WO2019130856A1 - Dispositif d'affichage d'image de particules, programme d'affichage d'image de particules, procédé d'affichage d'image de particules et système de mesure de particules - Google Patents

Dispositif d'affichage d'image de particules, programme d'affichage d'image de particules, procédé d'affichage d'image de particules et système de mesure de particules Download PDF

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Publication number
WO2019130856A1
WO2019130856A1 PCT/JP2018/041754 JP2018041754W WO2019130856A1 WO 2019130856 A1 WO2019130856 A1 WO 2019130856A1 JP 2018041754 W JP2018041754 W JP 2018041754W WO 2019130856 A1 WO2019130856 A1 WO 2019130856A1
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particle
information
deformed
image
image display
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PCT/JP2018/041754
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English (en)
Japanese (ja)
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森　哲也
誠 名倉
浩行 越川
久 秋山
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株式会社堀場製作所
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/02—Investigating particle size or size distribution

Definitions

  • the present invention relates to a particle image display apparatus or the like that acquires information on dispersed particles, such as particle size distribution, from a particle measurement device, and images and displays the dispersion mode of the particles.
  • a light scattering type particle size distribution measuring apparatus is known as one of the particle measuring apparatuses.
  • a light scattering type that measures particle size distribution based on the intensity of scattered light or diffracted light obtained by irradiating light to particles in a dispersion medium, or CCD
  • the actual particle dispersion mode in the dispersion medium is imaged using a camera, an optical system, etc., and the imaged image is analyzed to analyze individual particle forms such as particle aspect ratio, length, color, etc. in addition to particle size distribution.
  • image analysis types There are known image analysis types that can measure up to.
  • the light scattering type has a relatively short measurement time, it is difficult to measure even the individual form of the particle, and conversely, the image analysis type has to capture and analyze a large number of images. Because the measurement time is long, even individual forms of particles can be measured.
  • the operator in addition to giving the operator a sense of being unfamiliar and unfamiliar to the operator, the operator is not intuitive, for example, when performing quality control on particle related products such as pigments using this particle size distribution measuring device. Because it is necessary to analyze the measurement result data carefully, it may take time and omissions may occur.
  • the measurement result is displayed as a graph or a numerical value, even an operator who is skilled in the art can not intuitively grasp the state.
  • the present invention is an epoch-making one that goes beyond the common sense in the measuring device industry that accurate results are required in order to solve the above problems, and a faithful particle dispersion image obtained from the measurement results By generating a deformed image from the measurement result in which the required features and the like are emphasized, rather than representing the image, it is intended that the operator can easily generate an intuitive image of the particle dispersion state.
  • the particle image display apparatus stores a particle information acquisition unit that acquires particle information, which is information on dispersed particles, from one or more types of particle measurement apparatuses, and a predetermined deformation rule. And the actual particle dispersion mode, that is, the deformed particle dispersion mode different from the particle dispersion mode obtained from the particle measurement device. And a deformed image generation unit that generates a deformed image in which the aspect is imaged.
  • dispersed particles means not only particles dispersed in a dispersion medium such as liquid and gas, but also particles etc. which are fixed and dispersed in a preparation or the like.
  • particles means not only solid particles and liquid particles (such as mists), but also gas particles (such as air bubbles) in the liquid and liquid particles (such as emulsion and oil particles in water) in the liquid. is there.
  • FIG. 1 is a schematic general view showing the entire particle measurement system according to an embodiment of the present invention.
  • grain model in the embodiment. 6 is a flowchart showing an operation of a deformed image generation unit in the embodiment.
  • particle measuring system 1 first particle measuring device (light scattering type particle size distribution measuring device) 2 Second particle measuring device (image analysis type particle size distribution measuring device, particle shape measuring device) 3 ... particle image display device 31 ... particle information acquisition unit 32 ... setting information acquisition unit 33 ... deformation image generation unit 34 ... deformation rule storage unit 35 ... particle model storage unit
  • the particle measurement system 100 includes a plurality of (here, two types of) particle measurement devices that measure particle information that is information about particles dispersed in a dispersion medium, and the particle measurement And a particle image display device 3 connected to the device.
  • the first particle measurement device 1 is a so-called static light scattering type particle diameter distribution measurement device.
  • the first particle measuring device 1 is a light intensity for each angle of diffracted light and / or scattered light obtained by irradiating measurement light such as laser light to particles (hereinafter also referred to as sample) dispersed in a dispersion medium.
  • Information processing hereinafter, also referred to as particle size distribution information relating to particle size distribution, which is one of the particle information, based on an optical sensor that measures the distribution of the light and a signal of the optical sensor And a mechanism (which need not be physically integral).
  • the particle size distribution information here includes several types such as volume-based number distribution information, number-based number distribution information, density information, and the like.
  • the first particle measuring device 1 for measuring the particle size distribution not only the above-mentioned static light scattering type but also the dynamic light scattering type may be used.
