WO2018142623A1 - Polishing pad recess forming method and polishing pad - Google Patents

Polishing pad recess forming method and polishing pad Download PDF

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Publication number
WO2018142623A1
WO2018142623A1 PCT/JP2017/004259 JP2017004259W WO2018142623A1 WO 2018142623 A1 WO2018142623 A1 WO 2018142623A1 JP 2017004259 W JP2017004259 W JP 2017004259W WO 2018142623 A1 WO2018142623 A1 WO 2018142623A1
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WO
WIPO (PCT)
Prior art keywords
polishing pad
polishing
recess
layer
forming
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PCT/JP2017/004259
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French (fr)
Japanese (ja)
Inventor
邦晴 大石
達広 海野
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株式会社大輝
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Publication date
Application filed by 株式会社大輝 filed Critical 株式会社大輝
Priority to PCT/JP2017/004259 priority Critical patent/WO2018142623A1/en
Priority to CN201780048120.0A priority patent/CN109562506B/en
Priority to JP2017553193A priority patent/JP6324637B1/en
Publication of WO2018142623A1 publication Critical patent/WO2018142623A1/en

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    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00Lapping machines or devices; Accessories
    • B24B37/11Lapping tools
    • B24B37/20Lapping pads for working plane surfaces
    • B24B37/26Lapping pads for working plane surfaces characterised by the shape of the lapping pad surface, e.g. grooved
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/302Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
    • H01L21/304Mechanical treatment, e.g. grinding, polishing, cutting

