WO2017183755A1

WO2017183755A1 - Sample inspection device

Info

Publication number: WO2017183755A1
Application number: PCT/KR2016/004535
Authority: WO
Inventors: 김장주; 문창기
Original assignee: 서울대학교 산학협력단
Priority date: 2016-04-21
Filing date: 2016-04-29
Publication date: 2017-10-26
Also published as: KR101802462B1; CN109073552A; KR20170120445A; CN109073552B

Abstract

The present invention relates to a sample inspection device and, more particularly, to a sample inspection device into which sample introduction is simple and which can implement sample inspection in an extremely simple and reliable manner, as the sample closely contacts a lens unit, excited light generated from the sample is widely diffused by the lens unit, and the diffused excited light is selectively captured and analyzed according to a specific angle.

Description

Sample inspection device

The present invention relates to a sample inspection apparatus, and more particularly, a sample is in close contact with a lens unit, light is irradiated to the sample, and excitation light generated in the sample is widely diffused by the lens unit, and the diffused excitation In an analytical method for selectively capturing light according to a specific angle, a sample is simply introduced, and a sample inspection apparatus can be performed very simply and reliably.

When inspecting a sample including a predetermined test sample, a thin film, microorganisms, etc., the intensity or distribution of the excitation light generated by irradiating a light such as ultraviolet light (UV light) to the sample using a predetermined light source and exciting the sample In some cases, inspection may be performed on a sample.

In the case of such a sample inspection apparatus and method, it is necessary to make the irradiation light of the said light source accurately enter into a predetermined analysis sample. If unnecessary external light, reflected light, or irradiated light other than the corresponding light source enters the analysis sample unnecessarily, or the area of the light irradiated onto the sample is too large, the inspection accuracy of the sample may be very poor. It is necessary to have a device that is not harmful to the human body by preventing external leakage of irradiated light except during the operation.

In addition, since the excitation light generated in the sample is diffused and spread through the attached lens, there is also a need for a device capable of easily capturing the distribution of the diffused excitation light and performing the analysis.

The present invention has been made to solve the above-described problems, an object of the present invention, the sample is in close contact with the lens portion, the excitation light generated in the sample is widely spread by the lens portion, and the diffused excitation light According to the present invention, it is possible to selectively capture and analyze a specific angle, thereby providing a simple sample injection apparatus, and providing a sample inspection apparatus capable of very simple and reliable inspection of a sample.

In order to achieve the above object, the sample inspection apparatus according to the present invention, the power unit for providing a rotational force; A rotation stage having a predetermined area and configured to be rotatable on an XY plane about a predetermined rotation center axis extending in a Z axis direction connected to the power unit; A lens unit disposed on the rotation stage and configured to be rotatable with the rotation stage about the rotation center axis, the lens unit being disposed on one side of the rotation stage; A sample holder disposed on the rotation stage and configured to be rotatable with the rotation stage about the rotation center axis, disposed on an opposite side of the lens portion with the rotation center axis therebetween, and rotatably connected to the rotation stage. ; And

An angle fixing part disposed on the rotating stage and configured to fix the angle of the sample holder, wherein the lens part has an incident surface formed in a predetermined plane on a side facing the sample holder, The sample holder may include a rotation shaft extending in the Y axis direction and connected to the rotation stage, and one end connected to the rotation stage through the rotation shaft, and pivotally connected on an XZ plane about the rotation axis. And a light source unit disposed in the rotating body, wherein the rotating body has a mounting surface on which a predetermined sample can be placed at a position facing the lens unit, and the rotating body rotates about the rotating shaft. The angle between the mounting surface and the incident surface is configured to be variable, wherein the angle fixing portion is positioned the sample holder The angle between the mounting surface and the incident surface to maintain a predetermined angle, and the irradiation light generated by the light source unit is fixed to the sample between the mounting surface and the incident surface at a predetermined angle. When irradiated onto the sample, excitation light generated by excitation of the sample is emitted through the lens portion.

Preferably, the lens unit is composed of a semi-circular lens having a predetermined thickness in the Z-axis direction, the incidence surface is formed upright on the front surface of the X-axis direction, and a semi-circular curved surface is formed on the rear surface in the X-axis direction.

Preferably, the rotating body includes a rotating beam having one end connected to the rotating shaft and the other end of the rotating beam and having a space therein so that the light source is mounted therein, wherein the mounting surface is It is formed at a position facing the lens portion in the rear of the X axis direction of the housing.

Preferably, when the pivoting beam is upright, the angle between the mounting surface and the incident surface is 0 °, and the sample seated on the mounting surface and the incident surface of the lens portion are in close contact with each other.