  • this dynamic light scattering type particle size distribution device a zeta potential indicating the degree of aggregation can also be obtained as particle shape information to be described later.
  • particle size distribution measuring devices such as centrifugal sedimentation type, counter type, one using a sieve, differential type electrostatic classifier (DMA) may be used.
  • DMA differential type electrostatic classifier
  • the second particle measurement device 2 is an image analysis type particle diameter distribution measurement device, and has a function as a particle shape measurement device.
  • the second particle measurement device 2 measures the same sample as the sample measured by the first particle measurement device 1 (strictly speaking, it includes not only the same sample but also the sample derived from the same). It comprises an imaging sensor such as a light source and a CCD disposed opposite to each other with a sample interposed therebetween, a telecentric lens optical system, and an information processing mechanism (which need not be physically integrated).
  • the transmitted light emitted from the light source and transmitted through the sample is projected onto the imaging sensor via a telecentric lens system or the like, and in the information processing mechanism, contour images of individual particles are acquired from the imaging sensor Based on the information, it is configured to calculate and output information on particle morphology (hereinafter also referred to as particle morphology information) which is particle information other than particle diameter distribution information.
  • particle morphology information is particle information other than particle diameter distribution information.
  • particle form refers to the shape, color, pattern and combination of particles. Further, as particle shape information, there are long-axis length, short-axis length, aspect ratio, circularity, unevenness, etc. of individual particles.
  • the second particle measuring device 2 for measuring the form of particles not only the type in which the transmitted light of the particles as described above is imaged to obtain the outline thereof, but also the reflected light from the particles is imaged to obtain the image It may be of the type. In that case, color or surface shape can be obtained as particle shape information.
  • the particle measuring apparatus is not limited thereto, and an SEM, a TEM, an optical microscope, a Raman microscope, or the like may be used. In that case, measurement of secondary electrons, reflected electrons, transmitted electrons, fluorescent X-rays, cathode luminescence, Raman light, etc. also obtains other physical property information on material, crystallinity, element, composition, molecular structure etc. as particle information. be able to.
  • the particle image display device 3 is a so-called computer provided with a CPU, a memory, various drivers and the like, and particle information acquisition described later by cooperation of the CPU and its peripheral devices according to a predetermined program stored in the memory It exerts functions as the unit 31, the setting information acquisition unit 32, the deformation image generation unit 33, the deformation rule storage unit 34, the particle model storage unit 35, and the like.
  • the particle information acquisition unit 31 acquires particle information of the sample output from the first particle measurement device 1 and the second particle measurement device 2, that is, the particle size distribution information and the particle shape information.
  • the setting information acquisition unit 32 receives setting information on the sample, that is, the dispersion medium and the particles.
  • the setting information is peripheral information different from the particle information, and is known information about the dispersion medium or particles (for example, fluid state of dispersion medium, temperature, viscosity of dispersion medium, specific gravity of particles and dispersion medium, etc.)
  • image setting information for example, 2D / 3D display, still image / moving image, etc.
  • image setting information for example, 2D / 3D display, still image / moving image, etc.
  • the deformed image generation unit 33 identifies the correlation thereof from the particle information and the setting information, and in consideration of the correlation, an aspect of the actual dispersed particles from the particle information and the setting information (hereinafter, actual particles) Estimated and calculated. Then, from the actual dispersion particle mode, or from the particle information and the setting information, a deformation image different from the actual image obtained by actually imaging the sample is generated with reference to the deformation rule storage unit 34 and the particle model storage unit 35.
  • the deformation rule storage unit 34 stores in advance one or more deformation rules used when generating a deformation image, and a predetermined display emphasizing item is emphasized according to each of the deformation rules.
  • the size deformation rule, the distance deformation rule, and the motion deformation rule are provided in the deformation rule storage unit 34.
  • the size deformation rule is a rule used when deforming a particle size such as particle diameter or particle length.
  • the size deformation rule for example, when two particles having different particle sizes are present, the larger the ratio of the large particle size to the small particle size, the larger the particle size of the large particle represented by the deformed image is actually Smaller than this (or the smaller particles represented in the deformed image will be larger than they actually are).
  • a rule for compression conversion by logarithm In this case, for example, even if the ratio of the actual diameters of the two particles is 1000, it is converted to 3 in the deformed image.
  • a deformation rule is a rule for deforming the distance between particles in relation to particle size and density such as particle diameter.
  • this distance deformation rule for example, as the interparticle distance calculated from the density becomes larger than the particle diameter, the interparticle distance represented by the deformed image is deformed so as to be smaller.
  • it is a rule for compression conversion by logarithm. In this case, even if the distance between particles is 1000 times the particle diameter, for example, the distance between particles in the deformed image is converted to three times the particle diameter.
  • a predetermined movement deformation rule is also defined, for example, for the movement of particles (Brownian movement, flow movement speed, etc.).
