WO2020042602A1 - 液晶显示器测试设备 - Google Patents

液晶显示器测试设备 Download PDF

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Publication number
WO2020042602A1
WO2020042602A1 PCT/CN2019/079933 CN2019079933W WO2020042602A1 WO 2020042602 A1 WO2020042602 A1 WO 2020042602A1 CN 2019079933 W CN2019079933 W CN 2019079933W WO 2020042602 A1 WO2020042602 A1 WO 2020042602A1
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WO
WIPO (PCT)
Prior art keywords
hollow tube
liquid crystal
crystal display
assembly
temperature control
Prior art date
Application number
PCT/CN2019/079933
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English (en)
French (fr)
Inventor
王丽君
Original Assignee
武汉华星光电技术有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 武汉华星光电技术有限公司 filed Critical 武汉华星光电技术有限公司
Priority to US16/349,982 priority Critical patent/US10816833B2/en
Publication of WO2020042602A1 publication Critical patent/WO2020042602A1/zh

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Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306—Details
    • G02F1/1309—Repairing; Testing

Definitions

  • the present application relates to the field of display technology, and in particular, to a liquid crystal display test device.
  • the purpose of the present application is to provide a liquid crystal display test device that can prevent the generation of condensed water in the temperature control box.
  • An embodiment of the present application provides a liquid crystal display test device, which includes: a heating platform, a temperature control box, a hollow tube assembly, a photodetector assembly, and a shutter assembly;
  • the heating platform has a heating area on the upper surface, the temperature control box covers the heating area, an opening is provided on the top of the temperature control box, and the hollow tube assembly is connected to the opening and communicates with the opening.
  • the temperature control box is connected, the shutter assembly is disposed in the hollow tube assembly, the photodetector assembly is disposed at the top of the hollow tube assembly and faces the temperature control box, and the shutter assembly is used for Open during measurement and closed during temperature rise and fall;
  • a through hole is provided on a side wall of the hollow pipe assembly, and an air inlet pipe for filling dry gas is provided at the through hole, and the through hole is located above the shutter assembly;
  • the photodetector component includes a photodetector, a photodetection lens, and an interface structure;
  • the interface structure is disposed at the top of the hollow tube assembly, the photodetection lens is disposed at the bottom of the photodetector, the photodetection lens is connected to the interface structure and is the same as the hollow tube assembly A shaft is provided, the interface structure is provided with a perforation communicating with the hollow tube assembly, and the photoelectric detection lens is inserted into the perforation.
  • the liquid crystal display test device further includes an air supply device for providing a dry gas, and the air supply device is in communication with the intake pipe.
  • the interface structure includes a substrate and a connection tube, the connection tube is disposed along an edge of the substrate, the perforation is disposed in a middle portion of the substrate, and an inner side of the connection tube and An elastic stop ring is arranged between the outer sides of the photoelectric detection lens.
  • the temperature control box includes a box body closed at both ends and a cover body disposed on an open top surface of the box body, and an open edge of the bottom end of the box body Set this heating area.
  • the cover is a transparent acrylic cover or a transparent glass cover.
  • the opening is provided on the cover, and the hollow tube assembly includes a hollow tube and a connection structure, and the hollow tube is connected to the top of the cover through the connection structure. Sealed connection at the opening.
  • connection structure includes a card slot structure and an elastic sealing ring located in the card slot structure.
  • the card slot structure is arranged around the opening, and the end of the hollow tube is plugged in.
  • the elastic sealing ring is sleeved on the bottom end of the hollow pipe and elastically abuts against the inner side wall of the card slot structure.
  • a black opaque coating is coated on the inner wall of the hollow tube.
  • An embodiment of the present application further provides a liquid crystal display test device, including: a heating platform, a temperature control box, a hollow tube assembly, a photodetector assembly, and a shutter assembly;
  • the heating platform has a heating area on the upper surface, the temperature control box covers the heating area, an opening is provided on the top of the temperature control box, and the hollow tube assembly is connected to the opening and communicates with the opening.
  • the temperature control box is connected, the shutter assembly is disposed in the hollow tube assembly, the photodetector assembly is disposed at the top of the hollow tube assembly and faces the temperature control box, and the shutter assembly is used for Open during measurement and closed during temperature rise and fall.
