WO2020199236A1 - Metal deposition method combining microelectromachinery and casting - Google Patents
Metal deposition method combining microelectromachinery and casting Download PDFInfo
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- WO2020199236A1 WO2020199236A1 PCT/CN2019/082027 CN2019082027W WO2020199236A1 WO 2020199236 A1 WO2020199236 A1 WO 2020199236A1 CN 2019082027 W CN2019082027 W CN 2019082027W WO 2020199236 A1 WO2020199236 A1 WO 2020199236A1
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B22—CASTING; POWDER METALLURGY
- B22D—CASTING OF METALS; CASTING OF OTHER SUBSTANCES BY THE SAME PROCESSES OR DEVICES
- B22D17/00—Pressure die casting or injection die casting, i.e. casting in which the metal is forced into a mould under high pressure
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B22—CASTING; POWDER METALLURGY
- B22D—CASTING OF METALS; CASTING OF OTHER SUBSTANCES BY THE SAME PROCESSES OR DEVICES
- B22D18/00—Pressure casting; Vacuum casting
- B22D18/04—Low pressure casting, i.e. making use of pressures up to a few bars to fill the mould
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B22—CASTING; POWDER METALLURGY
- B22D—CASTING OF METALS; CASTING OF OTHER SUBSTANCES BY THE SAME PROCESSES OR DEVICES
- B22D18/00—Pressure casting; Vacuum casting
- B22D18/06—Vacuum casting, i.e. making use of vacuum to fill the mould
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B22—CASTING; POWDER METALLURGY
- B22D—CASTING OF METALS; CASTING OF OTHER SUBSTANCES BY THE SAME PROCESSES OR DEVICES
- B22D19/00—Casting in, on, or around objects which form part of the product
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
- H01L21/768—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics
Definitions
- the invention belongs to the field of semiconductor or microelectronic manufacturing, and in particular relates to a metal deposition method combining microelectronic machinery and casting.
- the thickness is less than 1um, and evaporation or sputtering can be used. When the thickness is from a few microns to tens or even hundreds of microns, electroplating is required.
- Thick metal layers are widely used in microelectronic devices.
- advanced packaging fields such as flip chip soldering, bumping is used, or TSV (Through-silicon via) and TGV (Through glass via)
- filter structures are used in integrated passive devices, delayers are all thick metal structures, and in the field of MEMS devices, spiral inductors are used.
- the deposition of thick metals mainly depends on electroplating.
- the electroplating filling can be divided into four steps.
- the first step is the deposition of the seed layer, which generally adopts sputtering or evaporation.
- the thickness of the seed layer is generally less than 1 micron.
- the second step is to conduct electroplating deposition in the electroplating solution by adding a field.
- the electroplating process is a very complex electrochemical process.
- the uniformity and yield of electroplating are related to the electric field distribution, the ratio of the electrolyte, and the concentration of inhibitors and accelerators in the electrolyte.
- the filling After the filling is completed, if it is the filling of the via interconnection, because the seed layer is in the hole and the surface, there will be metal plating deposition on the hole and the surface during electroplating.
- the metal plating on the surface needs to pass the third step of chemical mechanical polishing ( CMP).
- CMP chemical mechanical polishing
- the fourth step is to go to the seed layer. Some areas on the electroplated surface do not require electroplating, so they will be covered with glue or other non-conductive materials before electroplating. After the electroplating is completed, the covering and the underlying seed layer also need to be removed.
- Electroplating has the following defects:
- the electroplating filling process is complicated, because the electroplating needs to be realized on the conductive surface, so for silicon wafers, glass wafers and other materials, a seed layer must be deposited in advance, and the seed layer needs to be removed after filling;
- electroplating solution used in electroplating is very toxic and easy to pollute the environment. With the rise of environmental protection awareness, the government now has stricter and stricter control on electroplating production;
- the filling speed of electroplating is not fast, especially for via filling, which usually takes several or even dozens of hours.
- electroless plating is also a method of thick metal deposition.
- the precision of electroless plating is difficult to control, and it also has high selectivity to materials.
- MEMS technology is a micro-processing technology developed from microelectronics technology in recent decades.
- micron-scale mechanical parts By manufacturing micron-scale mechanical parts on silicon wafers or other substrates, functions such as sensing, energy harvesting, and execution can be realized.
- the basic concept of the combination of MEMS and casting is to create a micro-mold that needs to be formed on a silicon wafer (or other material substrate) through a bulk silicon etching process, and then melt the metal to fill it and solidify it.
- the combination of MEMS and casting is not just as simple as replacing the macroscopic mold with the silicon micromold etched by bulk silicon, because the surface effect and temperature effect caused by the shrinking of the casting size by several orders of magnitude, etc., in the silicon micromold Manufacturing, mold clamping, microfluidic filling of molten alloys, volume shrinkage during solidification and demolding cannot be solved by macro casting. Only by introducing related micro-nano effects can the combination of MEMS and casting be realized in a true sense.
- the present invention proposes a metal deposition method combining microelectronic machinery and casting.
- a metal deposition method combining microelectronic machinery and casting includes:
- step S6 it further includes:
- step S2 an air gap is left between the lower cover plate and/or the upper cover plate and the silicon micro-mold.
- the surface of the lower cover plate and/or the upper cover plate is provided with convex points or strip-shaped grooves forming the ventilation gap.
- step S3 the entire sandwich structure is placed on the surface of the molten metal pool.
- Step S3 the liquid metal is filled into the hole and groove structure through the nozzle hole by increasing the pressure difference ⁇ p.
- step S4 the liquid metal in the nozzle hole is cut by reducing the pressure difference ⁇ p.
- step S3 the hole and groove structure is evacuated, and the liquid metal is filled from the nozzle hole into the hole and groove structure in a vacuum environment under the action of external air pressure.
- step S5 cold air is blown to the upper cover plate exposed to the outside.