Definitions

  • the present invention relates to a method for forming a recess of a polishing pad used for polishing an object to be polished and a polishing pad.
  • a sheet-like abrasive called a polishing pad has been widely used to polish semiconductor wafers cut from ingots and intermediate products produced in the manufacturing process of precision equipment represented by semiconductor integrated circuits. ing.
  • a polishing pad having a concave portion such as a streak-like groove formed on the surface is also known, and various methods have been proposed for forming the concave portion. For example, in the method disclosed in Patent Document 1, a concavo-convex shape is formed on the surface of the polishing sheet using a sand blasting method in which a fine abrasive is sprayed.
  • Patent Document 1 discloses a method for forming a concavo-convex shape in a heating embossing process, and a method for curing after applying and embossing a non-adhesive reactive resin instead of the sandblasting method. .
  • Patent Document 2 In the method disclosed in Patent Document 2, first, a lower layer formed into a disk shape and an upper layer having the same shape as the lower layer are prepared, and the upper layer is cut radially. At that time, the width of the cut is matched with the width of the groove to be formed. Next, a pad piece cut into a fan shape is pasted on the lower layer. As a result, radial grooves are formed on the surface of the polishing pad.
  • Patent Document 3 discloses a method of forming a narrow groove on the surface of a semiconductor CMP processing pad by cutting a urethane foam pad with a milling cutter.
  • Patent Document 4 discloses a method of forming a recess on the surface of a polishing layer included in a polishing sheet using a printing method such as screen printing, gravure printing, or gravure offset printing.
  • Patent Document 5 discloses a method of forming a CMP pad (porous polishing pad) using laser sintering.
  • the method includes focusing a laser beam from a laser into a sintering nozzle and injecting fluidized thermoplastic particles into the sintering nozzle through an injection port.
  • the thermoplastic particles are sintered with a laser beam, and the sintered thermoplastic particles are selectively deposited on a plate. Thereby, the part which is not deposited becomes a groove.
  • a coating film is formed by applying a resin solution onto a precursor sheet-forming substrate having an uneven shape. This coating film is formed so as to follow the uneven shape of the substrate and the coating film surface becomes flat.
  • the base material is attached to the resin sheet from which the base material has been peeled off from the structure via an adhesive layer. Then, the skin layer region is curved / bent in the thickness direction by pressing the skin layer region portion toward the pressure-sensitive adhesive layer side using a press. Thereby, a groove is formed on the skin layer region side of the resin sheet.
  • a polishing sheet having a large number of vertically long bubbles is formed using a wet film forming method.
  • the surface of the polishing sheet where the bubbles are reduced in diameter is ground or sliced to open the tear-type bubbles on the polishing surface of the polishing sheet.
  • the protective sheet which suppresses a temperature rise is arrange
  • the heated mold is pressed against the surface on which the protective sheet is disposed. Since this mold has a convex portion of a predetermined shape, a groove corresponding to the concave portion of the mold is formed on the polishing surface by this pressing.
  • the quality of the polishing pad has a great influence on the yield of objects to be polished using the polishing pad, in recent years, the required specifications from the user side who uses the polishing pad are increasing. As such a requirement, it is possible to respond flexibly to diversification of specifications including complicated concave patterns, and the concave portions (grooves) formed by cutting with a cutter are preferable because the inner surfaces of the concave portions are roughened. If the unevenness is square, the object to be polished is caught during polishing, which is not preferable.
  • the present invention has been made in view of such circumstances, and an object of the present invention is to provide a high-quality polishing pad that meets the user's request regarding the recess.
  • the first invention provides a method of forming a recess in the surface of a polishing pad.
  • a polishing pad is disposed on the work surface.
  • the work surface is provided with a convex pattern corresponding to the concave pattern to be formed on the surface of the polishing layer provided in the polishing pad.
  • the surface of the polishing layer raised according to the convex pattern on the work surface is partially removed in the thickness direction while applying an external force to the polishing pad to bend the polishing pad. Thereby, a recess is formed on the surface of the polishing layer.
  • the first step may include a step of placing a jig on the work surface prior to placement of the polishing pad on the work surface.
  • This jig has a base member and a protrusion.
  • the base member has a shape corresponding to the surface shape of the polishing pad and has air permeability.
  • the protrusion is attached to protrude from the surface of the base member, and has a convex pattern corresponding to the concave pattern to be formed on the surface of the polishing layer.
  • the jig disposed on the work surface is removed, the polishing pad is rearranged on the work surface, and the surface of the polishing layer excluding the recess is ground to form a flat polishing surface.
  • These steps may be further provided.
  • the removal of the polishing layer in the second step is preferably performed by grinding only the raised surface of the polishing layer.
  • the second step includes a step of sucking and removing dust generated by grinding the raised surface of the polishing layer.
  • the second invention provides a polishing pad provided with a polishing layer.
  • the polishing layer has a flat polishing surface that is a part of the surface, a concave portion that is partially provided on the surface, and that is recessed from the surface, and a flat back surface that is opposite to the surface.
  • the thickness of the polishing layer gradually decreases from the polishing surface toward the recess. Further, the rate of change of the thickness of the polishing layer gradually increases from the polishing surface toward the side wall surface of the recess, and gradually decreases from the side wall surface of the recess toward the bottom surface of the recess.
  • the roughness of the side wall surface and the bottom surface of the recess may be the same as the roughness of the polished surface.
  • the said recessed part is a groove
  • the first invention since a cutter that causes roughening of the inner surface of the recess is not used, a fine surface equivalent to or close to the polished surface can be obtained as the inner surface of the recess.
  • the object to be polished is hardly caught when polishing using a polishing pad.
  • the concave pattern of the polishing pad can be flexibly formed with a high degree of freedom by exchanging the jig.
  • the thickness of the polishing layer is gradually decreased from the polishing surface toward the concave portion, and there is no angular irregularity on the surface of the polishing layer. Therefore, when polishing with the polishing pad, The object to be polished is not easily caught. Further, since the profile relating to the thickness of the polishing layer is specific to the method according to the first invention, it is effective whether or not the polishing pad is created by using the method according to the first invention through observation of the profile. Can be judged.
  • FIG. 1 is a configuration diagram of a polishing pad processing apparatus.
  • This processing apparatus 1 is mainly composed of a work table 2, a suction machine 3, and a grinding machine 4.
  • a work frame 2 provided in the work table 2 is fixed with a frame 5 for positioning a disc-shaped polishing pad or the like.
  • the work surface 2a is provided with a number of suction holes 2b that penetrate the work table 2 up and down.
  • the suction machine 3 is disposed under the work table 2.
  • the suction machine 3 communicates with a number of suction holes 2b provided in the work table 2, and sucks the polishing pad held in the table frame 5 from the back surface thereof.
  • the grinding machine 4 is disposed above the work table 2 so as to face the work surface 2a, and is movable in a three-dimensional direction by an actuator (not shown).
  • the grinding machine 4 includes a rotary roller 4a and a dust suction machine 4b. Diamond powder is fixed to the outer peripheral surface of the roller 4a.
  • the object to be ground polishing pad
  • the dust suction machine 4b sucks and removes dust generated by grinding with the roller 4a.
  • the dust sucked by the dust suction machine 4b is discharged to the outside through a hose 4c attached to the grinding machine 4.
  • FIG. 3 is a configuration diagram of the jig 6.
  • the jig 6 includes a base member 6a and a protruding portion 6b.
  • the base member 6a has a shape (disk shape) corresponding to the surface shape of the polishing pad.
  • the base member 6a is formed of a material having air permeability (for example, polyurethane) so as not to hinder the suction of the polishing pad through the suction hole 2b.
  • the protruding portion 6b is attached to the base member 6a so as to protrude upward from the surface of the base member 6a.
  • the protrusion 6b has a convex shape (convex pattern) corresponding to the shape of the concave portion (concave pattern) to be formed on the surface of the polishing layer provided in the polishing pad.
  • the protrusion 6b is formed of an acrylic material as an example.
  • the protruding shape of the protruding portion 6b can be freely formed with a high degree of freedom including straight lines, curved lines, and combinations thereof.
  • the protruding portion 6b in order to form a turtle shell-shaped concave pattern on the surface of the polishing pad, the protruding portion 6b also has a turtle shell-shaped convex pattern.
  • FIG. 4 is a cross-sectional view of the polishing pad 7.
  • the polishing pad 7 is mainly composed of a polishing layer 7a, an adhesive layer 7b, and a release sheet 7c in order from the top layer, and is cut (formed) into a disk shape in this embodiment. Further, the polishing pad 7 has a property of bending itself, that is, flexibility.
  • the polishing layer 7a is a layer having a function of polishing an object to be polished, which is a central function of the polishing pad 7, and is made of, for example, polyurethane (foamed urethane).
  • a double-sided tape can be used as the adhesive layer 7b.
  • the lowermost release sheet 7c is peeled to expose the adhesive layer 7b, and then the polishing pad 7 is attached to a predetermined part of the polishing apparatus.
  • FIG. 6 is a view showing a state in which the polishing pad 7 is disposed on the work surface 2a via the jig 6. As shown in FIG. When the suction machine 3 is stopped, the polishing pad 7 is lifted by the height of the protrusion 6b, and there is a space between the polishing pad 7 and the base member 6a. Due to the presence of this space, when an external force is applied to the polishing pad 7 in the next step, partial deflection of the polishing pad 7 that is lifted from the work surface 2a is allowed.
  • FIG. 7 is an explanatory diagram of a grinding process of the polishing pad 7.
  • the suction machine 3 is operated to suck the polishing pad 7 from the back surface through the plurality of suction holes 2b facing the work surface 2a.
  • this suction force acting on the polishing pad 7 as an external force a portion of the surface of the polishing pad 7 that is in a state of being lifted by the adjacent protrusions 6b is bent, and the upper surface of the base member 6a disposed below and Contact. That is, the surface of the polishing pad 7 (polishing layer 7a) is depressed only at the part that has been lifted, and as a result, the part supported by the protruding portion 6b is relatively raised.
  • the grinding machine 4 set to a predetermined height is moved in parallel with the work surface 2a, and the polishing layer which is the uppermost layer of the polishing pad 7 is formed by the roller 4a.
  • the surface of 7a is partially ground, that is, only the raised portion is ground by a predetermined thickness ⁇ (grinding step).
  • the following two conditions are required as conditions for preventing the grinding process by the grinding machine 4 from being hindered.
  • the height reference is the work surface 2a
  • the height H1 of the underframe 5 is lower than the sum of the jig height H2 and the thickness D of the polishing pad 7 (before grinding). is there.
  • the partial removal of the polishing layer 7a may be performed by using a slicing process that thinly slices the surface of the grinding layer 7a instead of the grinding process.
  • the finishing process of the polishing pad 7 is performed.
  • the jig 6 arranged on the work surface 2a is removed, and the polishing pad 7 is rearranged on the work surface 2a.
  • the surface of the polishing layer 7a excluding the concave portion 7d is thinly ground by using the same grinding machine 4 as in the grinding step, thereby forming a flat polishing surface as a part of the surface of the polishing layer 7a.
  • FIG. 8 is a view showing the polishing pad 7 completed through a series of steps.
  • the uppermost polishing surface 7 a has a flat polishing surface 7 d that is a part of the surface, and a recess 7 e that is partially provided on the surface and is recessed from the surface (polishing surface 7 d).
  • a shape corresponding to the convex pattern of the jig 6 is transferred as the shape (concave pattern) of the concave portion 7e.
  • the surface of the polishing layer 7a has irregularities, but the back surface thereof is flat.
  • FIG. 9 is an enlarged cross-sectional photograph of the polishing pad 7.
  • A is the maximum thickness (1.402 mm) of the polishing layer 7a
  • B is the width of the recess (groove) (3.786 mm)
  • C is the depth of the recess 7e (0.246 mm).
  • the surface changes gently from the polishing surface 7d toward the recess 7e, and there is no angular portion.
  • the inner surface of the recess 7e does not have the roughness as in the case of cutting with a cutter, and is in a fine state equivalent to or close to the roughness of the polishing surface 7d.
  • the roughness of the inner surface (side wall surface and bottom surface) of the recess is the same as the roughness of the polished surface.
  • FIG. 10 is a characteristic diagram showing a profile of the thickness D of the polishing layer 7a with respect to the length X in the groove width direction.
  • the thickness D of the polishing layer 7a is gradually decreased from the polishing surface 7d toward the recess 7e.
  • the change rate ⁇ D that is, the inclination of the thickness D gradually increases from the polishing surface 7d toward the side wall surface of the recess 7e, and gradually decreases from the side wall surface of the recess 7d toward the bottom surface thereof. is doing.
  • a cutter that causes roughening of the inner surface of the recess 7e of the polishing pad 7 is not used, so that a fine surface equivalent to or close to the polishing surface 7e can be obtained as the inner surface of the recess 7e. Can do. Further, since there are no angular irregularities on the surface of the polishing layer 7a, the object to be polished is not easily caught when polishing by the polishing pad 7 by the user.
  • the concave pattern of the polishing pad 7 can be flexibly formed with a high degree of freedom by replacing the jig 6 for transferring the concave pattern to the polishing pad 7 with a different convex pattern. can do.
  • the convex pattern may be directly formed on the work surface 2a without using the replaceable jig 6.
  • the profile relating to the thickness D of the polishing layer 7a is unique to the processing method according to the present embodiment. It is possible to effectively determine whether the polishing pad is created using the processing method.
  • the polishing layer The thickness D changes rapidly.
  • the side wall surface of the recess is also vertical and does not have the inclination as shown in FIG. Even if the boundary portion B becomes gentle depending on the shape of the cutting edge of the cutter, the boundary portion A does not become gentle.
  • Patent Document 6 listed as the prior art discloses a polishing pad in which the surface of the skin layer region corresponding to the polishing layer is gently connected as shown in FIG. It is similar to the polishing pad 7 according to this embodiment in that there is no unevenness.
  • the skin layer region of Patent Document 6 has a constant thickness and does not have a profile as shown in FIG. From the above, it can be said that the profile of FIG. 10 is unique to a processing method in which surface grinding is performed while the polishing layer is bent and deformed.
  • the present invention is not limited to this.
  • the magnetic force of the magnet 8 may be used.
  • a metal mesh or the like is used as the base member 6a, and the magnet 8 is disposed between the adjacent protruding portions 6.
  • the polishing pad 7 is bent by the magnetic force generated between the magnet 8 and the base member 6 a, and as a result, a bump corresponding to the convex shape of the jig 6 is generated on the surface of the polishing pad 7.
  • a weight may be used and the polishing pad 7 may be bent with its own weight as an external force. Further, the polishing pad 7 may be bent by pressing both ends of the polishing pad 7 against the work surface 2a.
  • the polishing layer 7a, the adhesive layer 7b, and the release sheet 7c are laminated and cut (formed) into a disk shape.
  • the polishing layer 7a before lamination may be a single body or a sheet body before cutting. From this point of view, the term “polishing pad 7” in the present specification is used in a sense including such a thing widely.
  • the polishing layer 7a is ground by moving the grinding machine 4 (roller 4a) with respect to the polishing pad 7 disposed on the work surface 2a
  • the present invention is not limited to this, and the polishing pad 7 may be moved with respect to the grinding machine 4.
  • the upper surface of the work table 2 may be curved. In this case, the portion of the curved surface of the work table 2 where the polishing layer 7a and the grinding machine 4 are in contact with each other can be regarded as the “work surface 2a”.
  • the polishing pad manufactured according to the present invention is widely applied to the use of polishing an object to be polished including a semiconductor wafer cut out from an ingot and an intermediate product generated in the manufacturing process of precision equipment represented by a semiconductor integrated circuit. be able to.

