WO2020103313A1 - 显示装置及显示装置有载测试的方法 - Google Patents

显示装置及显示装置有载测试的方法

Info

Publication number
WO2020103313A1
WO2020103313A1 PCT/CN2019/070560 CN2019070560W WO2020103313A1 WO 2020103313 A1 WO2020103313 A1 WO 2020103313A1 CN 2019070560 W CN2019070560 W CN 2019070560W WO 2020103313 A1 WO2020103313 A1 WO 2020103313A1
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WO
WIPO (PCT)
Prior art keywords
display device
timing controller
eye diagram
signal
eye
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/CN2019/070560
Other languages
English (en)
French (fr)
Inventor
李继龙
王月
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
TCL China Star Optoelectronics Technology Co Ltd
Original Assignee
Shenzhen China Star Optoelectronics Technology Co Ltd
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Filing date
Publication date
Application filed by Shenzhen China Star Optoelectronics Technology Co Ltd filed Critical Shenzhen China Star Optoelectronics Technology Co Ltd
Publication of WO2020103313A1 publication Critical patent/WO2020103313A1/zh
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays

Definitions

  • the present application relates to the field of display technology, and in particular, to a display device and a method for on-load testing of a display device.
  • the mass production code includes various control circuits (timing on the printed circuit board) Control circuit, programmable gamma correction buffer circuit and digital power management integrated circuit, etc.) The data information required for operation.
  • the test signal is transmitted to the drive circuit of the display panel, the drive circuit converts the processed test signal to light the display panel, and the accuracy of the mass production code is judged by the screen point of the display device, that is, the amount is judged by the method of on-load testing The accuracy of the production code.
  • the data transmission rate required by the display device also becomes higher and higher.
  • the test signal is transmitted to the printed circuit board
  • the data transmission rate of the control circuit is the same as the actual application.
  • the test signal transmission rate is too high, the impedance of the jumper leads to serious signal attenuation, which will cause the drive signal transmitted to the drive circuit to be seriously attenuated, making the load
  • the purpose of the present application is to provide a display device and a method for on-load testing of a display device, to solve the problem that the accuracy of mass production codes is affected due to signal attenuation during on-load testing.
  • a display device includes a timing controller, a flash memory chip, a driving chip, an internal integrated circuit bus controller, and a display panel, the timing controller and the flash memory chip, the driving chip, and the internal integrated circuit, respectively A bus controller is connected, the display panel is electrically connected to the driving chip,
  • the internal integrated circuit bus controller is used to output an eye diagram increase instruction to the timing controller
  • the timing controller is used to read the mass production code required for the operation of the timing controller from the flash memory chip and run the mass production code required for the operation of the timing controller to be in a working state
  • the timing controller is further used to receive and execute the eye diagram increase instruction to correspondingly output a drive signal with increased eye diagram to the drive chip;
  • the driving chip is used to convert the driving signal with the increased eye pattern to light up the display panel.
  • the timing controller includes:
  • An eye diagram increasing instruction receiving unit configured to receive the eye diagram increasing instruction
  • the eye diagram increasing instruction execution unit is configured to modify the code of the eye diagram register in the timing controller according to the eye diagram increasing instruction to increase the eye diagram code, and process the input image according to the eye diagram increasing code
  • the test signal of the timing controller correspondingly outputs the driving signal for increasing the eye diagram, and the mass production code required for the operation of the timing controller includes the code of the eye diagram register.
  • the test signal is an image signal or a video signal.
  • the internal integrated circuit bus controller includes:
  • the output unit is used for outputting the eye diagram increasing command through the internal integrated circuit bus after the detection unit detects a high level.
  • the display device further includes a power supply module, and the power supply module is used to output the high level to the detection unit.
  • the flash memory chip and the timing controller are connected through a serial peripheral device interface bus.
  • the driving signal with an increased eye pattern is a micro-swing differential signal with an increased eye pattern.
  • the micro-swing differential signal with the increased eye pattern has an eye pattern amplitude of 600-700 millivolts.
  • the micro-swing differential signal with the increased eye pattern has an eye pattern amplitude of 650 mV.
  • the display device includes a timing controller, a flash memory chip, a driving chip, an internal integrated circuit bus controller, and a display panel.
