WO2020013508A1 - Retainer ring for cmp, method for manufacturing same, and cmp device comprising retainer ring - Google Patents
Retainer ring for cmp, method for manufacturing same, and cmp device comprising retainer ring Download PDFInfo
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- WO2020013508A1 WO2020013508A1 PCT/KR2019/008064 KR2019008064W WO2020013508A1 WO 2020013508 A1 WO2020013508 A1 WO 2020013508A1 KR 2019008064 W KR2019008064 W KR 2019008064W WO 2020013508 A1 WO2020013508 A1 WO 2020013508A1
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- WIPO (PCT)
- Prior art keywords
- resin layer
- layer
- retainer ring
- synthetic resin
- frame layer
- Prior art date
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Classifications
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/27—Work carriers
- B24B37/30—Work carriers for single side lapping of plane surfaces
- B24B37/32—Retaining rings
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C39/00—Shaping by casting, i.e. introducing the moulding material into a mould or between confining surfaces without significant moulding pressure; Apparatus therefor
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C39/00—Shaping by casting, i.e. introducing the moulding material into a mould or between confining surfaces without significant moulding pressure; Apparatus therefor
- B29C39/003—Shaping by casting, i.e. introducing the moulding material into a mould or between confining surfaces without significant moulding pressure; Apparatus therefor characterised by the choice of material
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- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08K—Use of inorganic or non-macromolecular organic substances as compounding ingredients
- C08K3/00—Use of inorganic substances as compounding ingredients
- C08K3/34—Silicon-containing compounds
- C08K3/36—Silica
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- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08L—COMPOSITIONS OF MACROMOLECULAR COMPOUNDS
- C08L63/00—Compositions of epoxy resins; Compositions of derivatives of epoxy resins
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
- H01L21/68714—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
- H01L21/68721—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by edge clamping, e.g. clamping ring
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29K—INDEXING SCHEME ASSOCIATED WITH SUBCLASSES B29B, B29C OR B29D, RELATING TO MOULDING MATERIALS OR TO MATERIALS FOR MOULDS, REINFORCEMENTS, FILLERS OR PREFORMED PARTS, e.g. INSERTS
- B29K2063/00—Use of EP, i.e. epoxy resins or derivatives thereof, as moulding material
Definitions
- the present invention relates to a CMP retainer ring, a method of manufacturing the same, and a CMP apparatus comprising a retainer ring, and more particularly, comprising a frame layer, a resin layer, and a primer resin layer disposed between the frame layer and the resin layer.
- CMP chemical mechanical polishing
- the CMP process uses a slurry, which is a chemical liquid, and a polishing pad to cause a chemical reaction between the slurry and the wafer, and simultaneously transfer the mechanical force of the polishing pad to the wafer to planarize the wafer.
- a slurry which is a chemical liquid
- a polishing pad to cause a chemical reaction between the slurry and the wafer, and simultaneously transfer the mechanical force of the polishing pad to the wafer to planarize the wafer.
- the polishing head of the CMP apparatus includes a retainer ring and a wafer carrier.
- the wafer carrier serves to position the wafer on the polishing pad in contact with the lower surface of the polishing head, and is then polished while the wafer is rotated by the rotation of the polishing pad and the polishing head.
- the retainer ring disposed at the bottom of the wafer carrier serves to prevent the wafer from being released from the wafer carrier during wafer polishing.
- the retainer ring is generally located at the bottom of the wafer carrier and is in the form of a ring surrounding the side of the wafer.
- Retainer rings are generally used in the manufacturing of injection and insert injection molding.
- insert injection an injection operation is performed after a separate metal core is inserted into a product.
- the existing retainer ring can include a retainer ring, a manufacturing process thereof, and a retainer ring, which can provide a cost reduction effect.
- CMP devices There is a need for development of CMP devices.
- the present invention provides a CMP retainer ring having a cost reduction effect, a method of manufacturing the same, and a CMP device including the retainer ring.
- the upper part of the CMP retainer ring is formed using a molding method to form a frame layer composed of a thermosetting resin, and the lower part of the CMP retainer ring is easily bonded to the thermosetting resin layer by using a primer treatment technique. It is to provide a CMP retainer ring, a method of manufacturing the same, and a CMP apparatus including a retainer ring, which has an effect of improving work process.
- Retainer ring in the retainer ring used in the CMP apparatus, is coupled to the lower end of the carrier of the CMP apparatus, the frame layer containing a thermosetting resin, disposed on the lower end of the frame layer And a synthetic resin layer having a lower portion in contact with the polishing pad and retaining the wafer, and a primer resin layer disposed between the synthetic resin layer and the frame layer to bond the synthetic resin layer and the frame layer.
- the frame layer may be formed with one or more holes for bolting to the bottom of the carrier.
- Bolts may be inserted into the one or more holes by insert bolt molding.
- a bolt fixing part having a shape including two or more protrusions to fix the bottom of the insert bolt may be formed.
- a helical coil may be inserted into the one or more holes.
- One or more protrusions may be formed on the top of the synthetic resin layer.
- One or more grooves may be formed in at least one of the bottom and side surfaces of the synthetic resin layer.
- At least one of the bottom and side surfaces of the synthetic resin layer may be formed with one or more through holes.
- the frame layer may include an epoxy resin and a curing agent as the thermosetting resin layer.
- the frame layer comprises a thermosetting resin of 4,4 '-(1-methylethylidene) bisphenol polymer with (chloromethyl) oxirane (85%), (Butoxymethyl) oxirane (10%), and titanium dioxide (5%), 3- Thermal curing of aminomethyl-3,5,5-trimethylcyclo hexylamine (90%), ⁇ - (2-Aminomethylethyl) - ⁇ - (2-aminomethylethoxy) poly [oxy (methyl-1,2-ethanediyl)] (10%) It may be made of a resin curing agent.
- the thermal expansion coefficient of the frame layer may be 40 ⁇ 50ppm / k.
- the synthetic resin layer is polyether ether ketone (PEEK), polyethylene (POM), polyphenylsulfide (PPS), polybenzimidazole (PBI), polyetherimide (PEI), polybutylene terephthalate (PBT), poly At least one of ethylenterephthalate (PET), polyimide (PI), and polyamideimide (PAI).
- PEEK polyether ether ketone
- POM polyethylene
- PPS polyphenylsulfide
- PBI polybenzimidazole
- PEI polyetherimide
- PBT polybutylene terephthalate
- PET ethylenterephthalate
- PI polyimide
- PAI polyamideimide
- the thermal expansion coefficient of the synthetic resin layer may be 50 ⁇ 60ppm / k.
- the primer resin layer may be composed of phenol-formaldehyde polymer glycidyl ether (30%), toluene (45%), Methyl ethyl ketone (20%), and Ethyl acetate (5%).
- the thermal expansion coefficient of the primer resin layer may be 35 ⁇ 45ppm / k.
- a method of manufacturing a retainer ring may include: forming a synthetic resin layer having a circular ring shape; Primer-processing the top of the synthetic resin layer to form a primer resin layer; Inserting the primer-treated synthetic resin layer into a retainer ring molding mold, filling the molding mold with a thermosetting resin and curing the thermosetting resin to form a frame layer; And taking out the synthetic resin layer, the primer resin layer, and the frame layer laminated and bonded from the molding mold.
- thermosetting resin after adding 10 phr of silica (SiO 2 ) to the epoxy resin, using a high speed stirrer to disperse; Adding a curing agent to the dispersed epoxy resin and mixing the mixture at a mixing ratio of 50 phr to 100 phr to generate a solution; And it may be the molding solution produced through the step of defoaming to a vacuum solution of the level of 10 0 ⁇ 10 -2 torr in the mixed solution, using a paste mixer to complete the molding solution.
- silica SiO 2
- One or more grooves may be formed in at least one of the bottom and side surfaces of the synthetic resin layer.
- At least one of the bottom and side surfaces of the synthetic resin layer may be formed with one or more through holes.
- the CMP apparatus CMP apparatus, the retainer ring; A carrier coupled to the top of the retainer ring; And a polishing pad in contact with a lower end of the retainer ring and having a wafer disposed on the upper end thereof, wherein the retainer ring includes a frame layer including a thermosetting resin, a lower surface of the frame layer, A synthetic resin layer in contact with and retaining the wafer, and a primer resin layer disposed between the synthetic resin layer and the frame layer to bond the synthetic resin layer and the frame layer.
- the cost reduction effect may be provided by eliminating elements that reduce work process efficiency or increase cost as a configuration included in the existing CMP retainer ring.
- FIG. 1 is a view showing a retainer ring according to an embodiment of the present invention.
- FIG. 2 is a view illustrating a retainer ring coupled to a carrier according to an embodiment of the present invention.
- FIG 3 is a view showing a synthetic resin layer according to an embodiment of the present invention.
- FIG. 4 is a diagram illustrating a frame layer and a spiral coil inserted into a hole of the frame layer according to another embodiment of the present invention.
- FIG. 5 is a view showing the projection formed on the top of the synthetic resin layer according to an embodiment of the present invention.
- FIG. 6 is a cross-sectional view of a retainer ring according to an embodiment of the present invention.
- FIG. 7 is a photograph showing a cross section of a junction between a thermosetting resin layer and a polyether ether ketone (PEEK) resin layer.
- PEEK polyether ether ketone
- FIG. 8 is a flowchart illustrating a method of manufacturing a retainer ring according to an embodiment of the present invention.
- FIG. 9 is a view illustrating a method of manufacturing a retainer ring according to an embodiment of the present invention.
- FIG. 1 is a view showing a retainer ring according to an embodiment of the present invention
- Figure 2 is a view showing a state in which the retainer ring is coupled to a carrier according to an embodiment of the present invention.
- the retainer ring 110 of the present invention may include a frame layer 112, a primer resin layer 118, and a synthetic resin layer 115.
- the retainer ring 110 used in the CMP apparatus is coupled to the lower end of the carrier 120 of the CMP apparatus 10, and includes a frame layer 112 and a frame layer 112 containing a thermosetting resin.
- the resin layer 115 is disposed at the lower side, and the lower portion is in contact with the polishing pad 200 and is disposed between the resin layer 115 and the frame layer 112 to retain the wafer 300.
- a primer resin layer 118 that bonds the frame layer 112.
- the frame layer 112 may be in the form of an integral circular ring, but in some embodiments, may be in the form of a split circular ring.
- the top of the frame layer 112 and the bottom of the carrier 120 may be contacted and coupled, as shown in FIG. 1, the frame layer 112.
- One or more holes 113 for bolt coupling with the bottom of the carrier 120 may be formed.
- FIG 3 is a view showing a synthetic resin layer according to an embodiment of the present invention.
- FIG. 3 is a view showing the top of the synthetic resin layer 115, it can be seen that the bolt fixing part 117 formed on the top of the synthetic resin layer 115.
- the bolt fixing part 117 includes two or more protrusions, and as shown in FIG. 3, a bolt (insert bolt) is disposed inside the protruding portion to fix the lower end of the insert bolt to the synthetic resin layer 115. do.
- the upper part of the bolt is surrounded by the primer resin layer 118 and the frame layer 112, and the cured frame layer 112 includes the upper part of the bolt.
- the hole 113 is formed.
- the synthetic resin layer 115 may include one or more bolt fixing parts 117, in this case, also in the frame layer 112 corresponding to each of the bolt fixing parts 117 One or more holes 113 are to be formed.
- the one or more holes 113 are bolted by insert bolt molding, and may be coupled to a bolt portion molded to the retainer ring 110.
- the retainer ring 110 and the carrier 120 can be coupled to the bottom.
- FIG. 4 is a diagram illustrating a frame layer and a spiral coil inserted into a hole of the frame layer according to another embodiment of the present invention.
- FIG. 4A is an enlarged view of the hole 113 formed in the frame layer 112.
- the frame layer 112 is coupled to the bottom of the carrier 120 of the CMP apparatus.
- One or more holes 113 into which a helical coil 114 is inserted may be formed at an upper end of the upper side.
- the spiral coil 114 is inserted into the tapping hole 113, and the inserted spiral coil 114 may be fastened to the bottom of the carrier 120 by bolt coupling.
- FIG. 4 (b) shows the spiral coil 114 inserted into the hole 113 of the frame layer 112.
- the structure of the spiral coil 114 is a coil. (coil), a tang for insertion, and a notch for removal of the tang after insertion.
