WO2018120034A1

WO2018120034A1 - Connector assembly with separate test probe opening

Info

Publication number: WO2018120034A1
Application number: PCT/CN2016/113536
Authority: WO
Inventors: 陆天赋; 赵洪昌; 高国林
Original assignee: 德尔福派克电气系统有限公司
Priority date: 2016-12-30
Filing date: 2016-12-30
Publication date: 2018-07-05

Abstract

A connector assembly (10) includes a terminal (12) and a housing (20). The terminal (12) defines a contact area (14) configured to receive and electrically contact a pin (16) of a mating connector (18) when the connector assembly (10) is connected to the mating connector (18). The housing (20) supports the terminal (12). The housing (20) has a first opening (22) and a second opening (24), the first opening (22) being configured to guide the pin (16) into the contact area (14) of the terminal (12) when the connector assembly (10) is connected to the mating connector (18), and the second opening (24) being configured to guide a test probe (26) toward a test point (28) of the terminal (12), wherein the test point (28) is spaced apart from the contact area (14).

Description

Connector assembly with separate test probe openings

Technical field

The present disclosure generally relates to a connector assembly, and more particularly to a housing of a connector assembly having a second opening configured to direct a test probe toward a test point of a terminal within the housing, wherein the second The pins of the opening and mating connector are typically spaced apart from the first opening of the housing in contact with the contact area of the terminal.

Background technique

It has been observed that automated testing of the electrical device performed by performing a conventional connection to a connector assembly of an electrical device sometimes deforms the terminals within the connector assembly or otherwise damages the terminals within the connector assembly. That is, damage has been observed when the automated test makes electrical connections to the connector assembly using a mating connector similar to that used in the intended end application of the electrical device. What is needed is a method of electrical contact with the terminals that seeks to avoid the risk of damaging the terminals.

Summary of the invention

According to one embodiment, a connector assembly is provided. The connector assembly includes a terminal and a housing. The terminal defines a contact area configured to receive and make electrical contact with a pin of the mating connector when the connector assembly is coupled to the mating connector. The housing supports the terminal. The housing has a first opening and a second opening configured to direct the pin into the contact area of the terminal when the connector assembly is coupled to the mating connector The second opening is configured to direct a test probe toward a test point of the terminal, wherein the test point is spaced apart from the contact area.

Further features and advantages will be more apparent from the following detailed description of the preferred embodiments.

DRAWINGS

The invention will now be described by way of example with reference to the accompanying drawings in which:

1 is an end view of a connector assembly in accordance with one embodiment;

2 is an end view of a portion of the connector assembly of FIG. 1 in accordance with an embodiment;

3 is a cross-sectional side view of the portion of the connector assembly of FIG. 2, in accordance with one embodiment.

detailed description

FIG. 1 illustrates a non-limiting embodiment of a connector assembly 10. As explained in more detail below, the connector assembly 10 described herein overcomes the problems described above because the connector assembly 10 provides electrical electrical equipment (not shown) that is attached to the connector assembly 10. A separate, distinct secondary location of contact, wherein the secondary location is spaced apart or spaced apart from where the mating connector of the end application will make electrical contact. While the number of connectors is numerous in this example, it should be recognized that the teachings presented herein are applicable when the connector assembly 10 has more or only fewer connectors or even one connector.

2 and 3 further illustrate non-limiting details regarding the connector assembly 10 that includes a terminal 12 that defines a contact area 14 that is configured to be coupled when the connector assembly 10 is connected When the mating connector 18 is mated, the pins 16 of the mating connector 18 are mated and in electrical contact therewith. As will be appreciated by those skilled in the art, the materials and processes used to form terminal 12 are well known. The terminal 12 may be characterized as a female terminal, which is typically cut by bending and bending the sheet metal into a desired configuration such that spring tension is applied to the pin 16 through the terminal 12 when the pin 16 is inserted into the contact region 14 or after the pin 16 is inserted into the contact region 14. To maintain reliable electrical contact in the contact area 14.

The connector assembly 10 also includes a housing 20 that supports the terminal 12. The housing 20 has a first opening 22 that may include a chamfer or slope that is configured to guide the pin 16 toward or into the contact area 14 of the terminal 12 when the connector assembly 10 is coupled to the mating connector 18. As will be appreciated by those skilled in the art, the terminal 12 and/or the housing 20 can include retention features (not shown) that hold the terminal 12 in position relative to the housing 20 when the pin 16 is inserted. in.

In order to overcome the above mentioned problems of structural features that may damage the contact area 14 of the terminal 12, the housing 20 includes a second opening 24 that is configured to direct the test probe 26 toward the test point 28 of the terminal 12. It should be understood that contact with the terminal 12 at the test point 28 by the test probe 26 is typically completed during testing as part of the manufacturing process. In contrast, contact with the terminal 12 at the contact area 14 by the pin 16 is mounted on an electrical device (not shown) attached to the connector assembly 10, such as a vehicle applied to the terminal of the electrical device (not Shown in the middle of the time. which is, The pin 16 and the test probe 26 are not intended to be in contact with the terminal 12 at the same time, but this is not prevented by the configuration of the housing 20. Due to the addition of the second opening 24, electrical devices (not shown) connected to the connector assembly 10 can be electrically tested by electrically contacting the test point 28 without making physical contact with the contact area 14 of the terminal 12. In this way, the risk of damage or deformation of the contact area 14 of the terminal 12 is minimized or eliminated because the test point 28 is spaced apart or physically isolated from the contact area 14.

It will be appreciated that some examples of terminals may have a configuration or design that inherently has features that can enter through the second opening 24 and thereby at the test point 28. However, it should also be appreciated that some terminal configurations may not have such characteristics, and thus the terminals 12 described herein may include features that are intentionally provided, such as a ring 30 that defines or provides the test point 28 of the terminal 12 or any other. Appropriate features. By way of further example, test point 28 may be provided by a fold, tab, bend, or other suitably formed arrangement of materials used to form terminal 12.

Accordingly, a connector assembly 10 is provided that includes an electrical device that can be electrically tested to the connector assembly 10 without the use of a mating connector 18 for use with the end application of the electrical device. The risk of damage due to deformation of the features of the connector assembly 10 that is in contact.

While the invention has been described in terms of its preferred embodiments, it is not intended to

Claims

A connector assembly (10) comprising:

a terminal (12) defining a contact area (14) configured to receive a fit when the connector assembly (10) is coupled to the mating connector (18) a pin (16) of the connector (18) and in electrical contact with it for electrical contact;

a housing (20) supporting the terminal (12), wherein the housing (20) has a first opening (22) and a second opening (24), the first opening ( 22) configured to direct the pin (16) into the contact area (14) of the terminal (12) when the connector assembly (10) is coupled to the mating connector (18), The second opening (24) is configured to direct the test probe (26) toward the test point (28) of the terminal (12), wherein the test point (28) is spaced apart from the contact area (14).
The connector assembly (10) of claim 1 wherein said terminal (12) includes a ring member (30), said ring member (30) defining a location of said terminal (12) Test points (28).