  • the timing controller is separately connected to the flash memory chip and the driver A chip and the internal integrated circuit bus controller are connected, the display panel is electrically connected to the driving chip, and the method for on-load testing of the display device includes the following steps:
  • the timing controller reads from the flash memory chip the mass production code required for the timing controller to work and runs the mass production code required for the timing controller to operate in a working state;
  • the timing controller in the working state receives and executes the eye diagram increase instruction output by the internal integrated circuit bus controller to correspondingly output a drive signal with an increased eye diagram to the drive chip;
  • the driving chip converts the driving signal with the increased eye pattern to light up the display panel.
  • the timing controller in the working state receives and executes an eye diagram increase instruction output by the internal integrated circuit bus controller to correspond to a driving signal for increasing the output eye diagram It includes the following steps:
  • the timing controller in the working state receives the eye diagram increasing instruction
  • the timing controller modifies the code of the eye diagram register in the timing controller according to the eye diagram increasing instruction to obtain an eye diagram increasing code
  • the timing controller processes the test signal according to the code for increasing the eye diagram to correspondingly output a driving signal for increasing the eye diagram;
  • the mass production code required for the operation of the timing controller includes the code of the eye diagram register.
  • the test signal is an image signal or a video signal.
  • the method further includes the following steps: after the internal integrated circuit bus controller detects a high level, the eye pattern increase command is output to the internal integrated circuit bus via the internal integrated circuit bus The timing controller.
  • the display device further includes a power supply module, and the power supply module outputs the high level to the internal integrated circuit bus controller.
  • the flash memory chip and the timing controller are connected through a serial peripheral device interface bus.
  • the driving signal with an increased eye pattern is a micro-swing differential signal with an increased eye pattern.
  • the amplitude of the micro-swing differential signal with an increased eye diagram is 600-700 millivolts.
  • the amplitude value of the micro-swing differential signal with an increased eye diagram is 650 mV.
  • the present application provides a display device and a method for on-load testing of a display device.
  • the timing controller receives and executes an eye diagram increase command output by an internal integrated circuit bus controller to correspondingly output a drive signal with an increased eye diagram to the drive chip. It is avoided that the drive device is seriously attenuated when the on-load test is performed on the display device, which affects the judgment of the on-load test result, thereby improving the accuracy of the on-load test of the display device.
  • FIG. 1 is a display device according to an embodiment of the application
  • FIG. 2 is a schematic flow chart of the display device shown in FIG. 1 performing on-load testing.
  • FIG. 1 is a display device 10 according to an embodiment of the present application.
  • the display device 10 includes a timing controller 11, a flash memory chip 12, a driving chip 14, an internal integrated circuit bus controller 13 and a display panel 15.
  • the timing controller 11 It is connected to the flash memory chip 12, the driving chip 14 and the internal integrated circuit bus controller (I 2 C-bus Control, Inter-Integrated Circuit Bus Control) 13, and the display panel 15 is electrically connected to the driving chip 14,
  • the internal integrated circuit bus controller 13 is used to output the eye diagram increase command to the timing controller 11;
  • the timing controller 11 is used to read the mass production code required for the operation of the timing controller 11 from the flash memory chip 12 and run the mass production code required for the operation of the timing controller 11 to be in the working state, and the timing controller 11 in the working state It is also used to receive and execute the eye diagram increasing instruction to correspondingly output the driving signal for increasing the eye diagram to the driving chip;
  • the driving chip is used to convert the driving signal of the increased eye pattern to light up the display panel 15.
  • the driving chip is composed of a source driving chip 142 and a gate driving chip 141.
  • the driving chip is located on a flip chip (not shown).
  • the flip chip is connected to the display panel 15 through an anisotropic conductive adhesive.
  • the printed circuit board with the timing controller 11 is connected.
  • the above-mentioned display device receives and executes the eye diagram increase command output by the internal integrated circuit bus controller through the timing controller to correspondingly output the drive signal with the increased eye diagram to the drive chip, to avoid serious attenuation of the drive signal during the on-load test of the display device And it affects the judgment of the load test result, thereby improving the accuracy of the load test of the display device.
  • timing controller 11 includes:
  • the eye diagram increasing instruction receiving unit is used to receive an eye diagram increasing instruction
  • the eye diagram increase instruction execution unit is used to modify the code of the eye diagram register in the timing controller 11 according to the eye diagram increase instruction to increase the eye diagram code, and process the test input to the timing controller 11 according to the increased eye diagram code
  • the signal corresponds to the drive signal for increasing the output eye diagram
  • the mass production code required for the operation of the timing controller 11 includes the code of the eye diagram register.
