WO2018018467A1 - 一种电器短路试验测量系统的校准方法 - Google Patents

一种电器短路试验测量系统的校准方法 Download PDF

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WO2018018467A1
WO2018018467A1 PCT/CN2016/091929 CN2016091929W WO2018018467A1 WO 2018018467 A1 WO2018018467 A1 WO 2018018467A1 CN 2016091929 W CN2016091929 W CN 2016091929W WO 2018018467 A1 WO2018018467 A1 WO 2018018467A1
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waveform signal
analog
measurement
short
circuit test
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PCT/CN2016/091929
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English (en)
French (fr)
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周小猛
林志力
张达芬
李淑仪
李赛赛
郭向荣
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东莞市广安电气检测中心有限公司
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Priority to PCT/CN2016/091929 priority Critical patent/WO2018018467A1/zh
Priority to GB1710299.7A priority patent/GB2555888B/en
Publication of WO2018018467A1 publication Critical patent/WO2018018467A1/zh

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
    • G01R35/005—Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references

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  • the invention belongs to the field of short-circuit test measurement and calibration, and particularly relates to a calibration method for an electrical short-circuit test measurement system.
  • the short-circuit test of electrical appliances refers to verifying the ability of various high- and low-voltage electrical equipment such as circuit breakers, switchgears, fuses and transformers to close, break or carry the short-circuit current under the test conditions specified in the relevant standards. It is a general term for a series of tests such as short circuit closing and breaking test, ultimate short circuit breaking capacity test, short circuit withstand capability test and peak withstand current test.
  • the electrical equipment itself will flow through the short-circuit current of up to hundreds of thousands of amps and withstand high electric power, heat and over-voltage. Therefore, the short-circuit test is a more severe test for assessing electrical equipment and is an important means of judging whether the equipment meets the requirements of the standard.
  • These systems typically use different transmitters to convert low-level analog signals (such as short-circuit current shunts or Rogowski coils) when collecting waveforms of different natures such as short-circuit current, recovery voltage, or stroke curve.
  • the integrator acts as a transmitter, the voltage is restored with a voltage transformer or a resistor-capacitor voltage divider as a transmitter, the stroke curve is an incremental encoder or a displacement sensor as a transmitter), and the general measurement front end such as Hall
  • the sensor or photoelectric converter is isolated and sent to the measuring host.
  • the host performs filtering, sampling, and arithmetic processing on these signals to obtain a digitized actual waveform.
  • the measurement system calculates the key test parameters such as the effective value, the transient recovery voltage value, the arcing time and the DC component percentage from the waveform according to the software and algorithm developed by the user or the user. Accordingly, the tester judges whether the test is valid and whether the device under test passes the test.
  • the key test parameters such as the effective value, the transient recovery voltage value, the arcing time and the DC component percentage from the waveform according to the software and algorithm developed by the user or the user. Accordingly, the tester judges whether the test is valid and whether the device under test passes the test.
  • the measurement accuracy and calculation accuracy of the short-circuit test measurement system consisting of the above-mentioned transmitter, measurement front end, measurement host, measurement software and algorithm affect the consistency and fairness of the test result judgment to a considerable extent.
  • the calibration of the measurement system is therefore of particular importance to the laboratory. According to the International Electrotechnical Commission (IEC) and the Short-Circuit Testing Liaison (STL) standards and technical guidelines, the current calibration methods for short-circuit test and measurement systems in the world are as follows: Two kinds:
  • the first is the overall calibration method.
  • a calibrated standard short-circuit test measurement system is installed in the test circuit of the laboratory together with the measurement system to be calibrated.
  • An approved calibration laboratory uses a standard measurement system in the user's laboratory for measurements that require calibration. The system performs a comparison test.
  • the measurement and algorithm calculation values of the standard measurement system are used as the agreed true values, and the measured values of the measurement system to be calibrated are compared with each other to achieve calibration of the measurement system to be calibrated.
  • the second is the component calibration method. That is, the components of the measuring system, such as the shunt, Rogowski coil and integrator, and the resistor-capacitor voltage divider, are separately calibrated with their respective product standards. The measurement front end and the measurement host of the Hall sensor, photoelectric converter, etc. are calibrated using a standard waveform generator and a high-precision measuring instrument. Then, for measurement software and algorithms, the International Short-Circuit Test Consortium proposed a method of calibration using a Test Data Generator (TDG) software. Specifically, the TDG software theoretically simulates and generates data parameter settings such as RMS values, DC components, noise, zero drift, and time constants at different starting components, as well as sampling rates, total sampling points, and number of data bits.
  • TDG Test Data Generator
  • the short-circuit test current waveform under the parameter setting value is converted into a txt text file according to a certain format.
  • the measurement software to be verified imports this file and displays it as a waveform curve, and then uses its algorithm to calculate the peak value, effective value, DC component, duration and other parameters of the waveform. Finally, these parameters are compared with the above set values to calibrate the measurement software and algorithm. Finally, by combining the calibration results of each part, the calibration results of the entire measurement system can be obtained.
  • the main drawback is that when the components such as the transmitter, the measuring front end and the measuring host are separately calibrated, the calibration mechanism can only provide a standard sine wave or square wave as a signal source according to their respective standards.
  • the actual short-circuit test waveform containing rich DC and high-frequency components cannot be provided, which makes the calibration results not reflect the actual application, and the difference between the two is unpredictable.
