WO2020135540A1

WO2020135540A1 - Quantum yield measurement method

Info

Publication number: WO2020135540A1
Application number: PCT/CN2019/128494
Authority: WO
Inventors: 薛占强; 郭翠; 潘奕
Original assignee: 深圳市太赫兹科技创新研究院有限公司; 华讯方舟科技有限公司
Priority date: 2018-12-26
Filing date: 2019-12-26
Publication date: 2020-07-02
Also published as: CN109507153A

Abstract

A quantum yield measurement method. By means of placing a material to be detected inside an integration sphere (60), first acquiring an excitation spectrum of excitation light (S10); then, emitting excitation light onto the material to be detected, acquiring a photoluminescence spectrum and an excitation light transmitted spectrum of the material to be detected (S20); according to the excitation spectrum, photoluminescence spectrum and transmitted spectrum, generating a quantum yield of the material to be detected (S30). Thus, it is not necessary to remove the material to be detected when probing an excitation spectrum, a photoluminescence spectrum and a transmitted spectrum, ensuring that measurement data is all obtained in an identical environment, preventing errors caused by different measurement environments, and solving the problem in conventional methods of measuring quantum yield of differences in measurement conditions when probing excitation spectrum and excitation light transmitted spectrum, leading to certain errors in quantum yield measurement.

Description

Method for testing quantum yield

Technical field

The embodiment of the present application belongs to the technical field of quantum yield, and particularly relates to a quantum yield testing method.

Background technique

Quantum yield is an important parameter for evaluating the performance of luminescent materials. The measurement of quantum yield mainly uses a spectrometer to detect the excitation light spectrum, photoluminescence spectrum, and transmission spectrum of the excitation light in the integrating sphere. It is obtained by calculating the ratio of the total number of emitted photons to the number of absorbed photons. Among them, the number of emitted photons It can be obtained by measuring the photoluminescence spectrum. The number of absorbed photons is the difference between the number of excitation photons and the number of transmitted excitation photons.

However, in the traditional method for measuring quantum yield, there is a difference in the measurement state when detecting the excitation light spectrum and the excitation light transmission spectrum, resulting in a certain error in the measured quantum yield.

Summary of the invention

The embodiments of the present application provide a quantum yield test method, which aims to solve the difference between the measurement state when detecting the excitation light spectrum and the excitation light transmission spectrum in the traditional method for measuring quantum yield, resulting in the measured quantum yield There is a certain error problem.

The embodiments of the present application provide a quantum yield test method, including:

Put the material to be tested inside the integrating sphere and obtain the excitation light spectrum of the excitation light;

Irradiating the excitation light on the surface of the material to be measured to obtain a photoluminescence spectrum of the material to be tested and a transmission spectrum of the excitation light;

The quantum yield of the material to be measured is generated according to the excitation light spectrum, the photoluminescence spectrum, and the transmission spectrum.

Optionally, the acquiring the excitation light spectrum of the excitation light includes:

Irradiating the excitation light on the inner wall of the integrating sphere through the entrance of the integrating sphere;

The excitation light spectrum of the excitation light emitted from the exit of the integrating sphere is detected.

Optionally, irradiating the excitation light on the surface of the material to be measured to obtain the photoluminescence spectrum of the material to be tested and the transmission spectrum of the excitation light include:

Adjusting the incident angle of the excitation light so that the excitation light irradiates the surface of the material to be measured;

Detecting the photoluminescence spectrum of the material to be tested and the transmission spectrum of the excitation light emitted from the exit of the integrating sphere.

Optionally, the adjusting the incident angle of the excitation light so that the excitation light irradiates the surface of the material to be measured includes:

Receiving the excitation light through a rotatable angle mirror device;

The angle of incidence of the excitation light into the integrating sphere is adjusted by adjusting the angle of the rotatable angle mirror device, so that the excitation light irradiates the surface of the material to be measured.

