WO2017177611A1 - Chip security detection method, chip structure and chip module - Google Patents

Chip security detection method, chip structure and chip module Download PDF

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WO2017177611A1
WO2017177611A1 PCT/CN2016/098796 CN2016098796W WO2017177611A1 WO 2017177611 A1 WO2017177611 A1 WO 2017177611A1 CN 2016098796 W CN2016098796 W CN 2016098796W WO 2017177611 A1 WO2017177611 A1 WO 2017177611A1
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signal
chip
circuit
current loop
integrated circuit
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PCT/CN2016/098796
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Chinese (zh)
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段维虎
车诒恒
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广州小微电子技术有限公司
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    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/07Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/16Error detection or correction of the data by redundancy in hardware
    • G06F11/20Error detection or correction of the data by redundancy in hardware using active fault-masking, e.g. by switching out faulty elements or by switching in spare elements
    • G06F11/202Error detection or correction of the data by redundancy in hardware using active fault-masking, e.g. by switching out faulty elements or by switching in spare elements where processing functionality is redundant
    • G06F11/2023Failover techniques
    • G06F11/2033Failover techniques switching over of hardware resources
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/07Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/16Error detection or correction of the data by redundancy in hardware
    • G06F11/20Error detection or correction of the data by redundancy in hardware using active fault-masking, e.g. by switching out faulty elements or by switching in spare elements
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/07Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/16Error detection or correction of the data by redundancy in hardware
    • G06F11/20Error detection or correction of the data by redundancy in hardware using active fault-masking, e.g. by switching out faulty elements or by switching in spare elements
    • G06F11/202Error detection or correction of the data by redundancy in hardware using active fault-masking, e.g. by switching out faulty elements or by switching in spare elements where processing functionality is redundant
    • G06F11/2038Error detection or correction of the data by redundancy in hardware using active fault-masking, e.g. by switching out faulty elements or by switching in spare elements where processing functionality is redundant with a single idle spare processing component

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  • the signal receiver receives a signal output by the current loop and inputs the signal to the determining circuit
  • the determining circuit compares the signal received by the signal receiver with the specific signal, and if the two are the same, the chip is considered to be normal; if different, the current loop is considered to be abnormal.
  • the chip has security risks.
  • the invention also provides a chip module comprising a chip of a safety detecting circuit structure.
  • the invention has the beneficial effects of constructing a reflow circuit in a chip metal layer, and setting a signal generator, a signal receiver, a judging circuit and the like in the chip integrated circuit to form a safety detection circuit structure, and performing safety detection on the chip when the chip
  • the chip can output feedback information in time; the chip security detection method does not need to set the chip peripheral device, and the integration degree is high and reliability. Ok, responsive.
  • the current loop of the metal layer can freely adjust the size of the area that needs to be safely detected.
  • the chip provided by the invention avoids unpredictable risks during use, especially in devices or devices with poor working conditions.
  • FIG. 3 and FIG. 4 are schematic diagrams showing waveforms of a normal and abnormal operation of a chip safety detecting circuit according to the present invention
  • 5 and 6 are schematic diagrams showing the wiring direction and coverage area of the current loop of the present invention.
  • the signal output by the signal generator is a square wave signal, and the output level is “10101010...”; after the signal receiver receives the current signal of the current loop, the current loop is not subjected to In the case of destruction, if the current is normal, the output detection signal is still a square wave signal. For example, the output level is “10101010...”. In an abnormal situation, such as when the current loop is broken, the detection signal is inconsistent with the square wave signal, for example, Return circuit There is no signal output, that is, the output level is "00000000".
  • the determining circuit is configured as an exclusive OR gate structure, and the signal output by the signal generator and the signal sent by the signal receiver are input to the XOR gate, and the two signals are subjected to an exclusive OR operation. Output the result of the operation.
  • the safety detection circuit structure may be energized periodically or randomly according to specific requirements, and the current signal output of the safety detection circuit structure is detected.
  • the outer casing and the metal of the chip are described.
  • the layer has been corrupted and a warning signal is sent to the CPU to put the chip into a safe state for replacement.
  • This embodiment provides a chip having a security detection circuit structure, including the security detection circuit structure described in the foregoing embodiment.
  • the current loop overlies the upper surface of the integrated circuit as part of the metal layer.
  • the reflow circuit can also adjust the routing direction and the coverage area of the current loop according to the size of the chip integrated circuit and the needs of the specific application, as shown in the schematic diagrams of FIGS. 5 and 6.
  • the safety detection circuit structure is used in a chip module, and the circuit circuit structure covers a portion of the chip module that needs to be safely detected.

