WO2020071572A1 - Method and device for repairing bright spot defect of liquid crystal display device - Google Patents
Method and device for repairing bright spot defect of liquid crystal display deviceInfo
- Publication number
- WO2020071572A1 WO2020071572A1 PCT/KR2018/012041 KR2018012041W WO2020071572A1 WO 2020071572 A1 WO2020071572 A1 WO 2020071572A1 KR 2018012041 W KR2018012041 W KR 2018012041W WO 2020071572 A1 WO2020071572 A1 WO 2020071572A1
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- liquid crystal
- laser beam
- intensity
- crystal display
- display device
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/1306—Details
- G02F1/1309—Repairing; Testing
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/1333—Constructional arrangements; Manufacturing methods
- G02F1/1335—Structural association of cells with optical devices, e.g. polarisers or reflectors
Definitions
- the liquid crystal panel 500 is bonded such that the color filter substrate 530 as an upper substrate and a thin film transistor (TFT) array substrate 510 as a lower substrate are opposed to each other, and have dielectric anisotropy between them. It is provided with a structure in which the liquid crystal layer 520 is formed, and is driven by switching a thin film transistor (TFT) added to hundreds of thousands of pixels through an address wiring for pixel selection to apply a voltage to the corresponding pixel. do.
- TFT thin film transistor
- the color filter substrate 530 includes a glass 531, a color filter 532 such as RGB, a black matrix 533 formed between the color filters 532, an overcoat layer 534, and a common electrode. It is made of an indium tin oxide (ITO) 535 and an alignment layer 536, and a polarizing plate 537 is attached to the top of the glass.
- ITO indium tin oxide
- the thin film transistor array substrate process is a process of forming a gate wiring, a data wiring, a thin film transistor, and a pixel electrode on a glass substrate by repeating deposition and photolithography processes on a lower substrate.
- the color filter substrate process is a process of forming an ITO film for a common electrode after producing a color filter of RGB, which is arranged in a certain order on a substrate on which a black matrix is formed, usually an upper substrate.
- the liquid crystal cell process is a process in which a liquid crystal layer is formed by injecting liquid crystal between the thin film transistor array substrate and the color filter array substrate to maintain a constant gap.
- ODF one drop filling
- a test pattern is displayed on the screen of the liquid crystal panel, and the presence or absence of defective pixels is detected and corrected for the defective pixels.
- the defects of the liquid crystal panel can be roughly divided into point defects, line defects, and display irregularities. Point defects are caused by defects in TFT elements, pixel electrodes, and color filter wiring, and line defects are caused by breaks in TFTs due to open wires, shorts, static electricity between the wires, and defective connection to the driving circuit.
- the display non-uniformity may be caused by non-uniformity of cell thickness, non-uniformity of liquid crystal orientation, dispersion of TFT characteristic locations, and time constant of relatively large wiring.
- impurities including dust, organic matter, or metal are adsorbed in the process of manufacturing the liquid crystal panel.
- impurities including dust, organic matter, or metal are adsorbed in the process of manufacturing the liquid crystal panel.
- the pixel emits light that is brighter than the brightness of other normal pixels. Can cause phenomena.
- FIG. 2 is a conceptual diagram showing a form in which a laser repair is performed on a pixel to be processed by a scanning method for a darkening operation.
- the entire pixel area including the pixel peripheral portion and the pixel central portion is processed with a laser beam of the same intensity.
- the scanning direction SC0 of the laser beam is usually a zigzag direction.
- FIG. 3 discloses a phenomenon in which an abnormality in liquid crystal arrangement in a pixel adjacent to a pixel to be processed (pixel, P0) diffuses in a form similar to a bubble and appears similar to black stain (BS).
- the enlarged drawing portion shows a case in which pixels having black spots are marked with dots BS1 after laser repair processing on a defective pixel.
- Japanese Patent Application Publication No. 2006-72229 irradiates a laser to the alignment layer to damage the alignment characteristics of the liquid crystal, thereby reducing light transmittance by lowering the transmittance of the liquid crystal. It discloses a technique for removing.
- Korean Patent Application No. 10-2006-86569 discloses a method of blackening a defective pixel using a femtosecond laser.
