WO2018168929A1 - Module optique - Google Patents

Module optique Download PDF

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Publication number
WO2018168929A1
WO2018168929A1 PCT/JP2018/009975 JP2018009975W WO2018168929A1 WO 2018168929 A1 WO2018168929 A1 WO 2018168929A1 JP 2018009975 W JP2018009975 W JP 2018009975W WO 2018168929 A1 WO2018168929 A1 WO 2018168929A1
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WO
WIPO (PCT)
Prior art keywords
mirror
optical
axis direction
mirror surface
fixed
Prior art date
Application number
PCT/JP2018/009975
Other languages
English (en)
Japanese (ja)
Inventor
智史 鈴木
恭輔 港谷
達哉 杉本
Original Assignee
浜松ホトニクス株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP2017133086A external-priority patent/JP6893449B2/ja
Application filed by 浜松ホトニクス株式会社 filed Critical 浜松ホトニクス株式会社
Priority to CN201880017380.6A priority Critical patent/CN110402408B/zh
Priority to DE112018001339.1T priority patent/DE112018001339T5/de
Priority to US16/492,712 priority patent/US11487104B2/en
Publication of WO2018168929A1 publication Critical patent/WO2018168929A1/fr

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    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B81—MICROSTRUCTURAL TECHNOLOGY
    • B81B—MICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICAL DEVICES
    • B81B3/00—Devices comprising flexible or deformable elements, e.g. comprising elastic tongues or membranes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/45—Interferometric spectrometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B26/00—Optical devices or arrangements for the control of light using movable or deformable optical elements
    • G02B26/06—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the phase of light

Definitions

  • This disclosure relates to an optical module.
  • An optical module in which an interference optical system is formed on an SOI (Silicon On Insulator) substrate by MEMS (Micro Electro Mechanical Systems) technology is known (see, for example, Patent Document 1).
  • Such an optical module is attracting attention because it can provide an FTIR (Fourier transform infrared spectroscopic analyzer) in which a highly accurate optical arrangement is realized.
  • the optical module as described above has the following problems in that, for example, the size of the mirror surface of the movable mirror depends on the achievement level of deep drilling on the SOI substrate. That is, since the achievement level of deep drilling on the SOI substrate is about 500 ⁇ m at the maximum, there is a limit to improving the sensitivity in FTIR by increasing the mirror surface of the movable mirror.
  • a technique is conceivable in which a movable mirror formed separately is mounted on a base made of, for example, an SOI substrate. In such a technique, it has been found that it is necessary to measure whether or not the angular deviation of the mirror surface of the movable mirror is within a predetermined range.
  • the present disclosure provides an optical module capable of easily measuring whether or not the angular deviation of the mirror surface of the movable mirror is within a predetermined range while increasing the size of the mirror surface of the movable mirror. Objective.
  • An optical module has a main surface, a base provided with a mounting region and a driving region that moves the mounting region along a first direction parallel to the main surface, and the main surface.
  • a movable mirror mounted in the mounting region, a first fixed mirror having a mirror surface in a positional relationship intersecting the main surface, and fixed in position relative to the base, and movable A beam splitter unit constituting a first interference optical system for measurement light together with the mirror and the first fixed mirror, and the mirror surface of the movable mirror and the mirror surface of the first fixed mirror are directed to one side in the first direction. ing.
  • a movable mirror having a mirror surface in a positional relationship intersecting with the main surface of the base is mounted in the mounting region of the base.
  • the mirror surface of the movable mirror mounted in the mounting region and the mirror surface of the first fixed mirror whose position with respect to the base are fixed are on one side in the first direction parallel to the main surface of the base. Suitable for.
  • the mirror surface of the movable mirror is used as a reference.
  • an opening is formed in the mounting region, and the movable mirror is configured to have a mirror part having a mirror surface, an elastic part connected to the mirror part, and elastic deformation of the elastic part. And a support part to which an elastic force is applied according to the elastic part.
  • the support part is inserted into the opening in a state where the elastic force of the elastic part is applied, and the movable mirror is applied to the support part from the inner surface of the opening. It may be fixed to the mounting area by the reaction force of the elastic force. According to this, the movable mirror can be easily and accurately mounted in the mounting area.
  • the mirror surface of the movable mirror may be deviated due to particles being sandwiched between the support portion and the inner surface of the opening.
  • a configuration that can easily measure whether or not the angular deviation of the mirror surface is within a predetermined range is particularly effective.
  • the first fixed mirror is located on one side with respect to the movable mirror in the second direction parallel to the main surface and perpendicular to the first direction, and at least in the drive region.
  • a part may be located on one side or the other side of the first fixed mirror in the first direction when viewed from a third direction perpendicular to the main surface.
  • the beam splitter unit reflects a part of the measurement light reflected by the half mirror surface that reflects a part of the measurement light and transmits the remaining part of the measurement light.
  • the half mirror surface and the total reflection mirror surface may be parallel to each other. According to this, even if a deviation occurs in the mounting angle of the beam splitter unit around the axis perpendicular to the main surface of the base, if the incident angle of the measurement light to the beam splitter unit is constant, The measurement light emission angle is constant.
  • the mirror surface of the movable mirror can be enlarged, even if a deviation occurs in the measurement light emission position from the beam splitter unit, the deviation can be substantially ignored. . Therefore, the alignment accuracy of the beam splitter unit can be relaxed.
  • the first fixed mirror may be mounted on the base. According to this, it is possible to facilitate the alignment of the movable mirror and the first fixed mirror.
  • the beam splitter unit may be mounted on the base. According to this, it is possible to facilitate the alignment of the movable mirror and the beam splitter unit.
  • An optical module is disposed on at least one optical path of a first optical path between the beam splitter unit and the movable mirror and a second optical path between the beam splitter unit and the first fixed mirror.
  • a light transmissive member that corrects the optical path difference between the first optical path and the second optical path may be further provided. According to this, the interference light of the measurement light can be obtained easily and with high accuracy.
  • the light transmitting member may be mounted on the base. According to this, it is possible to facilitate the alignment of the movable mirror and the light transmission member.
  • An optical module is arranged so that measurement light incident portions are arranged so that measurement light is incident on the first interference optical system from the outside, and measurement light is emitted from the first interference optical system to the outside. And a measurement light emitting unit that has been provided. According to this, FTIR provided with the measurement light incident part and the measurement light emission part can be obtained.
  • the optical module according to one aspect of the present disclosure further includes a second fixed mirror having a mirror surface that is in a positional relationship intersecting with the main surface, and having a fixed position with respect to the base.
  • the beam splitter unit includes the movable mirror and the second mirror.
  • the second interference optical system may be configured for the laser light together with the fixed mirror, and the mirror surface of the second fixed mirror may be directed to one side in the first direction. According to this, the position of the mirror surface of the movable mirror can be measured by detecting the interference light of the laser light.
  • the mirror surface of the second fixed mirror is also directed to one side in the first direction parallel to the main surface of the base, like the mirror surface of the movable mirror. Thereby, by using the mirror surface of the second fixed mirror as a reference, it is possible to easily measure whether or not the angular deviation of the mirror surface of the movable mirror is within a predetermined range.
  • the first fixed mirror and the second fixed mirror are respectively located on both sides of the movable mirror in the second direction parallel to the main surface and perpendicular to the first direction.
  • At least a part of the drive region, when viewed from the third direction perpendicular to the main surface, is one side or the other side of the first fixed mirror in the first direction and the second fixed mirror in the first direction. It may be located on one side or the other side. According to this, space saving in the plane parallel to the main surface of the base can be achieved, and the increase in the size of the entire optical module can be suppressed.
  • the optical module according to one aspect of the present disclosure may further include a filter that is disposed on an optical path in which the laser light does not travel and the measurement light travels, and that cuts light in a wavelength range including the center wavelength of the laser light. According to this, it is possible to prevent the measurement light from becoming noise in the detection of the interference light of the laser light.
  • the optical module according to one aspect of the present disclosure further includes a light source that generates laser light to be incident on the second interference optical system, and a photodetector that detects the laser light emitted from the second interference optical system. Good. According to this, since the position of the movable mirror can be detected in real time by detecting the laser light, a more accurate FTIR can be obtained.