- Spiral coil 114 used in the present invention is durable, such as stainless steel, it is possible to use a metal strong in acid resistance and chemical resistance.
- FIG. 4C is a cross-sectional view of the spiral coil 114 inserted into the hole 113 of the frame layer 112. As shown in the spiral coil 114 portion not inserted into the hole 113 in FIG. 4C, the diameter of the spiral coil 114 before insertion may be greater than the diameter of the hole 113. .
- the process of inserting the spiral coil 114 into the hole 113 can be performed by applying a torque to the tang of the spiral coil 114 to reduce the diameter of the first peak of the spiral coil 114.
- Each coil's acid with the spring expands outwards like a spring, allowing the product to be permanently fixed. Due to this fixing method, when the bolt fastened to the spiral coil 114 is taken out, the spiral coil 114 itself may be prevented from falling out of the hole 113.
- FIG. 5 is a view showing the projection formed on the top of the synthetic resin layer according to an embodiment of the present invention.
- one or more protrusions 116 may be formed on the top of the synthetic resin layer 115. This increases the contact area between the synthetic resin layer 115 and the frame layer 112 due to the projection 116, thereby providing an effect of increasing the friction between the frame layer 112 and the synthetic resin layer 115, and finally Has the effect of increasing the mutual holding power.
- the retainer ring 110 moving together with the carrier 120 may perform rotational movement and horizontal movement (X, Y-axis directions) based on the center axis of the carrier 120, and apply pressure to the wafer 300.
- X, Y-axis directions rotational movement and horizontal movement
- Z-axis vertical movement
- the frame layer 112 with respect to the X, Y, Z-axis force transmitted to the retainer ring 110 It is meaningful to provide strong bonding force with).
- the shape of the protrusion 116 formed on the synthetic resin layer 115 may be the shape shown in FIG. 5, but is not limited thereto and may include various shapes to increase the contact area.
- the arrangement of the protrusions is not limited, and the protrusion shape extending only to one side is not the protrusion shape of FIG. 5 extending to both sides. It may be.
- a structure surrounding both sides of the frame layer 112 coupled to the upper portion of the synthetic resin layer 115 it may be a structure to increase the contact area of the synthetic resin layer 115 and the frame layer 112, of course.
- one or more grooves may be formed in at least one of the bottom and side surfaces of the synthetic resin layer 115. This is to prevent the slurry liquid used in the wafer 300 polishing process from sticking to the inner space of the retainer ring 110 retaining the wafer 300.
- the synthetic resin layer 115 may be dug into a predetermined depth, but in some embodiments, may be a through-hole penetrating from inside to outside.
- FIG. 6 is a cross-sectional view of a retainer ring according to an embodiment of the present invention.
- the retainer ring 110 of the present invention has a frame layer 112 having a predetermined thickness, a resin layer 115, and a primer resin layer bonding the frame layer 112 and the resin layer 115 to each other. 118 may be included.
- the topmost frame layer 112 is a thermosetting resin layer, and may include an epoxy resin and a curing agent.
- the epoxy resin is not a simple contact member, but is a direct configuration of the retainer ring 110, and is characterized in that it is configured to be disposed above the ring member having a predetermined thickness.
- the frame layer 112 comprises 4,4 '-(1-methylethylidene) bisphenol polymer with (chloromethyl) oxirane (85%), (Butoxymethyl) oxirane (10%), and titanium dioxide (5%).
- the coefficient of thermal expansion of the frame layer 112 may be 40 ⁇ 50ppm / k, preferably 45ppm / k.
- the synthetic resin layer 115 is made of polyether ether ketone (PEEK), polyethylene (POM), polyphenylsulfide (PPS), polybenzimidazole (PBI), polyetherimide (PEI), polybutylene terephthalate (PBT) And at least one of polyethylenterephthalate (PET), polyimide (PI), and polyamideimide (PAI).
- PEEK polyether ether ketone
- POM polyethylene
- PPS polyphenylsulfide
- PBI polybenzimidazole
- PEI polyetherimide
- PBT polybutylene terephthalate
- PET polyethylenterephthalate
- PI polyimide
- PAI polyamideimide
- the coefficient of thermal expansion of the synthetic resin layer 115 may be 50 ⁇ 60 ppm / k, preferably 55 ppm / k.
- the primer resin layer 118 serves to bond the frame layer 112 and the synthetic resin layer 115, and the primer resin layer 118 is a phenol-formaldehyde to facilitate physical bonding with the thermosetting resin. And may be composed of (phenol-formaldehyde polymer glycidyl ether (30%), toluene (45%), Methyl ethyl ketone (20%), and Ethyl acetate (5%), depending on the embodiment. .
- the coefficient of thermal expansion of the primer resin layer 118 may be 35 ⁇ 45ppm / k, preferably 40ppm / k.
- FIG. 7 is a photograph showing a cross section of a junction between a thermosetting resin layer and a polyether ether ketone (PEEK) resin layer.
- PEEK polyether ether ketone
- Polyether ether ketone (PEEK) used in the synthetic resin layer 115 of the present invention is an annealed plastic having excellent heat resistance, abrasion resistance, chemical resistance, and acid resistance, but generally has a weak contact force with a thermosetting resin, thereby bonding between the layers. This has been a difficult problem.
- Figure 7 (a) is not the primer, the conventional thermosetting resin and polyether ether keketone (PEEK) is the appearance of the junction between the layers, it can be seen that the lifting phenomenon occurs in the cross-section to be bonded, from which the interlayer bond strength is weak You can see that.
- PEEK polyether ether keketone
- Fig. 7 (b) shows the case where the primer treatment in the present invention is performed, and the junction between each layer is shown. From this, in the case of the present invention using a primer resin having excellent contact force with both the thermosetting resin and polyether ether ketone (PEEK), it can be confirmed that the bonding force is increased without lifting phenomenon in the adhesive portion of each layer.
- PEEK polyether ether ketone
- the primer resin layer 118 may be applied to the top surface of the synthetic resin layer 115 by a spray method.
- FIG. 8 is a flowchart illustrating a method of manufacturing a retainer ring according to an embodiment of the present invention.
- the method for manufacturing a retainer ring in the method for manufacturing a retainer ring, forming a synthetic ring layer of a circular ring (S100), the primer treatment on top of the synthetic resin layer
- a primer resin layer S200
- inserting the primer-treated synthetic resin layer into the retainer ring molding mold filling the thermosetting resin in the molding mold and curing the thermosetting resin to form a frame layer ( S300)
- the synthetic resin layer may be formed not only in the form of a circular ring of an injection molded product, but also in the form of a divided circular ring, and the synthetic resin layer may be formed of an injection molded product or a rolled tube, a plate, or the like by a mold structure. It may also be manufactured by machining.
- the retainer ring can be machined to the use standard, in accordance with an embodiment, for coupling the carrier and the retainer ring, the top of the frame layer and the bottom of the carrier of the CMP apparatus It may further comprise the step of combining.
- one or more holes may be formed in the frame layer disposed on the retainer ring, and bolts may be formed with the carrier through the holes.
- FIG. 9 is a view illustrating a method of manufacturing a retainer ring according to an embodiment of the present invention.
- Figure 9 is a method of manufacturing a retainer ring using an insert bolt molding method.
- the bolt fixing part 117 is formed on the upper end of the synthetic resin layer 115, and fixing the lower end of the bolt to the formed bolt fixing part 117 (FIG. 9 (a)).
- Inserting a resin bolt into the resin bolt (Fig. 9 (b)), in a state in which the resin bolt is inserted, forming a primer resin layer 118, the frame layer 112 on the top surface of the synthetic resin layer 115 ( 9 (c) can be seen.
- the space in which the resin bolt is inserted is the hole 113 in the frame layer 112.
- the next step may include removing the resin bolts to form the holes 113 in the frame layer 112 in which only the insert bolts are molded, and as a result, as shown in FIG. 9 (d).
- One or more holes 113 may be formed.
- the lower end of the carrier 120 of the CMP apparatus and the upper end of the retainer ring may be coupled to the hole 113 into which the bolt is inserted in the insert bolt molding method formed as described above using a bolt that can be coupled.
- a method of bolting the carrier and the retainer ring by inserting a spiral coil into the hole itself of the frame layer may be used.
- the method may further include forming a hole in an upper portion of the frame layer taken out from the molding mold, tapping around the inside of the hole, and inserting a spiral coil into the tapped hole.
- the bolt fastening method may further include coupling the upper end of the frame layer and the lower end of the carrier of the CMP device.
- the method may further include forming one or more protrusions on top of the synthetic resin layer which is in contact with the frame layer. This is to increase the fixing force between the frame layer and the synthetic resin layer by widening the contact area between the synthetic resin layer and the frame layer by forming one or more protrusions.
- one or more grooves may be formed in at least one of the bottom and side surfaces of the synthetic resin layer, and one or more through holes may be formed. This is to prevent the slurry liquid used in the wafer polishing process from accumulating in the inner space of the retainer ring retaining the wafer.
- thermosetting resin In the thermosetting resin according to the embodiment, 10 phr of silica (SiO 2 ) is added to the epoxy resin, followed by dispersing using a high speed stirrer. It may be a molding liquid produced by the step of, and in the mixed solution, by using a paste mixer, degassing at a vacuum level of 10 0 ⁇ 10 -2 torr to complete the molding liquid.
- Such a molding liquid is transferred to a molding mold into which a primer-treated synthetic resin layer is inserted, by a vacuum injector, molded in a vacuum state, and cured at about 100 ° C. for 30 minutes, whereby the thermosetting resin, that is, the molding liquid is cured.
- the frame layer is located at the top is formed.
- thermosetting resin injected using the vacuum molding method has an advantage as shown in Table 1 below compared to the insert injection method used in the prior art.
- the CMP apparatus 10 including the retainer ring according to the embodiment of the present invention is disposed at the bottom of the frame layer 112 and the frame layer 112 including the thermosetting resin as shown in FIG. 2.
- Retainer ring 110 having a synthetic resin layer 115, and a primer resin layer 118 disposed between the synthetic resin layer 115 and the frame layer 112 to bond the synthetic resin layer 115 and the frame layer 112.
- a carrier 120 coupled to the top of the retainer ring 110, and a polishing pad 200 contacting the bottom of the retainer ring 110 and having the wafer 300 disposed on the top thereof.
- the retainer ring is a component included in the existing CMP retainer ring to remove the elements that reduce the work process efficiency or increase the cost, and the lower resin layer, the molded upper part Including a frame layer, by easily bonding the frame layer and the synthetic resin layer through a primer treatment, there is a cost reduction effect and work process improvement compared to the existing.
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Abstract
A retainer ring according to an embodiment of the present invention is used in a CMP device and comprises: a frame layer which is coupled to the lower end of a carrier of the CMP device and includes a thermosetting resin; a synthetic resin layer, which is arranged at the lower end of the frame layer, has a lower part in contact with a polishing pad, and retains a wafer; and a primer resin layer arranged between the synthetic resin layer and the frame layer so as to bond together the synthetic resin layer and the frame layer.
Description
관련 출원(들)과의 상호 인용Cross Citation with Related Application (s)
본 출원은 2018년 7월 13일자 한국 특허 출원 제10-2018-0081740호에 기초한 우선권의 이익을 주장하며, 해당 한국 특허 출원의 문헌에 개시된 모든 내용은 본 명세서의 일부로서 포함된다.This application claims the benefit of priority based on Korean Patent Application No. 10-2018-0081740 dated July 13, 2018, and all content disclosed in the literature of that Korean patent application is incorporated as part of this specification.
본 발명은 CMP 리테이너 링, 이를 제조하는 방법, 및 리테이너 링을 포함하는 CMP 장치에 관한 것으로서, 보다 구체적으로는 프레임 층, 합성수지 층, 및 프레임 층 및 합성수지 층 사이에 배치된 프라이머 수지 층을 포함하는 CMP 리테이너 링, 이를 제조하는 방법, 및 리테이너 링을 포함하는 CMP 장치에 관한 것이다.The present invention relates to a CMP retainer ring, a method of manufacturing the same, and a CMP apparatus comprising a retainer ring, and more particularly, comprising a frame layer, a resin layer, and a primer resin layer disposed between the frame layer and the resin layer. A CMP retainer ring, a method of making the same, and a CMP apparatus comprising a retainer ring.
