WO2017111361A8 - 대기 비개방 분석을 위한 시편 이송 용기 및 시편 이송 방법 - Google Patents
대기 비개방 분석을 위한 시편 이송 용기 및 시편 이송 방법 Download PDFInfo
- Publication number
- WO2017111361A8 WO2017111361A8 PCT/KR2016/014378 KR2016014378W WO2017111361A8 WO 2017111361 A8 WO2017111361 A8 WO 2017111361A8 KR 2016014378 W KR2016014378 W KR 2016014378W WO 2017111361 A8 WO2017111361 A8 WO 2017111361A8
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- sample
- sample transfer
- exposure
- analysis
- atmosphere
- Prior art date
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Classifications
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
- B65D—CONTAINERS FOR STORAGE OR TRANSPORT OF ARTICLES OR MATERIALS, e.g. BAGS, BARRELS, BOTTLES, BOXES, CANS, CARTONS, CRATES, DRUMS, JARS, TANKS, HOPPERS, FORWARDING CONTAINERS; ACCESSORIES, CLOSURES, OR FITTINGS THEREFOR; PACKAGING ELEMENTS; PACKAGES
- B65D85/00—Containers, packaging elements or packages, specially adapted for particular articles or materials
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N1/00—Sampling; Preparing specimens for investigation
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N1/00—Sampling; Preparing specimens for investigation
- G01N1/28—Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/66—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence
- G01N21/67—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence using electric arcs or discharges
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/225—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion
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- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Sampling And Sample Adjustment (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Abstract
대기 비개방 분석을 위한 시편 이송 용기 및 시편 이송 방법이 개시된다. 대기 비개방 분석용 시편 이송 용기는, i ) 시편 고정을 위한 시편 홀더와, ii ) 일측에 시편 홀더가 출입하는 시편 출입구를 가지는 본체와, iii ) 본체 내부에 위치하며 열린 상태에서 시편 출입구와 이어져 시편 홀더를 수용하는 개구부를 가지는 볼과, 볼을 회전시켜 시편 출입구를 열거나 닫는 회전 조작부를 포함하는 밸브 부재와, iv ) 본체에 슬라이드 가능하게 설치되고, 밸브 부재의 열린 상태에서 시편 홀더와 접하여 시편 홀더를 밀기 위한 이동 막대를 포함한다.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR10-2015-0186476 | 2015-12-24 | ||
KR1020150186476A KR101711855B1 (ko) | 2015-12-24 | 2015-12-24 | 대기 비개방 분석을 위한 시편 이송 용기 및 시편 이송 방법 |
Publications (2)
Publication Number | Publication Date |
---|---|
WO2017111361A1 WO2017111361A1 (ko) | 2017-06-29 |
WO2017111361A8 true WO2017111361A8 (ko) | 2017-08-31 |
Family
ID=58410614
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/KR2016/014378 WO2017111361A1 (ko) | 2015-12-24 | 2016-12-07 | 대기 비개방 분석을 위한 시편 이송 용기 및 시편 이송 방법 |
Country Status (2)
Country | Link |
---|---|
KR (1) | KR101711855B1 (ko) |
WO (1) | WO2017111361A1 (ko) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN114660315B (zh) * | 2022-05-24 | 2022-10-14 | 季华实验室 | 样品转移装置、批量进样系统、分析设备及批量进样方法 |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4697192B2 (ja) * | 2007-06-12 | 2011-06-08 | 東京エレクトロン株式会社 | 位置ずれ検出装置及びこれを用いた処理システム |
KR101039749B1 (ko) * | 2008-10-08 | 2011-06-08 | 한국수력원자력 주식회사 | 고방사성 시료의 x-선 회절분석용 시료 홀더장치 |
KR101084653B1 (ko) * | 2009-02-12 | 2011-11-22 | 국민대학교산학협력단 | 전자주사현미경의 시료챔버 |
JP2010206139A (ja) * | 2009-03-06 | 2010-09-16 | Hitachi Kokusai Electric Inc | 基板処理装置 |
JP5973136B2 (ja) * | 2010-05-20 | 2016-08-23 | 株式会社キッツ | 回転弁 |
KR101184596B1 (ko) * | 2010-12-22 | 2012-09-21 | 주식회사 원익아이피에스 | 기판 이송 장치 및 그 동작 방법 |
KR101408164B1 (ko) * | 2012-12-26 | 2014-06-17 | 주식회사 싸이맥스 | 웨이퍼 이송위치 측정 범위를 최소화하는 트랜스퍼 모듈 |
KR101585869B1 (ko) * | 2014-02-24 | 2016-01-15 | 주식회사 아스타 | 진공시스템의 시편이송장치 |
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2015
- 2015-12-24 KR KR1020150186476A patent/KR101711855B1/ko active IP Right Grant
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2016
- 2016-12-07 WO PCT/KR2016/014378 patent/WO2017111361A1/ko active Application Filing
Also Published As
Publication number | Publication date |
---|---|
KR101711855B1 (ko) | 2017-03-03 |
WO2017111361A1 (ko) | 2017-06-29 |
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