WO2015030369A1 - 적외선 발광다이오드 감지센서를 이용한 냉동시스템 증발기의 제상장치 - Google Patents
적외선 발광다이오드 감지센서를 이용한 냉동시스템 증발기의 제상장치 Download PDFInfo
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- WO2015030369A1 WO2015030369A1 PCT/KR2014/006580 KR2014006580W WO2015030369A1 WO 2015030369 A1 WO2015030369 A1 WO 2015030369A1 KR 2014006580 W KR2014006580 W KR 2014006580W WO 2015030369 A1 WO2015030369 A1 WO 2015030369A1
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- Prior art keywords
- frost
- infrared light
- infrared
- light emitting
- signal
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- 238000010257 thawing Methods 0.000 title claims abstract description 43
- 238000005057 refrigeration Methods 0.000 title claims description 7
- 230000035945 sensitivity Effects 0.000 claims abstract description 29
- 238000001514 detection method Methods 0.000 claims description 37
- 238000000034 method Methods 0.000 claims description 17
- 230000003287 optical effect Effects 0.000 claims description 12
- 230000000694 effects Effects 0.000 claims description 11
- 238000006243 chemical reaction Methods 0.000 claims description 4
- 238000001816 cooling Methods 0.000 abstract description 10
- 238000010586 diagram Methods 0.000 description 9
- 230000008447 perception Effects 0.000 description 9
- 239000003507 refrigerant Substances 0.000 description 6
- 238000010521 absorption reaction Methods 0.000 description 4
- 230000035807 sensation Effects 0.000 description 3
- 230000007423 decrease Effects 0.000 description 2
- 238000010438 heat treatment Methods 0.000 description 2
- 239000007788 liquid Substances 0.000 description 2
- 206010034960 Photophobia Diseases 0.000 description 1
- 230000002159 abnormal effect Effects 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 230000001149 cognitive effect Effects 0.000 description 1
- 230000000295 complement effect Effects 0.000 description 1
- 238000001704 evaporation Methods 0.000 description 1
- 230000008020 evaporation Effects 0.000 description 1
- 238000001914 filtration Methods 0.000 description 1
- 238000002513 implantation Methods 0.000 description 1
- 208000013469 light sensitivity Diseases 0.000 description 1
- 230000008016 vaporization Effects 0.000 description 1
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Classifications
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- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F25—REFRIGERATION OR COOLING; COMBINED HEATING AND REFRIGERATION SYSTEMS; HEAT PUMP SYSTEMS; MANUFACTURE OR STORAGE OF ICE; LIQUEFACTION SOLIDIFICATION OF GASES
- F25D—REFRIGERATORS; COLD ROOMS; ICE-BOXES; COOLING OR FREEZING APPARATUS NOT OTHERWISE PROVIDED FOR
- F25D21/00—Defrosting; Preventing frosting; Removing condensed or defrost water
- F25D21/002—Defroster control
- F25D21/006—Defroster control with electronic control circuits
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- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F25—REFRIGERATION OR COOLING; COMBINED HEATING AND REFRIGERATION SYSTEMS; HEAT PUMP SYSTEMS; MANUFACTURE OR STORAGE OF ICE; LIQUEFACTION SOLIDIFICATION OF GASES
- F25D—REFRIGERATORS; COLD ROOMS; ICE-BOXES; COOLING OR FREEZING APPARATUS NOT OTHERWISE PROVIDED FOR
- F25D21/00—Defrosting; Preventing frosting; Removing condensed or defrost water
- F25D21/02—Detecting the presence of frost or condensate
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
- G01J5/08—Optical arrangements
- G01J5/0896—Optical arrangements using a light source, e.g. for illuminating a surface
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
- G01N21/3554—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for determining moisture content
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
- G01N21/3563—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing solids; Preparation of samples therefor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
- G01N21/359—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using near infrared light
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F25—REFRIGERATION OR COOLING; COMBINED HEATING AND REFRIGERATION SYSTEMS; HEAT PUMP SYSTEMS; MANUFACTURE OR STORAGE OF ICE; LIQUEFACTION SOLIDIFICATION OF GASES
- F25B—REFRIGERATION MACHINES, PLANTS OR SYSTEMS; COMBINED HEATING AND REFRIGERATION SYSTEMS; HEAT PUMP SYSTEMS
- F25B2700/00—Sensing or detecting of parameters; Sensors therefor
- F25B2700/11—Sensor to detect if defrost is necessary
- F25B2700/111—Sensor to detect if defrost is necessary using an emitter and receiver, e.g. sensing by emitting light or other radiation and receiving reflection by a sensor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/06—Illumination; Optics
- G01N2201/062—LED's
Definitions
- the present invention detects the frost generated in the evaporator of a refrigerator, a low temperature warehouse, a freezer or a heat pump through an infrared light emitting diode sensor and controls it by a processor, and then operates a defroster to remove the frost of the evaporator. It relates to a defrosting device.