- Republic of Korea Patent Registration No. 10-0879010 discloses a method of blackening a block shot method or a scan method by using a laser beam having a specific wavelength of organic substances for each color constituting a color filter layer of a liquid crystal display device.
- Korean Patent Registration No. 10-1226711 discloses a pixel configuration that is divided into two parts of an S-PVA mode liquid crystal display device, which is a type of vertically oriented liquid crystal mode, and has a Vcom line and an ITO line pattern.
- an object of the present invention is to provide a method for repairing defective spots in a liquid crystal display device, which can prevent an adverse effect on adjacent pixels in the process of repairing defective pixels.
- the present invention causes a phenomenon in which an abnormality of a liquid crystal arrangement state occurring in an adjacent pixel of a pixel to be processed spreads in a form similar to a bubble, thereby preventing or suppressing a problem observed as a stain in a display device.
- An object of the present invention is to provide a method and a device for repairing defects in a liquid crystal display device.
- Another object of the present invention has the advantage of suppressing and preventing problems particularly well occurring in the liquid crystal arrangement of adjacent pixels in a vertical alignment mode liquid crystal display device such as patterned vertical alignment (PVA) or super PVA (S-PVA). It is to provide a method and apparatus for repairing defects in a liquid crystal display device.
- PVA patterned vertical alignment
- S-PVA super PVA
- a method for repairing defective spots in a liquid crystal display device for solving the above technical problem is a method for repairing defective luminance in a liquid crystal display device that illuminates and darkens a defective pixel with laser light, corresponding to an edge of a defective pixel.
- a second step of darkening is a method for repairing defective luminance in a liquid crystal display device that illuminates and darkens a defective pixel with laser light, corresponding to an edge of a defective pixel.
- the first light intensity ranges from 30% to 80% of the second light intensity.
- the length of the peripheral portion in the width direction may reach 10 to 15% of each length in the length direction and the width direction of the defective pixel at an outer boundary of the defective pixel.
- a method for repairing defective spots in a liquid crystal display device may include, before the first step, from a monitoring device coupled to a laser irradiation unit that supplies the laser light or from a storage device connected to the monitoring device.
- the method may further include obtaining information about a shape and determining a scanning direction and intensity of the laser light according to the obtained information.
- the method of repairing defective spots in a liquid crystal display device may include a power line pattern inside the defective pixel through welding by laser light before the first step, before the second step, or after the second step. It may further include the step of blocking.
- the method for repairing defective spots in a liquid crystal display device may further include, after the second step, secondary processing of the peripheral portion to enhance darkening of the peripheral portion.
- the defective spot repair device of the liquid crystal display device is a liquid crystal display device for repairing dark defects by irradiating defective pixels with laser light, and a laser that irradiates laser light.
- Irradiation unit A work unit for placing or fixing a liquid crystal display device; An actuator installed in any one or more of the laser irradiation unit and the working unit to change a relative position of laser light irradiated to a defective pixel of the liquid crystal display; And a control unit that controls the operation of the actuator and the operation of the laser irradiation unit, and the control unit irradiates a peripheral portion corresponding to the edge of the defective pixel with laser light of a first light intensity and is surrounded by the peripheral portion.
- the central portion of the defective pixel is irradiated with laser light of a second light intensity stronger than the first light intensity.
- the first light intensity is in the range of 30% to 80% of the second light intensity
- the length in the width direction of the peripheral portion is in the length direction and the width direction of the defective pixel at an outer boundary of the defective pixel. Each can reach 10-15% of the length.
- the defective spot repair device of the liquid crystal display device before irradiating the laser light of the first light intensity, the defective pixel from a monitoring device coupled to the laser irradiation unit or from a storage device connected to the monitoring device It is possible to obtain information about the internal shape and determine the scanning direction and intensity of the laser light according to the information.
- the defect repair device of the liquid crystal display device before irradiating the laser light of the first light intensity, before irradiating the laser light of the second light intensity, or the laser light of the second light intensity After irradiating, the power line pattern inside the defective pixel may be blocked through welding by laser light.
- the liquid crystal display device is a liquid crystal display device in which a liquid crystal in a vertical alignment mode (VA MODE) is disposed in a pixel.
