WO2016026187A1 - 测量液晶层盒厚与预倾角的方法 - Google Patents

测量液晶层盒厚与预倾角的方法 Download PDF

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WO2016026187A1
WO2016026187A1 PCT/CN2014/086586 CN2014086586W WO2016026187A1 WO 2016026187 A1 WO2016026187 A1 WO 2016026187A1 CN 2014086586 W CN2014086586 W CN 2014086586W WO 2016026187 A1 WO2016026187 A1 WO 2016026187A1
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liquid crystal
effective display
measurement
thickness
area
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PCT/CN2014/086586
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English (en)
French (fr)
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谢克成
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深圳市华星光电技术有限公司
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Priority claimed from CN201410415863.5A external-priority patent/CN104166254B/zh
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Publication of WO2016026187A1 publication Critical patent/WO2016026187A1/zh

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    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells

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  • the present invention relates to the field of liquid crystal display technology, and in particular, to a method for measuring a cell layer thickness and a pretilt angle.
  • LCD Liquid crystal display
  • PDA personal digital assistant
  • digital camera computer screen or laptop screen.
  • a liquid crystal display device includes a housing, a liquid crystal display panel disposed in the housing, and a backlight module disposed in the housing.
  • the liquid crystal display panel is mainly composed of a Thin Film Transistor Array Substrate (TFT Array Substrate), a color filter substrate (Color Filter, CF), and a liquid crystal layer (Liquid Crystal Layer) disposed between the two substrates.
  • TFT Array Substrate Thin Film Transistor Array Substrate
  • Color Filter, CF color filter substrate
  • Liquid Crystal Layer Liquid Crystal Layer
  • the cell gap and the pre angle are two important parameters that affect the performance of the liquid crystal display panel.
  • the thickness of the cell is the thickness of the liquid crystal layer disposed between the array substrate and the color filter substrate, and the thickness of the cell affects the transmittance of the liquid crystal display panel and the reaction time of the liquid crystal.
  • the thickness of the box In order to obtain a high contrast, high brightness, high response speed display effect, the thickness of the box must be strictly controlled, and at the same time, the thickness of the box should be uniform, and the background color of the liquid crystal display should be prevented from being changed, resulting in uneven color.
  • a rubbed polyimide (Polyimide, PI) guiding film is disposed on the side of the array substrate and the color filter substrate adjacent to the liquid crystal layer, and a branched group in the PI guiding film is respectively disposed.
  • the interaction between the liquid crystal molecules and the liquid crystal molecules is relatively strong, and the liquid crystal molecules have an anchoring effect, so that the liquid crystal molecules are aligned in a polar angle inclined with respect to the surface of the PI guiding film, and this polar angle is the pretilt angle of the liquid crystal layer.
  • the pretilt angle can control the orientation of the liquid crystal molecules, prevent the occurrence of anti-dip domains in the liquid crystal layer, and can also affect the transmittance of the liquid crystal layer to a certain extent - the voltage curve, the appropriate pretilt angle can lower the threshold voltage, and the liquid crystal response speed is accelerated. .
  • the liquid crystal display panel process needs to be first made of a liquid crystal display mother board: a sealant frame is coated on the array substrate or the color film substrate, liquid crystal is injected, and the array substrate, the color film substrate are subjected to a process of grouping, baking, aligning, etc., and the process is completed.
  • the production of the liquid crystal display mother board, and finally the liquid crystal display mother board is cut into a plurality of specific sizes a single LCD panel.
  • the liquid crystal injection amount is different, and the box thickness of the liquid crystal display mother board at different positions is inconsistent with the pretilt angle.
  • the traditional method of measuring the thickness of the box and the pretilt angle is only for measuring the effective display area of a single liquid crystal display panel in the liquid crystal display mother board, but the uniformity of the film thickness of the liquid crystal display mother board is not good, and the box thickness and the pretilt angle are likely to occur. Undetectable phenomena cannot be effectively monitored.
