WO2014118996A1

WO2014118996A1 - Electronic parts transport device

Info

Publication number: WO2014118996A1
Application number: PCT/JP2013/052522
Authority: WO
Inventors: 潤平米満; 日出夫南
Original assignee: 上野精機株式会社
Priority date: 2013-02-04
Filing date: 2013-02-04
Publication date: 2014-08-07
Also published as: PH12015501683B1; JPWO2014118996A1; JP5645291B1; PH12015501683A1

Abstract

Provided is an electronic parts transport device capable of achieving both inspection precision and production efficiency for electronic parts. An electronic parts transport device (1) has a transport table (12) installed on a stand (14) having a fixed width. The transport table (12) has a horizontal plate in a location higher than the top face of the stand (14) and operates intermittently while retaining electronic parts in the outer circumference of the horizontal plate. A side-attached unit (4) that processes the electronic parts is installed next to the stand (14) so that the height of a stage (41) disposed on the top face of the side-attached unit is set to be between the height of the stand (14) and the horizontal plate. The transport table (12) has a projecting section (A), an outer circumferential portion of which projects from the edge (E) of the stand (14). Electronic parts are directly transferred between a holding means (13) on the transport table (12) and the stage (41) of the side-attached unit (4) by placing the side-attached unit (4) directly underneath the projecting section (A).

Description

Electronic component conveyor

The present invention relates to an electronic component transport apparatus that transports an electronic component by forming a transport path and inspects the electronic component during the transport.

Electronic parts are parts used in electrical products. Examples of the electronic component include a semiconductor element and resistors and capacitors other than the semiconductor element. Examples of the semiconductor element include discrete semiconductors such as transistors, diodes, LEDs, and thyristors, and integrated circuits such as ICs and LSIs. There is an electronic component transport apparatus that performs various processes on the transport of the electronic component and the surrounding points. The conveyance path is formed by a disk-shaped conveyance table provided on the gantry. The transfer table has suction nozzles on the outer periphery. The transfer table is supported at a certain height from the gantry, and a certain accommodation space exists between the transfer table and the upper surface of the gantry. In principle, a processing unit that performs various types of processing on electronic components is installed in this accommodation space.

However, the electrical test unit that inspects the electrical characteristics of the electronic components does not fit in the accommodation space between the transfer table and the mount. For this reason, it must be installed outside the gantry, but if it is installed simply, the suction nozzle will not reach the socket that will be the receiving port for the electronic component. Thus, various configurations have been proposed in which an electronic test unit is installed on the outside of a gantry and an electronic component is delivered to a socket.

For example, a configuration is proposed in which the socket is separated from the unit body, the socket is installed at a position where the suction nozzle can reach, and the unit body and the socket are connected by a cable (see, for example, Patent Document 1). This is because the socket and the board on which the socket is mounted can be accommodated in the accommodation space between the transfer table and the mount.

Also, for example, a configuration has been proposed in which a transfer table and an electrical test unit are connected by a shuttle, and an arm is installed between the shuttle and the electrical test unit (see, for example, Patent Document 2). The electronic components are transferred from the transfer table to the shuttle, transported by the shuttle to the immediate vicinity of the electrical test unit, and transferred from the shuttle to the socket by the arm. Further, the electronic component is transferred from the socket to the shuttle by the arm, carried to the vicinity of the transport table by the shuttle, and returned to the transport path formed by the transport table by being held by the suction nozzle.

JP 2010-127740 A JP 2010-014632 A

Each method has its own disadvantages. Mainly, one causes a decrease in reliability of inspection and the other causes a decrease in production efficiency of electronic components.

In the method of separating the socket and the unit main body of the electrical test unit, it is usually necessary to connect both with a cable of about 300 to 500 mm. Depending on the inspection contents of electrical characteristics such as injection of minute current and response to logic signals, The measurement results may not meet the target accuracy due to the effects of signal delay and attenuation due to the cable length. In order to satisfy the target accuracy, advanced cables and gain circuits were employed, and complicated analysis and correction processing were required.

