WO2019220711A1 - Cleaning agent, cleaning agent production method, and target object processing method - Google Patents

Cleaning agent, cleaning agent production method, and target object processing method Download PDF

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Publication number
WO2019220711A1
WO2019220711A1 PCT/JP2019/004969 JP2019004969W WO2019220711A1 WO 2019220711 A1 WO2019220711 A1 WO 2019220711A1 JP 2019004969 W JP2019004969 W JP 2019004969W WO 2019220711 A1 WO2019220711 A1 WO 2019220711A1
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Prior art keywords
cleaning agent
mass
temporary fixing
support
fixing material
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PCT/JP2019/004969
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French (fr)
Japanese (ja)
Inventor
洋平 大石
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Jsr株式会社
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Publication of WO2019220711A1 publication Critical patent/WO2019220711A1/en

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    • BPERFORMING OPERATIONS; TRANSPORTING
    • B08CLEANING
    • B08BCLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
    • B08B3/00Cleaning by methods involving the use or presence of liquid or steam
    • B08B3/04Cleaning involving contact with liquid
    • B08B3/08Cleaning involving contact with liquid the liquid having chemical or dissolving effect
    • CCHEMISTRY; METALLURGY
    • C11ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
    • C11DDETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
    • C11D1/00Detergent compositions based essentially on surface-active compounds; Use of these compounds as a detergent
    • C11D1/38Cationic compounds
    • C11D1/62Quaternary ammonium compounds
    • CCHEMISTRY; METALLURGY
    • C11ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
    • C11DDETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
    • C11D1/00Detergent compositions based essentially on surface-active compounds; Use of these compounds as a detergent
    • C11D1/66Non-ionic compounds
    • C11D1/72Ethers of polyoxyalkylene glycols
    • CCHEMISTRY; METALLURGY
    • C11ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
    • C11DDETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
    • C11D7/00Compositions of detergents based essentially on non-surface-active compounds
    • C11D7/50Solvents
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/302Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
    • H01L21/304Mechanical treatment, e.g. grinding, polishing, cutting

Definitions

  • the present invention relates to a cleaning agent, a manufacturing method of the cleaning agent, and a processing method of an object.
  • a method has been proposed in which an object such as a semiconductor wafer is bonded to a support such as a glass substrate via a temporary fixing material, and processing such as back grinding and photofabrication is performed on the object.
  • the temporary fixing material needs to be able to temporarily fix the object on the support during the processing, and to easily separate the support and the object after the processing.
  • the present invention provides a cleaning agent capable of satisfactorily removing a residue in a semiconductor manufacturing process such as removal of a residue of a temporary fixing material, and also provides a method for manufacturing the cleaning agent, and temporary fixing.
  • a cleaning agent capable of satisfactorily removing a residue in a semiconductor manufacturing process such as removal of a residue of a temporary fixing material
  • a method for manufacturing the cleaning agent, and temporary fixing In a method of processing and moving an object in a state where the object to be treated is temporarily fixed on the support using a material, and subsequently separating the support from the object, the residue of the temporarily fixed material on the object It is an object of the present invention to provide a method for processing an object with a small amount.
  • the present inventors have intensively studied to solve the above problems. As a result, the present inventors have found that the above problems can be solved by a cleaning agent having the following configuration, and have completed the present invention. That is, the present invention relates to, for example, the following [1] to [5].
  • [1] Contains 3 to 10% by mass of tetramethylammonium hydroxide (A), 20 to 60% by mass of water (B), dimethyl sulfoxide (C), and compound (D) represented by the following formula (1)
  • a cleaning agent characterized by.
  • R 1 represents an alkanediyl group having 1 to 3 carbon atoms
  • n represents an integer of 1 to 3
  • R 2 represents an alkyl group having 1 to 6 carbon atoms.
  • a method for producing a cleaning agent comprising: a step of mixing to form a mixed solution; and a step of mixing the mixed solution and dimethyl sulfoxide (C).
  • a method for processing an object comprising:
  • the cleaning agent which can remove a residue favorably the manufacturing method of the cleaning agent which can manufacture a cleaning agent favorably, and temporary
  • the temporary fixing material on the object A method for treating an object with little residue can be provided.
  • FIG. 1 is a diagram showing an embodiment relating to processing of an object according to the present invention.
  • each component exemplified in this specification for example, each component in the cleaning agent may be used alone or in combination of two or more unless otherwise specified.
  • the cleaning agent of the present invention comprises 3 to 10% by mass of tetramethylammonium hydroxide (A), 20 to 60% by mass of water (B), dimethyl sulfoxide (C), and the following formula (1) It contains the compound (D) shown in the above.
  • R 1 represents an alkanediyl group having 1 to 3 carbon atoms
  • n represents an integer of 1 to 3
  • R 2 represents an alkyl group having 1 to 6 carbon atoms.
  • the residue of the temporary fixing material after irradiation with light energy such as ultraviolet rays and infrared rays is a high carbon content film.
  • a high carbon content film is generally soluble in water but contains a lot of oil, so it has the property of inhibiting it, that is, a thick hydrophilic film (hydroxyl group, carboxyl group, etc.) on the surface layer of the high carbon content film. It is necessary to design a cleaning agent in which the hydrophobic film in the inner layer of the high carbon-containing film is dissolved and peeled off with an aprotic solvent.
  • the cleaning agent of the present invention contains basic tetramethylammonium hydroxide (A) for acting on the acidic groups of the hydrophilic film, and decomposes the hydrophilic film with tetramethylammonium hydroxide (A). And in order to melt
  • an aprotic organic solvent mixed with tetramethylammonium hydroxide (A) and water (B) is required.
  • dimethyl sulfoxide (C) is used as the aprotic organic solvent.
  • the compound (D) of a protic solvent is used as a component miscible with tetramethylammonium hydroxide (A) and water (B) or dimethyl sulfoxide (C). It is presumed that the components were mixed uniformly and thus became a cleaning agent having good detergency. Compound (D) is presumed to have a co-solvent effect with dimethyl sulfoxide (C), and by containing compound (D) in the cleaning agent, it becomes a cleaning agent having good detergency. Estimated.
  • Tetramethylammonium hydroxide (A) is a component that acts on the hydrophilic film in the surface layer of the residue of the temporary fixing material and decomposes.
  • the content of tetramethylammonium hydroxide (A) contained in the cleaning agent is 3 to 10% by mass, preferably 3.5 to 7% by mass, more preferably 4 to 6% by mass. If it is in the said range, the residue of a temporary fixing material can be removed favorably, without having a bad influence on the part (for example, copper film) weak to the base contained in a process target board
  • Water (B) is a component used for dissolving tetramethylammonium hydroxide (A).
  • the content of water (B) contained in the cleaning agent is 20 to 60% by mass, preferably 30 to 55% by mass, more preferably 40 to 50% by mass. If it is within the above range, water (B) can be mixed well with other components contained in the cleaning agent, so that a transparent cleaning agent can be obtained without becoming cloudy. The residue of the material can be removed well.
  • Dimethyl sulfoxide (C) is an aprotic component and is a component that acts and dissolves in the hydrophobic membrane in the inner layer of the residue of the temporary fixing material.
  • Dimethyl sulfoxide (C) is a component that is difficult to mix with tetramethylammonium hydroxide (A) and water (B), while it is considered to have a cosolvent effect with compound (D). Therefore, the content ratio of dimethyl sulfoxide (C) contained in the cleaning agent depends on the total content ratio of tetramethylammonium hydroxide (A) and water (B) contained in the cleaning agent, and the content ratio of compound (D). adjust.
  • the content ratio of dimethyl sulfoxide (C) contained in the cleaning agent is usually 10 to 40% by mass, preferably 15 to 35% by mass, and more preferably 20 to 35% by mass. Within the above range, dimethyl sulfoxide (C) can be mixed well with other components contained in the cleaning agent, so that a transparent cleaning agent can be obtained without becoming cloudy. The fixing material residue can be removed satisfactorily.
  • Compound (D) is a protic component that is miscible with water (B) and is a component that functions as a co-solvent for dimethyl sulfoxide (C).
  • Compound (D) is a compound represented by the following formula (1).
  • R 1 represents an alkanediyl group having 1 to 3 carbon atoms
  • n represents an integer of 1 to 3
  • R 2 represents an alkyl group having 1 to 6 carbon atoms, preferably 1 to 4 carbon atoms.
  • Examples of the compound (D) include ethylene glycol monomethyl ether, ethylene glycol monoethyl ether, ethylene glycol monopropyl ether, ethylene glycol monobutyl ether, ethylene glycol monohexyl ether, ethylene glycol mono-2-ethylbutyl ether, and the like.
  • Alkyl ethers such as diethylene glycol monomethyl ether, diethylene glycol monoethyl ether, diethylene glycol monopropyl ether, diethylene glycol monobutyl ether, diethylene glycol monohexyl ether; propylene glycol monoethyl ether, propylene glycol monopropyl ether, propylene glycol Propylene glycol monoalkyl ethers such as dimonobutyl ether and propylene glycol monomethyl ether; and dipropylene glycol monoalkyl ethers such as dipropylene glycol monobutyl ether, dipropylene glycol monomethyl ether, dipropylene glycol monoethyl ether and dipropylene glycol monopropyl ether And the like.
  • dipropylene glycol monoalkyl ethers are preferable because they are excellent in the cosolvent effect with dimethyl sulfoxide (C) and the residue of the temporary
  • the content ratio of the compound (D) contained in the cleaning agent is usually 10 to 40% by mass, preferably 15 to 35% by mass, more preferably 15 to 30% by mass.
  • compound (D) can be mixed well with other components contained in the cleaning agent, so that a transparent cleaning agent can be obtained without becoming cloudy, and as a result, temporarily fixed. The residue of the material can be removed well.
  • the cleaning agent of the present invention can contain other components as needed within a range not losing the effect of the cleaning agent of the present invention.
  • the other components include bases (excluding tetramethylammonium hydroxide (A)), aprotic organic solvents (excluding dimethyl sulfoxide (C)), protic organic solvents (excluding compound (D)) ), Corrosion inhibitors and surfactants.
  • the base is used for decomposing the hydrophilic film on the surface of the high carbon-containing film in the same manner as tetramethylammonium hydroxide (A).
  • the base include quaternary ammonium hydroxides such as tetraethylammonium hydroxide, tetra-n-butylammonium hydroxide, and tetraphenylammonium hydroxide; alkanolamines such as trimethanolamine; potassium hydroxide, potassium hydrogencarbonate And inorganic bases such as sodium carbonate; amines such as triethylamine and diethylamine.
  • the surfactant is used to improve the wettability of the cleaning agent to the residue of the temporary fixing material.
  • the surfactant include nonionic surfactants such as polyoxyalkylene phenyl ether, polyoxyalkylene methyl phenyl ether, polyoxyalkylene octyl phenyl ether, polyoxyalkylene nonyl phenyl ether; sodium dodecylbenzenesulfonate, and the like.
  • anionic surfactants such as alkylaryl sulfonates.
  • the content of the surfactant contained in the cleaning agent is usually 0.01 to 1% by mass.
  • the cleaning agent of the present invention can be divided into combined products.
  • the amount of water (B) contained in the cleaning agent is limited to the amount capable of dissolving tetramethylammonium hydroxide (A), and the reduced amount of water (B) is used. It can be a combined product that is mixed immediately before.
  • the cleaning agent of the present invention contains dimethyl sulfoxide (C) which can be oxidized, it is preferable to store the cleaning agent of the present invention by enclosing an inert gas such as nitrogen.
  • the content ratio of impurities including metal (including metal ions) contained in the cleaning agent of the present invention does not adversely affect the substrate to be processed, particularly when the substrate to be processed is a precise substrate such as a semiconductor element. Therefore, it is preferably as small as possible and is usually 1 wtppm or less.
  • the viscosity of the cleaning agent of the present invention at 23 ° C. according to JIS Z8803 (2011) is usually 0.4 to 50 mPa ⁇ s, preferably 0.8 to 10 mPa ⁇ s.
  • the vapor pressure according to JIS K2258-1 (2009) of the cleaning agent of the present invention is usually 100 hPa or less, preferably 40 hPa or less. If it is in the said range, it will become the cleaning agent excellent in the point of the washing
  • the cleaning agent of the present invention can be mixed with tetramethylammonium hydroxide (A), water (B), dimethyl sulfoxide (C) and compound (D) uniformly. Although they may be mixed in any order, the method for producing the cleaning agent of the present invention described below is preferred. In addition, although the usage-amount (mass part) of each component is described below, these are the quantity when the cleaning agent finally obtained is 100 mass parts.
  • the method for producing a cleaning agent of the present invention comprises a step of preparing an aqueous solution by mixing 3 to 10 parts by mass of tetramethylammonium hydroxide (A) and 20 to 60 parts by mass of water (B) (hereinafter referred to as “step (I)”).
  • a step of mixing the aqueous solution and the compound (D) to form a mixed solution hereinafter also referred to as “step (II)”
  • step (II) a step of mixing the mixed solution and dimethyl sulfoxide (C)
  • step (III) Also referred to as “step (III)”.
  • the manufacturing method of the cleaning agent of the present invention is based on the above-mentioned possibility. That is, in the step (I), tetramethylammonium hydroxide (A) and water (B) are mixed and tetrahydroxide hydroxide is mixed. By preparing an aqueous solution of methylammonium (A), then mixing the compound (D) in the step (II) and finally mixing the dimethyl sulfoxide (C) in the step (III). Without any possibility, the cleaning agent according to the invention can be produced.
  • Step (I) an aqueous solution is prepared by mixing 3 to 10 parts by mass of tetramethylammonium hydroxide (A) and 20 to 60 parts by mass of water (B) in a vessel equipped with a stirring blade.
