WO2016138674A1 - 对产品制程进行线上实时控制的方法 - Google Patents

对产品制程进行线上实时控制的方法 Download PDF

Info

Publication number
WO2016138674A1
WO2016138674A1 PCT/CN2015/073951 CN2015073951W WO2016138674A1 WO 2016138674 A1 WO2016138674 A1 WO 2016138674A1 CN 2015073951 W CN2015073951 W CN 2015073951W WO 2016138674 A1 WO2016138674 A1 WO 2016138674A1
Authority
WO
WIPO (PCT)
Prior art keywords
product
line parameters
production line
quality
display
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/CN2015/073951
Other languages
English (en)
French (fr)
Inventor
陈黎暄
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
TCL China Star Optoelectronics Technology Co Ltd
Original Assignee
Shenzhen China Star Optoelectronics Technology Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shenzhen China Star Optoelectronics Technology Co Ltd filed Critical Shenzhen China Star Optoelectronics Technology Co Ltd
Priority to US14/779,698 priority Critical patent/US9891614B2/en
Publication of WO2016138674A1 publication Critical patent/WO2016138674A1/zh
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Images

Classifications

    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B19/00—Program-control systems
    • G05B19/02—Program-control systems electric
    • G05B19/18—Numerical control [NC], i.e. automatically operating machines, in particular machine tools, e.g. in a manufacturing environment, so as to execute positioning, movement or co-ordinated operations by means of program data in numerical form
    • G05B19/406—Numerical control [NC], i.e. automatically operating machines, in particular machine tools, e.g. in a manufacturing environment, so as to execute positioning, movement or co-ordinated operations by means of program data in numerical form characterised by monitoring or safety
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B19/00—Program-control systems
    • G05B19/02—Program-control systems electric
    • G05B19/418—Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS] or computer integrated manufacturing [CIM]
    • G05B19/41885—Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS] or computer integrated manufacturing [CIM] characterised by modeling, simulation of the manufacturing system
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B19/00—Program-control systems
    • G05B19/02—Program-control systems electric
    • G05B19/418—Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS] or computer integrated manufacturing [CIM]
    • G05B19/41875—Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS] or computer integrated manufacturing [CIM] characterised by quality surveillance of production
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00—Program-control systems
    • G05B2219/30—Nc systems
    • G05B2219/32—Operator till task planning
    • G05B2219/32182—If state of tool, product deviates from standard, adjust system, feedback
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00—Program-control systems
    • G05B2219/30—Nc systems
    • G05B2219/32—Operator till task planning
    • G05B2219/32368—Quality control
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P90/00—Enabling technologies with a potential contribution to greenhouse gas [GHG] emissions mitigation
    • Y02P90/02—Total factory control, e.g. smart factories, flexible manufacturing systems [FMS] or integrated manufacturing systems [IMS]

