WO2018233154A1 - 一种显示面板及显示面板的修复方法 - Google Patents

一种显示面板及显示面板的修复方法 Download PDF

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Publication number
WO2018233154A1
WO2018233154A1 PCT/CN2017/106308 CN2017106308W WO2018233154A1 WO 2018233154 A1 WO2018233154 A1 WO 2018233154A1 CN 2017106308 W CN2017106308 W CN 2017106308W WO 2018233154 A1 WO2018233154 A1 WO 2018233154A1
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Prior art keywords
line
repair
lines
display panel
scan
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Ceased
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PCT/CN2017/106308
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English (en)
French (fr)
Inventor
简重光
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HKC Co Ltd
Chongqing HKC Optoelectronics Technology Co Ltd
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HKC Co Ltd
Chongqing HKC Optoelectronics Technology Co Ltd
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Priority to US16/623,184 priority Critical patent/US11156885B2/en
Publication of WO2018233154A1 publication Critical patent/WO2018233154A1/zh
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

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    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
    • G09G3/34—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source
    • G09G3/36—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source using liquid crystals
    • G09G3/3611—Control of matrices with row and column drivers
    • G09G3/3648—Control of matrices with row and column drivers using an active matrix
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306—Details
    • G02F1/1309—Repairing; Testing
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/1333—Constructional arrangements; Manufacturing methods
    • G02F1/1335—Structural association of cells with optical devices, e.g. polarisers or reflectors
    • G02F1/133509—Filters, e.g. light shielding masks
    • G02F1/133514—Colour filters
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
    • G02F1/1362—Active matrix addressed cells
    • G02F1/136259—Repairing; Defects
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
    • G02F1/1362—Active matrix addressed cells
    • G02F1/136286—Wiring, e.g. gate line, drain line
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
    • G02F1/1362—Active matrix addressed cells
    • G02F1/1368—Active matrix addressed cells in which the switching element is a three-electrode device
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D86/00—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
    • H10D86/40—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs
    • H10D86/441—Interconnections, e.g. scanning lines
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D86/00—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
    • H10D86/40—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs
    • H10D86/60—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs wherein the TFTs are in active matrices
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P74/00—Testing or measuring during manufacture or treatment of wafers, substrates or devices
    • H10P74/23—Testing or measuring during manufacture or treatment of wafers, substrates or devices characterised by multiple measurements, corrections, marking or sorting processes
    • H10P74/232—Testing or measuring during manufacture or treatment of wafers, substrates or devices characterised by multiple measurements, corrections, marking or sorting processes comprising connection or disconnection of parts of a device in response to a measurement
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
    • G02F1/1362—Active matrix addressed cells
    • G02F1/136259—Repairing; Defects
    • G02F1/136263—Line defects
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G2330/00—Aspects of power supply; Aspects of display protection and defect management
    • G09G2330/08—Fault-tolerant or redundant circuits, or circuits in which repair of defects is prepared

Definitions

  • the present application relates to the field of display panel technologies, and in particular, to a display panel and a repair method of the display panel.
  • liquid crystal displays have become the mainstream products of displays due to their thin body, low power consumption and low radiation, and have been widely used.
  • Most of the liquid crystal displays on the market are backlight type liquid crystal displays, which include a liquid crystal panel and a backlight module.
  • the working principle of the liquid crystal panel is to place liquid crystal molecules in two parallel glass substrates, and apply a driving voltage on the two glass substrates to control the rotation direction of the liquid crystal molecules to refract the light of the backlight module to generate a picture.
  • a thin film transistor liquid crystal display includes a liquid crystal panel including a color filter substrate (CF Substrate, also referred to as a color filter substrate), and a thin film transistor array substrate (Thin Film Transistor Substrate, TFT Substrate). And a mask, a transparent electrode is present on the opposite inner side of the substrate. A layer of liquid crystal molecules (LC) is sandwiched between the two substrates.
  • CF Substrate also referred to as a color filter substrate
  • TFT Substrate Thin Film Transistor Substrate, TFT Substrate
  • the technical problem to be solved by the present application is to provide a display panel, a display device, and a repair method for a display panel that can be repaired when a scan line or a data line is poorly connected.
  • a display panel including:
  • a first substrate comprising a color resisting unit
  • An active switch matrix disposed on the first substrate or the second substrate;
  • the active switch matrix includes a plurality of scan lines and data lines
  • One side of the scan line is provided with a first repair line, and one side of the data line is provided with a second repair line;
  • the first repair line and the number of scan lines are in one-to-one correspondence, and the number of the second repair line and the data line are in one-to-one correspondence;
  • the first repair line and the scan line are disposed corresponding to each other in the same layer or different layers;
  • the second repair line and the data line are correspondingly disposed on the same layer or different layers;
  • the first repair line and the second repair line are disposed on the same layer or different layers.
  • the application also discloses a display panel, comprising:
  • a first substrate comprising a color resisting unit
  • An active switch matrix disposed on the first substrate or the second substrate;
  • the active switch matrix includes a plurality of scan lines and data lines
  • One side of the scan line is provided with a first repair line, and one side of the data line is provided with a second repair line.