- nano-molecular layer materials that can reduce the surface energy are deposited on the surfaces of the upper and lower cover plates; for high-temperature alloys, deposited on the surfaces of the upper and lower cover plates A layer of release material.
- the invention realizes the combination of microelectronic machinery and casting, and provides a brand-new metal layering method for thick metal deposition. It utilizes capillary phenomenon and liquid bridge pinch-off phenomenon to realize filling of liquid metal in the hole and groove structure through the nozzle hole.
- the technology avoids the seed layer deposition and chemical mechanical polishing required by the commonly used electroplating filling methods, and uses rapid cooling to increase the number of nuclei during the solidification process to achieve a uniform solidification effect.
- Figure 1 is a flow chart of the thick metal deposition process combining microelectronic machinery and casting of the present invention
- FIG. 2 is a schematic structural diagram of a filling method according to an embodiment of the present invention.
- a metal deposition method combining microelectronics and casting includes the following steps:
- a silicon micro-mold 1 is provided, and a hole structure 5 is provided on the silicon micro-mold 1;
- the silicon micro-mold 1 adopts silicon body processing technology, and there are two main types: deep silicon etching and KOH etching. Among them, deep silicon etching can achieve a higher aspect ratio. Generally, the pattern is determined by photolithography, and the accuracy can be controlled within 1 micron.
- the present invention Compared with macroscopic casting, in addition to replacing the mold with a silicon micro mold 1, the present invention also changes the silicon micro mold 1 into a flat shape.
- This thick metal deposition method can reduce the size of traditional casting to several microns.
- the types of the slot structure 5 include through hole, blind hole and cavity structure.
- the slot structure 5 in FIG. 1 is composed of a plurality of through holes connected together, and the slot structure 5 in FIG. 2 is composed of a single through hole.
- the hole and groove structures 5 are arranged in an array on the silicon micro mold.
- a plurality of nozzle holes 4 are provided on the lower cover plate 3, and the plurality of nozzle holes 4 correspond to a plurality of hole groove structures 5 one by one; further, as shown in FIG. 1, the lower cover plate 3 A nozzle hole 4 is provided, and the metal liquid flows into each interconnected through hole of the silicon micro-mold 1 through the entrance of the hole structure 5.
- An air gap 7 is left between the lower cover plate 3 and/or the upper cover plate 2 and the silicon micro mold 1. Since the ventilation gap 7 is small enough, liquid metal will not overflow from the gap.
- the surface of the lower cover plate 3 and/or the upper cover plate 2 is provided with bumps 8 or strip-shaped grooves forming the ventilation gap 7.
- both the upper cover 2 and the lower cover 3 may be silicon wafers or glass wafers.
- Flowing and filling of high-temperature molten metal in micro-scale microgrooves is similar to microfluidics, but due to the surface tension of the alloy, viscosity coefficient, and wettability with silicon micromold 1, compared to traditional microfluidics
- the aqueous solution is different, so it has a special flow filling mechanism.
- the entire sandwich structure is placed on the surface of the molten liquid metal pool 6 so that the liquid metal is pressed into the hole structure 5.
- This filling method has the advantages of fast speed and low cost, so it is very practical.
- the nozzle holes 4, 5 and the pressure vent hole groove structure 7 communicating gap space pressure P i, 6 of the surface of the metal pool P 0, the pressure difference ⁇ p P 0 -P i.
- the liquid metal does not wet the surfaces of the nozzle hole 4 and the hole structure 5.
- the liquid metal is filled into the slot structure 5 through the nozzle hole 4 by increasing the pressure difference ⁇ p.
- ⁇ p is increased can be obtained by reducing the P i. If P i when the vacuum drops to zero, Delta] p is also sufficient to overcome the capillary pressure of the nozzle holes 4, it can be considered to increase the value of P 0.
- the hole structure 5 is evacuated, and the liquid metal is filled from the nozzle hole 4 into the hole structure 5 in a vacuum environment under the action of external air pressure. Since the liquid metal generates filling pressure when filling the hole structure 5, it is necessary to apply a certain pressure on the upper cover plate 2 and the lower cover plate 3 to clamp the silicon micromold 1 at this time.
- the liquid metal in the slot structure 5 and the metal pool 6 are connected through the nozzle hole 4.
- the liquid metal forms a liquid bridge in the nozzle hole 4.
- the liquid bridge needs a certain pressure to maintain. When the pressure of the liquid bridge is lower than its breaking pressure, the liquid bridge will be pinched off due to surface tension.
- step S3 and step S4 by reducing the pressure differential ⁇ p liquid metal to the cutting nozzle hole 4, and ⁇ p is reduced can be obtained by increasing the P i and / or decreasing P 0.
- step S3 and step S4 the hole and groove structure 5 is filled with liquid metal and the cutting and separation (liquid bridge pinch off) of the liquid metal in the nozzle hole 4 is realized based on the huge surface tension on the micrometer scale.
- the liquid bridge pinching effect can be achieved by reducing the filling pressure of the liquid metal, that is, the liquid metal in the hole structure 5 and the nozzle hole 4 Cutting separation.
- the upper cover plate 2 may be exposed to the outside, and the upper cover plate 2 may be rapidly cooled by blowing cold air.
- the cold air may be liquefied low-temperature nitrogen, which is not limited here.
- the upper cover plate 2 and the lower cover plate 3 are likely to be stuck by the alloy and cannot be separated after solidification.
- Step S7 is not a necessary step.
- CMP chemical mechanical polishing
- the thick metal deposition method provided by the present invention can be applied to the following three microelectronic fields: 1) Silicon via interconnection TSV/glass via interconnection TGV for semiconductor advanced packaging; 2) MEMS devices, such as MEMS flux gates, electromagnetic Type energy harvester, etc.; 3) Three-dimensional stacked microwave components and integrated passive device IPD.
