WO2016083448A1 - Optoelektronischer halbleiterchip, verfahren zur herstellung eines optoelektronischen halbleiterchips, konversionselement und leuchtstoff für ein konversionselement - Google Patents
Optoelektronischer halbleiterchip, verfahren zur herstellung eines optoelektronischen halbleiterchips, konversionselement und leuchtstoff für ein konversionselement Download PDFInfo
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- WO2016083448A1 WO2016083448A1 PCT/EP2015/077637 EP2015077637W WO2016083448A1 WO 2016083448 A1 WO2016083448 A1 WO 2016083448A1 EP 2015077637 W EP2015077637 W EP 2015077637W WO 2016083448 A1 WO2016083448 A1 WO 2016083448A1
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/80—Constructional details
- H10H20/85—Packages
- H10H20/851—Wavelength conversion means
- H10H20/8514—Wavelength conversion means characterised by their shape, e.g. plate or foil
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/80—Constructional details
- H10H20/85—Packages
- H10H20/851—Wavelength conversion means
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/80—Constructional details
- H10H20/85—Packages
- H10H20/851—Wavelength conversion means
- H10H20/8515—Wavelength conversion means not being in contact with the bodies
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/80—Constructional details
- H10H20/85—Packages
- H10H20/851—Wavelength conversion means
- H10H20/8516—Wavelength conversion means having a non-uniform spatial arrangement or non-uniform concentration, e.g. patterned wavelength conversion layer or wavelength conversion layer with a concentration gradient
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/80—Constructional details
- H10H20/85—Packages
- H10H20/852—Encapsulations
- H10H20/854—Encapsulations characterised by their material, e.g. epoxy or silicone resins
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/80—Constructional details
- H10H20/85—Packages
- H10H20/855—Optical field-shaping means, e.g. lenses
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/20—Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials
- H10P14/27—Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials using selective deposition, e.g. simultaneous growth of monocrystalline and non-monocrystalline semiconductor materials
- H10P14/271—Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials using selective deposition, e.g. simultaneous growth of monocrystalline and non-monocrystalline semiconductor materials characterised by the preparation of substrate for selective deposition
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W70/00—Package substrates; Interposers; Redistribution layers [RDL]
- H10W70/60—Insulating or insulated package substrates; Interposers; Redistribution layers
Definitions
- Optoelectronic semiconductor chip method for producing an optoelectronic semiconductor chip, conversion element and phosphor for a conversion element
- An optoelectronic semiconductor chip and a method for its production are specified. Furthermore, a conversion element and an optoelectronic
- An optoelectronic semiconductor chip is specified, for example, in the document US 2012/0098017 A1.
- Object of the present invention is to provide a highly efficient optoelectronic semiconductor chip with a
- Another object of the present application is to provide a particularly efficient conversion element for producing warm white light. Preferably that should
- Conversion element to be suitable, warm white light with color temperatures between 2000 K and inclusive
- a phosphor is to be specified, the
- An optoelectronic semiconductor chip in particular comprises a semiconductor body which is suitable for
- the optoelectronic includes
- the ceramic conversion plate comprises a ceramic or is formed from a ceramic.
- the monocrystalline conversion plate is formed of a monocrystalline material or comprises a monocrystalline material. The ceramic or monocrystalline is preferred
- the conversion chip having a wavelength-converting bonding layer is connected to the radiation exit surface of the semiconductor chip
- wavelength-converting bonding layer a mechanically stable connection between the semiconductor body and the conversion plate.
- the conversion plate a mechanically stable connection between the semiconductor body and the conversion plate.
- Wavelength-converting bonding layer has an adhesive as a joining material.
- a resin may be used, for example, a silicone or epoxy or a mixture of these materials.