  • the operator can also access the deformation rule storage unit 34 to change, add, or delete the deformation rule.
  • the particle model storage unit 35 stores particle models of a plurality of predetermined types (in this example, four types of spheres, rods, disks, and bubbles as shown in FIG. 2) used in the deformed image. There is.
  • An operator can access the particle model storage unit 35 to change, add, or delete particle models.
  • the deformed image generation unit 33 sets the type of model particle displayed as a deformed image (step S1 in FIG. 3), and deforms the form of the model particle stored in the particle model storage unit 35 (step 3 in FIG. 3). S2).
  • the deformed image generation unit 33 acquires and refers to the setting information and particle information (particle form) from the second particle measurement device 2 (image analysis type particle diameter distribution measurement device).
  • the deformed image generation unit 33 determines a particle model according to the aspect ratio. For example, if the aspect ratio is close to 1, the particle model is set as a sphere, and if the aspect ratio is a value separated by 1 or more from 1, the particle model is set as a rod.
  • the deformed image generation unit 33 sets a disk as a particle model.
  • the deformed image generation unit 33 deforms the shape of the particle model set as described above according to the particle shape information from the second particle measurement device 2. For example, if a rod is set in the particle model and the aspect ratio is 10, the default rod shape in the display model storage unit is deformed to a rod shape with an aspect ratio of 10. If it is a disk, the ratio of thickness to diameter is changed according to the aspect ratio.
  • the deformed image generation unit 33 determines the size of the particle displayed in the deformed image (step S3 in FIG. 3).
  • the actual size of the particle is calculated based on the particle size distribution information obtained from the first particle measurement device 1, and then, according to the diameter deformation rule stored in the deformation rule storage unit 34, Determine the size of the particle displayed in the deformed image.
  • the deformation image generation unit 33 determines that there are two peaks in the particle size distribution obtained from the first particle measurement device 1 and two types of particles having different representative diameters from the distribution graph shape. If there is a difference of 1000 times in the representative diameter, the deformed image generation unit 33 converts this in logarithm and the difference in the size of the particles displayed in the deformed image is based on any particle diameter Set to triple.
  • the deformed image generation unit 33 determines the inter-particle distance displayed in the deformed image (step S4 in FIG. 3).
  • the actual inter-particle distance is calculated based on the frequency and density obtained from the first particle measurement device 1, and this is compared with the particle diameter, and the distance deformation stored in the deformation rule storage unit 34 According to the rules, determine the inter-particle distance displayed in the deformed image.
  • the deformation image generation unit 33 estimates that the aspect ratio is close to 1 and the particle form is close to a sphere in this embodiment, for example, from the particle form information and the setting information.
  • the particle size distribution it is estimated that the particles are dispersed in the dispersion medium with the frequency as the particle size distribution information, and the density of the particles of each diameter is calculated from the frequency.
  • the particle diameter distribution information two peaks are present in the longitudinal length and the latitudinal length of the particle. Since it is possible, the particle diameter distribution information is converted, the frequency of the actual particle distribution is calculated based on the converted particle diameter distribution, and the density of particles of each diameter is calculated based thereon.
  • the interparticle distance is 1000 times the particle diameter
  • the interparticle distance is set so as to be three times the particle diameter by logarithmic conversion.
  • the deformed image generation unit 33 refers to the setting information to determine the movement of particles displayed in the deformed image (step S5 in FIG. 3). For example, when the flow state of the dispersion medium is obtained from the sample setting information as the stationary state, the convection state, the stirring state, the circulation state, etc., the particles are set to perform the movement according to the flow state of the dispersion medium. At this time, if the movement speed of the particle is too fast or too slow, the movement speed of the particle on the virtual image is actually determined according to the movement deformation rule stored in the deformation rule storage unit 34. Change from the speed of In addition, for example, settling or rising motion of each particle due to difference in specific gravity, Brownian motion, etc. are also set in accordance with the motion deformation rule.
  • the deformed image generated by the deformed image generation unit 33 is transmitted as image data to the display 4 and displayed (step S6 in FIG. 3).
  • the display mode on the display 4 can be switched to 2D / 3D, still image / moving image or the like according to, for example, image setting information set by the operator.
  • particle information is also transmitted to the display 4 and measurement data such as particle diameter distribution information and aspect ratio indicated by the particle information are displayed as numerical values or graphs in the deformed image At the same time or switching, it can be displayed on the display 4. This is to make it possible to simultaneously confirm correct measurement data while looking at the deformed image.
  • the present invention is not limited to the above embodiment.
  • the deformation is always caused by raising the existence probability or display priority even if the number is small. It may be displayed on an image, or may be highlighted by making the color or the shape different.
  • particle information for example, particles whose value of particle information is out of a predetermined range or particles in a predetermined range are extracted, or in a sample to be measured, particle information Specific particles are extracted by, for example, extracting values whose values are out of a predetermined range statistically or in a predetermined range.