  • the present application also discloses a repair method of a display panel, the display panel includes a first substrate and a second substrate disposed opposite to the first substrate, the first substrate includes a color resisting unit, and the active
  • the switch matrix is disposed on the first substrate or the second substrate, and the active switch matrix includes a plurality of scan lines and data lines, and the repairing method includes:
  • a conductive path is formed by bridging the open scan line or the data line with the first repair line and the second repair line, respectively.
  • the scan line or the data line of the found broken circuit is analyzed to see whether the repair needs the first repair line or the second repair line, or two repair lines are needed for the repair and repair, and after analysis, By bridging to form a conductive path, the problem of open circuit can be repaired.
  • the method for bridging the open scan line or the data line with the first repair line and the second repair line respectively to form a conductive path comprises: bridging the scan line or the data line and corresponding first by laser welding Repair line and second repair line.
  • the bridging is mainly achieved by a welding method such as a laser welding lamp, and in addition, the first repairing line and the second repairing line which are adopted as the repairing route, which are not incorporated into the conductive path, will pass Cut off the connection, etc., and isolate it from the part of the conductive path to avoid the possibility of short circuit, open circuit and other problems.
  • the first repair line and the second repair line are respectively disposed correspondingly to the scan line and the data line, so that not only the data line but also the scan line can be repaired; in addition, because the first repair line and the first The second repair line can be set at least two separately, so that the number of repairs is also better improved; further, since the lengths of the first repair line and the second repair line are equivalent to the corresponding scan lines and data lines, there is no The problem that the trace is too long to decay and needs to be scaled up.
  • Figure 1 is a schematic view of a panel for wire break repair.
  • FIG. 2 is a schematic diagram of data line break repair of a display panel of the present application
  • FIG. 3 is a schematic diagram of a scan line break repair of a display panel of the present application.
  • FIG. 4 is a schematic view of a display panel of the present invention.
  • Figure 5 is a schematic view of a display device of the present application.
  • FIG. 6 is a flow chart of a method for repairing a display panel of the present application.
  • FIG. 1 is a schematic view of a panel of the present invention.
  • the design is repaired by the repair line 1 and the peripheral circuit of the substrate is removed.
  • the position of the circuit is broken at A, and the repair line 1 can be repaired, that is, the repair line is replaced by the solder joint 3
  • the data line is used to complete the line conduction.
  • the signal direction arrow 4 refers to the direction of the signal after repairing the data line by using the repair line, but the repairing ability of the repair method is limited.
  • the method can only Repairing one or two Data lines, but not repairing the Gate line; and, because of the outer routing, it is inevitable that the repair line has a longer length and is thus bridged When the circuit is broken, the signal will be attenuated in the longer signal.
  • FIG. 2 is a schematic diagram of data line break repair of a display panel of the present application
  • FIG. 3 is a schematic diagram of scan line break repair of a display panel of the present application
  • FIG. 4 is a schematic diagram of a display panel of the present invention, see FIG. 2, FIG. FIG. 4 and FIG. 1 show that the present disclosure discloses a display panel 100, including:
  • a first substrate comprising a color resisting unit
  • the active switch matrix 300 is disposed on the first substrate or the second substrate;
  • the active switch matrix 300 includes a plurality of scan lines 10 and data lines 20;
  • One side of the scan line is provided with a first repair line 11
  • one side of the data line 20 is provided with a second repair line.
  • the first repair line 11 is disposed on the side of the scan line 10, and the second repair line 21 is disposed on the side of the data line 20;
  • the first repair line 11 or the second repair line 20 When the scan line 10 or the data line 20 is broken, the first repair line 11 or the second repair line 20 will It is bridged to the corresponding open scan line 10 or data line 20 line.
  • the applicant of the present application has repaired the method using a repair line on the periphery of the substrate, but the method intelligently repairs one or two data lines (Data line), and the scan line (Gate line) ), not only that, because the trace is long, it is inevitable that the operation amplification function needs to be added to the corresponding PCB board, which increases the production cost.
  • the first repair line and the second repair line are respectively disposed correspondingly to the scan line and the data line, so that not only the data line but also the scan line can be repaired; in addition, because the first repair line and the first The second repair line can be set at least two separately, so that the number of repairs is also better improved; further, since the lengths of the first repair line and the second repair line are equivalent to the corresponding scan lines and data lines, there is no The problem that the trace is too long to decay and needs to be scaled up.
  • the first repairing line 11 or the second repairing line 21 will be welded and bridged by the solder joint 30 to complete the repair work of the line.
  • the number of the first repair line 11 and the scan line 10 is in one-to-one correspondence
  • the number of the second repair line 21 and the data line 20 are in one-to-one correspondence.
  • the repair line and the scan line and the data line are arranged one by one, which only needs to be made in the design of the repair line when the mask is processed; thus, even if there are multiple short lines of the line, It is also possible to repair the short line by soldering the reserved metal repair line.
  • the ratio of the number of the first repairing lines 11 and the scanning lines 10 is greater than or equal to one-half, and the first repairing lines 21 are equally spaced; each of the data lines 20 is correspondingly disposed One of the second repair lines 21.