- wavelength-converting in the present case means, in particular, that irradiated electromagnetic radiation of a specific wavelength range in
- wavelength-converting element absorbs electromagnetic radiation of an irradiated one
- Wavelength range this converts by electronic processes at the atomic and / or molecular level
- the wavelength-converting joining layer has phosphor particles which are suitable for radiation of the first
- Wavelength range and the second wavelength range is different. In other words, the
- the wavelength-converting bonding layer preferably has a thickness of at most 30 micrometers. Due to the small thickness of the wavelength-converting joining layer is a particularly efficient dissipation of heat, which in the conversion of the primary radiation of the first
- Wavelength range within the phosphor particles arises, possible. In this way, a particularly efficient operation of the semiconductor chip is possible.
- the wavelength-converting joining layer has a thickness which has a maximum of 20 micrometers, a maximum of 15 micrometers or a maximum of 10 micrometers.
- the thickness of the wavelength-converting bonding layer can in this case production reasons over its entire surface
- Wavelength-converting joining layer spoken, so hereby the arithmetic mean meant.
- individual measured values of the thickness do not deviate more than 50%, particularly preferably not more than 30%, of the
- the wavelength-converting bonding layer can not be made arbitrarily thin, since to achieve a specific color locus, for example in the warm-white region of the CIE standard color chart, a certain amount of primary radiation of the first wavelength range is converted by the phosphor particles in the wavelength-converting bonding layer into radiation of the second wavelength range got to. Since the proportion of the radiation of the first wavelength range, which are converted by the phosphor particles into radiation of the third wavelength range, with the thickness of the wavelength-converting
- Wavelength-converting bonding layer at 5 microns, more preferably at 8 microns.
- Wavelength range blue light, the radiation of the second wavelength range green or green-yellow light and the radiation of the third wavelength range red light preferably emits blue light that partially diffuses from the conversion wafer into green or green-yellow light and from the
- the semiconductor chip in this embodiment emits mixed-colored light of blue light of the first wavelength range, green or green-yellow Light of the second wavelength range and red light of the third wavelength range.
- the color location of the mixed-color light is preferably in the warm-white range of the CIE standard color chart. In order to achieve a warm white color location, in particular a red component in the mixed-colored radiation is necessary.
- the warm white light preferably has color temperatures
- the warm white light has a color locus containing no more than 10 McAdams ellipses from the color loci on the Planck curve with a color temperature between
- the color location of the mixed-color light is preferably in a range of +/- 10 McAdams ellipses around the Planck curve at color temperatures between 2000 K inclusive and 4500 K.
- the warm white light has a color locus containing no more than 10 McAdams ellipses from the color loci on the Planck curve with a color temperature between
- the color location of the mixed-color light is preferably in a range of +/- 10 McAdams ellipses around the Planck curve at color temperatures between 2500 K and 3500 K.
- the blue radiation of the first wavelength range preferably has a dominant wavelength of between 400 nm and 480 nm inclusive, especially preferably between 440 nm and 440 nm
- Wavelength range preferably has one
- Dominant wavelengths between 520 nm inclusive and 580 nm inclusive, more preferably between 550 nm and 570 nm inclusive.
- the red radiation of the third wavelength range preferably has a dominant wavelength between and including 590 nanometers and including 650 nanometers, more preferably between and including 600 nanometers and
- Electromagnetic radiation is drawn in the CIE standard diagram from the white point through the color location of the radiation a straight line.
- the intersection of the straight line with the spectral color line delimiting the CIE standard diagram denotes the dominant wavelength of the electromagnetic radiation.
- the dominant wavelength deviates from a maximum intensity wavelength.
- Phosphor particles are introduced into a resin. For this reason, to generate radiation of the second,
- green or green-yellow, wavelength range present also a ceramic or monocrystalline
- Conversion plate for producing warm white light compared to stacked conversion plates has the advantage that a large part of the heat generated during the conversion arises in the wavelength-converting joining layer and therefore only has to travel a smaller distance through the joining layer. For this reason, the configuration proposed here can consist of a wavelength-converting bonding layer and a conversion layer of a stacked one
- the present application adopts the idea of converting primary radiation of a first wavelength range into radiation of a second one
- Wavelength range to use a conversion plate which has an improved heat dissipation
- Beam exit surface of the semiconductor body mechanically connects to form wavelength converting.