- VA MODE vertical alignment mode
- the influence of laser light irradiation in the process of repairing the defective pixel by irradiating relatively weak laser light to the peripheral area of the defective pixel is diffused to the periphery, thereby suppressing adverse effects on the liquid crystal arrangement state of the adjacent pixel. And prevent.
- a normal alignment of adjacent pixels in a vertical alignment mode liquid crystal display device such as a patterned vertical alignment (PVA) or a super PVA (S-PVA) in which a problem is easily spread to a liquid crystal alignment state to adjacent pixels. It is possible to effectively suppress and prevent the occurrence of a problem in operation.
- PVA patterned vertical alignment
- S-PVA super PVA
- FIG. 1 is a cross-sectional view showing the configuration of a conventional liquid crystal display
- Figure 2 is a conceptual diagram showing a method of repairing defective pixels (pixels) of a conventional liquid crystal display device with a laser beam
- Figure 3 is a picture for explaining the problem according to the repair method as in Figure 2,
- FIG. 4 is a flowchart illustrating a method for repairing defects in bright spots in a liquid crystal display device according to an exemplary embodiment of the present invention
- FIG. 5 is a conceptual diagram showing a form of irradiating a laser beam of weak intensity to a periphery of a defective pixel to be repaired in accordance with the repair method of FIG. 4 and irradiating a strong intensity laser light to a center of the defective pixel to be repaired;
- FIG. 6 is an exemplary view of a portion of a screen of a liquid crystal display including pixels darkened by the repair method of FIG. 4.
- FIG. 7 is a view illustrating various forms of a scanning direction of a laser beam of a strong intensity among the repair method of FIG. 4,
- FIG. 8 is a flowchart of a method for repairing defects in bright spots of a liquid crystal display according to another embodiment of the present invention.
- 11 and 12 are exemplary views showing a state in which welding is performed on Vcom and ITO lines of defective pixels to be repaired in the repair method of FIG. 8,
- FIG. 13 is a view for explaining a method of repairing a defect in a liquid crystal display according to another embodiment of the present invention.
- FIG. 14 is a block diagram of a defect repair device for a liquid crystal display according to another embodiment of the present invention.
- FIG. 4 is a flowchart illustrating a method for repairing defects in bright spots in a liquid crystal display according to an exemplary embodiment of the present invention.
- FIG. 5 is a conceptual diagram showing a form of irradiating a weak intensity laser light to a periphery of a defective pixel to be repaired in accordance with the repair method of FIG. 4 and irradiating a strong intensity laser light to the center of the defective pixel to be repaired.
- FIG. 6 is an exemplary view of a portion of a screen of a liquid crystal display including pixels darkened by the repair method of FIG. 4.
- the method for repairing defective bright spots in the liquid crystal display according to the present embodiment includes: a peripheral region or a peripheral portion of the defective pixel 20 that needs repair. 21) is irradiated with a laser beam (S41 in FIG. 4). Scanning of the laser beam at the periphery (SC1) is carried out along the periphery of the pixel while making a completely closed curve in the clockwise direction or as shown by the arrow in FIG. 5 (a), or by performing two long sides and two short sides respectively. Irradiation, or a part of the periphery, for example, can be made in various ways, such as a method of irradiating laser light only on two sides.
- the laser power is smaller than, for example, 30 to 80% of the laser beam output for repairing the conventional pixel as shown in FIG. 2, and more preferably 40 to 60%.
- the laser beam output is too small, the dark ignition of the color filter layer or the alignment layer is insufficient, and light leakage through the peripheral portion may occur.
- the output is too large and close to 100%, partial darkening of adjacent pixels, which is an undesired result, may occur due to the extension of color filter layer, alignment layer modification, and rupture of adjacent pixels in the process of laser light irradiation to the peripheral portion. .
- the widths w1 and w2 of the peripheral portion are 5 to 20% of the total pixel width at the pixel boundary, preferably 10 to 15%.
- the peripheral widths w1 and w2 are too small, it is difficult to sufficiently block the influence of adjacent pixels during laser repair in the center, and if the peripheral widths w1 and w2 are too large, dark ignition may not be sufficiently achieved in this area. Through this, the possibility of light leakage increases.
- the polyimide film or the like forming the alignment film around the target pixel is hardened to some extent through weak laser beam irradiation on the peripheral part, but severe damage such as rupture does not occur. Moreover, even in the adjacent pixel region close to this periphery, the periphery is processed by weak laser light, so that the effect can be minimized when the processing is performed.