  • the code of the eye diagram register in the timing controller 11 is modified according to the eye diagram increase instruction to store the code for increasing the eye diagram in the eye diagram register, namely When the timing controller 11 is in the working state, modify the code in the eye diagram register to obtain a code that can increase the eye diagram.
  • the timing controller 11 processes the test signal according to the modified code, it can increase the driving signal output by the timing controller Eye diagram to overcome the problem of drive signal attenuation.
  • This application takes into account that the purpose of on-load testing is to test the correctness of the mass production code in the flash memory chip 12 of the display device 10, and the mass production code in the flash memory chip 12 has been verified by multiple tests and proved to be a reasonable code, directly modifying the flash memory
  • the production code of the chip 12 to increase the eye diagram of the drive signal will cause the display device to fail the Electromagnetic Interference (EMI) test, so the production code of the flash memory chip 12 cannot be directly modified to increase the eye diagram of the drive signal .
  • EMI Electromagnetic Interference
  • This application modifies the code in the eye diagram register in the timing controller 11 online when the timing controller 11 reads the mass production code required for its work to be in the working state to obtain the enlarged eye diagram code. This modification will not affect To the judgment of the mass production code in the flash memory chip 12.
  • the internal integrated circuit bus controller 13 includes:
  • the output unit is used to output an eye diagram increase command through the internal integrated circuit (Inter-Integrated Circuit, I 2 C) bus after the detection unit detects a high level.
  • I 2 C Inter-Integrated Circuit
  • the high level is a switch signal designed specifically for the on-load test of the display device 10.
  • the internal integrated circuit bus controller 13 sends a signal to the timing controller 11 Output the eye diagram increase instruction to modify the code in the eye register of the timing controller 11 online to achieve the purpose of increasing the eye diagram; when the display device 10 is powered off, the integrated circuit bus controller 13 cannot receive the high level , The code in the eye diagram register is restored to the unmodified code.
  • the display device 10 further includes a power module (not shown), which is used to output a high level to the detection unit.
  • serial Peripheral Interface Serial Peripheral Interface
  • test signal is an analog signal such as an image signal or a video signal, and is input to the timing controller 11 through a corresponding interface on the printed circuit board.
  • the test signal may also be other analog voltage signals, which is not specifically limited in this application.
  • the driving signal with increased eye diagram is a reduced swing differential signal (RSDS) with increased eye diagram
  • the timing controller 11 outputs the RSDS signal with increased eye diagram to the source driver chip 142
  • the RSDS signal with an increased eye pattern has an eye pattern amplitude of 600-700 mV, for example, the RSDS signal with an increased eye pattern has an eye pattern amplitude of 650 mV.
  • FIG. 2 it is a schematic flow chart of the on-load test of the display device 10 shown in FIG. 1.
  • the display device 10 includes a timing controller 11, a flash memory chip 12, a driving chip 14, an internal integrated circuit bus controller 13 and a display panel 15.
  • the timing controller 11 is respectively connected to the flash memory chip 12, the driving chip 14 and the internal integrated circuit bus controller 13, the display panel 15 is electrically connected to the driving chip 14, and the display device 10 on-load test method includes the following steps:
  • the timing controller 11 reads the mass production code required for the operation of the timing controller 11 from the flash memory chip 12 and runs the mass production code required for the operation of the timing controller 11 to be in a working state;
  • the timing controller 11 in the working state receives and executes the eye diagram increase instruction output by the internal integrated circuit bus controller 13 to correspondingly output the drive signal with the increased eye diagram to the drive chip 14;
  • the driving chip 14 converts the driving signal with an increased eye pattern to light up the display panel 15.
  • timing controller 11 in the working state receives and executes the eye diagram increase instruction output by the internal integrated circuit bus controller 13 to correspond to the output driving signal of the increase in the eye diagram, including the following steps:
  • the timing controller 11 in the working state receives the eye diagram increasing instruction
  • the timing controller 11 modifies the code of the eye diagram register in the timing controller 13 according to the eye diagram increasing instruction to obtain the code for increasing the eye diagram;
  • the timing controller 11 processes the test signal according to the code for increasing the eye pattern to correspond to the drive signal for increasing the output eye pattern
  • the mass production code required for the operation of the timing controller 11 includes the code of the eye diagram register.
