WO2020029465A1 - Substrat d'électrode souple transparent et procédé de fabrication pour celui-ci - Google Patents
Substrat d'électrode souple transparent et procédé de fabrication pour celui-ci Download PDFInfo
- Publication number
- WO2020029465A1 WO2020029465A1 PCT/CN2018/116135 CN2018116135W WO2020029465A1 WO 2020029465 A1 WO2020029465 A1 WO 2020029465A1 CN 2018116135 W CN2018116135 W CN 2018116135W WO 2020029465 A1 WO2020029465 A1 WO 2020029465A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- flexible transparent
- polymer
- transparent electrode
- substrate
- manufacturing
- Prior art date
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Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/31—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
- H01L21/3205—Deposition of non-insulating-, e.g. conductive- or resistive-, layers on insulating layers; After-treatment of these layers
- H01L21/32051—Deposition of metallic or metal-silicide layers
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/1333—Constructional arrangements; Manufacturing methods
- G02F1/1343—Electrodes
- G02F1/13439—Electrodes characterised by their electrical, optical, physical properties; materials therefor; method of making
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/31—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
- H01L21/3205—Deposition of non-insulating-, e.g. conductive- or resistive-, layers on insulating layers; After-treatment of these layers
- H01L21/321—After treatment
Abstract
L'invention concerne un substrat d'électrode souple transparent et un procédé de fabrication pour celui-ci, lequel procédé pour fabriquer le substrat d'électrode souple transparent comprend : la disposition d'un substrat avant (11) ; la formation d'un support souple transparent (13) sur le substrat avant (11), le matériau de préparation du support souple transparent (13) étant un polymère comprenant un groupe carboxyle ; et le traitement successif du support souple transparent (13) avec une solution alcaline forte, une solution de nitrate d'argent, et une solution de chlorure, le fait de soumettre celui-ci à un traitement d'éclairage, puis la formation d'un substrat d'électrode souple transparent.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201810911707.6 | 2018-08-10 | ||
CN201810911707.6A CN109148286B (zh) | 2018-08-10 | 2018-08-10 | 一种柔性透明电极基板及其制作方法 |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2020029465A1 true WO2020029465A1 (fr) | 2020-02-13 |
Family
ID=64792911
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/CN2018/116135 WO2020029465A1 (fr) | 2018-08-10 | 2018-11-19 | Substrat d'électrode souple transparent et procédé de fabrication pour celui-ci |
Country Status (2)
Country | Link |
---|---|
CN (1) | CN109148286B (fr) |
WO (1) | WO2020029465A1 (fr) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN110911051A (zh) * | 2019-11-13 | 2020-03-24 | Tcl华星光电技术有限公司 | 一种柔性导电线制程方法、柔性导电线及显示装置 |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101020242A (zh) * | 2006-02-15 | 2007-08-22 | 三星电机株式会社 | 生产金属纳米颗粒的方法 |
US20090104437A1 (en) * | 2007-10-17 | 2009-04-23 | Michael Jeremiah Bortner | Scalable silver nano-particle colloid |
CN102203318A (zh) * | 2008-09-02 | 2011-09-28 | 特拉维夫大学拉玛特有限公司 | 金属纳米线薄膜 |
CN106654057A (zh) * | 2016-11-16 | 2017-05-10 | 福建师范大学 | 一种聚合物电致发光器件及其制备方法 |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TW554405B (en) * | 2000-12-22 | 2003-09-21 | Seiko Epson Corp | Pattern generation method and apparatus |
KR100672933B1 (ko) * | 2003-06-04 | 2007-01-23 | 삼성전자주식회사 | 세정 용액 및 이를 이용한 반도체 소자의 세정 방법 |
CN101750444B (zh) * | 2008-11-28 | 2013-04-17 | 中国科学院烟台海岸带研究所 | 一种聚合物膜银离子选择性电极的制备方法 |
JP2012188516A (ja) * | 2011-03-10 | 2012-10-04 | Unitika Ltd | 脱酸素塗剤、脱酸素剤含有塗膜及び積層体 |
CN102921958B (zh) * | 2012-11-06 | 2014-10-15 | 上海交通大学 | 一种具有pH调节相转移行为的发光纳米银的制备方法 |
CN106847378A (zh) * | 2017-03-31 | 2017-06-13 | 东莞市纳利光学材料有限公司 | 一种柔性透明导电膜及其制备方法 |
-
2018
- 2018-08-10 CN CN201810911707.6A patent/CN109148286B/zh active Active
- 2018-11-19 WO PCT/CN2018/116135 patent/WO2020029465A1/fr active Application Filing
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101020242A (zh) * | 2006-02-15 | 2007-08-22 | 三星电机株式会社 | 生产金属纳米颗粒的方法 |
US20090104437A1 (en) * | 2007-10-17 | 2009-04-23 | Michael Jeremiah Bortner | Scalable silver nano-particle colloid |
CN102203318A (zh) * | 2008-09-02 | 2011-09-28 | 特拉维夫大学拉玛特有限公司 | 金属纳米线薄膜 |
CN106654057A (zh) * | 2016-11-16 | 2017-05-10 | 福建师范大学 | 一种聚合物电致发光器件及其制备方法 |
Also Published As
Publication number | Publication date |
---|---|
CN109148286B (zh) | 2021-02-02 |
CN109148286A (zh) | 2019-01-04 |
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