Optionally, the angle of incidence of the excitation light into the integrating sphere is adjusted by adjusting the angle of the rotatable angle mirror device, so that the excitation light irradiates the surface of the material to be measured, and include:

Adjust the angle of the rotatable angle mirror device;

A focusing lens is provided between the rotatable angle mirror device and the integrating sphere;

The angle of the rotatable angle mirror device is adjusted so that the excitation light irradiates the surface of the material to be measured after passing through a focusing lens.

Optionally, the rotatable angle mirror device includes:

An optical mirror is used to receive the excitation light and reflect the excitation light;

A mirror support rod for fixing the optical mirror, and the mirror support rod is connected to the optical mirror; and

An electric rotating table is used to adjust the angle of the optical mirror through the mirror support rod, and the electric rotating table is connected with the mirror support rod.

Optionally, the generating the quantum yield of the material to be measured according to the excitation light spectrum, the photoluminescence spectrum, and the transmission spectrum, further includes:

Obtaining a preset excitation light spectrum band from the excitation light spectrum, a preset photoluminescence spectrum band from the photoluminescence spectrum, and a preset transmission spectrum band from the transmission spectrum according to a preset wavelength range ;

The area between the preset excitation light spectrum band and the horizontal axis of wavelength is set as the number of photons in the excitation light spectrum, and the area between the preset photoluminescence spectrum band and the horizontal axis of wavelength is For the photon number of the photoluminescence spectrum, the area between the preset transmission spectrum band and the horizontal axis of the wavelength is taken as the photon number of the transmission spectrum.

Optionally, the generating the quantum yield of the material to be tested according to the excitation light spectrum, the photoluminescence spectrum, and the transmission spectrum includes:

The excitation light spectrum, the photoluminescence spectrum, and the transmission spectrum are generated by a preset quantum yield relationship, and the preset quantum yield relationship is:

η=Ne/Na;

Where η is the quantum yield of the material to be measured, Ne is the number of photons in the photoluminescence spectrum, and Na is the difference between the number of photons in the excitation light spectrum and the number of photons in the transmission spectrum.

Optionally, the setting of the area between the preset excitation light spectrum band and the horizontal axis of wavelength as the number of photons in the excitation light spectrum includes:

Obtaining the energy value of the excitation light spectrum through the excitation light spectrum;

The energy value of the excitation light spectrum is calculated by the preset photon number relationship of the excitation light spectrum, and the preset photon number relationship of the excitation light spectrum is:

Ea1=h*c/λ;

△N＝P(λ)*△λ/Ea1;

Where Ea1 is the energy value of the excitation light spectrum, h is the Planck constant, c is the speed of light, λ1 is the first wavelength in the preset wavelength range, and λ2 is the second in the preset wavelength range Wavelength, P (λ) is the absolute power.

Optionally, the setting of the area between the preset photoluminescence spectrum band and the horizontal axis of wavelength as the photon number of the photoluminescence spectrum includes:

Obtaining the energy value of the photoluminescence spectrum through the photoluminescence spectrum;

The energy value of the photoluminescence spectrum is calculated by a preset photon number relationship of photoluminescence spectrum, and the photon number relationship of the preset photoluminescence spectrum is:

Ee=h*c/λ;

△N＝P(λ)*△λ/Ee;

Where Ee is the energy value of the photoluminescence spectrum, h is the Planck constant, c is the speed of light, λ1 is the first wavelength in the preset wavelength range, and λ2 is the first in the preset wavelength range At two wavelengths, P(λ) is the absolute power, and Ne is the number of photons in the photoluminescence spectrum.