  • the first repair line and the scan line are correspondingly arranged one to two, and the second repair line and the data line are arranged one-to-one correspondingly, which only needs to be designed when the mask is processed, corresponding to the repair line.
  • the circuit can be modified by modification; thus, even if a plurality of short-line problems occur, the short-line repair can be achieved by soldering the reserved metal repair wires.
  • each of the scan lines 10 is disposed adjacent to the first repair line 11 , and the ratio of the number of the second repair lines 21 and the data lines 20 is greater than or equal to one-half.
  • the second repair lines 21 are equally spaced.
  • the first repair line 11 and the scan line 10 are correspondingly arranged one by one, and the second repair line 21 and the data line 20 are correspondingly arranged one to two, which only needs to be processed during the mask processing.
  • the design can be modified to make the line; thus, even if there are multiple short-line problems, the repaired short-line can be achieved by soldering the reserved metal repair line.
  • the first repair line 11 and the scan line 10 are correspondingly disposed on the same layer or different layers;
  • the first repair line 11 When a repair process is required, the first repair line 11 will be bridged into the scan line 10 line to be repaired.
  • the first repairing line and the scanning line are corresponding to each other and are disposed nearby.
  • the setting manner may be corresponding to the same layer, or may be set corresponding to different layers, and under normal conditions, not connected.
  • the repair line is connected to the disconnected line by means of solder joint welding or via solder joint connection, thereby achieving the purpose of repair.
  • the second repair line 21 and the data line 20 are correspondingly disposed on the same layer or different layers;
  • the second repair line 21 When a repair process is required, the second repair line 21 will be bridged into the scan line 20 line to be repaired.
  • the second repairing line and the data line are corresponding to each other and are disposed nearby.
  • the setting manner may be corresponding to the same layer, or may be set corresponding to different layers. Under normal circumstances, the connection is not connected.
  • the repair line is connected to the disconnected line by means of solder joint welding or via solder joint connection, thereby achieving the purpose of repair.
  • the first repair line and the second repair line will pass through the solder joint 30.
  • the welding method is bridged.
  • the breaking circuit when the first repairing line 11 and the second repairing line 21 are disposed, it is considered that there is a possibility that the broken line may be repaired by a single repair line or the second repair line alone, for example, for example, for example, When a certain data line cannot achieve the repairing purpose by the corresponding second repairing line, the repairing purpose of the breaking circuit can be completed by the part of the first repairing line or the first repairing line.
  • the first repair line 11 and the second repair line 21 belong to a portion other than the repair requirement.
  • the line will be disconnected from the repair line by the cut-off process, i.e., by cutting the process point C, to isolate the useful line from the useless line.
  • a disconnection that may occur when the first repair line 11 and the second repair line 21 are disposed may be repaired by a single repair line or a second repair line alone, for example, a certain data.
  • the repairing purpose of the breaking circuit can be completed by the part of the first repairing line or the first repairing line; and the unrepaired part of the repairing line is not broken.
  • Other problems such as short circuit are likely to occur. Therefore, in this embodiment, if only the first repair line or the second repair line is required for the repair purpose, the unused portion will be used with the part of the line to be repaired. Cut off the isolation.
  • first repair line 11 or the second repair line 21 is bridged to the broken scan line 10 line or the data line 20 line by soldering of the solder joint 30.
  • first repairing line and the second repairing line may be bridged into the shorted scanning line or the data line by solder joint welding.
  • the active switch matrix is disposed on the second substrate.
  • the active switch matrix can also be disposed on the first substrate.
  • the color resist unit is formed on the active switch matrix.
  • the display panel further includes a repair detecting module 400 coupled to the active switch matrix 300 for detecting a line condition of the scan line 10 or the data line 20;
  • the repair positioning module 500 is coupled to the active switch matrix 300 and the repair detecting module 400 respectively for locating the specific position of the scan line 10 or the data line 20 in which a line problem occurs.
  • the display panel includes a liquid crystal panel, an OLED (Organic Light-Emitting Diode) panel, a QLED (Quantum Dot Light Emitting Diodes) panel, a plasma panel, a flat panel, a curved panel, and the like.
  • a liquid crystal display layer is disposed between the first substrate and the second substrate, and the light transmittance is controlled by controlling the deflection of the liquid crystal molecules, and various display images are formed by using the color filter.
  • FIG. 5 is a schematic diagram of a display device of the present application, the display device 100 including a control component 200, and a display panel 300 as disclosed in any of the applications.
  • the repair line can be repaired by using a repair line on the periphery of the substrate, but the method intelligently repairs one or two data lines, and a gate line. Not only that, because the wiring is long, it is necessary to increase the operational amplification function on the corresponding PCB board, which increases the production cost; this application correspondingly sets the first repair line and the second repair corresponding to the scan line and the data line respectively.
  • first repair line and the second repair line can be set at least two, respectively, the number of repairs is also better improved; Since the lengths of the first repair line and the second repair line are equivalent to the corresponding scan lines and data lines, there is no problem that the traces are too long to be attenuated and operation amplification is required.