  • the TDG software can only generate the current waveform of the short-circuit test, but cannot generate voltage waveforms including the transient recovery voltage, arcing time, arc voltage and other key parameters. Current waveform and stroke curve.
  • the TDG software actually calibrates only the uncertainty of the software and the algorithm, and cannot calibrate the uncertainty of the measurement host during data acquisition, conversion and transmission.
  • the object of the present invention is to provide a calibration method for an electrical short-circuit test measurement system, which greatly improves the accuracy and reliability of the short-circuit test measurement system calibration.
  • a method for calibrating an electrical short-circuit test measurement system includes the following steps:
  • Analog short circuit waveform signal generator converts digital waveform signal into calibration waveform signal Number and transmit the calibration waveform signal to the measurement front end;
  • the measurement software at the measurement host performs data calculation on the analog waveform signal outputted by the measurement front end to obtain a parameter of the analog waveform signal, and the analog waveform signal is converted by the measurement front end to obtain the calibration waveform signal;
  • the measurement front end is a Hall sensor or an opto-isolator. It can further solve the technical problem of the setting of the measurement front end.
  • the analog short circuit waveform generator comprises an FPGA chip, a digital to analog conversion chip and a low pass filter which are electrically connected in sequence. It can further solve the technical problem of the configuration of the analog short-circuit waveform generator.
  • the analog short circuit waveform generator further includes a direct frequency synthesizer electrically connected between the FPGA chip and the digital to analog conversion chip.
  • a direct frequency synthesizer electrically connected between the FPGA chip and the digital to analog conversion chip.
  • the digital waveform signal is a standard short circuit test waveform or a test data generator generates a waveform or a theoretical calculation data waveform.
  • the problem of the source of the digital waveform signal can be further solved.
  • the parameters of the analog waveform signal include the effective value of the waveform, the transient recovery voltage value, the arcing time, and the percentage of the DC component.
  • the parameters of the analog waveform signal can be further disclosed.
  • the innovations of the present invention mainly have the following three points: 1.
  • the standard analog short-circuit test waveform is used instead of the standard sine wave or square wave as the signal source, which is more in line with the practical application scenario, and greatly improves the short-circuit test measurement.
  • the correctness and reliability of the system calibration 2.
  • the invention can use the actual current waveform, voltage waveform or stroke curve as the signal source when calibrating the measurement software and algorithm, instead of the test data generator software, the current can only be used. Waveforms, therefore, the present invention enables more comprehensive and reliable calibration of measurement software and algorithms; 3.
  • the present invention calibrates Hall sensors, opto-isolators, measurement masters, and measurement software and algorithms as a whole, with simplified processes And improve the efficiency of the advantages.
  • the transmission line and communication network between these devices are also calibrated, and it is easy to find problems such as loose hardware connectors, line impedance mismatch, and abnormal network transmission that are easily overlooked during single calibration.
  • FIG. 1 is a flow chart of a calibration method of an electrical short circuit test system of the present invention
  • FIG. 2 is a circuit structural diagram of an analog short-circuit waveform signal generator of the present invention.
  • the present invention provides a calibration method for an electrical short-circuit test measurement system, which includes the following steps:
  • S1 transmitting the digital waveform signal to an analog short-circuit waveform signal generator, where the digital waveform signal is stored in a memory chip;
  • the analog short-circuit waveform generator includes sequentially Connected FPGA chip, DC frequency synthesizer, digital to analog converter chip and low pass filter,
  • the digital waveform signal may be derived from any one of the following three methods: 1.
  • the short-circuit test parameter is calculated according to the model and the theoretical formula of the circuit short circuit, that is, the theoretical calculation data waveform; 2.
  • the short-circuit test parameter is used in the test data.
  • Direct generation on the generator (TDG) (only for the short-circuit current waveform), that is, the waveform generated by the test data generator; 3.
  • the short-circuit test measurement system that has been calibrated and whose uncertainty meets the requirements of the relevant standard is measured and short-circuited.
  • the standard short-circuit test waveform of the test parameters is the standard short-circuit test waveform; then the digital waveform signal is stored in the memory chip.
  • the analog short-circuit waveform signal generator converts the digital waveform signal into a calibration waveform signal and transmits the calibration waveform signal to the measurement front end; the measurement front end is one of a Hall sensor or an optical isolator.
  • the measurement software at the measurement host performs data calculation on the analog waveform signal outputted by the measurement front end to obtain parameters of the analog waveform signal, and the analog waveform signal is converted by the measurement front end to obtain the calibration waveform signal;
  • the parameters of the analog waveform signal include the waveform RMS, peak value, short circuit duration, transient recovery voltage value, arcing time, and DC component percentage.
  • the above-mentioned analog short-circuit waveform generator of any given parameter consisting of FPGA chip, direct digital frequency synthesizer, digital-to-analog converter chip and low-pass filter should be calibrated by standard short-circuit test system before use. Measurement, uncertainty and traceability Sex meets the requirements of relevant standards.
  • the calibration waveform signal output by the analog short-circuit waveform generator is sent to the measurement front end of the short-circuit test measurement system to be calibrated, and is collected and processed by the measurement host of the measurement system.
  • the measurement software and algorithm in the measurement host calculate the collected short-circuit test waveform, and obtain parameters such as the effective value of the waveform, the transient recovery voltage value, the arcing time and the DC component percentage.
  • the synthetic standard uncertainty of the measurement front end, the measurement host, and the measurement software and algorithm can be known. If the uncertainty of the measurement system transmitter is taken into account, the calibration of the entire short-circuit test measurement system can be achieved.

