WO2017166801A1 - 基于光频域反射的分布式应变温度同时测量装置及方法 - Google Patents
基于光频域反射的分布式应变温度同时测量装置及方法 Download PDFInfo
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/16—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge
- G01B11/161—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge by interferometric means
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
- G01D21/00—Measuring or testing not otherwise provided for
- G01D21/02—Measuring two or more variables by means not covered by a single other subclass
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/16—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/16—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge
- G01B11/168—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge by means of polarisation
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/16—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge
- G01B11/18—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge using photoelastic elements
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
- G01D5/00—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable
- G01D5/26—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light
- G01D5/32—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light with attenuation or whole or partial obturation of beams of light
- G01D5/34—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light with attenuation or whole or partial obturation of beams of light the beams of light being detected by photocells
- G01D5/353—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light with attenuation or whole or partial obturation of beams of light the beams of light being detected by photocells influencing the transmission properties of an optical fibre
- G01D5/35303—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light with attenuation or whole or partial obturation of beams of light the beams of light being detected by photocells influencing the transmission properties of an optical fibre using a reference fibre, e.g. interferometric devices
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
- G01D5/00—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable
- G01D5/26—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light
- G01D5/32—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light with attenuation or whole or partial obturation of beams of light
- G01D5/34—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light with attenuation or whole or partial obturation of beams of light the beams of light being detected by photocells
- G01D5/353—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light with attenuation or whole or partial obturation of beams of light the beams of light being detected by photocells influencing the transmission properties of an optical fibre
- G01D5/35306—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light with attenuation or whole or partial obturation of beams of light the beams of light being detected by photocells influencing the transmission properties of an optical fibre using an interferometer arrangement
- G01D5/35329—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light with attenuation or whole or partial obturation of beams of light the beams of light being detected by photocells influencing the transmission properties of an optical fibre using an interferometer arrangement using interferometer with two arms in transmission, e.g. Mach-Zender interferometer
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K11/00—Measuring temperature based upon physical or chemical changes not covered by groups G01K3/00, G01K5/00, G01K7/00 or G01K9/00
- G01K11/32—Measuring temperature based upon physical or chemical changes not covered by groups G01K3/00, G01K5/00, G01K7/00 or G01K9/00 using changes in transmittance, scattering or luminescence in optical fibres
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B6/00—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
- G02B6/24—Coupling light guides
- G02B6/26—Optical coupling means
- G02B6/28—Optical coupling means having data bus means, i.e. plural waveguides interconnected and providing an inherently bidirectional system by mixing and splitting signals
- G02B6/293—Optical coupling means having data bus means, i.e. plural waveguides interconnected and providing an inherently bidirectional system by mixing and splitting signals with wavelength selective means
- G02B6/29346—Optical coupling means having data bus means, i.e. plural waveguides interconnected and providing an inherently bidirectional system by mixing and splitting signals with wavelength selective means operating by wave or beam interference
- G02B6/2935—Mach-Zehnder configuration, i.e. comprising separate splitting and combining means
Definitions
- the invention relates to the technical field of distributed optical fiber sensing instruments, in particular to a distributed strain temperature simultaneous measuring device and method based on optical frequency domain reflection.
- High-precision and high spatial resolution distributed strain sensing is widely used in many fields such as people's death and national defense security, such as structural monitoring of aircraft, spacecraft, ships, defense equipment, industrial equipment, bridge culverts, etc.
- Rayleigh scattering spectral shift of single-mode fiber in optical frequency domain reflection can realize distributed temperature strain sensing with high precision and high spatial resolution.
- the temperature and strain change at the same time, which will cause the Rayleigh scattering spectrum to move, that is, the cross-sensitive problem.
- New approaches are needed to overcome cross-sensitive issues.
- the present invention proposes a temperature-sense sensing cross-sensing system for optical frequency domain reflection, which performs distributed strain temperature measurement based on Rayleigh scattering spectrum shift of single-mode fiber in optical frequency domain reflection.
- Two kinds of optical fibers with different diameters are juxtaposed together as sensing fibers. Due to the different temperature and strain coefficient of the same-diameter cladding fiber, the matrix operation can be used to obtain temperature and strain values that change simultaneously with temperature and strain, thus achieving elimination.
- the effect of temperature-sense sensing cross-sensitivity in optical frequency domain reflection is a temperature-sense sensing cross-sensitivity in optical frequency domain reflection.