  • the display panel is taken as an example for detailed description. It should be noted that the above description of the structure of the display panel is also applicable to the display device of the embodiment of the present application.
  • the display device of the embodiment of the present application is a liquid crystal display
  • the liquid crystal display includes a backlight module, and the backlight module can be used as a light source for supplying sufficient light source with uniform brightness and distribution.
  • the backlight module of the embodiment can be For the front light type, it may also be a backlight type. It should be noted that the backlight module of the embodiment is not limited thereto.
  • the present application also discloses a repair method for a display panel. Referring to the flowchart of the repair method of the display panel of FIG. 6, as shown in FIG. 1 to FIG. 5, it can be seen that:
  • the display panel 100 includes a first substrate and a second substrate disposed opposite to the first substrate, the first substrate includes a color resisting unit, and the active switch matrix 300 is disposed on the first substrate or the second substrate
  • the active switch matrix 300 includes a plurality of scan lines and data lines, and the repair method includes the steps of:
  • the scan line or the data line of the found broken circuit is analyzed to see whether the repair requires the first repair line or the second repair line, or two repair lines are needed for the repair and repair. After the analysis, bridging it to form a conductive path can repair the problem of the open circuit.
  • the method for bridging the two ends of the broken scan line or the data line with the first repair line and the second repair line to form a conductive path includes: bridging the scan line or the data line by laser welding Corresponding first repair line and second repair line.
  • the bridging may be achieved by a welding method such as a laser welding lamp, and in addition, the first repairing line and the second repairing line which are adopted as the repairing route, which are not incorporated into the conductive path, will pass Cut off the connection, etc., and isolate it from the part of the conductive path to avoid the possibility of short circuit, open circuit and other problems.

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Abstract