  • the base has a main surface, a device layer provided with a mounting region and a drive region, a support layer that supports the device layer, and a support layer between the support layer and the device layer.
  • An intermediate layer provided, the support layer is a first silicon layer of the SOI substrate, the device layer is a second silicon layer of the SOI substrate, and the intermediate layer is an insulating layer of the SOI substrate. May be. According to this, the structure for the reliable movement of the movable mirror mounted on the device layer can be suitably realized by the SOI substrate.
  • an optical module capable of easily measuring whether or not the angular deviation of the mirror surface of the movable mirror is within a predetermined range while increasing the size of the mirror surface of the movable mirror. It becomes possible.
  • FIG. 1 is a plan view of the optical module of the first embodiment.
  • FIG. 2 is a sectional view taken along line II-II in FIG. 3 is a cross-sectional view taken along line III-III in FIG.
  • FIG. 4 is a schematic diagram showing a modification of the first embodiment.
  • FIG. 5 is a plan view of the optical module of the second embodiment.
  • FIG. 6 is a diagram showing a spectrum of light incident on the photodetector in the optical module of FIG.
  • FIG. 7 is a schematic diagram showing a modification of the second embodiment.
  • FIG. 8 is a schematic diagram showing a modification of the second embodiment.
  • FIG. 9 is a schematic diagram showing a modification of the second embodiment.
  • the optical module 1 ⁇ / b> A includes a base 10.
  • the base 10 includes a support layer 2, a device layer 3 provided on the support layer 2, and an intermediate layer 4 provided between the support layer 2 and the device layer 3.
  • the support layer 2 supports the device layer 3 through the intermediate layer 4.
  • the base 10 has a main surface 10a.
  • the main surface 10a is a surface of the device layer 3 opposite to the support layer 2.
  • the support layer 2, the device layer 3, and the intermediate layer 4 are configured by an SOI substrate.
  • the support layer 2 is a first silicon layer of an SOI substrate.
  • the device layer 3 is a second silicon layer of the SOI substrate.
  • the intermediate layer 4 is an insulating layer of the SOI substrate.
  • the support layer 2 When the support layer 2, the device layer 3, and the intermediate layer 4 are viewed from the Z-axis direction (direction parallel to the Z-axis) that is the stacking direction thereof (the direction perpendicular to the main surface 10a, the third direction), for example, ,
  • One side has a rectangular shape of about 10 mm.
  • the thickness of each of the support layer 2 and the device layer 3 is, for example, about several hundred ⁇ m.
  • the thickness of the intermediate layer 4 is, for example, about several ⁇ m.
  • the device layer 3 and the intermediate layer 4 are shown with one corner of the device layer 3 and one corner of the intermediate layer 4 cut out.
  • the device layer 3 is provided with a mounting area 31 and a driving area 32.
  • the drive region 32 includes a pair of actuator regions 33 and a pair of elastic support regions 34.
  • the mounting region 31 and the drive region 32 (that is, the mounting region 31 and the pair of actuator regions 33 and the pair of elastic support regions 34) are integrally formed on a part of the device layer 3 by MEMS technology (patterning and etching). Yes.
  • the pair of actuator regions 33 are disposed on both sides of the mounting region 31 in the X-axis direction parallel to the main surface 10a (the direction parallel to the X-axis orthogonal to the Z-axis, the first direction). That is, the mounting area 31 is sandwiched between the pair of actuator areas 33 in the X-axis direction.
  • Each actuator region 33 is fixed to the support layer 2 via the intermediate layer 4.
  • a first comb tooth portion 33 a is provided on the side surface of each actuator region 33 on the mounting region 31 side.
  • Each first comb-tooth portion 33 a is in a state of floating with respect to the support layer 2 by removing the intermediate layer 4 immediately below the first comb-tooth portion 33 a.
  • Each actuator region 33 is provided with a first electrode 35.
  • the pair of elastic support regions 34 are provided on both sides of the mounting region 31 in the Y-axis direction (direction parallel to the Z-axis and the Y-axis perpendicular to the X-axis, the second direction) parallel to the main surface 10a and perpendicular to the X-axis direction. Has been placed. That is, the mounting region 31 is sandwiched between the pair of elastic support regions 34 in the Y-axis direction. Both end portions 34 a of each elastic support region 34 are fixed to the support layer 2 through the intermediate layer 4.
  • Each elastic support region 34 has an elastic deformation portion 34b (a portion between both end portions 34a) having a structure in which a plurality of leaf springs are connected.
  • each elastic support region 34 is in a state of floating with respect to the support layer 2 by removing the intermediate layer 4 immediately below the elastic deformation portion 34b.
  • a second electrode 36 is provided at each of both end portions 34 a.
  • each elastic support area 34 is connected to the mounting area 31.
  • the mounting region 31 is in a state of floating with respect to the support layer 2 by removing the intermediate layer 4 immediately below the mounting region 31. That is, the mounting area 31 is supported by the pair of elastic support areas 34.
  • a second comb tooth portion 31 a is provided on the side surface of each mounting region 31 on the side of each actuator region 33. Each second comb tooth portion 31 a is in a state of floating with respect to the support layer 2 by removing the intermediate layer 4 immediately below the second comb tooth portion 31 a. In the first comb tooth portion 33a and the second comb tooth portion 31a facing each other, the comb teeth of the first comb tooth portion 33a are located between the comb teeth of the second comb tooth portion 31a.
  • the pair of elastic support regions 34 sandwich the mounting region 31 from both sides when viewed from the direction A parallel to the X axis, and when the mounting region 31 moves along the direction A, the mounting region 31 returns to the initial position.
  • an elastic force is applied to the mounting region 31. Therefore, when a voltage is applied between the first electrode 35 and the second electrode 36 and an electrostatic attractive force acts between the first comb tooth portion 33a and the second comb tooth portion 31a facing each other, the electrostatic attractive force is applied.
  • the mounting region 31 is moved along the direction A to a position where the elastic force by the pair of elastic support regions 34 is balanced.
  • the drive area 32 functions as an electrostatic actuator and moves the mounting area 31 along the X-axis direction.
  • the optical module 1A further includes a movable mirror 5, a fixed mirror (first fixed mirror) 6, a beam splitter unit 7, a measurement light incident part 8, a measurement light emission part 9, and a light transmission member 11. ing.
  • the movable mirror 5, the fixed mirror 6, and the beam splitter unit 7 are arranged on the device layer 3 so as to constitute an interference optical system (first interference optical system) I1 for the measurement light L0.
  • the interference optical system I1 is a Michelson interference optical system.
  • the movable mirror 5 is mounted on the mounting area 31 of the device layer 3.
  • the movable mirror 5 has a mirror part 51.
  • the mirror part 51 has a mirror surface 51a in a positional relationship intersecting with the main surface 10a.
  • the mirror surface 51 a is located on the opposite side of the support layer 2 with respect to the device layer 3.
  • the mirror surface 51a is, for example, a surface perpendicular to the X-axis direction (that is, a surface perpendicular to the direction A), and is directed to one side (beam splitter unit 7 side) in the X-axis direction.
  • the fixed mirror 6 is mounted in the mounting area 37 of the device layer 3. That is, the fixed mirror 6 is mounted on the base 10.
  • the position of the fixed mirror 6 with respect to the base 10 (the position of the base 10 with respect to the region excluding the mounting region 31 and the drive region 32) is fixed.
  • the fixed mirror 6 is located on one side with respect to the movable mirror 5 in the Y-axis direction. That is, the fixed mirror 6 is shifted to one side in the Y-axis direction with respect to the movable mirror 5.
  • At least a part of the drive region 32 is located on one side of the fixed mirror 6 in the X-axis direction when viewed from the Z-axis direction.
  • the drive region 32 is aligned with the fixed mirror 6 in the X-axis direction when viewed from the Z-axis direction.
  • one elastic support region 34 in the drive region 32 is located on one side of the fixed mirror 6 in the X-axis direction when viewed from the Z-axis direction.
  • the fixed mirror 6 has a mirror part 61.
  • the mirror part 61 has a mirror surface 61a in a positional relationship intersecting with the main surface 10a.
  • the mirror surface 61 a is located on the side opposite to the support layer 2 with respect to the device layer 3.
  • the mirror surface 61a is, for example, a surface perpendicular to the X-axis direction (that is, a surface perpendicular to the direction A) and is directed to one side (beam splitter unit 7 side) in the X-axis direction.