  • the use of conventional measurement methods can no longer meet the production requirements, and is not conducive to the benign long-term development of liquid crystal display products.
  • the object of the present invention is to provide a method for measuring the thickness and pretilt angle of a liquid crystal layer, which can accurately measure the box thickness and the pretilt angle of the liquid crystal display mother board, and effectively monitor the box thickness and the pretilt angle to ensure product quality. Conducive to rapid product development and process control.
  • the present invention provides a method of measuring a cell layer thickness and a pretilt angle, comprising the steps of:
  • Step 1 respectively define an effective display area and a plurality of measurement areas located on the periphery of the effective display area on the array substrate and the color film substrate, respectively, and respectively create a uniform pattern in the effective display area and the measurement area;
  • Step 2 the patterned array and the effective display area and the measurement area corresponding to the color film substrate are respectively coated with a plastic frame and dropped into the liquid crystal;
  • Step 3 completing the pairing, baking, and alignment process of the array coated with the plastic frame and the liquid crystal on the color film substrate;
  • Step 4 Perform measurement of the liquid crystal layer box thickness and the pretilt angle for the effective display area and the measurement area, and process the measurement data.
  • the effective display areas are spaced apart from each other, and the area of the measurement area is smaller than the area of the effective display area.
  • the shape of the measurement area is a rectangle.
  • the plurality of measurement areas are respectively disposed between the array, the periphery of the color filter substrate, and the adjacent two effective display areas.
  • the step 2 includes applying a first plastic frame to the peripheral edge of the effective display area, and dropping liquid crystal into the first plastic frame; and coating a second plastic frame on the peripheral edges of the plurality of measurement areas. And dropping liquid crystal into the second plastic frame.
  • the liquid crystal dropped into the second plastic frame is a standard liquid droplet size liquid crystal.
  • the first plastic frame is coated on the color film substrate or coated on the array substrate; the second plastic frame It is coated on a color film substrate or coated on an array substrate.
  • the step 4 is to set the measurement lens to the measurement area by software setting to measure the liquid crystal layer box thickness and the pretilt angle.
  • the film thickness, the line width, the line spacing, and the electrical characteristics of each layer are measured in each process of the array.
  • a method for measuring a thickness and a pretilt angle of a liquid crystal layer according to the present invention wherein a plurality of measurement areas are disposed on the periphery of the effective display area, and a uniform pattern is formed in the effective display area and the measurement area, respectively.
  • the measurement area is measured, and the cell thickness and pretilt angle of the liquid crystal layer can be accurately measured, and the box thickness and the pretilt angle are effectively monitored to ensure product quality, which is beneficial to rapid product development and process control.
  • FIG. 1 is a flow chart of a method for measuring a cell layer thickness and a pretilt angle of the present invention
  • FIG. 2 is a schematic view showing a step 3 of a method for measuring a cell thickness and a pretilt angle of a liquid crystal layer according to the present invention
  • step 4 is a schematic view of step 4 of the method for measuring the thickness and pretilt angle of a liquid crystal layer according to the present invention.
  • the present invention provides a method for measuring a cell layer thickness and a pretilt angle, comprising the following steps:
  • step 1 the effective display area 5 and the plurality of measurement areas 7 located on the periphery of the effective display area 5 are respectively defined on the array substrate 1 and the color filter substrate 3, and a uniform pattern is formed in the effective display area 5 and the measurement area 7, respectively.