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  • Mechanical Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
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  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
  • Mechanical Treatment Of Semiconductor (AREA)

Abstract

[Problem] To provide a high-quality polishing pad that satisfies a user's demand regarding recesses. [Solution] First, a tool (6) that has a projected shape conforming to the shape of a recess to be formed on the front surface of a polishing pad (7) is arranged on a work surface (2a). Then, the polishing pad (7) is arranged on the work surface (2a) on which the tool (6) has been arranged. The polishing pad (7) is sucked from the back surface via a suction hole (2b), and the front surface raised in accordance with the projected shape of the tool (6) is partially removed in the thickness direction while bending the polishing pad (7) which is supported in the state of being suspended by the projected part of the tool (6). Thus, a recess is formed in the front surface of the polishing pad (7).

Description

ポリッシングバッドの凹部形成方法およびポリッシングパッドMethod of forming recess of polishing pad and polishing pad
 本発明は、被研磨物を研磨するために用いられるポリッシングパッドの凹部形成方法およびポリッシングパッドに関する。 The present invention relates to a method for forming a recess of a polishing pad used for polishing an object to be polished and a polishing pad.
 従来より、インゴットより切り出された半導体ウェハや、半導体集積回路に代表される精密機器の製造過程で生成される中間品などを研磨するために、ポリッシングパッドと呼ばれるシート状の研磨材が広く用いられている。また、筋状の溝などの凹部が表面に形成されたポリッシングパッドも知られており、凹部の形成について様々な方法が提案されている。例えば、特許文献1に開示された方法では、微細な研磨剤を吹き付けるサンドブラスト法を用いて、研磨シートの表面に凹凸形状が形成される。また、特許文献1には、サンドブラスト法に代えて、加熱エンボス工程で凹凸形状を賦型する手法や、非粘着の反応型樹脂を塗工・エンボス加工した上で硬化させる手法も開示されている。 Conventionally, a sheet-like abrasive called a polishing pad has been widely used to polish semiconductor wafers cut from ingots and intermediate products produced in the manufacturing process of precision equipment represented by semiconductor integrated circuits. ing. A polishing pad having a concave portion such as a streak-like groove formed on the surface is also known, and various methods have been proposed for forming the concave portion. For example, in the method disclosed in Patent Document 1, a concavo-convex shape is formed on the surface of the polishing sheet using a sand blasting method in which a fine abrasive is sprayed. Further, Patent Document 1 discloses a method for forming a concavo-convex shape in a heating embossing process, and a method for curing after applying and embossing a non-adhesive reactive resin instead of the sandblasting method. .
 特許文献2に開示された方法では、まず、円板状に成形した下層と、この下層と同形の上層とを用意し、上層が放射状に切断される。その際、切り込みの幅は、形成しようとする溝の幅と一致させる。つぎに、切り込まれて扇形状に形成されたパッド片が下層上に貼り付けられる。これにより、研磨パッドの表面に放射状の溝が形成される。 In the method disclosed in Patent Document 2, first, a lower layer formed into a disk shape and an upper layer having the same shape as the lower layer are prepared, and the upper layer is cut radially. At that time, the width of the cut is matched with the width of the groove to be formed. Next, a pad piece cut into a fan shape is pasted on the lower layer. As a result, radial grooves are formed on the surface of the polishing pad.
 特許文献3には、発泡ウレタンパッドに対して、フライスカッターで切削加工を施すことによって、半導体CMP加工用パッドの表面に細溝を形成する方法が開示されている。また、特許文献4には、スクリーン印刷、グラビア印刷、グラビアオフセット印刷などの印刷法を用いて、研磨シートが備える研磨層の表面に凹部を形成する方法が開示されている。 Patent Document 3 discloses a method of forming a narrow groove on the surface of a semiconductor CMP processing pad by cutting a urethane foam pad with a milling cutter. Patent Document 4 discloses a method of forming a recess on the surface of a polishing layer included in a polishing sheet using a printing method such as screen printing, gravure printing, or gravure offset printing.
 一方、特許文献5には、レーザ焼結を利用してCMPパッド(多孔性研摩パッド)を形成する方法が開示されている。この方法は、レーザから焼結ノズルの中にレーザビームを集束する工程と、注入ポートを通じて、流動化された熱可塑性粒子を焼結ノズルの中に注入する工程とを有する。レーザビームで熱可塑性粒子を焼結し、焼結した熱可塑粒子を盤上に選択的に堆積させる。これにより、堆積させない部分が溝となる。 On the other hand, Patent Document 5 discloses a method of forming a CMP pad (porous polishing pad) using laser sintering. The method includes focusing a laser beam from a laser into a sintering nozzle and injecting fluidized thermoplastic particles into the sintering nozzle through an injection port. The thermoplastic particles are sintered with a laser beam, and the sintered thermoplastic particles are selectively deposited on a plate. Thereby, the part which is not deposited becomes a groove.
 また、特許文献6に開示された方法では、まず、凹凸形状を有する前駆体シート形成用基材上に、樹脂溶液を塗布して塗膜が形成される。この塗膜は、基材の凹凸形状に追従するように、かつ、塗膜表面が平坦になるよう形成される。つぎに、この構造物から基材が剥離された樹脂シートに、粘着剤層を介して基材が帖着される。そして、プレス機を用いて、スキン層領域の部分を粘着剤層側に向かって押し付けることで、スキン層領域を厚さ方向に湾曲/屈曲させる。これにより、樹脂シートのスキン層領域の側に溝が形成される。 Further, in the method disclosed in Patent Document 6, first, a coating film is formed by applying a resin solution onto a precursor sheet-forming substrate having an uneven shape. This coating film is formed so as to follow the uneven shape of the substrate and the coating film surface becomes flat. Next, the base material is attached to the resin sheet from which the base material has been peeled off from the structure via an adhesive layer. Then, the skin layer region is curved / bent in the thickness direction by pressing the skin layer region portion toward the pressure-sensitive adhesive layer side using a press. Thereby, a groove is formed on the skin layer region side of the resin sheet.
 さらに、特許文献7に開示された方法では、まず、湿式成膜法を用いて、内部に多数の縦長気泡を有する研磨シートが形成される。つぎに、研磨シートの気泡が縮径している側の面を研削またはスライス処理して、涙型気泡を研磨シートの研磨面を開口させる。そして、開口させた研磨面に、温度上昇を抑制する保護シートが配置される。最後に、保護シートが配置された面に、加熱された金型が押し当てられる。この金型は、所定形状の凸部を有しているため、この押し当てによって、金型の凹部に対応した溝が研磨面に形成される。 Furthermore, in the method disclosed in Patent Document 7, first, a polishing sheet having a large number of vertically long bubbles is formed using a wet film forming method. Next, the surface of the polishing sheet where the bubbles are reduced in diameter is ground or sliced to open the tear-type bubbles on the polishing surface of the polishing sheet. And the protective sheet which suppresses a temperature rise is arrange | positioned at the opened grinding | polishing surface. Finally, the heated mold is pressed against the surface on which the protective sheet is disposed. Since this mold has a convex portion of a predetermined shape, a groove corresponding to the concave portion of the mold is formed on the polishing surface by this pressing.
特開2001-113467号公報JP 2001-113467 A 特開2002-100592号公報JP 2002-100592 A 特開2002-11630号公報JP 2002-11630 A 特開2003-103470号公報JP 2003-103470 A 特開2007-281435号公報JP 2007-281435 A 特開2013-208687号公報JP 2013-208687 A 特開2013-208687号公報JP 2013-208687 A
 ポリッシングパッドの品質は、これを用いて研磨される被研磨物の歩留まりに大きな影響を及すため、近年では、ポリッシングパッドを使用するユーザ側からの要求スペックも益々高くなっている。このような要求としては、複雑な凹模様を含む仕様の多様化に対して柔軟に対応可能であること、カッターによる切削加工で形成された凹部(溝)は凹部の内面が荒れてしまうので好ましくないこと、凹凸が角張っていると、研磨の際に被研磨物が引っ掛かってしまうので好ましくないこと、などが挙げられる。 Since the quality of the polishing pad has a great influence on the yield of objects to be polished using the polishing pad, in recent years, the required specifications from the user side who uses the polishing pad are increasing. As such a requirement, it is possible to respond flexibly to diversification of specifications including complicated concave patterns, and the concave portions (grooves) formed by cutting with a cutter are preferable because the inner surfaces of the concave portions are roughened. If the unevenness is square, the object to be polished is caught during polishing, which is not preferable.