- Refrigerators low-temperature warehouses, freezers or heat pumps are used as devices for purifying a predetermined space through heat exchange by purifying refrigerant.
- a cooling device cyclically cycles four steps of compressing, condensing, expanding, and vaporizing a refrigerant to perform cooling through heat exchange.
- Such a cooling device is provided with a compressor, a condenser, an expansion valve, an evaporator, and the like.
- the compressed refrigerant in the liquid state is cooled by adjusting the flow rate in the expansion valve.
- it When it is injected into the evaporator, it expands and vaporizes, thus absorbing heat from the surroundings in the evaporator to supply cold air to an internal space such as a storage compartment or a room to cool the space.
- the refrigerant in the gaseous state in the evaporator is returned to the compressor and then compressed and becomes a liquid state, and the above-mentioned refrigeration cycle is repeated.
- the evaporator surface temperature which absorbs the heat of the internal space through the refrigeration cycle and cools the internal space, is relatively low compared to the temperature of the internal space air, thereby condensing the evaporator surface from the air of the internal space, which is relatively hot and wet. Moisture sticks to the frost.
- the castle formed on the surface of the evaporator becomes thicker and thicker with time, and as a result, the heat exchange efficiency of the air passing through the evaporator is reduced, resulting in low cooling efficiency and excessive power consumption.
- a timer is installed in a cooling device to accumulate the operation time of the compressor, and when the accumulated operation time exceeds a predetermined time, the heating unit installed around the evaporator is operated to remove frost generated in the evaporator. Defrosting operation was performed.
- this defrosting operation has a limitation in efficiently removing the frost formed on the evaporator by performing defrosting operation periodically after a certain time, regardless of the amount of actual frost formed on the evaporator. The temperature rise by the defrosting operation frequently occurred.
- Korean Patent Laid-Open Publication No. 10-2011-88745 uses an electronic device to detect frost and detects a signal according to the amount of frost detected. A method of generating and controlling frost is disclosed.
- the frost detection method used in the patent method is performed by converting the amount of frost of the evaporator by sensing the capacitance between the cooling fins by using a plurality of sensors, and the frost detection signal includes a noise signal. Because the detection method of is not a relatively complex and accurate measure of the amount of frost, there was a problem with the reliability of the frost detection method.
- the infrared light emitting unit emits infrared rays and the reflected infrared light sensitivity is detected by the infrared light receiving unit
- the reflection sensitivity is not only changed due to the difference in infrared absorption of the medium depending on the state of the medium to which the infrared light is projected. Even if the infrared light of the same intensity is projected, since the same infrared light is not emitted from the infrared generator, the error due to the difference in the intensity of the infrared light cannot be completely eliminated.
