WO2019184244A1 - 一种用于to-can激光器的测试装置和测试系统 - Google Patents

一种用于to-can激光器的测试装置和测试系统 Download PDF

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Publication number
WO2019184244A1
WO2019184244A1 PCT/CN2018/103648 CN2018103648W WO2019184244A1 WO 2019184244 A1 WO2019184244 A1 WO 2019184244A1 CN 2018103648 W CN2018103648 W CN 2018103648W WO 2019184244 A1 WO2019184244 A1 WO 2019184244A1
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test
pin
coaxial waveguide
socket
laser
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PCT/CN2018/103648
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English (en)
French (fr)
Inventor
黄自宁
布沙·依卜
阚家溪
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昂纳信息技术（深圳）有限公司
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Priority to US16/292,390 priority Critical patent/US10948533B2/en
Publication of WO2019184244A1 publication Critical patent/WO2019184244A1/zh

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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00—Semiconductor lasers
    • H01S5/0014—Measuring characteristics or properties thereof
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00—Semiconductor lasers
    • H01S5/02—Structural details or components not essential to laser action
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00—Semiconductor lasers
    • H01S5/02—Structural details or components not essential to laser action
    • H01S5/022—Mountings; Housings
    • H01S5/02208—Mountings; Housings characterised by the shape of the housings
    • H01S5/02212—Can-type, e.g. TO-CAN housings with emission along or parallel to symmetry axis