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Or Calibration Of Command Recording Devices (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)

Abstract

一种电器短路试验测量系统的校准方法，包括以下步骤：S1：将数字波形信号传输至模拟短路波形信号发生器；S2：模拟短路波形信号发生器将数字波形信号转换成校准波形信号，并将校准波形信号传输至测量前端；S3：测量主机处的测量软件对测量前端输出的模拟波形信号进行数据计算以得到模拟波形信号的参数；S4：将得到的模拟波形信号的参数与数字波形信号的参数进行比对得到其差值。作为对组件校准法的改进，在校准电器短路试验测量系统的测量前端及测量主机时，使用标准的模拟短路试验波形代替标准的正弦波或方波作为信号源，更加符合实际应用场景，大幅度提高了短路试验测量系统校准的正确性与可靠性。

Description

一种电器短路试验测量系统的校准方法 技术领域
本发明属于短路试验测量校准领域，尤其涉及一种电器短路试验测量系统的校准方法。
背景技术
电器的短路试验，是指验证断路器、开关柜、熔断器和变压器等各种高低压电气设备在相关标准规定的试验条件下，对短路电流关合、分断或承载的能力。它是短路关合和开断试验、极限短路分断能力试验、短路承受能力试验和峰值耐受电流试验等一系列试验的总称。短路试验时，电气设备自身会流过最高数十万安培的短路电流，并承受很高的电动力、热量及过电压。因此，短路试验作为对电气设备考核较为严酷的试验，是评判设备是否符合标准要求的重要手段。
在进行电气设备的短路试验时，需要不失真地记录短路电流、工频恢复电压、瞬态恢复电压、合分闸线圈电流、行程曲线等波形，并从这些波形上准确地测算出有效值、峰值、短路持续时间、瞬态恢复电压值、燃弧时间、功率因数和直流分量百分数等电气参数，以便于公正有效地判定试验是否有效以及这些电气设备是否通过试验。为此，需要一种工作稳定可靠、电气隔离与抗干扰能力强、采集速度快、参数测量计算准确的短路试验测量系统。在这种需求下，德国HBM、美国ATIS等公司各自推出了自己的测量系统，被普遍应用于国内外各 大实验室的短路试验测量中。这些系统在采集短路电流、恢复电压或行程曲线等不同性质的波形时，一般先用不同的变送器将其转换为较小量程的低电平模拟信号(如短路电流用分流器或罗氏线圈及积分器作为变送器，恢复电压用电压互感器或阻容分压器作为变送器，行程曲线用增量编码器或位移传感器作为变送器)，再由通用的测量前端如霍尔传感器或者光电转换器等隔离后，送入测量主机中。主机对这些信号进行滤波、采样和运算等处理，得到数字化的实际波形。测量系统再依据自带或使用者另行开发的软件和算法，从波形上计算出有效值、瞬态恢复电压值、燃弧时间和直流分量百分数等关键的试验参数。据此，试验人员判断本次试验是否有效以及被试设备是否通过试验。
因此，由上述变送器、测量前端、测量主机、测量软件及算法四部分组成短路试验测量系统的测量精度及计算精度在相当大的程度上影响着试验结果判定的一致性与公正性。测量系统的校准对各实验室来说也因而显得尤为重要。依据国际电工委员会(International Electrotechnical Commission，IEC)和国际短路试验联盟(Short-Circuit Testing Liaison，STL)的相关标准和技术导则的规定，目前世界上通行的对短路试验测量系统的校准方法有以下两种：