- the present inventors project the infrared rays generated at a specific voltage through the infrared light emitting diode (D1) in the infrared light emitting unit to completely remove the errors that may occur during infrared projection and reflection in the infrared frost sensor, and then infrared
- the light receiving unit measures the signal voltage of the light-receiving unit LED which is reduced due to the optical interference effect with the reflected infrared rays by projecting infrared rays through the infrared light emitting diode (D2), and the thickness of the frost on the evaporator in the control processor is greater than or equal to a certain thickness.
- the present invention has been completed by developing a defrosting device for defrosting the frost of the evaporator by driving the operation of the defroster by reading whether it is recognized.
- the technical problem of the present invention is to project the infrared rays generated at a specific voltage through the infrared light emitting diode (D1) in the infrared light emitting unit to completely eliminate the errors that may occur during infrared projection and reflection in the infrared frost detection sensor to the evaporator
- the infrared light receiving unit measures the signal voltage of the light-receiving unit light emitting diode which is reduced due to the optical interference effect with the reflected infrared rays by projecting the sensing infrared rays through the infrared light emitting diode (D2), and the thickness of the frost on the evaporator in the control processor is constant. It is intended to develop a defrosting device that defrosts the frost of the evaporator by driving the operation of the defroster by reading whether it is thicker or more.
- An object of the present invention is 1) after receiving the frost detection signal transmitted from the output of the control processor 60, the frost detection sensor 50 for transmitting the frost detection signal through the infrared light emission and reflection to the control processor 60 input unit ; 2) After converting the input frost detection signal from the signal conversion unit into a digital signal, if the frost sensitivity threshold from the frost sensor 50 set in the control processor 60 through the signal setting unit 61 is exceeded.
- a control processor 60 for transmitting a display signal to the signal display unit 62 and an operation signal to the defroster 70; And 3) a defroster 70 operated according to a signal received from the control processor 60.
- the defrosting apparatus of the refrigeration system evaporator using the infrared light emitting diode sensor is provided.
- the frost sensor 50 projects the infrared light generated at a specific voltage through the infrared light emitting diode (D1) in the infrared light emitting unit 51 to the evaporator 20, and then the infrared light emitting diode (52) in the infrared light emitting diode ( D2) measures the signal voltage of the light-receiving part LED which is reduced due to the optical interference effect with the reflected infrared rays by projecting the sensing infrared rays.
- infrared projection from the infrared light emitting unit 51 and sensing infrared projection from the infrared light receiving unit 52 are performed without interference, and
- the infrared projection from the infrared light emitting unit 51 and the sensing infrared projection from the infrared light receiving unit 52 are characterized in that a light interference phenomenon between the sensing infrared light and the infrared light reflected from the evaporator occurs and is degraded.
- the frost sensor 50 projects the infrared light generated at a specific voltage through the infrared light emitting diode D1 in the infrared light emitting unit 51 to the evaporator 20, and then the transistor TR in the infrared light receiving unit 52. It further comprises a sensor, characterized in that for measuring the infrared sensitivity reflected by the absorption through the voltage generated by the transistor.
- the signal setting unit 61 in the control processor 60 can set and input the defrost mode, defrost time, defrost method, defrost recognition sensitivity, implantation recognition sensitivity, forced defrost period, the signal display unit 62 Defrost mode, defrost time, defrosting method and the frost is detected by the frost detection sensor 50 is characterized in that the alarm operation can be displayed through the sensitivity.
- the infrared rays are infrared rays having a wavelength of 800 to 950 nm, and the voltage applied to the infrared light emitting diode D1 in the infrared light emitting unit 51 is 5V.
- the effect of the present invention is to project the infrared rays generated at a specific voltage through the infrared light emitting diode (D1) in the infrared light emitting unit to completely eliminate the errors that may occur during infrared projection and reflection in the infrared frost detection sensor,
- Infrared light receiver also measures the signal voltage of the light-receiving diode which is reduced due to the optical interference effect with the reflected infrared rays by projecting infrared rays through the infrared light emitting diode (D2), and the thickness of the frost on the evaporator in the control processor is a certain thickness. It is to provide a defrosting device for defrosting the frost of the evaporator by driving the operation of the defroster by reading whether or not it is abnormal.
