WO2020133672A1 - Array substrate and manufacturing method therefor and display panel - Google Patents

Array substrate and manufacturing method therefor and display panel Download PDF

Info

Publication number
WO2020133672A1
WO2020133672A1 PCT/CN2019/076232 CN2019076232W WO2020133672A1 WO 2020133672 A1 WO2020133672 A1 WO 2020133672A1 CN 2019076232 W CN2019076232 W CN 2019076232W WO 2020133672 A1 WO2020133672 A1 WO 2020133672A1
Authority
WO
WIPO (PCT)
Prior art keywords
layer
array substrate
active layer
electrode
drain
Prior art date
Application number
PCT/CN2019/076232
Other languages
French (fr)
Chinese (zh)
Inventor
陈书志
陈俊吉
Original Assignee
深圳市华星光电半导体显示技术有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 深圳市华星光电半导体显示技术有限公司 filed Critical 深圳市华星光电半导体显示技术有限公司
Publication of WO2020133672A1 publication Critical patent/WO2020133672A1/en

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/70Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
    • H01L21/77Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/02Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier
    • H01L27/12Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being other than a semiconductor body, e.g. an insulating body

Definitions

  • the present application relates to the field of display, in particular to an array substrate, a manufacturing method thereof, and a display panel.
  • metal oxide-based thin film transistors have received more and more attention because of their advantages of high mobility, good light transmittance, stable thin film structure, low manufacturing temperature, and low cost.
  • metal oxide TFTs represented by indium gallium zinc oxide (In-Ga-Zn-O, IGZO) are highly compatible with current a-Si TFTs, and are thus obtained in the production of large-size display panels Has been widely used.
  • the method for preparing a thin film transistor in the prior art includes four photomask steps, respectively:
  • the array substrate manufacturing process adopts a photomask process, which is used many times, and the production process is complicated and the cost is high.
  • an array substrate including:
  • An active layer provided on the substrate
  • a gate insulating layer provided on the active layer
  • the active layer includes source and drain at both ends, and a channel region between the source and the drain.
  • the material for manufacturing the active layer includes one of polysilicon and indium gallium zinc oxide.
  • the preparation material of the active layer includes indium gallium zinc oxide.
  • the active layer further includes a pixel electrode, and the pixel electrode is located on a side of the channel region away from the source electrode.
  • the position and pattern of the gate insulating layer correspond to the position and pattern of the channel region.
  • the array substrate further includes:
  • a passivation layer disposed above the metal layer and covering the active layer
  • a transparent electrode provided on the passivation layer.
  • the pixel electrode, the source electrode and the drain electrode are arranged in the same layer.
  • a method for manufacturing an array substrate including:
  • Step S10 Provide a substrate
  • Step S20 forming a layer patterned channel layer on the substrate through a first photomask process
  • Step S30 forming a stacked patterned gate insulating layer and a patterned metal layer on the substrate through a second photomask process, the gate insulating layer being in contact with the channel layer;
  • Step S40 the metal layer is used as a photomask, and ion implantation is performed on both ends of the channel layer to form an active layer, the active layer includes a channel region in the middle, and Source and drain.
  • the material for manufacturing the active layer includes one of polysilicon and indium gallium zinc oxide.
  • the preparation material of the active layer includes indium gallium zinc oxide
  • the active layer further includes a pixel electrode
  • the pixel electrode is located on a side of the channel region away from the source electrode ,
  • the pixel electrode, the source electrode and the drain electrode are formed in the same ion implantation.
  • a plasma process is used to ion implant the channel layer.
  • the manufacturing method of the array substrate further includes:
  • Step S50 forming a non-metal layer on the metal layer, and patterning the non-metal layer using a third photomask process to form a passivation layer;
  • Step S60 forming a transparent electrode on the passivation layer.
  • a display panel which includes an array substrate and a color filter substrate disposed oppositely, the array substrate including:
  • An active layer provided on the substrate
  • a gate insulating layer provided on the active layer
  • the active layer includes source and drain at both ends, and a channel region between the source and the drain.
  • the material for manufacturing the active layer includes one of polysilicon and indium gallium zinc oxide.
  • the preparation material of the active layer includes indium gallium zinc oxide.
  • the active layer further includes a pixel electrode, and the pixel electrode is located on a side of the channel region away from the source electrode.
  • the position and pattern of the gate insulating layer correspond to the position and pattern of the channel region.
  • the array substrate further includes:
  • a passivation layer disposed above the metal layer and covering the active layer
  • a transparent electrode provided on the passivation layer.
  • the pixel electrode, the source electrode and the drain electrode are arranged in the same layer.
  • FIG. 1 is a schematic structural diagram of an array substrate provided by a first embodiment of this application;
  • FIG. 2 is a schematic structural diagram of an array substrate provided by a second embodiment of this application.
  • FIG. 3 is a schematic structural diagram of an array substrate provided by a third embodiment of the present application.
  • FIG. 4 is a schematic structural diagram of an array substrate provided by a fourth embodiment of the present application.
  • FIG. 5 is a schematic flow chart of a method for manufacturing an array substrate provided by a fifth embodiment of the present application.
  • 6a-6c are schematic structural diagrams of a method for manufacturing an array substrate provided in a fifth embodiment of the present application.
  • FIG. 7 is a schematic structural diagram of an array substrate in a method for manufacturing an array substrate provided in a sixth embodiment of the present application.
  • the present application provides an array substrate, a manufacturing method thereof, and a display panel, to solve the problems that the existing array substrate manufacturing process uses a photomask process more times, the production process is complicated, and the cost is higher.
  • FIG. 1 is a schematic structural diagram of an array substrate according to a first embodiment of the present application.
