WO2020052003A1 - 测试组件和测试设备 - Google Patents

测试组件和测试设备 Download PDF

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Publication number
WO2020052003A1
WO2020052003A1 PCT/CN2018/111645 CN2018111645W WO2020052003A1 WO 2020052003 A1 WO2020052003 A1 WO 2020052003A1 CN 2018111645 W CN2018111645 W CN 2018111645W WO 2020052003 A1 WO2020052003 A1 WO 2020052003A1
Authority
WO
WIPO (PCT)
Prior art keywords
test
detection
driver
pressure sensor
pressure
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/CN2018/111645
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English (en)
French (fr)
Inventor
邱添辉
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
HKC Co Ltd
Chongqing HKC Optoelectronics Technology Co Ltd
Original Assignee
HKC Co Ltd
Chongqing HKC Optoelectronics Technology Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by HKC Co Ltd, Chongqing HKC Optoelectronics Technology Co Ltd filed Critical HKC Co Ltd
Priority to US16/312,578 priority Critical patent/US11016139B2/en
Publication of WO2020052003A1 publication Critical patent/WO2020052003A1/zh
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/01—Subjecting similar articles in turn to test, e.g. "go/no-go" tests in mass production; Testing objects at points as they pass through a testing station
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L1/00—Measuring force or stress, in general
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L5/00—Apparatus for, or methods of, measuring force, work, mechanical power, or torque, specially adapted for specific purposes
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays

Definitions

  • the present application relates to the field of detection technology, and more particularly, to a test component and a test device.
  • a thin film transistor is a current liquid crystal display device (Liquid Crystal
  • LCD Display
  • AMOLED Active Matrix Organic Light Emitting Diode
  • Both the LCD and the AMOLED include a TFT array substrate.
  • TFT array substrate In order to monitor the characteristic value of the active light-emitting area (AA area, Active Area) of the display panel product, multiple test keys will be designed around the large panel of the display panel or around the panel. Test element assembly (TEG, Test Element
  • test component assemblies After crimping with these test keys, monitor various components such as TFT (thin film transistor) / Rs (line resistance or area resistance) / Rc (contact resistance between different conductors) / C (capacitance) in the display panel circuit RC (Contact Resistance) characteristics. 5Some test component assemblies are easily damaged during inspection. Summary of invention
  • the purpose of the embodiments of the present application is to provide a test component to solve the technical problem that the test component is easily damaged during detection.
  • test component which is arranged to be crimped with a test key provided around the display panel to detect a contact characteristic of a circuit of the display panel.
  • the test components include:
  • a detection needle which is driven by a driving force to press-fit with the test key, and at least one of the detection needles is provided;
  • a pressure sensor a pressure sensor, the pressure sensor and the detection needle are connected one-to-one correspondingly, the pressure sensor is configured to detect the magnitude of the pressure to which the detection needle connected, and the pressure sensor has a preset value;
  • a driving mechanism that is connected to each of the detection pins and outputs a driving force to each of the detection pins to drive the movement of each of the detection pins, and the driving mechanism includes a one-to-one correspondence with the detection pins
  • a first driver connected to drive the detection pin connected thereto, a pressure sensor and a first driver connected to the same detection pin to be mutually signal-connected, the first driver driving the detection pin and the detection pin Test key crimp;
  • each of the pressure sensors detects the pressure experienced by the detection needle connected to it in real time, and when the pressure of the detection needle detected by the pressure sensor reaches a preset value, the pressure sensor generates feedback A signal is transmitted to the first driver, and the first driver stops outputting a driving force to the detection needle
  • a test component provided in an embodiment of the present application includes at least one detection pin that is driven by a driving force to be crimped to a test key, and is in one-to-one correspondence with the detection pin and is configured to detect the pressure of the detection pin connected thereto.
  • a large-sized pressure sensor and a driving mechanism connected to the detection needle and outputting a driving force to each detection needle to drive the movement of each detection needle.
  • the driving mechanism includes a first driver correspondingly connected to the detection needle to drive the movement of the detection needle connected thereto. When performing a characteristic test on the test key, the first driver outputs a driving force to the test pin to drive the test pin to come into pressure contact with the test key. In the process, the pressure sensor detects the pressure on the test pin in real time.
  • the pressure sensor When the pressure sensor detects that the pressure on the detection needle reaches a preset value, the pressure sensor transmits a signal to the first driver. After receiving the signal, the first driver stops outputting driving force to the detection needle, and the detection needle stops moving. In this way, detection can be avoided.
  • the needle is bent and deformed due to excessive pressure during the test key crimping process The damage makes the test pin reusable, which in turn can save costs, and can also ensure that the test pin is subjected to the same pressure each time it is crimped to the test key, which can improve the test key characteristic test. Accuracy.
  • An object of the embodiment of the present application is also to provide a test device configured to detect a contact characteristic of a circuit of a display panel, including a test component, the test component is configured to be crimped to a test key provided around the display panel,
  • the test component includes:
  • a detection needle the detection needle is driven by a driving force to press-fit with the test key, and the detection needle is provided at least one;
  • a pressure sensor wherein the pressure sensor and the detection needle are connected in a one-to-one correspondence, the pressure sensor is configured to detect the pressure on the detection needle connected thereto, and the pressure sensor has a preset value;
  • a driving mechanism the driving mechanism is connected to each of the detection pins and outputs a driving force to each of the detection pins to drive the movement of each of the detection pins, and the driving mechanism includes a one-to-one correspondence with the detection pins A first driver connected to drive the detection pin connected thereto, a pressure sensor and a first driver connected to the same detection pin to be mutually signal-connected, the first driver driving the detection pin and the detection pin Test key crimp;
  • each of the pressure sensors detects the pressure experienced by the detection needle connected thereto in real time, and when the pressure of the detection needle detected by the pressure sensor reaches a preset value, the pressure sensor generates feedback A signal is transmitted to the first driver, and the first driver stops outputting a driving force to the detection needle
  • a test device provided by an embodiment of the present application includes a test component, and the test component includes at least one detection pin that is driven by a driving force to be crimped to the test key, is in one-to-one correspondence with the detection pin, and is configured to detect and A pressure sensor connected to the detection needle and a driving mechanism connected to the detection needle and outputting a driving force to each detection needle to drive the movement of each detection needle.
  • the driving mechanism includes a one-to-one corresponding connection with the detection needle to drive the connection therewith.
  • the first driver for detecting the movement of the test pin, when performing a characteristic test on the test key, the first driver outputs a driving force to the test pin to drive the test pin to press contact with the test key.
  • the pressure sensor detects the test pin in real time.