In addition, the method of connecting the transfer table and the electrical test unit with a shuttle or arm increases the cost due to an increase in the number of parts, and also causes a time for re-loading to the shuttle and a round-trip time for the shuttle. It has been pointed out that the production efficiency of electronic parts declines, such as affecting the production volume per hour. In order to make up for this, it is necessary to increase the transport speed by electronic component transport equipment and shorten the time by parallel operation, etc., and advanced specifications and high-precision operations are required for various parts including motors. Increases equipment cost and requires precise adjustment work.

The present invention has been proposed in order to solve the above-described problems of the prior art, and an object thereof is to provide an electronic component transport apparatus capable of achieving both inspection accuracy of electronic components and production efficiency. To do.

An electronic component transport device according to the present invention is an electronic component transport device that transports electronic components and performs various processes, and has a base having a certain size, and is installed on the base and is higher than the upper surface of the base A horizontal table at a position, a conveyance table that intermittently rotates while holding electronic components around the outer periphery of the horizontal plate, and a stage on which electronic components are placed, and the height from the bottom to the stage is A horizontal unit that is higher than the height between the gantry and the horizontal plate and performs processing on the electronic component on the stage, and the transfer table has an overhanging section in which a part of the outer periphery projects from the edge of the gantry. The horizontal unit is positioned directly below the overhanging section, and the transfer table and the horizontal unit directly transfer electronic components.

The transfer table may include a holding unit that holds an electronic component, and the horizontal unit may be positioned directly below the overhanging section so that the stage is positioned directly below the holding unit.

The lateral unit may be an electrical test unit that inspects electrical characteristics of electronic components.

A bracket for fixing the lateral unit may be further provided, and the bracket may have a fixing portion with the lateral unit in the vicinity of the overhanging section.

The stage may be provided on the bracket separately from the main body of the lateral unit, and the lateral unit may be connected to the stage while being fixed to the bracket.

According to the present invention, the manufacturing cost of the electronic component transfer device is reduced by reducing the number of components, the production efficiency of the electronic component is improved by reducing the transfer time from the transfer table of the electronic component to the unit, the inspection result of the electronic component Reliability is improved.

It is a perspective view which shows the structure of an electronic component conveying apparatus. It is a top view which shows the structure of an electronic component conveying apparatus. It is a side view which shows the structure of an electronic component conveying apparatus. It is an expansion perspective view which shows an example of the connection of the horizontal unit by a bracket. It is an expansion perspective view which shows the other example of the connection of the horizontal unit by a bracket. It is an expansion perspective view which shows the further another example of the connection of the horizontal unit by a bracket.

(Electronic component conveyor)
DESCRIPTION OF EMBODIMENTS Hereinafter, an embodiment of an electronic component transport device according to the present invention will be described in detail with reference to the drawings. FIG. 1 is a perspective view of the electronic component transport apparatus 1, FIG. 2 is a top view illustrating the overall configuration of the electronic component transport apparatus 1, and FIG. 3 is a side view illustrating the overall configuration of the electronic component transport apparatus 1. It is.

The electronic component transport apparatus 1 arranges a transport path 11 for electronic components on the gantry 14, aligns and transports a plurality of electronic components along the transport path 11, and inspects the electronic components on the transport path 11. The gantry 14 is a rectangular parallelepiped pedestal on which the apparatus is installed, and accommodates a control device such as a computer and a driver, a power source, cables, a vacuum pump, and an air pipe.

At the beginning of the transport path 11 of the electronic component transport apparatus 1, a supply unit 2 for supplying electronic components to the transport path 11 is provided. At the end of the transport path 11, a housing unit 3 for housing electronic components is provided. An electric test unit 4, an appearance inspection unit 5, a classification unit 6, and other various processing units are arranged in parallel on the transport path 11 between the supply unit 2 and the storage unit 3.