一是整体校准法。即将一套经过校准后的标准短路试验测量系统与需要校准的测量系统一起安装在实验室的试验回路中，由一个被认可的校准实验室在用户实验室使用标准测量系统对需要校准的测量 系统进行比对试验。以标准测量系统的测量与算法计算值作为约定真值，将其与待校准测量系统的测算值相互比对，以此来实现待校准测量系统的校准。
二是组件校准法。即先对测量系统的变送器，如分流器、罗氏线圈及积分器、阻容分压器等组件，用各自的产品标准分别校准。再对霍尔传感器、光电转换器等测量前端和测量主机，用标准的波形发生器和高精度测量仪表来校准。然后对测量软件及算法，国际短路试验联盟提出了用一个试验数据发生器(Test Data Generator，TDG)软件来校准的方法。具体来说，TDG软件从理论上模拟并生成在不同的起始分量有效值、直流分量、噪声、零漂、时间常数等数据参数设定值以及采样速率、总采样点数、数据位数等采样参数设定值下的短路试验电流波形，并按照一定的格式转换为txt文本文件。待验证的测量软件导入此文件并将其显示为波形曲线，再使用其算法计算波形的峰值、有效值、直流分量、持续时间等参数。最后将这些参数与上述设定值相比较，来校准该测量软件及算法。最终，将各部分的校准结果综合到一起，就可以得到整个测量系统的校准结果。
在实际应用中，上述两种方法都存在着缺陷和不足。对于整体校准法，首先，获取一套标准短路试验测量系统是很困难的，特别是额定电流高达数十万安培的标准分流器，对制造和加工的工艺和精度要求都很高，很少有校准机构拥有。其次，校准时需要安装整套的标准测量系统，同时进行实际的短路试验，需要耗费大量的时间和精力，成本很高。再次，每次试验时试品的动作特性、回路的分布参数等均 不尽相同，而这些对燃弧时间、瞬态恢复电压等都有较大的影响，致使校准的复现性较差。因此实际中很少采用整体校准法，一般只有少数大容量实验室在首次投产时或进行国际比对时才会采用。
对于组件校准法，其主要的缺陷在于对变送器、测量前端及测量主机等组件分别进行校准时，校准机构只能依据其各自的标准提供标准的正弦波或方波等作为信号源，而无法提供实际的包含丰富直流和高频分量的短路试验波形，这使得校准结果不能反映实际应用情况，且两者间差异不可预知。此外，在对测量主机及软件进行校准时，TDG软件只能生成短路试验的电流波形，而不能生成包含有瞬态恢复电压、燃弧时间、电弧电压等关键参数的电压波形、合分闸线圈电流波形及行程曲线。并且TDG软件实际了只校准了软件及算法的不确定度，而无法校准测量主机在数据采集、转换与传输时的不确定度。
发明内容
为了克服现有技术的不足，本发明的目的在于提供一种电器短路试验测量系统的校准方法，其大幅度的提高了短路试验测量系统校准的正确性和可靠性。
本发明的目的采用以下技术方案实现：
一种电器短路试验测量系统的校准方法，包括以下步骤：
S1：将数字波形信号传输至模拟短路波形信号发生器，所述数字波形信号存储于一存储芯片中；
S2：模拟短路波形信号发生器将数字波形信号转换成校准波形信 号，并将校准波形信号传输至测量前端；
S3：测量主机处的测量软件对测量前端输出的模拟波形信号进行数据计算以得到模拟波形信号的参数，所述模拟波形信号由测量前端将校准波形信号转换得到；
S4：将得到的模拟波形信号的参数与数字波形信号的参数进行比对，得到模拟波形信号的参数与数字波形信号的参数的差值。
优选地，所述测量前端为霍尔传感器或者光电隔离器。其能进一步解决测量前端的设置的技术问题。
优选地，所述模拟短路波形发生器包括依次电性连接的FPGA芯片、数模转换芯片和低通滤波器。其能够进一步解决模拟短路波形发生器的构成的技术问题。
优选地，所述模拟短路波形发生器还包括直接频率合成器，所述直接频率合成器电性连接在FPGA芯片与数模转换芯片之间。能进一步解决数据波形的准确性的问题。