  • the magnitude of the pressure to be borne When the pressure sensor detects that the pressure on the detection needle reaches a preset value, the pressure sensor transmits a signal to the first driver. After receiving the signal, the first driver stops outputting driving force to the detection needle. Stop the movement. In this way, the test pin can be prevented from bearing due to the test key crimping process. Bending deformation and damage caused by excessive pressure make the test needle reusable, which can save costs, and also ensure that the pressure that the test needle is subjected to every time it is crimped to the test key is maintained Consistent, can improve the accuracy of the test key characteristic detection.
  • An object of the embodiment of the present application is also to provide a test device configured to detect a contact characteristic of a circuit of a display panel, including a test component, the test component being provided to a test key provided around the display panel. Crimping, the test component includes:
  • a detection needle which is driven by a driving force to press-fit with the test key, and the detection needle is provided with at least one;
  • a pressure sensor wherein the pressure sensor is connected to the detection needle in a one-to-one correspondence, the pressure sensor is configured to detect the magnitude of the pressure to which the detection needle connected, and the pressure sensor has a preset value;
  • a driving mechanism that is connected to each of the detection pins and outputs a driving force to each of the detection pins to drive the movement of each of the detection pins, and the driving mechanism includes a one-to-one correspondence with the detection pins
  • a first driver connected to drive the detection pin connected thereto, and a second driver configured to drive the detection pin closer to the test key; the second driver driving the detection pin to approach in a first direction
  • the test key makes the detection pin reach above the test key and align, and the first driver drives the detection pin to move in a second direction to be crimped to the test key;
  • the pressure sensor and the first driver connected to the same detection pin are mutually signal-connected, and the first driver drives the detection pin to be crimped to the test key;
  • each of the pressure sensors detects the pressure on the detection needle connected to the pressure sensor in real time, and when the pressure of the detection needle detected by the pressure sensor reaches a preset value, the pressure sensor generates feedback A signal is transmitted to the first driver, and the first driver stops outputting a driving force to the detection needle
  • a test device provided in an embodiment of the present application includes a test component, and the test component includes at least one detection pin that is driven by a driving force to be crimped to the test key, is in one-to-one correspondence with the detection pin, and is configured to detect A pressure sensor connected to the detection needle and a driving mechanism connected to the detection needle and outputting a driving force to each detection needle to drive the movement of each detection needle.
  • the driving mechanism includes a one-to-one corresponding connection with the detection needle to drive the connection therewith.
  • the test keys are aligned above and above, and the first driver drives the test pin to move in a second direction to be crimped to the test key; the efficiency and accuracy of the process of crimping the test pin to the test key can be improved.
  • the first driver outputs a driving force to the test pin to drive the test pin to press contact with the test key.
  • Real-time detection sensor detects a pressure The pressure of the needle.
  • the pressure sensor When the pressure sensor detects that the pressure on the detection needle reaches a preset value, the pressure sensor transmits a signal to the first driver. After receiving the signal, the first driver stops outputting driving force to the detection needle. The needle stops moving. In this way, it is possible to avoid bending and deformation of the test needle due to excessive pressure during the test key crimping process, so that the test needle can be reused, which can also save costs, and, It can also ensure that the pressure applied to the test pin every time it is crimped to the test key remains the same, which can improve the accuracy of detecting the characteristics of the test key.
  • FIG. 1 is a schematic structural diagram of a test component according to an embodiment of the present application.
  • FIG. 2 is a schematic structural diagram of a test component according to an embodiment of the present application.
  • FIG. 3 is a schematic structural diagram of a pressure sensor and a detection needle.
  • the present application provides a test component configured to be crimped with a test key formed around the display panel during a manufacturing stage of the display panel to detect a contact resistance characteristic of a circuit of the display panel.
  • the display panel is provided with a plurality of test pads. Each test pad leads to a test lead, and the test key is formed by the test lead connection between the test pads, such as the first test pad and the third test pad.
  • the test lead connection can form a test key, and the test lead connection of the second and fourth test pads can form a test key. According to the test needs and the structure of the display panel, more test keys can be formed.
  • the test key is formed in an invalid area around the display panel.
  • the test assembly includes at least one detection pin 11 which is under pressure contact with the test key by a driving force, a pressure sensor 12 connected to the detection pin 11 in a one-to-one correspondence, and the pressure sensor 12 is configured to detect the detection pin 11 connected thereto.
  • the amount of pressure also includes a driving mechanism 18 that is connected to each detection needle 11 and outputs a driving force to each detection needle 11 to drive the movement of each detection needle 11.
  • the driving mechanism 18 includes a first driver 13 correspondingly connected to the detection pin 11 to drive the detection pin 11 connected thereto, and a pressure sensor 12 and a first driver 13 connected to the same detection pin 11 are signal-connected to each other.
  • the pressure sensor 12 has a preset value.
  • the first driver 13 drives the detection pin 11 to be in pressure contact with the test key.
  • Each pressure sensor 12 detects the pressure on the detection pin 11 connected to it in real time. When the pressure reaches a preset value, the pressure sensor 12 generates a signal and transmits it to the first driver 13, and the first driver 13 stops outputting the driving force to the detection needle 11.
  • the test assembly includes at least one detection pin 11 that is driven to press-contact with the test key, is in one-to-one correspondence with the detection pin 11 and is configured to detect the pressure of the detection pin 11 connected thereto.
  • the driving mechanism 18 includes a corresponding connection with the detection pin 11 to drive the connection therewith
  • the first driver 13 of the detection pin 11 moves. When performing a characteristic test on the test key, the first driver 13 outputs a driving force to the detection pin 11 to drive the detection pin 11 to move into pressure contact with the test key.
  • the pressure The sensor 12 detects the pressure on the detection needle 11 in real time.
  • the pressure sensor 12 detects that the pressure on the detection needle 11 reaches a preset value
  • the pressure sensor 12 transmits a stop signal to the first driver 13 and the first driver 13 receives After the stop signal is reached, the output of the driving force to the detection pin 11 is stopped, and the detection pin 11 stops moving. In this way, the detection pin 11 can be prevented from receiving pressure during the test key crimping process.
  • the purpose of the present invention is also to ensure that the pressure applied to the test pin 11 every time it is crimped to the test key is kept consistent, and the accuracy of detecting the characteristics of the test key can be improved.
  • the test component further includes a data processing unit 14 that is signally connected to each of the pressure sensors 12, and each of the first driver 13 and the data processing unit 14 Signal connection.
  • the pressure sensor 12 and the first driver 13 connected to the same detection pin 11 are signal-connected to each other through the data processing unit 14.
  • the pressure sensor 12 When the pressure of the detection pin 11 detected by the pressure sensor 12 reaches a preset value, the pressure sensor 12 generates a feedback signal.
  • the feedback signal is transmitted to the data processing unit 14.
  • the data processing unit 14 receives the feedback signal of the pressure sensor 12 and generates a control signal.
  • the data processing unit 14 transmits the control signal to the first driver 13, and the first driver 13 receives the control signal. Then, the output of the driving force to the detection needle 11 is stopped.