  • the effective display areas 5 are spaced apart from each other, and the plurality of measurement areas 7 are located at the periphery of the effective display area 5, and the plurality of measurement areas are not affected by the principle of maximizing the layout utilization rate of the finally formed liquid crystal display panel.
  • the number of 7 is not limited, and the setting position thereof can be arbitrarily selected on the periphery of the effective display area 5.
  • the plurality of measurement areas 7 are respectively disposed in the array, The periphery of the color filter substrates 1, 3 and the adjacent two effective display areas 5.
  • the shape of the measurement area 7 is the same as the shape of the effective display area 5, and is rectangular, but the area of the measurement area 7 is smaller than the area of the effective display area 5.
  • the pattern in which the effective display area 5 and the measurement area 7 are respectively formed is the same, and the pattern located in the measurement area 7 is the same as the structure of each film layer in the pattern of the effective display area 5.
  • the pattern located in the measurement area 7 includes a gate layer, a gate insulating layer, a source/drain, a PI guiding film, and the like on the side of the array substrate 1; the pattern located in the measurement area 7 is on the color filter substrate 3
  • the side includes a film layer of a black matrix (BM), a filter (CF), a PI guiding film, etc., in other words, the measuring area 7 corresponds to a miniature effective display area 5, and the measuring area 7 can be applied to each process of the array.
  • the measurement of the thickness, line width, line spacing and electrical properties of each film layer is beneficial to the quality monitoring of the process.
  • Step 2 The patterned array and the effective display area 5 and the measurement area 7 corresponding to the color film substrates 1 and 3 are respectively coated with a plastic frame and dropped into the liquid crystal.
  • the step 2 includes applying a first plastic frame 51 to the peripheral edge of the effective display area 5, and dropping liquid crystal into the first plastic frame 51; and coating the peripheral edge of the measurement area 7.
  • the second plastic frame 71 is filled with liquid crystal into the second plastic frame 71.
  • the liquid crystal dropped into the second plastic frame 71 is a standard liquid droplet size liquid crystal, that is, a standard sample liquid crystal.
  • the first plastic frame 51 may be coated on the color filter substrate 3 or coated on the array substrate 1; the second plastic frame coating 71 may be applied to the color filter substrate 3 or may be applied to the color filter substrate 3 On the array substrate 1.
  • Step 3 The array, the baking process, and the alignment process are completed by the array coated with the plastic frame and the liquid crystal on the substrate and the color film substrate 1 and 3.
  • an effective display unit is formed corresponding to the effective display area 6, and a measuring unit for measuring the liquid crystal layer box thickness and the pretilt angle is formed corresponding to the measurement area 7.
  • Step 4 Perform measurement of the liquid crystal layer box thickness and the pretilt angle for the effective display area 5 and the measurement area 7, and process the measurement data.
  • step 4 the measurement lens of the measuring machine is aligned with the measurement area 7 by software setting to measure the thickness of the liquid crystal layer and the pretilt angle.
  • liquid crystal of the standard sample dropped into the measurement area 7 does not cause unevenness in film thickness of each layer of the array and the color filter substrates 1, 3, liquid crystal drop amount and uniformity of liquid crystal diffusion, the liquid crystal layer box thickness and the pretilt angle deviation occur.
  • the phenomenon of shifting makes the measurement of the thickness and pretilt angle of the liquid crystal layer more accurate, and can effectively monitor the box thickness and the pretilt angle.
  • the method for measuring the thickness and pretilt angle of a liquid crystal layer of the present invention is A plurality of measurement areas are disposed on the periphery of the effective display area, and a uniform pattern is respectively formed in the effective display area and the measurement area, and the measurement area is measured, and the cell thickness and the pretilt angle of the liquid crystal layer can be accurately measured, and the thickness of the box is The pre-tilt angle is effectively monitored to ensure product quality, which is conducive to rapid product development and process control.