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  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Semiconductor Integrated Circuits (AREA)

Abstract

A chip security detection method. The chip at least comprises an integrated circuit, and a metal layer covering the integrated circuit. The method comprises: building a current loop on a metal layer; setting a signal generator, a signal receiver and a determination circuit in the integrated circuit; the signal generator outputting a specific signal, and the specific signal being input into the current loop; the current loop converting the specific signal into a detection signal, receiving the detection signal via the signal receiver and inputting the detection signal into the determination circuit; and the determination circuit determines whether the chip has a security risk according to the detection signal and the specific signal. In the chip security detection method, a current loop converting a specific signal into a detection signal, and then determining whether an abnormality occurs by comparing the detection signal with the specific signal, and therefore, a chip can be prevented from sustaining an unpredictable risk due to a damaged external factor.

Description

一种芯片安全检测方法、芯片结构、芯片模块Chip safety detection method, chip structure and chip module 技术领域Technical field
本发明涉及电子领域,尤其涉及一种芯片安全检测方法、芯片结构、芯片模块。The present invention relates to the field of electronics, and in particular, to a chip security detection method, a chip structure, and a chip module.
背景技术Background technique
随着经济的发展,电子芯片的运用范围越来越广,也越来越重要。因此对于安全性的要求也越来越高。为了保证芯片内部数据的安全,一般做法都是通过各种纠错验算法检查数据的正确性来确保数据的安全。这种传统的做法是基于芯片没有受到物理损坏的情况下检验芯片数据。然而,当芯片运用到产品中,产品往往需要移动、搬运等,这时就有可能因为发生碰撞等原因使芯片收到物理损坏,这种物理损坏可能会引起芯片各种不可预知的错误和故障。这种不可预知的错误和故障有时无法通过算法校验确认芯片是否出现问题。如果将这类出现物理损坏的芯片运用到一些危险性比较大的设备,则会带来不可预知的风险。With the development of the economy, the use of electronic chips is becoming more and more important and more and more important. Therefore, the requirements for security are also getting higher and higher. In order to ensure the security of the internal data of the chip, it is common practice to check the correctness of the data through various error correction algorithms to ensure the security of the data. This traditional approach is to verify chip data based on the fact that the chip is not physically damaged. However, when the chip is applied to the product, the product often needs to be moved, handled, etc., and the chip may be physically damaged due to collision or the like, which may cause various unpredictable errors and malfunctions of the chip. . This unpredictable error and failure sometimes cannot be verified by an algorithm to check if the chip has a problem. If such a physically damaged chip is applied to some potentially dangerous devices, there is an unpredictable risk.
为了预防出现以上的这种风险,很有必要设计一种解决方案,当芯片出现物理结构改变或损坏时,能及时输出反馈信息,便于系统马上启用备用器件,并提醒管理人员及时更换损坏的芯片。In order to prevent this kind of risk, it is necessary to design a solution. When the physical structure of the chip changes or is damaged, the feedback information can be output in time, so that the system can immediately enable the spare device and remind the management personnel to replace the damaged chip in time. .
鉴于此,本发明提出了一种可以运用在芯片中的安全检测电路结构,另外,本发明还提出一种芯片安全检测方法、芯片结构、芯片模块。 In view of this, the present invention proposes a security detection circuit structure that can be used in a chip. In addition, the present invention also provides a chip security detection method, a chip structure, and a chip module.
发明内容Summary of the invention
为了实现上述目的,本发明提供一种芯片安全检测方法,包括如下步骤:In order to achieve the above object, the present invention provides a chip security detection method, including the following steps:
构件回流电路,将特定信号通过回流电路后生成检测信号;a component reflow circuit that generates a detection signal after passing a specific signal through the reflow circuit;
根据所述检测信号生成判断信号;Generating a determination signal according to the detection signal;
将所述判断信号与特定信号进行比较,并根据比较的结果判断所述芯片是否正常工作。Comparing the determination signal with a specific signal, and judging whether the chip is working normally according to the result of the comparison.
优选的,所述特定信号为方波信号;Preferably, the specific signal is a square wave signal;
优选的,所述判断信号与特定信号通过采用异或运算进行比较。Preferably, the determination signal is compared with a specific signal by using an exclusive OR operation.
优选的,所述比较的结果包括:所述判断信号与特定信号相同或者所述判断信号与特定信号不相同;Preferably, the result of the comparison includes: the determination signal is the same as the specific signal or the determination signal is different from the specific signal;
优选的,当所述判断信号与特定信号相同时,则芯片正常工作;否则芯片异常工作。Preferably, when the determination signal is the same as the specific signal, the chip works normally; otherwise the chip operates abnormally.
本发明还提供的一种芯片安全检测方法,所述芯片至少包括一个集成电路以及一个覆盖所述集成电路的金属层;The invention also provides a chip security detecting method, the chip comprising at least one integrated circuit and a metal layer covering the integrated circuit;
所述的方法包括:在所述金属层上构建一个电流回路;The method includes: constructing a current loop on the metal layer;
在所述集成电路中设置信号发生器、信号接收器、判断电路;Providing a signal generator, a signal receiver, and a judging circuit in the integrated circuit;
所述信号发生器,输出一个特定信号,所述特定信号输入所述电流回路;The signal generator outputs a specific signal, and the specific signal is input to the current loop;
所述信号接收器接收所述电流回路输出的信号并将信号输入所述判断电路;The signal receiver receives a signal output by the current loop and inputs the signal to the determining circuit;
所述判断电路根据所述信号接收器接收到的信号跟所述特定信 号来判断所述芯片是否存在安全风险。The determining circuit is based on the signal received by the signal receiver and the specific signal No. to determine whether the chip has a security risk.