The embodiments of the present application provide a method for measuring quantum yield. By placing the material to be tested inside the integrating sphere, the excitation light spectrum of the excitation light is obtained first, and then the excitation light is irradiated on the material to be tested to obtain the material to be tested The photoluminescence spectrum and the transmission spectrum of the excitation light, and the quantum yield of the material to be tested is generated according to the excitation light spectrum, the photoluminescence spectrum and the transmission spectrum, so that when the excitation light spectrum, the photoluminescence spectrum and the transmission spectrum are detected No need to take out the material to be tested, to ensure that the test data are obtained in the same environment, to avoid errors caused by different test environments, to solve the traditional method of measuring quantum yield, in the detection of excitation light spectrum and excitation light transmission spectrum There is a difference in the measurement state at the time, which causes a certain error in the quantum yield of the measurement.

BRIEF DESCRIPTION

In order to more clearly explain the technical solutions in the embodiments of the present application, the following will briefly introduce the drawings used in the description of the embodiments. Obviously, the drawings in the following description are some embodiments of the present application. Those of ordinary skill in the art can obtain other drawings based on these drawings without creative work.

FIG. 1 is a schematic diagram of a quantum yield test method provided by an embodiment of this application;

2 is a schematic structural diagram of a quantum yield testing device provided by an embodiment of the present application;

3 is a schematic diagram of a quantum yield test method provided by another embodiment of the present application;

4 is a schematic diagram of a quantum yield test method provided by another embodiment of the present application;

5 is a schematic diagram of a quantum yield test method provided by another embodiment of the present application;

6 is a schematic diagram of a quantum yield test method provided by another embodiment of the present application;

7 is a schematic structural diagram of a rotatable angle mirror device provided by an embodiment of the present application;

8 is a schematic diagram of the excitation light provided to the inner wall of the integrating sphere provided by an embodiment of the present application;

9 is a schematic diagram of the excitation light provided to the surface of the material to be measured provided by an embodiment of the present application;

10 is a schematic diagram of excitation light spectrum, transmission spectrum and photoluminescence spectrum when the excitation light provided by one embodiment of the present application is irradiated to the surface of the material to be measured.

detailed description

In order to enable those skilled in the art to better understand the solutions of the present application, the technical solutions in the embodiments of the present application will be described clearly in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments are the present application Some embodiments, not all embodiments. Based on the embodiments in this application, all other embodiments obtained by a person of ordinary skill in the art without creative work shall fall within the scope of protection of this application.

The term "comprising" and any variations thereof in the description and claims of the present application and the above drawings are intended to cover non-exclusive inclusion. For example, a process, method or system, product, or device that includes a series of steps or units is not limited to the listed steps or units, but optionally includes steps or units that are not listed, or optionally includes Other steps or units inherent to these processes, methods, products, or equipment. In addition, the terms "first", "second", "third", etc. are used to distinguish different objects, not to describe a specific order.

FIG. 1 is a schematic flowchart of a quantum yield test method provided by an embodiment of the present application. As shown in FIG. 1, the quantum yield test method in this embodiment includes:

Step S10: Put the material to be tested inside the integrating sphere, and obtain the excitation light spectrum of the excitation light;

Step S20: irradiate the excitation light on the surface of the material to be measured to obtain a photoluminescence spectrum of the material to be tested and a transmission spectrum of the excitation light;

Step S30: Generate a quantum yield of the material to be measured according to the excitation light spectrum, the photoluminescence spectrum, and the transmission spectrum.

In this embodiment, the user can put the material to be tested inside the integrating sphere in advance, and after the excitation light is generated, irradiate the excitation light to the inner wall of the integrating sphere to detect the excitation light spectrum of the excitation light, and then adjust the incident angle of the excitation light , So that the excitation light is irradiated on the surface of the material to be tested, so as to obtain the photoluminescence spectrum of the material to be tested and the transmission spectrum of the excitation light after passing the material to be tested. In the entire test process, there is no need to frequently take out the material to be tested and Put in, to avoid the inconsistency of the test state of the material to be tested in the integrating sphere.

In one embodiment, the material to be tested can be placed on a sample stage, which is preset in the integrating sphere.