- the invention provides a distributed strain temperature simultaneous measuring device based on optical frequency domain reflection, which comprises a tunable laser, a 1:99 beam splitter, a main interferometer system, a light source phase monitoring system based on an auxiliary interferometer, Acquisition device and computer processing unit; wherein:
- the tunable laser for providing a light source to the device for linear scanning
- the 1:99 beam splitter, the outgoing light of the tunable laser is entered by a port of the 1:99 beam splitter, and the 1:99 beam splitter is respectively at a ratio of 1:99
- the other two ports are assigned to the optical phase monitoring system based on the auxiliary interferometer and the main interferometer system;
- the light source phase monitoring system based on the auxiliary interferometer is configured to collect phase information of the output light in real time, and the structure thereof comprises an isolator, a 50:50 coupler, first and second Faraday rotating mirrors, a delay fiber and a detector, wherein : Isolator to prevent reflected light from the 50:50 coupler from entering the tunable laser; 50:50 coupler for optical interference; light passing through the isolator into port 50 of the 50:50 coupler, from 50: The coupler's port three and four exits are respectively reflected by the first and second Faraday rotating mirrors of the two arms of the auxiliary phase sensor based phase monitoring system, and are returned to the port of the 50:50 coupler three, four, two The beam of light interferes in the 50:50 coupler, the interfering light exits from the port of the 50:50 coupler, and the outgoing light is collected by the detector;
- the main interferometer system (33) measures the back-direction Rayleigh scattering in the two sensing fibers by using the interference principle, and the structure includes two Mach-Zehnder interferometers for measuring the back-direction of a sensing fiber. Diffusion, separated by a beam splitter, wherein: each Mach-Zehnder interferometer includes a circulator, a 50:50 beam splitter, a 50:50 coupler, a polarization controller, a sensing fiber, and first and second polarizations, respectively a beam splitter and first and second balance detectors; the acquisition device converts the first and second balance detectors of the two Mach-Zehnder interferometers, and outputs the analog electrical signals to the first and second polarization beam splitters The signal is transmitted to a computer processing unit; the computer processing unit performs data processing on the acquired interference signal to obtain a strain measurement result; wherein, the structure of the Mach-Zehnder interferometer includes: light enters from the port of the 50:50 beam
- the c-end of the second polarization beam splitter, the s-ends of the first and second polarization beam splitters are connected to the first balance detector, and the p-ends of the first and second polarization beam splitters are connected to the second balance detection.
- the sensing fiber is composed of two kinds of fibers with different cladding diameters, and generates Rayleigh scattering spectral frequency shift.
- the temperature change ⁇ T and the strain change ⁇ are obtained according to the following relationship. :
- the temperature sensing coefficients K T1 and K T2 of the sensing fiber, the strain sensing coefficients K S1 and K S2 , and the Rayleigh scattering spectral shifts of the first and second sensing fibers are ⁇ f 1 and ⁇ f 2 , respectively .
- the invention also proposes a distributed strain temperature simultaneous measurement method based on optical frequency domain reflection, the method comprising the following steps:
- Step 1 The outgoing light of the tunable laser is entered by a port of the 1:99 optical beam splitter and is respectively distributed from the other two ports of the 1:99 optical beam splitter in a ratio of 1:99.
- Optical phase monitoring system and main interferometer system based on auxiliary K S1 K T2 -K T1 K S2 ⁇ 0 interferometer;
- Step 2 real-time collecting output optical phase information by using a light source phase monitoring system based on the auxiliary interferometer
- Step 3 Using the main interferometer system to measure the back-direction Rayleigh scattering in the two sensing fibers by using the interference principle, the sensing fiber as the fiber to be tested is composed of two different cladding diameter fibers, and the main interferometer system measures The back-direction Rayleigh scattering signals are transmitted to the computer in the two sensing fibers, and the data is processed by cross-correlation and the like by the computer to obtain the back-direction Rayleigh scattering spectral frequency shift.
- the two single-mode fibers with different cladding diameters are calibrated at different temperatures and strains to obtain the Rayleigh scattering spectral frequency shift. Calibration curves at different temperatures and Rayleigh scattering spectral shifts at different strain calibration curves;
- the temperature sensing coefficients KT1 and KT2 of the two kinds of optical fibers are obtained by using the Rayleigh scattering spectral frequency shift calibration curves at different temperatures, and the strain sensing coefficients KS1 and KS2 are obtained by using Rayleigh scattering spectral frequency shifting on different strain calibration curves;
- the distributed strain temperature simultaneous measuring device based on optical frequency domain reflection is used to demodulate the Rayleigh scattering spectral frequency shift of the sensing fiber to ⁇ f 1 and ⁇ f 2 , and the corresponding temperature change is ⁇ T, the strain change is ⁇ , which is obtained by the following relationship:
- Step 4 Perform data processing on the collected interference signal to obtain a strain measurement result.
- the invention provides the simultaneous measurement of temperature strain parameters by using optical fibers with different cladding diameters, that is, standard optical fibers and fine-diameter optical fibers.
- the two optical fibers constituting the sensing optical fiber are not limited to standard optical fibers and fine-diameter optical fibers, and both types are satisfied.
- the temperature sensing coefficients K T1 and K T2 of the optical fiber and the strain sensing coefficients K S1 and K S2 have a relationship: K S1 K T2 -K T1 K S2 ⁇ 0, which can simultaneously measure the temperature change and the strain change parameter.
- FIG. 1 is a schematic structural view of a moving strain temperature simultaneous sensing system based on optical fiber Rayleigh scattering spectrum in optical frequency domain reflection;
- a first sensing fiber 16. a first polarization beam splitter;
- a second polarization beam splitter 18.
- a first balance detector 19.
- Second balance detector 20. Acquisition device;
- the temperature-sense sensing cross-sensing system for optical frequency domain reflection in the present invention includes: a tunable laser 1, a 1:99 beam splitter 4, a main interferometer system 33, and a light source based on an auxiliary interferometer.