  • the beam splitter unit 7 is located on one side of the movable mirror 5 and the fixed mirror 6 in the X-axis direction.
  • the beam splitter unit 7 is positioned on the base 10 with one corner on the bottom surface side of the beam splitter unit 7 positioned at one corner of the rectangular opening 3 a formed in the device layer 3. ing. More specifically, in the beam splitter unit 7, both side surfaces constituting the one corner in the beam splitter unit 7 are brought into contact with both side surfaces reaching the one corner in the opening 3 a. Thus, the base 10 is positioned.
  • the beam splitter unit 7 is mounted on the support layer 2 by being fixed to the support layer 2 by bonding or the like in a positioned state. That is, the beam splitter unit 7 is mounted on the base 10. Since the one corner of the opening 3a is provided with relief, the one corner of the beam splitter unit 7 does not contact the one corner of the opening 3a.
  • the beam splitter unit 7 has a half mirror surface 71, a total reflection mirror surface 72, and a plurality of optical surfaces 73a, 73b, 73c, 73d.
  • the half mirror surface 71, the total reflection mirror surface 72, and the plurality of optical surfaces 73 a, 73 b, 73 c, and 73 d are located on the side opposite to the support layer 2 with respect to the device layer 3.
  • the beam splitter unit 7 is configured by joining a plurality of optical blocks.
  • the half mirror surface 71 is formed of, for example, a dielectric multilayer film.
  • the total reflection mirror surface 72 is formed of, for example, a metal film.
  • the optical surface 73a is, for example, a surface perpendicular to the X-axis direction, and overlaps with the mirror surface 61a of the fixed mirror 6 when viewed from the X-axis direction.
  • the optical surface 73a transmits the measurement light L0 incident along the X-axis direction.
  • the half mirror surface 71 is, for example, a surface inclined by 45 ° with respect to the optical surface 73a, and overlaps the mirror surface 61a of the fixed mirror 6 when viewed from the X-axis direction.
  • the half mirror surface 71 reflects a part of the measurement light L0 incident on the optical surface 73a along the X-axis direction along the Y-axis direction, and the remaining part of the measurement light L0 along the X-axis direction. Permeate to the side.
  • the total reflection mirror surface 72 is a surface parallel to the half mirror surface 71, overlaps the mirror surface 51a of the movable mirror 5 when viewed from the X-axis direction, and half mirror surface 71 when viewed from the Y-axis direction. It overlaps with.
  • the total reflection mirror surface 72 reflects a part of the measurement light L0 reflected by the half mirror surface 71 toward the movable mirror 5 along the X-axis direction.
  • the optical surface 73b is a surface parallel to the optical surface 73a and overlaps the mirror surface 51a of the movable mirror 5 when viewed from the X-axis direction.
  • the optical surface 73b transmits a part of the measurement light L0 reflected by the total reflection mirror surface 72 to the movable mirror 5 side along the X-axis direction.
  • the optical surface 73c is a surface parallel to the optical surface 73a and overlaps the mirror surface 61a of the fixed mirror 6 when viewed from the X-axis direction.
  • the optical surface 73c transmits the remaining part of the measurement light L0 transmitted through the half mirror surface 71 to the fixed mirror 6 side along the X-axis direction.
  • the optical surface 73d is, for example, a surface perpendicular to the Y-axis direction, and overlaps the half mirror surface 71 and the total reflection mirror surface 72 when viewed from the Y-axis direction.
  • the optical surface 73d transmits the measurement light L1 along the Y-axis direction.
  • the measurement light L1 is partly reflected by the mirror surface 51a and the total reflection mirror surface 72 of the movable mirror 5 and transmitted through the half mirror surface 71, and the mirror surface 61a and the half mirror surface of the fixed mirror 6. Interference light with the remainder of the measurement light L0 sequentially reflected by 71.
  • the measurement light incident part 8 is arranged so that the measurement light L0 is incident on the interference optical system I1 from the outside.
  • the measurement light incident part 8 is mounted on the device layer 3 on one side of the beam splitter unit 7 in the X-axis direction.
  • the measurement light incident part 8 faces the optical surface 73a of the beam splitter unit 7 in the X-axis direction.
  • the measurement light incident part 8 is constituted by, for example, an optical fiber and a collimating lens.
  • the measurement light emitting unit 9 is arranged to emit measurement light L1 (interference light) from the interference optical system I1 to the outside.
  • the measurement light emitting unit 9 is mounted on the device layer 3 on one side of the beam splitter unit 7 in the Y-axis direction.
  • the measurement light emitting unit 9 faces the optical surface 73d of the beam splitter unit 7 in the Y-axis direction.
  • the measurement light emitting unit 9 is configured by, for example, an optical fiber and a collimating lens.
  • the light transmitting member 11 is disposed between the beam splitter unit 7 and the fixed mirror 6.
  • the light transmissive member 11 is positioned on the base 10 with one corner on the bottom surface side of the light transmissive member 11 positioned at one corner of the rectangular opening 3b formed in the device layer 3. ing. More specifically, the light transmitting member 11 is brought into contact with each of both side surfaces reaching the one corner in the opening 3b and both side surfaces constituting the one corner in the light transmitting member 11. Thus, the base 10 is positioned.
  • the light transmission member 11 is mounted on the support layer 2 by being fixed to the support layer 2 by adhesion or the like in a positioned state. That is, the light transmission member 11 is mounted on the base 10.
  • the relief is provided in the one corner in the opening 3b, the one corner in the light transmitting member 11 does not contact the one corner in the opening 3b.
  • the light transmitting member 11 includes a pair of optical surfaces 11a and 11b.
  • the pair of optical surfaces 11 a and 11 b are located on the opposite side of the support layer 2 with respect to the device layer 3.
  • Each of the pair of optical surfaces 11a and 11b is, for example, a surface perpendicular to the X-axis direction.
  • the pair of optical surfaces 11a and 11b are parallel to each other.
  • the light transmission member 11 includes an optical path (first optical path) P1 between the beam splitter unit 7 and the movable mirror 5 and an optical path (second optical path) P2 between the beam splitter unit 7 and the fixed mirror 6. Correct the optical path difference.
  • the optical path P1 is an optical path from the half mirror surface 71 to the mirror surface 51a of the movable mirror 5 located at the reference position through the total reflection mirror surface 72 and the optical surface 73b in order, and is measured. This is an optical path along which a part of the light L0 travels.
  • the optical path P2 is an optical path from the half mirror surface 71 to the mirror surface 61a of the fixed mirror 6 through the optical surface 73c, and is an optical path along which the remainder of the measurement light L0 travels.
  • the light transmitting member 11 includes an optical path length of the optical path P1 (an optical path length considering the refractive index of each medium passing through the optical path P1) and an optical path length of the optical path P2 (an optical path length considering the refractive index of each medium passing through the optical path P2). For example, the optical path difference between the optical path P1 and the optical path P2 is corrected so that the difference between the two becomes zero.
  • the light transmitting member 11 is formed of the same light transmitting material as the light transmitting material (for example, glass) used for each optical block constituting the beam splitter unit 7.
  • a part of the measurement light L0 is a half mirror surface of the beam splitter unit 7. 71 and the total reflection mirror surface 72 are sequentially reflected and proceed toward the mirror surface 51 a of the movable mirror 5.
  • a part of the measurement light L 0 is reflected by the mirror surface 51 a of the movable mirror 5, travels on the same optical path (that is, the optical path P 1), and passes through the half mirror surface 71 of the beam splitter unit 7.
  • the remaining part of the measurement light L0 passes through the half mirror surface 71 of the beam splitter unit 7 and proceeds toward the mirror surface 61a of the fixed mirror 6.
  • the remainder of the measurement light L0 is reflected by the mirror surface 61a of the fixed mirror 6, travels on the same optical path (that is, the optical path P2), and is reflected by the half mirror surface 71 of the beam splitter unit 7.
  • the measurement light L1 is emitted from the interference optical system I1 to the outside via the measurement light emitting unit 9.
  • the optical module 1A since the movable mirror 5 can be reciprocated at high speed along the direction A, a small and highly accurate FTIR can be provided. [Movable mirror and surrounding structure]
  • the movable mirror 5 includes a mirror part 51, an elastic part 52, a connecting part 53, a pair of leg parts (support parts) 54, and a pair of locking parts (support parts). 55).