  • a side wall of the hollow tube assembly is provided with a through hole, and an air inlet pipe for filling dry gas is provided at the through hole, and the through hole is located in the through hole.
  • an air inlet pipe for filling dry gas is provided at the through hole, and the through hole is located in the through hole.
  • the liquid crystal display test device further includes an air supply device for providing a dry gas, and the air supply device is in communication with the intake pipe.
  • the photodetector component includes a photodetector, a photodetection lens, and an interface structure;
  • the interface structure is disposed at the top of the hollow tube assembly, the photodetection lens is disposed at the bottom of the photodetector, the photodetection lens is connected to the interface structure and is the same as the hollow tube assembly A shaft is provided, the interface structure is provided with a perforation communicating with the hollow tube assembly, and the photoelectric detection lens is inserted into the perforation.
  • the interface structure includes a substrate and a connection tube, the connection tube is disposed along an edge of the substrate, the perforation is disposed in a middle portion of the substrate, and an inner side of the connection tube and An elastic stop ring is arranged between the outer sides of the photoelectric detection lens.
  • the temperature control box includes a box body closed at both ends and a cover body disposed on an open top surface of the box body, and an open edge of the bottom end of the box body Set this heating area.
  • the cover is a transparent acrylic cover or a transparent glass cover.
  • the opening is provided on the cover, and the hollow tube assembly includes a hollow tube and a connection structure, and the hollow tube is connected to the top of the cover through the connection structure. Sealed connection at the opening.
  • connection structure includes a card slot structure and an elastic sealing ring located in the card slot structure.
  • the card slot structure is arranged around the opening, and the end of the hollow tube is plugged in.
  • the elastic sealing ring is sleeved on the bottom end of the hollow pipe and elastically abuts against the inner side wall of the card slot structure.
  • a black opaque coating is coated on the inner wall of the hollow tube.
  • the liquid crystal display test device provided by the present application is provided with a shutter assembly in the hollow tube assembly, and the shutter assembly is used to open during measurement, and is filled with dry gas so that the gas in the hollow tube hardly matches the temperature control box.
  • the internal gas is heat-exchanged to avoid generating condensation water on the device to be detected, and the device to be detected can be protected.
  • FIG. 1 is a schematic structural diagram of a liquid crystal display test device according to an embodiment of the present application.
  • FIG. 2 is a schematic structural diagram of an interface structure of a liquid crystal display test device according to an embodiment of the present application.
  • first and second are used for descriptive purposes only, and cannot be understood as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Therefore, the features defined as “first” and “second” may explicitly or implicitly include one or more of the features. In the description of the present application, the meaning of "a plurality" is two or more, unless specifically defined otherwise.
  • the "first" or “under” of the second feature may include the first and second features in direct contact, and may also include the first and second features. Not directly, but through another characteristic contact between them.
  • the first feature is “above”, “above”, and “above” the second feature, including that the first feature is directly above and obliquely above the second feature, or merely indicates that the first feature is higher in level than the second feature.
  • the first feature is “below”, “below”, and “below” of the second feature, including the fact that the first feature is directly below and obliquely below the second feature, or merely indicates that the first feature is less horizontal than the second feature.
  • FIG. 1 is a schematic structural diagram of a liquid crystal display test device in some embodiments of the present application.
  • the liquid crystal display test device includes a heating platform 10, a temperature control box 20, a hollow tube assembly 30, and a photodetector assembly. 40 and shutter assembly 50.
  • the heating platform 10 has a heating area on the upper surface, and the temperature control box 20 covers the heating area.
  • the top of the temperature control box 20 is provided with an opening, and the hollow tube assembly 30 is connected to the opening. And communicates with the temperature control box 20, the shutter assembly 50 is disposed in the hollow tube assembly 30, and the photodetector assembly 40 is disposed at the top of the hollow tube assembly 30 and faces the temperature control Inside the box 20, the shutter assembly 50 is used to open when the heating platform 10 is heated and to close when the temperature is lowered.
  • the heating platform 10 has a substantially plate-like structure, and a heating element is disposed therein, and the heating element covers the heating area.
