WO2018205500A1 - Système de test au niveau d'une carte électronique - Google Patents

Système de test au niveau d'une carte électronique Download PDF

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Publication number
WO2018205500A1
WO2018205500A1 PCT/CN2017/106872 CN2017106872W WO2018205500A1 WO 2018205500 A1 WO2018205500 A1 WO 2018205500A1 CN 2017106872 W CN2017106872 W CN 2017106872W WO 2018205500 A1 WO2018205500 A1 WO 2018205500A1
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WIPO (PCT)
Prior art keywords
board
tested
controller
card
control switch
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Application number
PCT/CN2017/106872
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English (en)
Chinese (zh)
Inventor
矫德余
吴涛
石勇
王延超
赵国平
Original Assignee
中车大连电力牵引研发中心有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Application filed by 中车大连电力牵引研发中心有限公司 filed Critical 中车大连电力牵引研发中心有限公司
Publication of WO2018205500A1 publication Critical patent/WO2018205500A1/fr

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/281—Specific types of tests or tests for a specific type of fault, e.g. thermal mapping, shorts testing
    • G01R31/2812—Checking for open circuits or shorts, e.g. solder bridges; Testing conductivity, resistivity or impedance

Definitions

  • the present invention relates to the field of testing technology, and in particular, to a board level testing system.
  • the development process of control system products is mainly divided into three stages: board level development, equipment level development and system level development.
  • board level development In order to ensure that the performance, reliability, safety and other indicators of the product meet the design requirements, it is necessary to test the products at each stage.
  • Tests for board-level development are board-level tests, and board-level tests are the most basic tests, mainly to complete board testing.
  • the prior art mainly relies on manual wiring for board-level testing to achieve switching between the channel under test and the test circuit. That is, when it is necessary to switch to the bypass channel or the next test content, it is necessary to manually change the wiring of the board to be tested and the test circuit.
  • the present invention provides a board level test system to overcome the problem of low efficiency in prior art board level testing.
  • the invention provides a board level test system, comprising: a controller, a communication board, an output board and a control switch; the output board is electrically connected to the board to be tested through a control switch, and the board to be tested comprises a plurality of circuits, and the control
  • the switch is used for selectively controlling the output board to be electrically connected to one or more circuits of the board to be tested;
  • the controller is communicatively connected with the control switch for controlling the on/off of the control switch; the controller passes the communication board and is to be tested The card communication connection;
  • the controller is further connected to the output board for controlling the output board to output the first excitation signal; the communication board receives the feedback signal of the board to be tested for the first excitation signal and transmits the signal to the controller.
  • the board level test system as described above further includes an input board, and the input board is electrically connected to the board to be tested through a control switch, and the control switch is further configured to selectively control one or more of the input board and the board to be tested.
  • the circuit is electrically connected; the controller is communicatively coupled to the input board; the controller is further configured to control the communication board to generate a second excitation signal; the input board receives the feedback signal of the to-be-tested card for the second excitation signal and transmits the feedback signal to the controller .
  • the board level test system as described above, wherein the input board comprises: a digital input board and an analog input board, and the control switch is further used for selectively controlling the digital input board and the analog input board and waiting One or more circuits of the test card are electrically connected.
  • the board level test system as described above, wherein the input board further comprises a digital multimeter, and the control switch is further configured to selectively control the digital input board, the analog input board, and one of the digital multimeter and the board to be tested or Multiple circuits are electrically connected.
  • the board level test system as described above, wherein the output board comprises: a digital output board and an analog output board, and the control switch is further used for selectively controlling the digital output board and the analog output board and waiting One or more circuits of the test card are electrically connected.
  • the board level test system as described above further includes an oscilloscope, and the oscilloscope is electrically connected to the board to be tested through a control switch, and the control switch is further configured to selectively control one or more circuits of the oscilloscope and the board to be tested to be electrically connected;
  • the device is further configured to control the communication board to generate a third excitation signal; the oscilloscope receives and displays the feedback signal of the to-be-tested card for the third excitation signal.