  • the movable mirror 5 configured as described below is integrally formed by MEMS technology (patterning and etching).
  • the mirror part 51 is formed in a plate shape (for example, a disk shape) having the mirror surface 51a as a main surface.
  • the elastic part 52 is formed in an annular shape (for example, an annular shape) surrounding the mirror part 51 while being separated from the mirror part 51 when viewed from the X-axis direction (direction perpendicular to the mirror surface 51a).
  • the connecting portion 53 connects the mirror portion 51 and the elastic portion 52 to each other on one side in the Y-axis direction with respect to the center of the mirror portion 51 when viewed from the X-axis direction.
  • the pair of leg portions 54 are connected to the outer surface of the elastic portion 52 on both sides in the Y-axis direction with respect to the center of the mirror portion 51 when viewed from the X-axis direction. That is, the mirror part 51 and the elastic part 52 are sandwiched between the pair of leg parts 54 in the Y-axis direction. Each leg portion 54 extends closer to the mounting region 31 than the mirror portion 51 and the elastic portion 52.
  • the pair of locking portions 55 are provided at the end portions on the mounting region 31 side of the respective leg portions 54. Each locking portion 55 is formed so as to be bent in, for example, a V shape on the inner side (side closer to each other) when viewed from the X-axis direction.
  • the movable mirror 5 configured as described above is mounted in the mounting region 31 by arranging the pair of locking portions 55 in the opening 31b formed in the mounting region 31.
  • the openings 31b are opened on both sides of the mounting region 31 in the Z-axis direction. A part of each locking portion 55 protrudes from the surface on the intermediate layer 4 side in the mounting region 31. That is, the movable mirror 5 penetrates the mounting area 31.
  • an elastic force acts on the outside (side away from each other) according to the elastic deformation of the elastic portion 52. That is, the pair of locking portions 55 are inserted into the opening 31b in a state where the elastic force of the elastic portion 52 is applied.
  • the elastic force is generated when the annular elastic portion 52 compressed when the movable mirror 5 is mounted in the mounting region 31 is restored to the initial state.
  • the movable mirror 5 is fixed to the mounting region 31 by the reaction force of the elastic force applied to the pair of locking portions 55 from the inner surface of the opening 31b.
  • the opening 31 b is formed in a trapezoidal shape spreading toward the opposite side to the beam splitter unit 7 when viewed from the Z-axis direction.
  • the movable mirror 5 is automatically operated in each of the X-axis direction, the Y-axis direction, and the Z-axis direction by engaging the pair of locking portions 55 having a shape bent inward with the opening 31b having such a shape. Positioned (self-aligned).
  • the intermediate layer 4 has an opening 41 formed therein.
  • the openings 41 are open on both sides of the intermediate layer 4 in the Z-axis direction.
  • An opening 21 is formed in the support layer 2.
  • the openings 21 are open on both sides of the support layer 2 in the Z-axis direction.
  • a continuous space S ⁇ b> 1 is configured by the region in the opening 41 of the intermediate layer 4 and the region in the opening 21 of the support layer 2. That is, the space S ⁇ b> 1 includes a region in the opening 41 of the intermediate layer 4 and a region in the opening 21 of the support layer 2.
  • the space S ⁇ b> 1 is formed between the support layer 2 and the device layer 3 and corresponds to at least the mounting region 31 and the drive region 32.
  • the region in the opening 41 of the intermediate layer 4 and the region in the opening 21 of the support layer 2 include a range in which the mounting region 31 moves when viewed from the Z-axis direction.
  • a region in the opening 41 of the intermediate layer 4 is a portion to be separated from the support layer 2 in the mounting region 31 and the drive region 32 (that is, a portion to be floated with respect to the support layer 2, for example,
  • a gap for separating the entire mounting region 31, the elastic deformation portion 34 b of each elastic support region 34, the first comb tooth portion 33 a and the second comb tooth portion 31 a) from the support layer 2 is formed.
  • the space S1 corresponding to at least the mounting region 31 and the drive region 32 is the support layer 2 and the device layer so that the entire mounting region 31 and at least a part of the drive region 32 are separated from the support layer 2.
  • 3 means a space formed between the two.
  • each locking portion 55 of the movable mirror 5 is located in the space S1. Specifically, a part of each locking portion 55 is located in a region in the opening 21 of the support layer 2 via a region in the opening 41 of the intermediate layer 4. A part of each locking portion 55 protrudes from the surface of the device layer 3 on the intermediate layer 4 side into the space S1, for example, about 100 ⁇ m. As described above, the region in the opening 41 of the intermediate layer 4 and the region in the opening 21 of the support layer 2 include a range in which the mounting region 31 moves when viewed from the Z-axis direction. Is reciprocated along the direction A, a part of each locking portion 55 of the movable mirror 5 positioned in the space S1 does not come into contact with the intermediate layer 4 and the support layer 2. [Fixed mirror and its peripheral structure]
  • the fixed mirror 6 has the same configuration as the movable mirror 5. As shown in FIG. 1, the fixed mirror 6 is mounted in the mounting region 37 by arranging a pair of locking portions in an opening 37 a formed in the mounting region 37. [Action and effect]
  • the movable mirror 5 having the mirror surface 51 a that is in a positional relationship intersecting the main surface 10 a of the base 10 is mounted in the mounting region 31 of the base 10. Thereby, the mirror surface 51a of the movable mirror 5 can be increased in size.
  • the mirror surface 51a of the movable mirror 5 mounted in the mounting region 31 and the mirror surface 61a of the fixed mirror 6 whose position with respect to the base 10 are fixed are parallel to the main surface 10a of the base 10. It faces one side in the axial direction.
  • the mirror surface 61a of the fixed mirror 6 is used as a reference. It is possible to easily measure whether or not the angular deviation of the mirror surface 51a is within a predetermined range. As described above, according to the optical module 1A, it is easily measured whether or not the angular deviation of the mirror surface 51a of the movable mirror 5 is within a predetermined range while increasing the size of the mirror surface 51a of the movable mirror 5. be able to.
  • the movable mirror 5 is fixed to the mounting region 31 by the reaction force of the elastic force applied to the locking portion 55 from the inner surface of the opening 31b of the mounting region 31.
  • the movable mirror 5 can be easily and accurately mounted on the mounting region 31 using self-alignment.
  • the mirror surface 51a of the movable mirror 5 may be angularly shifted due to particles caught between the locking portion 55 and the inner surface of the opening 31b.
  • a configuration that can easily measure whether or not the angular deviation of the mirror surface 51a of the movable mirror 5 is within a predetermined range is particularly effective.
  • the fixed mirror 6 when the fixed mirror 6 is positioned on one side with respect to the movable mirror 5 in the Y-axis direction, and at least a part of the drive region 32 is viewed from the Z-axis direction, It is located on one side of the fixed mirror 6 in the X-axis direction. Thereby, space saving in the surface parallel to the main surface 10a of the base 10 can be achieved, and the enlargement of the entire optical module 1A can be suppressed.
  • the beam splitter unit 7 reflects a part of the measurement light L0 and transmits the remaining part of the measurement light L0, and one of the measurement light L0 reflected by the half mirror surface 71.
  • the total reflection mirror surfaces 72 that reflect the portions are parallel to each other. Thereby, even if the mounting angle of the beam splitter unit 7 around the axis perpendicular to the main surface 10a of the base 10 is deviated, the measurement light L0 to the beam splitter unit 7 (specifically, the optical surface 73a) is shifted. If the incident angle is constant, the emission angle of the measurement light L0 from the beam splitter unit 7 (specifically, the optical surface 73b) is constant.
  • the mirror surface 51a of the movable mirror 5 can be enlarged, even if a deviation occurs in the emission position of the measurement light L0 from the beam splitter unit 7, the deviation is substantially ignored. can do. Therefore, the alignment accuracy of the beam splitter unit 7 can be relaxed.
  • the fixed mirror 6 is mounted on the base 10. Thereby, the positioning of the movable mirror 5 and the fixed mirror 6 can be facilitated.
  • the beam splitter unit 7 is mounted on the base 10. Thereby, the positioning of the movable mirror 5 and the beam splitter unit 7 can be facilitated.