Preferably, the pivoting beam and the housing are bent at a predetermined angle to each other, so that the light source unit irradiates light on the sample in a diagonally downward direction while the pivoting beam is upright.

Preferably, the rotating body includes a fixing means for positioning the sample placed on the mounting surface, the fixing means is disposed on the upper surface of the mounting surface, the rotating small axis extending in the Y-axis direction, Including a rotation fixing pin to rotate on the XZ plane around the rotation axis, the rotation fixing pin is configured to cover the upper part of the sample to fix the position when the sample is placed on the mounting surface.

Preferably, the angle fixing portion is disposed in front of the sample holder in the X-axis direction, and is configured to be rotatable with respect to the base jig, and the base jig fixed on the rotation stage, to fix the position of the sample holder. It includes a rotating jig.

Preferably, the pivot jig is rotated around a support shaft disposed on both sides of the base in the Y axis direction and extending in the X axis direction, and the pivot jig is centered on the support shaft while the sample holder is upright. When rotated upwards, the pivoting jig supports the X-axis front surface of the sample holder to fix the sample holder.

Preferably, the rotation stage is provided on the base stage connected to the power unit, an upper cover covering the upper surface of the lens unit, and on both sides of the sample holder in the Y-axis direction and upright on the base stage and the base It connects the stage and the upper cover and has a connecting portion that the rear surface is in contact with the incident surface of the lens portion.

Preferably, the base stage has a circular shape, and an upper surface of the base stage is divided into a semicircular lens surface and a base surface having different heights, and the lens surface has a height lower than that of the base surface. A stepped surface is formed between the lens surface and the base surface, the lens portion is disposed on the lens surface, and the light irradiation portion and the angle fixing portion are disposed on the base surface.

Preferably, the stepped surface and the incident surface of the lens portion are disposed on the same surface and constitute one surface.

Preferably, on the base surface, a fluid groove is formed on the outside of the angle fixing portion and has a predetermined depth so that a predetermined liquid material is filled therein.

Preferably, the sample has a transmission portion made of a material having a predetermined area and a light transmissive so that a predetermined inspection sample is placed, the refractive index of the transmission portion is configured to be the same as the refractive index of the lens portion.

Preferably, the sample comprises a liquid solvent applied on the test sample placed on the transmission part to closely contact the incident surface between the test sample and the transmission part and the lens part, wherein the refractive index of the liquid solvent is the refractive index of the lens part. It is configured in the same way.

Preferably, the light passing portion disposed in the rear of the lens portion in the X-axis direction and having a predetermined slit to pass the light transmitted through the lens portion; And an analysis device in which light passing through the passage is incident to perform analysis. It further includes.

Preferably, the angle adjusting unit for adjusting the rotation angle, and the initial angle of the rotation stage; further includes.

According to the sample inspection device according to the present invention, the inspection of the sample can be made very simple and reliable. In particular, since the sample is in close contact with the lens unit, the excitation light generated in the sample is widely spread by the lens unit, and the captured excitation light can be selectively captured and analyzed according to a specific angle, so that accurate analysis can be performed. have.

In addition, since the entire apparatus is covered by the casing, the irradiated light and the excitation light irradiated from the light source unit can be prevented from being exposed to the harmful light without leaking to the outside.

1 is a view showing the appearance of a sample inspection apparatus according to an embodiment of the present invention.

2 is a view showing a shape in which the door of the casing of the sample inspection apparatus according to an embodiment of the present invention is opened.

3 is a view showing the structure of the internal device of the sample inspection apparatus according to the present invention.

4 is a view of the internal device of FIG. 3 viewed from above in the Z-axis direction.

FIG. 5 is a view of the internal device of FIG. 3 seen in the Y-axis direction.

FIG. 6 is a view of the internal device of FIG. 2 as viewed in the X-axis direction.

7 is a view showing that the sample is mounted in the sample holder when the sample holder of the sample inspection device of the present invention is in the open mode.

8 to 10 are views showing the operation of the sample inspection device according to the present invention.

11 is a view showing a sample inspection method according to an embodiment of the present invention.

12A and 12B are diagrams showing an example of a test result.

Sample inspection apparatus according to the present invention according to an embodiment, the power unit for providing a rotational force; A rotation stage having a predetermined area and configured to be rotatable on an XY plane about a predetermined rotation center axis extending in a Z axis direction connected to the power unit; A lens unit disposed on the rotation stage and configured to be rotatable with the rotation stage about the rotation center axis, the lens unit being disposed on one side of the rotation stage; A sample holder disposed on the rotation stage and configured to be rotatable with the rotation stage about the rotation center axis, disposed on an opposite side of the lens portion with the rotation center axis therebetween, and rotatably connected to the rotation stage. ; And

Hereinafter, exemplary embodiments of the present invention will be described with reference to the accompanying drawings. This embodiment is not intended to be limiting.