최근 반도체 웨이퍼의 고밀도 및 고기능화에 따라 반도체 웨이퍼 표면을 평탄화하기 위한 장치로서, 화학적 연마와 동시에 기계적 연마를 동시에 수행하는 화학적 기계적 연마(CMP: Chemical Mechanical Polishing) 장치가 이용되고 있다.Recently, as a device for planarizing a semiconductor wafer surface according to high density and high functionalization of a semiconductor wafer, a chemical mechanical polishing (CMP) device that simultaneously performs chemical polishing and mechanical polishing at the same time has been used.
반도체 제조공정 중 CMP 공정은 화학액인 슬러리와 연마 패드를 이용하여, 슬러리와 웨이퍼 사이에 화학적 반응을 일으킴과 동시에, 연마 패드의 기계적인 힘을 웨이퍼에 전달함으로써 웨이퍼를 평탄화시키는 공정이다.In the semiconductor manufacturing process, the CMP process uses a slurry, which is a chemical liquid, and a polishing pad to cause a chemical reaction between the slurry and the wafer, and simultaneously transfer the mechanical force of the polishing pad to the wafer to planarize the wafer.
CMP 장치 중 연마 헤드(polishing head)는 리테이너 링(retainer ring)과 웨이퍼 캐리어(wafer carrier)를 포함한다. 웨이퍼 캐리어는 웨이퍼를 연마 헤드의 하면에 접촉된 상태로, 연마 패드 상에 위치시키는 역할을 하며, 이 후 연마 패드, 연마 헤드의 회전에 의하여 웨이퍼가 회전되면서 연마되는 것이다.The polishing head of the CMP apparatus includes a retainer ring and a wafer carrier. The wafer carrier serves to position the wafer on the polishing pad in contact with the lower surface of the polishing head, and is then polished while the wafer is rotated by the rotation of the polishing pad and the polishing head.
웨이퍼의 연마 과정에서, 웨이퍼 캐리어의 하단에 배치된 리테이너 링은, 웨이퍼 연마 도중 웨이퍼 캐리어로부터 웨이퍼가 이탈되는 것을 방지하는 역할을 한다. 리테이너 링은 일반적으로 웨이퍼 캐리어의 최하단에 위치하는 것으로, 웨이퍼의 측면을 둘러싸는 링 형태이다.In the polishing of the wafer, the retainer ring disposed at the bottom of the wafer carrier serves to prevent the wafer from being released from the wafer carrier during wafer polishing. The retainer ring is generally located at the bottom of the wafer carrier and is in the form of a ring surrounding the side of the wafer.
기존에 일반적으로 이용되고 있는 리테이너 링의 제조는 사출 및 인서트 사출(insert injection molding) 방식으로서, 인서트 사출의 경우 제품 내부에 별도 금속 코어(core)를 삽입한 후, 사출 작업이 진행되는 방식이다.Retainer rings are generally used in the manufacturing of injection and insert injection molding. In the case of insert injection, an injection operation is performed after a separate metal core is inserted into a product.
모든 사출 공정은 300℃ 이상의 고온에서 이루어져야 하며, 전용 사출 장비, 고가의 금형이 필요한 방식이어서 원가적 문제가 있었고, 고열 작업 조건에서의 금형 관리 등 작업 공정상 상당한 정도의 기술적 관리가 요구되는 문제도 있었다.All injection processes must be performed at a high temperature of 300 ℃ or higher, and there is a cost problem because it requires exclusive injection equipment and expensive molds, and a problem that requires a considerable degree of technical control in the work process, such as mold management under high temperature working conditions, is also required. there was.
특히, 고열 작업에 따라 사출 장비 내 체류하게 되는 수지의 탄화 문제로, 수지의 물성 변화 및 탄화 제품이 사출 제품의 표면에 노출되는 문제, 뿐만 아니라 이로 인한 제품 표면에 흑점이 발생하는 등 제품의 품질적 문제가 발생 된다.In particular, the problem of carbonization of the resin staying in the injection equipment due to the high-temperature work, the change of the physical properties of the resin and the problem of the carbonized product is exposed to the surface of the injection product, as well as the appearance of black spots on the surface of the product due to this product quality Problems arise.
상기와 같은 기존의 리테이너 링의 제조, 이용으로 인한 작업 품질개선 및작업 효율상의 문제를 해결하기 위하여 작업 공정 개선, 원가 절감 효과를 제공할 수 있는, 리테이너 링, 이의 제조 공정, 및 리테이너 링을 포함하는 CMP 장치에 대한 개발이 필요하다.In order to solve the problems of improvement of work quality and work efficiency due to the manufacture and use of the existing retainer ring as described above, it can include a retainer ring, a manufacturing process thereof, and a retainer ring, which can provide a cost reduction effect. There is a need for development of CMP devices.
본 발명이 해결하고자 하는 과제는 기존에 제안된 방법들의 상기와 같은 문제점들을 해결하기 위해 제안된 것으로, 기존의 CMP 리테이너 링에 포함된 구성으로서 작업 공정 효율을 떨어뜨리거나 비용을 증가시키는 구성을 최소화하여, 원가 절감 효과가 있는 CMP 리테이너 링, 이를 제조하는 방법, 및 리테이너 링을 포함하는 CMP 장치를 제공하는 것이다.The problem to be solved by the present invention is proposed to solve the above problems of the conventionally proposed methods, the configuration included in the existing CMP retainer ring to minimize the configuration to reduce the work process efficiency or increase the cost Accordingly, the present invention provides a CMP retainer ring having a cost reduction effect, a method of manufacturing the same, and a CMP device including the retainer ring.
또한, CMP 리테이너 링의 상부를 몰딩 방법을 사용하여 열경화성 수지로 구성된 프레임 층을 형성하며, CMP 리테이너 링의 하부에는 합성수지 층을 프라이머 처리 기법을 이용하여 열경화성 수지 층과 용이하게 접합되도록 함으로써, 기존 대비 작업 공정 개선 효과가 있는, CMP 리테이너 링, 이를 제조하는 방법, 및 리테이너 링을 포함하는 CMP 장치를 제공하는 것이다.In addition, the upper part of the CMP retainer ring is formed using a molding method to form a frame layer composed of a thermosetting resin, and the lower part of the CMP retainer ring is easily bonded to the thermosetting resin layer by using a primer treatment technique. It is to provide a CMP retainer ring, a method of manufacturing the same, and a CMP apparatus including a retainer ring, which has an effect of improving work process.
다만, 본 발명의 실시예들이 해결하고자 하는 과제는 상술한 과제에 한정되지 않고 본 발명에 포함된 기술적 사상의 범위에서 다양하게 확장될 수 있다. However, the problem to be solved by the embodiments of the present invention is not limited to the above-described problem can be variously extended within the scope of the technical idea included in the present invention.
본 발명의 일 실시예에 따른 리테이너 링은, CMP 장치에 이용되는 리테이너 링에 있어서, 상기 CMP 장치의 캐리어의 하단에 결합되며, 열경화 수지를 포함하는 프레임 층, 상기 프레임 층의 하단에 배치되며, 하부가 연마 패드와 접촉되며 웨이퍼를 리테이닝 하는 합성수지 층, 및 상기 합성수지 층과 상기 프레임 층 사이에 배치되어 상기 합성수지 층과 상기 프레임 층을 접합시키는 프라이머 수지 층을 포함한다.Retainer ring according to an embodiment of the present invention, in the retainer ring used in the CMP apparatus, is coupled to the lower end of the carrier of the CMP apparatus, the frame layer containing a thermosetting resin, disposed on the lower end of the frame layer And a synthetic resin layer having a lower portion in contact with the polishing pad and retaining the wafer, and a primer resin layer disposed between the synthetic resin layer and the frame layer to bond the synthetic resin layer and the frame layer.
상기 프레임 층에는 상기 캐리어의 하단과 볼트 결합을 위한 하나 이상의 홀이 형성될 수 있다.The frame layer may be formed with one or more holes for bolting to the bottom of the carrier.
상기 하나 이상의 홀에는 인서트 볼트 몰딩(Insert Bolt Molding) 방식으로 볼트가 삽입될 수 있다.Bolts may be inserted into the one or more holes by insert bolt molding.
상기 합성수지 층의 상단에는, 인서트 볼트의 하단을 고정시키기 위하여 둘 이상의 돌출부를 포함하는 형태인 볼트 고정부가 형성될 수 있다.At the top of the synthetic resin layer, a bolt fixing part having a shape including two or more protrusions to fix the bottom of the insert bolt may be formed.
상기 하나 이상의 홀에는 나선 코일(helical coil)이 삽입될 수 있다.A helical coil may be inserted into the one or more holes.
상기 합성수지 층의 상단에는 하나 이상의 돌기가 형성될 수 있다.One or more protrusions may be formed on the top of the synthetic resin layer.
상기 합성수지 층의 하단과 측면 중 적어도 하나에는 하나 이상의 홈이 형성될 수 있다.One or more grooves may be formed in at least one of the bottom and side surfaces of the synthetic resin layer.
상기 합성수지 층의 하단과 측면 중 적어도 하나에는 하나 이상의 관통홀이 형성될 수 있다.At least one of the bottom and side surfaces of the synthetic resin layer may be formed with one or more through holes.
상기 프레임 층은 열경화성 수지 층으로서 에폭시 수지 및 경화제를 포함할 수 있다.The frame layer may include an epoxy resin and a curing agent as the thermosetting resin layer.
상기 프레임 층은 4,4'-(1-methylethylidene) bisphenol polymer with (chloromethyl)oxirane (85%), (Butoxymethyl)oxirane (10%), 및 titanium dioxide (5%)의 열경화 수지와, 3-Aminomethyl-3,5,5-trimethylcyclo hexylamine (90%), α-(2-Aminomethylethyl)-ω-(2-aminomethylethoxy)poly [oxy(methyl-1,2-ethanediyl)] (10%)의 열경화 수지 경화제로 이루어질 수 있다.The frame layer comprises a thermosetting resin of 4,4 '-(1-methylethylidene) bisphenol polymer with (chloromethyl) oxirane (85%), (Butoxymethyl) oxirane (10%), and titanium dioxide (5%), 3- Thermal curing of aminomethyl-3,5,5-trimethylcyclo hexylamine (90%), α- (2-Aminomethylethyl) -ω- (2-aminomethylethoxy) poly [oxy (methyl-1,2-ethanediyl)] (10%) It may be made of a resin curing agent.
상기 프레임 층의 열팽창 계수는 40~50ppm/k 일 수 있다.The thermal expansion coefficient of the frame layer may be 40 ~ 50ppm / k.
상기 합성수지 층은 폴리에테르에트레케톤(PEEK), 폴리에틸렌(POM), 폴리페닐설파이드(PPS), 폴리벤지미다졸(PBI), 폴리에테르이미드(PEI), 폴리부틸렌테레프탈레이트(PBT), 폴리에틸린테레프탈레이트(PET), 폴리이미드(PI), 및 폴리아미드이미드(PAI) 중 적어도 하나일 수 있다.The synthetic resin layer is polyether ether ketone (PEEK), polyethylene (POM), polyphenylsulfide (PPS), polybenzimidazole (PBI), polyetherimide (PEI), polybutylene terephthalate (PBT), poly At least one of ethylenterephthalate (PET), polyimide (PI), and polyamideimide (PAI).
상기 합성수지 층의 열팽창 계수는 50~60ppm/k 일 수 있다.The thermal expansion coefficient of the synthetic resin layer may be 50 ~ 60ppm / k.
상기 프라이머 수지 층은 phenol-formaldehyde polymer glycidyl ether (30%), Toluene (45%), Methyl ethyl ketone (20%), 및 Ethyl acetate (5%)로 이루어질 수 있다.The primer resin layer may be composed of phenol-formaldehyde polymer glycidyl ether (30%), toluene (45%), Methyl ethyl ketone (20%), and Ethyl acetate (5%).
상기 프라이머 수지 층은 (C=18)-unsaturated dimers polymers with ethylenediamine and meta-xylenediamine (45%), Salicylic acid (5%), Toluene (45%), 및 Ethyl acetate (5%)로 이루어지는 프라이머 수지 경화제를 더 포함할 수 있다.The primer resin layer is composed of (C = 18) -unsaturated dimers polymers with ethylenediamine and meta-xylenediamine (45%), Salicylic acid (5%), Toluene (45%), and Ethyl acetate (5%) It may further include.
상기 프라이머 수지 층의 열팽창 계수는 35~45ppm/k 일 수 있다.The thermal expansion coefficient of the primer resin layer may be 35 ~ 45ppm / k.