- the central portion 22 of the corresponding pixel that is, an area or peripheral portion excluding the peripheral portion
- Laser beam irradiation is performed on the area enclosed by (S42 of FIG. 4).
- the color filter layer, alignment layer, etc. of the part irradiated with laser light organic material carbonization and degeneration occur, and light transmittance deteriorates, and as the characteristics of the alignment film change, the liquid crystal arrangement state of the processed part changes, so light passes through this pixel. It turns into a dark ignition state that cannot be done.
- the scan SC2 of the laser beam in the central portion 22 of the pixel to be processed, that is, the defective pixel 20, may be performed in a zigzag form in the vertical direction. According to the method for repairing defective spots according to the present embodiment, repair processing can be performed without adversely affecting peripheral pixels of the repaired pixel P2 as shown in FIG. 6.
- FIG. 7 is a view illustrating various forms of a scanning direction of a laser beam having a strong intensity among the repair method of FIG. 4.
- a scan (SC) of a laser beam of a pixel to be processed which can be employed in the method for repairing defective spots according to the present exemplary embodiment, may be performed in various forms.
- the laser beam is rotated in the left and right width directions within the pixel several times in consideration of the shape and size of the laser beam in various ways as illustrated in FIG. 7.
- the scan may be performed in the vertical direction, but may be implemented to move the laser beam up and down or left and right at regular intervals for each horizontal scan or vertical scan.
- laser light irradiation may be performed by selecting the most effective method in consideration of the shape of the pixel and the structure inside the pixel.
- the scan direction is usually a left-right direction or a vertical direction, but may be made in a diagonal direction such as the ITO line shown according to the rotation state of the liquid crystal display table.
- the scan trajectory of the laser beam can be created through the relative movement of the laser beam and the liquid crystal display, and more specifically, the angle and position of the optical element such as a light source irradiating the laser beam, a reflection mirror on the path, and a beam splitter. Adjustment can be made by adjusting the position on the xy plane of the table on which the liquid crystal display is placed. Since these specific adjustment methods are already well known, detailed description thereof will be omitted.
- the intensity of the laser light is strong, so that rupture of the alignment layer or the like may occur, and such rupture may be extended to the periphery as if the gold of the glass extends to the periphery, due to the characteristics of the alignment layer itself.
- the peripheral portion inside the pixel to be processed is already hardened and the alignment film characteristics are changed, when processing the central portion, the energy of the laser beam does not extend beyond the peripheral portion of the pixel and is blocked.
- the dark ignition is performed only in the corresponding pixel, the alignment layer is maintained in the peripheral pixel without being ruptured, and there is no change in the arrangement of the liquid crystal of the peripheral pixel, and the luminance decrease due to partial dark ignition in these peripheral pixels. Will not occur.
- FIG. 8 is a flowchart of a method for repairing defects in bright spots in a liquid crystal display according to another exemplary embodiment of the present invention.
- 9 and 10 are flowcharts for explaining a modified example of the repair method of FIG. 8.
- 11 and 12 are exemplary views showing a state in which welding is performed on Vcom and ITO lines of defective pixels to be repaired in the repair method of FIG. 8.
- a defect repair device (hereinafter simply referred to as a repair device for defective spots) of a liquid crystal display device that implements a method for repairing a defect in a liquid crystal display device according to the present embodiment, first, is a laser scan direction according to a shape inside a pixel. And it is possible to determine the intensity (S81).
- the defective repair device may scan an edge portion of the laser processing region, that is, a peripheral portion corresponding to the edge with a laser beam of first energy (S82).
- the defect repair device may scan the inner portion of the laser processing region, that is, the center portion surrounded by the peripheral portion with a laser beam of a second energy greater than the first energy (S83).
- the defect repair apparatus may short circuit the power electrode pattern inside the pixel included in the laser processing region through laser welding (S84).
- the short-circuiting step (S84) may be performed before the step (S83) of scanning the central portion with a laser beam.
- the short-circuiting step (S84) is performed before the step (S82) of scanning the peripheral portion with a laser beam, or determining the laser scanning direction and intensity according to the shape inside the pixel ( S81).