  • the present application provides an array substrate 100 including a substrate 11, an active layer 12, a gate insulating layer 13, and a metal layer 14.
  • the substrate 11 is one of a flexible substrate and a rigid substrate.
  • the flexible substrate is made of polyimide.
  • the rigid substrate is made of a glass substrate.
  • the material for preparing the active layer 12 includes but is not limited to one of polysilicon and indium gallium zinc oxide (IGZO).
  • IGZO indium gallium zinc oxide
  • the indium gallium zinc oxide is a transparent material.
  • the active layer 12 includes a source 121 and a drain 122 at both ends, and a channel region 123 between the source 121 and the drain 122.
  • the source electrode 121 and the drain electrode 122 in this application are directly disposed on both sides of the channel region 123, thereby avoiding the increase in the number of film layers caused by separately setting the source electrode 121 and the drain electrode 122.
  • the problem of the increase in the mask process further saves the manufacturing cost of the array substrate 100.
  • FIG. 2 is a schematic structural diagram of an array substrate provided by a second embodiment of the present application.
  • the active layer 12 is made of indium gallium zinc oxide. Since the indium gallium zinc oxide is a transparent material, the pixel electrode 124 of the array substrate 100 can also be provided in the same layer as the channel region 123 and the source 121 and the drain 122.
  • the active layer 12 further includes a pixel electrode 124, which is located on the side of the channel region 123 away from the source electrode 121, that is, the source electrode 121 is located on the side of the channel region 123,
  • the drain 122 and the pixel electrode 124 are located on the other side of the channel region 123, thereby avoiding separate preparation of the pixel electrode 124 and simplifying the film layer structure of the array substrate 100.
  • the material for preparing the gate insulating layer 13 includes at least one of silicon nitride and silicon oxide, and the gate insulating layer 13 is used to protect the metal layer 14.
  • the position and pattern of the gate insulating layer 13 correspond to the position and pattern of the channel region 123.
  • the metal layer 14 is a gate metal layer.
  • the material for preparing the metal layer 14 includes one of aluminum, copper, and aluminum neodymium alloy.
  • FIG. 3 is a schematic structural diagram of an array substrate according to a third embodiment of the present application.
  • FIG. 4 is a schematic structural diagram of an array substrate according to a fourth embodiment of the present application.
  • the difference between the third embodiment and the fourth embodiment of the present application lies in whether the pixel electrode 124 in the array substrate 100 is arranged in the same layer as the source 121, the drain 122, and the channel region 123.
  • Specific applications can be set according to actual conditions. Here No limitation.
  • the array substrate 100 further includes a passivation layer 15 and a transparent electrode 16 disposed on the metal layer 14;
  • the passivation layer 15 is disposed above the metal layer 14 and covers the active layer 12;
  • the transparent electrode 16 is provided on the passivation layer 15.
  • FIG. 5 is a schematic flowchart of a method for manufacturing an array substrate according to a fifth embodiment of the present application.
  • a method for manufacturing an array substrate including the following steps.
  • step S10 a substrate 11 is provided.
  • the substrate 11 is one of a flexible substrate and a rigid substrate.
  • the flexible substrate is made of polyimide.
  • the rigid substrate is made of a glass substrate.
  • Step S20 forming a layer patterned channel layer 17 on the substrate through a first photomask process.
  • the channel layer 17 is ion-implanted to form the active layer 12, and the material for preparing the channel layer 17 includes but is not limited to one of polysilicon and indium gallium zinc oxide.
  • step S30 a stacked patterned gate insulating layer 13 and a patterned metal layer 14 are formed on the substrate by a second photomask process, and the gate insulating layer 13 is in contact with the channel layer 17.
  • the step S30 specifically includes: sequentially depositing a non-metallic film layer and a metal film layer on the channel layer 17, and patterning the non-metallic film layer and the metal film layer using a second photomask process to form a pattern Gate insulation layer 13 and patterned metal layer 14.
  • step S40 using the metal layer 14 as a photomask, ion implanting the two ends of the channel layer 17 to form an active layer 12, the active layer 12 includes a channel region 123 in the middle And the source 121 and the drain 122 located at both ends of the channel region 123 respectively.
  • the channel region 123 is an undoped region, which is a semiconductor; the source 121 and the drain 122 at both ends are ion-doped and are conductors .
  • FIG. 7 is a schematic structural diagram of an array substrate in a method for manufacturing an array substrate according to a sixth embodiment of the present application.
  • the preparation material of the active layer 12 includes indium gallium zinc oxide
  • the active layer 12 further includes a pixel electrode 124
  • the pixel electrode 124 is located in the channel region 123 away from the source
  • the pixel electrode 124, the source electrode 121 and the drain electrode 122 are formed in the same ion implantation, thereby avoiding the separate preparation of the pixel electrode 124 and simplifying the film layer structure of the array substrate 100 .
  • a plasma process is used to ion implant the channel layer 17.
  • the manufacturing method of the array substrate 100 further includes:
  • Step S50 forming a non-metal layer on the metal layer 14, and patterning the non-metal layer using a third photomask process to form a passivation layer 15.
  • Step S60 forming a transparent electrode 16 on the passivation layer 15.
  • the step S60 specifically includes: coating a photoresist layer on the passivation layer 15 outside the coverage area of the transparent electrode 16, depositing the transparent electrode 16 on the passivation layer 15, and peeling off The photoresist layer forms a transparent electrode 16.

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Manufacturing & Machinery (AREA)
  • Thin Film Transistor (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)

Abstract

The present application provides an array substrate and a manufacturing method therefor, and a display panel. The array substrate comprises: a substrate. An active layer is disposed on the substrate. A gate insulating layer is disposed on the active layer. A metal layer is disposed on the gate insulating layer. The active layer comprises a source and a drain at two ends thereof, and a channel region disposed between the source and the drain.