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Abstract
Disclosed in the present invention is a metal deposition method combining microelectromachinery and casting, comprising: S1, providing a silicon micro-mold, a hole trough structure being provided in the silicon micro-mold; S2, clamping the silicon micro-mold, which needs to be filled, between an upper cover panel and a lower cover panel to form a sandwich structure, a nozzle hole in the lower cover panel perpendicularly corresponding to the hole trough structure; S3, filling the hole trough structure with a high temperature, melted liquid metal; S4, cutting and separating the liquid metal in the nozzle hole and the hole trough structure; S5, evenly curing the liquid metal in the hole trough structure; and S6; separating the upper cover panel and the lower cover panel from the silicon micro-mold. The present invention combines new MEMS technology with millennia-old casting technology, creating a completely new metal deposition method for the field of microelectronics.
Description
本发明属于半导体或者微电子制造领域,尤其涉及一种结合微电子机械和铸造的金属沉积方法。The invention belongs to the field of semiconductor or microelectronic manufacturing, and in particular relates to a metal deposition method combining microelectronic machinery and casting.
厚金属层的目前没有严格的定义,一般厚度在1um以下,可以用蒸发或者溅射,在几个微米至几十甚至上百微米时,需要使用电镀。There is currently no strict definition of thick metal layers. Generally, the thickness is less than 1um, and evaporation or sputtering can be used. When the thickness is from a few microns to tens or even hundreds of microns, electroplating is required.
厚金属层在微电子器件中有着广泛的应用,在先进封装领域,例如芯片倒装焊中,使用的凸点Bumping,或者在过孔互连使用的TSV(Through-silicon via)和TGV(Through glass via),在集成无源器件中使用滤波器结构,延时器等均为厚金属结构,在MEMS器件领域,螺线型电感等结构。Thick metal layers are widely used in microelectronic devices. In advanced packaging fields, such as flip chip soldering, bumping is used, or TSV (Through-silicon via) and TGV (Through glass via), filter structures are used in integrated passive devices, delayers are all thick metal structures, and in the field of MEMS devices, spiral inductors are used.
目前厚金属的沉积主要依靠电镀实现。电镀填充可以分成四步,第一步是种子层沉积,一般采用溅射或者蒸发的方式,种子层厚度一般小于1微米。第二步是在电镀液中通过加场的方式进行电镀沉积。电镀过程是一个非常复杂的电化学过程,电镀的均匀性和成品率与电场分布,电解液的配比以及电解液中抑制剂,加速剂等的浓度有关。在填充完成后,如果是过孔互连的填充,因为种子层在孔中和表面都有,所以电镀时孔和表面都会有金属电镀沉积,表面的金属电镀需要通过第三步化学机械研磨(CMP)的方式去除。第四步是去种子层。在电镀的表面有些区域因为不需要电镀,所以在电镀前会用胶或者其他不导电材料进行覆盖。在电镀完成后,覆盖以及覆盖下面的种子层也需要去除。At present, the deposition of thick metals mainly depends on electroplating. The electroplating filling can be divided into four steps. The first step is the deposition of the seed layer, which generally adopts sputtering or evaporation. The thickness of the seed layer is generally less than 1 micron. The second step is to conduct electroplating deposition in the electroplating solution by adding a field. The electroplating process is a very complex electrochemical process. The uniformity and yield of electroplating are related to the electric field distribution, the ratio of the electrolyte, and the concentration of inhibitors and accelerators in the electrolyte. After the filling is completed, if it is the filling of the via interconnection, because the seed layer is in the hole and the surface, there will be metal plating deposition on the hole and the surface during electroplating. The metal plating on the surface needs to pass the third step of chemical mechanical polishing ( CMP). The fourth step is to go to the seed layer. Some areas on the electroplated surface do not require electroplating, so they will be covered with glue or other non-conductive materials before electroplating. After the electroplating is completed, the covering and the underlying seed layer also need to be removed.
电镀存在着下述缺陷:Electroplating has the following defects:
1.电镀填充工艺过程复杂,因为电镀需要在导电表面实现,因此对于硅片,玻璃片等材料需要预先沉积种子层,并且填充完成后还需要去种子层;1. The electroplating filling process is complicated, because the electroplating needs to be realized on the conductive surface, so for silicon wafers, glass wafers and other materials, a seed layer must be deposited in advance, and the seed layer needs to be removed after filling;
2.电镀使用的电镀液有很强的毒害性,容易染污环境,随着环保意识的兴起,现在政府对电镀生产管制越来越严;2. The electroplating solution used in electroplating is very toxic and easy to pollute the environment. With the rise of environmental protection awareness, the government now has stricter and stricter control on electroplating production;
3.电镀的填充速度并不快,特别是用于过孔填充,通常需要几个甚至数十个小时。3. The filling speed of electroplating is not fast, especially for via filling, which usually takes several or even dozens of hours.
除电镀外,化学镀也是一个厚金属沉积的方法。但是化学镀精度难控制,对材料也有较高的选择性。In addition to electroplating, electroless plating is also a method of thick metal deposition. However, the precision of electroless plating is difficult to control, and it also has high selectivity to materials.