  • the heating platform 10 itself is made of metal with excellent thermal conductivity, and the heating element is embedded in the heating area.
  • the heating element is a semiconductor heating element, which can be heated or lowered. By changing the direction of the current flowing through the semiconductor heating element, the heating or cooling can be changed.
  • the temperature control system uses semiconductor heating.
  • the sample can be placed directly on the heating platform 10, or it can be supported by a suspension bracket and suspended in the air.
  • the heating platform 10 is connected to a controller through a control line to control heating and cooling.
  • a high-precision thermocouple is installed inside the heating platform 10 to accurately control the heating temperature of the platform.
  • the shutter When measuring the response time, the shutter is closed first, and the cavity is filled with CDA gas to increase or decrease the temperature to the target value. Then open the shutter through the electronic device and start the measuring instrument to measure the corresponding time.
  • the response time will be measured within 2 ⁇ 3 seconds, so the surface temperature of the panel under test will hardly change.
  • the temperature control box 20 includes a box body 21 closed at both ends, and a cover body 22 covering the top open surface of the box body 21, and the bottom edge of the box body 21 has an open edge. Set this heating area.
  • the cover 22 is a transparent acrylic cover or a transparent glass cover.
  • the box 21 has a double-layer structure. The opening is disposed on the cover 22.
  • the hollow tube assembly 30 includes a hollow tube 31 and a connection structure 32 for sealingly connecting the hollow tube 31 and the opening of the cover 22.
  • the hollow tube 31 has a substantially circular tube shape, and a side wall is provided with a through hole.
  • An air inlet pipe 33 for filling dry gas is provided at the through hole, and the through hole is located above the shutter assembly 50.
  • connection structure 32 includes a card slot structure and an elastic sealing ring located in the card slot structure.
  • the card slot structure is disposed around the opening on the cover 22, and the end of the hollow tube 31 Plugged in the slot structure, the elastic sealing ring is sleeved on the bottom end of the hollow tube 31 and elastically abuts against the inner side wall of the slot structure.
  • the inner wall of the hollow tube 31 is coated with a black opaque coating.
  • the hollow tube 31 is made of electrochromic glass, and its transparency can be adjusted as needed to facilitate coordination. Testing is performed.
  • the liquid crystal display test apparatus further includes an air supply device for providing a dry gas, and the air supply device is in communication with the air inlet pipe 33.
  • the air supply device communicates with the air inlet pipe 33 through a conduit, and a solenoid valve is also provided on the conduit, and whether to inflate the hollow pipe 31 is controlled by controlling the on or off of the solenoid valve.
  • the CDA gas needs to be input during low-temperature measurement, so that the gas in the hollow tube 31 hardly exchanges heat with the gas in the temperature control box 20 to prevent condensation water from being generated on the photoelectric detection lens 42.
  • the photodetector assembly 40 includes a photodetector 41, a photodetection lens 42, and an interface structure 43; the interface structure 43 is disposed at the top of the hollow tube assembly 30, and the photodetection lens 42 is disposed at At the bottom of the photodetector 41, the photodetection lens 42 is connected to the interface structure 43 and is disposed coaxially with the hollow tube 41 of the hollow tube assembly 40, and the interface structure 43 is provided in communication with the hollow tube 41.
  • the hollow tube assembly 40 communicates with a perforation, and the photoelectric detection lens 42 is inserted into the perforation.
  • the interface structure 43 includes a substrate 431 and a connection pipe 432.
  • the connection pipe 432 is disposed along the edge of the substrate 431.
  • the perforation is disposed in the middle of the substrate 431.
  • An elastic stop ring 433 is provided between the inside of the connecting tube 432 and the outside of the photodetection lens 42.
  • the interface structure 43 is detachably connected to the top of the hollow tube 41 by means of a snap connection, or a threaded connection may also be adopted. Accordingly, a screw connection portion or a snap connection portion needs to be provided on the bottom of the substrate 431.
  • the shutter assembly 50 is an electronically controlled switch-type switch assembly.
  • the shutter is opened during heating so that the gas can be discharged, and the shutter is closed when the temperature is lowered to prevent external water vapor from entering the device to be measured. Condensation on the device.

