WO2013174131A1 - 用于检测残像的液晶模组检测装置、检测评定系统及方法 - Google Patents

用于检测残像的液晶模组检测装置、检测评定系统及方法 Download PDF

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Publication number
WO2013174131A1
WO2013174131A1 PCT/CN2012/086800 CN2012086800W WO2013174131A1 WO 2013174131 A1 WO2013174131 A1 WO 2013174131A1 CN 2012086800 W CN2012086800 W CN 2012086800W WO 2013174131 A1 WO2013174131 A1 WO 2013174131A1
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Prior art keywords
temperature
liquid crystal
detecting
crystal module
container
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PCT/CN2012/086800
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English (en)
French (fr)
Inventor
张培林
柳在健
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京东方科技集团股份有限公司
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Application filed by 京东方科技集团股份有限公司 filed Critical 京东方科技集团股份有限公司
Priority to US13/995,481 priority Critical patent/US9939671B2/en
Publication of WO2013174131A1 publication Critical patent/WO2013174131A1/zh

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    • GPHYSICS
    • G02OPTICS
    • G02FOPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/1333Constructional arrangements; Manufacturing methods
    • G02F1/133382Heating or cooling of liquid crystal cells other than for activation, e.g. circuits or arrangements for temperature control, stabilisation or uniform distribution over the cell
    • GPHYSICS
    • G09EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09GARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
    • GPHYSICS
    • G09EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09GARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G2320/00Control of display operating conditions
    • G09G2320/02Improving the quality of display appearance
    • G09G2320/0257Reduction of after-image effects