  • the degree of circularity, the degree of unevenness, the aspect ratio, etc. are out of the preset ranges, such as extremely long particles or large particles, or the particle size distribution information
  • the particle size is extracted as a specific particle, for example, the value of which deviates from a certain statistic compared to other particle sizes.
  • specific particles are extracted based on one type of particle information, but in addition, multivariate values calculated from a plurality of types of particle information in predetermined relational expressions, tables, etc. are out of specification, or statistics You may extract as a specific particle the thing of the value etc. which deviated from.
  • specific particles may be extracted by image recognition such as pattern matching.
  • the specific particles extracted in this way are added to the deformed image and displayed, but in this case, in this example, as shown in FIG.
  • the particle model is stored, and the specific particle model is displayed in addition to the deformed image as shown in FIG.
  • the operator can recognize an abnormality or grasp the presence or frequency of a predetermined particle or the like simply by looking at this deformed image, thereby improving the check efficiency of measurement result data in quality control and the like. It will be able to contribute significantly to the reduction of checks and omissions.
  • the presence or absence of aggregation may be provided.
  • the deformed image generation unit 33 is not a large diameter particle but a deformed image in which a plurality of particles are aggregated. Should be generated.
  • a particle measuring device capable of measuring the degree of aggregation of dispersed particles as particle information such as a dynamic light scattering type dragon diameter distribution device is used, a deformed image may be generated based on the degree of aggregation.
  • a shape model is used for the deformed image in the above embodiment, an actual image may be used as the shape model, or a deformed image may be obtained using the form of particles obtained from an image analysis type particle size distribution measuring apparatus. You may generate
  • the deformed images respectively generated based on the particle information measured at each time may be switched and displayed on the display 4 in the order of measurement time, or may be displayed side by side on the same screen. In this way, it is possible to more intuitively grasp the movement of the particle and the change in its form.
  • time deformation rules may be added as deformation rules. For example, it is a rule to expand and display an actual 1 us at an interval of 1 s, or to shorten an actual 10 s to an interval of 1 s.
  • Temporal change The deformation rule is a rule that defines how the form and number of particles change with the passage of time.
  • the change in the form or number of particles is, for example, the dispersion of aggregated particles over time, the destruction of single particles, the decrease, the increase, the decrease, the increase, or the like of bubbles.
  • the temporal change deformation rule may be a rule that defines a change in form between particles given the form of particles at each of two different times (first and second times).
  • the rule may be such that the temporal change of the particle before or after that is determined with reference to other particle information and setting information.
  • the former time-varying deformation rule measures particles at different times in a particle measurement device, and generates a deformation image from the particle information acquired at each of these times, to supplement the interval, so as to supplement the interval It can generate deformed images.
  • the time-lapse deformation rule is applied and the interval between them is applied.
  • An aspect in which particles gradually change can be displayed continuously and smoothly in a deformed image of a moving image. It is also possible to generate a deformed image (still image) at a certain time when measurement is not performed between the first time and the second time.
  • time-lapse deformation rule is only required to be measured once, and it is not necessary to take correspondence of particles at different times, so a deformed image can be generated easily.
  • the particle measuring device may be single. If the particle measuring apparatus is a single light scattering type, the operator may specify the particle shape. For example, when it is determined from the particle size distribution information that there are two representative diameters, if the operator designates the particle shape to be spherical, spherical particles of two diameters are deformed in size, distance, movement, etc. Displayed as a deformed image. On the other hand, if the operator designates the particle shape to be anomalous (for example, rod-like or disc-like), only one type of particle having the same aspect ratio as the ratio of the two representative diameters is deformed in size, distance, movement, etc. Is displayed as a deformed image.
  • particle information measured by the particle measuring device may be linked to each particle displayed in the deformed image.
  • measurement data of the particles can be displayed by selecting any particle in the deformed image by clicking or the like. More specifically, when any particle is clicked in the deformed image, an actual captured image including the particle obtained by the second particle measuring device 2 is displayed on the display 4, or Alternatively, the position of the particles may be indicated on the particle diameter distribution graph obtained by the first particle measuring device, or the actual particle diameter, aspect ratio, color or other form, material, refractive index, etc. Physical properties may be displayed as numerical values or text.
  • the operator can easily refer to only the actual data having a feature selected from a large amount of actual data, leading to an improvement in check efficiency and a reduction in check omissions.
  • the particles to be measured may be not only particles dispersed in the dispersion medium, but also particles in a dispersed state in which the dispersion medium is evaporated and fixed to a preparation or the like.
  • the present invention instead of representing an image of a faithful particle dispersion mode obtained from measurement results, for example, a deformed image in which a required feature or the like is emphasized is generated from the measurement results, and the particle dispersion state is intuitive It is possible to provide a particle image display device capable of easily causing an image.