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  • Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Liquid Crystal (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)

Abstract

一种液晶显示器测试设备，包括：加热平台（10）、温控箱（20）、中空管组件（30）、光电探测器组件（40）以及快门组件（50）；温控箱（20）覆盖于加热平台（10）的加热区域上，温控箱（20）顶部设置有开口，中空管组件（30）连接于开口处并与温控箱（10）连通，快门组件（50）设置于中空管组件（30）内，光电探测器组件（40）设置于中空管组件（30）的顶端并朝向温控箱（20）内。在温控箱（20）内快门组件（50）用于在量测时打开，同时充入干燥气体使中空管（31）内气体几乎不与温控箱（20）内气体进行热交换，避免在该待检测的器件上产生冷凝水，可以保护其中待检测的器件。

Description

液晶显示器测试设备 技术领域
本申请涉及显示技术领域，具体涉及一种液晶显示器测试设备。
 背景技术
手机与车载液晶显示器由于应用条件苛刻，因此要求测量低温下的响应时间。液晶显示器在低温条件下的响应时间量测是一件很困难的事情。通常的做法是将样品和有快速采样（1MHz或以上）功能的光电倍增管一起放在温控箱内，记录光强变化曲线，并根据曲线算出相应时间。由于量测距离和PMT（光电倍增管）体积的限制，整合设备的体积庞大，而且升温降温时间长，量测效率不高。低温时会产生冷凝水，长期将PMT（光电倍增管）放置在此环境中易损坏。
因此，现有技术存在缺陷，急需改进。
 技术问题
本申请的目的是提供一种液晶显示器测试设备，可以防止在该温控箱内产生冷凝水。
 技术解决方案
本申请实施例提供一种液晶显示器测试设备，其包括：加热平台、温控箱、中空管组件、光电探测器组件以及快门组件；
所述加热平台上表面具有加热区域，所述温控箱覆盖于所述加热区域上，所述温控箱的顶部设置有开口，所述中空管组件连接于所述开口处并与所述温控箱连通，所述快门组件设置于所述中空管组件内，所述光电探测器组件设置于所述中空管组件的顶端并朝向所述温控箱内，所述快门组件用于在量测时打开，在升降温时关闭；
所述中空管组件的侧壁上开设有通孔，该通孔处设置有一用于充入干燥气体的进气管，所述通孔位于所述快门组件上方；
所述光电探测器组件包括光电探测器、光电探测镜头以及接口结构；
所述接口结构设置于所述中空管组件的顶端，所述光电探测镜头设置于所述光电探测器的底部，所述光电探测镜头与所述接口结构连接并与所述中空管组件同轴设置，所述接口结构设置有与所述中空管组件连通的穿孔，该光电探测镜头插接与该穿孔中。
在本申请所述的液晶显示器测试设备中，所述液晶显示器测试设备还包括用于提供干燥气体的供气装置，所述供气装置与所述进气管连通。
在本申请所述的液晶显示器测试设备中，所述接口结构包括一基板以及一连接管，该连接管沿着该基板的边缘设置，该穿孔设置于该基板的中部，该连接管的内侧与该光电探测镜头的外侧之间设置有弹性限位圈。
在本申请所述的液晶显示器测试设备中，所述温控箱包括两端封闭的箱体以及盖设于该箱体的顶端敞口面上的盖体，该箱体的底端敞口沿着该加热区域设置。
在本申请所述的液晶显示器测试设备中，所述盖体为透明亚克力盖体或者透明玻璃盖体。
在本申请所述的液晶显示器测试设备中，所述开口设置于所述盖体上，所述中空管组件包括中空管以及连接结构，该中空管通过该连接结构与该盖体顶端的开口处密封连接。
在本申请所述的液晶显示器测试设备中，所述连接结构包括卡槽结构以及位于该卡槽结构内的弹性密封圈，该卡槽结构环绕该开口设置，该中空管的端部插接在该卡槽结构中，该弹性密封圈套接在该中空管的底端并与该卡槽结构的内侧壁相互弹性抵接。