 本発明は、かかる事情に鑑みてなされたものであり、その目的は、凹部に関するユーザの要求に応えた高品質なポリッシングパッドを提供することである。 The present invention has been made in view of such circumstances, and an object of the present invention is to provide a high-quality polishing pad that meets the user's request regarding the recess.
 かかる課題を解決すべく、第1の発明は、ポリッシングパッドの表面に凹部を形成する方法を提供する。この方法では、まず、第1のステップとして、作業面上にポリッシングパッドを配置する。この作業面には、ポリッシングパッドが備える研磨層の表面に形成すべき凹模様に対応した凸模様が設けられている。つぎに、第2のステップとして、ポリッシングパッドに外力を加えてポリッシングパッドを撓ませながら、作業面上の凸模様に応じて隆起した研磨層の表面を厚さ方向に部分的に除去する。これによって、研磨層の表面に凹部が形成される。 In order to solve this problem, the first invention provides a method of forming a recess in the surface of a polishing pad. In this method, first, as a first step, a polishing pad is disposed on the work surface. The work surface is provided with a convex pattern corresponding to the concave pattern to be formed on the surface of the polishing layer provided in the polishing pad. Next, as a second step, the surface of the polishing layer raised according to the convex pattern on the work surface is partially removed in the thickness direction while applying an external force to the polishing pad to bend the polishing pad. Thereby, a recess is formed on the surface of the polishing layer.
 ここで、第1の発明の上記第2のステップにおいて、上記外力として、作業面に設けられた複数の吸引孔を介して、ポリッシングパッドを裏面より吸引する吸引力を用いてもよい。この場合、上記第1のステップは、作業面上へのポリッシングパッドの配置に先立ち、作業面上に治具を配置するステップを含んでいてもよい。この治具は、ベース部材と、突出部とを有する。ベース部材は、ポリッシングパッドの面形状に対応した形状を有し、かつ、通気性を有する。突出部は、ベース部材の表面に対して突出して取り付けられ、研磨層の表面に形成すべき凹模様に対応した凸模様を有する。また、この場合、作業面上に配置された治具を取り除き、作業面上にポリッシングパッドを再配置した上で、凹部を除く研磨層の表面を研削して平坦な研磨面を形成する第3のステップをさらに設けてもよい。この場合、上記第2のステップおよび上記ステップ3は、同一の研削機を用いて行われることが好ましい。 Here, in the second step of the first invention, a suction force for sucking the polishing pad from the back surface through a plurality of suction holes provided in the work surface may be used as the external force. In this case, the first step may include a step of placing a jig on the work surface prior to placement of the polishing pad on the work surface. This jig has a base member and a protrusion. The base member has a shape corresponding to the surface shape of the polishing pad and has air permeability. The protrusion is attached to protrude from the surface of the base member, and has a convex pattern corresponding to the concave pattern to be formed on the surface of the polishing layer. Further, in this case, the jig disposed on the work surface is removed, the polishing pad is rearranged on the work surface, and the surface of the polishing layer excluding the recess is ground to form a flat polishing surface. These steps may be further provided. In this case, it is preferable that the second step and the step 3 are performed using the same grinding machine.
 第1の発明において、上記第2のステップにおける研磨層の除去は、研磨層の隆起した表面のみを研削することによって行われることが好ましい。この場合、上記第2のステップは、研磨層の隆起した表面を研削することによって生じた粉塵を吸引して除去するステップを含むことが望ましい。 In the first invention, the removal of the polishing layer in the second step is preferably performed by grinding only the raised surface of the polishing layer. In this case, it is desirable that the second step includes a step of sucking and removing dust generated by grinding the raised surface of the polishing layer.
 第2の発明は、研磨層を備えるポリッシングパッドを提供する。この研磨層は、表面の一部である平坦な研磨面と、表面に部分的に設けられ、表面より陥没した凹部と、表面とは反対側の平坦な裏面とを有する。研磨層の厚さは、研磨面から凹部に向かってなだらかに減少している。また、研磨層の厚さの変化率は、研磨面から凹部の側壁面に向かって徐々に増大し、かつ、凹部の側壁面から凹部の底面に向かって徐々に減少している。 The second invention provides a polishing pad provided with a polishing layer. The polishing layer has a flat polishing surface that is a part of the surface, a concave portion that is partially provided on the surface, and that is recessed from the surface, and a flat back surface that is opposite to the surface. The thickness of the polishing layer gradually decreases from the polishing surface toward the recess. Further, the rate of change of the thickness of the polishing layer gradually increases from the polishing surface toward the side wall surface of the recess, and gradually decreases from the side wall surface of the recess toward the bottom surface of the recess.
 ここで、第2の発明において、凹部における側壁面および底面の荒さは、研磨面の荒さと同一であってもよい。また、上記凹部は、表面上を筋状に延在する溝であることが好ましい。 Here, in the second invention, the roughness of the side wall surface and the bottom surface of the recess may be the same as the roughness of the polished surface. Moreover, it is preferable that the said recessed part is a groove | channel extended on the surface in the shape of a line.
 第1の発明によれば、凹部の内面を荒らす原因となるカッターを使用しないので、凹部の内面として、研磨面と同等またはそれに近いきめ細かな面を得ることができる。また、研磨層の表面に角張った凹凸が存在しないので、ポリッシングパッドを用いた研磨の際、被研磨物が引っかかり難い。特に、凸模様を有する治具を用いれば、治具の交換によって、ポリッシングパッドの凹模様を高い自由度で柔軟に形成することができる。 According to the first invention, since a cutter that causes roughening of the inner surface of the recess is not used, a fine surface equivalent to or close to the polished surface can be obtained as the inner surface of the recess. In addition, since there are no angular irregularities on the surface of the polishing layer, the object to be polished is hardly caught when polishing using a polishing pad. In particular, if a jig having a convex pattern is used, the concave pattern of the polishing pad can be flexibly formed with a high degree of freedom by exchanging the jig.
 第2の発明によれば、研磨層の厚さは、研磨面から凹部に向かってなだらかに減少しており、研磨層の表面に角張った凹凸が存在しないので、ポリッシングパッドを用いた研磨の際、被研磨物が引っかかり難い。また、研磨層の厚さに関するプロファイルが第1の発明に係る方法に固有であるがゆえに、プロファイルの観察を通じて、第1の発明に係る方法を用いて作成されたポリッシングパッドであるかどうかを有効に判断できる。 According to the second invention, the thickness of the polishing layer is gradually decreased from the polishing surface toward the concave portion, and there is no angular irregularity on the surface of the polishing layer. Therefore, when polishing with the polishing pad, The object to be polished is not easily caught. Further, since the profile relating to the thickness of the polishing layer is specific to the method according to the first invention, it is effective whether or not the polishing pad is created by using the method according to the first invention through observation of the profile. Can be judged.
ポリッシングパッドの加工装置の構成図Configuration diagram of polishing pad processing equipment 治具の配置工程の説明図Illustration of jig placement process 治具の構成図Jig configuration diagram ポリッシングパッドの配置工程の説明図Explanation of polishing pad placement process ポリッシングパッドの断面図Cross section of polishing pad ポリッシングパッドの配置状態を示す図The figure which shows the arrangement | positioning state of a polishing pad 研削工程の説明図Illustration of grinding process 一連の工程を経て完成したポリッシングパッドを示す図The figure which shows the polishing pad completed through a series of processes ポリッシングパッドの拡大断面写真Enlarged cross-sectional photo of polishing pad 溝幅方向に対する厚さのプロファイルを示す特性図Characteristic diagram showing the profile of thickness in the groove width direction 切削加工による厚さのプロファイルを示す特性図Characteristic diagram showing profile of thickness by cutting 従来技術における研磨パッドの断面図Cross-sectional view of a polishing pad in the prior art 吸引工程の代替技術の説明図Illustration of alternative technology for suction process