  • tetramethylammonium hydroxide (A) is usually sold in the form of an aqueous solution, finally, 3 to 10 parts by mass of tetramethylammonium hydroxide (A) and 20 to 60 water (B) are finally obtained. It is carried out by mixing tetramethylammonium hydroxide (A) and water (B) with a stirring blade so as to be part by mass.
  • the liquid temperature during mixing is usually 5 to 50 ° C., preferably 15 to 35 ° C. under 1 atm.
  • mixing in order to reduce the amount of dissolved oxygen contained in the aqueous solution, it is preferable to mix while bubbling an inert gas such as nitrogen.
  • step (II) the aqueous solution and compound (D) are mixed to form a mixed solution.
  • the mixing is performed by adding the compound (D) to the container while stirring the aqueous solution.
  • the liquid temperature during mixing is usually 5 to 50 ° C., preferably 15 to 35 ° C. under 1 atm.
  • an inert gas such as nitrogen.
  • the amount of compound (D) to be used is usually 10 to 40 parts by mass.
  • the other components are included in the cleaning agent, the other components are usually mixed before and after the step (II).
  • step (III) the mixed solution and dimethyl sulfoxide (C) are mixed.
  • the dimethyl sulfoxide (C) is put into the container while stirring the aqueous solution.
  • the amount of dimethyl sulfoxide (C) used is usually 10 to 40 parts by mass.
  • Tetramethylammonium hydroxide (A) and water (B) are not miscible with dimethyl sulfoxide (C). Therefore, when adding dimethyl sulfoxide (C), the total amount of dimethyl sulfoxide (C) is small. It is preferable to divide and input.
  • the liquid temperature during mixing is usually 5 to 50 ° C., preferably 15 to 35 ° C. under 1 atm. Further, as in the step (I), in order to reduce the amount of dissolved oxygen contained in the mixed solution, it is preferable to mix while bubbling an inert gas such as nitrogen.
  • the mixed solution can be aged, and usually a detergent having excellent storage stability by aging at 5 to 50 ° C. for 12 hours or longer, preferably 15 to 35 ° C. for 24 hours or longer. Can be manufactured. Since the cleaning agent of the present invention contains tetramethylammonium hydroxide (A) and dimethyl sulfoxide (C), the hydroxide anion of tetramethylammonium hydroxide (A) and polarized dimethyl sulfoxide (C) May form an ion-bonded compound (AC).
  • A tetramethylammonium hydroxide
  • C dimethyl sulfoxide
  • the cleaning agent of the present invention does not contain one or both of tetramethylammonium hydroxide (A) and dimethyl sulfoxide (C), and even when compound (AC) is contained. It is a cleaning agent of the invention.
  • filtration such as a capsule filter can be performed in order to remove impurities.
  • the temporarily fixing material means that an object is temporarily fixed on a support so that the object does not move due to being shifted from the support when the object to be processed is processed and / or moved. It is the material used to do.
  • the object to be processed means an object to be subjected to a processing process or a movement process in a process (2) described later (for example, a stage in the process (1) or (2) described later), and the process has been received. It may mean a later object (for example, a stage in steps (3) and (4) described later).
  • the processing object is also simply referred to as “object”.
  • the method for treating an object of the present invention includes a step of forming a laminate having a support, a temporary fixing material, and an object to be treated (hereinafter also referred to as “step (1)”), wherein the object is the temporary A step of processing the object and / or moving the laminate (hereinafter also referred to as “step (2)”); a step of separating the object from the support; (Hereinafter also referred to as “step (3)”), and a step of cleaning the object with the cleaning agent of the present invention (hereinafter also referred to as “step (4)”).
  • An embodiment is shown in FIG.
  • Step (1) As shown in FIG. 1 (1), for example, the temporary fixing material 30 is formed on the surface of the support 10 and / or the object 20, and the object is interposed via the temporary fixing material 30.
  • the object 20 is temporarily fixed on the support 10 by laminating 20 and the support 10 to form the laminate 40.
  • the temporary fixing material 30 is formed on the surface of the support 10, and an object such as a resin coating film or a wiring layer is formed on the temporary fixing material 30, whereby the target 20 is placed on the support 10. It may be temporarily fixed.
  • the object can be surface-treated as necessary.
  • the temporary fixing material may be a temporary fixing material consisting of one layer or a temporary fixing material consisting of two or more layers, and as a method of forming the temporary fixing material, for example, the temporary fixing material has A method of directly forming each layer on a support and / or an object, after forming a film with a fixed thickness on a film subjected to a release treatment using a temporary fixing composition, And / or a method of transferring to an object by a laminating method. From the viewpoint of film thickness uniformity, the direct forming method is preferable.
  • the surface of the object (for example, the circuit surface) can be pretreated in order to make the spread of the temporarily fixed material in the surface uniform.
  • the surface treatment method include a method in which a surface treatment agent is applied to the surface of an object in advance.
  • the surface treatment agent include a coupling agent such as a silane coupling agent.
  • Examples of the method for applying the temporary fixing composition include a spin coating method and an ink jet method. After the temporary fixing composition is applied and a coating film is formed, each layer of the temporary fixing material is formed by heating as necessary to volatilize the solvent.
  • the heating conditions are appropriately determined according to the type of the temporary fixing composition. For example, the heating temperature is usually 100 to 350 ° C., and the heating time is usually 1 to 60 minutes.
  • the temporary fixing of the object and the support via the temporary fixing material is performed by, for example, preferably laminating each layer with a pressure of 0.01 to 100 MPa for 1 to 20 minutes at 5 to 400 ° C., more preferably 150 to 400 ° C. By adding in the direction. Further, if necessary, heat treatment is performed at 150 to 300 ° C. for 10 minutes to 3 hours. In this way, the object is firmly fixed on the support via the temporary fixing material.
  • Examples of the temporary fixing composition and the temporary fixing material include known temporary fixing compositions and temporary fixing materials.
  • Japanese Patent Application Laid-Open No. 2013-235919, International Publication No. 2015/077983, Japan Temporary fixing of the type in which the object is separated from the support by mechanical force such as published patent 2013-179135, published US 2012/291919, and published US 2011/065257 Composition and temporary fixing material; and Japanese Patent Publication No. 2012-052031, International Publication No. 2017/056662, U.S. Publication No. 2007/077685, Japanese Publication No. 2012-106486, and Japan Temporary fixing material is altered by light irradiation as described in Japanese Patent Publication No. 2016-215394.
  • the object of the temporary fixing composition of the type separating from the support and the temporary fixing material (light-irradiating temporary fixing material) and the like by causing preferably a light irradiation type temporary fixing material, more preferably light is a light irradiation type temporary fixing material by laser light, and the reason is that in step (4), a higher carbon residue is washed. This is because the effect of the cleaning agent of the present invention can be utilized more.
  • Examples of the object to be processed (moved) include a semiconductor wafer, a semiconductor chip, a glass substrate, a resin substrate, a metal substrate, a metal foil, a polishing pad, a resin coating, and a wiring layer. At least one selected from bumps, wirings, through holes, through hole vias, insulating films, and various elements can be formed on the semiconductor wafer and the semiconductor chip. Various elements can be formed or mounted on the substrate.
  • Examples of the resin coating include a layer containing an organic component as a main component; specifically, a photosensitive resin layer formed from a photosensitive material, an insulating resin layer formed from an insulating material, A photosensitive insulating resin layer formed from a photosensitive insulating resin material can be used.
  • the support may be any material as long as it does not cause damage or alteration when the object to be processed is processed and / or moved, such as a silicon wafer substrate, a sapphire substrate, or a glass substrate. And quartz substrate and transparent resin substrate.
  • the support when using a temporarily fixing material that separates the object from the support by altering the temporarily fixed material by light irradiation, the support is irradiated with light from the support side to temporarily fix the material. Therefore, it is preferable to use a substrate having a high transmittance with respect to light used in light irradiation, and examples thereof include a glass substrate, a quartz substrate, and a transparent resin substrate.
  • Step (2) As shown in FIG. 1 (2), the object 20 temporarily fixed on the support 10 is processed to obtain the processed object 21, and / or the obtained laminate 41 is obtained. It is a process of moving.
  • the moving process is a process of moving an object such as a semiconductor wafer together with a support from one apparatus to another apparatus. Examples of processing of the object temporarily fixed on the support include dicing of the object, thinning of the object (backside grinding, etc.), photofabrication, stacking of semiconductor wafers or chips, mounting of various elements, Resin sealing is mentioned.
  • the photofabrication includes, for example, one or more processes selected from resist pattern formation, etching processing, sputtered film formation, plating process, and plating reflow process.
  • Step (3) After the processing of the object or the movement of the laminate, in step (3), the processed object 21 is separated from the support 10 as shown in FIG.
  • the method for separating the object and the support include, for example, a method in which a force is applied to the object or the support in a direction parallel to the support surface or the object surface to separate the two; one of the object or the support Is fixed, and the other is lifted at a certain angle from the parallel direction with respect to the support surface or the object surface to separate the two.
  • the object is slid horizontally with respect to the surface of the support, and at the same time, the support is fixed, or a force that antagonizes the force applied to the object is applied to the support. And a method of separating the support and the object.
  • a force in a direction substantially perpendicular to the support surface or the object surface means that the z axis, which is an axis perpendicular to the support surface or the object surface, is usually 0 ° to 60 °. It means to apply a force in the range, preferably in the range 0 ° to 45 °, particularly preferably 0 °, ie perpendicular to the support surface or the object surface.
  • the separation method for example, a method in which the peripheral edge of the object or the support is lifted and peeled in order from the peripheral edge toward the center while applying a force in a direction substantially perpendicular to the support surface or the object surface (hook-pull method). Can be done.
  • the separation can be performed usually at 5 to 100 ° C., preferably 10 to 45 ° C., more preferably 15 to 30 ° C.
  • a reinforcing tape for example, a commercially available dicing tape, can be applied to the surface of the object opposite to the temporary fixing surface with the support.
  • the temporary fixing material is irradiated with light to decompose or alter the temporary fixing material, thereby reducing the strength and adhesive force of the temporary fixing material, and then separating the object from the support. It is preferable to do.
  • the temporary fixing material is irradiated with light from the support side. By light irradiation, the components contained in the temporary fixing material absorb light, and the strength and adhesive strength of the temporary fixing material are reduced. Therefore, if it is after the light irradiation with respect to a temporarily fixed material, a support body can be easily isolate
  • ultraviolet rays are preferably used.
  • ultraviolet rays having a wavelength of 10 to 400 nm are employed, and ultraviolet rays having a wavelength of 250 to 400 nm are particularly preferred.
  • the light source of irradiation light include a low-pressure mercury lamp, a high-pressure mercury lamp, an ultrahigh-pressure mercury lamp, and a laser.
  • a laser is preferable. It is preferable to irradiate the entire surface of the temporarily fixed material while scanning the laser from the support side, and it is more preferable to irradiate the laser to the temporarily fixed material with a focus.
  • the laser examples include a solid laser (eg, all solid laser using a photoexcited semiconductor laser, YAG laser), a liquid laser (eg, dye laser), and a gas laser (eg, excimer laser).
  • a solid laser eg, all solid laser using a photoexcited semiconductor laser, YAG laser
  • a liquid laser eg, dye laser
  • a gas laser eg, excimer laser
  • YAG laser wavelength: 355 nm
  • excimer laser wavelength: 200 to 310 nm
  • the light irradiation conditions vary depending on the type of light source and the like, but in the case of an all-solid-state laser using a light-excited semiconductor laser and a YAG laser, it is usually 1 mW to 100 W, and the integrated light quantity is usually 1.4 ⁇ 10 ⁇ 7 to 1. 4 ⁇ 10 7 mJ / cm 2 .
  • the object is separated from the support by separating the object from the support.
  • separation is preferably performed after the light irradiation, but the separation can be performed while performing the light irradiation.
  • Step (4) is a step of cleaning with the cleaning agent 50 of the present invention. After separating the support and the object, the temporary fixing material usually remains on the object. The temporary fixing material remaining on the object after the separation step, that is, the residue 31 of the temporary fixing material can be favorably removed by using the cleaning agent of the present invention as described above.
  • Examples of the cleaning method include a method of immersing an object in the cleaning agent of the present invention and a method of spraying the cleaning agent of the present invention on the object as shown in FIG. Ultrasound may be applied.
  • the temperature of the cleaning agent for cleaning the object is not particularly limited, but is usually 10 to 80 ° C., preferably 15 to 55 ° C., more preferably 20 to 40 ° C., and further preferably 25 to 40 ° C.
  • the washing time, for example, the immersion time is usually 2 to 20 minutes, preferably 5 to 15 minutes.
  • the dissolved oxygen content of the cleaning agent of the present invention is preferably small from the viewpoint of preventing the above-described processing object from deteriorating. For this reason, it is preferable to perform the said washing
  • step (4) the object to be treated can be cleaned using another cleaning agent after being cleaned using the cleaning agent of the present invention.
  • cleaning with the cleaning agent of the present invention cleaning with water, cleaning with an acid cleaning agent, and cleaning with water are sequentially performed.
  • Examples of the acid in the acid detergent include inorganic acids such as sulfuric acid; organic acids such as acetic acid, oxalic acid, benzenesulfonic acid, and dodecylbenzenesulfonic acid.
  • the acid content in the acid detergent is usually more than 0% by mass and 10% by mass or less, preferably 0.001 to 8% by mass, more preferably 0.01 to 1% by mass. Such an embodiment is preferable because cleaning can be performed while suppressing corrosion of the metal.
  • Examples of the solvent in the acid cleaning agent include the solvents exemplified in the cleaning agent of the present invention, and water is preferable. That is, an acid aqueous solution is preferable as the acid cleaning agent.
  • Examples of the cleaning method using the acid cleaning agent include a method of immersing the object in the acid cleaning agent and a method of spraying the acid cleaning agent on the object, and ultrasonic waves may be applied during the immersion.
  • the temperature of the acid detergent is not particularly limited, but is usually 10 to 80 ° C., preferably 15 to 55 ° C.
