WO2016143484A1 - Metal foil with carrier, and manufacturing method for wiring board - Google Patents
Metal foil with carrier, and manufacturing method for wiring board Download PDFInfo
- Publication number
- WO2016143484A1 WO2016143484A1 PCT/JP2016/054851 JP2016054851W WO2016143484A1 WO 2016143484 A1 WO2016143484 A1 WO 2016143484A1 JP 2016054851 W JP2016054851 W JP 2016054851W WO 2016143484 A1 WO2016143484 A1 WO 2016143484A1
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- WIPO (PCT)
- Prior art keywords
- layer
- metal foil
- carrier
- ultrathin
- wiring board
- Prior art date
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Classifications
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B15/00—Layered products comprising a layer of metal
- B32B15/04—Layered products comprising a layer of metal comprising metal as the main or only constituent of a layer, which is next to another layer of the same or of a different material
- B32B15/08—Layered products comprising a layer of metal comprising metal as the main or only constituent of a layer, which is next to another layer of the same or of a different material of synthetic resin
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/12—Mountings, e.g. non-detachable insulating substrates
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/10—Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern
- H05K3/20—Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern by affixing prefabricated conductor pattern
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/46—Manufacturing multilayer circuits
- H05K3/4644—Manufacturing multilayer circuits by building the multilayer layer by layer, i.e. build-up multilayer circuits
- H05K3/4652—Adding a circuit layer by laminating a metal foil or a preformed metal foil pattern
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B2457/00—Electrical equipment
- B32B2457/08—PCBs, i.e. printed circuit boards
Definitions
- the present invention relates to a metal foil with a carrier. Moreover, this invention relates to the manufacturing method of the wiring board using the copper foil with a carrier.
- Patent Document 1 proposes a circuit-forming support substrate (hereinafter referred to as a support) in which an insulating resin layer, such as a prepreg, is bonded to a carrier foil surface of an ultrathin copper foil with a carrier foil.
- a support a circuit-forming support substrate
- an insulating resin layer such as a prepreg
- pattern electrolytic copper plating is performed on an ultrathin copper foil in the support to form a first wiring conductor; a second insulating resin is disposed so as to be in contact with the first wiring conductor.
- a non-through hole reaching the first wiring conductor is formed in the second insulating resin, and the inner wall of the non-through hole is subsequently connected by electrolytic copper plating or electroless copper plating.
- a coreless build-up wiring board is manufactured by forming a conductor; and then peeling off the carrier foil and the ultrathin copper foil.
- a multilayer metal foil in which a first carrier metal foil, a second carrier metal foil, and a base metal foil are laminated in this order is prepared, and the base metal foil side of the multilayer metal foil is prepared. And a prepreg as a base material are laminated to form a support.
- the first carrier metal foil is physically peeled between the first carrier metal foil and the second carrier metal foil of the multilayer metal foil.
- first pattern plating is performed on the second carrier metal foil remaining on the core substrate.
- an insulating layer and a conductor layer are sequentially laminated on the second carrier metal foil including the first pattern plating to form a laminate having a build-up layer.
- the laminate is physically separated from the support together with the second carrier metal foil and separated.
- an etching resist is formed on the second carrier metal foil of the peeled laminate, and etching is performed to form a three-dimensional circuit on the first pattern plating or the insulating layer.
- the support is formed in the process of manufacturing a coreless buildup substrate on which a buildup layer is formed.
- a process of carrying is required.
- grips the copper foil with a carrier exposed to the support body surface is performed.
- the gripping work is performed by manual gripping, gripping by the fork or suction pad of the substrate transfer robot, or by a conveyor roll.
- gripping and gripping by slit conveyance There are various types such as gripping and gripping by slit conveyance.
- an object of the present invention is to improve a metal foil with a carrier and to improve a method for producing a wiring board using the same. More specifically, when forming a support, the metal foil with a carrier has good handling properties such as conveyance. And it is providing the manufacturing method of a wiring board using the same.
- the present invention is a metal foil with a carrier having a carrier, an ultrathin metal foil layer, and a release layer located between them,
- the release layer has a thickness of 1 nm to 1 ⁇ m
- the carrier solves the above-mentioned problems by providing a metal foil with a carrier having an extended portion extending from at least a part of the outer edge of the ultrathin metal foil layer.
- the present invention is a method for manufacturing a wiring board using the metal foil with a carrier.
- the above-described problems are solved by providing a method of manufacturing a wiring board having a step of gripping the extended portion of the metal foil with a carrier.
- FIG.1 (a) is a top view which shows one Embodiment of metal foil with a carrier of this invention
- FIG.1 (b) is a top view which shows another embodiment of metal foil with a carrier of this invention
- . 2A is a cross-sectional view taken along line bb in FIGS. 1A and 1B
- FIG. 2B is a cross-sectional view taken along line bb in FIGS. 1A and 1B. It is another form of line sectional drawing.
- 3 (a) to 3 (c) are schematic views showing a production process of a support using the metal foil with a carrier shown in FIG.
- FIG. 4 (a) to 4 (d) are schematic views showing a process for manufacturing a wiring board with a carrier using the metal foil with a carrier shown in FIG. 1 and a metal foil with a carrier as shown in FIG. 3 (c). It is. 5 (a) to 5 (c) are schematic diagrams showing a manufacturing process of a wiring board by a support using the metal foil with a carrier shown in FIG. 1 as a continuation of FIG. 4 (d). 6 (a) to 6 (e) are schematic views showing a manufacturing process of a wiring board using the metal foil with a carrier shown in FIG. 1 and a support using the metal foil with a carrier as shown in FIG. 5 (c). FIG.
- FIG. 1A shows a plan view of an embodiment of the metal foil with a carrier of the present invention.
- FIG.1 (b) is a top view of another embodiment of the metal foil with a carrier of this invention.
- 2A is a cross-sectional view taken along the line cc in FIGS. 1A and 1B.
- the metal foil 10 with a carrier of this embodiment includes a carrier 11 and an ultrathin metal foil layer 12.
- the carrier 11 is provided to be peelable from the ultrathin metal foil layer 12.
- the metal foil 10 with a carrier has a release layer 13 located between the carrier 11 and the ultrathin metal foil layer 12.
- the ultrathin metal foil layer 12 in the metal foil with carrier 10 has a pair of sides facing each other in plan view.
- the peeling layer 13 positioned between the ultrathin metal foil layer 12 and the carrier 10 can be formed so that they are completely overlapped with each other when viewed from the ultrathin metal foil layer 12.
- the release layer 13 has the same shape and dimensions as the ultrathin metal foil layer 12.
- the shape of the release layer 13 is not limited to this, and may be extended from at least a part of the outer edge of the ultrathin metal foil layer 12 in plan view of the metal foil 10 with a carrier, as will be described later.
- the ultrathin metal foil layer 12 having a quadrilateral shape in plan view has a pair of first outer edges 12a, 12a facing each other and a pair of second outer edges 12b, 12b facing each other.
- the pair of first outer edges 12a and 12a may be parallel to each other or may not be parallel to each other.
- the pair of first outer edges 12a, 12a may have the same length or may be different. The same applies to the pair of second outer edges 12b, 12b.
- the carrier 11 when viewed in plan, has a first outer edge 12a and a second outer edge 12b which are outer edges of the ultrathin metal foil layer 12. It extends from the whole area.
- the carrier 11 has a quadrilateral shape in plan view, and has a pair of first outer edges 11a and 11a facing each other and a pair of second outer edges 11b and 11b facing each other.
- the first outer edge 11 a of the carrier 11 is substantially parallel to the first outer edge 12 a of the ultrathin metal foil layer 12.
- the second outer edge 11 b of the carrier 11 is substantially parallel to the second outer edge 12 b of the ultrathin metal foil layer 12.
- the carrier 11 has a quadrilateral shape having four sides substantially parallel to the four sides of the ultrathin metal foil layer 12 in plan view.
- the carrier 11 has a pair of first extending portions 111a extending from the outer edge of the ultrathin metal foil layer 12 and facing each other, and a pair of second extending portions 111b facing each other in plan view.
- Each extending part 111a, 111b has a long quadrilateral shape in one direction.
- Each extending part 111a, 111b improves the handleability of the end part of the metal foil 10 with a carrier, for example, the handling property in the transport process when the support is formed, and further, in the process of the later build-up layer It is formed for the purpose of forming a sealed region in which the interface between the carrier 11 and the ultrathin metal foil layer 12 can be sealed with an insulating resin over four sides.
- the ultrathin metal foil layer 12 preferably has a quadrilateral shape such as a rectangle.
- the extending portions 111a and 111b and the ultrathin metal foil layer 12 when the extending portions 111a and 111b and the ultrathin metal foil layer 12 are viewed in cross section along their thickness directions, the extending portions are provided.
- the end portions of 111a, 111b and the ultrathin metal foil layer 12 may be stepped shapes having different planes as shown in FIG.
- the extended portions 111a and 111b may be sloped, and the end of the ultrathin metal foil layer 12 may be formed on a plane continuous with the slope.
- the ultrathin metal foil layer 13 has a quadrilateral shape in plan view, and the carrier 11 extends at least from a pair of opposing sides in the ultrathin metal foil layer. It has a pair of extended portions 111a and 111a.
- the carrier 11 is used as a member that supports the ultrathin metal foil layer 12 in order to improve the handleability of the ultrathin metal foil layer 12 that is a thin member.
- the material constituting the carrier 11 is not particularly limited.
- Metal foil can be used.
- a resin film such as a PET film, a PEN film, an aramid film, a polyimide film, a nylon film, and a liquid crystal polymer, a metal-coated resin film having a metal coating layer on the resin film, a glass plate, a ceramic plate, and the like.