- phosphor particles are incorporated into the joining material of the joining layer
- the wavelength-converting joining layer in which
- Phosphor particles are introduced into a joining material such as a silicone, facing a transparent
- joining material particularly preferred are high concentrations of phosphor particles, for example between including 50% by weight and including 70% by weight, incorporated in the joining material. Such high concentrations of phosphor particles usually lead to an increase in the specific thermal conductivity of the
- Wavelength-converting bonding layer compared to a transparent bonding layer without phosphor particles by 50% to 100%.
- the thermal conductivity of a wavelength-converting bonding layer having a thickness of approximately 10 micrometers differs only slightly from the thermal conductivity of a transparent bonding layer having a thickness of approximately 5 micrometers.
- Wavelength-converting bonding layer to improve heat dissipation particularly useful.
- the phosphor particles particularly preferably comprise a phosphor or are formed from a phosphor which is doped with europium as the activator, wherein the
- Concentration of europium preferably at least 1 mol%, preferably at least 1.5 mol%, preferably at least 2 mol% and particularly preferably at least 3 mol%.
- Activator of a phosphor is usually a foreign ion, which is introduced into a host lattice and there is a
- the activator ions form the active part of the phosphor. They are brought into an excited electronic state by the irradiated electromagnetic radiation, also called primary radiation. By emission of electromagnetic radiation Aktivatorion goes back to its ground state. The emitted radiation is the converted radiation of the second
- Wavelength range It usually has larger ones
- Wavelength range is approximately proportional to the concentration of activator ions such as europium ions, since these form the optically active part of the phosphor.
- concentration of activator ions such as europium ions
- Conversion plate to the semiconductor body ensures as a thicker wavelength-converting joining layer.
- a (Sr, Ca) AIS1N3 phosphor or a 226 phosphor is suitable.
- Phosphors are particularly preferably suitable for converting blue light into red light.
- a 226 phosphor is a phosphor including an inorganic substance having in its composition at least the element D, the Element AI, the element AX, the element SX and the element NX, where D is one, two or more elements from the group Mn, Ce, Pr, Nd, Sm, Eu, Tb, Dy, Ho, Er, Tm
- Alkali metals Li, Na, K, Rb, Cs
- Yb Alkali metals
- AI one, two or more elements from the group of divalent
- the 226 phosphors have the same crystal structure as Sr (Sr a Cai_ a ) Si 2 Al 2 N 6 .
- Space groups can be described: PI, P2, PI and its length of the chemical bonds between the elements Al-N and Si-N calculated from the lattice constants and atomic coordinates according to a Rietveld analysis within a value of ⁇ 15% of the values described in Figure 7 lies.
- Invention is the space group of the 226 phosphor monoclinic
- the crystal structure of the 226 phosphor compared to the crystal structure of a
- a 226 phosphor is particularly suitable with a
- the 226 phosphor is preferably doped with at least 1 mol%, preferably with at least 1.5 mol%, preferably with at least 2 mol% and particularly preferably with at least 3 mol%.
- a 226 phosphor in contrast to a (Sr, Ca) Al S 1N 3 phosphor, it is possible with a 226 phosphor to provide it with the said high europium doping, since in the case of a 226 phosphor, in contrast to a
- a 226 phosphor can also be general
- B here corresponds to trivalent metals
- E in this case corresponds to monovalent metals
- G in this case corresponds to tetravalent elements
- L in this case corresponds to trivalent elements.
- the term "226 phosphor" results here from the proportions of silicon, aluminum and nitride corresponding to the stoichiometric mentioned
- a 226 red light emission phosphor has the general empirical formula Sr x Cai x Al S iN 3 : Eu, where 0.8 ⁇ x -S 1, where between 0.1% and 5%, respectively, of Sr , Ca and / or Sr / Ca lattice sites are replaced by Eu, and wherein in the X-ray structure analysis of
- Phosphorus in orthorhombic description shows a reflex with the Miller indices 1 2 1.
- composition of a phosphor 226 according to one embodiment with the formula Sr (Sr a CAI a) S 1 2 AI 2 N 6: Eu will be described. This corresponds to the nominal
- the actual Si: Al ratio can also deviate from 2: 2, which can be expressed by a parameter d.