 図1は、ポリッシングパッド加工装置の構成図である。この加工装置1は、作業台2と、吸引機3と、研削機4とを主体に構成されている。作業台2が備える作業面2aには、円盤状のポリッシングパッド等を位置決めするための台枠5が固定されている。また、この作業面2aには、作業台2を上下に貫通する吸引孔2bが多数設けられている。吸引機3は、作業台2の下に配置されている。この吸引機3は、作業台2に設けられた多数の吸引孔2bと連通しており、台枠5内に保持されたポリッシングパッドをその裏面より吸引する。 FIG. 1 is a configuration diagram of a polishing pad processing apparatus. This processing apparatus 1 is mainly composed of a work table 2, a suction machine 3, and a grinding machine 4. A work frame 2 provided in the work table 2 is fixed with a frame 5 for positioning a disc-shaped polishing pad or the like. The work surface 2a is provided with a number of suction holes 2b that penetrate the work table 2 up and down. The suction machine 3 is disposed under the work table 2. The suction machine 3 communicates with a number of suction holes 2b provided in the work table 2, and sucks the polishing pad held in the table frame 5 from the back surface thereof.
 研削機4は、作業面2aに対向するように作業台2の上方に配置されており、図示しないアクチュエータによって、三次元方向に移動自在となっている。この研削機4は、回転式のローラ4aと、粉塵吸引機4bとを有する。ローラ4aの外周面にはダイヤモンドの粉末が固着されている。研削機4を移動させながら、ローラ4aを回転させることによって、ローラ4aの外周面と接触した被研削物(ポリッシングパッド)が平面状に研削(研削とは削ること)される。粉塵吸引機4bは、ローラ4aによる研削することによって生じた粉塵を吸引して除去する。粉塵吸引機4bによって吸引された粉塵は、研削機4に取り付けられたホース4cを介して、外部に排出される。 The grinding machine 4 is disposed above the work table 2 so as to face the work surface 2a, and is movable in a three-dimensional direction by an actuator (not shown). The grinding machine 4 includes a rotary roller 4a and a dust suction machine 4b. Diamond powder is fixed to the outer peripheral surface of the roller 4a. By rotating the roller 4 a while moving the grinding machine 4, the object to be ground (polishing pad) in contact with the outer peripheral surface of the roller 4 a is ground into a flat shape (to be ground). The dust suction machine 4b sucks and removes dust generated by grinding with the roller 4a. The dust sucked by the dust suction machine 4b is discharged to the outside through a hose 4c attached to the grinding machine 4.
 つぎに、ポリッシングパッド加工装置1を用いて、ポリッシングパッドの表面に凹部を形成する方法について説明する。凹部としては、筋状に延在する溝、あるいは、ポリッシングパッドの外周近傍に設けられた陥没部などが想定される。 Next, a method for forming a recess on the surface of the polishing pad using the polishing pad processing apparatus 1 will be described. As the concave portion, a groove extending in a streak shape or a depressed portion provided in the vicinity of the outer periphery of the polishing pad is assumed.
 図2に示すように、ポリッシングパッド7の加工に先立ち、作業面2a上に固定された台枠5内に円盤状の治具6が配置される。図3は、治具6の構成図である。この治具6は、ベース部材6aと、突出部6bとを有する。ベース部材6aは、ポリッシングパッドの面形状に対応した形状(円盤形状)を有する。このベース部材6aは、吸引孔2bを介したポリッシングパッドの吸引を阻害しないように、通気性を有する材質(例えば、ポリウレタン)によって形成されている。ただし、ベース部材6aとしては、材質自体が通気性を備えていなくても、例えば金属メッシュのごとく、構造上、通気を許容するものを用いてもよい。また、突出部6bは、ベース部材6aの表面より上方に向かって突出するように、ベース部材6aに取り付けられている。この突出部6bは、ポリッシングパッドが備える研磨層の表面上に形成すべき凹部の形状(凹模様)に対応した凸形状(凸模様)を有している。突出部6bは、一例としてアクリル材によって形成されている。アクリル材のようなレーザカットが容易な素材を用いることで、突出部6bの凸形状を、直線状、曲線状、これらの組み合わせを含めて、高い自由度で自在に形成することができる。本実施形態では、ポリッシングパッドの表面に亀甲状の凹模様を形成するために、突出部6bも亀甲状の凸模様を有している。 As shown in FIG. 2, prior to the processing of the polishing pad 7, a disk-shaped jig 6 is arranged in a frame 5 fixed on the work surface 2a. FIG. 3 is a configuration diagram of the jig 6. The jig 6 includes a base member 6a and a protruding portion 6b. The base member 6a has a shape (disk shape) corresponding to the surface shape of the polishing pad. The base member 6a is formed of a material having air permeability (for example, polyurethane) so as not to hinder the suction of the polishing pad through the suction hole 2b. However, as the base member 6a, even if the material itself does not have air permeability, a material that allows ventilation, such as a metal mesh, may be used. Further, the protruding portion 6b is attached to the base member 6a so as to protrude upward from the surface of the base member 6a. The protrusion 6b has a convex shape (convex pattern) corresponding to the shape of the concave portion (concave pattern) to be formed on the surface of the polishing layer provided in the polishing pad. The protrusion 6b is formed of an acrylic material as an example. By using a material that can be easily cut by laser, such as an acrylic material, the protruding shape of the protruding portion 6b can be freely formed with a high degree of freedom including straight lines, curved lines, and combinations thereof. In this embodiment, in order to form a turtle shell-shaped concave pattern on the surface of the polishing pad, the protruding portion 6b also has a turtle shell-shaped convex pattern.
 図4に示すように、治具6が配置された作業面2a上(台枠5内)に、円盤状のポリッシングパッド7が配置される。図5は、ポリッシングパッド7の断面図である。このポリッシングパッド7は、最上層から順に、研磨層7aと、粘着層7bと、剥離シート7cとを主体に構成されており、本実施形態では、円盤状にカット(成形)されている。また、ポリッシングパッド7は、自己が撓む性質、すなわち可撓性を有している。研磨層7aは、ポリッシングパッド7の中心的な機能である被研磨物を研磨する機能を担う層であり、例えば、ポリウレタン(発泡ウレタン)によって形成されている。粘着層7bとしては、例えば、両面テープを用いることができる。ユーザが研磨装置にポリッシングパッド7を取り付ける場合、最下層の剥離シート7cを剥離して粘着層7bを露出された上で、ポリッシングパッド7を研磨装置の所定の部位に貼着する。 As shown in FIG. 4, a disc-shaped polishing pad 7 is disposed on the work surface 2a (within the frame 5) on which the jig 6 is disposed. FIG. 5 is a cross-sectional view of the polishing pad 7. The polishing pad 7 is mainly composed of a polishing layer 7a, an adhesive layer 7b, and a release sheet 7c in order from the top layer, and is cut (formed) into a disk shape in this embodiment. Further, the polishing pad 7 has a property of bending itself, that is, flexibility. The polishing layer 7a is a layer having a function of polishing an object to be polished, which is a central function of the polishing pad 7, and is made of, for example, polyurethane (foamed urethane). For example, a double-sided tape can be used as the adhesive layer 7b. When the user attaches the polishing pad 7 to the polishing apparatus, the lowermost release sheet 7c is peeled to expose the adhesive layer 7b, and then the polishing pad 7 is attached to a predetermined part of the polishing apparatus.
 図6は、作業面2a上に、治具6を介してポリッシングパッド7が配置された状態を示す図である。吸引機3の停止時において、ポリッシングパッド7は、突出部6bの高さ分だけ浮き上がった状態になり、ポリッシングパッド7とベース部材6aとの間には空間が存在することになる。この空間の存在によって、次の工程でポリッシングパッド7に外力を加えた際、作業面2aより浮き上がっているポリッシングパッド7の部分的な撓みが許容される。 FIG. 6 is a view showing a state in which the polishing pad 7 is disposed on the work surface 2a via the jig 6. As shown in FIG. When the suction machine 3 is stopped, the polishing pad 7 is lifted by the height of the protrusion 6b, and there is a space between the polishing pad 7 and the base member 6a. Due to the presence of this space, when an external force is applied to the polishing pad 7 in the next step, partial deflection of the polishing pad 7 that is lifted from the work surface 2a is allowed.