一种显示面板(100)、显示装置和显示面板(100)的修复方法，显示面板(100)包括：第一基板，包括色阻单元；第二基板，与第一基板相对设置；主动开关矩阵(300)，设置在第一基板或第二基板上；其中，主动开关矩阵(300)包括多条扫描线(10)和数据线(20)；扫描线(10)的一侧设置有第一修复线(11)，数据线(20)的一侧设置有第二修复线(21)。

Description

一种显示面板及显示面板的修复方法 【技术领域】
本申请涉及显示面板技术领域，特别是涉及一种显示面板及显示面板的修复方法。
【背景技术】
随着科技的发展和进步，液晶显示器由于具备机身薄、省电和辐射低等热点而成为显示器的主流产品，得到了广泛应用。现有市场上的液晶显示器大部分为背光型液晶显示器，其包括液晶面板及背光模组(backlight module)。液晶面板的工作原理是在两片平行的玻璃基板当中放置液晶分子，并在两片玻璃基板上施加驱动电压来控制液晶分子的旋转方向，以将背光模组的光线折射出来产生画面。
其中，薄膜晶体管液晶显示器(Thin Film Transistor-Liquid Crystal Display，TFT-LCD)由于具有低的功耗、优异的画面品质以及较高的生产良率等性能，目前已经逐渐占据了显示领域的主导地位。同样，薄膜晶体管液晶显示器包含液晶面板和背光模组，液晶面板包括彩膜基板(Color Filter Substrate，CF Substrate，也称彩色滤光片基板)、薄膜晶体管阵列基板(Thin Film Transistor Substrate，TFT Substrate)和光罩(Mask)，上述基板的相对内侧存在透明电极。两片基板之间夹一层液晶分子(Liquid Crystal，LC)。
而随着LCD产品趋向于高解析度方向发展，由于浮游尘粒(Particle)等问题，导致面内线路会出现导通不良等问题，如何，解决好这一问题是本领域技术人员亟待解决的问题。
应该注意，上面对技术背景的介绍只是为了方便对本申请的技术方案进行清楚、完整的说明，并方便本领域技术人员的理解而阐述的。不能仅仅因为这些方案在本申请的背景技术部分进行了阐述而认为上述技术方案为本领域技术人员所公知。
【发明内容】
有鉴于现有技术的上述缺陷，本申请所要解决的技术问题是提供一种在扫描线或者数据线导通不良时，能够进行修复的显示面板、显示装置和显示面板的修复方法。
为实现上述目的，本申请提供了一种显示面板，包括：
第一基板，包括色阻单元；
第二基板，与所述第一基板相对设置；
主动开关矩阵，设置在所述第一基板或第二基板上；
其中，所述主动开关矩阵包括多条扫描线和数据线；
所述扫描线的一侧设置有第一修复线，所述数据线的一侧设置有第二修复线；
所述第一修复线和扫描线的数量一一对应，所述第二修复线和数据线的数量一一对应；
所述第一修复线与扫描线相互对应设置在同一图层或不同图层；
所述第二修复线与数据线相互对应设置在同一图层或不同图层；
所述第一修复线与第二修复线设置在同一图层或不同图层。
本申请还公开了一种显示面板，包括：
第一基板，包括色阻单元；
第二基板，与所述第一基板相对设置；
主动开关矩阵，设置在所述第一基板或第二基板上；
其中，所述主动开关矩阵包括多条扫描线和数据线；
所述扫描线的一侧设置有第一修复线，所述数据线的一侧设置有第二修复线。
本申请还公开了一种显示面板的修复方法，所述显示面板包括第一基板和与所述第一基板相对设置的第二基板，所述第一基板包括色阻单元，所述主动 开关矩阵设置在所述第一基板或第二基板上，所述主动开关矩阵包括多条扫描线和数据线，所述修复方法包括：
在扫描线的旁边对应设置第一修复线，在数据线的旁边对应设置第二修复线；
查找断路的扫描线或数据线；
将断路的扫描线或数据线两端分别与第一修复线和第二修复线桥接形成导电通路。
本实施例中，将根据查找到的断路的扫描线或者数据线，进行分析，看其修复需要第一修复线或者第二修复线，还是需要两种修复线进行配合修复，分析后，将其桥接形成导电通路，即可修复断路的问题。
进一步的，将断路的扫描线或数据线两端分别与第一修复线和第二修复线桥接形成导电通路的方法包括：通过激光焊接的方式桥接所述扫描线或数据线与对应的第一修复线和第二修复线。
本实施例中，桥接主要是通过激光焊接灯等焊接方式实现的，除此之外，被采用作为修复路线的第一修复线和第二修复线，其未被纳入导电通路的部分，将通过切断连接等方式，将其与导电通路的部分隔绝，避免短路、开路及其他问题发生的可能。
本申请由于对应扫描线和数据线，分别在其旁边对应设置了第一修复线和第二修复线，如此，不仅能够修复数据线，也可以修复扫描线；另外，由于第一修复线和第二修复线可以分别设置至少两条，如此，修复的数量也得到了较好的提升；再者，由于第一修复线和第二修复线的长度与对应的扫描线和数据线相当，不存在走线太长衰减而需要进行运算放大的问题。
参照后文的说明和附图，详细公开了本申请的特定实施方式，指明了本申请的原理可以被采用的方式。应该理解，本申请的实施方式在范围上并不因而受到限制。在所附权利要求的精神和条款的范围内，本申请的实施方式包括许多改变、修改和等同。
针对一种实施方式描述和/或示出的特征可以以相同或类似的方式在一个或更多个其它实施方式中使用，与其它实施方式中的特征相组合，或替代其它实施方式中的特征。
应该强调，术语“包括/包含”在本文使用时指特征、整件、步骤或组件的存在，但并不排除一个或更多个其它特征、整件、步骤或组件的存在或附加。
【附图说明】