人类使用铸造有着数千年的历史,金属铸造是一种广泛使用的金属制造方式,人类使用铸造的历史有5000多年。铸造的基本原理是将金属或者合金熔化后注入预制模具中,待固化后脱模取出成型铸件。MEMS技术能与铸造的结合,缘自它们一个共通点:两者都是机械部件制造技术,区别在于尺度上存在几个数量级。相对于其他机械加工方法,例如车,洗,抛等,铸造的长处在于可成型复杂结构的机械部件。而MEMS技术是近几十年从微电子技术中发展出来的一项微加工技术。通过在硅片或者其它基板上制造出微米尺度的机械部件,来实现传感,能量采集,执行等功能。MEMS与铸造结合的基本概念是通过体硅刻蚀工艺在硅片(或者其它材料基板)上制造出需要成型的微模具,然后将金属熔化注入填充并固化成型。Humans have used casting for thousands of years. Metal casting is a widely used method of metal manufacturing. Humans have used casting for more than 5,000 years. The basic principle of casting is to melt the metal or alloy and inject it into a prefabricated mold. After it is solidified, the mold is removed to take out the molded casting. The combination of MEMS technology and casting is due to one thing in common: Both are manufacturing technologies for mechanical parts, and the difference lies in the scale of several orders of magnitude. Compared with other machining methods, such as turning, washing, polishing, etc., the advantage of casting is that it can form mechanical parts with complex structures. And MEMS technology is a micro-processing technology developed from microelectronics technology in recent decades. By manufacturing micron-scale mechanical parts on silicon wafers or other substrates, functions such as sensing, energy harvesting, and execution can be realized. The basic concept of the combination of MEMS and casting is to create a micro-mold that needs to be formed on a silicon wafer (or other material substrate) through a bulk silicon etching process, and then melt the metal to fill it and solidify it.
将新兴的MEMS技术与有数千年历史的铸造技术结合给微电子领域创造了一项全新的金属沉积方法,但是这个结合面临巨大的技术挑战。首先,对于宏观的铸件,存在的问题是铸件内部容易产生气泡或者空洞,这些气泡或者空洞的尺寸可以达到毫米级别,已经远超MEMS结构的尺寸。其次,铸造通常用于机械部件而不是电子元件的制造,MEMS铸件在电性能方面能否满足器件的要求也需要研究。最后,MEMS与铸造的结合,不仅仅是将宏观的模具换成体硅刻蚀的硅微模具这么简单,因为铸件尺寸缩小几个数量级带来的表面 效应和温度效应等,在硅微模具的制造,合模,熔融合金的微流控填充,固化过程中的体积收缩问题以及脱模等方面均无法采用宏观铸造的解决方法。只有引入相关的微纳效应,才能真正意义上实现MEMS和铸造的结合。Combining emerging MEMS technology with thousands of years of casting technology has created a new metal deposition method for the microelectronics field, but this combination faces huge technical challenges. First of all, for macroscopic castings, the problem is that bubbles or cavities are easily generated inside the castings. The size of these bubbles or cavities can reach the millimeter level, which has far exceeded the size of the MEMS structure. Secondly, casting is usually used in the manufacture of mechanical parts rather than electronic components. Whether MEMS castings can meet the requirements of devices in terms of electrical properties also needs to be studied. Finally, the combination of MEMS and casting is not just as simple as replacing the macroscopic mold with the silicon micromold etched by bulk silicon, because the surface effect and temperature effect caused by the shrinking of the casting size by several orders of magnitude, etc., in the silicon micromold Manufacturing, mold clamping, microfluidic filling of molten alloys, volume shrinkage during solidification and demolding cannot be solved by macro casting. Only by introducing related micro-nano effects can the combination of MEMS and casting be realized in a true sense.
发明内容Summary of the invention
为了解决现有技术存在的问题,本发明提出了一种结合微电子机械和铸造的金属沉积方法。In order to solve the problems in the prior art, the present invention proposes a metal deposition method combining microelectronic machinery and casting.
本发明所采用的技术方案是:The technical scheme adopted by the present invention is:
一种结合微电子机械和铸造的金属沉积方法,包括:A metal deposition method combining microelectronic machinery and casting includes:
S1,提供硅微模具,所述硅微模具上设置有孔槽结构;S1, providing a silicon micro-mold with a slot structure provided on the silicon micro-mold;
S2,把需要填充的所述硅微模具夹在上盖板和下盖板之间,组成一个三明治结构,所述下盖板上的喷嘴孔与所述孔槽结构垂直对应;S2, sandwiching the silicon micro-mold to be filled between the upper cover plate and the lower cover plate to form a sandwich structure, and the nozzle holes on the lower cover plate correspond vertically to the hole and groove structure;
S3,往所述孔槽结构内填充高温融化的液态金属;S3, filling the hole structure with liquid metal melted at high temperature;
S4,将所述孔槽结构和所述喷嘴孔的液态金属切割分离;S4, cutting and separating the hole and groove structure and the liquid metal of the nozzle hole;
S5,快速冷却均匀固化所述孔槽结构内的液态金属;S5, rapid cooling and uniform solidification of the liquid metal in the hole structure;
S6,将所述上盖板和所述下盖板与所述硅微模具分离。S6, separating the upper cover plate and the lower cover plate from the silicon micro mold.
较佳的,在步骤S6之后还包括:Preferably, after step S6, it further includes:
S7,对所述硅微模具进行化学机械研磨。S7, performing chemical mechanical polishing on the silicon micromold.
较佳的,步骤S2中,所述下盖板和/或所述上盖板与所述硅微模具之间留有通气间隙。Preferably, in step S2, an air gap is left between the lower cover plate and/or the upper cover plate and the silicon micro-mold.
较佳的,所述下盖板和/或所述上盖板表面上设有形成所述通气间隙的凸点或条形槽。Preferably, the surface of the lower cover plate and/or the upper cover plate is provided with convex points or strip-shaped grooves forming the ventilation gap.
较佳的,步骤S3中,将整个三明治结构放置在熔融状态的液态金属池表 面。Preferably, in step S3, the entire sandwich structure is placed on the surface of the molten metal pool.
较佳的,假设所述喷嘴孔、所述孔槽结构及通气间隙内连通空间的气压为P
i,金属池表面的压力为P
0,压力差Δp=P
0-P
i,则:步骤S3中,通过增大压力差Δp使得液态金属通过所述喷嘴孔填充入所述孔槽结构中。
Preferably, assuming that the nozzle hole, the air pressure in the pore structure and the ventilation groove communicating gap space is P i, the metal surface of the pool to the pressure P 0, the pressure difference Δp = P 0 -P i, then: Step S3 In the above, the liquid metal is filled into the hole and groove structure through the nozzle hole by increasing the pressure difference Δp.