在本申请所述的液晶显示器测试设备中，所述中空管内侧壁上涂布有黑色的不透光涂层。
本申请实施例还提供一种液晶显示器测试设备，包括：加热平台、温控箱、中空管组件、光电探测器组件以及快门组件；
所述加热平台上表面具有加热区域，所述温控箱覆盖于所述加热区域上，所述温控箱的顶部设置有开口，所述中空管组件连接于所述开口处并与所述温控箱连通，所述快门组件设置于所述中空管组件内，所述光电探测器组件设置于所述中空管组件的顶端并朝向所述温控箱内，所述快门组件用于在量测时打开，在升降温时关闭。
在本申请所述的液晶显示器测试设备中，所述中空管组件的侧壁上开设有通孔，该通孔处设置有一用于充入干燥气体的进气管，所述通孔位于所述快门组件上方。
在本申请所述的液晶显示器测试设备中，所述液晶显示器测试设备还包括用于提供干燥气体的供气装置，所述供气装置与所述进气管连通。
在本申请所述的液晶显示器测试设备中，所述光电探测器组件包括光电探测器、光电探测镜头以及接口结构；
所述接口结构设置于所述中空管组件的顶端，所述光电探测镜头设置于所述光电探测器的底部，所述光电探测镜头与所述接口结构连接并与所述中空管组件同轴设置，所述接口结构设置有与所述中空管组件连通的穿孔，该光电探测镜头插接与该穿孔中。
在本申请所述的液晶显示器测试设备中，所述接口结构包括一基板以及一连接管，该连接管沿着该基板的边缘设置，该穿孔设置于该基板的中部，该连接管的内侧与该光电探测镜头的外侧之间设置有弹性限位圈。
在本申请所述的液晶显示器测试设备中，所述温控箱包括两端封闭的箱体以及盖设于该箱体的顶端敞口面上的盖体，该箱体的底端敞口沿着该加热区域设置。
在本申请所述的液晶显示器测试设备中，所述盖体为透明亚克力盖体或者透明玻璃盖体。
在本申请所述的液晶显示器测试设备中，所述开口设置于所述盖体上，所述中空管组件包括中空管以及连接结构，该中空管通过该连接结构与该盖体顶端的开口处密封连接。
在本申请所述的液晶显示器测试设备中，所述连接结构包括卡槽结构以及位于该卡槽结构内的弹性密封圈，该卡槽结构环绕该开口设置，该中空管的端部插接在该卡槽结构中，该弹性密封圈套接在该中空管的底端并与该卡槽结构的内侧壁相互弹性抵接。
在本申请所述的液晶显示器测试设备中，所述中空管内侧壁上涂布有黑色的不透光涂层。
 有益效果
本申请提供的液晶显示器测试设备通过在中空管组件设置快门组件，在温控箱内所述快门组件用于在量测时打开，同时充入干燥气体使中空管内气体几乎不与温控箱内气体进行热交换，避免在该待检测的器件上产生冷凝水，可以保护其中待检测的器件。
 附图说明
为了更清楚地说明本申请实施例中的技术方案，下面将对实施例描述中所需要使用的附图作简单地介绍，显而易见地，下面描述中的附图仅仅是本申请的一些实施例，对于本领域技术人员来讲，在不付出创造性劳动的前提下，还可以根据这些附图获得其他的附图。
图1为本申请实施例提供的液晶显示器测试设备的结构示意图。
图2为本申请实施例提供的液晶显示器测试设备的接口结构的结构示意图。
 本发明的实施方式
下面将结合本申请实施例中的附图，对本申请实施例中的技术方案进行清楚、完整地描述。显然，所描述的实施例仅仅是本申请一部分实施例，而不是全部的实施例。基于本申请中的实施例，本领域技术人员在没有作出创造性劳动前提下所获得的所有其他实施例，都属于本申请保护的范围。