In one embodiment, due to a certain deflection of the incident angle of the excitation light, it fails to illuminate the sample surface, but illuminates the whiteboard at the bottom of the integrating sphere, and the excitation light undergoes uniform diffuse reflection inside the integrating sphere. Therefore, it is emitted through the exit of the integrating sphere. Therefore, the optical spectrum of the light beam emitted from the exit of the integrating sphere can be detected by providing an optical detection module at the exit of the integrating sphere.

In one embodiment, the material to be measured may be a luminescent material.

In one embodiment, FIG. 2 is a quantum yield testing device used in a quantum yield testing method in this embodiment. The quantum yield testing method in this embodiment may further include:

Radiation of spectral energy through xenon lamp 10;

A monochromator 20 is used to separate a series of narrow-band light beams from a wide-band light beam;

When a beam of composite light enters the entrance slit of the monochromator 20, the collimating lens 30 converges into parallel light to emit excitation light.

In this embodiment, the optical collimating lens 30 collects and collimates the divergent monochromatic light output by the monochromator 20 into a parallel beam.

In one embodiment, the optical collimating lens 30 is dispersed by a diffraction grating into separate single wavelengths.

As shown in FIG. 2, in one embodiment, the optical detection module 70 may be connected to the exit of the integrating sphere 60 to detect the spectrum of the light beam emitted from the exit of the integrating sphere 60.

In one embodiment, FIG. 3 is a flowchart of another quantum yield test method provided by an embodiment of the present application. As shown in FIG. 3, in this embodiment, the excitation light for acquiring the excitation light Spectrum, including:

S11: irradiate the excitation light on the inner wall of the integrating sphere through the entrance of the integrating sphere;

S12: Detect the excitation light spectrum of the excitation light emitted from the exit of the integrating sphere.

In this embodiment, the excitation light is irradiated to the inner wall of the integrating sphere through the entrance of the integrating sphere, thereby detecting the excitation light spectrum of the excitation light emitted at the exit of the integrating sphere. At this time, the detection of the excitation light spectrum is completed. When measuring the photoluminescence spectrum of the material and the transmission spectrum of the excitation light, it is sufficient to adjust the incident angle of the excitation light to avoid taking out and putting in the sample.

In one embodiment, as shown in FIG. 4, irradiating the excitation light on the surface of the material to be measured to obtain the photoluminescence spectrum of the material to be tested and the transmission spectrum of the excitation light include:

S21: Adjust the incident angle of the excitation light so that the excitation light irradiates the surface of the material to be measured;

S22: Detect the photoluminescence spectrum of the material to be tested and the transmission spectrum of the excitation light emitted from the exit of the integrating sphere.

In this embodiment, by adjusting the incident angle of the excitation light and irradiating the excitation light to the surface of the material to be measured, it is possible to avoid moving the material to be measured when acquiring the photoluminescence spectrum of the material to be tested and the transmission spectrum of the excitation light. Moving includes adjusting the position of the material to be tested or removing the material to be tested. The user can directly detect the light beam emitted by the exit of the integrating sphere 60 through the optical detection module 70 to obtain the photoluminescence spectrum of the material to be measured and the transmission spectrum of the excitation light.

In one embodiment, as shown in FIG. 5, the adjusting the incident angle of the excitation light so that the excitation light irradiates the surface of the material to be measured includes:

Step S211: receiving the excitation light through a rotatable angle mirror device;

Step S212: Adjust the angle of incidence of the excitation light into the integrating sphere by adjusting the angle of the rotatable angle mirror device, so that the excitation light irradiates the surface of the material to be measured.

In this embodiment, the incident angle of the excitation light can be adjusted by adjusting the angle of the rotatable angle mirror device 40 to adjust the incident angle of the excitation light to the integrating sphere 60.