优选地，所述数字波形信号为标准短路试验波形或者试验数据发生器产生波形或者理论计算数据波形。能进一步解决数字波形信号的来源的问题。
优选地，模拟波形信号的参数包括波形的有效值、瞬态恢复电压值、燃弧时间和直流分量百分数。能进一步公开模拟波形信号的各项参数。
相比现有技术，本发明的有益效果在于：
本发明的创新之处主要有以下三点：1、作为对组件校准法的改 进，本发明在校准霍尔传感器、光电隔离器及测量主机时，使用标准的模拟短路试验波形代替标准的正弦波或方波作为信号源，更加符合实际应用场景，大幅度提高了短路试验测量系统校准的正确性与可靠性；2、本发明在校准测量软件及算法时，可使用模拟实际的电流波形、电压波形或行程曲线来作为信号源，而非试验数据发生器软件只能使用电流波形，因此，本发明能够更为全面和可信地对测量软件及算法进行校准；3、本发明将霍尔传感器、光电隔离器、测量主机及测量软件和算法作为整体一起校准，具有简化流程并提高效率的优点。同时也一并校准了这些设备间的传输线和通信网络，容易发现单独校准时易于忽视的硬件接头松动、线路阻抗不匹配及网络传输异常等问题。
附图说明
图1为本发明电器短路试验系统的校准方法的流程图；
图2为本发明模拟短路波形信号发生器的电路结构图。
具体实施方式
下面，结合附图以及具体实施方式，对本发明做进一步描述：
如图1和图2所示，本发明提供了一种电器短路试验测量系统的校准方法，包括以下步骤：
S1：将数字波形信号传输至模拟短路波形信号发生器，所述数字波形信号存储于一存储芯片中；所述模拟短路波形发生器包括依次电 性连接的FPGA芯片、直流频率合成器、数模转换芯片和低通滤波器，
所述数字波形信号可以源于以下三种方式中的任意一种：1、通过短路试验参数根据电路短路的模型和理论公式计算，即是理论计算数据波形；2、通过短路试验参数在试验数据发生器(TDG)上直接生成(仅限于短路电流波形)，即是试验数据发生器产生波形；3、由经过校准且不确定度满足相关标准要求的标准短路试验测量系统采集并已测得短路试验参数的标准短路试验波形，即是标准短路试验波形；然后将数字波形信号存储于存储芯片中。
S2：模拟短路波形信号发生器将数字波形信号转换成校准波形信号，并将校准波形信号传输至测量前端；所述测量前端为霍尔传感器或者光电隔离器中的一种。
S3：测量主机处的测量软件对测量前端输出的模拟波形信号进行数据计算以得到模拟波形信号的参数，所述模拟波形信号由测量前端将校准波形信号转换得到；模拟波形信号的参数包括波形的有效值、峰值、短路持续时间、瞬态恢复电压值、燃弧时间和直流分量百分数等。
S4：将得到的模拟波形信号的参数与数字波形信号的参数进行比对，得到模拟波形信号的参数与数字波形信号的参数的差值。
本发明的工作原理：
上述由FPGA芯片、直接数字频率合成器、数模转换芯片和低通滤波器组成的任意给定参数的模拟短路波形发生器在使用前，本身应通过标准短路试验测量系统的校准，以使其测量值、不确定度和溯源 性符合相关标准要求。使用时，上述模拟短路波形发生器输出的校准波形信号被发送到待校准短路试验测量系统的测量前端中，并被测量系统的测量主机所采集和处理。测量主机中的测量软件和算法对采集到的短路试验波形进行计算，得出波形的有效值、瞬态恢复电压值、燃弧时间和直流分量百分数等参数。将这些参数同模拟短路试验波形的发生器的已知参数相互比对，便可以获知测量前端、测量主机和测量软件及算法的合成标准不确定度。若将该测量系统变送器的不确定度考虑进来，就可以实现对整个短路试验测量系统的校准。
对本领域的技术人员来说，可根据以上描述的技术方案以及构思，做出其它各种相应的改变以及形变，而所有的这些改变以及形变都应该属于本发明权利要求的保护范围之内。