- a metal foil is preferable from the viewpoint of preventing foreign matter from being entrained by static electricity that may occur during handling, and a copper foil is preferable from the viewpoint of uniformity of thickness and corrosion resistance of the foil.
- the thickness of the carrier 11 is typically 250 ⁇ m or less, preferably 12 ⁇ m or more and 200 ⁇ m or less, provided that it is larger than the thickness of the ultrathin metal foil layer 12.
- the peeling layer 13 weakens the peeling strength of the carrier 11, ensures the stability of the strength, and further may occur between the carrier 11 and the ultrathin metal foil layer 12 during press molding at a high temperature. It is a layer having a function of suppressing diffusion.
- the release layer 13 is formed only on one surface of the carrier 11, but may be formed on both surfaces of the carrier 11 as necessary.
- the release layer 13 may be either an organic release layer or an inorganic release layer. Examples of organic components used in the organic release layer include nitrogen-containing organic compounds, sulfur-containing organic compounds, carboxylic acids and the like. Examples of nitrogen-containing organic compounds include triazole compounds, imidazole compounds, and the like.
- triazole compounds are preferable in terms of easy release properties.
- triazole compounds include 1,2,3-benzotriazole, carboxybenzotriazole, N ′, N′-bis (benzotriazolylmethyl) urea, 1H-1,2,4-triazole and 3-amino-1H. -1,2,4-triazole and the like.
- sulfur-containing organic compound include mercaptobenzothiazole, thiocyanuric acid, 2-benzimidazolethiol and the like.
- carboxylic acid include monocarboxylic acid and dicarboxylic acid.
- examples of inorganic components used in the inorganic release layer include at least one of Ni, Mo, Co, Cr, Fe, Ti, W, P, Zn, and carbon, or an alloy thereof, and / or an oxide. Can be mentioned.
- these materials By using these materials as the release layer, an extremely thin release layer can be formed. Due to this, for example, the surface area of the release layer exposed at the end of the extension site is reduced compared to the case where the release layer is formed by applying a pressure-sensitive adhesive. It becomes possible to strongly prevent chemicals from entering the interface between the metal foil and the carrier at the stage and the occurrence of a peeling start point due to mechanical impact.
- the release layer 13 is formed by bringing the release layer component-containing solution into contact with at least one surface of the carrier 11 and fixing the release layer component to the surface of the carrier 11. Just do it.
- this contact may be performed by immersion in the release layer component-containing solution, spraying of the release layer component-containing solution, or flowing down of the release layer component-containing solution.
- examples of the method for forming the release layer 13 when the release layer 13 is an inorganic release layer include wet processes such as an electrodeposition method and an electroless plating method.
- a method of forming a release layer component by a vapor phase method such as vapor deposition (PVD), sputtering, or CVD can be employed regardless of organic or inorganic.
- the thickness of the release layer 13 is typically 1 nm or more and 1 ⁇ m or less, preferably 2 nm or more and 500 nm or less, more preferably 2 nm or more and 100 nm or less.
- the thickness can be measured by employing a cross-sectional observation method, an area weight conversion method, or the like.
- the area weight conversion method is obtained by identifying the compound adhered as the release layer 13 and then measuring the adhesion weight per unit area by spectroscopic analysis or chromatography and dividing by the specific gravity of the compound.
- the insulating layer is overlapped with a part of or all of the region where the ultrathin metal foil is formed and the carrier extension part in the build-up layer manufacturing stage described later.
- the thickness of the release layer 13 is very thin and the step between the carrier extension portion and the surface of the ultrathin metal foil can be lowered, the surface of the end portion of the insulating layer in the buildup layer stacking stage It becomes possible to maintain the flatness significantly.
- the thickness of the release layer 13 can be controlled, for example, by adjusting the immersion time when the carrier 11 is immersed in the release layer component-containing solution, or by adjusting the spray amount when spraying the release layer component-containing solution onto the carrier 11. it can.
- the peel strength between the release layer 13 and the carrier 11 is preferably 2 gf / cm or more and 50 gf / cm or less, more preferably 5 gf / cm or more and 30 gf / cm or less, and still more preferably 10 gf / cm or more and 20 gf / cm. cm or less.
- another functional layer may be provided between the release layer 13 and the carrier 11 and / or the ultrathin metal foil layer 12.
- An example of such another functional layer is an auxiliary metal layer.
- the auxiliary metal layer is preferably made of nickel and / or cobalt. By forming such an auxiliary metal layer on the surface side of the carrier 11 and / or the surface side of the ultrathin metal foil layer 12, the carrier 11 and the ultrathin metal foil layer 12 can be formed during hot press molding for a long time or at a long time. Interdiffusion that may occur between the two is suppressed, and the stability of the peeling strength of the carrier 11 can be ensured.
- the thickness of the auxiliary metal layer is preferably 0.001 ⁇ m or more and 1 ⁇ m or less.
- the thickness of the ultrathin metal foil layer 12 in the carrier-attached metal foil 10 is, from the viewpoint of electroplating conductivity for a wiring pattern at the time of manufacturing a wiring board, which will be described later, and a fine line forming property when flash etching is performed after peeling the support.
- the thickness is preferably 0.1 ⁇ m or more and 10 ⁇ m or less, more preferably 0.2 ⁇ m or more and 8 ⁇ m, and still more preferably 1 ⁇ m or more and 5 ⁇ m or less.
- the ultrathin metal foil layer 12 is preferably made of a material having conductivity and etching processability by a chemical solution, and can be formed of a metal material such as copper, copper alloy, aluminum, zinc, nickel, tin, or stainless steel, for example.
- a copper foil or a copper alloy foil, particularly a copper foil can be suitably used from the viewpoint of low electrical resistance, excellent workability during circuit formation by etching or the like, and ease of subsequent wiring layer formation.
- Examples of the method for producing the metal foil layer 12 include a sputtering method, a vapor deposition method, and an electrolytic method. From the viewpoint of batch productivity of the carrier 11 and the release layer 13, it is preferable to employ an electrolytic method.
- the surface of the ultrathin metal foil layer 12 is preferably a rough surface.
- a rough surface is formed, and the glossiness between the surface of the ultrathin metal foil layer 12 and the surfaces of the extended portions 111a and 111b of the carrier 10 is reduced by reducing the glossiness of the surface of the ultrathin metal foil layer 12. And the visibility of the extended portions 111a and 111b of the carrier 10 is improved.
- the rough surface can be formed by an electrodeposition method, an etching method, a blast method, or a metal oxidation and reduction method. Among these, if the electrodeposition method is used, a uniform particulate metal can be deposited, and by adjusting the particle shape and particle size, it is possible to increase the range of glossiness.
- the surface roughness of the ultrathin metal foil layer 12 is represented by surface roughness Rz (JIS B0601-2013), preferably 0.1 ⁇ m or more and 5.0 ⁇ m or less, and 0.2 ⁇ m or more and 4.0 ⁇ m or less. More preferably it is.
- the surface of the ultrathin metal foil layer 12 (including the case of a rough surface) is used.
- a rust prevention layer or a coupling layer may be formed.
- the material for the rust prevention layer include metals or alloys made of at least one of Ni, Mo, Co, Cr, Fe, Ti, W, P, Zn, and the like, and / or oxides thereof.
- the film of a silane coupling agent is mentioned, for example.
- silane coupling agents examples include vinyl methoxy silane, vinyl phenyl trimethoxy silane, methacryloxy propyl trimethoxy silane, glycidoxy propyl trimethoxy silane, glycidyl butyl trimethoxy silane, imidazole silane, triazine silane, mercapto propyl trimethoxy.
- Examples include silane, aminopropyltriethoxysilane, aminopropyltrimethoxysilane, and the like.
- the surface protective layer 14 is used to oxidize the surface located on the ultrathin metal foil layer 12 side in the first extension part 111a and / or the second extension part 111b of the carrier and hold the extension part by long-term storage. It is used for the purpose of protecting from oxidation caused by scratches and prevention of oxidation contamination from water droplets and oil droplets transferred from a holding jig or gloves.
- the surface protective layer 14 may be an inorganic protective layer or an organic protective layer, but an organic protective layer is preferable in order to prevent oxidative contamination more firmly.
- the surface protective layer 14 is an organic protective layer
- a form in which the surface protective layer 14 is an extension portion of the release layer 13 described above can be given. Since the surface protective layer 14 can be formed simultaneously with the peeling layer 13 when the surface protective layer 14 is composed of an extended portion of the peeling layer 13, the manufacturing process of the metal foil 10 with a carrier is not complicated. Is advantageous. When the surface protective layer 14 is composed of the extended portion of the release layer 13, both are integrated, and thus the surface protective layer 14 and the release layer 13 are made of the same material.
- the surface protective layer 14 is an organic protective layer
- a resin layer may be mentioned.
- the resin constituting the surface protective layer 14 include resin components such as acrylic resin, acetal resin, ethylene resin, epoxy resin, silicone resin, fluorine resin, imide resin, amide resin, amideimide resin, and styrene-butadiene copolymer. It is preferable that it is comprised.
- the surface protective layer 14 is formed of a resin component, the oxidation resistance can be maintained predominately, and by selecting the coating method, for example, the corner of the extension portion is chamfered, and the extension site It is possible to freely design the shape of this.
- these resins may appropriately contain a color pigment and an inorganic filler.
- the surface protective layer 14 can be composed of a layer containing the above-described rust inhibitor, for example.
- the layer containing a rust preventive agent may be composed of, for example, a metal or alloy made of at least one of Ni, Mo, Co, Cr, Fe, Ti, W, P, Zn, and / or an oxide thereof. preferable.