- a possible value of d is between 0 and 0.1, including boundary values.
- X-ray diffraction of Si and Al is not possible. It is also possible that the finished phosphor contains other further elements, for example, about
- Impurities or fluxes are introduced into the batch mixture or during the synthesis, in particular (but not exclusively) boron and / or carbon and / or
- Oxygen and / or halogens such as fluorine or
- Chlorine Due to possible evaporation of individual components, it may also come to statistical understaffing of individual layers. This effect is not or only very difficult to detect with X-ray analysis. Therefore may also have a formula of the type S ri_ e (Sr a CAI a) ig (Si, C) 2 + d (Al, B) 2 -d (N, 0, F, Cl, C) 6: Eu a possible
- Phosphors relate to their properties and the processes for their preparation.
- the phosphor particles are formed from a 226 phosphor.
- 226 phosphors advantageously have a particularly narrow-band emission spectrum, which has a better overlap with the spectral sensitivity of the human eye compared to conventional red phosphors. For this reason, 226 phosphors are suitable, along with a green or green-yellow
- Radiation of the semiconductor body from the first, preferably blue, wavelength range in radiation of the third, preferably red, wavelength range converts to achieve a desired color location, for example in the warm white area.
- Phosphor particles form a 226 phosphor or are formed from a 226 phosphor and the Wavelength-converting bonding layer has a thickness of at most 15 micrometers, preferably of at most 10 micrometers.
- the phosphor particles in the wavelength-converting joining layer have a comparatively high concentration.
- Particularly preferred is the
- a high concentration of phosphor particles leads with advantage to an improved heat dissipation from the
- the phosphor particles have a diameter which corresponds to the thickness of the phosphor particles
- wavelength-converting bonding layer does not exceed.
- a joining material is provided in which phosphor particles are introduced. For example, first
- Phosphor particles are introduced into a joining material such as a resin.
- a joining material such as a resin.
- Conversion film can be provided.
- Conversion film which is suitable to be used as a joining material for example, comprises a pre-crosslinked resin, such as a silicone, are incorporated in the phosphor particles.
- the conversion film is particularly preferably pre-crosslinked but not yet fully cured.
- Such a conversion film with a pre-crosslinked resin is advantageous adhesive and can therefore be used as a joining material.
- the use of a conversion foil as a joining material offers the advantage that in the wavelength-converting
- Radiation can be set very precisely.
- the joining material with the phosphor particles can be any suitable material.
- Semiconductor body can be applied by means of a spray process or by printing. Also by means of printing the
- Bonding material can be produced semiconductor chips, in which the color location of the emitted radiation can be set very precisely.
- the joining material with the phosphor particles can be any suitable material.
- Solvent such as toluene
- the conversion plate has or is composed of a phosphor having the chemical formula (Lu, Y,) 3 (Al, Ga) 5O12: Ce 3+
- the ceramic or monocrystalline conversion plate has one of the following phosphors or is one of the following
- These phosphors are particularly suitable for converting primary radiation from the blue wavelength range into green or green-yellow radiation of a second wavelength range.
- the conversion element includes in addition to the
- Conversion plate a conversion layer, which is formed of a resin, are incorporated in the phosphor particle.
- the conversion layer is applied to a major surface of the conversion plate.
- the conversion layer is preferably in direct contact with the
- Conversion platelets Particularly preferably, the
- Conversion layer has a thickness not greater than 30 microns.
- the conversion element can be present be made spatially separated from the semiconductor body.
- the conversion element embraces the idea, a very thin conversion layer for converting primary
- Resin layer as has already been described above as a wavelength-converting joining layer, on the
- Characteristics should also be formed at the conversion layer.
- the conversion element is preferably suitable for combining with a semiconductor body, the blue light as electromagnetic radiation of the first
- Wavelength range emits mixed-colored radiation from the warm white area of the CIE standard color chart.
- the conversion element has the advantage that its wavelength-converting properties before application can be characterized on a semiconductor body. Thus, several conversion elements can be sorted by obtained color locations.