Advantages and features of the present invention and methods for achieving them will be apparent with reference to the embodiments described below in detail with the accompanying drawings. However, the present invention is not limited to the embodiments disclosed below, but can be implemented in various different forms, and only the embodiments make the disclosure of the present invention complete, and the general knowledge in the art to which the present invention belongs. It is provided to fully inform the person having the scope of the invention, which is defined only by the scope of the claims. Like reference numerals refer to like elements throughout.

The terminology used herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the invention. In this specification, the singular also includes the plural unless specifically stated otherwise in the phrase. As used herein, "comprises" and / or "comprising" refers to the presence of one or more other components, steps, actions and / or members. Or does not exclude additions.

Unless otherwise defined, all terms (including technical and scientific terms) used in the present specification may be used in a sense that can be commonly understood by those skilled in the art. In addition, the terms defined in the commonly used dictionaries are not ideally or excessively interpreted unless they are specifically defined clearly.

1 is a view showing the appearance of a sample inspection device 1 according to an embodiment of the present invention, Figure 2 is a door 30 of the casing 20 of the sample inspection device 1 according to an embodiment of the present invention Fig. 3 is a view showing an open shape, and Fig. 3 is a view showing the structure of the device inside the sample inspection device 1 according to the present invention, and Figs. 4 to 6 respectively show the internal device of Fig. 3 in the Z-axis direction. It is the figure seen from the upper direction, the Y-axis direction lateral direction, and the X-axis direction omnidirectional.

Here, the X-axis direction, the Y-axis direction, and the Z-axis direction will be described with reference to the directions shown in FIG. 3, respectively.

The sample inspection apparatus 1 according to the present invention includes a power unit 100, a rotation stage 200, a lens unit 300, a sample holder 400, an angle fixing unit 500, a light passing unit 600, It may be configured to include an angle adjusting unit 700 and the analysis device (800). On the other hand, the devices are disposed on a predetermined base plate 10, it may be covered with a predetermined casing (20). In addition, the casing 20 may have a structure in which the door 30 is opened and closed.

First, the power unit 100 will be described.

The power unit 100 receives a predetermined power to provide rotational force. Accordingly, the power unit 100 is fixedly disposed on the base plate 10, and may be connected to a predetermined power supply device to receive a predetermined power.

The power unit 100 is disposed on a predetermined power unit 110 such as a motor, a side casing 120 covering an outer side of the power unit 110, and an upper portion of the power unit 110. It may have an upper casing 130 to cover. The power unit 110 may have a predetermined shaft to rotate the rotation stage 200.

Next, the rotation stage 200 will be described.

The rotation stage 200 is a member having a predetermined area on the XY plane, and is configured to rotate on the XY plane about a predetermined rotation center axis extending in the Z axis direction.

Specifically, the rotating stage 200 has a base stage 210, an upper cover 220, and a connecting portion 230.

The base stage 210 may be formed of a member of a predetermined disc shape that is connected to the power unit 100 and rotatably configured. Specifically, it may be connected to the shaft of the power unit 100 to rotate.

An upper surface of the base stage 210 is divided into a lens surface 214 and a base surface 112. The lens surface 214 and the base surface 112 each have a semicircular shape that divides the area of the upper surface of the base stage 210 by approximately 1/2. In this case, the height of the lens surface 214 is higher than the height of the base surface 112, so that the lens surface 214 and the base surface 112 are divided around the predetermined step surface 216. Accordingly, the stepped surface 216 is formed to coincide with or parallel to the diameter passing through the center point of the disc shaped base stage 210.

Meanwhile, a recessed groove 213 having a predetermined depth and recessed may be formed on the base surface 112. The recessed grooves 213 may be formed at both sides of the Y-axis direction of the angle fixing part 500 to be described later, so that the liquid substances flowing out of the sample to be described later may be appropriately collected without spreading to the outside.

The upper cover 220 may be positioned above the lens surface 214 and may have a semi-circular shape as a shape of the lens surface 214. A lens unit 300 to be described below is disposed between the upper cover 220 and the base surface 112.

The connection part 230 connects the base stage 210 and the upper cover 220 to each other in the vertical direction. Specifically, the lower end of the connecting portion 230 is connected to the base stage 210, the upper end is connected to the upper cover 220. Two connection units 230 are provided, and specific arrangement of each connection unit 230 will be described later.

Next, the lens unit 300 will be described.

The lens unit 300 is disposed on the rotation stage 200 and configured to be rotatable with the rotation stage 200.