- the layer containing the rust preventive agent is composed of at least one metal or alloy selected from the group consisting of Ni, Cr and Zn, and / or an oxide thereof, the extended portion and the ultrathin metal This is particularly preferable because visibility with the foil surface is improved.
- the thickness thereof is 1 nm or more in terms of preventing breakage due to the gripping of the extended portion and preventing spread of the spread width in the coating process or the like. It is preferably 10 ⁇ m or less, more preferably 2 nm or more and 5 ⁇ m or less, still more preferably 2 nm or more and 1 ⁇ m or less, particularly preferably 2 nm or more and 500 nm or less, and 2 nm or more and 50 nm or less. Most preferred.
- the ultrathin metal foil layer 12 is used.
- the difference ⁇ Gs in glossiness at an incident angle of 60 ° between the surface of the first extending portion 111a and / or the surface of the second extending portion 111b located on the ultrathin metal foil layer 12 side is: It is preferable that it is 30 or more.
- the visibility mentioned here includes not only visibility with the naked eye but also visibility with an optical device.
- ⁇ Gs is within this range, when the support is formed using the metal foil with carrier 10 and the prepreg and the wiring board is manufactured, the first extending portion 111a of the metal foil with carrier 10 and / or The position of the second extension part 111b is not only clearer with the naked eye, but is also clearer when various optical devices are used, and the gripping operation of these extension parts 111a and 111b is surely performed. Can do. From the viewpoint of making this advantageous effect more remarkable, ⁇ Gs is more preferably 35 or more, and further preferably 40 or more. There is no particular limitation on the upper limit value of ⁇ Gs, and the higher the value, the better. However, when the value is as high as 90, the above-described effects are sufficiently achieved.
- the glossiness is measured using a commercially available gloss meter according to “Specular Glossiness—Measurement Method” of JIS Z8741-1997.
- the incident angle is 60 °.
- As the gloss meter for example, PG-1M manufactured by Nippon Denshoku Industries Co., Ltd. can be used.
- the surface glossiness measured according to JIS Z8741-1997 means that the greater the value, the higher the degree of gloss. In the present invention, if the difference ⁇ Gs in glossiness is equal to or greater than the above value, the visibility of the extended portions 111a and 111b is sufficiently enhanced.
- the magnitude relationship between the glossiness of the ultrathin metal foil layer 12 and the surface glossiness of the first extension portion 111a and / or the second extension portion 111b is not particularly limited.
- a method for adjusting the surface glossiness of the first extension part 111a and / or the second extension part 111b for example, a method for changing the surface roughness of the carrier by etching, electrolytic method, blasting, polishing, etc. The method of adjusting also with the material of the protective layer 14, thickness, etc. is mentioned.
- the above-described surface protective layer 14 may be formed in the first extending portion 111a and / or the second extending portion 111b with a thickness in the above-described range. It is advantageous. Further, the surface glossiness of the ultrathin metal foil layer 12 can be adjusted by a surface treatment similar to the treatment applied to the carrier.
- the surface glossiness (Gs-e) of the first extension part 111a and / or the second extension part 111b is preferably 30 or more and 600 or less, in view of the purpose of recognizing that it is a gripping part, and 50 or more. More preferably, it is 500 or less.
- the surface glossiness (Gs ⁇ t) of the ultrathin metal foil layer 12 is such that the glossiness difference ⁇ Gs with respect to the extension portion is not less than a desired value, while maintaining a certain level of visibility, It is preferably 4 or more and 500 or less, more preferably 5 or more and 400 or less, from the viewpoint of preventing powder falling due to the rough surface.
- the metal foil with carrier 10 having the above configuration, in the process of manufacturing a wiring board using the metal foil with carrier 10, a support is formed by laminating the metal foil with carrier and a prepreg, etc.
- the metal foil 10 with a carrier is conveyed by holding the first extending portion 111a and / or the second extending portion 111b in the attached metal foil 10, the holding can be reliably performed. Since the ultrathin metal foil layer 12 does not exist in the first extension part 111a and / or the second extension part 111b, the first extension part 111a and / or the second extension part 111b is gripped. Thus, it is possible to effectively prevent contaminants from adhering to the ultrathin metal foil layer 12 and damage such as tearing to the ultrathin metal foil layer 12.
- the ultrathin metal foil layer 12 and the carrier 11 are formed at the time of forming the embedded wiring layer. It is possible to effectively prevent peeling due to the infiltration of the chemical solution between them.
- the metal foil 10 with a carrier is prepared.
- the metal foil 10 with a carrier having the extending portion 111 of the carrier 11 only at a part of the outer edge of the ultrathin metal foil layer 12 is shown, but this is for convenience of explanation.
- the extended portion may extend from the entire outer edge of the ultrathin metal foil layer 12.
- FIGS. 3B and 3C show a support formed by laminating the metal foil 10 with a carrier and the resin layer 15.
- the resin layer 15 is laminated on the carrier 11 side of the metal foil with carrier 10, that is, on the non-formed surface of the ultrathin metal foil layer 12.
- the metal foil formed on the support surface serves as a seed layer for forming the first wiring layer of the wiring board.
- the support has a role of preventing warping, assisting in handling, and facilitating conveyance when forming a build-up layer that is a thin layer of the wiring board.
- the support with the buildup layer includes the carrier 11 in close contact with the resin layer and the ultrathin metal foil layer 12 in close contact with the wiring substrate. Are separated and separated. That is, it is separated at the ultrathin metal thin layer 12 constituting the support and the release layer 13 between the carriers 11.
- the resin layer 15 is laminated in a region overlapping with the ultrathin metal foil layer 12 and a region overlapping part or all of the extended portion 111 in a plan view of the metal foil with carrier 10.
- FIG. 3B shows a state in which the resin layer 15 is laminated in a region that overlaps with the entire extension portion 111.
- the lamination of the metal foil with carrier 10 and the resin layer 15 may be performed in accordance with known conditions and techniques employed for the lamination of copper foil and prepreg in a normal printed wiring board manufacturing process.
- the resin layer 15 typically includes a resin, preferably an insulating resin.
- the resin layer 15 is preferably a prepreg and / or a resin sheet, more preferably a prepreg.
- the prepreg is a general term for composite materials in which a synthetic resin plate, a glass plate, a glass woven fabric, a glass nonwoven fabric, paper or the like is impregnated with a synthetic resin.
- the insulating resin impregnated in the prepreg include an epoxy resin, a cyanate resin, a bismaleimide triazine resin (BT resin), a polyphenylene ether resin, and a phenol resin.
- insulating resin which comprises a resin sheet insulating resins, such as an epoxy resin, a polyimide resin, and a polyester resin, are mentioned.
- the resin layer 15 may contain filler particles made of various inorganic particles such as silica and alumina from the viewpoint of improving insulation.
- the thickness of the resin layer 15 is not particularly limited, but is preferably 3 ⁇ m or more and 1000 ⁇ m or less, more preferably 5 ⁇ m or more and 400 ⁇ m or less, and still more preferably 10 ⁇ m or more and 200 ⁇ m or less.
- the support may be cut at a predetermined position as shown in FIG. 3 (c) as necessary before forming the first wiring layer.
- the laminated body serving as the support body leaves the extending portion 111 located at the peripheral edge part, and extends the extending portion 111 and the resin layer 15 together in the thickness direction. Disconnected.
- an extension residual portion 111 ′′ is formed in the laminated body.
- the extension residual is obtained by performing the above-described cutting.
- the formation of the portion 111 ′′ has an advantage that the ultrathin metal foil layer 12 is remarkably prevented from being turned over when the laminated body after cutting is held or transported.
- the extension part 111 before cutting not only the extension part 111 before cutting but also the extension residual part 111 "on the substrate side generated by the cutting may be used as a gripping part. From this viewpoint, the extension part 111 before cutting is used.
- the width W is preferably set to a value such that a sufficiently long extension residual portion 111 ′′ is generated after cutting. From this point of view, the carrier 11 has a pair of first extending portions 111a and a pair of second extending portions 111b extending from the entire outer edge of the ultrathin metal foil layer 12 having a quadrilateral shape. As shown in FIG.
- the width W2 of the second extension part 111b is made larger than the width W1 of the first extension part 111a, and a part of the second extension part 111b is cut together with the resin layer. It is preferable to do.
- the width W2 of the second extending portion 111b larger than the width W1 of the first extending portion 111a, for example, when the outer dimension of the metal foil 10 with a carrier is square, It becomes easy to identify the first extension part 111a and the second extension part 111b artificially or mechanically.
- the resist layer 16 is formed in the surface by the side of the ultra-thin metal foil layer 12 in a laminated body.
- the resist layer 16 is formed so that at least the exposed surface of the ultrathin metal foil layer 12 is covered, and preferably the surface on the ultrathin metal foil layer 12 side in the extended residual portion 111 ′′ is also covered.
- the resist layer 16 is subjected to pattern exposure as shown in FIG. 4B, and subsequently developed as shown in FIG. 4C. Thereby, a resist pattern 16 'is formed.
- the material for forming the pattern 16 ′ may be a negative resist or a positive resist.
- the resist may be either a film type or a liquid type. Examples of the light source for exposure include ultraviolet rays and electron beams.
- As the developer sodium carbonate, sodium hydroxide, an amine-based aqueous solution, or the like can be used.
- the copper plating 18 is applied to the surface of the resist pattern 16' as shown in FIG.
- the copper plating 18 can generally be formed by electroplating.
- the formation of the copper plating 18 is not particularly limited as long as it is performed using, for example, a copper sulfate plating solution, a copper pyrophosphate plating solution, or the like according to various pattern plating methods and conditions generally used for manufacturing a wiring board.