- An optoelectronic semiconductor chip has, for example, a semiconductor body which is suitable for
- the conversion element is preferably in the semiconductor body in its
- the conversion element is applied to the radiation exit surface of the semiconductor body.
- the conversion element is in this case particularly preferably arranged such that the
- the conversion element is fastened with a transparent bonding layer on the radiation exit surface of the semiconductor body.
- the transparent joining layer is preferably in direct contact with the
- the transparent joining layer is particularly preferably permeable to
- the transparent bonding layer is formed from silicone or comprises a silicone.
- the transparent bonding layer is particularly preferably no thicker than 5 micrometers.
- FIG. 4 shows a schematic sectional view of an optoelectronic semiconductor chip according to a further exemplary embodiment.
- Figure 5 shows a schematic sectional view of a
- FIG. 6 shows a schematic sectional illustration of an optoelectronic semiconductor chip according to a further exemplary embodiment. With reference to Figures 7 to 10 phosphors are closer
- a semiconductor body 1 is provided.
- the semiconductor body 1 has an active zone 2, which is suitable for electromagnetic radiation of a first
- Wavelength range of a radiation exit surface 3 of the semiconductor body 1 to emit ( Figure 1).
- Semiconductor body 1 emits in the present case blue light with a dominant wavelength of 450 nanometers.
- Nitride compound semiconductor materials are based here on a nitride compound semiconductor material. Nitride compound semiconductor materials
- Compound semiconductor materials containing nitrogen such as the materials from the system In x Al y Gai x - y N with 0 ⁇ x ⁇ 1, 0 ⁇ y ⁇ 1 and x + y ⁇ 1.
- phosphor particles 4 are introduced into a joining material, such as a silicone (not
- the phosphor particles 4 have a CaAlSiN phosphor or are formed from a CaAlSiN phosphor.
- the CaAlSiN phosphor corresponds, for example, to the formula (Sr, Ca) AIS1N3 and is thereto
- Phosphor particle 4 does not exceed 20 microns.
- the joining material with the phosphor particles 4 is applied as a layer 5 to the radiation exit surface 3 of the
- Conversion plate 6 is placed on the layer 5 of the joining material with the phosphor particles 4.
- Conversion plate 6 is suitable for converting radiation of the first wavelength range, that is to say in the present case blue light of the semiconductor body 1, into green or green-yellow radiation. Finally, the joining material is cured and there is a wavelength-converting bonding layer 7, the
- Conversion plate 6 connects ( Figure 3).
- Wavelength-converting bonding layer 7 has a thickness of approximately 20 micrometers. The concentration of
- Wavelength-converting joining layer 7 in the present case is approximately 54% by weight.
- the conversion chip 6 is formed of a phosphor having the following formula or has a phosphor having the following formula: LU 3 Al 5 O 12 : Ce 3+ , wherein the cerium content is 1 mol%.
- Embodiment of Figure 3 sends in operation
- mixed-colored radiation consisting of primary blue light of the semiconductor body 1, by the phosphor particles. 4
- Conversion plate 6 converted green / green-yellow light.
- the CRI value (Color Rendering Index" for
- Color rendering value of this light is about 92.
- the mixed-color light has a Color locus in the warm white area of the CIE standard color chart of, for example, 2700 K.
- Wavelength-converting bonding layer 7 which are converted into heat.
- a temperature of 155 ° C is close to the maximum permissible continuous operating temperature of
- the semiconductor chip can be used with higher current densities
- the optoelectronic semiconductor chip act as semiconductor chips with purely resin-based, thick conversion layers, which typically have maximum current densities of 1 A / mm 2 to 1.5 A / mm 2 . Therefore, the optoelectronic semiconductor chip according to the
- Embodiment of Figure 3 not only suitable to warm white light efficiently with a high
- Color rendering index and high luminance emit, but also has a long life.
- Embodiment of Figure 3 phosphor particles 4 in the wavelength-converting joining layer 7, which have a 226 phosphor or are formed from a 226 phosphor.
- the 226 phosphor transmits red light when excited with blue light of the semiconductor body 1
- Wavelength-converting bonding layer 7 not larger than 10 microns.