The electrical test unit 4 inspects the electrical characteristics by applying voltage or current injection to the electronic components. The electrical characteristics include the voltage, current, resistance, or frequency of the electronic component for current injection or voltage application to the electronic component, an output signal for a logic signal, and the like. The appearance inspection unit 5 inspects the appearance of the electronic component by photographing and image processing. The classification unit 6 accommodates electronic components that are not worthy of being accommodated in the accommodation unit 3 in accordance with the inspection results of the electrical characteristics and appearance.

The conveyance path 11 is formed by a conveyance table 12. The conveyance table 12 is a horizontal plate having suction nozzles 13 on the outer periphery, and has a shape such as a disk or a star that expands radially around one point. The transport table 12 rotates intermittently by a predetermined angle in the circumferential direction. The power source of the transfer table 12 is a direct drive motor 15, and the transfer table 12 is installed on the gantry 14 via the direct drive motor 15.

The suction nozzles 13 included in the transport table 12 are holding means for holding and releasing electronic components, and a plurality of suction nozzles 13 are attached to the outer circumference of the horizontal board at equal circumferential positions and at the same distance from the center of the horizontal board. The suction nozzle 13 is hollow inside and has one end opened, and the suction nozzle 13 is installed on a horizontal plate with the open end facing downward. The inside of the suction nozzle 13 communicates with a pneumatic circuit of a negative pressure generator such as a vacuum pump or an ejector. By generating a negative pressure in the pneumatic circuit, the suction nozzle 13 sucks the electronic component at one end of the opening, and releases the electronic component by vacuum break or release to the atmosphere.

The direct drive motor 15 is installed on the top surface of the gantry 14. The direct drive motor 15 is controlled to rotate intermittently by one pitch. The pitch is adjusted to be equal to the arrangement interval of the suction nozzles 13. That is, the suction nozzle 13 follows a common movement locus with the intermittent rotation of the transport table 12 and stops at a common stop position. By providing a processing unit at this stop position, processing such as inspection for electronic components can be performed.

At each stop position where the processing unit is provided, an advancing / retreating drive device 8 is provided immediately above the transfer table 12. The advance / retreat drive device 8 is a device that lowers the suction nozzle 13 toward the stage of the processing unit. For example, the suction nozzle 13 can be moved up and down by being provided on the transport table 12 via a cylindrical bearing having an axis in the vertical direction, and is always urged upward by a compression spring. Further, the advancing / retreating drive device 8 includes a rod extending toward the head of the suction nozzle 13, and a rotation motor and a cam mechanism that apply axial thrust to the rod.

The advancing / retreating drive device 8 generates a thrust by a rotary motor, converts the thrust into a linear thrust along the axis of the suction nozzle 13 by a cam mechanism and a rod, and uses the rod to resist the biasing force of the compression spring. Push 13 in. The electronic component held by the suction nozzle 13 is placed on the stage of the processing unit when the suction nozzle 13 is lowered, and receives a process corresponding to the processing unit. When the rod releases the suction nozzle 13, the suction nozzle 13 is raised toward the original position by the urging force of the compression spring while holding the electronic component.

As a result, the electronic component transport device 1 sequentially transports the electronic components supplied from the supply unit 2 to each unit by the transport table 12, and moves the suction nozzle 13 up and down by the advance / retreat drive device 8 immediately above each processing unit. Deliver electronic components to and from the processing unit.

Here, the rotary shaft of the direct drive motor 15 extends upward, and the transfer table 12 is pivotally supported by the rotary shaft at the radiation center. That is, the horizontal plate of the transfer table 12 is at a position higher than the upper surface of the gantry 14. Further, the outer diameter of the direct drive motor 15 is smaller than the diameter of the transfer table 12. Therefore, a storage space having a height exists between the bottom surface of the transfer table 12 and the top surface of the gantry 14.

The supply unit 2, the appearance inspection unit 5, the classification unit 6, and the storage unit 3 are each embedded in the storage space between the transfer table 12 and the gantry 14 by entering the outer periphery of the transfer table 12 and stopping the suction nozzle 13. Located just below the position.