In one embodiment, as shown in FIG. 6, in this embodiment, the angle of incidence of the excitation light into the integrating sphere is adjusted by adjusting the angle of the rotatable angle mirror device, so that The irradiation of the excitation light onto the surface of the material to be measured includes:

Step S2121: adjust the angle of the rotatable angle mirror device;

Step S2122: setting a focusing lens between the rotatable angle mirror device and the integrating sphere;

Step S2123: Adjust the angle of the rotatable angle mirror device so that the excitation light irradiates the surface of the material to be measured after passing through a focusing lens.

In this embodiment, the excitation light can be focused by the focusing lens 50 so that the excitation light entering the integrating sphere 60 can be completely irradiated to the sample surface.

7 is a schematic structural diagram of a rotatable angle mirror device 40 according to an embodiment of the present application. As shown in FIG. 7, the rotatable angle mirror device 40 in this embodiment includes:

The optical reflector 41 is used to receive the excitation light and reflect the excitation light;

A mirror support rod 42 for fixing the optical mirror, and the mirror support rod is connected with the optical mirror; and

The electric rotating table 43 is used to adjust the angle of the optical mirror through the mirror support rod, and the electric rotating table is connected to the mirror support rod.

In this embodiment, the electric rotating table 43 can rotate clockwise or counterclockwise, driving the optical mirror 41 to rotate a certain angle, thereby changing the angle of excitation light incident into the integrating sphere 60, so that the excitation light deviates from the material to be measured or irradiates Measure the surface of the material.

FIG. 8 is a schematic diagram of the excitation light irradiating the inner wall of the integrating sphere provided by an embodiment of the present application. As shown in FIG. There is a certain deflection, which fails to illuminate the surface of the sample, but illuminates the whiteboard at the bottom of the integrating sphere. The excitation light uniformly diffuses inside the integrating sphere, and the excitation light entering the integrating sphere 60 is emitted from the exit of the integrating sphere 60. Then the optical detection module 7 measures the spectrum of the light beam. Although the rotation direction here is defined as clockwise, the rotation direction is related to the actual optical path layout, and the clockwise direction is not limited.

9 is a schematic diagram of the excitation light irradiating the surface of the material to be measured provided by an embodiment of the present application. As shown in FIG. 9, the electric rotating table 43 rotates counterclockwise by a certain angle, and the excitation light passes through the focusing lens 50 and enters the integrating sphere 60. Because the incident angle of the excitation light is deflected, it can be irradiated on the surface of the sample to be tested, and the sample to be tested can be excited to produce a photoluminescence spectrum. Using the optical detection module 70, the photoluminescence spectrum and the transmission spectrum of the excitation light are measured. Although the rotation direction here is defined as counterclockwise, the rotation direction depends on the actual optical path layout, and the rotation direction may be opposite to the rotation direction described in FIG. 3.

10 is a schematic diagram of a photoluminescence spectrum, excitation light spectrum, and transmission spectrum of excitation light of a material to be tested provided by an embodiment of the present application. As shown in FIG. 10, the horizontal axis of the spectrum diagram is the wavelength. The vertical axis in the spectrum diagram is the absolute energy distribution of the spectrum. When the excitation light deviates from the sample to be measured, the excitation light is not absorbed by the sample to be measured, and the intensity of the excitation light obtained by detection is large. When the excitation light is irradiated on the sample to be tested, the excitation light energy is absorbed by the sample to be tested, and the sample to be tested generates a photoluminescence spectrum. After the excitation light energy is absorbed, it becomes the transmission light spectrum of the excitation light, and its wavelength is still consistent with the excitation light.

In one embodiment, the generating the quantum yield of the material to be tested according to the excitation light spectrum, the photoluminescence spectrum, and the transmission spectrum includes:

In this embodiment, the preset wavelength range includes a first wavelength and a second wavelength, where the second wavelength is greater than the first wavelength. Specifically, the second wavelength may be the upper limit of the preset wavelength range, and the first wavelength may be The lower limit of the preset wavelength range.