  • the above method further includes the following steps: after the internal integrated circuit bus controller 13 detects a high level, an eye diagram increase instruction is output to the timing controller 11 through the internal integrated circuit bus.
  • the above display device 10 further includes a power supply module (not shown), and the power supply module outputs a high level to the internal integrated circuit bus controller 13.
  • the flash memory chip 12 and the timing controller 11 are connected through a serial peripheral device interface bus.
  • test signal is an analog signal such as an image signal or a video signal, and is input to the timing controller 11 through a corresponding interface on the printed circuit board.
  • the test signal may also be other analog voltage signals, which is not specifically limited in this application.
  • the driving signal with an increased eye diagram is a micro-swing differential signal with an increased eye diagram
  • the timing controller 11 outputs the RSDS signal with an increased eye diagram to the source driver chip 142.
  • the increased eye diagram The amplitude of the eye pattern of the RSDS signal is 600-700 mV.
  • the amplitude of the eye pattern of the RSDS signal with an increased eye pattern is 650 mV.
  • the above-mentioned display device on-load test method receives and executes the eye diagram increase command output by the internal integrated circuit bus controller through the timing controller to correspondingly output the drive signal with increased eye diagram to the drive chip, to avoid the display device performing on-load test Because the driving signal is severely attenuated, the judgment of the on-load test result is affected, thereby improving the accuracy of the on-load test of the display device.

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Control Of Indicators Other Than Cathode Ray Tubes (AREA)

Abstract