优选的,所述判断电路将所述信号接收器接收到的信号跟所述特定信号进行对比,如果两者相同,则认为所述芯片正常;如果不同,则认为所述电流回路出现异常,所述芯片则存在安全风险。Preferably, the determining circuit compares the signal received by the signal receiver with the specific signal, and if the two are the same, the chip is considered to be normal; if different, the current loop is considered to be abnormal. The chip has security risks.
优选的,所述判断电路是异或门,所述异或门将所述特定信号以及信号接收器接收到的信号进行异或运算,根据运算结果进行判断所述芯片是否存在风险。Preferably, the determining circuit is an exclusive OR gate, and the XOR gate performs an exclusive OR operation on the specific signal and the signal received by the signal receiver, and determines whether the chip is in danger according to the operation result.
优选的,所述电流回路覆盖所述集成电路的面积以及布线走向根据所述集成电路的大小或者需要进行安全检测的部分集成电路的面积来设计。Preferably, the area of the current loop covering the integrated circuit and the routing direction are designed according to the size of the integrated circuit or the area of a part of the integrated circuit that needs to be safely detected.
本发明还提供一种含有安全检测电路结构的芯片,其特征在于,至少包括一个集成电路以及一个覆盖所述集成电路的金属层;所述金属层含有一个电流回路,所述电流回路覆盖所需要安全检测的至少部分集成电路上表面;所述集成电路中至少包含一个信号发生器,用于给所述电流回路提供特定信号;一个信号接收器,用于接收所述电流回路输出的信号;以及一个判断电路,用于根据所述信号接收器接收到的信号以及所述信号发生器发出的特定信号判断所述芯片是否存在安全风险。The invention also provides a chip comprising a safety detection circuit structure, characterized in that it comprises at least one integrated circuit and a metal layer covering the integrated circuit; the metal layer contains a current loop, and the current loop covers the required Safely detecting at least a portion of the upper surface of the integrated circuit; the integrated circuit includes at least one signal generator for providing a specific signal to the current loop; and a signal receiver for receiving a signal output by the current loop; A judging circuit is configured to judge whether the chip has a security risk according to a signal received by the signal receiver and a specific signal sent by the signal generator.
优选的,所述判断电路是异或门,所述异或门将所述特定信号以及信号接收器接收到的信号进行异或运算,根据运算结果进行判断所述芯片是否存在风险。Preferably, the determining circuit is an exclusive OR gate, and the XOR gate performs an exclusive OR operation on the specific signal and the signal received by the signal receiver, and determines whether the chip is in danger according to the operation result.
本发明还提供一种含有安全检测电路结构芯片的芯片模块。 The invention also provides a chip module comprising a chip of a safety detecting circuit structure.
本发明的有益效果在于,在芯片金属层构建回流电路,以及在芯片集成电路中设置信号发生器、信号接收器、判断电路等构成安全检测电路结构的方法对芯片进行安全检测,当所述芯片在运用过程出现物理结构改变或损坏时,覆盖在所述集成电路表面的电流回路如果出现信号异常,芯片可及时输出反馈信息;该芯片安全检测方法不用设置芯片外围器件,集成度高,可靠性好,响应迅速。另外,还可以根据应用需要,金属层的电流回路走线自由调整需要安全检测的面积大小。本发明提供的芯片,在运用时,避免可能会带来不可预知的风险,尤其运用在工作环境恶劣的装置或设备。The invention has the beneficial effects of constructing a reflow circuit in a chip metal layer, and setting a signal generator, a signal receiver, a judging circuit and the like in the chip integrated circuit to form a safety detection circuit structure, and performing safety detection on the chip when the chip When the physical structure changes or is damaged during the application process, if there is a signal abnormality in the current loop covering the surface of the integrated circuit, the chip can output feedback information in time; the chip security detection method does not need to set the chip peripheral device, and the integration degree is high and reliability. Ok, responsive. In addition, according to the application needs, the current loop of the metal layer can freely adjust the size of the area that needs to be safely detected. The chip provided by the invention avoids unpredictable risks during use, especially in devices or devices with poor working conditions.
附图说明DRAWINGS
图1和图2是本发明一种芯片安全检测电路结构图;1 and 2 are structural diagrams of a chip security detecting circuit of the present invention;
图3和图4是本发明一种芯片安全检测电路结构正常以及异常工作情况的波形示意图;3 and FIG. 4 are schematic diagrams showing waveforms of a normal and abnormal operation of a chip safety detecting circuit according to the present invention;
图5和图6是本发明电流回路的布线走向以及覆盖面积示意图。5 and 6 are schematic diagrams showing the wiring direction and coverage area of the current loop of the present invention.