Definitions

  • the present invention generally relates to display manufacturing. More specifically, it relates to a method of performing on-line real-time control of a display process. Further, the method can also be applied to a manufacturing process of a product having a large number of manufacturing processes and a complicated process.
  • the quality of the display is one of the important factors determining the market share. Since the production process of the display includes several processes, if the process fluctuation of the process is too large, the key attributes of the display will exceed the specifications. Phenomenon means that the quality of the display does not meet the specified quality specifications.
  • Gamma is one of the key attributes affecting the quality of liquid crystal displays. It is derived from the response curve of the display, which characterizes the nonlinear relationship between the display brightness of the display and the input voltage. Among them, the corresponding production line of some processes in the process of liquid crystal display. The parameters are related to the Gamma genus. If the corresponding line parameters of a certain process fluctuate greatly, the Gamma attribute will exceed the specification, that is, the quality of the liquid crystal display does not meet the specified quality specifications.
  • An exemplary embodiment of the present invention is to provide a method for online real-time control of a product process, particularly in the process of the display, to overcome the problem that the quality of the semi-finished product in the prior art is unqualified and difficult to remedy.
  • the present invention provides a method for online real-time control of a product process, the method comprising: (A) establishing a monitoring equation for estimating product attributes based on line parameters corresponding to respective processes in a process of the product, wherein The calculation result of the monitoring equation is used to indicate the quality of the product, the monitoring equation is expressed as a nonlinear function relationship of the production line parameter, and a least square method is used to determine a specific nonlinear function; (B) each When a process of the product is completed, according to the online feedback Updating the calculation result of the monitoring equation by the value of the corresponding production line parameter; (C) when the quality of the product indicated by the calculation result updated in the step (B) does not meet the specified quality specification, The line parameters corresponding to the process after one process are adjusted so that the quality of the product meets the specified quality specifications.
  • monitoring equation is expressed as the following equation:
  • S is the product properties, including products manufactured by X-i i-th process step of the respective parameters for all production lines, the number n is the product of a step included in the manufacturing process.
  • the monitoring equation is expressed as a weighting of a nonlinear function of the line parameters, wherein the monitoring equation is expressed as the following equation:
  • S is the product attributes
  • X i comprises a product manufacturing process in the i-th step corresponding to all of the production line parameters
  • the number of processes of F i is a nonlinear function of the X i corresponding to
  • n is an item process included.
  • the non-linear function is a power function, a logarithmic function or a polynomial function.
  • the method is for a display process, the product being a liquid crystal display or an organic electroluminescent display.
  • the product attribute comprises at least one of the following: a gamma attribute, a contrast attribute, and a penetration attribute.
  • the product is a liquid crystal display
  • the product attribute is a Gamma attribute
  • each process in the product process includes a PI process, an ITO process, a box gap process, an HVA process, and an LC process
  • the corresponding production line parameters include thickness and temperature
  • the production line parameters corresponding to the ITO process include cracks and thicknesses
  • the production line parameters corresponding to the box gap process include distances
  • the production line parameters corresponding to the HVA process include voltage, temperature, Time and illumination
  • line parameters corresponding to the LC process include quantities.
  • step (B) for the production line parameters corresponding to the process after the one process, the calculation results of the monitoring equation are updated by using preset standard values respectively.
  • step (C) according to the adjustment range preset for each line parameter
  • the line parameters corresponding to the steps after the one step are dynamically adjusted.
  • the key attributes of the display can be maintained within the qualified specifications by adjusting the production line parameters of the subsequent process, thereby avoiding the quality of the semi-finished product.
  • the problem is difficult to remedy, increasing the output of qualified display products and reducing costs.
  • the monitoring equation adopts a nonlinear function relationship, and the nonlinear fitting system can better meet the actual situation and improve the accuracy of monitoring.
  • FIG. 1 illustrates a flow chart of a method of performing on-line real-time control of a process of a display, in accordance with an exemplary embodiment of the present invention.
  • the method comprises: (A) establishing a monitoring equation for estimating product attributes based on line parameters respectively corresponding to respective processes in the process of the product, wherein the calculation result of the monitoring equation is used to indicate the quality of the product, The monitoring equation is expressed as a nonlinear functional relationship of the production line parameters, and a least squares method is used to determine a specific nonlinear function; (B) each time a process of the product is completed, according to the online feedback The calculation result of the monitoring equation is updated by the value of the corresponding production line parameter of the process; (C) when the quality of the product indicated by the calculation result updated in the step (B) does not meet the specified quality specification, The line parameters corresponding to the steps after one step are adjusted so that the quality of the product meets the specified quality specifications.
  • a product with a complicated manufacturing process it includes a plurality of manufacturing processes. If the product attributes are not in compliance with the specified quality specifications after the completion of the previous process, the product attributes are maintained to be qualified by adjusting the production line parameters of the subsequent processes. Within the specifications, it avoids the situation that the quality of semi-finished products is difficult to remedy, which improves the output of qualified products and reduces the cost.
  • FIG. 1 illustrates online real-time control of a process of a display according to an exemplary embodiment of the present invention.
  • the display may be a liquid crystal display (LCD) or an organic electroluminescent display (OLCD). It should be understood that the display is not limited to a liquid crystal display or an organic electroluminescent display, and may be other display devices.
  • LCD liquid crystal display
  • OLED organic electroluminescent display
  • a monitoring equation for estimating the properties of the display is established.
  • a monitoring equation for estimating the properties of the display is established based on the line parameters corresponding to the respective processes in the process of the display, and the calculation result of the monitoring equation is used to indicate the quality of the display.