  • the board level test system as described above, wherein the oscilloscope is communicatively coupled to the controller for transmitting a feedback signal of the third excitation signal to the controller.
  • the board level test system as described above further comprising: a signal processing device connected in series between the output board and the control switch for processing the first excitation signal.
  • the board level test system as described above further includes a server, and the server is in remote communication connection with the controller.
  • the board level test system as described above further includes: a processor connected between the server and the control switch for controlling the working state of the control switch according to the control signal of the server.
  • the board level test system communicates with the control switch through a controller to control the switching of the control switch, thereby selectively electrically connecting the output board to one or more circuits of the board to be tested, thereby realizing the board to be tested.
  • the automatic test improves the efficiency of the board test to be tested.
  • Embodiment 1 is a schematic structural view of Embodiment 1 of the present invention.
  • FIG. 2 is a schematic structural view of a test insertion box of the present invention
  • Embodiment 2 of the present invention is a schematic structural view of Embodiment 2 of the present invention.
  • FIG. 4 is a schematic structural view of a program-controlled load board
  • FIG. 5 is a schematic structural diagram of Embodiment 3 of the present invention.
  • FIG. 6 is a schematic structural view of the simulation machine of FIG. 5;
  • Figure 7 is a schematic structural view of Embodiment 4 of the present invention.
  • Figure 8 is a schematic structural view of the switching matrix box of Figure 7;
  • Figure 9 is a schematic structural view of the processor of Figure 7;
  • Figure 10 is an internal circuit diagram of the processor of Figure 9;
  • Figure 11 is a schematic view of the mechanism of the wiring box of Figure 7.
  • 61 analog input board
  • 62 digital input board
  • test insertion box test insertion box
  • 101 communication interface
  • 161 switch matrix board
  • 1611 first row of relay switches
  • FIG. 1 is a schematic structural view of Embodiment 1 of the present invention.
  • the board level test system includes: a controller 3, a communication board 4, an output board 5, and a control switch 2; the output board 5 is electrically connected to the board to be tested 1 through the control switch 2, and the board to be tested 1 includes a control circuit 2 for selectively controlling the output card 5 to be electrically connected to one or more circuits of the board to be tested 1; the controller 3 is communicatively coupled to the control switch 2 for controlling the on and off of the control switch 2
  • the controller 3 is communicably connected to the board to be tested 1 through the communication board 4; the controller 3 is also communicably connected with the output board 5 for controlling the output board 5 to output the first excitation signal; the communication board 4 is to be tested.
  • the feedback signal of the card 1 to the first excitation signal is transmitted to the controller 3.
  • the card to be tested 1 may include multiple circuits, which may correspond to different test contents (such as digital input, analog input, etc.) or different test channels (the channel to be tested corresponding to a certain test content may have Multiple, such as 16 or 32 digital input channels, etc.
  • the control switch 2 can selectively control the output board 5 to be electrically connected to one or more circuits of the board to be tested 1 for testing different contents. Or channel.
  • the controller 3 When the test card 1 is subjected to an input test, first, the controller 3 first selects one or more circuits for testing, and then outputs a control signal to control the control switch 2 to connect the selected circuit to the test circuit, that is, the selected circuit An electrical connection is made between the output card 5. Then, the controller 3 outputs another control signal to the output board 5, and the output board 5 outputs the first excitation signal after receiving the control signal, and the first excitation signal is input to the board to be tested as an input signal of the board 1 to be tested. In the card 1, the board to be tested 1 reacts to the first excitation signal, and outputs the feedback signal to the communication board 4 according to the communication protocol. The communication board 4 inputs the feedback signal to the controller 3, and the controller 3 will feedback.
  • the signal is compared with the first excitation signal to determine whether the test is successful, and the test result is recorded to complete the input test of the selected circuit.
  • the controller 3 can continue to control the control switch 2 to connect other circuits into the test circuit, and perform testing until all circuits of the board 1 to be tested are tested.
  • control switches can be in multiple groups, each group corresponding to different test content or different test channels. No specific restrictions are imposed here. Moreover, the type of the control switch in this embodiment is not specifically limited.