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Abstract

Afin de fournir un dispositif d'affichage d'image de particules (3) qui permet à un opérateur d'imager facilement et intuitivement un état de dispersion de particules, l'invention concerne un dispositif pourvu : d'une unité d'acquisition d'informations de particules (31) qui acquiert des informations de particules concernant des particules dispersées dans un milieu de dispersion à partir d'un ou plusieurs types de dispositifs de mesure de particules (1, 2) qui mesurent les informations de particules ; d'une unité de stockage de règles de déformation (34) qui stocke une règle de déformation prescrite ; et d'une unité de génération d'image déformée (33) qui génère une image déformée indiquant un mode de dispersion de particules déformé différent d'un mode de dispersion de particules réel dans le milieu de dispersion par application de la règle de déformation aux informations de particules et conversion des informations.
PCT/JP2018/041754 2017-12-28 2018-11-09 Dispositif d'affichage d'image de particules, programme d'affichage d'image de particules, procédé d'affichage d'image de particules et système de mesure de particules WO2019130856A1 (fr)

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JP2017253589A JP2021063654A (ja) 2017-12-28 2017-12-28 粒子画像表示装置、粒子画像表示プログラム、粒子画像表示方法、及び粒子測定システム

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111334428A (zh) * 2020-03-23 2020-06-26 深圳赛动生物自动化有限公司 干细胞智能配液系统及其工作方法
WO2023053528A1 (fr) * 2021-09-28 2023-04-06 株式会社島津製作所 Microscope à sonde locale, procédé de traitement d'informations et programme

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JPH07286954A (ja) * 1994-04-19 1995-10-31 Hitachi Ltd 細胞自動分類装置
JPH07286952A (ja) * 1994-04-19 1995-10-31 Hitachi Ltd 粒子画像分析装置
JP2010151523A (ja) * 2008-12-24 2010-07-08 Hitachi High-Technologies Corp 粒子画像解析方法および装置
JP2016191565A (ja) * 2015-03-30 2016-11-10 国立大学法人名古屋大学 細胞分析結果出力装置、細胞分析結果出力方法及びプログラム
WO2017195785A1 (fr) * 2016-05-13 2017-11-16 株式会社堀場製作所 Appareil d'analyse de particules et système d'analyse de particules
JP2018077112A (ja) * 2016-11-09 2018-05-17 学校法人同志社 粒径解析法および粒径解析プログラム

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JPH07286954A (ja) * 1994-04-19 1995-10-31 Hitachi Ltd 細胞自動分類装置
JPH07286952A (ja) * 1994-04-19 1995-10-31 Hitachi Ltd 粒子画像分析装置
JP2010151523A (ja) * 2008-12-24 2010-07-08 Hitachi High-Technologies Corp 粒子画像解析方法および装置
JP2016191565A (ja) * 2015-03-30 2016-11-10 国立大学法人名古屋大学 細胞分析結果出力装置、細胞分析結果出力方法及びプログラム
WO2017195785A1 (fr) * 2016-05-13 2017-11-16 株式会社堀場製作所 Appareil d'analyse de particules et système d'analyse de particules
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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111334428A (zh) * 2020-03-23 2020-06-26 深圳赛动生物自动化有限公司 干细胞智能配液系统及其工作方法
WO2023053528A1 (fr) * 2021-09-28 2023-04-06 株式会社島津製作所 Microscope à sonde locale, procédé de traitement d'informations et programme

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