- the ultrathin metal foil layer 12 is less likely to be peeled off when the copper plating 18 is formed. .
- the resist pattern 16 ′ is peeled off to form a wiring pattern 20 as shown in FIG.
- the resist pattern 16 ′ is peeled off by using a sodium hydroxide aqueous solution, an amine-based solution or an aqueous solution thereof, and may be performed in accordance with various peeling methods and conditions generally used in the production of printed wiring boards. In this way, a wiring pattern in which wiring portions (lines) made of the first wiring layer 22 are arranged with a gap (space) therebetween is directly formed on the surface of the ultrathin metal foil layer 12.
- the first wiring layer 22 may be subjected to a roughening process (not shown) according to a conventional method if necessary.
- ⁇ Formation of build-up wiring layer> it is preferable to continue to form a buildup wiring layer to produce a laminate with a buildup wiring layer.
- the method for forming the build-up wiring layer is not particularly limited, and a subtractive method, an MSAP (Modified Semi-Additive Process) method, an SAP (Semi-Additive) method, a full additive method, or the like can be used.
- a forming method using the modified semi-additive method is shown below. Specifically, as shown in FIG. 5B, the insulating layer 24 is formed on the surface on the first wiring layer 22 side.
- the insulating layer 24 overlaps with a region overlapping with the ultrathin metal foil layer 12 and a part or all of the extended portion 111 in the peripheral portion in plan view of the metal foil with carrier 10. It is preferable to be stacked in the region. By laminating the insulating layer 24 in this way, it becomes possible to reliably prevent the intrusion of the chemical solution in the build-up layer forming process.
- a metal foil 30 with a carrier is laminated on the laminated insulating layer 24 as shown in FIG.
- the metal foil 30 with a carrier has a laminated structure of a carrier 31 and an ultrathin metal foil layer 32, and a release layer 33 is interposed between the two, and these members are the carrier described above. It can comprise from the material similar to the metal foil 10 with attachment.
- the ultrathin metal foil layer 32 in the metal foil 30 with a carrier is laminated so as to face the insulating layer 24.
- the ultrathin metal foil layer 32 and the insulating layer 24 positioned immediately below are subjected to perforation processing, and the first wiring layer 22 is formed.
- the perforation process can be performed by laser processing using, for example, a carbon dioxide laser, a UV-YAG laser, an excimer laser, or the like.
- patterning is performed by photoresist processing, electroless copper plating, electrolytic copper plating, photoresist stripping, flash etching, or the like to form the second wiring layer 34 as shown in FIG. 6B. This patterning can be repeated a plurality of times as necessary, whereby the nth wiring layer (n is an integer of 2 or more) can be formed.
- the build-up layer after the second wiring layer 34 for example, when a metal foil typified by a resin layer and a copper foil is bonded together by press working at the same time, interlayer conduction such as via hole formation and panel plating is performed. In combination with the formation of the means, the panel plating layer and the metal foil can be etched to form a wiring pattern. When only the resin layer is bonded to the surface of the ultrathin metal foil layer 12 by pressing or laminating, a wiring pattern can be formed on the surface by a semi-additive method.
- the shape of the carrier 11 and the ultrathin metal foil layer 12 in the metal foil with carrier 10 in a plan view is a quadrilateral, but the shape of these members is not limited to a quadrilateral.
- Example 1 a rectangular metal foil 10 with a carrier shown in FIGS. 1A and 2B was manufactured by the following procedures (1) to (6).
- (1) Production of electrolytic copper foil for carrier A sulfuric acid copper sulfate solution is used as a copper electrolyte, a titanium electrode having a surface roughness Ra of 0.20 ⁇ m is used as a cathode, and a DSA (dimensional stability anode) is used as an anode.
- a solution temperature of 45 ° C. and a current density of 55 A / dm 2 to obtain an electrolytic copper foil for carriers having a thickness of 12 ⁇ m.
- the surface of the electrolytic copper foil for carrier that is processed in the steps described later is referred to as the “electrode surface side” that is in contact with the cathode during electrolysis, and is in contact with the electrolytic solution.
- the side is referred to as the “electrolyte surface side”.
- Electroplating is carried out at an electric current density of 8 A / dm 2 in an acidic copper sulfate solution on the electrode surface side of the electrolytic copper foil for carriers on which an organic release layer is formed.
- a 3 ⁇ m ultrathin copper foil layer was formed on the organic release layer.
- Roughening treatment was performed on the ultrathin copper foil layer formed on the electrode surface side of the electrolytic copper foil for carrier by the following two-stage process.
- the first stage of the roughening treatment is electrolysis (current density 27 A / dm 2 ) in a copper electrolytic solution for roughening treatment (copper concentration: 11 g / L, free sulfuric acid concentration: 220 g / L, solution temperature: 35 ° C.). This was done by washing with water.
- the second stage of the roughening treatment is electrolysis (current density: 21 A / dm 2 ) in a copper electrolytic solution for roughening treatment (copper concentration: 69 g / L, free sulfuric acid concentration: 130 g / L, solution temperature: 52 ° C.). And then by washing with water.
- Rust prevention layer The rust prevention process which consists of an inorganic rust prevention process and a chromate process was performed on both surfaces of the copper foil after a roughening process.
- a pyrophosphoric acid bath is used as an inorganic rust prevention treatment, potassium pyrophosphate concentration 80 g / L, zinc concentration 0.29 g / L, nickel concentration 2.9 g / L, liquid temperature 40 ° C., current density 0.5 A / dm.
- Step 2 a rust-proofing treatment of zinc-nickel alloy was performed.
- chromate treatment was performed, and a chromate layer was further formed on the zinc-nickel alloy rust prevention treatment. This chromate treatment was performed at a chromic acid concentration of 1 g / L, pH 11, a solution temperature of 25 ° C., and a current density of 1 A / dm 2 .
- part formation process After cutting the said copper foil into a rectangle, it set
- a metal foil 10 with a carrier shown in FIGS. 1 (a) and 2 (b) was obtained.
- the organic peeling layer was also formed in the whole area of the surface on the ultrathin copper foil side in the extended portion.
- the gloss of the ultrathin copper foil (incident angle 60 °) in this metal foil with carrier 10 was 5, and the glossiness of the ultrathin copper foil side (incident angle 60 °) at the extended portion was 50.
- the difference in glossiness ⁇ Gs between the two was 45. Due to the difference in glossiness between the two, the support laminated with the prepreg of the same size using the metal foil with carrier 10 had very good visibility of the extended portion.
- part 111a was 20 mm
- part 111b was 20 mm
- the grip property by a suction pad was also favorable.
- the wiring layer shown in FIG. 5 is formed, and the build-up layer shown in FIG. After forming, the laminate was cut and the support including the carrier was peeled off. As a result, it was confirmed that the chemical solution did not enter from the end face at the interface between the carrier and the metal foil, and that the four sides were securely sealed.
- Example 2 a metal foil 10 with a carrier whose extension part was covered with a protective layer made of an epoxy resin was prepared by the following procedure.
- (1) Production of electrolytic copper foil for carrier The electrolytic copper foil for carrier was prepared in the same manner as in Example 1.
- (2) Step of forming epoxy resin protective layer and extension site After shielding the inner region from the position 20 mm away from the outer edge of the electrolytic copper foil for carrier with a mask film, the transparent epoxy resin is dried to a thickness of 3 ⁇ m. Spray coated. Then, it was cured at 150 ° C. for 10 minutes in a drying furnace to obtain a copper foil provided with a surface protective layer formed by applying an epoxy resin to the region of the extended portion 20 mm from the outer edge.
- Organic release layer to antirust treatment For the copper foil, an organic release layer, an ultrathin copper foil layer, a roughening treatment layer, and an antirust layer were formed in the same manner as in Example 1 except for the step of forming the organic release layer. Formed.
- the organic release layer in this example was formed in the same manner as in Example 1 except that the immersion time was 90 seconds and the thickness of the release layer was 6 nm.
- a new film was not formed in the region covered with the protective layer made of epoxy resin, and a metal foil 10 with a carrier having an extended portion covered with the protective layer was obtained.
- the glossiness (incident angle 60 °) of the ultrathin copper foil in this metal foil 10 with a carrier was 5, and the glossiness (incident angle 60 °) on the ultrathin copper foil side at the extended portion was 37.
- the difference in glossiness ⁇ Gs between them was 32. Due to the difference in glossiness between them, in the support using the metal foil with carrier 10, the visibility of the extended portion was good.
- part 111a was 20 mm
- part 111b was 20 mm, and the grip property by a suction pad was also favorable.
- Example 3 the metal foil 10 with a carrier whose extension part was covered with a protective layer composed of two layers of an inorganic zinc-nickel alloy layer and a chromate layer was prepared by the following procedure.
- (1) Formation of electrolytic copper foil for carrier The electrolytic copper foil for carrier was prepared in the same manner as in Example 1 except that the immersion time in the step of forming the organic release layer was 180 seconds and the thickness of the release layer was 10 nm. .
- the shielding board was installed in the position of 5 mm as a distance from the deposition surface of copper foil only in the process of an ultra-thin copper foil layer and a roughening process layer.
- the shielding area was an area within 20 mm from the outer edge of the copper foil, and an ultrathin copper foil layer and a roughening treatment layer were not formed in that area.
- Each treatment solution and electrodeposition conditions were the same as in Example 1.
- the rust preventive layer was formed in the same manner as in Example 1, that is, without installing a shielding plate. As a result, a copper foil with a carrier in which a zinc-nickel alloy layer and a chromate layer having the same components as the rust preventive layer were coated on the extended portion was obtained.