  • the washing time, for example, the immersion time is usually 0.02 to 15 minutes, preferably 0.5 to 10 minutes.
  • cleaning agents examples include various solvents exemplified in the cleaning agent of the present invention, and water is preferable.
  • the cleaning method and conditions using other cleaning agents are the same as the cleaning method and conditions using acid cleaners.
  • the cleaning agent of the present invention can satisfactorily remove residues having both hydrophilic and hydrophobic properties such as a high carbon-containing film. Residues that are difficult to remove can be satisfactorily removed, such as residues of photoresist after etching and plating of the substrate to be processed and residues of temporary fixing materials.
  • Examples 2A to 10A and Comparative Examples 1A to 11A In the same procedure as in Example 1A, the cleaning agents of Examples 2A to 10A and Comparative Examples 1A to 11A containing the respective components and the content ratios shown in Table 1 were produced. The unit of numerical values in Table 1 is mass%.
  • TMAH Tetramethylammonium hydroxide
  • TEAH Tetraethylammonium hydroxide
  • DIW Water DMSO: Dimethyl sulfoxide
  • PGME Propylene glycol monomethyl ether
  • dEGBE Diethylene glycol monobutyl ether
  • dPGBE Dipropylene glycol monomethyl ether
  • PG Propylene glycol
  • PGMEA Propylene glycol monomethyl ether acetate
  • PGdME Propylene glycol dimethyl ether
  • a 4-inch silicon wafer was spin-coated with the composition for temporary fixing of Production Example 1, heated at 180 ° C. for 1 minute using a hot plate, and further heated at 300 ° C. for 2 minutes to form a uniform layer having a thickness of 10 ⁇ m ( A substrate 1 having I) was obtained. After the substrate 1 was cut into a square of 1 cm in length and 1 cm in width, it was bonded to a glass substrate (a square of 1 cm in length and 1 cm in width; a support) through the layer (I), and 250 ° C. using a die bonder device. Then, a pressure of 0.2 MPa was applied for 2 minutes to produce a laminate.
  • a glass substrate with an output of 100 mW and an integrated light amount of 2.08 ⁇ 10 ⁇ 4 mJ / cm 2 is applied to the laminate using an all-solid-state high-power laser device (trade name “Genesis CX355 STM Compact”, manufactured by Coherent Japan Co., Ltd.). UV laser (wavelength 355 nm) was irradiated from the side. Using a universal bond tester (trade name “Daily 4000”, manufactured by Daisy) for the test laminate after light irradiation, in the direction of the axis (z axis) perpendicular to the glass substrate surface by the hook-pull method. A glass substrate was separated from the silicon wafer by applying a force (speed of 500 ⁇ m / second, 23 ° C.). A residue substrate having a residue of layer (I) on a silicon wafer was obtained.
  • an all-solid-state high-power laser device trade name “Genesis CX355 STM Compact”, manufactured by Coherent Japan Co., Ltd.
  • Example 1A The cleaning agent of Example 1A was put in a container, and the residue substrate was immersed at 25 ° C. for 5 minutes while stirring at 250 rpm with a stirrer chip. Next, the surface of the silicon wafer was washed away by spraying with pure water for 2 minutes and then dried. The presence or absence of the residue after drying was observed with an optical microscope, and the removal area ratio of the residue on the surface of the wafer was measured. The result of the removal area ratio of the residue with an optical microscope was evaluated according to the following criteria. The evaluation results are shown in Table 2. AA: The residue is peeled off by 80% or more. BB: The residue is peeled off by 40% or more and less than 80%. CC: The residue is peeled off less than 40% or not peeled off.
  • Example 1B [Examples 2B to 10B and Comparative Examples 1B to 11B]
  • Example 1B the treatment of the object was performed in the same procedure as Example 1B, except that the cleaning agents of Examples 1A to 10A and Comparative Examples 1A to 11A were used instead of the cleaning agent of Example 1A, respectively.
  • the removal area ratio of the residue was measured and evaluated according to the same criteria as in Example 1B. The evaluation results are shown in Table 2.
  • Support 20 Object 21: Processed object 30: Temporary fixing material 31: Residue of temporary fixing material 40: Laminated body 41: Laminated body 50 after processing: Cleaning agent

Abstract

The present invention addresses the problem of providing a cleaning agent capable of adequately eliminating residue in semiconductor production processes such as in the elimination of a temporary fixing material residue. The cleaning agent contains 3 to 10% by mass of tetramethylammonium hydroxide (A), 20 to 60% by mass of water (B), dimethylsulfoxide (C), and a compound (D) represented by formula (1). (In formula (1), R1 represents an alkanediyl group having 1 to 3 carbons; n represents an integer from 1 to 3; when n is 2 or greater, the plurality of R1 may be identical or different from one another; and R2 represents an alkyl group having 1 to 6 carbons.)

Description

洗浄剤、洗浄剤の製造方法、および対象物の処理方法Cleaning agent, manufacturing method of cleaning agent, and processing method of object
 本発明は、洗浄剤、洗浄剤の製造方法、および対象物の処理方法に関する。 The present invention relates to a cleaning agent, a manufacturing method of the cleaning agent, and a processing method of an object.
 半導体ウエハ等の対象物をガラス基板等の支持体上に仮固定材を介して接合した状態で、対象物に対して、裏面研削およびフォトファブリケーション等の加工処理を行う方法が提案されている。仮固定材には、加工処理中において支持体上に対象物を仮固定することができ、加工処理後には支持体と対象物とを容易に分離できることが必要とされる。 A method has been proposed in which an object such as a semiconductor wafer is bonded to a support such as a glass substrate via a temporary fixing material, and processing such as back grinding and photofabrication is performed on the object. . The temporary fixing material needs to be able to temporarily fix the object on the support during the processing, and to easily separate the support and the object after the processing.
 分離処理において、紫外線および赤外線等の光エネルギーを、支持体と仮固定材と対象物とを有する積層体中の前記仮固定材に照射することによって、仮固定材の接着力を低減させて、続いて支持体と対象物とを分離する方法が提案されている(特許文献1~2参照)。 In the separation process, by irradiating the temporary fixing material in the laminate having the support, the temporary fixing material, and the object with light energy such as ultraviolet rays and infrared rays, the adhesive force of the temporary fixing material is reduced, Subsequently, a method of separating the support and the object has been proposed (see Patent Documents 1 and 2).
国際公開第2017/056662号公報International Publication No. 2017/056662 米国公開特許第2014/0106473号公報US Published Patent No. 2014/0106473
 対象物を支持体から分離すると、通常、対象物上には仮固定材の残渣が存在するため、前記残渣を除去するために、洗浄剤を用いた対象物の洗浄が行われる。しかしながら、この洗浄を行っても仮固定材の残渣を良好に除去できないことがある。 When the object is separated from the support, there is usually a residue of temporarily fixing material on the object, and thus the object is cleaned with a cleaning agent in order to remove the residue. However, even if this cleaning is performed, the temporary fixing material residue may not be removed well.
 本発明は、仮固定材の残渣の除去などの半導体製造プロセスにおいて、残渣を良好に除去することができる洗浄剤を提供すること、また、前記洗浄剤の製造方法を提供すること、ならびに仮固定材を用いて支持体上に処理対象物を仮固定した状態で対象物の加工・移動処理を行い、続いて支持体と対象物とを分離する方法において、対象物上の仮固定材の残渣が少ない対象物の処理方法を提供することを課題とする。 The present invention provides a cleaning agent capable of satisfactorily removing a residue in a semiconductor manufacturing process such as removal of a residue of a temporary fixing material, and also provides a method for manufacturing the cleaning agent, and temporary fixing. In a method of processing and moving an object in a state where the object to be treated is temporarily fixed on the support using a material, and subsequently separating the support from the object, the residue of the temporarily fixed material on the object It is an object of the present invention to provide a method for processing an object with a small amount.
 本発明者らは前記課題を解決すべく鋭意検討を行った。その結果、以下の構成を有する洗浄剤により前記課題を解決できることを見出し、本発明を完成するに至った。すなわち本発明は、例えば以下の[1]~[5]に関する。 The present inventors have intensively studied to solve the above problems. As a result, the present inventors have found that the above problems can be solved by a cleaning agent having the following configuration, and have completed the present invention. That is, the present invention relates to, for example, the following [1] to [5].
[1]水酸化テトラメチルアンモニウム(A)を3~10質量%、水(B)を20~60質量%、ジメチルスルホキシド(C)、および下記式(1)に示す化合物(D)を、含有することを特徴とする洗浄剤。
Figure JPOXMLDOC01-appb-C000003
(式(1)中、R1は、炭素数1~3のアルカンジイル基を示し;nは1~3の整数を示し;nが2以上の場合、複数のR1はそれぞれ同じであっても異なっていてもよく;R2は炭素数1~6のアルキル基を示す。)
[1] Contains 3 to 10% by mass of tetramethylammonium hydroxide (A), 20 to 60% by mass of water (B), dimethyl sulfoxide (C), and compound (D) represented by the following formula (1) A cleaning agent characterized by.
Figure JPOXMLDOC01-appb-C000003
(In the formula (1), R 1 represents an alkanediyl group having 1 to 3 carbon atoms; n represents an integer of 1 to 3; and when n is 2 or more, the plurality of R 1 are the same. And R 2 represents an alkyl group having 1 to 6 carbon atoms.)
 [2]洗浄剤に含まれる前記ジメチルスルホキシド(C)の含有割合が10~40質量%である、前記[1]に記載の洗浄剤。 [2] The cleaning agent according to [1], wherein the content ratio of the dimethyl sulfoxide (C) contained in the cleaning agent is 10 to 40% by mass.
 [3]洗浄剤に含まれる前記式(1)に示す化合物(D)の含有割合が10~40質量%である、前記[1]または[2]に記載の洗浄剤。 [3] The cleaning agent according to [1] or [2], wherein the content ratio of the compound (D) represented by the formula (1) contained in the cleaning agent is 10 to 40% by mass.
 [4]水酸化テトラメチルアンモニウム(A)3~10質量部と水(B)20~60質量部を混合し水溶液を準備する工程、前記水溶液と前記式(1)に示す化合物(D)を混合し混合液を形成する工程、および前記混合液とジメチルスルホキシド(C)を混合する工程、を有することを特徴とする洗浄剤の製造方法。 [4] A step of preparing an aqueous solution by mixing 3 to 10 parts by mass of tetramethylammonium hydroxide (A) and 20 to 60 parts by mass of water (B), the aqueous solution and the compound (D) represented by the formula (1) A method for producing a cleaning agent, comprising: a step of mixing to form a mixed solution; and a step of mixing the mixed solution and dimethyl sulfoxide (C).
[5](1)支持体と仮固定材と処理対象物とを有する積層体を形成する工程、ここで前記対象物は前記仮固定材上に保持されており;
(2)前記対象物を加工し、および/または前記積層体を移動する工程;
(3)前記対象物を前記支持体から分離する工程;ならびに
(4)前記対象物を、前記[1]~[3]のいずれかに記載の洗浄剤で洗浄する工程;
を有することを特徴とする対象物の処理方法。
[5] (1) A step of forming a laminated body having a support, a temporary fixing material, and a processing object, wherein the object is held on the temporary fixing material;
(2) processing the object and / or moving the laminate;
(3) a step of separating the object from the support; and (4) a step of washing the object with the cleaning agent according to any one of [1] to [3];
A method for processing an object, comprising:
 本発明によれば、仮固定材の残渣の除去などの半導体製造プロセスにおいて、残渣を良好に除去することができる洗浄剤、洗浄剤を良好に製造することができる洗浄剤の製造方法、ならびに仮固定材を用いて支持体上に処理対象物を仮固定した状態で対象物の加工・移動処理を行い、続いて支持体と対象物とを分離する方法において、対象物上の仮固定材の残渣が少ない対象物の処理方法を提供することができる。 ADVANTAGE OF THE INVENTION According to this invention, in the semiconductor manufacturing processes, such as removal of the residue of temporary fixing material, the cleaning agent which can remove a residue favorably, the manufacturing method of the cleaning agent which can manufacture a cleaning agent favorably, and temporary In a method of processing and moving an object in a state where the object to be processed is temporarily fixed on the support using a fixing material, and subsequently separating the support and the object, the temporary fixing material on the object A method for treating an object with little residue can be provided.
図1は、本発明の対象物の処理に係る一実施形態を示す図である。FIG. 1 is a diagram showing an embodiment relating to processing of an object according to the present invention.
 本明細書で例示する各成分、例えば洗浄剤中の各成分は、特に言及しない限り、それぞれ1種単独で用いてもよく、2種以上を併用してもよい。 Each component exemplified in this specification, for example, each component in the cleaning agent may be used alone or in combination of two or more unless otherwise specified.
<1>洗浄剤
 本発明の洗浄剤は、水酸化テトラメチルアンモニウム(A)を3~10質量%、水(B)を20~60質量%、ジメチルスルホキシド(C)、および下記式(1)に示す化合物(D)を、含有することを特徴とする。
<1> Cleaning Agent The cleaning agent of the present invention comprises 3 to 10% by mass of tetramethylammonium hydroxide (A), 20 to 60% by mass of water (B), dimethyl sulfoxide (C), and the following formula (1) It contains the compound (D) shown in the above.
Figure JPOXMLDOC01-appb-C000004
Figure JPOXMLDOC01-appb-C000004
(式(1)中、R1は、炭素数1~3のアルカンジイル基を示し;nは1~3の整数を示し;nが2以上の場合、複数のR1はそれぞれ同じであっても異なっていてもよく;R2は炭素数1~6のアルキル基を示す。) (In the formula (1), R 1 represents an alkanediyl group having 1 to 3 carbon atoms; n represents an integer of 1 to 3; and when n is 2 or more, the plurality of R 1 are the same. And R 2 represents an alkyl group having 1 to 6 carbon atoms.)