Definitions

  • Liquid crystal module detecting device for detecting afterimage, detection evaluation system and method
  • Embodiments of the present invention relate to a liquid crystal module detecting apparatus, a detection evaluation system, and a method for detecting afterimages. Background technique
  • TFT-LCD Thin Film Transistor-Liquid Crystal Display
  • Major panel manufacturers are working hard to improve product performance, such as reducing power consumption, increasing viewing angles, and reducing response time. Improvements to the afterimage of the display panel are particularly important because the presence or absence of the afterimage directly affects the quality of the display.
  • the afterimage is a phenomenon in which the liquid crystal panel partially displays (drives) a specific still image and then partially shifts it to another image.
  • the afterimage is a phenomenon that occurs inside a liquid crystal cell. Since the liquid crystal panel changes to display other images after displaying the still picture for a long time, the liquid crystal molecules cannot be completely deflected in time to adapt to the new picture, thereby affecting the display effect.
  • the afterimage can be divided into two types: area image sticking and line image sticking depending on the form of occurrence.
  • the main cause of residual image is the effect of residual charge, which includes the polarization charge generated inside the liquid crystal cell under the applied electric field and the different distribution of impurity charges inside the liquid crystal cell.
  • residual charge includes the polarization charge generated inside the liquid crystal cell under the applied electric field and the different distribution of impurity charges inside the liquid crystal cell.
  • These residual charges affect the orientation of the liquid crystal at the top and bottom of the cell, so that afterimages occur throughout the panel area, and more severely, at the interface between images with significant color differences.
  • the generation of afterimages is also affected by other factors such as ambient temperature and still picture type, display time, brightness level, and so on.
  • the traditional system for assessing afterimages mainly consists of two parts: one part is the signal generation part, and the other part is the outside world. Heating and temperature control equipment. Since heating and temperature control equipment requires an external power supply and a complicated temperature control device, the conventional afterimage detection system is usually bulky, expensive, and inconvenient to move due to the large size of the device. These lead to the traditional system requiring a dedicated evaluation site, which is not convenient for real-time evaluation, and is not conducive to monitoring the afterimage level at any time. Summary of the invention
  • the embodiment of the present invention provides a liquid crystal module detecting device, a detecting and evaluating system and a method for detecting afterimages which are small in size and convenient to carry.
  • One aspect of the present invention provides a liquid crystal module detecting apparatus for detecting afterimages, comprising: a sealed and heat-insulating transparent container for accommodating a liquid crystal module to be tested; and a temperature control module for tempering the temperature inside the container
  • the signal generating module is configured to provide a driving signal for the liquid crystal module to be tested.
  • the temperature control module may include: a temperature control unit and a temperature adjusting unit, wherein the temperature control unit is configured to sense a temperature in the container, and open and close according to the sensed temperature
  • the temperature adjustment unit is connected to the temperature control unit for adjusting the temperature in the container.
  • the temperature control unit may be integrated in the container.
  • the temperature adjusting unit may be integrated in the container.
  • the signal generating module can be integrated in the container.
  • the temperature control unit may include: a temperature sensor and a controller, wherein the temperature sensor is configured to sense a temperature in the container, and send the sensed temperature data to the control The controller opens and closes the temperature adjustment unit according to the temperature data.
  • the signal generating module may be a programmable logic controller.
  • the controller and the signal generating module may belong to the same block programmable logic controller.
  • Another aspect of the present invention also provides a liquid crystal module detection and evaluation system for detecting afterimages, the system comprising the above apparatus.
  • Still another aspect of the present invention provides a liquid crystal module detection and evaluation method for detecting afterimages Law, including steps:
  • sensing the temperature in the container if the sensed temperature does not reach the detection temperature reference range, waiting; if the sensed temperature exceeds the detection temperature reference range, adjusting the temperature in the container until induction The temperature reached is within the detection temperature reference range, and the detection of the liquid crystal module to be tested is started.
  • the device, the system and the method of the embodiment of the invention form a transparent container with good sealing and heat insulation characteristics through the liquid crystal module to be tested, and use the heat generated by the backlight of the module and the panel to form a temperature environment required for testing, and reduce the device.
  • the volume is reduced, and the signal generation module and the temperature control module are integrated in the container, which can further reduce the volume of the device and make it convenient to carry, which is beneficial to real-time monitoring of the detection and evaluation of the liquid crystal module.
  • FIG. 1 is a schematic diagram showing the structure of a liquid crystal module detecting device for detecting afterimages according to an embodiment of the present invention
  • FIG. 2 is a flow chart of a method for detecting and evaluating a liquid crystal module for detecting afterimages according to an embodiment of the present invention. detailed description
  • Embodiments of the present invention utilize the heat emitted by the backlight of the liquid crystal module and the panel to create the temperature environment required for detection, thereby reducing the added volume of additional heating and temperature control equipment and reducing cost.
  • a liquid crystal module detecting apparatus for detecting an afterimage includes: a sealed and insulated transparent container 1, a temperature control module, and a signal generating module 4.
  • the sealed and heat-insulating transparent container 1 is used for accommodating the liquid crystal module 5 to be tested.
  • the container is made of a heat-insulating and transparent material, and the size thereof can be customized according to different sizes of the liquid crystal module to be tested, so as to fully utilize the size.
  • the heat of the liquid crystal module itself; the temperature control module is used to adjust the temperature in the container 1; the signal generating module 4 is used to provide a driving signal for the liquid crystal module 5 to be tested.
  • the temperature control module may further include a temperature control unit 2 and a temperature adjustment unit 3.
  • the temperature control unit 2 is for sensing the temperature inside the container 1 and opening and closing the temperature adjustment unit 3 according to the sensed temperature;
  • the temperature adjustment unit 3 is connected to the temperature control unit 2 for controlling under the control of the temperature control unit 2
  • the temperature inside the vessel 1 is adjusted to avoid the temperature in the vessel 1 exceeding the reference temperature range of the test evaluation due to excessive accumulation of heat.
  • the temperature control unit 2, the temperature adjusting unit 3, and the signal generating module 4 may be integrated in the container 1 in whole or in part.
  • the temperature control unit 2 may further include a temperature sensor and a controller.
  • the temperature sensor is for sensing the temperature inside the container 1, and sends the sensed temperature data to the controller; the controller opens and closes the temperature adjustment unit 3 based on the temperature data.
  • the signal generation module 4 can be, for example, a programmable logic controller.
  • PLC Protein Logic Controller
  • the function of the controller may be implemented by a programmable logic controller (PLC) (not limited thereto), and the controller controls the opening and closing of the temperature adjustment unit 3 according to the temperature data sent by the temperature sensor.
  • PLC programmable logic controller
  • the function of the controller can also be the same block
  • the PLC controls the implementation to further reduce the size of the device.
  • the temperature adjustment unit 3 may be a valve or a heat exchange device or the like connected to the temperature control unit 2, as long as the excess heat in the container 1 can be discharged from the container, and the specific implementation form is not limited thereto.
  • Another aspect of the present invention provides a liquid crystal module detection and evaluation system for detecting afterimages, the system comprising the above detection device.
  • a liquid crystal module detection and evaluation method for detecting afterimages may include the following steps.
  • the temperature control module senses the temperature in the container in real time, and waits if the sensed temperature does not reach the detection temperature reference range; if the sensed temperature exceeds the detection temperature reference range, adjusts the temperature in the container, The detection of the liquid crystal module to be tested is started until the sensed temperature is within the detection temperature reference range.