  • the line parameters are used to establish a monitoring equation for estimating the properties of the display.
  • the display attributes can include at least one of the following: a Gamma attribute, a contrast attribute, and a penetration rate attribute.
  • the Gamma property can characterize the non-linear relationship between the display brightness of the display and the input voltage
  • the contrast property can characterize the ratio of the brightness of the display
  • the transmittance property can characterize the efficiency with which the display transmits light.
  • the monitoring equation can be expressed as a nonlinear function relationship of the line parameters, and a least squares method is used to determine a specific nonlinear function.
  • the monitoring equation is expressed as a weighting of the nonlinear function of the line parameters.
  • the monitoring equation can be expressed by Equation 1 below:
  • S is a display attribute
  • X i comprises a display process in the i-th step corresponding to all of the production line parameters
  • F i is a linear function of X i corresponding to, which may be a power function, a logarithmic function or a polynomial
  • n is the number of processes included in the process of the display.
  • X-i may be made of the display process corresponding to the i-th step of the production line of a plurality of parameters, for example the i-th step of the production line comprises two parameters X i1 and X i2, the above Equation 1 Should include f i1 (X i1 ) and f i2 (X i2 )
  • the display is a liquid crystal display
  • the display attribute is a Gamma attribute
  • each process in the process of the display includes a PI process, an ITO process, a cell gap process, an HVA process, and an LC process.
  • the production line parameters corresponding to the PI process include thickness and temperature
  • the production line parameters corresponding to the ITO process include cracks and thicknesses
  • the production line parameters corresponding to the box gap process include distances
  • the production line parameters corresponding to the HVA process include Voltage, temperature, time, and illumination
  • line parameters corresponding to the LC process include quantities.
  • the least squares can be utilized based on the above-mentioned line parameters and Gamma standard values monitored online.
  • the method determines the nonlinear function corresponding to each line parameter, thereby obtaining a monitoring equation for estimating the Gamma attribute.
  • Equation 2 The monitoring equation for estimating the Gamma property can be expressed by Equation 2 below:
  • X 11 and X 12 are the thickness line parameters and the temperature line parameters corresponding to the PI process, respectively, and f 11 (X 11 ) and f 12 (X 12 ) are the thickness line parameters respectively.
  • the nonlinear function corresponding to X 11 and the nonlinear function corresponding to the temperature production line parameter X 12 , X 21 and X 22 are the crack production line parameters and the thickness production line parameters corresponding to the ITO process, respectively, f 21 (X 21 ) and f 22 (X 22 ) is the nonlinear function corresponding to the crack production line parameter X 21 and the nonlinear function corresponding to the thickness production line parameter X 22 , and X 3 is the distance line parameter corresponding to the box gap process, f 3 (X 3 ) ) for the nonlinear function corresponding to the production line parameter X 3 , X 41 , X 42 , X 43 and X 44 are the voltage line parameters corresponding to the HVA process, the temperature production line parameters, the time production line parameters and the illumination production.
  • Line parameters, f 41 (X 41 ), f 42 (X 42 ), f 43 (X 43 ), and f 44 (X 44 ) are voltage line parameters X 41 , temperature line parameters X 42 , and time line parameters, respectively.
  • X 5 is a step corresponding to the number of the LC production line parameters
  • f 5 (X 5) is the number of X 5 parameter nonlinear function corresponding to the line.
  • step S20 each time a process of the display is completed, the calculation result of the monitoring equation is updated according to the value of the line parameter corresponding to the process fed back on the line.
  • the production process of the display may include a plurality of processes, and the process has a predetermined sequence, and each time a process of the display is completed, the value of the line parameter corresponding to the process fed back on the line is performed. Update, at this time, the value of the line parameter corresponding to the process fed back on the line can be substituted into the monitoring equation to obtain an updated calculation result.
  • the preset can be The standard values are substituted into the monitoring equation. That is to say, for the production line parameters corresponding to the processes located after the one process, the calculation results of the monitoring equations may be updated by using preset standard values respectively.
  • step S30 when the quality of the display indicated by the calculation result updated in step S20 does not conform to the specified quality specification, the line parameters corresponding to the process after the one process are adjusted to make the quality of the display Meet the required quality specifications.
  • the quality of the display indicated by the calculation result updated in step S20 does not comply with the regulations.
  • the process that is completed when the quality of the display does not meet the specified quality specifications can be determined.
  • the production line corresponding to the next process that is, the process after the box gap process
  • the line parameters corresponding to the steps after the one step may be manually adjusted in accordance with the adjustment range set in advance for each line parameter.
  • the adjustment of the line parameters corresponding to the process after the one step should be performed within an adjustment range that meets the product requirements. If the evaluation result is to adjust the production line parameters of the subsequent process, the property exceeding the specification can be adjusted to meet the specified range, and the parameter adjustment value report will be adjusted accordingly; if the evaluation result is to adjust the production line parameters of the subsequent process After that, it is still not possible to adjust the property beyond the specification to within the specified range (the fluctuation is too severe), then abandon the revised parameters and report the risk of control of the batch of products in the latter stage.
  • the monitoring equation adopts a nonlinear function relationship, and the nonlinear fitting system can better satisfy the actual situation and improve the accuracy of the monitoring.
  • the monitoring equations (Equation 1, Equation 2) are represented as a linear superposition of the nonlinear results of the various line parameters.
  • individual line parameters may also be directly related to the results of the product attributes by a non-linear relationship.
  • the monitoring equation can be expressed by Equation 3 below:
  • each line parameter (X 1 , X 2 , X 3 , ... X i ..., X n ) is directly related to the result (S) representing the product attribute by a nonlinear relationship.
  • the nonlinear relationship can be a power function, a logarithmic function or a polynomial function.
  • the key attributes of the display can be maintained within the qualified specifications by adjusting the production line parameters of the subsequent process, thereby avoiding the quality of the semi-finished product.
  • the problem is difficult to remedy, increasing the output of qualified displays and reducing production costs.