On the other hand, the electrical test unit 4 has a height from the lowermost end such as a leg or a bottom surface to a socket portion 41 that is a stage on which an electronic component is placed, which is higher than the accommodation space. This is a horizontal unit that is arranged side by side with the gantry 14. However, the conveyance path 11 is an overhanging section A in which a part of the section protrudes from the mount 14. That is, the distance from the center of the conveyance table 12 to the edge E of the gantry 14 is shorter than the radius of the conveyance table 12 in a range of continuous predetermined angles.

Specifically, the conveyance table 12 is not the center of the gantry 14 but is shifted from the center by a predetermined distance and is biased toward the edge E side. Thereby, the conveyance table 12 has an overhanging section A in which a part of the outer periphery protrudes from the edge E of the gantry 14.

The installation position of the electrical test unit 4 is directly below this overhanging section A. As a result, the electrical test unit 4 can be positioned directly below the suction nozzle 13 by allowing the gantry 14 to enter the outer periphery of the transport table 12 without causing a physical obstacle.

That is, the overhanging section A is provided to allow the socket portion 41 of the electrical test unit 4 and the suction nozzle 13 to face each other. The length of the overhanging section A depends on the number of socket portions 41 facing the suction nozzle 13. For example, when there are eight socket portions 41, the overhanging section A includes at least eight stop positions.

As shown in FIG. 4, in such an electrical test unit 4 that can be placed directly under the transfer table 12, the socket portion 41 has a terminal disposed therein, and is a board placed vertically on the upper surface of the electrical test unit 4. 42, with the opening facing upward. The board 42 includes a driver circuit, receives electric power and a control signal from the unit main body 4a, generates a current, voltage, or logic signal, inputs the signal to the terminal of the socket unit 41, and returns a test result to the unit main body 4a. The unit body 4a analyzes the test result, determines the quality of the electronic component, and notifies the control device in the gantry 14 inside.

Each socket portion 41 corresponds to each stop position of the suction nozzle 13 on a one-to-one basis and is disposed immediately below it. That is, the arrangement interval of each socket part 41 is equal to the arrangement interval of the suction nozzle 13. Further, the arrangement of the socket portions 41 is curved along the transport path 11. Further, each socket portion 41 faces the center of the transport table 12. In other words, the substrates 42 are arranged in a fan shape so as to be orthogonal to the transport path 11. Furthermore, in other words, each board 42 is inserted into a slot 44 (see FIG. 5) provided in the electrical test unit 4, and the slots 44 are arranged in a fan shape so as to be orthogonal to the transport path 11. .

The height of this electrical test unit 4 is adjusted by placing it on a height-adjustable installation base 9. The electrical test unit 4 is fixed to the gantry 14 using the bracket 7. As shown in FIG. 4, the bracket 7 is erected on the upper surface of the gantry 14. The bracket 7 has a fixing portion 72 in the vicinity of the overhanging section A, and fixes the board 42 side on which the socket portion 41 is mounted, not the unit main body 4a. This is because at least the positional relationship between the suction nozzle 13 stopped in the overhanging section A and the socket portion 41 is fixed with high accuracy.

That is, the bracket 7 integrally processes a substantially L-shaped reinforcing portion 71 having a depth and a fixing portion 72 that is erected on the reinforcing portion 71 and extends in a horizontal direction so as to protrude from the mount 14. Become. The reinforcing portion 71 is provided so that the bracket 7 does not bend against the weight of the electrical test unit 4. The fixing portion 72 is a U-shaped frame extending along the same horizontal plane, and extends from the gantry 14 so as to surround the protruding section A from three directions. Both ends of the U-shaped frame are bent vertically and connected to both ends of the reinforcing portion 71 in the depth direction.