- wavelength-converting bonding layer 7 would be in the
- Embodiment according to the figure 3 is not possible, since the degree of conversion of the CaAlSiN phosphor used there is not sufficient.
- the concentration of the phosphor particles 4 in the wavelength-converting joining layer 7 in the present case has a value of approximately 59% by weight.
- the mixed-color light consisting of blue light of the semiconductor body 1, green / green-yellow light of the conversion plate 6 and red light of the phosphor particles 4, the of the
- Semiconductor chip is emitted according to the figure 4, has a CRI value of about 93.
- a simulation of the temperature of a main surface 8 of the wavelength-converting joining layer 7 of the semiconductor chip according to the exemplary embodiment of FIG. 4 yields 146 ° C. as the highest value. This means that the
- optoelectronic semiconductor chip could be operated at a higher ambient temperature by 10 ° C than the
- the conversion element 9 according to the embodiment of Figure 5 has a ceramic or monocrystalline
- Conversion plate 6 which is suitable for radiation of a first wavelength range, preferably blue light, in radiation of a second wavelength range, preferably to convert green / green-yellow light.
- a conversion layer 11 is applied on a main surface 10 of the conversion plate 6, a conversion layer 11 is applied.
- the conversion layer 11 is formed of a resin in which phosphor particles 4 are introduced.
- the phosphor particles 4 are suitable for radiation of the first wavelength range in radiation of a third
- Wavelength range, preferably red light to convert, the thickness of the conversion layer 11 has in the present case
- Embodiment of Figure 6 has a semiconductor body 1, as has already been described with reference to FIG.
- a conversion element 9 is applied, as has already been described with reference to FIG 5.
- the conversion element 9 is provided with a transparent bonding layer 12, for example
- the transparent joining layer 12 is in direct contact with the
- FIGS. 8 and 9 show a view of the layers of Sr (Sr a CAI a) S1 2 AI 2 N6.
- the layers are derived from A1N.
- Figure 10 shows for comparison the literature known structure of (Sr 0 .846Ca 0 .2ii) AIS1N3 (ICSD 163203) from direction [010].
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Abstract
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Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE112015005366.2T DE112015005366A5 (de) | 2014-11-27 | 2015-11-25 | Optoelektronischer Halbleiterchip, Verfahren zur Herstellung eines optoelektronischen Halbleiterchips, Konversionselement und Leuchtstoff für ein Konversionselement |
| US15/531,349 US10418530B2 (en) | 2014-11-27 | 2015-11-25 | Optoelectronic semiconductor chip, method for producing an optoelectronic semiconductor chip, conversion element and phosphor for a conversion element |
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE102014117448.8 | 2014-11-27 | ||
| DE102014117448.8A DE102014117448A1 (de) | 2014-11-27 | 2014-11-27 | Optoelektronischer Halbleiterchip, Verfahren zur Herstellung eines optoelektronischen Halbleiterchips, Konversionselement und Leuchtstoff für ein Konversionselement |
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| Publication Number | Publication Date |
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| WO2016083448A1 true WO2016083448A1 (de) | 2016-06-02 |
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| PCT/EP2015/077637 Ceased WO2016083448A1 (de) | 2014-11-27 | 2015-11-25 | Optoelektronischer halbleiterchip, verfahren zur herstellung eines optoelektronischen halbleiterchips, konversionselement und leuchtstoff für ein konversionselement |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | US10418530B2 (de) |