Specifically, the lens unit 300 may have a semicircular shape having a predetermined thickness. That is, a semi-circular lens curved surface having a predetermined thickness in the Z-axis direction and having a predetermined plane in the X-axis direction is formed upright, and a semi-circular lens curved surface is formed at the rear in the X-axis direction. It may be composed of a lens.

The lens unit 300 is disposed on the lens surface 214 on the base stage 210. In this case, the incident surface 310 is disposed to be parallel to the stepped surface 216. That is, as shown in FIG. 4, the incident surface 310 is located on the stepped surface 216, and may form one surface side by side. Therefore, the lens unit 300 is disposed concentrically with the base stage 210. Meanwhile, the diameter of the semicircle drawn by the lens unit 300 may be smaller than the diameter of the semicircle drawn by the lens surface 214.

The upper surface of the lens unit 300 is disposed in contact with the lower surface of the upper cover 220. Therefore, the lens unit 300 is positioned between the base stage 210 and the upper cover 220. In addition, both side portions of the incident surface 310 abut each of the connection portion 230. Accordingly, the connection part 230 is fixed in contact with the bottom surface 216 and the incident surface 310 at the same time.

Therefore, the lower surface of the lens unit 300 is covered by the base surface 112, the upper surface of the lens unit 300 is covered by the upper cover 220, both side portions of the incident surface 310 It is covered by the connecting portion 230. The base stage 210, the upper cover 220, and the connection part 230 fix the lens part 300, and the lens part 300 of the incident surface 310 positioned forward in the X-axis direction. The center portion and the lens curved surface 320 positioned rearward in the X-axis direction may be exposed.

Next, the sample holder 400 will be described.

The sample holder 400 is a device on which a predetermined sample is mounted and irradiates light onto the sample.

The sample holder 400 may be disposed on the rotation stage 200 and disposed on the base surface 112. That is, when the stepped surface 216 divides the base stage 210 into 1/2, the lens unit 300 is disposed on one side with the stepped surface 216 interposed therebetween, and the sample holder 400 on the opposite side. ) May be arranged.

The sample holder 400 includes a rotation shaft 410, a rotation body 420, and a light source 430.

The rotation shaft 410 is configured as an axis extending in the Y axis direction and is connected to the rotation stage 200. Specifically, it may be composed of a predetermined beam connected across the two connecting portions 230. Of course, since the rotating shaft 410 is sufficient to be configured to rotate the rotating body 420, it is also possible to implement an embodiment consisting of a predetermined projecting beam provided on the rotating body 420 or the connecting portion 230.

The rotating body 420 has a light source unit 430 disposed therein, and one end of the rotating body 420 is disposed between the connecting units 230, and is connected to the rotating stage 200 through the rotating shaft 410 and rotates the rotating shaft 410. It is a member configured to be rotatable on the XZ plane about the center.

The light source unit 430 may be a predetermined light emitting device, and for example, may be configured as a predetermined LED light emitting device that emits light of a specific wavelength such as UV light. However, it is not necessarily limited thereto.

The rotating body 420 includes a rotating beam 440, a housing 450, and a mounting surface 460.

The rotating beam 440 is a portion of which one end is connected to the rotating shaft 410, and is composed of a predetermined beam connected to the rotating shaft 410 and rotatable.

The housing 450 is a portion in which a predetermined space is formed to mount the light source unit 430 therein. The housing 450 is connected to the other end of the rotating beam 440 and rotates together according to the rotation of the rotating beam 440. The rotating beam 440 and the housing 450 may preferably have a configuration that is bent at a predetermined angle from each other.

The housing 450 has a light opening 452 at the rear in the X axis direction. The light opening part 452 is a part which is spatially open, or is provided with a member such as a window having a predetermined light transmissive material, through which light can pass. Therefore, the irradiation light generated by the light source unit 430 mounted in the housing 450 may be irradiated to the sample.

The mounting surface 460 is a surface formed at a position facing the lens unit 300 and is provided at the rear of the housing 450. The mounting surface 460 may be configured to accommodate a predetermined sample, and the mounting surface 460 may be provided with a predetermined groove for receiving and fixing the sample. For example, when the sample is a cartridge containing a predetermined liquid sample or a predetermined rectangular glass, a groove corresponding to the external shape of the cartridge or the rectangular glass may be formed to mount the cartridge or the rectangular glass.

The mounting surface 460 communicates with the light opening 452 of the housing 450, so that the sample is received on the mounting surface 460, and the front portion of the sample is disposed by the light opening. It is configured to face 430 has a configuration that the light generated by the light source unit 430 can be irradiated to the sample.

On the other hand, the rotation body 420 may further include a fixing means 470 for positioning the sample placed on the mounting surface 460. The fixing means 470 may be disposed above the mounting surface 460, and may include a rotating shaft 472 and a rotating fixing pin 474.