On the other hand, the electrical test unit 4 includes a common docking plate 43 to which the substrates 42 are fixed. The docking plate 43 has a horizontally extending plane, and each substrate 42 is fitted perpendicularly to the plane, and its outer shape has the same dimensions as the outer frame of the fixed portion 72. The bottom surface of the fixing portion 72 and the top surface of the docking plate 43 are overlapped and fastened with bolts or the like so that the socket portion 41 faces the suction nozzle 13 stopped in the overhanging section A. In addition, a flat support plate is separately prepared, and the docking plate 43 is sandwiched between the fixing portion 72 and the support plate, thereby realizing a fixed relationship without loosening and the positional relationship between the socket portion 41 and the suction nozzle 13 with high accuracy. You can keep it.

Alternatively, the docking plate 43 has the same dimensions as the inner frame of the fixed portion 72. In this case, the electrical test unit 4 is fixed by fitting the docking plate 43 into the frame of the fixing portion 72 and fastening it with a bolt or the like from the side. The docking plate 43 may be formed with a recess that matches the frame of the fixed portion 72, and positioning of the docking plate 43 and the fixed portion 72 is facilitated.

Further, as shown in FIG. 5, each substrate 42 may be provided in the bracket 7 in advance, and the substrate 42 and the bracket 7 may be connected to the unit main body 4a. That is, the electrical test unit 4 includes the unit main body 4a and the substrate 42 separately. The unit body 4 a is provided with a slot 44 that is electrically coupled to the substrate 42. The fixing portion 72 of the bracket 7 is a plate that extends horizontally immediately below the overhanging section A, and each substrate 42 on which the socket portion 41 is mounted fits perpendicularly to the plate, and the socket portion 41 is connected to each suction nozzle. It is fixed in advance corresponding to 13 stop positions.

In such a connection mode of the electrical test units 4, the unit main body 4 a is placed immediately below the overhanging section A, and each substrate 42 is inserted into each slot 44. Since the socket portion 41 mounted on the substrate 42 and the stop position of the suction nozzle 13 are associated in advance, the positioning operation for connection does not affect the delivery accuracy of the electronic components.

In the electronic component transport apparatus 1 as described above, even if it is a horizontal unit that has to be connected side by side with the gantry 14 due to size restrictions, it does not have a socket portion 41 that delivers the electronic component to and from the suction nozzle 13. Since the stage can be provided facing the stage, the unit can directly receive the electronic component from the suction nozzle 13. Therefore, there is no need to arrange a shuttle or the like between the unit and the suction nozzle 13, a reduction in the manufacturing cost of the electronic component transport apparatus 1 due to a reduction in the number of components, and a transfer time of the electronic component from the suction nozzle 13 to the unit. This leads to an improvement in the production efficiency of electronic components due to a dramatic decrease in

Further, when the horizontal unit is the electrical test unit 4, a cable connecting the socket part 41 and the unit main body 4a is not necessary, so that the influence on the electrical property inspection caused by the cable can be eliminated and the electrical property of the electronic component can be eliminated. The reliability of the result obtained by the inspection is improved.

Further, the unit arranged side by side with the gantry 14 is connected to the gantry 14, and the fixing point between the unit and the bracket 7 is set close to the stop position of the suction nozzle 13. Can be prevented from spreading greatly, and the delivery accuracy of electronic components can be easily improved.

Moreover, in this electronic component transport apparatus 1, simultaneous inspection can be performed as many as the number of socket portions 41 overlapped in the overhanging section A. The simultaneous inspection results in a reduction in the stop time during which the transport table 12 is stopped according to the number of simultaneous operations. That is, after the suction nozzle 13 receives the electronic parts one by one from the supply unit 2 in order, the electronic parts are not inspected until the electronic parts that have not been subjected to the electrical property inspection are arranged immediately above all the sockets 41. Only intermittent rotation of the table 12 is performed. When the electronic components are aligned immediately above all the socket portions 41, the electronic component transport apparatus 1 performs the electrical property inspection processing of the electronic components and the delivery processing between the suction nozzle 13 and the socket portion 41 at the time before and after that. Do. That is, on average, the time during which the transport table 12 is stopped can be reduced by the time obtained by dividing the time required for the electrical characteristic inspection processing by the number of socket portions 41.