Claims (6)

  1. 一种电器短路试验测量系统的校准方法，其特征在于，包括以下步骤：
    S1：将数字波形信号传输至模拟短路波形信号发生器，所述数字波形信号存储于一存储芯片中；
    S2：模拟短路波形信号发生器将数字波形信号转换成校准波形信号，并将校准波形信号传输至测量前端；
    S3：测量主机处的测量软件对测量前端输出的模拟波形信号进行数据计算以得到模拟波形信号的参数，所述模拟波形信号由测量前端将校准波形信号转换得到；
    S4：将得到的模拟波形信号的参数与数字波形信号的参数进行比对，得到模拟波形信号的参数与数字波形信号的参数的差值。
  2. 如权利要求1所述的电器短路试验测量系统的校准方法，其特征在于，所述测量前端为霍尔传感器或者光电隔离器。
  3. 如权利要求1所述的电器短路试验测量系统的校准方法，其特征在于，所述模拟波形信号发生器包括电性连接的FPGA芯片、数模转换芯片和低通滤波器。
  4. 如权利要求1所述的电器短路试验测量系统的校准方法，其特征在于，所述模拟短路波形发生器还包括直接频率合成器，所述直接频率合成器电性连接在FPGA芯片与数模转换芯片之间。
  5. 如权利要求1所述的电器短路试验测量系统的校准方法，其特征在于，所述数字波形信号为标准短路试验波形或者试验数据发生器产生波形或者理论计算数据波形。
  6. 如权利要求1所述的电器短路试验测量系统的校准方法，其特征在于，模拟波形信号的参数包括波形的有效值、瞬态恢复电压值、燃弧时间和直流分量百分数。
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