Description

阵列基板及其制作方法、显示面板Array substrate, manufacturing method thereof, and display panel 技术领域Technical field
本申请涉及显示领域,特别涉及一种阵列基板及其制作方法、显示面板。The present application relates to the field of display, in particular to an array substrate, a manufacturing method thereof, and a display panel.
背景技术Background technique
近年来,基于金属氧化物的薄膜晶体管因为其迁移率高、透光性好、薄膜结构稳定、制备温度低以及成本低等优点受到越来越多的重视。特别是以铟镓锌氧化物(In-Ga-Zn-O,IGZO)为代表的金属氧化物TFT,与目前a-Si TFT制成兼容性较高,因而在大尺寸显示面板的生产中得到了广泛的应用。In recent years, metal oxide-based thin film transistors have received more and more attention because of their advantages of high mobility, good light transmittance, stable thin film structure, low manufacturing temperature, and low cost. In particular, metal oxide TFTs represented by indium gallium zinc oxide (In-Ga-Zn-O, IGZO) are highly compatible with current a-Si TFTs, and are thus obtained in the production of large-size display panels Has been widely used.
现有技术中制备薄膜晶体管的方法包括四个光罩步骤,分别为:The method for preparing a thin film transistor in the prior art includes four photomask steps, respectively:
使用第一光罩在基板上制作有源层图案;Use the first photomask to make an active layer pattern on the substrate;
使用第二光罩制作第一绝缘层图案;Use the second photomask to make the first insulating layer pattern;
使用第三光罩制作金属层图案;Use the third mask to make the metal layer pattern;
使用第四光罩制作第二绝缘层图案;Use the fourth photomask to make the second insulating layer pattern;
使用第五光罩制作漏极和源极图案。Use the fifth mask to make the drain and source patterns.
因此,如何节省光罩的成本及简化工艺为业界所持续研究的课题。Therefore, how to save the cost of the reticle and simplify the process is the subject of continuous research in the industry.
技术问题technical problem
阵列基板制程采用光罩工艺使用次数较多,生产工艺复杂且成本较高的问题。The array substrate manufacturing process adopts a photomask process, which is used many times, and the production process is complicated and the cost is high.
技术解决方案Technical solution
为解决上述问题,本申请提供的技术方案如下:In order to solve the above problems, the technical solutions provided by this application are as follows:
根据本申请的一个方面,提供了一种阵列基板,包括:According to an aspect of the present application, an array substrate is provided, including:
基板;Substrate
设置在所述基板上的有源层;An active layer provided on the substrate;
设置在所述有源层上的栅绝缘层;A gate insulating layer provided on the active layer;
设置在所述栅绝缘层上的金属层;A metal layer provided on the gate insulating layer;
其中,所述有源层包括两端的源极和漏极,以及位于所述源极和所述漏极之间的沟道区。Wherein, the active layer includes source and drain at both ends, and a channel region between the source and the drain.
根据本申请一实施例,所述有源层的制作材料包括多晶硅和铟镓锌氧化物中的其中一者。According to an embodiment of the present application, the material for manufacturing the active layer includes one of polysilicon and indium gallium zinc oxide.
根据本申请一实施例,所述有源层的制备材料包括铟镓锌氧化物。According to an embodiment of the present application, the preparation material of the active layer includes indium gallium zinc oxide.
根据本申请一实施例,所述有源层还包括像素电极,所述像素电极位于所述沟道区远离所述源极的一侧。According to an embodiment of the present application, the active layer further includes a pixel electrode, and the pixel electrode is located on a side of the channel region away from the source electrode.
根据本申请一实施例,所述栅绝缘层的位置和图案与所述沟道区的位置和图案相对应。According to an embodiment of the present application, the position and pattern of the gate insulating layer correspond to the position and pattern of the channel region.
根据本申请一实施例,所述阵列基板还包括:According to an embodiment of the present application, the array substrate further includes:
设置在所述金属层上方并覆盖所述有源层的钝化层;A passivation layer disposed above the metal layer and covering the active layer;
设置在所述钝化层上的透明电极。A transparent electrode provided on the passivation layer.
根据本申请一实施例,所述像素电极、所述源极和所述漏极同层设置。According to an embodiment of the present application, the pixel electrode, the source electrode and the drain electrode are arranged in the same layer.
根据本申请的另一个发明、还提供了一种阵列基板的制作方法,包括:According to another invention of the present application, a method for manufacturing an array substrate is also provided, including:
步骤S10、提供一基板;Step S10: Provide a substrate;
步骤S20、在所述基板上通过第一光罩工艺形成层图案化的通道层;Step S20, forming a layer patterned channel layer on the substrate through a first photomask process;
步骤S30、在所述基板上通过第二光罩工艺形成层叠设置的图案化的栅绝缘层和图案化的金属层,所述栅绝缘层与所述通道层接触;Step S30, forming a stacked patterned gate insulating layer and a patterned metal layer on the substrate through a second photomask process, the gate insulating layer being in contact with the channel layer;
步骤S40、以所述金属层作为光罩,对所述通道层的两端进行离子注入以形成有源层,所述有源层包括中间的沟道区以及分别位于所述沟道区两端的源极和漏极。Step S40, the metal layer is used as a photomask, and ion implantation is performed on both ends of the channel layer to form an active layer, the active layer includes a channel region in the middle, and Source and drain.
根据本申请一实施例,所述有源层的制作材料包括多晶硅和铟镓锌氧化物中的其中一者。According to an embodiment of the present application, the material for manufacturing the active layer includes one of polysilicon and indium gallium zinc oxide.
根据本申请一实施例,所述有源层的制备材料包括铟镓锌氧化物,所述有源层还包括像素电极,所述像素电极位于所述沟道区远离所述源极的一侧,所述像素电极、所述源极与所述漏极在同一道离子注入中形成。According to an embodiment of the present application, the preparation material of the active layer includes indium gallium zinc oxide, the active layer further includes a pixel electrode, and the pixel electrode is located on a side of the channel region away from the source electrode , The pixel electrode, the source electrode and the drain electrode are formed in the same ion implantation.