- the circuit portion of the lower substrate is irradiated with a laser beam having a higher intensity than the intensity of the laser beam in the scan step of the peripheral portion or the center portion of the defective pixel, and the circuit is disconnected or the upper layer circuit
- the organic material constituting the interlayer insulating film is volatilized and carbonized at the portion where the lower layer circuit overlaps, the upper layer circuit and the lower layer circuit are short-circuited, so that the lighting voltage signal is not properly induced in the corresponding pixel, and the lighting signal is not applied to this pixel, so that the lighting is turned on. It is possible to prevent pixel darkening in a double or redundant manner by preventing it from being achieved.
- a pixel electrode inside a defective pixel 26
- the electrical connection of the common electrode 27 may be cut off through the laser welding 30.
- a welding region 32 connecting across regions dividing two sub-pixels 20a and 20b making one pixel and , A welding region 30 having a shape traversing the ITO pattern 24 displayed in a diagonal shape is shown as an example.
- laser welding is performed on a common power line (Vcom Line) and a transparent electrode line (ITO Line) inside a pixel to change a defective pixel into a pixel driving impossible state, thereby improving the degree of pixel blackening.
- Vcom Line common power line
- ITO Line transparent electrode line
- the laser shot shape of the laser welding may be formed using X-Y- ⁇ slit.
- the defective pixel dark ignition according to laser light irradiation is generally performed, and dark ignition is also performed through circuit signal blocking to stably complete the dark ignition processing.
- the peripheral portion of the defective pixel is denatured through the initial low-intensity laser light irradiation, thereby acting as a barrier to prevent propagation to the periphery of the organic material rupture due to the next strong-intensity laser light irradiation, so that the liquid crystal array is arranged in the peripheral pixel.
- the phenomenon that the luminance is lowered when disturbed and the lighting signal is applied can be effectively prevented.
- the first step is to irradiate the periphery of the target pixel with laser light of a weak intensity, and the circuit blocking process of cutting or welding the circuit part by irradiating with strong laser light is performed last,
- the circuit blocking process may be absent or may be performed first, or may be performed between a weak laser light irradiation step in the periphery and a strong laser light irradiation step in the center portion.
- FIG. 13 is a view for explaining a defect repair method of a liquid crystal display device according to another embodiment of the present invention.
- the method for repairing defects in bright spots in the liquid crystal display device improves the lightness or blurring of the peripheral portion 21 relatively lightly after darkening by processing the central portion 22 of the defective pixel 20 with a laser beam. It can be implemented to further perform the step of strengthening the peripheral dark ignition.
- 13 (a) illustrates the pixel state before the peripheral darkening enhancement step
- FIG. 13 (b) illustrates the pixel state after the peripheral darkening enhancement step.
- the step of enhancing the darkening of the periphery may include once again scanning the periphery with a laser beam having a first intensity or less in the same or similar shape to the periphery.
- the laser beam scan for enhancing the peripheral darkening can be performed quickly in a very short time, such as 10 ⁇ s or less of the first intensity.
- the defect repair device of the liquid crystal display device darkens the central portion 22 and then scans the peripheral portion 21 once again using a laser beam having a third intensity of a first intensity or less, that is, The dark ignition of the peripheral portion 21 can be enhanced by secondary processing of the peripheral portion 21.
- This peripheral darkening enhancement process can be used to effectively treat a very small light leakage condition in the peripheral part seen in the processed defective pixel with a probability less than approximately 10% of the defect repair process.
- FIG. 14 is a block diagram of a defect repair device for a liquid crystal display according to another embodiment of the present invention.
- the bright spot defect repair apparatus 100 of the liquid crystal display includes a control unit 110 and a storage unit 120, a laser irradiation unit 140, and a monitoring device 150 And an actuator 160. It may include a defect repair device 100, in a broad sense, a laser irradiation unit 140, a monitoring device 150 and an actuator 160.
- the control unit 110 performs a program stored in the storage unit 120.
- the control unit 110 may be implemented as a central processing unit, a processor, or the like.
- the storage unit 120 may store a program that implements a method for repairing defects in a liquid crystal display device.
- the storage unit 120 may store a program for controlling the operation of the defect repair device of the liquid crystal display device.
- the program may include software modules.