 また、本発明の洗浄剤の性能を失わない範囲で、必要に応じて、その他成分を含有することができる。 In addition, other components can be contained as necessary within a range not losing the performance of the cleaning agent of the present invention.
 分離処理において、紫外線および赤外線等の光エネルギーを照射後の仮固定材の残渣は、高炭素含有膜であると推定される。
 高炭素含有膜は、一般的に、水には溶けるが油分が多いため、それを阻害する性質を有しており、つまり、高炭素含有膜の表層にある厚い親水膜(水酸基やカルボキシル基などの酸性基)を分解した後、高炭素含有膜の内部層にある疎水膜を、非プロトン性溶剤で溶かして剥がすという洗浄剤の設計が必要である。
In the separation treatment, it is estimated that the residue of the temporary fixing material after irradiation with light energy such as ultraviolet rays and infrared rays is a high carbon content film.
A high carbon content film is generally soluble in water but contains a lot of oil, so it has the property of inhibiting it, that is, a thick hydrophilic film (hydroxyl group, carboxyl group, etc.) on the surface layer of the high carbon content film. It is necessary to design a cleaning agent in which the hydrophobic film in the inner layer of the high carbon-containing film is dissolved and peeled off with an aprotic solvent.
 本発明の洗浄剤は、親水膜の酸性基に作用させるために塩基性の水酸化テトラメチルアンモニウム(A)を含有し、水酸化テトラメチルアンモニウム(A)により親水膜を分解する。そして、水酸化テトラメチルアンモニウム(A)を溶解するためには水(B)が必要になる。一方で、疎水膜を溶かすためには、水酸化テトラメチルアンモニウム(A)および水(B)と混ざる非プロトン性有機溶剤が必要になる。本発明では非プロトン性有機溶剤としてジメチルスルホキシド(C)を用いているが、洗浄剤中には、厚い親水膜を分解させるために、多量の水酸化テトラメチルアンモニウム(A)およびそれに付随して多量の水(B)が含まれるため、水酸化テトラメチルアンモニウム(A)および水(B)と、ジメチルスルホキシド(C)とが均一に混和できず、その結果、洗浄剤の洗浄力が低下することが明らかになった。 The cleaning agent of the present invention contains basic tetramethylammonium hydroxide (A) for acting on the acidic groups of the hydrophilic film, and decomposes the hydrophilic film with tetramethylammonium hydroxide (A). And in order to melt | dissolve tetramethylammonium hydroxide (A), water (B) is needed. On the other hand, in order to dissolve the hydrophobic membrane, an aprotic organic solvent mixed with tetramethylammonium hydroxide (A) and water (B) is required. In the present invention, dimethyl sulfoxide (C) is used as the aprotic organic solvent. However, in order to decompose the thick hydrophilic film, a large amount of tetramethylammonium hydroxide (A) and accompanying it are contained in the cleaning agent. Since a large amount of water (B) is contained, tetramethylammonium hydroxide (A) and water (B) and dimethyl sulfoxide (C) cannot be mixed uniformly, and as a result, the cleaning power of the cleaning agent is reduced. It became clear.
 本発明の洗浄剤では、水酸化テトラメチルアンモニウム(A)および水(B)にも、ジメチルスルホキシド(C)にも混和できる成分として、プロトン性溶剤の化合物(D)を用いることで、これらの成分が均一に混和し、したがって良好な洗浄力を有する洗浄剤になったものと推定される。
 また、化合物(D)は、ジメチルスルホキシド(C)と共溶媒効果を有していると推定され、洗浄剤中に化合物(D)を含有させることで、良好な洗浄力を有する洗浄剤になったものと推定される。
In the cleaning agent of the present invention, the compound (D) of a protic solvent is used as a component miscible with tetramethylammonium hydroxide (A) and water (B) or dimethyl sulfoxide (C). It is presumed that the components were mixed uniformly and thus became a cleaning agent having good detergency.
Compound (D) is presumed to have a co-solvent effect with dimethyl sulfoxide (C), and by containing compound (D) in the cleaning agent, it becomes a cleaning agent having good detergency. Estimated.
<1-1>水酸化テトラメチルアンモニウム(A)
 水酸化テトラメチルアンモニウム(A)は、仮固定材の残渣の表層にある親水膜に作用し、分解する成分である。
<1-1> Tetramethylammonium hydroxide (A)
Tetramethylammonium hydroxide (A) is a component that acts on the hydrophilic film in the surface layer of the residue of the temporary fixing material and decomposes.
 洗浄剤中に含まれる水酸化テトラメチルアンモニウム(A)の含有割合は、3~10質量%、好ましくは3.5~7質量%、より好ましくは4~6質量%である。
 前記範囲内であれば、処理対象基板に含まれる塩基に弱い部分(例えば、銅膜)に悪影響を及ぼすことなく、仮固定材の残渣を良好に除去することができる。
The content of tetramethylammonium hydroxide (A) contained in the cleaning agent is 3 to 10% by mass, preferably 3.5 to 7% by mass, more preferably 4 to 6% by mass.
If it is in the said range, the residue of a temporary fixing material can be removed favorably, without having a bad influence on the part (for example, copper film) weak to the base contained in a process target board | substrate.
<1-2>水(B)
 水(B)は、水酸化テトラメチルアンモニウム(A)を溶解させるために用いる成分である。
<1-2> Water (B)
Water (B) is a component used for dissolving tetramethylammonium hydroxide (A).
 洗浄剤中に含まれる水(B)の含有割合は、20~60質量%、好ましくは30~55質量%、より好ましくは40~50質量%である。
 前記範囲内であれば、水(B)は洗浄剤中に含まれる他の成分と良好に混和することができるため、白濁することなく透明な洗浄剤を得ることができ、その結果、仮固定材の残渣を良好に除去することができる。
The content of water (B) contained in the cleaning agent is 20 to 60% by mass, preferably 30 to 55% by mass, more preferably 40 to 50% by mass.
If it is within the above range, water (B) can be mixed well with other components contained in the cleaning agent, so that a transparent cleaning agent can be obtained without becoming cloudy. The residue of the material can be removed well.
<1-3>ジメチルスルホキシド(C)
 ジメチルスルホキシド(C)は、非プロトン性の成分であり、仮固定材の残渣の内部層にある疎水膜に作用し溶解する成分である。
<1-3> Dimethyl sulfoxide (C)
Dimethyl sulfoxide (C) is an aprotic component and is a component that acts and dissolves in the hydrophobic membrane in the inner layer of the residue of the temporary fixing material.
 ジメチルスルホキシド(C)は、水酸化テトラメチルアンモニウム(A)や水(B)とは混和しにくい成分であり、一方で、化合物(D)とは共溶媒効果を有すると考えられる。よって、洗浄剤に含まれるジメチルスルホキシド(C)の含有割合は、洗浄剤に含まれる水酸化テトラメチルアンモニウム(A)および水(B)の合計の含有割合、ならびに化合物(D)の含有割合によって調整する。 Dimethyl sulfoxide (C) is a component that is difficult to mix with tetramethylammonium hydroxide (A) and water (B), while it is considered to have a cosolvent effect with compound (D). Therefore, the content ratio of dimethyl sulfoxide (C) contained in the cleaning agent depends on the total content ratio of tetramethylammonium hydroxide (A) and water (B) contained in the cleaning agent, and the content ratio of compound (D). adjust.
 洗浄剤中に含まれるジメチルスルホキシド(C)の含有割合は、通常、10~40質量%、好ましくは15~35質量%、より好ましくは20~35質量%である。
 前記範囲内であれば、ジメチルスルホキシド(C)は洗浄剤中に含まれる他の成分と良好に混和することができるため、白濁することなく透明な洗浄剤を得ることができ、その結果、仮固定材の残渣を良好に除去することができる。
The content ratio of dimethyl sulfoxide (C) contained in the cleaning agent is usually 10 to 40% by mass, preferably 15 to 35% by mass, and more preferably 20 to 35% by mass.
Within the above range, dimethyl sulfoxide (C) can be mixed well with other components contained in the cleaning agent, so that a transparent cleaning agent can be obtained without becoming cloudy. The fixing material residue can be removed satisfactorily.
<1-4>化合物(D)
 化合物(D)は、水(B)と混和するプロトン性の成分であり、ジメチルスルホキシド(C)の共溶媒として機能する成分である。
<1-4> Compound (D)
Compound (D) is a protic component that is miscible with water (B) and is a component that functions as a co-solvent for dimethyl sulfoxide (C).
 化合物(D)は、下記式(1)に示す化合物である。 Compound (D) is a compound represented by the following formula (1).
Figure JPOXMLDOC01-appb-C000005
Figure JPOXMLDOC01-appb-C000005
(式(1)中、R1は、炭素数1~3のアルカンジイル基を示し;nは1~3の整数を示し;nが2以上の場合、複数のR1はそれぞれ同じであっても異なっていてもよく;R2は炭素数1~6、好ましくは炭素数1~4のアルキル基を示す。) (In the formula (1), R 1 represents an alkanediyl group having 1 to 3 carbon atoms; n represents an integer of 1 to 3; and when n is 2 or more, the plurality of R 1 are the same. R 2 represents an alkyl group having 1 to 6 carbon atoms, preferably 1 to 4 carbon atoms.)
 化合物(D)としては、例えば、エチレングリコールモノメチルエーテル、エチレングリコールモノエチルエーテル、エチレングリコールモノプロピルエーテル、エチレングリコールモノブチルエーテル、エチレングリコールモノヘキシルエーテル、エチレングリコールモノ-2-エチルブチルエーテル等のエチレングリコールモノアルキルエーテル類;ジエチレングリコールモノメチルエーテル、ジエチレングリコールモノエチルエーテル、ジエチレングリコールモノプロピルエーテル、ジエチレングリコールモノブチルエーテル、ジエチレングリコールモノヘキシルエーテル等のジエチレングリコールモノアルキルエーテル類;プロピレングリコールモノエチルエーテル、プロピレングリコールモノプロピルエーテル、プロピレングリコールモノブチルエーテル、プロピレングリコールモノメチルエーテル等のプロピレングリコールモノアルキルエーテル類;およびジプロピレングリコールモノブチルエーテル、ジプロピレングリコールモノメチルエーテル、ジプロピレングリコールモノエチルエーテル、ジプロピレングリコールモノプロピルエーテル等のジプロピレングリコールモノアルキルエーテル類;が挙げられる。
 これらの中でも、ジプロピレングリコールモノアルキルエーテル類がジメチルスルホキシド(C)との共溶媒効果に優れ、仮固定材の残渣を良好に除去することができることから好ましい。
Examples of the compound (D) include ethylene glycol monomethyl ether, ethylene glycol monoethyl ether, ethylene glycol monopropyl ether, ethylene glycol monobutyl ether, ethylene glycol monohexyl ether, ethylene glycol mono-2-ethylbutyl ether, and the like. Alkyl ethers; diethylene glycol monoalkyl ethers such as diethylene glycol monomethyl ether, diethylene glycol monoethyl ether, diethylene glycol monopropyl ether, diethylene glycol monobutyl ether, diethylene glycol monohexyl ether; propylene glycol monoethyl ether, propylene glycol monopropyl ether, propylene glycol Propylene glycol monoalkyl ethers such as dimonobutyl ether and propylene glycol monomethyl ether; and dipropylene glycol monoalkyl ethers such as dipropylene glycol monobutyl ether, dipropylene glycol monomethyl ether, dipropylene glycol monoethyl ether and dipropylene glycol monopropyl ether And the like.
Among these, dipropylene glycol monoalkyl ethers are preferable because they are excellent in the cosolvent effect with dimethyl sulfoxide (C) and the residue of the temporary fixing material can be removed well.
 洗浄剤中に含まれる化合物(D)の含有割合は、通常、10~40質量%、好ましくは15~35質量%、より好ましくは15~30質量%である。
 前記範囲内であれば、化合物(D)は洗浄剤中に含まれる他の成分と良好に混和することができるため、白濁することなく透明な洗浄剤を得ることができ、その結果、仮固定材の残渣を良好に除去することができる。
The content ratio of the compound (D) contained in the cleaning agent is usually 10 to 40% by mass, preferably 15 to 35% by mass, more preferably 15 to 30% by mass.
Within the above range, compound (D) can be mixed well with other components contained in the cleaning agent, so that a transparent cleaning agent can be obtained without becoming cloudy, and as a result, temporarily fixed. The residue of the material can be removed well.
<1-5>その他成分
 本発明の洗浄剤は、本発明の洗浄剤の効果を失わない範囲で、必要に応じて、その他成分を含有することができる。前記その他成分としては、塩基(ただし、水酸化テトラメチルアンモニウム(A)を除く)、非プロトン性有機溶剤(ただし、ジメチルスルホキシド(C)を除く)、プロトン性有機溶剤(ただし、化合物(D)を除く)、防蝕剤および界面活性剤が挙げられる。
<1-5> Other Components The cleaning agent of the present invention can contain other components as needed within a range not losing the effect of the cleaning agent of the present invention. Examples of the other components include bases (excluding tetramethylammonium hydroxide (A)), aprotic organic solvents (excluding dimethyl sulfoxide (C)), protic organic solvents (excluding compound (D)) ), Corrosion inhibitors and surfactants.
 前記塩基は、水酸化テトラメチルアンモニウム(A)と同様に高炭素含有膜の表層にある親水膜の分解に用いられるものである。
 前記塩基としては、例えば、水酸化テトラエチルアンモニウム、水酸化テトラ-n-ブチルアンモニウム、および水酸化テトラフェニルアンモニウム等の水酸化4級アンモニウム;トリメタノールアミン等のアルカノールアミン;水酸化カリウム、炭酸水素カリウム、および炭酸ナトリウム等の無機塩基;トリエチルアミン、およびジエチルアミン等のアミン;が挙げられる。
The base is used for decomposing the hydrophilic film on the surface of the high carbon-containing film in the same manner as tetramethylammonium hydroxide (A).