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • General Physics & Mathematics (AREA)
  • Automation & Control Theory (AREA)
  • Physics & Mathematics (AREA)
  • Quality & Reliability (AREA)
  • General Engineering & Computer Science (AREA)
  • Human Computer Interaction (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)
  • Liquid Crystal (AREA)
  • Control Of Indicators Other Than Cathode Ray Tubes (AREA)
  • Controls And Circuits For Display Device (AREA)
  • Liquid Crystal Display Device Control (AREA)

Abstract

一种对产品制程进行线上实时控制的方法，包括：(A)基于分别与产品制程中的各个工序相应的产线参数来建立用于估计产品属性的监控方程，其中，监控方程的计算结果用于指示产品的质量，监控方程表示为所述产线参数的非线性函数关系；(B)每当完成显示器的一个工序时，根据线上反馈的与该工序相应的产线参数的数值来更新监控方程的计算结果；(C)当在步骤(B)中更新的计算结果指示的显示器的质量不符合规定的质量规格时，对与位于所述一个工序后的工序相应的产线参数进行调整以使产品的质量符合规定的质量规格。根据所述方法，可以通过调整后续工序的产线参数来将显示器的关键属性保持在合格的规格内。

Description

对产品制程进行线上实时控制的方法 技术领域
本发明总体来说涉及显示器制造。更具体地讲，涉及一种对显示器的制程进行线上实时控制的方法。进一步地，该方法也可以适用于制造工序较多、工艺较为复杂的产品的制造过程。
背景技术
在品牌众多的显示器市场，显示器的质量是决定市场占有率的重要因素之一，由于显示器的生产过程包括若干道制程，如果制程的某个工序波动过大，就会出现显示器关键属性超出规格的现象，即意味着显示器的质量不符合规定的质量规格。
例如，Gamma是影响液晶显示器质量的关键属性之一，源于显示器的响应曲线，其表征显示器的显示亮度与输入电压的非线性关系，其中，液晶显示器的制程中的某些工序相应的产线参数与Gamma属相相关，如果某个工序相应的产线参数出现较大的波动，就会使Gamma属性超出规格，即，液晶显示器的质量不符合规定的质量规格。
在现有的显示器制造工艺中，即使及时地发现了由于产线制程波动导致出现了不符合规定的制品，也无法挽回已经生产到一半的半成品。
发明内容
本发明的示例性实施例在于提供一种对产品制程进行线上实时控制的方法，特别是在显示器的制程中，以克服现有技术中半成品质量不合格难以补救的问题。
本发明提供一种对产品制程进行线上实时控制的方法，该方法包括：(A)基于分别与产品的制程中的各个工序相应的产线参数来建立用于估计产品属性的监控方程，其中，所述监控方程的计算结果用于指示产品的质量，所述监控方程表示为所述产线参数的非线性函数关系，并且，利用最小二乘法来确定具体的非线性函数；(B)每当完成所述产品的一个工序时，根据线上反馈的与该 工序相应的产线参数的数值来更新所述监控方程的计算结果；(C)当在步骤(B)中更新的计算结果指示的产品的质量不符合规定的质量规格时，对与位于所述一个工序后的工序相应的产线参数进行调整以使所述产品的质量符合规定的质量规格。
可选地，所述监控方程表示为下面的等式：
S＝f(X1,X2,X3,…Xi…,Xn)，
其中，S为产品属性，Xi包括与产品制程中的第i个工序相应的所有产线参数，n为产品制程中所包括的工序的数量。
可选地，所述监控方程表示为所述产线参数的非线性函数加权，其中，所述监控方程表示为下面的等式：
Figure PCTCN2015073951-appb-000001
其中，S为产品属性，Xi包括与产品制程中的第i个工序相应的所有产线参数，fi为与Xi对应的非线性函数，n为产品制程中所包括的工序的数量。
可选地，所述非线性函数为幂函数、对数函数或多项式函数。
可选地，该方法用于显示器制程，所述产品为液晶显示器或有机电激发光显示器。
可选地，所述产品属性包括以下项中的至少一项：Gamma属性、对比度属性和穿透率属性。
可选地，所述产品为液晶显示器，所述产品属性为Gamma属性，其中，所述产品制程中的各个工序包括PI工序、ITO工序、盒间隙工序、HVA工序和LC工序，其中，与PI工序相应的产线参数包括厚度和温度；与ITO工序相应的产线参数包括裂缝和厚度；与盒间隙工序相应的产线参数包括距离；与HVA工序相对应的产线参数包括电压、温度、时间和照明度；与LC工序相应的产线参数包括数量。
可选地，在步骤(B)中，对于与位于所述一个工序后的工序相应的产线参数，采用分别预设的标准数值来更新所述监控方程的计算结果。
可选地，在步骤(C)中，按照针对各个产线参数预先设置的调整范围来手 动调整与位于所述一个工序后的工序相应的产线参数。
在根据本发明示例性实施例的对显示器的制程进行线上实时控制的方法中，可以通过调整后续工序的产线参数来将显示器的关键属性保持在合格的规格内，从而避免了半成品质量出现问题难以补救的局面，提高了合格显示器产品的产量，降低了成本。其中，由于显示器的物理机制复杂、制造工序很多，因此监控方程采用了非线性函数关系，非线性的拟合系统可以更好地满足实际情况，提高了监控的精确度。
附图说明
图1示出根据本发明示例性实施例的对显示器的制程进行线上实时控制的方法的流程图。
具体实施方式
如前所述，本发明的目的是提供一种对产品制程进行线上实时控制的方法，以克服现有技术中半成品质量不合格难以补救的问题。该方法包括：(A)基于分别与产品的制程中的各个工序相应的产线参数来建立用于估计产品属性的监控方程，其中，所述监控方程的计算结果用于指示产品的质量，所述监控方程表示为所述产线参数的非线性函数关系，并且，利用最小二乘法来确定具体的非线性函数；(B)每当完成所述产品的一个工序时，根据线上反馈的与该工序相应的产线参数的数值来更新所述监控方程的计算结果；(C)当在步骤(B)中更新的计算结果指示的产品的质量不符合规定的质量规格时，对与位于所述一个工序后的工序相应的产线参数进行调整以使所述产品的质量符合规定的质量规格。
对于制造工艺较为复杂的产品，其包括多个制造工序，在完成前续工序后若监控到产品属性不符合规定的质量规格时，通过调整后续工序的产线参数来将产品属性保持在合格的规格内，从而避免了半成品质量出现问题难以补救的局面，提高了合格产品的产量，降低了成本。
现将详细参照本发明的示例性实施例，所述实施例的示例在附图中示出，其中，相同的标号始终指的是相同的部件。以下将以对显示器的制程为例，通过参照附图来说明所述实施例，以便解释本发明。