 つぎに、ポリッシングパッド7に外力(吸引力)を加えてポリッシングパッド7を撓ませながら、研磨層7aの表面が厚さ方向に部分的に研削・除去される。図7は、ポリッシングパッド7の研削工程の説明図である。この工程では、吸引機3を動作させて、作業面2aに臨んだ複数の吸引孔2bを介して、ポリッシングパッド7を裏面より吸引する。この吸引力が外力としてポリッシングパッド7に作用した結果、ポリッシングパッド7の表面のうち、隣り合った突出部6bによって浮き上がった状態にある部位が撓んで、下方に配置されたベース部材6aの上面と接触する。すなわち、ポリッシングパッド7(研磨層7a)の表面は、浮き上がっていた部位だけが陥没し、その結果、突出部6bによって支持されている部位が相対的に隆起することになる。 Next, while the polishing pad 7 is bent by applying an external force (suction force) to the polishing pad 7, the surface of the polishing layer 7a is partially ground and removed in the thickness direction. FIG. 7 is an explanatory diagram of a grinding process of the polishing pad 7. In this step, the suction machine 3 is operated to suck the polishing pad 7 from the back surface through the plurality of suction holes 2b facing the work surface 2a. As a result of this suction force acting on the polishing pad 7 as an external force, a portion of the surface of the polishing pad 7 that is in a state of being lifted by the adjacent protrusions 6b is bent, and the upper surface of the base member 6a disposed below and Contact. That is, the surface of the polishing pad 7 (polishing layer 7a) is depressed only at the part that has been lifted, and as a result, the part supported by the protruding portion 6b is relatively raised.
 そして、ポリッシングパッド7が撓んだ状態を維持しながら、所定の高さに設定された研削機4を作業面2aと平行に移動させ、ローラ4aによって、ポリッシングパッド7の最上層である研磨層7aの表面を部分的、すなわち、隆起した部位のみを所定の厚さα分だけ研削する(研削工程)。ここで、研削機4による研削加工に支障がないようにするための条件として、以下の2つが要求される。第1に、高さの基準を作業面2aとすると、台枠5の高さH1は、治具の高さH2とポリッシングパッド7の厚さD(研削前)との合計よりも低いことである。第2に、ポリッシングパッド7の研削後の高さH3(=H2+D-α)は、台枠5の高さH1よりも高いことである。研削加工後に、吸引機3を停止させると、自己の復元力によって、ポリッシングパッド7の撓み変形が解消される。これによって、ポリッシングパッド7(研磨面7a)の表面とは反対側の裏面は平坦な状態に復元し、その表面には、上記研削に応じた凹部が生じることになる。 Then, while maintaining the state where the polishing pad 7 is bent, the grinding machine 4 set to a predetermined height is moved in parallel with the work surface 2a, and the polishing layer which is the uppermost layer of the polishing pad 7 is formed by the roller 4a. The surface of 7a is partially ground, that is, only the raised portion is ground by a predetermined thickness α (grinding step). Here, the following two conditions are required as conditions for preventing the grinding process by the grinding machine 4 from being hindered. First, if the height reference is the work surface 2a, the height H1 of the underframe 5 is lower than the sum of the jig height H2 and the thickness D of the polishing pad 7 (before grinding). is there. Second, the height H3 (= H2 + D−α) after grinding of the polishing pad 7 is higher than the height H1 of the underframe 5. When the suction machine 3 is stopped after grinding, the bending deformation of the polishing pad 7 is eliminated by its own restoring force. Thereby, the back surface opposite to the surface of the polishing pad 7 (polishing surface 7a) is restored to a flat state, and a concave portion corresponding to the grinding is generated on the surface.
 この研削工程において、研磨層7aの隆起した表面を研削することによって生じた粉塵は、研削機4aが備える粉塵吸引機4bを動作させることによって、吸引・除去される。なお、本工程において、研磨層7aの部分的な除去は、研削加工に代えて、研削層7aの表面を薄くスライスするスライス加工を用いて行ってもよい。 In this grinding process, dust generated by grinding the raised surface of the polishing layer 7a is sucked and removed by operating the dust suction device 4b included in the grinding machine 4a. In this step, the partial removal of the polishing layer 7a may be performed by using a slicing process that thinly slices the surface of the grinding layer 7a instead of the grinding process.
 最後に、ポリッシングパッド7の仕上げ工程が行われる。仕上げ工程では、作業面2a上に配置された治具6が取り除かれ、作業面2a上にポリッシングパッド7が再配置される。その上で、研削工程と同じ研削機4を用いて、凹部7dを除く研磨層7aの表面が薄く研削され、これによって、研磨層7aの表面の一部として平坦な研磨面が形成される。なお、仕上げ工程においても、吸引機3を動作させて、作業面2aの臨んでいる複数の吸引孔2bを介して、ポリッシングパッド7を裏面より吸引することが好ましい。これにより、先の工程でポリッシングパッド7を撓み変形させることによって生じたクセを取り除く効果が期待できるからである。 Finally, the finishing process of the polishing pad 7 is performed. In the finishing process, the jig 6 arranged on the work surface 2a is removed, and the polishing pad 7 is rearranged on the work surface 2a. Then, the surface of the polishing layer 7a excluding the concave portion 7d is thinly ground by using the same grinding machine 4 as in the grinding step, thereby forming a flat polishing surface as a part of the surface of the polishing layer 7a. In the finishing process, it is preferable to operate the suction machine 3 to suck the polishing pad 7 from the back surface through the plurality of suction holes 2b facing the work surface 2a. This is because an effect of removing the peculiarity caused by bending and deforming the polishing pad 7 in the previous step can be expected.
 図8は、一連の工程を経て完成したポリッシングパッド7を示す図である。このポリッシングパッド7において、最上層の研磨面7aは、その表面の一部である平坦な研磨面7dと、表面に部分的に設けられ、表面(研磨面7d)より陥没した凹部7eとを有する。凹部7eの形状(凹模様)として、治具6の凸模様に対応したものが転写される。また、上述したように、研磨層7aの表面には凹凸が存在するが、その裏面は平坦になっている。 FIG. 8 is a view showing the polishing pad 7 completed through a series of steps. In the polishing pad 7, the uppermost polishing surface 7 a has a flat polishing surface 7 d that is a part of the surface, and a recess 7 e that is partially provided on the surface and is recessed from the surface (polishing surface 7 d). . A shape corresponding to the convex pattern of the jig 6 is transferred as the shape (concave pattern) of the concave portion 7e. Further, as described above, the surface of the polishing layer 7a has irregularities, but the back surface thereof is flat.
 図9は、ポリッシングパッド7の拡大断面写真である。ここで、Aは研磨層7aの最大厚さ(1.402mm)、Bは凹部(溝)の幅(3.786mm)、Cは凹部7eの深さ(0.246mm)である。この写真から理解できるように、研磨面7dから凹部7eに向かって表面がなだらかに変化しており、角張った部分が存在しない。これにより、研磨の際に被研磨物が引っ掛かってしまうことなどを有効に防止できる。また、凹部7eの内面には、カッターによる切削加工を施した場合のような荒れが存在せず、研磨面7dの荒さと同等またはそれに近いきめ細かな状態になっている。特に、同一の研削機4を用いて研削加工と仕上げ加工とを行った場合には、凹部の内面(側壁面および底面)の荒さは、研磨面の荒さと同一となる。 FIG. 9 is an enlarged cross-sectional photograph of the polishing pad 7. Here, A is the maximum thickness (1.402 mm) of the polishing layer 7a, B is the width of the recess (groove) (3.786 mm), and C is the depth of the recess 7e (0.246 mm). As can be understood from this photograph, the surface changes gently from the polishing surface 7d toward the recess 7e, and there is no angular portion. As a result, it is possible to effectively prevent the object to be polished from being caught during polishing. Further, the inner surface of the recess 7e does not have the roughness as in the case of cutting with a cutter, and is in a fine state equivalent to or close to the roughness of the polishing surface 7d. In particular, when grinding and finishing are performed using the same grinding machine 4, the roughness of the inner surface (side wall surface and bottom surface) of the recess is the same as the roughness of the polished surface.
 図10は、溝幅方向長Xに対する研磨層7aの厚さDのプロファイルを示す特性図である。研磨層7aの厚さDは、研磨面7dから凹部7eに向かってなだらかに減少している。また、その変化率ΔD、すなわち、厚さDの傾きは、研磨面7dから凹部7eの側壁面に向かって徐々に増大していると共に、凹部7dの側壁面からその底面に向かって徐々に減少している。 FIG. 10 is a characteristic diagram showing a profile of the thickness D of the polishing layer 7a with respect to the length X in the groove width direction. The thickness D of the polishing layer 7a is gradually decreased from the polishing surface 7d toward the recess 7e. Further, the change rate ΔD, that is, the inclination of the thickness D gradually increases from the polishing surface 7d toward the side wall surface of the recess 7e, and gradually decreases from the side wall surface of the recess 7d toward the bottom surface thereof. is doing.