| DE (2) | DE102014117448A1 (de) |
| WO (1) | WO2016083448A1 (de) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112470280A (zh) * | 2018-06-28 | 2021-03-09 | 艾利迪公司 | 发光器件、相关的显示屏以及制造发光器件的方法 |
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| JP2016535800A (ja) * | 2013-10-08 | 2016-11-17 | オスラム オプト セミコンダクターズ ゲゼルシャフト ミット ベシュレンクテル ハフツングOsram Opto Semiconductors GmbH | 蛍光体、蛍光体の製造方法及び蛍光体の使用 |
| DE102017101729A1 (de) * | 2017-01-30 | 2018-08-02 | Osram Opto Semiconductors Gmbh | Strahlungsemittierende Vorrichtung |
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| US20110133631A1 (en) * | 2008-08-11 | 2011-06-09 | Osram Gesellschaft Mit Beschraenkter Haftung | Conversion led |
| US20140008683A1 (en) * | 2010-12-03 | 2014-01-09 | Osram Opto Semiconductors Gmbh | Method for Producing a Semiconductor Chip Emitting Radiation, Semiconductor Chip Emitting Radiation, and Component Emitting Radiation |
| WO2014013406A1 (en) * | 2012-07-20 | 2014-01-23 | Koninklijke Philips N.V. | Led with ceramic green phosphor and protected red phosphor layer |
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| JP4422653B2 (ja) * | 2004-07-28 | 2010-02-24 | Dowaエレクトロニクス株式会社 | 蛍光体およびその製造方法、並びに光源 |
| CN100486397C (zh) * | 2005-04-19 | 2009-05-06 | 皇家飞利浦电子股份有限公司 | 包括红色发射陶瓷发光转换器的照明系统 |
| WO2007018260A1 (ja) * | 2005-08-10 | 2007-02-15 | Mitsubishi Chemical Corporation | 蛍光体及びそれを用いた発光装置 |
| CN102428582B (zh) | 2009-05-15 | 2015-03-04 | 株式会社小糸制作所 | 发光模块、发光模块的制造方法及灯具单元 |
| US9318669B2 (en) * | 2012-01-30 | 2016-04-19 | Cree, Inc. | Methods of determining and making red nitride compositions |
| DE102012107290A1 (de) * | 2012-08-08 | 2014-02-13 | Osram Opto Semiconductors Gmbh | Optoelektronisches Halbleiterbauteil, Konversionsmittelplättchen und Verfahren zur Herstellung eines Konversionsmittelplättchens |
| DE102012110552A1 (de) * | 2012-11-05 | 2014-05-08 | Osram Opto Semiconductors Gmbh | Konverterelement, optoelektronisches Bauelement mit einem derartigen Konverterelement und Verfahren zum Herstellen eines Konverterelements |
| JP2016535800A (ja) * | 2013-10-08 | 2016-11-17 | オスラム オプト セミコンダクターズ ゲゼルシャフト ミット ベシュレンクテル ハフツングOsram Opto Semiconductors GmbH | 蛍光体、蛍光体の製造方法及び蛍光体の使用 |
| JP2015211202A (ja) * | 2014-04-30 | 2015-11-24 | 株式会社東芝 | 発光装置 |
-
2014
- 2014-11-27 DE DE102014117448.8A patent/DE102014117448A1/de not_active Withdrawn
-
2015
- 2015-11-25 DE DE112015005366.2T patent/DE112015005366A5/de not_active Withdrawn
- 2015-11-25 US US15/531,349 patent/US10418530B2/en not_active Expired - Fee Related
- 2015-11-25 WO PCT/EP2015/077637 patent/WO2016083448A1/de not_active Ceased
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20110133631A1 (en) * | 2008-08-11 | 2011-06-09 | Osram Gesellschaft Mit Beschraenkter Haftung | Conversion led |
| US20140008683A1 (en) * | 2010-12-03 | 2014-01-09 | Osram Opto Semiconductors Gmbh | Method for Producing a Semiconductor Chip Emitting Radiation, Semiconductor Chip Emitting Radiation, and Component Emitting Radiation |
| WO2014013406A1 (en) * | 2012-07-20 | 2014-01-23 | Koninklijke Philips N.V. | Led with ceramic green phosphor and protected red phosphor layer |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112470280A (zh) * | 2018-06-28 | 2021-03-09 | 艾利迪公司 | 发光器件、相关的显示屏以及制造发光器件的方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| US20170358718A1 (en) | 2017-12-14 |
| DE102014117448A1 (de) | 2016-06-02 |
| DE112015005366A5 (de) | 2017-08-03 |
| US10418530B2 (en) | 2019-09-17 |
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