Definitions

  • the invention relates to the field of TO-CAN laser testing, and in particular to a testing device and a testing system for a TO-CAN laser.
  • the TO-CAN laser is a laser diode module, especially a coaxial type.
  • the housing is usually cylindrical and is generally used in a 40 Gbit/s transmission system. At present, the most important use is 2.5Gbit/s and 10Gbit/s short-distance transmission, but now there are coaxial belt cooling technologies in development, 10Gbit/s and 20km transmission technologies have been initially available, and because of its low cost, the process is simple. The prospects are excellent.
  • the TO-CAN laser is tested and obtained; however, when testing the TOCAN, it is necessary to shorten the lead, which is not conducive to mass production testing.
  • the technical problem to be solved by the present invention is to provide a test device for a TO-CAN laser for the above-mentioned defects of the prior art, which solves the problems of low efficiency of existing tests and unfavorable for mass production testing.
  • the technical problem to be solved by the present invention is to provide a test system for a TO-CAN laser for the above-mentioned defects of the prior art, which solves the problems of low efficiency of existing tests and unfavorable for mass production testing.
  • the technical solution adopted by the present invention to solve the technical problem thereof is to provide a testing device for a TO-CAN laser, the testing device comprising a test socket, a coaxial waveguide substrate and a test PCB board, the test socket comprising a TO a coaxial waveguide of the CAN laser signal output pin, and a conductive socket for receiving a signal input pin of the TO-CAN laser, the coaxial waveguide substrate being coaxial with the coaxial waveguide pin and the socket of the test PCB board, respectively The waveguide is connected, and the conductive socket of the test socket is connected to a corresponding control pin of the test PCB.
  • the coaxial waveguide substrate is a copper substrate.
  • the coaxial waveguide substrate further includes a radio frequency grounding pin, and the radio frequency grounding pin is connected to a grounding pin of the test PCB board.
  • the test socket includes a socket body, the end surface of the socket body is provided with a first through hole as a coaxial waveguide opening, and a second through hole is provided as a slot of the conductive slot. a hole; the coaxial waveguide and the conductive slot are both disposed in the socket body.
  • the test PCB board includes a main control processing circuit, and the coaxial waveguide pin and the plurality of the control pins are respectively connected to the main control processing circuit.
  • control pin comprises an LD control pin, a TEC control pin and a GND pin, and the coaxial waveguide pin is a PD control pin.
  • the technical solution adopted by the present invention to solve the technical problem thereof is to provide a test system for a TO-CAN laser, the test system comprising a test device and a test platform, and the test platform acquires a test device for testing a TO-CAN laser Test the information and display it.
  • the test information includes one or more of a wavelength, a threshold current, an operating current, and a monitoring current.
  • the invention has the beneficial effects that the present invention designs a test device and a test system for a TO-CAN laser compared with the prior art, and does not need to shorten the lead wire when testing the TOCAN, which is advantageous for mass production testing, and
  • the TOCAN optical transmitter is fully tested; at the same time, the bandwidth can be extended from DC to approximately 60 GHz through the coaxial waveguide substrate.
  • Figure 1 is a schematic structural view of a test device of the present invention
  • Figure 2 is a side view showing the structure of the test device of the present invention.
  • Figure 3 is a block diagram showing the structure of the test apparatus of the present invention.
  • FIG. 4 is a block diagram showing the structure of a test system of the present invention.
  • the present invention provides a preferred embodiment of a test device.
  • test apparatus for a TO-CAN laser including a test socket 10, a coaxial waveguide substrate 20, and a test PCB board 30, the test socket 10 including a coaxial line that accommodates a TO-CAN laser signal output pin a waveguide, and a conductive socket for receiving a signal input pin of the TO-CAN laser, the coaxial waveguide substrate 20 being respectively connected to a coaxial waveguide pin of the test PCB board 30 and a coaxial waveguide of the socket,
  • the conductive socket pins 11 of the test socket 10 are connected to corresponding control pins of the test PCB board 30.
  • the coaxial waveguide substrate 20 is connected to the coaxial waveguide pin of the test PCB board 30 through the coaxial waveguide pin 201.
  • the TO-CAN laser includes an LD pin (positive and negative), a TEC pin (positive and negative), a PD pin (positive and negative), and a GND pin; and the test socket 10 is included to accommodate the above reference A coaxial waveguide of the foot and a plurality of conductive slots, the coaxial waveguide receiving the PD positive pin, and the plurality of conductive slots accommodating the remaining corresponding pins, respectively.
  • the control pin of the test PCB board 30 includes an LD control pin, a TEC control pin and a GND pin, and the coaxial waveguide pin is a PD control pin.
  • the coaxial waveguide substrate 20 is a copper substrate.
  • the transmission mode of the radio frequency signal in the test socket 10 is a coaxial coplanar waveguide manner, and the excess of the test socket 10 to the test PCB board 30 is transmitted through the coaxial coplanar waveguide method used by the copper substrate, and the bandwidth can be from DC. Expanded to approximately 60 GHz; available for evaluation of 10G-TOCAN EM transmitter products.
  • the coaxial waveguide substrate 20 further includes a radio frequency ground pin 202 connected to the ground pin of the test PCB board 30.
  • the test socket 10 includes a socket body, the end surface of the socket body is provided with a first through hole 121 as a coaxial waveguide opening, and a second hole as a conductive slot slot.
  • the through hole 122; the coaxial waveguide and the conductive slot are both disposed in the socket body.
  • the TO-CAN laser is inserted into the first through hole 121 and the second through hole 122 of the socket body through the pins of the TO-CAN laser, and the socket body passes through the coaxial waveguide substrate 20 and tests through the coaxial waveguide
  • the PCB board 30 is connected, and the socket body is connected to the test PCB board 30 through a conductive socket.
  • the test PCB board 30 includes a main control processing circuit, and the coaxial waveguide pin and the plurality of the control pins are respectively connected to the main control processing circuit.
  • the main control processing circuit includes a main control chip, and the coaxial waveguide pin and the plurality of the control are connected to the main control chip through leads.
  • test system As shown in Figure 4, a preferred embodiment of the test system is provided in the present invention.
  • test system for a TO-CAN laser comprising a test device 1 and a test platform 40, the test platform 40 acquiring test information of the test device 1 for testing the TO-CAN laser and displaying.
  • the test system includes a display device 50 that is coupled to the test platform 40 and displays relevant information, such as a display or other display instrument, to facilitate intuitive acquisition of the test results.
  • the test system further includes a control device 60, such as a computer or the like, connected to the test platform 40 and implementing corresponding control.
  • the test information includes one or more of a wavelength, a threshold current, an operating current, and a monitoring current.
  • the wavelength (nm) is the working wavelength of the laser
  • the threshold current (Ith) is the current at which the laser diode starts to generate laser oscillation.
  • the value is about tens of milliamps
  • the operating current (Iop) is reached by the laser diode.
  • the drive current at rated output power. This value is important for designing and debugging the laser drive circuit. It monitors the current flowing through the PIN tube at the rated output power of the laser diode.
  • the implementation parameters of the TO-CAN laser placed in the testing device 1 under various working environments are obtained, and the performance of the TO-CAN laser to be detected is detected.