根据本申请一实施例,采用电浆工艺对所述通道层进行离子注入。According to an embodiment of the present application, a plasma process is used to ion implant the channel layer.
根据本申请一实施例,所述阵列基板的制作方法还包括:According to an embodiment of the present application, the manufacturing method of the array substrate further includes:
步骤S50、在所述金属层上形成非金属层,采用第三光罩工艺对所述非金属层进行图案化以形成钝化层;Step S50, forming a non-metal layer on the metal layer, and patterning the non-metal layer using a third photomask process to form a passivation layer;
步骤S60、在所述钝化层上形成透明电极。Step S60, forming a transparent electrode on the passivation layer.
根据本申请的又一个方面,还提供了一种显示面板,其包括相对设置的阵列基板和彩膜基板,所述阵列基板包括:According to yet another aspect of the present application, there is also provided a display panel, which includes an array substrate and a color filter substrate disposed oppositely, the array substrate including:
基板;Substrate
设置在所述基板上的有源层;An active layer provided on the substrate;
设置在所述有源层上的栅绝缘层;A gate insulating layer provided on the active layer;
设置在所述栅绝缘层上的金属层;A metal layer provided on the gate insulating layer;
其中,所述有源层包括两端的源极和漏极,以及位于所述源极和所述漏极之间的沟道区。Wherein, the active layer includes source and drain at both ends, and a channel region between the source and the drain.
根据本申请一实施例,所述有源层的制作材料包括多晶硅和铟镓锌氧化物中的其中一者。According to an embodiment of the present application, the material for manufacturing the active layer includes one of polysilicon and indium gallium zinc oxide.
根据本申请一实施例,所述有源层的制备材料包括铟镓锌氧化物.According to an embodiment of the present application, the preparation material of the active layer includes indium gallium zinc oxide.
根据本申请一实施例,所述有源层还包括像素电极,所述像素电极位于所述沟道区远离所述源极的一侧。According to an embodiment of the present application, the active layer further includes a pixel electrode, and the pixel electrode is located on a side of the channel region away from the source electrode.
根据本申请一实施例,所述栅绝缘层的位置和图案与所述沟道区的位置和图案相对应。According to an embodiment of the present application, the position and pattern of the gate insulating layer correspond to the position and pattern of the channel region.
根据本申请一实施例,所述阵列基板还包括:According to an embodiment of the present application, the array substrate further includes:
设置在所述金属层上方并覆盖所述有源层的钝化层;A passivation layer disposed above the metal layer and covering the active layer;
设置在所述钝化层上的透明电极。A transparent electrode provided on the passivation layer.
根据本申请一实施例,所述像素电极、所述源极和所述漏极同层设置。According to an embodiment of the present application, the pixel electrode, the source electrode and the drain electrode are arranged in the same layer.
有益效果Beneficial effect
有益效果:本申请通过将有源层的两端直接作为源极和漏极使用,从而在省掉一层绝缘层的基础上,能够减少两道光罩制程,有效的简化了阵列基板的制作工艺,减少了产品的成本。Beneficial effect: In this application, the two ends of the active layer are directly used as the source and drain, so that on the basis of eliminating an insulating layer, two mask processes can be reduced, and the manufacturing process of the array substrate is effectively simplified , Reducing the cost of the product.
附图说明BRIEF DESCRIPTION
为了更清楚地说明实施例或现有技术中的技术方案,下面将对实施例或现有技术描述中所需要使用的附图作简单介绍,显而易见地,下面描述中的附图仅仅是发明的一些实施例,对于本领域普通技术人员来讲,在不付出创造性劳动的前提下,还可以根据这些附图获得其他的附图。In order to more clearly explain the embodiments or the technical solutions in the prior art, the following will briefly introduce the drawings required in the embodiments or the description of the prior art. Obviously, the drawings in the following description are only inventions. For some embodiments, those of ordinary skill in the art can obtain other drawings based on these drawings without creative efforts.
图1为本申请第一实施例提供的阵列基板的结构示意图;FIG. 1 is a schematic structural diagram of an array substrate provided by a first embodiment of this application;
图2为本申请第二实施例提供的阵列基板的结构示意图;2 is a schematic structural diagram of an array substrate provided by a second embodiment of this application;
图3为本申请第三实施例提供的阵列基板的结构示意图;3 is a schematic structural diagram of an array substrate provided by a third embodiment of the present application;
图4为本申请第四实施例提供的阵列基板的结构示意图;4 is a schematic structural diagram of an array substrate provided by a fourth embodiment of the present application;
图5为本申请第五实施例提供的阵列基板的制作方法的流程示意图;5 is a schematic flow chart of a method for manufacturing an array substrate provided by a fifth embodiment of the present application;
图6a-6c为本申请第五实施例提供的阵列基板的制作方法的结构示意图;6a-6c are schematic structural diagrams of a method for manufacturing an array substrate provided in a fifth embodiment of the present application;
图7为本申请第六实施例提供的阵列基板的制作方法中阵列基板的结构示意图。7 is a schematic structural diagram of an array substrate in a method for manufacturing an array substrate provided in a sixth embodiment of the present application.
本发明的实施方式Embodiments of the invention
以下各实施例的说明是参考附加的图示,用以例示本发明可用以实施的特定实施例。本发明所提到的方向用语,例如[上]、[下]、[前]、[后]、[左]、[右]、[内]、[外]、[侧面]等,仅是参考附加图式的方向。因此,使用的方向用语是用以说明及理解本发明,而非用以限制本发明。在图中,结构相似的单元是用以相同标号表示。The descriptions of the following embodiments refer to additional drawings to illustrate specific embodiments that can be implemented by the present invention. Directional terms mentioned in the present invention, such as [upper], [lower], [front], [back], [left], [right], [inner], [outer], [side], etc., are for reference only Attach the direction of the schema. Therefore, the directional terminology is used to illustrate and understand the present invention, not to limit the present invention. In the figure, units with similar structures are indicated by the same reference numerals.
