3331的位置的基础上,通过形成向外延伸的第二支撑面3333b来适应外移的外圈加热丝323,此时,由于两条外圈支撑脚3331的位置不变,陶瓷基座35的位置也无需改变,安装孔311及贯穿孔341的位置也无需改变,大大简化了改进工艺。That is to say, this embodiment does not change the positions of the two outer ring support legs 3331, and forms a second support surface 3333b that extends outward to adapt to the outer ring heating wire 323 that moves outward. The position of the support leg 3331 of the outer ring remains unchanged, the position of the ceramic base 35 does not need to be changed, and the positions of the mounting hole 311 and the through hole 341 do not need to be changed, which greatly simplifies the improvement process.
具体的,外圈支架333一体成型,且两条外圈支撑脚3331及外圈支撑部3332位于同一平面内,也就是说,可以在一个平面内通过弯折一根直线型材料而形成该外圈支架333,工艺简单,且成型效果好。Specifically, the outer ring bracket 333 is integrally formed, and the two outer ring support legs 3331 and the outer ring support portion 3332 are located in the same plane, that is, the outer ring can be formed by bending a linear material in a plane. The ring bracket 333 has simple process and good forming effect.
这里,第二支撑面3333b与邻近的外圈支撑脚3331之间具有连接部3334,第二支撑面3333b与连接部3334之间的夹角为锐角,但不以此为限。Here, there is a connecting portion 3334 between the second supporting surface 3333b and the adjacent outer ring supporting leg 3331, and the included angle between the second supporting surface 3333b and the connecting portion 3334 is an acute angle, but not limited to this.
本实施方式的支撑面3333上任意一点至水平面的距离均相等,也就是说,支撑面3333为一个平面。In this embodiment, the distance from any point on the supporting surface 3333 to the horizontal plane is equal, that is, the supporting surface 3333 is a plane.
另外,加热装置30还包括连接基板31的支撑部,支撑部延伸至外圈加热丝333的外侧缘处,这里,支撑部可延伸并突出于外圈加热丝333的上表面,且支撑部紧靠外圈加热丝333设置,当外圈加热丝333发生形变时,支撑部可抵靠外圈加热丝333而阻止外圈加热丝333发生形变。In addition, the heating device 30 further includes a support portion connected to the substrate 31, the support portion extends to the outer edge of the outer ring heating wire 333, where the support portion can extend and protrude from the upper surface of the outer ring heating wire 333, and the support portion is tight It is arranged by the outer ring heating wire 333. When the outer ring heating wire 333 is deformed, the support portion can abut against the outer ring heating wire 333 to prevent the outer ring heating wire 333 from deforming.
在本实施方式中,罩体40环绕加热装置30设置。In this embodiment, the cover body 40 is arranged around the heating device 30.
这里,罩体40为钼罩,罩体40可以起到保护加热装置30的作用,罩体40可以避免反应产生的杂质进入加热装置30的底部,当有气流通入时,由于罩体40的阻挡作用,可以稳定气流。Here, the cover body 40 is a molybdenum cover, and the cover body 40 can protect the heating device 30. The cover body 40 can prevent impurities generated by the reaction from entering the bottom of the heating device 30. When there is airflow, the cover body 40 The blocking effect can stabilize the airflow.
罩体40的内径范围为480~500mm,以适应加热装置30的尺寸变化。The inner diameter of the cover body 40 ranges from 480 mm to 500 mm to adapt to the size change of the heating device 30.
结合图10,集灰环50上设置有若干排气孔51,生长的气流及反应后的化合物通过集灰环50中排气孔51排出反应腔S,残留杂质滞留在集灰环50内。10, the ash collecting ring 50 is provided with a number of vent holes 51, and the growing gas flow and reacted compounds are discharged from the reaction chamber S through the vent holes 51 in the ash collecting ring 50, and residual impurities are retained in the ash collecting ring 50.