  • each pressure sensor 12 when the pressure of the detection needle 11 detected by the pressure sensor 12 reaches a preset value, since each pressure sensor 12 is signally connected to the data processing unit 14, the pressure sensor 12 may generate a feedback signal and The feedback signal is transmitted to the data processing unit 14, and each first driver 13 is signal-connected to the data processing unit 14.
  • the data processing unit 14 generates a control signal after receiving the feedback signal from the pressure sensor 12, and the data processing unit 14 sends the control signal to the data processing unit 14.
  • the control signal is transmitted to the first driver 13 so that the first driver 13 stops working, and further stops the detection needle 11 from moving, thereby avoiding bending of the detection needle 11 due to excessive pressure during the crimping process with the test key.
  • the deformation and damage make the detection needle 11 reusable, which can further reduce costs.
  • test assembly further includes a carrier configured to mount each of the detection pins 11, and the driving mechanism 18 further includes a second driver 16 connected to the carrier and driving the carrier to move the detection pin 11 close to the test key. as shown in picture 2.
  • the number of the carrier may be one or more, and each detection pin 11 is movably mounted on the carrier.
  • the second driver 16 and the first driver 13 may be configured to drive the carrier and the detection needle 11 in different directions.
  • the number of the supporting members may be one, and the second driver 16 drives the one supporting member to move so as to drive the detection pins 11 to move in the first direction.
  • the first driver 13 corresponds to the detection pins 11 one by one.
  • each first driver 13 drives the corresponding detection needle 11 to move in the second direction to the Test the key crimp.
  • the second driver 16 is configured to drive the carrier and the detection pins 11 to gradually approach the test key in the first direction, such as to reach above the test key and align, and then, the first driver 13 drives each detection pin 11 along Movement in the second direction (ie downward movement) until crimping with the test key.
  • the first direction is perpendicular to the second direction.
  • the speed of the second driver 16 to drive the carrier may be greater than that of the first driver 13 to drive the detection pins 11 The speed of movement, which is helpful to improve the detection efficiency, and will not cause damage to the detection needle 11
  • the alignment between the detection pin 11 and the test key is determined by the position between the test component itself and the test key, which can be easily
  • the ground is determined by the relative positioning between the test component itself and the display panel or the large panel of the display panel to be tested, or a third-direction slide rail on the rack is provided with a movement direction perpendicular to the first direction and the second direction.
  • the carrier moves in a first direction and a third direction. No more restrictions here.
  • the test assembly further includes a rack, and the carrier and the rack are slidingly mounted. During the movement of the carrier driven by the first drive, the carrier approaches the test piece in a manner of sliding on the frame in the first direction.
  • the number of the carrier is plural and corresponds to the detection pins 11 one by one, and the second driver 16 and the first driver 13 are both configured to drive the carrier and the detection pins 11 in a three-dimensional direction.
  • the second driver 16 drives each carrier and the detection pin to move in the first direction, the second direction, and the third direction and approach the test key.
  • the second direction is a direction perpendicular to the plane of the test key, that is, the detection pin 11 is crimped. To the direction on the plane of the test key, in this second direction, the detection needle 11 is pressed.
  • the first direction, the third direction, and the second direction are perpendicular to each other. Then, the first driver 13 continues to move in the first direction, the second direction, and the third party, and presses the test key.
  • the control accuracy of the first driver 13 is higher than the control accuracy of the second driver 16, so that the detection pins 11 and 11 can be controlled more accurately.
  • the relative distance between the test keys in the second direction avoids excessive or small pressure between the test pin 11 and the test key, avoids damage to the test pin 11, and ensures detection accuracy.
  • the control accuracy of the first driver 13 may be 5 ⁇ m, that is, the detection needle 11 may be driven to a minimum of 5 ⁇ m.
  • the micrometer step distance is closer to the test key.
  • the control accuracy of the second driver 16 may be more than 10 micrometers, such as 10 micrometers, 20 micrometers, etc., which is not limited herein.
  • each detection pin 11 is mounted on a carrier.
  • the second driver 16 first drives the carrier to quickly approach the test key.
  • the carrier The detection pin 11 is brought close to the test key, and then the detection pin 11 is driven by the first driver 13 to be crimped to the test key for detection.
  • the second driver 16 can improve the detection efficiency, and the first driver 13 can achieve high-precision control, thereby avoiding the bending and deformation of the detection needle 11 due to excessive pressure during the test key crimping process, so that the detection needle 11 It can be reused, which can save costs.
  • the test assembly further includes a rack, and the carrier is approached to the test part in a manner of sliding on the rack in the first direction, the second direction, and the third direction.
  • the test component further includes a camera that is signally connected to the data processing unit 14 and is configured to obtain a distance between each detection pin 11 and the test key in a first direction, and the second driver 16 is controlled to be connected to the data processing unit 14,
  • the data processing unit 14 may also be provided with a standard value of the distance.
  • the camera captures the image of the detection pin 11 and the test key and transmits the image to the data processing unit 14.
  • the data processing unit 14 analyzes the image to obtain the distance information between the detection pin 11 and the test key.
  • the data processing unit 14 compares the detection pin 11
  • the distance information between the test key and the standard value determines whether the second driver 16 needs to be controlled to stop working. When the distance between the detection pin 11 and the test key is greater than the standard value, the second driver 16 continues to work. When the distance between the detection pin 11 and the test key is less than or equal to a standard value, the second driver 16 stops working.
  • the standard value is set to 20 micrometers.
  • the distance between the test pin 11 and the test key in the second direction is less than or equal to 20 micrometers, it indicates that the test pin 11 has reached the test key.
  • the minimum distance should be changed by the first driver 13 at a smaller step distance.
  • the standard value is set to 10 micrometers, which can further accurately control the distance between the detection pin 11 and the test key.
  • the camera may be a CCD (Charge Coupled Device
  • the charge is called a conforming component) camera or a CMOS (Complementary Metal Oxide Semiconductor) camera, which is not limited here.
  • CMOS Complementary Metal Oxide Semiconductor
  • the second driver 16 drives the carrier close to the test key, and the carrier drives the detection needle 11 against Near the test key
  • the camera acquires the image of the test pin 11 and the test key in real time, and sends the image to the data processing unit 14, the data processing unit 14 analyzes the image to obtain the data between the test pin 11 and the test key.
  • Distance information The data processing unit 14 compares the distance information between the detection pin 11 and the test key with a standard value to determine whether it is necessary to control the second driver 16 to stop working. When the distance between the detection pin 11 and the test key is stopped, When the distance is greater than the standard value, the second driver 16 continues to work. When the distance between the detection pin 11 and the test key is less than or equal to the standard value, the second driver 16 stops working. In this way, it can be avoided that the detection pin 11 and the test key occur. The collision causes the detection needle 11 to bend and deform.