본 발명의 일 실시예에 따른 리테이너 링을 제조하는 방법은, 리테이너 링을 제조하는 방법에 있어서, 원형 고리 형태의 합성수지 층을 형성하는 단계; 상기 합성수지 층의 상단에 프라이머 처리를 하여, 프라이머 수지 층을 형성하는 단계; 리테이너 링 몰딩 틀에 상기 프라이머 처리된 상기 합성수지 층을 삽입한 후, 상기 몰딩 틀에 열경화 수지를 채우고 상기 열경화 수지를 경화시켜 프레임 층을 형성하는 단계; 및 상기 몰딩 틀로부터 적층되어 결합된 상기 합성수지 층, 상기 프라이머 수지 층, 및 상기 프레임 층을 취출하는 단계를 포함한다.According to one or more exemplary embodiments, a method of manufacturing a retainer ring may include: forming a synthetic resin layer having a circular ring shape; Primer-processing the top of the synthetic resin layer to form a primer resin layer; Inserting the primer-treated synthetic resin layer into a retainer ring molding mold, filling the molding mold with a thermosetting resin and curing the thermosetting resin to form a frame layer; And taking out the synthetic resin layer, the primer resin layer, and the frame layer laminated and bonded from the molding mold.
상기 열경화성 수지는, 에폭시 수지에 실리카(SiO2)를 10phr 첨가한 후, 고속 교반기를 이용하여 분산시키는 단계; 상기 분산된 에폭시 수지에, 경화제를 첨가하여 혼합 비율 50phr ~ 100phr로 혼합시켜 용액을 생성하는 단계; 및 상기 혼합된 용액에, 페이스트 믹서(Paste Mixer)를 이용하여, 100~10-2 torr 수준의 진공도로 탈포하여 몰딩액을 완성하는 단계를 통하여 생성된 상기 몰딩액일 수 있다.The thermosetting resin, after adding 10 phr of silica (SiO 2 ) to the epoxy resin, using a high speed stirrer to disperse; Adding a curing agent to the dispersed epoxy resin and mixing the mixture at a mixing ratio of 50 phr to 100 phr to generate a solution; And it may be the molding solution produced through the step of defoaming to a vacuum solution of the level of 10 0 ~ 10 -2 torr in the mixed solution, using a paste mixer to complete the molding solution.
상기 합성수지 층의 상단에 볼트 고정부를 형성하는 단계; 상기 볼트 고정부에 볼트 하단을 고정시키는 단계; 상기 고정된 볼트의 내부에 수지 볼트를 삽입한 상태에서, 상기 합성수지 층의 상단면에 프라이머 수지 층, 프레임 층을 형성하는 단계; 상기 수지 볼트를 제거하여 상기 프레임 층에 홀을 형성하는 단계; 및 상기 홀에 결합되는 볼트를 이용하여, 상기 프레임 층의 상단과 상기 CMP 장치의 캐리어의 하단을 결합시키는 단계를 더 포함할 수 있다.Forming a bolt fixing part on an upper end of the synthetic resin layer; Fixing a bolt bottom to the bolt fixing part; Forming a primer resin layer and a frame layer on an upper surface of the synthetic resin layer while the resin bolt is inserted into the fixed bolt; Removing the resin bolts to form holes in the frame layer; And coupling the upper end of the frame layer to the lower end of the carrier of the CMP device by using a bolt coupled to the hole.
상기 프레임 층의 상단에 홀을 형성하는 단계; 상기 홀 내부 주변을 탭핑(taping)하는 단계; 상기 탭핑한 홀에 나선 코일(helical coil)을 삽입하는 단계; 및 상기 나선 코일이 삽입된 홀에, 볼트 체결 방식을 이용하여, 상기 프레임 층의 상단과 상기 CMP 장치의 캐리어의 하단을 결합시키는 단계를 더 포함할 수 있다.Forming a hole in the top of the frame layer; Tapping around the inside of the hole; Inserting a helical coil into the tapped hole; And coupling the upper end of the frame layer and the lower end of the carrier of the CMP device to the hole into which the spiral coil is inserted by using a bolt fastening method.
상기 합성수지 층을 형성하는 단계 이후에, 상기 프레임 층과 접촉하게 되는 상기 합성수지 층의 상단에 하나 이상의 돌기를 형성시키는 단계를 더 포함하여, 상기 프레임 층과 상기 합성수지 층의 고정력을 높일 수 있다.After forming the synthetic resin layer, further comprising the step of forming one or more protrusions on the top of the synthetic resin layer in contact with the frame layer, it is possible to increase the fixing force of the frame layer and the synthetic resin layer.
상기 합성수지 층의 하단과 측면 중 적어도 하나에는 하나 이상의 홈이 형성될 수 있다.One or more grooves may be formed in at least one of the bottom and side surfaces of the synthetic resin layer.
상기 합성수지 층의 하단과 측면 중 적어도 하나에는 하나 이상의 관통홀이 형성될 수 있다.At least one of the bottom and side surfaces of the synthetic resin layer may be formed with one or more through holes.
또한, 본 발명의 실시예에 따른 CMP 장치는, CMP 장치에 있어서, 리테이너 링; 상기 리테이너 링의 상단에 결합되는 캐리어; 및 상기 리테이너 링의 하단과 접촉되며, 상단에 웨이퍼가 배치되는 연마 패드를 포함하며, 상기 리테이너 링은, 열경화 수지를 포함하는 프레임 층, 상기 프레임 층의 하단에 배치되며, 하부가 연마 패드와 접촉되며 웨이퍼를 리테이닝 하는 합성수지 층, 및 상기 합성수지 층과 상기 프레임 층 사이에 배치되어 상기 합성수지 층과 상기 프레임 층을 접합시키는 프라이머 수지 층을 포함한다.In addition, the CMP apparatus according to the embodiment of the present invention, CMP apparatus, the retainer ring; A carrier coupled to the top of the retainer ring; And a polishing pad in contact with a lower end of the retainer ring and having a wafer disposed on the upper end thereof, wherein the retainer ring includes a frame layer including a thermosetting resin, a lower surface of the frame layer, A synthetic resin layer in contact with and retaining the wafer, and a primer resin layer disposed between the synthetic resin layer and the frame layer to bond the synthetic resin layer and the frame layer.
본 발명의 실시예들에 따르면, 기존의 CMP 리테이너 링에 포함된 구성으로서 작업 공정 효율을 떨어뜨리거나 비용을 증가시키는 요소를 제거함으로써, 원가 절감 효과를 제공할 수 있다.According to embodiments of the present invention, the cost reduction effect may be provided by eliminating elements that reduce work process efficiency or increase cost as a configuration included in the existing CMP retainer ring.
또한, 상부 프레임 층 및 하부 합성수지 층을 프라이머 처리 기법을 통하여 접합시킴으로써 각 층간의 결합력을 높여, 작업 공정 개선 효과를 제공할 수 있다.In addition, by bonding the upper frame layer and the lower synthetic resin layer through a primer treatment technique, it is possible to increase the bonding strength between the layers, thereby providing a work process improvement effect.
도 1은 본 발명의 일 실시에에 따른 리테이너 링을 도시한 도면이다.1 is a view showing a retainer ring according to an embodiment of the present invention.
도 2는 본 발명의 일 실시예에 따른 리테이너 링이 캐리어에 결합된 모습을 도시한 도면이다.2 is a view illustrating a retainer ring coupled to a carrier according to an embodiment of the present invention.
도 3은 본 발명의 일 실시예에 따른 합성수지 층을 나타낸 도면이다.3 is a view showing a synthetic resin layer according to an embodiment of the present invention.
도 4는 본 발명의 다른 실시예에 따른 프레임 층 및 프레임 층의 홀에 삽입되는 나선 코일을 도시한 도면이다.4 is a diagram illustrating a frame layer and a spiral coil inserted into a hole of the frame layer according to another embodiment of the present invention.
도 5는 본 발명의 일 실시예에 따른 합성수지 층의 상단에 형성된 돌기를 도시한 도면이다.5 is a view showing the projection formed on the top of the synthetic resin layer according to an embodiment of the present invention.
도 6은 본 발명의 일 실시예에 따른 리테이너 링의 단면을 나타낸 도면이다.6 is a cross-sectional view of a retainer ring according to an embodiment of the present invention.
도 7은 열경화성 수지 층과 폴리에테르에트레케톤(PEEK) 수지 층 간의 접합부 단면을 나타낸 사진이다.FIG. 7 is a photograph showing a cross section of a junction between a thermosetting resin layer and a polyether ether ketone (PEEK) resin layer. FIG.
도 8는 본 발명의 일 실시예에 따른 리테이너 링을 제조하는 방법의 흐름도를 도시한 도면이다.8 is a flowchart illustrating a method of manufacturing a retainer ring according to an embodiment of the present invention.
도 9는 본 발명의 일 실시예에 따른 리테이너 링을 제조하는 방법을 설명하기 위하여 도시한 도면이다.9 is a view illustrating a method of manufacturing a retainer ring according to an embodiment of the present invention.
이하, 첨부한 도면을 참고로 하여 본 발명의 여러 실시예들에 대하여 본 발명이 속하는 기술 분야에서 통상의 지식을 가진 자가 용이하게 실시할 수 있도록 상세히 설명한다. 본 발명은 여러 가지 상이한 형태로 구현될 수 있으며 여기에서 설명하는 실시예들에 한정되지 않는다.Hereinafter, various embodiments of the present invention will be described in detail with reference to the accompanying drawings so that those skilled in the art may easily implement the present invention. As those skilled in the art would realize, the described embodiments may be modified in various different ways, all without departing from the spirit or scope of the present invention.
본 발명을 명확하게 설명하기 위해서 설명과 관계없는 부분은 생략하였으며, 명세서 전체를 통하여 동일 또는 유사한 구성요소에 대해서는 동일한 참조 부호를 붙이도록 한다.In order to clearly describe the present invention, parts irrelevant to the description are omitted, and like reference numerals designate like elements throughout the specification.
또한, 도면에서 나타난 각 구성의 크기 및 두께는 설명의 편의를 위해 임의로 나타내었으므로, 본 발명이 반드시 도시된 바에 한정되지 않는다. 도면에서 여러 층 및 영역을 명확하게 표현하기 위하여 두께를 확대하여 나타내었다. 그리고 도면에서, 설명의 편의를 위해, 일부 층 및 영역의 두께를 과장되게 나타내었다.In addition, since the size and thickness of each component shown in the drawings are arbitrarily shown for convenience of description, the present invention is not necessarily limited to the illustrated. In the drawings, the thickness of layers, films, panels, regions, etc., are exaggerated for clarity. In the drawings, the thicknesses of layers and regions are exaggerated for clarity.
또한, 명세서 전체에서, 어떤 부분이 어떤 구성요소를 "포함" 한다고 할 때, 이는 특별히 반대되는 기재가 없는 한 다른 구성요소를 제외하는 것이 아니라 다른 구성요소를 더 포함할 수도 있는 것을 의미한다.In addition, throughout the specification, when a part is said to "include" a certain component, it means that it may further include other components, without excluding the other components unless otherwise stated.
도 1은 본 발명의 일 실시에에 따른 리테이너 링을 도시한 도면이며, 도 2는 본 발명의 일 실시예에 따른 리테이너 링이 캐리어에 결합된 모습을 도시한 도면이다.1 is a view showing a retainer ring according to an embodiment of the present invention, Figure 2 is a view showing a state in which the retainer ring is coupled to a carrier according to an embodiment of the present invention.
도 1 및 도 2에 도시된 바와 같이, 본 발명의 리테이너 링(110)은 프레임 층(112), 프라이머 수지 층(118) 및 합성수지 층(115)을 포함할 수 있다.As shown in FIGS. 1 and 2, the retainer ring 110 of the present invention may include a frame layer 112, a primer resin layer 118, and a synthetic resin layer 115.
구체적으로는, CMP 장치에 이용되는 리테이너 링(110)은, CMP 장치(10)의 캐리어(120)의 하단에 결합되며, 열경화 수지를 포함하는 프레임 층(112), 프레임 층(112)의 하단에 배치되며, 하부가 연마 패드(200)와 접촉되며 웨이퍼(300)를 리테이닝 하는 합성수지 층(115), 및 합성수지 층(115)과 프레임 층(112) 사이에 배치되어 합성수지 층(115)과 프레임 층(112)을 접합시키는 프라이머 수지 층(118)을 포함할 수 있다. Specifically, the retainer ring 110 used in the CMP apparatus is coupled to the lower end of the carrier 120 of the CMP apparatus 10, and includes a frame layer 112 and a frame layer 112 containing a thermosetting resin. The resin layer 115 is disposed at the lower side, and the lower portion is in contact with the polishing pad 200 and is disposed between the resin layer 115 and the frame layer 112 to retain the wafer 300. And a primer resin layer 118 that bonds the frame layer 112.