(Modification)
(Horizontal unit)
In the above embodiment, the electric test unit 4 is taken as an example of the horizontal unit. However, it can also be applied to an installation mode for various units that must be arranged side by side with the gantry 14 due to the size limit.

(Overhang section)
In addition, the overhanging section A may be provided not only at one place but also at a plurality of places, and various units that have to be arranged side by side with the gantry 14 can be installed immediately below the transfer table 12 at the same time. Further, the gantry 14 is formed in a U shape so that a rectangular region including the overhanging section A is cut out, and a horizontal unit may be arranged in the cut out portion of the U shape. it can.

In addition, by sharing one electrical test unit 4 between the two transfer tables 12, two transfer paths can be realized. That is, in the electronic component transport apparatus 1, one electrical test unit 4 is sandwiched between the two mounts 14. Each of the racks 14 is provided with a transfer table 12, and the overhanging section A is provided on the electrical test unit 4 side. As a result, one electrical test unit 4 is installed immediately below the two overhanging sections A. In the sandwiched electrical test unit 4, the socket portion 41 may be disposed immediately below each stop position of the suction nozzle 13 existing in the both overhanging sections A.

(Electrical test unit)
Further, regarding the electrical test unit 4, in the embodiment, a configuration in which the unit main body 4 a and the substrate 42 on which the socket portion 41 is mounted is integrated, or a configuration in which the substrate 42 is integrated by inserting the substrate 42 into the slot 44 is exemplified. However, it is not limited to this. The present invention can also be applied to the electrical test unit 4 in which the unit main body 4a and the board 42 are separately connected by a cable, and the cable length can be shortened by the amount that the unit main body 4a can be brought close to the position directly below the transfer table 12. There is.

For example, as shown in FIG. 6, the electrical test unit 4 includes a unit main body 4a (not shown) and a head box 4b separated from each other. The head box 4b accommodates the substrate 42, and the socket portion 41 is separated from the head box 4b. The socket part 41 and the board | substrate 42 are connected with the cable. The bracket 7 has a two-stage structure, the socket part 41 is disposed on the lower stage 7b, and the head box 4b is disposed on the upper stage 7a. The lower stage 7 b is attached to the edge of the gantry 14 so that the surface thereof is flush with the upper surface of the gantry 14. The upper stage 7a is fixed to a support frame extending from the lower stage 7b. The upper stage 7a is provided on the outer side of the overhanging section A so as not to be a physical obstacle to the overhanging section A of the transport path 11 while being as close as possible to the lower stage 7b.

Thereby, since both the head box 4b and the socket part 41 can be provided in the vicinity of the overhanging section A, the length of the cable connecting the head box 4b and the socket part 41 can be shortened, and a conventional type of electric machine having the head box 4b is provided. Even the test unit 4 can be applied.

In addition, the electrical test unit 4 is configured so that the socket part 41 is curvedly arranged along the transport path 11, but even in the electrical test unit 4 in which the socket part 41 is arranged on a straight line as in the past, Installation is possible by using a conversion adapter. The conversion adapter is a board in which the socket part 41 is curved along the transport path 11 and arranged on the upper surface. On the back surface of the board, socket portions 41 arranged in a straight line are fitted. Inside the board, wiring is formed to electrically connect the socket part 41 fitted into the socket part 41 arranged on the upper surface. In the conventional electrical test unit 4, the socket parts 41 are generally arranged on a straight line. By covering the electrical test unit 4 with a conversion adapter, the socket part 41 can be easily converted into a mode in which the socket part 41 is arranged along the transport path 11.