- the frost defrosting device of the present invention receives the detection signal from the frost sensor at the time when the frost of the evaporator is removed to stop the defrosting operation by the processor to minimize the defrosting operation time and thus the effective defrosting operation.
- the frost defrosting device of the present invention receives the detection signal from the frost sensor at the time when the frost of the evaporator is removed to stop the defrosting operation by the processor to minimize the defrosting operation time and thus the effective defrosting operation.
- the control processor 60 may set and input a defrost mode, a defrost time, a defrost method, a defrost perception sensitivity, a perception perception sensitivity, a forced defrost period, and the like through the signal setting unit 61, and the signal display unit 62 is currently set.
- the alarm action can be displayed through the frost sensitivity recognized by the frost sensor.
- FIG. 2 is a schematic view showing an overall configuration of a defrosting apparatus of the present invention.
- Fig. 3A is a detailed view showing the infrared projection from the infrared light emitting section 51 and the sensing infrared projection from the infrared light receiving section 52 when no frost is generated in the evaporator in the frost detection system of the present invention.
- FIG. 3B is a detailed view showing infrared projection from the infrared light emitting unit 51 and sensing infrared projection from the infrared light receiving unit 52 when frost is generated in the evaporator in the frost detection system of the present invention. It is shown that the optical interference phenomenon between the detection infrared rays from the infrared light receiving portion and the infrared rays reflected from the evaporator.
- 3C shows an infrared projection and reflection of another frost sensor used in the frost detection system of the present invention.
- FIG. 3D shows the infrared projection and reflection of another frost sensor used in the frost detection system of the present invention.
- frost is generated in the evaporator
- the infrared projection from the infrared light emitting unit 51 and the infrared light receiving unit 52 are shown.
- infrared absorption reflected from the evaporator is generated and a voltage due to reflected infrared rays is generated in the transistor in the light receiving unit.
- 4A is a diagram illustrating a circuit constituting the infrared light emitting unit 51 and the infrared light receiving unit 52 in the frost sensor of the present invention.
- the standard voltage 5V of the light emitting unit infrared light emitting diode D1 and the signal voltage of the light receiving unit infrared light emitting diode D2 (5V-reverse voltage) are shown.
- Figure 4b is a graph showing the relationship between the signal voltage and the frost thickness measured at the light receiving unit in the frost sensor of the present invention. As the thickness of the castle increases, the signal voltage of the light receiver decreases through the generation of reverse voltage. In the criticality for the operation of the defrosting apparatus of the present invention, the thickness is denoted by T 1 and the measured signal voltage of the light receiver is denoted by V 1 .
- Figure 4c illustrates a circuit diagram used for another sensation sensor of the present invention, which is the infrared light emitting unit 51, the infrared light emitting diode (D1) through the infrared light emitted from a specific voltage to the evaporator 20
- the infrared light receiving unit 52 is a frost detection sensor for measuring the infrared sensitivity reflected by the transistor TR through the voltage generated by the TR.
- FIG. 5 is a schematic diagram showing the shape of the sensation sensor of the present invention.
- the frost sensor has a left and right attachment member on the front of the sensor so that it can be attached to a pin in the evaporator.
- FIG. 6 is a flowchart showing the step of setting the defrosting operating condition of the control processor of the present invention.
- the defroster is driven by transmitting a control signal to the defroster in accordance with a set operating condition.
- Cooling device 20 Evaporator 30. Infrared reflection area in the frost
- the present invention 1) after receiving the frost detection signal transmitted from the output of the control processor 60, frost detection sensor 50 for transmitting the frost detection signal through the infrared light emission and reflection to the control processor 60 input; 2) After converting the input frost detection signal from the signal conversion unit into a digital signal, if the frost sensitivity threshold from the frost sensor 50 set in the control processor 60 through the signal setting unit 61 is exceeded.