  • the pressure sensor 12 includes a housing 121 formed with a mounting cavity 122, a pressure elastic member 123 installed in the mounting cavity 122, and connected to the pressure elastic member 123 and configured to force signals.
  • a signal converter converted into an electrical signal one end of the detection pin 11 is inserted into the mounting cavity 122, and the other end is exposed outside the mounting cavity 122 to be crimped with the test key.
  • One end of the pressure elastic member 123 is fixed to the mounting cavity of the housing 121.
  • the other end of the pressure elastic member 123 is fixed to an end of the detection needle 11 located in the installation cavity 122, so that the detection needle 11 can slide inside the installation cavity 122 to realize the sliding connection between the detection needle 11 and the housing 121.
  • the detection pin 11 is crimped to the test key, the detection pin 11 is compressed back into the mounting cavity 122.
  • the length of the detection pin 11 being compressed back into the installation cavity 122 that is, the degree of compression of the pressure elastic member 123 indicates the amount of pressure between the detection pin 11 and the test key.
  • the degree of compression of the pressure elastic member 123 can be further converted by signals.
  • the device converts the pressure value into a visual representation.
  • the signal converter is signal-connected to the data processing unit 14, and the pressure elastic member 123 may be connected to the signal converter.
  • the signal converter senses the deformation of the pressure elastic member 123, and further senses the pressure.
  • the pressure of the detection needle 11 is transmitted to the data processing unit 14 in the form of a feedback signal.
  • the driving of the detection pins 11 by the first driver 13 can be realized by the housing 121, that is, the first driver 13 drives the detection pins 11 by driving the housing 121 and senses each The pressure applied to the needle 11 is detected.
  • the support member drives each detection pin 11 to reach above the test key in the first direction
  • each housing 121 can slide on the support member in the second direction, so that each detection pin 11 is crimped to the test key through the housing 121.
  • test device configured to monitor, for example, a thin film transistor, a line resistance, a surface resistance, a contact resistance between different conductors, a capacitance, and the like in a circuit of the display panel during the manufacturing stage of the display panel. Contact characteristics of various components.
  • the test equipment includes the test assembly described above.

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  • General Physics & Mathematics (AREA)
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Abstract

本申请实施例提供一种测试组件，包括检测针（11）、与检测针（11）连接的压力传感器（12）以及驱动各检测针（11）运动的驱动机构（18），各压力传感器（12）实时检测检测针（11）所承受的压力。

Description

说明书 发明名称:测试组件和测试设备
技术领域
[0001] 本申请涉及检测技术领域， 更具体地说， 是涉及一种测试组件和测试设备。
背景技术
[0002] 薄膜晶体管（Thin Film Transistor, TFT）是目前液晶显示装置（Liquid Crystal