图1示出根据本发明示例性实施例的对显示器的制程进行线上实时控制的 方法的流程图。这里，作为示例，所述显示器可以为液晶显示器(LCD)或有机电激发光显示器(OLCD)。应理解，所述显示器不限于液晶显示器或有机电激发光显示器，也可以是其他显示设备。
如图1所示，在步骤S10，建立用于估计显示器属性的监控方程。其中，基于分别与显示器的制程中的各个工序相应的产线参数来建立用于估计显示器属性的监控方程，所述监控方程的计算结果用于指示显示器的质量。
这里，在实际生产中，显示器属性的漂移会严重影响显示器的质量，而显示器的制程中的各个工序相应的产线参数会影响显示器属性，因此，可基于分别与显示器的制程中的各个工序相应的产线参数来建立用于估计显示器属性的监控方程。作为示例，所述显示器属性可包括以下项中的至少一项：Gamma属性、对比度属性和穿透率属性。这里，Gamma属性可表征显示器的显示亮度与输入电压的非线性关系；对比度属性可表征显示器亮度的比值；穿透率属性可表征显示器透过光的效率。其中，所述监控方程可表示为所述产线参数的非线性函数关系，并且，利用最小二乘法来确定具体的非线性函数。
具体说来，所述监控方程表示为所述产线参数的非线性函数加权。例如，可用下面的等式1来表示所述监控方程：
Figure PCTCN2015073951-appb-000002
   等式1
其中，S为显示器属性，Xi包括与显示器的制程中的第i个工序相应的所有产线参数，fi为与Xi对应的非线性函数，其可以为幂函数、对数函数或多项式函数，n为显示器的制程中所包括的工序的数量。这里，作为示例，Xi可以为与显示器的制程中的第i个工序相应的多个产线参数，例如第i个工序包括两个产线参数Xi1和Xi2，则如上等式1中应包括fi1(Xi1)和fi2(Xi2)
例如，所述显示器为液晶显示器，所述显示器属性为Gamma属性，其中，所述显示器的制程中的各个工序包括PI工序、ITO工序、盒间隙工序、HVA工序和LC工序。其中，与PI工序相应的产线参数包括厚度和温度；与ITO工序相应的产线参数包括裂缝和厚度；与盒间隙工序相应的产线参数包括距离；与HVA工序相对应的产线参数包括电压、温度、时间和照明度；与LC工序相应的产线参数包括数量。
相应地，可基于线上监控的上述产线参数和Gamma标准值，利用最小二乘 法来确定各个产线参数对应的非线性函数，从而获得用于估计Gamma属性的监控方程。
可用下面的等式2来表示所述用于估计Gamma属性的监控方程：
S＝f11(X11)+f12(X12)+f21(X21)+f22(X22)+f3(X3)+f41(X41)+f42(X42)+   等式2
f43(X43)+f44(X44)+f5(X5)
其中，S为液晶显示器Gamma属性，X11和X12分别为与PI工序相应的厚度产线参数和温度产线参数，f11(X11)和f12(X12)分别为厚度产线参数X11对应的非线性函数和温度产线参数X12对应的非线性函数，X21和X22分别为与ITO工序相应的裂缝产线参数和厚度产线参数，f21(X21)和f22(X22)分别为裂缝产线参数X21对应的非线性函数和厚度产线参数X22对应的非线性函数，X3为与盒间隙工序相应的距离产线参数，f3(X3)为距离产线参数X3对应的非线性函数，X41、X42、X43和X44分别为与HVA工序相应的电压产线参数、温度产线参数、时间产线参数和照明度产线参数，f41(X41)、f42(X42)、f43(X43)和f44(X44)分别为电压产线参数X41、温度产线参数X42、时间产线参数X43和照明度产线参数X44对应的非线性函数，X5为与LC工序相应的数量产线参数，f5(X5)为与数量产线参数X5对应的非线性函数。
在步骤S20，每当完成显示器的一个工序时，根据线上反馈的与该工序相应的产线参数的数值来更新所述监控方程的计算结果。
具体说来，显示器的生产过程可包括若干个工序，并且，所述工序存在预定的顺序，每当完成显示器的一个工序时，线上反馈的与该工序相应的产线参数的数值就会进行更新，这时，可将线上反馈的与该工序相应的产线参数的数值代入所述监控方程，以得到更新的计算结果，这里，应注意，对于尚未经过的工序，可将预设的标准数值代入所述监控方程。也就是说，对于与位于所述一个工序后的工序相应的产线参数，可采用分别预设的标准数值来更新所述监控方程的计算结果。
在步骤S30，当在步骤S20中更新的计算结果指示的显示器的质量不符合规定的质量规格时，对与位于所述一个工序后的工序相应的产线参数进行调整以使所述显示器的质量符合规定的质量规格。
具体说来，当在步骤S20更新的计算结果指示的显示器的质量不符合规定 的质量规格时，可确定在显示器的质量不符合规定的质量规格时所完成的工序。例如，当在盒间隙工序完成时更新的显示器属性Gamma的计算结果超出规格(例如，Gamma＝2.3)时，可对与接下来的工序(即，位于盒间隙工序后的工序)相应的产线参数进行调整以使显示器的质量符合规定的质量规格(例如，Gamma＝2.2)。这里，作为示例，可按照针对各个产线参数预先设置的调整范围来手动调整与位于所述一个工序后的工序相应的产线参数。通过上述处理方式，可以通过调整后续工序的产线参数来将显示器的关键属性保持在合格的规格内，从而挽救半成品。
其中，对于所述一个工序后的工序相应的产线参数的调整，应当是在符合产品要求的调整范围内进行。若评估结果为调整后续工序的产线参数后，可以将超出规格的属性调整到符合规定的范围内，则将参数调整值报告后段进行相应调整；若评估结果为调整后续工序的产线参数后，仍不可以将超出规格的属性调整到符合规定的范围内(波动过于剧烈)，则放弃修订参数，报告后段工序此批次产品的管控风险。
如上实施例中，由于显示器的物理机制复杂、制造工序很多，因此监控方程采用了非线性函数关系，非线性的拟合系统可以更好地满足实际情况，提高了监控的精确度。在如上实施例中，监控方程(等式1、等式2)表示为各个产线参数非线性结果的线性叠加。在另外的一些实施例中，还可以将各个产线参数通过一种非线性关系与表示产品属性的结果直接联系起来。例如，在另外的一些实施例中，可用下面的等式3来表示所述监控方程：
S＝f(X1,X2,X3,…Xi…,Xn)   等式3
其中，S为产品属性，Xi包括与产品制程中的第i个工序相应的所有产线参数，n为产品制程中所包括的工序的数量。等式3中，就是将各个产线参数(X1,X2,X3,…Xi…,Xn)通过一种非线性关系与表示产品属性的结果(S)直接联系起来。其中的非线性关系可以为幂函数、对数函数或多项式函数。
由此可见，如上实施例提供的对显示器的制程进行线上实时控制的方法中，可以通过调整后续工序的产线参数来将显示器的关键属性保持在合格的规格内，从而避免了半成品质量出现问题难以补救的局面，提高了合格显示器的产量，降低了生产成本。
虽然已表示和描述了本发明的一些示例性实施例，但本领域技术人员应该 理解，在不脱离由权利要求及其等同物限定其范围的本发明的原理和精神的情况下，可以对这些实施例进行修改。