  • the control switch may be a relay switch or a switch tube.
  • the board level test system of the present embodiment may further include a test box 10 for installing various components of the board level test system in the test box 10 to improve the integration of the board level test system, thereby reducing Small overall volume.
  • the board to be tested may be fixed in the test box 10, and the test box 10 may be given to the board to be tested.
  • the card 1 provides a power supply interface 103 and a communication interface 101 for powering the board to be tested 1 and implementing a communication connection.
  • the communication interface 101 of the line connection test box 10 and the communication board 4 realize the communication connection between the board 1 and the communication board 4 to be tested, and the other line connects the board 1 to be tested and the control switch 2 to be implemented.
  • the test card 1 is electrically connected to the control switch 2.
  • the test plug box can provide various interfaces for the board to be tested, which improves the versatility of the test system.
  • the test card 10 can also provide the board interface 102 to be tested for the board to be tested 1 , and the control switch 2 can be connected with the board interface 102 of the test box 10 to implement the board 1 and control to be tested. Switch 2 is electrically connected.
  • the test box 10 can be provided with a main test slot 104 and a plurality of spare slots 105.
  • the board to be tested 1 is fixed in each slot.
  • the spare slot 105 can be utilized. Test to improve the reliability of the test system.
  • the controller 3 can also be connected to the tested box 10 to control the main test slot 104 or the spare slot 105 of the tested box 10 to be connected to the test circuit; when there are multiple boards to be tested, The tested boards are placed in multiple slots in sequence, and the controller 3 automatically tests multiple boards. After testing one board to be tested, the controller 3 will test the board in the next slot. The test circuit is connected and the test is continued. The automatic test of multiple boards to be tested can be realized, and the board is not manually switched, and the degree of automation is high.
  • the excitation signal and the feedback signal may be analog or digital output signals or communication signals, and the like.
  • the first excitation signal may be an analog or digital output signal.
  • the communication board may be any board that can realize communication in the prior art, such as a CAN communication board, an MVB communication board, etc., and is not specifically limited herein.
  • the controller can communicate with other controlled devices through the Ethernet switch. .
  • the board level test system provided in this embodiment is connected to the control switch through a controller to control the switching of the control switch, thereby selectively connecting the output board to one or more circuits of the board to be tested, thereby implementing the board to be tested.
  • the automatic test of the card improves the efficiency of the test of the board to be tested.
  • the board level test system provided in this embodiment further includes an input board 6 electrically connected to the board to be tested 1 through the control switch 2, and the control switch 2 is further configured to selectively control the input board 6 is electrically connected to one or more circuits of the board 1 to be tested; the controller 3 is communicatively connected with the input board 6; the controller 3 is further configured to control the communication board 4 to generate a second excitation signal; the input board 6 receives the The feedback signal of the card 1 for the second excitation signal is transmitted to the controller 3.
  • the controller 3 first selects one or more circuits for testing, and then outputs a control signal to control the control switch 2 to connect the selected circuit to the test circuit, which is about to be An electrical connection is made between the selected circuit and the input card 6. Then, the controller 3 outputs another control signal to the communication board 4, and after receiving the control signal, the communication board 4 outputs a second excitation signal to the board to be tested 1, and the board 1 to be tested makes a second excitation signal.
  • the reaction output feedback signal, the input board 6 receives the feedback signal and inputs it into the controller 3, and the controller 3 compares the feedback signal with the second excitation signal to determine whether the test is successful, and records the test result to complete the selected circuit.
  • the controller 3 can continue to control the control switch 2 to connect other circuits into the test circuit, and perform testing until all circuits of the board 1 to be tested are tested.
  • the output test of the board to be tested can be realized through the input board, so that the function of the test system is more perfect.
  • the second excitation signal is a communication signal, and the analog card or the digital signal is controlled to be output by the card to be tested.
  • FIG. 3 is a schematic structural diagram of Embodiment 2 of the present invention.