Specifically, one end of the pivot fixing pin 474 may be rotatably connected to the pivot shaft 472 disposed on the mounting surface 460 and extending in the Y-axis direction. Therefore, the pivot pin 474 may rotate on the XZ plane about the pivot axis 472. In this case, a predetermined fixing protrusion may be provided on the other side of the rotation fixing pin 474 to cover a portion of the upper surface of the sample placed on the mounting surface 460 to fix the sample.

As the pivoting body 420 rotates, the inclination angle of the mounting surface 460 may also vary. The mounting surface 460 may be in a state where the mounting surface 460 is opened with a predetermined angle between the incident surface 310 according to the rotation of the rotation body 420, or in close contact with the incident surface 310. The angle between the mounting surfaces 460 may be 0 degrees.

That is, the sample holder 400 has an open mode and a closing mode. In the open mode, the rotation body 420 rotates outward with respect to the lens unit 300 with the rotation axis 410 as the center so that the incident surface 310 and the mounting surface 460 are spaced apart from each other so that the incident surface ( 310 and the mounting surface 460 have a predetermined angle, and the mounting surface 460 is exposed upward. Accordingly, the sample can be mounted on the mounting surface 460.

In the closing mode, the angle between the incident surface 310 and the mounting surface 460 becomes 0 °. At this time, the rotating beam 440 is upright, the mounting surface 460 and the incident surface 310 is in close contact with each other. More precisely, it can be understood that the sample seated on the mounting surface 460 is in close contact with the incident surface 310.

Hereinafter, the angle fixing part 500 will be described.

The angle fixing part 500 is disposed in front of the sample holder 400 in the X axis direction, and is a member for maintaining a constant tilt angle of the sample holder 400.

The angle fixing part 500 may be disposed on the base surface 112 of the base stage 210, and may include a base jig 510 and a rotation jig 520.

The base jig 510 is fixed on the base surface 112 of the base stage 210 and positioned in front of the sample holder 400 in the X axis direction. A predetermined groove may be formed at both sides of the base jig 510 in the Y axis direction so that the rotation jig 520 may be connected.

The rotation jig 520 is disposed at both sides of the base jig 510 in the Y-axis direction and is rotatably connected to the base jig 510 through a predetermined support shaft 514. The support shaft 514 extends in the X-axis direction, and the rotation jig 520 is configured to be rotatable on the XZ plane. Accordingly, the rotation jig 520 is laid on the base surface 112 to face the base surface 112, and rotates about the support shaft 514 to the base surface 112 and 90. It has a longitudinal angle between degrees and is upright. Of course, the angle between the base surface 112 and the base surface 112 in the longitudinal mode is not necessarily limited to 90 degrees, but it is sufficient to have a suitable angle between them.

The position fixing of the sample holder 400 by the angle fixing part 500 will be described below.

When the sample holder 400 is closed, the pivot beam 440 is in an upright state. In this case, when the pivoting jig 520 is rotated about the support shaft 514 to be in the longitudinal mode in the horizontal mode, the rear surface of the pivoting jig 520 contacts the front surface of the pivoting beam 440. Accordingly, the front surface of the pivoting beam 440 is supported to maintain the attitude of the pivoting beam 440, and the pivoting beam 440 is maintained in the closed mode. Preferably, the rotation jig 520 may have a suitable length and arrangement so that the sample holder 400 can maintain a precisely upright state in a closed state. That is, the X-axis rear surface of the rotation jig 520 may have a length and arrangement suitable to closely contact the front surface of the sample holder 400 in a state where the sample holder 400 is upright.

The light passing part 600 is a member disposed behind the lens part 300 in the X-axis direction, and predetermined to selectively pass only light at a predetermined position among the light transmitted through the lens part 300. It may have a slit 610 and a lens 620. The light passing part 600 may be formed of a predetermined structure fixed on the base plate.

The angle adjusting unit 700 is configured as a device capable of adjusting the rotation angle, rotation angle range, rotation speed and initial angle of the rotation stage 200. The angle adjusting unit 700 may be configured to be connected to the power unit 100, and may adjust an initial angle of the rotating stage 200 by rotating a predetermined adjustment pin. For example, the adjustment pin may be connected to the rotation stage 200 through a predetermined gear.

Although not shown in FIGS. 1 to 6, the analyzer 800 may be positioned opposite to the lens unit 300 with the light passing part 600 therebetween. Therefore, the light passing through the light passing part 600 may be configured to be incident in the analysis device 800. The analysis apparatus 800 may analyze and process various signals using the light passing through the light passing part 600 to derive a predetermined test result. Therefore, the analysis device 800 may be configured to include a predetermined computing device, a database, a signal processing device, a display device, an input device, and the like.