Examples of the base include quaternary ammonium hydroxides such as tetraethylammonium hydroxide, tetra-n-butylammonium hydroxide, and tetraphenylammonium hydroxide; alkanolamines such as trimethanolamine; potassium hydroxide, potassium hydrogencarbonate And inorganic bases such as sodium carbonate; amines such as triethylamine and diethylamine.
 前記界面活性剤は、洗浄剤の仮固定材の残渣への濡れ性を改良するために用いられるものである。
 前記界面活性剤としては、例えば、ポリオキシアルキレンフェニルエーテル、ポリオキシアルキレンメチルフェニルエーテル、ポリオキシアルキレンオクチルフェニルエーテル、ポリオキシアルキレンノニルフェニルエーテル等の非イオン系界面活性剤;ドデシルベンゼンスルホン酸ナトリウム等のアルキルアリールスルホン酸塩などのアニオン系界面活性剤が挙げられる。
 洗浄剤中に含まれる、前記界面活性剤の含有割合は、通常、0.01~1質量%である。
The surfactant is used to improve the wettability of the cleaning agent to the residue of the temporary fixing material.
Examples of the surfactant include nonionic surfactants such as polyoxyalkylene phenyl ether, polyoxyalkylene methyl phenyl ether, polyoxyalkylene octyl phenyl ether, polyoxyalkylene nonyl phenyl ether; sodium dodecylbenzenesulfonate, and the like. And anionic surfactants such as alkylaryl sulfonates.
The content of the surfactant contained in the cleaning agent is usually 0.01 to 1% by mass.
<1-6>洗浄剤の使用形態
 本発明の洗浄剤は、分割して、組み合わせ製品とすることができる。例えば、洗浄剤の輸送においてその重量を減らすため、洗浄剤中に含まれる水(B)は水酸化テトラメチルアンモニウム(A)を溶かせる量だけにして、減らした分の水(B)を使用直前に混ぜる、組み合わせ製品とすることができる。
<1-6> Use form of cleaning agent The cleaning agent of the present invention can be divided into combined products. For example, in order to reduce the weight of the cleaning agent during transportation, the amount of water (B) contained in the cleaning agent is limited to the amount capable of dissolving tetramethylammonium hydroxide (A), and the reduced amount of water (B) is used. It can be a combined product that is mixed immediately before.
 本発明の洗浄剤には、酸化する可能性のあるジメチルスルホキシド(C)が含まれているため、本発明の洗浄剤は、窒素などの不活性ガスを封入して保管することが好ましい。 Since the cleaning agent of the present invention contains dimethyl sulfoxide (C) which can be oxidized, it is preferable to store the cleaning agent of the present invention by enclosing an inert gas such as nitrogen.
 本発明の洗浄剤中に含まれる金属を含む不純物(金属イオンも含む)の含有割合は、特に処理対象基板が半導体素子などの精密な基板である場合には、処理対象基板に悪影響を与えないためにできるだけ少ない方が好ましく、通常、1wtppm以下である。 The content ratio of impurities including metal (including metal ions) contained in the cleaning agent of the present invention does not adversely affect the substrate to be processed, particularly when the substrate to be processed is a precise substrate such as a semiconductor element. Therefore, it is preferably as small as possible and is usually 1 wtppm or less.
 本発明の洗浄剤のJIS Z8803(2011)による23℃での粘度は、通常、0.4~50mPa・s、好ましくは0.8~10mPa・sである。
 本発明の洗浄剤のJIS K2258-1(2009)による蒸気圧は、通常、100hPa以下、好ましくは40hPa以下である。前記範囲内であれば、高温での洗浄性の点に優れた洗浄剤となる。
 前記範囲内であれば、洗浄剤を仮固定材の残渣に均一に接触させることができることから、仮固定材の残渣を良好に除去することができる。
The viscosity of the cleaning agent of the present invention at 23 ° C. according to JIS Z8803 (2011) is usually 0.4 to 50 mPa · s, preferably 0.8 to 10 mPa · s.
The vapor pressure according to JIS K2258-1 (2009) of the cleaning agent of the present invention is usually 100 hPa or less, preferably 40 hPa or less. If it is in the said range, it will become the cleaning agent excellent in the point of the washing | cleaning property at high temperature.
If it is in the said range, since a cleaning agent can be made to contact the residue of a temporary fixing material uniformly, the residue of a temporary fixing material can be removed favorably.
<2>洗浄剤の製造方法
 本発明の洗浄剤は、水酸化テトラメチルアンモニウム(A)、水(B)、ジメチルスルホキシド(C)および化合物(D)を均一に混合すれことができれば、どのような順番で混合してもよいが、好ましくは、以下に記載する本発明の洗浄剤の製造方法が好ましい。
 なお、以下に各成分の使用量(質量部)を記載するが、これらは最終的に得られる洗浄剤を100質量部としたときの量である。
<2> Manufacturing method of cleaning agent The cleaning agent of the present invention can be mixed with tetramethylammonium hydroxide (A), water (B), dimethyl sulfoxide (C) and compound (D) uniformly. Although they may be mixed in any order, the method for producing the cleaning agent of the present invention described below is preferred.
In addition, although the usage-amount (mass part) of each component is described below, these are the quantity when the cleaning agent finally obtained is 100 mass parts.
 本発明の洗浄剤の製造方法は、水酸化テトラメチルアンモニウム(A)3~10質量部と水(B)20~60質量部を混合し水溶液を準備する工程(以下、「工程(I)」ともいう)、前記水溶液と化合物(D)を混合し混合液を形成する工程(以下、「工程(II)」ともいう)、および前記混合液とジメチルスルホキシド(C)を混合する工程(以下、「工程(III)」ともいう)、を有する。 The method for producing a cleaning agent of the present invention comprises a step of preparing an aqueous solution by mixing 3 to 10 parts by mass of tetramethylammonium hydroxide (A) and 20 to 60 parts by mass of water (B) (hereinafter referred to as “step (I)”). A step of mixing the aqueous solution and the compound (D) to form a mixed solution (hereinafter also referred to as “step (II)”), and a step of mixing the mixed solution and dimethyl sulfoxide (C) (hereinafter, referred to as “step (II)”). (Also referred to as “step (III)”).
 洗浄剤に含まれる水酸化テトラメチルアンモニウム(A)および水(B)と、ジメチルスルホキシド(C)とは、混和しにくいため、水酸化テトラメチルアンモニウム(A)および水(B)と、ジメチルスルホキシド(C)とを直接混ぜ合わせると、添加ショックにより均一に混和しない可能性がある。
 そのため、水酸化テトラメチルアンモニウム(A)および水(B)と、ジメチルスルホキシド(C)とを混ぜ合わせる前に、ジメチルスルホキシド(C)の共溶媒である化合物(D)を先に混ぜ合わせる。
 また、ジメチルスルホキシド(C)は、空気中の酸素による酸化を起こす可能性があるため、できるだけ空気と触れる時間を短くする。
Since tetramethylammonium hydroxide (A) and water (B) and dimethyl sulfoxide (C) contained in the detergent are difficult to mix, tetramethylammonium hydroxide (A) and water (B) and dimethyl sulfoxide When (C) is directly mixed, there is a possibility that it will not mix uniformly due to the addition shock.
Therefore, before the tetramethylammonium hydroxide (A) and water (B) are combined with the dimethyl sulfoxide (C), the compound (D) which is a co-solvent of the dimethyl sulfoxide (C) is first mixed.
Further, since dimethyl sulfoxide (C) may be oxidized by oxygen in the air, the time of contact with air is made as short as possible.
 本発明の洗浄剤の製造方法は、前記可能性を鑑みたものであり、つまり、前記工程(I)において、水酸化テトラメチルアンモニウム(A)および水(B)を混合して、水酸化テトラメチルアンモニウム(A)の水溶液を準備し、次いで、前記工程(II)において、化合物(D)を混合し、最後に前記工程(III)において、ジメチルスルホキシド(C)を混合することで、上記の可能性なく、本発明の洗浄剤を製造することができる。 The manufacturing method of the cleaning agent of the present invention is based on the above-mentioned possibility. That is, in the step (I), tetramethylammonium hydroxide (A) and water (B) are mixed and tetrahydroxide hydroxide is mixed. By preparing an aqueous solution of methylammonium (A), then mixing the compound (D) in the step (II) and finally mixing the dimethyl sulfoxide (C) in the step (III). Without any possibility, the cleaning agent according to the invention can be produced.
<2-1>工程(I)
 前記工程(I)では、撹拌翼を備えた容器に、水酸化テトラメチルアンモニウム(A)3~10質量部および水(B)20~60質量部を混合し水溶液を準備する。
 ここで、水酸化テトラメチルアンモニウム(A)は、通常、水溶液の状態で販売されているため、最終的に、水酸化テトラメチルアンモニウム(A)3~10質量部および水(B)20~60質量部となるように、水酸化テトラメチルアンモニウム(A)と水(B)を、撹拌翼により混合することにより行われる。
<2-1> Step (I)
In the step (I), an aqueous solution is prepared by mixing 3 to 10 parts by mass of tetramethylammonium hydroxide (A) and 20 to 60 parts by mass of water (B) in a vessel equipped with a stirring blade.
Here, since tetramethylammonium hydroxide (A) is usually sold in the form of an aqueous solution, finally, 3 to 10 parts by mass of tetramethylammonium hydroxide (A) and 20 to 60 water (B) are finally obtained. It is carried out by mixing tetramethylammonium hydroxide (A) and water (B) with a stirring blade so as to be part by mass.
 混合中の液温は、1気圧下において、通常、5~50℃、好ましくは15~35℃である。混合に際しては、前記水溶液中に含まれる溶存酸素量を減らすため、窒素などの不活性ガスをバブリングしながら混合するのが好ましい。 The liquid temperature during mixing is usually 5 to 50 ° C., preferably 15 to 35 ° C. under 1 atm. In mixing, in order to reduce the amount of dissolved oxygen contained in the aqueous solution, it is preferable to mix while bubbling an inert gas such as nitrogen.
<2-2>工程(II)
 工程(II)では、前記水溶液と化合物(D)を混合し混合液を形成する。
 混合に際しては、前記水溶液を撹拌しながら、化合物(D)を前記容器に投入することにより行われる。混合中の液温は、1気圧下において、通常、5~50℃、好ましくは15~35℃である。また、工程(I)と同じく、前記混合液中に含まれる溶存酸素量を減らすため、窒素などの不活性ガスをバブリングしながら混合するのが好ましい。
 化合物(D)の使用量は、通常、10~40質量部である。
<2-2> Step (II)
In step (II), the aqueous solution and compound (D) are mixed to form a mixed solution.
The mixing is performed by adding the compound (D) to the container while stirring the aqueous solution. The liquid temperature during mixing is usually 5 to 50 ° C., preferably 15 to 35 ° C. under 1 atm. Further, as in the step (I), in order to reduce the amount of dissolved oxygen contained in the mixed solution, it is preferable to mix while bubbling an inert gas such as nitrogen.
The amount of compound (D) to be used is usually 10 to 40 parts by mass.
 また、前記その他成分を洗浄剤中に含有させる場合、通常、工程(II)の前後に前記その他成分を混合する。 In addition, when the other components are included in the cleaning agent, the other components are usually mixed before and after the step (II).
<2-3>工程(III)
 工程(III)では、前記混合液とジメチルスルホキシド(C)を混合する。
 混合に際しては、前記水溶液を撹拌しながら、ジメチルスルホキシド(C)を前記容器に投入することにより行われる。
 ジメチルスルホキシド(C)の使用量は、通常、10~40質量部である。
<2-3> Step (III)
In step (III), the mixed solution and dimethyl sulfoxide (C) are mixed.
In mixing, the dimethyl sulfoxide (C) is put into the container while stirring the aqueous solution.
The amount of dimethyl sulfoxide (C) used is usually 10 to 40 parts by mass.
 水酸化テトラメチルアンモニウム(A)および水(B)と、ジメチルスルホキシド(C)とは混和しにくいことから、ジメチルスルホキシド(C)を投入する際には、ジメチルスルホキシド(C)の投入全量を小分割して投入することが好ましい。 Tetramethylammonium hydroxide (A) and water (B) are not miscible with dimethyl sulfoxide (C). Therefore, when adding dimethyl sulfoxide (C), the total amount of dimethyl sulfoxide (C) is small. It is preferable to divide and input.
 混合中の液温は、1気圧下において、通常、5~50℃、好ましくは15~35℃である。また、工程(I)と同じく、前記混合液中に含まれる溶存酸素量を減らすため、窒素などの不活性ガスをバブリングしながら混合するのが好ましい。 The liquid temperature during mixing is usually 5 to 50 ° C., preferably 15 to 35 ° C. under 1 atm. Further, as in the step (I), in order to reduce the amount of dissolved oxygen contained in the mixed solution, it is preferable to mix while bubbling an inert gas such as nitrogen.
 工程(III)の後、混合液をエージングすることができ、通常、5~50℃で12時間以上、好ましくは15~35℃で24時間以上、エージングすることで貯蔵安定性に優れた洗浄剤を製造することができる。
 本発明の洗浄剤には、水酸化テトラメチルアンモニウム(A)とジメチルスルホキシド(C)が含まれているため、水酸化テトラメチルアンモニウム(A)の水酸化アニオンと、分極したジメチルスルホキシド(C)がイオン結合した化合物(AC)を形成している可能性がある。
After step (III), the mixed solution can be aged, and usually a detergent having excellent storage stability by aging at 5 to 50 ° C. for 12 hours or longer, preferably 15 to 35 ° C. for 24 hours or longer. Can be manufactured.
Since the cleaning agent of the present invention contains tetramethylammonium hydroxide (A) and dimethyl sulfoxide (C), the hydroxide anion of tetramethylammonium hydroxide (A) and polarized dimethyl sulfoxide (C) May form an ion-bonded compound (AC).