Display , LCD）和有源矩阵驱动式有机电致发光显示装置（Active Matrix Organic Light- Emitting Diode, AMOLED）中的主要驱动元件， 直接关系平板显示装置的 显示性能。
[0003] 不论是 LCD还是 AMOLED均包括一 TFT阵列基板。 一般在显示面板的产品制造 阶段， 为监控显示器面板产品的有效发光区（AA区， Active Area）的特性值， 会在 显示器面板的大板四周或面板四周设计多个测试键（Test key）， 通过测试元件组 件（TEG, Test Element
Group）与这些测试键压接后监控如显示面板的电路中的 TFT（薄膜晶体管）/Rs（线 电阻或面电阻） /Rc（不同导体间的接触电阻）/C（电容）等各种组件的 RC （接触电阻 , Contact Resistance） 特性。 5见有的测试元件组件在检测时， 容易受到损坏。 发明概述
技术问题
[0004] 本申请实施例的目的在于提供一种测试组件， 以解决测试组件在检测时容易受 到损坏的技术问题。
问题的解决方案
技术解决方案
[0005] 为解决上述技术问题， 本申请实施例采用的技术方案是： 提供一种测试组件， 设置为与设于显示面板周围的测试键压接以检测显示面板的电路的接触特性， 所述测试组件包括：
[0006] 检测针， 所述检测针受驱动力作用以与所述测试键压接配合， 所述检测针设置 至少一个； [0007] 压力传感器， 所述压力传感器与所述检测针一一对应连接， 所述压力传感器设 置为检测与之连接的所述检测针所受到的压力大小， 所述压力传感器具有预设 值；
[0008] 驱动机构， 所述驱动机构与各所述检测针均连接并对各所述检测针输出驱动力 以驱动各所述检测针运动， 所述驱动机构包括与所述检测针一一对应连接以驱 动与之连接的所述检测针运动的第一驱动器， 与同一所述检测针连接的所述压 力传感器和第一驱动器相互信号连接， 所述第一驱动器驱动所述检测针与所述 测试键压接；
[0009] 其中， 各所述压力传感器实时检测与之连接的所述检测针所承受的压力， 当所 述压力传感器检测的所述检测针的压力达到预设值时， 所述压力传感器产生反 馈信号并传向所述第一驱动器， 所述第一驱动器停止对所述检测针输出驱动力
[0010] 本申请实施例提供的一种测试组件， 包括受驱动力作用以与测试键压接的至少 一检测针、 与检测针一一对应连接且设置为检测与之连接的检测针的压力大小 的压力传感器以及与检测针均连接并对各检测针输出驱动力以驱动各检测针运 动的驱动机构， 驱动机构包括与检测针—对应连接以驱动与之连接的检测针 运动的第一驱动器， 在对测试键进行特性检测时， 第一驱动器对检测针输出驱 动力以驱动检测针运动至与测试键压接， 在该过程中， 压力传感器实时检测检 测针所承受的压力的大小， 当压力传感器测得检测针所承受的压力达到预设值 时， 压力传感器向第一驱动器传输信号， 第一驱动器接收到信号后停止对检测 针输出驱动力， 检测针停止运动， 如此， 可以避免检测针在于测试键压接过程 中由于承受的压力过大而导致的弯折变形和损坏， 使得检测针可重复利用， 进 而可以起到节约成本的作用， 并且， 还可以保证检测针每次与测试键压接时受 承受的压力大小均保持一致， 可以提高对测试键特性检测的准确率。
[0011] 本申请实施例的目的还在于提供一种测试设备， 设置为检测显示面板的电路的 接触特性， 包括测试组件， 所述测试组件设置为与设于显示面板周围的测试键 压接， 所述测试组件包括：
[0012] 检测针， 所述检测针受驱动力作用以与所述测试键压接配合， 所述检测针设置 至少一个；
[0013] 压力传感器， 所述压力传感器与所述检测针一一对应连接， 所述压力传感器设 置为检测与之连接的所述检测针所受到的压力大小， 所述压力传感器具有预设 值；
[0014] 驱动机构， 所述驱动机构与各所述检测针均连接并对各所述检测针输出驱动力 以驱动各所述检测针运动， 所述驱动机构包括与所述检测针一一对应连接以驱 动与之连接的所述检测针运动的第一驱动器， 与同一所述检测针连接的所述压 力传感器和第一驱动器相互信号连接， 所述第一驱动器驱动所述检测针与所述 测试键压接；
[0015] 其中， 各所述压力传感器实时检测与之连接的所述检测针所承受的压力， 当所 述压力传感器检测的所述检测针的压力达到预设值时， 所述压力传感器产生反 馈信号并传向所述第一驱动器， 所述第一驱动器停止对所述检测针输出驱动力
[0016] 本申请实施例提供的一种测试设备中， 包括测试组件， 测试组件包括受驱动力 作用以与测试键压接的至少一检测针、 与检测针一一对应连接且设置为检测与 之连接的检测针的压力大小的压力传感器以及与检测针均连接并对各检测针输 出驱动力以驱动各检测针运动的驱动机构， 驱动机构包括与检测针一一对应连 接以驱动与之连接的检测针运动的第一驱动器， 在对测试键进行特性检测时， 第一驱动器对检测针输出驱动力以驱动检测针运动至与测试键压接， 在该过程 中， 压力传感器实时检测检测针所承受的压力的大小， 当压力传感器测得检测 针所承受的压力达到预设值时， 压力传感器向第一驱动器传输信号， 第一驱动 器接收到信号后停止对检测针输出驱动力， 检测针停止运动， 如此， 可以避免 检测针在于测试键压接过程中由于承受的压力过大而导致的弯折变形和损坏， 使得检测针可重复利用， 进而可以起到节约成本的作用， 并且， 还可以保证检 测针每次与测试键压接时受承受的压力大小均保持一致， 可以提高对测试键特 性检测的准确率。
[0017] 本申请实施例的目的还在于提供一种测试设备， 设置为检测显示面板的电路的 接触特性， 包括测试组件， 所述测试组件设置为与设于显示面板周围的测试键 压接， 所述测试组件包括：
[0018] 检测针， 所述检测针受驱动力作用以与所述测试键压接配合， 所述检测针设置 至少一个；
[0019] 压力传感器， 所述压力传感器与所述检测针一一对应连接， 所述压力传感器设 置为检测与之连接的所述检测针所受到的压力大小， 所述压力传感器具有预设 值；
[0020] 驱动机构， 所述驱动机构与各所述检测针均连接并对各所述检测针输出驱动力 以驱动各所述检测针运动， 所述驱动机构包括与所述检测针一一对应连接以驱 动与之连接的所述检测针运动的第一驱动器， 以及设置为驱动所述检测针靠近 所述测试键的第二驱动器； 所述第二驱动器驱动所述检测针沿第一方向靠近所 述测试键， 使所述检测针到达所述测试键的上方并对齐， 所述第一驱动器驱动 所述检测针沿第二方向运动至与所述测试键压接；
[0021] 与同一所述检测针连接的所述压力传感器和第一驱动器相互信号连接， 所述第 一驱动器驱动所述检测针与所述测试键压接；
[0022] 其中， 各所述压力传感器实时检测与之连接的所述检测针所承受的压力， 当所 述压力传感器检测的所述检测针的压力达到预设值时， 所述压力传感器产生反 馈信号并传向所述第一驱动器， 所述第一驱动器停止对所述检测针输出驱动力