具体实施方式detailed description
下面,结合附图以及具体实施方式,对本发明做进一步描述:The present invention will be further described below in conjunction with the drawings and specific embodiments.
本发明提出的一种安全检测电路结构,包括一个电流回路结构,以及一个根据所述检测电路结构输出的信号作出对应的处理判断是否出现异常的信号检测结构。The invention provides a safety detecting circuit structure, comprising a current loop structure, and a signal detecting structure for performing corresponding processing according to the signal outputted by the detecting circuit structure to determine whether an abnormality occurs.
所述安全检测电路结构运用在芯片中,当检测出信号出现异常的情况下,可以通知系统启用备用器件,或者提醒管理人员及时更换损坏的芯片,避免芯片在毁坏的情况下仍然继续使用导致出现各种不可 预测的重大风险。The safety detection circuit structure is used in the chip. When the signal is abnormal, the system can be notified to enable the backup device, or the management personnel can be promptly replaced with the damaged chip to prevent the chip from continuing to be used in the event of destruction. Various A significant risk of prediction.
本发明还提出了安全检测电路结构的运用,以及一种芯片安全检测方法、芯片结构以及运用在芯片模块中的芯片模块结构。The invention also proposes the application of the safety detection circuit structure, and a chip safety detection method, a chip structure and a chip module structure used in the chip module.
下面参考附图和实施例,对本发明的技术方案作进一步说明。The technical solution of the present invention will be further described below with reference to the accompanying drawings and embodiments.
安全检测电路结构实施例Safety detection circuit structure embodiment
如图1至图2所示,本实施例提供的一种安全检测电路结构,包括一个电流回路结构,以及一个根据所述检测电路结构输出的信号作出对应的处理判断是否出现异常的信号检测结构;As shown in FIG. 1 to FIG. 2, the security detection circuit structure provided by the embodiment includes a current loop structure, and a signal detection structure that performs corresponding processing according to the signal outputted by the detection circuit structure to determine whether an abnormality occurs. ;
所述电流回路结构至少包括一个电流回路。The current loop structure includes at least one current loop.
所述信号检测结构至少包括:一个信号发生器,用于输出一个特定信号;一个信号接收器,用于接收前述电流回路结构输出的信号;一个将所述信号发生器输出的特定信号以及所述信号接收器接收到信号进行判断的判断电路结构。参照图2,通过信号发生器生产方波信号,然后将方波信号发送至回流电路与判断电路。所述方波信号经过回流电路之后后生成检测信号。所述判断电路根据其接收的检测与特定信号进行异或运算方式比较得出述芯片是否正常工作。The signal detecting structure includes at least: a signal generator for outputting a specific signal; a signal receiver for receiving a signal output by the current loop structure; a specific signal outputting the signal generator and the The signal receiver receives the signal to judge the structure of the circuit. Referring to Fig. 2, a square wave signal is generated by a signal generator, and then a square wave signal is sent to a return circuit and a judging circuit. The square wave signal passes through the reflow circuit to generate a detection signal. The judging circuit compares the detection received by the judging circuit with the specific signal to determine whether the chip works normally.
本实施例中,所述信号发生器输出的信号为方波信号,输出电平为“10101010……”;所述信号接收器接收了所述电流回路的电流信号后,所述电流回路没有受破坏的情况下,电流正常,则输出的检测信号仍为方波信号,例如输出电平为“10101010……”,异常情况下,比如电流回路断路了,则检测信号与方波信号不一致,例如回流电路 没有信号输出,即输出电平为“00000000…”。In this embodiment, the signal output by the signal generator is a square wave signal, and the output level is “10101010...”; after the signal receiver receives the current signal of the current loop, the current loop is not subjected to In the case of destruction, if the current is normal, the output detection signal is still a square wave signal. For example, the output level is “10101010...”. In an abnormal situation, such as when the current loop is broken, the detection signal is inconsistent with the square wave signal, for example, Return circuit There is no signal output, that is, the output level is "00000000...".
本实施例中,所述的判断电路结构为异或门结构,所述信号发生器输出的信号以及所述信号接收器发出的信号输入所述的异或门,前述两个信号通过异或运算输出运算结果。In this embodiment, the determining circuit is configured as an exclusive OR gate structure, and the signal output by the signal generator and the signal sent by the signal receiver are input to the XOR gate, and the two signals are subjected to an exclusive OR operation. Output the result of the operation.
本实施例中,所述的安全检测电路结构是具体这样工作来判断是否有异常情况出现,如表1所示,结合表格以及图3至图4可以看出,异或门输出方波时为异常情况。当检测到所述芯片安全检测电路结构输出的波形为方波时,即可预测芯片安全检测电路结构所检测的对象可能会出现异常。In this embodiment, the security detection circuit structure is specifically operated to determine whether an abnormal condition occurs, as shown in Table 1, together with the table and FIG. 3 to FIG. 4, the XOR gate outputs a square wave. abnormal situation. When it is detected that the waveform of the output of the chip safety detection circuit structure is a square wave, it may be predicted that the object detected by the chip safety detection circuit structure may be abnormal.