较佳的,步骤S4中,通过减小压力差Δp来切割所述喷嘴孔中的液态金属。Preferably, in step S4, the liquid metal in the nozzle hole is cut by reducing the pressure difference Δp.
较佳的,步骤S3中,对所述孔槽结构抽真空,液态金属在外部气压作用下从所述喷嘴孔中填充进入处于真空环境的所述孔槽结构内。Preferably, in step S3, the hole and groove structure is evacuated, and the liquid metal is filled from the nozzle hole into the hole and groove structure in a vacuum environment under the action of external air pressure.
较佳的,步骤S5中,对暴露在外面的所述上盖板吹冷气。Preferably, in step S5, cold air is blown to the upper cover plate exposed to the outside.
较佳的,步骤S6中,针对低温合金时,在上盖板和下盖板的表面沉积能减少其表面能的纳米分子层材料;针对高温合金时,在上盖板和下盖板表面沉积一层脱模材料。Preferably, in step S6, for low-temperature alloys, nano-molecular layer materials that can reduce the surface energy are deposited on the surfaces of the upper and lower cover plates; for high-temperature alloys, deposited on the surfaces of the upper and lower cover plates A layer of release material.
与现有技术相比,本发明的有益效果是:Compared with the prior art, the beneficial effects of the present invention are:
本发明实现了微电子机械和铸造的结合,给厚金属沉积提供了一种全新的金属层积方法,利用毛细现象和液桥夹断现象通过喷嘴孔实现液态金属在孔槽结构的填充,该技术避免了常用的电镀填充方法所需要的种子层沉积以及化学机械研磨等工艺,通过快速冷却来提高固化过程中的形核数,达到均匀固化的效果。The invention realizes the combination of microelectronic machinery and casting, and provides a brand-new metal layering method for thick metal deposition. It utilizes capillary phenomenon and liquid bridge pinch-off phenomenon to realize filling of liquid metal in the hole and groove structure through the nozzle hole. The technology avoids the seed layer deposition and chemical mechanical polishing required by the commonly used electroplating filling methods, and uses rapid cooling to increase the number of nuclei during the solidification process to achieve a uniform solidification effect.
当然,实施本发明的任一产品并不一定需要同时达到以上所述的所有优点。Of course, any product implementing the present invention does not necessarily need to achieve all the advantages described above at the same time.
图1为本发明的微电子机械和铸造相结合的厚金属沉积工艺流程图;Figure 1 is a flow chart of the thick metal deposition process combining microelectronic machinery and casting of the present invention;
图2为本发明一实施例的填充方法结构示意图。2 is a schematic structural diagram of a filling method according to an embodiment of the present invention.
为使本发明的目的、技术方案和优点更加清楚,下面将结合附图对本发明的各实施方式进行详细的阐述。In order to make the objectives, technical solutions, and advantages of the present invention clearer, the various embodiments of the present invention will be described in detail below with reference to the accompanying drawings.
请综合参考图1和图2,一种结合微电子机械和铸造的金属沉积方法,包括以下步骤:Please refer to Figure 1 and Figure 2 comprehensively. A metal deposition method combining microelectronics and casting includes the following steps:
S1,提供硅微模具1,硅微模具1上设置有孔槽结构5;S1, a silicon micro-mold 1 is provided, and a hole structure 5 is provided on the silicon micro-mold 1;
硅微模具1采用硅体加工工艺,主要有两种:深硅刻蚀和KOH刻蚀。其中深硅刻蚀可以实现较高的深宽比。一般通过光刻来确定图形,精度可以控制在1微米以内。The silicon micro-mold 1 adopts silicon body processing technology, and there are two main types: deep silicon etching and KOH etching. Among them, deep silicon etching can achieve a higher aspect ratio. Generally, the pattern is determined by photolithography, and the accuracy can be controlled within 1 micron.
与宏观铸造相比,本发明除了把模具换成硅微模具1外,还将硅微模具1变成扁平状。该厚金属沉积方法可以将传统铸造的尺寸缩小到数微米。Compared with macroscopic casting, in addition to replacing the mold with a silicon micro mold 1, the present invention also changes the silicon micro mold 1 into a flat shape. This thick metal deposition method can reduce the size of traditional casting to several microns.
孔槽结构5的类型包括通孔、盲孔和腔体结构。图1中的孔槽结构5是由多个连通在一起的通孔构成,图2中的孔槽结构5由单一通孔构成。The types of the slot structure 5 include through hole, blind hole and cavity structure. The slot structure 5 in FIG. 1 is composed of a plurality of through holes connected together, and the slot structure 5 in FIG. 2 is composed of a single through hole.
优选的,孔槽结构5阵列式地布置在硅微模具上。Preferably, the hole and groove structures 5 are arranged in an array on the silicon micro mold.
S2,把需要填充的硅微模具1夹在上盖板2和下盖板3之间,组成一个三明治结构,下盖板3上的喷嘴孔4与孔槽结构5垂直对应;S2, sandwich the silicon micromold 1 to be filled between the upper cover plate 2 and the lower cover plate 3 to form a sandwich structure, and the nozzle hole 4 on the lower cover plate 3 corresponds to the hole structure 5 vertically;
如图2所示,下盖板3上设置多个喷嘴孔4,多个喷嘴孔4与多个孔槽结构5一一垂直对应;更进一步地,如图1所示,下盖板3上设置一个喷嘴孔4,通过孔槽结构5的入口处,金属液体流入各个相互连通的贯穿硅微模具1的通孔内。As shown in FIG. 2, a plurality of nozzle holes 4 are provided on the lower cover plate 3, and the plurality of nozzle holes 4 correspond to a plurality of hole groove structures 5 one by one; further, as shown in FIG. 1, the lower cover plate 3 A nozzle hole 4 is provided, and the metal liquid flows into each interconnected through hole of the silicon micro-mold 1 through the entrance of the hole structure 5.