  • the light transmission member 11 is disposed on the optical path P1, and corrects the optical path difference between the optical path P1 and the optical path P2. Thereby, the interference light (measurement light L1) of the measurement light L0 can be obtained easily and with high accuracy.
  • the light transmitting member 11 is mounted on the base 10. Thereby, the positioning of the movable mirror 5 and the light transmission member 11 can be facilitated.
  • the measurement light incident part 8 is arranged so that the measurement light L0 is incident on the interference optical system I1 from the outside, and the measurement light emitting part 9 is externally measured from the interference optical system I1. It arrange
  • the base 10 is configured by an SOI substrate.
  • the structure for the reliable movement of the movable mirror 5 mounted on the device layer 3 can be suitably realized by the SOI substrate.
  • the fixed mirror 6 may be provided on the optical surface 11b of the light transmitting member 11. Moreover, as shown in FIG. 4B, the mirror surface 51a of the movable mirror 5 and the mirror surface 61a of the fixed mirror 6 may be located on the same plane. In this case, the light transmission member 11 may be disposed between the beam splitter unit 7 and the movable mirror 5, and the light transmission member 17 may be disposed between the beam splitter unit 7 and the fixed mirror 6.
  • the light transmitting member 17 includes optical surfaces 17a and 17b and total reflection mirror surfaces 17c and 17d.
  • the optical surface 17a is, for example, a surface perpendicular to the X-axis direction.
  • the optical surface 17a transmits the remainder of the measurement light L0 incident along the X-axis direction.
  • the total reflection mirror surface 17c is, for example, a surface inclined by 45 ° with respect to the optical surface 17a.
  • the total reflection mirror surface 17c reflects the remainder of the measurement light L0 incident on the optical surface 17a along the X-axis direction along the Y-axis direction.
  • the total reflection mirror surface 17d is a surface parallel to the total reflection mirror surface 17c.
  • the total reflection mirror surface 17d reflects the remainder of the measurement light L0 reflected by the total reflection mirror surface 17c toward the fixed mirror 6 along the X-axis direction.
  • the optical surface 17b is a surface parallel to the optical surface 17a. The optical surface 17b transmits the remainder of the measurement light L0 incident along the X-axis direction.
  • the light transmitting member 11 and the light transmitting member 17 are provided between the beam splitter unit 7 and the movable mirror 5, and between the beam splitter unit 7 and the fixed mirror 6. In the configuration shown in FIG. The optical path difference from the optical path P2 is corrected.
  • the optical module 1 ⁇ / b> B includes the above-described optical module 1 ⁇ / b> A in that it further includes a fixed mirror (second fixed mirror) 12, a light source 13, a photodetector 14, and a filter 15. Mainly different.
  • the movable mirror 5, the fixed mirror 6, and the beam splitter unit 7 are arranged on the device layer 3 so as to configure the interference optical system (first interference optical system) I1 for the measurement light L0.
  • the movable mirror 5, the fixed mirror 12, and the beam splitter unit 7 are arranged on the device layer 3 so as to constitute an interference optical system (second interference optical system) I2 with respect to the laser light L10. Yes.
  • each of the interference optical systems I1 and I2 is a Michelson interference optical system.
  • the fixed mirror 12 is mounted in the mounting area 38 of the device layer 3. That is, the fixed mirror 12 is mounted on the base 10.
  • the fixed mirror 12 is fixed at a position relative to the base 10 (a position relative to an area of the base 10 excluding the mounting area 31 and the drive area 32).
  • the fixed mirror 12 is located on the other side with respect to the movable mirror 5 in the Y-axis direction (the side opposite to the one side on which the fixed mirror 6 is displaced). That is, the fixed mirror 12 is shifted to the other side in the Y-axis direction with respect to the movable mirror 5.
  • the fixed mirrors 6 and 12 are positioned on both sides of the movable mirror 5 in the Y-axis direction. At least a part of the drive region 32 is located on one side of the fixed mirror 6 in the X-axis direction and one side of the fixed mirror 12 in the X-axis direction when viewed from the Z-axis direction. That is, at least a part of the drive region 32 is aligned with the fixed mirrors 6 and 12 in the X-axis direction when viewed from the Z-axis direction. Specifically, one elastic support region 34 in the drive region 32 is located on one side of the fixed mirror 6 in the X-axis direction when viewed from the Z-axis direction. Further, the other elastic support region 34 of the drive region 32 is located on one side of the fixed mirror 12 in the X-axis direction when viewed from the Z-axis direction.
  • the fixed mirror 12 has a mirror part 121.
  • the mirror part 121 has a mirror surface 121a in a positional relationship intersecting the main surface 10a.
  • the mirror surface 121 a is located on the side opposite to the support layer 2 with respect to the device layer 3.
  • the mirror surface 121a is, for example, a surface perpendicular to the X-axis direction (that is, a surface perpendicular to the direction A) and is directed to one side (beam splitter unit 7 side) in the X-axis direction.
  • the fixed mirror 12 has the same configuration as that of the movable mirror 5 and is mounted in the mounting region 38 by arranging a pair of locking portions in the opening 38 a formed in the mounting region 38.
  • the beam splitter unit 7 has a plurality of half mirror surfaces 71a and 71b, a total reflection mirror surface 72, a dichroic mirror surface 74, and a plurality of optical surfaces 75a, 75b, 75c, 75d, 75e, and 75f.
  • the plurality of half mirror surfaces 71a and 71b, the total reflection mirror surface 72, the dichroic mirror surface 74, and the plurality of optical surfaces 75a, 75b, 75c, 75d, 75e, and 75f are opposite to the support layer 2 with respect to the device layer 3. Is located.
  • the beam splitter unit 7 is configured by joining a plurality of optical blocks.
  • Each half mirror surface 71a, 71b is formed of a dielectric multilayer film, for example.
  • the total reflection mirror surface 72 is formed of, for example, a metal film.
  • the dichroic mirror surface 74 is formed of a dielectric multilayer film, for example.
  • the optical surface 75a is, for example, a surface perpendicular to the X-axis direction, and overlaps the mirror surface 61a of the fixed mirror 6 when viewed from the X-axis direction.
  • the optical surface 75a transmits the measurement light L0 incident along the X-axis direction.
  • the half mirror surface 71a is, for example, a surface inclined by 45 ° with respect to the optical surface 75a, and overlaps the mirror surface 61a of the fixed mirror 6 when viewed from the X-axis direction.
  • the half mirror surface 71a reflects a part of the measurement light L0 incident on the optical surface 75a along the X-axis direction along the Y-axis direction, and the remaining part of the measurement light L0 along the X-axis direction. Permeate to the side.
  • the optical surface 75b is, for example, a surface perpendicular to the X-axis direction, and overlaps the mirror surface 51a of the movable mirror 5 when viewed from the X-axis direction.
  • the optical surface 75b transmits the laser beam L10 incident along the X-axis direction.
  • the half mirror surface 71b is a surface parallel to the half mirror surface 71a, overlaps the mirror surface 51a of the movable mirror 5 when viewed from the X-axis direction, and the half mirror surface 71a when viewed from the Y-axis direction. overlapping.
  • the half mirror surface 71b reflects a part of the laser light L10 incident on the optical surface 75b along the X-axis direction along the Y-axis direction and the remaining part of the laser light L10 along the X-axis direction. Permeate to the side.
  • the half mirror surface 71b reflects a part of the measurement light L0 reflected by the half mirror surface 71a to the movable mirror 5 side along the X-axis direction.
  • the total reflection mirror surface 72 is a surface parallel to the half mirror surfaces 71a and 71b, overlaps the mirror surface 121a of the fixed mirror 12 when viewed from the X-axis direction, and is a half mirror when viewed from the Y-axis direction. It overlaps with the surfaces 71a and 71b.
  • the total reflection mirror surface 72 reflects a part of the laser light L10 reflected by the half mirror surface 71b to the fixed mirror 12 side along the X-axis direction.
  • the optical surface 75c is a surface parallel to the optical surfaces 75a and 75b, and overlaps the mirror surface 51a of the movable mirror 5 when viewed from the X-axis direction.