프레임 층(112)은 일체형의 원형 고리 형태일 수 있으나, 실시예에 따라서는 분할형의 원형 고리 형태일 수도 있다.The frame layer 112 may be in the form of an integral circular ring, but in some embodiments, may be in the form of a split circular ring.
리테이너 링(110)이 캐리어(120)에 결합되는 경우, 프레임 층(112)의 상단과 캐리어(120)의 하단이 접촉되어 결합될 수 있으며, 도 1에 도시된 바와 같이, 프레임 층(112)에는 캐리어(120)의 하단과 볼트 결합을 위한 하나 이상의 홀(113)이 형성될 수 있다.When the retainer ring 110 is coupled to the carrier 120, the top of the frame layer 112 and the bottom of the carrier 120 may be contacted and coupled, as shown in FIG. 1, the frame layer 112. One or more holes 113 for bolt coupling with the bottom of the carrier 120 may be formed.
캐리어(120)와 리테이너 링(110)의 결합에 대하여는 이하에서 설명하도록 한다.The coupling of the carrier 120 and the retainer ring 110 will be described below.
도 3은 본 발명의 일 실시예에 따른 합성수지 층을 나타낸 도면이다.3 is a view showing a synthetic resin layer according to an embodiment of the present invention.
도 3은 합성수지 층(115)의 상단을 도시한 도면으로서, 합성수지 층(115)의 상단에 형성된 볼트 고정부(117)를 확인할 수 있다. 볼트 고정부(117)는 둘 이상의 돌출부를 포함하는 형태로서, 도 3에서와 같이 돌출된 부분 내부에 볼트(인서트 볼트)를 배치시켜, 인서트 볼트의 하단을 합성수지 층(115)에 고정시키는 역할을 한다.3 is a view showing the top of the synthetic resin layer 115, it can be seen that the bolt fixing part 117 formed on the top of the synthetic resin layer 115. The bolt fixing part 117 includes two or more protrusions, and as shown in FIG. 3, a bolt (insert bolt) is disposed inside the protruding portion to fix the lower end of the insert bolt to the synthetic resin layer 115. do.
이와 같이, 볼트 고정부(117)에 볼트가 고정되는 경우, 볼트의 상단 부분은 프라이머 수지 층(118), 프레임 층(112)이 감싸게 되며, 볼트 상단 부분을 포함한 상태로 경화된 프레임 층(112)에는 홀(113)이 형성되게 된다.As such, when the bolt is fixed to the bolt fixing part 117, the upper part of the bolt is surrounded by the primer resin layer 118 and the frame layer 112, and the cured frame layer 112 includes the upper part of the bolt. In the hole 113 is formed.
즉, 본 발명의 일 실시예에 따라서는, 합성수지 층(115)에는 하나 이상의 볼트 고정부(117)가 포함될 수 있으며, 이 경우, 볼트 고정부(117) 각각에 대응되는 프레임 층(112)에도 하나 이상의 홀(113)이 형성되게 되는 것이다.That is, according to one embodiment of the present invention, the synthetic resin layer 115 may include one or more bolt fixing parts 117, in this case, also in the frame layer 112 corresponding to each of the bolt fixing parts 117 One or more holes 113 are to be formed.
이러한 하나 이상의 홀(113)에는 앞서 설명한 바와 같이, 인서트 볼트 몰딩(Insert Bolt Molding) 방식에 의하여 볼트가 몰딩되어 있는 것이며, 리테이너 링(110)에 몰딩되어 있는 볼트 부분에, 결합될 수 있는 볼트 구성을 이용하여 리테이너 링(110)과 캐리어(120) 하단을 결합시킬 수 있게 된다.As described above, the one or more holes 113 are bolted by insert bolt molding, and may be coupled to a bolt portion molded to the retainer ring 110. By using the retainer ring 110 and the carrier 120 can be coupled to the bottom.
도 4는 본 발명의 다른 실시예에 따른 프레임 층 및 프레임 층의 홀에 삽입되는 나선 코일을 도시한 도면이다.4 is a diagram illustrating a frame layer and a spiral coil inserted into a hole of the frame layer according to another embodiment of the present invention.
도 4(a)는 프레임 층(112)에 형성된 홀(113)을 확대하여 나타낸 도면으로서, 도 4(a)에 나타낸 바와 같이, CMP 장치의 캐리어(120)의 하단에 결합되는 프레임 층(112)의 상단에는, 나선 코일(helical coil)(114)이 삽입된 홀(113)이 하나 이상 형성될 수 있다. 태핑 작업된 홀(113)에 나선 코일(114)이 삽입된 모습을 확인할 수 있으며, 이렇게 삽입된 나선 코일(114)은 캐리어(120) 하단과 볼트 결합으로 체결될 수 있다.FIG. 4A is an enlarged view of the hole 113 formed in the frame layer 112. As shown in FIG. 4A, the frame layer 112 is coupled to the bottom of the carrier 120 of the CMP apparatus. One or more holes 113 into which a helical coil 114 is inserted may be formed at an upper end of the upper side. The spiral coil 114 is inserted into the tapping hole 113, and the inserted spiral coil 114 may be fastened to the bottom of the carrier 120 by bolt coupling.
도 4(b)는 프레임 층(112)의 홀(113)에 삽입되는 나선 코일(114)을 도시한 도면으로서, 도 4(b)에 도시된 바와 같이, 나선 코일(114)의 구조는 코일(coil), 삽입을 위한 탱(tang), 삽입 후 탱 제거를 위한 노치(notch)로 구성될 수 있다. 본 발명에서 이용되는 나선 코일(114)은 스테인레스 스틸 등 내구성이 강하며, 내산성, 내화학성에 강한 금속을 사용할 수 있다.4 (b) shows the spiral coil 114 inserted into the hole 113 of the frame layer 112. As shown in FIG. 4 (b), the structure of the spiral coil 114 is a coil. (coil), a tang for insertion, and a notch for removal of the tang after insertion. Spiral coil 114 used in the present invention is durable, such as stainless steel, it is possible to use a metal strong in acid resistance and chemical resistance.
도 4(c)는 프레임 층(112)의 홀(113)에 삽입된 나선 코일(114)의 단면을 도시한 도면이다. 도 4(c)에서 홀(113)에 삽입되지 않은 나선 코일(114) 부분에서 보이는 바와 같이, 삽입되기 전의 나선 코일(114)의 지름은, 홀(113)의 지름보다 더 큰 것을 확인할 수 있다.4C is a cross-sectional view of the spiral coil 114 inserted into the hole 113 of the frame layer 112. As shown in the spiral coil 114 portion not inserted into the hole 113 in FIG. 4C, the diameter of the spiral coil 114 before insertion may be greater than the diameter of the hole 113. .
나선 코일(114)을 홀(113)에 삽입하는 과정은, 나선 코일(114)의 탱에 토크를 가하여, 나선 코일(114) 첫 산의 지름을 작게 함으로써 삽입이 가능하고, 삽입 후, 높은 신장력을 지닌 각각의 코일의 산은 스프링처럼 바깥으로 팽창하여 제품을 영구적으로 고정시킬 수 있게 되는 것이다. 이와 같은 고정 방법으로 인하여, 나선 코일(114)에 체결된 볼트를 빼낼 때, 나선 코일(114) 자체가 홀(113)에서 빠지지 않게 할 수 있다.The process of inserting the spiral coil 114 into the hole 113 can be performed by applying a torque to the tang of the spiral coil 114 to reduce the diameter of the first peak of the spiral coil 114. Each coil's acid with the spring expands outwards like a spring, allowing the product to be permanently fixed. Due to this fixing method, when the bolt fastened to the spiral coil 114 is taken out, the spiral coil 114 itself may be prevented from falling out of the hole 113.
도 5는 본 발명의 일 실시예에 따른 합성수지 층의 상단에 형성된 돌기를 도시한 도면이다.5 is a view showing the projection formed on the top of the synthetic resin layer according to an embodiment of the present invention.
도 5 (a), (b)에 도시된 바와 같이, 합성수지 층(115)의 상단에는 하나 이상의 돌기(116)가 형성될 수 있다. 이는 돌기(116)로 인하여 합성수지 층(115)과 프레임 층(112)과의 접촉 면적이 넓어지게 되어, 프레임 층(112)과 합성수지 층(115)의 마찰력을 높이는 효과를 제공하게 되며, 최종적으로는 상호간의 고정력을 높이게 되는 효과가 있다.As shown in FIGS. 5A and 5B, one or more protrusions 116 may be formed on the top of the synthetic resin layer 115. This increases the contact area between the synthetic resin layer 115 and the frame layer 112 due to the projection 116, thereby providing an effect of increasing the friction between the frame layer 112 and the synthetic resin layer 115, and finally Has the effect of increasing the mutual holding power.
캐리어(120)와 함께 이동하는 리테이너 링(110)은, 캐리어(120)의 중심 축을 기준으로 하여 회전 이동, 좌우 이동(X, Y축 방향)을 하기도 하며, 웨이퍼(300)에 압력을 가하는 과정에서 상하 이동(Z축)도 하게 되는데, 여기서 합성수지 층(115)의 상단의 돌기(116)는, 리테이너 링(110)에 전달되는 X, Y, Z축 방향의 힘에 대하여, 프레임 층(112)과의 강한 결합력을 제공할 수 있게 한다는 점에 의의가 있다.The retainer ring 110 moving together with the carrier 120 may perform rotational movement and horizontal movement (X, Y-axis directions) based on the center axis of the carrier 120, and apply pressure to the wafer 300. In the vertical movement (Z-axis), where the protrusion 116 of the top of the synthetic resin layer 115, the frame layer 112 with respect to the X, Y, Z-axis force transmitted to the retainer ring 110 It is meaningful to provide strong bonding force with).
합성수지 층(115)에 형성된 돌기(116)의 형태는 도 5에 나타낸 형상일 수 있으나, 이에 한정되는 것은 아니고, 접촉 면적을 높이도록 하는 다양한 형태를 포함할 수 있음은 물론이다.The shape of the protrusion 116 formed on the synthetic resin layer 115 may be the shape shown in FIG. 5, but is not limited thereto and may include various shapes to increase the contact area.
예를 들어, 합성수지 층(115)의 상단을 이루는 구조가 도 5에 나타난 돌기 형상인 경우, 돌기의 배열 형태가 제한되지 않으며, 양측으로 뻗는 도 5의 돌기 형상이 아닌, 일측으로만 뻗는 돌기 형상일 수도 있다. 뿐만 아니라, 합성수지 층(115)의 상부에 결합되는 프레임 층(112)의 양측을 감싸는 구조로서, 합성수지 층(115)과 프레임 층(112)의 접촉 면적을 높이는 구조일 수도 있음은 물론이다.For example, when the structure forming the upper end of the synthetic resin layer 115 is a protrusion shape shown in FIG. 5, the arrangement of the protrusions is not limited, and the protrusion shape extending only to one side is not the protrusion shape of FIG. 5 extending to both sides. It may be. In addition, as a structure surrounding both sides of the frame layer 112 coupled to the upper portion of the synthetic resin layer 115, it may be a structure to increase the contact area of the synthetic resin layer 115 and the frame layer 112, of course.
도시하지는 않았지만, 합성수지 층(115)의 하단과 측면 중 적어도 하나에는 하나 이상의 홈이 형성될 수 있다. 이는 웨이퍼(300) 연마 과정에서 이용되는 슬러리 액이, 웨이퍼(300)를 리테이닝 하고 있는 리테이너 링(110)의 내부 공간에 고이는 것을 방지하기 위함이다. 홈 형태로서 합성수지 층(115)의 내부에 일정 깊이만큼 파여진 형태일 수 있으나, 실시예에 따라서는 내부에서 외부까지 관통하는 관통홀 형태일 수도 있다.Although not shown, one or more grooves may be formed in at least one of the bottom and side surfaces of the synthetic resin layer 115. This is to prevent the slurry liquid used in the wafer 300 polishing process from sticking to the inner space of the retainer ring 110 retaining the wafer 300. As a groove shape, the synthetic resin layer 115 may be dug into a predetermined depth, but in some embodiments, may be a through-hole penetrating from inside to outside.