在本申请的描述中，需要理解的是，术语“中心”、“纵向”、“横向”、“长度”、“宽度”、“厚度”、“上”、“下”、“前”、“后”、“左”、“右”、“竖直”、“水平”、“顶”、“底”、“内”、“外”、“顺时针”、“逆时针”等指示的方位或位置关系为基于附图所示的方位或位置关系，仅是为了便于描述本申请和简化描述，而不是指示或暗示所指的装置或元件必须具有特定的方位、以特定的方位构造和操作，因此不能理解为对本申请的限制。此外，术语“第一”、“第二”仅用于描述目的，而不能理解为指示或暗示相对重要性或者隐含指明所指示的技术特征的数量。由此，限定有“第一”、“第二”的特征可以明示或者隐含地包括一个或者更多个所述特征。在本申请的描述中，“多个”的含义是两个或两个以上，除非另有明确具体的限定。
在本申请的描述中，需要说明的是，除非另有明确的规定和限定，术语“安装”、“相连”、“连接”应做广义理解，例如，可以是固定连接，也可以是可拆卸连接，或一体地连接；可以是机械连接，也可以是电连接或可以相互通讯；可以是直接相连，也可以通过中间媒介间接相连，可以是两个元件内部的连通或两个元件的相互作用关系。对于本领域的普通技术人员而言，可以根据具体情况理解上述术语在本申请中的具体含义。
在本申请中，除非另有明确的规定和限定，第一特征在第二特征之“上”或之“下”可以包括第一和第二特征直接接触，也可以包括第一和第二特征不是直接接触而是通过它们之间的另外的特征接触。而且，第一特征在第二特征“之上”、“上方”和“上面”包括第一特征在第二特征正上方和斜上方，或仅仅表示第一特征水平高度高于第二特征。第一特征在第二特征“之下”、“下方”和“下面”包括第一特征在第二特征正下方和斜下方，或仅仅表示第一特征水平高度小于第二特征。
下文的公开提供了许多不同的实施方式或例子用来实现本申请的不同结构。为了简化本申请的公开，下文中对特定例子的部件和设置进行描述。当然，它们仅仅为示例，并且目的不在于限制本申请。此外，本申请可以在不同例子中重复参考数字和/或参考字母，这种重复是为了简化和清楚的目的，其本身不指示所讨论各种实施方式和/或设置之间的关系。此外，本申请提供了的各种特定的工艺和材料的例子，但是本领域普通技术人员可以意识到其他工艺的应用和/或其他材料的使用。
请参阅图1，图1是本申请一些实施例中的一种液晶显示器测试设备的结构示意图，该液晶显示器测试设备包括加热平台10、温控箱20、中空管组件30、光电探测器组件40以及快门组件50。
其中，该加热平台10上表面具有加热区域，该温控箱20覆盖于所述加热区域上，所述温控箱20的顶部设置有开口，所述中空管组件30连接于所述开口处并与所述温控箱20连通，所述快门组件50设置于所述中空管组件30内，所述光电探测器组件40设置于所述中空管组件30的顶端并朝向所述温控箱20内，所述快门组件50用于在加热平台10加热时打开，降温时关闭。
在一些实施例中，具体地，该加热平台10大致呈板状结构，其内设置有加热元件，且该加热元件布满该加热区域。该加热平台10本身采用导热性能优良的金属制成，该加热元件内嵌于加热区域内。其中，该加热元件为半导体加热元件，即可升温也可降温，通过改变流过该半导体加热元件的电流方向可以实现加温或者降温的转变。温度控制系统采用半导体加热。样品可以直接放置在加热平台10上，也可以使用悬空支架支撑，悬空在空气中。加热平台10通过控制线连接控制器，控制升温和降温。加热平台10内部安装有高精度热电偶，可以精确控制平台加热温度。
量测响应时间时，先封闭快门，给腔体通入CDA气体，将温度升高或者降低到目标值。然后通过电子装置打开快门，同时启动量测仪器量测相应时间。响应时间会在2~3秒内量测完成，因此被测面板表面温度几乎不会改变。
在一些实施例中，其中，该温控箱20包括两端封闭的箱体21以及盖设于该箱体21的顶端敞口面上的盖体22，该箱体21的底端敞口沿着该加热区域设置。盖体22为透明亚克力盖体或者透明玻璃盖体。其中，该箱体21采用双层结构。该开口设置于该盖体22上。
在一些实施例中，该中空管组件30包括中空管31以及一用于将该中空管31以及该盖体22的开口处密封连接的连接结构32。该中空管31大致呈圆管状，其侧壁上开设有通孔，该通孔处设置有一用于充入干燥气体的进气管33，所述通孔位于所述快门组件50上方。