表1:安全检测电路结构工作过程的信号可能的情况列举Table 1: List of possible conditions for the signalling of the safety detection circuit structure
Figure PCTCN2016098796-appb-000001
Figure PCTCN2016098796-appb-000001
在其他实施例,所述的判断电路结构还可以是其他逻辑门结构,判断异常方法根据具体逻辑门的特点来设定;所述信号发生器输出的信号也不限于方波信号,均可以根据具体需要来设计,不限于本实施例。In other embodiments, the determining circuit structure may also be other logic gate structures, and the determining abnormality method is set according to the characteristics of the specific logic gate; the signal output by the signal generator is not limited to the square wave signal, and may be based on It is specifically designed as needed, and is not limited to this embodiment.
本实施例提供的一种芯片安全检测电路结构,其有益效果在于:所述的芯片安全检测电路结构具有物理结构安全检测功能,当检测结构出现物理结构改变或损坏时,能及时输出反馈信息。 A chip security detection circuit structure provided by this embodiment has the beneficial effects that: the chip security detection circuit structure has a physical structure security detection function, and when the detection structure has a physical structure change or damage, the feedback information can be output in time.
安全检测电路结构运用实施例Safety detection circuit structure application example
方法实施例Method embodiment
本发明提出一种芯片安全检测方法,所述芯片至少包括一个集成电路以及一个覆盖所述集成电路的金属层;The invention provides a chip security detecting method, the chip comprising at least one integrated circuit and a metal layer covering the integrated circuit;
所述的方法包括:在所述金属层上构建一个电流回路;The method includes: constructing a current loop on the metal layer;
在所述集成电路中设置一个信号发生器、一个信号接收器、一个判断电路;Providing a signal generator, a signal receiver, and a determining circuit in the integrated circuit;
所述信号发生器,输出一个特定信号,所述特定信号输入所述电流回路;The signal generator outputs a specific signal, and the specific signal is input to the current loop;
所述信号接收器接收所述电流回路输出的信号并将信号输入所述判断电路;The signal receiver receives a signal output by the current loop and inputs the signal to the determining circuit;
所述判断电路将所述信号接收器接收到的信号跟所述特定信号进行判断所述芯片是否存在安全风险。The determining circuit determines whether the chip has a security risk by using the signal received by the signal receiver and the specific signal.
本实施例,所述判断电路将所述信号接收器接收到的信号跟所述特定信号进行对比两者是否相同,如果相同,则认为所述电流回路正常工作,即所述芯片正常;如果不同,则认为所述电流回路出现异常,即覆盖在所述集成电路的金属层受到损坏,所述芯片则存在安全风险。In this embodiment, the determining circuit compares whether the signal received by the signal receiver is compared with the specific signal, and if they are the same, the current loop is considered to be working normally, that is, the chip is normal; if different It is considered that the current loop is abnormal, that is, the metal layer covering the integrated circuit is damaged, and the chip has a safety risk.
在其他实施例,所述判断电路可以是异或门,当所述特定信号以及信号接收器接收到的信号输入所述异或门进行异或运算,最后根据所述异或门输出的信号进行判断芯片是否存在风险。 In other embodiments, the determining circuit may be an exclusive OR gate, and when the specific signal and the signal received by the signal receiver are input to the XOR gate for exclusive OR operation, finally according to the signal output by the XOR gate. Determine if the chip is at risk.
所述电流回路的覆盖面积以及布线走向可以根据所述集成电路的大小或者需要安全检测的部分集成电路的面积进行设计。The coverage area of the current loop and the routing direction may be designed according to the size of the integrated circuit or the area of a portion of the integrated circuit that needs to be safely detected.
本实施例提供的一种芯片安全检测方法,有益效果在于,在芯片金属层构建回流电路,以及在芯片集成电路中设置信号发生器、信号接收器、判断电路等构成安全检测电路结构的方法对芯片进行安全检测,当所述芯片在运用过程出现物理结构改变或损坏时,覆盖在所述集成电路表面的电流回路如果出现信号异常,芯片可及时输出反馈信息;该芯片安全检测方法不用设置芯片外围器件,集成度高,可靠性好,响应迅速。另外,还可以根据应用需要,金属层的电流回路走线自由调整需要安全检测的面积大小。A chip security detection method provided by this embodiment has the beneficial effects of constructing a reflow circuit in a metal layer of the chip, and setting a signal generator, a signal receiver, a judgment circuit, and the like in the chip integrated circuit to form a safety detection circuit structure. The chip performs safety detection. When the physical structure changes or is damaged during the operation of the chip, if a signal abnormality occurs in the current loop covering the surface of the integrated circuit, the chip can output feedback information in time; the chip security detection method does not need to set the chip. Peripheral devices with high integration, good reliability and fast response. In addition, according to the application needs, the current loop of the metal layer can freely adjust the size of the area that needs to be safely detected.