- the software module includes a laser management module 121, an actuator control module 122, a laser beam intensity adjustment module 123, an information acquisition module 124, a scan direction determination module 125, a welding processing module 126, and a peripheral enhancement It may include a processing module 127.
- the laser management module 121 manages the operation of the laser irradiation unit that irradiates laser light.
- the actuator control module 122 is installed in the work unit for placing or fixing the liquid crystal display device or the laser irradiation unit, and operates to change or control the relative position of the laser light irradiated to the defective pixel of the liquid crystal display device.
- the laser beam intensity control module 123 adjusts the intensity of the laser beam to a first intensity (first light intensity) when laser scanning the periphery of the defective pixel, and adjusts the intensity of the laser beam when laser scanning the central portion of the defective pixel. Adjust to a second intensity (second light intensity) higher than the first intensity.
- the information acquisition module 124 acquires information for determining the scanning direction and intensity of the laser according to the state inside the pixel before laser scanning.
- the information acquisition module 124 may be installed in a defective pixel from a monitoring device 150 coupled to the laser irradiation unit 140 or from a storage device (not shown or 120) connected to the monitoring device 150 to store the collected information. Information about the form can be obtained.
- the scan direction determination module 125 may compare information acquired by the information acquisition module 124 with pre-stored reference information to determine the scan direction and intensity of the laser beam for the corresponding defective pixel.
- the welding processing module 126 blocks a power line pattern inside the defective pixel through welding by laser light.
- the welding processing module 126 may have at least any one of before, after irradiating the laser light of the first light intensity, before irradiating the laser light of the second light intensity, and after irradiating the laser light of the second light intensity to the periphery of the defective pixel. It may be implemented to perform at least one welding process in one or more process processes.
- the peripheral enhancement module 127 controls the operation of laser scanning of the peripheral portion using a laser beam having a third intensity equal to or less than the first intensity after laser scanning and darkening the central portion of the defective pixel, thereby controlling the peripheral portion of the defective pixel. It improves the dark ignition state and strengthens the dark ignition of the surrounding area.
- the laser irradiation unit 140 is provided to irradiate the laser beam to the liquid crystal display device disposed on the working unit.
- the laser irradiation unit 140 may include a laser generator, an optical system, and the like.
- the monitoring device 150 is disposed around the work unit and is installed to sense the internal state of a specific pixel of the liquid crystal display device.
- the monitoring device 150 may include a lighting device, a camera device, and the like.
- the actuator 160 may be installed in the work unit or laser irradiation unit and controlled by a control unit.
- the actuator 160 may include at least one or more devices selected from motors, pistons, pumps, valves, hydraulic devices, and the like.
- the bright spot defect repair apparatus 100 can effectively darken a bright spot defective pixel of a liquid crystal display device, particularly a liquid crystal display device having a vertical alignment mode (VA MODE) liquid crystal in a pixel. .
- VA MODE vertical alignment mode
Abstract
Description
Claims (15)
- 불량 화소를 레이저빔으로 조사하여 암점화하는 액정표시장치 휘도불량 수리방법에 있어서, In the method of repairing the defective luminance of the liquid crystal display device to darken by irradiating a defective pixel with a laser beam,상기 불량 화소의 가장자리에 대응하는 주변부를 제1 세기의 레이저빔으로 조사하여 상기 주변부를 경화 상태의 격벽으로 형성하는 제1 단계; 및A first step of irradiating a peripheral portion corresponding to the edge of the defective pixel with a laser beam of a first intensity to form the peripheral portion as a partition wall in a hardened state; And상기 주변부로 둘러쌓인 상기 불량 화소의 중앙부를 상기 제1 세기보다 강한 제2 세기의 레이저빔으로 조사하여 암점화하는 제2 단계;A second step of darkening by irradiating a central portion of the defective pixel surrounded by the peripheral portion with a laser beam of a second intensity stronger than the first intensity;를 포함하는 것을 특징으로 하는 액정표시장치의 휘점불량 수리방법.Repair method of defects in the liquid crystal display device comprising a.
- 제 1 항에 있어서,According to claim 1,상기 제1 세기는 상기 제2 세기의 30% 내지 80% 범위인 것을 특징으로 하는 액정표시장치의 휘점불량 수리방법.The first intensity is 30% to 80% of the second intensity, characterized in that the defect repair method of the liquid crystal display device.