  • the board level test system provided in this embodiment, wherein the input board 6 includes: a digital input board 62 and an analog input board 61, and the control switch 2 is also used to selectively control the digital input.
  • the board 62 and the analog input board 61 are electrically connected to one or more circuits of the board 1 to be tested.
  • the digital input card 62 can be selected by the controller 3 as an input card to access the test circuit; when the analog output of the card 1 to be tested is performed During the test, the analog input board 61 can be selected by the controller 3 as an input board to be connected to the test circuit; if both the digital output needs to be tested and the analog output needs to be tested, the controller 3 can be passed. Different control signals are issued to enable automatic switching between the digital input board 62 and the analog input board 61.
  • the digital input board and the analog input board enable the test system to measure both the digital output of the board to be tested and the analog output, and the test function is more comprehensive.
  • the input board 6 further includes a digital multimeter 63.
  • the control switch 2 is further configured to selectively control the digital input board 62, the analog input board 61, and the digital multimeter 63 and the board 1 to be tested. Or multiple circuits are electrically connected.
  • the feed signal can be input to the digital multimeter 63, and the size or shape of the voltage or current or the like is displayed by a digital multimeter. Displaying the feedback signal with a digital multimeter can make the test results intuitive and specific.
  • the output board 5 includes: a digital output board 52 and an analog output board 51.
  • the control switch 2 is further configured to selectively control the digital output board 52 and the analog output board 51 and One or more circuits of the card 1 are electrically connected.
  • the digital output card 52 can be selected by the controller 3 as an output card to be connected to the test circuit; when the analog input of the card 1 to be tested is performed During the test, the analog output board 51 can be selected by the controller 3 as an input board to be connected to the test circuit; if both the digital input needs to be tested and the analog input needs to be tested, the controller 3 can be passed. Different control signals are issued to enable automatic switching between the digital output board 52 and the analog output board 51.
  • the digital output board and the analog output board enable the test system to measure both the digital output of the board to be tested and the analog output, and the test function is more comprehensive.
  • the input board and the output board can be integrated into one board.
  • the digital input board and the digital output board can be integrated into one digital IO card, which is not specifically limited herein.
  • the board level test system further includes an oscilloscope 7, and the oscilloscope 7 is electrically connected to the board to be tested 1 through the control switch 2, and the control switch 2 is further configured to selectively control one of the oscilloscope 7 and the board to be tested 1 or The plurality of circuits are electrically connected; the controller 3 is further configured to control the communication board 4 to generate a third excitation signal; and the oscilloscope 7 receives and displays the feedback signal of the board 1 to be tested for the third excitation signal.
  • the controller 3 when performing the output test on the test card 1 to be tested, first, the controller 3 first selects one or more circuits for testing, and then outputs a control signal to control the control switch 2 to connect the selected circuit to the test circuit. An electrical connection is made between the circuit to be selected and the oscilloscope 7. Then, the controller 3 outputs another control signal to the communication board 4, and after receiving the control signal, the communication board 4 outputs a third excitation signal to the board to be tested 1, and the board 1 to be tested makes a third excitation signal. The reaction outputs a feedback signal, and the oscilloscope 7 receives the feedback signal and displays the change.
  • the third excitation signal may be the same as the second excitation signal.
  • the third excitation signal is a communication signal for controlling the output digital quantity of the card to be tested.
  • the oscilloscope can be used for the board to be tested. The time characteristics of the rising or falling edge of the digital output are tested and the test results are more intuitive.
  • the oscilloscope 7 is communicatively coupled to the controller 3 for transmitting a feedback signal of the third excitation signal to the controller 3. Specifically, the oscilloscope 7 also transmits a feedback signal to the controller 3, and the controller 3 compares the feedback signal with the third excitation signal to determine whether the test is successful, and records the test result to complete the input test of the selected circuit. After the circuit test is completed, the controller 3 can continue to control the control switch 2 to connect other circuits into the test circuit, and perform testing until all circuits of the board 1 to be tested are tested. Transfer the results of the oscilloscope to the controller for the controller to compare and store the test results.