The power unit 100, the rotation stage 200, the lens unit 300, the sample holder 400, the angle fixing unit 500, the light passing unit 600, and the analysis device 800 may have a predetermined base. It is installed on the plate 10 and, in addition, the entire apparatus can be housed in a predetermined casing 20. The casing 20 is configured in an open structure to open the door 30 provided in the casing 20 to inject a sample or to replace or repair each device. In addition, the casing 20 may be provided with a predetermined output device and input device.

In addition, in order to further improve inspection reliability by excluding light other than the light used for inspection, other members other than the light-emitting and light transmitting members may be applied and colored in black. That is, the lens unit 300, a portion of the sample holder 400, and the remaining portions except for the slit 610 and the lens of the light passing part 600 are coated and colored in black, so that unnecessary reflection light and external light are applied. And the like can be prevented from entering the analysis apparatus 800. Accordingly, the inner surface of the casing 20, the inner surface of the door 30 and the outer surface of each member may be made black.

Hereinafter, the operation of the sample inspection device 1 according to the present invention will be described.

7 is a view showing that the sample is mounted in the sample holder 400 when the sample holder 400 of the sample inspection apparatus 1 of the present invention is in an open mode, and FIGS. 8 to 10 are sample inspection apparatuses according to the present invention. A diagram showing the operation of (1). However, reference may be made to the display portion of FIGS. 1 to 6.

First, as shown in FIG. 7, in the open mode of the sample holder 400 described above, the sample P is injected onto the mounting surface 460 of the sample holder 400. That is, as shown in FIG. 7, in the open mode, the mounting surface 460 is exposed upward, and the sample P may be injected onto the mounting surface 460. In addition, after the sample is put on the mounting surface 460, the fixing means 470 can be rotated as shown by arrow Q of FIG. 8 to fix the sample on the mounting surface 460.

As described above, the sample P may be a predetermined glass into which a cartridge, a liquid sample, or the like is introduced, and may be fixed by the fixing means 470 after being appropriately loaded on the mounting surface 460.

According to one example, the sample P has a transmissive portion (G) made of a material having a predetermined area and a light transmissive, such as glass, so that a predetermined test sample (F) is placed, the The refractive index may be the same as the refractive index of the lens unit 300. In addition, the sample is a liquid solvent that is applied on the test sample placed on the transmission part (G) to close contact between the test sample (F) and the transmission part (G) and the incident surface 310 of the lens unit 300. It may include. Preferably, the refractive index of the liquid solvent may be the same as the refractive index of the lens unit 300.

When the input of the sample P is completed as described above, the sample holder 400 is rotated as shown by the arrow R in FIG. 8 to switch to the closing mode described above. That is, the sample holder 400 is rotated so that the sample injected into the mounting surface 460 comes into close contact with the incident surface 310.

In this case, after the sample holder 400 is switched to the above-described closing mode, the angle fixing part 500 is switched from the horizontal mode to the vertical mode. Mode switching of the angle fixing unit 500 may be made as shown by arrow W of FIG. That is, the pivoting jig 520 is rotated to support the front surface of the sample holder 400. Accordingly, the mounting surface 460 and the sample of the sample holder 400 may maintain a state in close contact with the incident surface 310.

In this case, when the sample P contains a liquid test sample or the like, the liquid substance may fall and flow. At this time, as described above, the recessed grooves 213 are formed on the base surface 112 so that the spilled liquid material is formed to be high, thereby preventing the liquid material from flowing to other places and contaminating the device.

Next, as shown in FIG. 9, when power is applied to the light source unit 430, the irradiation light L1 is generated by the light source unit 430. According to the configuration of the rotating body 420 as described above, the irradiation light L1 may be incident in the downward direction from the diagonal upward direction with respect to the sample. An incident angle of the irradiation light L1 may be determined according to an angle between the pivot beam 440 and the housing 450, and preferably 45 °, but is not limited thereto.

When the irradiation light L1 is irradiated to the sample, the liquid test sample contained in the sample is excited by the irradiation light L1 to generate excitation light L2 and L3. The excitation light L2 and L3 are diffused through the lens unit 300.

At this time, since the light passing part 600 having the predetermined slit 610 is positioned behind the lens part 300, only the excitation light L2 having a predetermined incident angle is selectively disposed at the rear of the analyzer 800. Will be entered. According to FIG. 8, since the sample holder 400, the sample, the lens unit 300, and the light passing part 600 are arranged in a line on a straight line, only the linear excitation light L2 is incident on the analyzer 800. Done. Therefore, it is possible to prevent the irradiated light, reflected light, etc. unnecessary for the inspection to enter the analysis device 800, the accurate inspection can be made. At this time, as described above, the refractive indexes of the transmission part, the liquid solvent and the lens part 300 of the sample are the same, and since the transmission part and the lens part 300 are in close contact with each other, the excitation light is not unnecessarily refracted, and the linear excitation light is analyzed. It is possible to enter into the 800.