- a control processor 60 for transmitting a display signal to the signal display unit 62 and an operation signal to the defroster 70; And 3) a defroster 70 operated according to a signal received from the control processor 60.
- FIG. 1 is a block diagram showing a schematic configuration of a frost sensor, a control processor and a defroster of the defrosting apparatus of the present invention.
- the present invention is configured around the control processor 60 to operate the defroster 70 for removing the frost attached to the evaporator, the control processor 60 inputs an electrical signal from the frost sensor 50 It is connected for output.
- the frost sensor 50 is composed of an infrared light emitting unit (D1) and infrared light receiving unit (D2), and can transfer and exchange electrical signals with the control processor 60, the infrared light emitting unit 51 in the infrared light emitting diode ( After projecting the infrared rays generated at a specific voltage, preferably 5V, to the evaporator 20 through D1), the infrared light receiving unit 52 projects the sensed infrared rays through the infrared light emitting diode D2 to reflect the reflected infrared light.
- the sensitivity of frost formation is measured by measuring the signal voltage of the light-receiving diode which is reduced due to the interference effect. In addition, it is to transmit the signal measured by the frost sensor to the control processor (60).
- control processor 60 converts the analog variable voltage signal transmitted from the frost sensor to a digital signal by filtering the signal conversion unit, and when the frost threshold set in the control processor 60 is exceeded, the defroster 70 may be used. It plays a role of transmitting the operation signal to the.
- the control processor 60 may set and input a defrost mode, a defrost time, a defrost method, a defrost perception sensitivity, a perception perception sensitivity, a forced defrost period, and the like through the signal setting unit 61, and the signal display unit 62 is currently set.
- the alarm action can be displayed through the frost sensitivity recognized by the frost sensor.
- the defroster 70 is operated according to a signal received from the control processor 60 and finally defrosts the evaporator frost of the cooling device.
- the defroster is not particularly limited as long as it is a heating device capable of defrosting an ordinary evaporator.
- FIG. 2 is a schematic view showing an overall configuration of a defrosting apparatus of the present invention.
- the frost sensor has an optical interference effect with infrared rays reflected from the infrared reflecting portion 30 in the frost generated on the surface of the evaporator 20. Is generated and the light receiving unit 52 is characterized by detecting the infrared light interference effect.
- the infrared wavelength is characterized in that 800 ⁇ 950nm.
- Fig. 3A is a detailed view showing the infrared projection from the infrared light emitting section 51 and the sensing infrared projection from the infrared light receiving section 52 when no frost is generated in the evaporator in the frost detection system of the present invention.
- the infrared rays projected from the infrared light emitting unit 51 are absorbed into the evaporator tube 100 or the evaporation fin 110 in the evaporator so that infrared reflection does not occur. Therefore, when projecting the sensing infrared rays from the infrared light receiving unit 52, the projected sensing infrared rays can be projected without any interference. Therefore, the voltage of the infrared light emitting diode D2 in the light receiving unit 52 is generally matched with the voltage of the infrared light emitting diode D1 in the infrared light emitting unit 51. In general, the voltage of the infrared light emitting diode D1 is preferably 5V.
- FIG. 3B is a detailed view showing infrared projection from the infrared light emitting unit 51 and sensing infrared projection from the infrared light receiving unit 52 when frost is generated in the evaporator in the frost detection system of the present invention. It is shown that the optical interference phenomenon between the detection infrared rays from the infrared light receiving portion and the infrared rays reflected from the evaporator.
- infrared rays projected from the infrared light emitting unit 51 When frost is generated in the evaporator, infrared rays projected from the infrared light emitting unit 51 generate infrared reflections from the frost generated in the evaporator. Therefore, in the case of projecting the sensing infrared rays from the infrared light receiving unit 52, the projected sensing infrared light causes an optical interference effect by the infrared rays reflected from the castle, so that the voltage of the infrared light emitting diode D2 in the light receiving unit 52 is optical interference. The phenomenon is lower than the voltage of the infrared light emitting diode D1 in the infrared light emitting unit 51.