  • the board level test system further includes: a signal processing device 8 connected in series between the output board 5 and the control switch 2 for processing the first excitation signal.
  • the signal processing device 8 can also be connected in series between the input card 6 and the control switch 2, and the feedback signal of the card 1 to be tested is processed.
  • the signal processing device can perform operations such as amplifying and filtering the signal to convert the signal into a signal that can be recognized by other devices, and can also function as isolation and protection.
  • the signal processing device may include a program-controlled load board, a relay output conditioning board, a relay input conditioning board, a high-voltage digital output conditioning board, a high-voltage digital input conditioning board, a digital output conditioning board, a digital input conditioning board, and an analog output conditioning board.
  • Analog input conditioning board, etc. Each board can correspond to different test contents, and the user can set the type and number of boards according to the actual situation.
  • the signal processing device can be a conditioning plug box integrating the above functions, and the modularity of the test system is realized, which is convenient for control and maintenance.
  • the program-controlled load board in the signal processing device can provide a load for the board to be tested to perform load characteristic test of the board to be tested.
  • the process control load board provides loads of different sizes to obtain a varying voltage and current of the board to be tested, so that the board to be tested can be characterized by different loads or Quantitative reaction, that is, measurement of the load characteristics of the board to be tested.
  • FIG. 4 is a schematic structural view of a program-controlled load board. Please refer to FIG. 4, the program-controlled load board is connected with a plurality of resistors in series, and each resistor has a switch in parallel, and a resistor can be connected to the circuit or short-circuited by the on-off of the switch.
  • each of the resistors may be formed by a plurality of resistors in series or in parallel.
  • the number and size of the resistors may be set according to actual requirements, and are not specifically limited herein.
  • the closing of the programmed load board switch can be controlled by the controller.
  • FIG. 5 is a schematic structural diagram of Embodiment 3 of the present invention.
  • the input card 6, the output card 5, the communication card 4, and the controller 3 can be integrated into a simulator 14.
  • the simulation machine 14 can provide various types of signals for testing the board to be tested, so that the modularity of the test system is high, and it is convenient for control and maintenance.
  • the emulator can integrate the various boards or controllers using a PXI/PXIe chassis.
  • FIG. 6 is a schematic structural view of the simulation machine of FIG. 5, and the simulation machine may include multiple slots according to FIG. 6, and different boards may be added according to the test content, such as an analog input board, an analog output board, and CAN communication. Board, Ethernet interface board, etc.
  • the type and number of boards can be added according to the test content, and are not specifically limited herein.
  • the board level test system further includes a server 11 that is in remote communication connection with the controller 3.
  • a server 11 that is in remote communication connection with the controller 3.
  • the server Through the communication connection between the server and the controller, a part of the functions of the controller are realized remotely by the server, and each part is separately controlled, so that the control system has high modularity, high reliability and easy maintenance.
  • the allocation of the controller and the server function can be set according to the actual situation, and the invention is not limited thereto.
  • the controller 3 is integrated into the emulator 14 and is responsible for implementing control of each of the boards in the emulator 14, i.e., which board is used to provide what signals to be tested.
  • the server 11 mainly implements centralized control, that is, controls independent switches such as the control switch 2 and the simulation machine 14, and records test results and the like.
  • the server 11 when testing the output of the card to be tested, the server 11 first selects one or more circuits for testing, and then outputs a control signal to control the control switch 2 to connect the selected circuit to the test circuit, the circuit to be selected. An electrical connection is made between the input card 5. Then, the server 11 outputs another control signal to the simulation machine 14, and the controller 3 in the simulation machine 14 controls the communication board 4 to output a second excitation signal to the board to be tested 1, and the board to be tested 1 performs the second excitation signal.
  • the reaction output feedback signal is output, the input card 6 receives the feedback signal and inputs it into the controller 3, the controller 3 compares the feedback signal with the second excitation signal, and then uploads the result to the server 11, and the server 11 judges the test Whether it is successful, and record the test results, complete the input test of the selected circuit.
  • the test flow is similar to the above process and will not be described again.