 このように、本実施形態によれば、ポリッシングパッド7の凹部7eの内面を荒らす原因となるカッターを使用しないので、凹部7eの内面として、研磨面7eと同等またはそれに近いきめ細かな面を得ることができる。また、研磨層7aの表面に角張った凹凸が存在しないので、ユーザによるポリッシングパッド7を用いて研磨の際、被研磨物が引っかかり難い。 As described above, according to the present embodiment, a cutter that causes roughening of the inner surface of the recess 7e of the polishing pad 7 is not used, so that a fine surface equivalent to or close to the polishing surface 7e can be obtained as the inner surface of the recess 7e. Can do. Further, since there are no angular irregularities on the surface of the polishing layer 7a, the object to be polished is not easily caught when polishing by the polishing pad 7 by the user.
 また、本実施形態によれば、ポリッシングパッド7に凹模様を転写するための治具6を、異なる凸模様のものに交換することによって、ポリッシングパッド7の凹模様を高い自由度で柔軟に形成することができる。ただし、多様な凹模様への対応性が要求されないのであれば、交換可能な治具6を用いることなく、作業面2a上に凸模様を直接形成してもよい。 According to the present embodiment, the concave pattern of the polishing pad 7 can be flexibly formed with a high degree of freedom by replacing the jig 6 for transferring the concave pattern to the polishing pad 7 with a different convex pattern. can do. However, if compatibility with various concave patterns is not required, the convex pattern may be directly formed on the work surface 2a without using the replaceable jig 6.
 また、本実施形態によれば、研磨層7aの厚さDに関するプロファイルは、本実施形態に係る加工方法に固有であるため、あるポリッシングパッドにおける研磨層のプロファイルの観察を通じて、本実施形態に係る加工方法を用いて作成されたポリッシングパッドであるかどうかを有効に判断できる。カッター等による切削加工の場合、図11に示すように、基本的に、研磨面と凹部の側壁面との境界部A、および、凹部の側壁面とその底面との境界部Bにおいて、研磨層の厚さDが急激に変化する。また、凹部の側壁面も垂直となり、図10に示したような傾斜にはならない。境界部Bは、カッターの刃先の形状次第でなだらかになることあっても、境界部Aがなだらかになることはない。この点は、カッターに限らず、レーザ加工やサンドブラスト法などの線状切削を基本とする全ての手法において同様である。また、従来技術として挙示した特許文献6には、図12に示すように、研磨層に相当するスキン層領域の表面がなだらかに繋がっている研磨パッドが開示されており、表面の形状として角張った凹凸が存在しないという点では、本実施形態に係るポリッシングパッド7と類似している。しかしながら、研磨層の厚さの変化に着目すると、特許文献6のスキン層領域は厚さが一定であり、図10のようなプロファイルを有していない。以上のことから、図10のプロファイルは、研磨層を撓み変形させながら面状研削を行う加工方法に固有のものといえる。 In addition, according to the present embodiment, the profile relating to the thickness D of the polishing layer 7a is unique to the processing method according to the present embodiment. It is possible to effectively determine whether the polishing pad is created using the processing method. In the case of cutting with a cutter or the like, as shown in FIG. 11, basically, at the boundary portion A between the polishing surface and the sidewall surface of the recess, and at the boundary portion B between the sidewall surface of the recess and the bottom surface thereof, the polishing layer The thickness D changes rapidly. Further, the side wall surface of the recess is also vertical and does not have the inclination as shown in FIG. Even if the boundary portion B becomes gentle depending on the shape of the cutting edge of the cutter, the boundary portion A does not become gentle. This point is not limited to the cutter, and is the same in all methods based on linear cutting such as laser processing and sandblasting. In addition, Patent Document 6 listed as the prior art discloses a polishing pad in which the surface of the skin layer region corresponding to the polishing layer is gently connected as shown in FIG. It is similar to the polishing pad 7 according to this embodiment in that there is no unevenness. However, paying attention to the change in the thickness of the polishing layer, the skin layer region of Patent Document 6 has a constant thickness and does not have a profile as shown in FIG. From the above, it can be said that the profile of FIG. 10 is unique to a processing method in which surface grinding is performed while the polishing layer is bent and deformed.
 なお、上述した実施形態では、研削工程において、ポリッシングパッド7を撓ませるための外力として、吸引孔2bを介して付与される吸引力を用いる例について説明した。しかしながら、本発明はこれに限定されるものではなく、例えば、図13に示すように、磁石8の磁力を用いてもよい。この場合、ベース部材6aとして金属メッシュ等を用い、隣り合った突出部6の間に磁石8を配置する。磁石8とベース部材6aとの間に生じる磁力によってポリッシングパッド7を撓み、これによって、治具6の凸形状に応じた隆起がポリッシングパッド7の表面に生じる。また、磁石8の代わりに、おもりを用い、その自重を外力としてポリッシングパッド7を撓ませてもよい。さらに、ポリッシングパッド7の両端を引っ張りながら作業面2aに押し当てることによって、ポリッシングパッド7を撓ませてもよい。 In the above-described embodiment, the example in which the suction force applied through the suction hole 2b is used as the external force for bending the polishing pad 7 in the grinding process has been described. However, the present invention is not limited to this. For example, as shown in FIG. 13, the magnetic force of the magnet 8 may be used. In this case, a metal mesh or the like is used as the base member 6a, and the magnet 8 is disposed between the adjacent protruding portions 6. The polishing pad 7 is bent by the magnetic force generated between the magnet 8 and the base member 6 a, and as a result, a bump corresponding to the convex shape of the jig 6 is generated on the surface of the polishing pad 7. Further, instead of the magnet 8, a weight may be used and the polishing pad 7 may be bent with its own weight as an external force. Further, the polishing pad 7 may be bent by pressing both ends of the polishing pad 7 against the work surface 2a.
 また、上述した実施形態では、研磨層7aと、粘着層7bと、剥離シート7cとが積層され、かつ、円盤状にカット(成形)されたものを加工対象としているが、この加工対象は、積層前の研磨層7a単体であってもよいし、カット前のシート体であってもよい。かかる観点より、本明細書における「ポリッシングパッド7」という用語は、そのようなものを広く含む意味で用いるものとする。 Further, in the above-described embodiment, the polishing layer 7a, the adhesive layer 7b, and the release sheet 7c are laminated and cut (formed) into a disk shape. The polishing layer 7a before lamination may be a single body or a sheet body before cutting. From this point of view, the term “polishing pad 7” in the present specification is used in a sense including such a thing widely.
 さらに、上述した実施形態では、作業面2a上に配置されたポリッシングパッド7に対して、研削機4(ローラ4a)を移動させることによって、研磨層7aを研削する例について説明した。しかしながら、本発明は、これに限定されるものではなく、研削機4に対してポリッシングパッド7を移動させてもよい。また、作業台2の上面は、曲面状であってもよい。この場合、作業台2の曲面のうち、研磨層7aと研削機4とが接する部分を「作業面2a」と捉して捉えることができる。 Furthermore, in the above-described embodiment, the example in which the polishing layer 7a is ground by moving the grinding machine 4 (roller 4a) with respect to the polishing pad 7 disposed on the work surface 2a has been described. However, the present invention is not limited to this, and the polishing pad 7 may be moved with respect to the grinding machine 4. Further, the upper surface of the work table 2 may be curved. In this case, the portion of the curved surface of the work table 2 where the polishing layer 7a and the grinding machine 4 are in contact with each other can be regarded as the “work surface 2a”.
 本発明によって製造されたポリッシングパッドは、インゴットより切り出された半導体ウェハや、半導体集積回路に代表される精密機器の製造過程で生成される中間品を含む被研磨物を研磨する用途に広く適用することができる。 The polishing pad manufactured according to the present invention is widely applied to the use of polishing an object to be polished including a semiconductor wafer cut out from an ingot and an intermediate product generated in the manufacturing process of precision equipment represented by a semiconductor integrated circuit. be able to.
 1 ポリッシングパッド加工装置
 2 作業台
 2a 作業面
 2b 吸引孔
 3 吸引機
 4 研削機
 4a ローラ
 4b 粉塵吸引機
 4c ホース
 5 台枠
 6 治具
 6a ベース部材
 6b 突出部
 7 ポリッシングパッド
 7a 研磨層
 7b 粘着層
 7c 剥離シート
 7d 研磨面
 7e 凹部