[0023] 本申请实施例提供的一种测试设备中， 包括测试组件， 测试组件包括受驱动力 作用以与测试键压接的至少一检测针、 与检测针一一对应连接且设置为检测与 之连接的检测针的压力大小的压力传感器以及与检测针均连接并对各检测针输 出驱动力以驱动各检测针运动的驱动机构， 驱动机构包括与检测针一一对应连 接以驱动与之连接的检测针运动的第一驱动器以及驱动所述检测针靠近所述测 试键的第二驱动器； 所述第二驱动器驱动所述检测针沿第一方向靠近所述测试 键， 使所述检测针到达所述测试键的上方并对齐， 所述第一驱动器驱动所述检 测针沿第二方向运动至与所述测试键压接； 能够提高检测针与测试键压接过程 的效率和准确性， 在对测试键进行特性检测时， 第一驱动器对检测针输出驱动 力以驱动检测针运动至与测试键压接， 在该过程中， 压力传感器实时检测检测 针所承受的压力的大小， 当压力传感器测得检测针所承受的压力达到预设值时 ， 压力传感器向第一驱动器传输信号， 第一驱动器接收到信号后停止对检测针 输出驱动力， 检测针停止运动， 如此， 可以避免检测针在于测试键压接过程中 由于承受的压力过大而导致的弯折变形和损坏， 使得检测针可重复利用， 进而 可以起到节约成本的作用， 并且， 还可以保证检测针每次与测试键压接时受承 受的压力大小均保持一致， 可以提高对测试键特性检测的准确率。
发明的有益效果
对附图的简要说明
附图说明
[0024] 为了更清楚地说明本申请实施例中的技术方案， 下面将对实施例或现有技术描 述中所需要使用的附图作简单地介绍， 显而易见地， 下面描述中的附图仅仅是 本申请的一些实施例， 对于本领域普通技术人员来讲， 在不付出创造性劳动性 的前提下， 还可以根据这些附图获得其他的附图。
[0025] 图 1是本申请实施例提供的测试组件的结构示意图。
[0026] 图 2是本申请实施例提供的测试组件的结构示意图；
[0027] 图 3是压力传感器和检测针的结构示意图。
发明实施例
本发明的实施方式
[0028] 为了使本申请所要解决的技术问题、 技术方案及有益效果更加清楚明白， 以下 结合附图及实施例， 对本申请进行进一步详细说明。 应当理解， 此处所描述的 具体实施例仅仅用以解释本申请， 并不用于限定本申请。
[0029] 需要说明的是， 当元件被称为“设置于”另一个元件， 它可以直接在另一个元件 上或者间接在该另一个元件上。 当一个元件被称为是“连接于”另一个元件， 它可 以是直接连接到另一个元件或间接连接至该另一个元件上。 此外， 术语“第一”、 “第二”仅用于描述目的， 而不能理解为指示或暗示相对重要性或者隐含指明所指 示的技术特征的数量。 由此， 限定有“第一”、 “第二”的特征可以明示或者隐含地 包括一个或者更多个该特征。 在本实用新型的描述中， “多个”的含义是两个或两 个以上， 除非另有明确具体的限定。
[0030] 如图 1至图 3所示， 本申请提供一种测试组件， 设置为在显示面板的制造阶段与 形成在显示面板周围的测试键压接， 以检测显示面板的电路的接触电阻特性。 显示面板上设有多个测试焊盘， 每一测试焊盘引出一测试引线， 测试键由测试 焊盘之间的测试引线连接形成， 如第 1个测试焊盘与第 3个测试焊盘的测试引线 连接可以形成一个测试键， 第 2个和第 4个测试焊盘的测试引线连接可以形成一 个测试键。 根据测试需要和显示面板结构， 可以形成更多个测试键。 测试键形 成于显示面板周围的无效区。
[0031] 测试组件包括受驱动力作用以与测试键压接的至少一检测针 11、 与检测针 11一 一对应连接的压力传感器 12, 压力传感器 12设置为检测与之连接的检测针 11的 压力大小， 还包括与各检测针 11均连接并对各检测针 11输出驱动力以驱动各检 测针 11运动的驱动机构 18。 驱动机构 18包括与检测针 11 -对应连接以驱动与 之连接的检测针 11运动的第一驱动器 13 , 与同一检测针 11连接的压力传感器 12 和第一驱动器 13相互信号连接。 压力传感器 12具有预设值， 第一驱动器 13驱动 检测针 11与测试键压接， 各压力传感器 12实时检测与之连接的检测针 11所承受 的压力， 当压力传感器 12检测的检测针 11的压力达到预设值时， 压力传感器 12 产生信号并传向第一驱动器 13 , 第一驱动器 13停止对检测针 11输出驱动力。
[0032] 在该实施例中， 测试组件包括受驱动力作用以与测试键压接的至少一检测针 11 、 与检测针 11一一对应连接且设置为检测与之连接的检测针 11的压力大小的压 力传感器 12， 以及与检测针 11均连接并对各检测针 11输出驱动力以驱动各检测 针 11运动的驱动机构 18， 驱动机构 18包括与检测针 11 -对应连接以驱动与之 连接的检测针 11运动的第一驱动器 13 , 在对测试键进行特性检测时， 第一驱动 器 13对检测针 11输出驱动力以驱动检测针 11运动至与测试键压接， 在该过程中 ， 压力传感器 12实时检测检测针 11所承受的压力的大小， 当压力传感器 12测得 检测针 11所承受的压力达到预设值时， 压力传感器 12向第一驱动器 13传输停止 信号， 第一驱动器 13接收到停止信号后停止对检测针 11输出驱动力， 检测针 11 停止运动， 如此， 可以避免检测针 11在于测试键压接过程中由于承受的压力过 大而导致的弯折变形和损坏， 使得检测针 11可重复利用， 进而可以起到节约成 本的目的， 并且， 还可以保证检测针 11每次与测试键压接时所承受的压力大小 均保持一致， 可以提高对测试键特性检测的准确率。
[0033] 进一步地， 压力传感器 12向第一驱动器 13传输停止信号可以这样实现， 测试组 件还包括与各压力传感器 12均信号连接的数据处理单元 14, 各第一驱动器 13均 与数据处理单元 14信号连接， 与同一检测针 11连接的压力传感器 12和第一驱动 器 13通过数据处理单元 14相互信号连接， 当压力传感器 12检测的检测针 11的压 力达到预设值时， 压力传感器 12产生反馈信号并将反馈信号传送至数据处理单 元 14, 数据处理单元 14接收到压力传感器 12的反馈信号后产生控制信号， 数据 处理单元 14将控制信号传送至第一驱动器 13 , 第一驱动器 13接收到控制信号后 停止对检测针 11输出驱动力。
[0034] 在该实施例中， 当压力传感器 12检测的检测针 11的压力达到预设值时， 由于各 压力传感器 12均与数据处理单元 14信号连接， 故， 压力传感器 12可产生反馈信 号并将反馈信号传送至数据处理单元 14, 而各第一驱动器 13均与数据处理单元 1 4信号连接， 数据处理单元 14接收到压力传感器 12的反馈信号后产生控制信号， 并且数据处理单元 14将该控制信号传送至第一驱动器 13 , 使得第一驱动器 13停 止工作， 进一步地使得检测针 11停止运动， 从而避免检测针 11在与测试键压接 过程中由于承受的压力过大而导致的弯折变形和损坏， 使得检测针 11可重复利 用， 进而可以起到节约成本的目的。
[0035] 进一步地， 测试组件还包括设置为安装各检测针 11的承载件， 驱动机构 18还包 括与承载件连接并驱动承载件运动以供检测针 11靠近测试键的第二驱动器 16。 如图 2所示。
[0036] 在本实施例中， 承载件的数量可以为一个或多个， 各检测针 11可移动地安装于 承载件上。
[0037] 在一实施例中， 第二驱动器 16和第一驱动器 13可以设置为在不同方向上驱动承 载件和检测针 11。 承载件的数量可以为一个， 第二驱动器 16带动该一个承载件 运动从而带动各检测针 11沿第一方向运动。 第一驱动器 13与各检测针 11是一一 对应的， 当第二驱动器 16带动承载件运动到达测试键的上方后， 各第一驱动器 1 3带动相应的检测针 11沿第二方向运动至与测试键压接。 [0038] 具体地， 第二驱动器 16设置为驱动承载件和各检测针 11沿第一方向逐渐靠近测 试键， 如到达测试键的上方并对齐， 然后， 第一驱动器 13驱动各检测针 11沿第 二方向运动 （即向下运动） 直至与测试键之间实现压接。 第一方向与第二方向 垂直。