本申请提供一种阵列基板及其制作方法、显示面板,以解决现有阵列基板制程采用光罩工艺使用次数较多,生产工艺复杂且成本较高的问题。The present application provides an array substrate, a manufacturing method thereof, and a display panel, to solve the problems that the existing array substrate manufacturing process uses a photomask process more times, the production process is complicated, and the cost is higher.
请参阅图1,图1为本申请第一实施例提供的阵列基板的结构示意图。Please refer to FIG. 1, which is a schematic structural diagram of an array substrate according to a first embodiment of the present application.
本申请提供了一种阵列基板100,包括基板11、有源层12、栅绝缘层13、金属层14。The present application provides an array substrate 100 including a substrate 11, an active layer 12, a gate insulating layer 13, and a metal layer 14.
在一种实施例中,所述基板11为柔性基板和刚性基板中的其中一者。In one embodiment, the substrate 11 is one of a flexible substrate and a rigid substrate.
在一种实施例中,所述柔性基板的制备材料为聚酰亚胺。In one embodiment, the flexible substrate is made of polyimide.
在一种实施例中,所述刚性基板的制备材料为玻璃基板。In one embodiment, the rigid substrate is made of a glass substrate.
在一种实施例中,所述有源层12的制备材料包括但不仅限于多晶硅和铟镓锌氧化物(IGZO)中的其中一者。所述铟镓锌氧化物为透明材料。In one embodiment, the material for preparing the active layer 12 includes but is not limited to one of polysilicon and indium gallium zinc oxide (IGZO). The indium gallium zinc oxide is a transparent material.
所述有源层12包括两端的源极121和漏极122,以及位于所述源极121和所述漏极122之间的沟道区123。The active layer 12 includes a source 121 and a drain 122 at both ends, and a channel region 123 between the source 121 and the drain 122.
相对于现有的阵列基板,本申请中的源极121与漏极122直接设置在沟道区123的两侧,从而避免了单独设置源极121、漏极122导致的膜层数目增加,光罩工艺增加的问题,进而节省了阵列基板100的制备成本。Compared with the existing array substrate, the source electrode 121 and the drain electrode 122 in this application are directly disposed on both sides of the channel region 123, thereby avoiding the increase in the number of film layers caused by separately setting the source electrode 121 and the drain electrode 122. The problem of the increase in the mask process further saves the manufacturing cost of the array substrate 100.
请参阅图2,图2为本申请第二实施例提供的阵列基板的结构示意图。Please refer to FIG. 2, which is a schematic structural diagram of an array substrate provided by a second embodiment of the present application.
在一种实施例中,所述有源层12的制备材料包括铟镓锌氧化物。由于铟镓锌氧化物为透明材料,因此阵列基板100的像素电极124也能够与沟道区123、源极121个漏极122同层设置。In one embodiment, the active layer 12 is made of indium gallium zinc oxide. Since the indium gallium zinc oxide is a transparent material, the pixel electrode 124 of the array substrate 100 can also be provided in the same layer as the channel region 123 and the source 121 and the drain 122.
所述有源层12还包括像素电极124,所述像素电极124位于所述沟道区123远离所述源极121的一侧,即所述源极121位于所述沟道区123一侧,所述漏极122和所述像素电极124位于所述沟道区123的另一侧,从而避免了像素电极124的单独制备,简化了阵列基板100的膜层结构。The active layer 12 further includes a pixel electrode 124, which is located on the side of the channel region 123 away from the source electrode 121, that is, the source electrode 121 is located on the side of the channel region 123, The drain 122 and the pixel electrode 124 are located on the other side of the channel region 123, thereby avoiding separate preparation of the pixel electrode 124 and simplifying the film layer structure of the array substrate 100.
在一种实施例中,所述栅绝缘层13的制备材料包括氮化硅和氧化硅中的至少一者,所述栅绝缘层13用于保护所述金属层14。In one embodiment, the material for preparing the gate insulating layer 13 includes at least one of silicon nitride and silicon oxide, and the gate insulating layer 13 is used to protect the metal layer 14.
在一种实施例中,所述栅绝缘层13的位置和图案与所述沟道区123的位置和图案相对应。In one embodiment, the position and pattern of the gate insulating layer 13 correspond to the position and pattern of the channel region 123.
在一种实施例中,所述金属层14为栅极金属层。In one embodiment, the metal layer 14 is a gate metal layer.
在一种实施例中,所述金属层14的制备材料包括铝、铜、铝钕合金中的其中一者。In an embodiment, the material for preparing the metal layer 14 includes one of aluminum, copper, and aluminum neodymium alloy.
请参阅图3,图3为本申请第三实施例提供的阵列基板的结构示意图。Please refer to FIG. 3, which is a schematic structural diagram of an array substrate according to a third embodiment of the present application.
请参阅图4,图4为本申请第四实施例提供的阵列基板的结构示意图。Please refer to FIG. 4, which is a schematic structural diagram of an array substrate according to a fourth embodiment of the present application.
本申请第三实施例和第四实施例的区别在于阵列基板100中的像素电极124是否与源极121、漏极122和沟道区123同层设置,具体应用可根据实际情况进行设置,这里不做限定。The difference between the third embodiment and the fourth embodiment of the present application lies in whether the pixel electrode 124 in the array substrate 100 is arranged in the same layer as the source 121, the drain 122, and the channel region 123. Specific applications can be set according to actual conditions. Here No limitation.
在一种实施例中,所述阵列基板100还包括设置在所述金属层14上的钝化层15和透明电极16;In one embodiment, the array substrate 100 further includes a passivation layer 15 and a transparent electrode 16 disposed on the metal layer 14;
其中,所述钝化层15在设置在所述金属层14上方并覆盖所述有源层12;Wherein, the passivation layer 15 is disposed above the metal layer 14 and covers the active layer 12;
所述透明电极16设置在所述钝化层15上。The transparent electrode 16 is provided on the passivation layer 15.