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  • Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Liquid Crystal (AREA)
  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)

Abstract

一种测量液晶层盒厚与预倾角的方法，包括以下步骤：步骤1、在阵列基板（1）与彩膜基板（3）上分别相应定义有效显示区域（5）及位于有效显示区域（5）外围的数个测量区域（7），于有效显示区域（5）与测量区域（7）分别制作一致的图案；步骤2、将阵列基板（1）与彩膜基板（3）对应有效显示区域（5）与测量区域（7）分别涂上胶框和滴入液晶；步骤3、将阵列基板（1）与彩膜基板（3）完成对组、烘烤、配向制程；步骤4、对有效显示区域（5）与测量区域（7）分别进行液晶层盒厚与预倾角的测量，并对测量数据进行处理。该方法能够较准确的测量液晶层的盒厚与预倾角，对盒厚与预倾角进行有效监控，保证产品品质。

Description

测量液晶层盒厚与预倾角的方法 技术领域
本发明涉及液晶显示技术领域，尤其涉及一种测量液晶层盒厚与预倾角的方法。
背景技术
液晶显示装置(LCD，Liquid Crystal Display)具有机身薄、省电、无辐射等众多优点，得到了广泛的应用。如：液晶电视、移动电话、个人数字助理(PDA)、数字相机、计算机屏幕或笔记本电脑屏幕等。
通常液晶显示装置包括壳体、设于壳体内的液晶显示面板及设于壳体内的背光模组(Backlight module)。其中，液晶显示面板主要是由一薄膜晶体管阵列基板(Thin Film Transistor Array Substrate，TFT Array Substrate)、一彩膜基板(Color Filter，CF)、以及一配置于两基板间的液晶层(Liquid Crystal Layer)所构成，其工作原理是通过在两片玻璃基板上施加驱动电压来控制液晶层的液晶分子的旋转，将背光模组的光线折射出来产生画面。
盒厚(Cell gap)与预倾角(Pre angle)是影响液晶显示面板性能的两个重要参数。
盒厚即配置于阵列基板与彩膜基板之间的液晶层的厚度，盒厚会影响液晶显示面板的透光率及液晶的反应时间。为了获得高对比度，高亮度，高响应速度的显示效果，必须严格控制盒厚，同时需保证盒厚均匀，避免液晶显示器底色变化，造成颜色不均。
为了使液晶分子排列较规则，在阵列基板与彩膜基板靠近液晶层的一侧分别设置有经摩擦处理过的聚酰亚胺(Polyimide，PI)导向膜，PI导向膜中的支链基团与液晶分子间的作用力比较强，对液晶分子有锚定作用，使液晶分子在相对于PI导向膜表面倾斜的某一极角上取向排列，这一极角就是液晶层的预倾角。预倾角可控制液晶分子的取向，防止液晶层中反倾畴的出现，在一定程度上还可影响液晶层的透光率—电压曲线，适当的预倾角可使阈值电压降低，液晶响应速度加快。
在液晶显示面板生产过程中，需要对盒厚与预倾角进行测量。通常液晶显示面板制程需先制作液晶显示母板：在阵列基板或彩膜基板上涂布密封胶框、注入液晶，再对阵列基板与彩膜基板进行对组、烘烤、配向等制程，完成液晶显示母板的制作，最后将液晶显示母板切割成多个特定尺寸 的单个液晶显示面板。由于在液晶显示母板制作过程中位于阵列基板与彩膜基板不同位置处的各膜层的厚度不同，引起液晶注入量不同，容易造成液晶显示母板不同位置的盒厚与预倾角不一致，达不到设计要求。传统的测量盒厚与预倾角的方法仅针对液晶显示母板内某单个液晶显示面板的有效显示区域进行测量，但液晶显示母板整体的膜厚均匀性不佳，容易发生盒厚与预倾角测量不到的现象，起不到有效的监控作用。随着对液晶显示产品的精细度及显示均匀性的要求越来越高，使用传统的测量方法已不能满足生产需求，且不利于液晶显示产品的良性长久开发。
发明内容
本发明的目的在于提供一种测量液晶层盒厚与预倾角的方法，能够较准确的测量液晶显示母板的盒厚与预倾角，对盒厚与预倾角进行有效监控，保证产品品质，有利于产品的快速开发与过程控制。
为实现上述目的，本发明提供一种测量液晶层盒厚与预倾角的方法，包括以下步骤：
步骤1、在阵列基板与彩膜基板上分别相应定义有效显示区域及位于有效显示区域外围的数个测量区域，于有效显示区域与测量区域分别制作一致的图案；
步骤2、将形成图案的阵列与彩膜基板对应有效显示区域与测量区域分别涂上胶框和滴入液晶；
步骤3、将涂有胶框和滴有液晶的阵列与彩膜基板完成对组、烘烤、配向制程；
步骤4、对有效显示区域与测量区域分别进行液晶层盒厚与预倾角的测量，并对测量数据进行处理。
所述有效显示区域相互间隔设置，所述测量区域的面积小于有效显示区域的面积。