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  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Computer Hardware Design (AREA)
  • Theoretical Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Mathematical Physics (AREA)
  • Optics & Photonics (AREA)
  • Liquid Crystal (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Investigating Or Analyzing Materials Using Thermal Means (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)

Abstract

一种用于检测残像的液晶模组检测装置、检测评定系统及方法。其中该装置包括:密封隔热的透明容器(1),用于容纳待测液晶模组(5);温度控制模块,用于对容器内的温度进行调节;信号发生模块(4),用于为待测液晶模组提供驱动信号。该装置使用密闭、绝热特性好的透明容器,并使用模组自身背光和面板所发出的热量来形成测试所需的温度环境。

Description

用于检测残像的液晶模组检测装置、 检测评定系统及方法 技术领域
本发明的实施例涉及一种用于检测残像的液晶模组检测装置、 检测评定 系统及方法。 背景技术
薄膜晶体管液晶显示器 ( Thin Film Transistor-Liquid Crystal Display, TFT-LCD )具有体积小、 功耗低、 无辐射等特点, 已经广泛地应用于人们的 生产和生活当中, 例如用于 TV、 监视器(Monitor ) 、 以及便携式的电子显 示产品等。 各大面板厂商都在努力提高产品的性能, 例如降低能耗, 增大视 角, 减小响应时间等。 对于显示面板残像的改善尤为重要, 因为残像存在与 否直接影响了显示画面的品质。
残像是指液晶面板长时间显示(驱动)特定静止图像后, 变换为其他图 像时部分残留之前显示的图像的现象。 残像是发生在液晶盒(cell )内部的一 种现象。 由于液晶面板长时间显示静止画面后, 改变为显示其他图像时, 液 晶分子不能即时完全的发生偏转以适应新的画面, 从而影响了显示效果。
残像依据发生的形态不同可以分为面残像 ( area image sticking )和线残 像 ( line image sticking ) 两种。
人们对残像机理的研究表明, 产生残像的主要原因是残留电荷的影响, 这些残留电荷包括在外加电场作用下在液晶盒内部产生的极化电荷以及在液 晶盒内部杂质电荷的不同分布。 这些残留的电荷会影响在液晶盒顶部和底部 的液晶取向, 从而使得残像发生在整个面板区域, 比较严重的情形分布在具 有明显颜色差别的图像之间的交界位置。 残像的产生还受其他因素影响, 比 如外界温度以及静止画面类型、 显示时间、 亮度等级等。
通常, 在液晶模组装配完成后, 需要对其画面品质、 灰尘、 异物等等方 面进行检测, 以提高液晶模组的品质及成品率。 这其中包括对残像进行检测 及评定的部分。 液晶模组的检测环境需要达到一定的温度。 传统的对残像进 行评定的系统主要包括两大部分: 一部分为信号发生部分, 一部分为外界的 加热和温控设备。 由于加热和温控设备需要外加大功率电源和复杂的控温装 置, 所以传统的残像检测系统通常体积很大, 造价也高, 并且由于设备体积 大, 所以不便移动。 这些导致该传统的系统需要专用的评价场地, 无法进行 便利的实时评价, 不利于对残像等级进行随时监控。 发明内容
本发明的实施例在于提供一种体积小、 方便携带的用于检测残像的液晶 模组检测装置、 检测评定系统及方法。
本发明的一个方面提供了一种用于检测残像的液晶模组检测装置,包括: 密封隔热透明容器, 用于容纳待测液晶模组; 温度控制模块, 用于对所述容 器内的温度进行调节; 信号发生模块, 用于为所述待测液晶模组提供驱动信 号。
对于该液晶检测装置, 例如, 所述温度控制模块可以包括: 温度控制单 元和温度调节单元, 其中, 所述温度控制单元用于感应所述容器内的温度, 并根据感应到的温度开闭所述温度调节单元; 所述温度调节单元与所述温度 控制单元相连, 用于对所述容器内的温度进行调节。
对于该液晶检测装置,例如,所述温度控制单元可以集成于所述容器内。 对于该液晶检测装置,例如,所述温度调节单元可以集成于所述容器内。 对于该液晶检测装置,例如,所述信号发生模块可以集成于所述容器内。 对于该液晶检测装置, 例如, 所述温度控制单元可以包括: 温度传感器 和控制器, 其中, 所述温度传感器用于感应所述容器内的温度, 并将感应到 的温度数据发送至所述控制器; 所述控制器根据所述温度数据开闭所述温度 调节单元。
对于该液晶检测装置, 例如, 所述信号发生模块可以为可编程逻辑控制 器。
对于该液晶检测装置, 例如, 所述控制器与所述信号发生模块可以属于 同一块可编程逻辑控制器。