 前記エージングを行うことにより、貯蔵安定性に優れた洗浄剤を製造できるものと推定される。 It is presumed that a detergent having excellent storage stability can be produced by performing the aging.
 以上により、本発明の洗浄剤は、水酸化テトラメチルアンモニウム(A)とジメチルスルホキシド(C)のどちらか一方、または、その両方が含まれず、化合物(AC)が含まれている場合も、本発明の洗浄剤である。 As described above, the cleaning agent of the present invention does not contain one or both of tetramethylammonium hydroxide (A) and dimethyl sulfoxide (C), and even when compound (AC) is contained. It is a cleaning agent of the invention.
 また、工程(III)の後、不純物を取り除くために、カプセルフィルターなどの濾過を行うことができる。 Further, after the step (III), filtration such as a capsule filter can be performed in order to remove impurities.
<3>対象物の処理方法
 本発明において仮固定材とは、処理対象物を加工および/または移動するに際して、支持体から対象物がずれて動かないように支持体上に対象物を仮固定するために用いられる材料のことである。処理対象物とは、後述する工程(2)での加工処理や移動処理を受ける対象物を意味し(例えば後述する工程(1)や(2)での段階)、また、前記処理を受けた後の対象物を意味する場合もある(例えば後述する工程(3)や(4)での段階)。以下、処理対象物を単に「対象物」ともいう。
<3> Method for processing an object In the present invention, the temporarily fixing material means that an object is temporarily fixed on a support so that the object does not move due to being shifted from the support when the object to be processed is processed and / or moved. It is the material used to do. The object to be processed means an object to be subjected to a processing process or a movement process in a process (2) described later (for example, a stage in the process (1) or (2) described later), and the process has been received. It may mean a later object (for example, a stage in steps (3) and (4) described later). Hereinafter, the processing object is also simply referred to as “object”.
 本発明の対象物の処理方法は、支持体と仮固定材と処理対象物とを有する積層体を形成する工程(以下、「工程(1)」ともいう)、ここで前記対象物は前記仮固定材上に保持されており;前記対象物を加工し、および/または前記積層体を移動する工程(以下、「工程(2)」ともいう);前記対象物を前記支持体から分離する工程(以下、「工程(3)ともいう」;ならびに前記対象物を、本発明の洗浄剤で洗浄する工程(以下、「工程(4)」ともいう);を有することを特徴とする。その一実施態様を図1に示す。 The method for treating an object of the present invention includes a step of forming a laminate having a support, a temporary fixing material, and an object to be treated (hereinafter also referred to as “step (1)”), wherein the object is the temporary A step of processing the object and / or moving the laminate (hereinafter also referred to as “step (2)”); a step of separating the object from the support; (Hereinafter also referred to as “step (3)”), and a step of cleaning the object with the cleaning agent of the present invention (hereinafter also referred to as “step (4)”). An embodiment is shown in FIG.
<3-1>工程(1)
 工程(1)では、図1(1)に示すように、例えば、支持体10および/または対象物20の表面に、前記仮固定材30を形成し、前記仮固定材30を介して対象物20と支持体10とを貼り合せることにより、対象物20を支持体10上に仮固定し積層体40を形成する。また、支持体10の表面に、前記仮固定材30を形成し、前記仮固定材30上に樹脂塗膜、配線層等の対象物を形成することにより、対象物20を支持体10上に仮固定してもよい。対象物は、必要に応じて表面処理することができる。
<3-1> Step (1)
In the step (1), as shown in FIG. 1 (1), for example, the temporary fixing material 30 is formed on the surface of the support 10 and / or the object 20, and the object is interposed via the temporary fixing material 30. The object 20 is temporarily fixed on the support 10 by laminating 20 and the support 10 to form the laminate 40. Further, the temporary fixing material 30 is formed on the surface of the support 10, and an object such as a resin coating film or a wiring layer is formed on the temporary fixing material 30, whereby the target 20 is placed on the support 10. It may be temporarily fixed. The object can be surface-treated as necessary.
 前記仮固定材は、1層からなる仮固定材であっても2層以上からなる仮固定材であってもよく、また、前記仮固定材の形成方法としては、例えば、仮固定材が有する各層を、支持体上および/または対象物上に直接形成する方法、離型処理が施されたフィルム上に仮固定用組成物を用いて一定膜厚で成膜した後、各層を支持体および/または対象物へラミネート方式により転写する方法が挙げられる。膜厚均一性の点から、前記直接形成する方法が好ましい。 The temporary fixing material may be a temporary fixing material consisting of one layer or a temporary fixing material consisting of two or more layers, and as a method of forming the temporary fixing material, for example, the temporary fixing material has A method of directly forming each layer on a support and / or an object, after forming a film with a fixed thickness on a film subjected to a release treatment using a temporary fixing composition, And / or a method of transferring to an object by a laminating method. From the viewpoint of film thickness uniformity, the direct forming method is preferable.
 仮固定材を対象物上に形成するに際して、仮固定材の面内への広がりを均一にするため、対象物面(例えば回路面)を予め表面処理することもできる。表面処理の方法としては、例えば、対象物面に予め表面処理剤を塗布する方法が挙げられる。表面処理剤としては、例えば、シランカップリング剤等のカップリング剤が挙げられる。 When forming the temporarily fixed material on the object, the surface of the object (for example, the circuit surface) can be pretreated in order to make the spread of the temporarily fixed material in the surface uniform. Examples of the surface treatment method include a method in which a surface treatment agent is applied to the surface of an object in advance. Examples of the surface treatment agent include a coupling agent such as a silane coupling agent.
 仮固定用組成物の塗布方法としては、例えば、スピンコート法、インクジェット法が挙げられる。仮固定用組成物を塗布して塗膜を形成した後は、必要に応じて加熱して、溶剤を揮発させることにより、仮固定材の各層を形成する。加熱の条件は、仮固定用組成物の種類に応じて適宜決定され、例えば、加熱温度が通常は100~350℃であり、加熱時間が通常は1~60分である。 Examples of the method for applying the temporary fixing composition include a spin coating method and an ink jet method. After the temporary fixing composition is applied and a coating film is formed, each layer of the temporary fixing material is formed by heating as necessary to volatilize the solvent. The heating conditions are appropriately determined according to the type of the temporary fixing composition. For example, the heating temperature is usually 100 to 350 ° C., and the heating time is usually 1 to 60 minutes.
 対象物と支持体との仮固定材を介した仮固定は、例えば、好ましくは5~400℃、より好ましくは150~400℃で1~20分間、0.01~100MPaの圧力を各層の積層方向に付加することにより行う。さらに必要に応じて、150~300℃で10分~3時間加熱処理する。このようにして、対象物が支持体上に仮固定材を介して強固に仮固定される。 The temporary fixing of the object and the support via the temporary fixing material is performed by, for example, preferably laminating each layer with a pressure of 0.01 to 100 MPa for 1 to 20 minutes at 5 to 400 ° C., more preferably 150 to 400 ° C. By adding in the direction. Further, if necessary, heat treatment is performed at 150 to 300 ° C. for 10 minutes to 3 hours. In this way, the object is firmly fixed on the support via the temporary fixing material.
 仮固定用組成物および仮固定材としては、公知の仮固定用組成物および仮固定材が挙げられ、例えば、日本特開特許第2013-235919号公報、国際公開第2015/079863号公報、日本公開特許第2013-179135号公報、米国公開特許第2012/291938号公報、および米国公開特許第2011/065257号公報等、の機械的力により前記対象物を前記支持体から分離するタイプの仮固定用組成物および仮固定材;ならびに日本公開特許第2012-052031号公報、国際公開第2017/056662号公報、米国公開特許第2007/077685号公報、日本公開特許第2012-106486号公報、および日本公開特許第2016-215394号公報に記載の光照射により仮固定材を変質させることにより前記対象物を前記支持体から分離するタイプの仮固定用組成物および仮固定材(光照射型仮固定材)が挙げられる。
 これらの中でも、好ましくは光照射型仮固定材、より好ましくは光がレーザー光による光照射型仮固定材であり、その理由は、工程(4)において、より高炭素の残渣を洗浄することになることから、本発明の洗浄剤の効果をより利用することができるからである。
Examples of the temporary fixing composition and the temporary fixing material include known temporary fixing compositions and temporary fixing materials. For example, Japanese Patent Application Laid-Open No. 2013-235919, International Publication No. 2015/077983, Japan Temporary fixing of the type in which the object is separated from the support by mechanical force such as published patent 2013-179135, published US 2012/291919, and published US 2011/065257 Composition and temporary fixing material; and Japanese Patent Publication No. 2012-052031, International Publication No. 2017/056662, U.S. Publication No. 2007/077685, Japanese Publication No. 2012-106486, and Japan Temporary fixing material is altered by light irradiation as described in Japanese Patent Publication No. 2016-215394. The object of the temporary fixing composition of the type separating from the support and the temporary fixing material (light-irradiating temporary fixing material) and the like by causing.
Among these, preferably a light irradiation type temporary fixing material, more preferably light is a light irradiation type temporary fixing material by laser light, and the reason is that in step (4), a higher carbon residue is washed. This is because the effect of the cleaning agent of the present invention can be utilized more.
 加工(移動)対象である前記処理対象物としては、例えば、半導体ウエハ、半導体チップ、ガラス基板、樹脂基板、金属基板、金属箔、研磨パッド、樹脂塗膜、配線層が挙げられる。半導体ウエハおよび半導体チップには、バンプ、配線、スルーホール、スルーホールビア、絶縁膜および各種の素子から選ばれる少なくとも1種が形成することができる。前記基板には、各種の素子が形成または搭載することができる。樹脂塗膜としては、例えば、有機成分を主成分として含有する層が挙げられ;具体的には、感光性材料から形成される感光性樹脂層、絶縁性材料から形成される絶縁性樹脂層、感光性絶縁樹脂材料から形成される感光性絶縁樹脂層が挙げられる。 Examples of the object to be processed (moved) include a semiconductor wafer, a semiconductor chip, a glass substrate, a resin substrate, a metal substrate, a metal foil, a polishing pad, a resin coating, and a wiring layer. At least one selected from bumps, wirings, through holes, through hole vias, insulating films, and various elements can be formed on the semiconductor wafer and the semiconductor chip. Various elements can be formed or mounted on the substrate. Examples of the resin coating include a layer containing an organic component as a main component; specifically, a photosensitive resin layer formed from a photosensitive material, an insulating resin layer formed from an insulating material, A photosensitive insulating resin layer formed from a photosensitive insulating resin material can be used.
 前記支持体としては、前記処理対象物を加工および/または移動するに際して、毀損や変質が起こらないものであればどのようなものであってもよく、例えば、シリコンウエハ基板、サファイア基板、ガラス基板、石英基板および透明樹脂製基板が挙げられる。特に工程(3)において、光照射により仮固定材を変質させることにより前記対象物を前記支持体から分離する仮固定材を用いる場合、支持体としては、支持体側から光照射して仮固定材を変質させることが好ましいため、光照射で用いられる光に対して透過率の高い基板が好ましく、例えば、ガラス基板、石英基板および透明樹脂基板が挙げられる。 The support may be any material as long as it does not cause damage or alteration when the object to be processed is processed and / or moved, such as a silicon wafer substrate, a sapphire substrate, or a glass substrate. And quartz substrate and transparent resin substrate. In particular, in the step (3), when using a temporarily fixing material that separates the object from the support by altering the temporarily fixed material by light irradiation, the support is irradiated with light from the support side to temporarily fix the material. Therefore, it is preferable to use a substrate having a high transmittance with respect to light used in light irradiation, and examples thereof include a glass substrate, a quartz substrate, and a transparent resin substrate.
<3-2>工程(2)
 工程(2)は、図1(2)に示すように、支持体10上に仮固定された対象物20を加工して加工後の対象物21を得る、および/または得られた積層体41を移動する工程である。移動工程は、半導体ウエハ等の対象物を、ある装置から別の装置へ支持体とともに移動する工程である。支持体上に仮固定された対象物の加工処理としては、例えば、対象物のダイシング、対象物の薄化(裏面研削等)、フォトファブリケーション、半導体ウエハ又はチップの積層、各種素子の搭載、樹脂封止が挙げられる。フォトファブリケーションは、例えば、レジストパターンの形成、エッチング加工、スパッタ膜の形成、メッキ処理およびメッキリフロー処理から選ばれる1つ以上の処理を含む。
<3-2> Step (2)
In the step (2), as shown in FIG. 1 (2), the object 20 temporarily fixed on the support 10 is processed to obtain the processed object 21, and / or the obtained laminate 41 is obtained. It is a process of moving. The moving process is a process of moving an object such as a semiconductor wafer together with a support from one apparatus to another apparatus. Examples of processing of the object temporarily fixed on the support include dicing of the object, thinning of the object (backside grinding, etc.), photofabrication, stacking of semiconductor wafers or chips, mounting of various elements, Resin sealing is mentioned. The photofabrication includes, for example, one or more processes selected from resist pattern formation, etching processing, sputtered film formation, plating process, and plating reflow process.
<3-3>工程(3)
 対象物の加工処理または積層体の移動後、工程(3)では、図1(3)に示すように、前記加工後の対象物21を前記支持体10から分離する。対象物と支持体との分離方法としては、例えば、支持体面または対象物面に対して平行方向に対象物または支持体に力を付加して両者を分離する方法;対象物または支持体の一方を固定し、他方を支持体面または対象物面に対して平行方向から一定の角度を付けて持ち上げることで両者を分離する方法が挙げられる。
<3-3> Step (3)
After the processing of the object or the movement of the laminate, in step (3), the processed object 21 is separated from the support 10 as shown in FIG. Examples of the method for separating the object and the support include, for example, a method in which a force is applied to the object or the support in a direction parallel to the support surface or the object surface to separate the two; one of the object or the support Is fixed, and the other is lifted at a certain angle from the parallel direction with respect to the support surface or the object surface to separate the two.