Claims (15)

  1. 一种对产品制程进行线上实时控制的方法，其中，包括：
    (A)基于分别与产品的制程中的各个工序相应的产线参数来建立用于估计产品属性的监控方程，其中，所述监控方程的计算结果用于指示产品的质量，所述监控方程表示为所述产线参数的非线性函数关系，并且，利用最小二乘法来确定具体的非线性函数；
    (B)每当完成所述产品的一个工序时，根据线上反馈的与该工序相应的产线参数的数值来更新所述监控方程的计算结果；
    (C)当在步骤(B)中更新的计算结果指示的产品的质量不符合规定的质量规格时，对与位于所述一个工序后的工序相应的产线参数进行调整以使所述产品的质量符合规定的质量规格。
  2. 如权利要求1所述的方法，其中，所述监控方程表示为所述产线参数的非线性函数加权，其中，所述监控方程表示为下面的等式：
    Figure PCTCN2015073951-appb-100001
    其中，S为产品属性，Xi包括与产品制程中的第i个工序相应的所有产线参数，fi为与Xi对应的非线性函数，n为产品制程中所包括的工序的数量。
  3. 如权利要求2所述的方法，其中，所述非线性函数为幂函数、对数函数或多项式函数。
  4. 如权利要求2所述的方法，其中，该方法用于显示器制程，所述产品为液晶显示器或有机电激发光显示器。
  5. 如权利要求4所述的方法，其中，所述产品属性包括以下项中的至少一项：Gamma属性、对比度属性和穿透率属性。
  6. 如权利要求2所述的方法，其中，所述产品为液晶显示器，所述产品属性为Gamma属性，
    其中，所述产品制程中的各个工序包括PI工序、ITO工序、盒间隙工序、HVA工序和LC工序，其中，与PI工序相应的产线参数包括厚度和温度；与ITO 工序相应的产线参数包括裂缝和厚度；与盒间隙工序相应的产线参数包括距离；与HVA工序相对应的产线参数包括电压、温度、时间和照明度；与LC工序相应的产线参数包括数量。
  7. 如权利要求2所述的方法，其中，在步骤(B)中，对于与位于所述一个工序后的工序相应的产线参数，采用分别预设的标准数值来更新所述监控方程的计算结果。
  8. 如权利要求2所述的方法，其中，在步骤(C)中，按照针对各个产线参数预先设置的调整范围来手动调整与位于所述一个工序后的工序相应的产线参数。
  9. 一种对产品制程进行线上实时控制的方法，其中，包括：
    (A)基于分别与产品的制程中的各个工序相应的产线参数来建立用于估计产品属性的监控方程，其中，所述监控方程的计算结果用于指示产品的质量，所述监控方程表示为所述产线参数的非线性函数关系，并且，利用最小二乘法来确定具体的非线性函数；
    (B)每当完成所述产品的一个工序时，根据线上反馈的与该工序相应的产线参数的数值来更新所述监控方程的计算结果；
    (C)当在步骤(B)中更新的计算结果指示的产品的质量不符合规定的质量规格时，对与位于所述一个工序后的工序相应的产线参数进行调整以使所述产品的质量符合规定的质量规格。
    其中，所述监控方程表示为下面的等式：
    S＝f(X1,X2,X3,…Xi…,Xn)，
    其中，S为产品属性，Xi包括与产品制程中的第i个工序相应的所有产线参数，n为产品制程中所包括的工序的数量。
  10. 如权利要求9所述的方法，其中，所述非线性函数为幂函数、对数函数或多项式函数。
  11. 如权利要求9所述的方法，其中，该方法用于显示器制程，所述产品为液晶显示器或有机电激发光显示器。
  12. 如权利要求11所述的方法，其中，所述产品属性包括以下项中的至少 一项：Gamma属性、对比度属性和穿透率属性。
  13. 如权利要求9所述的方法，其中，所述产品为液晶显示器，所述产品属性为Gamma属性，
    其中，所述产品制程中的各个工序包括PI工序、ITO工序、盒间隙工序、HVA工序和LC工序，其中，与PI工序相应的产线参数包括厚度和温度；与ITO工序相应的产线参数包括裂缝和厚度；与盒间隙工序相应的产线参数包括距离；与HVA工序相对应的产线参数包括电压、温度、时间和照明度；与LC工序相应的产线参数包括数量。
  14. 如权利要求9所述的方法，其中，在步骤(B)中，对于与位于所述一个工序后的工序相应的产线参数，采用分别预设的标准数值来更新所述监控方程的计算结果。
  15. 如权利要求9所述的方法，其中，在步骤(C)中，按照针对各个产线参数预先设置的调整范围来手动调整与位于所述一个工序后的工序相应的产线参数。
PCT/CN2015/073951 2015-03-03 2015-03-10 对产品制程进行线上实时控制的方法 Ceased WO2016138674A1 (zh)