本发明的另一个方面还提供了一种用于检测残像的液晶模组检测评定系 统, 该系统包括上述的装置。
本发明的再一个方还提供了一种用于检测残像的液晶模组检测评定方 法, 包括步骤:
51. 将待测液晶模组放入密封隔热透明容器内;
52. 为所述待测液晶模组提供驱动信号, 将所述待测液晶模组点亮;
53. 感应所述容器内的温度,若感应到的温度未达到检测温度基准范围, 则等待; 若感应到的温度超出了所述检测温度基准范围, 则调节所述容器内 的温度, 直至感应到的温度位于检测温度基准范围内, 开始对所述待测液晶 模组的检测。
本发明实施例的装置、 系统及方法通过对待测液晶模组定制密闭、 绝热 特性好的透明容器, 使用模组自身背光和面板所发出的热量来形成测试所需 的温度环境, 减小了装置体积, 降低了成本; 将信号发生模块和温度控制模 块集成在容器内, 可进一步减小装置体积, 使其方便携带, 有利于液晶模组 检测评定的实时监控。 附图说明
为了更清楚地说明本发明实施例的技术方案, 下面将对实施例的附图作 简单地介绍,显而易见地,下面描述中的附图仅仅涉及本发明的一些实施例, 而非对本发明的限制。
图 1为依照本发明一种实施方式的用于检测残像的液晶模组检测装置结 构示意图;
图 2为依照本发明一种实施方式的用于检测残像的液晶模组检测评定方 法流程图。 具体实施方式
为使本发明实施例的目的、 技术方案和优点更加清楚, 下面将结合本发 明实施例的附图,对本发明实施例的技术方案进行清楚、 完整地描述。显然, 所描述的实施例是本发明的一部分实施例, 而不是全部的实施例。 基于所描 述的本发明的实施例, 本领域普通技术人员在无需创造性劳动的前提下所获 得的所有其他实施例, 都属于本发明保护的范围。
除非另作定义, 此处使用的技术术语或者科学术语应当为本发明所属领 域内具有一般技能的人士所理解的通常意义。 "一个" 或者 "一" 等类似词 语也不表示数量限制, 而是表示存在至少一个。 "连接" 或者 "相连" 等类 似的词语并非限定于物理的或者机械的连接, 而是可以包括电性的连接, 不 管是直接的还是间接的。
液晶模组背光所发出的光线通常只有 5%左右可以透过面板, 最终起到 显示效果, 而其余能量大部分都转化为热量排出。 本发明的实施例利用液晶 模组自身背光和面板所发出的热量来形成检测所需的温度环境, 从而减少附 加的加热和温控设备增加的体积, 并降低成本。
如图 1所示, 依照本发明一种实施方式的用于检测残像的液晶模组检测 装置包括: 密封隔热透明容器 1、 温度控制模块、 以及信号发生模块 4。 密封 隔热透明容器 1用于容纳待测液晶模组 5 , 例如该容器釆用绝热性好且透明 的材料制成, 其尺寸可根据不同的待测液晶模组的尺寸进行定制, 以充分利 用液晶模组自身的热量; 温度控制模块用于对容器 1内的温度进行调节; 信 号发生模块 4用于为待测液晶模组 5提供驱动信号。
在本实施方式的装置中, 该温度控制模块可进一步包括温度控制单元 2 以及温度调节单元 3。 温度控制单元 2用于感应容器 1 内的温度, 并根据感 应到的温度开闭温度调节单元 3; 温度调节单元 3与温度控制单元 2相连, 用于在该温度控制单元 2的控制下, 对容器 1内的温度进行调节, 以避免由 于热量的过多累积使得容器 1内的温度超出检测评定的基准温度范围。
为了减小装置的体积, 以实现携带方便, 从而便于残像的实时监控, 例 如可将温度控制单元 2、 温度调节单元 3以及信号发生模块 4全部或部分集 成于容器 1内。
在本实施方式的装置中, 该温度控制单元 2还可进一步包括温度传感器 和控制器。 温度传感器用于感应容器 1内的温度, 并将感应到的温度数据发 送至控制器; 控制器根据所述温度数据开闭所述温度调节单元 3。
在本实施方式的装置中, 信号发生模块 4 例如可为可编程逻辑控制器
( Programmable Logic Controller, PLC ) (不限于此) , 为待测液晶模组 5 提供驱动信号。
进一步地, 控制器的功能可由可编程逻辑控制器(Programmable Logic Controller, PLC ) (不限于此)来实现, 控制器根据温度传感器发送的温度 数据进而控制温度调节单元 3的开闭。 优选地, 控制器的功能也可由同一块 PLC来控制实现, 以进一步减小装置体积。
温度调节单元 3可为与温度控制单元 2相连的阀门或热交换设备等, 只 要能实现将容器 1内的多余热量排出容器即可, 具体的实现形式在此不作为 对本发明的限制。
本发明的另一个还提供了一种用于检测残像的液晶模组检测评定系统, 该系统包括上述检测装置。
如图 2所示, 依照本发明一种实施方式的用于检测残像的液晶模组检测 评定方法, 可以包括如下步骤。
S1. 将待测液晶模组放入密封隔热透明容器内;
S2. 开启信号发生模块,为待测液晶模组的面板和背光源提供驱动信号, 将待测液晶模组点亮;
S3. 温度控制模块实时感应容器内的温度, 若感应到的温度未达到检测 温度基准范围, 则等待; 若感应到的温度超出了所述检测温度基准范围, 则 调节所述容器内的温度, 直至感应到的温度位于检测温度基准范围内, 开始 对待测液晶模组的检测。
以上所述仅是本发明的示范性实施方式, 而非用于限制本发明的保护范 围, 本发明的保护范围由所附的权利要求确定。