  • the server 11 is communicably connected to the controller 3 through the Ethernet switch 12, and can be remotely monitored in real time. control.
  • the board level test system may further include a programmable power source 13 , and the program control power source 13 may also be electrically connected to one or more of the power devices such as the simulator 14 , the signal processing device 8 , the oscilloscope 7 , and the control switch 2 .
  • the programmable power supply 13 can also be communicatively coupled to the controller 3 or the server 11 via the Ethernet switch 12 to receive the power control signals output by the controller 3 or the server 11 so as to be different powered devices or different. Time provides the power supply with different voltage values or current values for the same powered device.
  • the server 11 can issue an instruction to control the programmable power supply 13 to supply power to the oscilloscope 7, and when the oscilloscope 7 is not used, the oscilloscope 7 is stopped.
  • This setting can avoid the instability of the grid when all the equipment is powered at the same time when the test system is running, and can reduce energy waste.
  • the number and voltage of the programmable power supply can be set according to actual conditions.
  • the programmable power supply can be two, one is used as the rated voltage power supply device of each test equipment, and the other is used as a digital input test. Power supply equipment.
  • the board level test system may further include a wiring box 9 connected in series between the board to be tested 1 and the control switch 2.
  • the wiring box 9 can connect all the control switches 2 and all the circuits of the board to be tested 1 to facilitate switching the test circuit.
  • the number of the wiring boxes can be configured as needed, and is not specifically limited herein.
  • the board level test system further includes: a processor (not shown) connected between the server 11 and the control switch 2 for controlling the working state of the control switch 2 according to the control signal of the server 11 Control the individual control of the switch.
  • FIG. 7 is a schematic structural view of Embodiment 4 of the present invention.
  • the server is not shown in the figure, and the connection relationship is referred to the above third embodiment. Please refer to FIG. 7.
  • the switch matrix box in the prior art can be used to implement the function of the control switch, and the switch matrix box can select one or more signals for output according to the need of one or more signal inputs, thereby improving the system.
  • the switch matrix box 16 can include a plurality of switch matrix boards 161, each switch matrix board 161 including one or more control switches to correspond to different test content or test channels to facilitate independent control of the test process.
  • the number of the switching matrix box and the switching matrix board can be set according to actual conditions, and is not specifically limited herein.
  • the switch matrix box 16 may further include a processor 15 communicatively coupled to the server 11 for receiving control signals of the server 11 and thereby controlling the switching of the channels of the switching matrix board 161 to implement an input card or The electrical connection of the output card to one or more circuits of the card to be tested.
  • the individual control of the switching matrix board 161 by the processor 15 can improve the reliability of the control system.
  • the server 11 when testing, the server 11 outputs a control signal to the processor 15, and the processor 15 controls the switching matrix board 161 to connect one or more circuits of the board to be tested 1 to the test circuit according to the control signal, and then the server 11 gives the simulator A control signal of controller 3 in 14 will test the required board (when testing the input of the board to be tested, the required board can be the communication board and the output board; when testing the output of the board to be tested)
  • the required board can be connected to the test circuit for the communication board and the input board to start testing. Different boards in the simulator 14 and different conditioning boards in the signal processing device 8 can be selected for different test contents.
  • FIG. 8 is a schematic structural view of the switching matrix box of FIG. 7.
  • the switching matrix board 161 may include a first row of relay switches 1611 and a second row of relay switches 1612.
  • the first row of relay switches 1611 implements switching between the signal processing device 8 and the test circuit, and the second row of relay switches 1612
  • the switch realizes switching between each circuit of the board to be tested 1 and the test circuit.
  • all relay switches are by default at the normally closed end.
  • the server 11 gives the processor 15 a control signal during the test, and the processor 15 controls the first row of relay switches 1611 and the second row of relay switches 1612 to switch to the test circuit corresponding to the test content and the test channel, The electrical connection between the board to be tested and the signal processing device.
  • the processor 15 can also undertake the switching function of the programmable load board and the test circuit.