  • the optical surface 75c transmits a part of the measurement light L0 reflected by the half mirror surface 71b and the remaining part of the laser light L10 transmitted through the half mirror surface 71b to the movable mirror 5 side along the X-axis direction.
  • the optical surface 75d is a surface parallel to the optical surfaces 75a and 75b, and overlaps the mirror surface 121a of the fixed mirror 12 when viewed from the X-axis direction.
  • the optical surface 75d transmits part of the laser light L10 reflected by the total reflection mirror surface 72 to the fixed mirror 12 side along the X-axis direction.
  • the optical surface 75e is a surface parallel to the optical surfaces 75a and 75b, and overlaps the mirror surface 61a of the fixed mirror 6 when viewed from the X-axis direction.
  • the optical surface 75e transmits the remaining portion of the measurement light L0 transmitted through the half mirror surface 71a to the fixed mirror 6 side along the X-axis direction.
  • the dichroic mirror surface 74 is parallel to the half mirror surfaces 71a and 71b and the total reflection mirror surface 72, and overlaps the half mirror surfaces 71a and 71b and the total reflection mirror surface 72 when viewed from the Y-axis direction.
  • the dichroic mirror surface 74 transmits the measurement light L1 along the Y-axis direction and reflects the laser light L11 along the X-axis direction.
  • the measurement light L1 is partly reflected by the mirror surface 51a and the half mirror surface 71b of the movable mirror 5 and transmitted through the half mirror surface 71a, and the mirror surface 61a and the half mirror surface 71a of the fixed mirror 6.
  • the laser beam L11 is sequentially reflected by the mirror surface 121a and the total reflection mirror surface 72 of the fixed mirror 12 and sequentially transmitted through the half mirror surface 71b and the half mirror surface 71a. This is interference light with the remainder of the laser beam L10 that is sequentially reflected by the mirror surface 51a and the half mirror surface 71b and transmitted through the half mirror surface 71a.
  • the optical surface 75f is a surface parallel to the optical surfaces 75c, 75d, and 75e, and overlaps the dichroic mirror surface 74 when viewed from the X-axis direction.
  • the optical surface 75f transmits the laser light L11 reflected by the dichroic mirror surface 74 along the X-axis direction.
  • the measurement light incident part 8 is arranged so that the measurement light L0 is incident on the interference optical system I1 from the outside.
  • the measurement light incident part 8 is mounted on the device layer 3 on one side of the beam splitter unit 7 in the X-axis direction.
  • the measurement light incident part 8 faces the optical surface 75a of the beam splitter unit 7 in the X-axis direction.
  • the measurement light incident part 8 is constituted by, for example, an optical fiber and a collimating lens.
  • the measurement light emitting unit 9 is arranged so as to emit measurement light L1 from the interference optical system I1 to the outside.
  • the measurement light emitting unit 9 is mounted on the device layer 3 on one side of the beam splitter unit 7 in the Y-axis direction.
  • the measurement light emitting unit 9 faces the dichroic mirror surface 74 of the beam splitter unit 7 in the Y-axis direction.
  • the measurement light emitting unit 9 is configured by, for example, an optical fiber and a collimating lens.
  • the light source 13 generates a laser beam L10 that is incident on the interference optical system I2.
  • the light source 13 is a laser diode, for example.
  • the light source 13 is mounted on the device layer 3 on one side of the beam splitter unit 7 in the X-axis direction.
  • the light source 13 faces the optical surface 75b of the beam splitter unit 7 in the X-axis direction.
  • the light detector 14 detects the laser light L11 emitted from the interference optical system I2.
  • the photodetector 14 is, for example, a photodiode.
  • the photodetector 14 is mounted on the device layer 3 on one side of the beam splitter unit 7 in the X-axis direction.
  • the photodetector 14 faces the optical surface 75f of the beam splitter unit 7 in the X-axis direction.
  • the filter 15 is disposed on the optical path where the laser beam L10 does not travel and the measurement beam L0 travels. Specifically, the filter 15 is disposed between the measurement light incident portion 8 and the beam splitter unit 7. The filter 15 cuts light in a wavelength range including the center wavelength of the laser light L10.
  • the optical module 1 ⁇ / b> B configured as described above, when the measurement light L ⁇ b> 0 enters the interference optical system I ⁇ b> 1 from the outside via the measurement light incident unit 8 and the filter 15, a part of the measurement light L ⁇ b> 0 is part of the beam splitter unit 7.
  • the light is sequentially reflected by the half mirror surface 71 a and the half mirror surface 71 b and travels toward the mirror surface 51 a of the movable mirror 5.
  • a part of the measurement light L 0 is reflected by the mirror surface 51 a of the movable mirror 5, travels on the same optical path (that is, the optical path P 1), and passes through the half mirror surface 71 a of the beam splitter unit 7.
  • the remaining part of the measurement light L0 passes through the half mirror surface 71a of the beam splitter unit 7 and proceeds toward the mirror surface 61a of the fixed mirror 6.
  • the remainder of the measurement light L0 is reflected by the mirror surface 61a of the fixed mirror 6, travels on the same optical path (that is, the optical path P2), and is reflected by the half mirror surface 71a of the beam splitter unit 7.
  • the measurement light L1 passes through the dichroic mirror surface 74 of the beam splitter unit 7 and is emitted from the interference optical system I1 to the outside via the measurement light emitting unit 9.
  • the laser light L10 when the laser light L10 is incident on the interference optical system I2 from the light source 13, a part of the laser light L10 is sequentially reflected by the half mirror surface 71b and the total reflection mirror surface 72 of the beam splitter unit 7. Then, it proceeds toward the mirror surface 121a of the fixed mirror 12. A part of the laser beam L10 is reflected by the mirror surface 121a of the fixed mirror 12, and travels on the same optical path (that is, the optical path P3 (third optical path) between the beam splitter unit 7 and the fixed mirror 12). The light travels through the half mirror surface 71 b of the beam splitter unit 7.
  • the remaining part of the laser beam L10 passes through the half mirror surface 71b of the beam splitter unit 7 and proceeds toward the mirror surface 51a of the movable mirror 5.
  • the remainder of the laser beam L10 is reflected by the mirror surface 51a of the movable mirror 5, travels on the same optical path (that is, the optical path P1), and is reflected by the half mirror surface 71b of the beam splitter unit 7.
  • a part of the laser light L10 transmitted through the half mirror surface 71b of the beam splitter unit 7 and the remaining part of the laser light L10 reflected by the half mirror surface 71b of the beam splitter unit 7 become laser light L11 that is interference light.
  • the laser beam L11 passes through the half mirror surface 71a of the beam splitter unit 7, is reflected by the dichroic mirror surface 74 of the beam splitter unit 7, is emitted from the interference optical system I2, and is detected by the photodetector 14.
  • the optical module 1B since the position of the movable mirror 5 can be detected in real time by detecting the laser light L11, more accurate FTIR can be provided.
  • the filter 15 disposed between the measurement light incident portion 8 and the beam splitter unit 7 causes light in a wavelength range including the center wavelength of the laser light L10 (for example, a wavelength of 1 ⁇ m or less) from the measurement light L0.
  • the measuring light L0) in the range is cut.
  • the laser light L11 and the measurement light L1 are prevented from being mixed in the light incident on the photodetector 14.
  • the mirror surface 51a of the movable mirror 5 is enlarged while the angular deviation of the mirror surface 51a of the movable mirror 5 is within a predetermined range. Whether or not there is can be easily measured.
  • the fixed mirrors 6 and 12 are positioned on both sides of the movable mirror 5 in the Y-axis direction, and at least a part of the drive region 32 is viewed from the Z-axis direction. , One side of the fixed mirror 6 in the X-axis direction and one side of the fixed mirror 12 in the X-axis direction. Thereby, the space saving in the surface parallel to the main surface 10a of the base 10 can be achieved, and the enlargement of the entire optical module 1B can be suppressed.
  • the filter 15 that cuts light in a wavelength range including the center wavelength of the laser light L10 is disposed on the optical path where the laser light L10 does not travel and the measurement light L0 travels. Thereby, it is possible to prevent the measurement light L1 from becoming noise in detecting the interference light (laser light L11) of the laser light L10.
  • the optical module 1B also includes a light source 13 that generates a laser beam L10 that is incident on the interference optical system I2, and a photodetector 14 that detects the laser beam L11 emitted from the interference optical system I2.