在下盖板3和/或上盖板2与硅微模具1之间留有通气间隙7。由于通气间隙7足够小,液态金属不会从间隙中溢出。An air gap 7 is left between the lower cover plate 3 and/or the upper cover plate 2 and the silicon micro mold 1. Since the ventilation gap 7 is small enough, liquid metal will not overflow from the gap.
可选的,下盖板3和/或上盖板2表面上设有形成通气间隙7的凸点8或条形槽。Optionally, the surface of the lower cover plate 3 and/or the upper cover plate 2 is provided with bumps 8 or strip-shaped grooves forming the ventilation gap 7.
可选的,上盖板2和下盖板3均可以是硅片或者玻璃片。Optionally, both the upper cover 2 and the lower cover 3 may be silicon wafers or glass wafers.
S3,往孔槽结构5内填充高温融化的液态金属;S3, filling the hole structure 5 with liquid metal melted at high temperature;
高温熔化的金属在微米尺度的微槽中流动填充虽然类似于微流控,但是因为合金的表面张力,粘滞系数,以及与硅微模具1的浸润性等因素,相较于传统微流控中的水溶液不一样,所以产生了特殊的流动填充机理。Flowing and filling of high-temperature molten metal in micro-scale microgrooves is similar to microfluidics, but due to the surface tension of the alloy, viscosity coefficient, and wettability with silicon micromold 1, compared to traditional microfluidics The aqueous solution is different, so it has a special flow filling mechanism.
在一个实施例中,将整个三明治结构放置在熔融状态的液态金属池6表面,使液态金属压入孔槽结构5。该填充方式具有速度快、成本低的优势,因此非常实用。In one embodiment, the entire sandwich structure is placed on the surface of the molten liquid metal pool 6 so that the liquid metal is pressed into the hole structure 5. This filling method has the advantages of fast speed and low cost, so it is very practical.
假设喷嘴孔4、孔槽结构5及通气间隙7内连通空间的气压为P
i,金属池6表面的压力为P
0,则压力差Δp=P
0-P
i。其中,液态金属对于喷嘴孔4和孔槽结构5的表面都是不浸润的。该步骤中,通过增大压力差Δp使得液态金属通过喷嘴孔4填充入孔槽结构5中。Δp的增大可以通过减小P
i获得。若当P
i降到真空为零时,Δp还不足以克服喷嘴孔4的毛细压力时,则可以考虑加大P
0的值。
Suppose the nozzle holes 4, 5 and the pressure vent hole groove structure 7 communicating gap space pressure P i, 6 of the surface of the metal pool P 0, the pressure difference Δp = P 0 -P i. Among them, the liquid metal does not wet the surfaces of the nozzle hole 4 and the hole structure 5. In this step, the liquid metal is filled into the slot structure 5 through the nozzle hole 4 by increasing the pressure difference Δp. Δp is increased can be obtained by reducing the P i. If P i when the vacuum drops to zero, Delta] p is also sufficient to overcome the capillary pressure of the nozzle holes 4, it can be considered to increase the value of P 0.
在另一个实施例中,对孔槽结构5抽真空,液态金属在外部气压作用下从喷嘴孔4中填充进入处于真空环境的孔槽结构5内。由于液态金属在填充孔槽结构5时会产生填充压力,此时需要在上盖板2和下盖板3上施加一定的压力夹紧硅微模具1。In another embodiment, the hole structure 5 is evacuated, and the liquid metal is filled from the nozzle hole 4 into the hole structure 5 in a vacuum environment under the action of external air pressure. Since the liquid metal generates filling pressure when filling the hole structure 5, it is necessary to apply a certain pressure on the upper cover plate 2 and the lower cover plate 3 to clamp the silicon micromold 1 at this time.
S4,将孔槽结构5和喷嘴孔4的液态金属切割分离;S4, cutting and separating the liquid metal of the hole structure 5 and the nozzle hole 4;
液态金属通过喷嘴孔4填满孔槽结构5后,孔槽结构5中的液态金属与金属池6是通过喷嘴孔4相连的。液态金属会在喷嘴孔4中形成一个液桥。液桥是需要一定的压力来维持的,当液桥的压力低于其断裂压力时,液桥会因表面张力夹断。After the liquid metal fills the slot structure 5 through the nozzle hole 4, the liquid metal in the slot structure 5 and the metal pool 6 are connected through the nozzle hole 4. The liquid metal forms a liquid bridge in the nozzle hole 4. The liquid bridge needs a certain pressure to maintain. When the pressure of the liquid bridge is lower than its breaking pressure, the liquid bridge will be pinched off due to surface tension.
在一个实施例中,通过减小压力差Δp来切割喷嘴孔4中的液态金属,而Δp 的减小可以通过增大P
i和/或减小P
0获得。步骤S3和步骤S4中孔槽结构5填充液态金属以及液态金属在喷嘴孔4的切割分离(液桥夹断)是基于微米尺度上巨大的表面张力来实现的。
In one embodiment, by reducing the pressure differential Δp liquid metal to the cutting nozzle hole 4, and Δp is reduced can be obtained by increasing the P i and / or decreasing P 0. In step S3 and step S4, the hole and groove structure 5 is filled with liquid metal and the cutting and separation (liquid bridge pinch off) of the liquid metal in the nozzle hole 4 is realized based on the huge surface tension on the micrometer scale.
在另一个实施例中,由于孔槽结构5处于真空环境下,此时可以通过减小液态金属的填充压力实现液桥夹断的效果,即将孔槽结构5和喷嘴孔4内的液态金属进行切割分离。In another embodiment, since the hole structure 5 is in a vacuum environment, the liquid bridge pinching effect can be achieved by reducing the filling pressure of the liquid metal, that is, the liquid metal in the hole structure 5 and the nozzle hole 4 Cutting separation.