- the glossiness (incident angle 60 °) of the ultrathin copper foil in this metal foil 10 with a carrier was 5, and the glossiness (incident angle 60 °) on the ultrathin copper foil side at the extended portion was 70.
- the difference in glossiness ⁇ Gs between the two was 65.
- the visibility of the extension site was very good.
- the width W1 of the 1st extension part 111a was 20 mm
- the width W2 of the 2nd extension part 111b was 20 mm
- the grip property by a suction pad was favorable.
- Example 4 The present example is an example in which the organic peeling layer as the surface protective layer was not formed on the extending portions 111a and 111b in the first example.
- (1) Formation of electrolytic copper foil for carrier and organic release layer The electrolytic copper foil for carrier and the organic release layer were prepared in the same manner as in Example 1.
- (2) Formation of an ultrathin copper foil layer, a roughening treatment layer, and a rust prevention layer The ultrathin copper foil layer, a roughening treatment layer, and an anti-proofing were installed with respect to the copper foil by installing the shielding plate used in Example 3. A rust-treated layer was formed. Each treatment solution and electrodeposition conditions were the same as in Example 1.
- the metal foil 10 with a carrier shown to Fig.1 (a) and (b) was obtained.
- the glossiness (incident angle 60 °) of the ultrathin copper foil in this metal foil 10 with a carrier was 5, and the glossiness (incident angle 60 °) on the ultrathin copper foil side at the extended portion was 30.
- the difference in glossiness ⁇ Gs between the two was 25. Due to the difference in glossiness between the two, in the support using the metal foil 10 with a carrier, the visibility of the extended portion immediately after production was barely possible. In addition, when a part of the region gripped by the rubber gloves was observed after one week, a part was oxidized and discolored.
- Example 5 This example is an example in which an organic layer and an inorganic layer as surface protective layers were formed on the extended portions 111a and 111b in Example 1. After forming the organic release layer of the electrolytic copper foil for the carrier, 50 mg / m 2 of Ni plating was formed, and the copper foil with carrier and the carrier extension were the same as in Example 1 except that the rust preventive layer forming step was not performed. A site was created.
- the organic peeling layer and the Ni layer were also formed on the entire surface of the extending portion on the ultrathin copper foil side.
- the amount of Ni deposited at the extension site was 3 nm in terms of thickness.
- the glossiness (incident angle 60 °) of the ultrathin copper foil in this metal foil 10 with carrier was 5, and the glossiness (incident angle 60 °) on the ultrathin copper foil side at the extended portion was 85.
- the difference in glossiness ⁇ Gs between them was 80. Due to the difference in glossiness between the two, the support laminated with the prepreg of the same size using the metal foil with carrier 10 had very good visibility of the extended portion.
- part 111a was 20 mm
- part 111b was 20 mm
- the grip property by a suction pad was also favorable.
- the wiring layer shown in FIG. 5 is formed, and the build-up layer shown in FIG. After forming, the laminate was cut and the support including the carrier was peeled off. As a result, it was confirmed that the chemical solution did not enter from the end face at the interface between the carrier and the metal foil, and that the four sides were securely sealed.
- Example 1 a pressure-sensitive adhesive layer having a thickness of 1.5 ⁇ m was used as the release layer in Example 1, and the extended portion was an exposed electrolytic copper foil for carrier.
- the outer periphery of the electrolytic copper foil for carrier obtained in Example 1 was masked with a polyimide tape having a width of 20 mm.
- the peeling layer was formed by apply
- part was produced by peeling a polyimide tape.
- the wiring layer shown in FIG. 5 is formed, and the build-up layer shown in FIG. 6 is further formed.
- the laminate was cut and the support including the carrier was peeled off.
- penetration of the chemical used when forming the buildup layer was observed in the adhesive layer and in the gap, and a pinhole having a size of 5 mm ⁇ was generated in the ultrathin copper layer.
- the handling property such as transportation is good and the visibility of the gripping portion is excellent.
- a coreless build-up board is manufactured, it is excellent in sealing from the end face of the support and can prevent the intrusion of chemicals in the build-up layer forming process, so that the productivity of the wiring board is high. It can be.
Abstract
Description
前記剥離層の厚さは1nm以上1μm以下であり、
前記キャリアは、前記極薄金属箔層の外縁の少なくとも一部から延出した延出部位を有するキャリア付き金属箔を提供することにより前記の課題を解決したものである。 The present invention is a metal foil with a carrier having a carrier, an ultrathin metal foil layer, and a release layer located between them,
The release layer has a thickness of 1 nm to 1 μm,
The carrier solves the above-mentioned problems by providing a metal foil with a carrier having an extended portion extending from at least a part of the outer edge of the ultrathin metal foil layer.
前記キャリア付き金属箔における前記延出部位を把持する工程を有する配線基板の製造方法を提供することにより前記の課題を解決したものである。 Further, the present invention is a method for manufacturing a wiring board using the metal foil with a carrier,
The above-described problems are solved by providing a method of manufacturing a wiring board having a step of gripping the extended portion of the metal foil with a carrier.
キャリア付き金属箔10における極薄金属箔層12は平面視して対向する一対の辺を有している。この極薄金属箔層12とキャリア10との間に位置する剥離層13は、極薄金属箔層12との平面視において、両者が完全に重なるように形成することができる。その場合には剥離層13は、極薄金属箔層12と同形且つ同寸法となる。尤も、剥離層13の形状はこれに限られず、後述するとおり、キャリア付き金属箔10の平面視において、極薄金属箔層12の外縁のうちの少なくとも一部から延出していてもよい。 <Metal foil with carrier>
The ultrathin
キャリア11は、厚みの薄い部材である極薄金属箔層12の取り扱い性を向上させるために、極薄金属箔層12を支持する部材として用いられる。キャリア11を構成する材料に特に限定はないが、例えば、銅箔、銅合金箔、アルミニウム箔、アルミニウム箔の表面に銅あるいは亜鉛等の金属めっき層が設けられた複合金属箔、ステンレス箔等の金属箔を用いることができる。その他には、PETフィルム、PENフィルム、アラミドフィルム、ポリイミドフィルム、ナイロンフィルム、液晶ポリマー等の樹脂フィルム、樹脂フィルム上に金属コート層を備える金属コート樹脂フィルム、ガラス板、セラミック板等が挙げられる。それらの中でも、ハンドリング中に生じることのある静電気による異物の巻込みを防ぐ点から、金属箔が好ましく、厚さの均一性及び箔の耐食性などの点から銅箔が好ましい。キャリア11の厚さは、極薄金属箔層12の厚さよりも大きいことを条件として、典型的には250μm以下であり、好ましくは12μm以上200μm以下である。 <Career>
The