 
DESCRIPTION OF SYMBOLS 1 Polishing pad processing apparatus 2 Worktable 2a Work surface 2b Suction hole 3 Suction machine 4 Grinding machine 4a Roller 4b Dust suction machine 4c Hose 5 Base frame 6 Jig 6a Base member 6b Protruding part 7 Polishing pad 7a Polishing layer 7b Adhesive layer 7c Release sheet 7d Polishing surface 7e Concave part

Claims (10)

  1.  ポリッシングパッドの凹部形成方法において、
     ポリッシングパッドが備える研磨層の表面に形成すべき凹模様に対応した凸模様が設けられた作業面上に、前記ポリッシングパッドを配置する第1のステップと、
     前記ポリッシングパッドに外力を加えて前記ポリッシングパッドを撓ませながら、前記作業面上の凸模様に応じて隆起した前記研磨層の表面を厚さ方向に部分的に除去することによって、前記研磨層の表面に前記凹部を形成する第2のステップと
    を有することを特徴とするポリッシングパッドの凹部形成方法。
    In the method of forming the recess of the polishing pad,
    A first step of disposing the polishing pad on a work surface provided with a convex pattern corresponding to the concave pattern to be formed on the surface of the polishing layer provided in the polishing pad;
    The surface of the polishing layer raised according to the convex pattern on the work surface is partially removed in the thickness direction while applying an external force to the polishing pad to bend the polishing pad. And a second step of forming the concave portion on the surface thereof.
  2.  前記第2のステップにおいて、前記外力として、前記作業面に設けられた複数の吸引孔を介して、前記ポリッシングパッドを裏面より吸引する吸引力を用いることを特徴とする請求項1に記載されたポリッシングパッドの凹部形成方法。 The said 2nd step WHEREIN: As the said external force, the suction force which attracts | sucks the said polishing pad from the back surface through the several suction hole provided in the said work surface is used. A method for forming a recess in a polishing pad.
  3.  前記第1のステップは、前記作業面上への前記ポリッシングパッドの配置に先立ち、前記作業面上に治具を配置するステップを含み、
     前記治具は、
     前記ポリッシングパッドの面形状に対応した形状を有し、かつ、通気性を有するベース部材と、
     前記ベース部材の表面に対して突出して取り付けられ、前記研磨層の表面に形成すべき凹模様に対応した凸模様を有する突出部と
    を有することを特徴とする請求項2に記載されたポリッシングパッドの凹部形成方法。
    The first step includes a step of placing a jig on the work surface prior to placement of the polishing pad on the work surface;
    The jig is
    A base member having a shape corresponding to the surface shape of the polishing pad and having air permeability;
    The polishing pad according to claim 2, further comprising: a protruding portion attached to protrude from the surface of the base member and having a convex pattern corresponding to the concave pattern to be formed on the surface of the polishing layer. The method of forming a recess.
  4.  前記作業面上に配置された前記治具を取り除き、前記作業面上に前記ポリッシングパッドを再配置した上で、前記凹部を除く前記研磨層の表面を研削して平坦な研磨面を形成する第3のステップをさらに有することを特徴とする請求項3に記載されたポリッシングパッドの凹部形成方法。 The jig disposed on the work surface is removed, the polishing pad is rearranged on the work surface, and the surface of the polishing layer excluding the recess is ground to form a flat polishing surface. The method for forming a recess of a polishing pad according to claim 3, further comprising: 3 steps.
  5.  前記第2のステップおよび前記ステップ3は、同一の研削機を用いて行われることを特徴とする請求項4に記載されたポリッシングパッドの凹部形成方法。 5. The method for forming a recess of a polishing pad according to claim 4, wherein the second step and the step 3 are performed using the same grinding machine.
  6.  前記第2のステップにおける前記研磨層の除去は、前記研磨層の隆起した表面のみを研削することによって行われることを特徴とする請求項1に記載されたポリッシングパッドの凹部形成方法。 2. The polishing pad recess forming method according to claim 1, wherein the removal of the polishing layer in the second step is performed by grinding only the raised surface of the polishing layer.
  7.  前記第2のステップは、前記研磨層の隆起した表面を研削することによって生じた粉塵を吸引して除去するステップを含むことを特徴とする請求項6に記載されたポリッシングパッドの凹部形成方法。 The method for forming a recess of a polishing pad according to claim 6, wherein the second step includes a step of sucking and removing dust generated by grinding the raised surface of the polishing layer.
  8.  ポリッシングパッドにおいて、
     表面の一部である平坦な研磨面と、
     前記表面に部分的に設けられ、前記表面より陥没した凹部と、
     前記表面とは反対側の平坦な裏面と
    を有する研磨層を備え、
     前記研磨層の厚さは、前記研磨面から前記凹部に向かってなだらかに減少し、
     前記研磨層の厚さの変化率は、前記研磨面から前記凹部の側壁面に向かって徐々に増大し、かつ、前記凹部の側壁面から前記凹部の底面に向かって徐々に減少していることを特徴とするポリッシングパッド。
    In polishing pad,
    A flat polished surface that is part of the surface;
    A concave portion partially provided on the surface and recessed from the surface;
    A polishing layer having a flat back surface opposite to the front surface;
    The thickness of the polishing layer gradually decreases from the polishing surface toward the recess,
    The rate of change of the thickness of the polishing layer gradually increases from the polishing surface toward the sidewall surface of the recess, and gradually decreases from the sidewall surface of the recess toward the bottom surface of the recess. Polishing pad characterized by
  9.  前記凹部における前記側壁面および前記底面の荒さは、前記研磨面の荒さと同一であることを特徴とする請求項8に記載されたポリッシングパッド。 The polishing pad according to claim 8, wherein the roughness of the side wall surface and the bottom surface of the recess is the same as the roughness of the polishing surface.
  10.  前記凹部は、前記表面上を筋状に延在する溝であることを特徴とする請求項8に記載されたポリッシングパッド。

     
    The polishing pad according to claim 8, wherein the recess is a groove extending in a streak pattern on the surface.

PCT/JP2017/004259 2017-02-06 2017-02-06 Polishing pad recess forming method and polishing pad WO2018142623A1 (en)

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