罩体40连接集灰环50,此时,考虑到罩体40及集灰环50的总高度需要满足设计要求,相较于原有的K465i机台,罩体40的高度可适当减小,减小的幅度例如为集灰环50的高度。The cover body 40 is connected to the dust collecting ring 50. At this time, considering that the total height of the cover body 40 and the dust ring 50 needs to meet the design requirements, the height of the cover body 40 can be appropriately reduced compared with the original K465i machine. The magnitude of the decrease is, for example, the height of the dust collecting ring 50.
这里,结合图11,罩体40包括罩体本体41及向外延伸出罩体本体41的外延部42,可通过螺丝或其他固定件将外延部42与集灰环50相互固定,此时,集灰环50上的排气孔51可做适当的让位设计。Here, with reference to Fig. 11, the cover body 40 includes a cover body 41 and an extension part 42 extending outward from the cover body 41. The extension part 42 and the dust collecting ring 50 can be fixed to each other by screws or other fixing members. At this time, The vent hole 51 on the ash collecting ring 50 can be appropriately designed to give way.
综上所述,本发明在原有机台整体不动的情况下,简单改变几个部件的设计便可大大提高产能,实用性高。In summary, the present invention can greatly increase the production capacity by simply changing the design of several components when the original machine station is not moving as a whole, and has high practicability.
应当理解,虽然本说明书按照实施方式加以描述,但并非每个实施方式仅包含一个独立的技术方案,说明书的这种叙述方式仅仅是为清楚起见,本领域技术人员应当将说明书作为一个整体,各实施方式中的技术方案也可以经适当组合,形成本领域技术人员可以理解的其他实施方式。It should be understood that although this specification is described in accordance with the implementation manners, not each implementation manner only includes an independent technical solution. This narration in the specification is only for clarity, and those skilled in the art should regard the specification as a whole. The technical solutions in the embodiments can also be appropriately combined to form other embodiments that can be understood by those skilled in the art.
上文所列出的一系列的详细说明仅仅是针对本发明的可行性实施方式的具体说明,它们并非用以限制本发明的保护范围,凡未脱离本发明技艺精神所作的等效实施方式或变更均应包含在本发明的保护范围之内。The series of detailed descriptions listed above are only specific descriptions of feasible implementations of the present invention. They are not intended to limit the scope of protection of the present invention. Any equivalent implementations or implementations made without departing from the technical spirit of the present invention All changes shall be included in the protection scope of the present invention.

Claims (10)

  1. 一种MOCVD反应装置,其特征在于,包括:载盘及位于所述载盘下方的加热装置,所述加热装置包括加热丝组件及支撑所述加热丝组件的支架组件,所述加热丝组件包括对应所述载盘的边缘区域设置的外圈加热丝,所述支架组件包括支撑所述外圈加热丝的若干外圈支架,所述外圈支架包括平行设置的两条外圈支撑脚及连接两条外圈支撑脚的外圈支撑部,所述外圈支撑部远离两条外圈支撑脚的一侧包括呈平面的支撑面,所述支撑面包括相连的第一支撑面及第二支撑面,所述第一支撑面对应两条外圈支撑脚的中间区域设置,所述第二支撑面朝远离所述外圈加热丝的中心方向凸伸出所述第一支撑面,且所述外圈加热丝位于所述第一支撑面及所述第二支撑面上。A MOCVD reaction device, characterized by comprising: a carrier plate and a heating device located below the carrier plate, the heating device comprising a heating wire assembly and a bracket assembly supporting the heating wire assembly, the heating wire assembly comprising Corresponding to the outer ring heating wire provided in the edge area of the carrier plate, the bracket assembly includes a plurality of outer ring brackets supporting the outer ring heating wire, and the outer ring bracket includes two outer ring support legs arranged in parallel and a connection The outer ring support portion of the two outer ring support feet, the side of the outer ring support portion away from the two outer ring support feet includes a flat support surface, and the support surface includes a first support surface and a second support that are connected The first support surface is set corresponding to the middle area of the two outer ring support legs, the second support surface protrudes from the first support surface in a direction away from the center of the outer ring heating wire, and The outer ring heating wire is located on the first supporting surface and the second supporting surface.