  • 9 is a schematic structural view of the processor of FIG. 7, and FIG. 10 is an internal circuit diagram of the processor of FIG. 9 and FIG. 10, the wiring box 9 includes a board interface and an excitation interface.
  • the board interface is an interface between the distribution box 9 and the board to be tested 1.
  • the excitation interface is the wiring box 9 and the switching matrix box 16. Interface, which can contain multiple channels for transmitting excitation signals.
  • the processor 15 is connected to the excitation interface of the wiring box 9, is connected to the program-controlled load board of the signal processing device 8, is connected to the switching matrix board 161, and is also connected to the oscilloscope 7 and the digital multimeter 63.
  • the switch S0 and the switch S5 are closed, and the process can be performed.
  • the load in the load board is connected to the test circuit.
  • the current flows from the switching matrix board 161 through the signal conditioning device 8, and is input to the current meter of the digital multimeter 63 (also can be output to a voltmeter or an oscilloscope, and is selected according to the test requirements. ), the result is displayed.
  • the switch S1 to S4 When the input of the test card is tested, one of the switches S1 to S4 is closed, and the switch S5 is closed. At this time, the first excitation signal is input from the switching matrix board to the different excitation channels of the wiring box, and finally to be tested.
  • the different circuits in the board realize electrical connection, and realize switching between each circuit of the board to be tested and the test circuit.
  • the switch S1, the switch S2, the switch S3 and the switch S4 represent different excitation channels, which can correspond to different circuits of the board to be tested, and can also be mutually redundant, ensuring the flexibility of applying the excitation signal.
  • the number of the excitation channels can be set according to actual conditions, and the invention is not limited thereto.
  • Figure 11 is a schematic view of the mechanism of the wiring box of Figure 7.
  • the wiring box 9 includes a plurality of test interfaces, which in turn include a card interface connected to the card 1 to be tested and an excitation interface connected to the processor 15.
  • the wiring box can also include a programmable power interface and a power supply interface for powering the wiring box.
  • the simulator may further include a delay test board, and the delay test board may be used to test the delay characteristics of the board to be tested.
  • the delay test can use the MVB board in the simulator to communicate, test the time difference between the first excitation signal from the MVB board and the feedback signal from the board to be tested, or test the input from the simulator.
  • the board sends a second excitation signal to the time difference between the board to be tested and the feedback signal sent to the MVB board.
  • the specific test process can refer to the above input and output test flow, and will not be described here.

Abstract

La présente invention concerne un système de test au niveau d'une carte électronique, comprenant un dispositif de commande (3), une carte de carte électronique de communication (4), une carte de carte électronique de sortie (5) et un commutateur de commande (2). La carte de carte électronique de sortie (5) est électriquement connectée à une carte de carte électronique (1) à tester, au moyen du commutateur de commande (2); la carte de carte électronique (1) à tester comprend une pluralité de circuits; le commutateur de commande (2) est utilisé pour commander sélectivement la connexion électrique de la carte de carte électronique de sortie (5) et un ou plusieurs circuits de la carte de carte électronique (1) à tester; le dispositif de commande (3) est en liaison de communication avec le commutateur de commande (2), qui est utilisé pour commander la commutation du commutateur de commande (2); le dispositif de commande (3) est en liaison de communication avec la carte de carte électronique (1) à tester au moyen de la carte de carte électronique de communication (4); le dispositif de commande (3) est en outre en liaison de communication avec la carte de carte électronique de sortie (5), qui est utilisée pour commander la carte de carte électronique de sortie (5) de telle sorte qu'il délivre en sortie un premier signal d'excitation; et la carte de carte électronique de communication (4) reçoit un signal de rétroaction, concernant le premier signal d'excitation, de la carte de carte électronique (1) à tester, et le transmet au dispositif de commande (3). Le système de test au niveau d'une carte électronique peut tester automatiquement une carte de carte électronique (1) à tester, ce qui permet d'améliorer l'efficacité d'un test de la carte de carte électronique (1) à tester.
PCT/CN2017/106872 2017-05-10 2017-10-19 Système de test au niveau d'une carte électronique WO2018205500A1 (fr)

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