所述测量区域的形状为矩形。
所述数个测量区域分别设置于阵列、彩膜基板的四周及相邻两个有效显示区域之间。
所述步骤2包括在所述有效显示区域的四周边缘涂布第一胶框，并向该第一胶框内滴入液晶；及在所述数个测量区域的四周边缘涂布第二胶框，并向该第二胶框内滴入液晶。
向第二胶框内滴入的液晶为标准液滴大小的液晶。
所述第一胶框涂布于彩膜基板上或涂布于阵列基板上；所述第二胶框 涂布于彩膜基板上或涂布于阵列基板上。
所述步骤4通过软件设定将测量镜头对准所述测量区域进行液晶层盒厚与预倾角的测量。
所述步骤1中，在阵列各制程中对各层膜厚、线宽、线距、及电性特性进行测量。
本发明的有益效果：本发明的一种测量液晶层盒厚与预倾角的方法，通过在有效显示区域外围设置数个测量区域，并于有效显示区域与测量区域分别制作一致的图案，对所述测量区域进行测量，能够较准确的测量液晶层的盒厚与预倾角，对盒厚与预倾角进行有效监控，保证产品品质，有利于产品的快速开发与过程控制。
为了能更进一步了解本发明的特征以及技术内容，请参阅以下有关本发明的详细说明与附图，然而附图仅提供参考与说明用，并非用来对本发明加以限制。
附图说明
下面结合附图，通过对本发明的具体实施方式详细描述，将使本发明的技术方案及其它有益效果显而易见。
附图中，
图1为本发明测量液晶层盒厚与预倾角的方法的流程图；
图2为本发明测量液晶层盒厚与预倾角的方法的步骤3的示意图；
图3为本发明测量液晶层盒厚与预倾角的方法的步骤4的示意图。
具体实施方式
为更进一步阐述本发明所采取的技术手段及其效果，以下结合本发明的优选实施例及其附图进行详细描述。
请参阅图1至图3，本发明提供一种测量液晶层盒厚与预倾角的方法，包括如下步骤：
步骤1、在阵列基板1与彩膜基板3上分别相应定义有效显示区域5及位于有效显示区域5外围的数个测量区域7，于有效显示区域5与测量区域7分别制作一致的图案。
所述有效显示区域5相互间隔设置，所述数个测量区域7位于有效显示区域5的外围，在不影响最终形成的液晶显示面板排版利用率最大化原则的前提下，所述数个测量区域7的数量不限，其设置位置可在有效显示区域5的外围任意选择，优选的，所述数个测量区域7分别设置于阵列、 彩膜基板1、3的四周及相邻两个有效显示区域5之间。
所述测量区域7的形状与有效显示区域5的形状相同，均为矩形，但所述测量区域7的面积小于有效显示区域5的面积。
值得一提的是，所述于有效显示区域5与测量区域7分别制作一致的图案，是指位于所述测量区域7的图案与位于所述有效显示区域5的图案的各膜层构造相同，如位于所述测量区域7的图案在阵列基板1一侧包括栅极、栅极绝缘层、源/漏极、PI导向膜等膜层；位于所述测量区域7的图案在彩膜基板3一侧包括黑色矩阵(BM)、滤光片(CF)、PI导向膜等膜层，换言之，所述测量区域7相当于一微型的有效显示区域5，可应用所述测量区域7在阵列各制程中对各膜层的厚度、线宽、线距、电性等特性进行测量，有利于制程过程的品质监控。
步骤2、将形成图案的阵列与彩膜基板1、3对应有效显示区域5与测量区域7分别涂上胶框和滴入液晶。
具体的，该步骤2包括在所述有效显示区域5的四周边缘涂布第一胶框51，并向该第一胶框51内滴入液晶；及在所述测量区域7的四周边缘涂布第二胶框71，并向该第二胶框71内滴入液晶。
特别需要说明的是，向第二胶框71内滴入的液晶为标准液滴大小的液晶，即标准样品液晶。
所述第一胶框51可以涂布于彩膜基板3上，也可以涂布于阵列基板1上；所述第二胶框涂71可以涂布于彩膜基板3上，也可以涂布于阵列基板1上。
步骤3、将涂有胶框和滴有液晶的阵列与彩膜基板1、3完成对组、烘烤、配向制程。
完成该步骤3后，对应于所述有效显示区域6处形成有效显示单元，对应于所述测量区域7处形成用于测量液晶层盒厚与预倾角的测量单元。
步骤4、对有效显示区域5与测量区域7分别进行液晶层盒厚与预倾角的测量，并对测量数据进行处理。
具体的，该步骤4通过软件设定将测量机台的测量镜头对准所述测量区域7进行液晶层盒厚与预倾角的测量。
由于滴入测量区域7内的的标准样品液晶不会因阵列与彩膜基板1、3的各层膜厚不均匀、液晶滴下量与液晶扩散均匀性问题而出现液晶层盒厚与预倾角偏移的现象，使得对液晶层盒厚与预倾角的测量较准确，能够对盒厚与预倾角进行有效监控。
综上所述，本发明的一种测量液晶层盒厚与预倾角的方法，通过在有 效显示区域外围设置数个测量区域，并于有效显示区域与测量区域分别制作一致的图案，对所述测量区域进行测量，能够较准确的测量液晶层的盒厚与预倾角，对盒厚与预倾角进行有效监控，保证产品品质，有利于产品的快速开发与过程控制。
以上所述，对于本领域的普通技术人员来说，可以根据本发明的技术方案和技术构思作出其他各种相应的改变和变形，而所有这些改变和变形都应属于本发明权利要求的保护范围。