剥離層13は、キャリア11の引き剥がし強度を弱くし、該強度の安定性を担保し、更には高温でのプレス成形時にキャリア11と極薄金属箔層12の間で起こる可能性のある相互拡散を抑制する機能を有する層である。図1に示す実施形態では、剥離層13は、キャリア11の一方の面にのみ形成されているが、必要に応じキャリア11の両面に形成されてもよい。剥離層13は、有機剥離層及び無機剥離層のいずれであってもよい。有機剥離層に用いられる有機成分の例としては、窒素含有有機化合物、硫黄含有有機化合物、カルボン酸等が挙げられる。窒素含有有機化合物の例としては、トリアゾール化合物、イミダゾール化合物等が挙げられ、中でもトリアゾール化合物は剥離性が安定しやすい点で好ましい。トリアゾール化合物の例としては、1,2,3-ベンゾトリアゾール、カルボキシベンゾトリアゾール、N’,N’-ビス(ベンゾトリアゾリルメチル)ユリア、1H-1,2,4-トリアゾール及び3-アミノー1H-1,2,4-トリアゾール等が挙げられる。硫黄含有有機化合物の例としては、メルカプトベンゾチアゾール、チオシアヌル酸、2-ベンズイミダゾールチオール等が挙げられる。カルボン酸の例としては、モノカルボン酸、ジカルボン酸等が挙げられる。一方、無機剥離層に用いられる無機成分の例としては、Ni、Mo、Co、Cr、Fe、Ti、W、P、Zn、炭素等のうち少なくとも一種若しくはこれらの合金、又は/及び酸化物が挙げられる。剥離層としてこれらの材料を用いることで、極めて薄層の剥離層を形成できる。このことに起因して、例えば、粘着剤を塗布して剥離層を形成する場合と比較して、延出部位の端部に露出される剥離層の表面積が少なくなるので、ビルドアップ層の製造段階での金属箔とキャリアとの界面への薬品侵入や、機械的衝撃による剥離起点の発生を強固に防ぐことが可能となる。 <Peeling layer>
The
キャリア付き金属箔10における極薄金属箔層12は、後述する配線基板製造時における配線パターン用電気めっき導通性、及び支持体を剥離後にフラッシュエッチングする際の細線形成性の観点から、その厚みが0.1μm以上10μm以下であることが好ましく、更に好ましくは、0.2μm以上8μm、一層好ましくは1μm以上5μm以下である。極薄金属箔層12は、導電性及び薬液等によるエッチング加工性を有する材料が好ましく、例えば銅、銅合金、アルミニウム、亜鉛、ニッケル、スズ又はステンレスの金属材料で形成することができる。特に、電気抵抗が低く、エッチング等による回路形成時の加工性に優れる点や、その後の配線層の形成の容易さの点から銅箔又は銅合金箔、特に銅箔を好適に用いることができる。金属箔層12の製造方法としては、例えばスパッタリング法、蒸着法、電解法などが挙げられる。キャリア11及び剥離層13の一括生産性の観点からは、電解法を採用することが好ましい。 <Ultrathin metal foil layer>
The thickness of the ultrathin
先に述べた第1延出部位111a及び/又は第2延出部位111bにおいては、それらの面のうち、極薄金属箔層12側に位置する面に、図2(b)に示すとおり、表面保護層14を設けることが一層好ましい。表面保護層14は、キャリアの第1延出部位111a及び/又は第2延出部位111bにおける極薄金属箔層12側に位置する表面を、長期保管による酸化、延出部位の把持の際に生じるキズによる酸化、並びに把持用治具や手袋などから転写される水滴及び油滴からの酸化汚染防止等から保護する目的で用いられる。表面保護層14は無機保護層であっても有機保護層であってもよいが、酸化汚染をより強固に防止するためには、有機保護層が好ましい。 <Surface protective layer>
In the
キャリア付き金属箔10を、その極薄金属箔層12側から見たときに、第1延出部位111a及び/又は第2延出部位111bの視認性を高める観点から、極薄金属箔層12の表面と、第1延出部位111a及び/又は第2延出部位111bのうち、該極薄金属箔層12側に位置する表面との、入射角60°での光沢度の差ΔGsは、30以上であることが好ましい。ここで言う視認性とは、肉眼での視認性だけでなく、光学機器による視認性も含まれる。ΔGsがこの範囲内であることによって、キャリア付き金属箔10及びプリプレグ等を用いて支持体を形成し、配線基板を製造するときに、キャリア付き金属箔10の第1延出部位111a及び/又は第2延出部位111bの位置が肉眼で一層明瞭になるだけでなく、各種の光学機器を用いた場合にも一層明瞭になり、これらの延出部位111a,111bの把持操作を確実に行うことができる。この有利な効果を一層顕著なものとする観点から、ΔGsは35以上であることが更に好ましく、40以上であることが一層好ましい。ΔGsの上限値に特に制限はなく、その値は高ければ高いほど好ましいが、90程度に高くなれば、上述の効果が十分に奏される。 <Visibility of the extended part>
From the viewpoint of enhancing the visibility of the first extending
図3(b)及び(c)は、前記のキャリア付き金属箔10と、樹脂層15を積層して形成される支持体を示すものである。
支持体において、樹脂層15は、キャリア付き金属箔10のキャリア11側、すなわち極薄金属箔層12の非形成面に積層されている。
支持体表面に形成された金属箔は、配線基板の第1配線層形成用のシード層となる。
支持体は、配線基板の薄層であるビルドアップ層形成時における反りの防止やハンドリングの補助、及び搬送を容易にする役割をもつ。また、第1配線層を含むビルドアップ層が形成された後、ビルドアップ層付きの支持体は、樹脂層と密着されたキャリア11と、配線基板と密着された極薄金属箔層12との間で剥離され、分離されるものである。つまり、支持体を構成する極薄金属薄層12と、キャリア11の間の剥離層13において分離されるものである。
樹脂層15は、キャリア付き金属箔10の平面視において、極薄金属箔層12と重なる領域、及び延出部位111の一部又は全部と重なる領域に積層される。図3(b)には、延出部位111の全部と重なる領域に樹脂層15が積層されている状態が示されている。 <Support>
FIGS. 3B and 3C show a support formed by laminating the
In the support, the
The metal foil formed on the support surface serves as a seed layer for forming the first wiring layer of the wiring board.
The support has a role of preventing warping, assisting in handling, and facilitating conveyance when forming a build-up layer that is a thin layer of the wiring board. In addition, after the buildup layer including the first wiring layer is formed, the support with the buildup layer includes the
The
本製造方法においては、切断前の延出部位111だけでなく、切断によって生じる基板側の延出残留部位111”も、把持部として用いる場合がある。その観点から、切断前の延出部位111の幅Wは、切断後に十分な幅の延出残留部位111”が生じるような値に設定することが好ましい。この観点から、キャリア11が、四辺形を有する極薄金属箔層12の外縁の全域から延出して、一対の第1延出部位111a及び一対の第2延出部位111bを有している場合には、図1(a)に示すとおり、第1延出部位111aの幅W1よりも第2延出部位111bの幅W2を大きくし、第2延出部位111bの一部を樹脂層とともに切断することが好ましい。このような目的の他、第1延出部位111aの幅W1よりも第2延出部位111bの幅W2を大きくしておくことで、例えばキャリア付き金属箔10の外形寸法が正方形だった場合、人為的ないし機械的に第1延出部位111aと第2延出部位111bを識別することが容易となる。 <Manufacturing method of wiring board>
In this manufacturing method, not only the
次に図4(a)に示すとおり、積層体における極薄金属箔層12側の表面にレジスト層16を形成する。レジスト層16は、少なくとも、極薄金属箔層12の露出面が被覆されるように形成され、好ましくは延出残留部位111”における極薄金属箔層12側の表面も被覆されるように形成される。このようにレジスト層16を形成することで、積層体の端部を確実に封止することが可能となるので、後述する第1配線層を確実に形成できるという利点がある。 <Formation of wiring pattern>
Next, as shown to Fig.4 (a), the resist
このようにして、第1配線層22が形成される。この第1配線層22は、必要に応じ露出面を常法に従い粗化処理してもよい(図示せず)。 After the copper plating 18 is formed, the resist
In this way, the
本製造方法においては、引き続き、ビルドアップ配線層を形成してビルドアップ配線層付き積層体を作製することが好ましい。ビルドアップ配線層の形成方法は、特に限定されず、サブトラクティブ法、MSAP(モディファイド・セミ・アディティブ・プロセス)法、SAP(セミアディティブ)法、フルアディティブ法等が使用可能である。一例としてモディファイド・セミ・アディティブ法を用いた形成方法を以下に示す。詳細には、図5(b)に示すとおり、第1配線層22側の表面に絶縁層24を形成する。 <Formation of build-up wiring layer>
In this manufacturing method, it is preferable to continue to form a buildup wiring layer to produce a laminate with a buildup wiring layer. The method for forming the build-up wiring layer is not particularly limited, and a subtractive method, an MSAP (Modified Semi-Additive Process) method, an SAP (Semi-Additive) method, a full additive method, or the like can be used. As an example, a forming method using the modified semi-additive method is shown below. Specifically, as shown in FIG. 5B, the insulating
このようにして第2配線層34又は/及び第2配線層34以降のビルドアップ層(図示せず)が形成されたら、図6(c)に示すとおり積層体をその厚み方向に沿って切断する切断工程を行う。積層体の切断位置は、先に述べたキャリアの延出残留部位111”よりも基板の中心側とすることが好ましい。そのような位置で切断を行うと、図6(d)に示す、キャリア11を含む支持体の剥離工程において、剥離が容易になるという利点がある。なお図6(d)に示す剥離工程においては、樹脂層15をキャリア11とともに剥離する。引き続き、図6(e)に示すとおり、第1配線層22の配線パターン間、及び第2配線層34の配線パターン間に露出する極薄金属箔層12,32をフラッシュエッチングにより除去して、目的とする配線基板を得る。 <Peeling of support and flash etching>
When the
本実施例では、図1(a)及び図2(b)に示す長方形のキャリア付き金属箔10を、以下の(1)-(6)の手順で製造した。
(1)キャリア用電解銅箔の製造
銅電解液として硫酸酸性硫酸銅溶液を用い、陰極に表面粗さRaが0.20μmのチタン製の電極を用い、陽極にはDSA(寸法安定性陽極)を用いて、溶液温度45℃、電流密度55A/dm2で電解し、厚さ12μmのキャリア用電解銅箔を得た。なお、以下の説明においては、キャリア用電解銅箔に対して、後述の工程で加工を施す面について、電解時に陰極と接していた側を「電極面側」と称し、電解液と接していた側を「電解液面側」と称する。 [Example 1]
In this example, a
(1) Production of electrolytic copper foil for carrier A sulfuric acid copper sulfate solution is used as a copper electrolyte, a titanium electrode having a surface roughness Ra of 0.20 μm is used as a cathode, and a DSA (dimensional stability anode) is used as an anode. Was used for electrolysis at a solution temperature of 45 ° C. and a current density of 55 A / dm 2 to obtain an electrolytic copper foil for carriers having a thickness of 12 μm. In the following description, the surface of the electrolytic copper foil for carrier that is processed in the steps described later is referred to as the “electrode surface side” that is in contact with the cathode during electrolysis, and is in contact with the electrolytic solution. The side is referred to as the “electrolyte surface side”.
酸洗処理されたキャリア用電解銅箔の電極面側を、CBTA(カルボキシベンゾトリアゾール)1000質量ppm、硫酸150g/L及び銅10g/Lを含む水溶液に、液温30℃で30秒間浸漬して引き上げた。こうしてCBTA成分をキャリア用電解銅箔の電極面側に吸着させて、CBTA層を有機剥離層として形成させた。面積重量換算法で測定した剥離層の厚さは3nmであった。 (2) Formation of Organic Peeling Layer The electrode surface side of the pickled electrolytic copper foil for carrier was subjected to an aqueous solution containing 1000 mass ppm of CBTA (carboxybenzotriazole), 150 g / L of sulfuric acid and 10 g / L of copper. It was dipped at 30 ° C. for 30 seconds and pulled up. Thus, the CBTA component was adsorbed on the electrode surface side of the electrolytic copper foil for carrier, and the CBTA layer was formed as an organic release layer. The thickness of the release layer measured by the area weight conversion method was 3 nm.