所包括的附图用来提供对本申请实施例的进一步的理解，其构成了说明书的一部分，用于例示本申请的实施方式，并与文字描述一起来阐释本申请的原理。显而易见地，下面描述中的附图仅仅是本申请的一些实施例，对于本领域普通技术人员来讲，在不付出创造性劳动性的前提下，还可以根据这些附图获得其他的附图。在附图中：
图1是一种断线修复的面板示意图。
图2是本申请一种显示面板的数据线断路修复示意图；
图3是本申请一种显示面板的扫描线断路修复示意图；
图4是本发明一种显示面板的示意图；
图5是本申请一种显示装置的示意图；
图6是本申请一种显示面板的修复方法的流程图。
【具体实施方式】
为了使本技术领域的人员更好地理解本申请中的技术方案，下面将结合本申请实施例中的附图，对本申请实施例中的技术方案进行清楚、完整地描述，显然，所描述的实施例仅仅是本申请一部分实施例，而不是全部的实施例。基于本申请中的实施例，本领域普通技术人员在没有做出创造性劳动前提下所获得的所有其它实施例，都应当属于本申请保护的范围。
图1是本一种断线修复的的面板示意图。
随着LCD产品趋向于高解析度方向发展，由于浮游尘粒(Particle)等问题，导致面内线路会出现导通不良等问题，对此，本申请的申请人曾采用如图1所示的方案进行修复：
具体的，该设计透过修复线1走基板的外围线路进行修复，参考图1，图中A处为断路位置，可以通过该修复线1进行修复，即通过焊点3将修复线替代断路的数据线，以完成线路导通，该图中，讯号走向箭头4指的是使用修复线对数据线进行修复后，讯号的走向线路，但是该修复方式的修复能力有限，首先，该方法只能修复一条或两条数据线(Data line)，而无法实现扫描线(Gate line)的修复；而且，由于外围走线，无可避免的，该修复线的长度较长，因而在将其桥接到断路线路中时，其信号在较长的信号中传输将会出现衰减，为了解决衰减问题，则需要在对应的印制电路板2(PCB)上对应该修复线1增加运算放大功能，如此，不仅增加了产品的生产成本，而且，修复能力有限，难以满足现有的需求。为了解决这一问题，本申请的申请人改进得到了如下的方案：可以
图2是本申请一种显示面板的数据线断路修复示意图，图3是本申请一种显示面板的扫描线断路修复示意图，图4是本发明一种显示面板的示意图，参见图2，图3和图4，对比图1可知：本申请公开了一种显示面板100，包括：
第一基板，包括色阻单元；
第二基板，与所述第一基板相对设置；
主动开关矩阵300，设置在所述第一基板或第二基板上；
其中，所述主动开关矩阵300包括多条扫描线10和数据线20；
所述扫描线的一侧设置有第一修复线11，所述数据线20的一侧设置有第二修复线。
所述扫描线10的旁边对应设置有第一修复线11，所述数据线20的旁边对应设置有第二修复线21；
当扫描线10或数据线20断路时，所述第一修复线11或第二修复线20将 被桥接至对应的断路的扫描线10或数据线20线路中。
对于显示面板，本申请的申请人曾使用修复线(Repair line)在基板外围走线的方法进行修复，但是该方法智能修一条或两条数据线(Data line)，而且，扫描线(Gate line)，不仅如此，由于走线较长，无可避免的需要在对应的PCB板增加运算放大功能，增加了生产成本。
本申请由于对应扫描线和数据线，分别在其旁边对应设置了第一修复线和第二修复线，如此，不仅能够修复数据线，也可以修复扫描线；另外，由于第一修复线和第二修复线可以分别设置至少两条，如此，修复的数量也得到了较好的提升；再者，由于第一修复线和第二修复线的长度与对应的扫描线和数据线相当，不存在走线太长衰减而需要进行运算放大的问题。
该图中，当数据线断路点B或者扫描线断路点D被发现时，该第一修复线11或第二修复线21将通过焊点30进行焊接桥接，完成线路的修复工作。
本实施例可选的，第一修复线11和扫描线10的数量一一对应，所述第二修复线21和数据线20的数量一一对应。本实施例中，修复线和扫描线及数据线一一对应设置，这只需要在光罩处理时，对应修复线，进行设计修改而作出线路即可；如此，即便出现多条线路短线问题，也能够通过将预留的金属修复线进行焊接桥接，而达到修复短线的目的。
本实施例可选的，第一修复线11和扫描线10的数量比值大于或等于二分之一，所述第一修复线21等间距设置；每根所述数据线20旁边均对应设置有一条所述第二修复线21。本实施例中，第一修复线和扫描线进行一比二的对应设置，而第二修复线及数据线则进行一一对应设置，这只需要在光罩处理时，对应修复线，进行设计修改而作出线路即可；如此，即便出现多条线路短线问题，也能够通过将预留的金属修复线进行焊接桥接，而达到修复短线的目的。
本实施例可选的，每根所述扫描线10旁边均对应设置有一条所述第一修复线11，所述第二修复线21和数据线20的数量比值大于或等于二分之一，所述第二修复线21等间距设置。
本实施例中，第一修复线11和扫描线10进行一比一的对应设置，而第二修复线21及数据线20则进行一比二的对应设置，这只需要在光罩处理时，对应修复线，进行设计修改而作出线路即可；如此，即便出现多条线路短线问题，也能够通过将预留的金属修复线进行焊接桥接，而达到修复短线的目的。
本实施例可选的，第一修复线11与扫描线10相互对应设置在同一图层或不同图层；
当需要进行修复处理时，所述第一修复线11将被桥接至待修复的扫描线10线路中。本实施例中，该第一修复线和扫描线，互相对应，就近设置，设置的方式可以是在同一图层对应设置，也可以在不同的图层对应设置，正常情况下，不相连通，而在需要时，则通过焊点焊接或者过孔焊点连接等方式，将修复线接入断线线路，而达到修复的目的。
本实施例可选的，第二修复线21与数据线20相互对应设置在同一图层或不同图层；