S5,均匀固化孔槽结构5内的液态金属;S5, uniformly solidify the liquid metal in the hole structure 5;
绝大部分金属在从液相到固相的固化过程中,体积会经历一个收缩,收缩量约在2%~7%之间。在宏观铸造中,体积收缩的问题是靠补偿的方式来实现的。即通过控制铸件从下往上冷却,在顶部冒口处的金属最后融化,这样在冷却过程中可以一直补偿其下方的合金固化收缩。但是在本实施例中,因为晶圆的扁平结构加上硅材料本身的高热导性,补偿需要的温度梯度无法实现。Most metals undergo a volume shrinkage during the solidification process from liquid to solid phase, and the shrinkage is about 2% to 7%. In macro casting, the problem of volume shrinkage is achieved by means of compensation. That is, by controlling the casting to cool from bottom to top, the metal at the top riser finally melts, so that the solidification and shrinkage of the alloy below it can be compensated during the cooling process. However, in this embodiment, because of the flat structure of the wafer and the high thermal conductivity of the silicon material itself, the temperature gradient required for compensation cannot be achieved.
该步骤中,优选通过快速冷却的方式来提高固化过程中的形核数,以达到均匀固化的目的。具体地,可以是将上盖板2暴露在外面,并对上盖板2吹冷气进行快速冷却,冷气可以是液化的低温氮气,在此不做限制。In this step, it is preferable to increase the number of nuclei in the solidification process by means of rapid cooling to achieve the goal of uniform solidification. Specifically, the upper cover plate 2 may be exposed to the outside, and the upper cover plate 2 may be rapidly cooled by blowing cold air. The cold air may be liquefied low-temperature nitrogen, which is not limited here.
S6,将上盖板2和下盖板3与硅微模具1分离;S6, separating the upper cover plate 2 and the lower cover plate 3 from the silicon micro mold 1;
因为合金是融化后进行填充的,固化后容易出现上盖板2和下盖板3被合金粘住无法分离的情况。针对低温合金,本实施例优选通过在盖板的表面沉积特种纳米分子层材料以减少其表面能,从而实现轻松的分片。针对高温合金,因为纳米分子层在高温下会分解,本实施例优选用物理或者化学沉积的方式在上盖板2和下盖板3表面沉积一层脱模材料,以辅助脱模。Because the alloy is filled after being melted, the upper cover plate 2 and the lower cover plate 3 are likely to be stuck by the alloy and cannot be separated after solidification. For low-temperature alloys, in this embodiment, it is preferable to deposit a special nano-molecular layer material on the surface of the cover plate to reduce its surface energy, thereby realizing easy slicing. For high-temperature alloys, because the nano-molecular layer decomposes at high temperatures, in this embodiment, it is preferable to deposit a layer of mold release material on the surfaces of the upper cover plate 2 and the lower cover plate 3 by physical or chemical deposition to assist the demolding.
S7,对硅微模具1进行化学机械研磨。S7, chemical mechanical polishing is performed on the silicon micro-mold 1.
步骤S7不是必须步骤。根据实际情况,脱模后可能需要进行化学机械研磨(CMP)来平整化,或者在铸件表面进行薄层电镀的方式来达到某些具体 应用要求。Step S7 is not a necessary step. Depending on the actual situation, chemical mechanical polishing (CMP) may be required after demolding to level, or thin-layer electroplating on the surface of the casting may be required to meet specific application requirements.
本发明提供的厚金属沉积方法可以应用于以下三个微电子领域:1)半导体先进封装的硅过孔互连TSV/玻璃过孔互连TGV;2)MEMS器件,例如MEMS磁通门,电磁式能量采集器等;3)三维堆叠微波组件及集成无源器件IPD。The thick metal deposition method provided by the present invention can be applied to the following three microelectronic fields: 1) Silicon via interconnection TSV/glass via interconnection TGV for semiconductor advanced packaging; 2) MEMS devices, such as MEMS flux gates, electromagnetic Type energy harvester, etc.; 3) Three-dimensional stacked microwave components and integrated passive device IPD.
以上所述,仅为本发明较佳的具体实施方式,但本发明的保护范围并不局限于此,任何熟悉本技术领域的技术人员在本发明揭露的技术范围内,可轻易想到的变化或替换,都应涵盖在本发明的保护范围之内。因此,本发明的保护范围应该以权利要求的保护范围为准。The above are only preferred specific embodiments of the present invention, but the protection scope of the present invention is not limited thereto. Any person skilled in the art can easily think of changes or changes within the technical scope disclosed by the present invention. All replacements shall be covered within the protection scope of the present invention. Therefore, the protection scope of the present invention should be subject to the protection scope of the claims.
Claims (10)
- 一种结合微电子机械和铸造的金属沉积方法,其特征在于,包括:A metal deposition method combining microelectronic machinery and casting is characterized in that it comprises:S1,提供硅微模具,所述硅微模具上设置有孔槽结构;S1, providing a silicon micro-mold with a slot structure provided on the silicon micro-mold;S2,把需要填充的所述硅微模具夹在上盖板和下盖板之间,组成一个三明治结构,所述下盖板上的喷嘴孔与所述孔槽结构垂直对应;S2, sandwiching the silicon micro-mold to be filled between the upper cover plate and the lower cover plate to form a sandwich structure, and the nozzle holes on the lower cover plate correspond vertically to the hole and groove structure;S3,往所述孔槽结构内填充高温融化的液态金属;S3, filling the hole structure with liquid metal melted at high temperature;S4,将所述孔槽结构和所述喷嘴孔的液态金属切割分离;S4, cutting and separating the hole and groove structure and the liquid metal of the nozzle hole;S5,均匀固化所述孔槽结构内的液态金属;S5, uniformly solidify the liquid metal in the hole structure;S6,将所述上盖板和所述下盖板与所述硅微模具分离。S6, separating the upper cover plate and the lower cover plate from the silicon micro mold.