Claims

权利要求书
1、 一种用于检测残像的液晶模组检测装置, 包括:
密封隔热透明容器, 用于容纳待测液晶模组;
温度控制模块, 用于对所述容器内的温度进行调节;
信号发生模块, 用于为所述待测液晶模组提供驱动信号。
2、如权利要求 1所述的用于检测残像的液晶模组检测装置, 其中, 所述 温度控制模块包括: 温度控制单元和温度调节单元,
所述温度控制单元用于感应所述容器内的温度, 并根据感应到的温度开 闭所述温度调节单元;
所述温度调节单元与所述温度控制单元相连, 用于对所述容器内的温度 进行调节。
3、如权利要求 2所述的用于检测残像的液晶模组检测装置, 其中, 所述 温度控制单元集成于所述容器内。
4、如权利要求 2所述的用于检测残像的液晶模组检测装置, 其中, 所述 温度调节单元集成于所述容器内。
5、如权利要求 1-4任一所述的用于检测残像的液晶模组检测装置,其中, 所述信号发生模块集成于所述容器内。
6、如权利要求 2-4任一所述的用于检测残像的液晶模组检测装置,其中, 所述温度控制单元包括: 温度传感器和控制器, 其中,
所述温度传感器用于感应所述容器内的温度, 并将感应到的温度数据发 送至所述控制器;
所述控制器, 根据所述温度数据开闭所述温度调节单元。
7、如权利要求 6所述的用于检测残像的液晶模组检测装置, 其中, 所述 信号发生模块为可编程逻辑控制器。
8、如权利要求 7所述的用于检测残像的液晶模组检测装置, 其中, 所述 控制器与所述信号发生模块属于同一块可编程逻辑控制器。
9、一种用于检测残像的液晶模组检测评定系统, 包括权利要求 1-8任一 项所述的装置。
10、 一种用于检测残像的液晶模组检测评定方法, 包括步骤: 51. 将待测液晶模组放入密封隔热透明容器内;
52. 为所述待测液晶模组提供驱动信号, 将所述待测液晶模组点亮;
53. 感应所述容器内的温度,若感应到的温度未达到检测温度基准范围, 则等待; 若感应到的温度超出了所述检测温度基准范围, 则调节所述容器内 的温度, 直至感应到的温度位于检测温度基准范围内, 开始对所述待测液晶 模组的检测。
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