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Electromagnetism (AREA)
  • Optics & Photonics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Semiconductor Lasers (AREA)

Abstract

一种用于TO-CAN激光器的测试装置，所述测试装置包括测试插座（10）、同轴波导基板（20）和测试PCB板（30），所述测试插座（10）包括容纳TO-CAN激光器信号输出引脚的同轴波导管，以及容纳TO-CAN激光器信号输入引脚的导电插槽，所述同轴波导基板（20）分别与测试PCB板（30）的同轴波导引脚和插座的同轴波导管连接，所述测试插座（10）的导电插槽与测试PCB板（30）的对应控制引脚连接。所述测试装置测试TOCAN时无需剪短其引线，有利于批量生产测试，以及对TO-CAN光发射器进行全面测试，同时通过同轴波导基板可将带宽从DC扩展到约60GHz。

Description

一种用于TO-CAN激光器的测试装置和测试系统 技术领域
本发明涉及TO-CAN激光器测试领域，具体涉及一种用于TO-CAN激光器的测试装置和测试系统。
 背景技术
TO-CAN激光器为镭射二极体模组，特别是同轴型，壳体通常为圆柱形，一般用于40Gbit/s的传输系统内。目前最主要的用途还在于2.5Gbit/s及10Gbit/s短距离传输，但现在已经有同轴带制冷技术在发展，10Gbit/s及20km传输技术已经初步具备，并且由于其成本低廉，工艺简单，前景极佳。
对TO-CAN激光器进行测试，获取；然而，现有的测试TOCAN时，需剪短其引线，不利于批量生产测试。
 技术问题
本发明要解决的技术问题在于，针对现有技术的上述缺陷，提供一种用于TO-CAN激光器的测试装置，解决现有测试效率低、不利于批量生产测试的问题。
本发明要解决的技术问题在于，针对现有技术的上述缺陷，提供一种用于TO-CAN激光器的测试系统，解决现有测试效率低、不利于批量生产测试的问题。
 技术解决方案
本发明解决其技术问题所采用的技术方案是：提供一种用于TO-CAN激光器的测试装置，所述测试装置包括测试插座、同轴波导基板和测试PCB板，所述测试插座包括容纳TO-CAN激光器信号输出引脚的同轴波导管，以及容纳TO-CAN激光器信号输入引脚的导电插槽，所述同轴波导基板分别与测试PCB板的同轴波导引脚和插座的同轴波导管连接，所述测试插座的导电插槽与测试PCB板的对应控制引脚连接。
其中，较佳方案是：所述同轴波导基板为铜基板。
其中，较佳方案是：所述同轴波导基板还包括射频接地引脚，所述射频接地引脚与测试PCB板的接地引脚连接。
其中，较佳方案是：所述测试插座包括插座筒身，所述插座筒身的端面设有作为同轴波导管开口的第一通孔，以及设有作为导电插槽槽口的第二通孔；所述同轴波导管和导电插槽均设置在插座筒身内。
其中，较佳方案是：所述测试PCB板包括主控处理电路，所述同轴波导引脚和多个所述控制引脚分别与主控处理电路连接。
其中，较佳方案是：所述控制引脚包括LD控制引脚、TEC控制引脚和GND引脚，所述同轴波导引脚为PD控制引脚。
本发明解决其技术问题所采用的技术方案是：提供一种用于TO-CAN激光器的测试系统，所述测试系统包括测试装置和测试平台，所述测试平台获取测试装置测试TO-CAN激光器的测试信息并显示。
其中，较佳方案是：所述测试信息包括波长、阈值电流、工作电流、监控电流中的一种或多种。
 有益效果
本发明的有益效果在于，与现有技术相比，本发明通过设计一种用于TO-CAN激光器的测试装置和测试系统，测试TOCAN时无需剪短其引线，有利于批量生产测试，以及对TOCAN光发射器进行全面测试；同时，通过同轴波导基板可将带宽从DC扩展到约60 GHz。
 附图说明
下面将结合附图及实施例对本发明作进一步说明，附图中：
图1是本发明测试装置的结构示意图；
图2是本发明测试装置的侧面结构示意图；
图3是本发明测试装置的结构框图；
图4是本发明测试系统的结构框图。
 本发明的最佳实施方式
现结合附图，对本发明的较佳实施例作详细说明。
如图1至图3所示，本发明提供测试装置的优选实施例。 
一种用于TO-CAN激光器的测试装置，所述测试装置包括测试插座10、同轴波导基板20和测试PCB板30，所述测试插座10包括容纳TO-CAN激光器信号输出引脚的同轴波导管，以及容纳TO-CAN激光器信号输入引脚的导电插槽，所述同轴波导基板20分别与测试PCB板30的同轴波导引脚和插座的同轴波导管的引脚连接，所述测试插座10的导电插槽引脚11与测试PCB板30的对应控制引脚连接。
其中，同轴波导基板20通过同轴波导引脚201与测试PCB板30的同轴波导引脚连接。
具体地，TO-CAN激光器包括LD引脚（正极和负极）、TEC引脚（正极和负极）、PD引脚（正极和负极）和GND引脚；以及，测试插座10包括用于容纳上述引脚的同轴波导管和多个导电插槽，所述同轴波导管容纳PD正极引脚，而多个导电插槽容分别容纳其余对应的引脚。以及，所述测试PCB板30的控制引脚包括LD控制引脚、TEC控制引脚和GND引脚，所述同轴波导引脚为PD控制引脚。
优选地，所述同轴波导基板20为铜基板。以及，射频信号在测试插座10的传输方式是同轴共面波导的方式，测试插座10到测试PCB板30的过度是通过铜基板使用的同轴共面波导方式进行传输，能够将带宽从DC扩展到约60 GHz；可用于10G-TOCAN EM发射器产品的评估中。其中，所述同轴波导基板20还包括射频接地引脚202，所述射频接地引脚202与测试PCB板30的接地引脚连接。
在本实施例中，所述测试插座10包括插座筒身，所述插座筒身的端面设有作为同轴波导管开口的第一通孔121，以及设有作为导电插槽槽口的第二通孔122；所述同轴波导管和导电插槽均设置在插座筒身内。
其中，TO-CAN激光器通过TO-CAN激光器的引脚插入插座筒身上的第一通孔121和第二通孔122，以及所述插座筒身通过同轴波导管通过同轴波导基板20与测试PCB板30连接，所述插座筒身通过导电插槽与测试PCB板30连接。
在本实施例中，所述测试PCB板30包括主控处理电路，所述同轴波导引脚和多个所述控制引脚分别与主控处理电路连接。具体地，主控处理电路包括主控芯片，以及通过引线将同轴波导引脚和多个所述控制与主控芯片连接。
如图4所示，在本发明提供测试系统的较佳实施例。
一种用于TO-CAN激光器的测试系统，所述测试系统包括测试装置1和测试平台40，所述测试平台40获取测试装置1测试TO-CAN激光器的测试信息并显示。
具体地，测试系统包括与测试平台40连接并显示相关信息的显示设备50，如显示器或其他显示仪器，便于直观获取检测结果。以及，测试系统还包括与测试平台40连接并实现相应控制的控制设备60，如计算机等。
在本实施例中，所述测试信息包括波长、阈值电流、工作电流、监控电流中的一种或多种。其中，波长（nm）为激光器工作波长，阈值电流（Ith）为激光二极管开始产生激光振荡的电流，对小功率激光器而言其值约在数十毫安，工作电流（Iop）为激光二极管达到额定输出功率时的驱动电流，此值对于设计调试激光驱动电路较重要，监控电流（Im ）激光二极管在额定输出功率时在PIN管上流过的电流。
其中，根据测试平台40的控制，获取放置在测试装置1的TO-CAN激光器在各种工作环境下的实施参数，检测待检测TO-CAN激光器的性能。
 以上所述者，仅为本发明最佳实施例而已，并非用于限制本发明的范围，凡依本发明申请专利范围所作的等效变化或修饰，皆为本发明所涵盖。