- 제 1 항에 있어서,According to claim 1,상기 주변부의 폭 방향의 길이는 상기 불량 화소의 외곽 경계에서 상기 불량 화소의 길이 방향과 폭 방향에서의 각각의 길이의 10~15%에 이르는 것을 특징으로 하는 액정표시장치의 휘점불량 수리방법.The length of the peripheral portion in the width direction reaches 10 to 15% of the length of each of the defective pixels in the longitudinal direction and the width direction at the outer boundary of the defective pixel.
- 제 1 항에 있어서,According to claim 1,상기 제1 단계 전에, 상기 레이저빔을 공급하는 레이저 조사유닛에 결합된 감시장치로부터 혹은 상기 감시장치에 연결된 저장장치로부터 상기 불량 화소의 내부 형태에 대한 정보를 획득하고, 상기 획득된 정보에 따라 레이저광의 스캔 방향 및 세기를 결정하는 단계를 더 포함하는 것을 특징으로 하는 액정표시장치의 휘점불량 수리방법.Before the first step, information on the internal shape of the defective pixel is obtained from a monitoring device coupled to the laser irradiation unit that supplies the laser beam or from a storage device connected to the monitoring device, and a laser is used according to the obtained information. And determining the scanning direction and intensity of the light.
- 제 1 항에 있어서,According to claim 1,상기 제1 단계 전에, 상기 제2 단계 전에, 혹은 상기 제2 단계 이후에 레이저빔에 의한 웰딩을 통해 상기 불량 화소 내부의 전원 라인 패턴을 차단하는 단계를 더 포함하는 것을 특징으로 하는 액정표시장치의 휘점불량 수리방법.And before the first step, before the second step, or after the second step, blocking the power line pattern inside the defective pixel through welding by a laser beam. How to repair bad spots.
- 제 5 항에 있어서,The method of claim 5,상기 전원 라인 패턴은 상기 불량 화소 내부의 공통전원(Vcom) 전극라인과 투명전극이 상하층으로 겹치는 영역 가운데 적어도 하나인 것을 특징으로 하는 액정표시장치의 휘점불량 수리방법.The power line pattern is at least one of a region in which the common power (Vcom) electrode line and the transparent electrode in the defective pixel overlap the upper and lower layers.
- 제 1 항에 있어서,According to claim 1,상기 제2 단계 이후에, 상기 제1 세기 이하의 제3 세기를 갖는 레이저빔의 레이저 스캔을 통해 상기 주변부를 2차 가공하여 상기 주변부의 암점화를 강화하는 단계를 더 포함하는 것을 특징으로 하는 액정표시장치의 휘점불량 수리방법.And after the second step, further comprising the step of secondaryly processing the periphery of the laser beam through a laser scan of the laser beam having a third intensity equal to or less than the first intensity to enhance darkening of the periphery. How to repair defective display device.
- 제 1 항 내지 제 7 항 중 어느 한 항에 있어서,The method according to any one of claims 1 to 7,상기 액정표시장치는 화소에 수직배향모드(VA MODE)의 액정을 구비하는 것을 특징으로 하는 액정표시장치의 휘점불량 수리방법.The liquid crystal display device, the vertical alignment mode (VA MODE) of the liquid crystal display, characterized in that the liquid crystal display device is provided with a defect.
- 불량 화소를 레이저빔으로 조사하여 암점화하는 액정표시장치 휘도불량 수리장치로서,A liquid crystal display device for illuminating dark pixels by irradiating defective pixels with a laser beam.레이저빔을 출력하는 레이저 조사유닛;A laser irradiation unit for outputting a laser beam;액정표시장치를 올려놓거나 고정하는 작업유닛;A work unit for placing or fixing a liquid crystal display device;상기 액정표시장치의 불량 화소에 조사되는 레이저빔의 상대적인 위치를 변경하기 위하여 상기 레이저 조사유닛 및 상기 작업유닛 중 어느 하나 이상에 설치되는 액추에이터; 및An actuator installed in at least one of the laser irradiation unit and the working unit to change a relative position of a laser beam irradiated to a defective pixel of the liquid crystal display; And상기 액추에이터의 동작과 상기 레이저 조사부의 동작을 제어하는 제어유닛을 포함하고,It includes a control unit for controlling the operation of the actuator and the operation of the laser irradiation unit,상기 제어유닛은 상기 불량 화소의 가장자리에 대응하는 주변부를 제1 세기의 레이저빔으로 조사하고, 상기 주변부로 둘러쌓인 상기 불량 화소의 중앙부를 상기 제1 세기보다 강한 제2 세기의 레이저빔으로 조사하는 것을 특징으로 하는 액정표시장치의 휘점불량 수리장치.The control unit irradiates a peripheral portion corresponding to the edge of the defective pixel with a laser beam of a first intensity, and irradiates a central portion of the defective pixel surrounded by the peripheral portion with a laser beam of a second intensity stronger than the first intensity. Repair device for defective bright spots of a liquid crystal display device, characterized in that.