In one embodiment, by selecting the preset wavelength range in FIG. 10 and then intercepting the corresponding spectrum, the area between each spectrum and the horizontal axis is calculated, and the area can be the number of photons corresponding to each spectrum. For example, if the preset wavelength range is 400nm-600nm, at this time, the first wavelength is 400nm and the second wavelength is 600nm, the area of each spectrum in the range of 400nm-600nm can be calculated to obtain the number of photons corresponding to each spectrum.

In one embodiment, the area between each spectrum and the horizontal axis can be obtained by integrating the spectral absolute energy of each spectrum.

In one embodiment, the generating the quantum yield of the material to be tested according to the excitation light spectrum, the photoluminescence spectrum, and the transmission spectrum, further includes:

η=Ne/Na;

In one embodiment, the setting of the area between the preset excitation light spectrum band and the horizontal axis of wavelength as the number of photons in the excitation light spectrum includes:

Ea1=h*c/λ;

△N＝P(λ)*△λ/Ea1;

Where Ea1 is the energy value of the excitation light spectrum, h is the Planck constant, c is the speed of light, λ1 is the first wavelength in the preset wavelength range, and λ2 is the second in the preset wavelength range The wavelength, P(λ) is the absolute power, and Na1 is the number of photons in the excitation light spectrum.

In one embodiment, the setting of the area between the preset transmission spectrum band and the horizontal axis of wavelength as the number of photons in the excitation light spectrum includes:

Acquiring the energy value of the transmission spectrum through the transmission spectrum;

The energy value of the transmission spectrum is calculated by the preset photon number relationship of the transmission spectrum, and the preset photon number relationship of the transmission spectrum is:

Ea2=h*c/λ;

△N＝P(λ)*△λ/Ea2;

Where Ea2 is the energy value of the transmission spectrum, h is the Planck constant, c is the speed of light, λ1 is the first wavelength in the preset wavelength range, and λ2 is the second wavelength in the preset wavelength range , P(λ) is the absolute power, and Na2 is the number of photons in the transmission spectrum.

In one embodiment, Na is the difference between the number of photons in the excitation light spectrum and the number of photons in the transmission spectrum, that is, Na=Na1-Na2.

In one embodiment, the setting of the area between the preset photoluminescence spectrum band and the horizontal axis as the number of photons in the photoluminescence spectrum includes:

Ee=h*c/λ;

△N＝P(λ)*△λ/Ee;

The above are only optional embodiments of this application and are not intended to limit this application. Any modification, equivalent replacement and improvement made within the spirit and principle of this application should be included in the protection of this application Within range.

Claims

A quantum yield test method, characterized in that the test method includes:

Put the material to be tested inside the integrating sphere and obtain the excitation light spectrum of the excitation light;

Irradiating the excitation light on the surface of the material to be measured to obtain a photoluminescence spectrum of the material to be tested and a transmission spectrum of the excitation light;

The quantum yield of the material to be measured is generated according to the excitation light spectrum, the photoluminescence spectrum, and the transmission spectrum.
The test method according to claim 1, wherein the acquiring the excitation light spectrum of the excitation light comprises:

Irradiating the excitation light on the inner wall of the integrating sphere through the entrance of the integrating sphere;

The excitation light spectrum of the excitation light emitted from the exit of the integrating sphere is detected.
The test method according to claim 1, wherein irradiating the excitation light on the surface of the material to be measured to obtain the photoluminescence spectrum of the material to be tested and the transmission spectrum of the excitation light include:

Adjusting the incident angle of the excitation light so that the excitation light irradiates the surface of the material to be measured;

Detecting the photoluminescence spectrum of the material to be tested and the transmission spectrum of the excitation light emitted from the exit of the integrating sphere.
The test method according to claim 3, wherein the adjusting the incident angle of the excitation light so that the excitation light irradiates the surface of the material to be measured includes:

Receiving the excitation light through a rotatable angle mirror device;