 前者の方法では、対象物を支持体の表面に対して水平方向にスライドさせると同時に、支持体を固定する、または前記対象物に付加される力に拮抗する力を支持体に付加することによって、支持体と対象物とを分離する方法が挙げられる。 In the former method, the object is slid horizontally with respect to the surface of the support, and at the same time, the support is fixed, or a force that antagonizes the force applied to the object is applied to the support. And a method of separating the support and the object.
 後者の方法では、支持体面または対象物面に対して略垂直方向に力を付加して、支持体と対象物とを分離することが好ましい。「支持体面または対象物面に対して略垂直方向に力を付加する」とは、支持体面または対象物面に対して垂直な軸であるz軸に対して、通常は0°~60°の範囲、好ましくは0°~45°の範囲、特に好ましくは0°、すなわち支持体面または対象物面に対して垂直の方向に力を付加することを意味する。分離方式としては、例えば、対象物または支持体の周縁を持ち上げ、支持体面または対象物面に対して略垂直方向に力を加えながら、前記周縁から中心に向けて順に剥離する方法(フックプル方式)で行うことができる。 In the latter method, it is preferable to separate the support and the object by applying a force in a direction substantially perpendicular to the support surface or the object surface. “Applying a force in a direction substantially perpendicular to the support surface or the object surface” means that the z axis, which is an axis perpendicular to the support surface or the object surface, is usually 0 ° to 60 °. It means to apply a force in the range, preferably in the range 0 ° to 45 °, particularly preferably 0 °, ie perpendicular to the support surface or the object surface. As the separation method, for example, a method in which the peripheral edge of the object or the support is lifted and peeled in order from the peripheral edge toward the center while applying a force in a direction substantially perpendicular to the support surface or the object surface (hook-pull method). Can be done.
 前記分離は、通常は5~100℃、好ましくは10~45℃、さらに好ましくは15~30℃で行うことができる。また、分離をする際、対象物の破損を防ぐため、対象物における支持体との仮止め面と反対側の面に補強テープ、例えば市販のダイシングテープを貼付することができる。 The separation can be performed usually at 5 to 100 ° C., preferably 10 to 45 ° C., more preferably 15 to 30 ° C. Moreover, when separating, in order to prevent damage to the object, a reinforcing tape, for example, a commercially available dicing tape, can be applied to the surface of the object opposite to the temporary fixing surface with the support.
 工程(3)では、前記仮固定材に光照射して前記仮固定材を分解または変質させることにより、仮固定材の強度および接着力を低減させた後、前記対象物を前記支持体から分離することが好ましい。一実施態様において、仮固定材に、支持体側から、光照射する。光照射により、仮固定材の含有成分が光を吸収し、仮固定材の強度および接着力が低下する。したがって、仮固定材に対する光照射後であれば、仮固定材の加熱処理を特に必要とすることなく、対象物から支持体を容易に分離することができる。 In the step (3), the temporary fixing material is irradiated with light to decompose or alter the temporary fixing material, thereby reducing the strength and adhesive force of the temporary fixing material, and then separating the object from the support. It is preferable to do. In one embodiment, the temporary fixing material is irradiated with light from the support side. By light irradiation, the components contained in the temporary fixing material absorb light, and the strength and adhesive strength of the temporary fixing material are reduced. Therefore, if it is after the light irradiation with respect to a temporarily fixed material, a support body can be easily isolate | separated from a target object, without specifically requiring the heat processing of a temporarily fixed material.
 光照射には紫外線を用いることが好ましく、例えば波長10~400nmの紫外線が採用され、波長250~400nmの紫外線が特に好ましい。照射光の光源としては、例えば、低圧水銀灯、高圧水銀灯、超高圧水銀灯、レーザーが挙げられる。これらの中でも、レーザーが好ましい。支持体側から、レーザーを走査させながら仮固定材の全面に照射することが好ましく、レーザーを仮固定材に焦点を絞って照射することがより好ましい。 For the light irradiation, ultraviolet rays are preferably used. For example, ultraviolet rays having a wavelength of 10 to 400 nm are employed, and ultraviolet rays having a wavelength of 250 to 400 nm are particularly preferred. Examples of the light source of irradiation light include a low-pressure mercury lamp, a high-pressure mercury lamp, an ultrahigh-pressure mercury lamp, and a laser. Among these, a laser is preferable. It is preferable to irradiate the entire surface of the temporarily fixed material while scanning the laser from the support side, and it is more preferable to irradiate the laser to the temporarily fixed material with a focus.
 レーザーとしては、例えば、固体レーザー(例:光励起半導体レーザーを用いた全固体レーザー、YAGレーザー)、液体レーザー(例:色素レーザー)、ガスレーザー(例:エキシマレーザー)が挙げられる。これらの中でも、YAGレーザー(波長:355nm)およびエキシマレーザー(波長:200~310nm)が好ましい。 Examples of the laser include a solid laser (eg, all solid laser using a photoexcited semiconductor laser, YAG laser), a liquid laser (eg, dye laser), and a gas laser (eg, excimer laser). Among these, YAG laser (wavelength: 355 nm) and excimer laser (wavelength: 200 to 310 nm) are preferable.
 光照射の条件は光源等の種類によって異なるが、光励起半導体レーザーを用いた全固体レーザー、およびYAGレーザーの場合、通常は1mW~100W、積算光量が通常は1.4×10-7~1.4×107mJ/cm2である。 The light irradiation conditions vary depending on the type of light source and the like, but in the case of an all-solid-state laser using a light-excited semiconductor laser and a YAG laser, it is usually 1 mW to 100 W, and the integrated light quantity is usually 1.4 × 10 −7 to 1. 4 × 10 7 mJ / cm 2 .
 続いて、対象物または支持体に力を付加することで、前記対象物を前記支持体から剥離するなどして両者を分離する。なお、光照射を終えた後に分離を行うことが好ましいが、光照射を行いながら分離を行うことができる。 Subsequently, by applying a force to the object or the support, the object is separated from the support by separating the object from the support. Note that separation is preferably performed after the light irradiation, but the separation can be performed while performing the light irradiation.
<3-4>工程(4)
 工程(4)は、本発明の洗浄剤50で洗浄する工程である。支持体と対象物とを分離した後、通常、仮固定材が対象物上に残存する。分離工程後の対象物上に残存する仮固定材、すなわち仮固定材の残渣31は、上述に記載のとおり、本発明の洗浄剤を用いることで良好に除去することができる。
<3-4> Step (4)
Step (4) is a step of cleaning with the cleaning agent 50 of the present invention. After separating the support and the object, the temporary fixing material usually remains on the object. The temporary fixing material remaining on the object after the separation step, that is, the residue 31 of the temporary fixing material can be favorably removed by using the cleaning agent of the present invention as described above.
 洗浄方法としては、例えば、図1(4)に示すように、対象物を本発明の洗浄剤に浸漬する方法、および対象物に本発明の洗浄剤をスプレーする方法が挙げられ、前記浸漬時に超音波を加えてもよい。対象物を洗浄する際の洗浄剤の温度は特に限定されないが、通常は10~80℃、好ましくは15~55℃、より好ましくは20~40℃、さらに好ましくは25~40℃である。洗浄時間、例えば浸漬時間は、通常は2~20分、好ましくは5~15分である。 Examples of the cleaning method include a method of immersing an object in the cleaning agent of the present invention and a method of spraying the cleaning agent of the present invention on the object as shown in FIG. Ultrasound may be applied. The temperature of the cleaning agent for cleaning the object is not particularly limited, but is usually 10 to 80 ° C., preferably 15 to 55 ° C., more preferably 20 to 40 ° C., and further preferably 25 to 40 ° C. The washing time, for example, the immersion time is usually 2 to 20 minutes, preferably 5 to 15 minutes.
 また、一実施態様において、上述した処理対象物の劣化を防止するという観点から、本発明の洗浄剤の溶存酸素量は小さいことが好ましい。このため、窒素等の不活性ガスによりバブリング処理した本発明の洗浄剤を用いて、上記洗浄を行うことが好ましい。例えば、対象物を本発明の洗浄剤に浸漬する方法において、洗浄剤を前記バブリング処理しながら上記洗浄を行うことが好ましい。 In one embodiment, the dissolved oxygen content of the cleaning agent of the present invention is preferably small from the viewpoint of preventing the above-described processing object from deteriorating. For this reason, it is preferable to perform the said washing | cleaning using the cleaning agent of this invention bubble-treated with inert gas, such as nitrogen. For example, in the method of immersing an object in the cleaning agent of the present invention, it is preferable that the cleaning is performed while the cleaning agent is subjected to the bubbling treatment.
 工程(4)では、本発明の洗浄剤を用いて洗浄した後に、他の洗浄剤を用いて処理対象物を洗浄することができる。一実施態様では、本発明の洗浄剤による洗浄、水による洗浄、酸洗浄剤による洗浄、水による洗浄を順次行う。 In step (4), the object to be treated can be cleaned using another cleaning agent after being cleaned using the cleaning agent of the present invention. In one embodiment, cleaning with the cleaning agent of the present invention, cleaning with water, cleaning with an acid cleaning agent, and cleaning with water are sequentially performed.
 酸洗浄剤における酸としては、例えば、硫酸等の無機酸;酢酸、シュウ酸、ベンゼンスルホン酸、ドデシルベンゼンスルホン酸等の有機酸が挙げられる。酸洗浄剤中の酸の含有割合は、通常は0質量%を超えて10質量%以下、好ましくは0.001~8質量%、より好ましくは0.01~1質量%である。このような態様であると、金属の腐食を抑制しつつ洗浄できることから好ましい。 Examples of the acid in the acid detergent include inorganic acids such as sulfuric acid; organic acids such as acetic acid, oxalic acid, benzenesulfonic acid, and dodecylbenzenesulfonic acid. The acid content in the acid detergent is usually more than 0% by mass and 10% by mass or less, preferably 0.001 to 8% by mass, more preferably 0.01 to 1% by mass. Such an embodiment is preferable because cleaning can be performed while suppressing corrosion of the metal.
 酸洗浄剤における溶剤としては、本発明の洗浄剤において例示した溶剤が挙げられ、水が好ましく、すなわち酸洗浄剤としては酸水溶液が好ましい。酸洗浄剤を用いた洗浄方法としては、例えば、対象物を酸洗浄剤に浸漬する方法、対象物に酸洗浄剤をスプレーする方法が挙げられ、前記浸漬時に超音波を加えてもよい。酸洗浄剤の温度は特に限定されないが、通常は10~80℃、好ましくは15~55℃である。洗浄時間、例えば浸漬時間は、通常は0.02~15分、好ましくは0.5~10分である。 Examples of the solvent in the acid cleaning agent include the solvents exemplified in the cleaning agent of the present invention, and water is preferable. That is, an acid aqueous solution is preferable as the acid cleaning agent. Examples of the cleaning method using the acid cleaning agent include a method of immersing the object in the acid cleaning agent and a method of spraying the acid cleaning agent on the object, and ultrasonic waves may be applied during the immersion. The temperature of the acid detergent is not particularly limited, but is usually 10 to 80 ° C., preferably 15 to 55 ° C. The washing time, for example, the immersion time is usually 0.02 to 15 minutes, preferably 0.5 to 10 minutes.
 他の洗浄剤としては、本発明の洗浄剤において例示した各種溶剤が挙げられ、水が好ましい。他の洗浄剤を用いた洗浄方法および条件としては、酸洗浄剤を用いた洗浄方法および条件と同様である。 Examples of other cleaning agents include various solvents exemplified in the cleaning agent of the present invention, and water is preferable. The cleaning method and conditions using other cleaning agents are the same as the cleaning method and conditions using acid cleaners.
 以上の洗浄を行った後、乾燥処理して、処理対象物を得ることができる。
 以上のようにして、仮固定材の残渣の付着のない処理対象物を得ることができる。
After performing the above washing | cleaning, it can dry and can obtain a process target object.
As described above, it is possible to obtain an object to be processed that is free of residue of the temporarily fixing material.
<4>洗浄剤の使用用途
 本発明の洗浄剤は、高炭素含有膜などの親水性と疎水性の両方の性質をもった残渣を良好に除去することができることから、例えば、フォトファブリケーションにおける、被加工基板のエッチング、メッキ処理の後のフォトレジストの残渣や、仮固定材の残渣などの、除去の難しい残渣を良好に除去することができる。
<4> Uses of the cleaning agent The cleaning agent of the present invention can satisfactorily remove residues having both hydrophilic and hydrophobic properties such as a high carbon-containing film. Residues that are difficult to remove can be satisfactorily removed, such as residues of photoresist after etching and plating of the substrate to be processed and residues of temporary fixing materials.
 以下、本発明を実施例に基づいてさらに具体的に説明するが、本発明はこれら実施例に限定されない。以下の実施例等の記載において、特に言及しない限り、「部」は「質量部」を示す。 Hereinafter, the present invention will be described more specifically based on examples, but the present invention is not limited to these examples. In the following description of Examples and the like, “part” means “part by mass” unless otherwise specified.
[製造例1]仮固定用組成物の製造
 コンデンサー、温度計および攪拌装置を備えた反応装置に、フェノール100部、プロピレングリコールモノメチルエーテルアセテート100部、およびパラホルムアルデヒド50部(ホルムアルデヒド換算)を仕込み、シュウ酸2部を添加し、脱水しながら120℃で5時間加熱した。
 反応溶液に水を加え攪拌を行った。沈殿物を回収した後、水にて洗浄し、50℃にて17時間乾燥して、フェノール/ホルムアルデヒド縮合物(Mw=1,550)を得た。
 前記縮合物100部を、シクロヘキサノン/メトキシプロピルアセテート=60/40(質量%)の混合溶剤550部で均一に溶解し、仮固定用組成物を製造した。
[Production Example 1] Production of temporary fixing composition A reactor equipped with a condenser, a thermometer and a stirrer was charged with 100 parts of phenol, 100 parts of propylene glycol monomethyl ether acetate, and 50 parts of paraformaldehyde (in terms of formaldehyde). 2 parts of oxalic acid was added and heated at 120 ° C. for 5 hours while dehydrating.