도 6은 본 발명의 일 실시예에 따른 리테이너 링의 단면을 나타낸 도면이다.6 is a cross-sectional view of a retainer ring according to an embodiment of the present invention.
도 6에 나타난 바와 같이, 본 발명의 리테이너 링(110)은 일정 두께를 갖는 프레임 층(112), 합성수지 층(115), 및 프레임 층(112)과 합성수지 층(115)을 접합하는 프라이머 수지 층(118)을 포함할 수 있다.As shown in FIG. 6, the retainer ring 110 of the present invention has a frame layer 112 having a predetermined thickness, a resin layer 115, and a primer resin layer bonding the frame layer 112 and the resin layer 115 to each other. 118 may be included.
우선, 가장 상단에 위치하게 되는 프레임 층(112)은 열경화성 수지 층으로서, 에폭시 수지 및 경화제를 포함할 수 있다. 본 발명에서는 에폭시 수지를 단순한 접촉부재가 아닌, 리테이너 링(110)의 직접적인 구성으로서, 일정 두께를 갖는 링 부재로 상부에 배치되도록 구성된다는 점에서 특징이 있다.First, the topmost frame layer 112 is a thermosetting resin layer, and may include an epoxy resin and a curing agent. In the present invention, the epoxy resin is not a simple contact member, but is a direct configuration of the retainer ring 110, and is characterized in that it is configured to be disposed above the ring member having a predetermined thickness.
실시예에 따라서는, 프레임 층(112)은 4,4'-(1-methylethylidene) bisphenol polymer with (chloromethyl)oxirane (85%), (Butoxymethyl)oxirane (10%), 및 titanium dioxide (5%)의 열경화 수지와, 3-Aminomethyl-3,5,5-trimethylcyclo hexylamine (90%), α-(2-Aminomethylethyl)-ω-(2-aminomethylethoxy)poly [oxy(methyl-1,2-ethanediyl)] (10%)의 열경화 수지 경화제로 이루어질 수 있다. 프레임 층(112)의 열팽창 계수는 40~50ppm/k일 수 있으며, 바람직하게는 45ppm/k일 수 있다.According to an embodiment, the frame layer 112 comprises 4,4 '-(1-methylethylidene) bisphenol polymer with (chloromethyl) oxirane (85%), (Butoxymethyl) oxirane (10%), and titanium dioxide (5%). Thermosetting resin, 3-Aminomethyl-3,5,5-trimethylcyclo hexylamine (90%), α- (2-Aminomethylethyl) -ω- (2-aminomethylethoxy) poly [oxy (methyl-1,2-ethanediyl) ] (10%) of the thermosetting resin curing agent. The coefficient of thermal expansion of the frame layer 112 may be 40 ~ 50ppm / k, preferably 45ppm / k.
합성수지 층(115)은 폴리에테르에트레케톤(PEEK), 폴리에틸렌(POM), 폴리페닐설파이드(PPS), 폴리벤지미다졸(PBI), 폴리에테르이미드(PEI), 폴리부틸렌테레프탈레이트(PBT), 폴리에틸린테레프탈레이트(PET), 폴리이미드(PI), 및 폴리아미드이미드(PAI) 중 적어도 하나를 포함할 수도 있다.The synthetic resin layer 115 is made of polyether ether ketone (PEEK), polyethylene (POM), polyphenylsulfide (PPS), polybenzimidazole (PBI), polyetherimide (PEI), polybutylene terephthalate (PBT) And at least one of polyethylenterephthalate (PET), polyimide (PI), and polyamideimide (PAI).
물론 상기 나열된 수지에 한정되는 것은 아니며, 폴리카보네이트(PC), 아세탈, 내열도와 내마모성, 내산성, 내화학성이 우수한 엔지니어링 플라스틱 수지 등을 포함할 수 있다. 이러한 합성수지 층(115)의 열팽창 계수는 50~60 ppm/k 일 수 있으며, 바람직하게는 55ppm/k일 수 있다.Of course, it is not limited to the resins listed above, and may include polycarbonate (PC), acetal, engineering plastic resin having excellent heat resistance and abrasion resistance, acid resistance, chemical resistance, and the like. The coefficient of thermal expansion of the synthetic resin layer 115 may be 50 ~ 60 ppm / k, preferably 55 ppm / k.
프라이머 수지 층(118)은 프레임 층(112)과 합성수지 층(115)을 접합시키는 역할을 하며, 프라이머 수지 층(118)은 열경화성 수지와 물리적 결합을 용이하게 하기 위하여 페놀 포름알데히드(phenol-formaldehyde)계 프라이머일 수 있고, 실시예에 따라서는, (phenol-formaldehyde polymer glycidyl ether (30%), Toluene (45%), Methyl ethyl ketone (20%), 및 Ethyl acetate (5%)으로 구성될 수 있다.The primer resin layer 118 serves to bond the frame layer 112 and the synthetic resin layer 115, and the primer resin layer 118 is a phenol-formaldehyde to facilitate physical bonding with the thermosetting resin. And may be composed of (phenol-formaldehyde polymer glycidyl ether (30%), toluene (45%), Methyl ethyl ketone (20%), and Ethyl acetate (5%), depending on the embodiment. .
또한, 프라이머 수지 층(118)은 (C=18)-unsaturated dimers polymers with ethylenediamine and meta-xylenediamine (45%), Salicylic acid (5%), Toluene (45%), 및 Ethyl acetate (5%)로 이루어지는 프라이머 수지 경화제를 더 포함할 수 있다. 프라이머 수지 층(118)의 열팽창 계수는 35~45ppm/k일 수 있으며, 바람직하게는 40ppm/k일 수 있다.In addition, the primer resin layer 118 is (C = 18) -unsaturated dimers polymers with ethylenediamine and meta-xylenediamine (45%), Salicylic acid (5%), Toluene (45%), and Ethyl acetate (5%). It may further include a primer resin curing agent made. The coefficient of thermal expansion of the primer resin layer 118 may be 35 ~ 45ppm / k, preferably 40ppm / k.
도 7은 열경화성 수지 층과 폴리에테르에트레케톤(PEEK) 수지 층 간의 접합부 단면을 나타낸 사진이다.FIG. 7 is a photograph showing a cross section of a junction between a thermosetting resin layer and a polyether ether ketone (PEEK) resin layer. FIG.
본 발명의 합성수지 층(115)에서 이용되는 폴리에테르에트레케톤(PEEK)은 내열도, 내마모성, 내화학, 내산성이 우수한 엔지리어링 플라스틱이지만, 일반적으로 열경화성 수지와의 접촉력이 약하여, 각 층간 결합이 어렵다는 문제가 있어 왔다.Polyether ether ketone (PEEK) used in the synthetic resin layer 115 of the present invention is an annealed plastic having excellent heat resistance, abrasion resistance, chemical resistance, and acid resistance, but generally has a weak contact force with a thermosetting resin, thereby bonding between the layers. This has been a difficult problem.
도 7(a)는 프라이머가 처리되지 않은, 기존의 열경화성 수지와 폴리에테르에트레케톤(PEEK) 층간의 접합부 모습으로, 접합되는 단면에서 들뜸 현상이 발생한 것을 확인할 수 있으며, 이로부터 층간 결합력이 약한 것을 확인할 수 있다.Figure 7 (a) is not the primer, the conventional thermosetting resin and polyether ether keketone (PEEK) is the appearance of the junction between the layers, it can be seen that the lifting phenomenon occurs in the cross-section to be bonded, from which the interlayer bond strength is weak You can see that.
도 7(b)는 본 발명에서의 프라이머 처리를 한 경우로서, 각 층간의 접합부의 모습이다. 이로부터, 열경화성 수지, 폴리에테르에트레케톤(PEEK) 모두와 접촉력이 우수한 프라이머 수지를 이용한 본 발명의 경우, 각 층의 접착부에 들뜸 현상 없이, 결합력을 높인 것을 확인할 수 있다.Fig. 7 (b) shows the case where the primer treatment in the present invention is performed, and the junction between each layer is shown. From this, in the case of the present invention using a primer resin having excellent contact force with both the thermosetting resin and polyether ether ketone (PEEK), it can be confirmed that the bonding force is increased without lifting phenomenon in the adhesive portion of each layer.
실시예에 따라서는 프라이머 수지 층(118)은, 합성수지 층(115)의 상단면에 스프레이 방식으로 도포될 수 있다.In some embodiments, the primer resin layer 118 may be applied to the top surface of the synthetic resin layer 115 by a spray method.
도 8는 본 발명의 일 실시예에 따른 리테이너 링을 제조하는 방법의 흐름도를 도시한 도면이다.8 is a flowchart illustrating a method of manufacturing a retainer ring according to an embodiment of the present invention.
도 8에 도시된 바와 같이, 실시예에 따른 리테이너 링을 제조하는 방법은, 리테이너 링을 제조하는 방법에 있어서, 원형 고리 형태의 합성수지 층을 형성하는 단계(S100), 합성수지 층의 상단에 프라이머 처리를 하여, 프라이머 수지 층을 형성하는 단계(S200), 리테이너 링 몰딩 틀에 프라이머 처리된 합성수지 층을 삽입한 후, 몰딩 틀에 열경화 수지를 채우고 열경화 수지를 경화시켜 프레임 층을 형성하는 단계(S300), 및 몰딩 틀로부터 적층되어 결합된 합성수지 층, 프라이머 수지 층, 및 프레임 층을 취출하는 단계(S400)를 포함할 수 있다.As shown in Figure 8, the method for manufacturing a retainer ring according to the embodiment, in the method for manufacturing a retainer ring, forming a synthetic ring layer of a circular ring (S100), the primer treatment on top of the synthetic resin layer By forming a primer resin layer (S200), inserting the primer-treated synthetic resin layer into the retainer ring molding mold, filling the thermosetting resin in the molding mold and curing the thermosetting resin to form a frame layer ( S300), and the step of taking out the synthetic resin layer, the primer resin layer, and the frame layer laminated and bonded from the molding mold (S400).
본 발명에서의 합성수지 층은 사출 제품의 원형 고리 형태뿐만 아니라, 분할된 원형 고리 형태로도 형성할 수 있으며, 합성수지 층은 금형 구조에 의한 사출물 또는 압연된 관(Tube), 판(Plate) 등을 기계 가공하여 제조될 수도 있다.In the present invention, the synthetic resin layer may be formed not only in the form of a circular ring of an injection molded product, but also in the form of a divided circular ring, and the synthetic resin layer may be formed of an injection molded product or a rolled tube, a plate, or the like by a mold structure. It may also be manufactured by machining.
상기의 취출하는 단계(S400) 이후, 리테이너 링을 사용 규격으로 외관을 기계 가공할 수 있으며, 실시예에 따라서는, 캐리어와 리테이너 링의 결합을 위하여, 프레임 층의 상단과 CMP 장치의 캐리어의 하단을 결합시키는 단계를 더 포함할 수 있다.After the take-out step (S400), the retainer ring can be machined to the use standard, in accordance with an embodiment, for coupling the carrier and the retainer ring, the top of the frame layer and the bottom of the carrier of the CMP apparatus It may further comprise the step of combining.
캐리어의 하단과 리테이너 링의 결합을 위하여, 리테이너 링의 상부에 배치된 프레임 층에는, 하나 이상의 홀이 형성될 수 있으며 홀을 통하여 캐리어와 볼트 결합이 이루어질 수 있다.In order to engage the lower end of the carrier and the retainer ring, one or more holes may be formed in the frame layer disposed on the retainer ring, and bolts may be formed with the carrier through the holes.
도 9는 본 발명의 일 실시예에 따른 리테이너 링을 제조하는 방법을 설명하기 위하여 도시한 도면이다.9 is a view illustrating a method of manufacturing a retainer ring according to an embodiment of the present invention.