- Phase monitoring system 34 and computer processing unit 11 wherein:
- the tunable laser 1 is used to provide a light source for the system, and the optical frequency can realize linear scanning; 1:99 optical beam splitter 4: The outgoing light of the tunable laser 1 is entered by the 4a port of the 1:99 optical beam splitter 4 And distributed to the optical phase monitoring system 34 and the main interferometer system 33 based on the auxiliary interferometer from the 4b port and the 4c port of the 1:99 optical beam splitter 4 in a ratio of 1:99;
- the light source phase monitoring system 34 based on the auxiliary interferometer is configured to collect real-time light source output optical phase information, and the structure thereof includes the isolator 10, the second 50:50 coupler 5, the first Faraday rotating mirror 8 and the second Faraday rotating mirror 9. Delay fiber 7 and detector 2;
- Isolator 10 for preventing reflected light from the 4b port of the second 50:50 coupler 5 from entering the tunable laser 1; second 50:50 coupler 5 for optical interference; light from the second 50:50 coupler
- the 5b port of 5 enters, exits from the 5c port and the 5d port of the second 50:50 coupler 5, and is coupled to the first Faraday rotator 8 and the second Faraday rotation of the arms of the source phase monitoring system 34 of the auxiliary interferometer, respectively.
- the mirror 9 reflects and returns to the 5c port and the 5d port of the second 50:50 coupler 5, and the two beams interfere in the 50:50 coupler 5, and are output from the 5a port of the second 50:50 coupler 5;
- the first Faraday rotator 8 and the second Faraday rotator 9 provide reflection based on the source phase monitoring system 34 of the auxiliary interferometer and are capable of eliminating polarization fading phenomena;
- the delay fiber 7 is used to realize beat frequency interference of the non-equal arm
- a detector 2 for collecting the outgoing light of the port of the second 50:50 coupler 5a;
- the main interferometer system 33 comprises two Mach-Zehnder interferometers, separated by a first beam splitter 21, one of which is a first Mach-Zehnder interferometer, a first circulator 13, a first 50:50 beam splitter 3, a third 50:50 coupler 14, a polarization controller 12, a first sensing fiber 15 and first and second polarization beam splitters 16 and 17 and first and second balance detectors 18 and 19; the other is Mach
- the Zender interferometer includes a second circulator 25, a second beam splitter 24, a fourth 50:50 coupler 27, a polarization controller 26, a second sensing fiber 32, and third and fourth polarization beam splitters 28 and 29 and third and fourth balance detectors 30 and 31; the acquisition device 20 will be the first and second balance detectors 18, 19, the first and second polarization beam splitters 28 and 29 of the two Mach-Zehnder interferometers.
- the output analog electrical signal converted digital signal is transmitted to the computer processing unit 11.
- the first 50:50 beam splitter 3 in the first Mach-Zehnder interferometer acts as an interferometer beam splitting, the light entering from the 3a port of the first 50:50 beam splitter 3, passing through the first 50:50 beam splitter 3
- the 3b port enters the polarization controller 12 of the interferometer reference arm 22, enters the port 13a of the first circulator 13 of the interferometer test arm 23 through the 3c port of the first 50:50 beam splitter 3;
- the polarization controller 12 on the Mach-Zehnder interferometer reference arm 22 is configured to adjust the polarization state of the reference light such that the light intensity is uniform in two orthogonal directions when the polarization beam splits;
- the first circulator 13 on the Mach-Zehnder interferometer test arm 23 light enters from the port 13a of the first circulator 13, enters the fiber 15 to be tested from the port 13c of the first circulator 13, and the back of the fiber 15 to be tested
- the Rayleigh scattered light enters from the 13c port of the first circulator 13 and is output from the 13b port of the first circulator 13;
- the device is combined to form beat interference and output from the 14c port and the 14d port of the third 50:50 coupler 14; the 14c port and the 14d port output optical signal of the third 50:50 coupler 14 are respectively connected to the first
- the c-ends of the second polarization beam splitters 16 and 17, the s-terminals of the first and second polarization beam splitters 16 and 17 are connected to the first balance detector 18, and the first and second polarization beam splitters 16 and 17
- the p-end is connected to the second balance detector 19.
- the second Mach-Zehnder interferometer is a second circulator 25, a second beam splitter 24, a fourth 50:50 coupler 27, a polarization controller 26, a second sensing fiber 32, and third and fourth polarization points.
- Beams 28 and 29 and third and fourth balance detectors 30 and 31 are connected in the same manner as the first Mach-Zehnder interferometer.
- the first to fourth polarization beam splitters 16, 17, 28, 29 separate the polarization orthogonal two polarizations of the optical signal, and output them at the s terminal and the p terminal, respectively.
- the first to fourth balance detectors 18, 19, 30, 31 and the detector 2 convert the optical signal into an electrical signal;
- the collecting device 20 collects the analog electrical signals output by the third and fourth balancing detectors 30, 31 and the detector 2 to the computer processing unit 11; wherein the computer processing unit 11 performs data processing on the interference signals collected by the collecting device 20.
- the first sensing fiber 15 and the second sensing fiber 32 use two single-mode fibers of different cladding diameters as the optical fiber, such as a standard fiber, a thin fiber, a first sensing fiber 15, and a second sensing.