具有安全检测电路结构的芯片实施例Chip embodiment with safety detection circuit structure
本实施例提供了一种具有安全检测电路结构的芯片,包含前述实施例中所述安全检测电路结构。This embodiment provides a chip having a security detection circuit structure, including the security detection circuit structure described in the foregoing embodiment.
具体的,一种含有安全检测电路结构的芯片,至少包括一个集成电路以及一个覆盖所述集成电路的金属层;所述金属层含有一个电流回路,所述电流回路覆盖所需要安全检测的至少一部分集成电路上表面;所述集成电路中至少包含一个信号发生器,用于给所述电流回路提供特定信号;一个信号接收器,用于接收所述电流回路输出的信号;以及一个判断电路,用于判断所述信号接收器接收到的信号以及所述信号发生器发出的特定信号是否一致,如果一致,则认为所述芯片安全,否则认为所述芯片存在安全风险。Specifically, a chip including a safety detecting circuit structure includes at least one integrated circuit and a metal layer covering the integrated circuit; the metal layer includes a current loop covering at least a portion of the required safety detection An upper surface of the integrated circuit; the integrated circuit includes at least one signal generator for providing a specific signal to the current loop; a signal receiver for receiving a signal output by the current loop; and a determining circuit for It is determined whether the signal received by the signal receiver and the specific signal sent by the signal generator are consistent. If they are consistent, the chip is considered to be safe, otherwise the chip is considered to have a security risk.
所述电流回路作为所述金属层的一部分覆盖在所述集成电路上 表面。所述回流电路还可以根据所述芯片集成电路的大小以及具体应用时的需要对所述电流回路的布线走向以及覆盖面积作出调整,如图4和图5的示意图所示。The current loop overlies the integrated circuit as part of the metal layer surface. The reflow circuit can also adjust the routing direction and the coverage area of the current loop according to the size of the chip integrated circuit and the needs of the specific application, as shown in the schematic diagrams of FIGS. 4 and 5.
所述芯片在运用过程,可根据具体需求定期或者随机对所述安全检测电路结构通电,检测所述安全检测电路结构的电流信号输出情况,当检测到异常信号,说明所述芯片的外壳及金属层已受到破坏,此时发出一个警告信号给CPU,让所述芯片进入安全状态等候更换。During the operation of the chip, the safety detection circuit structure may be energized periodically or randomly according to specific requirements, and the current signal output of the safety detection circuit structure is detected. When an abnormal signal is detected, the outer casing and the metal of the chip are described. The layer has been corrupted and a warning signal is sent to the CPU to put the chip into a safe state for replacement.
由于所述安全检测电路结构中的电流回路在所述金属层构建,覆盖在所述集成电路上表面,当所述芯片在运用过程出现物理结构改变或损坏时,覆盖在所述集成电路表面的电流回路如果出现信号异常,芯片可及时输出反馈信息,便于系统马上启用备用器件,并提醒管理人员及时更换损坏的芯片。避免该芯片运用到一些危险性比较大的设备,可能会带来不可预知的风险,本实施例提供的芯片尤其适合运用在工作环境恶劣的装置或设备。Since the current loop in the safety detecting circuit structure is built on the metal layer, covering the upper surface of the integrated circuit, when the chip has a physical structure change or damage during the application, covering the surface of the integrated circuit If there is a signal abnormality in the current loop, the chip can output feedback information in time, so that the system can immediately enable the spare device and remind the management to replace the damaged chip in time. Avoiding the use of the chip to some dangerous devices may bring unpredictable risks. The chip provided in this embodiment is particularly suitable for use in a device or device with a harsh working environment.
所述安全检测电路结构集成在芯片内部,没有外围器件,集成度高,可靠性好,响应迅速。另外,还可以根据应用需要,调整金属层的电流回路的走线自由调整需要防范安全检测的面积大小。The safety detection circuit structure is integrated inside the chip, has no peripheral components, has high integration, good reliability, and rapid response. In addition, according to the needs of the application, the adjustment of the wiring of the current loop of the metal layer can be adjusted to prevent the area of the safety detection.
具有安全检测电路结构的芯片实施例Chip embodiment with safety detection circuit structure
本实施例提供了一种具有安全检测电路结构的芯片,包含前述实施例中所述安全检测电路结构。This embodiment provides a chip having a security detection circuit structure, including the security detection circuit structure described in the foregoing embodiment.
具体的,一种含有安全检测电路结构的芯片,至少包括一个集成 电路以及一个覆盖所述集成电路的金属层;所述金属层含有一个电流回路,所述电流回路覆盖所需要安全检测的至少一部分集成电路上表面;所述集成电路中至少包含一个信号发生器,用于给所述电流回路提供特定信号;一个信号接收器,用于接收所述电流回路输出的信号;以及一个判断电路,用于判断所述信号接收器接收到的信号以及所述信号发生器发出的特定信号是否一致,如果一致,则认为所述芯片安全,否则认为所述芯片存在安全风险。Specifically, a chip containing a security detection circuit structure includes at least one integration a circuit and a metal layer covering the integrated circuit; the metal layer comprising a current loop covering at least a portion of the upper surface of the integrated circuit required for safe detection; the integrated circuit including at least one signal generator Providing a specific signal to the current loop; a signal receiver for receiving a signal output by the current loop; and a determining circuit for determining a signal received by the signal receiver and the signal generator Whether the specific signals sent are consistent, if they are consistent, the chip is considered to be safe, otherwise the chip is considered to be a security risk.