Subsequently, when the predetermined operation button is operated, the power unit 100 generates a rotational force, and the rotation stage 200 rotates as shown by arrow T in FIG. 4. As the rotation stage 200 rotates, the orientation angles of the sample P and the lens unit 300 vary, and the orientation of the lens unit 300 is changed as shown by arrow S of FIG. 10. Therefore, the excitation light L3 having a different angle of incidence may be positioned on a straight line connecting the sample, the lens unit 300, and the light passing unit 600 to enter the analysis apparatus 800. At this time, the excitation light L2 does not enter the analysis device 800, and as described above, as the inside of the casing 20 is black, the excitation light L2 may be absorbed without being reflected and noise may be removed.

According to the invention, the inspection of the sample can be made very simple and reliable. In particular, the sample is in close contact with the lens unit 300, the excitation light generated in the sample is widely spread by the lens unit 300, and the diffused excitation light can be selectively captured and analyzed according to a specific angle. Accurate analysis can be achieved.

In addition, since the entire apparatus is covered by the casing 20, the irradiation light and the excitation light irradiated from the light source unit 430 do not leak to the outside, thereby preventing the user from being exposed to harmful light. In particular, when the light emitted from the light source unit 430 is short wavelength light such as UV, it may be harmful to the human body, but in the present invention, since the light is not exposed by the casing in the use process, a safe inspection may be performed.

11 is a view showing a sample inspection method according to an embodiment of the present invention, Figure 12 is a view showing an example of the inspection results.

As shown in FIG. 11, according to the present invention, the lens unit 300 and the sample P may be rotated as shown by the arrow R so that light of a specific angle may be selectively incident on the analysis device 800. Therefore, the light pattern according to the angle can be obtained and utilized in the inspection. This can be said to have the same effect as that the analysis device 800 is disposed over the entire rotation angle range of the lens unit 300.

For example, analyzing the excitation light incident on the analyzer at a specific angle may result in a result as shown in FIG. 12A according to the intensity of the incident excitation light. That is, the excitation light incident at a specific angle may have various wavelengths, and the intensity of the incident light may also appear together. The inspection result may be derived by analyzing the incident light. For example, when the inspection result is analyzed based on the incident light having a wavelength of 520 nm, the inspection result may appear as shown in FIG.

Although the preferred embodiments have been illustrated and described above, the invention is not limited to the specific embodiments described above, and does not depart from the gist of the invention as claimed in the claims. Various modifications may be made by the person having the above, and these modifications should not be individually understood from the technical spirit or the prospect of the present invention.

Claims

Power unit 100 to provide a rotational force;

A rotation stage 200 having a predetermined area and configured to be rotatable on an XY plane about a predetermined rotation center axis extending in the Z axis direction connected to the power unit 100;

A lens unit 300 disposed on the rotation stage 200 and configured to be rotatable with the rotation stage 200 about the rotation center axis, and disposed on one side of the rotation stage 200;

Disposed on the rotation stage 200 and configured to be rotatable with the rotation stage 200 about the rotation center axis, disposed on an opposite side of the lens unit 300 with the rotation center axis therebetween and being rotated. A sample holder 400 rotatably connected to the stage 200 and fixing the sample; And

And an angle fixing part 500 disposed on the rotating stage 200 and configured to fix the angle of the sample holder 400.

The lens unit 300,

It has an incident surface 310 composed of a predetermined plane on the side facing the sample holder 400,

The sample holder 400,

A rotation shaft 410 extending in the Y-axis direction and connected to the rotation stage 200;

Rotating body 420, one end of which is connected to the rotary stage 200 through the rotating shaft 410, the pivot body 420 is pivotally connected on the XZ plane around the rotating shaft 410, and

It includes a light source unit 430 disposed in the rotation body 420,

The rotating body 420 has a mounting surface 460 on which a predetermined sample can be placed at a position facing the lens unit 300, and the rotating body 420 rotates about the rotating shaft 410. As the angle between the mounting surface 460 and the incident surface 310 is configured to vary,

The angle fixing part 500 fixes the sample holder 400 so that the angle between the mounting surface 460 and the incident surface 310 maintains a predetermined angle.