  • a light source 13 that generates a laser beam L10 that is incident on the interference optical system I2
  • a photodetector 14 that detects the laser beam L11 emitted from the interference optical system I2.
  • the light source 13 and the photodetector 14 may be mounted on a circuit board 16 provided separately from the base 10.
  • the fixed mirror 6 may be provided on the optical surface 11 b of the light transmitting member 11. 7B, the fixed mirrors 6 and 12 may be located on one side with respect to the movable mirror 5 in the Y-axis direction.
  • the beam splitter unit 7 may be configured as follows.
  • the optical surface 75a is, for example, a surface perpendicular to the X-axis direction and overlaps the mirror surface 61a of the fixed mirror 6 when viewed from the X-axis direction. .
  • the optical surface 75a transmits the measurement light L0 incident along the X-axis direction.
  • the half mirror surface 71a is, for example, a surface inclined by 45 ° with respect to the optical surface 75a, and overlaps the mirror surface 61a of the fixed mirror 6 when viewed from the X-axis direction.
  • the half mirror surface 71a reflects a part of the measurement light L0 incident on the optical surface 75a along the X-axis direction along the Y-axis direction, and the remaining part of the measurement light L0 along the X-axis direction. Permeate to the side.
  • the optical surface 75b is, for example, a surface perpendicular to the X-axis direction, and overlaps with the mirror surface 121a of the fixed mirror 12 when viewed from the X-axis direction.
  • the optical surface 75b transmits the laser beam L10 incident along the X-axis direction.
  • the half mirror surface 71b is a surface parallel to the half mirror surface 71a, overlaps with the mirror surface 121a of the fixed mirror 12 when viewed from the X-axis direction, and the half mirror surface 71a when viewed from the Y-axis direction. overlapping.
  • the half mirror surface 71b reflects a part of the laser light L10 incident on the optical surface 75b along the X-axis direction along the Y-axis direction and the remaining part of the laser light L10 along the X-axis direction. Permeate to the side.
  • the half mirror surface 71a transmits part of the laser light L10 reflected by the half mirror surface 71b along the Y-axis direction.
  • the total reflection mirror surface 72 is a surface parallel to the half mirror surfaces 71a and 71b, overlaps the mirror surface 51a of the movable mirror 5 when viewed from the X-axis direction, and is a half mirror when viewed from the Y-axis direction. It overlaps with the surfaces 71a and 71b.
  • the total reflection mirror surface 72 reflects a part of the measurement light L0 reflected by the half mirror surface 71a and a part of the laser light L10 reflected by the half mirror surface 71b to the movable mirror 5 side along the X-axis direction. To do.
  • the optical surface 75c is a surface parallel to the optical surfaces 75a and 75b, and overlaps the mirror surface 61a of the fixed mirror 6 when viewed from the X-axis direction.
  • the optical surface 75c transmits the remaining portion of the measurement light L0 transmitted through the half mirror surface 71a to the fixed mirror 6 side along the X-axis direction.
  • the optical surface 75d is a surface parallel to the optical surfaces 75a and 75b, and overlaps the mirror surface 51a of the movable mirror 5 when viewed from the X-axis direction.
  • the optical surface 75d transmits part of the measurement light L0 and part of the laser light L10 reflected by the total reflection mirror surface 72 to the movable mirror 5 side along the X-axis direction.
  • the optical surface 75e is a surface parallel to the optical surfaces 75a and 75b, and overlaps the mirror surface 121a of the fixed mirror 12 when viewed from the X-axis direction.
  • the optical surface 75e transmits the remaining part of the laser light L10 transmitted through the half mirror surface 71a to the fixed mirror 12 side along the X-axis direction.
  • the dichroic mirror surface 74 is parallel to the half mirror surfaces 71a and 71b and the total reflection mirror surface 72, and overlaps the half mirror surfaces 71a and 71b and the total reflection mirror surface 72 when viewed from the Y-axis direction.
  • the dichroic mirror surface 74 transmits the measurement light L1 along the Y-axis direction and reflects the laser light L11 along the X-axis direction.
  • the measurement light L1 is partly reflected by the mirror surface 51a and the total reflection mirror surface 72 of the movable mirror 5 and sequentially transmitted through the half mirror surfaces 71a and 71b, and the mirror surface 61a of the fixed mirror 6.
  • the laser beam L11 is partly reflected by the mirror surface 51a and the total reflection mirror surface 72 of the movable mirror 5 and sequentially transmitted through the half mirror surfaces 71a and 71b, and the mirror surface 121a of the fixed mirror 12. And interference light with the remainder of the laser light L10 reflected sequentially by the half mirror surface 71b.
  • the optical surface 75f is a surface parallel to the optical surfaces 75c, 75d, and 75e, and overlaps the dichroic mirror surface 74 when viewed from the X-axis direction.
  • the optical surface 75f transmits the laser light L11 reflected by the dichroic mirror surface 74 along the X-axis direction.
  • the movable mirror 5, the fixed mirror 6, and the beam splitter unit 7 constitute the interference optical system I1 for the measurement light L0 and the interference optical system for the laser light L10. I2 may be configured.
  • the beam splitter unit 7 may be configured as follows.
  • the optical surface 75a is, for example, a surface perpendicular to the X-axis direction and overlaps the mirror surface 61a of the fixed mirror 6 when viewed from the X-axis direction. .
  • the optical surface 75a transmits the measurement light L0 incident along the X-axis direction.
  • the half mirror surface 71a is, for example, a surface inclined by 45 ° with respect to the optical surface 75a, and overlaps the mirror surface 61a of the fixed mirror 6 when viewed from the X-axis direction.
  • the half mirror surface 71a reflects a part of the measurement light L0 incident on the optical surface 75a along the X-axis direction along the Y-axis direction, and the remaining part of the measurement light L0 along the X-axis direction. Permeate to the side.
  • the optical surface 75b is, for example, a surface perpendicular to the X-axis direction, and is located on one side of the optical surface 75a in the Y-axis direction.
  • the optical surface 75b transmits the laser beam L10 incident along the X-axis direction.
  • the half mirror surface 71b is a surface parallel to the half mirror surface 71a, and overlaps the optical surface 75b when viewed from the X-axis direction and overlaps the half mirror surface 71a when viewed from the Y-axis direction.
  • the half mirror surface 71b reflects the laser light L10 incident on the optical surface 75b along the X-axis direction along the Y-axis direction.
  • the half mirror surface 71a transmits part of the laser light L10 reflected by the half mirror surface 71b along the Y-axis direction and reflects the remaining part of the laser light L10 toward the fixed mirror 6 along the X-axis direction.
  • the total reflection mirror surface 72 is a surface parallel to the half mirror surfaces 71a and 71b, overlaps the mirror surface 51a of the movable mirror 5 when viewed from the X-axis direction, and is a half mirror when viewed from the Y-axis direction. It overlaps with the surfaces 71a and 71b.
  • the total reflection mirror surface 72 reflects a part of the measurement light L0 reflected by the half mirror surface 71a and a part of the laser light L10 transmitted through the half mirror surface 71a to the movable mirror 5 side along the X-axis direction. .
  • the optical surface 75c is a surface parallel to the optical surfaces 75a and 75b, and overlaps the mirror surface 61a of the fixed mirror 6 when viewed from the X-axis direction.
  • the optical surface 75c transmits the remaining portion of the measurement light L0 transmitted through the half mirror surface 71a and the remaining portion of the laser light L10 reflected by the half mirror surface 71a to the fixed mirror 6 side along the X-axis direction.
  • the optical surface 75d is a surface parallel to the optical surfaces 75a and 75b, and overlaps the mirror surface 51a of the movable mirror 5 when viewed from the X-axis direction.
  • the optical surface 75d transmits part of the measurement light L0 and part of the laser light L10 reflected by the total reflection mirror surface 72 to the movable mirror 5 side along the X-axis direction.
  • the half mirror surface 71c is a surface parallel to the half mirror surfaces 71a and 71b and the total reflection mirror surface 72, and is located between the half mirror surface 71a and the half mirror surface 71b in the Y-axis direction.
  • the half mirror surface 71c reflects the measurement light L1 along the X-axis direction and transmits the laser light L11 along the Y-axis direction.