구체적으로, 도 9는 인서트 볼트 몰딩 방식을 이용한 리테이너 링의 제조 방법이다. 도 9를 통하여, 합성수지 층(115)의 상단에 볼트 고정부(117)를 형성하고, 형성된 볼트 고정부(117)에 볼트 하단을 고정시키는 단계(도 9(a)), 고정된 볼트의 내부에 수지 볼트를 삽입하는 단계(도 9(b)), 수지 볼트가 삽입되어 있는 상태에서, 합성수지 층(115)의 상단면에 프라이머 수지 층(118), 프레임 층(112)을 형성하는 단계(도 9(c))를 확인할 수 있다. 이 경우, 수지 볼트가 삽입되어 있는 공간은 프레임 층(112)에서 홀(113)이 되는 것이다.Specifically, Figure 9 is a method of manufacturing a retainer ring using an insert bolt molding method. 9, the bolt fixing part 117 is formed on the upper end of the synthetic resin layer 115, and fixing the lower end of the bolt to the formed bolt fixing part 117 (FIG. 9 (a)). Inserting a resin bolt into the resin bolt (Fig. 9 (b)), in a state in which the resin bolt is inserted, forming a primer resin layer 118, the frame layer 112 on the top surface of the synthetic resin layer 115 ( 9 (c) can be seen. In this case, the space in which the resin bolt is inserted is the hole 113 in the frame layer 112.
즉, 그 다음 단계로, 수지 볼트를 제거하여, 프레임 층(112)에 인서트 볼트만이 몰딩된 상태의 홀(113)을 형성하는 단계가 포함될 수 있으며, 그 결과 도 9(d)에서와 같이 홀(113)은 하나 이상이 형성될 수 있다. 이렇게 형성된 인서트 볼트 몰딩(Insert Bolt Molding) 방식으로 볼트가 삽입된 홀(113)에, 결합 가능한 볼트를 이용하여, CMP 장치의 캐리어(120)의 하단과 리테이너 링의 상단을 결합시킬 수 있다.That is, the next step may include removing the resin bolts to form the holes 113 in the frame layer 112 in which only the insert bolts are molded, and as a result, as shown in FIG. 9 (d). One or more holes 113 may be formed. The lower end of the carrier 120 of the CMP apparatus and the upper end of the retainer ring may be coupled to the hole 113 into which the bolt is inserted in the insert bolt molding method formed as described above using a bolt that can be coupled.
도 9에서 설명한, 합성수지 층에 볼트 고정부를 형성하는 방식과 달리, 다른 실시예에 따라서는, 프레임 층의 홀 자체에 나선 코일을 삽입함으로써, 캐리어와 리테이너 링을 볼트 결합시키는 방식을 이용할 수 있다.Unlike the method of forming the bolt fixing part in the synthetic resin layer described with reference to FIG. 9, according to another embodiment, a method of bolting the carrier and the retainer ring by inserting a spiral coil into the hole itself of the frame layer may be used. .
구체적으로는, 몰딩 틀로부터 취출된 프레임 층의 상단에 홀을 형성하는 단계, 홀 내부 주변을 탭핑하는 단계, 및 탭핑한 홀에 나선 코일을 삽입하는 단계를 더 포함하여, 나선 코일이 삽입된 홀에 볼트 체결 방식을 이용하여, 프레임 층의 상단과 CMP 장치의 캐리어의 하단을 결합시키는 단계를 더 포함할 수 있다.Specifically, the method may further include forming a hole in an upper portion of the frame layer taken out from the molding mold, tapping around the inside of the hole, and inserting a spiral coil into the tapped hole. The bolt fastening method may further include coupling the upper end of the frame layer and the lower end of the carrier of the CMP device.
또한, 합성수지 층을 형성하는 단계 이후에, 프레임 층과 접촉하게 되는 합성수지 층의 상단에 하나 이상의 돌기를 형성시키는 단계를 더 포함할 수 있다. 이는 하나 이상의 돌기를 형성함으로써, 합성수지 층과 프레임 층과의 접촉 면적을 넓어지게 하여, 프레임 층과 합성수지 층 간의 고정력을 높이기 위함이다.In addition, after forming the synthetic resin layer, the method may further include forming one or more protrusions on top of the synthetic resin layer which is in contact with the frame layer. This is to increase the fixing force between the frame layer and the synthetic resin layer by widening the contact area between the synthetic resin layer and the frame layer by forming one or more protrusions.
실시예에 따라서는, 합성수지 층의 하단과 측면 중 적어도 하나에는 하나 이상의 홈을 형성할 수 있으며, 하나 이상의 관통홀을 형성할 수도 있다. 이는 웨이퍼 연마 과정에서 이용되는 슬러리 액이 웨이퍼를 리테이닝 하고 있는 리테이너 링의 내부 공간에 고이는 것을 방지하기 위함이다.In some embodiments, one or more grooves may be formed in at least one of the bottom and side surfaces of the synthetic resin layer, and one or more through holes may be formed. This is to prevent the slurry liquid used in the wafer polishing process from accumulating in the inner space of the retainer ring retaining the wafer.
실시예에 따른 열경화성 수지는, 에폭시 수지에 실리카(SiO2)를 10phr 첨가한 후, 고속 교반기를 이용하여 분산시키는 단계, 분산된 에폭시 수지에, 경화제를 첨가하여 혼합 비율 50phr ~ 100phr로 혼합시켜 용액을 생성하는 단계, 및 혼합된 용액에, 페이스트 믹서(Paste Mixer)를 이용하여, 100~10-2 torr 수준의 진공도로 탈포하여 몰딩액을 완성하는 단계를 통하여 생성된 몰딩액일 수 있다.In the thermosetting resin according to the embodiment, 10 phr of silica (SiO 2 ) is added to the epoxy resin, followed by dispersing using a high speed stirrer. It may be a molding liquid produced by the step of, and in the mixed solution, by using a paste mixer, degassing at a vacuum level of 10 0 ~ 10 -2 torr to complete the molding liquid.
이와 같은 몰딩액을, 프라이머 처리된 합성수지 층이 삽입되어 있는, 몰딩 틀에 진공 주입기로 이송하여, 진공 상태에서 몰딩한 후, 약 100℃에서 30분간 경화시키면, 열경화 수지, 즉 몰딩액이 경화되면서 상부에 위치하게 되는 프레임 층이 형성되는 것이다.Such a molding liquid is transferred to a molding mold into which a primer-treated synthetic resin layer is inserted, by a vacuum injector, molded in a vacuum state, and cured at about 100 ° C. for 30 minutes, whereby the thermosetting resin, that is, the molding liquid is cured. As the frame layer is located at the top is formed.
본 발명의 실시예에 따른, 진공 몰딩 공법을 이용하여 주입되는 열경화 수지는 기존에 이용되는 인서트 사출 공법에 비하여 아래 <표 1>에 나타낸 바와 같은 장점이 있다.According to an embodiment of the present invention, the thermosetting resin injected using the vacuum molding method has an advantage as shown in Table 1 below compared to the insert injection method used in the prior art.
각각의 단계들과 관련된 상세한 내용들은, 앞서 본 발명의 일실시예에 따른 리테이너 링(110)와 관련하여 충분히 설명되었으므로, 상세한 설명은 생략하기로 한다.Details related to each of the steps have been described above with reference to the retainer ring 110 according to an embodiment of the present invention, and thus the detailed description thereof will be omitted.
또한, 본 발명이 일 실시예에 따른 리테이너 링을 포함하는 CMP 장치(10)는, 도 2에 도시된 바와 같이 열경화 수지를 포함하는 프레임 층(112), 프레임 층(112)의 하단에 배치되는 합성수지 층(115), 및 합성수지 층(115)과 프레임 층(112) 사이에 배치되어 합성수지 층(115)과 프레임 층(112)을 접합시키는 프라이머 수지 층(118)을 구비하는 리테이너 링(110)을 포함하며, 리테이너 링(110)의 상단에 결합되는 캐리어(120), 및 리테이너 링(110)의 하단과 접촉되며, 상단에 웨이퍼(300)가 배치되는 연마 패드(200)를 포함한다.In addition, the CMP apparatus 10 including the retainer ring according to the embodiment of the present invention is disposed at the bottom of the frame layer 112 and the frame layer 112 including the thermosetting resin as shown in FIG. 2. Retainer ring 110 having a synthetic resin layer 115, and a primer resin layer 118 disposed between the synthetic resin layer 115 and the frame layer 112 to bond the synthetic resin layer 115 and the frame layer 112. ), A carrier 120 coupled to the top of the retainer ring 110, and a polishing pad 200 contacting the bottom of the retainer ring 110 and having the wafer 300 disposed on the top thereof.
상술한 바와 같이, 본 발명의 일실시예에 따른 리테이너 링은 기존의 CMP 리테이너 링에 포함된 구성으로서 작업 공정 효율을 떨어뜨리거나 비용을 증가시키는 요소를 제거하고, 하부 합성수지 층, 몰딩 처리된 상부 프레임 층을 포함하며, 프레임 층과 합성수지 층을 프라이머 처리 기법을 통하여 용이하게 접합시킴으로써, 기존 대비 원가 절감 효과 및 작업 공정 개선 효과가 있다.As described above, the retainer ring according to an embodiment of the present invention is a component included in the existing CMP retainer ring to remove the elements that reduce the work process efficiency or increase the cost, and the lower resin layer, the molded upper part Including a frame layer, by easily bonding the frame layer and the synthetic resin layer through a primer treatment, there is a cost reduction effect and work process improvement compared to the existing.
이상에서 본 발명의 바람직한 실시예에 대하여 상세하게 설명하였지만 본 발명의 권리범위는 이에 한정되는 것은 아니고 다음의 청구범위에서 정의하고 있는 본 발명의 기본 개념을 이용한 당업자의 여러 변형 및 개량 형태 또한 본 발명의 권리범위에 속하는 것이다.Although the preferred embodiments of the present invention have been described in detail above, the scope of the present invention is not limited thereto, and various modifications and improvements of those skilled in the art using the basic concepts of the present invention defined in the following claims are also provided. It belongs to the scope of rights.
[부호의 설명][Description of the code]
10: CMP 장치10: CMP device
100: 연마 헤드100: polishing head
110: 리테이너 링110: retainer ring
112: 프레임 층112: frame layer
113: 홀113: hall
114: 나선 코일114: spiral coil
115: 합성수지 층115: resin layer
116: 돌기116: turning
117: 볼트 고정부117: bolt fixing
118: 프라이머 수지 층118: primer resin layer
120: 캐리어120: carrier
200: 연마 패드200: polishing pad
300: 웨이퍼300: wafer
Claims (24)
- CMP 장치에 이용되는 리테이너 링에 있어서,In the retainer ring used for the CMP apparatus,상기 CMP 장치의 캐리어의 하단에 결합되며, 열경화 수지를 포함하는 프레임 층;A frame layer bonded to a lower end of a carrier of the CMP apparatus and comprising a thermosetting resin;상기 프레임 층의 하단에 배치되며, 하부가 연마 패드와 접촉되며 웨이퍼를 리테이닝 하는 합성수지 층; 및A synthetic resin layer disposed at a lower end of the frame layer and having a lower portion in contact with a polishing pad and retaining a wafer; And상기 합성수지 층과 상기 프레임 층 사이에 배치되어 상기 합성수지 층과 상기 프레임 층을 접합시키는 프라이머 수지 층을 포함하는 리테이너 링.And a primer resin layer disposed between the synthetic resin layer and the frame layer to bond the synthetic resin layer and the frame layer.
- 제1항에 있어서,The method of claim 1,상기 프레임 층에는 상기 캐리어의 하단과 볼트 결합을 위한 하나 이상의 홀이 형성된 리테이너 링.And a retainer ring in the frame layer having one or more holes for bolting to the bottom of the carrier.
- 제2항에 있어서,The method of claim 2,상기 하나 이상의 홀에는 인서트 볼트 몰딩(Insert Bolt Molding) 방식으로 볼트가 삽입되는 리테이너 링.Retainer ring is inserted into the one or more holes in the insert bolt molding method (Insert Bolt Molding).
- 제3항에 있어서,The method of claim 3,상기 합성수지 층의 상단에는, 인서트 볼트의 하단을 고정시키기 위하여 둘 이상의 돌출부를 포함하는 형태인 볼트 고정부가 형성된 리테이너 링.Retainer ring formed on the top of the synthetic resin layer, the bolt fixing portion is formed to include a two or more protrusions for fixing the bottom of the insert bolt.
- 제2항에 있어서,The method of claim 2,상기 하나 이상의 홀에는 나선 코일(helical coil)이 삽입되는 리테이너 링.A retainer ring into which the helical coil is inserted into the one or more holes.
- 제1항에 있어서,The method of claim 1,상기 합성수지 층의 상단에는 하나 이상의 돌기가 형성된 리테이너 링.A retainer ring having one or more protrusions formed on top of the synthetic resin layer.