Priority Applications (1)

Application Number Priority Date Filing Date Title
US14/779,698 US9891614B2 (en) 2015-03-03 2015-03-10 Online real-time control method for product manufacturing process

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
CN201510095593.9A CN104678974B (zh) 2015-03-03 2015-03-03 对产品制程进行线上实时控制的方法
CN201510095593.9 2015-03-03

Publications (1)

Publication Number Publication Date
WO2016138674A1 true WO2016138674A1 (zh) 2016-09-09

Family

ID=53314205

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/CN2015/073951 Ceased WO2016138674A1 (zh) 2015-03-03 2015-03-10 对产品制程进行线上实时控制的方法

Country Status (3)

Country Link
US (1) US9891614B2 (zh)
CN (1) CN104678974B (zh)
WO (1) WO2016138674A1 (zh)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20160187680A1 (en) * 2014-12-30 2016-06-30 Shenzhen China Star Optoelectronics Technology Co. Ltd. An on-line actual-time monitoring method performed on manufacturing procedures for a display
CN105739476B (zh) * 2016-04-29 2019-01-08 深圳联友科技有限公司 一种车间工序工艺可配置化的产品控制方法及装置
US10754319B1 (en) * 2019-08-26 2020-08-25 Globalfoundries Inc. Across-wafer profile control in semiconductor processes
CN113552848B (zh) * 2020-04-23 2022-11-08 广州小圳科技有限公司 单个或跨多个通信网管系统的sdh路径创建系统及方法
CN111723492B (zh) * 2020-06-30 2023-09-05 哈工大机器人（合肥）国际创新研究院 一种基于仿真验证的生产过程参数确定方法
EP4009254A1 (en) * 2020-12-04 2022-06-08 United Grinding Group Management AG Method of operating a production system
CN113021076A (zh) * 2021-04-09 2021-06-25 杭州秋瑞自动化科技有限公司 一种机械加工自动适应控制方法
CN116243667B (zh) * 2023-02-21 2025-10-10 厦门盈趣科技股份有限公司 一种数字化生产线产品质量监控方法及系统

Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20020082738A1 (en) * 2000-12-27 2002-06-27 Insyst Ltd. Method for global automated process control
CN1916613A (zh) * 2006-09-12 2007-02-21 浙江大学 一种基于小波分析的工业聚丙烯生产熔融指数软测量方法
JP2007058806A (ja) * 2005-08-26 2007-03-08 Sumitomo Metal Ind Ltd 製造条件計算方法、品質調整方法、鉄鋼製造方法、製造条件計算装置、品質調整システム、及びコンピュータプログラム
JP2009064054A (ja) * 2007-09-04 2009-03-26 Sumitomo Metal Ind Ltd 製品品質の制御方法及び制御装置
CN101587328A (zh) * 2008-05-23 2009-11-25 朱豫才 非线性过程动态模型辨识装置
CN101673096A (zh) * 2009-10-26 2010-03-17 浙江大学 一种丹参注射液生产浓缩过程密度的软测量方法
EP2172820A1 (de) * 2008-10-06 2010-04-07 Basf Se Verfahren und System zur automatisierten Analyse von Prozessdaten
JP2013084057A (ja) * 2011-10-06 2013-05-09 Nippon Steel & Sumitomo Metal 製品品質の管理方法、及び製品品質の管理装置
JP2013140548A (ja) * 2012-01-06 2013-07-18 Nippon Steel & Sumitomo Metal 操業状況評価装置、操業状況評価方法、コンピュータプログラムおよびコンピュータ読み取り可能な記憶媒体