- the optical fiber 32 is pasted on the object to be tested, it should be ensured that the two optical fibers are in close contact.
- the invention also discloses a method for eliminating temperature strain sensing cross sensitivity in optical frequency domain reflection, and the steps of the method are:
- the optical frequency domain reflection system is used to demodulate the two fibers, that is, the first and second sensing fibers 15 and 32 Rayleigh scattering spectral frequency shifts are ⁇ f 1 and ⁇ f 2 , the corresponding temperature change is ⁇ T, and the strain change is ⁇ , which is obtained by the following relationship:
- Fibers with different cladding diameters ie standard fiber and small-diameter fiber, are used, but the method is not limited to using only standard fiber and small-diameter fiber, as long as the temperature sensing coefficients K T1 and K T2 and strain sensing of the two fibers are used.
- the simultaneous measurement of the temperature strain parameters can be achieved by the coefficients K S1 and K S2 in the presence of K S1 K T2 -K T1 K S2 ⁇ 0.
- the method uses a standard communication fiber (with a cladding diameter of 125 ⁇ m and a coating layer of 250 ⁇ m) and a small-diameter single-mode fiber (with a cladding diameter of 80 ⁇ m and a coating layer of 160 ⁇ m) as the sensing fiber.
- the verification experiment of the present invention demodulates the temperature change value ⁇ T and the strain change value ⁇ ⁇ by the system and method proposed by the present invention when the temperature and strain of the fiber having the same cladding diameter, that is, the standard fiber and the thin fiber, are simultaneously changed.
- the fiber diameter sensor coefficient K T1 3.4747 GHz / ° C
- the standard fiber temperature sensor coefficient K T2 2.1385 GHz / ° C.
- the small-diameter optical fiber strain sensing coefficient K S1 0.1483 GHz / ⁇ ⁇
- the standard optical fiber strain sensing coefficient K S2 0.0348 GHz / ⁇ ⁇ .
- the standard fiber and the small-diameter fiber are simultaneously attached to the cantilever beam, and the bonding on the cantilever beam is heated by the heating belt. Since the true strain change value on the cantilever beam can be obtained from the weight applied to the cantilever beam, the true temperature change value on the heating belt is obtained by attaching a platinum resistance temperature sensor to the heating belt.