请参阅图5,图5为本申请第五实施例提供的阵列基板的制作方法的流程示意图。Please refer to FIG. 5, which is a schematic flowchart of a method for manufacturing an array substrate according to a fifth embodiment of the present application.
根据本申请的另一个方面,还提供了一种阵列基板的制作方法,包括以下步骤。According to another aspect of the present application, a method for manufacturing an array substrate is also provided, including the following steps.
请参阅图6a,步骤S10、提供一种基板11。Referring to FIG. 6a, step S10, a substrate 11 is provided.
在一种实施例中,所述基板11为柔性基板和刚性基板中的其中一者。In one embodiment, the substrate 11 is one of a flexible substrate and a rigid substrate.
在一种实施例中,所述柔性基板的制备材料为聚酰亚胺。In one embodiment, the flexible substrate is made of polyimide.
在一种实施例中,所述刚性基板的制备材料为玻璃基板。In one embodiment, the rigid substrate is made of a glass substrate.
步骤S20、在所述基板上通过第一光罩工艺形成层图案化的通道层17。Step S20, forming a layer patterned channel layer 17 on the substrate through a first photomask process.
所述通道层17经过离子注入形成有源层12,所述通道层17的制备材料包括但不仅限于多晶硅和铟镓锌氧化物中的其中一者。The channel layer 17 is ion-implanted to form the active layer 12, and the material for preparing the channel layer 17 includes but is not limited to one of polysilicon and indium gallium zinc oxide.
请参阅图6b,步骤S30、在所述基板上通过第二光罩工艺形成层叠设置的图案化的栅绝缘层13和图案化的金属层14,所述栅绝缘层13与通道层17接触。Referring to FIG. 6b, in step S30, a stacked patterned gate insulating layer 13 and a patterned metal layer 14 are formed on the substrate by a second photomask process, and the gate insulating layer 13 is in contact with the channel layer 17.
所述步骤S30具体包括:在所述通道层17上依次沉积非金属膜层和金属膜层,采用第二光罩工艺对所述非金属膜层和所述金属膜层图案化,进而形成图案化的栅绝缘层13和图案化的金属层14。The step S30 specifically includes: sequentially depositing a non-metallic film layer and a metal film layer on the channel layer 17, and patterning the non-metallic film layer and the metal film layer using a second photomask process to form a pattern Gate insulation layer 13 and patterned metal layer 14.
请参阅图6c,步骤S40、以所述金属层14作为光罩,对所述通道层17的两端进行离子注入以形成有源层12,所述有源层12包括中间的沟道区123以及分别位于所述沟道区123两端的源极121和漏极122。Referring to FIG. 6c, step S40, using the metal layer 14 as a photomask, ion implanting the two ends of the channel layer 17 to form an active layer 12, the active layer 12 includes a channel region 123 in the middle And the source 121 and the drain 122 located at both ends of the channel region 123 respectively.
由于所述沟道区123所在位置被所述金属层14遮挡,因此所述沟道区123为未掺杂区,为半导体;两端的源极121和漏极122均有离子掺杂,为导体。Since the position of the channel region 123 is blocked by the metal layer 14, the channel region 123 is an undoped region, which is a semiconductor; the source 121 and the drain 122 at both ends are ion-doped and are conductors .
请参阅图7,为本申请第六实施例提供的阵列基板的制作方法中阵列基板的结构示意图。Please refer to FIG. 7, which is a schematic structural diagram of an array substrate in a method for manufacturing an array substrate according to a sixth embodiment of the present application.
在一实施例中,所述有源层12的制备材料包括铟镓锌氧化物,所述有源层12还包括像素电极124,所述像素电极124位于所述沟道区123远离所述源极121的一侧,所述像素电极124、所述源极121与所述漏极122在同一道离子注入中形成,从而避免了像素电极124的单独制备,简化了阵列基板100的膜层结构。In an embodiment, the preparation material of the active layer 12 includes indium gallium zinc oxide, the active layer 12 further includes a pixel electrode 124, and the pixel electrode 124 is located in the channel region 123 away from the source On one side of the electrode 121, the pixel electrode 124, the source electrode 121 and the drain electrode 122 are formed in the same ion implantation, thereby avoiding the separate preparation of the pixel electrode 124 and simplifying the film layer structure of the array substrate 100 .
在一实施例中,采用电浆工艺对所述通道层17进行离子注入。In one embodiment, a plasma process is used to ion implant the channel layer 17.
在一实施例中,所述阵列基板100的制作方法还包括:In an embodiment, the manufacturing method of the array substrate 100 further includes:
步骤S50、在所述金属层14上形成非金属层,采用第三光罩工艺对所述非金属层进行图案化以形成钝化层15。Step S50, forming a non-metal layer on the metal layer 14, and patterning the non-metal layer using a third photomask process to form a passivation layer 15.
步骤S60、在所述钝化层15上形成透明电极16。Step S60, forming a transparent electrode 16 on the passivation layer 15.
在一实施例中,所述步骤S60具体包括:在所述钝化层15上处透明电极16覆盖区以外的区域涂布光阻层,在所述钝化层15上沉积透明电极16,剥离所述光阻层,形成透明电极16。In one embodiment, the step S60 specifically includes: coating a photoresist layer on the passivation layer 15 outside the coverage area of the transparent electrode 16, depositing the transparent electrode 16 on the passivation layer 15, and peeling off The photoresist layer forms a transparent electrode 16.
有益效果:本申请通过将有源层的两端直接作为源极和漏极使用,从而在省掉一层绝缘层的基础上,能够减少两道光罩制程,有效的简化了阵列基板的制作工艺,减少了产品的成本。Beneficial effect: In this application, the two ends of the active layer are directly used as the source and drain, so that on the basis of eliminating an insulating layer, two mask processes can be reduced, and the manufacturing process of the array substrate is effectively simplified , Reducing the cost of the product.
综上所述,虽然本申请已以优选实施例揭露如上,但上述优选实施例并非用以限制本申请,本领域的普通技术人员,在不脱离本申请的精神和范围内,均可作各种更动与润饰,因此本申请的保护范围以权利要求界定的范围为准。In summary, although the present application has been disclosed as preferred embodiments above, the above preferred embodiments are not intended to limit the present application. Those of ordinary skill in the art can make various changes without departing from the spirit and scope of the present application Such changes and retouching, so the scope of protection of this application shall be subject to the scope defined by the claims.