所述电流回路作为所述金属层的一部分覆盖在所述集成电路上表面。所述回流电路还可以根据所述芯片集成电路的大小以及具体应用时的需要对所述电流回路的布线走向以及覆盖面积作出调整,如图5和图6的示意图所示。The current loop overlies the upper surface of the integrated circuit as part of the metal layer. The reflow circuit can also adjust the routing direction and the coverage area of the current loop according to the size of the chip integrated circuit and the needs of the specific application, as shown in the schematic diagrams of FIGS. 5 and 6.
所述芯片在运用过程,可根据具体需求定期或者随机对所述安全检测电路结构通电,检测所述安全检测电路结构的电流信号输出情况,当检测到异常信号,说明所述芯片的外壳及金属层已受到破坏,此时发出一个警告信号给CPU,让所述芯片进入安全状态等候更换。During the operation of the chip, the safety detection circuit structure may be energized periodically or randomly according to specific requirements, and the current signal output of the safety detection circuit structure is detected. When an abnormal signal is detected, the outer casing and the metal of the chip are described. The layer has been corrupted and a warning signal is sent to the CPU to put the chip into a safe state for replacement.
由于所述安全检测电路结构中的电流回路在所述金属层构建,覆盖在所述集成电路上表面,当所述芯片在运用过程出现物理结构改变或损坏时,覆盖在所述集成电路表面的电流回路如果出现信号异常,芯片可及时输出反馈信息,便于系统马上启用备用器件,并提醒管理人员及时更换损坏的芯片。避免该芯片运用到一些危险性比较大的设备,可能会带来不可预知的风险,本实施例提供的芯片尤其适合运用在工作环境恶劣的装置或设备。 Since the current loop in the safety detecting circuit structure is built on the metal layer, covering the upper surface of the integrated circuit, when the chip has a physical structure change or damage during the application, covering the surface of the integrated circuit If there is a signal abnormality in the current loop, the chip can output feedback information in time, so that the system can immediately enable the spare device and remind the management to replace the damaged chip in time. Avoiding the use of the chip to some dangerous devices may bring unpredictable risks. The chip provided in this embodiment is particularly suitable for use in a device or device with a harsh working environment.
所述安全检测电路结构集成在芯片内部,没有外围器件,集成度高,可靠性好,响应迅速。另外,还可以根据应用需要,调整金属层的电流回路的走线自由调整需要防范安全检测的面积大小。The safety detection circuit structure is integrated inside the chip, has no peripheral components, has high integration, good reliability, and rapid response. In addition, according to the needs of the application, the adjustment of the wiring of the current loop of the metal layer can be adjusted to prevent the area of the safety detection.
安全检测电路结构运用在芯片模块实施例Safety detection circuit structure used in chip module embodiment
本发明提供了所述一种芯片模块结构,至少包含一个上述的安全检测电路结构。The present invention provides the chip module structure including at least one of the above-described security detection circuit structures.
所述安全检测电路结构运用在芯片模块当中,所述电路回路结构覆盖在所述芯片模块中需要做安全检测的部位。The safety detection circuit structure is used in a chip module, and the circuit circuit structure covers a portion of the chip module that needs to be safely detected.
本发明还提供了所述一种芯片模块结构,至少包含一个前述的含有安全检测电路结构的芯片。The present invention also provides the chip module structure comprising at least one of the aforementioned chips including a safety detecting circuit structure.
对本领域的技术人员来说,可根据以上描述的技术方案以及构思,做出其它各种相应的改变以及形变,而所有的这些改变以及形变都应该属于本发明权利要求的保护范围之内。 Various other changes and modifications may be made by those skilled in the art in light of the above-described technical solutions and concepts, and all such changes and modifications are intended to fall within the scope of the appended claims.

Claims (12)

  1. 一种芯片安全检测方法,其特征在于,包括如下步骤:A chip security detection method, comprising the steps of:
    构建回流电路,将特定信号通过回流电路后生成检测信号;Constructing a reflow circuit to generate a detection signal after passing a specific signal through the reflow circuit;
    根据所述检测信号生成判断信号;Generating a determination signal according to the detection signal;
    将所述判断信号与特定信号进行比较,并根据比较的结果判断所述芯片是否正常工作。Comparing the determination signal with a specific signal, and judging whether the chip is working normally according to the result of the comparison.
  2. 根据权利要求1所述的芯片安全检测方法,其特征在于,所述特定信号为方波信号。The chip security detecting method according to claim 1, wherein the specific signal is a square wave signal.