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5404388A (en) * 1993-03-03 1995-04-04 Northern Telecom Limited Digital measurement of amplitude and phase of a sinusoidal signal and detection of load coil based on said measurement
JPH1076446A (ja) * 1996-08-30 1998-03-24 Toshiba Corp 生産工程管理装置および生産工程管理方法
US7157700B2 (en) * 2001-06-30 2007-01-02 Sionex Corporation System for collection of data and identification of unknown ion species in an electric field
US7219068B2 (en) * 2001-03-13 2007-05-15 Ford Motor Company Method and system for product optimization
US6720194B1 (en) * 2002-10-02 2004-04-13 Siverion, Inc. Semiconductor characterization and production information system
US7220990B2 (en) * 2003-08-25 2007-05-22 Tau-Metrix, Inc. Technique for evaluating a fabrication of a die and wafer
DE102007005070B4 (de) * 2007-02-01 2010-05-27 Klippel, Wolfgang, Dr. Anordnung und Verfahren zur optimalen Schätzung der linearen Parameter und der nichtlinearen Parameter eines Modells, das einen Wandler beschreibt
CN103064282B (zh) * 2012-05-04 2015-12-16 浙江大学 非线性参数变化模型辨识方法（npv）
CN104636861B (zh) * 2014-12-30 2018-04-13 深圳市华星光电技术有限公司 对显示器的制程进行线上实时控制的方法

Patent Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20020082738A1 (en) * 2000-12-27 2002-06-27 Insyst Ltd. Method for global automated process control
JP2007058806A (ja) * 2005-08-26 2007-03-08 Sumitomo Metal Ind Ltd 製造条件計算方法、品質調整方法、鉄鋼製造方法、製造条件計算装置、品質調整システム、及びコンピュータプログラム
CN1916613A (zh) * 2006-09-12 2007-02-21 浙江大学 一种基于小波分析的工业聚丙烯生产熔融指数软测量方法
JP2009064054A (ja) * 2007-09-04 2009-03-26 Sumitomo Metal Ind Ltd 製品品質の制御方法及び制御装置
CN101587328A (zh) * 2008-05-23 2009-11-25 朱豫才 非线性过程动态模型辨识装置
EP2172820A1 (de) * 2008-10-06 2010-04-07 Basf Se Verfahren und System zur automatisierten Analyse von Prozessdaten
CN101673096A (zh) * 2009-10-26 2010-03-17 浙江大学 一种丹参注射液生产浓缩过程密度的软测量方法
JP2013084057A (ja) * 2011-10-06 2013-05-09 Nippon Steel & Sumitomo Metal 製品品質の管理方法、及び製品品質の管理装置
JP2013140548A (ja) * 2012-01-06 2013-07-18 Nippon Steel & Sumitomo Metal 操業状況評価装置、操業状況評価方法、コンピュータプログラムおよびコンピュータ読み取り可能な記憶媒体

Also Published As

Publication number Publication date
US9891614B2 (en) 2018-02-13
US20160378094A1 (en) 2016-12-29
CN104678974B (zh) 2018-06-15
CN104678974A (zh) 2015-06-03

Similar Documents

Publication Publication Date Title
WO2016138674A1 (zh) 对产品制程进行线上实时控制的方法
CN106782283B (zh) 一种显示装置的伽玛曲线校正方法及显示装置
Joekes et al. An improved attribute control chart for monitoring non-conforming proportion in high quality processes
WO2016041224A1 (zh) 调节液晶面板闪烁度的方法
MY188651A (en) Method and device for controlling data risk
TWI507971B (zh) 顯示參數調整方法及系統
CN112653884B (zh) 一种屏幕质量优缺的评价方法
US10339849B2 (en) Method and system for regulating brightness and chromaticity of display panel
CN105427788A (zh) 自动校调显示装置亮度和色度的方法及系统
MY191360A (en) Method for adjusting risk parameter, and method and device for risk identification
CN103971022B (zh) 基于t2控制图的飞机零部件质量稳定性控制算法
US20210350761A1 (en) Method, device and system for determining actual option common voltage of display panel
JP7579785B2 (ja) 動的バッチ制限事項検証方法
WO2016106862A1 (zh) 一种液晶显示面板的品质的监控方法
CN103473364A (zh) 一种服务推荐方法及装置
CN105304065B (zh) 曲面显示面板的制造方法及制造系统
WO2016106890A1 (zh) 一种对显示器的制程进行线上实时控制的方法
CN103700335B (zh) 一种调整目标Gamma曲线的方法及装置
US10928683B2 (en) Gamma automatic adjusting method and gamma automatic adjusting method system
CN120705435A (zh) 矿山综合管控平台数据融合关联分析的方法及系统
US20160187680A1 (en) An on-line actual-time monitoring method performed on manufacturing procedures for a display
TWI713919B (zh) 製程控制系統與方法
CN111210763B (zh) 一种伽马校准方法及装置
CN108573683B (zh) 一种提升显示面板质量的方法及系统
CN110808222A (zh) 一种制程设备的控制方法及装置

Legal Events

Date Code Title Description
WWE Wipo information: entry into national phase

Ref document number: 14779698

Country of ref document: US

121 Ep: the epo has been informed by wipo that ep was designated in this application

Ref document number: 15883731

Country of ref document: EP

Kind code of ref document: A1

NENP Non-entry into the national phase

Ref country code: DE

122 Ep: pct application non-entry in european phase

Ref document number: 15883731

Country of ref document: EP

Kind code of ref document: A1