When the irradiation light generated by the light source unit 430 is irradiated onto the sample while the angle between the mounting surface 460 and the incident surface 310 is fixed at a predetermined angle, the sample is excited and generated. A sample inspection device (1) in which light is emitted through the lens unit (300).
The method of claim 1,

The lens unit 300,

Has a predetermined thickness in the Z axis direction,

The incident surface 310 is formed upright on the entire X-axis direction,

A sample inspection device (1) consisting of a semicircular lens having a semicircular curved surface formed on a rear surface in the X axis direction.
The method of claim 1,

The rotating body 420,

A rotating beam 440 having one end connected to the rotating shaft 410,

A housing 450 connected to the other end of the pivot beam 440 and having a space therein such that the light source unit 430 is mounted therein; and

The mounting surface (460) is a sample inspection device (1) is formed in a position facing the lens portion 300 in the rear of the X-axis direction of the housing (450).
The method of claim 3,

When the rotating beam 440 is upright, the angle between the mounting surface 460 and the incident surface 310 becomes 0 °, and the sample seated on the mounting surface 460 and the lens unit 300 are positioned. A sample inspection device (1) wherein the incident surface 310 is in close contact with each other.
The method of claim 4, wherein

The rotating beam 440 and the housing 450 are bent at a predetermined angle to each other,

The light source unit (430) is a sample inspection device (1) for irradiating light to the sample in a diagonal downward direction in the state in which the rotating beam (440) upright.
The method of claim 3,

The rotating body 420,

A fixing means 470 for positioning the sample lying on the mounting surface 460,

The fixing means 470 is disposed on the mounting surface 460,

A rotating shaft 472 extending in the Y-axis direction,

Including a rotation fixing pin 474 that rotates on the XZ plane around the rotation axis (472),

And the pivot fixing pin (474) partially covers the top of the sample to fix the position when the sample is placed on the mounting surface (460).
The method of claim 1,

The angle fixing part 500 is disposed in front of the sample holder 400 in the X axis direction,

A base jig 510 fixed to the rotation stage 200, and

A sample inspection device (1) comprising a pivoting jig (520) configured to be rotatable with respect to the base jig (510) to fix the position of the sample holder (400).
The method of claim 7, wherein

The rotation jig 520,

Rotating around a support shaft 514 disposed on both sides of the base in the Y-axis direction and extending in the X-axis direction,

When the pivoting jig 520 rotates upward with respect to the support shaft 514 while the sample holder 400 is upright, the pivoting jig 520 is front in the X-axis direction of the sample holder 400. A sample inspection device (1) configured to support and hold the sample holder (400) in position.
The method of claim 1,

The rotation stage 200,

A base stage 210 connected to the power unit 100,

An upper cover 220 covering an upper surface of the lens unit 300, and

It is provided on both sides of the sample holder 400 in the Y-axis direction and upright on the base stage 210 and connects the base stage 210 and the upper cover 220, the rear side of the lens unit 300 A sample inspection device (1) having a connection portion (230) in contact with the incident surface (310).
The method of claim 9,

The base stage 210 has a circular shape,

The upper surface of the base stage 210 is divided into a semicircular lens surface 214 and a base surface 112 having different heights, and the lens surface 214 is lower than the base surface 112. Has a stepped surface 216 formed between the lens surface 214 and the base surface 112,

The lens unit 300 is disposed on the lens surface 214,

And a light irradiation part and an angle fixing part (500) are arranged on the base surface (112).
The method of claim 10,

The sample inspection device (1), wherein the stepped surface (216) and the incident surface (310) of the lens unit (300) are positioned on the same surface and constitute one surface.
The method of claim 10,

On the base surface 112,

A sample inspection device (1) is formed on the outside of the angle fixing part 500 is formed with a fluid groove having a predetermined depth to fill a predetermined liquid material therein.
The method of claim 1,

The sample is

It has a transmissive portion made of a material having a predetermined area and a light transmissive so that a predetermined inspection sample is placed,

The sample inspection apparatus (1) of which the refractive index of the said transmission part is the same as the refractive index of the said lens part (300).
The method of claim 13,

The sample is

It includes a liquid solvent that is applied on the test sample placed on the transmissive portion and in close contact between the test sample and the transmissive portion and the incident surface 310 of the lens unit 300,

The sample inspection apparatus (1) of which the refractive index of the said liquid solvent is the same as the refractive index of the said lens part 300.
The method of claim 1,

A light passing part 600 disposed behind the lens part 300 in an X axis direction and having a predetermined slit 610 to allow light transmitted through the lens part 300 to pass therethrough; And

An analyzer 800 configured to perform analysis by incident light passing through the passage part; Sample inspection device (1) further comprising.
The method of claim 1,

Sample inspection apparatus (1) further comprises; an angle adjusting unit (700) for adjusting the rotation angle, and the initial angle of the rotation stage (200).