- 3C shows infrared projection and reflection of another frost sensor used in the frost detection system of the present invention.
- 3d illustrates infrared projection and reflection when frost is generated in the evaporator of another frost sensor used in the frost detection system of the present invention.
- Infrared projection from the infrared light emitting unit 51 and infrared absorption reflected from the evaporator are generated in the infrared light receiving unit 52 to generate a voltage due to reflected infrared light in the transistor in the light receiving unit.
- 4A is a diagram illustrating a circuit constituting the infrared light emitting unit 51 and the infrared light receiving unit 52 in the frost sensor of the present invention.
- the standard voltage 5V of the light emitting unit infrared light emitting diode D1 and the signal voltage of the light receiving unit infrared light emitting diode D2 (5V-reverse voltage) are shown.
- the reverse voltage increases so that the signal voltage of the infrared light emitting diode D2 is lowered. That is, due to the optical interference effect through the reflected infrared light, the voltage of the infrared light emitting diode D2 in the light receiving unit 52 is reversed due to the light interference phenomenon, so that the voltage of the infrared light emitting diode D1 in the infrared light emitting unit 51 is generated. Will be lower than 5V.
- the reverse voltage in the light receiving unit infrared light emitting diode D2 does not occur, and the light receiving unit signal voltage matches the light emitting unit signal voltage.
- Figure 4b is a graph showing the relationship between the signal voltage and the frost thickness measured at the light receiving unit in the frost sensor of the present invention.
- the thickness of the castle increases, the signal voltage of the light receiver decreases through the generation of reverse voltage.
- the thickness is represented by T 1 and the measured signal voltage of the light receiver is represented by V 1 .
- Threshold gender thickness T 1 for the operation of the defrosting apparatus of the present invention can be detected by the light receiving signal voltage V 1 measured and threshold light receiving signal voltage V 1 is the control processor via the set of signal setting unit 61 of the present invention It is set within 60.
- Figure 4c illustrates a circuit diagram used in another sex sensor of the present invention.
- the frost detection sensor 50 is a circuit diagram used for another frost detection sensor used to complement the frost detection sensor of the present invention consisting of the light emitting unit infrared light emitting diode (D1) and the light receiving unit infrared light emitting diode (D2). It is illustrated.
- frost sensor that can be used to project the infrared light generated at a specific voltage through the infrared light emitting diode (D1) in the infrared light emitting unit 51 to the evaporator 20 and then the transistor (TR) in the infrared light receiving unit (52) It is a frost detection sensor that measures the infrared sensitivity reflected and absorbed through the voltage generated by TR.
- FIG. 5 is a schematic diagram showing the shape of the sensation sensor of the present invention.
- the frost sensor has a left and right attachment member on the front of the sensor so that it can be attached to a pin in the evaporator.
- the frost sensor 50 has an infrared light emitting unit including an infrared light emitting diode (D1) and an infrared light receiving unit including an infrared light emitting diode (D2).
- FIG. 6 is a flowchart showing the step of setting the defrosting operating condition of the control processor of the present invention.
- the defroster is driven by transmitting a control signal to the defroster in accordance with a set operating condition.
- the control processor 60 may set and input a defrost mode, a defrost time, a defrost method, a defrost perception sensitivity, a perception perception sensitivity, a forced defrost period, and the like through the signal setting unit 61, and the signal display unit 62 is currently set.
- the alarm action can be displayed through the frost sensitivity recognized by the frost sensor.
- a flowchart illustrating a defrost time setting, a defrost mode setting, a defrosting method setting, and an frosting sensitivity setting, which are set through the signal setting unit, are illustrated.
- the procedure for setting target idea sensitivity, forced defrost period, and cognitive delay time after setting the idea sensitivity is also shown in the flowchart.