Water was added to the reaction solution and stirred. After collecting the precipitate, it was washed with water and dried at 50 ° C. for 17 hours to obtain a phenol / formaldehyde condensate (Mw = 1,550).
100 parts of the condensate was uniformly dissolved with 550 parts of a mixed solvent of cyclohexanone / methoxypropyl acetate = 60/40 (mass%) to produce a temporary fixing composition.
[実施例1A]
 撹拌翼を備えた容器に、25℃で、35部の水、および25質量%水酸化テトラメチルアンモニウム水溶液を入れ撹拌した。撹拌しながら、化合物(D)として、22部のプロピレングリコールモノメチルエーテルを容器に入れ、次いで、27部のジメチルスルホキシドを少量ずつ入れた。25℃で1時間撹拌後、25℃で12時間エージングし、均一で透明な実施例1Aの洗浄剤を製造した。
 実施例1Aの洗浄剤中に含まれる成分の含有割合は、水酸化テトラメチルアンモニウム/水/ジメチルスルホキシド/プロピレングリコールモノメチルエーテル=4/47/27/22(質量%)であった。
[Example 1A]
In a container equipped with a stirring blade, 35 parts of water and a 25 mass% tetramethylammonium hydroxide aqueous solution were added and stirred at 25 ° C. While stirring, 22 parts of propylene glycol monomethyl ether as compound (D) was placed in a container, and then 27 parts of dimethyl sulfoxide was added in small portions. After stirring at 25 ° C. for 1 hour, the mixture was aged at 25 ° C. for 12 hours to produce a uniform and transparent cleaning agent of Example 1A.
The content ratio of the components contained in the cleaning agent of Example 1A was tetramethylammonium hydroxide / water / dimethylsulfoxide / propylene glycol monomethyl ether = 4/47/27/22 (mass%).
[実施例2A~10A、および比較例1A~11A]
 実施例1Aと同様の手順にて、表1に示す、各成分およびその含有割合で含有する、実施例2A~10A、比較例1A~11Aの洗浄剤を製造した。表1中の数値の単位は質量%である。
[Examples 2A to 10A and Comparative Examples 1A to 11A]
In the same procedure as in Example 1A, the cleaning agents of Examples 2A to 10A and Comparative Examples 1A to 11A containing the respective components and the content ratios shown in Table 1 were produced. The unit of numerical values in Table 1 is mass%.
Figure JPOXMLDOC01-appb-T000006
Figure JPOXMLDOC01-appb-T000006
 表1中の各成分の詳細は以下のとおりである。
TMAH:水酸化テトラメチルアンモニウム
TEAH:水酸化テトラエチルアンモニウム
DIW:水
DMSO:ジメチルスルホキシド
PGME:プロピレングリコールモノメチルエーテル
dEGBE:ジエチレングリコールモノブチルエーテル
dPGBE:ジプロピレングリコールモノメチルエーテル
PG:プロピレングリコール
PGMEA:プロピレングリコールモノメチルエーテルアセテート
PGdME:プロピレングリコールジメチルエーテル
Details of each component in Table 1 are as follows.
TMAH: Tetramethylammonium hydroxide TEAH: Tetraethylammonium hydroxide DIW: Water DMSO: Dimethyl sulfoxide PGME: Propylene glycol monomethyl ether dEGBE: Diethylene glycol monobutyl ether dPGBE: Dipropylene glycol monomethyl ether PG: Propylene glycol PGMEA: Propylene glycol monomethyl ether acetate PGdME : Propylene glycol dimethyl ether
<対象物の処理>
[実施例1B]
<Processing of the object>
[Example 1B]
4インチのシリコンウエハに製造例1の仮固定用組成物をスピンコートし、ホットプレートを用いて180℃で1分間加熱した後にさらに300℃で2分間加熱し、厚さ10μmの均一な層(I)を有する基板1を得た。
 前記基板1を縦1cm、横1cmの正方形に切断した後、層(I)を介して、ガラス基板(縦1cm、横1cmの正方形;支持体)と貼り合わせ、ダイボンダー装置を用いて、250℃で0.2MPaの圧力を2分間加え、積層体を製造した。
A 4-inch silicon wafer was spin-coated with the composition for temporary fixing of Production Example 1, heated at 180 ° C. for 1 minute using a hot plate, and further heated at 300 ° C. for 2 minutes to form a uniform layer having a thickness of 10 μm ( A substrate 1 having I) was obtained.
After the substrate 1 was cut into a square of 1 cm in length and 1 cm in width, it was bonded to a glass substrate (a square of 1 cm in length and 1 cm in width; a support) through the layer (I), and 250 ° C. using a die bonder device. Then, a pressure of 0.2 MPa was applied for 2 minutes to produce a laminate.
前記積層体に、全固体高出力レーザー装置(商品名「GenesisCX355 STM Compact」、コヒレント・ジャパン(株)製)にて、出力100mW、積算光量2.08×10-4mJ/cm2でガラス基板側からUVレーザー(波長355nm)を照射した。光照射後の試験用積層体に対して、万能ボンドテスター(商品名「デイジ4000」、デイジ社製)を用いて、フックプル方式で、ガラス基板面に対して垂直な軸(z軸)方向に力(500μm/秒の速度、23℃)を付加し、シリコンウエハからガラス基板を分離した。シリコンウエハ上に層(I)の残渣を有する残渣基板を得た。 A glass substrate with an output of 100 mW and an integrated light amount of 2.08 × 10 −4 mJ / cm 2 is applied to the laminate using an all-solid-state high-power laser device (trade name “Genesis CX355 STM Compact”, manufactured by Coherent Japan Co., Ltd.). UV laser (wavelength 355 nm) was irradiated from the side. Using a universal bond tester (trade name “Daily 4000”, manufactured by Daisy) for the test laminate after light irradiation, in the direction of the axis (z axis) perpendicular to the glass substrate surface by the hook-pull method. A glass substrate was separated from the silicon wafer by applying a force (speed of 500 μm / second, 23 ° C.). A residue substrate having a residue of layer (I) on a silicon wafer was obtained.
 容器に実施例1Aの洗浄剤を入れ、スターラーチップにて250rpmで撹拌しながら、上記残渣基板を25℃で5分間浸漬した。次いで、シリコンウエハの表面を純水で2分間吹き付けて洗い流し、次いで乾燥した。
 乾燥後の残渣の有無を光学顕微鏡で観察し、ウエハの表面の残渣の除去面積率を測定した。光学顕微鏡による残渣の除去面積率の結果は、以下の基準にて評価した。評価結果を表2に示す。
AA:残渣が80%以上剥がれている。
BB:残渣が40%以上、80%未満剥がれている。
CC:残渣が40%未満剥がれているか、剥がれていない。
The cleaning agent of Example 1A was put in a container, and the residue substrate was immersed at 25 ° C. for 5 minutes while stirring at 250 rpm with a stirrer chip. Next, the surface of the silicon wafer was washed away by spraying with pure water for 2 minutes and then dried.
The presence or absence of the residue after drying was observed with an optical microscope, and the removal area ratio of the residue on the surface of the wafer was measured. The result of the removal area ratio of the residue with an optical microscope was evaluated according to the following criteria. The evaluation results are shown in Table 2.
AA: The residue is peeled off by 80% or more.
BB: The residue is peeled off by 40% or more and less than 80%.
CC: The residue is peeled off less than 40% or not peeled off.
[実施例2B~10B、および比較例1B~11B]
 実施例1Bにおいて、実施例1Aの洗浄剤の代わりに、それぞれ、実施例1A~10A、比較例1A~11Aの洗浄剤を用いた以外は、実施例1Bと同じ手順にて、対象物の処理を行い、残渣の除去面積率を測定し、実施例1Bと同じ基準にて評価した。評価結果を表2に示す。
[Examples 2B to 10B and Comparative Examples 1B to 11B]
In Example 1B, the treatment of the object was performed in the same procedure as Example 1B, except that the cleaning agents of Examples 1A to 10A and Comparative Examples 1A to 11A were used instead of the cleaning agent of Example 1A, respectively. And the removal area ratio of the residue was measured and evaluated according to the same criteria as in Example 1B. The evaluation results are shown in Table 2.
Figure JPOXMLDOC01-appb-T000007
Figure JPOXMLDOC01-appb-T000007
10:支持体
20:対象物
21:加工後の対象物
30:仮固定材
31:仮固定材の残渣
40:積層体
41:加工後の積層体
50:洗浄剤
10: Support 20: Object 21: Processed object 30: Temporary fixing material 31: Residue of temporary fixing material 40: Laminated body 41: Laminated body 50 after processing: Cleaning agent

Claims (5)

  1.  水酸化テトラメチルアンモニウム(A)を3~10質量%、水(B)を20~60質量%、ジメチルスルホキシド(C)、および下記式(1)に示す化合物(D)を、含有することを特徴とする洗浄剤。
    Figure JPOXMLDOC01-appb-C000001
    (式(1)中、R1は、炭素数1~3のアルカンジイル基を示し;nは1~3の整数を示し;nが2以上の場合、複数のR1はそれぞれ同じであっても異なっていてもよく;R2は炭素数1~6のアルキル基を示す。)
    Containing 3 to 10% by mass of tetramethylammonium hydroxide (A), 20 to 60% by mass of water (B), dimethyl sulfoxide (C), and compound (D) represented by the following formula (1) Characteristic cleaning agent.
    Figure JPOXMLDOC01-appb-C000001
    (In the formula (1), R 1 represents an alkanediyl group having 1 to 3 carbon atoms; n represents an integer of 1 to 3; and when n is 2 or more, the plurality of R 1 are the same. And R 2 represents an alkyl group having 1 to 6 carbon atoms.)
  2.  洗浄剤に含まれる前記ジメチルスルホキシド(C)の含有割合が10~40質量%である、請求項1に記載の洗浄剤。 The cleaning agent according to claim 1, wherein the content ratio of the dimethyl sulfoxide (C) contained in the cleaning agent is 10 to 40% by mass.
  3.  洗浄剤に含まれる前記式(1)に示す化合物(D)の含有割合が10~40質量%である、請求項1または2に記載の洗浄剤。 The cleaning agent according to claim 1 or 2, wherein the content of the compound (D) represented by the formula (1) contained in the cleaning agent is 10 to 40% by mass.
  4.  水酸化テトラメチルアンモニウム(A)3~10質量部と水(B)20~60質量部を混合し水溶液を準備する工程、前記水溶液と下記式(1)に示す化合物(D)を混合し混合液を形成する工程、および前記混合液とジメチルスルホキシド(C)を混合する工程、を有することを特徴とする洗浄剤の製造方法。
    Figure JPOXMLDOC01-appb-C000002
    (式(1)中、R1は、炭素数1~3のアルカンジイル基を示し;nは1~3の整数を示し;nが2以上の場合、複数のR1はそれぞれ同じであっても異なっていてもよく;R2は炭素数1~6のアルキル基を示す。)
    Step of preparing an aqueous solution by mixing 3 to 10 parts by mass of tetramethylammonium hydroxide (A) and 20 to 60 parts by mass of water (B), mixing and mixing the aqueous solution and the compound (D) represented by the following formula (1) The manufacturing method of the cleaning agent characterized by having the process of forming a liquid, and the process of mixing the said liquid mixture and dimethylsulfoxide (C).
    Figure JPOXMLDOC01-appb-C000002
    (In the formula (1), R 1 represents an alkanediyl group having 1 to 3 carbon atoms; n represents an integer of 1 to 3; and when n is 2 or more, the plurality of R 1 are the same. And R 2 represents an alkyl group having 1 to 6 carbon atoms.)
  5. (1)支持体と仮固定材と処理対象物とを有する積層体を形成する工程、ここで前記対象物は前記仮固定材上に保持されており;
    (2)前記対象物を加工し、および/または前記積層体を移動する工程;
    (3)前記対象物を前記支持体から分離する工程;ならびに
    (4)前記対象物を、請求項1~3のいずれかに記載の洗浄剤で洗浄する工程;
    を有することを特徴とする対象物の処理方法。
    (1) A step of forming a laminate having a support, a temporarily fixing material, and a processing object, wherein the object is held on the temporarily fixing material;
    (2) processing the object and / or moving the laminate;
    (3) a step of separating the object from the support; and (4) a step of washing the object with the cleaning agent according to any one of claims 1 to 3;
    A method for processing an object, comprising:
PCT/JP2019/004969 2018-05-16 2019-02-13 Cleaning agent, cleaning agent production method, and target object processing method WO2019220711A1 (en)

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JP2011164293A (en) * 2010-02-08 2011-08-25 Tokyo Ohka Kogyo Co Ltd Cleaning solution for lithography and method for forming wiring line
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WO2017056662A1 (en) * 2015-09-28 2017-04-06 Jsr株式会社 Method for processing work, composition for temporary fixation, semiconductor device, and process for producing same

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Publication number Priority date Publication date Assignee Title
JP2000089480A (en) * 1998-09-09 2000-03-31 Kao Corp Release agent composition
JP2007254555A (en) * 2006-03-22 2007-10-04 Sanyo Chem Ind Ltd Cleanser composition
JP2011164293A (en) * 2010-02-08 2011-08-25 Tokyo Ohka Kogyo Co Ltd Cleaning solution for lithography and method for forming wiring line
JP2016500918A (en) * 2012-10-11 2016-01-14 インターナショナル・ビジネス・マシーンズ・コーポレーションInternational Business Machines Corporation Method for processing a semiconductor wafer
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WO2017056662A1 (en) * 2015-09-28 2017-04-06 Jsr株式会社 Method for processing work, composition for temporary fixation, semiconductor device, and process for producing same

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