- the system and method proposed by the present invention demodulate the temperature change value ⁇ T and the strain change value ⁇ ⁇ and compare the true temperature change value with the true strain change value to verify the effectiveness of the method. See Table 1 and Table 2.
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Abstract
一种基于光频域反射的分布式应变温度测量系统和方法,系统包括可调谐激光器(1)、1:99光分束器(4)、主干涉仪系统(33)、基于辅助干涉仪的光源相位监测系统(34)和计算机处理单元(11);其中主干涉仪系统(33)包括两个马赫曾德尔干涉仪,采用不同直径包层的两种光纤并列在一起作为传感光纤(15,32),由于不同直径包层的光纤温度、应变系数不同,利用矩阵运算可以得到在温度应变同时变化的温度和应变值,实现了消除光频域反射中温度应变传感交叉敏感的效果。
Description
本发明涉及分布式光纤传感仪器技术领域,尤其涉及一种基于光频域反射的分布式应变温度同时测量装置及方法。
高精度高空间分辨率的分布式应变传感广泛应用于民生、国防安全等多个领域中,如飞行器、航天器、船舶、国防装备、工业设备、桥梁涵洞等重点部位的结构健康监控,利用光频域反射中单模光纤瑞利散射光谱移动可实现高精度高空间分辨率的分布式温度应变传感。但在实际应用中温度、应变同时变化,其都会引起瑞利散射光谱移动,即交叉敏感问题。需要采用新的方法克服交叉敏感问题。
发明内容
基于上述现有技术和存在的问题,本发明提出了一种光频域反射中消除温度应变传感交叉敏感系统,基于光频域反射中单模光纤瑞利散射光谱移动进行分布式应变温度测量,采用两种不同直径包层的光纤并列在一起为传感光纤,由于同直径包层的光纤温度、应变系数不同,利用矩阵运算可以得到在温度应变同时变化的温度和应变值,实现了消除光频域反射中温度应变传感交叉敏感的效果。
本发明提出了一种基于光频域反射的分布式应变温度同时测量装置,该装置包括可调谐激光器、1:99光分束器、主干涉仪系统、基于辅助干涉仪的光源相位监测系统、采集装置和计算机处理单元;其中:
所述可调谐激光器,用于为装置提供光源,实现线性扫描;
所述1:99光分束器,将可调谐激光器的出射光由所述1:99光分束器的一端口进入,并以1:99的比例分别从所述1:99光分束器的另外两个端口分配到基于辅助干涉仪的光相位监测系统和主干涉仪系统;
所述基于辅助干涉仪的光源相位监测系统,用于实时采集输出光的相位信息,其结构包括隔离器、50:50耦合器、第一、第二法拉第旋转镜、延迟光纤和探测器,其中:隔离器,用于防止来自50:50耦合器的反射光进入可调谐激光器;50:50耦合器,用于光干涉;光通过隔离器后进入50:50耦合器的端口二,从50:50耦合器的端口三、四出射,分别被基于辅助干涉仪的光源相位监测系统的两臂的第一、第二法拉第旋转镜反射,并返回到50:50耦合器的端口三、四,两束光在50:50耦合器中发生干涉,干涉光从与50:50耦合器的端口一出射,出射光由探测器采集;
所述主干涉仪系统(33),采用干涉原理测量两种传感光纤中背向瑞利散射,其结构包括两个马赫曾德尔干涉仪,分别用于测量一种传感光纤中背向瑞利散射,利用分束器分开,其中:每个马赫曾德尔干涉仪分别包括环行器、50:50分束器、50:50耦合器、偏振控制器、传感光纤和第一、第二偏振分束器以及第一、第二平衡探测器;所述采集装置将两个马赫曾德尔干涉仪中第一、第二平衡探测器、第一、第二偏振分束器输出模拟电信号转换数字信号传送到计算机处理单元;所述计算机处理单元,对采集的干涉信号进行数据处理,得到应变测量结果;其中,马赫曾德尔干涉仪的结构包括:光从50:50分束器的端口一进入,经过50:50分束器的端口二进入设置于参考臂的偏振控制器,经过50:50分束器的端口三进入设置于测试臂的环行器的端口一,从环行器的端口三进入作为待测光纤的传感光纤,而传感光纤的背向瑞利散射光从环行器的端口三进入,从环行器的端口二出射;参考臂上的参考光与测试臂上传感光纤的背向瑞利散射光通过50:50耦合器的端口一、二进入该耦合器进行合束,形成拍频干涉,并从50:50耦合器的端口三、四出射;出射光信号分别接入第一、第二偏振分束器的c端,第一、第二偏振分束器的s端接入第一平衡探测器,第一、第二偏振分束器的p端接入第二平衡探测器;
所述传感光纤采用两种不同包层直径的两种光纤构成,并且产生瑞利散射光谱频移,当实际测量中温度、应变同时变化时,温度变化ΔT和应变变化Δε,依据下面关系得到:
其中,传感光纤的温度传感系数KT1和KT2,应变传感系数KS1和KS2,第一、第二传感光纤的瑞利散射光谱频移分别为Δf1和Δf2。
本发明还提出了一种基于光频域反射的分布式应变温度同时测量方法,该方法包括以下步骤:
步骤1、将可调谐激光器的出射光由所述1:99光分束器的一端口进入,并以1:99的比例分别从所述1:99光分束器的另外两个端口分配到基于辅助KS1KT2-KT1KS2≠0干涉仪的光相位监测系统和主干涉仪系统;
步骤2、利用基于辅助干涉仪的光源相位监测系统实时采集输出光相位信息;