- the defroster 70 is operated by a program input accordingly. It is operated through the digitized defrosting operation signal within. In addition, if the frost is sufficiently removed by the frost sensor 50 to detect this stops the operation of the defroster.
- the frost defrosting device of the present invention receives the detection signal from the frost sensor at the time when the frost of the evaporator is removed to stop the defrosting operation by the processor to minimize the defrosting operation time and thus the effective defrosting operation. Through this, minimization of defrosting cost can be realized.
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Abstract
Description
Claims (6)
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201480046703.6A CN105579798B (zh) | 2013-08-26 | 2014-08-01 | 使用红外线发射二极管传感器对制冷系统的蒸发器除霜的设备 |
US14/431,435 US9657983B2 (en) | 2013-08-26 | 2014-08-01 | Apparatus for defrosting evaporator in refrigeration system using infrared emitting diode sensor |
SG11201600769QA SG11201600769QA (en) | 2013-08-26 | 2014-08-01 | Apparatus for defrosting evaporator in refrigeration system using infrared light-emitting diode sensor |
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
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KR10-2013-0100895 | 2013-08-26 | ||
KR20130100895A KR101499499B1 (ko) | 2013-08-26 | 2013-08-26 | 발광다이오드 적외선 감지센서를 이용한 냉동시스템 증발기의 제상장치 |
KR10-2014-0017681 | 2014-02-17 | ||
KR1020140017681A KR101402705B1 (ko) | 2014-02-17 | 2014-02-17 | 적외선 감지센서를 이용한 냉동시스템 증발기의 제상장치 |
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WO2015030369A1 true WO2015030369A1 (ko) | 2015-03-05 |
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PCT/KR2014/006580 WO2015030369A1 (ko) | 2013-08-26 | 2014-08-01 | 적외선 발광다이오드 감지센서를 이용한 냉동시스템 증발기의 제상장치 |
Country Status (4)
Country | Link |
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US (1) | US9657983B2 (ko) |
CN (1) | CN105579798B (ko) |
SG (1) | SG11201600769QA (ko) |
WO (1) | WO2015030369A1 (ko) |
Cited By (2)
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CN107796083A (zh) * | 2016-08-31 | 2018-03-13 | 青岛海尔智能技术研发有限公司 | 空调外机蒸发器的结霜程度检测方法与装置 |
CN114593549A (zh) * | 2022-02-09 | 2022-06-07 | 广东和益节能科技股份有限公司 | 一种基于红外线的空气源热泵除霜控制方法及空气源热泵 |
Families Citing this family (6)
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WO2019033315A1 (zh) * | 2017-08-16 | 2019-02-21 | 深圳市启惠智能科技有限公司 | 一种监控处理方法、服务器及计算机存储介质 |
CN108240696A (zh) * | 2018-03-15 | 2018-07-03 | 重庆物奇科技有限公司 | 一种空调除霜除冰系统及方法 |
EP3640568B1 (en) | 2018-10-16 | 2022-09-14 | Vestel Elektronik Sanayi ve Ticaret A.S. | Freezing sensor |
CN110186229A (zh) * | 2019-06-19 | 2019-08-30 | 贵州大学 | 一种基于红外线的空气源热泵除霜控制方法及空气源热泵 |
CN111707026A (zh) * | 2020-05-14 | 2020-09-25 | 广东纽恩泰新能源科技发展有限公司 | 采用红外线探测翅片蒸发器霜层方法以及化霜装置、方法 |
CN113883770A (zh) * | 2020-07-01 | 2022-01-04 | 海信(山东)冰箱有限公司 | 一种冰箱和除霜控制方法 |
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Also Published As
Publication number | Publication date |
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CN105579798A (zh) | 2016-05-11 |
SG11201600769QA (en) | 2016-03-30 |
US20150247663A1 (en) | 2015-09-03 |
US9657983B2 (en) | 2017-05-23 |
CN105579798B (zh) | 2018-04-17 |
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