- 根据权利要求1所述的一种结合微电子机械和铸造的金属沉积方法,其特征在于,在步骤S6之后还包括:A metal deposition method combining microelectronic machinery and casting according to claim 1, characterized in that, after step S6, it further comprises:S7,对所述硅微模具进行化学机械研磨。S7, performing chemical mechanical polishing on the silicon micromold.
- 根据权利要求1所述的一种结合微电子机械和铸造的金属沉积方法,其特征在于,步骤S2中,所述下盖板和/或所述上盖板与所述硅微模具之间留有通气间隙。The method for metal deposition combining microelectronic machinery and casting according to claim 1, wherein in step S2, there is a gap between the lower cover plate and/or the upper cover plate and the silicon micromold There is a ventilation gap.
- 根据权利要求3所述的一种结合微电子机械和铸造的金属沉积方法,其特征在于,所述下盖板和/或所述上盖板表面上设有形成所述通气间隙的凸点或条形槽。The method of metal deposition combining microelectronic machinery and casting according to claim 3, wherein the surface of the lower cover plate and/or the upper cover plate is provided with bumps or bumps forming the ventilation gap. Strip groove.
- 根据权利要求3所述的一种结合微电子机械和铸造的金属沉积方法,其特征在于,步骤S3中,将整个三明治结构放置在熔融状态的液态金属池表面。A metal deposition method combining microelectronic machinery and casting according to claim 3, wherein in step S3, the entire sandwich structure is placed on the surface of the molten metal pool.
- 根据权利要求5所述的一种结合微电子机械和铸造的金属沉积方法,其特征在于,假设所述喷嘴孔、所述孔槽结构及通气间隙内连通空间的气压为 P i,金属池表面的压力为P 0,压力差Δp=P 0-P i,则:步骤S3中,通过增大压力差Δp使得液态金属通过所述喷嘴孔填充入所述孔槽结构中。 According to one of claim 5 in conjunction with the metal deposition process and MEMS foundry, characterized in that, assuming the nozzle hole, the pressure within the pore structure and the ventilation groove communicating gap space is P i, metal pool surface The pressure of is P 0 , and the pressure difference Δp=P 0 -P i , then: in step S3, the pressure difference Δp is increased so that the liquid metal is filled into the hole structure through the nozzle hole.
- 根据权利要求6所述的一种结合微电子机械和铸造的金属沉积方法,其特征在于,步骤S4中,通过减小压力差Δp来切割所述喷嘴孔中的液态金属。The metal deposition method combining microelectronic machinery and casting according to claim 6, characterized in that, in step S4, the liquid metal in the nozzle hole is cut by reducing the pressure difference Δp.
- 根据权利要求1所述的一种结合微电子机械和铸造的金属沉积方法,其特征在于,步骤S3中,对所述孔槽结构抽真空,液态金属在外部气压作用下从所述喷嘴孔中填充进入处于真空环境的所述孔槽结构内。A metal deposition method combining microelectronic machinery and casting according to claim 1, wherein in step S3, the hole and groove structure is evacuated, and liquid metal is removed from the nozzle hole under the action of external air pressure. Filling into the hole structure in a vacuum environment.
- 根据权利要求1所述的一种结合微电子机械和铸造的金属沉积方法,其特征在于,步骤S5中,对暴露在外面的所述上盖板吹冷气。A metal deposition method combining microelectronic machinery and casting according to claim 1, wherein in step S5, cold air is blown to the upper cover plate exposed to the outside.
- 根据权利要求1所述的一种结合微电子机械和铸造的金属沉积方法,其特征在于,步骤S6中:针对低温合金时,在上盖板和下盖板的表面沉积能减少其表面能的纳米分子层材料;针对高温合金时,在上盖板和下盖板表面沉积一层脱模材料。A metal deposition method combining microelectronic machinery and casting according to claim 1, characterized in that, in step S6: for low-temperature alloys, deposition on the surface of the upper cover plate and the lower cover plate can reduce the surface energy Nano-molecular layer material; for high-temperature alloys, a layer of release material is deposited on the surface of the upper cover and the lower cover.
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CN114378261B (en) * | 2022-02-24 | 2023-12-05 | 德清县东旭合金钢铸造有限公司 | Casting process of bimetal alloy steel plate |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101740425A (en) * | 2008-11-26 | 2010-06-16 | 纳普拉有限公司 | Method for filling metal into fine space |
US20160221075A1 (en) * | 2015-02-02 | 2016-08-04 | Honda Motor Co., Ltd. | Low-pressure casting apparatus and low-pressure casting method using the same |
CN106298639A (en) * | 2015-06-12 | 2017-01-04 | 中国科学院上海微系统与信息技术研究所 | A kind of micropore metal interstitital texture and fill method |
Family Cites Families (4)
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SG10201807673SA (en) * | 2014-03-07 | 2018-10-30 | Agc Inc | Process for producing package for mounting a semiconductor element and mold release film |
JP6453625B2 (en) * | 2014-11-27 | 2019-01-16 | 新光電気工業株式会社 | WIRING BOARD, MANUFACTURING METHOD THEREOF, AND ELECTRONIC COMPONENT DEVICE |
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Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101740425A (en) * | 2008-11-26 | 2010-06-16 | 纳普拉有限公司 | Method for filling metal into fine space |
US20160221075A1 (en) * | 2015-02-02 | 2016-08-04 | Honda Motor Co., Ltd. | Low-pressure casting apparatus and low-pressure casting method using the same |
CN106298639A (en) * | 2015-06-12 | 2017-01-04 | 中国科学院上海微系统与信息技术研究所 | A kind of micropore metal interstitital texture and fill method |
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