一种显示装置（10）及显示装置（10）有载测试的方法，通过时序控制器（11）接收并执行内部集成电路总线控制器（13）输出的眼图增大指令以对应输出眼图增大的驱动信号至驱动芯片（14），避免显示装置（10）进行有载测试时由于驱动信号衰减严重而影响有载测试结果的判断，从而提高显示装置（10）有载测试的准确性。

Description

显示装置及显示装置有载测试的方法 技术领域
本申请涉及显示技术领域，尤其涉及一种显示装置及显示装置有载测试的方法。
 背景技术
显示装置制成之后，需要判断打件厂烧录在印刷电路板（Printed Circuit Board Assembly,  PCBA）的闪存中的量产代码的准确性，量产代码包括印刷电路板上多种控制电路（时序控制电路、可编程伽玛校正缓冲电路以及数字电源管理集成电路等）运行所需要的数据信息。对量产代码进行判断时，需要使用跳线将测试设备输出的测试信号传输至印刷电路板上的控制电路以进行处理，而控制电路需要运行量产代码才能处于工作状态从而处理测试信号，处理后的测试信号传输至显示面板的驱动电路，驱动电路转化处理后的测试信号以点亮显示面板，通过显示装置的点屏结果判断量产代码的准确性，即通过有载测试的方法判断量产代码的准确性。
然而，显示装置的分辨率越来越高的同时，显示装置所需要的数据传输速率也越来越高，需要模拟实际应用以判断量产代码的准确性时，将测试信号传输至印刷电路板的控制电路时的数据传输速率也与实际应用的相同，当测试信号传输速率太高时，跳线阻抗大导致信号衰减严重，从而会导致传输至驱动电路的驱动信号出现严重衰减，使得有载测试无法顺利点亮画面，影响量产代码判断的准确性。
因此，有必要提出一种技术方案以解决有载测试时由于信号衰减而导致量产代码准确性判断受影响的问题。
 技术问题
本申请的目的在于提供一种显示装置及显示装置有载测试的方法，以解决有载测试时由于信号衰减而导致量产代码准确性判断受影响的问题。
 技术解决方案
一种显示装置，所述显示装置包括时序控制器、闪存芯片、驱动芯片、内部集成电路总线控制器及显示面板，时序控制器分别与所述闪存芯片、所述驱动芯片以及所述内部集成电路总线控制器连接，所述显示面板与所述驱动芯片电连接，
所述内部集成电路总线控制器用于将眼图增大指令输出至所述时序控制器；
所述时序控制器用于从所述闪存芯片中读取所述时序控制器工作所需的量产代码并运行所述时序控制器工作所需的量产代码以处于工作状态，处于工作状态的所述时序控制器还用于接收并执行所述眼图增大指令以对应输出眼图增大的驱动信号至所述驱动芯片；
所述驱动芯片用于转化所述眼图增大的驱动信号以点亮所述显示面板。
在上述显示装置中，所述时序控制器包括：
眼图增大指令接收单元，用于接收所述眼图增大指令；
眼图增大指令执行单元，用于根据所述眼图增大指令修改所述时序控制器中眼图寄存器的代码以得增大眼图代码，并根据所述增大眼图代码处理输入所述时序控制器的测试信号以对应输出所述眼图增大的驱动信号，所述时序控制器工作所需的量产代码包括所述眼图寄存器的代码。
在上述显示装置中，所述测试信号为图像信号或视频信号。
在上述显示装置中，所述内部集成电路总线控制器包括：
侦测单元，用于侦测高电平；
输出单元，用于所述侦测单元侦测到高电平后通过内部集成电路总线输出所述眼图增大指令。
在上述显示装置中，所述显示装置还包括电源模块，所述电源模块用于输出所述高电平至所述侦测单元。
在上述显示装置中，所述闪存芯片和所述时序控制器通过串行外围设备接口总线连接。
在上述显示装置中，所述眼图增大的驱动信号为眼图增大的微摆幅差分信号。
在上述显示装置中，所述眼图增大的微摆幅差分信号的眼图幅值为600-700毫伏。
在上述显示装置中，所述眼图增大的微摆幅差分信号的眼图幅值为650毫伏。
一种显示装置有载测试的方法，所述显示装置包括时序控制器、闪存芯片、驱动芯片、内部集成电路总线控制器及显示面板，所述时序控制器分别与所述闪存芯片、所述驱动芯片以及所述内部集成电路总线控制器连接，所述显示面板与所述驱动芯片电连接，所述显示装置有载测试的方法包括如下步骤：
在所述显示装置通电后通过跳线向所述时序控制器输入测试信号；
所述时序控制器从所述闪存芯片中读取所述时序控制器工作所需的量产代码并运行所述时序控制器工作所需的量产代码以处于工作状态；
处于工作状态的所述时序控制器接收并执行所述内部集成电路总线控制器输出的眼图增大指令以对应输出眼图增大的驱动信号至所述驱动芯片；
所述驱动芯片转化所述眼图增大的驱动信号以点亮所述显示面板。
在上述显示装置有载测试的方法中，所述处于工作状态的所述时序控制器接收并执行所述内部集成电路总线控制器输出的眼图增大指令以对应输出眼图增大的驱动信号包括如下步骤：