- 제1항에 있어서,The method of claim 1,상기 합성수지 층의 하단과 측면 중 적어도 하나에는 하나 이상의 홈이 형성된 리테이너 링.Retainer ring formed with at least one groove on at least one of the bottom and side of the synthetic resin layer.
- 제1항에 있어서,The method of claim 1,상기 합성수지 층의 하단과 측면 중 적어도 하나에는 하나 이상의 관통홀이 형성된 리테이너 링.Retainer ring formed with at least one through hole in at least one of the bottom and side of the synthetic resin layer.
- 제1항에 있어서,The method of claim 1,상기 프레임 층은 열경화성 수지 층으로서 에폭시 수지 및 경화제를 포함하는 리테이너 링.And the frame layer is a thermosetting resin layer comprising an epoxy resin and a curing agent.
- 제1항에 있어서,The method of claim 1,상기 프레임 층은 4,4'-(1-methylethylidene) bisphenol polymer with (chloromethyl)oxirane (85%), (Butoxymethyl)oxirane (10%), 및 titanium dioxide (5%)의 열경화 수지와, 3-Aminomethyl-3,5,5-trimethylcyclo hexylamine (90%), α-(2-Aminomethylethyl)-ω-(2-aminomethylethoxy)poly [oxy(methyl-1,2-ethanediyl)] (10%)의 열경화 수지 경화제로 이루어지는 리테이너 링.The frame layer is a thermosetting resin of 4,4 '-(1-methylethylidene) bisphenol polymer with (chloromethyl) oxirane (85%), (Butoxymethyl) oxirane (10%), and titanium dioxide (5%), 3- Thermal curing of aminomethyl-3,5,5-trimethylcyclo hexylamine (90%), α- (2-Aminomethylethyl) -ω- (2-aminomethylethoxy) poly [oxy (methyl-1,2-ethanediyl)] (10%) A retainer ring made of a resin hardener.
- 제1항에 있어서,The method of claim 1,상기 프레임 층의 열팽창 계수는 40~50ppm/k인 리테이너 링.And a coefficient of thermal expansion of said frame layer is 40-50 ppm / k.
- 제1항에 있어서,The method of claim 1,상기 합성수지 층은 폴리에테르에트레케톤(PEEK), 폴리에틸렌(POM), 폴리페닐설파이드(PPS), 폴리벤지미다졸(PBI), 폴리에테르이미드(PEI), 폴리부틸렌테레프탈레이트(PBT), 폴리에틸린테레프탈레이트(PET), 폴리이미드(PI), 및 폴리아미드이미드(PAI) 중 적어도 하나인 리테이너 링.The synthetic resin layer is polyether ether ketone (PEEK), polyethylene (POM), polyphenylsulfide (PPS), polybenzimidazole (PBI), polyetherimide (PEI), polybutylene terephthalate (PBT), poly A retainer ring that is at least one of ethylenterephthalate (PET), polyimide (PI), and polyamideimide (PAI).
- 제1항에 있어서,The method of claim 1,상기 합성수지 층의 열팽창 계수는 50~60ppm/k인 리테이너 링.Retaining ring of the expansion coefficient of the synthetic resin layer is 50 ~ 60ppm / k.
- 제1항에 있어서,The method of claim 1,상기 프라이머 수지 층은 phenol-formaldehyde polymer glycidyl ether (30%), Toluene (45%), Methyl ethyl ketone (20%), 및 Ethyl acetate (5%)로 이루어지는 리테이너 링.The primer resin layer is a retainer ring consisting of phenol-formaldehyde polymer glycidyl ether (30%), Toluene (45%), Methyl ethyl ketone (20%), and Ethyl acetate (5%).
- 제1항에 있어서,The method of claim 1,상기 프라이머 수지 층은 (C=18)-unsaturated dimers polymers with ethylenediamine and meta-xylenediamine (45%), Salicylic acid (5%), Toluene (45%), 및 Ethyl acetate (5%)로 이루어지는 프라이머 수지 경화제를 더 포함하는 리테이너 링.The primer resin layer is composed of (C = 18) -unsaturated dimers polymers with ethylenediamine and meta-xylenediamine (45%), Salicylic acid (5%), Toluene (45%), and Ethyl acetate (5%) Retainer ring further comprising.
- 제1항에 있어서,The method of claim 1,상기 프라이머 수지 층의 열팽창 계수는 35~45ppm/k인 리테이너 링.Retaining ring of the thermal expansion coefficient of the primer resin layer is 35 ~ 45ppm / k.
- 리테이너 링을 제조하는 방법에 있어서,In the method of manufacturing the retainer ring,원형 고리 형태의 합성수지 층을 형성하는 단계;Forming a synthetic resin layer in the form of a circular ring;상기 합성수지 층의 상단에 프라이머 처리를 하여, 프라이머 수지 층을 형성하는 단계;Primer-processing the top of the synthetic resin layer to form a primer resin layer;리테이너 링 몰딩 틀에 상기 프라이머 처리된 상기 합성수지 층을 삽입한 후, 상기 몰딩 틀에 열경화 수지를 채우고 상기 열경화 수지를 경화시켜 프레임 층을 형성하는 단계; 및Inserting the primer-treated synthetic resin layer into a retainer ring molding mold, filling the molding mold with a thermosetting resin and curing the thermosetting resin to form a frame layer; And상기 몰딩 틀로부터 적층되어 결합된 상기 합성수지 층, 상기 프라이머 수지 층, 및 상기 프레임 층을 취출하는 단계를 포함하는 리테이너 링을 제조하는 방법.Extracting the synthetic resin layer, the primer resin layer, and the frame layer laminated and bonded from the molding mold.
- 제17항에 있어서,The method of claim 17,상기 열경화성 수지는,The thermosetting resin,에폭시 수지에 실리카(SiO2)를 10phr 첨가한 후, 고속 교반기를 이용하여 분산시키는 단계;Adding 10 phr of silica (SiO 2 ) to the epoxy resin, followed by dispersing with a high speed stirrer;상기 분산된 에폭시 수지에, 경화제를 첨가하여 혼합 비율 50phr ~ 100phr로 혼합시켜 용액을 생성하는 단계; 및Adding a curing agent to the dispersed epoxy resin and mixing the mixture at a mixing ratio of 50 phr to 100 phr to generate a solution; And상기 혼합된 용액에, 페이스트 믹서(Paste Mixer)를 이용하여, 100~10-2 torr 수준의 진공도로 탈포하여 몰딩액을 완성하는 단계를 통하여 생성된 상기 몰딩액인 리테이너 링을 제조하는 방법.Method for producing a retainer ring in the mixed solution, the molding solution produced by the step of defoaming to a vacuum level of 10 0 ~ 10 -2 torr using a paste mixer to complete the molding solution.
- 제17항에 있어서,The method of claim 17,상기 합성수지 층의 상단에 볼트 고정부를 형성하는 단계;Forming a bolt fixing part on an upper end of the synthetic resin layer;상기 볼트 고정부에 볼트 하단을 고정시키는 단계;Fixing a bolt bottom to the bolt fixing part;상기 고정된 볼트의 내부에 수지 볼트를 삽입한 상태에서, 상기 합성수지 층의 상단면에 프라이머 수지 층, 프레임 층을 형성하는 단계;Forming a primer resin layer and a frame layer on an upper surface of the synthetic resin layer while the resin bolt is inserted into the fixed bolt;상기 수지 볼트를 제거하여 상기 프레임 층에 홀을 형성하는 단계; 및Removing the resin bolts to form holes in the frame layer; And상기 홀에 결합되는 볼트를 이용하여, 상기 프레임 층의 상단과 상기 CMP 장치의 캐리어의 하단을 결합시키는 단계를 더 포함하는 리테이너 링을 제조하는 방법.Coupling a top of the frame layer and a bottom of a carrier of the CMP device using bolts coupled to the holes.
- 제17항에 있어서,The method of claim 17,상기 프레임 층의 상단에 홀을 형성하는 단계;Forming a hole in the top of the frame layer;상기 홀 내부 주변을 탭핑(taping)하는 단계;Tapping around the inside of the hole;상기 탭핑한 홀에 나선 코일(helical coil)을 삽입하는 단계; 및Inserting a helical coil into the tapped hole; And상기 나선 코일이 삽입된 홀에, 볼트 체결 방식을 이용하여, 상기 프레임 층의 상단과 상기 CMP 장치의 캐리어의 하단을 결합시키는 단계를 더 포함하는 리테이너 링을 제조하는 방법.Coupling the upper end of the frame layer and the lower end of the carrier of the CMP device to the hole into which the spiral coil is inserted, using a bolt fastening method.
- 제17항에 있어서,The method of claim 17,상기 합성수지 층을 형성하는 단계 이후에, 상기 프레임 층과 접촉하게 되는 상기 합성수지 층의 상단에 하나 이상의 돌기를 형성시키는 단계를 더 포함하여, 상기 프레임 층과 상기 합성수지 층의 고정력을 높인 리테이너 링을 제조하는 방법.After forming the synthetic resin layer, further comprising the step of forming one or more projections on top of the synthetic resin layer in contact with the frame layer, to produce a retainer ring to increase the fixing force of the frame layer and the synthetic resin layer How to.
- 제17항에 있어서,The method of claim 17,상기 합성수지 층의 하단과 측면 중 적어도 하나에는 하나 이상의 홈이 형성된 리테이너 링을 제조하는 방법.At least one of the lower and side surfaces of the synthetic resin layer, wherein the at least one groove is formed.
- 제17항에 있어서,The method of claim 17,상기 합성수지 층의 하단과 측면 중 적어도 하나에는 하나 이상의 관통홀이 형성된 리테이너 링을 제조하는 방법.At least one of the bottom and side surfaces of the synthetic resin layer to produce a retainer ring having at least one through hole.
- CMP 장치에 있어서,In a CMP apparatus,리테이너 링;Retainer rings;상기 리테이너 링의 상단에 결합되는 캐리어; 및A carrier coupled to the top of the retainer ring; And상기 리테이너 링의 하단과 접촉되며, 상단에 웨이퍼가 배치되는 연마 패드를 포함하며,A polishing pad in contact with a lower end of the retainer ring and having a wafer disposed thereon;상기 리테이너 링은,The retainer ring,열경화 수지를 포함하는 프레임 층, 상기 프레임 층의 하단에 배치되며, 하부가 연마 패드와 접촉되며 웨이퍼를 리테이닝 하는 합성수지 층, 및 상기 합성수지 층과 상기 프레임 층 사이에 배치되어 상기 합성수지 층과 상기 프레임 층을 접합시키는 프라이머 수지 층을 포함하는 CMP 장치.A frame layer including a thermosetting resin, a bottom layer of the frame layer, a bottom layer of which is in contact with a polishing pad, and a resin layer for retaining a wafer, and disposed between the resin layer and the frame layer and the synthetic resin layer and the CMP device comprising a primer resin layer for bonding the frame layer.
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US20230129597A1 (en) * | 2021-10-27 | 2023-04-27 | Sch Power Tech Co., Ltd. | Retaining Ring for Wafer Polishing |
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KR102510720B1 (en) * | 2021-05-04 | 2023-03-16 | 피코맥스(주) | Retainer ring used in chemical mechanical polishing apparatus |
KR102670395B1 (en) * | 2021-10-25 | 2024-05-29 | 주식회사 에스엠티 | High-strength retainer ring for chemical-mechanical polishing machine and manufacturing method thereof |
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JP2011224731A (en) * | 2010-04-20 | 2011-11-10 | Ntn Corp | Retainer ring and method of manufacturing retainer ring |
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US6585850B1 (en) * | 1999-10-29 | 2003-07-01 | Applied Materials Inc. | Retaining ring with a three-layer structure |
WO2005092010A2 (en) * | 2004-03-19 | 2005-10-06 | Saint-Gobain Performance Plastics Corporation | Chemical mechanical polishing retaining ring |
KR20080067563A (en) * | 2007-01-16 | 2008-07-21 | 가부시키가이샤 토쿄 세이미쯔 | Retainer ring for polishing head |
KR101224539B1 (en) * | 2011-09-30 | 2013-01-21 | 한상효 | Retainer ring for polishing wafer |
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US20230129597A1 (en) * | 2021-10-27 | 2023-04-27 | Sch Power Tech Co., Ltd. | Retaining Ring for Wafer Polishing |
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