在一些实施例中，其中，该连接结构32包括卡槽结构以及位于该卡槽结构内的弹性密封圈，该卡槽结构环绕该盖体22上的开口设置，该中空管31的端部插接在该卡槽结构中，该弹性密封圈套接在该中空管31的底端并与该卡槽结构的内侧壁相互弹性抵接。其中，该中空管31内侧壁上涂布有黑色的不透光涂层，在一些实施例中，该中空管31采用电致变色玻璃制成，可以根据需要调整其透明度，以便于配合检测的进行。
在一些实施例中，该液晶显示器测试设备还包括用于提供干燥气体的供气装置，所述供气装置与所述进气管33连通。该供气装置与该进气管33通过导管连通，且该导管上还设置有电磁阀，通过控制该电磁阀的导通或关闭来控制是否向该中空管31内充气。低温量测时需输入CDA气体，使中空管31内气体几乎不与温控箱20内气体进行热交换，防止在光电探测镜头42上产生冷凝水。
在一些实施例中，该光电探测器组件40包括光电探测器41、光电探测镜头42以及接口结构43；接口结构43设置于所述中空管组件30的顶端，所述光电探测镜头42设置于所述光电探测器41的底部，所述光电探测镜头42与所述接口结构43连接并与所述中空管组件40的中空管41同轴设置，所述接口结构43设置有与所述中空管组件40连通的穿孔，该光电探测镜头42插接与该穿孔中。
在一些实施例中，请同时参照图2，该接口结构43包括一基板431以及一连接管432，该连接管432沿着该基板431的边缘设置，该穿孔设置于该基板431的中部，该连接管432的内侧与该光电探测镜头42的外侧之间设置有弹性限位圈433。接口结构43通过卡扣连接的方式与该中空管41的顶端可拆卸连接，或者也可以采用螺纹连接。相应地，需要在该基板431的底部设置螺纹连接部或者卡扣连接部。
在一些实施例中，其中，该快门组件50为电控开关型的开关组件，在加热时打开该快门使得气体可以排出，并在降温时关闭该快门，避免外部水蒸气进入在其中的待测器件上冷凝。
在上述实施例中，对各个实施例的描述都各有侧重，某个实施例中没有详述的部分，可以参见其他实施例的相关描述。
以上对本申请实施例所提供的一种液晶显示器测试设备进行了详细介绍，本文中应用了具体个例对本申请的原理及实施方式进行了阐述，以上实施例的说明只是用于帮助理解本申请的技术方案及其核心思想；本领域的普通技术人员应当理解：其依然可以对前述各实施例所记载的技术方案进行修改，或者对其中部分技术特征进行等同替换；而这些修改或者替换，并不使相应技术方案的本质脱离本申请各实施例的技术方案的范围。

Claims (18)

  1. 一种液晶显示器测试设备，其包括：加热平台、温控箱、中空管组件、光电探测器组件以及快门组件；
    所述加热平台上表面具有加热区域，所述温控箱覆盖于所述加热区域上，所述温控箱的顶部设置有开口，所述中空管组件连接于所述开口处并与所述温控箱连通，所述快门组件设置于所述中空管组件内，所述光电探测器组件设置于所述中空管组件的顶端并朝向所述温控箱内，所述快门组件用于在量测时打开，在升降温时关闭；
    所述中空管组件的侧壁上开设有通孔，该通孔处设置有一用于充入干燥气体的进气管，所述通孔位于所述快门组件上方；
    所述光电探测器组件包括光电探测器、光电探测镜头以及接口结构；
    所述接口结构设置于所述中空管组件的顶端，所述光电探测镜头设置于所述光电探测器的底部，所述光电探测镜头与所述接口结构连接并与所述中空管组件同轴设置，所述接口结构设置有与所述中空管组件连通的穿孔，该光电探测镜头插接与该穿孔中。
  2. 根据权利要求1所述的液晶显示器测试设备，其中，所述液晶显示器测试设备还包括用于提供干燥气体的供气装置，所述供气装置与所述进气管连通。