步骤3、利用主干涉仪系统采用干涉原理测量两种传感光纤中背向瑞利散射其中,作为待测光纤的传感光纤采用两种不同包层直径的光纤构成,主干涉仪系统测量到两种传感光纤中背向瑞利散射信号传送给计算机,利用计算机对其进行互相关等数据处理,得到背向瑞利散射光谱频移。
利用计算机解调出的第一、第二传感光纤的瑞利散射光谱频移,分别在不同温度和应变下对两种不同包层直径的单模光纤进行标定,得到瑞利散射光谱频移在不同温度的标定曲线和瑞利散射光谱频移在不同应变的标定曲线;
利用瑞利散射光谱频移在不同温度的标定曲线得到两种光纤的温度传感系数KT1和KT2,利用瑞利散射光谱频移在不同应变的标定曲线得到应变传感系数KS1和KS2;
当实际测量中温度、应变同时变化时,利用基于光频域反射的分布式应变温度同时
测量装置解调出传感光纤瑞利散射光谱频移为Δf1和Δf2,则对应的温度变化为ΔT,应变变化为Δε,利用下面关系得到:
步骤4、对采集的干涉信号进行数据处理,得到应变测量结果。
与现有技术相比,本发明的优点在于:
本发明提供的采用不同包层直径的光纤即标准光纤和细径光纤实现了温度应变参量的同时测量,构成所述传感光纤的两种光纤不限于标准光纤和细径光纤,凡满足两种光纤的温度传感系数KT1和KT2及应变传感系数KS1和KS2存在关系式:KS1KT2-KT1KS2≠0,即可实现温度变化和应变变化参量的同时测量。
图1是一种基于光频域反射中光纤瑞利散射光谱移动应变温度同时传感系统的结构示意图;
附图标记如下:
1、可调谐激光器; 2、探测器;
3、第一50:50分束器; 4、1:99光分束器;
5、第二50:50耦合器; 6、时钟整形电路模块;
7、延迟光纤; 8、第一法拉第旋转镜;
9、第二法拉第旋转镜; 10、隔离器;
11、计算机; 12、偏振控制器;
13、第一环形器; 14、第三50:50耦合器;
15、第一传感光纤; 16、第一偏振分束器;
17、第二偏振分束器; 18、第一平衡探测器;
19、第二平衡探测器; 20、采集装置;
21、第一分束器 221、第一参考臂
231、第一测试臂 24、第二50:50分束器
25、第二环形器 222、第二参考臂
232、第二测试臂 26、偏振控制器;
27、第四50:50耦合器; 28、第三偏振分束器;
29、第四偏振分束器; 30、第三平衡探测器;
31、第四平衡探测器; 32、第二传感光纤
33、主干涉仪系统
34、基于辅助干涉仪的光源相位监测系统
以下结合附图及具体实施方式,进一步详述本发明的技术方案。
如图1所示,本发明的光频域反射中消除温度应变传感交叉敏感系统包括:可调谐激光器1、1:99光分束器4、主干涉仪系统33、基于辅助干涉仪的光源相位监测系统34和计算机处理单元11;其中:
可调谐激光器1,用于为系统提供光源,光频能够实现线性扫描;1:99光分束器4:可调谐激光器1的出射光由所述1:99光分束器4的4a端口进入,并以1:99的比例分别从所述1:99光分束器4的4b端口和4c端口分配到基于辅助干涉仪的光相位监测系统34和主干涉仪系统33;
基于辅助干涉仪的光源相位监测系统34,用于采集实时的光源输出光相位信息,其结构包括隔离器10、第二50:50耦合器5、第一法拉第旋转镜8和第二法拉第旋转镜
9、延迟光纤7和探测器2;
隔离器10,用于防止第二50:50耦合器5的4b端口的反射光进入可调谐激光器1;第二50:50耦合器5,用于光干涉;光从第二50:50耦合器5的5b端口进入,从第二50:50耦合器5的5c端口和5d端口出射,分别被基于辅助干涉仪的光源相位监测系统34的两臂的第一法拉第旋转镜8和第二法拉第旋转镜9反射,并返回到第二50:50耦合器5的5c端口和5d端口,两束光在50:50耦合器5中发生干涉,从第二50:50耦合器5的5a端口输出;
第一法拉第旋转镜8和第二法拉第旋转镜9基于辅助干涉仪的光源相位监测系统34提供反射,并且能够消除偏振衰落现象;
延迟光纤7,用于实现非等臂的拍频干涉;
探测器2,用于采集第二50:50耦合器5a端口的出射光;
主干涉仪系统33包括两个马赫曾德尔干涉仪,利用第一分束器21分开,其中一个即第一马赫曾德尔干涉仪为第一环行器13、第一50:50分束器3,第三50:50耦合器14、偏振控制器12、第一传感光纤15和第一、第二偏振分束器16和17以及第一、第二平衡探测器18和19;另一个即马赫曾德尔干涉仪包含第二环行器25、第二分束器24,第四50:50耦合器27、偏振控制器26、第二传感光纤32和第三、第四偏振分束器28和29以及第三、第四平衡探测器30和31;采集装置20将两个马赫曾德尔干涉仪中第一、第二平衡探测器18、19、第一、第二偏振分束器28和29输出模拟电信号转换数字信号传送到计算机处理单元11。
第一马赫曾德尔干涉仪中第一50:50分束器3作用是干涉仪分束,光从第一50:50分束器3的3a端口进入,经过第一50:50分束器3的3b端口进入干涉仪参考臂22的偏振控制器12,经过第一50:50分束器3的3c端口进入干涉仪测试臂23的第一环行器13的13a端口;
马赫曾德尔干涉仪参考臂22上的偏振控制器12,用于调节参考光偏振态,使其在偏振分束时两个正交方向上光强一致;
马赫曾德尔干涉仪测试臂23上的第一环行器13:光从第一环行器13的13a端口进入,从第一环行器13的13c端口进入待测光纤15,而待测光纤15的背向瑞利散射光从第一环行器13的13c端口进入,从第一环行器13的13b端口输出;
第三50:50耦合器14,用于将参考臂上的参考光与测试臂上传感光纤15的背向瑞利散射光通过第三50:50耦合器14的14a端口和14b端口进入该耦合器进行合束,形成拍频干涉并从该第三50:50耦合器14的14c端口和14d端口输出;第三50:50耦合器14的14c端口和14d端口输出光信号分别接入第一、第二偏振分束器16和17的c端,第一、第二偏振分束器16和17的s端接入第一平衡探测器18,第一、第二偏振分束器16和17的p端接入第二平衡探测器19。