所述处于工作状态的时序控制器接收所述眼图增大指令；
所述时序控制器根据所述眼图增大指令修改所述时序控制器中眼图寄存器的代码以得到增大眼图代码；
所述时序控制器根据所述增大眼图代码处理所述测试信号以对应输出所述眼图增大的驱动信号；
其中，所述时序控制器工作所需的量产代码包括所述眼图寄存器的代码。
在上述显示装置有载测试的方法中，所述测试信号为图像信号或视频信号。
在上述显示装置有载测试的方法中，所述方法还包括如下步骤：所述内部集成电路总线控制器侦测到高电平后，通过内部集成电路总线将所述眼图增大指令输出至所述时序控制器。
在上述显示装置有载测试的方法中，所述显示装置还包括电源模块，所述电源模块将所述高电平输出至所述内部集成电路总线控制器。
在上述显示装置有载测试的方法中，所述闪存芯片和所述时序控制器通过串行外围设备接口总线连接。
在上述显示装置有载测试的方法中，所述眼图增大的驱动信号为眼图增大的微摆幅差分信号。
在上述显示装置有载测试的方法中，所述眼图增大的微摆幅差分信号的眼图幅值为600-700毫伏。
在上述显示装置有载测试的方法中，所述眼图增大的微摆幅差分信号的眼图幅值为650毫伏。
 有益效果
本申请提供一种显示装置及显示装置有载测试的方法，通过时序控制器接收并执行内部集成电路总线控制器输出的眼图增大指令以对应输出眼图增大的驱动信号至驱动芯片，避免显示装置进行有载测试时由于驱动信号衰减严重而影响有载测试结果的判断，从而提高显示装置有载测试的准确性。
 附图说明
图1为本申请一实施例的显示装置；
图2为图1所示显示装置进行有载测试的流程示意图。
 本发明的实施方式
下面将结合本申请实施例中的附图，对本申请实施例中的技术方案进行清楚、完整地描述。显然，所描述的实施例仅仅是本申请一部分实施例，而不是全部的实施例。基于本申请中的实施例，本领域技术人员在没有作出创造性劳动前提下所获得的所有其他实施例，都属于本申请保护的范围。
请参阅图1，其为本申请一实施例的显示装置10，显示装置10包括时序控制器11、闪存芯片12、驱动芯片14、内部集成电路总线控制器13及显示面板15，时序控制器11与闪存芯片12、驱动芯片14以及内部集成电路总线控制器（I 2C-bus Control, Inter-Integrated Circuit Bus Control）13连接，显示面板15与驱动芯片14电连接，
内部集成电路总线控制器13用于将眼图增大指令输出至时序控制器11；
时序控制器11用于从闪存芯片12中读取时序控制器11工作所需的量产代码并运行时序控制器11工作所需的量产代码以处于工作状态，处于工作状态的时序控制器11还用于接收并执行眼图增大指令以对应输出眼图增大的驱动信号至驱动芯片；
驱动芯片用于转化眼图增大的驱动信号以点亮显示面板15。
需要了解的是，对于数字信号，其高电平和低电平的变化有多种序列组合，在时序上将足够多的序列按某一个基准点对齐，然后将序列的波形叠加起来，就形成眼图。
驱动芯片由源极驱动芯片142和栅极驱动芯片141组成，驱动芯片位于覆晶薄膜（未示出）上，覆晶薄膜通过各向异性导电胶与显示面板15连接，覆晶薄膜还与置有时序控制器11的印刷电路板连接。
上述显示装置通过时序控制器接收并执行内部集成电路总线控制器输出的眼图增大指令以对应输出眼图增大的驱动信号至驱动芯片，避免显示装置进行有载测试时由于驱动信号衰减严重而影响有载测试结果的判断，从而提高显示装置有载测试的准确性。
进一步地，时序控制器11包括：
眼图增大指令接收单元，用于接收眼图增大指令；
眼图增大指令执行单元，用于根据眼图增大指令修改时序控制器11中眼图寄存器的代码以得增大眼图代码，并根据增大眼图代码处理输入时序控制器11的测试信号以对应输出眼图增大的驱动信号，时序控制器11工作所需的量产代码包括眼图寄存器的代码。
时序控制器11读取工作所需的量产代码以处于工作状态时，根据眼图增大指令修改时序控制器11中眼图寄存器的代码以在眼图寄存器中存储增大眼图代码，即在时序控制器11处于工作状态时修改眼图寄存器中的代码以得到能够增大眼图的代码，时序控制器11根据修改后的代码处理测试信号时，能增大时序控制器输出的驱动信号的眼图，克服驱动信号衰减的问题。
本申请考虑到有载测试的目的就是测试显示装置10的闪存芯片12中量产代码的正确性，而闪存芯片12中的量产代码是经过多次试验验证且证明为合理代码，直接修改闪存芯片12中量产代码以增大驱动信号的眼图会导致显示装置进行电磁干扰（Electromagnetic Interference，EMI）测试无法通过，故不能直接修改闪存芯片12中量产代码以增大驱动信号的眼图。本申请通过在时序控制器11读取其工作所需的量产代码以处于工作状态时在线修改时序控制器11中眼图寄存器中的代码以得到增大眼图代码，这种修改不会影响到对闪存芯片12中量产代码的判断。