有機剥離層を形成したキャリア用電解銅箔の電極面側に対して酸性硫酸銅溶液中で、電流密度8A/dm2にて電気めっきを行い、厚さ3μmの極薄銅箔層を有機剥離層上に形成した。 (3) Formation of ultrathin copper foil layer Electroplating is carried out at an electric current density of 8 A / dm 2 in an acidic copper sulfate solution on the electrode surface side of the electrolytic copper foil for carriers on which an organic release layer is formed. A 3 μm ultrathin copper foil layer was formed on the organic release layer.
キャリア用電解銅箔の電極面側に形成された極薄銅箔層に対して、以下の2段階のプロセスで粗化処理を行った。粗化処理の1段目は、粗化処理用銅電解溶液(銅濃度:11g/L、フリー硫酸濃度:220g/L、溶液温度:35℃)にて電解(電流密度27A/dm2)し、水洗することにより行った。粗化処理の2段目は、粗化処理用銅電解溶液(銅濃度:69g/L、フリー硫酸濃度:130g/L、溶液温度:52℃)にて電解(電流密度:21A/dm2)し、水洗することにより行った。 (4) Roughening treatment Roughening treatment was performed on the ultrathin copper foil layer formed on the electrode surface side of the electrolytic copper foil for carrier by the following two-stage process. The first stage of the roughening treatment is electrolysis (current density 27 A / dm 2 ) in a copper electrolytic solution for roughening treatment (copper concentration: 11 g / L, free sulfuric acid concentration: 220 g / L, solution temperature: 35 ° C.). This was done by washing with water. The second stage of the roughening treatment is electrolysis (current density: 21 A / dm 2 ) in a copper electrolytic solution for roughening treatment (copper concentration: 69 g / L, free sulfuric acid concentration: 130 g / L, solution temperature: 52 ° C.). And then by washing with water.
粗化処理後の銅箔の両面に、無機防錆処理及びクロメート処理からなる防錆処理を行った。先ず、無機防錆処理として、ピロリン酸浴を用い、ピロリン酸カリウム濃度80g/L、亜鉛濃度0.29g/L、ニッケル濃度2.9g/L、液温40℃、電流密度0.5A/dm2で亜鉛-ニッケル合金防錆処理を行った。次いで、クロメート処理をして、亜鉛-ニッケル合金防錆処理の上に、更にクロメート層を形成した。このクロメート処理は、クロム酸濃度が1g/L、pH11、溶液温度25℃、電流密度1A/dm2で行った。 (5) Rust prevention layer The rust prevention process which consists of an inorganic rust prevention process and a chromate process was performed on both surfaces of the copper foil after a roughening process. First, as an inorganic rust prevention treatment, a pyrophosphoric acid bath is used, potassium pyrophosphate concentration 80 g / L, zinc concentration 0.29 g / L, nickel concentration 2.9 g / L, liquid temperature 40 ° C., current density 0.5 A / dm. In Step 2 , a rust-proofing treatment of zinc-nickel alloy was performed. Next, chromate treatment was performed, and a chromate layer was further formed on the zinc-nickel alloy rust prevention treatment. This chromate treatment was performed at a chromic acid concentration of 1 g / L,
前記の銅箔を、長方形にカットした後、極薄銅層を上面にして平板ステージ上に置いて全面を真空吸着させた。その後、銅箔の一辺の端部より20mmの領域のみを露出させた状態で、ステンレス板で被覆し、露出部のみにシリコーン系粘着剤付きのポリイミド・テープを貼り合わせた。貼り合わせの後、速度5m/minでポリイミド・テープを引き上げることで、極薄銅箔が粘着されたポリイミド・テープを銅箔から剥離し、一辺の端部に剥離層が露出した幅20mmの延出部位を得た。同様の処理を残りの3辺について行い、四辺の端部20mmが剥離層で被覆された延出部位の設けられたキャリア付き金属箔10を得た。 (6) Carrier extension site | part formation process After cutting the said copper foil into a rectangle, it set | placed on the flat plate stage by making an ultra-thin copper layer into an upper surface, and the whole surface was vacuum-sucked. Then, in the state which exposed only the area | region of 20 mm from the edge part of one side of copper foil, it coat | covered with the stainless steel plate, and the polyimide tape with a silicone type adhesive was bonded only to the exposed part. After bonding, the polyimide tape with the ultrathin copper foil adhered is peeled off from the copper foil by pulling up the polyimide tape at a speed of 5 m / min, and a 20 mm wide extension with a release layer exposed at one end. The exit site was obtained. The same process was performed for the remaining three sides, and a
本実施例では、延出部位がエポキシ樹脂からなる保護層で被覆されたキャリア付き金属箔10を次の手順で作成した。
(1)キャリア用電解銅箔の製造
キャリア用電解銅箔は、実施例1と同様に作成した。
(2)エポキシ樹脂保護層及び延出部位の形成工程
キャリア用電解銅箔の外縁から20mm隔てた位置から内側の領域をマスクフィルムで遮蔽した後、透明エポキシ樹脂を乾燥膜厚3μmとなる要領でスプレーコートした。その後、乾燥炉で150℃10分硬化させ外縁から20mmの延出部位の領域にエポキシ樹脂が塗布されて形成された表面保護層を備えた銅箔を得た。
(3)有機剥離層~防錆処理
前記銅箔に対して、有機剥離層の形成工程以外は実施例1と同様に有機剥離層、極薄銅箔層、粗化処理層及び防錆層を形成した。本実施例における有機剥離層の形成は、浸漬時間を90秒として、剥離層の厚さを6nmとする以外は実施例1と同様とした。エポキシ樹脂からなる保護層で被覆された領域には、新たな被膜は形成せず、該保護層で被覆された延出部位をもつキャリア付き金属箔10を得た。 [Example 2]
In this example, a
(1) Production of electrolytic copper foil for carrier The electrolytic copper foil for carrier was prepared in the same manner as in Example 1.
(2) Step of forming epoxy resin protective layer and extension site After shielding the inner region from the
(3) Organic release layer to antirust treatment For the copper foil, an organic release layer, an ultrathin copper foil layer, a roughening treatment layer, and an antirust layer were formed in the same manner as in Example 1 except for the step of forming the organic release layer. Formed. The organic release layer in this example was formed in the same manner as in Example 1 except that the immersion time was 90 seconds and the thickness of the release layer was 6 nm. A new film was not formed in the region covered with the protective layer made of epoxy resin, and a
本実施例では、延出部位が、無機物である亜鉛-ニッケル合金層とクロメート層の2層からなる保護層で被覆されたキャリア付き金属箔10を次の手順で作成した。
(1)キャリア用電解銅箔の形成
キャリア用電解銅箔は、有機剥離層の形成工程における浸漬時間を180秒とし、剥離層の厚さを10nmとする以外は実施例1と同様に作成した。
(2)極薄銅箔層、粗化処理層及び防錆層の形成
前記銅箔に対して、遮蔽板を設置して極薄銅箔層、粗化処理層を形成した。ここで、極薄銅箔層と粗化処理層の工程のみ、銅箔の析出面からの距離として5mmの位置に遮蔽板を設置した。遮蔽領域は銅箔の外縁から20mm以内の領域とし、その領域に極薄銅箔層と粗化処理層が形成されないようにした。それぞれの処理液や電着の条件は実施例1と同様に行った。次いで、防錆層は実施例1と同様に、すなわち遮蔽板を設置せずに形成した。その結果、延出部位上に防錆層と同じ成分の亜鉛-ニッケル合金層とクロメート層が被覆されたキャリア付き銅箔を得た。 Example 3
In this example, the
(1) Formation of electrolytic copper foil for carrier The electrolytic copper foil for carrier was prepared in the same manner as in Example 1 except that the immersion time in the step of forming the organic release layer was 180 seconds and the thickness of the release layer was 10 nm. .
(2) Formation of ultrathin copper foil layer, roughening treatment layer, and rust prevention layer A shielding plate was installed on the copper foil to form an ultrathin copper foil layer and a roughening treatment layer. Here, the shielding board was installed in the position of 5 mm as a distance from the deposition surface of copper foil only in the process of an ultra-thin copper foil layer and a roughening process layer. The shielding area was an area within 20 mm from the outer edge of the copper foil, and an ultrathin copper foil layer and a roughening treatment layer were not formed in that area. Each treatment solution and electrodeposition conditions were the same as in Example 1. Next, the rust preventive layer was formed in the same manner as in Example 1, that is, without installing a shielding plate. As a result, a copper foil with a carrier in which a zinc-nickel alloy layer and a chromate layer having the same components as the rust preventive layer were coated on the extended portion was obtained.
本実施例は、実施例1において、延出部位111a,111bに表面保護層としての有機剥離層の形成を行わなかった例である。
(1)キャリア用電解銅箔及び有機剥離層の形成
キャリア用電解銅箔及び有機剥離層は、実施例1と同様に作成した。
(2)極薄銅箔層、粗化処理層及び防錆層の形成
前記銅箔に対して、実施例3で用いた遮蔽板を設置して極薄銅箔層、粗化処理層及び防錆処理層を形成した。それぞれの処理液や電着の条件は実施例1と同様に行った。その結果、防錆処理工程においてキャリア延出部位上に形成された剥離層は防錆処理工程において溶解除去されたことが確認できた。
このようにして図1(a)及び(b)に示すキャリア付き金属箔10を得た。このキャリア付き金属箔10における極薄銅箔の光沢度(入射角60°)は5であり、延出部位における極薄銅箔側の光沢度(入射角60°)は30であった。両者の光沢度の差ΔGsは25であった。両者の光沢度の差に起因して、キャリア付き金属箔10を用いた支持体においては、製造直後の延出部位の視認性は辛うじて可能なレベルであった。また、ゴム手袋で把持した領域の一部は1週間後に観察すると、一部が酸化し変色を発生していた。 Example 4
The present example is an example in which the organic peeling layer as the surface protective layer was not formed on the extending
(1) Formation of electrolytic copper foil for carrier and organic release layer The electrolytic copper foil for carrier and the organic release layer were prepared in the same manner as in Example 1.