  2. 根据权利要求1所述的MOCVD反应装置,其特征在于,所述载盘呈圆形,所述载盘的直径范围为480~500mm,所述外圈加热丝的外径范围为480~500mm。The MOCVD reactor according to claim 1, wherein the carrier disk is circular, the diameter of the carrier disk ranges from 480 to 500 mm, and the outer diameter of the outer ring heating wire ranges from 480 to 500 mm.
  3. 根据权利要求1所述的MOCVD反应装置,其特征在于,所述外圈支架一体成型,且两条外圈支撑脚及所述外圈支撑部位于同一平面内。The MOCVD reactor according to claim 1, wherein the outer ring support is integrally formed, and the two outer ring support legs and the outer ring support portion are located in the same plane.
  4. 根据权利要求1所述的MOCVD反应装置,其特征在于,所述支撑面上任意一点至水平面的距离均相等。The MOCVD reaction device according to claim 1, wherein the distance from any point on the supporting surface to the horizontal plane is equal.
  5. 根据权利要求1所述的MOCVD反应装置,其特征在于,所述加热装置还包括基板、位于所述基板及所述加热丝组件之间的隔热组件及陶瓷基座,所述基板包括安装孔,所述隔热组件包括贯穿孔,所述陶瓷基座设置于所述贯穿孔及所述安装孔内,且所述陶瓷基座具有容纳腔,所述外圈支架的两条外圈支撑脚限位于所述容纳腔内。The MOCVD reaction device according to claim 1, wherein the heating device further comprises a substrate, an insulation component and a ceramic base located between the substrate and the heating wire assembly, and the substrate includes a mounting hole , The heat insulation component includes a through hole, the ceramic base is disposed in the through hole and the mounting hole, and the ceramic base has a accommodating cavity, and two outer ring support legs of the outer ring bracket It is limited to the containing cavity.
  6. 根据权利要求5所述的MOCVD反应装置,其特征在于,所述隔热组件包括若干叠置的隔热片,所述隔热组件的外径范围为480~500mm,所述基板的外径小于所述隔热组件的外径。The MOCVD reaction device according to claim 5, wherein the thermal insulation component comprises a plurality of stacked thermal insulation sheets, the outer diameter of the thermal insulation component ranges from 480 to 500 mm, and the outer diameter of the substrate is smaller than The outer diameter of the thermal insulation component.
  7. 根据权利要求5所述的MOCVD反应装置,其特征在于,所述加热装置还包括连接所述基板的支撑部,所述支撑部延伸至所述外圈加热丝的外侧缘处。The MOCVD reaction device according to claim 5, wherein the heating device further comprises a support portion connected to the substrate, the support portion extending to the outer edge of the outer ring heating wire.
  8. 根据权利要求1所述的MOCVD反应装置,其特征在于,所述MOCVD反应装置还包括环绕所述加热装置设置的罩体,所述罩体的内径范围为480~500mm。The MOCVD reaction device according to claim 1, wherein the MOCVD reaction device further comprises a cover body arranged around the heating device, and the inner diameter of the cover body ranges from 480 to 500 mm.
  9. 根据权利要求8所述的MOCVD反应装置,其特征在于,所述MOCVD反应装置还包括集灰环,所述罩体连接所述集灰环,所述集灰环上设置有若干排气孔。8. The MOCVD reaction device according to claim 8, wherein the MOCVD reaction device further comprises an ash collecting ring, the cover is connected to the ash collecting ring, and a plurality of exhaust holes are provided on the ash collecting ring.
  10. 根据权利要求1所述的MOCVD反应装置,其特征在于,所述MOCVD反应装置还包括呈中空环状的挡板,所述挡板的侧壁的上端面具有第一宽度,所述第一宽度的取值范围为16.9~26.9mm。The MOCVD reaction device according to claim 1, wherein the MOCVD reaction device further comprises a baffle in a hollow ring shape, the upper end surface of the side wall of the baffle has a first width, and the first width The value range of is 16.9~26.9mm.
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CN114959659A (en) * 2022-03-31 2022-08-30 松山湖材料实验室 Heating device for sample heating

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