  3. 根据权利要求1所述的液晶显示器测试设备，其中，所述接口结构包括一基板以及一连接管，该连接管沿着该基板的边缘设置，该穿孔设置于该基板的中部，该连接管的内侧与该光电探测镜头的外侧之间设置有弹性限位圈。
  4. 根据权利要求1所述的液晶显示器测试设备，其中，所述温控箱包括两端封闭的箱体以及盖设于该箱体的顶端敞口面上的盖体，该箱体的底端敞口沿着该加热区域设置。
  5. 根据权利要求4所述的液晶显示器测试设备，其中，所述盖体为透明亚克力盖体或者透明玻璃盖体。
  6. 根据权利要求4所述的液晶显示器测试设备，其中，所述开口设置于所述盖体上，所述中空管组件包括中空管以及连接结构，该中空管通过该连接结构与该盖体顶端的开口处密封连接。
  7. 根据权利要求6所述的液晶显示器测试设备，其中，所述连接结构包括卡槽结构以及位于该卡槽结构内的弹性密封圈，该卡槽结构环绕该开口设置，该中空管的端部插接在该卡槽结构中，该弹性密封圈套接在该中空管的底端并与该卡槽结构的内侧壁相互弹性抵接。
  8. 根据权利要求6所述的液晶显示器测试设备，其中，所述中空管内侧壁上涂布有黑色的不透光涂层。
  9. 一种液晶显示器测试设备，其包括：加热平台、温控箱、中空管组件、光电探测器组件以及快门组件；
    所述加热平台上表面具有加热区域，所述温控箱覆盖于所述加热区域上，所述温控箱的顶部设置有开口，所述中空管组件连接于所述开口处并与所述温控箱连通，所述快门组件设置于所述中空管组件内，所述光电探测器组件设置于所述中空管组件的顶端并朝向所述温控箱内，所述快门组件用于在量测时打开，在升降温时关闭。
  10. 根据权利要求9所述的液晶显示器测试设备，其中，所述中空管组件的侧壁上开设有通孔，该通孔处设置有一用于充入干燥气体的进气管，所述通孔位于所述快门组件上方。
  11. 根据权利要求10所述的液晶显示器测试设备，其中，所述液晶显示器测试设备还包括用于提供干燥气体的供气装置，所述供气装置与所述进气管连通。
  12. 根据权利要求9所述的液晶显示器测试设备，其中，所述光电探测器组件包括光电探测器、光电探测镜头以及接口结构；
    所述接口结构设置于所述中空管组件的顶端，所述光电探测镜头设置于所述光电探测器的底部，所述光电探测镜头与所述接口结构连接并与所述中空管组件同轴设置，所述接口结构设置有与所述中空管组件连通的穿孔，该光电探测镜头插接与该穿孔中。
  13. 根据权利要求12所述的液晶显示器测试设备，其中，所述接口结构包括一基板以及一连接管，该连接管沿着该基板的边缘设置，该穿孔设置于该基板的中部，该连接管的内侧与该光电探测镜头的外侧之间设置有弹性限位圈。
  14. 根据权利要求9所述的液晶显示器测试设备，其中，所述温控箱包括两端封闭的箱体以及盖设于该箱体的顶端敞口面上的盖体，该箱体的底端敞口沿着该加热区域设置。
  15. 根据权利要求14所述的液晶显示器测试设备，其中，所述盖体为透明亚克力盖体或者透明玻璃盖体。
  16. 根据权利要求14所述的液晶显示器测试设备，其中，所述开口设置于所述盖体上，所述中空管组件包括中空管以及连接结构，该中空管通过该连接结构与该盖体顶端的开口处密封连接。
  17. 根据权利要求16所述的液晶显示器测试设备，其中，所述连接结构包括卡槽结构以及位于该卡槽结构内的弹性密封圈，该卡槽结构环绕该开口设置，该中空管的端部插接在该卡槽结构中，该弹性密封圈套接在该中空管的底端并与该卡槽结构的内侧壁相互弹性抵接。
  18. 根据权利要求16所述的液晶显示器测试设备，其中，所述中空管内侧壁上涂布有黑色的不透光涂层。
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US20200264458A1 (en) 2020-08-20

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