  • the half mirror surface 71b transmits the laser light L11 transmitted through the half mirror surface 71c along the Y-axis direction.
  • the measurement light L1 is partly reflected by the mirror surface 51a and the total reflection mirror surface 72 of the movable mirror 5 and transmitted through the half mirror surface 71a, and the mirror surface 61a and the half mirror surface of the fixed mirror 6.
  • the laser beam L11 is partly reflected by the mirror surface 51a and the total reflection mirror surface 72 of the movable mirror 5 and transmitted through the half mirror surface 71a, and the mirror surface 61a and the half mirror surface of the fixed mirror 6. It is interference light with the remainder of the laser beam L10 reflected sequentially by 71a.
  • the optical surface 75f is a surface parallel to the optical surfaces 75c and 75d, and overlaps the half mirror surface 71c when viewed from the X-axis direction.
  • the optical surface 75f transmits the measurement light L1 reflected by the half mirror surface 71c along the X-axis direction.
  • the total reflection mirror surface 72 for the measurement light L0 is caused to function as a half mirror surface for the laser light L10.
  • the movable mirror 5, the fixed mirror 12, and the beam splitter unit 7 can constitute the interference optical system I2 for the laser light L10.
  • the fixed mirror 12 is disposed so that the mirror surface 121a faces the total reflection mirror surface 72 in the Y-axis direction, and the measurement light L1 and laser light L11 emitted from the optical surface 73d.
  • a dichroic mirror 76 is arranged so as to separate the two.
  • the movable mirror 5, the fixed mirror 6, and the beam The splitter unit 7 can constitute an interference optical system I1 for the measurement light L0 and an interference optical system I2 for the laser light L10.
  • the movable mirror 5, the fixed mirror 6, and The beam splitter unit 7 can constitute an interference optical system I1 for the measurement light L0 and an interference optical system I2 for the laser light L10.
  • the optical block 77 shown in FIGS. 9A and 9B includes a plurality of optical surfaces 77a and 77b and half mirror surfaces 77c and 77d.
  • the optical surface 77a is, for example, a surface perpendicular to the X-axis direction, and transmits the laser light L10 incident along the X-axis direction.
  • the half mirror surface 77c is, for example, a surface inclined by 45 ° with respect to the optical surface 77a, and overlaps the optical surface 77a when viewed from the X-axis direction.
  • the half mirror surface 77c reflects the laser light L10 transmitted through the optical surface 77a along the Y-axis direction.
  • the half mirror surface 77d is a surface parallel to the half mirror surface 77c, and overlaps the optical surface 73a when viewed from the X axis direction and overlaps the half mirror surface 77c when viewed from the Y axis direction.
  • the half mirror surface 77d transmits the measurement light L0 incident along the X axis direction and reflects the laser light L10 reflected by the half mirror surface 77c toward the optical surface 73a side along the X axis direction.
  • the optical surface 77b is a surface parallel to the optical surface 77a, and overlaps the optical surface 73a when viewed from the X-axis direction.
  • the optical surface 77b transmits the measurement light L0 transmitted through the half mirror surface 77d and the laser light L10 reflected by the half mirror surface 77d to the optical surface 73a side along the X-axis direction.
  • the measurement light L1 is emitted from the optical surface 73d as in the configuration shown in FIGS. 4A and 4B.
  • the laser beam L11 sequentially passes through the optical surfaces 73a and 77b, is reflected by the half mirror surface 77d, and is emitted from the half mirror surface 77c.
  • the measurement light L1 is partly reflected by the mirror surface 51a and the total reflection mirror surface 72 of the movable mirror 5 and transmitted through the half mirror surface 71, and the mirror surface 61a and the half mirror surface of the fixed mirror 6. Interference light with the remainder of the measurement light L0 sequentially reflected by 71.
  • the laser light L11 is reflected by the mirror surface 51a of the movable mirror 5, the part of the laser light L10 sequentially reflected by the total reflection mirror surface 72 and the half mirror surface 71, and the mirror surface 61a of the fixed mirror 6 and reflected by the half mirror. Interference light with the remainder of the laser beam L10 that has passed through the surface 71.
  • this indication is not limited to the above-mentioned embodiment.
  • the fixed mirror 6 may be disposed between one elastic support region 34 of the drive region 32 and the beam splitter unit 7.
  • at least a part of the drive region 32 is located not on one side of the fixed mirror 12 in the X-axis direction but on the other side of the fixed mirror 12 in the X-axis direction when viewed from the Z-axis direction. May be.
  • the fixed mirror 12 may be disposed between one elastic support region 34 of the drive region 32 and the beam splitter unit 7.
  • At least one of the fixed mirrors 6 and 12, the beam splitter unit 7, and the light transmission member 11 may not be mounted on the base 10.
  • at least one of the fixed mirrors 6, 12, the beam splitter unit 7, and the light transmission member 11 may be mounted on a base different from the base 10.
  • the light transmitting member 11 may be disposed on the optical path P1 between the beam splitter unit 7 and the movable mirror 5, as shown in FIG. 4B.
  • the light transmitting member 11 may be disposed on both the optical path P1 between the beam splitter unit 7 and the movable mirror 5 and the optical path P2 between the beam splitter unit 7 and the fixed mirror 6.
  • the light transmission member 11 is disposed on at least one optical path of the optical path P1 between the beam splitter unit 7 and the movable mirror 5 and the optical path P2 between the beam splitter unit 7 and the fixed mirror 6. That's fine.
  • the position of the filter 15 is not limited as long as the filter 15 is arranged on the optical path where the laser light does not travel and the measurement light travels.
  • the filter 15 may be disposed between the beam splitter unit 7 and the movable mirror 5 and between the beam splitter unit 7 and the fixed mirror 6.
  • a support layer is provided for the device layer 3. It is not limited to what is located on the opposite side to 2.
  • the mirror surface 51 a of the movable mirror 5, the mirror surface 61 a of the fixed mirror 6, and the mirror surface 121 a of the fixed mirror 12 directly intersect the main surface 10 a of the base 10 such as directly passing through the device layer 3. It may be.
  • Locking part (supporting part), 61a ... Mirror surface 71 ... half mirror surface, 72 ... total reflection mirror surface, 121a ... mirror surface, L0, L1 ... measurement light, L10, L11 ... laser light, I1 ... interference optical system (first interference optical system), I2 ... interference optics System (second interference optical system), P1... Optical path (first Road), P2 ... optical path (second optical path).

Abstract

L'invention concerne un module optique comprenant : une base qui possède une surface principale, et qui est pourvue d'une région de montage et d'une région d'entraînement qui déplace la région de montage le long d'une première direction parallèle à la surface principale ; un miroir mobile qui possède une surface de miroir dans une relation de position croisant la surface principale et qui est montée sur la région de montage ; un premier miroir fixe qui possède une surface de miroir dans une relation de position croisant la surface principale et qui possède une position fixe par rapport à la base ; et une unité de diviseur de faisceau qui, conjointement avec le miroir mobile et le premier miroir fixe, configure un premier système optique d'interférence pour la lumière de mesure. La surface de miroir du miroir mobile et la surface de miroir du premier miroir fixe font face à la même direction dans la première direction.
PCT/JP2018/009975 2017-03-14 2018-03-14 Module optique WO2018168929A1 (fr)

Priority Applications (3)

Application Number Priority Date Filing Date Title
CN201880017380.6A CN110402408B (zh) 2017-03-14 2018-03-14 光组件
DE112018001339.1T DE112018001339T5 (de) 2017-03-14 2018-03-14 Optisches Modul
US16/492,712 US11487104B2 (en) 2017-03-14 2018-03-14 Optical module

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
JP2017-048561 2017-03-14
JP2017048561 2017-03-14
JP2017133086A JP6893449B2 (ja) 2017-03-14 2017-07-06 光モジュール
JP2017-133086 2017-07-06

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WO2018168929A1 true WO2018168929A1 (fr) 2018-09-20

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JP2003159698A (ja) * 2001-09-17 2003-06-03 Nikon Corp マイクロアクチュエータ、並びに、これを用いたマイクロアクチュエータ装置、光スイッチ及び光スイッチアレー
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US11898841B2 (en) 2019-01-30 2024-02-13 Hamamatsu Photonics K.K. Optical module, signal processing system, and signal processing method

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