Claims (19)

  1. 一种阵列基板,其包括:An array substrate, including:
    基板;Substrate
    设置在所述基板上的有源层;An active layer provided on the substrate;
    设置在所述有源层上的栅绝缘层;A gate insulating layer provided on the active layer;
    设置在所述栅绝缘层上的金属层;A metal layer provided on the gate insulating layer;
    其中,所述有源层包括两端的源极和漏极,以及位于所述源极和所述漏极之间的沟道区。Wherein, the active layer includes source and drain at both ends, and a channel region between the source and the drain.
  2. 根据权利要求1所述的阵列基板,其中,所述有源层的制作材料包括多晶硅和铟镓锌氧化物中的其中一者。The array substrate according to claim 1, wherein the active layer is made of polysilicon and indium gallium zinc oxide.
  3. 根据权利要求1所述的阵列基板,其中,所述有源层的制备材料包括铟镓锌氧化物.The array substrate according to claim 1, wherein the preparation material of the active layer comprises indium gallium zinc oxide.
  4. 根据权利要求3所述的阵列基板,其中,所述有源层还包括像素电极,所述像素电极位于所述沟道区远离所述源极的一侧。The array substrate according to claim 3, wherein the active layer further includes a pixel electrode, the pixel electrode being located on a side of the channel region away from the source electrode.
  5. 根据权利要求1所述的阵列基板,其中,所述栅绝缘层的位置和图案与所述沟道区的位置和图案相对应。The array substrate according to claim 1, wherein the position and pattern of the gate insulating layer correspond to the position and pattern of the channel region.
  6. 根据权利要求1所述的阵列基板,其中,所述阵列基板还包括:The array substrate according to claim 1, wherein the array substrate further comprises:
    设置在所述金属层上方并覆盖所述有源层的钝化层;A passivation layer disposed above the metal layer and covering the active layer;
    设置在所述钝化层上的透明电极。A transparent electrode provided on the passivation layer.
  7. 根据权利要求1所述的阵列基板,其中,所述像素电极、所述源极和所述漏极同层设置。The array substrate according to claim 1, wherein the pixel electrode, the source electrode and the drain electrode are provided in the same layer.
  8. 一种阵列基板的制作方法,其包括:An array substrate manufacturing method includes:
    步骤S10、提供一基板;Step S10: Provide a substrate;
    步骤S20、在所述基板上通过第一光罩工艺形成层图案化的通道层;Step S20, forming a layer patterned channel layer on the substrate through a first photomask process;
    步骤S30、在所述通道层上通过第二光罩工艺形成层叠设置的图案化的栅绝缘层和图案化的金属层,所述栅绝缘层与所述通道层接触;Step S30: forming a stacked patterned gate insulating layer and a patterned metal layer on the channel layer through a second photomask process, the gate insulating layer being in contact with the channel layer;
    步骤S40、以所述金属层作为光罩,对所述通道层的两端进行离子注入以形成有源层,所述有源层包括中间的沟道区以及分别位于所述沟道区两端的源极和漏极。Step S40, the metal layer is used as a photomask, and ion implantation is performed on both ends of the channel layer to form an active layer, the active layer includes a channel region in the middle, and Source and drain.
  9. 根据权利要求8所述的阵列基板的制作方法,其中,所述有源层的制作材料包括多晶硅和铟镓锌氧化物中的其中一者。The method for manufacturing an array substrate according to claim 8, wherein the material for manufacturing the active layer includes one of polysilicon and indium gallium zinc oxide.
  10. 根据权利要求8所述的阵列基板的制作方法,其中,所述有源层的制备材料包括铟镓锌氧化物,所述有源层还包括像素电极,所述像素电极位于所述沟道区远离所述源极的一侧,所述像素电极、所述源极与所述漏极在同一道离子注入中形成。The method for manufacturing an array substrate according to claim 8, wherein the preparation material of the active layer includes indium gallium zinc oxide, the active layer further includes a pixel electrode, and the pixel electrode is located in the channel region On the side far from the source electrode, the pixel electrode, the source electrode and the drain electrode are formed in the same ion implantation.
  11. 根据权利要求8所述的阵列基板的制作方法,其中,采用电浆工艺对所述通道层进行离子注入。The method for manufacturing an array substrate according to claim 8, wherein the channel layer is ion implanted using a plasma process.
  12. 根据权利要求8所述的阵列基板的制作方法,其中,还包括:The method for manufacturing an array substrate according to claim 8, further comprising:
    步骤S50、在所述金属层上形成非金属层,采用第三光罩工艺对所述非金属层进行图案化以形成钝化层;Step S50, forming a non-metal layer on the metal layer, and patterning the non-metal layer using a third photomask process to form a passivation layer;
    步骤S60、在所述钝化层上形成透明电极。Step S60, forming a transparent electrode on the passivation layer.
  13. 一种显示面板,其包括相对设置的阵列基板和彩膜基板,所述阵列基板包括:A display panel includes an array substrate and a color filter substrate disposed oppositely. The array substrate includes:
    基板;Substrate
    设置在所述基板上的有源层;An active layer provided on the substrate;
    设置在所述有源层上的栅绝缘层;A gate insulating layer provided on the active layer;
    设置在所述栅绝缘层上的金属层;A metal layer provided on the gate insulating layer;
    其中,所述有源层包括两端的源极和漏极,以及位于所述源极和所述漏极之间的沟道区。Wherein, the active layer includes source and drain at both ends, and a channel region between the source and the drain.
  14. 根据权利要求13所述的显示面板,其中,所述有源层的制作材料包括多晶硅和铟镓锌氧化物中的其中一者。The display panel according to claim 13, wherein the active layer is made of polysilicon and indium gallium zinc oxide.
  15. 根据权利要求13所述的显示面板,其中,所述有源层的制备材料包括铟镓锌氧化物.The display panel according to claim 13, wherein the preparation material of the active layer comprises indium gallium zinc oxide.
  16. 根据权利要求15所述的显示面板,其中,所述有源层还包括像素电极,所述像素电极位于所述沟道区远离所述源极的一侧。The display panel according to claim 15, wherein the active layer further includes a pixel electrode, the pixel electrode being located on a side of the channel region away from the source electrode.
  17. 根据权利要求13所述的显示面板,其中,所述栅绝缘层的位置和图案与所述沟道区的位置和图案相对应。The display panel according to claim 13, wherein the position and pattern of the gate insulating layer correspond to the position and pattern of the channel region.
  18. 根据权利要求13所述的显示面板,其中,所述阵列基板还包括:The display panel of claim 13, wherein the array substrate further comprises:
    设置在所述金属层上方并覆盖所述有源层的钝化层;A passivation layer disposed above the metal layer and covering the active layer;
    设置在所述钝化层上的透明电极。A transparent electrode provided on the passivation layer.
  19. 根据权利要求13所述的显示面板,其中,所述像素电极、所述源极和所述漏极同层设置。The display panel according to claim 13, wherein the pixel electrode, the source electrode and the drain electrode are provided in the same layer.
PCT/CN2019/076232 2018-12-26 2019-02-27 Array substrate and manufacturing method therefor and display panel WO2020133672A1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
CN201811602885.7A CN109755261A (en) 2018-12-26 2018-12-26 A kind of array substrate and preparation method thereof
CN201811602885.7 2018-12-26