当需要进行修复处理时，所述第二修复线21将被桥接至待修复的扫描线20线路中。本实施例中，该第二修复线和数据线，互相对应，就近设置，设置的方式可以是在同一图层对应设置，也可以在不同的图层对应设置，正常情况下，不相连通，而在需要时，则通过焊点焊接或者过孔焊点连接等方式，将修复线接入断线线路，而达到修复的目的。
另外，当所述扫描线10或数据线20的断路需要通过相互交叉的第一修复线11和第二修复线21共同修复时，所述第一修复线和第二修复线将通过焊点30焊接的方法进行桥接连通。
本实施例中，在设置第一修复线11和第二修复线21时，考虑到，有可能出现的断线，光靠一条第一修复线或第二修复线单独无法完成修复的情况，例如，某条数据线光靠对应的第二修复线无法达到修复目的时，可以就近借助第一修复线或第一修复线的部分，完成断路的修复目的。
本实施例中，该第一修复线11和第二修复线21属于修复需要以外的部分 线路，将通过切断处理的方式，即通过切断处理点C，将有用线路和无用线路进行隔绝，将其与用于形成导电通路的修复线路部分断开。
本实施例中，在设置第一修复线11和第二修复线21时有可能出现的断线，光靠一条第一修复线或第二修复线单独无法完成修复的情况，例如，某条数据线光靠对应的第二修复线无法达到修复目的时，可以就近借助第一修复线或第一修复线的部分，完成断路的修复目的；而修复线未被采用的部分，若不将其断路，很有可能出现短路等其他问题，因而，本实施例中，若修复目的只需第一修复线或第二修复线的部分，则未被采用的部分将与被用来修复的部分线路进行切断隔离。
焊接实现桥接，第一修复线11或第二修复线21是通过焊点30焊接的方法桥接至断路的扫描线10线路或数据线20线路中的。本实施例中，该第一修复线和第二修复线，可以通过焊点焊接的方式桥接短路的扫描线或数据线中。
本实施例可选的，主动开关矩阵设置在所述第二基板上。当然了，该主动开关矩阵也可以设置在所述第一基板上，此时，该色阻单元形成在所述主动开关矩阵上。
本实施例可选的，所述显示面板还包括修复检测模块400，耦接与所述主动开关矩阵300，用于检测所述扫描线10或数据线20的线路情况；
修复定位模块500，分别耦接与所述主动开关矩阵300和修复检测模块400，用于定位出现线路问题的所述扫描线10或者数据线20的具体位置。
在上述实施例中，显示面板包括液晶面板、OLED(Organic Light-Emitting Diode)面板、QLED(Quantum Dot Light Emitting Diodes)面板、等离子面板、平面型面板、曲面型面板等。对于液晶显示面板，第一基板和第二基板之间设置有液晶显示层，通过控制液晶分子偏转来控制透光率，配合彩色滤光片形成各种显示图像。
图5是本申请一种显示装置的示意图，该显示装置100包括控制部件200，以及如本申请任一公开的显示面板300。
本申请的显示装置中，可使用修复线(Repair line)在基板外围走线的方法进行修复，但是该方法智能修一条或两条数据线(Data line)，而且，扫描线(Gate line)，不仅如此，由于走线较长，需要在对应的PCB板增加运算放大功能，增加了生产成本；本申请由于对应扫描线和数据线，分别在其旁边对应设置了第一修复线和第二修复线，如此，不仅能够修复数据线，也可以修复扫描线；另外，由于第一修复线和第二修复线可以分别设置至少两条，如此，修复的数量也得到了较好的提升；再者，由于第一修复线和第二修复线的长度与对应的扫描线和数据线相当，不存在走线太长衰减而需要进行运算放大的问题。
以上以显示面板为例进行详细说明，需要说明的是，以上对显示面板结构的描述同样适用于本申请实施例的显示装置中。其中，当本申请实施例的显示装置为液晶显示器时，液晶显示器包括有背光模组，背光模组可作为光源，用于供应充足的亮度与分布均匀的光源，本实施例的背光模组可以为前光式，也可以为背光式，需要说明的是，本实施例的背光模组并不限于此。
本申请还公开了一种显示面板的修复方法，参考如图6一种显示面板的修复方法的流程图所示，结合图1-图5所示可知：
该显示面板100包括第一基板和与所述第一基板相对设置的第二基板，所述第一基板包括色阻单元，所述主动开关矩阵300设置在所述第一基板或第二基板上，所述主动开关矩阵300包括多条扫描线和数据线，该修复方法包括步骤：
S1:在扫描线的旁边对应设置第一修复线，在数据线的旁边对应设置第二修复线；
S2:查找断路的扫描线或数据线；
S3：将断路的扫描线或数据线两端分别与第一修复线和第二修复线桥接形成导电通路。
本实施例中，将根据查找到的断路的扫描线或者数据线，进行分析，看其修复需要第一修复线或者第二修复线，还是需要两种修复线进行配合修复，分 析后，将其桥接形成导电通路，即可修复断路的问题。
本实施例可选的，将断路的扫描线或数据线两端分别与第一修复线和第二修复线桥接形成导电通路的方法包括：通过激光焊接的方式桥接所述扫描线或数据线与对应的第一修复线和第二修复线。本实施例中，桥接可以是通过激光焊接灯等焊接方式实现的，除此之外，被采用作为修复路线的第一修复线和第二修复线，其未被纳入导电通路的部分，将通过切断连接等方式，将其与导电通路的部分隔绝，避免短路、开路及其他问题发生的可能。
以上详细描述了本申请的具体实施例。应当理解，本领域的普通技术人员无需创造性劳动就可以根据本申请的构思作出诸多修改和变化。因此，凡本技术领域中技术人员依本申请的构思在现有技术的基础上通过逻辑分析、推理或者有限的实验可以得到的技术方案，皆应在由权利要求书所确定的保护范围内。

Claims (20)

  1. 一种显示面板，包括：
    第一基板，包括色阻单元；
    第二基板，与所述第一基板相对设置；
    主动开关矩阵，设置在所述第一基板或第二基板上；