进一步地，内部集成电路总线控制器13包括：
侦测单元，用于侦测高电平；
输出单元，用于侦测单元侦测到高电平后通过内部集成电路(Inter-Integrated Circuit, I 2C)总线输出眼图增大指令。
在本申请中，高电平是专门针对显示装置10进行有载测试而设计的开关信号，当内部集成电路总线控制器13接收到高电平后，内部集成电路总线控制器13向时序控制器11输出眼图增大指令以在线修改时序控制器11中眼图寄存器中的代码从而实现增大眼图的目的；当显示装置10断电后导致集成电路总线控制器13不能接收到高电平时，眼图寄存器中的代码恢复至未修改之前的代码。
更进一步地，显示装置10还包括电源模块（未示出），电源模块用于输出高电平至侦测单元。
进一步地，闪存芯片12和时序控制器11通过串行外围设备接口(Serial Peripheral Interface, SPI)总线连接。
进一步地，测试信号为图像信号或视频信号等模拟信号，通过印刷电路板上相对应地接口输入至时序控制器11，测试信号也可以是其他模拟电压信号，本申请不作具体地限定。
进一步地，眼图增大的驱动信号为眼图增大的微摆幅差分信号（Reduced Swing Differential Signal，RSDS），时序控制器11将眼图增大的RSDS信号输出至源极驱动芯片142，具体地，眼图增大的RSDS信号的眼图幅值为600-700毫伏，例如眼图增大的RSDS信号的眼图幅值为650毫伏。
如图2所示，其为图1所示显示装置10进行有载测试的流程示意图，显示装置10包括时序控制器11、闪存芯片12、驱动芯片14、内部集成电路总线控制器13及显示面板15，时序控制器11分别与闪存芯片12、驱动芯片14以及内部集成电路总线控制器13连接，显示面板15与驱动芯片14电连接，显示装置10有载测试的方法包括如下步骤：
S20:在显示装置10通电后通过跳线向时序控制器11输入测试信号；
S21:时序控制器11从闪存芯片12中读取时序控制器11工作所需的量产代码并运行时序控制器11工作所需的量产代码以处于工作状态；
S22:处于工作状态的时序控制器11接收并执行内部集成电路总线控制器13输出的眼图增大指令以对应输出眼图增大的驱动信号至驱动芯片14；
S23:驱动芯片14转化眼图增大的驱动信号以点亮显示面板15。
进一步地，处于工作状态的时序控制器11接收并执行内部集成电路总线控制器13输出的眼图增大指令以对应输出眼图增大的驱动信号包括如下步骤：
处于工作状态的时序控制器11接收眼图增大指令；
时序控制器11根据眼图增大指令修改时序控制器13中眼图寄存器的代码以得到增大眼图代码；
时序控制器11根据增大眼图代码处理测试信号以对应输出眼图增大的驱动信号；
其中，所述时序控制器11工作所需的量产代码包括眼图寄存器的代码。
进一步地，上述方法还包括如下步骤：内部集成电路总线控制器13侦测到高电平后，通过内部集成电路总线将眼图增大指令输出至时序控制器11。
更进一步地，上述显示装置10还包括电源模块（未示出），电源模块将高电平输出至内部集成电路总线控制器13。
进一步地，闪存芯片12和时序控制器11通过串行外围设备接口总线连接。
进一步地，测试信号为图像信号或视频信号等模拟信号，通过印刷电路板上相对应地接口输入至时序控制器11，测试信号也可以是其他模拟电压信号，本申请不作具体地限定。
进一步地，眼图增大的驱动信号为眼图增大的微摆幅差分信号，时序控制器11将眼图增大的RSDS信号输出至源极驱动芯片142，具体地，眼图增大的RSDS信号的眼图幅值为600-700毫伏，例如眼图增大的RSDS信号的眼图幅值为650毫伏。
上述显示装置有载测试的方法通过时序控制器接收并执行内部集成电路总线控制器输出的眼图增大指令以对应输出眼图增大的驱动信号至驱动芯片，避免显示装置进行有载测试时由于驱动信号衰减严重而影响有载测试结果的判断，从而提高显示装置有载测试的准确性。
以上实施例的说明只是用于帮助理解本申请的技术方案及其核心思想；本领域的普通技术人员应当理解：其依然可以对前述各实施例所记载的技术方案进行修改，或者对其中部分技术特征进行等同替换；而这些修改或者替换，并不使相应技术方案的本质脱离本申请各实施例的技术方案的范围。

Claims (18)

  1. 一种显示装置，其中，所述显示装置包括时序控制器、闪存芯片、驱动芯片、内部集成电路总线控制器及显示面板，所述时序控制器分别与所述闪存芯片、所述驱动芯片以及所述内部集成电路总线控制器连接，所述显示面板与所述驱动芯片电连接，