Publications (1)

Publication Number Publication Date
WO2020133672A1 true WO2020133672A1 (en) 2020-07-02

Family

ID=66404142

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/CN2019/076232 WO2020133672A1 (en) 2018-12-26 2019-02-27 Array substrate and manufacturing method therefor and display panel

Country Status (2)

Country Link
CN (1) CN109755261A (en)
WO (1) WO2020133672A1 (en)

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20050134754A1 (en) * 2003-12-22 2005-06-23 Lg.Philips Lcd Co., Ltd. Method of fabricating liquid crystal display device
CN101090125A (en) * 2006-06-12 2007-12-19 三菱电机株式会社 Active matrix display
CN102651403A (en) * 2012-04-16 2012-08-29 京东方科技集团股份有限公司 Thin film transistor, array substrate and manufacturing method of array substrate and display panel
CN103018974A (en) * 2012-11-30 2013-04-03 京东方科技集团股份有限公司 Liquid crystal display device, polysilicon array substrate and manufacturing method
CN104681627A (en) * 2015-03-10 2015-06-03 京东方科技集团股份有限公司 Array substrate, thin-film transistor and manufacturing methods thereof as well as display device

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102237411A (en) * 2010-05-05 2011-11-09 元太科技工业股份有限公司 Oxide thin film transistor and manufacturing method thereof
CN103021942B (en) * 2012-12-14 2015-08-12 京东方科技集团股份有限公司 Array base palte and manufacture method, display unit
CN103715094B (en) * 2013-12-27 2017-02-01 京东方科技集团股份有限公司 Thin film thyristor and manufacturing method thereof, array substrate and manufacturing method thereof and display device

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20050134754A1 (en) * 2003-12-22 2005-06-23 Lg.Philips Lcd Co., Ltd. Method of fabricating liquid crystal display device
CN101090125A (en) * 2006-06-12 2007-12-19 三菱电机株式会社 Active matrix display
CN102651403A (en) * 2012-04-16 2012-08-29 京东方科技集团股份有限公司 Thin film transistor, array substrate and manufacturing method of array substrate and display panel
CN103018974A (en) * 2012-11-30 2013-04-03 京东方科技集团股份有限公司 Liquid crystal display device, polysilicon array substrate and manufacturing method
CN104681627A (en) * 2015-03-10 2015-06-03 京东方科技集团股份有限公司 Array substrate, thin-film transistor and manufacturing methods thereof as well as display device

Also Published As

Publication number Publication date
CN109755261A (en) 2019-05-14

Similar Documents

Publication Publication Date Title
CN105390451B (en) The preparation method of low temperature polycrystalline silicon TFT substrate
CN105489552B (en) The production method of LTPS array substrates
CN106531692A (en) Array substrate and preparation method therefor, and display apparatus
WO2016165185A1 (en) Manufacturing method for dual-gate oxide semiconductor tft substrate, and structure of dual-gate oxide semiconductor tft substrate
WO2017133145A1 (en) Metal-oxide thin film transistor and method for manufacture thereof
WO2019205333A1 (en) Array substrate and manufacturing method therefor
JP2018503869A (en) Array substrate, display panel, and method for preparing array substrate
WO2021027059A1 (en) Array substrate and preparation method therefor, and touch control display panel
WO2017024605A1 (en) Ffs array substrate fabrication method
CN102651343A (en) Manufacturing method of array substrate, array substrate and display device
US10170506B2 (en) LTPS array substrate and method for producing the same
CN105390443A (en) Manufacture method of TFT substrate
WO2017000335A1 (en) Manufacturing method for and structure of tft back plate
JP6110412B2 (en) Thin film transistor array substrate and manufacturing method thereof
WO2020077861A1 (en) Array substrate and preparation method therefor
WO2016026177A1 (en) Method for manufacturing tft substrate, and structure of tft substrate
US11106070B2 (en) Array substrate and manufacturing method of the same and display panel
WO2021026990A1 (en) Array substrate and method for manufacturing same
WO2020019728A1 (en) Thin film transistor and manufacturing method therefor, and array substrate
US20180122840A1 (en) Ltps array substrate and method for producing the same
WO2016145726A1 (en) Low temperature polysilicon thin film transistor array substrate manufacturing method
US20170133515A1 (en) Thin film transistor, array substrate and liquid crystal display panel
WO2020172918A1 (en) Display panel and fabricating method therefor
WO2019104849A1 (en) Method for manufacturing thin film transistor and method for manufacturing array substrate
US20150279873A1 (en) Manufacturing Method of TFT Array Substrate

Legal Events

Date Code Title Description
121 Ep: the epo has been informed by wipo that ep was designated in this application

Ref document number: 19903365

Country of ref document: EP

Kind code of ref document: A1

NENP Non-entry into the national phase

Ref country code: DE

122 Ep: pct application non-entry in european phase

Ref document number: 19903365

Country of ref document: EP

Kind code of ref document: A1