    其中，所述主动开关矩阵包括多条扫描线和数据线；
    所述扫描线的一侧设置有第一修复线，所述数据线的一侧设置有第二修复线。
  2. 如权利要求1所述的显示面板，其中，所述第一修复线和扫描线的数量一一对应，所述第二修复线和数据线的数量一一对应；
    所述第一修复线与扫描线相互对应设置在同一图层或不同图层。
  3. 如权利要求1所述的显示面板，其中，所述第一修复线和扫描线的数量比值大于或等于二分之一，所述第一修复线等间距设置；每根所述数据线旁边均对应设置有一条所述第二修复线；
    所述第一修复线与扫描线相互对应设置在同一图层或不同图层。
  4. 如权利要求1所述的显示面板，其中，每根所述扫描线旁边对应设置有一条所述第一修复线，所述第二修复线和数据线的数量比值大于或等于二分之一，所述第二修复线等间距设置；
    所述第一修复线与扫描线相互对应设置在同一图层或不同图层。
  5. 如权利要求1所述的显示面板，其中，所述第一修复线和扫描线的数量一一对应，所述第二修复线和数据线的数量一一对应；
    所述第二修复线与数据线相互对应设置在同一图层或不同图层。
  6. 如权利要求1所述的显示面板，其中，所述第一修复线和扫描线的数量比值大于或等于二分之一，所述第一修复线等间距设置；每根所述数据线旁边对应设置有一条所述第二修复线；
    所述第二修复线与数据线相互对应设置在同一图层或不同图层。
  7. 如权利要求1所述的显示面板，其中，每根所述扫描线旁边对应设置有一条所述第一修复线，所述第二修复线和数据线的数量比值大于或等于二分之一，所述第二修复线等间距设置；
    所述第二修复线与数据线相互对应设置在同一图层或不同图层。
  8. 如权利要求1所述的显示面板，其中，所述第一修复线和扫描线的数量一一对应，所述第二修复线和数据线的数量一一对应；
    所述第一修复线与第二修复线设置在同一图层或不同图层。
  9. 如权利要求1所述的显示面板，其中，所述第一修复线和扫描线的数量比值大于或等于二分之一，所述第一修复线等间距设置；每根所述数据线旁边均对应设置有一条所述第二修复线；
    所述第一修复线与第二修复线设置在同一图层或不同图层。
  10. 如权利要求1所述的显示面板，其中，每根所述扫描线旁边对应设置有一条所述第一修复线，所述第二修复线和数据线的数量比值大于或等于二分之一，所述第二修复线等间距设置；
    所述第一修复线与第二修复线设置在同一图层或不同图层。
  11. 如权利要求1所述的显示面板，其中，所述主动开关矩阵设置在所述第二基板上。
  12. 如权利要求1所述的显示面板，其中，所述主动开关矩阵设置在所述第一基板上，所述色阻单元形成在所述主动开关矩阵上。
  13. 如权利要求1所述的显示面板，其中，所述第一修复线与扫描线相互对应设置在同一图层或不同图层；
    所述第二修复线与数据线相互对应设置在同一图层或不同图层；
    所述第一修复线与第二修复线设置在同一图层或不同图层。
  14. 如权利要求1所述的显示面板，其中，所述显示面板还包括修复检测模块，耦接与所述主动开关矩阵，用于检测所述扫描线或数据线的线路情况；
    修复定位模块，分别耦接与所述主动开关矩阵和修复检测模块，用于定位出现线路问题的所述扫描线或者数据线的具体位置。
  15. 一种显示面板，包括：
    第一基板，包括色阻单元；
    第二基板，与所述第一基板相对设置；
    主动开关矩阵，设置在所述第一基板或第二基板上；
    其中，所述主动开关矩阵包括多条扫描线和数据线；
    所述扫描线的一侧设置有第一修复线，所述数据线的一侧设置有第二修复线；
    所述第一修复线和扫描线的数量一一对应，所述第二修复线和数据线的数量一一对应；
    所述第一修复线与扫描线相互对应设置在同一图层或不同图层；
    所述第二修复线与数据线相互对应设置在同一图层或不同图层；
    所述第一修复线与第二修复线设置在同一图层或不同图层。
  16. 一种显示面板的修复方法，所述显示面板包括第一基板和与所述第一基板相对设置的第二基板，所述第一基板包括色阻单元，所述主动开关矩阵设置在所述第一基板或第二基板上，所述主动开关矩阵包括多条扫描线和数据线，所述修复方法包括：
    在扫描线的旁边对应设置第一修复线，在数据线的旁边对应设置第二修复线；
    查找断路的扫描线或数据线；
    将断路的扫描线或数据线两端分别与第一修复线和第二修复线桥接形成导电通路。
  17. 如权利要求16所述的显示面板的修复方法，其中，所述将断路的扫描线或数据线两端分别与第一修复线和第二修复线桥接形成导电通路的方法包括：通过激光焊接的方式桥接所述扫描线或数据线与对应的第一修复线和第二 修复线。
  18. 如权利要求16所述的显示面板的修复方法，其中，所述主动开关矩阵设置在所述第二基板上。
  19. 如权利要求16所述的显示面板的修复方法，其中，所述主动开关矩阵设置在所述第一基板上，所述色阻单元形成在所述主动开关矩阵上。
  20. 如权利要求16所述的显示面板的修复方法，其中，所述显示面板还包括：
    修复检测模块，用于检测所述扫描线或数据线的线路情况；
    修复定位模块，用于定位出现线路问题的所述扫描线或者数据线的具体位置。
PCT/CN2017/106308 2017-06-20 2017-10-16 一种显示面板及显示面板的修复方法 Ceased WO2018233154A1 (zh)

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