[0039] 由于第二驱动器 16设置为驱动承载件和各检测针 11沿第一方向运动并到达测试 键的上方， 第二驱动器 16驱动承载件运动的速度可以大于第一驱动器 13驱动检 测针 11运动的速度， 这样有利于提高检测效率， 并且不会对检测针 11造成损坏
[0040] 而在垂直于由第一方向和第二方向所决定的平面的第三方向上， 检测针 11与测 试键之间的对齐由测试组件本身与测试键之间的位置决定， 这可容易地由测试 组件本身与待测的显示面板或显示面板大板之间的相对定位决定， 或者于机架 上设置运动方向与第一方向和第二方向均垂直的第三方向的滑轨， 供承载件在 第一方向和第三方向移动。 此处不再限制。
[0041] 在一个实施例中， 测试组件还包括一机架， 承载件与机架滑动安装。 在第一驱 动器驱动承载件运动的过程中， 承载件以在机架上沿第一方向滑动的方式向测 试件靠近。
[0042] 在一实施例中， 承载件的数量为多个且与检测针 11一一对应， 第二驱动器 16和 第一驱动器 13均设置为在三维方向上驱动承载件和检测针 11。 第二驱动器 16驱 动各承载件和检测针在第一方向、 第二方向和第三方向上移动并靠近测试键， 其中第二方向为垂直于测试键的平面的方向， 也即检测针 11压接到测试键的平 面上的方向， 在该第二方向上， 检测针 11受到压力。 第一方向、 第三方向与第 二方向之间两两垂直。 然后， 改由第一驱动器 13继续在第一方向、 第二方向和 第三方向上移动并于测试键实现压接。
[0043] 由于第一驱动器 13的驱动使得检测针 11与测试键之间实现压接， 第一驱动器 13 的控制精度高于第二驱动器 16的控制精度， 这样可以更精确地控制检测针 11与 测试键之间沿第二方向的相对距离， 避免检测针 11与测试键之间的压力过大或 过小， 避免检测针 11的损坏， 保证检测准确率。
[0044] 具体地， 第一驱动器 13的控制精度可以为 5微米， 即可以驱动检测针 11以最小 5 微米的步进距离向测试键靠近。 第二驱动器 16的控制精度可以为 10微米以上， 如 10微米、 20微米等， 此处不做限制。
[0045] 在该实施例中， 各检测针 11均安装于承载件上， 在对测试键检测的过程中， 首 先由第二驱动器 16驱动承载件快速靠近测试键， 在此过程中， 承载件带动检测 针 11靠近测试键， 然后由第一驱动器 13驱动检测针 11与测试键压接后进行检测 。 第二驱动器 16可以提高检测的效率， 第一驱动器 13可以实现高精度控制， 进 而避免检测针 11在于测试键压接过程中由于承受的压力过大而导致的弯折变形 和损坏， 使得检测针 11可重复利用， 进而可以起到节约成本的目的。
[0046] 在该实施例中， 测试组件还包括一机架， 承载件以在机架上沿第一方向、 第二 方向和第三方向滑动的方式向测试件靠近。
[0047] 进一步地， 测试组件还包括与数据处理单元 14信号连接且设置为获取各检测针 11与测试键之间在第一方向上的距离的摄像头， 第二驱动器 16控制连接于数据 处理单元 14, 数据处理单元 14中还可以设有一距离的标准值。 摄像头拍摄检测 针 11和测试键的图像并将图像传送至数据处理单元 14, 数据处理单元 14通过分 析图像以获取检测针 11与测试键之间的距离信息， 数据处理单元 14通过对比检 测针 11与测试键之间的该距离信息与标准值的大小从而判断是否需要控制第二 驱动器 16停止工作， 其中， 当检测针 11与测试键之间的距离大于标准值时， 第 二驱动器 16继续工作， 当检测针 11与测试键之间的距离小于或等于标准值时， 第二驱动器 16停止工作。
[0048] 在一实施例中， 标准值设为 20微米， 当检测针 11与测试键之间在第二方向上的 距离小于或等于 20微米时， 表示检测针 11已经到达与测试键之间的最小距离， 此时应改由第一驱动器 13进行更小步进距离的移动。
[0049] 在一实施例中， 标准值设为 10微米， 能够进一步精确地控制检测针 11与测试键 之间的距离。
[0050] 摄像头可以为 CCD （Charge Coupled Device,
电荷稱合兀件） 相机或者 CMOS （ Complementary Metal Oxide Semiconductor,互 补金属氧化物半导体） 相机， 此处不做限制。
[0051] 在该实施例中， 第二驱动器 16驱动承载件靠近测试键， 承载件带动检测针 11靠 近测试键， 在此过程中， 摄像头实时获取检测针 11和测试键的图像， 并将该图 像发送给数据处理单元 14, 数据处理单元 14对图像进行分析获取检测针 11与测 试键之间的距离信息， 数据处理单元 14通过对比检测针 11与测试键之间的该距 离信息与标准值的大小从而判断是否需要控制第二驱动器 16停止工作， 其中， 当检测针 11与测试键之间的距离大于标准值时， 第二驱动器 16继续工作， 当检 测针 11与测试键之间的距离小于或等于标准值时， 第二驱动器 16停止工作， 如 此， 可以避免由于检测针 11与测试键发生碰撞导致检测针 11弯折变形。
[0052] 进一步地， 如图 3所示， 压力传感器 12包括形成有安装腔 122的壳体 121、 安装 于安装腔 122内的压力弹性件 123以及与压力弹性件 123连接并设置为将力信号转 换为电信号的信号转换器， 检测针 11的一端插入安装腔 122内， 另一端外露于安 装腔 122外部， 以与测试键压接， 压力弹性件 123的一端固定于壳体 121的安装腔 122内， 压力弹性件 123的另一端固定于检测针 11位于安装腔 122内的一端， 从而 检测针 11能够在安装腔 122的内部滑动， 实现检测针 11与壳体 121的滑动连接。 当检测针 11与测试键压接后， 检测针 11被压缩回安装腔 122内。 检测针 11被压缩 回安装腔 122内的长度， 也即压力弹性件 123被压缩的程度表示检测针 11与测试 键之间的压力的大小， 压力弹性件 123被压缩的程度进而可以通过信号转换器转 换为压力值以直观表示出来。
[0053] 在本实施例中， 信号转换器与数据处理单元 14信号连接， 压力弹性件 123可以 与信号转换器连接， 通过信号转换器感知压力弹性件 123的形变量， 进而感知压 力， 并将检测针 11的压力以反馈信号的形式传递至数据处理单元 14。
[0054] 对于承载件为一个的情况， 第一驱动器 13对各检测针 11的驱动可通过壳体 121 实现， 即第一驱动器 13通过带动壳体 121来实现驱动各检测针 11运动以及感知各 检测针 11所受到的压力。 当承载件带动各检测针 11沿第一方向到达测试键的上 方时， 各壳体 121在承载件上可沿第二方向滑动， 从而， 各检测针 11通过壳体 12 1向测试键压接。
[0055] 本申请其他实施例还提供一种测试设备， 设置为在显示面板的制造阶段监控如 显示面板的电路中的薄膜晶体管、 线电阻、 面电阻、 不同导体间的接触电阻、 电容等各种组件的接触特性。 该测试设备包括上述的测试组件。 [0056] 以上所述仅为本申请的较佳实施例而已， 并不用以限制本申请， 凡在本申请的 精神和原则之内所作的任何修改、 等同替换和改进等， 均应包含在本申请的保 护范围之内。