  3. 根据权利要求1或2所述的芯片安全检测方法,其特征在于,所述判断信号与特定信号通过采用异或运算进行比较。The chip security detecting method according to claim 1 or 2, wherein the determination signal and the specific signal are compared by using an exclusive OR operation.
  4. 根据权利要求3所述的芯片安全检测方法,其特征在于,所述比较的结果包括:所述判断信号与特定信号相同,或者所述判断信号与特定信号不相同。The chip security detecting method according to claim 3, wherein the result of the comparing comprises: the determining signal is the same as the specific signal, or the determining signal is different from the specific signal.
  5. 根据权利要求4所述的芯片安全检测方法,其特征在于,当所述判断信号与特定信号相同时,则芯片正常工作;否则芯片异常工作。The chip security detection method according to claim 4, wherein when the determination signal is the same as the specific signal, the chip operates normally; otherwise, the chip operates abnormally.
  6. 一种芯片安全检测方法,所述芯片至少包括集成电路以及覆盖所述集成电路的金属层;A chip security detecting method, the chip comprising at least an integrated circuit and a metal layer covering the integrated circuit;
    所述方法包括:在所述金属层上构建电流回路;The method includes constructing a current loop on the metal layer;
    在所述集成电路中设置信号发生器、信号接收器、判断电路;Providing a signal generator, a signal receiver, and a judging circuit in the integrated circuit;
    通过所述信号发生器生成特定信号,并将所述特定信号输入所述电流回路;Generating a specific signal by the signal generator and inputting the specific signal to the current loop;
    在所述信号接收器接收所述电流回路输出的信号之后,并将该信 号输入至所述判断电路;After the signal receiver receives the signal output by the current loop, and the signal is received Number input to the determination circuit;
    在所述判断电路接收到由所述信号接收器发出的信号之后,根据该信号与所述特定信号来判断芯片是否存在安全风险。After the judging circuit receives the signal sent by the signal receiver, it determines whether the chip has a security risk according to the signal and the specific signal.
  7. 根据权利要求6所述的芯片安全检测方法,其特征在于,The chip security detecting method according to claim 6, wherein
    所述判断电路将所述信号接收器接收到的信号跟所述特定信号进行对比,如果两者相同,则认为所述芯片正常;如果不同,则认为所述电流回路出现异常,所述芯片则存在安全风险。The determining circuit compares the signal received by the signal receiver with the specific signal, and if the two are the same, the chip is considered to be normal; if different, the current loop is considered to be abnormal, and the chip is There is a security risk.
  8. 根据权利要求6所述的芯片安全检测方法,其特征在于,The chip security detecting method according to claim 6, wherein
    所述判断电路是异或门,所述异或门将所述特定信号以及信号接收器接收到的信号进行异或运算,根据运算结果进行判断芯片是否存在风险。The determining circuit is an exclusive OR gate, and the XOR gate performs an exclusive OR operation on the specific signal and the signal received by the signal receiver, and determines whether the chip is at risk according to the operation result.
  9. 根据权利要求6所述的芯片安全检测方法,其特征在于,The chip security detecting method according to claim 6, wherein
    所述电流回路覆盖所述集成电路的面积根据所述集成电路的大小或者需要进行安全检测的部分集成电路的面积来确定。The area of the current loop covering the integrated circuit is determined according to the size of the integrated circuit or the area of a portion of the integrated circuit that needs to be safely detected.
  10. 一种含有安全检测电路结构的芯片,其特征在于,至少包括一个集成电路以及一个覆盖所述集成电路的金属层;所述金属层含有电流回路,所述电流回路覆盖所需要安全检测的至少部分集成电路上表面;A chip comprising a safety detection circuit structure, comprising at least one integrated circuit and a metal layer covering the integrated circuit; the metal layer containing a current loop covering at least a portion of the required safety detection The upper surface of the integrated circuit;
    所述集成电路中包括:The integrated circuit includes:
    信号发生器,用于给所述电流回路提供特定信号;a signal generator for providing a specific signal to the current loop;
    信号接收器,用于接收所述电流回路输出的信号;a signal receiver, configured to receive a signal output by the current loop;
    以及判断电路,用于根据所述信号接收器接收到的信号以及所述 信号发生器发出的特定信号判断所述芯片是否存在安全风险。And a judging circuit for receiving a signal according to the signal receiver and the The specific signal from the signal generator determines if the chip is at risk of security.
  11. 根据权利要求10所述的一种含有安全检测电路结构的芯片,其特征在于,A chip including a security detecting circuit structure according to claim 10, wherein
    所述判断电路是异或门,所述异或门将所述特定信号以及信号接收器接收到的信号进行异或运算,根据运算结果进行判断所述芯片是否存在风险。The determining circuit is an exclusive OR gate, and the XOR gate performs an exclusive OR operation on the specific signal and the signal received by the signal receiver, and determines whether the chip is in danger according to the operation result.
  12. 一种芯片模块,至少包括权利要求8所述的一种含有安全检测电路结构的芯片。 A chip module comprising at least the chip of claim 8 having a security detection circuit structure.
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