    所述内部集成电路总线控制器用于将眼图增大指令输出至所述时序控制器；
    所述时序控制器用于从所述闪存芯片中读取所述时序控制器工作所需的量产代码并运行所述时序控制器工作所需的量产代码以处于工作状态，处于工作状态的所述时序控制器还用于接收并执行所述眼图增大指令以对应输出眼图增大的驱动信号至所述驱动芯片；
    所述驱动芯片用于转化所述眼图增大的驱动信号以点亮所述显示面板。
  2. 根据权利要求1所述的显示装置，其中，所述时序控制器包括：
    眼图增大指令接收单元，用于接收所述眼图增大指令；
    眼图增大指令执行单元，用于根据所述眼图增大指令修改所述时序控制器中眼图寄存器的代码以得增大眼图代码，并根据所述增大眼图代码处理输入所述时序控制器的测试信号以对应输出所述眼图增大的驱动信号，所述时序控制器工作所需的量产代码包括所述眼图寄存器的代码。
  3. 根据权利要求2所述的显示装置，其中，所述测试信号为图像信号或视频信号。
  4. 根据权利要求1所述的显示装置，其中，所述内部集成电路总线控制器包括：
    侦测单元，用于侦测高电平；
    输出单元，用于所述侦测单元侦测到高电平后通过内部集成电路总线输出所述眼图增大指令。
  5. 根据权利要求4所述的显示装置，其中，所述显示装置还包括电源模块，所述电源模块用于输出所述高电平至所述侦测单元。
  6. 根据权利要求1所述的显示装置，其中，所述闪存芯片和所述时序控制器通过串行外围设备接口总线连接。
  7. 根据权利要求1所述的显示装置，其中，所述眼图增大的驱动信号为眼图增大的微摆幅差分信号。
  8. 根据权利要求7所述的显示装置，其中，所述眼图增大的微摆幅差分信号的眼图幅值为600-700毫伏。
  9. 根据权利要求8所述的显示装置，其中，所述眼图增大的微摆幅差分信号的眼图幅值为650毫伏。
  10. 一种显示装置有载测试的方法，其中，所述显示装置包括时序控制器、闪存芯片、驱动芯片、内部集成电路总线控制器及显示面板，所述时序控制器分别与所述闪存芯片、所述驱动芯片以及所述内部集成电路总线控制器连接，所述显示面板与所述驱动芯片电连接，所述显示装置有载测试的方法包括如下步骤：
    在所述显示装置通电后通过跳线向所述时序控制器输入测试信号；
    所述时序控制器从所述闪存芯片中读取所述时序控制器工作所需的量产代码并运行所述时序控制器工作所需的量产代码以处于工作状态；
    处于工作状态的所述时序控制器接收并执行所述内部集成电路总线控制器输出的眼图增大指令以对应输出眼图增大的驱动信号至所述驱动芯片；
    所述驱动芯片转化所述眼图增大的驱动信号以点亮所述显示面板。
  11. 根据权利要求10所述的显示装置有载测试的方法，其中，所述处于工作状态的所述时序控制器接收并执行所述内部集成电路总线控制器输出的眼图增大指令以对应输出眼图增大的驱动信号包括如下步骤：
    所述处于工作状态的所述时序控制器接收所述眼图增大指令；
    所述时序控制器根据所述眼图增大指令修改所述时序控制器中眼图寄存器的代码以得到增大眼图代码；
    所述时序控制器根据所述增大眼图代码处理所述测试信号以对应输出所述眼图增大的驱动信号；
    其中，所述时序控制器工作所需的量产代码包括所述眼图寄存器的代码。
  12. 根据权利要求11所述的显示装置有载测试的方法，其中，所述测试信号为图像信号或视频信号。
  13. 根据权利要求10所述的显示装置有载测试的方法，其中，所述方法还包括如下步骤：所述内部集成电路总线控制器侦测到高电平后，通过内部集成电路总线将所述眼图增大指令输出至所述时序控制器。
  14. 根据权利要求13所述的显示装置有载测试的方法，其中，所述显示装置还包括电源模块，所述电源模块将所述高电平输出至所述内部集成电路总线控制器。
  15. 根据权利要求10所述的显示装置有载测试的方法，其中，所述闪存芯片和所述时序控制器通过串行外围设备接口总线连接。
  16. 根据权利要求10所述的显示装置有载测试的方法，其中，所述眼图增大的驱动信号为眼图增大的微摆幅差分信号。
  17. 根据权利要求16所述的显示装置有载测试的方法，其中，所述眼图增大的微摆幅差分信号的眼图幅值为600-700毫伏。
  18. 根据权利要求17所述的显示装置有载测试的方法，其中，所述眼图增大的微摆幅差分信号的眼图幅值为650毫伏。
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