(2) Formation of an ultrathin copper foil layer, a roughening treatment layer, and a rust prevention layer The ultrathin copper foil layer, a roughening treatment layer, and an anti-proofing were installed with respect to the copper foil by installing the shielding plate used in Example 3. A rust-treated layer was formed. Each treatment solution and electrodeposition conditions were the same as in Example 1. As a result, it was confirmed that the release layer formed on the carrier extension site in the rust prevention treatment step was dissolved and removed in the rust prevention treatment step.
Thus, the
本実施例は、実施例1において、延出部位111a,111bに表面保護層としての有機層及び無機層の形成を行った例である。キャリア用電解銅箔の有機剥離層を形成した後、Niめっきを50mg/m2形成し、且つ防錆層形成工程を行わなかった以外は実施例1と同様にキャリア付銅箔及びキャリア延出部位を作製した。 Example 5
This example is an example in which an organic layer and an inorganic layer as surface protective layers were formed on the
本実施例は、実施例1において、剥離層として厚さ1.5μmの粘着剤層を用い、延出部位はキャリア用電解銅箔を露出させた例である。先ず、実施例1で得られるキャリア用電解銅箔の外周に、幅20mmのポリイミド・テープでマスキングを行った。その後、マスキングを行った面に、アクリル酸エステル樹脂とエラストマーの混合物である接着剤を乾燥厚さ1.5μmとして塗布乾燥することで剥離層を形成した。その後、マグネトロン式のスパッタリング装置により厚さ2μmの極薄銅層を形成した。その後、粗化処理及び防錆処理を実施例1と同様に行った後、ポリイミド・テープを剥離することでキャリア延出部位を作製した。 [Comparative Example 1]
In this example, a pressure-sensitive adhesive layer having a thickness of 1.5 μm was used as the release layer in Example 1, and the extended portion was an exposed electrolytic copper foil for carrier. First, the outer periphery of the electrolytic copper foil for carrier obtained in Example 1 was masked with a polyimide tape having a width of 20 mm. Then, the peeling layer was formed by apply | coating and drying the adhesive agent which is a mixture of acrylic ester resin and an elastomer with the dry thickness of 1.5 micrometers on the masked surface. Thereafter, an ultrathin copper layer having a thickness of 2 μm was formed by a magnetron type sputtering apparatus. Then, after performing a roughening process and a rust prevention process like Example 1, the carrier extension site | part was produced by peeling a polyimide tape.
Claims (11)
- キャリアと、極薄金属箔層と、これらの間に位置する剥離層とを有するキャリア付き金属箔において、
前記剥離層の厚さは1nm以上1μm以下であり、
前記キャリアは、前記極薄金属箔層の外縁の少なくとも一部から延出した延出部位を有するキャリア付き金属箔。 In a metal foil with a carrier having a carrier, an ultrathin metal foil layer, and a release layer located between them,
The release layer has a thickness of 1 nm to 1 μm,
The carrier is a metal foil with a carrier having an extended portion extending from at least a part of an outer edge of the ultrathin metal foil layer. - 前記延出部位のうち、前記極薄金属箔層側の面に、表面保護層が設けられている請求項1に記載のキャリア付き金属箔。 The metal foil with a carrier according to claim 1, wherein a surface protective layer is provided on a surface of the extending portion on the ultrathin metal foil layer side.
- 前記表面保護層が、前記剥離層の延出部からなる請求項2に記載のキャリア付き金属箔。 The metal foil with a carrier according to claim 2, wherein the surface protective layer comprises an extended portion of the release layer.
- 前記表面保護層が、防錆剤を含む層からなる請求項2に記載のキャリア付き金属箔。 The metal foil with a carrier according to claim 2, wherein the surface protective layer comprises a layer containing a rust inhibitor.
- JIS Z8741-1997に準じて測定された、入射角60°での前記極薄金属箔層表面と前記延出部位表面との光沢度の差ΔGsが30以上である請求項1ないし4のいずれか一項に記載のキャリア付き金属箔。 5. The difference ΔGs in glossiness between the surface of the ultrathin metal foil layer and the surface of the extended part at an incident angle of 60 °, measured according to JIS Z8741-1997, is 30 or more. The metal foil with a carrier according to one item.
- 前記極薄金属箔層が平面視して対向する少なくとも一対の辺を有し、
前記キャリアは、前記極薄金属箔層における対向する少なくとも一対の辺から延出した前記延出部位を有する請求項1ないし5のいずれかに記載のキャリア付き金属箔。 The ultrathin metal foil layer has at least a pair of sides facing each other in plan view;
The metal foil with a carrier according to any one of claims 1 to 5, wherein the carrier has the extended portion extending from at least a pair of opposing sides in the ultrathin metal foil layer. - 前記極薄金属箔層が平面視して四辺形をしており、
前記キャリアが、前記極薄金属箔層の外縁の全域から延出し、平面視して該極薄金属箔層の四辺と略平行な四辺を有する四辺形をしており、それによって該キャリアは、対向する一対の第1延出部位及び対向する一対の第2延出部位を有し、
第1延出部位の幅W1よりも第2延出部位の幅W2が大きくなっている請求項1ないし6のいずれか一項に記載のキャリア付き金属箔。 The ultrathin metal foil layer has a quadrilateral shape in plan view,
The carrier extends from the entire outer edge of the ultrathin metal foil layer and has a quadrilateral shape having four sides substantially parallel to the four sides of the ultrathin metal foil layer in plan view. A pair of opposing first extending portions and a pair of opposing second extending portions;
The metal foil with a carrier according to any one of claims 1 to 6, wherein a width W2 of the second extension part is larger than a width W1 of the first extension part. - 請求項1ないし7のいずれか一項に記載のキャリア付き金属箔における前記極薄金属箔層の非形成面に樹脂層が積層されてなり、
前記樹脂層は前記極薄金属箔層と重なる領域、及び前記延出部位の一部又は全部と重なる領域に積層されている配線基板製造用支持体。 A resin layer is laminated on a non-formed surface of the ultrathin metal foil layer in the metal foil with a carrier according to any one of claims 1 to 7,
The support for manufacturing a wiring board, wherein the resin layer is laminated in a region overlapping with the ultrathin metal foil layer and a region overlapping a part or all of the extended portion. - 請求項1ないし7のいずれか一項に記載のキャリア付き金属箔を用いた配線基板の製造方法であって、
前記キャリア付き金属箔における前記延出部位を把持する工程を有する配線基板の製造方法。 A method for manufacturing a wiring board using the metal foil with a carrier according to any one of claims 1 to 7,
The manufacturing method of a wiring board which has the process of hold | gripping the said extension part in the said metal foil with a carrier. - 請求項8に記載の配線基板製造用支持体を用いた配線基板の製造方法であって、
前記支持体の極薄金属箔上に配線パターンを形成する工程、
ビルドアップ配線層を形成する工程をこの順に有し、
前記ビルドアップ配線層形成工程において、絶縁層が積層され、
前記支持体の周縁部において、前記絶縁層が、前記極薄金属箔層と重なる領域、及び前記延出部位の一部又は全部と重なる領域に積層される、配線基板の製造方法。 A method for manufacturing a wiring board using the wiring board manufacturing support according to claim 8,
Forming a wiring pattern on the ultrathin metal foil of the support,
It has a process of forming a build-up wiring layer in this order,
In the build-up wiring layer forming step, an insulating layer is laminated,
A method for manufacturing a wiring board, wherein the insulating layer is laminated in a region overlapping with the ultrathin metal foil layer and a region overlapping with a part or all of the extended portion at a peripheral portion of the support. - 請求項8に記載の配線基板製造用支持体を用いた配線基板の製造方法であって、
前記支持体の周縁部において、前記延出部位の一部を残して、該延出部位と前記樹脂層とを一緒に切断する工程を有する配線基板の製造方法。 A method for manufacturing a wiring board using the wiring board manufacturing support according to claim 8,
A method for manufacturing a wiring board, comprising a step of cutting the extended portion and the resin layer together, leaving a part of the extended portion at a peripheral portion of the support.
Priority Applications (3)
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CN201680011755.9A CN107249876A (en) | 2015-03-12 | 2016-02-19 | The manufacture method of metal foil and circuit board with carrier |
KR1020177022124A KR20170127414A (en) | 2015-03-12 | 2016-02-19 | Carrier-attached metal foil and method for manufacturing wiring board |
JP2017504945A JPWO2016143484A1 (en) | 2015-03-12 | 2016-02-19 | Metal foil with carrier and method for manufacturing wiring board |
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JPPCT/JP2015/057298 | 2015-03-12 | ||
PCT/JP2015/057298 WO2016143117A1 (en) | 2015-03-12 | 2015-03-12 | Metal foil with carrier, and manufacturing method for wiring board |
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PCT/JP2016/054851 WO2016143484A1 (en) | 2015-03-12 | 2016-02-19 | Metal foil with carrier, and manufacturing method for wiring board |
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PCT/JP2015/057298 WO2016143117A1 (en) | 2015-03-12 | 2015-03-12 | Metal foil with carrier, and manufacturing method for wiring board |
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JP (1) | JPWO2016143484A1 (en) |
KR (1) | KR20170127414A (en) |
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CN107249876A (en) | 2017-10-13 |
TW201644330A (en) | 2016-12-16 |
JPWO2016143484A1 (en) | 2017-12-28 |
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