Claims (10)

  1. 一种测量液晶层盒厚与预倾角的方法，包括以下步骤：
    步骤1、在阵列基板与彩膜基板上分别相应定义有效显示区域及位于有效显示区域外围的数个测量区域，于有效显示区域与测量区域分别制作一致的图案；
    步骤2、将形成图案的阵列与彩膜基板对应有效显示区域与测量区域(7)分别涂上胶框和滴入液晶；
    步骤3、将涂有胶框和滴有液晶的阵列与彩膜基板完成对组、烘烤、配向制程；
    步骤4、对有效显示区域与测量区域分别进行液晶层盒厚与预倾角的测量，并对测量数据进行处理。
  2. 如权利要求1所述的测量液晶层盒厚与预倾角的方法，其中，所述有效显示区域相互间隔设置，所述测量区域的面积小于有效显示区域的面积。
  3. 如权利要求1所述的测量液晶层盒厚与预倾角的方法，其中，所述测量区域的形状为矩形。
  4. 如权利要求1所述的测量液晶层盒厚与预倾角的方法，其中，所述数个测量区域分别设置于阵列、彩膜基板的四周及相邻两个有效显示区域之间。
  5. 如权利要求1所述的测量液晶层盒厚与预倾角的方法，其中，所述步骤2包括在所述有效显示区域的四周边缘涂布第一胶框，并向该第一胶框内滴入液晶；及在所述数个测量区域的四周边缘涂布第二胶框，并向该第二胶框内滴入液晶。
  6. 如权利要求5所述的测量液晶层盒厚与预倾角的方法，其中，向第二胶框内滴入的液晶为标准液滴大小的液晶。
  7. 如权利要求5所述的测量液晶层盒厚与预倾角的方法，其中，所述第一胶框涂布于彩膜基板上或涂布于阵列基板上；所述第二胶框涂布于彩膜基板上或涂布于阵列基板上。
  8. 如权利要求1所述的测量液晶层盒厚与预倾角的方法，其中，所述步骤4通过软件设定将测量镜头对准所述测量区域进行液晶层盒厚与预倾角的测量。
  9. 如权利要求1所述的测量液晶层盒厚与预倾角的方法，其中，所述 步骤1中，在阵列各制程中对各层膜厚、线宽、线距、及电性特性进行测量。
  10. 一种测量液晶层盒厚与预倾角的方法，包括以下步骤：
    步骤1、在阵列基板与彩膜基板上分别相应定义有效显示区域及位于有效显示区域外围的数个测量区域，于有效显示区域与测量区域分别制作一致的图案；
    步骤2、将形成图案的阵列与彩膜基板对应有效显示区域与测量区域分别涂上胶框和滴入液晶；
    步骤3、将涂有胶框和滴有液晶的阵列与彩膜基板完成对组、烘烤、配向制程；
    步骤4、对有效显示区域与测量区域分别进行液晶层盒厚与预倾角的测量，并对测量数据进行处理；
    其中，所述有效显示区域相互间隔设置，所述测量区域的面积小于有效显示区域的面积；
    其中，所述测量区域的形状为矩形；
    其中，所述数个测量区域分别设置于阵列、彩膜基板的四周及相邻两个有效显示区域之间；
    其中，所述步骤2包括在所述有效显示区域的四周边缘涂布第一胶框，并向该第一胶框内滴入液晶；及在所述数个测量区域的四周边缘涂布第二胶框，并向该第二胶框内滴入液晶；
    其中，向第二胶框内滴入的液晶为标准液滴大小的液晶；
    其中，所述第一胶框涂布于彩膜基板上或涂布于阵列基板上；所述第二胶框涂布于彩膜基板上或涂布于阵列基板上；
    其中，所述步骤4通过软件设定将测量镜头对准所述测量区域进行液晶层盒厚与预倾角的测量；
    其中，所述步骤1中，在阵列各制程中对各层膜厚、线宽、线距、及电性特性进行测量。
PCT/CN2014/086586 2014-08-20 2014-09-16 测量液晶层盒厚与预倾角的方法 WO2016026187A1 (zh)