Claims (8)

  1. 一种用于TO-CAN激光器的测试装置，其特征在于：所述测试装置包括测试插座、同轴波导基板和测试PCB板，所述测试插座包括容纳TO-CAN激光器信号输出引脚的同轴波导管，以及容纳TO-CAN激光器信号输入引脚的导电插槽，所述同轴波导基板分别与测试PCB板的同轴波导引脚和插座的同轴波导管连接，所述测试插座的导电插槽与测试PCB板的对应控制引脚连接。
  2. 根据权利要求1所述的测试装置，其特征在于：所述同轴波导基板为铜基板。
  3. 根据权利要求1或2所述的测试装置，其特征在于：所述同轴波导基板还包括射频接地引脚，所述射频接地引脚与测试PCB板的接地引脚连接。
  4. 根据权利要求1或2所述的测试装置，其特征在于：所述测试插座包括插座筒身，所述插座筒身的端面设有作为同轴波导管开口的第一通孔，以及设有作为导电插槽槽口的第二通孔；所述同轴波导管和导电插槽均设置在插座筒身内。
  5. 根据权利要求1所述的测试装置，其特征在于：所述测试PCB板包括主控处理电路，所述同轴波导引脚和多个所述控制引脚分别与主控处理电路连接。
  6. 根据权利要求1所述的测试装置，其特征在于：所述控制引脚包括LD控制引脚、TEC控制引脚和GND引脚，所述同轴波导引脚为PD控制引脚。
  7. 一种用于TO-CAN激光器的测试系统，其特征在于：所述测试系统包括如权利要求1-6任一所述的测试装置和测试平台，所述测试平台获取测试装置测试TO-CAN激光器的测试信息并显示。
  8. 根据权利要求1所述的测试装置，其特征在于：所述测试信息包括波长、阈值电流、工作电流、监控电流中的一种或多种。 
PCT/CN2018/103648 2018-03-29 2018-08-31 一种用于to-can激光器的测试装置和测试系统 WO2019184244A1 (zh)

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