Claims

权利要求书
[权利要求 1] 一种测试组件， 设置为与设于显示面板周围的测试键压接以检测显示 面板的电路的接触特性， 所述测试组件包括：
检测针， 所述检测针受驱动力作用以与所述测试键压接配合， 所述检 测针设置至少一个；
压力传感器， 所述压力传感器与所述检测针一一对应连接， 所述压力 传感器设置为检测与之连接的所述检测针所受到的压力大小， 所述压 力传感器具有预设值；
驱动机构， 所述驱动机构与各所述检测针均连接并对各所述检测针输 出驱动力以驱动各所述检测针运动， 所述驱动机构包括与所述检测针 一一对应连接以驱动与之连接的所述检测针运动的第一驱动器， 与同 一所述检测针连接的所述压力传感器和第一驱动器相互信号连接， 所 述第一驱动器驱动所述检测针与所述测试键压接； 其中， 各所述压力传感器实时检测与之连接的所述检测针所承受的压 力， 当所述压力传感器检测的所述检测针的压力达到预设值时， 所述 压力传感器产生反馈信号并传向所述第一驱动器， 所述第一驱动器停 止对所述检测针输出驱动力。
[权利要求 2] 如权利要求 1所述的测试组件， 所述测试组件还包括：
数据处理单元， 所述数据处理单元与各所述压力传感器信号连接， 各 所述第一驱动器与所述数据处理单元信号连接， 与同一所述检测针连 接的所述压力传感器和所述第一驱动器通过所述数据处理单元相互信 号连接。
[权利要求 3] 如权利要求 2所述的测试组件， 所述测试组件还包括：
承载件， 所述承载件设置为安装各所述检测针。
[权利要求 4] 如权利要求 3所述的测试组件， 所述驱动机构还包括与所述承载件连 接并驱动所述承载件运动以供所述检测针靠近所述测试键的第二驱动 器， 所述第二驱动器驱动所述承载件沿第一方向靠近所述测试键， 使 所述检测针到达所述测试键的上方并对齐。
[权利要求 5] 如权利要求 4所述的测试组件， 所述第一驱动器驱动所述检测针沿第 二方向运动至与所述测试键压接。
[权利要求 6] 如权利要求 4所述的测试组件， 所述第二驱动器的驱动速度大于所述 第一驱动器的驱动速度。
[权利要求 7] 如权利要求 4所述的测试组件， 所述第一驱动器的控制精度高于所述 第二驱动器的控制精度。
[权利要求 8] 如权利要求 5所述的测试组件， 所述测试组件还包括：
机架， 所述承载件与所述机架滑动安装， 所述承载件在所述机架上沿 所述第一方向滑动。
[权利要求 9] 如权利要求 3所述的测试组件， 所述驱动机构还包括与所述承载件连 接并驱动所述承载件运动以供所述检测针靠近所述测试键的第二驱动 器， 所述第二驱动器驱动所述承载件在三维方向上靠近所述测试键， 使所述检测针到达所述测试键的上方并对齐。
[权利要求 10] 如权利要求 9所述的测试组件， 所述第一驱动器驱动所述检测针沿三 维方向运动至与所述测试键压接。
[权利要求 11] 如权利要求 9所述的测试组件， 所述第二驱动器的驱动速度大于所述 第一驱动器的驱动速度。
[权利要求 12] 如权利要求 9所述的测试组件， 所述第一驱动器的控制精度高于所述 第二驱动器的控制精度。
[权利要求 13] 如权利要求 9所述的测试组件， 所述测试组件还包括：
机架， 所述承载件与所述机架滑动安装， 所述承载件在所述机架上沿 所述三维方向滑动。
[权利要求 14] 如权利要求 10所述的测试组件， 所述测试组件还包括：
摄像头， 所述摄像头与所述数据处理单元信号连接， 设置为获取各所 述检测针与所述测试键之间的距离， 所述第二驱动器连接于所述数据 处理单元， 所述摄像头拍摄所述检测针和所述测试键的图像并将所述 图像传送至所述数据处理单元， 所述数据处理单元通过分析所述图像 以获取所述检测针与测试键之间在所述第二方向上的距离信息， 所述 数据处理单元通过对比所述检测针与所述测试键之间的所述距离信息 与标准值的大小从而判断是否需要控制所述第二驱动器停止工作； 所 述第二方向为垂直于所述测试键的平面的方向。
[权利要求 15] 如权利要求 14所述的测试组件， 所述摄像头包括电荷耦合元件相机或 互补金属氧化物半导体相机。
[权利要求 16] 如权利要求 14所述的测试组件， 所述标准值为 10微米或 20微米。
[权利要求 17] 如权利要求 2所述的测试组件， 所述压力传感器包括：
壳体， 所述壳体形成有安装腔； 所述检测针的一端安装于所述安装腔 内；
压力弹性件， 所述压力弹性件安装于所述安装腔内， 所述压力弹性件 的一端固定于壳体上， 所述压力弹性件的另一端固定于所述检测针位 于所述安装腔内的一端。
信号转换器， 设置于所述安装腔内， 所述信号转换器与所述压力弹性 件连接并设置为将力信号转换为电信号。
[权利要求 18] 如权利要求 17所述的测试组件， 所述信号转换器与所述数据处理单元 信号连接。
[权利要求 19] 一种测试设备， 设置为检测显示面板的电路的接触特性， 包括测试组 件， 所述测试组件设置为与设于显示面板周围的测试键压接， 所述测 试组件包括：
检测针， 所述检测针受驱动力作用以与所述测试键压接配合， 所述检 测针设置至少一个；
压力传感器， 所述压力传感器与所述检测针一一对应连接， 所述压力 传感器设置为检测与之连接的所述检测针所受到的压力大小， 所述压 力传感器具有预设值；
驱动机构， 所述驱动机构与各所述检测针均连接并对各所述检测针输 出驱动力以驱动各所述检测针运动， 所述驱动机构包括与所述检测针 一一对应连接以驱动与之连接的所述检测针运动的第一驱动器， 与同 一所述检测针连接的所述压力传感器和第一驱动器相互信号连接， 所 述第一驱动器驱动所述检测针与所述测试键压接；
其中， 各所述压力传感器实时检测与之连接的所述检测针所承受的压 力， 当所述压力传感器检测的所述检测针的压力达到预设值时， 所述 压力传感器产生反馈信号并传向所述第一驱动器， 所述第一驱动器停 止对所述检测针输出驱动力。
[权利要求 20] 一种测试设备， 设置为检测显示面板的电路的接触特性， 包括测试组 件， 所述测试组件与设于显示面板周围的测试键压接， 所述测试组件 包括：
所述测试组件包括：
检测针， 所述检测针受驱动力作用以与所述测试键压接配合， 所述检 测针设置至少一个；
压力传感器， 所述压力传感器与所述检测针一一对应连接， 所述压力 传感器设置为检测与之连接的所述检测针所受到的压力大小， 所述压 力传感器具有预设值；
驱动机构， 所述驱动机构与各所述检测针均连接并对各所述检测针输 出驱动力以驱动各所述检测针运动， 所述驱动机构包括与所述检测针 一一对应连接以驱动与之连接的所述检测针运动的第一驱动器， 以及 设置为驱动所述检测针靠近所述测试键的第二驱动器； 所述第二驱动 器驱动所述检测针沿第一方向靠近所述测试键， 使所述检测针到达所 述测试键的上方并对齐， 所述第一驱动器驱动所述检测针沿第二方向 运动至与所述测试键压接；
与同一所述检测针连接的所述压力传感器和第一驱动器相互信号连接 ， 所述第一驱动器驱动所述检测针与所述测试键压接；
其中， 各所述压力传感器实时检测与之连接的所述检测针所承受的压 力， 当所述压力传感器检测的所述检测针的压力达到预设值时， 所述 压力传感器产生反馈信号并传向所述第一驱动器， 所述第一驱动器停 止对所述检测针输出驱动力。
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