Further, instead of dividing the substrate 42 in units, the substrates 42 can be accommodated in individual head boxes 4b and arranged along the transport path 11 in units of head boxes 4b. The head box 4b is provided with a socket part 41 exposed on the upper surface, and accommodates a substrate 42 therein. An individual head box 4 b corresponding to each socket part 41 is connected to the unit body 4 a by cable, and the head box 4 b is arranged in a fan shape along the transport path 11.

Furthermore, in the embodiment, the orientation of the socket portion 41 is directed toward the center of the transfer table 12, but the orientation of the socket portion 41 may be all parallel. In this case, a position correction unit for changing the orientation of the electronic component is arranged in the front stage and the rear stage of the electrical test unit 4. The position correction unit is a unit in which a stage is pivotally supported on a motor shaft and the stage is rotated by θ. The front position correction unit changes the orientation of the electronic component in advance in accordance with the orientation of the socket portion 41 on which the electronic component is to be placed. The rear position correction unit returns the electronic component to the original position so as to face the center of the transport table 12.

(Advance / retreat drive)
The advance / retreat drive device 8 can be replaced in various ways. For example, in the advancing / retreating drive device 8, it is assumed that the rod extending toward the head of the suction nozzle 13 is obtained by extending the coil bobbin of the voice coil motor. When the thrust of the voice coil motor is not generated, the rod is retracted into the voice coil motor by being defeated by the reaction force received from the suction nozzle 13. On the other hand, when the voice coil motor generates a counter thrust or more that antagonizes the reaction force, the rod does not sink into the moving block but pushes the suction nozzle 13. The voice coil motor generates a total thrust obtained by adding a pressing force that presses the electronic component against the socket portion 41 and an opposite thrust that antagonizes the reaction force from the suction nozzle 13.

As a result, the pressing force planned for the electronic component can be realized with a fine accuracy, and if an excessive force is applied to the electronic component, the rod sinks into the moving block and can absorb the excess amount. it can. In the electrical characteristic inspection of an electronic component having a multi-pin electrode, a large pressing force pressing the electronic component against the socket portion 41 is required for accurate contact with the terminal of each pin, but rather a delicate and minute pressing force is required. For example, for a fragile electronic component, such an advancing / retreating drive device 8 with a voice coil motor is effective.

The delivery of the electronic components between the transport table 12 and the electrical test unit 4 may be performed by causing the suction nozzle 13 and the socket part 41 to relatively approach or separate from each other. That is, the socket part 41 may be moved toward the suction nozzle 13. In this case, the fixing portion 72 and the reinforcing portion 71 of the bracket 7 are connected to the guide shaft by a tension spring or the like, and the advancing / retreating drive device 8 moves the entire fixing portion 72 toward the suction nozzle 13 against the tension spring. Like that. In this moving mode, it is necessary to separate the board 42 and the unit main body 4a and connect them with a cable. However, an extremely short cable of about the approach distance between the socket part 41 and the suction nozzle 13 is sufficient, and the electric power depending on the cable length The effect on the accuracy of characteristic inspection is insignificant.

Also, instead of moving the fixed portion 72 toward the suction nozzle 13, the rod tip of the advance / retreat drive device 8 may be connected to the lower portion of the substrate 42 on which the socket portion 41 is mounted, and the substrate 42 may be pushed up. In this case, the advance / retreat drive device 8 may be provided for each substrate 42, or a common plate for connecting all the substrates 42 may be provided, and the rod tip of the advance / retreat drive device 8 may be connected to the lower portion of the common plate. Good.

If the advancing / retreating drive device 8 is provided for each suction nozzle 13 or socket part 41, the voice coil motor can be used to measure the approaching amount between the suction nozzle 13 and the socket part 41 in advance, and the electronic component. When the transport device 1 is in operation, the suction nozzle 13 and the socket part 41 can be brought close to each other according to the measured value.

That is, the sinking of the rod into the moving block is detected, and the total rotation angle from the start of the rotation motor of the advance / retreat drive device 8 to the detection timing is measured. The measurement value is input to the control device of the gantry 14 and is reproduced by controlling the relative movement between the suction nozzle 13 and the socket part 41.