其中第二马赫曾德尔干涉仪中第二环行器25、第二分束器24,第四50:50耦合器27、偏振控制器26、第二传感光纤32和第三、第四偏振分束器28和29以及第三、第四平衡探测器30和31连接方式与第一马赫曾德尔干涉仪一样。
所述第一至第四偏振分束器16、17、28、29将光信号中偏振正交两路偏振光分开,分别以s端和p端输出。所述第一至第四平衡探测器18、19、30、31和探测器2将光信号转换为电信号;
采集装置20将第三、第四平衡探测器30、31和探测器2输出的模拟电信号采集到计算机处理单元11;其中,计算机处理单元11对采集装置20采集的干涉信号进行数据处理。
第一传感光纤15和第二传感光纤32采用两种不同包层直径的单模光纤作为光纤如一种采用标准光纤、一种采用细径光纤,第一传感光纤15和第二传感光纤32粘贴在待测物体时,应保证两种光纤紧靠。
本发明同时公布一种光频域反射中消除温度应变传感交叉敏感方法,该方法的步骤是:
1)、利用光频域反射系统解调出传感光纤15和32瑞利散射光谱频移,分别在不同温度和应变下对两种不同包层直径的单模光纤进行标定,即得到瑞利散射光谱频移在
不同温度的标定曲线和瑞利散射光谱频移在不同应变的标定曲线;
2)、利用瑞利散射光谱频移在不同温度的标定曲线得到两种光纤的温度传感系数KT1和KT2,利用瑞利散射光谱频移在不同应变的标定曲线得到应变传感系数KS1和KS2;
3)、当实际测量中温度、应变同时变化时,利用光频域反射系统解调出两种光纤即第一、第二传感光纤15和32瑞利散射光谱频移为Δf1和Δf2,则对应的温度变化为ΔT,应变变化为Δε,利用下面关系得到:
采用不同包层直径的光纤即标准光纤和细径光纤实现,但本方法不限于只使用标准光纤和细径光纤实现,只要采用两种光纤的温度传感系数KT1和KT2及应变传感系数KS1和KS2存在KS1KT2-KT1KS2≠0,即可实现温度应变参量的同时测量。本方法采用采用标准通讯光纤(包层直径为125微米,加涂覆层为250微米)和细径单模光纤(包层直径为80微米,加涂覆层为160微米)作为传感光纤。
本发明验证实验为采用同包层直径的光纤即标准光纤和细径光纤实现温度和应变同时变化时,利用本发明中提出系统和方法解调出温度变化值ΔT和应变变化值Δε。根据前期测量细径光纤温度传感系数KT1=3.4747GHz/℃,标准光纤温度传感系数KT2=2.1385GHz/℃。细径光纤应变传感系数KS1=0.1483GHz/με,标准光纤应变传感系数KS2=0.0348GHz/με。将标准光纤和细径光纤同时粘贴在悬臂梁上,利用加热带对悬臂梁上的粘贴进行加热。由于悬臂梁上真实的应变变化值可以从施加在悬臂梁上砝码得到,而加热带上真实的温度变化值由贴在加热带上铂电阻温度传感器得到。利用本发明中提出系统和方法解调出温度变化值ΔT和应变变化值Δε与真实温度变化值与真实应变变化值进行比对,来验证本方法有效性见表1和表2。
表1、测量温度变化与真实温度变化对比
| 真实温度变化/℃ | 测量温度变化/℃ | 误差(测量值-真实值)/℃ |
| 0 | 0 | 0 |
| 1 | 0.81 | -0.19 |
| 1.98 | 1.71 | -0.27 |
| 3.02 | 3.15 | 0.13 |
| 4.04 | 4.16 | 0.12 |
| 5.03 | 5.18 | 0.15 |
| 6.05 | 5.87 | -0.18 |
| 7.02 | 6.98 | -0.04 |
| 8.08 | 8.10 | 0.02 |
| 9.06 | 8.89 | -0.17 |
| 11.02 | 10.45 | -0.57 |
表2、测量应变变化与真实温度变化对比
| 真实应变变化/με | 测量应变变化/με | 误差(测量值-真实值)/με |
| 0 | 0 | 0 |
| 15 | 22.33 | 7.33 |
| 30 | 38.61 | 8.61 |
| 45 | 46.18 | 1.18 |
| 60 | 63.60 | 3.60 |
| 75 | 81.01 | 6.01 |
| 90 | 102.20 | 12.20 |
| 105 | 113.56 | 8.56 |
| 120 | 124.92 | 4.92 |
| 135 | 140.06 | 5.06 |
| 150 | 155.96 | 5.96 |
从表1和表2可以看到,温度变化的测量误差最大为0.57℃,应变变化测量误差为12.2με。
本领域技术人员可以理解附图只是一个优选实施例的示意图,上述本发明实施例序号仅仅为了描述,不代表实施例的优劣。
以上所述仅为本发明的较佳实施例,并不用以限制本发明,凡在本发明的精神和原则之内,所作的任何修改、等同替换、改进等,均应包含在本发明的保护范围之内。
Claims (4)