- 제 9 항에 있어서,The method of claim 9,상기 제1 세기는 상기 제2 세기의 30% 내지 80% 범위인 것을 특징으로 하는 액정표시장치의 휘점불량 수리장치.The first intensity is 30% to 80% of the second intensity range Defect repair device of the liquid crystal display device, characterized in that.
- 제 9 항에 있어서,The method of claim 9,상기 주변부의 폭 방향의 길이는 상기 불량 화소의 외곽 경계에서 상기 불량 화소의 길이 방향과 폭 방향에서의 각각의 길이의 10~15%에 이르는 것을 특징으로 하는 액정표시장치의 휘점불량 수리장치.The length of the peripheral portion in the width direction reaches 10 to 15% of each length in the length direction and the width direction of the defective pixel at an outer boundary of the defective pixel.
- 제 9 항에 있어서,The method of claim 9,상기 제1 세기의 레이저빔을 조사하기 전에, 상기 제어장치는 상기 레이저 조사유닛에 결합된 감시장치로부터 혹은 상기 감시장치에 연결된 저장장치로부터 상기 불량 화소의 내부 형태에 대한 정보를 획득하고, 상기 정보에 따라 레이저빔의 스캔 방향 및 세기를 결정하는 것을 특징으로 하는 액정표시장치의 휘점불량 수리장치.Before irradiating the laser beam of the first intensity, the control device obtains information on the internal shape of the defective pixel from a monitoring device coupled to the laser irradiation unit or from a storage device connected to the monitoring device, and the information Defect point repair device of a liquid crystal display device, characterized in that to determine the scanning direction and intensity of the laser beam according to.
- 제 9 항에 있어서,The method of claim 9,상기 제1 세기의 레이저빔을 조사하기 전에, 상기 제2 세기의 레이저빔을 조사하기 전에, 혹은 상기 제2 세기의 레이저빔을 조사한 이후에, 상기 제어장치는 레이저빔에 의한 웰딩을 통해 상기 불량 화소 내부의 전원 라인 패턴을 차단하는 것을 특징으로 하는 액정표시장치의 휘점불량 수리장치.Before irradiating the laser beam of the first intensity, before irradiating the laser beam of the second intensity, or after irradiating the laser beam of the second intensity, the control device performs the defect through welding by the laser beam. A defect repair device for a liquid crystal display device, characterized in that the power line pattern inside the pixel is cut off.
- 제 9 항에 있어서,The method of claim 9,상기 제2 세기의 레이저광을 조사한 후에, 상기 제어장치는 상기 제1 세기 이하의 제3 세기를 갖는 레이저빔을 통해 상기 주변부를 레이저 스캔하여 상기 주변부의 암점화를 강화하는 것을 특징으로 하는 액정표시장치의 휘점불량 수리장치.After irradiating the laser beam of the second intensity, the control device laser-scans the periphery through a laser beam having a third intensity less than or equal to the first intensity to enhance darkening of the peripheral area. A device for repairing defective devices.
- 제 9 항 내지 제 14 항 중 어느 한 항에 있어서,The method according to any one of claims 9 to 14,상기 액정표시장치는 화소에 수직배향모드(VA MODE)의 액정이 배치되는 액정표시장치인 것을 특징으로 하는 액정표시장치의 휘점불량 수리장치.The liquid crystal display device is a liquid crystal display device, characterized in that the liquid crystal in the vertical alignment mode (VA MODE) is disposed in the pixel.
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