In order to sink the rod into the moving block, a step portion serving as a lid is provided on the rod. On the other hand, when the rod is advanced from the moving block, air is moved to a position where the rod is blocked by the step portion. Make a hole. Further, positive pressure or negative pressure is applied to the air hole, and a pressure sensor is provided in the air pipe communicating with the air hole. When the rod sinks into the moving block, the step portion is separated from the air hole, so that the air hole communicates with the atmosphere and a change in pressure occurs in the air pipe. The pressure sensor detects this pressure change, thereby detecting the sinking of the rod into the moving block.

Thus, when the advance / retreat driving device 8 is provided for each suction nozzle 13 or for each substrate 42, the approach amount and the load can be adjusted individually. Since the electrical test unit 4 and the mount 14 are fixed by the bracket 7 in the vicinity of the overhanging section A, the positioning accuracy between the suction nozzle 13 and the socket portion 41 is high.

However, depending on the accumulated error between the distortion error of the bracket 7 and the uniformity error of the thickness of the docking plate 43, the distance between the suction nozzle 13 and the socket part 41 may vary. In this case, it is only necessary to rotate the conveyance table 12 once and intermittently, automatically measure the distance between the two and feed back to the height of the suction nozzle 13 regardless of the manual operation. This improves the production efficiency of electronic parts.

(Other)
Further, although the suction nozzle 13 has been described as an example of the holding means, an electrostatic suction method, a Bernoulli chuck method, or a chuck mechanism that mechanically holds an electronic component may be provided. In addition to the electrical test unit 4, various process processing units can be arranged immediately below the transfer table 12. Examples of other process processing units include a position correction unit, a marking unit, and a defective product discharge device.

Although the embodiments of the present invention have been described above, various omissions, replacements, and changes can be made without departing from the spirit of the invention. And this embodiment and its deformation | transformation are included in the invention described in the claim, and its equivalent range while being included in the range and summary of invention.

DESCRIPTION OF SYMBOLS 1 Electronic component conveying apparatus 12 Conveyance table 13 Suction nozzle 14 Base 15 Direct drive motor 2 Supply unit 3 Housing unit 4 Electrical test unit 4a Unit main body 4b Head box 41 Socket part 42 Board | substrate 43 Docking plate 44 Slot 5 Appearance inspection unit 6 Classification unit 7 Bracket 71 Reinforcement part 72 Fixing part 7a Upper stage 7b Lower stage 8 Advance / retreat drive device 9 Installation base A Overhang section E Edge

Claims

An electronic component transport apparatus for transporting electronic components and various processes,
A frame having a certain size;
A transport table installed on the gantry, having a horizontal plate at a position higher than the upper surface of the gantry, and intermittently rotating while holding electronic components on the outer periphery of the horizontal plate;
A horizontal unit that has a stage on which electronic components are placed, the height from the bottom surface to the stage is higher than the height between the gantry and the horizontal plate, and performs processing on the electronic components on the stage;
With
The transfer table has an overhanging section in which a part of the outer periphery protrudes from an edge of the frame,
The lateral unit is located immediately below the overhanging section,
The transfer table and the horizontal unit directly transfer electronic components;
An electronic component conveying device characterized by the above.
The transport table has holding means for holding electronic components,
The horizontal unit is located directly below the overhanging section, thereby positioning the stage directly below the holding means;
The electronic component conveying apparatus according to claim 1.
The lateral unit is an electrical test unit for inspecting electrical characteristics of electronic components;
The electronic component carrying device according to claim 1 or 2.
A bracket for fixing the lateral unit;
The bracket has a fixing portion with the lateral unit in the vicinity of the overhanging section;
The electronic component conveying apparatus according to claim 1, wherein
The bracket is provided with the stage separately from the body of the lateral unit,
The lateral unit is connected to the stage while being fixed to the bracket;
The electronic component carrying device according to claim 4.