- 一种基于光频域反射的分布式应变温度同时测量装置,其特征在于,该装置包括可调谐激光器、1:99光分束器、主干涉仪系统、基于辅助干涉仪的光源相位监测系统、采集装置和计算机处理单元;其中:所述可调谐激光器,用于为装置提供光源,实现线性扫描;所述1:99光分束器,将可调谐激光器的出射光由所述1:99光分束器的一端口进入,并以1:99的比例分别从所述1:99光分束器的另外两个端口分配到基于辅助干涉仪的光相位监测系统和主干涉仪系统;所述基于辅助干涉仪的光源相位监测系统,用于实时采集输出光的相位信息,其结构包括隔离器、50:50耦合器、第一、第二法拉第旋转镜、延迟光纤和探测器,其中:隔离器,用于防止来自50:50耦合器的反射光进入可调谐激光器;50:50耦合器,用于光干涉;光通过隔离器后进入50:50耦合器的端口二,从50:50耦合器的端口三、四出射,分别被基于辅助干涉仪的光源相位监测系统的两臂的第一、第二法拉第旋转镜反射,并返回到50:50耦合器的端口三、四,两束光在50:50耦合器中发生干涉,干涉光从与50:50耦合器的端口一出射,出射光由探测器采集;所述主干涉仪系统(33),采用干涉原理测量两种传感光纤中背向瑞利散射,其结构包括两个马赫曾德尔干涉仪分别用于测量一种传感光纤中背向瑞利散射,利用分束器分开,其中:每个马赫曾德尔干涉仪分别包括环行器、50:50分束器、50:50耦合器、偏振控制器、传感光纤和第一、第二偏振分束器以及第一、第二平衡探测器;所述采集装置将两个马赫曾德尔干涉仪中第一、第二平衡探测器、第一、第二偏振分束器输出模拟电信号转换数字信号传送到计算机处理单元;所述计算机处理单元,对采集的干涉信号进行数据处理,得到应变测量结果;其中,马赫曾德尔干涉仪的结构包括:光从50:50分束器的端口一进入,经过50:50分束器的端口二进入设置于参考臂的偏振控制器,经过50:50分束器的端口三进入设置于测试臂的环行器的端口一,从环行器的端口三进入作为待测光纤的传感光纤,而传感光纤的背向瑞利散射光从环行器的端口三进入,从环行器的端口二出射;参考臂上的参考光与测试臂上传感光纤的背向瑞利散射光通过50:50耦合器的端口一、二进入该耦合器进行合束,形成拍频干涉,并从50:50耦合器的端口三、四出射;出射光信号分别接入第一、第二偏振分束器的c端,第一、第二偏 振分束器的s端接入第一平衡探测器,第一、第二偏振分束器的p端接入第二平衡探测器;所述传感光纤采用两种不同包层直径的两种光纤构成,并且产生瑞利散射光谱频移,当实际测量中温度、应变同时变化时,温度变化ΔT和应变变化Δε,依据下面关系得到:其中,传感光纤的温度传感系数KT1和KT2,应变传感系数KS1和KS2,第一、第二传感光纤的瑞利散射光谱频移分别为Δf1和Δf2。
- 如权利要求1所述的基于光频域反射的分布式应变温度同时测量装置,其特征在于,构成所述传感光纤的两种光纤不限于标准光纤和细径光纤,凡满足两种光纤的温度传感系数KT1和KT2及应变传感系数KS1和KS2存在关系式:KS1KT2-KT1KS2≠0,即可实现温度变化和应变变化参量的同时测量。
- 一种基于光频域反射的分布式应变温度同时测量方法,其特征在于,该方法包括以下步骤:步骤(1)、将可调谐激光器的出射光由所述1:99光分束器的一端口进入,并以1:99的比例分别从所述1:99光分束器的另外两个端口分配到基于辅助KS1KT2-KT1KS2≠0干涉仪的光相位监测系统和主干涉仪系统;步骤(2)、利用基于辅助干涉仪的光源相位监测系统实时采集输出光相位信息;步骤(3)、利用主干涉仪系统采用干涉原理测量两种传感光纤中背向瑞利散射其中,作为待测光纤的传感光纤采用两种不同包层直径的光纤构成,主干涉仪系统测量到两种传感光纤中背向瑞利散射信号传送给计算机,利用计算机对其进行互相关等数据处理,得到背向瑞利散射光谱频移,利用计算机解调出的第一、第二传感光纤的瑞利散射光谱频移,分别在不同温度和应变下对两种不同包层直径的单模光纤进行标定,得到瑞利散射光谱频移在不同温度的标定曲线和瑞利散射光谱频移在不同应变的标定曲线;利用瑞利散射光谱频移在不同温度的标定曲线得到两种光纤的温度传感系数KT1和KT2,利用瑞利散射光谱频移在不同应变的标定曲线得到应变传感系数KS1和KS2;当实际测量中温度、应变同时变化时,利用基于光频域反射的分布式应变温度同时测量装置解调出传感光纤瑞利散射光谱频移为Δf1和Δf2,则对应的温度变化为ΔT,应变变化为Δε,利用下面关系得到:步骤(4)、对采集的干涉信号进行数据处理,得到应变测量结果。
- 如权利要求3所述的基于光频域反射的分布式应变温度同时测量装置,其特征在于,构成所述传感光纤的两种光纤不限于标准光纤和细径光纤,凡满足两种光纤的温度传感系数KT1和KT2及应变传感系数KS1和KS2存在关系式:KS1KT2-KT1KS2≠0,即可实现温度变化和应变变化参量的同时测量。
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| CN113654580A (zh) * | 2021-07-30 | 2021-11-16 | 太原理工大学 | 一种同时测量温度与应变的光频域反射系统 |
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| CN115683363A (zh) * | 2022-10-13 | 2023-02-03 | 哈尔滨工程大学 | 一种基于共光路干涉仪结构的光频域测量装置 |
| CN115950372A (zh) * | 2023-03-13 | 2023-04-11 | 山东省科学院激光研究所 | 一种分布式多维传感光纤形状传感测量方法及系统 |
Also Published As
| Publication number | Publication date |
|---|---|
| US20190011253A1 (en) | 2019-01-10 |
| US10365088B2 (en) | 2019-07-30 |
| CN105698871A (zh) | 2016-06-22 |
| CN105698871B (zh) | 2018-08-21 |
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