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Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1307247A (zh) * 2000-01-31 2001-08-08 夏普公司 测量液晶层厚度的方法和装置
CN1952748A (zh) * 2005-10-19 2007-04-25 统宝光电股份有限公司 液晶显示面板的制造方法
CN101118320A (zh) * 2007-07-18 2008-02-06 汕头超声显示器（二厂）有限公司 液晶显示器件液晶层厚度的测试方法
CN201945777U (zh) * 2011-01-20 2011-08-24 福州华映视讯有限公司 液晶显示面板
CN102799030A (zh) * 2012-08-30 2012-11-28 南京中电熊猫液晶显示科技有限公司 一种液晶显示基板及其制造方法
JP2013064937A (ja) * 2011-09-20 2013-04-11 Stanley Electric Co Ltd 液晶表示装置
KR20130076120A (ko) * 2011-12-28 2013-07-08 하이디스 테크놀로지 주식회사 패널의 실런트 디스펜싱 방법 및 이를 이용한 액정표시패널

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1307247A (zh) * 2000-01-31 2001-08-08 夏普公司 测量液晶层厚度的方法和装置
CN1952748A (zh) * 2005-10-19 2007-04-25 统宝光电股份有限公司 液晶显示面板的制造方法
CN101118320A (zh) * 2007-07-18 2008-02-06 汕头超声显示器（二厂）有限公司 液晶显示器件液晶层厚度的测试方法
CN201945777U (zh) * 2011-01-20 2011-08-24 福州华映视讯有限公司 液晶显示面板
JP2013064937A (ja) * 2011-09-20 2013-04-11 Stanley Electric Co Ltd 液晶表示装置
KR20130076120A (ko) * 2011-12-28 2013-07-08 하이디스 테크놀로지 주식회사 패널의 실런트 디스펜싱 방법 및 이를 이용한 액정표시패널
CN102799030A (zh) * 2012-08-30 2012-11-28 南京中电熊猫液晶显示科技有限公司 一种液晶显示基板及其制造方法

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