The angle of incidence of the excitation light into the integrating sphere is adjusted by adjusting the angle of the rotatable angle mirror device, so that the excitation light irradiates the surface of the material to be measured.
The test method according to claim 4, wherein the angle of incidence of the excitation light into the integrating sphere is adjusted by adjusting the angle of the rotatable angle mirror device so that the excitation light Irradiation to the surface of the material to be measured includes:

Adjust the angle of the rotatable angle mirror device;

A focusing lens is provided between the rotatable angle mirror device and the integrating sphere;

The angle of the rotatable angle mirror device is adjusted so that the excitation light irradiates the surface of the material to be measured after passing through a focusing lens.
The test method according to claim 4, wherein the rotatable angle mirror device includes:

An optical mirror is used to receive the excitation light and reflect the excitation light;

A mirror support rod for fixing the optical mirror, and the mirror support rod is connected to the optical mirror; and

An electric rotating table is used to adjust the angle of the optical mirror through the mirror support rod, and the electric rotating table is connected with the mirror support rod.
The test method according to claim 1, wherein the generating the quantum yield of the material to be tested according to the excitation light spectrum, the photoluminescence spectrum, and the transmission spectrum includes:

Obtaining a preset excitation light spectrum band from the excitation light spectrum according to a preset wavelength range, a preset photoluminescence spectrum band from the photoluminescence spectrum, and a preset transmission spectrum band from the transmission spectrum;

The area between the preset excitation light spectrum band and the horizontal axis of wavelength is set as the number of photons in the excitation light spectrum, and the area between the preset photoluminescence spectrum band and the horizontal axis of wavelength is For the photon number of the photoluminescence spectrum, the area between the preset transmission spectrum band and the horizontal axis of the wavelength is taken as the photon number of the transmission spectrum.
The test method according to claim 7, wherein the generating the quantum yield of the material to be tested according to the excitation light spectrum, the photoluminescence spectrum, and the transmission spectrum further comprises:

The excitation light spectrum, the photoluminescence spectrum, and the transmission spectrum are generated by a preset quantum yield relationship, and the preset quantum yield relationship is:

η=Ne/Na;

Where η is the quantum yield of the material to be measured, Ne is the number of photons in the photoluminescence spectrum, and Na is the difference between the number of photons in the excitation light spectrum and the number of photons in the transmission spectrum.
The test method according to claim 7, wherein the area between the preset excitation light spectrum band and the horizontal axis of wavelength is set as the number of photons in the excitation light spectrum, including:

Obtaining the energy value of the excitation light spectrum through the excitation light spectrum;

The energy value of the excitation light spectrum is calculated by the preset photon number relationship of the excitation light spectrum, and the preset photon number relationship of the excitation light spectrum is:

Ea1=h*c/λ;

△N＝P(λ)*△λ/Ea1;

Where Ea1 is the energy value of the excitation light spectrum, h is the Planck constant, c is the speed of light, λ1 is the first wavelength in the preset wavelength range, and λ2 is the second in the preset wavelength range Wavelength, P(λ) is absolute power.
The test method according to claim 7, wherein the area between the preset photoluminescence spectrum band and the horizontal axis of wavelength is set as the number of photons in the photoluminescence spectrum, including:

Obtaining the energy value of the photoluminescence spectrum through the photoluminescence spectrum;

The energy value of the photoluminescence spectrum is calculated by a preset photon number relationship of photoluminescence spectrum, and the photon number relationship of the preset photoluminescence spectrum is:

Ee=h*c/λ;

△N＝P(λ)*△λ/Ee;

Where Ee is the energy value of the photoluminescence spectrum, h is the Planck constant, c is the speed of light, λ1 is the first wavelength in the preset wavelength range, and λ2 is the first in the preset wavelength range At two wavelengths, P(λ) is the absolute power, and Ne is the number of photons in the photoluminescence spectrum.